WO2023149337A1 - ディスプレイ光計測装置及び光計測方法、データ処理装置並びにプログラム - Google Patents

ディスプレイ光計測装置及び光計測方法、データ処理装置並びにプログラム Download PDF

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WO2023149337A1
WO2023149337A1 PCT/JP2023/002447 JP2023002447W WO2023149337A1 WO 2023149337 A1 WO2023149337 A1 WO 2023149337A1 JP 2023002447 W JP2023002447 W JP 2023002447W WO 2023149337 A1 WO2023149337 A1 WO 2023149337A1
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Prior art keywords
frequency
interest
flicker
display
measurement
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English (en)
French (fr)
Japanese (ja)
Inventor
敏 増田
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Konica Minolta Inc
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Konica Minolta Inc
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Priority to JP2023578519A priority Critical patent/JPWO2023149337A1/ja
Priority to KR1020247023433A priority patent/KR20240118866A/ko
Priority to CN202380020002.4A priority patent/CN118647845A/zh
Publication of WO2023149337A1 publication Critical patent/WO2023149337A1/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0228—Control of working procedures; Failure detection; Spectral bandwidth calculation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0238—Details making use of sensor-related data, e.g. for identification of sensor or optical parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09F—DISPLAYING; ADVERTISING; SIGNS; LABELS OR NAME-PLATES; SEALS
    • G09F9/00—Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4413—Type
    • G01J2001/4426—Type with intensity to frequency or voltage to frequency conversion [IFC or VFC]
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2360/00—Aspects of the architecture of display systems
    • G09G2360/14—Detecting light within display terminals, e.g. using a single or a plurality of photosensors
    • G09G2360/145—Detecting light within display terminals, e.g. using a single or a plurality of photosensors the light originating from the display screen

Definitions

  • the present invention relates to a display light measurement device for measuring light from a display, and more particularly to a display light measurement device and light measurement method, a data processing device, and a program capable of measuring flicker, which is the amount of visible flickering of a display.
  • the characteristics of display panels vary from individual to individual. By adjusting and inspecting such panels individually, a display device having desired characteristics and uniform quality is finished.
  • adjustment/inspection of static characteristics includes correction of panel input/output characteristics, and gamma characteristics and white balance are adjusted/inspected for each individual in order to reproduce the desired characteristics of luminance and chromaticity.
  • Optical measurement equipment luminance and chromaticity measurement
  • performance in the low luminance range low noise, high accuracy is particularly important. be.
  • Measuring instruments that acquire dynamic characteristics have become more complex and have high amplitude emission waveforms due to improvements in display functions and performance. are of particular importance.
  • OLED organic light emitting diode
  • light emission control that combines not only amplitude modulation but also pulse width modulation is adopted for dimming control in order to achieve faithful color reproduction.
  • Shaped luminescence is becoming more common.
  • multiple pulse emission controls are performed in one frame period (vertical synchronization period), and the emission waveform is much faster than the image update period.
  • a display color analyzer for example, is an optical measurement device that can measure both the dynamic and static characteristics of a display.
  • This conventional optical measurement device has dedicated data acquisition circuits suitable for each measurement of dynamic and static characteristics, and achieves both.
  • Fig. 8 shows a schematic configuration of a conventional display light measurement device.
  • incident light from a display is collected by a light collection unit 101 of the light measurement device 100 and then split into four optical paths by an optical path branching unit 102. is used to receive the light in each optical path with the optical sensor (X) 103a, the optical sensor (Y) 103b, and the optical sensor (Z) 103c, respectively, and obtain the static characteristics of the stimulus values XYZ (luminance and chromaticity measurement ).
  • Static characteristics are obtained by an integration method using current integration circuits 104a to 104c, which have excellent S/N characteristics in the low luminance range, that is, a method of obtaining an integral value ( ⁇ average value) for a predetermined time.
  • Each value obtained by the integration method is converted into a digital value by analog/digital converters (A/D converters) 105 a to 105 c and output to the control unit 106 that controls the entire optical measurement device 100 .
  • Reference numeral 107 denotes a storage unit that stores the acquired digital values and the like.
  • the remaining one optical path branched by the optical path branching unit 102 is used, and the light of this optical path is received by the optical sensor 110, thereby obtaining the dynamic characteristic of the stimulus value Y (flicker measurement).
  • a successive approximation method is used to acquire the dynamic characteristics by converting to voltage with the current-voltage conversion circuit 111, and the successive approximation method is adopted.In addition, it has excellent high speed and a low pass that removes high frequency components that cause measurement errors.
  • a filter 112 is interposed, and the output of the low-pass filter 112 is digitally converted by an A/D converter 113 .
  • Non-Patent Document 1 As a flicker measurement method for a complicated light emission waveform, there is a method specified in the IEC standard "62341-6-3" of Non-Patent Document 1.
  • the number of branches of the optical path by the optical path branching unit 102 is large, so the amount of light that can be used for each measurement is reduced. For this reason, the measurement at low luminance has a performance limit from the viewpoint of S/N due to insufficient light intensity. Also, having a dedicated circuit for each branch has led to an increase in cost. Therefore, as a countermeasure, as shown in FIG. 9, it has been proposed to perform flicker measurement using a luminance and chromaticity measurement circuit (for static characteristics) using an optical sensor (Y) 103b. 8, the same components as in FIG. 7 are denoted by the same reference numerals. With this configuration, the optical path branched by the optical path branching unit 102 is divided into three, and an increase in the amount of light and a reduction in cost can be expected.
  • an anti-aliasing filter which is an analog low-pass filter for cutting unnecessary high frequencies, cannot be provided before the A/D converter 105b.
  • An object of the present invention is to provide a display light measurement device, a light measurement method, a data processing device, and a program.
  • stimulus value acquisition means for receiving light from the display and continuously acquiring intensity corresponding to the stimulus value at a predetermined sampling frequency; setting means for setting a frequency of interest that is an error factor in flicker measurement; determining means for determining the sampling frequency to be a natural number multiple of two or more times the frequency of interest set by the setting means; flicker measuring means for measuring flicker using the data acquired by the stimulus value acquiring means;
  • a display optical measurement device with In a display optical measurement device that does not have an anti-aliasing filter before the A/D converter, stimulus value acquisition means for receiving light from the display and continuously acquiring intensity corresponding to the stimulus value at a predetermined sampling frequency; flicker measuring means for measuring flicker using the data acquired by the stimulus value acquiring means; with The display light measurement device, wherein the sampling frequency is a natural number multiple of two or more times the frequency of interest, which is an error factor in flicker measurement.
  • the display light measuring device according to any one of the preceding items 1 to 6, which performs two-dimensional measurement.
  • a display light measuring device that does not have an anti-aliasing filter before the A/D converter receives the light of the display, and continuously measures the intensity corresponding to the stimulus value at a predetermined sampling frequency.
  • a stimulus value acquisition step to be acquired a setting step of setting a frequency of interest as an error factor in flicker measurement; a determination step of determining the sampling frequency to be a natural number multiple of two or more times the frequency of interest set in the setting step; a flicker measurement step of measuring flicker using the data acquired by the stimulus value acquisition step; display light measurement method including; (9) A display light measurement device that does not have an anti-aliasing filter upstream of the A/D converter receives light from the display, and continuously measures the intensity corresponding to the stimulus value at a predetermined sampling frequency.
  • a stimulus value acquisition step to be acquired a flicker measurement step of measuring flicker using the data acquired by the stimulus value acquisition step; including The display light measurement method, wherein the sampling frequency is a natural number multiple of two or more times the frequency of interest that causes an error in flicker measurement.
  • (11) The display light measurement method according to any one of the preceding items 8 to 10, wherein when the frequency of interest is 110 Hz or higher, the sampling frequency is a natural number multiple of 3 or more times as large as 1/2 of the frequency of interest. .
  • a display light measurement device that does not have an anti-aliasing filter upstream of an A/D converter, receives light from the display, and continuously measures the intensity corresponding to the stimulus value at a predetermined sampling frequency.
  • a data processing device for determining the sampling frequency of a display light measuring device, comprising: stimulus value acquisition means for objectively acquiring; and flicker measurement means for measuring flicker using the data acquired by the stimulus value acquisition means.
  • a data processing device with (16) A display light measurement device that does not have an anti-aliasing filter upstream of an A/D converter, receives light from the display, and continuously measures the intensity corresponding to the stimulus value at a predetermined sampling frequency.
  • the sampling frequency is a natural number multiple of 1/2 of the frequency of interest, which is three or more times.
  • the data processing device is a computer, a setting step of setting a frequency of interest as an error factor in flicker measurement; a determination step of determining the sampling frequency to be a natural number multiple of two or more times the frequency of interest set in the setting step; A program for causing the computer to execute.
  • the light of the display is received, and the intensity corresponding to the stimulus value is continuously acquired at a predetermined sampling frequency.
  • This sampling frequency is determined to be a natural number multiple of two or more times the frequency of interest, assuming that the frequency that causes an error in flicker measurement is the frequency of interest.
  • aliasing noise folding noise
  • the frequency of interest can be set, and the sampling frequency can be determined so as to be a natural number multiple of two or more times the set frequency of interest.
  • a computer it is possible to cause a computer to execute a process of setting the frequency or period of interest and determining the sampling frequency so as to be a natural number multiple of two or more times the set frequency of interest. can.
  • FIG. 3 is a diagram showing frequency components and intensities (frequency spectrum) that constitute an emission waveform of a display
  • FIG. 10 is a diagram showing a visibility characteristic TCSF
  • FIG. 4 is a block diagram showing a second embodiment of the present invention
  • FIG. 5 is a block diagram showing a third embodiment of the invention
  • FIG. 11 is a block diagram showing a fourth embodiment of the invention
  • FIG. 1 is a block diagram showing the configuration of a conventional display light measuring device
  • FIG. FIG. 9 is a block diagram showing the configuration of a display light measurement device proposed to solve the problem of the conventional display light measurement device of FIG. 8;
  • FIG. 1 is a block diagram showing the functional configuration of a display optical measurement device (hereinafter also simply referred to as an optical measurement device) 1 according to one embodiment of the present invention.
  • the optical measurement device 1 includes a light collection unit 2, an optical path branching unit 3, a stimulus value acquisition unit 4, a target frequency setting unit 5, a sampling frequency determination unit 6, and a flicker value derivation unit 7. etc. are provided in one device, and are connected to a personal computer (PC) 10 so as to be communicable.
  • PC personal computer
  • Reference numeral 11 denotes an operation section for the PC
  • reference numeral 12 denotes a display section.
  • the condensing unit 2 consists of a condensing lens and the like, and collects the light emitted from the display, which is the object to be measured.
  • the optical path branching section 3 divides the optical path of the light condensed by the condensing section 2 into three.
  • the stimulus value acquisition unit 4 uses the three optical paths branched by the optical path branching unit 3, and includes an optical sensor (X) 41a, an optical sensor (Y) 41b, and an optical sensor (Z) 41c that receive light from each optical path, and an output unit. 42, the output of each of the optical sensors 41a to 41c is continuously acquired by the output unit 42 at regular time intervals corresponding to the sampling frequency determined by the method described later, and is converted into continuous data of stimulus value intensity. It has a function to convert.
  • the output of the optical sensor (Y) 41b is also used for flicker measurement.
  • the optical sensors 41a to 41c may be tristimulus value direct reading type or spectroscopic type (in the case of spectroscopic type, the number of optical sensors depends on the number of acquired wavelengths).
  • the converted stimulus values include, for example, luminance, chromaticity (xy), and tristimulus values represented by XYZ. Filtering may be performed to remove noise in the continuous data conversion of stimulus values. For example, moving average processing that utilizes data before and after may be applied.
  • the output unit 42 includes three current integration circuits, one for each of the three optical sensors 41a to 41c, and a total of three current integration circuits, as in the optical measurement device 100 shown in FIG. A total of three A/D converters are provided in the rear stages of the circuit, one for each.
  • the output unit 42 acquires data of the respective photosensors 41a to 41c by an integration method in a current integration circuit. Since the integral method has excellent S/N, it is possible to improve the measurement accuracy.
  • an anti-aliasing filter cannot be provided in the preceding stage of the A/D converter, and the present embodiment does not have an anti-aliasing filter. Therefore, there is a problem that an error occurs in flicker measurement (waveform measurement).
  • the integration method has the disadvantage that the data acquisition speed cannot be increased, but this is not a problem in flicker measurement applications because the human visual response is slow.
  • the frequency-of-interest setting unit 5 sets the frequency of interest, which will be described later. Since the frequency and the period are inextricably linked, the "setting of the frequency of interest” not only sets the frequency of interest itself, but also automatically sets the frequency of interest corresponding to the period of interest by setting the period of interest. Also included when set to In this embodiment, the setting is performed based on an instruction from the user via the external PC 10, but may be performed based on the user's direct input to the optical measurement device 1. FIG. Alternatively, as will be described later, an optical waveform frequency detector may be provided, and settings may be made based on the detection result of the frequency detector. The setting of the frequency of interest based on the detection result of the frequency detection unit will also be described later.
  • the sampling frequency determination unit 6 determines the sampling frequency for the stimulus value acquisition unit 4 to acquire the outputs of the optical sensors 41a to 41c. Note that "determining the sampling frequency” includes not only the determination of the sampling frequency itself, but also the case where the sampling frequency is automatically determined by determining the sampling period.
  • the flicker value derivation unit 7 measures flicker by a method described later using the data output from the optical sensor (Y) 41b and acquired by the output unit 42.
  • TCSF temporary contrast sensitivity function: temporal contrast sensitivity function
  • flicker derivation unit 72 for deriving a flicker value by convolving the TCSF.
  • the operation unit 11 allows the user to input data and perform other operations on the optical measurement device 1 via the PC 10 .
  • the display unit 14 displays the optical waveform obtained by the output unit 42, the flicker value derived by the flicker value deriving unit 7, and the like via the PC 10.
  • the processing for setting the frequency of interest by the frequency-of-interest setting unit 5 and the processing for determining the sampling frequency by the sampling frequency determination unit 6 are performed by the processor mounted on the display light measurement device 1 according to an operation program stored in a storage unit (not shown). It is executed by ⁇ Set target frequency>
  • optical waveform measurement of a display operating under the drive condition of a vertical synchronization signal (Vsync) frequency of 15 Hz will be described as an example.
  • Light emission control is hybrid control of pulse width modulation and amplitude modulation, and the pulse number of pulse width modulation is set to 16.
  • the control signal is shown in FIG. 2(A), and its enlarged view is shown in FIG. 2(B).
  • the frequency-of-interest setting unit 5 sets a frequency that causes an error in flicker measurement as a frequency of interest.
  • the frequency of interest is set by connecting the optical measurement device 1 and the PC 10, and the user writes and sets the frequency via the PC 10. However, the user writes directly to the optical measurement device 1 to set the frequency. But it's okay.
  • the Vsync frequency is selected in the case of conventional luminance measurement, but it is also possible to select a different frequency in this embodiment. In flicker measurement, it is preferable to select a frequency at which the amount of light intensity variation (amplitude) is maximized.
  • the sampling frequency determination unit 6 determines the sampling frequency to be a natural number multiple of the frequency of interest, and the output unit 42 acquires the intensity corresponding to the stimulus value at regular time intervals corresponding to the determined sampling frequency. do.
  • a usable upper limit may be set for the sampling frequency and derived according to the following formula (1). This makes it possible to select the fastest sampling frequency on the condition that the S/N is ensured.
  • the upper limit frequency is set to 2.9 kHz because an unnecessary increase in speed leads to a decrease in the amount of incident light and an increase in circuit noise, which deteriorates the S/N ratio.
  • the magnification (oversampling amount) was 12 times and the sampling frequency was 2880 Hz.
  • the determination of the sampling frequency is not limited to the above.
  • the sampling frequency may be selected by the user from among the magnifications that are equal to or lower than the upper limit frequency.
  • the user may simply specify the magnification.
  • ⁇ Derivation of flicker value> Derivation of the flicker value by the flicker value derivation unit 7 is performed by applying a conventional method. For example, the flicker value is derived according to IEC standard "62341-6-3".
  • the flicker derivation unit 72 convolves the visibility characteristic TCSF (shown in FIG. 4) stored in the visibility storage unit 71 with respect to the obtained continuous stimulus values, thereby obtaining the time response of the eye. is derived, and the flicker index is derived from the stimulus value, and is processed according to the following flow. i.e. (1) Continuous acquisition of stimulus values of a luminous display. (2) Perform discrete Fourier transform (DFT) processing on the obtained data to convert it into a frequency spectrum. (3) The obtained frequency spectrum is convoluted with the TCSF to superimpose the eye characteristics. (4) Inverse Fourier transform (iDFT) processing is performed to generate TCSF-convolved stimulus values.
  • DFT discrete Fourier transform
  • iDFT Inverse Fourier transform
  • the light emission waveform is composed of a component with a Vsync frequency of 15 Hz as a fundamental frequency, a component with a pulse width modulated pulse of 240 Hz as a fundamental frequency, and harmonics thereof.
  • the amplitude is pulse width modulated at 240Hz and its harmonics grow.
  • the aliasing noise is 240 Hz (originally 2640 Hz, 3120 Hz components), 480 Hz (2400 Hz, 3360 Hz), 240 ⁇ n Hz in descending order of frequency. ... occurs.
  • the noise with the lowest frequency is 240 Hz, it is possible to avoid the occurrence of noise components in the eye response band below 55 Hz. Therefore, it is possible to ensure measurement accuracy in flicker measurement.
  • FIG. 5 is a block diagram showing a second embodiment of the invention.
  • This embodiment shows a display optical metrology system comprising a metrology head 20 and a data processor 30 .
  • the measurement head 20 is provided with a stimulus value acquisition unit 4 that continuously acquires the intensity corresponding to the stimulus value at a predetermined sampling frequency, while the sampling frequency is determined and the flicker value is derived. , and the sampling frequency determined by the data processing device 30 is transmitted to the measurement head 20 .
  • the measurement head 20 is equipped with a light collecting section 2, an optical path branching section 3, and a stimulus value acquisition section 4.
  • the configurations of the light collecting unit 2, the optical path branching unit 3, and the stimulus value acquiring unit 4 are the same as those of the light collecting unit 2, the optical path branching unit 3, and the stimulus value acquiring unit 4 in the light measuring device 1 shown in FIG. .
  • the data processing device 30 includes a frequency-of-interest setting unit 5, a sampling frequency determination unit 6, and a flicker value derivation unit 7.
  • the configuration of the frequency of interest setting unit 5, the sampling frequency determination unit 6, and the flicker value derivation unit 7 is the configuration of the frequency of interest setting unit 5, the sampling frequency determination unit 6, and the flicker value derivation unit 7 in the light measurement device 1 shown in FIG. is the same as
  • the measurement head 20 and the data processing device 30 can communicate with each other via communication means (not shown).
  • the sampling frequency determined by the sampling frequency determination unit 6 is transmitted to the measurement head 20 .
  • the output unit 42 of the measurement head 20 continuously acquires the intensity corresponding to the stimulus value at the transmitted sampling frequency.
  • the measurement head 20 transmits at least the data from the optical sensor (Y) acquired by the output unit 42 to the data processing device 30, and the flicker value deriving unit 7 of the data processing device 30 uses the received data to calculate the flicker value. to derive
  • the setting of the frequency of interest, the determination of the sampling frequency, the derivation of the flicker value, etc. are performed by the same method as in the first embodiment.
  • the setting of the frequency of interest, the determination of the sampling frequency, the derivation of the flicker value, etc. by the data processing device 30 are executed by the processor of the data processing device 30 operating according to an operation program stored in a storage unit (not shown).
  • FIG. 6 is a block diagram showing a third embodiment of the invention. This embodiment also shows a display optical metrology system comprising a metrology head 20 and a data processor 30 . Compared to the second embodiment shown in FIG. 5, the configuration of the flicker value deriving unit 7 provided in the data processing device 30 is different, and a flicker value measurement method utilizing a digital filter is employed. Since the configuration other than the flicker value derivation unit 7 is the same as that of the embodiment shown in FIG. 5, detailed description thereof will be omitted.
  • the flicker derivation unit 7 includes a response storage unit 73 , a digital filter processing unit 74 and a flicker derivation unit 72 .
  • the digital filter processing unit 74 performs digital filtering on the continuous data of the stimulus value intensity acquired by the output unit 42 of the measurement head 20 using the impulse response characteristics stored in the response storage unit 73 to obtain a visual stimulus response. generates data on which is superimposed. Using this data, the flicker derivation unit 72 derives a flicker value. Since the superimposed stimulus value data obtained by digital processing has no waveform distortion and has a highly visible waveform, the dynamic analysis accuracy of flicker is improved, and good flicker measurement can be performed.
  • FIG. 7 is a block diagram showing a fourth embodiment of the invention.
  • the optical measurement device 1 is configured as a stimulus value direct-reading luminance measurement device.
  • the optical measurement device 1 includes a stimulus value acquisition unit 4, a target frequency setting unit 5, a sampling frequency determination unit 6, and a flicker value derivation unit 7 in one device.
  • the stimulus value acquisition unit 4 includes an optical sensor 43 that receives light from the display, and an output unit 44 that continuously acquires the output of the optical sensor 43 at regular time intervals corresponding to the determined sampling frequency.
  • an optical sensor 43 that receives light from the display
  • an output unit 44 that continuously acquires the output of the optical sensor 43 at regular time intervals corresponding to the determined sampling frequency.
  • LPF low-pass filter
  • the frequency-of-interest setting unit 5 sets the frequency of interest.
  • the frequency detection unit 51 is provided, and the frequency detected by the frequency detection unit 51 is set as the frequency of interest.
  • the setting of the frequency of interest and the determination of the sampling frequency by the sampling frequency determination unit 6 will be described later.
  • the flicker value derivation unit 7 has a response storage unit 73, a digital filter processing unit 74, and a flicker derivation unit 72, and performs flicker value measurement using a digital filter as in the third embodiment shown in FIG. conduct.
  • ⁇ Set target frequency> Next, setting of the frequency of interest in the fourth embodiment will be described.
  • pre-photometry is performed before main photometry, and the frequency detection unit 51 performs frequency spectrum analysis on the data obtained by pre-photometry, extracts frequencies with large amplitude intensity, and sets them as frequencies of interest. do.
  • detection of the frequency of interest by the frequency detection unit 51 is not limited to this method.
  • the fluctuation period (frequency) may be obtained directly by waveform analysis such as autocorrelation method instead of spectrum analysis.
  • 240 Hz which has the maximum amplitude, is detected and set as the frequency of interest.
  • the sampling frequency was determined in the speed priority mode by the following formula (2).
  • the lower limit frequency is set to 3 kHz.
  • the magnification (oversampling amount) was 12.5 times and the sampling frequency was 3 kHz.
  • Sampling frequency frequency of interest/2
  • x (natural number) Frequency of interest ⁇ Roundup (lower limit frequency/frequency of interest) Equation (2) ⁇ Effects of the Fourth Embodiment>
  • the aliasing noise is 120Hz (original 2880Hz, 3120Hz components), 240Hz (5760Hz, 6240Hz), 120 ⁇ nHz...
  • derivation of the flicker value by the flicker value derivation unit 7 may be performed by the JEITA method.
  • optical measurement device 1 and the optical measurement system may be those capable of obtaining both static characteristics and dynamic characteristics, or may be so-called flicker measurement dedicated machines that are specialized only for obtaining dynamic characteristics.
  • the photometry method of the two-dimensional sensor corresponds to the integration method in principle, it has a high affinity with the present invention.
  • This invention can be used for measuring light from a display, etc.

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PCT/JP2023/002447 2022-02-07 2023-01-26 ディスプレイ光計測装置及び光計測方法、データ処理装置並びにプログラム Ceased WO2023149337A1 (ja)

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KR1020247023433A KR20240118866A (ko) 2022-02-07 2023-01-26 디스플레이 광 계측 장치 및 광 계측 방법, 데이터 처리 장치 그리고 프로그램
CN202380020002.4A CN118647845A (zh) 2022-02-07 2023-01-26 显示器光测量装置及光测量方法、数据处理装置和程序

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WO2006095743A1 (ja) * 2005-03-11 2006-09-14 Sharp Kabushiki Kaisha 表示装置、液晶モニター、液晶テレビジョン受像機および表示方法
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