WO2023077725A1 - Inclined plane detection device packaging structure and manufacturing method therefor - Google Patents

Inclined plane detection device packaging structure and manufacturing method therefor Download PDF

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Publication number
WO2023077725A1
WO2023077725A1 PCT/CN2022/086477 CN2022086477W WO2023077725A1 WO 2023077725 A1 WO2023077725 A1 WO 2023077725A1 CN 2022086477 W CN2022086477 W CN 2022086477W WO 2023077725 A1 WO2023077725 A1 WO 2023077725A1
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WIPO (PCT)
Prior art keywords
metal
metal base
conductive layer
functional block
insulating substrate
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PCT/CN2022/086477
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French (fr)
Chinese (zh)
Inventor
闫志超
黄小辉
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至芯半导体(杭州)有限公司
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Publication of WO2023077725A1 publication Critical patent/WO2023077725A1/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/0203Containers; Encapsulations, e.g. encapsulation of photodiodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/02002Arrangements for conducting electric current to or from the device in operations
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/02002Arrangements for conducting electric current to or from the device in operations
    • H01L31/02005Arrangements for conducting electric current to or from the device in operations for device characterised by at least one potential jump barrier or surface barrier
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Definitions

  • the invention belongs to the field of semiconductor detection and relates to a semiconductor device packaging technology, in particular to a slope detection device packaging structure and a manufacturing method thereof.
  • Semiconductor detection is a commonly used detection technology in industrial production.
  • ultraviolet light-emitting diodes are widely used in fields such as disinfection and sterilization, optical signal transmission, and industrial manufacturing.
  • the existing packaging structure of detection devices generally adopts a planar packaging structure, that is, the detection device (such as a diode chip) is designed in parallel with the metal base, and is arranged perpendicular to or at an angle to the received light.
  • the detection device (such as a diode chip) only Part of the light can be received, which has a great impact on the detection accuracy of the detector.
  • the existing detection device packaging structure is more difficult to design when it is applied to the application structure such as miniaturization and integration. greater impact.
  • the purpose of the present invention is to provide a packaging structure for inclined-plane detection devices, which can directly detect inclined-plane structures, so as to solve the problem of poor performance of detection devices in the above-mentioned prior art and the impact on detection accuracy of detection devices due to low radiation flux acceptance rate. The problem.
  • the present invention provides the following scheme:
  • the present invention provides a package structure of an inclined plane detection device, comprising:
  • An insulating functional module includes an insulating substrate, and the insulating substrate is arranged obliquely on the metal base; the side of the insulating substrate facing the metal base is provided with a conductive layer on the back, and the insulating substrate is provided with a back conductive layer.
  • a front conductive layer is provided on a side away from the metal base, and the front conductive layer is electrically connected to the back conductive layer;
  • a detector chip the detector chip is arranged on the side of the insulating substrate away from the metal base, and is electrically connected to the front conductive layer to form a slope detection end;
  • a first metal conduction column one end of the first metal conduction column passes through the metal base, and is electrically connected to the back conductive layer, and the other end of the first metal conduction column is used to connect to a circuit board; Insulation is provided between the metal base and the first metal conducting column;
  • a metal cap tube the metal cap tube is buckled upside down on the metal base, so that the insulating functional module and the detector chip are packaged between the metal cap tube and the metal base; the metal cap The tube is provided with an obliquely arranged signal receiving window, the signal receiving window, the detector chip and the slope to be measured are parallel to each other, and the detector chip can receive all the incoming signals from the signal receiving window. Radiant flux.
  • the insulating substrate is a ceramic substrate; the upper surface of the metal base is provided with a metal base fixing groove for inserting the ceramic substrate, and the bottom of the ceramic substrate is provided for fixing the groove with the metal base Solder the bottom metal layer.
  • the bottom metal layer, the front conductive layer and/or the back conductive layer are electroplated copper layers.
  • a via hole is opened on the insulating substrate, and a second metal conduction column is penetrated in the via hole, and the two ends of the second metal conduction column are respectively connected to the front conductive layer, the The conductive layer on the back is electrically connected.
  • the metal base is provided with a through hole of the metal base, and an insulating column with a hole in the metal base is arranged in the through hole of the metal base, and an insulating column with a hole in the metal base is provided with a hole for the first metal conductor.
  • the metal base through which the post passes through has a hole insulated post through hole.
  • the first metal conducting column is fixedly connected to the insulating column with holes in the metal base through holes. For example by bonding.
  • the front conductive layer includes a first front conductive functional block and a second front conductive functional block arranged in isolation, and the first front conductive functional block and the second front conductive functional block pass through
  • the detector chip is electrically connected to form an inclined plane conduction circuit
  • the back conductive layer includes a first back conductive functional block and a second rear conductive functional block arranged in isolation, and the first back conductive functional block and the second rear conductive functional block are provided with a back surface.
  • the conductive functional block fixing groove, any one of the conductive functional block fixing grooves on the back is inserted with the first metal conduction column;
  • the metal vias are electrically connected.
  • any one of the first metal vias is set perpendicular to the metal base; the top of any one of the first metal vias is set as an inclined end surface parallel to the insulating substrate, and the The bottom of the fixing groove of the conductive functional block on the back is parallel to the inclined end surface.
  • the detector chip is a diode chip; the detector chip is arranged parallel to the insulating substrate.
  • the front conductive layer and the back conductive layer are respectively provided on both sides of the insulating substrate, the two sides of the insulating substrate are parallel to each other, and are arranged obliquely relative to the metal base; at least the insulating substrate
  • the bottom surface of the insulating substrate is set parallel to the horizontal plane of the metal base, and the top surface of the insulating substrate can be set parallel to the bottom surface, or not.
  • the bottom surface of the insulating substrate is connected to the bottom ends of the two sides, and the bottom surface of the insulating substrate is set at an angle with the two sides, and the angle is consistent with the inclination angle of the inclined surface to be measured, so as to ensure that the fronts arranged on the two sides conduct electricity.
  • layer and the conductive layer on the back are parallel to the slope to be tested.
  • a section of the insulating substrate cut perpendicular to its side is a parallelogram section.
  • the bottom of the insulating substrate can form a plane butt joint with the fixing groove of the metal base, and the installation is more reliable.
  • the bottom metal layer (planar layer) is provided on the bottom of the insulating substrate, so that the insulating substrate is welded to the fixing groove of the metal base.
  • the top of the metal cap tube is provided with an oblique plane parallel to the detector chip, and the signal receiving window is set on the oblique plane; the signal receiving window is provided with a plane lens, and the A flat lens is adhered to the inner wall of the chamfered surface.
  • the inclination angles of the insulating substrate, the detector chip and the signal receiving window may be 0° to 90°.
  • the present invention proposes a method for manufacturing a packaging structure of any one of the above-mentioned inclined-plane detection devices, including:
  • the front conductive layer and the back conductive layer are respectively arranged on both sides of the insulating substrate, and the front conductive layer and the back conductive layer are electrically connected;
  • the metal cap tube is welded on the metal base to form a sealed cavity for protecting the detector chip.
  • the packaging structure of the slope detection device proposed by the present invention has a novel and reasonable structure.
  • the signal receiving window and the detector chip parallel to the slope to be measured, not only can the structure of the slope to be measured be directly detected under the condition that the performance of the detection device is good.
  • the signal receiving window is set At the top of the cap tube, it can better guarantee the application link's demand for radiation flux, improve the detection accuracy of the detector for inclined-plane structures, and thus solve the problem of poor performance of the detector and the low radiation flux reception rate in the existing technology. Problems that affect the detection accuracy of detection devices.
  • the insulating functional module to support the detector chip and related conductive components, the packaging technology of the detector chip on the slope structure is realized, and the integration and installation stability of the structure are improved, which is conducive to improving the detection accuracy of the slope structure. Solve the current problem of slope detection and data collection.
  • the insulation function module of the present invention has a three-dimensional structure as a whole.
  • it is welded and fixed with the metal base and the first metal conducting column, which can effectively improve the firmness and stability of the inclined-plane detection structure. .
  • Fig. 1 is a front view of the packaging structure of the slope detection device disclosed in the embodiment of the present invention
  • Fig. 2 is a rear view of the packaging structure of the slope detection device disclosed in the embodiment of the present invention.
  • Fig. 3 is an exploded view of the packaging structure of the slope detection device disclosed in the embodiment of the present invention.
  • Fig. 4 is a front perspective view of the metal base disclosed by the embodiment of the present invention.
  • Fig. 5 is a back view of the metal base disclosed by the embodiment of the present invention.
  • Fig. 6 is a schematic diagram of the assembly structure of the metal base, the insulating functional module and the first metal conducting column disclosed in the embodiment of the present invention
  • Fig. 7 is a schematic diagram of the front structure of the insulation function module disclosed by the embodiment of the present invention.
  • Fig. 8 is a schematic diagram of the rear structure of the insulating functional module disclosed in the embodiment of the present invention.
  • Fig. 9 is a three-dimensional structure diagram of the metal cap tube disclosed by the embodiment of the present invention.
  • Fig. 10 is an internal structure diagram of the metal cap tube disclosed by the embodiment of the present invention.
  • FIG. 11 is a schematic structural diagram of a first metal via post disclosed by an embodiment of the present invention.
  • the reference numerals are: 100, the package structure of the slope detector; 1, the metal base; 2, the through hole of the metal base; 3, the fixing groove of the metal base; 4, the insulating substrate; Bottom metal layer; 7. Conductive layer on the back; 8. Metal base with hole insulating column; 9. Slope of metal conduction column; 10. First metal conduction column; 11. Metal cap tube; 12. Signal receiving window; 13. Plane lens; 14. Detector chip; 15. Front conductive layer; 16. Via position; 17. Fixing slot for back conductive functional block; 18. Insulation functional module; 19. Back conductive functional block; 20. Metal base belt 21. The front conductive functional block; 22. The inclined inner wall of the metal cap tube; 23. The steps of the metal base.
  • One of the objectives of the present invention is to provide a packaging structure for an inclined-plane detection device, so as to meet the requirements of the detection device for inclined-plane structure detection applications and improve the detection accuracy of the detection device for inclined-plane structures.
  • Another object of the present invention is to provide a detector chip packaging technology on an inclined plane structure, which improves the detection accuracy of the inclined plane structure and solves the current difficult problem of inclined plane detection and data collection.
  • Another object of the present invention is to provide a combination method of the metal base and the insulating functional module, so as to improve the firmness and stability of the slope detection structure.
  • Another object of the present invention is to provide a combination method of the first metal conducting column and the insulating functional module, so as to improve the firmness and stability of the slope detection structure.
  • this embodiment provides a package structure 100 for an inclined-plane detection device, which mainly includes a metal base 1 , an insulating functional module 18 , a detector chip 14 , a first metal conducting column 10 and a metal cap tube 11 .
  • the insulating function module 18 includes an insulating substrate 4, and the insulating substrate 4 is arranged obliquely on the metal base 1; There is a front conductive layer 15 , and the front conductive layer 15 is electrically connected to the back conductive layer 7 .
  • the detector chip 14 is arranged on the side of the insulating substrate 4 away from the metal base, and is electrically connected to the front conductive layer 15 to form a slope detection end for detecting the slope to be measured.
  • One end of the first metal conducting post 10 runs through the metal base 1 and is electrically connected to the back conductive layer 15, and the other end of the first metal conducting post 10 is used to connect to a circuit board (the circuit board has a signal transceiver function and a circuit conduction function). function), the first metal conducting column 10 and the metal base 1 are insulated.
  • the metal cap tube 11 is turned upside down on the metal base 1 to form a sealed cavity, so that the insulating functional module 18 and the detector chip 14 are packaged inside the sealed cavity, thereby better protecting the stability of the detector chip 14;
  • the cap tube 11 is provided with a signal receiving window 12 arranged obliquely.
  • the signal receiving window 12, the detector chip 14 and the slope to be measured are parallel to each other.
  • the detector chip 14 can receive all the radiation injected by the signal receiving window 12. flux.
  • the insulating substrate 4 is preferably a ceramic substrate; the upper surface of the metal base 1 is provided with a metal base fixing groove 3 for inserting the ceramic substrate (insulating substrate 4), and the bottom of the ceramic substrate (insulating substrate 4) is provided for The bottom metal layer 6 welded with the metal base fixing groove 3.
  • the bottom metal layer 6 , the front conductive layer 15 and the back conductive layer 7 are all electroplated copper layers.
  • the relationship between the bottom metal layer 6 and the metal base 1 is fastened, and there is no electrical connection between the two.
  • a via hole 16 is opened on the insulating substrate 4, and a second metal conduction column 5 is pierced in the via hole 16.
  • the two ends of the second metal conduction column 5 are respectively electrically conductive with the front conductive layer 15 and the back Layer 7 is electrically connected.
  • the metal base 1 is provided with a metal base through hole 2
  • the metal base through hole 2 is provided with a metal base with a hole insulating column 8, and the metal base with a hole insulating column 8 is axially provided with a first metal guide.
  • the through hole 20 of the insulating post with a hole in the metal base through which the post 10 passes.
  • the metal base through hole 2 just installs the metal base band hole insulating post 8 (the outer diameter of the metal base band insulating post 8 is equal to the aperture of the metal base through hole 2, and the interference fit can be arranged between the two), and the metal base band
  • the hole insulating post 8 plays a role of fixing and insulating the first metal via post 10 .
  • the first metal conducting column 10 is fixedly connected to the through hole 20 of the insulating column with holes in the metal base. For example by bonding.
  • the front conductive layer 15 includes two front conductive functional blocks 21 (also referred to as "ceramic front electroplated copper layer functional areas") arranged in isolation, so that the front conductive layer 15 is divided into an insulating area, an insulating area, and an insulating area.
  • the aforementioned first front conductive functional block and the aforementioned second front conductive functional block are three parts, an insulating area is provided between the two front conductive functional blocks 21, and the two front conductive functional blocks 21 are arranged symmetrically, which can be connected with
  • the detector chips 14 are welded together at high temperature to form a three-dimensional beveled detector device.
  • the first front conductive functional block and the second front conductive functional block are electrically connected through the detector chip 14 to form a slope conduction circuit.
  • the two front conductive functional blocks 21 are parallel to the slope to be tested, which can form a precise detection of light on the slope to be tested.
  • the back conductive layer 7 includes two back conductive functional blocks 19 (also referred to as “ceramic back electroplated copper layer functional areas”) arranged in isolation, so that the back conductive layer 7 is integrally divided into Insulation area, the aforementioned first back conductive functional block and the aforementioned second rear front conductive functional block are three parts, an insulating area is provided between the two rear conductive functional blocks 19, and the two front conductive functional blocks 21 are symmetrical Layout; both the first back conductive functional block and the second rear conductive functional block are provided with a rear conductive functional block fixing groove 17 (also referred to as “ceramic back electroplating copper layer fixing groove”), any one of the back conductive A first metal conducting column 10 is inserted in each of the functional block fixing slots 17 (also referred to as “ceramic back electroplated copper layer fixing slots”).
  • Both the first front conductive functional block and the first rear conductive functional block, and the second front conductive functional block and the second rear conductive functional block are electrically connected through the second metal conductive column 5 .
  • the second metal conducting column 5 is preferably an electroplated through-hole metal conducting column, which can connect the electroplated copper layer functional area on the ceramic back side formed by two back conductive functional blocks 19 on the back conductive layer 7 with the front conductive layer 15.
  • the functional areas of the ceramic front electroplated copper layer formed by the upper two front conductive functional blocks 21 are interconnected (electrically connected).
  • any one of the first metal vias 10 is set perpendicular to the metal base 1; the top of any one of the first metal vias 10 is set as an inclined end surface parallel to the insulating substrate 4, that is, the metal vias
  • the inclined surface 9, the above-mentioned oblique end surface i.e. the inclined surface 9 of the metal conducting column
  • the inclination angle of the inclined end surface of the first metal conducting column 10 is the same as that of the conductive layer 7 on the back
  • the second The oblique end surface of a metal via post 10 can be welded to the back conductive layer 7 as a whole by metal solder.
  • the metal base 1 , the insulating functional module 18 and the first metal conductive column 10 form a triangular three-dimensional structure, forming a three-dimensional support structure that can firmly support the detection device with a three-dimensional slope.
  • the detector chip 14 is preferably a diode chip, more specifically, an ultraviolet light emitting diode, which can detect ultraviolet light.
  • the detector chip 14 is arranged parallel to the insulating substrate 4 .
  • the front conductive layer 15 and the back conductive layer 7 are respectively provided on both sides of the insulating substrate 4, the two sides of the insulating substrate 4 are parallel to each other, and are arranged obliquely relative to the metal base 1 in the assembled state; at least the bottom surface of the insulating substrate 4 is provided with In order to be parallel to the horizontal plane of the metal base 1 , the top surface of the insulating substrate 4 can be arranged parallel to the bottom surface, or not.
  • the bottom surface of the insulating substrate 4 is connected to the bottom ends of the two sides, and the bottom surface of the insulating substrate 4 is arranged at an angle with the two sides, and the angle is consistent with the inclination angle of the inclined surface to be measured, so as to ensure that the front conductive layer 15 arranged on the two sides and the conductive layer 7 on the back are parallel to the slope to be measured.
  • the metal base fixing groove 3 is preferably rectangular, and the size of the slot hole matches the size of the bottom metal layer 6 of the insulating substrate 4.
  • the insulating function module 18 is welded together through the bottom metal layer 6 and the metal base fixing groove 3 through silver-copper solder.
  • the insulating functional module and the metal base 1 form an integral body, specifically a three-dimensional slope structure.
  • the cross section of the insulating substrate 4 cut perpendicular to its side is a parallelogram cross section.
  • the bottom of the insulating substrate 4 can form a plane butt joint with the fixing groove 3 of the metal base, so that the installation is more reliable and the electrical conductivity is better.
  • the bottom metal layer 6 is set on the bottom of the insulating substrate 4. In the unassembled state, when the two sides of the insulating substrate 4 are in a vertical state, the bottom surface is a chamfered bottom surface, and the bottom metal layer 6 is arranged on the chamfered bottom surface, so the bottom metal layer Layer 6 may also be referred to as a "ceramic bevel electroplated copper layer".
  • the top of the metal cap tube 11 is provided with an oblique section parallel to the detector chip 14, and the signal receiving window 12 is set on the oblique section; the signal receiving window 12 is provided with a plane lens 13, and the plane lens 13 is adhered On the inner wall of the inclined plane, that is, the plane lens 13 is fixed on the inclined inner wall 22 of the metal cap tube.
  • the oblique plane is parallel to the insulating substrate 4 , so that the detector chip 14 can accurately receive the ultraviolet light irradiated through the oblique light receiving window, that is, the signal receiving window 12 .
  • the plane lens 13 can be combined with the inner wall of the signal receiving window 12 through an adhesive to form a closed cavity cap.
  • the outer ring of the metal base 1 is provided with a metal base step 23, and the metal cap tube 11 is buckled upside down on the metal base step 23.
  • metal solder By applying metal solder on the metal cap tube 11 and the metal base step 23, the The two are welded as a whole to form a highly airtight airtight cavity that can protect the long-term stability of the detector chip 14 .
  • the inclination angle ⁇ of the slope to be tested, the insulating substrate 4, the detector chip 14, and the signal receiving window 12 can be 0° to 90°.
  • the inclination angle ⁇ of the signal receiving window 12 is set to 30° ⁇ 80°, the included angle between the above-mentioned "beveled bottom surface" and the front side of the insulating substrate 4 (the side on which the detector chip 14 is installed) is the same as the setting angle of ⁇ .
  • this embodiment proposes a method for manufacturing the packaging structure of the above-mentioned slope detector device, which mainly includes the following steps:
  • Step 1 Weld the insulating substrate on the metal base;
  • Step 2 setting the front conductive layer and the back conductive layer respectively on both sides of the insulating substrate, and electrically connecting the front conductive layer and the back conductive layer;
  • Step 3 welding the detector chip on the front conductive layer of the insulating substrate
  • Step 4 welding the first metal via post 10 on the back conductive layer of the insulating substrate;
  • Step 5 welding the metal cap tube to the metal base to form a sealed cavity for protecting the detector chip.
  • the insulating substrate 4 of the insulating functional module 18 is formed by cutting a rectangular ceramic substrate.
  • the two short sides of the ceramic substrate are cut at 45 degrees, and two via holes 16 are formed on the ceramic substrate by laser drilling.
  • Electroplating fills the via hole position 16 to form the second metal via post 5, and then electroplates the copper layer on the front of the ceramic (ie, the front conductive layer 15) and the electroplated copper layer on the back of the ceramic (ie, the back conductive layer 7) on the front and back of the ceramic substrate.
  • the electroplated copper layer (i.e. front conductive layer 15) on the front side of the electroplated ceramic and the electroplated copper layer (i.e. back conductive layer 7) on the back side of the electroplated ceramic are conducted through the above-mentioned second metal conduction column 5 to form conduction between the front and back sides of the ceramic substrate.
  • the beveled surfaces of the two short sides of the ceramic substrate are inclined at 45 degrees, and the electroplated copper layer on the beveled surface at the bottom forms the bottom metal layer 6, thereby realizing the electroplating combination of three surfaces of the ceramic substrate.
  • the back conductive layer 7 preferably continues to thicken the electroplated copper layer on the back conductive layer 7 to open the back conductive functional block fixing groove 17. are equal in size.
  • the alloy metal block is processed by a machine tool into a metal base 1 with a metal base fixing groove 3 and a metal base step 23, and two metal base through holes 2 are processed in the metal base 1 by a punching machine, and the two metal bases pass through
  • the positions of the holes 2 are in one-to-one correspondence with the positions of the two rear conducting functional block fixing grooves 17 on the insulating functional module 18 .
  • the first metal via post 10 can be machined into a metal via post slope 9 with a slope of 45 degrees.
  • the fixing groove 3 is filled with metal silver copper solder, and the bottom metal layer 6 of the insulating function module 18 is put into the fixing groove 3 of the metal base, and fixed by a jig; wherein the conductive function block fixing groove 17 on the back side of the insulating function module 18 is filled with Metal silver-copper solder, the metal conduction column slope 9 of the first metal conduction column 10 passes through the metal base through hole 2, inserts the conductive functional block fixing groove 17 on the back, and is fixed by a jig; the metal base 1, the insulating function module 18 1.
  • the first metal via post 10 is fixed together by a jig, and then the three can be welded into a whole at a high temperature of 600-1000° C., that is,
  • the detector chip 14 is placed on the front conductive functional block 21 by placing the front conductive functional block 21 of the jig horizontally, and the two can be welded together by high temperature.
  • the detector chip 14 and the front conductive functional area The block 21 , the back conductive functional block 19 , and the first metal conduction column 10 form a circuit conduction loop.
  • the first metal conducting column 10 is penetrated in the through hole 20 of the insulating column with holes in the metal base 8 , and then The first metal conducting post 10 and the insulating post with holes in the metal base 8 can be bonded together by heating, and the insulating post with holes in the metal base 8 can fix and insulate the first metal conducting post 10 .
  • the metal cap tube 11 is formed by processing the metal sheet into a hat shape symmetrical to the central axis, and then cutting a gap (chamfer) on one side of the top of the cap, and further processing the signal receiving window 12 through a mold. Apply adhesive to the inclined inner wall 22 of the metal cap tube of the signal receiving window 12 to combine the plane lens 13 with the inclined inner wall 22 of the metal cap tube.
  • smear medium and low temperature metal solder on the metal base step 23 place the metal cap tube 11 on the metal base step 23 coated with low temperature metal solder on the metal base 1, and control the temperature to connect the metal base 1 and the metal cap.
  • the tubes 11 are welded together to form a sealed cavity for the detector chip 14 to protect the conduction loop of the aforementioned circuit, thereby forming a packaging structure for the inclined-plane detector, which can accurately detect the inclined-plane structure.
  • the packaging structure of the slope detector device proposed by the present invention has a novel and reasonable structure.
  • the signal receiving window and the detector chip By setting the signal receiving window and the detector chip to be parallel to the slope to be measured, not only can the slope be directly tested under the condition that the performance of the detection device is good, structure detection, so as to meet the requirements of detection devices for slope structure detection applications, and enable the detector chip to receive all the radiation flux (such as light, etc.) injected from the signal receiving window, compared with the traditional metal cap tube will
  • the signal receiving window is set on the top of the cap tube, which can better ensure the application link's demand for radiation flux, improve the detection accuracy of the detector device for inclined-plane structures, and thus solve the problem of poor performance of the detector device in the existing technology and the problem of radiation flux due to The low acceptance rate affects the detection accuracy of the detection device.
  • the insulating functional module to support the detector chip and related conductive components, the packaging technology of the detector chip on the slope structure is realized, and the integration and installation stability of the structure are improved, which is conducive to improving the detection accuracy of the slope structure. Solve the current problem of slope detection and data collection.
  • the insulation function module of the present invention has a three-dimensional structure as a whole.
  • it is welded and fixed with the metal base and the first metal conducting column, which can effectively improve the firmness and stability of the inclined-plane detection structure. .

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
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  • Measurement Of Radiation (AREA)

Abstract

Disclosed in the present invention is an inclined plane detection device packaging structure, comprising a metal base, an insulation function module, a detector chip, a first metal conduction column, and a metal cap tube. According to the present invention, a signal receiving window and a detector chip are arranged to be parallel to an inclined plane to be detected, such that said inclined plane structure can be directly detected under the condition that the performance of the detection device is good so as to meet the requirement of the detection application of the inclined plane structure on the detection device, and the detector chip can receive all radiation flux (such as light rays) incident from the signal receiving window. Compared with a traditional metal tube cap in which the signal receiving window is provided at the top of the cap tube, the requirement of an application link for the radiation flux can be better guaranteed, the detection precision of a detector for the inclined plane structure is improved, the problems that the performance of the detector is poor and the detection precision of the detector is affected due to the low radiation flux receiving rate in the prior art are solved.

Description

斜面探测器件封装结构及其制作方法Inclined surface detection device packaging structure and manufacturing method thereof 技术领域technical field
本发明属于半导体探测领域,涉及一种半导体器件封装技术,特别是涉及一种斜面探测器件封装结构及其制作方法。The invention belongs to the field of semiconductor detection and relates to a semiconductor device packaging technology, in particular to a slope detection device packaging structure and a manufacturing method thereof.
背景技术Background technique
半导体探测是目前工业生产中常用的探测技术。其中,紫外发光二极管被广泛应用于消毒杀菌、光学信号传输、工业制造等领域。Semiconductor detection is a commonly used detection technology in industrial production. Among them, ultraviolet light-emitting diodes are widely used in fields such as disinfection and sterilization, optical signal transmission, and industrial manufacturing.
目前,现有的探测器件封装结构,普遍采用平面封装结构,即探测器件(比如二极管芯片)与金属底座平行设计,与接收到的光线垂直或呈夹角设置,探测器件(比如二极管芯片)只能接收到一部分光线,对探测器件探测精度造成很大影响。而且,现有的探测器件封装结构应用在小型化、集成化等应用结构时设计难度比较大,为了适应一些倾斜面,还需要将探测器件的金属导通柱弯曲处理,对整个探测器件性能造成较大影响。At present, the existing packaging structure of detection devices generally adopts a planar packaging structure, that is, the detection device (such as a diode chip) is designed in parallel with the metal base, and is arranged perpendicular to or at an angle to the received light. The detection device (such as a diode chip) only Part of the light can be received, which has a great impact on the detection accuracy of the detector. Moreover, the existing detection device packaging structure is more difficult to design when it is applied to the application structure such as miniaturization and integration. greater impact.
因此,根据特定应用领域的探测需求,有必要提出一种能够直接对斜面(侧面)结构进行探测的斜面探测器件封装结构,以保证探测器件的探测性能和应用环节探测器件对全辐射通量(比如对光线的全部接收或接近全部接收)的需求。Therefore, according to the detection requirements of specific application fields, it is necessary to propose a package structure of slope detection devices that can directly detect slope (side) structures, so as to ensure the detection performance of the detection device and the application of the detection device to the total radiation flux ( Such as the demand for full or close to full reception of light).
发明内容Contents of the invention
本发明的目的是提供一种斜面探测器件封装结构,其能够直接对斜面结构进行探测,以解决上述现有技术存在的探测器件性能较差以及由于辐射通量接收率低而影响探测器件探测精度的问题。The purpose of the present invention is to provide a packaging structure for inclined-plane detection devices, which can directly detect inclined-plane structures, so as to solve the problem of poor performance of detection devices in the above-mentioned prior art and the impact on detection accuracy of detection devices due to low radiation flux acceptance rate. The problem.
为实现上述目的,本发明提供了如下方案:To achieve the above object, the present invention provides the following scheme:
本发明提供一种斜面探测器件封装结构,包括:The present invention provides a package structure of an inclined plane detection device, comprising:
金属底座;metal base;
绝缘功能模块,所述绝缘功能模块包括绝缘基板,所述绝缘基板倾斜设置于所述金属底座上;所述绝缘基板的朝向所述金属底座的一侧设置有背面导电层,所述绝缘基板的背离所述金属底座的一侧设置有正面导电层,所述正面导电层与所述背面导电层电连接;An insulating functional module, the insulating functional module includes an insulating substrate, and the insulating substrate is arranged obliquely on the metal base; the side of the insulating substrate facing the metal base is provided with a conductive layer on the back, and the insulating substrate is provided with a back conductive layer. A front conductive layer is provided on a side away from the metal base, and the front conductive layer is electrically connected to the back conductive layer;
探测器芯片,所述探测器芯片设置于所述绝缘基板的背离所述金属底座的一侧,并与所述正面导电层电连接,形成斜面探测端;A detector chip, the detector chip is arranged on the side of the insulating substrate away from the metal base, and is electrically connected to the front conductive layer to form a slope detection end;
第一金属导通柱,所述第一金属导通柱的一端贯穿所述金属底座,并与所述背面导电层电连接,所述第一金属导通柱的另一端用于连接线路板;所述金属底座与所述第一金属导通柱之间绝缘设置;A first metal conduction column, one end of the first metal conduction column passes through the metal base, and is electrically connected to the back conductive layer, and the other end of the first metal conduction column is used to connect to a circuit board; Insulation is provided between the metal base and the first metal conducting column;
金属帽管,所述金属帽管倒扣于所述金属底座上,以将所述绝缘功能模块和所述探测器芯片封装于所述金属帽管和所述金属底座之间;所述金属帽管上设置有倾斜布置的信号接收窗口,所述信号接收窗口、所述探测器芯片以及待测斜面之间两两相互平行,所述探测器芯片能够接收由所述信号接收窗口射入的全部辐射通量。A metal cap tube, the metal cap tube is buckled upside down on the metal base, so that the insulating functional module and the detector chip are packaged between the metal cap tube and the metal base; the metal cap The tube is provided with an obliquely arranged signal receiving window, the signal receiving window, the detector chip and the slope to be measured are parallel to each other, and the detector chip can receive all the incoming signals from the signal receiving window. Radiant flux.
可选的,所述绝缘基板为陶瓷基板;所述金属底座的上表面开设有用于所述陶瓷基板插接的金属底座固定槽,所述陶瓷基板的底部设置用于与所述金属底座固定槽焊接的底部金属层。Optionally, the insulating substrate is a ceramic substrate; the upper surface of the metal base is provided with a metal base fixing groove for inserting the ceramic substrate, and the bottom of the ceramic substrate is provided for fixing the groove with the metal base Solder the bottom metal layer.
可选的,所述底部金属层、所述正面导电层和/或所述背面导电层为电镀铜层。Optionally, the bottom metal layer, the front conductive layer and/or the back conductive layer are electroplated copper layers.
可选的,所述绝缘基板上开设有过孔位,所述过孔位内穿设第二金属导通柱,所述第二金属导通柱的两端分别与所述正面导电层、所述背面导电层电连接。Optionally, a via hole is opened on the insulating substrate, and a second metal conduction column is penetrated in the via hole, and the two ends of the second metal conduction column are respectively connected to the front conductive layer, the The conductive layer on the back is electrically connected.
可选的,所述金属底座上开设有金属底座通孔,所述金属底座通孔内设置有金属底座带孔绝缘柱,所述金属底座带孔绝缘柱上开设有供所述第一金属导通柱穿过的金属底座带孔绝缘柱通孔。Optionally, the metal base is provided with a through hole of the metal base, and an insulating column with a hole in the metal base is arranged in the through hole of the metal base, and an insulating column with a hole in the metal base is provided with a hole for the first metal conductor. The metal base through which the post passes through has a hole insulated post through hole.
可选的,所述第一金属导通柱与所述金属底座带孔绝缘柱通孔固定连接。比如通过粘接的方式。Optionally, the first metal conducting column is fixedly connected to the insulating column with holes in the metal base through holes. For example by bonding.
可选的,所述正面导电层包括间隔绝缘布置的第一正面导电功能区块和第二正面导电功能区块,所述第一正面导电功能区块和所述第二正面导电功能区块通过所述探测器芯片电连接形成斜面导通电路;Optionally, the front conductive layer includes a first front conductive functional block and a second front conductive functional block arranged in isolation, and the first front conductive functional block and the second front conductive functional block pass through The detector chip is electrically connected to form an inclined plane conduction circuit;
所述背面导电层包括间隔绝缘布置的第一背面导电功能区块和第二背面导电功能区块,所述第一背面导电功能区块和所述第二背面导电功能区块上均开设有背面导电功能区块固定槽,任意一所述背面导电功能区块固定槽内均插设一所述第一金属导通柱;The back conductive layer includes a first back conductive functional block and a second rear conductive functional block arranged in isolation, and the first back conductive functional block and the second rear conductive functional block are provided with a back surface. The conductive functional block fixing groove, any one of the conductive functional block fixing grooves on the back is inserted with the first metal conduction column;
所述第一正面导电功能区块与所述第一背面导电功能区块之间,以及所述第二正面导电功能区块与所述第二背面导电功能区块之间均通过所述第二金属导通柱电连接。Between the first front conductive functional block and the first rear conductive functional block, and between the second front conductive functional block and the second rear conductive functional block are all passed through the second The metal vias are electrically connected.
可选的,任意一所述第一金属导通柱均垂直于所述金属底座设置;任意一所述第一金属导通柱的顶端均设置为与所述绝缘基板平行的斜端面,所述背面导电功能区块固定槽的槽底平行于所述斜端面。Optionally, any one of the first metal vias is set perpendicular to the metal base; the top of any one of the first metal vias is set as an inclined end surface parallel to the insulating substrate, and the The bottom of the fixing groove of the conductive functional block on the back is parallel to the inclined end surface.
可选的,所述探测器芯片为二极管芯片;所述探测器芯片平行于所述绝缘基板设置。Optionally, the detector chip is a diode chip; the detector chip is arranged parallel to the insulating substrate.
可选的,所述绝缘基板的两侧面分别设置所述正面导电层和所述背面导电层,所述绝缘基板的两侧面相互平行,且均相对所述金属底座倾斜布置;至少所述绝缘基板的底面设置为平行于所述金属底座的水平面,所述绝缘基板的顶面可与该底面平行设置,也可不平行设置。所述绝缘基板的底面连接两侧面的底端,所述绝缘基板的底面与两侧面之间呈夹角设置,该夹角与待测斜面的倾斜角度一致,以确保设置于两侧面的正面导电层和背面导电层均平行于待测斜面。Optionally, the front conductive layer and the back conductive layer are respectively provided on both sides of the insulating substrate, the two sides of the insulating substrate are parallel to each other, and are arranged obliquely relative to the metal base; at least the insulating substrate The bottom surface of the insulating substrate is set parallel to the horizontal plane of the metal base, and the top surface of the insulating substrate can be set parallel to the bottom surface, or not. The bottom surface of the insulating substrate is connected to the bottom ends of the two sides, and the bottom surface of the insulating substrate is set at an angle with the two sides, and the angle is consistent with the inclination angle of the inclined surface to be measured, so as to ensure that the fronts arranged on the two sides conduct electricity. layer and the conductive layer on the back are parallel to the slope to be tested.
可选的,所述绝缘基板的沿垂直于其侧面所切得的截面为平行四边形截面。所述绝缘基板的底部能够与所述金属底座固定槽形成平面对接,安装更加牢靠。所述绝缘基板的底部设置所述底部金属层(平面层),以便绝缘基板与所述金属底座固定槽焊接。Optionally, a section of the insulating substrate cut perpendicular to its side is a parallelogram section. The bottom of the insulating substrate can form a plane butt joint with the fixing groove of the metal base, and the installation is more reliable. The bottom metal layer (planar layer) is provided on the bottom of the insulating substrate, so that the insulating substrate is welded to the fixing groove of the metal base.
可选的,所述金属帽管的顶部设置有与所述探测器芯片平行的斜切面,所述信号接收窗口开设于所述斜切面上;所述信号接收窗口上配置有平面透镜,所述平面透镜粘附于所述斜切面的内壁。Optionally, the top of the metal cap tube is provided with an oblique plane parallel to the detector chip, and the signal receiving window is set on the oblique plane; the signal receiving window is provided with a plane lens, and the A flat lens is adhered to the inner wall of the chamfered surface.
可选的,所述绝缘基板、所述探测器芯片以及所述信号接收窗口的倾斜角度可为0~90°。Optionally, the inclination angles of the insulating substrate, the detector chip and the signal receiving window may be 0° to 90°.
同时,本发明提出一种上述任意一所述斜面探测器件封装结构的制作方法,包括:At the same time, the present invention proposes a method for manufacturing a packaging structure of any one of the above-mentioned inclined-plane detection devices, including:
在所述金属底座上焊接所述绝缘基板;welding the insulating substrate on the metal base;
在所述绝缘基板的两侧分别设置所述正面导电层和所述背面导电层,并将所述正面导电层和所述背面导电层电连接;The front conductive layer and the back conductive layer are respectively arranged on both sides of the insulating substrate, and the front conductive layer and the back conductive layer are electrically connected;
在所述绝缘基板的所述正面导电层焊接所述探测器芯片;Welding the detector chip on the front conductive layer of the insulating substrate;
在所述绝缘基板的所述背面导电层焊接所述第一金属导通柱;Welding the first metal via column on the back conductive layer of the insulating substrate;
将所述金属帽管焊接于所述金属底座上,以形成对所述探测器芯片进行保护的密闭腔体。The metal cap tube is welded on the metal base to form a sealed cavity for protecting the detector chip.
本发明相对于现有技术取得了以下技术效果:Compared with the prior art, the present invention has achieved the following technical effects:
本发明提出的斜面探测器件封装结构,结构新颖合理,通过将信号接收窗口、探测器芯片均设置为与待测斜面平行,不仅能够在探测器件性能良好的状况下直接对待测斜面结构进行探测,藉以满足斜面结构探测应用对探测器件的需求,而且能够使探测器芯片接收到由信号接收窗口射入的全部辐射通量(比如光线等),相较于传统的金属帽管将信号接收窗口设置于帽管顶部,能够更好地保证应用环节对辐射通量的需求,提升探测器件对斜面结构的探测精度,进而解决现有技术存在的探测器件性能较差以及由于辐射通量接收率低而影响探测器件探测精度的问题。The packaging structure of the slope detection device proposed by the present invention has a novel and reasonable structure. By setting the signal receiving window and the detector chip parallel to the slope to be measured, not only can the structure of the slope to be measured be directly detected under the condition that the performance of the detection device is good, In order to meet the requirements of the detection device for the application of slope structure detection, and to enable the detector chip to receive all the radiation flux (such as light, etc.) injected by the signal receiving window, compared with the traditional metal cap tube, the signal receiving window is set At the top of the cap tube, it can better guarantee the application link's demand for radiation flux, improve the detection accuracy of the detector for inclined-plane structures, and thus solve the problem of poor performance of the detector and the low radiation flux reception rate in the existing technology. Problems that affect the detection accuracy of detection devices.
此外,通过设置绝缘功能模块支撑探测器芯片以及相关导电组件,实现了探测器芯片在斜面结构的封装技术,提高了结构的集成性和安装稳定性,从而有利于提高对斜面结构探测的精度,解决目前斜面探测采集数据的难题。In addition, by setting the insulating functional module to support the detector chip and related conductive components, the packaging technology of the detector chip on the slope structure is realized, and the integration and installation stability of the structure are improved, which is conducive to improving the detection accuracy of the slope structure. Solve the current problem of slope detection and data collection.
本发明的绝缘功能模块整体呈立体结构,在提出的斜面探测器件封装结构制作方法中,将其与金属底座和第一金属导通柱均焊接固定,可有效提高斜面探测结构的牢固、稳定性。The insulation function module of the present invention has a three-dimensional structure as a whole. In the proposed manufacturing method of the packaging structure of the inclined-plane detection device, it is welded and fixed with the metal base and the first metal conducting column, which can effectively improve the firmness and stability of the inclined-plane detection structure. .
附图说明Description of drawings
为了更清楚地说明本发明实施例或现有技术中的技术方案,下面将对实施例中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本发明的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the accompanying drawings required in the embodiments. Obviously, the accompanying drawings in the following description are only some of the present invention. Embodiments, for those of ordinary skill in the art, other drawings can also be obtained based on these drawings without any creative effort.
图1为本发明实施例所公开的斜面探测器件封装结构的主视图;Fig. 1 is a front view of the packaging structure of the slope detection device disclosed in the embodiment of the present invention;
图2为本发明实施例所公开的斜面探测器件封装结构的后视图;Fig. 2 is a rear view of the packaging structure of the slope detection device disclosed in the embodiment of the present invention;
图3为本发明实施例所公开的斜面探测器件封装结构的爆炸图;Fig. 3 is an exploded view of the packaging structure of the slope detection device disclosed in the embodiment of the present invention;
图4为本发明实施例所公开的金属底座的正面立体图;Fig. 4 is a front perspective view of the metal base disclosed by the embodiment of the present invention;
图5为本发明实施例所公开的金属底座的背面图;Fig. 5 is a back view of the metal base disclosed by the embodiment of the present invention;
图6为本发明实施例所公开的金属底座、绝缘功能模块及第一金属导 通柱的组装结构示意图;Fig. 6 is a schematic diagram of the assembly structure of the metal base, the insulating functional module and the first metal conducting column disclosed in the embodiment of the present invention;
图7为本发明实施例所公开的绝缘功能模块的正面结构示意图;Fig. 7 is a schematic diagram of the front structure of the insulation function module disclosed by the embodiment of the present invention;
图8为本发明实施例所公开的绝缘功能模块的背面结构示意图;Fig. 8 is a schematic diagram of the rear structure of the insulating functional module disclosed in the embodiment of the present invention;
图9为本发明实施例所公开的金属帽管的立体结构图;Fig. 9 is a three-dimensional structure diagram of the metal cap tube disclosed by the embodiment of the present invention;
图10为本发明实施例所公开的金属帽管的内部结构图;Fig. 10 is an internal structure diagram of the metal cap tube disclosed by the embodiment of the present invention;
图11为本发明实施例所公开的第一金属导通柱的结构示意图。FIG. 11 is a schematic structural diagram of a first metal via post disclosed by an embodiment of the present invention.
其中,附图标记为:100、斜面探测器件封装结构;1、金属底座;2、金属底座通孔;3、金属底座固定槽;4、绝缘基板;5、第二金属导通柱;6、底部金属层;7、背面导电层;8、金属底座带孔绝缘柱;9、金属导通柱斜面;10、第一金属导通柱;11、金属帽管;12、信号接收窗口;13、平面透镜;14、探测器芯片;15、正面导电层;16、过孔位;17、背面导电功能区块固定槽;18、绝缘功能模块;19、背面导电功能区块;20、金属底座带孔绝缘柱通孔;21、正面导电功能区块;22、金属帽管斜面内壁;23、金属底座台阶。Wherein, the reference numerals are: 100, the package structure of the slope detector; 1, the metal base; 2, the through hole of the metal base; 3, the fixing groove of the metal base; 4, the insulating substrate; Bottom metal layer; 7. Conductive layer on the back; 8. Metal base with hole insulating column; 9. Slope of metal conduction column; 10. First metal conduction column; 11. Metal cap tube; 12. Signal receiving window; 13. Plane lens; 14. Detector chip; 15. Front conductive layer; 16. Via position; 17. Fixing slot for back conductive functional block; 18. Insulation functional module; 19. Back conductive functional block; 20. Metal base belt 21. The front conductive functional block; 22. The inclined inner wall of the metal cap tube; 23. The steps of the metal base.
具体实施方式Detailed ways
下面将结合本发明实施例中的附图,对本发明实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例仅仅是本发明一部分实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本发明保护的范围。The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
本发明的目的之一在于提供一种斜面探测器件封装结构,藉以满足斜面结构探测应用对探测器件的需求,提升探测器件对斜面结构的探测精度。One of the objectives of the present invention is to provide a packaging structure for an inclined-plane detection device, so as to meet the requirements of the detection device for inclined-plane structure detection applications and improve the detection accuracy of the detection device for inclined-plane structures.
本发明的另一目的在于提供一种探测器芯片在斜面结构封装技术,提高对斜面结构探测的精度,解决目前斜面探测采集数据的难题。Another object of the present invention is to provide a detector chip packaging technology on an inclined plane structure, which improves the detection accuracy of the inclined plane structure and solves the current difficult problem of inclined plane detection and data collection.
本发明的再一目的在于提供一种金属底座与绝缘功能模块的结合方式,以提高斜面探测结构的牢固、稳定性。Another object of the present invention is to provide a combination method of the metal base and the insulating functional module, so as to improve the firmness and stability of the slope detection structure.
本发明的又一目的在于提供一种第一金属导通柱与绝缘功能模块的结合方式,以提高斜面探测结构的牢固、稳定性。Another object of the present invention is to provide a combination method of the first metal conducting column and the insulating functional module, so as to improve the firmness and stability of the slope detection structure.
为使本发明的上述目的、特征和优点能够更加明显易懂,下面结合附 图和具体实施方式对本发明作进一步详细的说明。In order to make the above objects, features and advantages of the present invention more obvious and comprehensible, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.
实施例一Embodiment one
如图1~图11所示,本实施例提供一种斜面探测器件封装结构100,主要包括金属底座1、绝缘功能模块18、探测器芯片14、第一金属导通柱10和金属帽管11。绝缘功能模块18包括绝缘基板4,绝缘基板4倾斜设置于金属底座1上;绝缘基板4的朝向金属底座1的一侧设置有背面导电层7,绝缘基板4的背离金属底座1的一侧设置有正面导电层15,正面导电层15与背面导电层7之间电连接。探测器芯片14设置于绝缘基板4的背离金属底座的一侧,并与正面导电层15电连接,形成用于探测待测斜面的斜面探测端。第一金属导通柱10的一端贯穿金属底座1,并与背面导电层15电连接,第一金属导通柱10的另一端用于连接线路板(该线路板具有信号收发功能和电路导通功能),第一金属导通柱10与金属底座1之间绝缘设置。金属帽管11倒扣于金属底座1上形成一个密封腔体,以将绝缘功能模块18和探测器芯片14封装于该密封腔体内部,从而更好地保护探测器芯片14的稳定性;金属帽管11上设置有倾斜布置的信号接收窗口12,信号接收窗口12、探测器芯片14以及待测斜面之间两两相互平行,探测器芯片14能够接收由信号接收窗口12射入的全部辐射通量。As shown in FIGS. 1 to 11 , this embodiment provides a package structure 100 for an inclined-plane detection device, which mainly includes a metal base 1 , an insulating functional module 18 , a detector chip 14 , a first metal conducting column 10 and a metal cap tube 11 . The insulating function module 18 includes an insulating substrate 4, and the insulating substrate 4 is arranged obliquely on the metal base 1; There is a front conductive layer 15 , and the front conductive layer 15 is electrically connected to the back conductive layer 7 . The detector chip 14 is arranged on the side of the insulating substrate 4 away from the metal base, and is electrically connected to the front conductive layer 15 to form a slope detection end for detecting the slope to be measured. One end of the first metal conducting post 10 runs through the metal base 1 and is electrically connected to the back conductive layer 15, and the other end of the first metal conducting post 10 is used to connect to a circuit board (the circuit board has a signal transceiver function and a circuit conduction function). function), the first metal conducting column 10 and the metal base 1 are insulated. The metal cap tube 11 is turned upside down on the metal base 1 to form a sealed cavity, so that the insulating functional module 18 and the detector chip 14 are packaged inside the sealed cavity, thereby better protecting the stability of the detector chip 14; The cap tube 11 is provided with a signal receiving window 12 arranged obliquely. The signal receiving window 12, the detector chip 14 and the slope to be measured are parallel to each other. The detector chip 14 can receive all the radiation injected by the signal receiving window 12. flux.
本实施例中,绝缘基板4优选为陶瓷基板;金属底座1的上表面开设有用于陶瓷基板(绝缘基板4)插接的金属底座固定槽3,陶瓷基板(绝缘基板4)的底部设置用于与金属底座固定槽3焊接的底部金属层6。In this embodiment, the insulating substrate 4 is preferably a ceramic substrate; the upper surface of the metal base 1 is provided with a metal base fixing groove 3 for inserting the ceramic substrate (insulating substrate 4), and the bottom of the ceramic substrate (insulating substrate 4) is provided for The bottom metal layer 6 welded with the metal base fixing groove 3.
本实施例中,底部金属层6、正面导电层15和背面导电层7均为电镀铜层。底部金属层6与金属底座1之间是紧固安装的关系,二者之间无电连接。In this embodiment, the bottom metal layer 6 , the front conductive layer 15 and the back conductive layer 7 are all electroplated copper layers. The relationship between the bottom metal layer 6 and the metal base 1 is fastened, and there is no electrical connection between the two.
本实施例中,绝缘基板4上开设有过孔位16,过孔位16内穿设第二金属导通柱5,第二金属导通柱5的两端分别与正面导电层15、背面导电层7电连接。In this embodiment, a via hole 16 is opened on the insulating substrate 4, and a second metal conduction column 5 is pierced in the via hole 16. The two ends of the second metal conduction column 5 are respectively electrically conductive with the front conductive layer 15 and the back Layer 7 is electrically connected.
本实施例中,金属底座1上开设有金属底座通孔2,金属底座通孔2内设置有金属底座带孔绝缘柱8,金属底座带孔绝缘柱8上轴向开设有供第一金属导通柱10穿过的金属底座带孔绝缘柱通孔20。金属底座通孔2正好安装金属底座带孔绝缘柱8(即金属底座带孔绝缘柱8的外径等于金 属底座通孔2的孔径,二者之间可为过盈配合设置),金属底座带孔绝缘柱8对第一金属导通柱10起固定与绝缘的作用。In this embodiment, the metal base 1 is provided with a metal base through hole 2, and the metal base through hole 2 is provided with a metal base with a hole insulating column 8, and the metal base with a hole insulating column 8 is axially provided with a first metal guide. The through hole 20 of the insulating post with a hole in the metal base through which the post 10 passes. The metal base through hole 2 just installs the metal base band hole insulating post 8 (the outer diameter of the metal base band insulating post 8 is equal to the aperture of the metal base through hole 2, and the interference fit can be arranged between the two), and the metal base band The hole insulating post 8 plays a role of fixing and insulating the first metal via post 10 .
本实施例中,第一金属导通柱10与金属底座带孔绝缘柱通孔20固定连接。比如通过粘接的方式。In this embodiment, the first metal conducting column 10 is fixedly connected to the through hole 20 of the insulating column with holes in the metal base. For example by bonding.
本实施例中,正面导电层15包括间隔绝缘布置的两块正面导电功能区块21(也可以称之为“陶瓷正面电镀铜层功能区”),从而正面导电层15整体分为绝缘区、前述的第一正面导电功能区块和前述的第二正面导电功能区块三部分,两块正面导电功能区块21之间设有绝缘区,两块正面导电功能区块21对称布置,可与探测器芯片14通过高温焊接在一起,形成一个立体斜面的探测器件。第一正面导电功能区块和第二正面导电功能区块通过探测器芯片14电连接形成斜面导通电路。两块正面导电功能区块21均平行于待测斜面,可形成对待测斜面光线精准探测。In this embodiment, the front conductive layer 15 includes two front conductive functional blocks 21 (also referred to as "ceramic front electroplated copper layer functional areas") arranged in isolation, so that the front conductive layer 15 is divided into an insulating area, an insulating area, and an insulating area. The aforementioned first front conductive functional block and the aforementioned second front conductive functional block are three parts, an insulating area is provided between the two front conductive functional blocks 21, and the two front conductive functional blocks 21 are arranged symmetrically, which can be connected with The detector chips 14 are welded together at high temperature to form a three-dimensional beveled detector device. The first front conductive functional block and the second front conductive functional block are electrically connected through the detector chip 14 to form a slope conduction circuit. The two front conductive functional blocks 21 are parallel to the slope to be tested, which can form a precise detection of light on the slope to be tested.
本实施例中,同理,背面导电层7包括间隔绝缘布置的两块背面导电功能区块19(也可以称之为“陶瓷背面电镀铜层功能区”),从而背面导电层7整体分为绝缘区、前述的第一背面导电功能区块和前述的第二背面正面导电功能区块三部分,两块背面导电功能区块19之间设有绝缘区,两块正面导电功能区块21对称布置;第一背面导电功能区块和第二背面导电功能区块上均开设有背面导电功能区块固定槽17(也可称之为“陶瓷背面电镀铜层固定槽”),任意一背面导电功能区块固定槽17(也可称之为“陶瓷背面电镀铜层固定槽”)内均插设一第一金属导通柱10。第一正面导电功能区块与第一背面导电功能区块之间,以及第二正面导电功能区块与第二背面导电功能区块之间均通过第二金属导通柱5电连接。其中,第二金属导通柱5优选为电镀通孔金属导通柱,其能够将背面导电层7上两块背面导电功能区块19形成的陶瓷背面电镀铜层功能区,与正面导电层15上两块正面导电功能区块21形成的陶瓷正面电镀铜层功能区导通互联(电连接)。In this embodiment, similarly, the back conductive layer 7 includes two back conductive functional blocks 19 (also referred to as "ceramic back electroplated copper layer functional areas") arranged in isolation, so that the back conductive layer 7 is integrally divided into Insulation area, the aforementioned first back conductive functional block and the aforementioned second rear front conductive functional block are three parts, an insulating area is provided between the two rear conductive functional blocks 19, and the two front conductive functional blocks 21 are symmetrical Layout; both the first back conductive functional block and the second rear conductive functional block are provided with a rear conductive functional block fixing groove 17 (also referred to as "ceramic back electroplating copper layer fixing groove"), any one of the back conductive A first metal conducting column 10 is inserted in each of the functional block fixing slots 17 (also referred to as “ceramic back electroplated copper layer fixing slots”). Both the first front conductive functional block and the first rear conductive functional block, and the second front conductive functional block and the second rear conductive functional block are electrically connected through the second metal conductive column 5 . Wherein, the second metal conducting column 5 is preferably an electroplated through-hole metal conducting column, which can connect the electroplated copper layer functional area on the ceramic back side formed by two back conductive functional blocks 19 on the back conductive layer 7 with the front conductive layer 15. The functional areas of the ceramic front electroplated copper layer formed by the upper two front conductive functional blocks 21 are interconnected (electrically connected).
本实施例中,任意一第一金属导通柱10均垂直于金属底座1设置;任意一第一金属导通柱10的顶端均设置为与绝缘基板4平行的斜端面,即金属导通柱斜面9,上述斜端面(即金属导通柱斜面9)平行于背面导电功能区块固定槽17的槽底,即第一金属导通柱10的斜端面倾斜角度与 背面导电层7相同,第一金属导通柱10的斜端面可通过金属焊料与背面导电层7焊接成一个整体。金属底座1、绝缘功能模块18以及第一金属导通柱10三者形成一个三角形立体结构,形成可对具有立体斜面的探测器件进行牢固支撑的立体支撑结构。In this embodiment, any one of the first metal vias 10 is set perpendicular to the metal base 1; the top of any one of the first metal vias 10 is set as an inclined end surface parallel to the insulating substrate 4, that is, the metal vias The inclined surface 9, the above-mentioned oblique end surface (i.e. the inclined surface 9 of the metal conducting column) is parallel to the groove bottom of the fixing groove 17 of the conductive functional block on the back, that is, the inclination angle of the inclined end surface of the first metal conducting column 10 is the same as that of the conductive layer 7 on the back, and the second The oblique end surface of a metal via post 10 can be welded to the back conductive layer 7 as a whole by metal solder. The metal base 1 , the insulating functional module 18 and the first metal conductive column 10 form a triangular three-dimensional structure, forming a three-dimensional support structure that can firmly support the detection device with a three-dimensional slope.
本实施例中,探测器芯片14优选为二极管芯片,更具体的,可以是紫外发光二极管,则其可以探测紫外光。探测器芯片14平行于绝缘基板4设置。In this embodiment, the detector chip 14 is preferably a diode chip, more specifically, an ultraviolet light emitting diode, which can detect ultraviolet light. The detector chip 14 is arranged parallel to the insulating substrate 4 .
本实施例中,绝缘基板4的两侧面分别设置正面导电层15和背面导电层7,绝缘基板4的两侧面相互平行,组装状态下均相对金属底座1倾斜布置;至少绝缘基板4的底面设置为平行于金属底座1的水平面,绝缘基板4的顶面可与该底面平行设置,也可不平行设置。绝缘基板4的底面连接两侧面的底端,绝缘基板4的底面与两侧面之间呈夹角设置,该夹角与待测斜面的倾斜角度一致,以确保设置于两侧面的正面导电层15和背面导电层7均平行于待测斜面。金属底座固定槽3优选为矩形,该槽的槽孔大小与绝缘基板4的底部金属层6尺寸匹配,绝缘功能模块18整体通过底部金属层6与金属底座固定槽3通过银铜焊料焊接一起,绝缘功能模块与金属底座1形成一个整体,具体为一个立体斜面结构。In this embodiment, the front conductive layer 15 and the back conductive layer 7 are respectively provided on both sides of the insulating substrate 4, the two sides of the insulating substrate 4 are parallel to each other, and are arranged obliquely relative to the metal base 1 in the assembled state; at least the bottom surface of the insulating substrate 4 is provided with In order to be parallel to the horizontal plane of the metal base 1 , the top surface of the insulating substrate 4 can be arranged parallel to the bottom surface, or not. The bottom surface of the insulating substrate 4 is connected to the bottom ends of the two sides, and the bottom surface of the insulating substrate 4 is arranged at an angle with the two sides, and the angle is consistent with the inclination angle of the inclined surface to be measured, so as to ensure that the front conductive layer 15 arranged on the two sides and the conductive layer 7 on the back are parallel to the slope to be measured. The metal base fixing groove 3 is preferably rectangular, and the size of the slot hole matches the size of the bottom metal layer 6 of the insulating substrate 4. The insulating function module 18 is welded together through the bottom metal layer 6 and the metal base fixing groove 3 through silver-copper solder. The insulating functional module and the metal base 1 form an integral body, specifically a three-dimensional slope structure.
本实施例中,绝缘基板4的沿垂直于其侧面所切得的截面为平行四边形截面。绝缘基板4的底部能够与金属底座固定槽3形成平面对接,安装更加牢靠,导电性能也更加良好。绝缘基板4的底部设置底部金属层6,未组装状态下,绝缘基板4的两侧面处于竖直状态时,其底面为斜切底面,底部金属层6设置于该斜切底面上,故底部金属层6还可以称之为“陶瓷斜面电镀铜层”。In this embodiment, the cross section of the insulating substrate 4 cut perpendicular to its side is a parallelogram cross section. The bottom of the insulating substrate 4 can form a plane butt joint with the fixing groove 3 of the metal base, so that the installation is more reliable and the electrical conductivity is better. The bottom metal layer 6 is set on the bottom of the insulating substrate 4. In the unassembled state, when the two sides of the insulating substrate 4 are in a vertical state, the bottom surface is a chamfered bottom surface, and the bottom metal layer 6 is arranged on the chamfered bottom surface, so the bottom metal layer Layer 6 may also be referred to as a "ceramic bevel electroplated copper layer".
本实施例中,金属帽管11的顶部设置有与探测器芯片14平行的斜切面,信号接收窗口12开设于该斜切面上;信号接收窗口12上配置有平面透镜13,平面透镜13粘附于该斜切面的内壁,即平面透镜13固定于金属帽管斜面内壁22上。组装状态下,该斜切面平行于绝缘基板4,可实现探测器芯片14对通过斜面光线接收窗口,即信号接收窗口12照射进的紫外光线精准接收。其中,平面透镜13可通过粘合剂与信号接收窗口12的内壁面结合,形成一个密闭的腔体帽。In this embodiment, the top of the metal cap tube 11 is provided with an oblique section parallel to the detector chip 14, and the signal receiving window 12 is set on the oblique section; the signal receiving window 12 is provided with a plane lens 13, and the plane lens 13 is adhered On the inner wall of the inclined plane, that is, the plane lens 13 is fixed on the inclined inner wall 22 of the metal cap tube. In the assembled state, the oblique plane is parallel to the insulating substrate 4 , so that the detector chip 14 can accurately receive the ultraviolet light irradiated through the oblique light receiving window, that is, the signal receiving window 12 . Wherein, the plane lens 13 can be combined with the inner wall of the signal receiving window 12 through an adhesive to form a closed cavity cap.
本实施例中,金属底座1的外圈设置有金属底座台阶23,金属帽管11倒扣于金属底座台阶23上,通过在金属帽管11与金属底座台阶23上涂抹金属焊料,通过高温把两者焊接成一个整体,形成一个可对探测器芯片14长期稳定性保护的高气密性的的密闭腔体。In this embodiment, the outer ring of the metal base 1 is provided with a metal base step 23, and the metal cap tube 11 is buckled upside down on the metal base step 23. By applying metal solder on the metal cap tube 11 and the metal base step 23, the The two are welded as a whole to form a highly airtight airtight cavity that can protect the long-term stability of the detector chip 14 .
本实施例中,待测斜面、绝缘基板4、探测器芯片14以及信号接收窗口12的倾斜角度α可为0°~90°,作为优选方式,待测斜面、绝缘基板4、探测器芯片14以及信号接收窗口12的倾斜角度α设置为30°~80°,前述“斜切底面”与绝缘基板4的正侧面(安装探测器芯片14的侧面)之间的夹角与α的设置角度相同。In this embodiment, the inclination angle α of the slope to be tested, the insulating substrate 4, the detector chip 14, and the signal receiving window 12 can be 0° to 90°. And the inclination angle α of the signal receiving window 12 is set to 30°~80°, the included angle between the above-mentioned "beveled bottom surface" and the front side of the insulating substrate 4 (the side on which the detector chip 14 is installed) is the same as the setting angle of α .
同时,本实施例提出一种上述斜面探测器件封装结构的制作方法,主要包括如下步骤:At the same time, this embodiment proposes a method for manufacturing the packaging structure of the above-mentioned slope detector device, which mainly includes the following steps:
步骤1、在金属底座上焊接绝缘基板; Step 1. Weld the insulating substrate on the metal base;
步骤2、在绝缘基板的两侧分别设置正面导电层和背面导电层,并将正面导电层和背面导电层电连接; Step 2, setting the front conductive layer and the back conductive layer respectively on both sides of the insulating substrate, and electrically connecting the front conductive layer and the back conductive layer;
步骤3、在绝缘基板的正面导电层焊接探测器芯片; Step 3, welding the detector chip on the front conductive layer of the insulating substrate;
步骤4、在绝缘基板的背面导电层焊接第一金属导通柱10; Step 4, welding the first metal via post 10 on the back conductive layer of the insulating substrate;
步骤5、将金属帽管焊接于金属底座上,以形成对探测器芯片进行保护的密闭腔体。 Step 5, welding the metal cap tube to the metal base to form a sealed cavity for protecting the detector chip.
本实施例中,绝缘功能模块18的绝缘基板4通过切割长方形陶瓷基板形成,陶瓷基板的两个短边做45度斜切面,通过激光在陶瓷基板打孔形成两个过孔位16,可通过电镀填充过孔位16形成第二金属导通柱5,之后通过在陶瓷基板的正反面电镀陶瓷正面电镀铜层(即正面导电层15)与陶瓷背面电镀铜层(即背面导电层7)。其中,电镀陶瓷正面电镀铜层(即正面导电层15)与电镀陶瓷背面电镀铜层(即背面导电层7)通过上述第二金属导通柱5导通,形成陶瓷基板正面反面导通。In this embodiment, the insulating substrate 4 of the insulating functional module 18 is formed by cutting a rectangular ceramic substrate. The two short sides of the ceramic substrate are cut at 45 degrees, and two via holes 16 are formed on the ceramic substrate by laser drilling. Electroplating fills the via hole position 16 to form the second metal via post 5, and then electroplates the copper layer on the front of the ceramic (ie, the front conductive layer 15) and the electroplated copper layer on the back of the ceramic (ie, the back conductive layer 7) on the front and back of the ceramic substrate. Wherein, the electroplated copper layer (i.e. front conductive layer 15) on the front side of the electroplated ceramic and the electroplated copper layer (i.e. back conductive layer 7) on the back side of the electroplated ceramic are conducted through the above-mentioned second metal conduction column 5 to form conduction between the front and back sides of the ceramic substrate.
本实施例中,陶瓷基板的两个短边的斜切面呈45度倾斜,其底部的斜切面电镀铜层形成底部金属层6,从而实现陶瓷基板上三个面的电镀结合体。In this embodiment, the beveled surfaces of the two short sides of the ceramic substrate are inclined at 45 degrees, and the electroplated copper layer on the beveled surface at the bottom forms the bottom metal layer 6, thereby realizing the electroplating combination of three surfaces of the ceramic substrate.
本实施例中,背面导电层7优选在背面导电层7继续加厚电镀铜层,以开设背面导电功能区块固定槽17,背面导电功能区块固定槽17的大小 与金属导通柱斜面9的大小相等。In this embodiment, the back conductive layer 7 preferably continues to thicken the electroplated copper layer on the back conductive layer 7 to open the back conductive functional block fixing groove 17. are equal in size.
本实施例中,将合金金属块通过机床加工成一个带金属底座固定槽3与金属底座台阶23的金属底座1,通过冲床在金属底座1加工两个金属底座通孔2,两个金属底座通孔2的位置与绝缘功能模块18上两个背面导电功能区块固定槽17的位置一一对应。In this embodiment, the alloy metal block is processed by a machine tool into a metal base 1 with a metal base fixing groove 3 and a metal base step 23, and two metal base through holes 2 are processed in the metal base 1 by a punching machine, and the two metal bases pass through The positions of the holes 2 are in one-to-one correspondence with the positions of the two rear conducting functional block fixing grooves 17 on the insulating functional module 18 .
本实施例中,第一金属导通柱10可通过机床加工成一个斜面45度的金属导通柱斜面9。In this embodiment, the first metal via post 10 can be machined into a metal via post slope 9 with a slope of 45 degrees.
本实施例的绝缘功能模块18、底部金属层6、背面导电功能区块固定槽17、金属底座固定槽3、金属底座通孔2和金属导通柱斜面9中,在金属底座1的金属底座固定槽3填涂金属银铜焊料,把绝缘功能模块18的底部金属层6放进金属底座固定槽3,通过治具固定;其中在绝缘功能模块18的背面导电功能区块固定槽17填涂金属银铜焊料,把第一金属导通柱10的金属导通柱斜面9通过金属底座通孔2,插入背面导电功能区块固定槽17,通过治具固定;金属底座1、绝缘功能模块18、第一金属导通柱10通过治具固定在一起,之后可通过高温600~1000℃将三者焊接成一个整体,即形成一个剪切强度非常高的立体结构。In the insulating functional module 18, the bottom metal layer 6, the fixing groove 17 of the conductive functional block on the back, the fixing groove 3 of the metal base, the through hole 2 of the metal base and the inclined surface 9 of the metal conduction column in this embodiment, the metal base of the metal base 1 The fixing groove 3 is filled with metal silver copper solder, and the bottom metal layer 6 of the insulating function module 18 is put into the fixing groove 3 of the metal base, and fixed by a jig; wherein the conductive function block fixing groove 17 on the back side of the insulating function module 18 is filled with Metal silver-copper solder, the metal conduction column slope 9 of the first metal conduction column 10 passes through the metal base through hole 2, inserts the conductive functional block fixing groove 17 on the back, and is fixed by a jig; the metal base 1, the insulating function module 18 1. The first metal via post 10 is fixed together by a jig, and then the three can be welded into a whole at a high temperature of 600-1000° C., that is, a three-dimensional structure with very high shear strength is formed.
本实施例中,通过治具正面导电功能区块21放水平,把探测器芯片14放置在正面导电功能区块21,可通过高温将二者焊接到一起,探测器芯片14、正面导电功能区块21、背面导电功能区块19、第一金属导通柱10四个部件形成一个电路导通回路。In this embodiment, the detector chip 14 is placed on the front conductive functional block 21 by placing the front conductive functional block 21 of the jig horizontally, and the two can be welded together by high temperature. The detector chip 14 and the front conductive functional area The block 21 , the back conductive functional block 19 , and the first metal conduction column 10 form a circuit conduction loop.
本实施例中,通过在金属底座通孔2的孔内壁涂抹粘合剂,第一金属导通柱10穿设于金属底座带孔绝缘柱8的金属底座带孔绝缘柱通孔20内,之后可通过温度加热将第一金属导通柱10和金属底座带孔绝缘柱8粘合一起,金属底座带孔绝缘柱8对第一金属导通柱10起到固定与绝缘的作用。In this embodiment, by applying adhesive on the inner wall of the through hole 2 of the metal base, the first metal conducting column 10 is penetrated in the through hole 20 of the insulating column with holes in the metal base 8 , and then The first metal conducting post 10 and the insulating post with holes in the metal base 8 can be bonded together by heating, and the insulating post with holes in the metal base 8 can fix and insulate the first metal conducting post 10 .
本实施例中,金属帽管11是通过把金属片加工成一个中心轴对称的帽子形状,再在帽子顶端的一个边切割成缺口(斜切面),进一步通过模具加工出信号接收窗口12,通过在信号接收窗口12的金属帽管斜面内壁22涂抹粘合剂,把平面透镜13与金属帽管斜面内壁22结合一起。In the present embodiment, the metal cap tube 11 is formed by processing the metal sheet into a hat shape symmetrical to the central axis, and then cutting a gap (chamfer) on one side of the top of the cap, and further processing the signal receiving window 12 through a mold. Apply adhesive to the inclined inner wall 22 of the metal cap tube of the signal receiving window 12 to combine the plane lens 13 with the inclined inner wall 22 of the metal cap tube.
本实施例中,在金属底座台阶23涂抹中低温金属焊料,把金属帽管 11放置在金属底座1的涂抹了低温金属焊料的金属底座台阶23上,通过温度控制,把金属底座1与金属帽管11焊接到一起,对探测器芯片14形成一个对前述形成的电路导通回路起保护作用的密闭腔体,从而形成一种斜面探测器件封装结构,可对斜面结构精准探测。In this embodiment, smear medium and low temperature metal solder on the metal base step 23, place the metal cap tube 11 on the metal base step 23 coated with low temperature metal solder on the metal base 1, and control the temperature to connect the metal base 1 and the metal cap. The tubes 11 are welded together to form a sealed cavity for the detector chip 14 to protect the conduction loop of the aforementioned circuit, thereby forming a packaging structure for the inclined-plane detector, which can accurately detect the inclined-plane structure.
由此可见,本发明提出的斜面探测器件封装结构,结构新颖合理,通过将信号接收窗口、探测器芯片均设置为与待测斜面平行,不仅能够在探测器件性能良好的状况下直接对待测斜面结构进行探测,藉以满足斜面结构探测应用对探测器件的需求,而且能够使探测器芯片接收到由信号接收窗口射入的全部辐射通量(比如光线等),相较于传统的金属帽管将信号接收窗口设置于帽管顶部,能够更好地保证应用环节对辐射通量的需求,提升探测器件对斜面结构的探测精度,进而解决现有技术存在的探测器件性能较差以及由于辐射通量接收率低而影响探测器件探测精度的问题。It can be seen that the packaging structure of the slope detector device proposed by the present invention has a novel and reasonable structure. By setting the signal receiving window and the detector chip to be parallel to the slope to be measured, not only can the slope be directly tested under the condition that the performance of the detection device is good, structure detection, so as to meet the requirements of detection devices for slope structure detection applications, and enable the detector chip to receive all the radiation flux (such as light, etc.) injected from the signal receiving window, compared with the traditional metal cap tube will The signal receiving window is set on the top of the cap tube, which can better ensure the application link's demand for radiation flux, improve the detection accuracy of the detector device for inclined-plane structures, and thus solve the problem of poor performance of the detector device in the existing technology and the problem of radiation flux due to The low acceptance rate affects the detection accuracy of the detection device.
此外,通过设置绝缘功能模块支撑探测器芯片以及相关导电组件,实现了探测器芯片在斜面结构的封装技术,提高了结构的集成性和安装稳定性,从而有利于提高对斜面结构探测的精度,解决目前斜面探测采集数据的难题。In addition, by setting the insulating functional module to support the detector chip and related conductive components, the packaging technology of the detector chip on the slope structure is realized, and the integration and installation stability of the structure are improved, which is conducive to improving the detection accuracy of the slope structure. Solve the current problem of slope detection and data collection.
本发明的绝缘功能模块整体呈立体结构,在提出的斜面探测器件封装结构制作方法中,将其与金属底座和第一金属导通柱均焊接固定,可有效提高斜面探测结构的牢固、稳定性。The insulation function module of the present invention has a three-dimensional structure as a whole. In the proposed manufacturing method of the packaging structure of the inclined-plane detection device, it is welded and fixed with the metal base and the first metal conducting column, which can effectively improve the firmness and stability of the inclined-plane detection structure. .
需要说明的是,对于本领域技术人员而言,显然本发明不限于上述示范性实施例的细节,而且在不背离本发明的精神或基本特征的情况下,能够以其他的具体形式实现本发明。因此,无论从哪一点来看,均应将实施例看作是示范性的,而且是非限制性的,本发明的范围由所附权利要求而不是上述说明限定,因此旨在将落在权利要求的等同要件的含义和范围内的所有变化囊括在本发明内,不应将权利要求中的任何附图标记视为限制所涉及的权利要求。It should be noted that, for those skilled in the art, it is obvious that the present invention is not limited to the details of the above-mentioned exemplary embodiments, and the present invention can be implemented in other specific forms without departing from the spirit or essential characteristics of the present invention. . Accordingly, the embodiments should be regarded in all points of view as exemplary and not restrictive, the scope of the invention being defined by the appended claims rather than the foregoing description, and it is therefore intended that the scope of the invention be defined by the appended claims rather than by the foregoing description. All changes within the meaning and range of equivalents of the elements are embraced in the invention, and any reference sign in a claim shall not be construed as limiting the claim concerned.
本发明中应用了具体个例对本发明的原理及实施方式进行了阐述,以上实施例的说明只是用于帮助理解本发明的方法及其核心思想;同时,对于本领域的一般技术人员,依据本发明的思想,在具体实施方式及应用范围上均会有改变之处。综上所述,本说明书内容不应理解为对本发明的限 制。In the present invention, specific examples have been used to illustrate the principle and implementation of the present invention. The description of the above embodiments is only used to help understand the method and core idea of the present invention; meanwhile, for those of ordinary skill in the art, according to the present invention The idea of the invention will have changes in the specific implementation and scope of application. In summary, the contents of this specification should not be construed as limiting the present invention.

Claims (10)

  1. 一种斜面探测器件封装结构,其特征在于,包括:A packaging structure for an inclined-plane detection device, characterized in that it comprises:
    金属底座;metal base;
    绝缘功能模块,所述绝缘功能模块包括绝缘基板,所述绝缘基板倾斜设置于所述金属底座上;所述绝缘基板的朝向所述金属底座的一侧设置有背面导电层,所述绝缘基板的背离所述金属底座的一侧设置有正面导电层,所述正面导电层与所述背面导电层电连接;An insulating functional module, the insulating functional module includes an insulating substrate, and the insulating substrate is arranged obliquely on the metal base; the side of the insulating substrate facing the metal base is provided with a conductive layer on the back, and the insulating substrate is provided with a back conductive layer. A front conductive layer is provided on a side away from the metal base, and the front conductive layer is electrically connected to the back conductive layer;
    探测器芯片,所述探测器芯片设置于所述绝缘基板的背离所述金属底座的一侧,并与所述正面导电层电连接,形成斜面探测端;A detector chip, the detector chip is arranged on the side of the insulating substrate away from the metal base, and is electrically connected to the front conductive layer to form a slope detection end;
    第一金属导通柱,所述第一金属导通柱的一端贯穿所述金属底座,并与所述背面导电层电连接,所述第一金属导通柱的另一端用于连接线路板;所述金属底座与所述第一金属导通柱之间绝缘设置;A first metal conduction column, one end of the first metal conduction column passes through the metal base, and is electrically connected to the back conductive layer, and the other end of the first metal conduction column is used to connect to a circuit board; Insulation is provided between the metal base and the first metal conducting column;
    金属帽管,所述金属帽管倒扣于所述金属底座上,以将所述绝缘功能模块和所述探测器芯片封装于所述金属帽管和所述金属底座之间;所述金属帽管上设置有倾斜布置的信号接收窗口,所述信号接收窗口、所述探测器芯片以及待测斜面之间两两相互平行,所述探测器芯片能够接收由所述信号接收窗口射入的全部辐射通量。A metal cap tube, the metal cap tube is buckled upside down on the metal base, so that the insulating functional module and the detector chip are packaged between the metal cap tube and the metal base; the metal cap The tube is provided with an obliquely arranged signal receiving window, the signal receiving window, the detector chip and the slope to be measured are parallel to each other, and the detector chip can receive all the incoming signals from the signal receiving window. Radiant flux.
  2. 根据权利要求1所述的斜面探测器件封装结构,其特征在于,所述绝缘基板为陶瓷基板;所述金属底座的上表面开设有用于所述陶瓷基板插接的金属底座固定槽,所述陶瓷基板的底部设置用于与所述金属底座固定槽焊接的底部金属层。The packaging structure of the slope detection device according to claim 1, wherein the insulating substrate is a ceramic substrate; the upper surface of the metal base is provided with a metal base fixing groove for inserting the ceramic substrate, and the ceramic The bottom of the substrate is provided with a bottom metal layer for welding with the fixing groove of the metal base.
  3. 根据权利要求2所述的斜面探测器件封装结构,其特征在于,所述底部金属层、所述正面导电层和/或所述背面导电层为电镀铜层。The packaging structure of the slope detection device according to claim 2, wherein the bottom metal layer, the front conductive layer and/or the back conductive layer is an electroplated copper layer.
  4. 根据权利要求1~3任意一项所述的斜面探测器件封装结构,其特征在于,所述绝缘基板上开设有过孔位,所述过孔位内穿设第二金属导通柱,所述第二金属导通柱的两端分别与所述正面导电层、所述背面导电层电连接。According to the packaging structure of the slope detector device according to any one of claims 1 to 3, it is characterized in that a via hole is opened on the insulating substrate, and a second metal conduction column is penetrated in the via hole, and the Two ends of the second metal via column are respectively electrically connected to the front conductive layer and the back conductive layer.
  5. 根据权利要求1~3任意一项所述的斜面探测器件封装结构,其特征在于,所述金属底座上开设有金属底座通孔,所述金属底座通孔内设置有金属底座带孔绝缘柱,所述金属底座带孔绝缘柱上开设有供所述第一金 属导通柱穿过的金属底座带孔绝缘柱通孔。According to the packaging structure of the slope detection device according to any one of claims 1 to 3, it is characterized in that, the metal base is provided with a metal base through hole, and the metal base through hole is provided with a metal base with a hole insulating column, The insulating post with holes in the metal base is provided with a through hole for the insulating post with holes in the metal base through which the first metal conduction post passes.
  6. 根据权利要求4所述的斜面探测器件封装结构,其特征在于,所述正面导电层包括间隔绝缘布置的第一正面导电功能区块和第二正面导电功能区块,所述第一正面导电功能区块和所述第二正面导电功能区块通过所述探测器芯片电连接形成斜面导通电路;The packaging structure of the slope detection device according to claim 4, wherein the front conductive layer includes a first front conductive functional block and a second front conductive functional block arranged in isolation, and the first front conductive functional block The block and the second front conductive functional block are electrically connected through the detector chip to form a slope conduction circuit;
    所述背面导电层包括间隔绝缘布置的第一背面导电功能区块和第二背面导电功能区块,所述第一背面导电功能区块和所述第二背面导电功能区块上均开设有背面导电功能区块固定槽,任意一所述背面导电功能区块固定槽内均插设一所述第一金属导通柱;The back conductive layer includes a first back conductive functional block and a second rear conductive functional block arranged in isolation, and the first back conductive functional block and the second rear conductive functional block are provided with a back surface. The conductive functional block fixing groove, any one of the conductive functional block fixing grooves on the back is inserted with the first metal conduction column;
    所述第一正面导电功能区块与所述第一背面导电功能区块之间,以及所述第二正面导电功能区块与所述第二背面导电功能区块之间均通过所述第二金属导通柱电连接。Between the first front conductive functional block and the first rear conductive functional block, and between the second front conductive functional block and the second rear conductive functional block are all passed through the second The metal vias are electrically connected.
  7. 根据权利要求6所述的斜面探测器件封装结构,其特征在于,任意一所述第一金属导通柱均垂直于所述金属底座设置;任意一所述第一金属导通柱的顶端均设置为与所述绝缘基板平行的斜端面,所述背面导电功能区块固定槽的槽底平行于所述斜端面。According to the packaging structure of the slope detection device according to claim 6, it is characterized in that, any one of the first metal conducting columns is arranged perpendicular to the metal base; any one of the top ends of the first metal conducting columns is arranged It is an oblique end surface parallel to the insulating substrate, and the groove bottom of the fixing groove of the conductive functional block on the back is parallel to the oblique end surface.
  8. 根据权利要求1~3任意一项所述的斜面探测器件封装结构,其特征在于,所述探测器芯片为二极管芯片;所述探测器芯片平行于所述绝缘基板设置。The packaging structure of an inclined plane detector according to any one of claims 1 to 3, wherein the detector chip is a diode chip; and the detector chip is arranged parallel to the insulating substrate.
  9. 根据权利要求1~3任意一项所述的斜面探测器件封装结构,其特征在于,所述金属帽管的顶部设置有与所述探测器芯片平行的斜切面,所述信号接收窗口开设于所述斜切面上;所述信号接收窗口上配置有平面透镜,所述平面透镜粘附于所述斜切面的内壁。According to the package structure of any one of claims 1-3, characterized in that, the top of the metal cap tube is provided with an oblique plane parallel to the detector chip, and the signal receiving window is opened at the on the beveled surface; a plane lens is arranged on the signal receiving window, and the plane lens is adhered to the inner wall of the beveled surface.
  10. 一种权利要求1~9任意一项所述斜面探测器件封装结构的制作方法,其特征在于,包括:A method for manufacturing the packaging structure of the slope detection device according to any one of claims 1 to 9, characterized in that it comprises:
    在所述金属底座上焊接所述绝缘基板;welding the insulating substrate on the metal base;
    在所述绝缘基板的两侧分别设置所述正面导电层和所述背面导电层,并将所述正面导电层和所述背面导电层电连接;The front conductive layer and the back conductive layer are respectively arranged on both sides of the insulating substrate, and the front conductive layer and the back conductive layer are electrically connected;
    在所述绝缘基板的所述正面导电层焊接所述探测器芯片;Welding the detector chip on the front conductive layer of the insulating substrate;
    在所述绝缘基板的所述背面导电层焊接所述第一金属导通柱;Welding the first metal via column on the back conductive layer of the insulating substrate;
    将所述金属帽管焊接于所述金属底座上,以形成对所述探测器芯片进行保护的密闭腔体。The metal cap tube is welded on the metal base to form a sealed cavity for protecting the detector chip.
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