WO2023020515A1 - Heterojunction solar cell and manufacturing method therefor and heterojunction photovoltaic module - Google Patents

Heterojunction solar cell and manufacturing method therefor and heterojunction photovoltaic module Download PDF

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WO2023020515A1
WO2023020515A1 PCT/CN2022/112904 CN2022112904W WO2023020515A1 WO 2023020515 A1 WO2023020515 A1 WO 2023020515A1 CN 2022112904 W CN2022112904 W CN 2022112904W WO 2023020515 A1 WO2023020515 A1 WO 2023020515A1
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film layer
amorphous silicon
solar cell
silicon film
heterojunction
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PCT/CN2022/112904
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French (fr)
Chinese (zh)
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钱洪强
张树德
符欣
连维飞
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苏州腾晖光伏技术有限公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/20Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials
    • H01L31/202Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof such devices or parts thereof comprising amorphous semiconductor materials including only elements of Group IV of the Periodic System
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/0216Coatings
    • H01L31/02161Coatings for devices characterised by at least one potential jump barrier or surface barrier
    • H01L31/02167Coatings for devices characterised by at least one potential jump barrier or surface barrier for solar cells
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/0224Electrodes
    • H01L31/022408Electrodes for devices characterised by at least one potential jump barrier or surface barrier
    • H01L31/022425Electrodes for devices characterised by at least one potential jump barrier or surface barrier for solar cells
    • H01L31/022441Electrode arrangements specially adapted for back-contact solar cells
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/0224Electrodes
    • H01L31/022466Electrodes made of transparent conductive layers, e.g. TCO, ITO layers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/04Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
    • H01L31/06Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier
    • H01L31/072Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier the potential barriers being only of the PN heterojunction type
    • H01L31/0745Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier the potential barriers being only of the PN heterojunction type comprising a AIVBIV heterojunction, e.g. Si/Ge, SiGe/Si or Si/SiC solar cells
    • H01L31/0747Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier the potential barriers being only of the PN heterojunction type comprising a AIVBIV heterojunction, e.g. Si/Ge, SiGe/Si or Si/SiC solar cells comprising a heterojunction of crystalline and amorphous materials, e.g. heterojunction with intrinsic thin layer or HIT® solar cells; solar cells
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/1884Manufacture of transparent electrodes, e.g. TCO, ITO
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Definitions

  • the present application relates to the field of photovoltaic technology, in particular to a heterojunction solar cell, a manufacturing method thereof, and a heterojunction photovoltaic module.
  • Heterojunction solar cells have a double-sided symmetric structure and excellent passivation effect endowed by the amorphous silicon layer. At the same time, they have the characteristics of high conversion efficiency and high double-sided ratio, and have become a hot spot in industry research.
  • TCO transparent conductive oxide, transparent conductive oxide
  • PVD Physical Vapor Deposition
  • the silicon wafer Put it in the pit of the hollow carrier board, and the hollow carrier board is placed in the PVD equipment, and the PVD equipment performs TCO coating on the front and back at one time. Since the silicon wafer is placed in the pit of the carrier board, the four edges of the back of the silicon wafer are covered by about 0.6mm and there is no TCO film layer. According to calculations, about 1.4% of the amorphous silicon film layer is not covered by the TCO film layer, resulting in The photogenerated carriers generated here cannot be effectively exported, and the theoretically calculated efficiency loss is about 0.34%.
  • the purpose of the present application is to provide a heterojunction solar cell, a manufacturing method thereof, and a heterojunction photovoltaic module, so as to improve the efficiency of the heterojunction solar cell.
  • the present application provides a method for manufacturing a heterojunction solar cell, including:
  • the width of the mask is between 0.05 mm and 0.5 mm, including the endpoints value
  • Electrodes are respectively made on the surfaces of the TCO film layers located on the front side and the back side to obtain a heterojunction solar cell.
  • the silicon wafer with the amorphous silicon film layer deposited on the front and the back it also includes:
  • An n-type amorphous silicon film layer is deposited on the surface of the amorphous silicon film layer located on the back side.
  • said obtaining said silicon wafer it also includes:
  • the silicon wafer is subjected to double-sided texturing treatment.
  • the electrodes after the electrodes are fabricated on the surfaces of the TCO film layers located on the front side and the back side respectively, it also includes:
  • the present application also provides a heterojunction solar cell, which is manufactured by using any one of the heterojunction solar cell manufacturing methods described above.
  • the present application also provides a heterojunction photovoltaic module, including a first substrate, a first adhesive film layer, a battery layer, a second adhesive film layer, and a second substrate sequentially stacked from bottom to top, wherein the battery layer includes multiple sheet of the heterojunction solar cell described above.
  • both the first adhesive film layer and the second adhesive film layer are EVA adhesive film layers.
  • the first adhesive film layer is an anti-crack adhesive film layer.
  • the first substrate is a glass substrate.
  • the side surface of the second substrate is a slope inclined toward the battery layer.
  • a method for manufacturing a heterojunction solar cell includes: obtaining a silicon wafer with an amorphous silicon film layer deposited on the front and back; depositing TCO on the surface of the amorphous silicon film layer located on the front film layer; turn the silicon wafer 180 degrees, and cover the surface of the amorphous silicon film layer on the back side with a mask along the edge; wherein, the width of the mask is between 0.05 mm and 0.5 mm , including endpoint values; deposit a TCO film layer on the surface of the amorphous silicon film layer covered with the mask; make electrodes on the surface of the TCO film layer located at the front side and the back side respectively to obtain a heterojunction Solar battery.
  • the heterojunction solar cell manufacturing method in this application after obtaining the silicon wafer with the amorphous silicon film layer deposited on the front and back, first deposit the TCO film layer on the surface of the amorphous silicon film layer on the front side, and then turn it over
  • the silicon wafer makes the back of the silicon wafer face up, covering the surface of the amorphous silicon film layer on the back with a mask along the edge, and depositing a TCO film layer on the surface of the amorphous silicon film layer on the back, and finally preparing the electrode, the shielding of the mask Realize the electrical isolation of the front and back TCO film layers, and at the same time make the symmetry and appearance of the heterojunction solar cells better, and the width of the mask is between 0.05mm and 0.5mm, and the shielding of the back amorphous silicon film layer The width is narrowed, and the area of the TCO film layer on the back is increased, thereby improving the efficiency of the heterojunction solar cell.
  • the present application also provides a method for manufacturing a heterojunction solar cell and a heterojunction photovoltaic module having the above-mentioned advantages.
  • FIG. 1 is a flow chart of a method for manufacturing a heterojunction solar cell provided in an embodiment of the present application
  • FIG. 2 is a top view after covering the mask in the embodiment of the present application.
  • Fig. 3 is a flow chart of another method for manufacturing a heterojunction solar cell provided by the embodiment of the present application.
  • FIG. 4 is a schematic structural view of a heterojunction solar cell provided by the present application.
  • Fig. 5 is a schematic structural diagram of a heterojunction photovoltaic module provided by the present application.
  • TCO film layer As mentioned in the background technology section, physical vapor deposition is currently used to deposit the TCO film layer.
  • the silicon wafer is placed in the pit of the hollow carrier, and the hollow carrier is placed in the PVD equipment. and TCO coating on the back. Since the silicon wafer is placed in the pit of the carrier board, the four edges of the back of the silicon wafer are covered by about 0.6mm and there is no TCO film layer. According to calculations, about 1.4% of the amorphous silicon film layer is not covered by the TCO film layer, resulting in The photogenerated carriers generated here cannot be effectively exported, and the theoretically calculated efficiency loss is about 0.34%.
  • the TCO film layer mainly includes oxides of In, Sb, Zn and Cd and their composite multi-element oxide film materials.
  • FIG. 1 is a flow chart of a method for manufacturing a heterojunction solar cell provided in an embodiment of the present application.
  • the method includes:
  • Step S101 Obtain a silicon wafer with amorphous silicon film layers deposited on both the front and back sides.
  • the front side of the silicon wafer is the light-facing side
  • the back side is the backlight side
  • Silicon wafers generally choose N-type silicon wafers.
  • the amorphous silicon film layer on the front side includes the stacked intrinsic amorphous silicon film layer and the p-type amorphous silicon film layer
  • the amorphous silicon film layer on the back includes the stacked intrinsic amorphous silicon film layer.
  • Step S102 Depositing a TCO film layer on the surface of the amorphous silicon film layer located on the front side.
  • the TCO film layer is only deposited on the surface of the front amorphous silicon film layer.
  • the TCO film layer on the surface of the amorphous silicon film layer on the front side can be deposited by physical vapor deposition.
  • Step S103 Flip the silicon wafer by 180 degrees, and cover the edge of the surface of the amorphous silicon film layer on the back with a mask; wherein, the width of the mask is between 0.05 mm and 0.5 mm , including the endpoint value.
  • the outer edge of the mask 15 is aligned and coincident with the edge of the amorphous silicon film layer (ie, the n-type amorphous silicon film layer 7).
  • the top view after covering the mask as shown in picture 2.
  • the mask is used for physical isolation and does not need to be removed.
  • the width of the mask is not specifically limited in this application, and can be set by itself.
  • the width of the mask can be 0.08mm, 0.1mm, 0.15mm, 0.20mm, 0.25mm, 0.28mm, 0.30mm, 0.34mm, 0.37mm, 0.4mm, 0.45mm, 0.48mm, and so on.
  • the width of the mask can be 0.1mm, that is, the distance between the masks of the two opposite sides is 158.55mm; when the side length of the silicon wafer increases, for example, the silicon wafer
  • the side lengths of the mask are 166mm and 210mm, and the width of the mask can be increased accordingly.
  • the efficiency of the heterojunction solar cell can be increased by about 0.3% compared with the heterojunction solar cell produced by the current related technology.
  • step S102 The silicon wafer is turned over by 180 degrees.
  • step S102 the front side of the silicon wafer faces upward, and the back side of the silicon wafer faces upward after turning over.
  • silicon wafers are flipped using a mechanical transfer device.
  • manual flipping may also be used, which is not specifically limited in this application.
  • Step S104 Depositing a TCO film layer on the surface of the amorphous silicon film layer covered with the mask.
  • the TCO film layer can be deposited by physical vapor deposition.
  • Step S105 making electrodes on the surfaces of the TCO film layers located on the front side and the back side respectively to obtain a heterojunction solar cell.
  • Both the front electrode and the back electrode can use silver electrodes, and the electrodes can be printed by screen printing and cured.
  • the manufacturing method of the heterojunction solar cell in this application after obtaining the silicon wafer with the amorphous silicon film layer deposited on the front and back, first deposit the TCO film layer on the surface of the amorphous silicon film layer located on the front side, and then turn over the silicon wafer Make the back side of the silicon wafer face up, cover the surface of the amorphous silicon film layer on the back side with a mask along the edge, and deposit a TCO film layer on the surface of the amorphous silicon film layer on the back side, and finally prepare electrodes, and the shielding of the mask realizes the front side
  • the electrical isolation from the TCO film layer on the back makes the symmetry and appearance of the heterojunction solar cell better, and the width of the mask is between 0.05mm and 0.5mm, and the shading width of the amorphous silicon film layer on the back becomes smaller. Narrow, increasing the area of the TCO film layer on the back, thereby improving the efficiency of heterojunction solar cells.
  • the silicon wafer with the amorphous silicon film layer deposited on the front and the back it also includes:
  • An n-type amorphous silicon film layer is deposited on the surface of the amorphous silicon film layer located on the back side.
  • the method of depositing the intrinsic amorphous silicon film layer is not specifically limited, and can be selected by oneself.
  • the intrinsic amorphous silicon film layer can be deposited by physical vapor deposition, or plasma enhanced chemical vapor deposition, and so on.
  • the p-type amorphous silicon film layer and the n-type amorphous silicon film layer are respectively deposited a layer of intrinsic amorphous silicon film layer, and then respectively doped the intrinsic amorphous silicon film layer to obtain the corresponding p-type amorphous silicon film layer and n-type amorphous silicon film layer.
  • the method of doping is not specifically limited in this application, for example, doping may be performed by diffusion or by ion implantation.
  • the silicon wafer after the silicon wafer is obtained, it also includes:
  • the silicon wafer is subjected to double-sided texturing treatment.
  • the silicon wafer needs to be cleaned to remove the oil and impurities on the surface of the silicon wafer, and then the subsequent process is carried out.
  • FIG. 3 is a flow chart of another method for manufacturing a heterojunction solar cell provided in an embodiment of the present application.
  • Step S201 obtaining the silicon wafer.
  • Step S202 performing double-sided texturing on the silicon wafer.
  • Step S203 Depositing an intrinsic amorphous silicon film layer on the front side and the back side of the silicon wafer respectively.
  • Step S204 depositing a p-type amorphous silicon film layer on the surface of the amorphous silicon film layer located on the front side.
  • Step S205 Depositing an n-type amorphous silicon film layer on the surface of the amorphous silicon film layer located on the back side.
  • Step S206 Depositing a TCO film layer on the surface of the amorphous silicon film layer located on the front side.
  • Step S207 Flip the silicon wafer by 180 degrees, and cover the edge of the surface of the amorphous silicon film layer on the back with a mask; wherein, the width of the mask is between 0.05 mm and 0.5 mm , including the endpoint value.
  • Step S208 Depositing a TCO film layer on the surface of the amorphous silicon film layer covered with the mask.
  • Step S209 making electrodes on the surfaces of the TCO film layers located on the front side and the back side respectively to obtain a heterojunction solar cell.
  • Step S210 Perform EL test and IV (current-voltage) curve test to screen out unqualified heterojunction solar cells.
  • EL Electrode, electroluminescent
  • EL test can detect abnormal phenomena such as internal defects, hidden cracks, fragments, virtual soldering, and broken gates of heterojunction solar cells. Qualified heterojunction solar cells, improve the quality of heterojunction solar cells, and package qualified heterojunction solar cells.
  • FIG. 4 is a schematic structural diagram of a heterojunction solar cell provided in the present application.
  • the heterojunction solar cell manufacturing method described above is prepared, including a back electrode 9, a TCO film layer 8 on the back side, an n-type amorphous silicon film layer 7, an intrinsic amorphous silicon film layer 6 on the back side, a silicon wafer 1, and a front side Intrinsic amorphous silicon film layer 2 , p-type amorphous silicon film layer 3 , front TCO film layer 4 , and front electrode 5 .
  • the present application also provides a heterojunction photovoltaic module, as shown in FIG.
  • the substrate 14 wherein the cell layer 12 includes a plurality of heterojunction solar cells connected in series and parallel in the above embodiments.
  • both the first adhesive film layer 11 and the second adhesive film layer 13 are EVA (Ethylene Vinyl Acetate Copolymer, ethylene-vinyl acetate copolymer) adhesive film layers.
  • EVA Ethylene Vinyl Acetate Copolymer, ethylene-vinyl acetate copolymer
  • the first adhesive film layer 11 and the second adhesive film layer 13 may both be POE adhesive film layers.
  • the first adhesive film layer 11 can be an anti-crack adhesive film layer.
  • the type of the second substrate 14 is not specifically limited, and can be selected by oneself.
  • the second substrate 14 may be a plexiglass substrate, a tempered glass substrate, an ultra-clear patterned glass substrate or the like.
  • the type of the first substrate 10 depends on the type of the heterojunction photovoltaic module, for example, when the heterojunction photovoltaic module is a single glass module, the first substrate 10 is the back plate, and when the heterojunction photovoltaic module is a double glass module , the first substrate 10 is a glass substrate.
  • the side of the second substrate is a vertical plane, it is very inconvenient to carry the heterojunction photovoltaic modules one by one.
  • the second substrate The side of the board is an inclined slope (inclines gradually approaching the center of the second substrate from top to bottom), and it is very convenient for the carrier to carry it by means of the inclined side.
  • each embodiment in this specification is described in a progressive manner, each embodiment focuses on the difference from other embodiments, and the same or similar parts of each embodiment can be referred to each other.
  • the description is relatively simple, and for the related information, please refer to the description of the method part.

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Abstract

Disclosed are a heterojunction solar cell and a manufacturing method therefor and a heterojunction photovoltaic module. The manufacturing method comprises: obtaining a silicon wafer having amorphous silicon film layers deposited on the front and back sides; depositing a TCO film layer on the surface of the amorphous silicon film layer on the front side; flipping the silicon wafer by 180 degrees, and covering the edge of the surface of the amorphous silicon film layer on the back side with a mask, wherein the width of the mask ranges from 0.05 mm to 0.5 mm, comprising endpoint values; depositing a TCO film layer on the surface of the amorphous silicon film layer covered with the mask; and manufacturing electrodes on the surfaces of the TCO film layers on the front and back sides to obtain the heterojunction solar cell. According to the present application, the TCO film layer is deposited on the surface of the amorphous silicon film layer on the front side, then the silicon wafer is flipped, the surface of the amorphous silicon film layer on the back side is covered with the mask, the width of the mask ranges from 0.05 mm to 0.5 mm, the shielding width of the mask is narrowed, the area of the TCO film layer on the back side is increased, and the efficiency of the cell is improved.

Description

异质结太阳能电池及其制作方法、异质结光伏组件Heterojunction solar cell and manufacturing method thereof, heterojunction photovoltaic module
本申请要求2021年8月17日提交的申请号为CN202110943834.6的中国专利申请的优先权,其全部内容通过引用的方式并入本申请中。This application claims the priority of the Chinese patent application with application number CN202110943834.6 filed on August 17, 2021, the entire contents of which are incorporated into this application by reference.
技术领域technical field
本申请涉及光伏技术领域,特别是涉及一种异质结太阳能电池及其制作方法、异质结光伏组件。The present application relates to the field of photovoltaic technology, in particular to a heterojunction solar cell, a manufacturing method thereof, and a heterojunction photovoltaic module.
背景技术Background technique
异质结太阳能电池具有双面对称结构和非晶硅层赋予的优秀的钝化效果,同时具有转换效率高、双面率高等特点,成为行业研究的热点。Heterojunction solar cells have a double-sided symmetric structure and excellent passivation effect endowed by the amorphous silicon layer. At the same time, they have the characteristics of high conversion efficiency and high double-sided ratio, and have become a hot spot in industry research.
异质结太阳能电池的正面和背面均有TCO(transparent conductive oxide,透明导电氧化物)膜层,目前在制备TCO膜层时采用物理气相沉积(Physical Vapor Deposition,PVD)方式进行沉积,将硅片放在镂空载板的凹坑里,镂空载板置于PVD设备中,PVD设备一次性进行正面和背面的TCO镀膜。由于硅片放置在载板的凹坑里,硅片背面四边边缘均有0.6mm左右的遮挡而没有TCO膜层,按照计算,约有1.4%的非晶硅膜层没有TCO膜层覆盖,导致此处产生的光生载流子无法有效导出,理论计算的效率损失在0.34%左右。There are TCO (transparent conductive oxide, transparent conductive oxide) film layers on the front and back of heterojunction solar cells. At present, physical vapor deposition (Physical Vapor Deposition, PVD) is used to deposit the TCO film layer, and the silicon wafer Put it in the pit of the hollow carrier board, and the hollow carrier board is placed in the PVD equipment, and the PVD equipment performs TCO coating on the front and back at one time. Since the silicon wafer is placed in the pit of the carrier board, the four edges of the back of the silicon wafer are covered by about 0.6mm and there is no TCO film layer. According to calculations, about 1.4% of the amorphous silicon film layer is not covered by the TCO film layer, resulting in The photogenerated carriers generated here cannot be effectively exported, and the theoretically calculated efficiency loss is about 0.34%.
发明内容Contents of the invention
本申请的目的是提供一种异质结太阳能电池及其制作方法、异质结光伏组件,以提升异质结太阳能电池的效率。The purpose of the present application is to provide a heterojunction solar cell, a manufacturing method thereof, and a heterojunction photovoltaic module, so as to improve the efficiency of the heterojunction solar cell.
本申请提供一种异质结太阳能电池制作方法,包括:The present application provides a method for manufacturing a heterojunction solar cell, including:
获得正面和背面均沉积有非晶硅膜层的硅片;Obtain a silicon wafer with an amorphous silicon film layer deposited on the front and back;
在位于所述正面的所述非晶硅膜层的表面沉积TCO膜层;Depositing a TCO film layer on the surface of the amorphous silicon film layer located on the front side;
将所述硅片翻转180度,并在位于所述背面的所述非晶硅膜层的表面的边缘覆盖掩膜;其中,所述掩膜的宽度在0.05mm~0.5mm之间,包括端点值;Turning the silicon wafer over 180 degrees, and covering the edge of the surface of the amorphous silicon film layer on the back side with a mask; wherein, the width of the mask is between 0.05 mm and 0.5 mm, including the endpoints value;
在覆盖有所述掩膜的所述非晶硅膜层的表面沉积TCO膜层;Depositing a TCO film layer on the surface of the amorphous silicon film layer covered with the mask;
分别在位于所述正面和所述背面的TCO膜层的表面制作电极,得到异质结太阳能电池。Electrodes are respectively made on the surfaces of the TCO film layers located on the front side and the back side to obtain a heterojunction solar cell.
在一些实施例中,在所述获得正面和背面均沉积有非晶硅膜层的硅片之前,还包括:In some embodiments, before obtaining the silicon wafer with the amorphous silicon film layer deposited on the front and the back, it also includes:
获得所述硅片;obtaining the wafer;
在所述硅片的所述正面和所述背面分别沉积本征非晶硅膜层;Depositing an intrinsic amorphous silicon film layer on the front side and the back side of the silicon wafer, respectively;
在位于所述正面的所述非晶硅膜层的表面沉积p型非晶硅膜层;Depositing a p-type amorphous silicon film layer on the surface of the amorphous silicon film layer located on the front side;
在位于所述背面的所述非晶硅膜层的表面沉积n型非晶硅膜层。An n-type amorphous silicon film layer is deposited on the surface of the amorphous silicon film layer located on the back side.
在一些实施例中,在所述获得所述硅片之后,还包括:In some embodiments, after said obtaining said silicon wafer, it also includes:
对所述硅片进行双面制绒处理。The silicon wafer is subjected to double-sided texturing treatment.
在一些实施例中,在所述分别在位于所述正面和所述背面的TCO膜层的表面制作电极之后,还包括:In some embodiments, after the electrodes are fabricated on the surfaces of the TCO film layers located on the front side and the back side respectively, it also includes:
进行EL测试和IV曲线测试,筛选出不合格的异质结太阳能电池。Perform EL test and IV curve test to screen out unqualified heterojunction solar cells.
本申请还提供一种异质结太阳能电池,所述异质结太阳能电池采用上述任一种所述的异质结太阳能电池制作方法制得。The present application also provides a heterojunction solar cell, which is manufactured by using any one of the heterojunction solar cell manufacturing methods described above.
本申请还提供一种异质结光伏组件,包括由下至上依次层叠的第一基板、第一胶膜层、电池层、第二胶膜层、第二基板,其中,所述电池层包括多片上述所述的异质结太阳能电池。The present application also provides a heterojunction photovoltaic module, including a first substrate, a first adhesive film layer, a battery layer, a second adhesive film layer, and a second substrate sequentially stacked from bottom to top, wherein the battery layer includes multiple sheet of the heterojunction solar cell described above.
在一些实施例中,所述第一胶膜层和所述第二胶膜层均为EVA胶膜层。In some embodiments, both the first adhesive film layer and the second adhesive film layer are EVA adhesive film layers.
在一些实施例中,所述第一胶膜层为抗隐裂胶膜层。In some embodiments, the first adhesive film layer is an anti-crack adhesive film layer.
在一些实施例中,所述第一基板为玻璃基板。In some embodiments, the first substrate is a glass substrate.
在一些实施例中,所述第二基板的侧面为向所述电池层倾斜的斜面。In some embodiments, the side surface of the second substrate is a slope inclined toward the battery layer.
本申请所提供的一种异质结太阳能电池制作方法,包括:获得正面和背面均沉积有非晶硅膜层的硅片;在位于所述正面的所述非晶硅膜层的表面沉积TCO膜层;将所述硅片翻转180度,并在位于所述背面的所述非晶硅膜层的表面沿边缘覆盖掩膜;其中,所述掩膜的宽度在 0.05mm~0.5mm之间,包括端点值;在覆盖有所述掩膜的所述非晶硅膜层的表面沉积TCO膜层;分别在位于所述正面和所述背面的TCO膜层的表面制作电极,得到异质结太阳能电池。A method for manufacturing a heterojunction solar cell provided by the present application includes: obtaining a silicon wafer with an amorphous silicon film layer deposited on the front and back; depositing TCO on the surface of the amorphous silicon film layer located on the front film layer; turn the silicon wafer 180 degrees, and cover the surface of the amorphous silicon film layer on the back side with a mask along the edge; wherein, the width of the mask is between 0.05 mm and 0.5 mm , including endpoint values; deposit a TCO film layer on the surface of the amorphous silicon film layer covered with the mask; make electrodes on the surface of the TCO film layer located at the front side and the back side respectively to obtain a heterojunction Solar battery.
可见,本申请中的异质结太阳能电池制作方法在得到正面和背面均沉积有非晶硅膜层的硅片后,先在位于正面的非晶硅膜层的表面沉积TCO膜层,然后翻转硅片使得硅片的背面朝上,在位于背面的非晶硅膜层的表面沿边缘覆盖掩膜,并在背面的非晶硅膜层表面沉积TCO膜层,最后制备电极,掩膜的遮挡实现正面和背面TCO膜层的电学隔离,同时使得异质结太阳能电池的对称性和外观都比较好,并且,掩膜的宽度在0.05mm~0.5mm之间,背面非晶硅膜层的遮挡宽度变窄,增加位于背面的TCO膜层的面积,从而提升异质结太阳能电池的效率。It can be seen that in the heterojunction solar cell manufacturing method in this application, after obtaining the silicon wafer with the amorphous silicon film layer deposited on the front and back, first deposit the TCO film layer on the surface of the amorphous silicon film layer on the front side, and then turn it over The silicon wafer makes the back of the silicon wafer face up, covering the surface of the amorphous silicon film layer on the back with a mask along the edge, and depositing a TCO film layer on the surface of the amorphous silicon film layer on the back, and finally preparing the electrode, the shielding of the mask Realize the electrical isolation of the front and back TCO film layers, and at the same time make the symmetry and appearance of the heterojunction solar cells better, and the width of the mask is between 0.05mm and 0.5mm, and the shielding of the back amorphous silicon film layer The width is narrowed, and the area of the TCO film layer on the back is increased, thereby improving the efficiency of the heterojunction solar cell.
此外,本申请还提供一种具有上述优点的异质结太阳能电池制作方法和异质结光伏组件。In addition, the present application also provides a method for manufacturing a heterojunction solar cell and a heterojunction photovoltaic module having the above-mentioned advantages.
附图说明Description of drawings
为了更清楚的说明本申请实施例或现有技术的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单的介绍,显而易见地,下面描述中的附图仅仅是本申请的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。In order to more clearly illustrate the technical solutions of the embodiments of the present application or the prior art, the accompanying drawings that need to be used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the accompanying drawings in the following description are only For some embodiments of the present application, those of ordinary skill in the art can also obtain other drawings based on these drawings without creative effort.
图1为本申请实施例所提供的一种异质结太阳能电池制作方法的流程图;FIG. 1 is a flow chart of a method for manufacturing a heterojunction solar cell provided in an embodiment of the present application;
图2为本申请实施例中覆盖掩膜后的俯视图;FIG. 2 is a top view after covering the mask in the embodiment of the present application;
图3为本申请实施例所提供的另一种异质结太阳能电池制作方法的流程图;Fig. 3 is a flow chart of another method for manufacturing a heterojunction solar cell provided by the embodiment of the present application;
图4为本申请所提供的一种异质结太阳能电池的结构示意图;FIG. 4 is a schematic structural view of a heterojunction solar cell provided by the present application;
图5为本申请所提供的一种异质结光伏组件的结构示意图。Fig. 5 is a schematic structural diagram of a heterojunction photovoltaic module provided by the present application.
具体实施方式Detailed ways
为了使本技术领域的人员更好地理解本申请方案,下面结合附图和具体实施方式对本申请作进一步的详细说明。显然,所描述的实施例仅仅是本申请的一部分实施例,而不是全部的实施例。基于本申请中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本申请保护的范围。In order to enable those skilled in the art to better understand the solution of the present application, the present application will be further described in detail below in conjunction with the drawings and specific implementation methods. Apparently, the described embodiments are only some of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.
在下面的描述中阐述了很多具体细节以便于充分理解本发明,但是本发明还可以采用其 他不同于在此描述的其它方式来实施,本领域技术人员可以在不违背本发明内涵的情况下做类似推广,因此本发明不受下面公开的具体实施例的限制。In the following description, a lot of specific details are set forth in order to fully understand the present invention, but the present invention can also be implemented in other ways different from those described here, and those skilled in the art can do it without departing from the meaning of the present invention. By analogy, the present invention is therefore not limited to the specific examples disclosed below.
正如背景技术部分所述,目前在制备TCO膜层时采用物理气相沉积方式进行沉积,将硅片放在镂空载板的凹坑里,镂空载板置于PVD设备中,PVD设备一次性进行正面和背面的TCO镀膜。由于硅片放置在载板的凹坑里,硅片背面四边边缘均有0.6mm左右的遮挡而没有TCO膜层,按照计算,约有1.4%的非晶硅膜层没有TCO膜层覆盖,导致此处产生的光生载流子无法有效导出,理论计算的效率损失在0.34%左右。As mentioned in the background technology section, physical vapor deposition is currently used to deposit the TCO film layer. The silicon wafer is placed in the pit of the hollow carrier, and the hollow carrier is placed in the PVD equipment. and TCO coating on the back. Since the silicon wafer is placed in the pit of the carrier board, the four edges of the back of the silicon wafer are covered by about 0.6mm and there is no TCO film layer. According to calculations, about 1.4% of the amorphous silicon film layer is not covered by the TCO film layer, resulting in The photogenerated carriers generated here cannot be effectively exported, and the theoretically calculated efficiency loss is about 0.34%.
TCO膜层主要包括In、Sb、Zn和Cd的氧化物及其复合多元氧化物薄膜材料。The TCO film layer mainly includes oxides of In, Sb, Zn and Cd and their composite multi-element oxide film materials.
有鉴于此,本申请提供了一种异质结太阳能电池制作方法,请参考图1,图1为本申请实施例所提供的一种异质结太阳能电池制作方法的流程图,该方法包括:In view of this, the present application provides a method for manufacturing a heterojunction solar cell, please refer to FIG. 1 , which is a flow chart of a method for manufacturing a heterojunction solar cell provided in an embodiment of the present application. The method includes:
步骤S101:获得正面和背面均沉积有非晶硅膜层的硅片。Step S101: Obtain a silicon wafer with amorphous silicon film layers deposited on both the front and back sides.
需要说明的是,硅片的正面为迎光面,背面为背光面。It should be noted that the front side of the silicon wafer is the light-facing side, and the back side is the backlight side.
硅片一般选择N型硅片,此时,正面的非晶硅膜层包括层叠的本征非晶硅膜层和p型非晶硅膜层,背面的非晶硅膜层包括层叠的本征非晶硅膜层和n型非晶硅膜层。Silicon wafers generally choose N-type silicon wafers. At this time, the amorphous silicon film layer on the front side includes the stacked intrinsic amorphous silicon film layer and the p-type amorphous silicon film layer, and the amorphous silicon film layer on the back includes the stacked intrinsic amorphous silicon film layer. An amorphous silicon film layer and an n-type amorphous silicon film layer.
步骤S102:在位于所述正面的所述非晶硅膜层的表面沉积TCO膜层。Step S102: Depositing a TCO film layer on the surface of the amorphous silicon film layer located on the front side.
需要指出的是,本步骤中只在正面的非晶硅膜层表面沉积TCO膜层。正面的非晶硅膜层表面的TCO膜层可以采用采用物理气相沉积方式沉积。It should be pointed out that in this step, the TCO film layer is only deposited on the surface of the front amorphous silicon film layer. The TCO film layer on the surface of the amorphous silicon film layer on the front side can be deposited by physical vapor deposition.
步骤S103:将所述硅片翻转180度,并在位于所述背面的所述非晶硅膜层的表面的边缘覆盖掩膜;其中,所述掩膜的宽度在0.05mm~0.5mm之间,包括端点值。Step S103: Flip the silicon wafer by 180 degrees, and cover the edge of the surface of the amorphous silicon film layer on the back with a mask; wherein, the width of the mask is between 0.05 mm and 0.5 mm , including the endpoint value.
结合图2所示,覆盖掩膜时需要进行精准对位,掩膜15的外侧边缘与非晶硅膜层(即n型非晶硅膜层7)的边缘对齐重合,覆盖掩膜后的俯视图如图2所示。As shown in FIG. 2, precise alignment is required when covering the mask. The outer edge of the mask 15 is aligned and coincident with the edge of the amorphous silicon film layer (ie, the n-type amorphous silicon film layer 7). The top view after covering the mask as shown in picture 2.
掩膜的作用是物理隔离,不需要去除。本申请中对掩膜的材料不做具体限定,只要能够起到隔离的作用即可,例如可以采用不锈钢等硬质材料。The mask is used for physical isolation and does not need to be removed. In this application, there is no specific limitation on the material of the mask, as long as it can play a role of isolation, for example, hard materials such as stainless steel can be used.
需要指出的是,本申请中对掩膜的宽度不做具体限定,可自行设置。例如,掩膜的宽度可以为0.08mm,0.1mm,0.15mm,0.20mm,0.25mm,0.28mm,0.30mm,0.34mm,0.37 mm,0.4mm,0.45mm,0.48mm,等等。It should be pointed out that the width of the mask is not specifically limited in this application, and can be set by itself. For example, the width of the mask can be 0.08mm, 0.1mm, 0.15mm, 0.20mm, 0.25mm, 0.28mm, 0.30mm, 0.34mm, 0.37mm, 0.4mm, 0.45mm, 0.48mm, and so on.
对于边长158.75mm的硅片,掩膜的宽度可以为0.1mm,也即相对的两条边的掩膜之间的间距为158.55mm;当硅片的边长增大时,例如,硅片的边长为166mm、210mm,掩膜的宽度也可以相应的增大。当硅片的边长为158.75mm,掩膜的宽度为0.1mm时,异质结太阳能电池的效率可以比目前相关技术制得的异质结太阳能电池提效0.3%左右。For a silicon wafer with a side length of 158.75mm, the width of the mask can be 0.1mm, that is, the distance between the masks of the two opposite sides is 158.55mm; when the side length of the silicon wafer increases, for example, the silicon wafer The side lengths of the mask are 166mm and 210mm, and the width of the mask can be increased accordingly. When the side length of the silicon wafer is 158.75mm and the width of the mask is 0.1mm, the efficiency of the heterojunction solar cell can be increased by about 0.3% compared with the heterojunction solar cell produced by the current related technology.
将硅片翻转180度,在步骤S102中,硅片的正面朝上,翻转后硅片的背面朝上。为了提高效率,使用机械传输设备对硅片进行翻转。当然,也可以采用人工的方式进行翻转,本申请中不做具体限定。The silicon wafer is turned over by 180 degrees. In step S102, the front side of the silicon wafer faces upward, and the back side of the silicon wafer faces upward after turning over. To improve efficiency, silicon wafers are flipped using a mechanical transfer device. Of course, manual flipping may also be used, which is not specifically limited in this application.
步骤S104:在覆盖有所述掩膜的所述非晶硅膜层的表面沉积TCO膜层。Step S104: Depositing a TCO film layer on the surface of the amorphous silicon film layer covered with the mask.
本步骤中TCO膜层可以采用采用物理气相沉积方式沉积。In this step, the TCO film layer can be deposited by physical vapor deposition.
步骤S105:分别在位于所述正面和所述背面的TCO膜层的表面制作电极,得到异质结太阳能电池。Step S105: making electrodes on the surfaces of the TCO film layers located on the front side and the back side respectively to obtain a heterojunction solar cell.
正面的电极和背面的电极均可以采用银电极,可以采用丝网印刷的方式印刷电极,并进行固化。Both the front electrode and the back electrode can use silver electrodes, and the electrodes can be printed by screen printing and cured.
本申请中的异质结太阳能电池制作方法在得到正面和背面均沉积有非晶硅膜层的硅片后,先在位于正面的非晶硅膜层的表面沉积TCO膜层,然后翻转硅片使得硅片的背面朝上,在位于背面的非晶硅膜层的表面沿边缘覆盖掩膜,并在背面的非晶硅膜层表面沉积TCO膜层,最后制备电极,掩膜的遮挡实现正面和背面TCO膜层的电学隔离,同时使得异质结太阳能电池的对称性和外观都比较好,并且,掩膜的宽度在0.05mm~0.5mm之间,背面非晶硅膜层的遮挡宽度变窄,增加位于背面的TCO膜层的面积,从而提升异质结太阳能电池的效率。In the manufacturing method of the heterojunction solar cell in this application, after obtaining the silicon wafer with the amorphous silicon film layer deposited on the front and back, first deposit the TCO film layer on the surface of the amorphous silicon film layer located on the front side, and then turn over the silicon wafer Make the back side of the silicon wafer face up, cover the surface of the amorphous silicon film layer on the back side with a mask along the edge, and deposit a TCO film layer on the surface of the amorphous silicon film layer on the back side, and finally prepare electrodes, and the shielding of the mask realizes the front side The electrical isolation from the TCO film layer on the back makes the symmetry and appearance of the heterojunction solar cell better, and the width of the mask is between 0.05mm and 0.5mm, and the shading width of the amorphous silicon film layer on the back becomes smaller. Narrow, increasing the area of the TCO film layer on the back, thereby improving the efficiency of heterojunction solar cells.
在上述实施例的基础上,在本申请的一个实施例中,在所述获得正面和背面均沉积有非晶硅膜层的硅片之前,还包括:On the basis of the above-mentioned embodiments, in one embodiment of the present application, before obtaining the silicon wafer with the amorphous silicon film layer deposited on the front and the back, it also includes:
获得所述硅片;obtaining the wafer;
在所述硅片的所述正面和所述背面分别沉积本征非晶硅膜层;Depositing an intrinsic amorphous silicon film layer on the front side and the back side of the silicon wafer, respectively;
在位于所述正面的所述非晶硅膜层的表面沉积p型非晶硅膜层;Depositing a p-type amorphous silicon film layer on the surface of the amorphous silicon film layer located on the front side;
在位于所述背面的所述非晶硅膜层的表面沉积n型非晶硅膜层。An n-type amorphous silicon film layer is deposited on the surface of the amorphous silicon film layer located on the back side.
本申请中对沉积本征非晶硅膜层的方法不做具体限定,可自行选择。例如,本征非晶硅膜层可以采用物理气相沉积方式,或者等离子体增强化学气相沉积方式等等。In this application, the method of depositing the intrinsic amorphous silicon film layer is not specifically limited, and can be selected by oneself. For example, the intrinsic amorphous silicon film layer can be deposited by physical vapor deposition, or plasma enhanced chemical vapor deposition, and so on.
p型非晶硅膜层和n型非晶硅膜层是分别先沉积一层本征非晶硅膜层,然后分别对本征非晶硅膜层进行掺杂得到对应的p型非晶硅膜层和n型非晶硅膜层。本申请中对掺杂的方式不做具体限定,例如,可以采用扩散的方式进行掺杂,或者采用离子注入的方式进行掺杂。The p-type amorphous silicon film layer and the n-type amorphous silicon film layer are respectively deposited a layer of intrinsic amorphous silicon film layer, and then respectively doped the intrinsic amorphous silicon film layer to obtain the corresponding p-type amorphous silicon film layer and n-type amorphous silicon film layer. The method of doping is not specifically limited in this application, for example, doping may be performed by diffusion or by ion implantation.
为了提高异质结太阳能电池的光电转换效率,在上述实施例的基础上,在本申请的一个实施例中在所述获得所述硅片之后,还包括:In order to improve the photoelectric conversion efficiency of the heterojunction solar cell, on the basis of the above-mentioned embodiments, in one embodiment of the present application, after the silicon wafer is obtained, it also includes:
对所述硅片进行双面制绒处理。The silicon wafer is subjected to double-sided texturing treatment.
需要指出的是,在双面制绒后需要对硅片进行清洗,以去除硅片表面的油污和杂质,然后再进行后续工艺。It should be pointed out that after the double-sided texturing, the silicon wafer needs to be cleaned to remove the oil and impurities on the surface of the silicon wafer, and then the subsequent process is carried out.
请参考图3,图3为本申请实施例所提供的另一种异质结太阳能电池制作方法的流程图。Please refer to FIG. 3 . FIG. 3 is a flow chart of another method for manufacturing a heterojunction solar cell provided in an embodiment of the present application.
步骤S201:获得所述硅片。Step S201: obtaining the silicon wafer.
步骤S202:对所述硅片进行双面制绒处理。Step S202: performing double-sided texturing on the silicon wafer.
步骤S203:在所述硅片的所述正面和所述背面分别沉积本征非晶硅膜层。Step S203: Depositing an intrinsic amorphous silicon film layer on the front side and the back side of the silicon wafer respectively.
步骤S204:在位于所述正面的所述非晶硅膜层的表面沉积p型非晶硅膜层。Step S204: depositing a p-type amorphous silicon film layer on the surface of the amorphous silicon film layer located on the front side.
步骤S205:在位于所述背面的所述非晶硅膜层的表面沉积n型非晶硅膜层。Step S205: Depositing an n-type amorphous silicon film layer on the surface of the amorphous silicon film layer located on the back side.
步骤S206:在位于所述正面的所述非晶硅膜层的表面沉积TCO膜层。Step S206: Depositing a TCO film layer on the surface of the amorphous silicon film layer located on the front side.
步骤S207:将所述硅片翻转180度,并在位于所述背面的所述非晶硅膜层的表面的边缘 覆盖掩膜;其中,所述掩膜的宽度在0.05mm~0.5mm之间,包括端点值。Step S207: Flip the silicon wafer by 180 degrees, and cover the edge of the surface of the amorphous silicon film layer on the back with a mask; wherein, the width of the mask is between 0.05 mm and 0.5 mm , including the endpoint value.
步骤S208:在覆盖有所述掩膜的所述非晶硅膜层的表面沉积TCO膜层。Step S208: Depositing a TCO film layer on the surface of the amorphous silicon film layer covered with the mask.
步骤S209:分别在位于所述正面和所述背面的TCO膜层的表面制作电极,得到异质结太阳能电池。Step S209: making electrodes on the surfaces of the TCO film layers located on the front side and the back side respectively to obtain a heterojunction solar cell.
步骤S210:进行EL测试和IV(电流-电压)曲线测试,筛选出不合格的异质结太阳能电池。Step S210: Perform EL test and IV (current-voltage) curve test to screen out unqualified heterojunction solar cells.
EL(Electroluminescent,电致发光)测试可以检测出异质结太阳能电池内部缺陷、隐裂、碎片、虚焊、断栅等异常现象,IV曲线测试得到异质结太阳能电池的IV曲线,筛选出不合格的异质结太阳能电池,提升异质结太阳能电池的品质,对合格的异质结太阳能电池进行包装。EL (Electroluminescent, electroluminescent) test can detect abnormal phenomena such as internal defects, hidden cracks, fragments, virtual soldering, and broken gates of heterojunction solar cells. Qualified heterojunction solar cells, improve the quality of heterojunction solar cells, and package qualified heterojunction solar cells.
本申请还提供一种异质结太阳能电池,请参考图4,图4为本申请所提供的一种异质结太阳能电池的结构示意图,所述异质结太阳能电池采用上述任一实施例所述的异质结太阳能电池制作方法制得,包括背面电极9、背面的TCO膜层8、n型非晶硅膜层7、背面的本征非晶硅膜层6、硅片1、正面的本征非晶硅膜层2、p型非晶硅膜层3、正面的TCO膜层4、正面电极5。The present application also provides a heterojunction solar cell, please refer to FIG. 4. FIG. 4 is a schematic structural diagram of a heterojunction solar cell provided in the present application. The heterojunction solar cell manufacturing method described above is prepared, including a back electrode 9, a TCO film layer 8 on the back side, an n-type amorphous silicon film layer 7, an intrinsic amorphous silicon film layer 6 on the back side, a silicon wafer 1, and a front side Intrinsic amorphous silicon film layer 2 , p-type amorphous silicon film layer 3 , front TCO film layer 4 , and front electrode 5 .
本申请还提供一种异质结光伏组件,如图5所示,包括由下至上依次层叠的第一基板10、第一胶膜层11、电池层12、第二胶膜层13、第二基板14,其中,所述电池层12包括多片串并联的上述实施例所述的异质结太阳能电池。The present application also provides a heterojunction photovoltaic module, as shown in FIG. The substrate 14, wherein the cell layer 12 includes a plurality of heterojunction solar cells connected in series and parallel in the above embodiments.
可选的,作为一种具体实施方式,所述第一胶膜层11和所述第二胶膜层13均为EVA(Ethylene Vinyl Acetate Copolymer,乙烯-醋酸乙烯共聚物)胶膜层。但是本申请中对此并不做具体限定,作为另一种具体实施方式,第一胶膜层11和第二胶膜层13还可以均为POE胶膜层。Optionally, as a specific embodiment, both the first adhesive film layer 11 and the second adhesive film layer 13 are EVA (Ethylene Vinyl Acetate Copolymer, ethylene-vinyl acetate copolymer) adhesive film layers. However, this application does not specifically limit it. As another specific implementation manner, the first adhesive film layer 11 and the second adhesive film layer 13 may both be POE adhesive film layers.
为了提升异质结光伏组件的性能,降低胶膜层发生隐裂的概率,所述第一胶膜层11可以 为抗隐裂胶膜层。In order to improve the performance of the heterojunction photovoltaic module and reduce the probability of cracks in the adhesive film layer, the first adhesive film layer 11 can be an anti-crack adhesive film layer.
本申请中对第二基板14的种类不做具体限定,可自行选择。例如,第二基板14可以为有机玻璃基板、钢化玻璃基板、超白压花玻璃基板等等。In this application, the type of the second substrate 14 is not specifically limited, and can be selected by oneself. For example, the second substrate 14 may be a plexiglass substrate, a tempered glass substrate, an ultra-clear patterned glass substrate or the like.
第一基板10的种类根据异质结光伏组件的类型而定,例如,当异质结光伏组件为单玻组件时,第一基板10为背板,当异质结光伏组件为双玻组件时,所述第一基板10为玻璃基板。The type of the first substrate 10 depends on the type of the heterojunction photovoltaic module, for example, when the heterojunction photovoltaic module is a single glass module, the first substrate 10 is the back plate, and when the heterojunction photovoltaic module is a double glass module , the first substrate 10 is a glass substrate.
异质结光伏组件在运输过程中会将多个堆叠起来,由于第二基板的侧面为垂直的平面,在一个一个搬运异质结光伏组件时非常不方便,为了便于搬运,所述第二基板的侧面为倾斜的斜面(自上至下以逐渐向第二基板的中心靠近的方式倾斜),搬运人员借助倾斜的侧面进行搬运,非常方便。During transportation, multiple heterojunction photovoltaic modules will be stacked. Since the side of the second substrate is a vertical plane, it is very inconvenient to carry the heterojunction photovoltaic modules one by one. In order to facilitate transportation, the second substrate The side of the board is an inclined slope (inclines gradually approaching the center of the second substrate from top to bottom), and it is very convenient for the carrier to carry it by means of the inclined side.
除非上下文明确说明,否则位于本文的元素或成份之前的不定冠词“一”、“一个”及“一种”旨在非限制性地说明所述元素或成份的数量。因此,“一”、“一个”及“一种”应理解为包括一个或至少一个,且所述元素或成分的单数词形也包括复数形式。Unless the context clearly dictates otherwise, the indefinite articles "a", "an" and "an" preceding an element or ingredient herein are intended to state a non-limiting quantity of said element or ingredient. Accordingly, "a", "an" and "an" should be read to include one or at least one, and singular forms of said elements or components also include plural forms.
在本说明书的描述中,参考术语“一个实施例”、“一些实施例”、“示例”、“具体示例”、或“一些示例”等的描述意指结合该实施例或示例描述的具体特征、结构、材料或者特点包含于本申请的至少一个实施例或示例中。在本说明书中,对上述术语的示意性表述不一定指的是相同的实施例或示例。而且,描述的具体特征、结构、材料或者特点可以在任何的一个或多个实施例或示例中以合适的方式结合。In the description of this specification, descriptions referring to the terms "one embodiment", "some embodiments", "example", "specific examples", or "some examples" mean that specific features described in connection with the embodiment or example , structure, material or characteristic is included in at least one embodiment or example of the present application. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
本说明书中各个实施例采用递进的方式描述,每个实施例重点说明的都是与其它实施例的不同之处,各个实施例之间相同或相似部分互相参见即可。对于实施例公开的装置而言,由于其与实施例公开的方法相对应,所以描述的比较简单,相关之处参见方法部分说明即可。Each embodiment in this specification is described in a progressive manner, each embodiment focuses on the difference from other embodiments, and the same or similar parts of each embodiment can be referred to each other. As for the device disclosed in the embodiment, since it corresponds to the method disclosed in the embodiment, the description is relatively simple, and for the related information, please refer to the description of the method part.
以上对本申请所提供的异质结太阳能电池及其制作方法、异质结光伏组件进行了详细介绍。本文中应用了具体个例对本申请的原理及实施方式进行了阐述,以上实施例的说明只是用于帮助理解本申请的方法及其核心思想。应当指出,对于本技术领域的普通技术人员来说, 在不脱离本申请原理的前提下,还可以对本申请进行若干改进和修饰,这些改进和修饰也落入本申请权利要求的保护范围内。The heterojunction solar cell and its manufacturing method, and the heterojunction photovoltaic module provided in the present application have been introduced in detail above. In this paper, specific examples are used to illustrate the principles and implementation methods of the present application, and the descriptions of the above embodiments are only used to help understand the methods and core ideas of the present application. It should be pointed out that those skilled in the art can make several improvements and modifications to the application without departing from the principle of the application, and these improvements and modifications also fall within the protection scope of the claims of the application.

Claims (11)

  1. 一种异质结太阳能电池制作方法,其特征在于,包括:A method for manufacturing a heterojunction solar cell, comprising:
    获得正面和背面均沉积有非晶硅膜层的硅片;Obtain a silicon wafer with an amorphous silicon film layer deposited on the front and back;
    在位于所述正面的所述非晶硅膜层的表面沉积TCO膜层;Depositing a TCO film layer on the surface of the amorphous silicon film layer located on the front side;
    将所述硅片翻转180度,并在位于所述背面的所述非晶硅膜层的表面的边缘覆盖掩膜;其中,所述掩膜的宽度在0.05mm~0.5mm之间,包括端点值;Turning the silicon wafer over 180 degrees, and covering the edge of the surface of the amorphous silicon film layer on the back side with a mask; wherein, the width of the mask is between 0.05 mm and 0.5 mm, including the endpoints value;
    在覆盖有所述掩膜的所述非晶硅膜层的表面沉积TCO膜层;Depositing a TCO film layer on the surface of the amorphous silicon film layer covered with the mask;
    分别在位于所述正面和所述背面的TCO膜层的表面制作电极,得到异质结太阳能电池。Electrodes are respectively made on the surfaces of the TCO film layers located on the front side and the back side to obtain a heterojunction solar cell.
  2. 如权利要求1所述的异质结太阳能电池制作方法,其特征在于,在所述获得正面和背面均沉积有非晶硅膜层的硅片之前,还包括:The method for manufacturing a heterojunction solar cell according to claim 1, further comprising:
    获得所述硅片;obtaining the wafer;
    在所述硅片的所述正面和所述背面分别沉积本征非晶硅膜层;Depositing an intrinsic amorphous silicon film layer on the front side and the back side of the silicon wafer, respectively;
    在位于所述正面的所述非晶硅膜层的表面沉积p型非晶硅膜层;Depositing a p-type amorphous silicon film layer on the surface of the amorphous silicon film layer located on the front side;
    在位于所述背面的所述非晶硅膜层的表面沉积n型非晶硅膜层。An n-type amorphous silicon film layer is deposited on the surface of the amorphous silicon film layer located on the back side.
  3. 如权利要求2所述的异质结太阳能电池制作方法,其特征在于,在所述获得所述硅片之后,还包括:The method for manufacturing a heterojunction solar cell according to claim 2, further comprising: after said obtaining said silicon wafer:
    对所述硅片进行双面制绒处理。The silicon wafer is subjected to double-sided texturing treatment.
  4. 如权利要求1至3任一项所述的异质结太阳能电池制作方法,其特征在于,在所述分别在位于所述正面和所述背面的TCO膜层的表面制作电极之后,还包括:The method for manufacturing a heterojunction solar cell according to any one of claims 1 to 3, further comprising:
    进行EL测试和IV曲线测试,筛选出不合格的异质结太阳能电池。Perform EL test and IV curve test to screen out unqualified heterojunction solar cells.
  5. 一种异质结太阳能电池,其特征在于,所述异质结太阳能电池采用如权利要求1至4任一项所述的异质结太阳能电池制作方法制得。A heterojunction solar cell, characterized in that the heterojunction solar cell is manufactured by the method for manufacturing a heterojunction solar cell according to any one of claims 1 to 4.
  6. 一种异质结光伏组件,其特征在于,包括由下至上依次层叠的第一基板.第一胶膜层.电池层.第二胶膜层.第二基板,其中,所述电池层包括多片如权利要求5所述的异质结太阳能电池。A heterojunction photovoltaic module, characterized in that it includes a first substrate, a first adhesive film layer, a battery layer, a second adhesive film layer, and a second substrate sequentially stacked from bottom to top, wherein the battery layer includes multiple The heterojunction solar cell as claimed in claim 5.
  7. 如权利要求6所述的异质结光伏组件,其特征在于,所述第一胶膜层和所述第二胶膜层均为EVA胶膜层。The heterojunction photovoltaic module according to claim 6, wherein the first adhesive film layer and the second adhesive film layer are both EVA adhesive film layers.
  8. 如权利要求6所述的异质结光伏组件,其特征在于,所述第一胶膜层为抗隐裂胶膜层。The heterojunction photovoltaic module according to claim 6, wherein the first adhesive film layer is an anti-crack adhesive film layer.
  9. 如权利要求6所述的异质结光伏组件,其特征在于,所述第一基板为玻璃基板。The heterojunction photovoltaic module according to claim 6, wherein the first substrate is a glass substrate.
  10. 如权利要求6至9任一项所述的异质结光伏组件,其特征在于,所述第二基板的侧面倾斜的斜面。The heterojunction photovoltaic module according to any one of claims 6 to 9, characterized in that, the side surface of the second substrate is inclined.
  11. 根据权利要求10所述的异质结光伏组件,其特征在于,所述第二基板的侧面自上至下逐渐向所述第二基板的中心靠近。The heterojunction photovoltaic module according to claim 10, wherein the side surface of the second substrate gradually approaches the center of the second substrate from top to bottom.
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