WO2022230952A1 - Led transfer member and method for manufacturing led device - Google Patents

Led transfer member and method for manufacturing led device Download PDF

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Publication number
WO2022230952A1
WO2022230952A1 PCT/JP2022/019137 JP2022019137W WO2022230952A1 WO 2022230952 A1 WO2022230952 A1 WO 2022230952A1 JP 2022019137 W JP2022019137 W JP 2022019137W WO 2022230952 A1 WO2022230952 A1 WO 2022230952A1
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Prior art keywords
led
transfer member
substrate
adhesive
mpa
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PCT/JP2022/019137
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French (fr)
Japanese (ja)
Inventor
一尊 本田
昌貴 西田
元雄 青山
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昭和電工マテリアルズ株式会社
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Publication of WO2022230952A1 publication Critical patent/WO2022230952A1/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages

Definitions

  • the present disclosure relates to an LED transfer member and a method for manufacturing an LED device.
  • a micro LED element After separating the micro LED element from the crystal growth substrate, the micro LED element is picked up and aligned, and then mounted on the substrate of the image display device.
  • a transfer member is attached to the surface of the crystal growth substrate on which the micro LED elements are formed.
  • the micro LED element separated from the crystal growth substrate is temporarily fixed to the surface of the transfer member to prevent scattering.
  • a micro LED element means an LED element having a side length of 100 ⁇ m or less.
  • the micro LED element Since the micro LED element is very small and thin, it is easily cracked and difficult to handle. When the micro LED element is fixed to the crystal growth substrate, it is difficult for cracks to occur. I have something to do. In addition, even if the transfer member can solve the above problems at the time of LLO, if it does not temporarily fix the micro LED element with an appropriate adhesive force, the micro LED element cannot be picked up from the transfer member and transferred to the substrate. Defects may occur. Also, the micro LED element fabricated on the crystal growth substrate is singulated by etching or the like. In order to manufacture more micro LED elements on the crystal growth substrate for the purpose of cost reduction, the interval between individual micro LED elements is generally set to a width of several tens of ⁇ m, which is very narrow.
  • the pick-up means when picking up the micro LED elements by the pick-up means, it is desirable that the intervals between the individual micro LED elements are widened. Furthermore, when mounting micro LED elements on a substrate of an image display device, for example, when red, blue, and green micro LED elements are arranged on the substrate, it is necessary to provide an interval of 100 ⁇ m or more between blue micro LED elements. be. When the micro LED elements are mounted on the substrate at intervals using a die mounter or the like, it may take a long time, resulting in low productivity.
  • the present disclosure has been made in view of the above-described conventional circumstances, and according to one aspect of the present disclosure, an LED transfer member excellent in transfer rate and stretchability of micro LED elements in a laser lift-off method, and using this LED transfer member
  • An object of the present invention is to provide a method for manufacturing an LED device that has
  • ⁇ 1> having a region on at least a part of the surface where the adhesive strength is reduced by light irradiation
  • An LED transfer member having a tensile strength of 1 MPa to 10 MPa at 50°C.
  • ⁇ 2> The LED relocating member according to ⁇ 1>, which has a substrate and an adhesive layer disposed on the substrate, wherein the adhesive layer is a region whose adhesive strength is reduced by light irradiation.
  • ⁇ 3> The LED relocating member according to ⁇ 1> or ⁇ 2>, wherein the adhesive strength of the region where the adhesive strength is reduced after light irradiation is 0.7 N/25 mm or less.
  • ⁇ 4> A method for manufacturing an LED device using the LED transfer member according to any one of ⁇ 1> to ⁇ 3>.
  • An optical device substrate having a crystal growth substrate, a buffer layer formed on the crystal growth substrate and an LED element formed on the buffer layer in a state of being divided into individual devices.
  • the surface of the LED transfer member according to any one of ⁇ 1> to ⁇ 3> on which the LED elements are formed is brought into contact with the optical device substrate by affixing the LED relocation member to form an affixed body; irradiating the buffer layer with laser light to destroy the buffer layer; transferring the LED element to the LED transfer member by separating the crystal growth substrate and the LED transfer member; expanding the distance between the LED elements transferred to the LED transfer member by extending the LED transfer member;
  • a method of manufacturing an LED device comprising irradiating the extended LED relocation member with light to reduce adhesive strength of the LED relocation member.
  • ⁇ 6> The method for manufacturing an LED device according to ⁇ 5>, wherein the length of the long side of the LED element is 100 ⁇ m or less.
  • an LED transfer member excellent in transfer rate and stretchability of micro LED elements in the laser lift-off method and a method for manufacturing an LED device using this LED transfer member.
  • FIG. 2 is a cross-sectional view of a transfer member 10 having a two-layer structure
  • FIG. 3 is a cross-sectional view of a transfer member 20 having a one-layer structure
  • 3 is a cross-sectional view of an optical device substrate 30;
  • FIG. It is a figure for demonstrating the manufacturing method of an LED device. It is a figure for demonstrating the manufacturing method of an LED device. It is a figure for demonstrating the manufacturing method of an LED device. It is a figure for demonstrating the manufacturing method of an LED device. It is a figure for demonstrating the manufacturing method of an LED device. It is a figure for demonstrating the manufacturing method of an LED device. It is a figure for demonstrating the manufacturing method of an LED device. It is a figure for demonstrating the manufacturing method of an LED device. It is a figure for demonstrating the manufacturing method of an LED device. It is a figure for demonstrating the manufacturing method of an LED device. It is a figure for demonstrating the manufacturing method of an LED device. It is a figure for
  • the term "process” includes a process that is independent of other processes, and even if the purpose of the process is achieved even if it cannot be clearly distinguished from other processes.
  • the numerical range indicated using "-" includes the numerical values before and after "-" as the minimum and maximum values, respectively.
  • the upper limit or lower limit of one numerical range may be replaced with the upper or lower limit of another numerical range described step by step.
  • the upper or lower limits of the numerical ranges may be replaced with the values shown in the examples.
  • each component may contain multiple types of applicable substances.
  • the content rate or content of each component is the total content rate or content of the multiple types of substances present in the composition unless otherwise specified. means quantity.
  • the term “layer” or “film” refers to the case where the layer or film is formed in the entire region when observing the region where the layer or film is present, and only a part of the region. It also includes the case where it is formed.
  • the term “laminate” indicates stacking layers, and two or more layers may be bonded, or two or more layers may be detachable.
  • (meth)acryloyl group means at least one of acryloyl group and methacryloyl group.
  • the average thickness of a layer or film is a value obtained by measuring the thickness of the target layer or film at five points and giving the arithmetic mean value.
  • the thickness of a layer or film can be measured using a micrometer or the like. In this disclosure, when the thickness of a layer or film can be measured directly, it is measured using a micrometer. On the other hand, when measuring the thickness of one layer or the total thickness of a plurality of layers, the thickness may be measured by observing the cross section of the object to be measured using an electron microscope.
  • the LED transfer member of the present disclosure has a region on at least a part of the surface where the adhesive force is reduced by light irradiation, and has a tensile strength of 1 MPa to 10 MPa at 50°C.
  • the LED transfer member of the present disclosure may be simply referred to as "transfer member”.
  • the micro LED transfer rate in the LLO method is excellent.
  • the LED transfer member of the present disclosure has a region where the adhesive force is reduced by light irradiation, and before light irradiation, the LED element attached to the region is more firmly held by the LED transfer member than after light irradiation, It becomes possible to separate the LED element from the substrate for crystal growth in the LLO method. In addition, the occurrence of cracks, misalignment, etc. due to a weak external force in the LLO method is suppressed. Therefore, the transfer rate from the crystal growth substrate to the LED transfer member is improved. On the other hand, after light irradiation, the adhesive strength of the area is lowered, so that the LED element temporarily fixed to the area can be easily picked up. Therefore, the transfer rate from the LED transfer member is improved.
  • the tensile strength of the transfer member at 50° C. is set to 1 MPa to 10 MPa. If the tensile strength of the transfer member at 50° C. is 1 MPa or more, the force for extending the distance between the micro LED elements transferred to the transfer member is sufficient when the transfer member is stretched, and the distance between the micro LED elements can be easily expanded. tend to be able. If the tensile strength of the transfer member at 50° C. is 10 MPa or less, the transfer member tends to be easily stretched by an expanding device or the like. The tensile strength of the transfer member at 50° C.
  • the tensile strength of the transfer member at 50°C is a value measured using a test piece with a width of 20 mm and a tensile tester at 50°C and a tensile speed of 5 mm/s.
  • the layer structure of the transfer member is not particularly limited, and may be a structure of one layer or two or more layers.
  • the material forming one surface of the transfer member and the material forming the other surface of the transfer member can be appropriately selected. power can be adjusted. Therefore, by increasing the adhesive strength of one surface of the transfer member and setting the other surface to exhibit no adhesive strength in the temperature range in which the LLO method is performed, the process adaptability of the transfer member can be improved.
  • the LED transfer member of the present disclosure will be described with reference to the drawings.
  • the LED transfer member of the present disclosure is not limited to the following embodiments.
  • the sizes of the members in each drawing are conceptual, and the relative relationship between the sizes of the members is not limited to this.
  • the same reference numerals are given to the same members, and redundant description may be omitted.
  • FIG. 1 is a cross-sectional view of a transfer member 10 having a two-layer structure.
  • the transfer member 10 has a base material 12 and an adhesive layer 14 arranged on the base material 12 .
  • the adhesive layer 14 corresponds to the region where the adhesive strength is reduced by light irradiation.
  • the base material 12 is polyester film such as polyethylene terephthalate film; polytetrafluoroethylene film, polyethylene film, polypropylene film, polymethylpentene film, polyvinyl acetate film, poly-4-methylpentene-1 or other ⁇ -olefin alone.
  • the substrate 12 is not limited to a single-layer film, and may be a multi-layer film obtained by combining two or more of the above plastic films or two or more of the same type of plastic films.
  • the substrate 12 is preferably a polyolefin film or a urethane resin film.
  • the substrate 12 may contain various additives such as an antiblocking agent, if necessary.
  • the average thickness of the base material 12 may be appropriately set as required.
  • the average thickness of the base material 12 is preferably 50 ⁇ m to 500 ⁇ m. If the average thickness of the base material 12 is 50 ⁇ m or more, there is a tendency that the deterioration of the extensibility of the transfer member is suppressed. If the average thickness of the base material 12 is 500 ⁇ m or less, the strain of the transfer member tends to be suppressed when the transfer member is stretched. As long as there is no problem with the handling of the transfer member, the thickness of the substrate 12 is preferably thin from the viewpoint of cost, more preferably 50 ⁇ m to 400 ⁇ m, even more preferably 50 ⁇ m to 300 ⁇ m.
  • the average thickness of the base material 12 is preferably a thickness that does not hinder the transmission of high energy rays when a high energy ray (in particular, ultraviolet) curable adhesive is used as the adhesive constituting the adhesive layer 14 . From such a point of view, the thickness is preferably 50 ⁇ m to 500 ⁇ m, more preferably 50 ⁇ m to 300 ⁇ m.
  • the substrate 12 is composed of a plurality of film-like substrates as described above, it is preferable to adjust the average thickness of the entire substrate 12 within the above range.
  • the base material 12 may be chemically or physically surface-treated as necessary in order to improve adhesion with the adhesive layer 14 .
  • the surface treatments include, for example, corona treatment, chromic acid treatment, ozone exposure, flame exposure, high voltage shock exposure, and ionizing radiation treatment.
  • the adhesive layer 14 is not particularly limited as long as it has a characteristic that the adhesive strength is reduced by light irradiation.
  • the adhesive layer 14 is preferably composed of an adhesive component that has adhesive strength to the LED element on the crystal growth substrate at 25°C.
  • the base resin of the adhesive component that constitutes the adhesive layer 14 include acrylic resins, various synthetic rubbers, natural rubbers, polyimide resins, and the like. Among these, acrylic resins are preferred.
  • the base resin preferably has a functional group such as a hydroxyl group or a carboxyl group that can react with the cross-linking agent described below.
  • a (meth)acryloyl group may be introduced into the base resin using a functional group such as a hydroxyl group or a carboxyl group contained in the base resin as a starting point.
  • a (meth)acryloyl group may be introduced into the base resin by reacting the hydroxyl group contained in the base resin with a compound containing a hydroxyl group-reactive functional group such as 2-methacryloxyethyl isocyanate and a (meth)acryloyl group.
  • a (meth)acryloyl group may be introduced into the base resin by reacting the carboxyl group contained in the base resin with a compound containing a functional group capable of reacting with the carboxyl group such as glycidyl methacrylate and a (meth)acryloyl group.
  • a curable resin is used as the base resin, the adhesive strength of the adhesive layer 14 can be reduced by curing the base resin by light irradiation.
  • the adhesive component may contain a cross-linking agent capable of cross-linking reaction with the functional group of the base resin.
  • the type of cross-linking agent is not particularly limited, and can be selected according to the type of base resin and the like. Specifically, isocyanate cross-linking agents, melamine cross-linking agents, peroxide cross-linking agents, metal alkoxide cross-linking agents, metal chelate cross-linking agents, metal salt cross-linking agents, carbodiimide cross-linking agents, oxazoline cross-linking agents, aziridine cross-linking agents, amine cross-linking agents, etc. is mentioned.
  • cross-linking agents may be used alone or in combination of two or more.
  • isocyanate cross-linking agents are preferred from the viewpoint of stable adhesion properties. If the reaction rate between the base resin and the cross-linking agent is slow, catalysts such as amines and tin-based compounds may be used as necessary.
  • the isocyanate cross-linking agent is not particularly limited, and can be selected from known compounds having an isocyanate group (isocyanate compounds). From the viewpoint of reactivity, bifunctional isocyanate compounds (compounds having two isocyanate groups) and polyfunctional isocyanates (compounds having three or more isocyanate groups) are preferred, and polyfunctional isocyanate compounds are more preferred.
  • the adhesive component may appropriately contain optional ingredients such as rosin-based, terpene resin-based tackifiers, and various surfactants.
  • the adhesive layer 14 may contain a photopolymerization initiator so that the base resin is cured by light irradiation.
  • the photopolymerization initiator is not particularly limited as long as it can be decomposed by light irradiation to generate radicals to initiate polymerization of the base resin.
  • the type and content of the photopolymerization initiator are appropriately selected in consideration of the wavelength of light applied to the adhesive layer 14, the intensity of light, the amount of (meth)acryloyl groups contained in the base resin, and the like.
  • the content of the component having a boiling point or sublimation point of 100 ° C. or less is set in the entire adhesive layer 14. is preferably 5% by mass or less, more preferably 3% by mass or less, and even more preferably 1.5% by mass or less.
  • the boiling point or sublimation point of each component contained in the adhesive layer 14 can be determined, for example, by thermogravimetry.
  • the average thickness of the adhesive layer 14 is preferably 1 ⁇ m to 100 ⁇ m, more preferably 2 ⁇ m to 50 ⁇ m, even more preferably 5 ⁇ m to 40 ⁇ m. By setting the average thickness of the adhesive layer to 1 ⁇ m or more, it is possible to ensure sufficient adhesive strength with the LED element. On the other hand, from the viewpoint of economy, the average thickness of the adhesive layer 14 is preferably 100 ⁇ m or less.
  • the adhesive strength of the adhesive layer 14 after light irradiation is preferably 0.7 N/25 mm or less, more preferably 0.5 N/25 mm or less, from the viewpoint of suppressing a decrease in the transfer rate of the LED elements from the transfer member. is more preferably 0.4 N/25 mm or less, and particularly preferably 0.3 N/25 mm or less.
  • the adhesive strength of the adhesive layer 14 after light irradiation may be 0.01 N/25 mm or more from the viewpoint of suppressing the occurrence of positional displacement of the LED elements.
  • the adhesive strength of the adhesive layer 14 before light irradiation is preferably 0.8 N/25 mm or more, and preferably 1.0 N/25 mm or more, from the viewpoint of stably holding the LED element by the adhesive layer 14 in the LLO process. is more preferable, and 1.2 N/25 mm or more is even more preferable.
  • the adhesive strength of the adhesive layer 14 before light irradiation may be 5.0 N/25 mm or less.
  • the adhesive strength of the adhesive layer 14 refers to the peel strength with SUS. Adhesive strength refers to a value obtained by measuring peel strength by a method conforming to JIS C 5016:1994 (conductor peeling strength).
  • FIG. 2 is a cross-sectional view of the transfer member 20 having a one-layer structure.
  • the transfer member 20 as a whole corresponds to a region where the adhesive strength is reduced by light irradiation.
  • the component constituting the transfer member 20 having a one-layer structure may be the same component as the adhesive layer 14 constituting the transfer member 10 shown in FIG. Since the transfer member 20 does not have a base material, it is preferable that the components constituting the transfer member 20 have higher mechanical strength than the adhesive layer 14 in order to improve the strength of the transfer member 20 itself. . For example, it is preferable to increase the amount of the cross-linking agent added or the amount of the catalyst added compared to the adhesive layer 14 .
  • a frame-shaped structure for reinforcing the transferable member 20 may be arranged on the periphery of the transferable member 20 .
  • the method of manufacturing the transfer member is not particularly limited, and the transfer member can be manufactured according to techniques known in the art.
  • the two-layer transfer member 10 can be manufactured according to the following method.
  • a coating liquid containing the components of the adhesive layer and a solvent is applied by a knife coating method, a roll coating method, a spray coating method, a gravure coating method, a bar coating method, a curtain coating method, or the like, and the solvent is removed.
  • a sticky layer is formed by removal.
  • the solvent is preferably removed by heating at 50° C. to 200° C. for 0.1 minute to 90 minutes.
  • the drying conditions are preferably such that the organic solvent in the adhesive layer evaporates up to 1.5% by mass or less, provided that voids are not generated in the coating and drying steps and the adjustment of the viscosity of the coating solution is not affected.
  • the prepared protective film with an adhesive layer and the base material are laminated under a temperature condition of room temperature to 60 ° C. so that the adhesive layer and the base material face each other, and are laminated using a roll laminator or the like.
  • a transfer member having a layer structure can be obtained.
  • the protective film is removed when the transfer member 10 is used. Further, by peeling the protective film from the adhesive layer-attached protective film, a transfer member having a single-layer structure can be obtained.
  • films that can be suitably used as protective films include A-63 (release agent: modified silicone) manufactured by Teijin DuPont Films Limited, and A-31 (release agent: modified silicone) manufactured by Teijin DuPont Films Limited. Pt-based silicone) and the like.
  • the average thickness of the protective film is appropriately selected within a range that does not impair workability, and is usually preferably 100 ⁇ m or less from an economical point of view.
  • the average thickness of the protective film is more preferably in the range of 10 ⁇ m to 75 ⁇ m, still more preferably 25 ⁇ m to 50 ⁇ m. If the average thickness of the protective film is 10 ⁇ m or more, troubles such as tearing of the protective film during production of the transfer member tend not to occur. Further, when the average thickness of the protective film is 100 ⁇ m or less, the protective film tends to be easily peeled off when the transfer member is used.
  • the manufacturing method of the LED device of the present disclosure uses the LED transfer member of the present disclosure.
  • the manufacturing method of the LED device of the present disclosure is not particularly limited as long as it uses the LED transfer member of the present disclosure. Since the LED transfer member of the present disclosure has a region on at least a part of the surface in which the adhesive strength is reduced by light irradiation, the method for manufacturing an LED device of the present disclosure reduces the adhesive strength of the transfer member at any stage. It is preferable to irradiate light as much as possible.
  • One embodiment of the method for manufacturing an LED device of the present disclosure includes, for example, a crystal growth substrate, a buffer layer formed on the crystal growth substrate in a state of being divided into individual devices, and a buffer layer formed on the buffer layer. and the side of the optical device substrate on which the LED elements are formed is brought into contact with the surface of the LED transfer member of the present disclosure on the side having the region where the adhesive strength is reduced, and the optical device substrate
  • the LED relocating member is affixed to form an affixed body
  • the buffer layer is irradiated with laser light to break the buffer layer
  • the crystal growth substrate and the LED relocating member are separated by separating the moving the LED element to the LED moving member, extending the LED moving member to extend the distance between the LED elements moved to the LED moving member, irradiating the extended LED moving member with light, It may include reducing the adhesive force of the LED transfer member.
  • the manufacturing method of the LED device of the present disclosure is suitable for manufacturing a micro LED element having a long side length of 100
  • FIG. 3 is a cross-sectional view of the optical device substrate 30.
  • the optical device substrate 30 includes a crystal growth substrate 32, a buffer layer 34 formed on the crystal growth substrate 32 in a state of being divided into individual devices, and LED elements (micrometers) formed on the buffer layer 34. LED element) 36.
  • the crystal growth substrate 32 serves as a base for forming the LED elements 36 on its surface.
  • the crystal growth substrate 32 include sapphire (AlO), SiC, Si, GaAs, GaN, MgAl 2 O 4 and the like. From the viewpoint of crystal growth, sapphire, SiC, Si, GaN substrates, and the like are preferable for crystal formation of GaN-based semiconductors used for blue LEDs.
  • a GaAs substrate is preferable from the viewpoint of crystal growth.
  • the buffer layer 34 is a layer that is destroyed by laser light irradiation, and functions as a separation layer for separating the LED element 36 from the crystal growth substrate 32 .
  • the components constituting the buffer layer 34 are appropriately selected in consideration of the components of the crystal growth substrate 32 and the LED elements 36 . Also, the method of forming the buffer layer 34 is not particularly limited.
  • the LED element 36 is responsible for the light emission characteristics of the micro LED, and the LPE method (Liquid Phase Epitaxy) and the MOVPE method (Metal Organic Vapor Phase Epitaxy) are formed on the crystal growth substrate 32. growth method), molecular beam epitaxy (MBE), or the like.
  • the components of the LED element 36 are, for example, aluminum gallium arsenide (AlGaAs): red, gallium arsenide phosphide (GaAsP): red/orange/yellow, and indium gallium nitride (InGaN)/gallium nitride (GaN)/aluminum gallium nitride (AlGaN).
  • GaP gallium phosphide
  • ZnSe zinc selenide
  • AlGaInP aluminum indium gallium phosphide
  • a bump 38 that is a conductive protrusion may be provided on the LED element 36 .
  • As the material of the bumps gold, silver, copper, tin-silver-based, tin-lead-based, tin-bismuth-based, tin-copper-based solders, tin, nickel, indium, etc. are used as main components.
  • Bump 38 may be composed of a single component or multiple components. When bumps 38 are composed of a plurality of components, these metal components may be formed so as to form a laminated structure.
  • the transfer member 10 is attached to the optical device substrate 30 by bringing the adhesive layer 14 side of the transfer member 10 into contact with the side of the optical device substrate 30 on which the LED elements 36 are formed. A patch 40 is obtained by sticking.
  • the method of adhering the transfer member 10 to the optical device substrate 30 is not particularly limited, and conventionally known lamination methods can be used. Examples of the lamination method include a lamination method using a roll laminator, a diaphragm type laminator, a vacuum roll laminator, a vacuum diaphragm type laminator, and the like.
  • Lamination conditions may be appropriately set depending on the physical properties and characteristics of the optical device substrate 30 and the transfer member 10 .
  • the lamination temperature is preferably room temperature (25°C) to 200°C, more preferably room temperature (25°C) to 150°C, and even more preferably room temperature (25°C) to 100°C. If the lamination temperature is 25° C. or higher, the transfer member 10 can be firmly adhered to the optical device substrate 30, so the transfer member 10 and the crystal growth substrate 32 are separated after irradiating the buffer layer 34 with laser light. In this case, the separation of the LED element 36 from the transfer member 10 and the occurrence of positional deviation of the LED element 36 tend to be prevented.
  • the lamination temperature is 200° C. or less, a difference in thermal expansion between the transfer member 10 and the optical device substrate 30 is unlikely to occur, and distortion, sagging, etc. due to low elasticity of the base material 12 constituting the transfer member 10 are unlikely to occur. Therefore, there is a tendency to prevent the LED element 36 from being displaced.
  • the temperature conditions are the same as those of the roll-type laminator described above.
  • the crimping time is preferably 5 seconds to 300 seconds, more preferably 5 seconds to 200 seconds, even more preferably 5 seconds to 100 seconds.
  • the transfer member 10 can be firmly attached to the optical device substrate 30, so the transfer member 10 and the crystal growth substrate 32 are separated after the buffer layer 34 is irradiated with the laser light. In this case, the separation of the LED element 36 from the transfer member 10 and the occurrence of positional deviation of the LED element 36 tend to be prevented. If the crimping time is 200 seconds or less, the productivity of LED devices tends to improve.
  • the lamination pressure is preferably 0.1 MPa to 3 MPa, more preferably 0.1 MPa to 2 MPa, even more preferably 0.1 MPa to 1 MPa.
  • the transfer member 10 can be firmly attached to the optical device substrate 30, so that the transfer member 10 and the crystal growth substrate 32 are separated after the buffer layer 34 is irradiated with the laser light. In this case, the separation of the LED element 36 from the transfer member 10 and the positional deviation of the LED element 36 tend to be prevented. If the lamination pressure is 3 MPa or less, damage to the LED elements 36 due to the bonding pressure applied to the LED elements 36 is prevented, and the occurrence of cracks and the like tends to be suppressed.
  • the buffer layer 34 is irradiated with laser light 50 .
  • the buffer layer 34 is irradiated with the laser light 50 from the opposite side of the optical device substrate 30 where the LED elements 36 are formed, but the irradiation direction of the laser light 50 is particularly limited.
  • the buffer layer 34 may be irradiated with the laser light 50 from the substrate 12 side of the transfer member 10 . By irradiating the buffer layer 34 with the laser light 50, the buffer layer 34 is destroyed.
  • lasers examples include lamp-excited lasers (xenon flash lamps, etc.) using a discharge lamp as an excitation light source, diode-excited lasers (LD-excited) excited by an LD (laser diode), and the like.
  • the medium includes solids, gases, semiconductors, etc.
  • YAG lasers using a YAG rod composed of yttrium (Y), aluminum (A), and garnet (G)
  • excimer lasers are used for gases (gas).
  • Laser CO2 laser, etc.
  • Diode-pumped lasers generally use solid-state lasers (diode-pumped solid-state lasers: DPSS lasers) (DPSS: Diode Pumping Solid-State).
  • a DPSS laser is preferable to an excimer laser because it is inexpensive and easy to maintain.
  • the crystal growth substrate 32 and the transfer member 10 are separated.
  • the LED elements 36 formed on the crystal growth substrate 32 are transferred while being adhered to the adhesive layer 14 of the transfer member 10 .
  • the transfer member 10 is stretched.
  • the transfer member 10 is extended in the planar direction of the transfer member indicated by the arrow in FIG.
  • the interval between the LED elements 36 is widened in the planar direction of the transfer member. Since the LED elements 36 are stuck to the adhesive layer 14 of the transfer member 10 when the transfer member 10 is extended, the separation of the LED elements 36 from the transfer member 10 and the displacement of the LED elements 36 do not occur. It tends to be prevented from occurring.
  • a method for stretching the transfer member 10 is not particularly limited, and includes, for example, a push-up method and a pulling method.
  • the push-up method is a method in which the transfer member 10 is stretched by raising a stage having a predetermined shape after fixing the transfer member 10 .
  • the pulling method is a method in which the moving member 10 is stretched by pulling in a predetermined direction in parallel with the moving member 10 that has been set after fixing the moving member 10 .
  • the push-up method is preferable because the space between the LED elements 36 can be uniformly extended and the device area required (occupied) is small and compact.
  • the stretching conditions may be appropriately set according to the characteristics of the transfer member 10 .
  • the amount of pushing up or pulling is preferably 10 mm to 500 mm, more preferably 10 mm to 300 mm. If the amount of push-up or the amount of pull is 10 mm or more, there is a tendency that the interval between the LED elements 36 can be sufficiently extended. If the thrust amount or the pull amount is 500 mm or less, scattering of the LED elements 36, positional displacement, etc. tend to be prevented.
  • the temperature during stretching may be appropriately set according to the characteristics of the transfer member 10 .
  • the temperature during stretching is, for example, preferably 10°C to 200°C, more preferably 10°C to 150°C, even more preferably 20°C to 100°C. If the temperature during stretching is 10° C.
  • the stretching speed may be appropriately set according to the characteristics of the transfer member 10 .
  • the stretching speed is preferably 0.1 mm/sec to 500 mm/sec, more preferably 0.1 mm/sec to 300 mm/sec, and even more preferably 0.1 mm/sec to 200 mm/sec. If the stretching speed is 0.1 mm/sec or more, deterioration of productivity tends to be suppressed. If the drawing speed is 500 mm/sec or less, scattering of the LED elements 36 tends to be suppressed.
  • the transfer member 10 is irradiated with light. As a result, the adhesive strength of the adhesive layer 14 on the transfer member 10 is reduced, making it easier to pick up the LED element 36 from the transfer member 10 .
  • the LED element 36 is picked up from the transfer member 10 using the pickup means 52, and as shown in FIG. After mounting, the bumps 38 and the pads 56 are bonded to manufacture the micro LED.
  • the mounting board 54 on which the LED element 36 is mounted is not particularly limited as long as it is a normal circuit board.
  • the mounting substrate 54 is mainly composed of glass, glass epoxy, polyester, ceramic, epoxy, bismaleimide triazine, polyimide, or the like, and a wiring pattern is formed by removing unnecessary portions of a metal layer formed on the surface of the substrate by etching.
  • substrate, a substrate having a wiring pattern formed on its surface by metal plating or the like, a substrate having a wiring pattern formed by printing a conductive substance on its surface, and the like can be used.
  • the surface of the wiring pattern including the pads 56 on the mounting board 54 is mainly composed of gold, silver, copper, tin-silver-based, tin-lead-based, tin-bismuth-based, tin-copper-based solder, tin , nickel, indium tin oxide (ITO), indium, or the like.
  • the wiring pattern may consist of only a single component, or may consist of a plurality of components.
  • the wiring pattern may have a structure in which a plurality of metal layers are laminated.
  • Methods for picking up the LED element 36 include a method of picking up the LED element 36 using a pick-up tool such as a flip chip bonder and a die mounter with an air pressure difference, and a pick-up method of providing an adhesive on the pick-up tool and picking up with an adhesive force. After being picked up, the LED elements 36 are aligned and mounted on the pads 56 provided on the mounting substrate 54 . The LED element 36 may be picked up using a roller or the like provided with an adhesive.
  • a carrier can also be used when picking up the LED element 36 from the transfer member 10 .
  • the crystal growth substrate 32 and the transfer member 10 are separated, and then the transfer member 10 is extended as shown in FIG. 7. After that, as shown in FIG. A carrier 60 is adhered to the surface of the transferred side. Light irradiation to the transferable member 10 may be performed after the transferable member 10 is stretched, and may be applied before or after the carrier 60 is adhered to the transferable member 10 .
  • the carrier 60 and the transfer member 10 are separated.
  • the LED element 36 is transferred to the carrier 60 .
  • the LED elements 36 transferred to the carrier 60 are mounted on the pads 56 provided on the mounting board 54, and the bumps 38 and the pads 56 are bonded to manufacture the micro LED.
  • the method of transferring the LED elements 36 to the carrier 60 is not particularly limited, and conventionally known lamination methods can be used.
  • the lamination method include a lamination method using a roll laminator, a diaphragm type laminator, a vacuum roll laminator, a vacuum diaphragm type laminator, and the like.
  • Lamination conditions may be appropriately set depending on the physical properties and characteristics of the carrier 60 and the transfer member 10 .
  • the lamination temperature is preferably room temperature (25°C) to 200°C, more preferably room temperature (25°C) to 150°C, and even more preferably room temperature (25°C) to 100°C. If the lamination temperature is 25° C. or higher, the carrier 60 can be firmly attached to the transfer member 10 , so when the carrier 60 and the transfer member 10 are separated, the LED element 36 can be removed from the transfer member 10 or the carrier 60 . This tends to prevent the occurrence of separation, positional deviation of the LED element 36, and the like. If the lamination temperature is 200° C.
  • the temperature conditions are the same as those of the roll-type laminator described above.
  • the crimping time is preferably 5 seconds to 300 seconds, more preferably 5 seconds to 200 seconds, even more preferably 5 seconds to 100 seconds.
  • the lamination pressure is preferably 0.1 MPa to 3 MPa, more preferably 0.1 MPa to 2 MPa, even more preferably 0.1 MPa to 1 MPa.
  • the carrier 60 can be firmly attached to the transfer member 10, so that when the carrier 60 and the transfer member 10 are separated, the LED element 36 cannot be removed from the transfer member 10 or the carrier 60. Detachment, displacement of the LED element 36, and the like tend to be prevented. If the lamination pressure is 3 MPa or less, damage to the LED elements 36 due to the bonding pressure applied to the LED elements 36 is prevented, and the occurrence of cracks and the like tends to be suppressed.
  • the carrier 60 is not particularly limited as long as it can withstand the temperature and pressure at the time of attachment, prevents the LED elements 36 from being damaged, and maintains the distance between the LED elements 36 .
  • Carrier 60 is preferably heat resistant to withstand the lamination temperatures described above.
  • the material of the carrier 60 is not particularly limited, but examples thereof include silicon, glass, SUS, iron, Cu plates, glass epoxy substrates, and the like.
  • the average thickness of the carrier 60 is preferably 100 ⁇ m to 5 mm, more preferably 100 ⁇ m to 4 mm, even more preferably 100 ⁇ m to 3 mm. If the average thickness of the carrier 60 is 100 ⁇ m or more, the handleability is improved. Even if the carrier 60 is thick, it is not expected that the handling efficiency will be significantly improved.
  • the carrier 60 may consist of multiple layers. In addition to the layer responsible for heat resistance and handleability described above, there may be a layer laminated with an adhesive layer or a temporary fixing material from the viewpoint of imparting adhesion control.
  • the adhesive force may be set as appropriate. From the viewpoint of transferability of the LED elements 36 from the transfer member 10 to the carrier 60, the adhesive strength imparted to the carrier 60 is preferably higher than the adhesive strength of the adhesive layer 14 after light irradiation.
  • the method of mounting the LED elements 36 from the carrier 60 to the mounting board 54 is not particularly limited, and conventionally known lamination methods can be used.
  • Examples of the lamination method include a lamination method using a roll laminator, a diaphragm type laminator, a vacuum roll laminator, a vacuum diaphragm type laminator, and the like.
  • the lamination conditions may be appropriately set according to the physical properties and characteristics of the carrier 60, the mounting board 54 and the LED element 36.
  • An underfill material may be supplied on the mounting board 54 in advance for the purpose of protecting the bumps 38, protecting the connecting portions between the bumps 38 and the mounting board 54, improving the reliability of the micro LED, and the like.
  • the underfill material is supplied, the LED elements 36 are easily fixed to the mounting substrate 54, and the positional deviation of the LED elements 36 tends to be less likely to occur.
  • the lamination temperature is preferably room temperature (25°C) to 200°C, more preferably room temperature (25°C) to 150°C, and even more preferably room temperature (25°C) to 100°C. If the lamination temperature is 25° C. or higher, the LED element 36 can be firmly fixed to the mounting board 54 , so when the carrier 60 and the mounting board 54 are separated, the LED element 36 does not detach from the mounting board 54 . This tends to prevent occurrence of positional displacement of the element 36 and the like. If the lamination temperature is 200° C.
  • the crimping time is preferably 5 seconds to 300 seconds, more preferably 5 seconds to 200 seconds, even more preferably 5 seconds to 100 seconds. If the crimping time is 5 seconds or more, the LED element 36 can be firmly fixed to the mounting board 54, so when the carrier 60 and the mounting board 54 are separated, the LED element 36 is detached from the mounting board 54, and the LED This tends to prevent occurrence of positional displacement of the element 36 and the like.
  • the lamination pressure is preferably 0.1 MPa to 3 MPa, more preferably 0.1 MPa to 2 MPa, even more preferably 0.1 MPa to 1 MPa. If the lamination pressure is 0.1 MPa or more, the LED element 36 can be firmly fixed to the mounting substrate 54, so when the carrier 60 and the mounting substrate 54 are separated, the LED element 36 does not detach from the mounting substrate 54, This tends to prevent the occurrence of positional deviation of the LED element 36 and the like. If the lamination pressure is 3 MPa or less, damage to the LED element 36 due to the pressure applied to the LED element 36 is prevented, and the occurrence of cracks and the like tends to be suppressed.
  • SD-8022 / DP-8020 / RI-8020 manufactured by Tosoh Corporation is used, Gelpack GL-A150-S / GL-A160-S manufactured by Showa Denko Materials Co., Ltd. is used for the column, and tetrahydrofuran is used as the eluent.
  • the polystyrene-equivalent weight average molecular weight of the acrylic resin was 420,000.
  • the obtained solution was coated on a release-treated polyethylene terephthalate (average thickness of 25 ⁇ m) as a protective film so that the average thickness of the adhesive layer when dried was 10 ⁇ m, and then dried to form an adhesive layer. . Furthermore, the adhesive layer surface was laminated on the substrate film (average thickness 100 ⁇ m). After that, aging was performed at 40° C. for 4 days. Thus, the transfer member A was obtained.
  • the base film is an ionomer resin Himilan 1706 (manufactured by DuPont Mitsui Polychemicals, ionomer resin), an ethylene/1-hexene copolymer, a butene/ ⁇ -olefin copolymer, and Himilan 1706 laminated in this order.
  • a three-layer resin film (Himilan 1706/ethylene/1-hexene copolymer and butene/ ⁇ -olefin copolymer/Himilan 1706, average thickness 100 ⁇ m) was used.
  • the adhesive layer and protective film and base film were laminated with a roll laminator at 40°C to form a protective film/adhesive layer/base film order.
  • the protective film was removed before use.
  • Transfer members B to E were produced in the same manner except that the ratio of the adhesive layer components and the type of base material were changed.
  • the ratio of the adhesive layer components was set to 100 parts by mass of acrylic resin, 4 parts by mass of Coronate L, and 184 parts by mass of Irgacure.
  • the ratio of the adhesive layer components was set to acrylic resin: 100 parts by mass, Coronate L: 0.2 parts by mass, and Irgacure 184:1 parts by mass.
  • the ratio of the adhesive layer components was set to acrylic resin: 100 parts by mass, Coronate L: 1 part by mass, and Irgacure 184: 1 part by mass.
  • the ratio of the adhesive layer components was set to acrylic resin: 100 parts by mass, Coronate L: 1 part by mass, and Irgacure 184: 1 part by mass.
  • the base film of the transfer member D was changed to a silicone sheet, and the base film of the transfer member E was changed to a polyethylene terephthalate film.
  • a transfer member was placed on a test vehicle (Test Vehicle, made by Nitride Semiconductor) in which LED elements were formed through a buffer layer in a state divided into individual devices on a 3.1 mm x 3.6 mm sapphire die. was laminated.
  • the transfer member had a size of 200 mm ⁇ 200 mm and an average thickness of 110 ⁇ m.
  • the size of the LED element was 25 ⁇ m ⁇ 50 ⁇ m ⁇ 6 ⁇ mt, and the bump size provided on the LED element was 15 ⁇ m ⁇ 15 ⁇ m ⁇ 2 ⁇ mt.
  • a diaphragm-type vacuum laminator (Laminator V130, manufactured by Nikko Materials) was used to laminate the transfer member onto the sapphire die to obtain an adhered body. This was used as a measurement sample.
  • the lamination conditions were 40° C./0.5 MPa/10 seconds.
  • a laser was irradiated from the sapphire die side of the prepared sample.
  • DFL7560 manufactured by DISCO Corporation
  • the irradiation intensity of the laser beam was set to 1W.
  • the sapphire die and the transfer member were separated.
  • the transfer rate of the LED element to the transfer member when separated was measured. An LED element that could be transferred to the transfer member without cracks or misalignment was regarded as a non-defective product.
  • the LED elements When the LED elements remained on the sapphire die side, or when the sapphire die and the transfer members were separated, the LED elements were detached or displaced from the transfer members, and the number of the LED elements was counted as defective products.
  • Six sapphire dies (4465 x 6 LED elements) were evaluated, and the number of successfully transferred LED elements was divided by the total number of LED elements (4465 x 6) and multiplied by 100 for transfer. This value was taken as the LLO transfer rate. A is given when the LLO transfer rate is 95% or more, B is given when it is 90% or more but less than 95%, and C is given when it is less than 90%. If the evaluation is A or B, there is no practical problem.
  • the LED element was transferred from the transfer member to the carrier.
  • the transfer member was irradiated with UV (UV exposure machine ML-320FSAT, manufactured by Mikasa Co., Ltd.)
  • the transfer member was laminated on the carrier.
  • a carrier a carrier having a configuration of Si die/adhesive layer was used.
  • the Si die had a diameter of 20 mm and a thickness of 725 ⁇ mt.
  • the component ratios of the adhesive layer were acrylic resin: 100 parts by mass, Coronate L: 7 parts by mass, and Irgacure: 1 part by mass.
  • the average thickness of the adhesive layer was 10 ⁇ m, and the adhesive strength was 1.1 N/25 mm.
  • the UV irradiation condition was 300 mJ/cm 2 .
  • a diaphragm-type vacuum laminator (Laminator V130, manufactured by Nikko Materials) was used.
  • the lamination conditions were 40° C./0.5 MPa/30 seconds.
  • An LED element that could be transferred from the transfer member to the carrier without cracks or misalignment was regarded as a non-defective product. When the LED elements remained on the transfer member, or when the LED elements were separated from the carrier when the transfer member and the carrier were separated, the LED elements were counted as defective products.
  • the adhesive strength of the transfer member before and after UV irradiation was measured by the following method. Using a laminator GK-13DX (manufactured by Lamy Corporation) on SUS (width 25 mm) having an average thickness of 0.5 mm, a sample before UV irradiation was obtained by laminating the transfer member at a lamination temperature of 40°C. Using an ultraviolet exposure machine (Mikasa Co., Ltd. "ML-320FSAT”), this sample was irradiated with ultraviolet rays under the conditions of an ultraviolet wavelength of 365 nm and an exposure amount of 300 mJ/cm 2 to obtain a sample after UV irradiation. The peel strength of each of the sample before UV irradiation and the sample after UV irradiation was measured by a method conforming to JIS C 5016:1994 (Peeling strength of conductor). The peel strength was defined as adhesive strength.
  • the transferred member obtained by separating the sapphire die when measuring the LLO transfer rate was set in a 12-inch expander device (MX-5154FN manufactured by Omiya Kogyo Co., Ltd.). The stage temperature) was pushed up at 50° C., and the transfer member was stretched. If the distance between the LED elements after stretching the relocating member can be expanded from the initial value (approximately 50 ⁇ m) to 1 mm or more, A is the case. B was given when an apparatus error occurred because the width of the transfer member could not be increased, or when the distance between the LED elements could not be increased to 1 mm even when pushed up by 100 mm.
  • the LED transfer member of the present disclosure is excellent in the transfer rate and stretchability of the micro LED elements.

Abstract

This LED transfer member includes, in at least a part of a surface thereof, a region in which tack strength is decreased by optical irradiation, and has a tensile strength at 50℃ of 1 MPa to 10 MPa. The LED transfer member is employed in a method for manufacturing an LED device.

Description

LED移設部材及びLED装置の製造方法Method for manufacturing LED transfer member and LED device
 本開示は、LED移設部材及びLED装置の製造方法に関する。 The present disclosure relates to an LED transfer member and a method for manufacturing an LED device.
 従来、LED(Light Emitting Diode)を用いた画像表示装置には、LED素子をワイヤーボンディングによって基板に実装した約1mmサイズ以上のLEDパッケージ(チップLED)が用いられていた。近年では、画像表示装置に対する高い画素密度及び高い応答速度といった観点から、ミニ又はマイクロLED素子をフリップチップによって画像表示装置の基板に実装する方式が用いられている。
 一般的に、マイクロLED素子はサファイア等の結晶成長用基板上でエピタキシャル成長によって作製される。マイクロLED素子を画像表示装置の基板上に実装するためには、まず結晶成長用基板からレーザーリフトオフ(LLO)工程によって結晶成長用基板とマイクロLED素子とを分離する必要がある(例えば、特許文献1参照)。マイクロLED素子を結晶成長用基板から分離後、マイクロLED素子をピックアップして位置合わせ後、画像表示装置の基板にマイクロLED素子を実装する。LLOによりマイクロLED素子を結晶成長用基板から分離するときに、マイクロLED素子の飛散を防止するため、結晶成長用基板のマイクロLED素子の形成された側の表面に移設部材が貼付される。結晶成長用基板から分離されたマイクロLED素子は移設部材の表面に仮固定されており、飛散が防止される。
 なお、本開示においてマイクロLED素子とは、1辺の長さが100μm以下のLED素子を意味する。
Conventionally, image display devices using LEDs (Light Emitting Diodes) have used LED packages (chip LEDs) with a size of about 1 mm or more, in which LED elements are mounted on a substrate by wire bonding. In recent years, from the viewpoint of high pixel density and high response speed for image display devices, a method of mounting mini or micro LED elements on a substrate of an image display device by flip chip has been used.
Micro LED devices are generally fabricated by epitaxial growth on a crystal growth substrate such as sapphire. In order to mount the micro LED element on the substrate of the image display device, it is first necessary to separate the crystal growth substrate and the micro LED element from the crystal growth substrate by a laser lift-off (LLO) process (see, for example, Patent Documents 1). After separating the micro LED element from the crystal growth substrate, the micro LED element is picked up and aligned, and then mounted on the substrate of the image display device. In order to prevent the micro LED elements from scattering when the micro LED elements are separated from the crystal growth substrate by LLO, a transfer member is attached to the surface of the crystal growth substrate on which the micro LED elements are formed. The micro LED element separated from the crystal growth substrate is temporarily fixed to the surface of the transfer member to prevent scattering.
In addition, in the present disclosure, a micro LED element means an LED element having a side length of 100 μm or less.
特開2015-23240号公報Japanese Unexamined Patent Application Publication No. 2015-23240
 マイクロLED素子は非常に小さく薄いため、クラックが発生しやすく取扱いが困難である。マイクロLED素子は、結晶成長用基板に固定されている状態ではクラック等は発生し難いが、LLOによって結晶成長用基板から分離する際に、静電気等の微力な外力によって位置ズレ、クラック等が発生することがある。
 また、LLOのときに上記課題を解決できる移設部材であっても、適切な粘着力でマイクロLED素子を仮固定するものでなければ、マイクロLED素子の移設部材からのピックアップ不良、基板への転写不良等が発生することがある。
 また、結晶成長用基板上に作製されたマイクロLED素子は、エッチング等によって個片化される。低コスト化を目的に、マイクロLED素子を結晶成長用基板上により多く作製するため、個々のマイクロLED素子の間隔は一般的に数十μm幅とされ、非常に狭い。そのため、ピックアップ手段でマイクロLED素子をピックアップする際に、個々のマイクロLED素子の間隔は広がった状態であることが望ましい。
 さらに、画像表示装置の基板にマイクロLED素子を実装する際に、例えば、基板上に赤色、青色及び緑色のマイクロLED素子を並べる場合、青色のマイクロLED素子どうしは100μm以上の間隔をあける必要がある。ダイマウンター等を使用して間隔を空けて基板上にマイクロLED素子を搭載する場合、長時間を要して生産性が低くなることがある。
 本開示は上記従来の事情に鑑みてなされたものであり、本開示の一形態によれば、レーザーリフトオフ法におけるマイクロLED素子の転写率及び延伸性に優れるLED移設部材及びこのLED移設部材を用いたLED装置の製造方法を提供することを課題とする。
Since the micro LED element is very small and thin, it is easily cracked and difficult to handle. When the micro LED element is fixed to the crystal growth substrate, it is difficult for cracks to occur. I have something to do.
In addition, even if the transfer member can solve the above problems at the time of LLO, if it does not temporarily fix the micro LED element with an appropriate adhesive force, the micro LED element cannot be picked up from the transfer member and transferred to the substrate. Defects may occur.
Also, the micro LED element fabricated on the crystal growth substrate is singulated by etching or the like. In order to manufacture more micro LED elements on the crystal growth substrate for the purpose of cost reduction, the interval between individual micro LED elements is generally set to a width of several tens of μm, which is very narrow. Therefore, when picking up the micro LED elements by the pick-up means, it is desirable that the intervals between the individual micro LED elements are widened.
Furthermore, when mounting micro LED elements on a substrate of an image display device, for example, when red, blue, and green micro LED elements are arranged on the substrate, it is necessary to provide an interval of 100 μm or more between blue micro LED elements. be. When the micro LED elements are mounted on the substrate at intervals using a die mounter or the like, it may take a long time, resulting in low productivity.
The present disclosure has been made in view of the above-described conventional circumstances, and according to one aspect of the present disclosure, an LED transfer member excellent in transfer rate and stretchability of micro LED elements in a laser lift-off method, and using this LED transfer member An object of the present invention is to provide a method for manufacturing an LED device that has
 前記課題を達成するための具体的手段は以下の通りである。
  <1> 光照射によって粘着力が低下する領域を表面の少なくとも一部に有し、
 50℃における引張強度が、1MPa~10MPaであるLED移設部材。
  <2> 基材と前記基材上に配置された粘着層とを有し、前記粘着層が、光照射によって粘着力が低下する領域である<1>に記載のLED移設部材。
  <3> 前記粘着力が低下する領域についての光照射後の粘着力が、0.7N/25mm以下である<1>又は<2>に記載のLED移設部材。
  <4> <1>~<3>のいずれか1項に記載のLED移設部材を用いるLED装置の製造方法。
  <5> 結晶成長用基板と、個々のデバイス毎に分割された状態で、前記結晶成長用基板上に形成されたバッファ層と前記バッファ層上に形成されたLED素子と、を有する光デバイス基板の前記LED素子の形成された側に、<1>~<3>のいずれか1項に記載のLED移設部材における粘着力が低下する領域を有する側の面を接触させて前記光デバイス基板に前記LED移設部材を貼付して貼付体とし、
 前記バッファ層に対してレーザー光を照射して、前記バッファ層を破壊し、
 前記結晶成長用基板と前記LED移設部材とを分離することで前記LED素子を前記LED移設部材に移設し、
 前記LED移設部材を延伸して前記LED移設部材に移設された前記LED素子の間隔を拡張し、
 延伸された前記LED移設部材に光照射して、前記LED移設部材の粘着力を低下させることを含むLED装置の製造方法。
  <6> 前記LED素子の長辺の長さが、100μm以下である<5>に記載のLED装置の製造方法。
Specific means for achieving the above object are as follows.
<1> having a region on at least a part of the surface where the adhesive strength is reduced by light irradiation,
An LED transfer member having a tensile strength of 1 MPa to 10 MPa at 50°C.
<2> The LED relocating member according to <1>, which has a substrate and an adhesive layer disposed on the substrate, wherein the adhesive layer is a region whose adhesive strength is reduced by light irradiation.
<3> The LED relocating member according to <1> or <2>, wherein the adhesive strength of the region where the adhesive strength is reduced after light irradiation is 0.7 N/25 mm or less.
<4> A method for manufacturing an LED device using the LED transfer member according to any one of <1> to <3>.
<5> An optical device substrate having a crystal growth substrate, a buffer layer formed on the crystal growth substrate and an LED element formed on the buffer layer in a state of being divided into individual devices. The surface of the LED transfer member according to any one of <1> to <3> on which the LED elements are formed is brought into contact with the optical device substrate by affixing the LED relocation member to form an affixed body;
irradiating the buffer layer with laser light to destroy the buffer layer;
transferring the LED element to the LED transfer member by separating the crystal growth substrate and the LED transfer member;
expanding the distance between the LED elements transferred to the LED transfer member by extending the LED transfer member;
A method of manufacturing an LED device, comprising irradiating the extended LED relocation member with light to reduce adhesive strength of the LED relocation member.
<6> The method for manufacturing an LED device according to <5>, wherein the length of the long side of the LED element is 100 μm or less.
 本開示の一形態によれば、レーザーリフトオフ法におけるマイクロLED素子の転写率及び延伸性に優れるLED移設部材及びこのLED移設部材を用いたLED装置の製造方法を提供することができる。 According to one embodiment of the present disclosure, it is possible to provide an LED transfer member excellent in transfer rate and stretchability of micro LED elements in the laser lift-off method, and a method for manufacturing an LED device using this LED transfer member.
2層構成の移設部材10の断面図である。FIG. 2 is a cross-sectional view of a transfer member 10 having a two-layer structure; 1層構成の移設部材20の断面図である。FIG. 3 is a cross-sectional view of a transfer member 20 having a one-layer structure; 光デバイス基板30の断面図である。3 is a cross-sectional view of an optical device substrate 30; FIG. LED装置の製造方法を説明するための図である。It is a figure for demonstrating the manufacturing method of an LED device. LED装置の製造方法を説明するための図である。It is a figure for demonstrating the manufacturing method of an LED device. LED装置の製造方法を説明するための図である。It is a figure for demonstrating the manufacturing method of an LED device. LED装置の製造方法を説明するための図である。It is a figure for demonstrating the manufacturing method of an LED device. LED装置の製造方法を説明するための図である。It is a figure for demonstrating the manufacturing method of an LED device. LED装置の製造方法を説明するための図である。It is a figure for demonstrating the manufacturing method of an LED device. LED装置の製造方法を説明するための図である。It is a figure for demonstrating the manufacturing method of an LED device. LED装置の製造方法を説明するための図である。It is a figure for demonstrating the manufacturing method of an LED device.
 以下、本開示を実施するための形態について詳細に説明する。但し、本開示は以下の実施形態に限定されるものではない。以下の実施形態において、その構成要素(要素ステップ等も含む)は、特に明示した場合を除き、必須ではない。数値及びその範囲についても同様であり、本開示を制限するものではない。 A detailed description will be given below of the embodiment for implementing the present disclosure. However, the present disclosure is not limited to the following embodiments. In the following embodiments, the constituent elements (including element steps and the like) are not essential unless otherwise specified. The same applies to numerical values and their ranges, which do not limit the present disclosure.
 本開示において「工程」との語には、他の工程から独立した工程に加え、他の工程と明確に区別できない場合であってもその工程の目的が達成されれば、当該工程も含まれる。
 本開示において「~」を用いて示された数値範囲には、「~」の前後に記載される数値がそれぞれ最小値及び最大値として含まれる。
 本開示中に段階的に記載されている数値範囲において、一つの数値範囲で記載された上限値又は下限値は、他の段階的な記載の数値範囲の上限値又は下限値に置き換えてもよい。また、本開示中に記載されている数値範囲において、その数値範囲の上限値又は下限値は、実施例に示されている値に置き換えてもよい。
 本開示において、各成分には、該当する物質が複数種含まれていてもよい。組成物中に各成分に該当する物質が複数種存在する場合、各成分の含有率又は含有量は、特に断らない限り、組成物中に存在する当該複数種の物質の合計の含有率又は含有量を意味する。
 本開示において「層」又は「膜」との語には、当該層又は膜が存在する領域を観察したときに、当該領域の全体に形成されている場合に加え、当該領域の一部にのみ形成されている場合も含まれる。
 本開示において「積層」との語は、層を積み重ねることを示し、二以上の層が結合されていてもよく、二以上の層が着脱可能であってもよい。
 本開示において「(メタ)アクリロイル基」とは、アクリロイル基及びメタクリロイル基の少なくとも一方を意味する。
 本開示において、層又は膜の平均厚みは、対象となる層又は膜の5点の厚みを測定し、その算術平均値として与えられる値とする。
 層又は膜の厚みは、マイクロメーター等を用いて測定することができる。本開示において、層又は膜の厚みを直接測定可能な場合には、マイクロメーターを用いて測定する。一方、1つの層の厚み又は複数の層の総厚みを測定する場合には、電子顕微鏡を用いて、測定対象の断面を観察することで測定してもよい。
In the present disclosure, the term "process" includes a process that is independent of other processes, and even if the purpose of the process is achieved even if it cannot be clearly distinguished from other processes. .
In the present disclosure, the numerical range indicated using "-" includes the numerical values before and after "-" as the minimum and maximum values, respectively.
In the numerical ranges described step by step in the present disclosure, the upper limit or lower limit of one numerical range may be replaced with the upper or lower limit of another numerical range described step by step. . Moreover, in the numerical ranges described in the present disclosure, the upper or lower limits of the numerical ranges may be replaced with the values shown in the examples.
In the present disclosure, each component may contain multiple types of applicable substances. When there are multiple types of substances corresponding to each component in the composition, the content rate or content of each component is the total content rate or content of the multiple types of substances present in the composition unless otherwise specified. means quantity.
In the present disclosure, the term “layer” or “film” refers to the case where the layer or film is formed in the entire region when observing the region where the layer or film is present, and only a part of the region. It also includes the case where it is formed.
In the present disclosure, the term "laminate" indicates stacking layers, and two or more layers may be bonded, or two or more layers may be detachable.
In the present disclosure, "(meth)acryloyl group" means at least one of acryloyl group and methacryloyl group.
In the present disclosure, the average thickness of a layer or film is a value obtained by measuring the thickness of the target layer or film at five points and giving the arithmetic mean value.
The thickness of a layer or film can be measured using a micrometer or the like. In this disclosure, when the thickness of a layer or film can be measured directly, it is measured using a micrometer. On the other hand, when measuring the thickness of one layer or the total thickness of a plurality of layers, the thickness may be measured by observing the cross section of the object to be measured using an electron microscope.
<LED移設部材>
 本開示のLED移設部材は、光照射によって粘着力が低下する領域を表面の少なくとも一部に有し、50℃における引張強度が、1MPa~10MPaとされたものである。以下、本開示のLED移設部材を、単に「移設部材」と称することがある。
 本開示のLED移設部材によれば、LLO法におけるマイクロLEDの転写率に優れる。その理由は明確ではないが、以下のように推察される。
 本開示のLED移設部材は光照射により粘着力が低下する領域を有し、光照射前においては、光照射後に比較して当該領域に貼付されたLED素子はLED移設部材によって強固に保持され、LLO法において結晶成長用基板からLED素子を分離可能になる。また、LLO法における微力な外力に起因するクラック、位置ズレ等の発生が抑制される。そのため、結晶成長用基板からLED移設部材への転写率が向上する。
 一方、光照射後においては当該領域の粘着力が低下するため当該領域に仮固定されたLED素子を容易にピックアップ可能になる。そのため、LED移設部材からの転写率が向上する。
 以上のことから、本開示のLED移設部材によれば、LLO法におけるマイクロLEDの転写率が向上すると推察される。
 さらに、本開示では、移設部材の50℃における引張強度が1MPa~10MPaとされる。移設部材の50℃における引張強度が1MPa以上であれば、移設部材を延伸したときに移設部材に移設されたマイクロLED素子の間隔を拡張する力が十分となり、マイクロLED素子の間隔を容易に拡張できる傾向にある。移設部材の50℃における引張強度が10MPa以下であれば、エキスパンド装置等による移設部材の延伸が容易になる傾向にある。
 移設部材の50℃における引張強度は2MPa~9MPaが好ましく、3MPa~8MPaがより好ましい。
 移設部材の50℃における引張強度は、幅20mmの試験片を用い、引張試験機を用いて、50℃、引張速度5mm/sの条件で測定した値をいう。
<LED transfer member>
The LED transfer member of the present disclosure has a region on at least a part of the surface where the adhesive force is reduced by light irradiation, and has a tensile strength of 1 MPa to 10 MPa at 50°C. Hereinafter, the LED transfer member of the present disclosure may be simply referred to as "transfer member".
According to the LED transfer member of the present disclosure, the micro LED transfer rate in the LLO method is excellent. Although the reason is not clear, it is presumed as follows.
The LED transfer member of the present disclosure has a region where the adhesive force is reduced by light irradiation, and before light irradiation, the LED element attached to the region is more firmly held by the LED transfer member than after light irradiation, It becomes possible to separate the LED element from the substrate for crystal growth in the LLO method. In addition, the occurrence of cracks, misalignment, etc. due to a weak external force in the LLO method is suppressed. Therefore, the transfer rate from the crystal growth substrate to the LED transfer member is improved.
On the other hand, after light irradiation, the adhesive strength of the area is lowered, so that the LED element temporarily fixed to the area can be easily picked up. Therefore, the transfer rate from the LED transfer member is improved.
From the above, according to the LED transfer member of the present disclosure, it is inferred that the micro LED transfer rate in the LLO method is improved.
Furthermore, in the present disclosure, the tensile strength of the transfer member at 50° C. is set to 1 MPa to 10 MPa. If the tensile strength of the transfer member at 50° C. is 1 MPa or more, the force for extending the distance between the micro LED elements transferred to the transfer member is sufficient when the transfer member is stretched, and the distance between the micro LED elements can be easily expanded. tend to be able. If the tensile strength of the transfer member at 50° C. is 10 MPa or less, the transfer member tends to be easily stretched by an expanding device or the like.
The tensile strength of the transfer member at 50° C. is preferably 2 MPa to 9 MPa, more preferably 3 MPa to 8 MPa.
The tensile strength of the transfer member at 50°C is a value measured using a test piece with a width of 20 mm and a tensile tester at 50°C and a tensile speed of 5 mm/s.
 移設部材の層構成は特に限定されるものではなく、1層又は2層以上の構成であってもよい。移設部材が2層以上の場合、移設部材の一方の面を構成する材料と他方の面を構成する材料とを適宜選択することでき、移設部材の一方の面の粘着力と他方の面の粘着力とを調整可能となる。そのため、移設部材の一方の面の粘着力を高くし、LLO法を実施する温度領域において他方の面が粘着力を示さない構成とすることで、移設部材のプロセス適合性を向上することができる。
 以下、本開示のLED移設部材を、図面を参照しながら説明する。なお、本開示のLED移設部材は以下の実施形態に限定されるものではない。また、各図における部材の大きさは概念的なものであり、部材間の大きさの相対的な関係はこれに限定されない。なお、各図面において、同一の部材には同一の符号を付し、重複した説明は省略することがある。
The layer structure of the transfer member is not particularly limited, and may be a structure of one layer or two or more layers. When the transfer member has two or more layers, the material forming one surface of the transfer member and the material forming the other surface of the transfer member can be appropriately selected. power can be adjusted. Therefore, by increasing the adhesive strength of one surface of the transfer member and setting the other surface to exhibit no adhesive strength in the temperature range in which the LLO method is performed, the process adaptability of the transfer member can be improved. .
Hereinafter, the LED transfer member of the present disclosure will be described with reference to the drawings. In addition, the LED transfer member of the present disclosure is not limited to the following embodiments. In addition, the sizes of the members in each drawing are conceptual, and the relative relationship between the sizes of the members is not limited to this. In addition, in each drawing, the same reference numerals are given to the same members, and redundant description may be omitted.
 図1は、2層構成の移設部材10の断面図である。
 図1において、移設部材10は、基材12と基材12上に配置された粘着層14とを有する。粘着層14が、光照射によって粘着力が低下する領域に該当する。
 基材12は、ポリエチレンテレフタレートフィルム等のポリエステル系フィルム;ポリテトラフルオロエチレンフィルム、ポリエチレンフィルム、ポリプロピレンフィルム、ポリメチルペンテンフィルム、ポリビニルアセテートフィルム、ポリ-4-メチルペンテン-1等のα-オレフィンの単独重合体及びそれらの共重合体、並びに上記単独重合体又は上記共重合体のアイオノマーを含むポリオレフィン系フィルム;ポリ塩化ビニルフィルム;ポリイミドフィルム;ウレタン樹脂系フィルムなどの各種プラスチックフィルムであってよい。基材12は、単層のフィルムに限らず、上記プラスチックフィルムを2種以上又は同種のプラスチックフィルムを2以上組み合わせて得られる多層のフィルムであってもよい。
FIG. 1 is a cross-sectional view of a transfer member 10 having a two-layer structure.
In FIG. 1 , the transfer member 10 has a base material 12 and an adhesive layer 14 arranged on the base material 12 . The adhesive layer 14 corresponds to the region where the adhesive strength is reduced by light irradiation.
The base material 12 is polyester film such as polyethylene terephthalate film; polytetrafluoroethylene film, polyethylene film, polypropylene film, polymethylpentene film, polyvinyl acetate film, poly-4-methylpentene-1 or other α-olefin alone. Polyolefin films containing polymers, copolymers thereof, and ionomers of the above homopolymers or copolymers; polyvinyl chloride films; polyimide films; and various plastic films such as urethane resin films. The substrate 12 is not limited to a single-layer film, and may be a multi-layer film obtained by combining two or more of the above plastic films or two or more of the same type of plastic films.
 基材12は、延伸性の観点から、ポリオレフィン系フィルム又はウレタン樹脂系フィルムであることが好ましい。基材12は、必要に応じて、ブロッキング防止剤等の各種添加剤を含んでもよい。 From the standpoint of stretchability, the substrate 12 is preferably a polyolefin film or a urethane resin film. The substrate 12 may contain various additives such as an antiblocking agent, if necessary.
 基材12の平均厚みは必要に応じて適宜設定すればよい。基材12の平均厚みは、50μm~500μmが好ましい。
 基材12の平均厚みが50μm以上であれば、移設部材の延伸性の低下が抑制される傾向にある。基材12の平均厚みが500μm以下であれば、移設部材を延伸した際に移設部材の歪みの発生が抑制される傾向にある。
 移設部材の取り扱い性に問題なければ、コストの観点から基材12は薄い方が好ましく、50μm~400μmがより好ましく、50μm~300μmがさらに好ましい。
 但し、基材12の平均厚みは、粘着層14を構成する粘着剤として高エネルギー線(中でも、紫外線)硬化性粘着剤を用いる場合は、高エネルギー線の透過を阻害しない厚みが好ましい。このような観点からは、50μm~500μmが好ましく、50μm~300μmがより好ましい。
 基材12を上述のフィルム状の複数の基材から構成する場合、基材12全体の平均厚みが上記範囲内となるように調整することが好ましい。
The average thickness of the base material 12 may be appropriately set as required. The average thickness of the base material 12 is preferably 50 μm to 500 μm.
If the average thickness of the base material 12 is 50 μm or more, there is a tendency that the deterioration of the extensibility of the transfer member is suppressed. If the average thickness of the base material 12 is 500 μm or less, the strain of the transfer member tends to be suppressed when the transfer member is stretched.
As long as there is no problem with the handling of the transfer member, the thickness of the substrate 12 is preferably thin from the viewpoint of cost, more preferably 50 μm to 400 μm, even more preferably 50 μm to 300 μm.
However, the average thickness of the base material 12 is preferably a thickness that does not hinder the transmission of high energy rays when a high energy ray (in particular, ultraviolet) curable adhesive is used as the adhesive constituting the adhesive layer 14 . From such a point of view, the thickness is preferably 50 μm to 500 μm, more preferably 50 μm to 300 μm.
When the substrate 12 is composed of a plurality of film-like substrates as described above, it is preferable to adjust the average thickness of the entire substrate 12 within the above range.
 基材12は、粘着層14との密着性を向上させるために、必要に応じて、化学的又は物理的に表面処理を施したものであってもよい。上記表面処理としては、例えば、コロナ処理、クロム酸処理、オゾン暴露、火炎暴露、高圧電撃暴露、及びイオン化放射線処理が挙げられる。 The base material 12 may be chemically or physically surface-treated as necessary in order to improve adhesion with the adhesive layer 14 . The surface treatments include, for example, corona treatment, chromic acid treatment, ozone exposure, flame exposure, high voltage shock exposure, and ionizing radiation treatment.
 粘着層14は、光照射によって粘着力が低下する特性を有するものであれば特に制限はない。 The adhesive layer 14 is not particularly limited as long as it has a characteristic that the adhesive strength is reduced by light irradiation.
 粘着層14は、25℃で結晶成長用基板上のLED素子に対し粘着力を有する粘着剤成分から構成されることが好ましい。
 粘着層14を構成する粘着剤成分のベース樹脂の一例として、アクリル系樹脂、各種合成ゴム、天然ゴム、ポリイミド樹脂等が挙げられる。これらの中でも、アクリル系樹脂が好ましい。粘着剤成分の糊残りを減少させる観点から、上記ベース樹脂は、後述の架橋剤と反応しうる水酸基、カルボキシ基等の官能基を有することが好ましい。
The adhesive layer 14 is preferably composed of an adhesive component that has adhesive strength to the LED element on the crystal growth substrate at 25°C.
Examples of the base resin of the adhesive component that constitutes the adhesive layer 14 include acrylic resins, various synthetic rubbers, natural rubbers, polyimide resins, and the like. Among these, acrylic resins are preferred. From the viewpoint of reducing the adhesive residue of the adhesive component, the base resin preferably has a functional group such as a hydroxyl group or a carboxyl group that can react with the cross-linking agent described below.
 ベース樹脂に含まれる水酸基、カルボキシ基等の官能基を基点として、ベース樹脂中に(メタ)アクリロイル基を導入してもよい。ベース樹脂に含まれる水酸基に2-メタクリロキシエチルイソシアネート等の水酸基と反応しうる官能基及び(メタ)アクリロイル基を含む化合物を反応させてベース樹脂に(メタ)アクリロイル基を導入してもよい。また、ベース樹脂に含まれるカルボキシ基にグリシジルメタクリレート等のカルボキシ基と反応しうる官能基及び(メタ)アクリロイル基を含む化合物を反応させてベース樹脂に(メタ)アクリロイル基を導入してもよい。このような硬化性樹脂をベース樹脂として使用した場合、ベース樹脂を光照射によって硬化させることで粘着層14の粘着力を低下させることができる。 A (meth)acryloyl group may be introduced into the base resin using a functional group such as a hydroxyl group or a carboxyl group contained in the base resin as a starting point. A (meth)acryloyl group may be introduced into the base resin by reacting the hydroxyl group contained in the base resin with a compound containing a hydroxyl group-reactive functional group such as 2-methacryloxyethyl isocyanate and a (meth)acryloyl group. Alternatively, a (meth)acryloyl group may be introduced into the base resin by reacting the carboxyl group contained in the base resin with a compound containing a functional group capable of reacting with the carboxyl group such as glycidyl methacrylate and a (meth)acryloyl group. When such a curable resin is used as the base resin, the adhesive strength of the adhesive layer 14 can be reduced by curing the base resin by light irradiation.
 また、粘着層14の粘着力を調整するため、上記粘着剤成分は、上記ベース樹脂の官能基と架橋反応できる架橋剤を含んでもよい。架橋剤の種類は特に制限されず、ベース樹脂の種類等に応じて選択できる。具体的には、イソシアネート架橋剤、メラミン架橋剤、過酸化物架橋剤、金属アルコキシド架橋剤、金属キレート架橋剤、金属塩架橋剤、カルボジイミド架橋剤、オキサゾリン架橋剤、アジリジン架橋剤、アミン架橋剤等が挙げられる。これらの架橋剤は、単独で使用してもよいし、二種以上を併用してもよい。
 上記架橋剤の中でも安定した粘着特性の観点からは、イソシアネート架橋剤が好ましい。
 また、ベース樹脂と架橋剤との反応速度が遅い場合は、必要に応じて、アミン、スズ系化合物等の触媒を使用してもよい。
Moreover, in order to adjust the adhesive force of the adhesive layer 14, the adhesive component may contain a cross-linking agent capable of cross-linking reaction with the functional group of the base resin. The type of cross-linking agent is not particularly limited, and can be selected according to the type of base resin and the like. Specifically, isocyanate cross-linking agents, melamine cross-linking agents, peroxide cross-linking agents, metal alkoxide cross-linking agents, metal chelate cross-linking agents, metal salt cross-linking agents, carbodiimide cross-linking agents, oxazoline cross-linking agents, aziridine cross-linking agents, amine cross-linking agents, etc. is mentioned. These cross-linking agents may be used alone or in combination of two or more.
Among the cross-linking agents, isocyanate cross-linking agents are preferred from the viewpoint of stable adhesion properties.
If the reaction rate between the base resin and the cross-linking agent is slow, catalysts such as amines and tin-based compounds may be used as necessary.
 イソシアネート架橋剤は特に制限されず、公知のイソシアネート基を有する化合物(イソシアネート化合物)から選択できる。反応性の観点からは、2官能イソシアネート化合物(2個のイソシアネート基を有する化合物)及び多官能イソシアネート(3個以上のイソシアネート基を有する化合物)が好ましく、多官能イソシアネート化合物がより好ましい。 The isocyanate cross-linking agent is not particularly limited, and can be selected from known compounds having an isocyanate group (isocyanate compounds). From the viewpoint of reactivity, bifunctional isocyanate compounds (compounds having two isocyanate groups) and polyfunctional isocyanates (compounds having three or more isocyanate groups) are preferred, and polyfunctional isocyanate compounds are more preferred.
 その他、粘着層14の粘着特性を適切に調整するために、上記粘着剤成分は、ロジン系、テルペン樹脂系等のタッキファイヤー、各種界面活性剤などの任意成分を適宜含有してもよい。 In addition, in order to appropriately adjust the adhesive properties of the adhesive layer 14, the adhesive component may appropriately contain optional ingredients such as rosin-based, terpene resin-based tackifiers, and various surfactants.
 ベース樹脂が(メタ)アクリロイル基を含む場合、このベース樹脂を光照射によって硬化させるため、粘着層14は光重合開始剤を含んでもよい。光重合開始剤としては、光照射により分解してラジカルを発生してベース樹脂の重合を開始し得るものであれば特に制限されない。光重合開始剤の種類及び含有量は、粘着層14に照射される光の波長、光の強度、ベース樹脂中に含まれる(メタ)アクリロイル基の量等を鑑みて適宜選択される。 When the base resin contains a (meth)acryloyl group, the adhesive layer 14 may contain a photopolymerization initiator so that the base resin is cured by light irradiation. The photopolymerization initiator is not particularly limited as long as it can be decomposed by light irradiation to generate radicals to initiate polymerization of the base resin. The type and content of the photopolymerization initiator are appropriately selected in consideration of the wavelength of light applied to the adhesive layer 14, the intensity of light, the amount of (meth)acryloyl groups contained in the base resin, and the like.
 粘着層14中に含まれる成分が揮発することによるLED素子の汚染及び破壊を防ぐため、粘着層14中には、100℃以下の沸点又は昇華点を有する成分の含有率が、粘着層14全体に対して5質量%以下が好ましく、3質量%以下がより好ましく、1.5質量%以下がさらに好ましい。
 粘着層14中に含まれる各成分の沸点又は昇華点は、例えば、熱重量測定により求めることができる。
In order to prevent contamination and destruction of the LED element due to volatilization of the components contained in the adhesive layer 14, the content of the component having a boiling point or sublimation point of 100 ° C. or less is set in the entire adhesive layer 14. is preferably 5% by mass or less, more preferably 3% by mass or less, and even more preferably 1.5% by mass or less.
The boiling point or sublimation point of each component contained in the adhesive layer 14 can be determined, for example, by thermogravimetry.
 粘着層14の平均厚みは、1μm~100μmが好ましく、2μm~50μmがより好ましく、5μm~40μmがさらに好ましい。粘着層の平均厚みを1μm以上にすることによって、LED素子との十分な粘着力を確保することができる。一方、経済性の観点から、粘着層14の平均厚みは100μm以下が好ましい。 The average thickness of the adhesive layer 14 is preferably 1 μm to 100 μm, more preferably 2 μm to 50 μm, even more preferably 5 μm to 40 μm. By setting the average thickness of the adhesive layer to 1 μm or more, it is possible to ensure sufficient adhesive strength with the LED element. On the other hand, from the viewpoint of economy, the average thickness of the adhesive layer 14 is preferably 100 μm or less.
 粘着層14の光照射後の粘着力は、移設部材からのLED素子の転写率の低下を抑制する観点から、0.7N/25mm以下であることが好ましく、0.5N/25mm以下であることがより好ましく、0.4N/25mm以下であることがさらに好ましく、0.3N/25mm以下であることが特に好ましい。粘着層14の光照射後の粘着力は、LED素子の位置ズレの発生を抑制する観点から、0.01N/25mm以上であってもよい。
 粘着層14の光照射前の粘着力は、LLO工程においてLED素子を粘着層14により安定して保持する観点から、0.8N/25mm以上であることが好ましく、1.0N/25mm以上であることがより好ましく、1.2N/25mm以上であることがさらに好ましい。粘着層14の光照射前の粘着力は、5.0N/25mm以下であってもよい。
 粘着層14の粘着力とは、SUSとのピール強度のことを指す。粘着力は、JIS C 5016:1994(導体の引きはがし強さ)に準拠した方法でピール強度を測定して得られた値をいう。
The adhesive strength of the adhesive layer 14 after light irradiation is preferably 0.7 N/25 mm or less, more preferably 0.5 N/25 mm or less, from the viewpoint of suppressing a decrease in the transfer rate of the LED elements from the transfer member. is more preferably 0.4 N/25 mm or less, and particularly preferably 0.3 N/25 mm or less. The adhesive strength of the adhesive layer 14 after light irradiation may be 0.01 N/25 mm or more from the viewpoint of suppressing the occurrence of positional displacement of the LED elements.
The adhesive strength of the adhesive layer 14 before light irradiation is preferably 0.8 N/25 mm or more, and preferably 1.0 N/25 mm or more, from the viewpoint of stably holding the LED element by the adhesive layer 14 in the LLO process. is more preferable, and 1.2 N/25 mm or more is even more preferable. The adhesive strength of the adhesive layer 14 before light irradiation may be 5.0 N/25 mm or less.
The adhesive strength of the adhesive layer 14 refers to the peel strength with SUS. Adhesive strength refers to a value obtained by measuring peel strength by a method conforming to JIS C 5016:1994 (conductor peeling strength).
 図2は、1層構成の移設部材20の断面図である。移設部材20全体が、光照射によって粘着力が低下する領域に該当する。
 1層構成の移設部材20を構成する成分は、図1に示す移設部材10を構成する粘着層14と同様の成分としてもよい。なお、移設部材20は基材を有さないことから、移設部材20自身の強度を向上するため、移設部材20を構成する成分は粘着層14よりも機械的強度の高い構成とすることが好ましい。例えば、粘着層14に比較して架橋剤の添加量を増加したり、触媒の添加量を増加したりすることが好ましい。
 移設部材20の周縁部には、移設部材20を補強するための枠状の構造物を配置してもよい。
FIG. 2 is a cross-sectional view of the transfer member 20 having a one-layer structure. The transfer member 20 as a whole corresponds to a region where the adhesive strength is reduced by light irradiation.
The component constituting the transfer member 20 having a one-layer structure may be the same component as the adhesive layer 14 constituting the transfer member 10 shown in FIG. Since the transfer member 20 does not have a base material, it is preferable that the components constituting the transfer member 20 have higher mechanical strength than the adhesive layer 14 in order to improve the strength of the transfer member 20 itself. . For example, it is preferable to increase the amount of the cross-linking agent added or the amount of the catalyst added compared to the adhesive layer 14 .
A frame-shaped structure for reinforcing the transferable member 20 may be arranged on the periphery of the transferable member 20 .
 移設部材の製造方法は特に限定されるものではなく、当技術分野で周知の技術に沿って製造することができる。例えば、2層構成の移設部材10は、以下の方法に従って製造することができる。
 保護フィルムの上に、ナイフコート法、ロールコート法、スプレーコート法、グラビアコート法、バーコート法、又はカーテンコート法等によって粘着層の構成成分及び溶媒を含む塗布液を塗工し、溶媒を除去することによって粘着層を形成する。溶媒の除去は、具体的には、50℃~200℃、0.1分間~90分間の加熱を行うことが好ましい。塗工工程及び乾燥工程でのボイド発生、塗布液の粘度調製等に影響がなければ、乾燥条件は、粘着層中の有機溶媒が1.5質量%以下まで揮発する条件とすることが好ましい。
 作製した粘着層付保護フィルムと、基材とを、常温~60℃の温度条件下で、粘着層と基材とが対向するように積層し、ロールラミネータ等を用いて貼り合せることで、2層構成の移設部材を得ることができる。保護フィルムは、移設部材10を使用する際に除去される。
 また、粘着層付保護フィルムから保護フィルムを剥離することで、1層構成の移設部材を得ることができる。
The method of manufacturing the transfer member is not particularly limited, and the transfer member can be manufactured according to techniques known in the art. For example, the two-layer transfer member 10 can be manufactured according to the following method.
On the protective film, a coating liquid containing the components of the adhesive layer and a solvent is applied by a knife coating method, a roll coating method, a spray coating method, a gravure coating method, a bar coating method, a curtain coating method, or the like, and the solvent is removed. A sticky layer is formed by removal. Specifically, the solvent is preferably removed by heating at 50° C. to 200° C. for 0.1 minute to 90 minutes. The drying conditions are preferably such that the organic solvent in the adhesive layer evaporates up to 1.5% by mass or less, provided that voids are not generated in the coating and drying steps and the adjustment of the viscosity of the coating solution is not affected.
The prepared protective film with an adhesive layer and the base material are laminated under a temperature condition of room temperature to 60 ° C. so that the adhesive layer and the base material face each other, and are laminated using a roll laminator or the like. A transfer member having a layer structure can be obtained. The protective film is removed when the transfer member 10 is used.
Further, by peeling the protective film from the adhesive layer-attached protective film, a transfer member having a single-layer structure can be obtained.
 保護フィルムとして好適に使用できるフィルムとして、例えば、帝人デュポンフィルム株式会社製のA-63(離型処理剤:変性シリコーン系)、同じく帝人デュポンフィルム株式会社製のA-31(離型処理剤:Pt系シリコーン系)等が挙げられる。 Examples of films that can be suitably used as protective films include A-63 (release agent: modified silicone) manufactured by Teijin DuPont Films Limited, and A-31 (release agent: modified silicone) manufactured by Teijin DuPont Films Limited. Pt-based silicone) and the like.
 保護フィルムの平均厚みは、作業性を損なわない範囲で適宜選択され、通常は、経済的観点から100μm以下であることが好ましい。保護フィルムの平均厚みは、より好ましくは10μm~75μm、さらに好ましくは25μm~50μmの範囲である。保護フィルムの平均厚みが10μm以上であれば、移設部材の作製時に保護フィルムが破れる等の不具合が起こり難い傾向にある。また、保護フィルムの平均厚みが100μm以下であれば、移設部材の使用時に保護フィルムを容易に剥離することができる傾向にある。 The average thickness of the protective film is appropriately selected within a range that does not impair workability, and is usually preferably 100 μm or less from an economical point of view. The average thickness of the protective film is more preferably in the range of 10 μm to 75 μm, still more preferably 25 μm to 50 μm. If the average thickness of the protective film is 10 μm or more, troubles such as tearing of the protective film during production of the transfer member tend not to occur. Further, when the average thickness of the protective film is 100 μm or less, the protective film tends to be easily peeled off when the transfer member is used.
<LED装置の製造方法>
 本開示のLED装置の製造方法は、本開示のLED移設部材を用いるものである。本開示のLED装置の製造方法は、本開示のLED移設部材を用いるものであれば特に限定されるものではない。本開示のLED移設部材は光照射によって粘着力が低下する領域を表面の少なくとも一部に有することから、本開示のLED装置の製造方法は、いずれかの段階で移設部材の粘着力を低下させるべく光照射を行うことが好ましい。
 本開示のLED装置の製造方法の一実施形態は、例えば、結晶成長用基板と、個々のデバイス毎に分割された状態で、前記結晶成長用基板上に形成されたバッファ層と前記バッファ層上に形成されたLED素子と、を有する光デバイス基板の前記LED素子の形成された側に、本開示のLED移設部材における粘着力が低下する領域を有する側の面を接触させて前記光デバイス基板に前記LED移設部材を貼付して貼付体とし、前記バッファ層に対してレーザー光を照射して、前記バッファ層を破壊し、前記結晶成長用基板と前記LED移設部材とを分離することで前記LED素子を前記LED移設部材に移設し、前記LED移設部材を延伸して前記LED移設部材に移設された前記LED素子の間隔を拡張し、延伸された前記LED移設部材に光照射して、前記LED移設部材の粘着力を低下させることを含むものであってもよい。
 本開示のLED装置の製造方法は、LED素子の長辺の長さが100μm以下であるマイクロLED素子の製造に好適である。
<Method for manufacturing LED device>
The manufacturing method of the LED device of the present disclosure uses the LED transfer member of the present disclosure. The manufacturing method of the LED device of the present disclosure is not particularly limited as long as it uses the LED transfer member of the present disclosure. Since the LED transfer member of the present disclosure has a region on at least a part of the surface in which the adhesive strength is reduced by light irradiation, the method for manufacturing an LED device of the present disclosure reduces the adhesive strength of the transfer member at any stage. It is preferable to irradiate light as much as possible.
One embodiment of the method for manufacturing an LED device of the present disclosure includes, for example, a crystal growth substrate, a buffer layer formed on the crystal growth substrate in a state of being divided into individual devices, and a buffer layer formed on the buffer layer. and the side of the optical device substrate on which the LED elements are formed is brought into contact with the surface of the LED transfer member of the present disclosure on the side having the region where the adhesive strength is reduced, and the optical device substrate The LED relocating member is affixed to form an affixed body, the buffer layer is irradiated with laser light to break the buffer layer, and the crystal growth substrate and the LED relocating member are separated by separating the moving the LED element to the LED moving member, extending the LED moving member to extend the distance between the LED elements moved to the LED moving member, irradiating the extended LED moving member with light, It may include reducing the adhesive force of the LED transfer member.
The manufacturing method of the LED device of the present disclosure is suitable for manufacturing a micro LED element having a long side length of 100 μm or less.
 以下、本開示のLED移設部材を用いたLED装置の製造方法の一例を、図面に基づいて説明する。以下の説明では、図1に示す2層構成の移設部材10を用いた場合を例に説明するが、移設部材の層構成は、特に限定されるものではない。
 図3は、光デバイス基板30の断面図である。光デバイス基板30は、結晶成長用基板32と、個々のデバイス毎に分割された状態で、結晶成長用基板32上に形成されたバッファ層34とバッファ層34上に形成されたLED素子(マイクロLED素子)36と、を有する。
An example of a method for manufacturing an LED device using the LED transfer member of the present disclosure will be described below with reference to the drawings. In the following description, the case of using the transfer member 10 having a two-layer structure shown in FIG. 1 will be described as an example, but the layer structure of the transfer member is not particularly limited.
FIG. 3 is a cross-sectional view of the optical device substrate 30. As shown in FIG. The optical device substrate 30 includes a crystal growth substrate 32, a buffer layer 34 formed on the crystal growth substrate 32 in a state of being divided into individual devices, and LED elements (micrometers) formed on the buffer layer 34. LED element) 36.
 結晶成長用基板32は、その表面にLED素子36を形成するための下地となるものである。結晶成長用基板32としては、サファイア(AlO)、SiC、Si、GaAs、GaN、MgAl等が挙げられる。青色LEDに用いられるGaN系半導体の結晶形成には、結晶成長性の観点から、サファイア、SiC,Si、GaN基板等が好ましい。赤色LEDに用いられるAlInGaP系又はAlGaAs系の結晶成長には、結晶成長性の観点から、GaAs基板が好ましい。 The crystal growth substrate 32 serves as a base for forming the LED elements 36 on its surface. Examples of the crystal growth substrate 32 include sapphire (AlO), SiC, Si, GaAs, GaN, MgAl 2 O 4 and the like. From the viewpoint of crystal growth, sapphire, SiC, Si, GaN substrates, and the like are preferable for crystal formation of GaN-based semiconductors used for blue LEDs. For AlInGaP-based or AlGaAs-based crystal growth used for red LEDs, a GaAs substrate is preferable from the viewpoint of crystal growth.
 バッファ層34は、レーザー光の照射により破壊される層であり、結晶成長用基板32からLED素子36を分離するための分離層として機能する。バッファ層34を構成する成分は、結晶成長用基板32及びLED素子36の成分を鑑みて適宜選択される。また、バッファ層34の形成方法は特に限定されるものではない。 The buffer layer 34 is a layer that is destroyed by laser light irradiation, and functions as a separation layer for separating the LED element 36 from the crystal growth substrate 32 . The components constituting the buffer layer 34 are appropriately selected in consideration of the components of the crystal growth substrate 32 and the LED elements 36 . Also, the method of forming the buffer layer 34 is not particularly limited.
 LED素子36は、マイクロLEDの発光特性を担うものであり、結晶成長用基板32上に、LPE法(Liquid Phase Epitaxy:液相成長法)、MOVPE法(Metal Organic Vapor Phase Epitaxy:有機金属気相成長法)、分子線エピタキシー(Molecular Beam Epitaxy:MBE)等の方法によって形成する。LED素子36の成分は、例えば、アルミニウムガリウムヒ素(AlGaAs):赤、ガリウムヒ素リン(GaAsP):赤・橙・黄、インジウム窒化ガリウム(InGaN)/窒化ガリウム(GaN)/アルミニウム窒化ガリウム(AlGaN):橙・黄・緑・青・紫、リン化ガリウム(GaP):赤・黄・緑、セレン化亜鉛(ZnSe):緑・青、及びアルミニウムインジウムガリウムリン(AlGaInP):橙・黄橙・黄・緑が挙げられる。 The LED element 36 is responsible for the light emission characteristics of the micro LED, and the LPE method (Liquid Phase Epitaxy) and the MOVPE method (Metal Organic Vapor Phase Epitaxy) are formed on the crystal growth substrate 32. growth method), molecular beam epitaxy (MBE), or the like. The components of the LED element 36 are, for example, aluminum gallium arsenide (AlGaAs): red, gallium arsenide phosphide (GaAsP): red/orange/yellow, and indium gallium nitride (InGaN)/gallium nitride (GaN)/aluminum gallium nitride (AlGaN). : orange/yellow/green/blue/purple, gallium phosphide (GaP): red/yellow/green, zinc selenide (ZnSe): green/blue, and aluminum indium gallium phosphide (AlGaInP): orange/yellow-orange/yellow・ Green is mentioned.
 LED素子36上には、導電性突起であるバンプ38が設けられてもよい。バンプの材質としては、主な成分として、金、銀、銅、スズ-銀系、スズ-鉛系、スズ-ビスマス系、スズ-銅系等のはんだ、スズ、ニッケル、インジウム等が用いられる。バンプ38は、単一の成分で構成されていても、複数の成分から構成されていてもよい。バンプ38が複数の成分から構成される場合、これらの金属成分が積層された構造をなすように形成されていてもよい。 A bump 38 that is a conductive protrusion may be provided on the LED element 36 . As the material of the bumps, gold, silver, copper, tin-silver-based, tin-lead-based, tin-bismuth-based, tin-copper-based solders, tin, nickel, indium, etc. are used as main components. Bump 38 may be composed of a single component or multiple components. When bumps 38 are composed of a plurality of components, these metal components may be formed so as to form a laminated structure.
 LED装置の製造方法では、図4に示すように、光デバイス基板30のLED素子36が形成された側に移設部材10の粘着層14側を接触させることで光デバイス基板30に移設部材10を貼付して、貼付体40を得る。
 光デバイス基板30に移設部材10を貼付する方法は特に限定されるものではなく、従来から公知のラミネート方法を用いることができる。ラミネート方法としては、ロールラミネータ、ダイヤフラム式ラミネータ、真空ロールラミネータ、真空ダイヤフラム式ラミネータ等を用いたラミネート方法が挙げられる。
In the LED device manufacturing method, as shown in FIG. 4, the transfer member 10 is attached to the optical device substrate 30 by bringing the adhesive layer 14 side of the transfer member 10 into contact with the side of the optical device substrate 30 on which the LED elements 36 are formed. A patch 40 is obtained by sticking.
The method of adhering the transfer member 10 to the optical device substrate 30 is not particularly limited, and conventionally known lamination methods can be used. Examples of the lamination method include a lamination method using a roll laminator, a diaphragm type laminator, a vacuum roll laminator, a vacuum diaphragm type laminator, and the like.
 ラミネート条件は光デバイス基板30及び移設部材10の物性・特性によって適宜設定すればよい。例えば、ロール系のラミネータであれば、ラミネート温度は、室温(25℃)~200℃が好ましく、室温(25℃)~150℃がより好ましく、室温(25℃)~100℃がさらに好ましい。ラミネート温度が25℃以上であれば、移設部材10を光デバイス基板30へ強固に貼着できるため、バッファ層34に対してレーザー光を照射後に移設部材10と結晶成長用基板32とを分離する際に、LED素子36の移設部材10からの脱離、LED素子36の位置ズレの発生等が防止される傾向にある。ラミネート温度が200℃以下であれば、移設部材10と光デバイス基板30との間の熱膨張差が生じにくく、移設部材10を構成する基材12の低弾性化による歪み、たるみ等が生じにくいため、LED素子36の位置ズレの発生が防止される傾向にある。
 ダイヤフラム系のラミネータであれば、温度条件に関しては上述のロール系ラミネータと同様である。圧着時間は5秒~300秒が好ましく、5秒~200秒がより好ましく、5秒~100秒がさらに好ましい。圧着時間が5秒以上であれば、移設部材10を光デバイス基板30へ強固に貼着できるため、バッファ層34に対してレーザー光を照射後に移設部材10と結晶成長用基板32とを分離する際に、LED素子36の移設部材10からの脱離、LED素子36の位置ズレの発生等が防止される傾向にある。圧着時間が200秒以下であれば、LED装置の生産性が向上する傾向にある。
 ラミネート圧力は0.1MPa~3MPaが好ましく、0.1MPa~2MPaがより好ましく、0.1MPa~1MPaがさらに好ましい。ラミネート圧力が0.1MPa以上であれば、移設部材10を光デバイス基板30へ強固に貼着できるため、バッファ層34に対してレーザー光を照射後に移設部材10と結晶成長用基板32とを分離する際に、LED素子36の移設部材10からの脱離、LED素子36の位置ズレの発生等が防止される傾向にある。ラミネート圧力が3MPa以下であれば、LED素子36に印加される貼着圧力に起因するLED素子36の破損が防止され、クラック等の発生が抑制される傾向にある。
Lamination conditions may be appropriately set depending on the physical properties and characteristics of the optical device substrate 30 and the transfer member 10 . For example, in the case of a roll-type laminator, the lamination temperature is preferably room temperature (25°C) to 200°C, more preferably room temperature (25°C) to 150°C, and even more preferably room temperature (25°C) to 100°C. If the lamination temperature is 25° C. or higher, the transfer member 10 can be firmly adhered to the optical device substrate 30, so the transfer member 10 and the crystal growth substrate 32 are separated after irradiating the buffer layer 34 with laser light. In this case, the separation of the LED element 36 from the transfer member 10 and the occurrence of positional deviation of the LED element 36 tend to be prevented. If the lamination temperature is 200° C. or less, a difference in thermal expansion between the transfer member 10 and the optical device substrate 30 is unlikely to occur, and distortion, sagging, etc. due to low elasticity of the base material 12 constituting the transfer member 10 are unlikely to occur. Therefore, there is a tendency to prevent the LED element 36 from being displaced.
In the case of a diaphragm-type laminator, the temperature conditions are the same as those of the roll-type laminator described above. The crimping time is preferably 5 seconds to 300 seconds, more preferably 5 seconds to 200 seconds, even more preferably 5 seconds to 100 seconds. If the crimping time is 5 seconds or longer, the transfer member 10 can be firmly attached to the optical device substrate 30, so the transfer member 10 and the crystal growth substrate 32 are separated after the buffer layer 34 is irradiated with the laser light. In this case, the separation of the LED element 36 from the transfer member 10 and the occurrence of positional deviation of the LED element 36 tend to be prevented. If the crimping time is 200 seconds or less, the productivity of LED devices tends to improve.
The lamination pressure is preferably 0.1 MPa to 3 MPa, more preferably 0.1 MPa to 2 MPa, even more preferably 0.1 MPa to 1 MPa. If the lamination pressure is 0.1 MPa or more, the transfer member 10 can be firmly attached to the optical device substrate 30, so that the transfer member 10 and the crystal growth substrate 32 are separated after the buffer layer 34 is irradiated with the laser light. In this case, the separation of the LED element 36 from the transfer member 10 and the positional deviation of the LED element 36 tend to be prevented. If the lamination pressure is 3 MPa or less, damage to the LED elements 36 due to the bonding pressure applied to the LED elements 36 is prevented, and the occurrence of cracks and the like tends to be suppressed.
 次いで、図5に示すように、バッファ層34に対してレーザー光50を照射する。図5では、光デバイス基板30におけるLED素子36の形成された側とは反対側からレーザー光50がバッファ層34に対して照射されているが、レーザー光50の照射方向は特に限定されるものではなく、移設部材10における基材12側からレーザー光50がバッファ層34に対して照射されてもよい。
 バッファ層34に対してレーザー光50を照射することで、バッファ層34が破壊される。
Next, as shown in FIG. 5, the buffer layer 34 is irradiated with laser light 50 . In FIG. 5, the buffer layer 34 is irradiated with the laser light 50 from the opposite side of the optical device substrate 30 where the LED elements 36 are formed, but the irradiation direction of the laser light 50 is particularly limited. Alternatively, the buffer layer 34 may be irradiated with the laser light 50 from the substrate 12 side of the transfer member 10 .
By irradiating the buffer layer 34 with the laser light 50, the buffer layer 34 is destroyed.
 レーザーとしては、放電ランプを励起光源とするランプ励起レーザー(キセノンフラッシュランプ等)、LD(レーザーダイオード)によって励起されるダイオード励起レーザー(LD励起)などがある。媒質には、固体、気体、半導体等があり、固体ではYAGレーザー(イットリウム(Y)、アルミニウム(A)、ガーネット(G)で構成するYAGロッド使用)が、気体(ガス)ではエキシマレーザー(Excimer Laser)、COレーザー等が一般的に使用される。
 ダイオード励起レーザーでは一般的に、固体レーザー(ダイオード励起固体レーザー:DPSSレーザー)(DPSS:Diode Pumping Solid-State)が用いられる。エキシマレーザーと比較して、DPSSレーザーは価格が安く、維持管理が容易な点から好適である。
Examples of lasers include lamp-excited lasers (xenon flash lamps, etc.) using a discharge lamp as an excitation light source, diode-excited lasers (LD-excited) excited by an LD (laser diode), and the like. The medium includes solids, gases, semiconductors, etc. YAG lasers (using a YAG rod composed of yttrium (Y), aluminum (A), and garnet (G)) are used for solids, and excimer lasers are used for gases (gas). Laser), CO2 laser, etc. are commonly used.
Diode-pumped lasers generally use solid-state lasers (diode-pumped solid-state lasers: DPSS lasers) (DPSS: Diode Pumping Solid-State). A DPSS laser is preferable to an excimer laser because it is inexpensive and easy to maintain.
 次いで、図6に示すように、結晶成長用基板32と移設部材10とを分離する。このとき、結晶成長用基板32上に形成されたLED素子36が、移設部材10における粘着層14に貼着された状態で移設される。 Next, as shown in FIG. 6, the crystal growth substrate 32 and the transfer member 10 are separated. At this time, the LED elements 36 formed on the crystal growth substrate 32 are transferred while being adhered to the adhesive layer 14 of the transfer member 10 .
 次いで、図7に示すように、移設部材10を延伸する。図7では、移設部材10を、図7中に矢印で示す移設部材の面方向に延伸している。移設部材10を延伸することで、LED素子36間の間隔が移設部材の面方向に広がる。移設部材10を延伸する際に、LED素子36が移設部材10における粘着層14に貼着された状態とされるため、LED素子36の移設部材10からの脱離、LED素子36の位置ズレの発生等が防止される傾向にある。 Then, as shown in FIG. 7, the transfer member 10 is stretched. In FIG. 7, the transfer member 10 is extended in the planar direction of the transfer member indicated by the arrow in FIG. By extending the transfer member 10, the interval between the LED elements 36 is widened in the planar direction of the transfer member. Since the LED elements 36 are stuck to the adhesive layer 14 of the transfer member 10 when the transfer member 10 is extended, the separation of the LED elements 36 from the transfer member 10 and the displacement of the LED elements 36 do not occur. It tends to be prevented from occurring.
 移設部材10の延伸方法は特に限定されるものではなく、例えば、突上げ方式と引張り方式がある。
 突上げ方式は、移設部材10を固定後、所定の形をしたステージが上昇することで移設部材10が引き伸ばされる方法である。引張り方式は移設部材10を固定後、設置した移設部材10と平行に所定の方向に引っ張ることで移設部材10が引き伸ばされる方式である。LED素子36の間隔を均一に引き伸ばせること、必要な(占有する)装置面積が小さくてコンパクトであることから、突上げ方式が好ましい。
A method for stretching the transfer member 10 is not particularly limited, and includes, for example, a push-up method and a pulling method.
The push-up method is a method in which the transfer member 10 is stretched by raising a stage having a predetermined shape after fixing the transfer member 10 . The pulling method is a method in which the moving member 10 is stretched by pulling in a predetermined direction in parallel with the moving member 10 that has been set after fixing the moving member 10 . The push-up method is preferable because the space between the LED elements 36 can be uniformly extended and the device area required (occupied) is small and compact.
 延伸条件は移設部材10の特性に応じて適宜設定すればよい。例えば、突上げ量又は引張り量は10mm~500mmが好ましく、10mm~300mmがより好ましい。突上げ量又は引張り量が10mm以上であれば、LED素子36の間隔を十分に拡張できる傾向にある。突上げ量又は引張り量が500mm以下であれば、LED素子36の飛散、位置ズレ等が防止される傾向にある。
 延伸の際の温度は、移設部材10の特性に応じて適宜設定すればよい。延伸の際の温度は、例えば、10℃~200℃が好ましく、10℃~150℃がより好ましく、20℃~100℃がさらに好ましい。延伸の際の温度が10℃以上であれば、移設部材10を容易に延伸可能となる傾向にある。延伸の際の温度が200℃以下であれば、移設部材10の熱膨張、低弾性化等に起因する歪み、たるみ等が防止され、LED素子36の飛散、位置ズレ等が防止される傾向にある。
 延伸速度は、移設部材10の特性に応じて適宜設定すればよい。例えば、延伸速度は、0.1mm/sec~500mm/secが好ましく、0.1mm/sec~300mm/secがより好ましく、0.1mm/sec~200mm/secがさらに好ましい。延伸速度が0.1mm/sec以上であれば、生産性の悪化が抑制される傾向にある。延伸速度が500mm/sec以下であれば、LED素子36の飛散が抑制される傾向にある。
The stretching conditions may be appropriately set according to the characteristics of the transfer member 10 . For example, the amount of pushing up or pulling is preferably 10 mm to 500 mm, more preferably 10 mm to 300 mm. If the amount of push-up or the amount of pull is 10 mm or more, there is a tendency that the interval between the LED elements 36 can be sufficiently extended. If the thrust amount or the pull amount is 500 mm or less, scattering of the LED elements 36, positional displacement, etc. tend to be prevented.
The temperature during stretching may be appropriately set according to the characteristics of the transfer member 10 . The temperature during stretching is, for example, preferably 10°C to 200°C, more preferably 10°C to 150°C, even more preferably 20°C to 100°C. If the temperature during stretching is 10° C. or higher, there is a tendency that the transfer member 10 can be easily stretched. If the temperature during stretching is 200° C. or less, distortion, sagging, and the like due to thermal expansion, low elasticity, and the like of the transfer member 10 are prevented, and scattering and positional displacement of the LED elements 36 tend to be prevented. be.
The stretching speed may be appropriately set according to the characteristics of the transfer member 10 . For example, the stretching speed is preferably 0.1 mm/sec to 500 mm/sec, more preferably 0.1 mm/sec to 300 mm/sec, and even more preferably 0.1 mm/sec to 200 mm/sec. If the stretching speed is 0.1 mm/sec or more, deterioration of productivity tends to be suppressed. If the drawing speed is 500 mm/sec or less, scattering of the LED elements 36 tends to be suppressed.
 その後、移設部材10に対して光照射が行われる。これにより、移設部材10における粘着層14の粘着力が低減し、LED素子36を移設部材10からピックアップしやすくなる。 After that, the transfer member 10 is irradiated with light. As a result, the adhesive strength of the adhesive layer 14 on the transfer member 10 is reduced, making it easier to pick up the LED element 36 from the transfer member 10 .
 次いで、図8に示すように、LED素子36を移設部材10からピックアップ手段52を用いてピックアップし、図9に示すように、ピックアップされたLED素子36を実装基板54に設けられたパッド56に搭載し、バンプ38とパッド56とを接合してマイクロLEDが製造される。 Next, as shown in FIG. 8, the LED element 36 is picked up from the transfer member 10 using the pickup means 52, and as shown in FIG. After mounting, the bumps 38 and the pads 56 are bonded to manufacture the micro LED.
 LED素子36が実装される実装基板54としては、通常の回路基板であれば特に制限はない。実装基板54は、主な成分として、ガラス、ガラスエポキシ、ポリエステル、セラミック、エポキシ、ビスマレイミドトリアジン、ポリイミド等の基板表面に形成された金属層の不要な個所をエッチング除去して配線パターンが形成されたもの、基板表面に金属めっきなどによって配線パターンを形成したもの、基板表面に導電性物質を印刷して配線パターンを形成したものなどを用いることができる。 The mounting board 54 on which the LED element 36 is mounted is not particularly limited as long as it is a normal circuit board. The mounting substrate 54 is mainly composed of glass, glass epoxy, polyester, ceramic, epoxy, bismaleimide triazine, polyimide, or the like, and a wiring pattern is formed by removing unnecessary portions of a metal layer formed on the surface of the substrate by etching. substrate, a substrate having a wiring pattern formed on its surface by metal plating or the like, a substrate having a wiring pattern formed by printing a conductive substance on its surface, and the like can be used.
 実装基板54上のパッド56を含む配線パターンの表面は、主な成分として、金、銀、銅、スズ-銀系、スズ-鉛系、スズ-ビスマス系、スズ-銅系等のはんだ、スズ、ニッケル、酸化インジウムスズ(ITO)、インジウム等からなる金属層で形成されていてもよい。配線パターンは、単一の成分のみで構成されていても、複数の成分から構成されていてもよい。また、配線パターンは、複数の金属層が積層された構造をしていてもよい。 The surface of the wiring pattern including the pads 56 on the mounting board 54 is mainly composed of gold, silver, copper, tin-silver-based, tin-lead-based, tin-bismuth-based, tin-copper-based solder, tin , nickel, indium tin oxide (ITO), indium, or the like. The wiring pattern may consist of only a single component, or may consist of a plurality of components. Moreover, the wiring pattern may have a structure in which a plurality of metal layers are laminated.
 LED素子36のピックアップ方法は、フリップチップボンダ、ダイマウンター等の、ピックアップツールを用いて気圧差で吸着する方法、ピックアップツールに粘着体を設けて粘着力でピックアップする方法などが挙げられる。LED素子36をピックアップ後に位置合わせして実装基板54に設けられたパッド56に搭載する。粘着体を設けたローラー等を使用してLED素子36をピックアップしてもよい。 Methods for picking up the LED element 36 include a method of picking up the LED element 36 using a pick-up tool such as a flip chip bonder and a die mounter with an air pressure difference, and a pick-up method of providing an adhesive on the pick-up tool and picking up with an adhesive force. After being picked up, the LED elements 36 are aligned and mounted on the pads 56 provided on the mounting substrate 54 . The LED element 36 may be picked up using a roller or the like provided with an adhesive.
 LED素子36を移設部材10からピックアップするに際し、キャリアを用いることもできる。
 図6に示すように結晶成長用基板32と移設部材10とを分離し、次いで図7に示すように移設部材10を延伸した後、図10に示すように、移設部材10におけるLED素子36が移設された側の面に、キャリア60を貼着する。移設部材10に対する光照射は、移設部材10を延伸した後であればよく、キャリア60を移設部材10に貼着する前であっても後であってもよい。
A carrier can also be used when picking up the LED element 36 from the transfer member 10 .
As shown in FIG. 6, the crystal growth substrate 32 and the transfer member 10 are separated, and then the transfer member 10 is extended as shown in FIG. 7. After that, as shown in FIG. A carrier 60 is adhered to the surface of the transferred side. Light irradiation to the transferable member 10 may be performed after the transferable member 10 is stretched, and may be applied before or after the carrier 60 is adhered to the transferable member 10 .
 次いで、キャリア60と移設部材10とを分離する。キャリア60には、LED素子36が移設される。次いで、図11に示すように、キャリア60に移設されたLED素子36を実装基板54に設けられたパッド56に搭載し、バンプ38とパッド56とを接合してマイクロLEDが製造される。 Then, the carrier 60 and the transfer member 10 are separated. The LED element 36 is transferred to the carrier 60 . Next, as shown in FIG. 11, the LED elements 36 transferred to the carrier 60 are mounted on the pads 56 provided on the mounting board 54, and the bumps 38 and the pads 56 are bonded to manufacture the micro LED.
 キャリア60にLED素子36を転写する方法は特に限定されるものではなく、従来から公知のラミネート方法を用いることができる。ラミネート方法としては、ロールラミネータ、ダイヤフラム式ラミネータ、真空ロールラミネータ、真空ダイヤフラム式ラミネータ等を用いたラミネート方法が挙げられる。 The method of transferring the LED elements 36 to the carrier 60 is not particularly limited, and conventionally known lamination methods can be used. Examples of the lamination method include a lamination method using a roll laminator, a diaphragm type laminator, a vacuum roll laminator, a vacuum diaphragm type laminator, and the like.
 ラミネート条件はキャリア60及び移設部材10の物性・特性によって適宜設定すればよい。例えば、ロール系のラミネータであれば、ラミネート温度は、室温(25℃)~200℃が好ましく、室温(25℃)~150℃がより好ましく、室温(25℃)~100℃がさらに好ましい。ラミネート温度が25℃以上であれば、キャリア60を移設部材10へ強固に貼着できるため、キャリア60と移設部材10とを分離する際に、LED素子36の移設部材10又はキャリア60からの脱離、LED素子36の位置ズレの発生等が防止される傾向にある。ラミネート温度が200℃以下であれば、移設部材10とキャリア60との間の熱膨張差が生じにくく、移設部材10を構成する基材12の低弾性化による歪み、たるみ等が生じにくいため、LED素子36の位置ズレの発生が防止される傾向にある。
 ダイヤフラム系のラミネータであれば、温度条件に関しては上述のロール系ラミネータと同様である。圧着時間は5秒~300秒が好ましく、5秒~200秒がより好ましく、5秒~100秒がさらに好ましい。圧着時間が5秒以上であれば、キャリア60を移設部材10へ強固に貼着できるため、キャリア60と移設部材10とを分離する際に、LED素子36の移設部材10又はキャリア60からの脱離、LED素子36の位置ズレの発生等が防止される傾向にある。圧着時間が200秒以下であれば、LED装置の生産性が向上する傾向にある。
 ラミネート圧力は0.1MPa~3MPaが好ましく、0.1MPa~2MPaがより好ましく、0.1MPa~1MPaがさらに好ましい。ラミネート圧力が0.1MPa以上であれば、キャリア60を移設部材10へ強固に貼着できるため、キャリア60と移設部材10とを分離する際に、LED素子36の移設部材10又はキャリア60からの脱離、LED素子36の位置ズレの発生等が防止される傾向にある。ラミネート圧力が3MPa以下であれば、LED素子36に印加される貼着圧力に起因するLED素子36の破損が防止され、クラック等の発生が抑制される傾向にある。
Lamination conditions may be appropriately set depending on the physical properties and characteristics of the carrier 60 and the transfer member 10 . For example, in the case of a roll-type laminator, the lamination temperature is preferably room temperature (25°C) to 200°C, more preferably room temperature (25°C) to 150°C, and even more preferably room temperature (25°C) to 100°C. If the lamination temperature is 25° C. or higher, the carrier 60 can be firmly attached to the transfer member 10 , so when the carrier 60 and the transfer member 10 are separated, the LED element 36 can be removed from the transfer member 10 or the carrier 60 . This tends to prevent the occurrence of separation, positional deviation of the LED element 36, and the like. If the lamination temperature is 200° C. or lower, a difference in thermal expansion between the transfer member 10 and the carrier 60 is less likely to occur, and distortion, sagging, etc. due to low elasticity of the base material 12 constituting the transfer member 10 are less likely to occur. This tends to prevent the positional deviation of the LED element 36 from occurring.
In the case of a diaphragm-type laminator, the temperature conditions are the same as those of the roll-type laminator described above. The crimping time is preferably 5 seconds to 300 seconds, more preferably 5 seconds to 200 seconds, even more preferably 5 seconds to 100 seconds. If the crimping time is 5 seconds or more, the carrier 60 can be firmly attached to the transfer member 10, so that when the carrier 60 and the transfer member 10 are separated, the LED element 36 cannot be removed from the transfer member 10 or the carrier 60. This tends to prevent the occurrence of separation, positional deviation of the LED element 36, and the like. If the crimping time is 200 seconds or less, the productivity of LED devices tends to improve.
The lamination pressure is preferably 0.1 MPa to 3 MPa, more preferably 0.1 MPa to 2 MPa, even more preferably 0.1 MPa to 1 MPa. If the lamination pressure is 0.1 MPa or more, the carrier 60 can be firmly attached to the transfer member 10, so that when the carrier 60 and the transfer member 10 are separated, the LED element 36 cannot be removed from the transfer member 10 or the carrier 60. Detachment, displacement of the LED element 36, and the like tend to be prevented. If the lamination pressure is 3 MPa or less, damage to the LED elements 36 due to the bonding pressure applied to the LED elements 36 is prevented, and the occurrence of cracks and the like tends to be suppressed.
 キャリア60は、貼着時の温度及び圧力に耐えられることができ、LED素子36の破損を防止し、LED素子36の間隔を維持できれば特に制限はない。キャリア60は、上述のラミネート温度に耐えうる耐熱性があることが好ましい。
 キャリア60の材質としては、特に制限はないが、シリコン、ガラス、SUS、鉄、Cu等の板、ガラスエポキシ基板などが挙げられる。
The carrier 60 is not particularly limited as long as it can withstand the temperature and pressure at the time of attachment, prevents the LED elements 36 from being damaged, and maintains the distance between the LED elements 36 . Carrier 60 is preferably heat resistant to withstand the lamination temperatures described above.
The material of the carrier 60 is not particularly limited, but examples thereof include silicon, glass, SUS, iron, Cu plates, glass epoxy substrates, and the like.
 キャリア60の平均厚みは100μm~5mmが好ましく、100μm~4mmがより好ましく、100μm~3mmがさらに好ましい。キャリア60の平均厚みが100μm以上であると取り扱い性が向上する。キャリア60は厚くても格段の取り扱い性向上が見込めるわけではないため、経済面から考慮してキャリアの平均厚みは5mm以下であればよい。 The average thickness of the carrier 60 is preferably 100 μm to 5 mm, more preferably 100 μm to 4 mm, even more preferably 100 μm to 3 mm. If the average thickness of the carrier 60 is 100 μm or more, the handleability is improved. Even if the carrier 60 is thick, it is not expected that the handling efficiency will be significantly improved.
 キャリア60は、複数の層から成っていてもよい。上述の耐熱性及び取り扱い性を担う層に加えて、粘着力制御を付与する観点から、粘着層又は仮固定材をラミネートした層があってもよい。粘着力は、適宜設定すればよい。移設部材10からキャリア60へのLED素子36の転写性の観点から、キャリア60に付与される粘着力は、粘着層14の光照射後の粘着力よりも高いことが好ましい。 The carrier 60 may consist of multiple layers. In addition to the layer responsible for heat resistance and handleability described above, there may be a layer laminated with an adhesive layer or a temporary fixing material from the viewpoint of imparting adhesion control. The adhesive force may be set as appropriate. From the viewpoint of transferability of the LED elements 36 from the transfer member 10 to the carrier 60, the adhesive strength imparted to the carrier 60 is preferably higher than the adhesive strength of the adhesive layer 14 after light irradiation.
 キャリア60から実装基板54にLED素子36を搭載する方法は、特に制限はなく、従来から公知のラミネート方法を用いることができる。ラミネート方法としては、ロールラミネータ、ダイヤフラム式ラミネータ、真空ロールラミネータ、真空ダイヤフラム式ラミネータ等を用いたラミネート方法が挙げられる。 The method of mounting the LED elements 36 from the carrier 60 to the mounting board 54 is not particularly limited, and conventionally known lamination methods can be used. Examples of the lamination method include a lamination method using a roll laminator, a diaphragm type laminator, a vacuum roll laminator, a vacuum diaphragm type laminator, and the like.
 ラミネート条件はキャリア60、実装基板54及びLED素子36の物性・特性によって適宜設定すればよい。バンプ38の保護、バンプ38と実装基板54との接続部の保護、マイクロLEDの信頼性向上等を目的として、アンダーフィル材が予め実装基板54上に供給されていてもよい。アンダーフィル材が供給されると、LED素子36が実装基板54に固定されやすく、LED素子36の位置ズレが発生しにくい傾向にある。 The lamination conditions may be appropriately set according to the physical properties and characteristics of the carrier 60, the mounting board 54 and the LED element 36. An underfill material may be supplied on the mounting board 54 in advance for the purpose of protecting the bumps 38, protecting the connecting portions between the bumps 38 and the mounting board 54, improving the reliability of the micro LED, and the like. When the underfill material is supplied, the LED elements 36 are easily fixed to the mounting substrate 54, and the positional deviation of the LED elements 36 tends to be less likely to occur.
 例えば、ロール系のラミネータであれば、ラミネート温度は、室温(25℃)~200℃が好ましく、室温(25℃)~150℃がより好ましく、室温(25℃)~100℃がさらに好ましい。ラミネート温度が25℃以上であれば、LED素子36を実装基板54へ強固に固定できるため、キャリア60と実装基板54とを分離する際に、LED素子36の実装基板54からの脱離、LED素子36の位置ズレの発生等が防止される傾向にある。ラミネート温度が200℃以下であれば、キャリア60と実装基板54との間の熱膨張差が生じにくく、LED素子36の位置ズレの発生が防止される傾向にある。
 ダイヤフラム系のラミネータであれば、温度条件に関しては上述のロール系ラミネータと同様である。圧着時間は5秒~300秒が好ましく、5秒~200秒がより好ましく、5秒~100秒がさらに好ましい。圧着時間が5秒以上であれば、LED素子36を実装基板54へ強固に固定できるため、キャリア60と実装基板54とを分離した際に、LED素子36の実装基板54からの脱離、LED素子36の位置ズレの発生等が防止される傾向にある。圧着時間が200秒以下であれば、LED装置の生産性が向上する傾向にある。
 ラミネート圧力は0.1MPa~3MPaが好ましく、0.1MPa~2MPaがより好ましく、0.1MPa~1MPaがさらに好ましい。ラミネート圧力が0.1MPa以上であれば、LED素子36を実装基板54へ強固に固定できるため、キャリア60と実装基板54とを分離する際に、LED素子36の実装基板54からの脱離、LED素子36の位置ズレの発生等が防止される傾向にある。ラミネート圧力が3MPa以下であれば、LED素子36に印加される圧力に起因するLED素子36の破損が防止され、クラック等の発生が抑制される傾向にある。
For example, in the case of a roll-type laminator, the lamination temperature is preferably room temperature (25°C) to 200°C, more preferably room temperature (25°C) to 150°C, and even more preferably room temperature (25°C) to 100°C. If the lamination temperature is 25° C. or higher, the LED element 36 can be firmly fixed to the mounting board 54 , so when the carrier 60 and the mounting board 54 are separated, the LED element 36 does not detach from the mounting board 54 . This tends to prevent occurrence of positional displacement of the element 36 and the like. If the lamination temperature is 200° C. or less, a difference in thermal expansion between the carrier 60 and the mounting board 54 is less likely to occur, and positional displacement of the LED elements 36 tends to be prevented.
In the case of a diaphragm-type laminator, the temperature conditions are the same as those of the roll-type laminator described above. The crimping time is preferably 5 seconds to 300 seconds, more preferably 5 seconds to 200 seconds, even more preferably 5 seconds to 100 seconds. If the crimping time is 5 seconds or more, the LED element 36 can be firmly fixed to the mounting board 54, so when the carrier 60 and the mounting board 54 are separated, the LED element 36 is detached from the mounting board 54, and the LED This tends to prevent occurrence of positional displacement of the element 36 and the like. If the crimping time is 200 seconds or less, the productivity of LED devices tends to improve.
The lamination pressure is preferably 0.1 MPa to 3 MPa, more preferably 0.1 MPa to 2 MPa, even more preferably 0.1 MPa to 1 MPa. If the lamination pressure is 0.1 MPa or more, the LED element 36 can be firmly fixed to the mounting substrate 54, so when the carrier 60 and the mounting substrate 54 are separated, the LED element 36 does not detach from the mounting substrate 54, This tends to prevent the occurrence of positional deviation of the LED element 36 and the like. If the lamination pressure is 3 MPa or less, damage to the LED element 36 due to the pressure applied to the LED element 36 is prevented, and the occurrence of cracks and the like tends to be suppressed.
 なお、本開示は、上述のような実施形態の具体的構成に限定されるものではなく、本開示の主旨を逸脱しない範囲で種々変形することができる。 It should be noted that the present disclosure is not limited to the specific configuration of the embodiment as described above, and various modifications can be made without departing from the gist of the present disclosure.
 以下、本開示を実施例に基づいてより具体的に説明するが、本開示はこれらの実施例に限定されるものではない。 Hereinafter, the present disclosure will be described more specifically based on examples, but the present disclosure is not limited to these examples.
(アクリル樹脂の作製)
 スリーワンモータ、撹拌翼及び窒素導入管が備え付けられた容量4000mlのオートクレーブに酢酸エチル1000g、2-エチルヘキシルアクリレート650g、2-ヒドロキシエチルアクリレート350g及びアゾビスイソブチロニトリル3.0gを配合し、均一になるまで撹拌後、流量100ml/分にて60分間窒素バブリングを実施し、系中の溶存酸素を脱気した。1時間かけて60℃まで昇温し、昇温後4時間重合させた。その後1時間かけて90℃まで昇温し、更に90℃にて1時間保持後、室温に冷却した。
 次に酢酸エチルを1000g加えて撹拌し希釈した。これに重合禁止剤としてメトキノンを0.1g、ウレタン化触媒として、ジオクチルスズジラウレートを0.05g添加したのち、2-メタクリロキシエチルイソシアネート(昭和電工株式会社製、カレンズMOI)を100g加え、70℃で6時間反応させたのち室温に冷却した。その後、酢酸エチルを加え、アクリル樹脂の溶液中の不揮発分含有率が35質量%となるよう調整し、連鎖重合可能な官能基を有するアクリル樹脂の溶液を得た。
 この樹脂の酸価と水酸基価を、JIS K0070:1992に従って測定したところ、酸価は検出されなかった。水酸基価を求めたところ、121mgKOH/gであった。
 得られたアクリル樹脂の溶液を60℃で一晩真空乾燥し、得られた固形分をエレメンタール社製全自動元素分析装置(varioEL)にて元素分析した。測定された窒素含有量から、アクリル樹脂に導入された2-メタクリロキシエチルイソシアネートの含有量を算出したところ、0.59mmol/gであった。
 また東ソー株式会社製SD-8022/DP-8020/RI-8020を使用し、カラムには昭和電工マテリアルズ株式会社製Gelpack GL-A150-S/GL-A160-Sを用い、溶離液にテトラヒドロフランを用いてGPC測定をした結果、アクリル樹脂のポリスチレン換算重量平均分子量は42万であった。
(Production of acrylic resin)
1000 g of ethyl acetate, 650 g of 2-ethylhexyl acrylate, 350 g of 2-hydroxyethyl acrylate and 3.0 g of azobisisobutyronitrile were mixed in an autoclave with a capacity of 4000 ml equipped with a three-one motor, a stirring blade and a nitrogen inlet tube, and mixed uniformly. After stirring until the content became , nitrogen bubbling was performed for 60 minutes at a flow rate of 100 ml/min to deaerate dissolved oxygen in the system. The temperature was raised to 60° C. over 1 hour, and polymerization was carried out for 4 hours after the temperature was raised. After that, the temperature was raised to 90° C. over 1 hour, held at 90° C. for 1 hour, and then cooled to room temperature.
Then 1000 g of ethyl acetate was added and diluted with stirring. To this, 0.1 g of methoquinone as a polymerization inhibitor and 0.05 g of dioctyltin dilaurate as a urethanization catalyst were added. After reacting for 6 hours at , it was cooled to room temperature. Thereafter, ethyl acetate was added to adjust the non-volatile content in the acrylic resin solution to 35% by mass, thereby obtaining an acrylic resin solution having a functional group capable of chain polymerization.
When the acid value and hydroxyl value of this resin were measured according to JIS K0070:1992, no acid value was detected. A hydroxyl value was found to be 121 mgKOH/g.
The obtained acrylic resin solution was vacuum-dried overnight at 60° C., and the obtained solid content was subjected to elemental analysis using a fully automatic elemental analyzer (varioEL) manufactured by Elemental. From the measured nitrogen content, the content of 2-methacryloxyethyl isocyanate introduced into the acrylic resin was calculated to be 0.59 mmol/g.
In addition, SD-8022 / DP-8020 / RI-8020 manufactured by Tosoh Corporation is used, Gelpack GL-A150-S / GL-A160-S manufactured by Showa Denko Materials Co., Ltd. is used for the column, and tetrahydrofuran is used as the eluent. As a result of GPC measurement using the acrylic resin, the polystyrene-equivalent weight average molecular weight of the acrylic resin was 420,000.
(移設部材Aの作製)
 このアクリル樹脂溶液(アクリル樹脂の固形分換算で100質量部)に対し、架橋剤として多官能イソシアネート(日本ポリウレタン工業株式会社製、コロネートL、固形分75質量%)を固形分として1質量部、光重合開始剤として1-ヒドロキシシクロヘキシルフェニルケトン(IGM Resins B.V.製、イルガキュア184)を1質量部、更に総固形分含有率が27質量%となるように酢酸エチルを加え、10分間均一に撹拌した。その後、得られた溶液を、保護フィルムである表面離型処理ポリエチレンテレフタレート(平均厚み25μm)の上に乾燥時の粘着層の平均厚みが10μmになるよう塗工後乾燥し、粘着層を形成した。更に、基材フィルム(平均厚み100μm)に粘着層面をラミネートした。その後、40℃で4日間エージングを行った。このようにして、移設部材Aを得た。
(Production of transfer member A)
For this acrylic resin solution (100 parts by mass in terms of the solid content of the acrylic resin), 1 part by mass of a polyfunctional isocyanate (manufactured by Nippon Polyurethane Industry Co., Ltd., Coronate L, solid content 75% by mass) as a solid content as a cross-linking agent, 1 part by mass of 1-hydroxycyclohexylphenyl ketone (Irgacure 184, manufactured by IGM Resins B.V.) as a photopolymerization initiator, and ethyl acetate was added so that the total solid content was 27% by mass, and the mixture was uniformly mixed for 10 minutes. was stirred to After that, the obtained solution was coated on a release-treated polyethylene terephthalate (average thickness of 25 μm) as a protective film so that the average thickness of the adhesive layer when dried was 10 μm, and then dried to form an adhesive layer. . Furthermore, the adhesive layer surface was laminated on the substrate film (average thickness 100 μm). After that, aging was performed at 40° C. for 4 days. Thus, the transfer member A was obtained.
 基材フィルムはアイオノマー樹脂のハイミラン1706(三井・デュポンポリケミカル株式会社製、アイオノマー樹脂)とエチレン・1-ヘキセン共重合体とブテン・α-オレフィン共重合体とハイミラン1706とがこの順で積層された三層の樹脂フィルム(ハイミラン1706/エチレン・1-ヘキセン共重合体とブテン・α-オレフィン共重合体/ハイミラン1706、平均厚み100μm)を用いた The base film is an ionomer resin Himilan 1706 (manufactured by DuPont Mitsui Polychemicals, ionomer resin), an ethylene/1-hexene copolymer, a butene/α-olefin copolymer, and Himilan 1706 laminated in this order. A three-layer resin film (Himilan 1706/ethylene/1-hexene copolymer and butene/α-olefin copolymer/Himilan 1706, average thickness 100 μm) was used.
 なお、粘着層及び保護フィルムと基材フィルムとは、40℃のロールラミネータでラミネートし、保護フィルム/粘着層/基材フィルムの順構成とした。移設部材として使用する際は、保護フィルムを剥がして使用した。 The adhesive layer and protective film and base film were laminated with a roll laminator at 40°C to form a protective film/adhesive layer/base film order. When used as a transfer member, the protective film was removed before use.
(移設部材B~Eの作製)
 粘着層成分の比率及び基材の種類を変更したこと以外は同様な方法で、移設部材B~Eを作製した。
 移設部材Bでは、粘着層成分の比率を、アクリル樹脂:100質量部、コロネートL:4質量部、イルガキュア184:1質量部とした。
 移設部材Cでは、粘着層成分の比率を、アクリル樹脂:100質量部、コロネートL:0.2質量部、イルガキュア184:1質量部とした。
 移設部材Dでは、粘着層成分の比率を、アクリル樹脂:100質量部、コロネートL:1質量部、イルガキュア184:1質量部とした。
 移設部材Eでは、粘着層成分の比率を、アクリル樹脂:100質量部、コロネートL:1質量部、イルガキュア184:1質量部とした。
 移設部材Dでは基材フィルムをシリコーン製シートに、移設部材Eではポリエチレンテレフタレートフィルムに、各々変更した。
(Production of transfer members B to E)
Transfer members B to E were produced in the same manner except that the ratio of the adhesive layer components and the type of base material were changed.
In the transfer member B, the ratio of the adhesive layer components was set to 100 parts by mass of acrylic resin, 4 parts by mass of Coronate L, and 184 parts by mass of Irgacure.
In the transfer member C, the ratio of the adhesive layer components was set to acrylic resin: 100 parts by mass, Coronate L: 0.2 parts by mass, and Irgacure 184:1 parts by mass.
In the transfer member D, the ratio of the adhesive layer components was set to acrylic resin: 100 parts by mass, Coronate L: 1 part by mass, and Irgacure 184: 1 part by mass.
In the transfer member E, the ratio of the adhesive layer components was set to acrylic resin: 100 parts by mass, Coronate L: 1 part by mass, and Irgacure 184: 1 part by mass.
The base film of the transfer member D was changed to a silicone sheet, and the base film of the transfer member E was changed to a polyethylene terephthalate film.
 評価サンプルの作製方法と各種条件を以下に記載する。 The method of preparing the evaluation sample and various conditions are described below.
 3.1mm×3.6mmサイズのサファイアダイの上に個々のデバイス毎に分割された状態でバッファ層を介してLED素子が形成されたテストビークル(Test Vehicle、ナイトライドセミコンダクター製)に、移設部材をラミネートした。移設部材のサイズは200mm×200mm、平均厚みは110μmとした。LED素子のサイズは25μm×50μm×6μmtとし、LED素子に設けられたバンプサイズは15μm×15μm×2μmtとした。サファイアダイ上のLED素子は4465個とした。サファイアダイへの移設部材のラミネートは、ダイヤフラム式の真空ラミネータ(ラミネート装置V130、ニッコーマテリアルズ製)を使用し、貼付体を得た。これを測定サンプルとした。ラミネート条件は、40℃/0.5MPa/10秒とした。 A transfer member was placed on a test vehicle (Test Vehicle, made by Nitride Semiconductor) in which LED elements were formed through a buffer layer in a state divided into individual devices on a 3.1 mm x 3.6 mm sapphire die. was laminated. The transfer member had a size of 200 mm×200 mm and an average thickness of 110 μm. The size of the LED element was 25 μm×50 μm×6 μmt, and the bump size provided on the LED element was 15 μm×15 μm×2 μmt. There were 4465 LED elements on the sapphire die. A diaphragm-type vacuum laminator (Laminator V130, manufactured by Nikko Materials) was used to laminate the transfer member onto the sapphire die to obtain an adhered body. This was used as a measurement sample. The lamination conditions were 40° C./0.5 MPa/10 seconds.
(LLO転写率の測定)
 作製した上記サンプルのサファイアダイ側からレーザーを照射した。LLO装置として、DFL7560(株式会社ディスコ製)を用いた。レーザー光の照射度は1Wとした。レーザー照射後、サファイアダイと移設部材とを分離した。分離した際の、LED素子の移設部材への転写率を測定した。移設部材にクラック及び位置ズレなく転写できたLED素子を良品とした。LED素子がサファイアダイ側に残った場合、または、サファイアダイと移設部材とを分離したときに移設部材からLED素子が外れたり位置ズレした場合を不良品として個数を数えた。
 サファイアダイ6個分(LED素子が4465個×6)を評価して、良好に転写できたLED素子の個数をLED素子の総数(4465個×6)で除して100を掛けた値を転写率として算出し、この値をLLO転写率とした。LLO転写率が95%以上をA、90%以上で95%よりも低い場合をB、90%未満をCとした。評価がA又はBであれば、実用上差し支えない。
(Measurement of LLO transfer rate)
A laser was irradiated from the sapphire die side of the prepared sample. DFL7560 (manufactured by DISCO Corporation) was used as the LLO device. The irradiation intensity of the laser beam was set to 1W. After the laser irradiation, the sapphire die and the transfer member were separated. The transfer rate of the LED element to the transfer member when separated was measured. An LED element that could be transferred to the transfer member without cracks or misalignment was regarded as a non-defective product. When the LED elements remained on the sapphire die side, or when the sapphire die and the transfer members were separated, the LED elements were detached or displaced from the transfer members, and the number of the LED elements was counted as defective products.
Six sapphire dies (4465 x 6 LED elements) were evaluated, and the number of successfully transferred LED elements was divided by the total number of LED elements (4465 x 6) and multiplied by 100 for transfer. This value was taken as the LLO transfer rate. A is given when the LLO transfer rate is 95% or more, B is given when it is 90% or more but less than 95%, and C is given when it is less than 90%. If the evaluation is A or B, there is no practical problem.
(キャリアへの転写率の測定)
 LLO転写率の測定の際にサファイアダイを分離して得られた移設部材をサンプルとして用い、移設部材からキャリアへのLED素子の転写を実施した。移設部材にUV照射(UV露光機ML-320FSAT、ミカサ株式会社製)を実施後、移設部材をキャリアにラミネートした。キャリアとしては、Siダイ/粘着層の構成のキャリアを用いた。Siダイは、直径20mm、厚み725μmtとした。粘着層の成分比率は、アクリル樹脂:100質量部、コロネートL:7質量部、イルガキュア:1質量部とした。粘着層の平均厚み:10μm、粘着力1.1N/25mmとした。
 ラミネート後に移設部材とキャリアとを分離した。UV照射条件は、300mJ/cmとした。ラミネートはダイヤフラム式の真空ラミネータ(ラミネート装置V130、ニッコーマテリアルズ製)を使用した。ラミネート条件は40℃/0.5MPa/30秒とした。移設部材からキャリアにクラック及び位置ズレなく転写できたLED素子を良品とした。LED素子が移設部材に残った場合、または、移設部材とキャリアとを分離したときにキャリアからLED素子が外れたり位置ズレした場合を不良品として個数を数えた。
 サファイアダイ6個分(LED素子が4465個×6)のLED素子が転写された移設部材を評価して、移設部材からキャリアへ良好に転写できたLED素子の個数をLED素子の総数(4465個×6)で除して100を掛けた値を転写率として算出し、この値をキャリアへの転写率とした。キャリアへの転写率が95%以上をA、90%以上で95%よりも低い場合をB、90%未満をCとした。評価がA又はBであれば、実用上差し支えない。
(Measurement of transfer rate to carrier)
Using the transfer member obtained by separating the sapphire die for the measurement of the LLO transfer rate as a sample, the LED element was transferred from the transfer member to the carrier. After the transfer member was irradiated with UV (UV exposure machine ML-320FSAT, manufactured by Mikasa Co., Ltd.), the transfer member was laminated on the carrier. As a carrier, a carrier having a configuration of Si die/adhesive layer was used. The Si die had a diameter of 20 mm and a thickness of 725 μmt. The component ratios of the adhesive layer were acrylic resin: 100 parts by mass, Coronate L: 7 parts by mass, and Irgacure: 1 part by mass. The average thickness of the adhesive layer was 10 μm, and the adhesive strength was 1.1 N/25 mm.
After lamination, the transfer member and the carrier were separated. The UV irradiation condition was 300 mJ/cm 2 . For lamination, a diaphragm-type vacuum laminator (Laminator V130, manufactured by Nikko Materials) was used. The lamination conditions were 40° C./0.5 MPa/30 seconds. An LED element that could be transferred from the transfer member to the carrier without cracks or misalignment was regarded as a non-defective product. When the LED elements remained on the transfer member, or when the LED elements were separated from the carrier when the transfer member and the carrier were separated, the LED elements were counted as defective products.
Evaluate the transfer member to which the LED elements for 6 sapphire dies (4465 LED elements x 6) have been transferred, and calculate the number of LED elements successfully transferred from the transfer member to the carrier as the total number of LED elements (4465 The value obtained by dividing by 6) and multiplying by 100 was calculated as the transfer rate, and this value was taken as the transfer rate to the carrier. A was given when the transfer rate to the carrier was 95% or more, B was given when it was 90% or more but lower than 95%, and C was given when it was less than 90%. If the evaluation is A or B, there is no practical problem.
(粘着力測定)
 移設部材のUV照射前後の粘着力を、以下の方法で測定した。
 平均厚み0.5mmのSUS(幅25mm)に、ラミネータGK-13DX(株式会社ラミーコーポレーション製)を用いて、ラミネート温度40℃の条件で移設部材を貼着したUV照射前のサンプルを得た。このサンプルに紫外線露光機(ミカサ株式会社「ML-320FSAT」)を用いて、紫外線波長:365nm、露光量:300mJ/cmの条件で紫外線を照射して、UV照射後のサンプルを得た。UV照射前サンプル及びUV照射後サンプルについて、それぞれJIS C 5016:1994(導体の引きはがし強さ)に準拠した方法でピール強度を測定した。ピール強度を粘着力とした。
(Adhesion measurement)
The adhesive strength of the transfer member before and after UV irradiation was measured by the following method.
Using a laminator GK-13DX (manufactured by Lamy Corporation) on SUS (width 25 mm) having an average thickness of 0.5 mm, a sample before UV irradiation was obtained by laminating the transfer member at a lamination temperature of 40°C. Using an ultraviolet exposure machine (Mikasa Co., Ltd. "ML-320FSAT"), this sample was irradiated with ultraviolet rays under the conditions of an ultraviolet wavelength of 365 nm and an exposure amount of 300 mJ/cm 2 to obtain a sample after UV irradiation. The peel strength of each of the sample before UV irradiation and the sample after UV irradiation was measured by a method conforming to JIS C 5016:1994 (Peeling strength of conductor). The peel strength was defined as adhesive strength.
(引張強度測定)
 50℃における引張強度の測定には、オートグラフ(AG-Xplus、株式会社島津製作所製)を用いた。幅20mmの評価用サンプルを移設部材から切り出した。この評価用サンプルを用いて、チャック間25mm、引張り速度を5mm/s、50℃で測定した。評価用サンプルを100%(初期長さの2倍)伸ばした際の値を引張強度とした。
(Tensile strength measurement)
An autograph (AG-Xplus, manufactured by Shimadzu Corporation) was used to measure the tensile strength at 50°C. An evaluation sample with a width of 20 mm was cut from the transfer member. Using this evaluation sample, measurement was performed at 25 mm between chucks, a pulling speed of 5 mm/s, and 50°C. The value when the sample for evaluation was stretched 100% (twice the initial length) was taken as the tensile strength.
(エキスパンド工程評価)
 LLO転写率の測定の際にサファイアダイを分離して得られた移設部材を12インチエキスパンダー装置(大宮工業製、MX-5154FN)にセットし、突上げ速度5mm/sec、突き上げ量100mm、温度(ステージ温度)50℃で突き上げ、移設部材を引き伸ばした。移設部材を引き伸ばした後のLED素子の間隔が初期値(約50μm)から1mm以上まで拡幅できた場合をA、100mmの突き上げが完了する前にエキスパンダー装置から移設部材が外れた場合、過荷重で移設部材が拡幅出来ずに装置エラーが発生した場合、または、100mm突上げても1mmまでLED素子の間隔が拡幅できなかった場合をBとした。
(Expanding process evaluation)
The transferred member obtained by separating the sapphire die when measuring the LLO transfer rate was set in a 12-inch expander device (MX-5154FN manufactured by Omiya Kogyo Co., Ltd.). The stage temperature) was pushed up at 50° C., and the transfer member was stretched. If the distance between the LED elements after stretching the relocating member can be expanded from the initial value (approximately 50 μm) to 1 mm or more, A is the case. B was given when an apparatus error occurred because the width of the transfer member could not be increased, or when the distance between the LED elements could not be increased to 1 mm even when pushed up by 100 mm.
Figure JPOXMLDOC01-appb-T000001
Figure JPOXMLDOC01-appb-T000001
 表1の評価結果から明らかなように、本開示のLED移設部材は、マイクロLED素子の転写率及び延伸性に優れることがわかる。 As is clear from the evaluation results in Table 1, the LED transfer member of the present disclosure is excellent in the transfer rate and stretchability of the micro LED elements.
 2021年4月27日に出願された日本国特許出願2021-075245号の開示は、その全体が参照により本明細書に取り込まれる。
 本明細書に記載された全ての文献、特許出願、及び技術規格は、個々の文献、特許出願、及び技術規格が参照により取り込まれることが具体的かつ個々に記された場合と同程度に、本明細書中に援用されて取り込まれる。
The disclosure of Japanese Patent Application No. 2021-075245 filed on April 27, 2021 is incorporated herein by reference in its entirety.
All publications, patent applications and technical standards mentioned herein are to the same extent as if each individual publication, patent application and technical standard were specifically and individually noted to be incorporated by reference. incorporated herein by reference.
10、20 移設部材
12 基材
14 粘着層
30 光デバイス基板
32 結晶成長用基板
34 バッファ層
36 LED素子
38 バンプ
40 貼付体
50 レーザー光
52 ピックアップ手段
54 実装基板
56 パッド
60 キャリア
10, 20 Transfer member 12 Base material 14 Adhesive layer 30 Optical device substrate 32 Crystal growth substrate 34 Buffer layer 36 LED element 38 Bump 40 Attached body 50 Laser beam 52 Pickup means 54 Mounting substrate 56 Pad 60 Carrier

Claims (6)

  1.  光照射によって粘着力が低下する領域を表面の少なくとも一部に有し、
     50℃における引張強度が、1MPa~10MPaであるLED移設部材。
    At least a part of the surface has a region where the adhesive strength is reduced by light irradiation,
    An LED transfer member having a tensile strength of 1 MPa to 10 MPa at 50°C.
  2.  基材と前記基材上に配置された粘着層とを有し、前記粘着層が、光照射によって粘着力が低下する領域である請求項1に記載のLED移設部材。 The LED relocating member according to claim 1, comprising a base material and an adhesive layer disposed on the base material, wherein the adhesive layer is a region whose adhesive strength is reduced by light irradiation.
  3.  前記粘着力が低下する領域についての光照射後の粘着力が、0.7N/25mm以下である請求項1又は請求項2に記載のLED移設部材。 The LED relocating member according to claim 1 or 2, wherein the adhesive strength after light irradiation of the area where the adhesive strength is lowered is 0.7 N/25 mm or less.
  4.  請求項1~請求項3のいずれか1項に記載のLED移設部材を用いるLED装置の製造方法。 A method for manufacturing an LED device using the LED transfer member according to any one of claims 1 to 3.
  5.  結晶成長用基板と、個々のデバイス毎に分割された状態で、前記結晶成長用基板上に形成されたバッファ層と前記バッファ層上に形成されたLED素子と、を有する光デバイス基板の前記LED素子の形成された側に、請求項1~請求項3のいずれか1項に記載のLED移設部材における粘着力が低下する領域を有する側の面を接触させて前記光デバイス基板に前記LED移設部材を貼付して貼付体とし、
     前記バッファ層に対してレーザー光を照射して、前記バッファ層を破壊し、
     前記結晶成長用基板と前記LED移設部材とを分離することで前記LED素子を前記LED移設部材に移設し、
     前記LED移設部材を延伸して前記LED移設部材に移設された前記LED素子の間隔を拡張し、
     延伸された前記LED移設部材に光照射して、前記LED移設部材の粘着力を低下させることを含むLED装置の製造方法。
    The LED of an optical device substrate having a crystal growth substrate, a buffer layer formed on the crystal growth substrate in a state of being divided into individual devices, and an LED element formed on the buffer layer. The LED is transferred to the optical device substrate by bringing the surface of the LED transfer member according to any one of claims 1 to 3, which has a region where the adhesive force is reduced, into contact with the side on which the element is formed. affixing a member to form an adhered body;
    irradiating the buffer layer with laser light to destroy the buffer layer;
    transferring the LED element to the LED transfer member by separating the crystal growth substrate and the LED transfer member;
    expanding the distance between the LED elements transferred to the LED transfer member by extending the LED transfer member;
    A method of manufacturing an LED device, comprising irradiating the extended LED relocation member with light to reduce adhesive strength of the LED relocation member.
  6.  前記LED素子の長辺の長さが、100μm以下である請求項5に記載のLED装置の製造方法。 The manufacturing method of the LED device according to claim 5, wherein the length of the long side of the LED element is 100 µm or less.
PCT/JP2022/019137 2021-04-27 2022-04-27 Led transfer member and method for manufacturing led device WO2022230952A1 (en)

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JP2002118124A (en) * 2000-10-06 2002-04-19 Sony Corp Device mounting method
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