WO2022188393A1 - 内存装置测试方法、装置、系统、介质及电子设备 - Google Patents

内存装置测试方法、装置、系统、介质及电子设备 Download PDF

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Publication number
WO2022188393A1
WO2022188393A1 PCT/CN2021/120069 CN2021120069W WO2022188393A1 WO 2022188393 A1 WO2022188393 A1 WO 2022188393A1 CN 2021120069 W CN2021120069 W CN 2021120069W WO 2022188393 A1 WO2022188393 A1 WO 2022188393A1
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Prior art keywords
memory device
test
target
test platform
target test
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PCT/CN2021/120069
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English (en)
French (fr)
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余玉
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长鑫存储技术有限公司
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Priority to US17/648,570 priority Critical patent/US11867755B2/en
Publication of WO2022188393A1 publication Critical patent/WO2022188393A1/zh

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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J9/00—Programme-controlled manipulators
    • B25J9/16—Programme controls
    • B25J9/1656—Programme controls characterised by programming, planning systems for manipulators
    • B25J9/1664—Programme controls characterised by programming, planning systems for manipulators characterised by motion, path, trajectory planning
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273—Test methods

Definitions

  • the present disclosure is based on the Chinese patent application with the application number of 202110260087.6 and the application date of March 10, 2021, and the application name is "memory device testing method and device, readable storage medium, electronic equipment", and requires the Chinese patent application Priority, the entire content of this Chinese patent application is hereby incorporated by reference into the present disclosure.
  • the present disclosure relates to, but is not limited to, a memory device testing method, device, system, medium, and electronic equipment.
  • the memory device is a channel connecting the CPU and other electronic devices, and plays the role of data storage and data exchange. Therefore, the detection of memory devices becomes crucial for the stability of computer performance.
  • the present disclosure provides a memory device testing method, device, system, medium and electronic equipment.
  • a first aspect of the present disclosure provides a method for testing a memory device, the method comprising: determining a running path according to a position coordinate of a target test platform and a current position coordinate of a memory device; setting a mobile device according to the running path, so that the The mobile device moves the memory device to the target test platform according to the running path; controls the target test platform to test the memory device according to the target test program; monitors the test result of the memory device in real time, and The test results of the memory device are stored in a database.
  • a second aspect of the present disclosure provides a memory device testing device, the memory device testing device comprising: a path determination module for determining a running path according to the position coordinates of a target test platform and the current position coordinates of the memory device; a memory moving module, for setting a mobile device according to the running path, so that the mobile device moves the memory device into the target test platform according to the running path; a test control module is configured to control the target test platform according to the target test platform The test program tests the memory device; the result monitoring module is used to monitor the test result of the memory device in real time, and store the test result of the memory device in a database.
  • a third aspect of the present disclosure provides a memory device testing system, the memory device testing system comprising: a moving device for receiving a running path, and moving the memory device into a target test platform according to the running path; the The target test platform is used to test the memory device according to the target test program in response to the test instruction; the test server is used to send test instructions to the target test platform, monitor the test results of the memory device in real time, and The test result of the memory device is stored in a database; wherein, the running path is calculated by the test server according to the position coordinates of the target test platform and the current position coordinates of the memory device.
  • a fourth aspect of the present disclosure provides a computer-readable medium on which a computer program is stored, and when the program is executed by a processor, implements the memory device testing method described in the embodiments of the first aspect.
  • a fifth aspect of the present disclosure provides an electronic device, comprising: one or more processors; and a storage device for storing one or more programs, when the one or more programs are processed by the one or more programs When the processor is executed, the one or more processors are caused to implement the memory device testing method described in the embodiments of the first aspect.
  • the running path is determined according to the position coordinates of the target test platform and the current position coordinates of the memory device; the mobile device is set according to the running path , so that the mobile device moves the memory device to the target test platform according to the running path; controls the target test platform to test the memory device according to the target test program; monitors the test of the memory device in real time result, and store the test results of the memory device in the database.
  • the memory device testing method in the present disclosure can automatically test the memory device through data interaction among the test server, the mobile device, and the target test platform, thereby improving the test efficiency and test accuracy; the memory device testing method of the present disclosure It completely replaces manual testing, avoids system consumption caused by human error, and saves labor and material costs.
  • FIG. 1 schematically shows a system architecture diagram of a memory device testing system according to an embodiment of the present disclosure
  • FIG. 2 schematically shows a schematic structural diagram of a mobile device according to an embodiment of the present disclosure
  • FIG. 3 schematically shows a schematic structural diagram of a test platform according to an embodiment of the present disclosure
  • FIG. 4 schematically shows a flow chart of a method for testing a memory device according to an embodiment of the present disclosure
  • FIG. 5 schematically shows a schematic flowchart of determining a test result of a memory device according to an embodiment of the present disclosure
  • FIG. 6 schematically shows a schematic flowchart of determining a test result of a memory device according to an embodiment of the present disclosure
  • FIG. 7 schematically shows a block diagram of a memory device testing apparatus according to an embodiment of the present disclosure
  • FIG. 8 schematically shows a block diagram of an electronic device according to an embodiment of the present disclosure
  • FIG. 9 schematically shows a schematic diagram of a program product according to an embodiment of the present disclosure.
  • FIG. 1 shows a schematic diagram of a system architecture of a memory device testing system to which the technical solutions of the embodiments of the present disclosure can be applied.
  • the memory device testing system 100 includes a mobile device 101 , a target test platform 102 and a test server 103 , wherein the mobile device 101 is configured to receive a running path, and move the memory device to the target test platform 102 according to the running path
  • the target test platform 102 is set to respond to the test instruction, and the memory device is tested according to the target test program;
  • the test server 103 is set to send the test instruction to the target test platform 102, and monitor the test results of the target test platform 102 in real time, and
  • the test result of the memory device is stored in the database; wherein, the running path is calculated by the test server 103 according to the position coordinates of the target test platform 102 and the current position coordinates of the memory device.
  • a target test program is added to the target test platform, and a unique type of target test program can be added to the target test platform.
  • a plurality of types of test programs may also be added, and the target test program is determined among the plurality of test programs according to the type of the memory device on the target test platform.
  • the types of memory devices may include memory modules, memory module particles, and memory module substrates.
  • the memory device testing system further includes a terminal, the terminal includes a display interface, the test server can respond to a query request on the display interface, and the identification information of the memory device in the query request is stored in the database Get test results for this memory device.
  • the moving device includes a robotic arm and a control end, and the control end can control the movement of the robotic arm.
  • the control terminal can receive the running path, so as to control the robotic arm to move the memory device according to the running path.
  • one or more clamping jaw mechanisms are arranged above the mechanical arm, and the clamping jaw mechanisms can grab the memory device and move with the mechanical arm.
  • the gripper mechanism can include multiple types, and different types of gripper mechanisms grab corresponding types of memory devices, for example, the memory stick gripper mechanism grabs memory sticks, the memory stick particle gripper mechanism grabs memory stick particles, and the memory stick gripper mechanism catches memory stick particles.
  • the substrate gripper mechanism grabs the memory module substrate.
  • the memory device testing system is further provided with a scanning device, which can scan the identification codes of the memory device and the target test platform to obtain the identification information of the memory device, the type of the memory device, and the target test.
  • Platform identification information
  • the scanning device may include a scanning gun, and the identification code may be a two-dimensional code.
  • the scanning gun scans the two-dimensional code on the memory device to obtain the identification information of the memory device and/or the type of the memory device, and the scanning gun passes the scanning target test.
  • the QR code on the platform to obtain the identification information of the target test platform.
  • the scanning device may be arranged on the mobile device, for example, may be arranged above the mechanical arm.
  • a height sensor is provided on the mobile device.
  • the height sensor can be set on the target test platform or on the robot arm.
  • the height sensor can detect the distance between the robot arm and the target test platform. distance.
  • the memory device testing system is further provided with a color sensor, which may be provided on the target test platform.
  • the target test platform sends the test state and the current test result of the memory device to the color sensor, and uses the color change of the color sensor to represent the test state of the target test platform or the current test result of the memory device.
  • FIG. 2 shows a schematic structural diagram of the mobile device of this embodiment.
  • the mobile device includes a control end 201 and a mechanical arm 202 , and a gripper mechanism is installed above the mechanical arm 202 respectively.
  • 203 a gripper mechanism 204 and a code scanning gun 205 .
  • the gripper mechanism 203 is a memory stick particle gripper mechanism, and is configured to grab the memory stick particles
  • the gripper mechanism 204 is a memory stick gripper mechanism, and is set to grab the memory stick.
  • FIG. 3 shows a schematic structural diagram of the test platform of the present embodiment.
  • the memory device test system includes 50 test platforms, wherein the 50 test platforms can be classified, for example, test platform 1 to test platform
  • the platform 20 is set to test memory modules
  • the test platform 21 to the test platform 40 are set to test memory module particles
  • the test platform 41 to the test platform 50 are set to test memory module substrates.
  • a memory module test program is added to test platform 1 to test platform 20
  • a memory module particle test program is added to test platform 21 to test platform 40
  • a memory module substrate test program is added to test platform 41 to test platform 50 .
  • the memory device testing method provided by the embodiments of the present disclosure is generally executed by a test server, and accordingly, the memory device testing device is generally set in the test server. However, in other embodiments of the present disclosure, the memory device testing method provided by the embodiments of the present disclosure may also be executed by a memory device testing device.
  • test methods for testing the memory device there are two test methods for testing the memory device, one is to develop a test platform to test the memory device, and the other is to test the memory device directly in the application equipment.
  • both test methods require manual testing, which not only has low test accuracy, but also consumes a lot of manpower and material costs.
  • FIG. 4 shows a schematic flowchart of the memory device testing method. As shown in FIG. 4 , the memory device testing method includes at least the following steps:
  • Step S410 Determine the running path according to the position coordinates of the target test platform and the current position coordinates of the memory device;
  • Step S420 setting the mobile device according to the running path, so that the mobile device moves the memory device to the target test platform according to the running path;
  • Step S430 controlling the target test platform to test the memory device according to the target test program
  • Step S440 Monitor the test result of the memory device in real time, and store the test result of the memory device in the database.
  • the memory device testing method in the embodiments of the present disclosure can automatically test the memory device through data interaction among the test server, the mobile device and the target test platform, thereby improving the test efficiency and test accuracy; and, the memory device of the present disclosure
  • the device testing method completely replaces manual testing, avoids system consumption caused by human error, and saves labor and material costs.
  • step S410 the running path is determined according to the position coordinates of the target test platform and the current position coordinates of the memory device.
  • the position coordinates of the target test platform are obtained, and the current position coordinates of the memory device are obtained, and the running path is calculated according to the position coordinates of the target test platform and the current position coordinates of the memory device.
  • the running path may be a straight path or a curved path, and the running path may be planned according to the actual application scenario.
  • a straight line path between two points can be calculated according to the position coordinates of the target test platform and the current position coordinates of the memory device.
  • a target point can also be set, and a linear path or a curved path can be planned according to the position coordinates of the target test platform, the position coordinates of the target point, and the current position coordinates of the memory device.
  • the test state of the test platform is acquired; when the test platform is in an idle state, the test platform is configured as Target test platform.
  • the test status of the test platform includes a testing status, a disconnected status, an idle status, and the like.
  • the state under test refers to placing the memory device on the test platform, and the test platform is testing the memory device; the offline state refers to placing the memory device on the test platform, and the test platform is in the process of testing the memory device.
  • a test failure occurs, causing the test to be terminated; the idle state means that no memory device is placed on the test platform, and the test platform is in a state to be tested.
  • the test state may also be other test states, which are not specifically limited in the present disclosure.
  • the test state of the test platform is acquired through a color sensor, and when the test platform is in an idle state, the test platform is configured as a target test platform.
  • the test state of the test platform can be characterized by the color sensor, and the color change of the test platform can be obtained by acquiring the color change of the color sensor.
  • the test state of the first color representation of the configuration color sensor is the testing state
  • the test state of the second color representation is the disconnected state
  • the test state of the third color representation is the idle state
  • the first color, the second color and the third color The three colors can be any number of different colors.
  • the test state can be multiple states, and the colors displayed by the color sensor can also be multiple different colors, which are not specifically limited in the present disclosure.
  • any one of the idle test platforms can be configured as the target test platform, and other test platforms in the idle state can be selected according to other screening methods. conditions to determine the target test platform.
  • the type of the memory device is matched with a plurality of test platforms; when the type of the memory device is matched with the test platform, the test platform is configured as the target test platform, wherein the type of the memory device Associated with the target test platform.
  • the memory device testing system is configured with multiple types of test platforms, including a memory stick test platform, a memory stick particle test platform, and a memory stick substrate test platform. Each type of test platform tests a corresponding type of memory device.
  • the type of the memory device may be obtained by scanning the memory device through the scanning device.
  • the type of the memory device is matched with the plurality of test platforms, and the test platform matched with the type of the memory device is configured as the target test platform. For example, if the memory device is a memory stick, the memory stick test platform is used as the target test platform.
  • step S420 the mobile device is set according to the running path, so that the mobile device moves the memory device to the target test platform according to the running path.
  • the running path is sent to the control terminal of the mobile device, and the control terminal controls the robotic arm, so that the robotic arm moves the memory device to the target test platform according to the running path.
  • the running path includes a target point, and the target point is at a preset distance from the target test platform.
  • the height sensor detects the target distance between the robotic arm and the target test platform.
  • the target point can be set at any point above the target test platform, for example, the target point is set right above the target test platform.
  • the target point is separated from the target test platform by a preset distance, and the preset distance can be set according to the actual situation, and the position of the target point is not specifically limited in the present disclosure.
  • the target distance is less than the preset distance, it indicates that there is a memory device under test on the target test platform. Therefore, when the target distance is less than the preset distance, a new target test platform is configured; a new running path is determined according to the position coordinates of the new target test platform and the current position coordinates of the memory device.
  • other test platforms can be matched with the type of the memory device, and the test platform matched with the type of the memory device can be configured as a new target test platform.
  • the flow of the testing method for the memory device is as follows:
  • the current position coordinates of the memory device are the position coordinates of the target point
  • a new running path is determined according to the position coordinates of the target point and the position coordinates of the new target test platform, and the new running path is sent to the mobile device to make the mobile device move.
  • the device moves to the new target test platform according to the new running path;
  • the new running path includes a target point, and when the memory device moves to the target point, the height sensor detects the target distance between the robotic arm and the target test platform;
  • the above steps are repeated until the target distance is equal to the preset distance, the memory device is placed on the new target test platform by the mobile device, and the new target test platform is controlled to test the memory device according to the target test program.
  • a target gripper mechanism is determined among a plurality of gripper mechanisms according to the type of the memory device; the target gripper mechanism is controlled by the control end to grab the memory device, and the robotic arm is controlled to store the memory device according to the running path. The device is moved to the target test platform.
  • the mechanical arm includes a plurality of clamping jaw mechanisms
  • the clamping jaw mechanisms can grasp the memory device
  • the clamping jaw mechanism can be set to multiple types of clamping jaw mechanisms according to the type of the memory device.
  • the clamping jaw mechanism may include a memory module clamping jaw mechanism, a memory module particle clamping jaw mechanism, and a memory module substrate clamping jaw mechanism, which have different structures.
  • the target gripper mechanism is determined among the plurality of gripper mechanisms according to the type of the memory device, the type of the memory device is matched with the plurality of gripper mechanisms, and the difference between the gripper mechanism and the memory device is determined. When the types match, the gripper mechanism is used as the target gripper mechanism for the memory device.
  • the target gripper mechanism is associated with the type of memory device. If the type of the memory device is a memory stick, the target gripper mechanism is a memory stick gripper mechanism. The control terminal controls the memory stick gripper mechanism to grab the memory stick, and controls the robotic arm to move the memory stick to the target test platform according to the running path. If the type of the memory device is memory stick pellets, the target gripper mechanism is a memory stick pellet gripper mechanism. The control terminal controls the memory stick particle gripper mechanism to grab the memory stick pellets, and controls the robotic arm to move the memory stick pellets to the target test platform according to the running path. If the type of the memory device is a memory module substrate, the target clamping jaw mechanism is a memory module substrate clamping jaw mechanism. The control terminal controls the memory module substrate gripper mechanism to grab the memory module substrate, and controls the robotic arm to move the memory module substrate to the target test platform according to the running path.
  • the identification codes of the memory device and the target test platform are scanned by a scanning device to obtain identification information of the memory device, the type of the memory device, and the identification information of the target test platform.
  • the identification information of the memory device includes the unique identification of the memory device, the number of the memory device, and the like, and the identification information of the target test platform may be the unique identification of the target test platform, the test platform number, and the like.
  • the identification code on the memory device and the test platform can be scanned by a scanning device to determine the identification information of the memory device, and the type of the memory device can be determined in the database according to the identification information of the memory device.
  • a mapping relationship is formed according to the identification information of the memory device and the identification information of the target test platform, and the mapping relationship between the memory device and the target test platform is stored in a database.
  • step S430 the target test platform is controlled to test the memory device according to the target test program.
  • the target test program is determined among the plurality of test programs according to the type of the memory device; the target test program is added to the target test platform, so that the target test platform runs the target test program.
  • the type of the memory device is matched with a plurality of test programs, and if the test program matches the type of the memory device, the test program is configured as a target test program.
  • the type of the memory device is associated with the target test program, and the target test program can test the memory device. Since the memory device includes memory modules, memory module particles, and memory module substrates, the test program for testing the memory device also includes memory modules. Test procedures, memory stick particle test procedures, memory stick substrate test procedures, and different test procedures test different types of memory devices.
  • step S440 the test result of the memory device is monitored in real time, and the test result of the memory device is stored in the database.
  • the test results of the memory devices on the target test platform monitored in real time are displayed on the display interface, so that the operator can obtain the test results of the memory devices on all target test platforms in real time .
  • the test result of the memory device includes a test pass and a test fail.
  • the test result of the memory device can be obtained from the database according to the identification information of the memory device, and the test result can be displayed in the display interface. That is to say, the operator can form a query request by triggering the query button on the display interface, and the query request can include the identification information of one or more memory devices.
  • the test server receives the query request, according to the identification information of one or more memory devices
  • the identification information queries the database for the test results of one or more memory devices, and sends the test results of the one or more memory devices to the terminal, so that the terminal displays the test results of the memory devices on the display interface.
  • the display interface can also display the test status on all test platforms and the current test result of the memory device in real time, and will display the test status of the test platform and the current test result of the memory device in real time. changes with the change.
  • the current test result of the memory device tested on the target test platform can be characterized by a color sensor on the target test platform.
  • the mapping relationship between the color information on the color sensor and the current test result of the memory device is set. For example, if the current test result of the memory device is that the test passes, the color sensor on the target test platform displays the fourth color; if the current test result of the memory device is that the test fails, the color sensor on the target test platform displays the fourth color. Five colors. Wherein, the fourth color and the fifth color belong to any different colors, and the fourth color and the fifth color respectively belong to any different colors from the first color, the second color and the third color in the above-mentioned embodiment.
  • FIG. 5 shows a schematic flowchart of a method for determining a test result of a memory device. As shown in FIG. 5 , the process includes at least steps S510 to S530, and the details are as follows:
  • step S510 the number of tests of the memory device is obtained, and it is determined whether the number of tests of the memory device is greater than or equal to the preset number of tests.
  • the preset number of tests may be set according to the actual situation, and may be set to 3 times, or may be set to 5 times, etc., which is not specifically limited in the present disclosure.
  • the preset number of tests can be adjusted according to the accuracy of the target test program. If the test accuracy of the target test program is low, a larger preset number of tests can be set to ensure that the accuracy of the test results is improved; If the test accuracy rate is higher, set a smaller preset number of tests to improve the test efficiency of the memory device and reduce system consumption.
  • the preset number of tests can also be adjusted according to the online time of the target test program. For example, when the target test program is just launched, a larger preset number of tests is set, and as the target test program goes online, a larger preset number of tests is set. The longer time, coupled with the update of the target test program, can set a smaller preset number of tests.
  • the memory device may be tested multiple times through the same target test platform, or the memory device may be tested separately by using multiple target test platforms.
  • the test information of the target test platform to the memory device includes the start test time, the end test time, the identification information of the target test platform, the identification information of the memory device, the current test result of the memory device, and the identification information of the target test program , the number of tests of the memory device, etc. If multiple target test platforms are used to test the memory device, the test information includes identification information of the multiple target test platforms, identification information of one or more target test programs, current test results of the multiple memory devices, and also includes Multiple pairs of start test time and end test time.
  • the number of tests of the memory device is obtained according to the identification information of the memory device, and the preset number of tests is obtained, and it is determined whether the number of tests of the memory device is greater than or equal to the preset number of tests.
  • step S520 if the number of tests of the memory device is greater than or equal to the preset number of tests, the test result of the memory device is determined.
  • the current test result of the memory device is configured as the test result of the memory device on the target test platform.
  • the current test result of the memory device can be directly obtained from the test information
  • the method for determining the current test result of the memory device is as follows: First, monitor the color of the color sensor on the target test platform in real time. information; then, analyze the color information of the color sensor according to the mapping relationship between the color information of the color sensor and the current test result of the memory device; finally, obtain the current test of the memory device on the target test platform according to the analysis result result.
  • analyzing the color information of the color sensor includes: matching the color information of the color sensor with the mapping relationship between the color information and the current test result, and obtaining the current test result corresponding to the color information of the color sensor.
  • the preset number of tests is multiple times
  • multiple current test results corresponding to the memory device and the number of tests of the memory device are obtained according to the identification information of the memory device, and according to the multiple times of the memory device
  • the current test result and the test times determine the test result of the memory device according to a preset rule.
  • the preset rule may be: if the number of times of test passing in the multiple current test results is greater than half of the number of tests, the test result of the memory device is the test pass.
  • the preset rule may also be: if the number of times of passing the test in the multiple current test results is greater than two-thirds of the number of tests, the test result of the memory device is the test passing.
  • the preset rule may also be: if the multiple current test results include only one test failure, and other current test results are all test passed, the test result of the memory device is the test passed.
  • the preset rules may be set according to actual conditions, which are not specifically limited in the present disclosure.
  • step S530 if the number of tests of the memory device is less than the preset number of tests, a new target test platform is configured, and a new running path is determined according to the position coordinates of the new target test platform and the current position coordinates of the memory device.
  • a new target test platform is determined among the test platforms in the idle state according to the type of the memory device. Among them, the new target test platform is associated with the type of memory device.
  • FIG. 6 shows a schematic flowchart of a method for determining a test result of a memory device. As shown in FIG. 6 , the process includes at least steps S610 to S650, and the details are as follows:
  • step S610 a new running path is determined according to the position coordinates of the new target test platform and the current position coordinates of the memory device.
  • the current position coordinates of the memory device are the position coordinates of the current target test platform.
  • step S620 the mobile device is set according to the new operation path, so that the mobile device moves the memory device to the new target test platform according to the new operation path.
  • step S630 the new target test platform is controlled to test the memory device according to the target test program, so as to obtain the current test result of the memory device, and update the test information of the memory device.
  • updating the test information of the memory device includes: adding the identification information of the new target test platform and the current test result of the memory device to the test information, and adding one to the number of tests to obtain the current number of tests.
  • step S640 it is determined whether the current number of tests of the memory device is greater than or equal to the preset number of tests.
  • step S650 if the current number of tests of the memory device is greater than or equal to the preset number of tests, the test result of the memory device is determined according to a plurality of current test results in the test information.
  • FIG. 7 schematically shows a block diagram of a memory device testing apparatus according to one embodiment of the present disclosure.
  • the memory device testing device 700 includes: a path determination module 701 , a memory moving module 702 , a test control module 703 and a result monitoring module 704 .
  • the path determination module 701 is configured to determine the running path according to the position coordinates of the target test platform and the current position coordinates of the memory device;
  • the memory moving module 702 is configured to set the mobile device according to the running path, so that the mobile device can move the memory device to the target test platform according to the running path;
  • the test control module 703 is configured to control the target test platform to test the memory device according to the target test program
  • the result monitoring module 704 is configured to monitor the test results of the memory device in real time, and store the test results of the memory device in the database.
  • the mobile device includes a robotic arm and a control terminal
  • the memory moving module 702 may also be configured to send a running path to the control terminal, and control the robotic arm through the control terminal, so that the robotic arm moves the movement path according to the running path.
  • the memory device is moved to the target test platform.
  • the robotic arm includes a plurality of gripper mechanisms
  • the memory moving module 702 may also be configured to determine a target gripper mechanism among the multiple gripper mechanisms according to the type of the memory device; control the target through the control terminal The gripper mechanism grabs the memory device and controls the robotic arm to move the memory device to the target test platform according to the running path.
  • the memory device testing apparatus 700 further includes a scanning module (not shown in the figure), the scanning module is configured to scan the identification codes of the memory device and the target test platform through a scanning device to obtain the memory device identification information, the type of memory device, and the identification information of the target test platform.
  • a scanning module (not shown in the figure)
  • the scanning module is configured to scan the identification codes of the memory device and the target test platform through a scanning device to obtain the memory device identification information, the type of memory device, and the identification information of the target test platform.
  • the memory device testing apparatus 700 further includes a target program determination module (not shown in the figure), and the target program determination module is configured to add the target test program to the target test platform according to the type of the memory device , so that the target test platform can run the target test program.
  • the memory device testing apparatus 700 further includes a first target platform determination module (not shown in the figure), and the first target platform determination module is configured to acquire the test status of the test platform through the color sensor; Configure the testbench as the target testbench when the testbench is idle.
  • the memory device testing apparatus 700 further includes a second target platform determination module (not shown in the figure), the second target platform determination module is configured to associate the type of the memory device with the plurality of test platforms Match; when the type of memory device matches the test platform, configure the test platform as the target test platform.
  • a second target platform determination module is configured to associate the type of the memory device with the plurality of test platforms Match; when the type of memory device matches the test platform, configure the test platform as the target test platform.
  • the memory device testing apparatus 700 further includes a third target platform determination module (not shown in the figure), the third target platform determination module is configured to, when the memory device moves to the target point, The height sensor detects the target distance between the robotic arm and the target test platform, wherein the running path includes a target point, and the target point is separated from the target test platform by a preset distance.
  • the third target platform determination module may also be configured to configure a new target test platform when the target distance is less than the preset distance; The position coordinates determine the new travel path.
  • the memory device testing apparatus 700 further includes a result determination module (not shown in the figure), the result determination module is configured to obtain the number of tests of the memory device, and determine whether the number of tests of the memory device is greater than or equal to is equal to the preset number of tests; if yes, determine the test result of the memory device; if not, configure a new target test platform, and determine a new running path according to the position coordinates of the new target test platform and the current position coordinates of the memory device.
  • a result determination module is configured to obtain the number of tests of the memory device, and determine whether the number of tests of the memory device is greater than or equal to is equal to the preset number of tests; if yes, determine the test result of the memory device; if not, configure a new target test platform, and determine a new running path according to the position coordinates of the new target test platform and the current position coordinates of the memory device.
  • the memory device testing device 700 further includes a result display module (not shown in the figure), and the result display module is configured to obtain the test result of the memory device in the database according to the identification information of the memory device, And display the test results on the display interface.
  • an electronic device capable of implementing the above method is also provided.
  • aspects of the present invention may be implemented as a system, method or program product. Therefore, various aspects of the present invention can be embodied in the following forms: a complete hardware implementation, a complete software implementation (including firmware, microcode, etc.), or a combination of hardware and software aspects, which may be collectively referred to herein as implementations "circuit", “module” or "system”.
  • FIG. 8 An electronic device 800 according to this embodiment of the present invention is described below with reference to FIG. 8 .
  • the electronic device 800 shown in FIG. 8 is only an example, and should not impose any limitation on the function and scope of use of the embodiments of the present invention.
  • electronic device 800 takes the form of a general-purpose computing device.
  • Components of the electronic device 800 may include, but are not limited to: the above-mentioned at least one processing unit 810 , the above-mentioned at least one storage unit 820 , a bus 830 connecting different system components (including the storage unit 820 and the processing unit 810 ), and a display unit 840 .
  • the storage unit stores program codes, and the program codes can be executed by the processing unit 810, so that the processing unit 810 executes various exemplary methods according to the present invention described in the above-mentioned “Exemplary Methods” section of this specification Implementation steps.
  • the processing unit 810 may execute step S410 as shown in FIG.
  • step S420 determine the running path according to the position coordinates of the target test platform and the current position coordinates of the memory device; step S420 , set the mobile device according to the running path to make the movement The device moves the memory device to the target test platform according to the running path; step S430, controls the target test platform to test the memory device according to the target test program; step S440, monitors the test results of the memory device in real time, and stores the test results of the memory device into the database.
  • the storage unit 820 may include a readable medium in the form of a volatile storage unit, such as a random access storage unit (RAM) 8201 and/or a cache storage unit 8202 , and may further include a read only storage unit (ROM) 8203 .
  • RAM random access storage unit
  • ROM read only storage unit
  • the storage unit 820 may also include a program/utility 8204 having a set (at least one) of program modules 8205 including, but not limited to, an operating system, one or more application programs, other program modules, and program data, An implementation of a network environment may be included in each or some combination of these examples.
  • the bus 830 may be representative of one or more of several types of bus structures, including a memory cell bus or memory cell controller, a peripheral bus, a graphics acceleration port, a processing unit, or a local area using any of a variety of bus structures bus.
  • the electronic device 800 may also communicate with one or more external devices 1000 (eg, keyboards, pointing devices, Bluetooth devices, etc.), with one or more devices that enable viewers to interact with the electronic device 800, and/or with Any device (eg, router, modem, etc.) that enables the electronic device 800 to communicate with one or more other computing devices. Such communication may take place through input/output (I/O) interface 850 . Also, the electronic device 800 may communicate with one or more networks (eg, a local area network (LAN), a wide area network (WAN), and/or a public network such as the Internet) through a network adapter 860 . As shown, network adapter 1060 communicates with other modules of electronic device 800 via bus 830 . It should be understood that, although not shown, other hardware and/or software modules may be used in conjunction with electronic device 800, including but not limited to: microcode, device drivers, redundant processing units, external disk drive arrays, RAID systems, tape drives and data backup storage systems.
  • the exemplary embodiments described herein may be implemented by software, or may be implemented by software combined with necessary hardware. Therefore, the technical solutions according to the embodiments of the present disclosure may be embodied in the form of software products, and the software products may be stored in a non-volatile storage medium (which may be CD-ROM, U disk, mobile hard disk, etc.) or on the network , including several instructions to cause a computing device (which may be a personal computer, a server, a terminal device, or a network device, etc.) to execute the method according to an embodiment of the present disclosure.
  • a computing device which may be a personal computer, a server, a terminal device, or a network device, etc.
  • a computer-readable storage medium on which a program product capable of implementing the above-described method of the present specification is stored.
  • aspects of the present invention can also be implemented in the form of a program product comprising program code for enabling the program product to run on a terminal device The terminal device performs the steps according to various exemplary embodiments of the present invention described in the "Example Method" section above in this specification.
  • a program product 900 for implementing the above method according to an embodiment of the present invention is described, which can adopt a portable compact disk read only memory (CD-ROM) and include program codes, and can be used in a terminal device, For example running on a personal computer.
  • CD-ROM compact disk read only memory
  • the program product of the present invention is not limited thereto, and in this document, a readable storage medium may be any tangible medium that contains or stores a program that can be used by or in conjunction with an instruction execution system, apparatus, or device.
  • the program product may employ any combination of one or more readable media.
  • the readable medium may be a readable signal medium or a readable storage medium.
  • the readable storage medium may be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus or device, or a combination of any of the above. More specific examples (non-exhaustive list) of readable storage media include: electrical connections with one or more wires, portable disks, hard disks, random access memory (RAM), read only memory (ROM), erasable programmable read only memory (EPROM or flash memory), optical fiber, portable compact disk read only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination of the foregoing.
  • a computer readable signal medium may include a propagated data signal in baseband or as part of a carrier wave with readable program code embodied thereon. Such propagated data signals may take a variety of forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination of the foregoing.
  • a readable signal medium can also be any readable medium, other than a readable storage medium, that can transmit, propagate, or transport the program for use by or in connection with the instruction execution system, apparatus, or device.
  • Program code embodied on a readable medium may be transmitted using any suitable medium, including but not limited to wireless, wireline, optical fiber cable, RF, etc., or any suitable combination of the foregoing.
  • Program code for carrying out operations of the present invention may be written in any combination of one or more programming languages, including object-oriented programming languages—such as Java, C++, etc., as well as conventional procedural Programming Language - such as the "C" language or similar programming language.
  • the program code may execute entirely on the user's computing device, partly on the user's device, as a stand-alone software package, partly on the user's computing device and partly on a remote computing device, or entirely on the remote computing device or server execute on.
  • the remote computing device may be connected to the user computing device through any kind of network, including a local area network (LAN) or a wide area network (WAN), or may be connected to an external computing device (eg, using an Internet service provider business via an Internet connection).
  • LAN local area network
  • WAN wide area network
  • an external computing device eg, using an Internet service provider business via an Internet connection
  • the running path is determined according to the position coordinates of the target test platform and the current position coordinates of the memory device; the mobile device is set according to the running path, to make the mobile device move the memory device to the target test platform according to the running path; control the target test platform to test the memory device according to the target test program; monitor the test result of the memory device in real time , and store the test results of the memory device in the database.
  • the memory device testing method in the present disclosure can automatically test the memory device through data interaction among the test server, the mobile device, and the target test platform, thereby improving the test efficiency and test accuracy; the memory device testing method of the present disclosure It completely replaces manual testing, avoids system consumption caused by human error, and saves labor and material costs.

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Abstract

一种内存装置测试方法、装置、系统、介质及电子设备，该内存装置测试方法包括：根据目标测试平台的位置坐标和内存装置的当前位置坐标确定运行路径(S410)；根据运行路径设置移动装置，以使移动装置根据运行路径将内存装置移动至目标测试平台中(S420)；控制目标测试平台根据目标测试程序对内存装置进行测试(S430)；实时监测内存装置的测试结果，并将内存装置的测试结果存储至数据库中(S440)。

Description

内存装置测试方法、装置、系统、介质及电子设备
本公开基于申请号为202110260087.6，申请日为2021年03月10日，申请名称为“内存装置测试方法及装置、可读存储介质、电子设备”的中国专利申请提出，并要求该中国专利申请的优先权，该中国专利申请的全部内容在此引入本公开作为参考。
技术领域
本公开涉及但不限于一种内存装置测试方法、装置、系统、介质及电子设备。
背景技术
随着计算机技术的发展，各行各业均已使用计算机，组成计算机的配件质量的好坏决定了计算机的性能，尤其是内存装置。内存装置是连接CPU与其他电子设备的通道，起到数据存储和数据交换的作用。因此，内存装置的检测，对于计算机性能的稳定变得至关重要。
现有技术中，存在利用开发软件测试平台测试内存装置，还存在利用应用设备对内存装置进行测试，但这两种方式都是人为手动测试，导致耗费人力和物力成本，并且测得的结果也不精确。
发明内容
以下是对本公开详细描述的主题的概述。本概述并非是为了限制权利要求的保护范围。
本公开提供一种内存装置测试方法、装置、系统、介质及电子设备。
本公开的第一方面提供一种内存装置测试方法，所述方法包括：根据目标测试平台的位置坐标和内存装置的当前位置坐标确定运行路径；根据所述运行路径设置移动装置，以使所述移动装置根据所述运行路径将所述内存装置移动至所述目标测试平台中；控制所述目标测试平台根据目标测试程序对所述内存装置进行测试；实时监测所述内存装置的测 试结果，并将所述内存装置的测试结果存储至数据库中。
本公开的第二方面提供一种内存装置测试装置，所述内存装置测试装置包括：路径确定模块，用于根据目标测试平台的位置坐标和内存装置的当前位置坐标确定运行路径；内存移动模块，用于根据所述运行路径设置移动装置，以使所述移动装置根据所述运行路径将所述内存装置移动至所述目标测试平台中；测试控制模块，用于控制所述目标测试平台根据目标测试程序对所述内存装置进行测试；结果监测模块，用于实时监测所述内存装置的测试结果，并将所述内存装置的测试结果存储至数据库中。
本公开的第三方面提供一种内存装置测试系统，所述内存装置测试系统包括：移动装置，用于接收运行路径，根据所述运行路径将所述内存装置移动至目标测试平台中；所述目标测试平台，用于响应测试指令，根据目标测试程序对所述内存装置进行测试；测试服务器，用于向目标测试平台发送测试指令，并实时监测所述内存装置的测试结果，并将所述内存装置的测试结果存储至数据库中；其中，所述运行路径为所述测试服务器根据所述目标测试平台的位置坐标和所述内存装置的当前位置坐标计算所得到。
本公开的第四方面提供了一种计算机可读介质，其上存储有计算机程序，所述程序被处理器执行时实现如第一方面实施例中所述的内存装置测试方法。
本公开的第五方面提供了一种电子设备，包括：一个或多个处理器；存储装置，用于存储一个或多个程序，当所述一个或多个程序被所述一个或多个处理器执行时，使得所述一个或多个处理器实现如第一方面实施例中所述的内存装置测试方法。
本公开的实施例所提供的内存装置测试方法、装置、系统、介质及电子设备中，通过根据目标测试平台的位置坐标和内存装置的当前位置坐标确定运行路径；根据所述运行路径设置移动装置，以使所述移动装置根据所述运行路径将所述内存装置移动至所述目标测试平台中；控制所述目标测试平台根据目标测试程序对所述内存装置进行测试；实时监测内存装置的测试结果，并将所述内存装置的测试结果存储至数据库中。 本公开中的内存装置测试方法，通过测试服务器、移动装置、目标测试平台之间的数据交互，能够自动实现对内存装置的测试，提高了测试效率和测试准确率；本公开的内存装置测试方法完全替代了人工测试，避免了因人为失误带来的系统消耗，节省了人力成本和物力成本。
在阅读并理解了附图和详细描述后，可以明白其他方面。
附图说明
并入到说明书中并且构成说明书的一部分的附图示出了本公开的实施例，并且与描述一起用于解释本公开实施例的原理。在这些附图中，类似的附图标记用于表示类似的要素。下面描述中的附图是本公开的一些实施例，而不是全部实施例。对于本领域技术人员来讲，在不付出创造性劳动的前提下，可以根据这些附图获得其他的附图。
图1示意性示出了根据本公开的一实施例的内存装置测试系统的系统架构示意图；
图2示意性示出了根据本公开的一实施例的移动装置的结构示意图；
图3示意性示出了根据本公开的一实施例的测试平台的结构示意图；
图4示意性示出了根据本公开的一实施例的内存装置测试方法的流程示意图；
图5示意性示出了根据本公开的一实施例的确定内存装置的测试结果的流程示意图；
图6示意性示出了根据本公开的一实施例的确定内存装置的测试结果的流程示意图；
图7示意性示出了根据本公开的一实施例的内存装置测试装置的框图；
图8示意性示出了根据本公开的一实施例的电子设备的模块示意图；
图9示意性示出了根据本公开的一实施例的程序产品示意图。
具体实施方式
下面将结合本公开实施例中的附图，对公开实施例中的技术方案进行清楚、完整地描述，显然，所描述的实施例是本公开一部分实施例，而不是全 部的实施例。基于本公开中的实施例，本领域技术人员在没有做出创造性劳动前提下所获得的所有其他实施例，都属于本公开保护的范围。需要说明的是，在不冲突的情况下，本公开中的实施例及实施例中的特征可以相互任意组合。
图1示出了可以应用本公开实施例的技术方案的内存装置测试系统的系统架构示意图。
如图1所示，内存装置测试系统100包括移动装置101，目标测试平台102和测试服务器103，其中，移动装置101，设置为接收运行路径，根据运行路径将内存装置移动至目标测试平台102中；目标测试平台102，设置为响应测试指令，根据目标测试程序对内存装置进行测试；测试服务器103，设置为向目标测试平台102发送测试指令，并实时监测目标测试平台102的测试结果，并将内存装置的测试结果存储至数据库中；其中，运行路径为测试服务器103根据目标测试平台102的位置坐标和内存装置的当前位置坐标计算所得到。
在本公开的示例性实施例中，目标测试平台上添加有目标测试程序，该目标测试平台上可以添加有唯一类型的目标测试程序。还可以添加有多个类型的测试程序，根据在目标测试平台上的内存装置的类型，在多个测试程序中确定目标测试程序。其中，内存装置的类型可以包括内存条、内存条颗粒和内存条基板。
在本公开的示例性实施例中，内存装置测试系统还包括一终端，该终端包括一显示界面，测试服务器可以响应显示界面上的查询请求，通过查询请求中的内存装置的标识信息在数据库中获取该内存装置的测试结果。
在本公开的示例性实施例中，移动装置包括机械臂和控制端，控制端可以控制机械臂的移动。例如，控制端可以接收运行路径，从而控制机械臂按照运行路径移动内存装置。其中，机械臂的上方设置有一个或多个夹爪机构，夹爪机构可以抓取内存装置，并跟随机械臂移动。夹爪机构可以包括多个类型，不同类型的夹爪机构抓取相对应类型的内存装置，比如，内存条夹爪机构抓取内存条，内存条颗粒夹爪机构抓取内存条颗粒，内存条基板夹爪机构抓取内存条基板。
在本公开的示例性实施例中，内存装置测试系统还设置有扫描设备，扫 描设备可以扫描内存装置和目标测试平台的识别码，以获得内存装置的标识信息、内存装置的类型、以及目标测试平台的标识信息。比如，扫描设备可以包括扫描枪，识别码可以是二维码，扫描枪通过扫描内存装置上的二维码，以获得内存装置的标识信息和/或内存装置的类型，扫描枪通过扫描目标测试平台上的二维码，以获得目标测试平台的标识信息。其中，扫描设备可以设置移动装置上，比如，可以设置在机械臂的上方。
在本公开的示例性实施例中，在移动装置上设置有高度传感器，高度传感器可以设置在目标测试平台上，也可以设置在机械臂上，高度传感器可以检测机械臂与目标测试平台之间的距离。
在本公开的示例性实施例中，内存装置测试系统还设置有颜色传感器，颜色传感器可以设置在目标测试平台上。目标测试平台将测试状态和内存装置的当次测试结果发送至颜色传感器中，利用颜色传感器的颜色变化表征目标测试平台的测试状态或内存装置的当次测试结果。
举例而言，图2示出了本实施例的移动装置的结构示意图，如图2所示，该移动装置中包括控制端201、机械臂202，在机械臂202的上方分别安装有夹爪机构203、夹爪机构204和一个扫码枪205。其中，夹爪机构203为内存条颗粒夹爪机构，设置为抓取内存条颗粒；夹爪机构204为内存条夹爪机构，设置为抓取内存条。
图3示出了本实施例的测试平台的结构示意图，如图3所示，内存装置测试系统中包括50个测试平台，其中，可以对50个测试平台进行分类，比如，测试平台1至测试平台20设置为测试内存条，测试平台21至测试平台40设置为测试内存条颗粒，测试平台41至测试平台50设置为测试内存条基板。另外，在测试平台1至测试平台20中添加内存条测试程序，在测试平台21至测试平台40中添加内存条颗粒测试程序，在测试平台41至测试平台50中添加内存条基板测试程序。
需要说明的是，本公开实施例所提供的内存装置测试方法一般由测试服务器执行，相应地，内存装置测试装置一般设置于测试服务器中。但是，在本公开的其它实施例中，也可以由内存装置测试装置执行本公开实施例所提供的内存装置测试方法。
在本领域的相关技术中，内存装置的测试有两种测试方式，一种是开发 测试平台测试内存装置，另一种是直接在内存装置应用设备中测试。但是，这两种测试方式都需要手动测试，不仅测试精度低，还耗费大量的人力物力成本。
本公开实施例提供了一种内存装置测试方法，应用于内存装置测试系统，图4示出了内存装置测试方法的流程示意图，如图4所示，该内存装置测试方法至少包括以下步骤：
步骤S410：根据目标测试平台的位置坐标和内存装置的当前位置坐标确定运行路径；
步骤S420：根据运行路径设置移动装置，以使移动装置根据运行路径将内存装置移动至目标测试平台中；
步骤S430：控制目标测试平台根据目标测试程序对内存装置进行测试；
步骤S440：实时监测内存装置的测试结果，并将内存装置的测试结果存储至数据库中。
本公开实施例中的内存装置测试方法通过测试服务器、移动装置以及目标测试平台之间的数据交互，能够自动实现对内存装置的测试，提高了测试效率和测试准确率；并且，本公开的内存装置测试方法完全替代了人工测试，避免了因人为失误带来的系统消耗，节省了人力成本和物力成本。
为了使本公开的技术方案更清晰，接下来对内存装置测试方法的各步骤进行说明。
在步骤S410中，根据目标测试平台的位置坐标和内存装置的当前位置坐标确定运行路径。
在本公开的示例性实施例中，获取目标测试平台的位置坐标，以及获取内存装置的当前位置坐标，根据目标测试平台的位置坐标和内存装置的当前位置坐标计算运行路径。其中，运行路径可以是直线路径，也可以是曲线路径，可以根据实际应用场景规划运行路径。
比如，可以根据目标测试平台的位置坐标和内存装置的当前位置坐标计算两点之间的直线路径。还可以设置一目标点，根据目标测试平台的位置坐标、目标点的位置坐标、以及内存装置的当前位置坐标规划直线路径或曲线路径，本公开对此运行路径的确定方法不作具体限定。
在本公开的示例性实施例中，在根据目标测试平台的位置坐标和内存装 置的当前位置坐标确定运行路径之前，获取测试平台的测试状态；在测试平台处于空闲状态时，将测试平台配置为目标测试平台。
其中，测试平台的测试状态包括正在测试状态、掉线状态、空闲状态等。正在测试状态指的是测试平台上放置内存装置，测试平台正在对内存装置进行测试中；掉线状态指的是测试平台上放置内存装置，测试平台在对内存装置进行测试的过程中，测试平台出现测试故障，导致测试中止的情况；空闲状态是测试平台上未放置内存装置，测试平台处于待测试状态。当然，测试状态还可以为其它的测试状态，本公开对此不作具体限定。
在本公开的示例性实施方式中，通过颜色传感器获取测试平台的测试状态，在测试平台处于空闲状态时，将测试平台配置为目标测试平台。测试平台的测试状态可以通过颜色传感器表征，通过获取颜色传感器的颜色变化，得到测试平台的颜色变化。比如，配置颜色传感器的第一颜色表征的测试状态为正在测试状态，第二颜色表征的测试状态为掉线状态，第三颜色表征的测试状态为空闲状态，第一颜色、第二颜色以及第三颜色可以为任意不同的颜色。当然，测试状态为多种状态，颜色传感器显示的颜色也可以为多个不同的颜色，本公开对此不作具体限定。
若多个测试平台中，存在两个以上的测试平台都处于空闲状态，可以将任意一个处于空闲状态的测试平台配置为目标测试平台，还可以在多个处于空闲状态的测试平台中根据其它筛选条件，确定目标测试平台。
在本公开的示例性实施例中，将内存装置的类型与多个测试平台相匹配；在内存装置的类型与测试平台相匹配时，将测试平台配置为目标测试平台，其中，内存装置的类型与目标测试平台相关联。
其中，内存装置测试系统中配置有多个类型的测试平台，分别包括内存条测试平台、内存条颗粒测试平台，内存条基板测试平台，各类型的测试平台分别测试对应类型的内存装置。
在本公开的示例性实施例中，可以通过扫描设备扫描内存装置，获得内存装置的类型。将内存装置的类型与多个测试平台相匹配，并将与内存装置的类型相匹配的测试平台配置为目标测试平台。比如，若内存装置为内存条，则将内存条测试平台作为目标测试平台。
在步骤S420中，根据运行路径设置移动装置，以使移动装置根据运行 路径将内存装置移动至目标测试平台中。
在本公开的示例性实施例中，将运行路径发送至移动装置的控制端，通过控制端控制机械臂，以使机械臂按照运行路径将内存装置移动至目标测试平台中。
在本公开的示例性实施例中，运行路径上包括一目标点，该目标点与目标测试平台相距预设距离。在内存装置移动至目标点时，通过高度传感器检测机械臂与目标测试平台之间的目标距离。
其中，该目标点可以设置在目标测试平台上方的任一点处，比如，将目标点设置在目标测试平台的正上方。另外，目标点与目标测试平台相距预设距离，预设距离可以根据实际情况进行设定，本公开对目标点的位置不作具体限定。
在本公开的示例性实施例中，若目标距离小于预设距离，则表明在目标测试平台上存在正在测试的内存装置。因此，在目标距离小于预设距离时，配置新的目标测试平台；根据新的目标测试平台的位置坐标和内存装置的当前位置坐标确定新的运行路径。其中，可以将其它测试平台与内存装置的类型相匹配，并将与内存装置的类型相匹配的测试平台配置为新的目标测试平台。
在本公开的示例性实施例中，若目标距离小于预设距离，内存装置的测试方法流程如下：
首先，若目标距离小于预设距离，配置新的目标测试平台；
接着，内存装置的当前位置坐标为目标点所在的位置坐标，根据目标点的位置坐标和新的目标测试平台的位置坐标确定新的运行路径，将新的运行路径发送至移动装置，以使移动装置根据新的运行路径移动至新的目标测试平台中；
然后，在移动装置移动至内存装置的过程中，新的运行路径中包括一目标点，在内存装置移动至目标点时，通过高度传感器检测机械臂与目标测试平台之间的目标距离；
重复上述步骤，直至目标距离等于预设距离，通过移动装置将内存装置放置在新的目标测试平台上，并控制新的目标测试平台根据目标测试程序对内存装置进行测试。
在本公开的示例性实施例中，根据内存装置的类型在多个夹爪机构中确定目标夹爪机构；通过控制端控制目标夹爪机构抓取内存装置，并控制机械臂根据运行路径将内存装置移动至目标测试平台中。
其中，机械臂包括多个夹爪机构，夹爪机构可以抓取内存装置，夹爪机构可以根据内存装置的类型设置为多个类型的夹爪机构。比如，夹爪机构可以包括内存条夹爪机构、内存条颗粒夹爪机构、内存条基板夹爪机构，内存条夹爪机构、内存条颗粒夹爪机构、内存条基板夹爪机构的结构不同。
在本公开的示例性实施例中，根据内存装置的类型在多个夹爪机构中确定目标夹爪机构，将内存装置的类型与多个夹爪机构相匹配，在夹爪机构与内存装置的类型相匹配时，将该夹爪机构作为该内存装置的目标夹爪机构。
比如，目标夹爪机构与内存装置的类型相关联。若内存装置的类型为内存条，则目标夹爪机构为内存条夹爪机构。通过控制端控制内存条夹爪机构抓取内存条，并控制机械臂根据运行路径将内存条移动至目标测试平台中。若内存装置的类型为内存条颗粒，则目标夹爪机构为内存条颗粒夹爪机构。通过控制端控制内存条颗粒夹爪机构抓取内存条颗粒，并控制机械臂根据运行路径将内存条颗粒移动至目标测试平台中。若内存装置的类型为内存条基板，则目标夹爪机构为内存条基板夹爪机构。通过控制端控制内存条基板夹爪机构抓取内存条基板，并控制机械臂根据运行路径将内存条基板移动至目标测试平台中。
在本公开的示例性实施例中，通过扫描设备扫描内存装置和目标测试平台的识别码，以获得内存装置的标识信息、内存装置的类型，以及目标测试平台的标识信息。
其中，内存装置的标识信息包括内存装置的唯一标识、内存装置编号等，目标测试平台的标识信息可以是目标测试平台的唯一标识、测试平台编号等。
在本公开的示例性实施例中，可以通过扫描设备扫描内存装置和测试平台上的识别码，确定内存装置的标识信息，根据内存装置的标识信息在数据库中确定该内存装置的类型。
在本公开的示例性实施例中，根据内存装置的标识信息和目标测试平台的标识信息形成映射关系，并将该内存装置与目标测试平台的映射关系存储 在数据库中。
在步骤S430中，控制目标测试平台根据目标测试程序对内存装置进行测试。
在本公开的示例性实施例中，根据内存装置的类型在多个测试程序中确定目标测试程序；将目标测试程序添加至目标测试平台中，以使目标测试平台运行目标测试程序。
在本公开的示例性实施例中，将内存装置的类型与多个测试程序进行匹配，若测试程序与内存装置的类型相匹配，则将该测试程序配置为目标测试程序。
其中，内存装置的类型与目标测试程序相关联，目标测试程序可以对内存装置进行测试，由于内存装置包括内存条、内存条颗粒、内存条基板，对内存装置进行测试的测试程序也包括内存条测试程序、内存条颗粒测试程序、内存条基板测试程序，不同的测试程序对不同类型的内存装置进行测试。
在步骤S440中，实时监测内存装置的测试结果，并将内存装置的测试结果存储至数据库中。
在本公开的示例性实施例中，将实时监测到的目标测试平台上的内存装置的测试结果显示在显示界面中，以使操作员工可以实时获取到所有目标测试平台上的内存装置的测试结果。其中，内存装置的测试结果包括测试通过、测试不通过。
在本公开的示例性实施例中，可以根据内存装置的标识信息在数据库中获取内存装置的测试结果，并将测试结果显示在显示界面中。也就是说，操作员工可以在显示界面通过触发查询按钮形成查询请求，该查询请求可以包括一个或多个内存装置的标识信息，测试服务器接收到该查询请求之后，根据一个或多个内存装置的标识信息在数据库中查询一个或多个内存装置的测试结果，并将一个或多个内存装置的测试结果发送至终端，以使终端在显示界面上显示内存装置的测试结果。
在本公开的示例性实施例中，该显示界面还可以实时显示所有测试平台上的测试状态以及内存装置的当次测试结果，并会随着测试平台的测试状态和内存装置的当次测试结果的变化而变化。
在本公开的示例性实施例中，可以通过目标测试平台上的颜色传感器表征在该目标测试平台上进行测试的内存装置的当次测试结果。例如，设置颜色传感器上的颜色信息与内存装置的当次测试结果之间的映射关系。比如，若内存装置的当次测试结果为测试通过，则目标测试平台上的颜色传感器显示第四颜色；若内存装置的当次测试结果为测试不通过，则目标测试平台上的颜色传感器显示第五颜色。其中，第四颜色和第五颜色属于任意不同的颜色，第四颜色和第五颜色分别与上述实施例中的第一颜色、第二颜色和第三颜色也属于任意不同的颜色。
在本公开的示例性实施例，图5示出了确定内存装置的测试结果的方法流程示意图，如图5所示，该流程至少包括步骤S510至步骤S530，详细介绍如下：
在步骤S510中，获取内存装置的测试次数，判断内存装置的测试次数是否大于或等于预设测试次数。
在本公开的示例性实施例中，预设测试次数可以根据实际情况进行设定，可以设置为3次，也可以设置为5次等，本公开对此不作具体限定。比如，可以通过目标测试程序的准确率调整预设测试次数，若目标测试程序的测试准确率较低，则设置较大的预设测试次数，以确保提高测试结果的准确率；若目标测试程序的测试准确率较高，则设置较小的预设测试次数，以提高内存装置的测试效率，较小系统消耗。
在本公开的示例性实施例中，还可以根据目标测试程序的上线时间调整预设测试次数，比如，在目标测试程序刚上线时，设置较大的预设测试次数，随着目标测试程序上线时间加长，再加上对目标测试程序的更新，可以设置较小的预设测试次数。
在本公开的示例性实施例中，可以通过同一目标测试平台对内存装置进行多次测试，也可以利用多个目标测试平台分别对内存装置进行测试。记录目标测试平台对内存装置的测试信息，该测试信息包括开始测试时间、结束测试时间，目标测试平台的标识信息、内存装置的标识信息、内存装置的当次测试结果、目标测试程序的标识信息、内存装置的测试次数等。若使用多个目标测试平台对内存装置进行测试，则测试信息中包括多个目标测试平台的标识信息、一个或多个目标测试程序的标识信息、多个内存装置的当次测 试结果，还包括多对开始测试时间和结束测试时间。
在本公开的示例性实施例中，根据内存装置的标识信息获取内存装置的测试次数，并获取预设测试次数，判断该内存装置的测试次数是否大于或等于预设测试次数。
在步骤S520中，若内存装置的测试次数大于或等于预设测试次数，则确定内存装置的测试结果。
在本公开的示例性实施例中，若预设测试次数为一次，则将内存装置的当次测试结果配置为该目标测试平台上的内存装置的测试结果。
在本公开的示例性实施例中，可以从测试信息中直接获取内存装置的当次测试结果，内存装置的当次测试结果的确定方法如下：首先，实时监测目标测试平台上的颜色传感器的颜色信息；然后，根据颜色传感器的颜色信息与内存装置的当次测试结果之间的映射关系，对颜色传感器的颜色信息进行解析；最后，根据解析结果获取该目标测试平台上内存装置的当次测试结果。其中，对颜色传感器的颜色信息进行解析包括：将颜色传感器的颜色信息与颜色信息与当次测试结果之间的映射关系进行匹配，获取该颜色传感器的颜色信息对应的当次测试结果。
在本公开的示例性实施例中，若预设测试次数为多次，则根据内存装置的标识信息获取内存装置对应的多个当次测试结果和内存装置的测试次数，根据内存装置的多个当次测试结果和测试次数按照预设规则确定该内存装置的测试结果。
在本公开的示例性实施例中，预设规则可以是：若多个当次测试结果中测试通过的次数大于测试次数的一半，则该内存装置的测试结果为测试通过。预设规则也可以是：若多个当次测试结果中测试通过的次数大于测试次数的三分之二，则该内存装置的测试结果为测试通过。该预设规则还可以是：若多个当次测试结果中只包含一次测试不通过，其它的当次测试结果均为测试通过，则该内存装置的测试结果为测试通过。当然，预设规则可以根据实际情况进行设定，本公开对此不作具体限定。
在步骤S530中，若内存装置的测试次数小于预设测试次数，配置新的目标测试平台，并根据新的目标测试平台的位置坐标和内存装置的当前位置坐标确定新的运行路径。
在本公开的示例性实施例中，若内存装置的测试次数小于预设测试次数，则根据内存装置的类型在测试状态为空闲状态的测试平台中确定新的目标测试平台。其中，新的目标测试平台与内存装置的类型相关联。
在本公开的示例性实施例中，图6示出了确定内存装置的测试结果的方法流程示意图，如图6所示，该流程至少包括步骤S610至步骤S650，详细介绍如下：
在步骤S610中，根据新的目标测试平台的位置坐标和内存装置的当前位置坐标确定新的运行路径。
其中，内存装置的当前位置坐标即为当前目标测试平台的位置坐标。
在步骤S620中，根据新的运行路径设置移动装置，以使移动装置根据新的运行路径将内存装置移动至新的目标测试平台中。
在步骤S630中，控制新的目标测试平台根据目标测试程序对内存装置进行测试，以获得内存装置的当次测试结果，并对内存装置的测试信息进行更新。
其中，对内存装置的测试信息进行更新，包括：将新的目标测试平台的标识信息、内存装置的当次测试结果添加至测试信息中，并对测试次数加一，以获得当前测试次数。
在步骤S640中，判断内存装置的当前测试次数是否大于或等于预设测试次数。
在步骤S650中，若内存装置的当前测试次数大于或等于预设测试次数，则根据测试信息中的多个当次测试结果确定内存装置的测试结果。
其中，若内存装置的当前测试次数小于预设测试次数，则重复上述步骤S610至步骤S640，直至得到内存装置的测试结果。
本领域技术人员可以理解实现上述实施方式的全部或部分步骤被实现为由CPU执行的计算机程序。在该计算机程序被CPU执行时，执行本发明提供的上述方法所限定的上述功能。所述的程序可以存储于一种计算机可读存储介质中，该存储介质可以是只读存储器，磁盘或光盘等。
此外，需要注意的是，上述附图仅是根据本发明示例性实施方式的方法所包括的处理的示意性说明，而不是限制目的。易于理解，上述附图所示的处理并不表明或限制这些处理的时间顺序。另外，也易于理解，这些处理可 以是例如在多个模块中同步或异步执行的。
以下介绍本公开的装置实施例，可以用于执行本公开上述的内存装置测试方法。对于本公开装置实施例中未披露的细节，请参照本公开上述的内存装置测试方法的实施例。
图7示意性示出了根据本公开的一个实施例的内存装置测试装置的框图。
参照图7所示，根据本公开的一个实施例的内存装置测试装置700，内存装置测试装置700包括：路径确定模块701、内存移动模块702、测试控制模块703和结果监测模块704。
路径确定模块701，设置为根据目标测试平台的位置坐标和内存装置的当前位置坐标确定运行路径；
内存移动模块702，设置为根据运行路径设置移动装置，以使移动装置根据运行路径将内存装置移动至目标测试平台中；
测试控制模块703，设置为控制目标测试平台根据目标测试程序对内存装置进行测试；
结果监测模块704，设置为实时监测内存装置的测试结果，并将内存装置的测试结果存储至数据库中。
在本公开的示例性实施例中，移动装置包括机械臂和控制端，内存移动模块702还可以设置为将运行路径发送至控制端，通过控制端控制机械臂，以使机械臂根据运行路径将内存装置移动至目标测试平台。
在本公开的示例性实施例中，机械臂包括多个夹爪机构，内存移动模块702还可以设置为根据内存装置的类型在多个夹爪机构中确定目标夹爪机构；通过控制端控制目标夹爪机构抓取内存装置，并控制机械臂根据运行路径将内存装置移动至目标测试平台中。
在本公开的示例性实施例中，内存装置测试装置700还包括扫描模块(图中未示出)，该扫描模块设置为通过扫描设备扫描内存装置和目标测试平台的识别码，以获得内存装置的标识信息、内存装置的类型、以及目标测试平台的标识信息。
在本公开的示例性实施例中，内存装置测试装置700还包括目标程序确定模块(图中未示出)，该目标程序确定模块设置为根据内存装置的类型将 目标测试程序添加至目标测试平台中，以使目标测试平台运行目标测试程序。
在本公开的示例性实施例中，内存装置测试装置700还包括第一目标平台确定模块(图中未示出)，该第一目标平台确定模块设置为通过颜色传感器获取测试平台的测试状态；在测试平台处于空闲状态时，将测试平台配置为目标测试平台。
在本公开的示例性实施例中，内存装置测试装置700还包括第二目标平台确定模块(图中未示出)，该第二目标平台确定模块设置为将内存装置的类型与多个测试平台相匹配；在内存装置的类型与测试平台相匹配时，将测试平台配置为目标测试平台。
在本公开的示例性实施例中，内存装置测试装置700还包括第三目标平台确定模块(图中未示出)，该第三目标平台确定模块设置为在内存装置移动至目标点时，通过高度传感器检测机械臂与目标测试平台之间的目标距离，其中，运行路径包括一目标点，目标点与目标测试平台相距预设距离。
在本公开的示例性实施例中，第三目标平台确定模块还可以设置为在目标距离小于预设距离时，配置新的目标测试平台；根据新的目标测试平台的位置坐标和内存装置的当前位置坐标确定新的运行路径。
在本公开的示例性实施例中，内存装置测试装置700还包括结果确定模块(图中未示出)，该结果确定模块设置为获取内存装置的测试次数，判断内存装置的测试次数是否大于或等于预设测试次数；若是，确定内存装置的测试结果；若否，配置新的目标测试平台，并根据新的目标测试平台的位置坐标和内存装置的当前位置坐标确定新的运行路径。
在本公开的示例性实施例中，内存装置测试装置700还包括结果显示模块(图中未示出)，该结果显示模块设置为根据内存装置的标识信息在数据库中获取内存装置的测试结果，并将测试结果显示在显示界面。
上述各内存装置测试装置的具体细节已经在对应的内存装置测试方法中进行了详细的描述，因此此处不再赘述。
应当注意，尽管在上文详细描述中提及了用于执行的设备的若干模块或者单元，但是这种划分并非强制性的。实际上，根据本公开的实施方式，上文描述的两个或更多模块或者单元的特征和功能可以在一个模块或者单元中 具体化。反之，上文描述的一个模块或者单元的特征和功能可以进一步划分为由多个模块或者单元来具体化。
在本公开的示例性实施例中，还提供了一种能够实现上述方法的电子设备。
所属技术领域的技术人员能够理解，本发明的各个方面可以实现为系统、方法或程序产品。因此，本发明的各个方面可以具体实现为以下形式，即：完全的硬件实施方式、完全的软件实施方式(包括固件、微代码等)，或硬件和软件方面结合的实施方式，这里可以统称为“电路”、“模块”或“系统”。
下面参照图8来描述根据本发明的这种实施方式的电子设备800。图8显示的电子设备800仅仅是一个示例，不应对本发明实施例的功能和使用范围带来任何限制。
如图8所示，电子设备800以通用计算设备的形式表现。电子设备800的组件可以包括但不限于：上述至少一个处理单元810、上述至少一个存储单元820、连接不同系统组件(包括存储单元820和处理单元810)的总线830、显示单元840。
其中，所述存储单元存储有程序代码，所述程序代码可以被所述处理单元810执行，使得所述处理单元810执行本说明书上述“示例性方法”部分中描述的根据本发明各种示例性实施方式的步骤。例如，所述处理单元810可以执行如图4中所示的步骤S410，根据目标测试平台的位置坐标和内存装置的当前位置坐标确定运行路径；步骤S420，根据运行路径设置移动装置，以使移动装置根据运行路径将内存装置移动至目标测试平台中；步骤S430，控制目标测试平台根据目标测试程序对内存装置进行测试；步骤S440，实时监测内存装置的测试结果，并将内存装置的测试结果存储至数据库中。
存储单元820可以包括易失性存储单元形式的可读介质，例如随机存取存储单元(RAM)8201和/或高速缓存存储单元8202，还可以进一步包括只读存储单元(ROM)8203。
存储单元820还可以包括具有一组(至少一个)程序模块8205的程序/实用工具8204，这样的程序模块8205包括但不限于：操作系统、一个或者多个应用程序、其它程序模块以及程序数据，这些示例中的每一个或某种组 合中可能包括网络环境的实现。
总线830可以为表示几类总线结构中的一种或多种，包括存储单元总线或者存储单元控制器、外围总线、图形加速端口、处理单元或者使用多种总线结构中的任意总线结构的局域总线。
电子设备800也可以与一个或多个外部设备1000(例如键盘、指向设备、蓝牙设备等)通信，还可与一个或者多个使得观众能与该电子设备800交互的设备通信，和/或与使得该电子设备800能与一个或多个其它计算设备进行通信的任何设备(例如路由器、调制解调器等等)通信。这种通信可以通过输入/输出(I/O)接口850进行。并且，电子设备800还可以通过网络适配器860与一个或者多个网络(例如局域网(LAN)，广域网(WAN)和/或公共网络，例如因特网)通信。如图所示，网络适配器1060通过总线830与电子设备800的其它模块通信。应当明白，尽管图中未示出，可以结合电子设备800使用其它硬件和/或软件模块，包括但不限于：微代码、设备驱动器、冗余处理单元、外部磁盘驱动阵列、RAID系统、磁带驱动器以及数据备份存储系统等。
通过以上的实施方式的描述，本领域的技术人员易于理解，这里描述的示例实施方式可以通过软件实现，也可以通过软件结合必要的硬件的方式来实现。因此，根据本公开实施方式的技术方案可以以软件产品的形式体现出来，该软件产品可以存储在一个非易失性存储介质(可以是CD-ROM，U盘，移动硬盘等)中或网络上，包括若干指令以使得一台计算设备(可以是个人计算机、服务器、终端装置、或者网络设备等)执行根据本公开实施方式的方法。
在本公开的示例性实施例中，还提供了一种计算机可读存储介质，其上存储有能够实现本说明书上述方法的程序产品。在一些可能的实施方式中，本发明的各个方面还可以实现为一种程序产品的形式，其包括程序代码，当所述程序产品在终端设备上运行时，所述程序代码用于使所述终端设备执行本说明书上述“示例性方法”部分中描述的根据本发明各种示例性实施方式的步骤。
参考图9所示，描述了根据本发明的实施方式的用于实现上述方法的程序产品900，其可以采用便携式紧凑盘只读存储器(CD-ROM)并包括程序代 码，并可以在终端设备，例如个人电脑上运行。然而，本发明的程序产品不限于此，在本文件中，可读存储介质可以是任何包含或存储程序的有形介质，该程序可以被指令执行系统、装置或者器件使用或者与其结合使用。
所述程序产品可以采用一个或多个可读介质的任意组合。可读介质可以是可读信号介质或者可读存储介质。可读存储介质例如可以为但不限于电、磁、光、电磁、红外线、或半导体的系统、装置或器件，或者任意以上的组合。可读存储介质的更具体的例子(非穷举的列表)包括：具有一个或多个导线的电连接、便携式盘、硬盘、随机存取存储器(RAM)、只读存储器(ROM)、可擦式可编程只读存储器(EPROM或闪存)、光纤、便携式紧凑盘只读存储器(CD-ROM)、光存储器件、磁存储器件、或者上述的任意合适的组合。
计算机可读信号介质可以包括在基带中或者作为载波一部分传播的数据信号，其中承载了可读程序代码。这种传播的数据信号可以采用多种形式，包括但不限于电磁信号、光信号或上述的任意合适的组合。可读信号介质还可以是可读存储介质以外的任何可读介质，该可读介质可以发送、传播或者传输用于由指令执行系统、装置或者器件使用或者与其结合使用的程序。
可读介质上包含的程序代码可以用任何适当的介质传输，包括但不限于无线、有线、光缆、RF等等，或者上述的任意合适的组合。
可以以一种或多种程序设计语言的任意组合来编写用于执行本发明操作的程序代码，所述程序设计语言包括面向对象的程序设计语言—诸如Java、C++等，还包括常规的过程式程序设计语言—诸如“C”语言或类似的程序设计语言。程序代码可以完全地在用户计算设备上执行、部分地在用户设备上执行、作为一个独立的软件包执行、部分在用户计算设备上部分在远程计算设备上执行、或者完全在远程计算设备或服务器上执行。在涉及远程计算设备的情形中，远程计算设备可以通过任意种类的网络，包括局域网(LAN)或广域网(WAN)，连接到用户计算设备，或者，可以连接到外部计算设备(例如利用因特网服务提供商来通过因特网连接)。
此外，上述附图仅是根据本发明示例性实施例的方法所包括的处理的示意性说明，而不是限制目的。易于理解，上述附图所示的处理并不表明或限制这些处理的时间顺序。另外，也易于理解，这些处理可以是例如在多个模 块中同步或异步执行的。
本领域技术人员在考虑说明书及实践这里公开的发明后，将容易想到本公开的其他实施例。本申请旨在涵盖本公开的任何变型、用途或者适应性变化，这些变型、用途或者适应性变化遵循本公开的一般性原理并包括本公开未公开的本技术领域中的公知常识或惯用技术手段。说明书和实施例仅被视为示例性的，本公开的真正范围和精神由权利要求指出。本说明书中各实施例或实施方式采用递进的方式描述，每个实施例重点说明的都是与其他实施例的不同之处，各个实施例之间相同相似部分相互参见即可。
在本说明书的描述中，参考术语“实施例”、“示例性的实施例”、“一些实施方式”、“示意性实施方式”、“示例”等的描述意指结合实施方式或示例描述的具体特征、结构、材料或者特点包含于本公开的至少一个实施方式或示例中。
在本说明书中，对上述术语的示意性表述不一定指的是相同的实施方式或示例。而且，描述的具体特征、结构、材料或者特点可以在任何的一个或多个实施方式或示例中以合适的方式结合。
在本公开的描述中，需要说明的是，术语“中心”、“上”、“下”、“左”、“右”、“竖直”、“水平”、“内”、“外”等指示的方位或位置关系为基于附图所示的方位或位置关系，仅是为了便于描述本公开和简化描述，而不是指示或暗示所指的装置或元件必须具有特定的方位、以特定的方位构造和操作，因此不能理解为对本公开的限制。
可以理解的是，本公开所使用的术语“第一”、“第二”等可在本公开中用于描述各种结构，但这些结构不受这些术语的限制。这些术语仅用于将第一个结构与另一个结构区分。
在一个或多个附图中，相同的元件采用类似的附图标记来表示。为了清楚起见，附图中的多个部分没有按比例绘制。此外，可能未示出某些公知的部分。为了简明起见，可以在一幅图中描述经过数个步骤后获得的结构。在下文中描述了本公开的许多特定的细节，例如器件的结构、材料、尺寸、处理工艺和技术，以便更清楚地理解本公开。但正如本领域技术人员能够理解的那样，可以不按照这些特定的细节来实现本公开。
最后应说明的是：以上各实施例仅用以说明本公开的技术方案，而非对 其限制；尽管参照前述各实施例对本公开进行了详细的说明，本领域技术人员应当理解：其依然可以对前述各实施例所记载的技术方案进行修改，或者对其中部分或者全部技术特征进行等同替换；而这些修改或者替换，并不使相应技术方案的本质脱离本公开各实施例技术方案的范围。
工业实用性
本公开实施例所提供的内存装置测试方法、装置、系统、介质及电子设备中，通过根据目标测试平台的位置坐标和内存装置的当前位置坐标确定运行路径；根据所述运行路径设置移动装置，以使所述移动装置根据所述运行路径将所述内存装置移动至所述目标测试平台中；控制所述目标测试平台根据目标测试程序对所述内存装置进行测试；实时监测内存装置的测试结果，并将所述内存装置的测试结果存储至数据库中。本公开中的内存装置测试方法，通过测试服务器、移动装置、目标测试平台之间的数据交互，能够自动实现对内存装置的测试，提高了测试效率和测试准确率；本公开的内存装置测试方法完全替代了人工测试，避免了因人为失误带来的系统消耗，节省了人力成本和物力成本。

Claims (18)

  1. 一种内存装置测试方法，包括：
    根据目标测试平台的位置坐标和内存装置的当前位置坐标确定运行路径；
    根据所述运行路径设置移动装置，以使所述移动装置根据所述运行路径将所述内存装置移动至所述目标测试平台中；
    控制所述目标测试平台根据目标测试程序对所述内存装置进行测试；
    实时监测所述内存装置的测试结果，并将所述内存装置的测试结果存储至数据库中。
  2. 根据权利要求1所述的内存装置测试方法，其中，所述方法还包括：
    通过扫描设备扫描所述内存装置和所述目标测试平台的识别码，以获得所述内存装置的标识信息、所述内存装置的类型、以及所述目标测试平台的标识信息。
  3. 根据权利要求2所述的内存装置测试方法，其中，在对所述内存装置进行测试之前，所述方法还包括：
    根据所述内存装置的类型将所述目标测试程序添加至所述目标测试平台，以使所述目标测试平台运行所述目标测试程序。
  4. 根据权利要求1所述的内存装置测试方法，其中，在确定运行路径之前，所述方法还包括：
    通过颜色传感器获取测试平台的测试状态；
    在所述测试平台处于空闲状态时，将所述测试平台配置为所述目标测试平台。
  5. 根据权利要求1所述的内存装置测试方法，其中，所述方法还包括：
    将所述内存装置的类型与多个测试平台相匹配；
    在所述内存装置的类型与所述测试平台相匹配时，将所述测试平台配置为目标测试平台。
  6. 根据权利要求1所述的内存装置测试方法，其中，所述移动装置包括机械臂和控制端；
    将所述运行路径发送至所述控制端，通过所述控制端控制所述机械臂， 以使所述机械臂根据所述运行路径将所述内存装置移动至所述目标测试平台中。
  7. 根据权利要求6所述的内存装置测试方法，其中，所述运行路径包括一目标点，所述目标点与所述目标测试平台相距预设距离；所述方法还包括：
    在所述内存装置移动至所述目标点时，通过高度传感器检测所述机械臂与所述目标测试平台之间的目标距离。
  8. 根据权利要求7所述的内存装置测试方法，其中，所述方法还包括：
    在所述目标距离小于所述预设距离时，配置新的目标测试平台；
    根据所述新的目标测试平台的位置坐标和所述内存装置的当前位置坐标确定新的运行路径。
  9. 根据权利要求6所述的内存装置测试方法，其中，所述机械臂包括多个夹爪机构；
    根据所述内存装置的类型在所述多个夹爪机构中确定目标夹爪机构；
    通过所述控制端控制所述目标夹爪机构抓取所述内存装置，并控制所述机械臂根据所述运行路径将所述内存装置移动至所述目标测试平台中。
  10. 根据权利要求1所述的内存装置测试方法，其中，所述方法还包括：
    获取所述内存装置的测试次数，判断所述内存装置的测试次数是否大于或等于预设测试次数；
    若是，确定内存装置的测试结果；
    若否，配置新的目标测试平台，并根据所述新的目标测试平台的位置坐标和所述内存装置的当前位置坐标确定新的运行路径。
  11. 根据权利要求1所述的内存装置测试方法，其中，所述方法还包括：
    根据所述内存装置的标识信息在所述数据库中获取所述内存装置的测试结果，并将所述测试结果显示在显示界面。
  12. 一种内存装置测试装置，包括：
    路径确定模块，设置为根据目标测试平台的位置坐标和内存装置的当前位置坐标确定运行路径；
    内存移动模块，设置为根据所述运行路径设置移动装置，以使所述移动装置根据所述运行路径将所述内存装置移动至所述目标测试平台中；
    测试控制模块，设置为控制所述目标测试平台根据目标测试程序对所述内存装置进行测试；
    结果监测模块，设置为实时监测所述内存装置的测试结果，并将所述内存装置的测试结果存储至数据库中。
  13. 一种内存装置测试系统，所述内存装置测试系统包括移动装置、目标测试平台和测试服务器；
    所述移动装置，设置为接收运行路径，根据所述运行路径将所述内存装置移动至所述目标测试平台中；
    所述目标测试平台，设置为响应测试指令，根据目标测试程序对所述内存装置进行测试；
    所述测试服务器，设置为向目标测试平台发送测试指令，并实时监测所述内存装置的测试结果，并将所述内存装置的测试结果存储至数据库中；
    其中，所述运行路径为所述测试服务器根据所述目标测试平台的位置坐标和所述内存装置的当前位置坐标计算所得到。
  14. 根据权利要求13所述的内存装置测试系统，其中，所述内存装置测试系统还包括：终端，所述终端包括显示界面，
    所述显示界面，设置为显示测试平台的测试状态和所述内存装置的测试结果。
  15. 根据权利要求13所述的内存装置测试系统，其中，所述内存装置测试系统还包括：扫描设备，
    所述扫描设备，设置为扫描所述内存装置和所述目标测试平台的识别码，以获得所述内存装置的标识信息、所述内存装置的类型、以及所述目标测试平台的标识信息。
  16. 根据权利要求13所述的内存装置测试系统，其中，所述内存装置测试系统还包括：颜色传感器，
    所述颜色传感器，设置为获取测试平台的测试状态和所述内存装置的测试结果。
  17. 一种计算机可读存储介质，其上存储有计算机程序，所述程序被处理器执行时实现如权利要求1至11中任一项所述的内存装置测试方法。
  18. 一种电子设备，包括：
    一个或多个处理器；
    存储装置，设置为存储一个或多个程序，当所述一个或多个程序被所述一个或多个处理器执行时，使得所述一个或多个处理器实现如权利要求1至11中任一项所述的内存装置测试方法。
PCT/CN2021/120069 2021-03-10 2021-09-24 内存装置测试方法、装置、系统、介质及电子设备 WO2022188393A1 (zh)

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