WO2022172125A1 - 発光デバイス、発光装置、電子機器および照明装置 - Google Patents
発光デバイス、発光装置、電子機器および照明装置 Download PDFInfo
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- WO2022172125A1 WO2022172125A1 PCT/IB2022/050842 IB2022050842W WO2022172125A1 WO 2022172125 A1 WO2022172125 A1 WO 2022172125A1 IB 2022050842 W IB2022050842 W IB 2022050842W WO 2022172125 A1 WO2022172125 A1 WO 2022172125A1
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- 229910052720 vanadium Inorganic materials 0.000 description 1
- GPPXJZIENCGNKB-UHFFFAOYSA-N vanadium Chemical group [V]#[V] GPPXJZIENCGNKB-UHFFFAOYSA-N 0.000 description 1
- 238000005019 vapor deposition process Methods 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
- YVTHLONGBIQYBO-UHFFFAOYSA-N zinc indium(3+) oxygen(2-) Chemical compound [O--].[Zn++].[In+3] YVTHLONGBIQYBO-UHFFFAOYSA-N 0.000 description 1
- TYHJXGDMRRJCRY-UHFFFAOYSA-N zinc indium(3+) oxygen(2-) tin(4+) Chemical compound [O-2].[Zn+2].[Sn+4].[In+3] TYHJXGDMRRJCRY-UHFFFAOYSA-N 0.000 description 1
- OPCPDIFRZGJVCE-UHFFFAOYSA-N zinc indium(3+) oxygen(2-) titanium(4+) Chemical compound [O-2].[Zn+2].[In+3].[Ti+4] OPCPDIFRZGJVCE-UHFFFAOYSA-N 0.000 description 1
- 229910001928 zirconium oxide Inorganic materials 0.000 description 1
- 229940072018 zofran Drugs 0.000 description 1
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- H10K59/121—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements
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Definitions
- One embodiment of the present invention relates to a light-emitting device, a display device, a light-emitting device, a light-receiving device, an electronic device, a lighting device, and an electronic device.
- a technical field of one embodiment of the invention disclosed in this specification and the like relates to a product, a method, or a manufacturing method.
- one aspect of the invention relates to a process, machine, manufacture, or composition of matter. Therefore, the technical field of one embodiment of the present invention disclosed in this specification more specifically includes semiconductor devices, display devices, liquid crystal display devices, light-emitting devices, lighting devices, power storage devices, storage devices, imaging devices, and the like.
- Driving methods or their manufacturing methods can be mentioned as an example.
- Light-emitting devices (organic EL devices) utilizing electroluminescence (EL) using organic compounds have been put to practical use.
- the basic structure of these light-emitting devices is to sandwich an organic compound layer (EL layer) containing a light-emitting material between a pair of electrodes.
- EL layer organic compound layer
- Such a light-emitting device is self-luminous, when it is used as a pixel of a display, it has advantages such as high visibility and no need for a backlight as compared with a liquid crystal, and is suitable as a flat panel display element.
- Another great advantage of a display using such a light-emitting device is that it can be made thin and light. Another feature is its extremely fast response speed.
- a method of forming a light-emitting layer without using a fine metal mask is known.
- Patent Document 1 There is a method for manufacturing an EL display (Patent Document 1).
- An object of one embodiment of the present invention is to provide a novel light-emitting device with excellent convenience, usefulness, or reliability. Another object of one embodiment of the present invention is to provide a novel light-emitting device that is highly convenient, useful, or highly reliable. Another object of one embodiment of the present invention is to provide a novel electronic device that is highly convenient, useful, or reliable. Another object of one embodiment of the present invention is to provide a novel lighting device that is highly convenient, useful, or reliable.
- One embodiment of the present invention has a second electrode over the first electrode with an EL layer interposed therebetween, wherein the EL layer includes a light-emitting layer, a first electron-transporting layer, a second electron-transporting layer, and an electron injection layer, a first electron-transporting layer on the light-emitting layer, a second electron-transporting layer on the first electron-transporting layer, a side surface of the light-emitting layer, the first An insulating layer is provided in contact with a side surface of the electron-transporting layer and a side surface of the second electron-transporting layer, and an electron-injecting layer is provided on the second electron-transporting layer.
- a heteroaromatic compound having at least one heteroaromatic ring located between the side of one electron-transporting layer and the side of the second electron-transporting layer and the electron-injecting layer; and an organic compound different from the heteroaromatic compound.
- a second electrode is provided over the first electrode with an EL layer interposed therebetween, and the EL layer includes a light-emitting layer, a first electron-transporting layer, and a second electron-transporting layer. and an electron injection layer, a first electron-transporting layer on the light-emitting layer, a second electron-transporting layer on the first electron-transporting layer, a side surface of the light-emitting layer, a second An insulating layer in contact with the side surface of the first electron-transporting layer and the side surface of the second electron-transporting layer, the electron-injecting layer on the second electron-transporting layer, and the insulating layer being in contact with the side surface of the light-emitting layer , the side of the first electron-transporting layer, the side of the second electron-transporting layer, and the electron-injecting layer, the second electron-transporting layer comprising a first electron-transporting layer having at least one heteroaromatic ring; and an organic compound different from the
- the organic compound preferably has at least one heteroaromatic ring.
- the heteroaromatic ring preferably has any one of a pyridine skeleton, a diazine skeleton, a triazine skeleton, and a polyazole skeleton.
- the heteroaromatic ring is preferably a condensed heteroaromatic ring having a condensed ring structure.
- the condensed heteroaromatic ring is any one of a quinoline ring, a benzoquinoline ring, a quinoxaline ring, a dibenzoquinoxaline ring, a quinazoline ring, a benzoquinazoline ring, a dibenzoquinoxaline ring, a phenanthroline ring, a furodiazine ring, and a benzimidazole ring. or one.
- Another embodiment of the present invention is a light-emitting device including a light-emitting device having any of the above structures, a transistor, or a substrate.
- one embodiment of the present invention includes a first light-emitting device and a second light-emitting device that are adjacent to each other, and the first light-emitting device is provided over the first electrode with the first EL layer interposed therebetween.
- the first EL layer includes at least a first light-emitting layer, a first electron-transporting layer, a second electron-transporting layer, and an electron-injecting layer; having a first electron-transporting layer on the light-emitting layer of, having a second electron-transporting layer on the first electron-transporting layer, a side surface of the first light-emitting layer, a side surface of the first electron-transporting layer, and a side surface of the second electron-transporting layer, and an electron-injecting layer on the second electron-transporting layer, the first insulating layer being in contact with the first light-emitting layer
- the second light-emitting device is located between the side, the side of the first electron-transporting layer, the side of the second
- a second electrode is provided between layers, and the second EL layer includes at least a second light-emitting layer, a third electron-transport layer, a fourth electron-transport layer, and an electron-injection layer. and a third electron-transporting layer on the second light-emitting layer, a fourth electron-transporting layer on the third electron-transporting layer, and a side surface of the second light-emitting layer and a third electron-transporting layer a second insulating layer in contact with the sides of the layer and an electron injection layer on the fourth electron-transporting layer, the second insulating layer contacting the sides of the second light-emitting layer and the third electron Located between the side surface of the transport layer and the electron injection layer, the second electron transport layer and the fourth electron transport layer comprise a heteroaromatic compound having at least one heteroaromatic ring and a heteroaromatic compound and an organic compound different from the light-emitting device.
- one embodiment of the present invention includes a first light-emitting device and a second light-emitting device that are adjacent to each other, and the first light-emitting device is provided over the first electrode with the first EL layer interposed therebetween.
- the first EL layer includes at least a first light-emitting layer, a first electron-transporting layer, a second electron-transporting layer, and an electron-injecting layer; having a first electron-transporting layer on the light-emitting layer of, having a second electron-transporting layer on the first electron-transporting layer, a side surface of the first light-emitting layer, a side surface of the first electron-transporting layer, and a side surface of the second electron-transporting layer, and an electron-injecting layer on the second electron-transporting layer, the first insulating layer being in contact with the first light-emitting layer
- the second light-emitting device is located between the side, the side of the first electron-transporting layer, the side of the second
- a second electrode is provided across the layer, and the second EL layer includes at least a second light-emitting layer, a third electron-transport layer, a fourth electron-transport layer, and an electron-injection layer. and having a third electron-transporting layer on the second light-emitting layer, a fourth electron-transporting layer on the third electron-transporting layer, and a side surface of the second light-emitting layer and a third electron-transporting layer a second insulating layer in contact with the sides of the layer, and an electron injection layer on the fourth electron-transporting layer, the second insulating layer contacting the sides of the second light-emitting layer and the third electron Positioned between the sides of the transport layer and the electron injection layer, the second electron transport layer and the fourth electron transport layer comprise a first heteroaromatic compound having at least one heteroaromatic ring; an organic compound different from one heteroaromatic compound, wherein the first electron-transporting layer and the third electron-transporting layer comprise a second heteroaromatic compound having at least one
- the organic compound preferably has at least one heteroaromatic ring.
- the heteroaromatic ring is preferably any one of a pyridine skeleton, a diazine skeleton, a triazine skeleton, and a polyazole skeleton.
- the heteroaromatic ring is preferably a condensed heteroaromatic ring having a condensed ring structure.
- the condensed heteroaromatic ring is any one of a quinoline ring, a benzoquinoline ring, a quinoxaline ring, a dibenzoquinoxaline ring, a quinazoline ring, a benzoquinazoline ring, a dibenzoquinazoline ring, a phenanthroline ring, a furodiazine ring, and a benzimidazole ring. or one.
- the electron injection layer includes the side surface of the first electron-transporting layer, the side surface of the second electron-transporting layer, the side surface of the third electron-transporting layer, and the side surface of the fourth electron-transporting layer. , the side surface of the first light-emitting layer and the side surface of the second light-emitting layer, and the second electrode.
- a light-emitting device having a layer containing an organic compound (for example, a cap layer) in contact with an electrode is also included in the scope of the present invention.
- light-emitting devices having transistors, substrates, and the like are also included in the scope of the invention.
- electronic devices and lighting devices having these light-emitting devices and any one of a detection unit, an input unit, a communication unit, and the like are also included in the scope of the invention.
- a light-emitting device in this specification refers to an image display device or a light source (including a lighting device).
- the light-emitting device may be a module in which a connector such as FPC (Flexible Printed Circuit) or TCP (Tape Carrier Package) is attached, a module in which a printed wiring board is provided at the end of the TCP, or a COG (Chip-On) to the light-emitting device. All modules in which an IC (integrated circuit) is directly mounted by the Glass method are included in the light-emitting device.
- the terms "source” and “drain” of a transistor are interchanged depending on the polarity of the transistor and the level of the potential applied to each terminal.
- a terminal to which a low potential is applied is called a source
- a terminal to which a high potential is applied is called a drain
- a terminal to which a high potential is applied is called a source.
- the connection relationship of transistors may be described on the assumption that the source and the drain are fixed. .
- the source of a transistor means a source region which is part of a semiconductor film functioning as an active layer, or a source electrode connected to the semiconductor film.
- the drain of a transistor means a drain region that is part of the semiconductor film or a drain electrode connected to the semiconductor film.
- a gate means a gate electrode.
- a state in which transistors are connected in series means, for example, a state in which only one of the source and drain of the first transistor is connected to only one of the source and drain of the second transistor. do.
- a state in which transistors are connected in parallel means that one of the source and drain of the first transistor is connected to one of the source and drain of the second transistor, and the other of the source and drain of the first transistor is connected to It means the state of being connected to the other of the source and the drain of the second transistor.
- connection means electrical connection, and corresponds to a state in which current, voltage or potential can be supplied or transmitted. Therefore, the state of being connected does not necessarily refer to the state of being directly connected, but rather a state of wiring, resistor, diode, transistor, etc., such that current, voltage or potential can be supplied or transmitted.
- a state of being indirectly connected via a circuit element is also included in this category.
- connection includes cases where one conductive film has the functions of a plurality of constituent elements.
- One embodiment of the present invention can provide a novel light-emitting device that is convenient, useful, or highly reliable. Further, one embodiment of the present invention can provide a novel light-emitting device that is highly convenient, useful, or highly reliable. Further, one embodiment of the present invention can provide a novel electronic device that is highly convenient, useful, or reliable. Further, one embodiment of the present invention can provide a novel lighting device with excellent convenience, usefulness, or reliability.
- One embodiment of the present invention can provide a light-emitting device with high heat resistance. Further, one embodiment of the present invention can provide a light-emitting device with high heat resistance in a manufacturing process. Alternatively, one embodiment of the present invention can provide a highly reliable light-emitting device. Alternatively, one embodiment of the present invention can provide a light-emitting device, a light-emitting device, an electronic device, a display device, and an electronic device with low power consumption. Alternatively, one embodiment of the present invention can provide a light-emitting device, a light-emitting device, an electronic device, a display device, and an electronic device with low power consumption and high reliability.
- 1A to 1C are diagrams illustrating the configuration of a light emitting device according to an embodiment.
- 2A and 2B are diagrams for explaining the configuration of the light emitting device according to the embodiment.
- 3A and 3B are diagrams illustrating the light emitting device according to the embodiment.
- 4A and 4B are diagrams for explaining the method for manufacturing the light emitting device according to the embodiment.
- 5A to 5C are diagrams for explaining the method for manufacturing the light emitting device according to the embodiment.
- 6A to 6C are diagrams for explaining the method for manufacturing the light emitting device according to the embodiment.
- 7A and 7B are diagrams for explaining the method for manufacturing the light emitting device according to the embodiment.
- FIG. 8 is a diagram for explaining a light emitting device according to an embodiment.
- 9A and 9B are diagrams illustrating the light emitting device according to the embodiment.
- 10A and 10B are diagrams for explaining the light emitting device according to the embodiment.
- 11A and 11B are diagrams illustrating the light emitting device according to the embodiment.
- 12A and 12B are diagrams illustrating the light emitting device according to the embodiment.
- 13A to 13E are diagrams illustrating electronic devices according to embodiments.
- 14A to 14E are diagrams illustrating electronic devices according to embodiments.
- 15A and 15B are diagrams for explaining the electronic device according to the embodiment.
- 16A and 16B are diagrams for explaining the electronic device according to the embodiment.
- 17A and 17B are diagrams illustrating an electronic device according to an embodiment;
- FIG. 18A to 18E are photographs according to Examples.
- 19A to 19D are photographs according to Examples.
- FIG. 20 is a diagram illustrating the configuration of a light-emitting device according to an example.
- FIG. 21 is a diagram showing luminance-current density characteristics of light-emitting device 1 and comparative light-emitting device 1.
- FIG. 22 is a diagram showing current efficiency-luminance characteristics of light-emitting device 1 and comparative light-emitting device 1.
- FIG. 23 is a diagram showing luminance-voltage characteristics of light-emitting device 1 and comparative light-emitting device 1.
- FIG. 24 is a diagram showing current-voltage characteristics of light-emitting device 1 and comparative light-emitting device 1.
- FIG. 25 is a diagram showing the external quantum efficiency-luminance characteristics of Light-Emitting Device 1 and Comparative Light-Emitting Device 1.
- FIG. FIG. 26 is a diagram showing emission spectra of Light-Emitting Device 1 and Comparative Light-Emitting Device 1.
- FIG. FIG. 27 is a diagram showing the reliability of light-emitting device 1 and comparativ
- FIG. 1A is a cross-sectional view illustrating the structure of a light-emitting device 100 according to one embodiment of the present invention.
- 1B and 1C are cross-sectional views illustrating a more specific structure of the light emitting device 100.
- FIG. 1A is a cross-sectional view illustrating the structure of a light-emitting device 100 according to one embodiment of the present invention.
- 1B and 1C are cross-sectional views illustrating a more specific structure of the light emitting device 100.
- FIG. 1A is a cross-sectional view illustrating the structure of a light-emitting device 100 according to one embodiment of the present invention.
- 1B and 1C are cross-sectional views illustrating a more specific structure of the light emitting device 100.
- FIG. 1A is a cross-sectional view illustrating the structure of a light-emitting device 100 according to one embodiment of the present invention.
- 1B and 1C are cross-sectional views illustrating a more specific structure of the light emit
- the light emitting device 100 has a first electrode 101 and a second electrode 102, and between the first electrode 101 and the second electrode 102 A hole injection/transport layer 104, a light emitting layer 113, a first electron transport layer 108-1, a second electron transport layer 108-2, and an electron injection layer 109 are stacked in this order.
- the second electron transport layer 108-2 includes a heteroaromatic compound having at least one heteroaromatic ring and an organic compound different from the heteroaromatic compound.
- the ratio of the heteroaromatic compound and the organic compound in the material constituting the second electron transport layer 108-2 is 10% or more, preferably 20% or more, and more preferably 30% or more. is preferable because the effect of improving the heat resistance appears remarkably.
- the organic compound preferably has at least one heteroaromatic ring.
- the second electron-transporting layer 108-2 has a heteroaromatic compound and an organic compound that are highly electron-transporting organic compounds, or a plurality of types of heteroaromatic compounds (preferably a mixed film).
- the heteroaromatic ring of the heteroaromatic compound is a condensed heteroaromatic ring
- thermophysical properties such as the glass transition temperature (Tg) are improved. Since it becomes difficult to form a perfect glassy state, there is a problem that crystallization tends to occur over time even at temperatures below Tg.
- Tg glass transition temperature
- crystallization of the heteroaromatic compound can be suppressed by using a structure including a plurality of types of heteroaromatic compounds. In other words, it is possible to prevent the film from crystallizing below Tg while improving the glass transition temperature.
- the heteroaromatic compound is a heteroaromatic compound that is included in organic compounds and has at least one heteroaromatic ring.
- a heteroaromatic ring has any one of a pyridine skeleton, a diazine skeleton, a triazine skeleton, or a polyazole skeleton.
- a heteroaromatic ring also includes a fused heteroaromatic ring having a fused ring structure.
- Condensed heteroaromatic rings include quinoline, benzoquinoline, quinoxaline, dibenzoquinoxaline, quinazoline, benzoquinazoline, dibenzoquinazoline, phenanthroline, furodiazine, and benzimidazole rings.
- the second electron-transporting layer 108-2 By configuring the second electron-transporting layer 108-2 to include a heteroaromatic compound and an organic compound, or a plurality of types of heteroaromatic compounds, compared to a configuration including a single material, It becomes possible to suppress crystallization during heating. Therefore, the heat resistance of the second electron transport layer 108-2 can be improved. Therefore, the second electron transport layer 108-2 has higher heat resistance than the first electron transport layer 108-1.
- the first electron-transporting layer 108-1 may be a layer using one type of heteroaromatic compound, a layer using a heteroaromatic compound and an organic compound, or a layer using a plurality of heteroaromatic compounds. A layer using a compound may be used.
- Electron-transporting materials such as heteroaromatic compounds and organic compounds that can be used for the first electron-transporting layer 108-1 and the second electron-transporting layer 108-2 will be described in more detail in later embodiments. to explain.
- the electron-transport layer preferably does not contain a metal complex.
- metal complexes mention may be made of alkaline earth metal complexes and alkali metal complexes, in particular alkali metal quinolinol complexes or alkaline earth metal quinolinol complexes.
- the electron injection layer 109 is part of the EL layer 103, but as shown in FIGS. -1, and the second electron-transporting layer 108-2).
- the high temperature in the manufacturing process causes problems such as crystallization of the other layers, resulting in deterioration of the reliability and brightness of the light-emitting device. may decrease.
- the temperature may rise after the second electron-transporting layer 108-2 with high heat resistance is formed. Decrease can be suppressed.
- the electron injection layer 109 is replaced by the other layers of the EL layer 103 (the hole injection/transport layer 104, the light emitting layer 113, the first electron transport layer 108-1 and the second electron transport layer 108-1). 2) can have a different shape.
- the electron injection layer 109 and the second electrode 102 can have the same shape. Since the electron injection layer 109 and the second electrode 102 can be layers common to a plurality of light emitting devices, the manufacturing process of the light emitting device 100 can be simplified and the throughput can be improved.
- the electron injection layer 109 is formed from the other layers of the EL layer 103 (the hole injection/transport layer 104, the light emitting layer 113, the first electron transport layer 108-1, and the second electron transport layer 108).
- the hole injection/transport layer 104 the hole injection/transport layer 104, the light emitting layer 113, the first electron transport layer 108-1, and the second electron transport layer 108.
- different shapes can be formed. That is, different shapes have different shapes in a plan view (top view).
- the same shape can be formed in a plan view (top view) by film formation or processing using the same mask.
- the edges (side surfaces) of the hole injection/transport layer 104, the light emitting layer 113, the first electron transport layer 108-1, and the second electron transport layer 108-2 have substantially the same surface (or the plan view (top view)).
- the end portion (side surface) of the electron injection layer 109 is the other layers of the EL layer 103 (the hole injection/transport layer 104, the light emitting layer 113, the first electron transport layer 108-1, and the second electron transport layer). 108-2) is not located substantially on the same plane as the end (side surface).
- the light emitting device 100 may also have an insulating layer 107, as shown in FIG. 1C.
- the insulating layer 107 is in contact with the side surface of the hole injection/transport layer 104, the side surface of the light emitting layer 113, the side surface of the first electron transport layer 108-1, and the side surface of the second electron transport layer 108-2.
- the insulating layer 107 includes the side surface of the hole injection/transport layer 104, the side surface of the light-emitting layer 113, the side surface of the first electron-transport layer 108-1, the side surface of the second electron-transport layer 108-2, and the electron injection layer. 109 and
- the second electrode 102 has the side surface of the hole injection/transport layer 104, the side surface of the light emitting layer 113, the side surface of the first electron transport layer 108-1, and the side surface of the second electron transport layer 108-1. 2, it may be possible to prevent conduction between the second electrode 102 and the hole injection/transport layer 104 . In addition, it may be possible to prevent conduction between the second electrode 102 and the first electrode 101 .
- various structures can be applied to the light emitting device 100 .
- a structure in which the electron injection layers 109 and the second electrodes 102 of the adjacent light emitting devices 100 are connected to each other can be employed.
- the second electrode 102 is the side surface of the hole injection/transport layer 104, the side surface of the light emitting layer 113, the side surface of the first electron transport layer 108-1, and the second electron transport layer 108-. 2, the light emitting device 100 may not have the insulating layer 107 in some cases. For example, if the conductivity between the second electrode 102 and the hole injection/transport layer 104 is sufficiently small, the light emitting device 100 may not have the insulating layer 107 . Also, if the conduction between the second electrode 102 and the first electrode 101 is sufficiently small, the light emitting device 100 may not have the insulating layer 107 .
- first electrode 101 Materials that can be used for the first electrode 101, the second electrode 102, the hole injection/transport layer 104, the light-emitting layer 113, the electron injection layer 109, and the insulating layer 107 will be described in a later embodiment.
- Embodiment 2 In this embodiment mode, a light-emitting device using the organic compound described in Embodiment Mode 1 will be described with reference to FIGS. 2A and 2B.
- the light-emitting device shown in FIGS. 2A and 2B has a structure (single structure) in which an EL layer is sandwiched between a pair of electrodes.
- First electrode and second electrode> As materials for forming the first electrode 101 and the second electrode 102, the following materials can be used in combination as appropriate, as long as the functions of the electrodes are satisfied. For example, metals, alloys, electrically conductive compounds, mixtures thereof, and the like can be used as appropriate. Specifically, In--Sn oxide (also referred to as ITO), In--Si--Sn oxide (also referred to as ITSO), In--Zn oxide, and In--W--Zn oxide are given.
- ITO In--Sn oxide
- ITSO In--Si--Sn oxide
- ITSO In--Zn oxide
- In--W--Zn oxide In--W--Zn oxide
- elements belonging to Group 1 or Group 2 of the periodic table of elements not exemplified above e.g., lithium (Li), cesium (Cs), calcium (Ca), strontium (Sr)), europium (Eu), ytterbium Rare earth metals such as (Yb), alloys containing an appropriate combination thereof, graphene, and the like can be used.
- the EL layer 103 is formed on the first electrode 101 by vacuum deposition.
- a hole-injection layer 111, a hole-transport layer 112, and a light-emitting layer are provided as the EL layer 103 between the first electrode 101 and the second electrode.
- an electron transport layer 114, and an electron injection layer 115 are sequentially laminated by a vacuum deposition method.
- the hole-injection layer 111 is a layer that injects holes from the first electrode 101, which is an anode, into the EL layer 103, and contains an organic acceptor material or a material with high hole-injection properties.
- the organic acceptor material has a LUMO (Lowest Unoccupied Molecular Orbital) level value and a HOMO (Highest Occupied Molecular Orbital) level value close to other organic compounds for charge separation. It is a material that can generate holes in the organic compound by causing the organic compound to generate holes. Accordingly, compounds having electron-withdrawing groups (halogen groups or cyano groups) such as quinodimethane derivatives, chloranil derivatives, and hexaazatriphenylene derivatives can be used as organic acceptor materials.
- halogen groups or cyano groups such as quinodimethane derivatives, chloranil derivatives, and hexaazatriphenylene derivatives can be used as organic acceptor materials.
- a compound in which an electron-withdrawing group is bound to a condensed aromatic ring having a plurality of heteroatoms such as HAT-CN, is particularly suitable because it has high acceptor properties and stable film quality against heat.
- [3] radialene derivatives having an electron-withdrawing group are preferred because of their extremely high electron-accepting properties, specifically ⁇ , ⁇ ', ⁇ '.
- Materials with high hole injection properties include oxides of metals belonging to groups 4 to 8 in the periodic table (molybdenum oxide, vanadium oxide, ruthenium oxide, tungsten oxide, manganese oxide, etc.). transition metal oxides, etc.) can be used. Specific examples include molybdenum oxide, vanadium oxide, niobium oxide, tantalum oxide, chromium oxide, tungsten oxide, manganese oxide, and rhenium oxide. Among the above, molybdenum oxide is preferred because it is stable in the atmosphere, has low hygroscopicity, and is easy to handle. In addition, phthalocyanine-based compounds such as phthalocyanine (abbreviation: H 2 Pc) and copper phthalocyanine (abbreviation: CuPc) can be used.
- H 2 Pc phthalocyanine
- CuPc copper phthalocyanine
- low-molecular-weight compounds such as 4,4′,4′′-tris(N,N-diphenylamino)triphenylamine (abbreviation: TDATA) and 4,4′,4′′-tris [N-(3-methylphenyl)-N-phenylamino]triphenylamine (abbreviation: MTDATA), 4,4′-bis[N-(4-diphenylaminophenyl)-N-phenylamino]biphenyl (abbreviation: DPAB), N,N'-bis ⁇ 4-[bis(3-methylphenyl)amino]phenyl ⁇ -N,N'-diphenyl-(1,1'-biphenyl)-4,4'-diamine (abbreviation: DNTPD), 1,3,5-tris[N-(4-diphenylaminophenyl)-N-phenylamino]benzene (abbreviation: DPA3B), 3-
- poly(N-vinylcarbazole) (abbreviation: PVK)
- poly(4-vinyltriphenylamine) (abbreviation: PVTPA)
- PVTPA poly(4-vinyltriphenylamine)
- PTPDMA poly[N-(4 - ⁇ N'-[4-(4-diphenylamino)phenyl]phenyl-N'-phenylamino ⁇ phenyl)methacrylamide]
- PTPDMA poly[N,N'-bis(4-butylphenyl)- N,N'-bis(phenyl)benzidine]
- Poly-TPD poly(N-vinylcarbazole) or the like
- poly (3,4-ethylenedioxythiophene) / poly (styrene sulfonic acid) (abbreviation: PEDOT / PSS), polyaniline / poly (styrene sulfonic acid) (abbreviation: PAni / PSS), etc.
- PEDOT / PSS poly(styrene sulfonic acid)
- PAni / PSS polyaniline / poly (styrene sulfonic acid)
- a composite material containing a hole-transporting material and the above-described organic acceptor material can also be used.
- electrons are extracted from the hole-transporting material by the organic acceptor material, holes are generated in the hole-injection layer 111 , and holes are injected into the light-emitting layer 113 via the hole-transporting layer 112 .
- the hole injection layer 111 may be formed of a single layer made of a composite material containing a hole-transporting material and an organic acceptor material (electron-accepting material). (electron-accepting material) may be laminated in separate layers.
- the hole-transporting material a substance having a hole mobility of 1 ⁇ 10 ⁇ 6 cm 2 /Vs or more at a square root of an electric field strength [V/cm] of 600 is preferable. Note that any substance other than these can be used as long as it has a higher hole-transport property than electron-transport property.
- hole-transporting materials include ⁇ -electron-rich heteroaromatic compounds (e.g., carbazole derivatives, furan derivatives, thiophene derivatives), aromatic amines (organic compounds having an aromatic amine skeleton), and other hole-transporting materials. High material is preferred.
- carbazole derivatives organic compounds having a carbazole skeleton
- examples of the carbazole derivatives include bicarbazole derivatives (eg, 3,3'-bicarbazole derivatives) and aromatic amines having a carbazolyl group.
- bicarbazole derivative for example, 3,3′-bicarbazole derivative
- PCCP 3,3′-bis(9-phenyl-9H-carbazole)
- BisBPCz 9,9 '-bis(biphenyl-4-yl)-3,3'-bi-9H-carbazole
- BismBPCz 9,9'-bis(1,1'-biphenyl-3-yl)-3,3' -bi-9H-carbazole
- BismBPCz 9-(1,1′-biphenyl-3-yl)-9′-(1,1′-biphenyl-4-yl)-9H,9′H-3 ,3′-bicarbazole
- mBPCCBP 9,2-naphthyl)-9′-phenyl-9H,9′H-3,3′-bicarbazole
- ⁇ NCCP 9-(2-naphthyl)-9′-phenyl-9H,9′H-3,3′-bicarbazol
- aromatic amine having a carbazolyl group examples include 4-phenyl-4′-(9-phenyl-9H-carbazol-3-yl)triphenylamine (abbreviation: PCBA1BP), N-( 4-biphenyl)-N-(9,9-dimethyl-9H-fluoren-2-yl)-9-phenyl-9H-carbazol-3-amine (abbreviation: PCBiF), N-(1,1'-biphenyl- 4-yl)-N-[4-(9-phenyl-9H-carbazol-3-yl)phenyl]-9,9-dimethyl-9H-fluorene-2-amine (abbreviation: PCBBiF), 4,4′- Diphenyl-4′′-(9-phenyl-9H-carbazol-3-yl)triphenylamine (abbreviation: PCBBi1BP), 4-(1-naphthyl)-4′-(9-phenyl-9H
- PCPPn 3-[4-(9-phenanthryl)-phenyl]-9-phenyl-9H-carbazole
- PCPN 3-[4-(1-naphthyl)- Phenyl]-9-phenyl-9H-carbazole
- mCP 1,3-bis(N-carbazolyl)benzene
- CBP 4,4′-di(N-carbazolyl)biphenyl
- CzTP 3,6-bis(3,5-diphenylphenyl)-9-phenylcarbazole
- TCPB 1,3,5-tris[4-(N-carbazolyl)phenyl]benzene
- TCPB 9 -[4-(10-phenyl-9-anthracenyl)phenyl]-9H-carbazole
- furan derivative organic compound having a furan skeleton
- DBF3P- II 4,4′,4′′-(benzene-1,3,5-triyl)tri(dibenzofuran)
- mmDBFFLBi-II 4- ⁇ 3-[3-(9-phenyl-9H-fluoren-9-yl)phenyl]phenyl ⁇ dibenzofuran
- thiophene derivative organic compound having a thiophene skeleton
- DBT3P 4,4′,4′′-(benzene-1,3,5-triyl)tri(dibenzothiophene)
- DBTFLP-III 2,8-diphenyl-4-[4-(9-phenyl-9H-fluoren-9-yl)phenyl]dibenzothiophene
- 4-[4-(9-phenyl- Examples thereof include organic compounds having a thiophene skeleton such as 9H-fluoren-9-yl)phenyl]-6-phenyldibenzothiophene (abbreviation: DBTFLP-IV).
- aromatic amine examples include 4,4′-bis[N-(1-naphthyl)-N-phenylamino]biphenyl (abbreviation: NPB or ⁇ -NPD), N,N′- Bis(3-methylphenyl)-N,N'-diphenyl-[1,1'-biphenyl]-4,4'-diamine (abbreviation: TPD), 4,4'-bis[N-(spiro-9, 9′-bifluoren-2-yl)-N-phenylamino]biphenyl (abbreviation: BSPB), 4-phenyl-4′-(9-phenylfluoren-9-yl)triphenylamine (abbreviation: BPAFLP), 4- Phenyl-3′-(9-phenylfluoren-9-yl)triphenylamine (abbreviation: mBPAFLP), N-(9,9-dimethyl-9H-fluoren-2
- poly(N-vinylcarbazole) (abbreviation: PVK) and poly(4-vinyltriphenylamine) (abbreviation: PVK), which are high molecular compounds (oligomers, dendrimers, polymers, etc.) PVTPA), poly[N-(4- ⁇ N'-[4-(4-diphenylamino)phenyl]phenyl-N'-phenylamino ⁇ phenyl)methacrylamide] (abbreviation: PTPDMA), poly[N,N' -Bis(4-butylphenyl)-N,N'-bis(phenyl)benzidine] (abbreviation: Poly-TPD) and the like can be used.
- PVK poly(N-vinylcarbazole)
- PVK poly(4-vinyltriphenylamine)
- PVTPA high molecular compounds (oligomers, dendrimers, polymers, etc.) PVTPA)
- PTPDMA
- poly (3,4-ethylenedioxythiophene) / poly (styrene sulfonic acid) (abbreviation: PEDOT / PSS), polyaniline / poly (styrene sulfonic acid) (abbreviation: PAni / PSS), etc.
- PEDOT / PSS poly(styrene sulfonic acid)
- PAni / PSS polyaniline / poly (styrene sulfonic acid)
- the hole-transporting material is not limited to the above, and one or a combination of various known materials may be used as the hole-transporting material.
- the hole injection layer 111 can be formed using various known film formation methods, and can be formed using, for example, a vacuum deposition method.
- the hole transport layer 112 is a layer that transports holes injected from the first electrode 101 to the light emitting layer 113 by the hole injection layer 111 .
- the hole-transport layer 112 is a layer containing a hole-transport material. Therefore, a hole-transporting material that can be used for the hole-injection layer 111 can be used for the hole-transporting layer 112 .
- the same organic compound as that for the hole-transport layer 112 can be used for the light-emitting layer 113 . It is more preferable to use the same organic compound for the hole-transport layer 112 and the light-emitting layer 113 because holes can be efficiently transported from the hole-transport layer 112 to the light-emitting layer 113 .
- the light-emitting layer 113 is a layer containing a light-emitting substance.
- a light-emitting substance that can be used for the light-emitting layer 113 a substance that emits light of blue, purple, blue-violet, green, yellow-green, yellow, orange, red, or the like can be used as appropriate.
- a structure in which different light-emitting substances are used for each light-emitting layer to exhibit different emission colors for example, white light emission obtained by combining complementary emission colors
- a laminated structure in which one light-emitting layer contains different light-emitting substances may be employed.
- the light-emitting layer 113 may contain one or more organic compounds (host material, etc.).
- the lowest singlet excitation energy level (S1 level) of the second host material is higher than the S1 level of the first host material
- the lowest triplet excitation energy level (T1 level) of the second host material is higher than the S1 level of the first host material. level) is preferably higher than the T1 level of the guest material.
- the lowest triplet excitation energy level (T1 level) of the second host material is preferably higher than the T1 level of the first host material.
- organic compounds used as the above host materials can be used for the hole-transport layer 112 as long as they satisfy the conditions for the host material used in the light-emitting layer. or an electron-transporting material that can be used in the electron-transporting layer 114, which will be described later. 2 host material).
- an exciplex also referred to as an exciplex, or an exciplex
- an exciplex in which multiple kinds of organic compounds form an excited state has an extremely small difference between the S1 level and the T1 level, and the triplet excitation energy is reduced to the singlet excitation energy. It has a function as a TADF material that can be converted into energy.
- an exciplex As a combination of a plurality of types of organic compounds that form an exciplex, for example, it is preferable that one has a ⁇ -electron-deficient heteroaromatic compound and the other has a ⁇ -electron-rich heteroaromatic compound.
- an organometallic complex based on iridium, rhodium, or platinum, or a phosphorescent substance such as a metal complex may be used as a combination forming an exciplex.
- a light-emitting substance that can be used for the light-emitting layer 113 is not particularly limited, and a light-emitting substance that converts singlet excitation energy into light emission in the visible light region or a light-emitting substance that converts triplet excitation energy into light emission in the visible light region can be used. can be done.
- Luminescent substances that convert singlet excitation energy into luminescence As a light-emitting substance that can be used for the light-emitting layer 113 and converts singlet excitation energy into light emission, the following substances that emit fluorescence (fluorescent light-emitting substances) can be given. Examples thereof include pyrene derivatives, anthracene derivatives, triphenylene derivatives, fluorene derivatives, carbazole derivatives, dibenzothiophene derivatives, dibenzofuran derivatives, dibenzoquinoxaline derivatives, quinoxaline derivatives, pyridine derivatives, pyrimidine derivatives, phenanthrene derivatives, naphthalene derivatives and the like.
- Pyrene derivatives are particularly preferred because they have a high emission quantum yield.
- Specific examples of pyrene derivatives include N,N'-bis(3-methylphenyl)-N,N'-bis-3[-(9-phenyl-9H-fluoren-9-yl)phenyl]pyrene-1,6 - diamine (abbreviation: 1,6mMemFLPAPrn), N,N'-diphenyl-N,N'-bis[4-(9-phenyl-9H-fluoren-9-yl)phenyl]pyrene-1,6-diamine (abbreviation: : 1,6FLPAPrn), N,N'-bis(dibenzofuran-2-yl)-N,N'-diphenylpyrene-1,6-diamine (abbreviation: 1,6FrAPrn), N,N'-bis(dibenzothiophene -2-yl)-N,N'-diphenylpyren
- N-[9,10-bis(1,1′-biphenyl-2-yl)-2-anthryl]-N,9-diphenyl-9H-carbazol-3-amine abbreviation: 2PCABPhA
- N-( 9,10-diphenyl-2-anthryl)-N,N',N'-triphenyl-1,4-phenylenediamine abbreviation: 2DPAPA
- N-[9,10-bis(1,1'-biphenyl- 2-yl)-2-anthryl]-N,N',N'-triphenyl-1,4-phenylenediamine abbreviation: 2DPABPhA
- 9,10-bis(1,1'-biphenyl-2-yl) -N-[4-(9H-carbazol-9-yl)phenyl]-N-phenylanthracen-2-amine abbreviation: 2YGABPhA
- N,N,9-triphenylanth abbre
- the light-emitting substance that converts triplet excitation energy into light emission includes, for example, a substance that emits phosphorescence (phosphorescent light-emitting substance), or a thermally activated delayed fluorescence that exhibits thermally activated delayed fluorescence. (Thermally activated delayed fluorescence: TADF) materials.
- a phosphorescent substance is a compound that exhibits phosphorescence and does not exhibit fluorescence in a temperature range from a low temperature to room temperature (that is, from 77 K to 313 K).
- the phosphorescent substance preferably contains a metal element having a large spin-orbit interaction, and examples thereof include organometallic complexes, metal complexes (platinum complexes), rare earth metal complexes, and the like.
- a transition metal element is preferable, and in particular, a platinum group element (ruthenium (Ru), rhodium (Rh), palladium (Pd), osmium (Os), iridium (Ir), or platinum (Pt)) may be included.
- iridium is preferable because the transition probability associated with the direct transition between the singlet ground state and the triplet excited state can be increased.
- phosphorescent substance (450 nm or more and 570 nm or less: blue or green)>>>>>> Examples of phosphorescent substances that exhibit blue or green color and have an emission spectrum with a peak wavelength of 450 nm or more and 570 nm or less include the following substances.
- Organometallic complexes having a triazole skeleton fac-tris[1-(2,6-diisopropylphenyl)-2-phenyl-1H-imidazole]iridium(III) (abbreviation: [Ir(iPrpmi) 3 ]), tris[3 -(2,6-dimethylphenyl)-7-methylimidazo[1,2-f]phenanthridinato]iridium(III) (abbreviation: [Ir(dmpimpt-Me) 3 ]) having an imidazole skeleton
- Organometallic complex bis[2-(4′,6′-difluorophenyl)pyridinato-N,C2 ′ ]iridium(III) tetrakis(1-pyrazolyl)borate (abbreviation: FIr6), bis[2-(4′) ,6′-difluorophenyl)pyridinato-N,C
- phosphorescent substance (495 nm or more and 590 nm or less: green or yellow)>>>>> Examples of phosphorescent substances that exhibit green or yellow color and have an emission spectrum with a peak wavelength of 495 nm or more and 590 nm or less include the following substances.
- tris(4-methyl-6-phenylpyrimidinato)iridium(III) (abbreviation: [Ir(mppm) 3 ]), tris(4-t-butyl-6-phenylpyrimidinato)iridium(III) (abbreviation: [Ir(tBuppm) 3 ]), (acetylacetonato)bis(6-methyl-4-phenylpyrimidinato)iridium (III) (abbreviation: [Ir(mppm) 2 (acac)]), ( acetylacetonato)bis(6-tert-butyl-4-phenylpyrimidinato)iridium(III) (abbreviation: [Ir(tBuppm) 2 (acac)]), (acetylacetonato)bis[6-(2- norbornyl)-4-phenylpyrimidinato]iridium(III) (abbreviation: [Ir(nbppm
- phosphorescent substance (570 nm or more and 750 nm or less: yellow or red)>>>>>> Examples of phosphorescent substances that exhibit yellow or red color and have an emission spectrum with a peak wavelength of 570 nm or more and 750 nm or less include the following substances.
- the TADF material has a small difference between the S1 level and the T1 level (preferably 0.2 eV or less), and the triplet excited state is up-converted to the singlet excited state by a small amount of thermal energy (reverse intersystem crossing). It is a material that efficiently emits light (fluorescence) from a singlet excited state.
- the energy difference between the triplet excitation energy level and the singlet excitation energy level is 0 eV or more and 0.2 eV or less, preferably 0 eV or more and 0.1 eV or less. Things are mentioned.
- delayed fluorescence in the TADF material refers to light emission having a spectrum similar to that of normal fluorescence and having a significantly long lifetime. Its lifetime is 1 ⁇ 10 ⁇ 6 seconds or more, preferably 1 ⁇ 10 ⁇ 3 seconds or more.
- TADF materials include, for example, fullerenes and their derivatives, and acridine derivatives such as proflavin and eosin.
- metal-containing porphyrins containing magnesium (Mg), zinc (Zn), cadmium (Cd), tin (Sn), platinum (Pt), indium (In), or palladium (Pd).
- metal-containing porphyrins include protoporphyrin-tin fluoride complex (abbreviation: SnF2 (Proto IX)), mesoporphyrin-tin fluoride complex (abbreviation: SnF2 (Meso IX)), and hematoporphyrin-tin fluoride.
- a substance in which a ⁇ -electron-rich heteroaromatic compound and a ⁇ -electron-deficient heteroaromatic compound are directly bonded has the donor property of the ⁇ -electron-rich heteroaromatic compound and the acceptor property of the ⁇ -electron-deficient heteroaromatic compound. becomes strong, and the energy difference between the singlet excited state and the triplet excited state becomes small, which is particularly preferable.
- materials having a function of converting triplet excitation energy into light emission include nanostructures of transition metal compounds having a perovskite structure. Nanostructures of metal halide perovskites are particularly preferred. Nanoparticles and nanorods are preferred as the nanostructures.
- the organic compound (host material, etc.) used in combination with the above-described light-emitting substance (guest material) one or more substances having an energy gap larger than that of the light-emitting substance (guest material) are selected. and use it.
- an organic compound (host material) to be combined has a high singlet excited energy level and a low triplet excited energy level, or an organic compound having a low triplet excited energy level. It is preferable to use organic compounds with high quantum yields. Therefore, a hole-transporting material (described above), an electron-transporting material (described later), or the like described in this embodiment can be used as long as the organic compound satisfies such conditions.
- the organic compounds (host materials) include anthracene derivatives, tetracene derivatives, phenanthrene derivatives, pyrene derivatives, chrysene derivatives, condensed polycyclic aromatic compounds such as dibenzo[g,p]chrysene derivatives;
- a specific example of an organic compound (host material) that is preferably used in combination with a fluorescent light-emitting substance is 9-phenyl-3-[4-(10-phenyl-9-anthryl)phenyl]-9H-carbazole (abbreviation : PCzPA), 3,6-diphenyl-9-[4-(10-phenyl-9-anthryl)phenyl]-9H-carbazole (abbreviation: DPCzPA), 3-[4-(1-naphthyl)-phenyl]- 9-phenyl-9H-carbazole (abbreviation: PCPN), 9,10-diphenylanthracene (abbreviation: DPAnth), N,N-diphenyl-9-[4-(10-phenyl-9-anthryl)phenyl]-9H- Carbazol-3-amine (abbreviation: CzA1PA), 4-(10-phenyl-9-anthryl)triphenylamine (abbre
- the organic compound (host material) to be combined with the triplet excitation energy (the energy difference between the ground state and the triplet excited state) is higher than the triplet excitation energy of the light-emitting substance.
- An organic compound with high excitation energy should be selected. Note that when a plurality of organic compounds (for example, a first host material, a second host material (also referred to as an assist material), or the like) are used in combination with a light-emitting substance to form an exciplex, these plurality of organic compounds It is preferable to use an organic compound mixed with a phosphorescent substance.
- ExTET Extra Transmitter-Triplet Energy Transfer
- a compound that easily forms an exciplex is preferable, and a compound that easily accepts holes (hole-transporting material) and a compound that easily accepts electrons (electron-transporting material) are combined. is particularly preferred.
- aromatic amines and carbazole derivatives which are highly hole-transporting organic compounds, include the same specific examples as the hole-transporting materials described above. All of these are preferable as host materials.
- dibenzothiophene derivatives and dibenzofuran derivatives which are highly hole-transporting organic compounds, include 4- ⁇ 3-[3-(9-phenyl-9H-fluorene- 9-yl)phenyl]phenyl ⁇ dibenzofuran (abbreviation: mmDBFFLBi-II), 4,4′,4′′-(benzene-1,3,5-triyl)tri(dibenzofuran) (abbreviation: DBF3P-II), DBT3P -II, 2,8-diphenyl-4-[4-(9-phenyl-9H-fluoren-9-yl)phenyl]dibenzothiophene (abbreviation: DBTFLP-III), 4-[4-(9-phenyl-9H) -fluoren-9-yl)phenyl]-6-phenyldibenzothiophene (abbreviation: DBTFLP-IV), 4-[4-(9-phenyl-9
- organic compounds having high electron transport properties such as oxadiazole derivatives, triazole derivatives, benzimidazole derivatives, quinoxaline derivatives, dibenzoquinoxaline derivatives, quinazoline derivatives, and phenanthroline derivatives
- PBD 2-(4-biphenylyl)-5-(4-tert-butylphenyl)-1,3,4-oxadiazole
- OXD-7 1,3-bis[5-(p-tert-butylphenyl) -1,3,4-oxadiazol-2-yl]benzene
- OXD-7 9-[4-(5-phenyl-1,3,4-oxadiazol-2-yl)phenyl] -9H-carbazole
- CO11 3-(4-biphenylyl)-4-phenyl-5-(4-tert-butylphenyl)-1,2,4-trione
- pyridine derivatives examples include 4, 6 -bis[3-(phenanthren-9-yl)phenyl]pyrimidine (abbreviation: 4,6mPnP2Pm), 4,6-bis[3-(4-dibenzothienyl)phenyl]pyrimidine (abbreviation: 4,6mDBTP2Pm-II), 4,6-bis[3-(9H-carbazol-9-yl)phenyl]pyrimidine (abbreviation: 4,6mCzP2Pm), 2- ⁇ 4-[3-(N-phenyl-9H-carbazol-3-yl)- 9H-carbazol-9-yl]phenyl ⁇ -4,6-diphenyl-1,
- the metal complex which is an organic compound having a high electron transport property
- a specific example of the metal complex is a zinc- or aluminum-based metal complex, tris(8-quinolinolato)aluminum (III) (abbreviation : Alq), tris(4-methyl-8-quinolinolato)aluminum( III ) (abbreviation: Almq3), bis(10-hydroxybenzo[h]quinolinato)beryllium(II) (abbreviation: BeBq2), bis( 2 -methyl-8-quinolinolato)(4-phenylphenolato)aluminum(III) (abbreviation: BAlq), bis(8-quinolinolato)zinc(II) (abbreviation: Znq), and also having a quinoline skeleton or a benzoquinoline skeleton Metal complexes and the like can be mentioned, and all of these are preferable as the host material.
- poly(2,5-pyridinediyl) (abbreviation: PPy), poly[(9,9-dihexylfluorene-2,7-diyl)-co-(pyridine-3,5-diyl)] (abbreviation: PF) -Py), poly[(9,9-dioctylfluorene-2,7-diyl)-co-(2,2′-bipyridine-6,6′-diyl)] (abbreviation: PF-BPy) Molecular compounds and the like are also preferred as host materials.
- PPy poly[(9,9-dihexylfluorene-2,7-diyl)-co-(pyridine-3,5-diyl)]
- PF-BPy poly[(9,9-dioctylfluorene-2,7-diyl)-co-(2,2′-bipyridine-6,6′-diy
- bipolar 9-phenyl-9′-(4-phenyl-2-quinazolinyl)-3,3′-bipolar organic compound which is an organic compound having a high hole-transporting property and a high electron-transporting property, -9H-carbazole (abbreviation: PCCzQz), 2-[4'-(9-phenyl-9H-carbazol-3-yl)-3,1'-biphenyl-1-yl]dibenzo[f,h]quinoxaline (abbreviation: 2mpPCBPDBq), 5-[3-(4,6-diphenyl-1,3,5-triazin-2-yl)phenyl]-7,7-dimethyl-5H,7H-indeno[2,1-b ]carbazole (abbreviation: mINc(II)PTzn), 11-(4-[1,1′-niphenyl]-4-yl-6-phenyl-1,3,5-triazin-2
- the electron transport layer 114 is a layer that transports electrons injected from the second electrode 102 by an electron injection layer 115 to be described later to the light emitting layer 113 .
- the electron-transporting layer 114 is a layer containing an electron-transporting material.
- the electron-transporting material used for the electron-transporting layer 114 preferably has an electron mobility of 1 ⁇ 10 ⁇ 6 cm 2 /Vs or more at a square root of 600 of the electric field intensity [V/cm]. Note that any substance other than these substances can be used as long as it has a higher electron-transport property than hole-transport property.
- the electron-transport layer 114 functions as a single layer, it preferably has a layered structure of two or more layers in one embodiment of the present invention. Note that when the electron-transporting layer 114 has a stacked-layer structure, an electron-transporting layer containing a heteroaromatic compound and an organic compound, or a plurality of types of heteroaromatic compounds (preferably a mixed film) as described in Embodiment 1. Since the layer has higher heat resistance than an electron-transporting layer having other structures, a photolithography process is performed on an electron-transporting layer containing a heteroaromatic compound and an organic compound, or a plurality of kinds of heteroaromatic compounds. Therefore, the influence of the heat process on the device characteristics can be suppressed.
- a heteroaromatic compound which is an organic compound having a high electron-transporting property
- a heteroaromatic compound is a cyclic compound containing at least two different elements in the ring.
- the ring structure includes a 3-membered ring, a 4-membered ring, a 5-membered ring, a 6-membered ring, etc., and a 5-membered ring or a 6-membered ring is particularly preferable.
- Heteroaromatic compounds containing any one or more of nitrogen, oxygen, or sulfur are preferred.
- nitrogen-containing heteroaromatic compounds nitrogen-containing heteroaromatic compounds
- materials with high electron transport properties such as nitrogen-containing heteroaromatic compounds or ⁇ -electron deficient heteroaromatic compounds containing these (electron transport properties material) is preferably used.
- the heteroaromatic compound is a heteroaromatic compound that is included in organic compounds and has at least one heteroaromatic ring.
- a heteroaromatic ring has any one of a pyridine skeleton, a diazine skeleton, a triazine skeleton, or a polyazole skeleton.
- the heteroaromatic ring includes a condensed heteroaromatic ring having a condensed ring structure.
- Condensed heteroaromatic rings include quinoline ring, benzoquinoline ring, quinoxaline ring, dibenzoquinoxaline ring, quinazoline ring, benzoquinazoline ring, dibenzoquinazoline ring, phenanthroline ring, flodiazine ring, and benzimidazole ring.
- heteroaromatic compounds having a five-membered ring structure include: Examples include organic compounds having an imidazole skeleton, organic compounds having a triazole skeleton, organic compounds having an oxazole skeleton, organic compounds having an oxadiazole skeleton, organic compounds having a thiazole skeleton, and organic compounds having a benzimidazole skeleton.
- heteroaromatic compounds having a 6-membered ring structure include a pyridine skeleton, a diazine skeleton (pyrimidine skeletons, pyrazine skeletons, pyridazine skeletons, etc.), triazine skeletons, organic compounds having heteroaromatic rings such as polyazole skeletons, and the like.
- organic compounds having a structure in which pyridine skeletons are linked organic compounds having a bipyridine structure, organic compounds having a terpyridine structure, and the like are included.
- heteroaromatic compounds having a condensed ring structure partially including the six-membered ring structure include a quinoline ring, a benzoquinoline ring, a quinoxaline ring, a dibenzoquinoxaline ring, a phenanthroline ring, and a (including a skeleton in which aromatic rings are condensed), organic compounds having a condensed heteroaromatic ring such as a benzimidazole ring, and the like.
- heteroaromatic compound having a five-membered ring structure examples include 2-(4-biphenylyl)-5 -(4-tert-butylphenyl)-1,3,4-oxadiazole (abbreviation: PBD), 1,3-bis[5-(p-tert-butylphenyl)-1,3,4-oxadiazole Azole-2-yl]benzene (abbreviation: OXD-7), 9-[4-(5-phenyl-1,3,4-oxadiazol-2-yl)phenyl]-9H-carbazole (abbreviation: CO11) , 3-(4-biphenylyl)-4-phenyl-5-(4-tert-butylphenyl)-1,
- heteroaromatic compound having a six-membered ring structure examples include 4,6-bis [3-(phenanthren-9-yl)phenyl]pyrimidine (abbreviation: 4,6mPnP2Pm), 4,6-bis[3-(4-dibenzothienyl)phenyl]pyrimidine (abbreviation: 4,6mDBTP2Pm-II), 4, 6-bis[3-(9H-carbazol-9-yl)phenyl]pyrimidine (abbreviation: 4,6mCzP2Pm), 2- ⁇ 4-[3-(N-phenyl-9H-carbazol-3-yl)-9H- Carbazol-9-yl]phenyl ⁇ -4,6-diphen
- 2,2′-(pyridine-2,6-diyl)bis(4-phenylbenzo[h]quinazoline) (abbreviation: 2,6(P-Bqn)2Py)
- 2,2′-(pyridine -2,6-diyl)bis ⁇ 4-[4-(2-naphthyl)phenyl]-6-phenylpyrimidine ⁇ (abbreviation: 2,6(NP-PPm)2Py), 6-(1,1'-biphenyl -3-yl)-4-[3,5-bis(9H-carbazol-9-yl)phenyl]-2-phenylpyrimidine (abbreviation: 6mBP-4Cz2PPm)
- 2,4,6-tris(3′-( Pyridin-3-yl)biphenyl-3-yl)-1,3,5-triazine (abbreviation: TmPPPyTz), 2,4,6-tris(2-pyridyl)-1,3,
- heteroaromatic compounds having a condensed ring structure partially including a six-membered ring structure include bathophenanthroline (abbreviation: Bphen), bathocuproine (abbreviation: BCP), 2,9-bis(naphthalene-2 -yl)-4,7-diphenyl-1,10-phenanthroline (abbreviation: NBphen), 2,2-(1,3-phenylene)bis[9-phenyl-1,10-phenanthroline] (abbreviation: mPPhen2P), 2-[3-(dibenzothiophen-4-yl)phenyl]dibenzo[f,h]quinoxaline (abbreviation: 2mDBTPDBq-II), 2-[3′-(dibenzothiophen-4-yl)biphenyl-3-yl] Dibenzo[f,h]quinoxaline (abbreviation: 2mDBTBPDBq-II), 2-[3′-(9
- the following metal complexes can be used for the electron transport layer.
- tris(8-quinolinolato) aluminum ( III ) (abbreviation: Alq3), Almq3 , 8-quinolinolato-lithium (I) (abbreviation: Liq), BeBq2, bis( 2 -methyl-8-quinolinolato)(4- phenylphenolato)aluminum (III) (abbreviation: BAlq), bis(8-quinolinolato)zinc (II) (abbreviation: Znq) and other metal complexes having a quinoline skeleton or benzoquinoline skeleton, bis[2-(2-benzo oxazolyl)phenolato]zinc(II) (abbreviation: ZnPBO), bis[2-(2-benzothiazolyl)phenolato]zinc(II) (abbreviation: ZnBTZ), and the like metal complexes
- poly(2,5-pyridinediyl) (abbreviation: PPy), poly[(9,9-dihexylfluorene-2,7-diyl)-co-(pyridine-3,5-diyl)] (abbreviation: PF -Py), poly[(9,9-dioctylfluorene-2,7-diyl)-co-(2,2′-bipyridine-6,6′-diyl)] (abbreviation: PF-BPy)
- PPy poly[(9,9-dihexylfluorene-2,7-diyl)-co-(pyridine-3,5-diyl)]
- PF -BPy poly[(9,9-dioctylfluorene-2,7-diyl)-co-(2,2′-bipyridine-6,6′-diyl)]
- the electron injection layer 115 is a layer containing a substance with high electron injection properties. Further, the electron injection layer 115 is a layer for increasing the injection efficiency of electrons from the second electrode 102, and the value of the work function of the material used for the second electrode 102 and the It is preferable to use a material with a small difference (0.5 eV or less) when compared with the value of the LUMO level.
- the electron injection layer 115 includes lithium, cesium, lithium fluoride (LiF), cesium fluoride (CsF), calcium fluoride (CaF 2 ), 8-(quinolinolato)lithium (abbreviation: Liq), 2-( 2-pyridyl)phenoratritium (abbreviation: LiPP), 2-(2-pyridyl)-3-pyridinolatritium (abbreviation: LiPPy), 4-phenyl-2-(2-pyridyl)phenoratritium (abbreviation: LiPPP) ), lithium oxide (LiO x ), alkali metals such as cesium carbonate, alkaline earth metals, or compounds thereof.
- Liq lithium, cesium, lithium fluoride
- CsF cesium fluoride
- CaF 2 calcium fluoride
- Liq 8-(quinolinolato)lithium
- LiPP 2-( 2-pyridyl)phenoratritium
- LiPPy 2-(2-pyr
- rare earth metal compounds such as erbium fluoride (ErF 3 ) and ytterbium (Yb) can be used.
- Electride may also be used for the electron injection layer 115 . Examples of the electride include a mixed oxide of calcium and aluminum to which electrons are added at a high concentration. Note that the above-described substances forming the electron-transporting layer 114 can also be used.
- a composite material obtained by mixing an organic compound and an electron donor (donor) may be used for the electron injection layer 115 .
- Such a composite material has excellent electron-injecting and electron-transporting properties because electrons are generated in the organic compound by the electron donor.
- the organic compound is preferably a material that is excellent in transporting the generated electrons.
- the electron donor any substance can be used as long as it exhibits an electron donating property with respect to an organic compound.
- alkali metals, alkaline earth metals, or rare earth metals are preferred, and examples include lithium, cesium, magnesium, calcium, erbium, ytterbium, and the like.
- alkali metal oxides or alkaline earth metal oxides are preferred, and examples thereof include lithium oxide, calcium oxide, barium oxide and the like.
- Lewis bases such as magnesium oxide can also be used.
- An organic compound such as tetrathiafulvalene (abbreviation: TTF) can also be used. Also, a plurality of these materials may be laminated and used.
- a composite material obtained by mixing an organic compound and a metal may be used for the electron injection layer 115 .
- the organic compound used here preferably has a LUMO level of -3.6 eV to -2.3 eV. Also, a material having a lone pair of electrons is preferred.
- a composite material obtained by mixing a heteroaromatic compound with a metal which can be used for the electron transport layer
- heteroaromatic compounds include heteroaromatic compounds having a 5-membered ring structure (imidazole skeleton, triazole skeleton, oxazole skeleton, oxadiazole skeleton, thiazole skeleton, benzimidazole skeleton, etc.), 6-membered ring structures (pyridine skeleton, diazine Heteroaromatic compounds having skeletons (including pyrimidine skeletons, pyrazine skeletons, pyridazine skeletons, etc.), triazine skeletons, bipyridine skeletons, terpyridine skeletons, etc.); A material having a lone pair of electrons, such as a heteroaromatic compound having a skeleton, a quinoxaline
- the metal used for the composite material it is preferable to use a transition metal belonging to Group 5, 7, 9 or 11 in the periodic table, or a material belonging to Group 13. For example, Ag, Cu, Al, In, or the like. Also, at this time, the organic compound forms a singly occupied molecular orbital (SOMO) with the transition metal.
- SOMO singly occupied molecular orbital
- the light-emitting device described in this embodiment can be formed over various substrates.
- the type of substrate is not limited to a specific one.
- substrates include semiconductor substrates (e.g. single crystal substrates or silicon substrates), SOI substrates, glass substrates, quartz substrates, plastic substrates, metal substrates, stainless steel substrates, substrates with stainless steel foil, tungsten substrates, Substrates with tungsten foils, flexible substrates, laminated films, papers containing fibrous materials, or substrate films may be mentioned.
- glass substrates include barium borosilicate glass, aluminoborosilicate glass, soda lime glass, and the like.
- flexible substrates, laminated films, base films, etc. include plastics such as polyethylene terephthalate (PET), polyethylene naphthalate (PEN), and polyether sulfone (PES), synthesis of acrylic and the like.
- PET polyethylene terephthalate
- PEN polyethylene naphthalate
- PES polyether sulfone
- acrylic and the like examples include resin, polypropylene, polyester, polyvinyl fluoride, polyvinyl chloride, polyamide, polyimide, aramid, epoxy, inorganic deposition film, and paper.
- a vacuum process such as an evaporation method, a spin coating method, or a solution process such as an inkjet method can be used for manufacturing the light-emitting device described in this embodiment.
- a physical vapor deposition method PVD method
- a sputtering method such as a sputtering method, an ion plating method, an ion beam vapor deposition method, a molecular beam vapor deposition method, or a vacuum vapor deposition method, or a chemical vapor deposition method (CVD method).
- PVD method physical vapor deposition method
- CVD method chemical vapor deposition method
- layers having various functions included in the EL layer of a light emitting device are formed by a vapor deposition method (vacuum vapor deposition). method, etc.), coating method (dip coating method, die coating method, bar coating method, spin coating method, spray coating method, etc.), printing method (inkjet method, screen (stencil printing) method, offset (lithographic printing) method, flexo ( It can be formed by a method such as a letterpress printing method, a gravure method, a microcontact method, or the like.
- a vapor deposition method vacuum vapor deposition). method, etc.
- coating method dip coating method, die coating method, bar coating method, spin coating method, spray coating method, etc.
- printing method inkjet method, screen (stencil printing) method, offset (lithographic printing) method, flexo
- It can be formed by a method such as a letterpress printing method, a gravure method, a microcontact method, or the like.
- high molecular compounds oligomers, dendrimers, polymers, etc.
- middle molecular compounds compounds in the intermediate region between low molecular weight and high molecular weight: molecular weight 400 to 4000
- inorganic compounds such as quantum dot materials
- quantum dot material a colloidal quantum dot material, an alloy quantum dot material, a core-shell quantum dot material, a core quantum dot material, or the like can be used.
- Each layer (the hole-injection layer 111, the hole-transport layer 112, the light-emitting layer 113, the electron-transport layer 114, and the electron-injection layer 115) constituting the EL layer 103 of the light-emitting device described in this embodiment is
- the materials are not limited to those shown, and other materials can be used in combination as long as they can satisfy the functions of each layer.
- the light-emitting device 700 shown in FIG. 3A has a light-emitting device 550B, a light-emitting device 550G, a light-emitting device 550R, and a partition 528. Also, the light emitting device 550B, the light emitting device 550G, the light emitting device 550R, and the partition wall 528 are formed on the functional layer 520 provided on the first substrate 510.
- the functional layer 520 includes a driving circuit GD, a driving circuit SD, and the like, which are configured by a plurality of transistors, as well as wiring for electrically connecting them.
- the drive circuits are electrically connected to, for example, the light emitting device 550B, the light emitting device 550G, and the light emitting device 550R, respectively, and can drive them.
- the light-emitting device 700 also includes an insulating layer 705 on the functional layer 520 and each light-emitting device, and the insulating layer 705 has a function of bonding the second substrate 770 and the functional layer 520 together. Further, the drive circuit GD and the drive circuit SD will be described later in a fourth embodiment.
- Light-emitting device 550B, light-emitting device 550G, and light-emitting device 550R have the device structure shown in the second embodiment. That is, it shows the case where the EL layer 103 in the structure shown in FIG. 2A is different for each light-emitting device.
- the light-emitting device of each color (e.g., blue (B), green (G), and red (R)) is referred to as SBS (Side-By-By). Side) structure.
- SBS Side-By-By. Side
- the light-emitting device 550B, the light-emitting device 550G, and the light-emitting device 550R are arranged in this order in the light-emitting device 700 illustrated in FIG. 3A, one embodiment of the present invention is not limited to this structure.
- these light-emitting devices may be arranged in order of light-emitting device 550B, light-emitting device 550R, and light-emitting device 550G.
- light emitting device 550B has electrode 551B, electrode 552, and EL layer 103B.
- a specific configuration of each layer is as shown in the second embodiment.
- the EL layer 103B has a layered structure including a plurality of layers having different functions including the light-emitting layer.
- the hole injection/transport layer 104B, the first electron-transport layer 108B-1, the second electron-transport layer 108B-2, and the electron-injection layer 109 but the present invention is not limited to this.
- the hole injection/transport layer 104B is a layer having the functions of the hole injection layer and the hole transport layer described in Embodiment Mode 2, and may have a laminated structure. In this specification, it is assumed that the hole injection/transport layer can be read in this manner in any light-emitting device.
- the electron-transporting layer has a laminated structure including at least a first electron-transporting layer 108B-1 and a second electron-transporting layer 108B-2.
- a transport layer 108B-1 is used, and an electron transport layer in contact with the electron injection layer 109 is a second electron transport layer 108B-2.
- the second electron-transporting layer 108B-2 is a layer (preferably a mixed film) using a heteroaromatic compound and an organic compound, or a plurality of types of heteroaromatic compounds, as described in Embodiment 1. layer).
- the second electron-transporting layer 108B-2 may be formed using an electron-transporting material. It may be a layer containing a heteroaromatic compound or a plurality of types of heteroaromatic compounds.
- the first electron transport layer 108B-1 may have a function of blocking holes that move from the anode side to the cathode side through the light-emitting layer. Further, the electron injection layer 109 may also have a layered structure in which a part or all of it is formed using different materials.
- An insulating layer 107 may be formed on the side surface (or end) of 108-2. Note that when the insulating layer 107 is added to the light-emitting device configuration of FIG. 1, forming up to the second electron transport layer 108B-2), the insulating layer 107 is formed while leaving the sacrificial layer formed thereon, and then the sacrificial layer is removed. Therefore, the insulating layer 107B is formed in contact with the side surface (or end) of a portion (above) of the EL layer 103B.
- the insulating layer 107B aluminum oxide, magnesium oxide, hafnium oxide, gallium oxide, indium gallium zinc oxide, silicon nitride, or silicon nitride oxide can be used for the insulating layer 107B, for example.
- a sputtering method, a CVD method, an MBE method, a PLD method, an ALD method, or the like can be used to form the insulating layer 107B, but the ALD method, which has good coverage, is more preferable.
- part of the EL layer 103B (including the light-emitting layer, the hole injection/transport layer 104B, the first electron-transport layer 108B-1, and the second electron-transport layer 108B-2) (however, the insulating layer 107B is formed) If it is, "part of the EL layer 103B (including the light-emitting layer, the hole injection/transport layer 104B, the first electron-transport layer 108B-1, and the second electron-transport layer 108B-2) and the insulating layer 107B''), an electron injection layer 109 is formed.
- the electron injection layer 109 may have a laminated structure of two or more layers having different electric resistances among the layers.
- a first layer in contact with the second electron-transporting layer 108B-2 is formed using only an electron-transporting material, and a second layer is formed thereon using an electron-transporting material containing a metal material.
- a third layer formed of an electron-transporting material containing a metal material may be provided between the first layer and the second electron-transporting layer 108B-2.
- an electrode 552 is formed on the electron injection layer 109 .
- the electrode 551B and the electrode 552 have regions that overlap with each other.
- An EL layer 103B is provided between the electrode 551B and the electrode 552.
- FIG. Therefore, the electrode 552 is part of the EL layer 103B (including the light-emitting layer, the hole injection/transport layer 104B, the first electron transport layer 108B-1 and the second electron transport layer 108B-) through the electron injection layer 109. 2) has a structure in contact with the side surface (or end).
- part of the EL layer 103B (including the light-emitting layer, the hole-injection/transport layer 104B, the first electron-transport layer 108B-1, and the second electron-transport layer 108B-2) and the electrode 552, more specifically, Therefore, electrical short-circuiting between the hole-injecting/transporting layer 104B and the electrode 552 in the EL layer 103B can be prevented.
- the EL layer 103B shown in FIG. 3A has a structure similar to that of the EL layer 103 described in the second embodiment. Further, the EL layer 103B can emit blue light, for example.
- light emitting device 550G has electrode 551G, electrode 552, and EL layer 103G.
- a specific configuration of each layer is as shown in the second embodiment.
- the EL layer 103G has a laminated structure including a plurality of layers with different functions including the light-emitting layer.
- the hole injection/transport layer 104G among the layers included in the EL layer 103G including the light emitting layer, the hole injection/transport layer 104G, the first electron transport layer 108G-1, the second electron transport layer 108G-2, and the electron injection layer 109 , but the present invention is not limited to this.
- the hole injection/transport layer 104G is a layer having the functions of the hole injection layer and the hole transport layer described in Embodiment 2, and may have a laminated structure.
- the electron-transporting layer has a laminated structure including at least a first electron-transporting layer 108G-1 and a second electron-transporting layer 108G-2.
- An electron transport layer in contact with the transport layer 108G-1 and the electron injection layer 109 is referred to as a second electron transport layer 108G-2.
- the second electron-transporting layer 108G-2 is a layer (preferably a mixed film) using a heteroaromatic compound and an organic compound, or a plurality of types of heteroaromatic compounds, as described in Embodiment 1. layer).
- the second electron-transporting layer 108G-2 may be formed using an electron-transporting material.
- the first electron transport layer 108G-1 may have a function of blocking holes that move from the anode side to the cathode side through the light-emitting layer. Further, the electron injection layer 109 may also have a layered structure in which a part or all of it is formed using different materials.
- An insulating layer 107 may be formed on the side (or end) of -2. Note that when the insulating layer 107 is added to the light-emitting device configuration of FIG. 1, the insulating layer 107 is formed while leaving the sacrificial layer formed on the second electron transport layer 108G-2), and then the sacrificial layer is removed.
- the insulating layer 107G is formed in contact with the side surface (or end) of a portion (above) of the EL layer 103G. As a result, it is possible to suppress entry of oxygen, moisture, or constituent elements thereof from the side surface of the EL layer 103G into the inside.
- aluminum oxide, magnesium oxide, hafnium oxide, gallium oxide, indium gallium zinc oxide, silicon nitride, or silicon nitride oxide can be used for the insulating layer 107G, for example.
- a sputtering method, a CVD method, an MBE method, a PLD method, an ALD method, or the like can be used to form the insulating layer 107G, but the ALD method, which has good coverage, is more preferable.
- an electron injection layer 109 is formed.
- the electron injection layer 109 may have a laminated structure of two or more layers having different electric resistances among the layers.
- the first layer in contact with the second electron-transporting layer 108G-2 is formed using only an electron-transporting material, and the second layer is formed thereon using an electron-transporting material containing a metal material.
- a third layer formed of an electron-transporting material containing a metal material may be provided between the first layer and the second electron-transporting layer 108G-2.
- an electrode 552 is formed on the electron injection layer 109 .
- the electrode 551G and the electrode 552 have regions that overlap each other.
- an EL layer 103G is provided between the electrode 551G and the electrode 552.
- the electrode 552 is part of the EL layer 103G (including the light emitting layer, the hole injection/transport layer 104G, the first electron transport layer 108G-1, and the second electron transport layer 108G) through the electron injection layer 109. -2) has a structure in contact with the side surface (or end).
- part of the EL layer 103G (including the light-emitting layer, the hole-injection/transport layer 104G, the first electron-transport layer 108G-1, and the second electron-transport layer 108G-2) and the electrode 552, more specifically, Therefore, the hole-injection/transport layer 104G and the electrode 552 included in the EL layer 103G can be prevented from being electrically short-circuited.
- An EL layer 103G shown in FIG. 3A has a structure similar to that of the EL layer 103 described in the second embodiment. Also, the EL layer 103G can emit green light, for example.
- light emitting device 550R has electrode 551R, electrode 552, and EL layer 103R.
- a specific configuration of each layer is as shown in the second embodiment.
- the EL layer 103R has a laminated structure including a plurality of layers having different functions, including a light-emitting layer.
- the hole injection/transport layer 104R indicates a layer having the functions of the hole injection layer and the hole transport layer described in Embodiment 2, and may have a laminated structure.
- the electron-transporting layer has a laminated structure including at least a first electron-transporting layer 108R-1 and a second electron-transporting layer 108R-2.
- the electron transport layer in contact with the transport layer 108R-1 and the electron injection layer 109 is referred to as a second electron transport layer 108R-2.
- the second electron-transporting layer 108R-2 is a layer (preferably a mixed film) using a heteroaromatic compound and an organic compound, or a plurality of types of heteroaromatic compounds, as described in Embodiment 1. layer).
- the second electron-transporting layer 108R-2 may be formed using an electron-transporting material.
- the first electron transport layer 108R-1 may have a function of blocking holes that move from the anode side through the light-emitting layer to the cathode side. Further, the electron injection layer 109 may also have a layered structure in which a part or all of it is formed using different materials.
- An insulating layer 107 may be formed on the side (or end) of -2. Note that when the insulating layer 107 is added to the light-emitting device configuration of FIG. 1, the insulating layer 107 is formed while leaving the sacrificial layer formed on the second electron transport layer 108R-2), and then the sacrificial layer is removed.
- the insulating layer 107R is formed in contact with the side surface (or end) of a portion (above) of the EL layer 103R. This makes it possible to suppress entry of oxygen, moisture, or constituent elements thereof from the side surface of the EL layer 103R into the inside.
- aluminum oxide, magnesium oxide, hafnium oxide, gallium oxide, indium gallium zinc oxide, silicon nitride, or silicon oxynitride can be used for the insulating layer 107R.
- a sputtering method, a CVD method, an MBE method, a PLD method, an ALD method, or the like can be used to form the insulating layer 107R, but the ALD method, which has good coverage, is more preferable.
- an electron injection layer 109 is formed.
- the electron injection layer 109 may have a laminated structure of two or more layers having different electric resistances among the layers.
- a first layer in contact with the second electron-transporting layer 108R-2 is formed using only an electron-transporting material, and a second layer is formed thereon using an electron-transporting material containing a metal material.
- a third layer formed of an electron-transporting material containing a metal material may be provided between the stack or the first layer and the second electron-transporting layer 108R-2.
- an electrode 552 is formed on the electron injection layer 109 .
- the electrode 551R and the electrode 552 have regions that overlap each other.
- An EL layer 103R is provided between the electrode 551R and the electrode 552.
- FIG. Therefore, the electrode 552 is part of the EL layer 103R (including the light emitting layer, the hole injection/transport layer 104R, the first electron transport layer 108R-1, and the second electron transport layer 108R) through the electron injection layer 109. -2) has a structure in contact with the side surface (or end).
- part of the EL layer 103R (including the light-emitting layer, the hole injection/transport layer 104R, the first electron-transport layer 108R-1, and the second electron-transport layer 108R-2) and the electrode 552, more specifically, Therefore, it is possible to prevent an electrical short circuit between the hole injection/transport layer 104R and the electrode 552 included in the EL layer 103R.
- An EL layer 103R shown in FIG. 3A has a structure similar to that of the EL layer 103 described in the second embodiment. Also, the EL layer 103R can emit red light, for example.
- a gap 580 is provided between the EL layer 103B, the EL layer 103G, and the EL layer 103R.
- the hole-injecting layer especially in the hole-transporting region located between the anode and the light-emitting layer, is often highly conductive and is therefore formed as a layer common to adjacent light-emitting devices. and may cause crosstalk. Therefore, by providing the gap 580 between each EL layer as shown in this configuration example, it is possible to suppress the occurrence of crosstalk between adjacent light emitting devices.
- a high-definition display panel exceeding 1000 ppi preferably a high-definition display panel exceeding 2000 ppi, more preferably an ultra-high-definition display panel exceeding 5000 ppi, by providing a gap 580, a display panel capable of displaying vivid colors. can provide.
- septum 528 includes opening 528B, opening 528G, and opening 528R.
- the opening 528B overlaps the electrode 551B
- the opening 528G overlaps the electrode 551G
- the opening 528R overlaps the electrode 551R.
- 3B is a top view of the light emitting device 700 shown in FIG. 3A in the XY direction, and a cross-sectional view taken along Y1-Y2 shown in FIG. 3B corresponds to FIG. 3A.
- the EL layer 103B, the EL layer 103G, and the EL layer 103R a pattern is formed using a photolithography method, so that a high-definition light-emitting device (display panel) can be manufactured. can do.
- the end portions (side surfaces) of the EL layer processed by pattern formation using a photolithography method have substantially the same surface (or are positioned substantially on the same plane).
- the gap 580 provided between the EL layers is preferably 5 ⁇ m or less, more preferably 1 ⁇ m or less.
- the hole-injecting layer contained in the hole-transporting region located between the anode and the light-emitting layer is often formed as a layer common to adjacent light-emitting devices because it often has high conductivity. , can cause crosstalk. Therefore, by separating the EL layers by patterning using photolithography as shown in this configuration example, it is possible to suppress the occurrence of crosstalk between adjacent light emitting devices.
- electrodes 551B, 551G, and 551R are formed.
- a conductive film is formed over the functional layer 520 formed over the first substrate 510 and processed into a predetermined shape by photolithography.
- the formation of the conductive film includes sputtering, chemical vapor deposition (CVD), molecular beam epitaxy (MBE), vacuum deposition, pulsed laser deposition (PLD). ) method, Atomic Layer Deposition (ALD) method, or the like.
- the CVD method includes a plasma enhanced CVD (PECVD) method, a thermal CVD method, and the like. Also, one of the thermal CVD methods is the metal organic CVD (MOCVD) method.
- the conductive film may be processed by a nanoimprint method, a sandblast method, a lift-off method, or the like.
- an island-shaped thin film may be directly formed by a film formation method using a shielding mask such as a metal mask.
- the island shape refers to a state in which a layer is separated from a layer formed in the same step and using the same material in a plan view.
- a photolithography method there are typically the following two methods. One is a method of forming a resist mask on a thin film to be processed, processing the thin film by etching or the like, and removing the resist mask. The other is a method of forming a photosensitive thin film, then performing exposure and development to process the thin film into a desired shape. When the former method is used, there are heat treatment steps such as heating after resist coating (PAB: Pre Applied Bake) and heating after exposure (PEB: Post Exposure Bake).
- PAB heating after resist coating
- PEB Post Exposure Bake
- a photolithography method is used not only for processing a conductive film but also for processing a thin film (a film containing an organic compound or a film partially containing an organic compound) used for forming an EL layer.
- the light used for exposure can be, for example, i-line (wavelength 365 nm), g-line (wavelength 436 nm), h-line (wavelength 405 nm), or a mixture thereof.
- ultraviolet rays, KrF laser light, ArF laser light, or the like can also be used.
- extreme ultraviolet (EUV: Extreme Ultra-violet) light or X-rays may be used.
- An electron beam can also be used instead of the light used for exposure. The use of extreme ultraviolet light, X-rays, or electron beams is preferable because extremely fine processing is possible.
- a photomask is not necessary when exposure is performed by scanning a beam such as an electron beam.
- a dry etching method, a wet etching method, a sandblasting method, or the like can be used for etching the thin film using the resist mask.
- partition walls 528 are formed between the electrodes 551B, 551G, and 551R.
- an insulating film is formed to cover the electrode 551B, the electrode 551G, and the electrode 551R, an opening is formed using a photolithography method, and a part of the electrode 551B, the electrode 551G, and the electrode 551R is exposed.
- a material that can be used for the partition 528 an inorganic material, an organic material, a composite material of an inorganic material and an organic material, or the like can be given.
- an inorganic oxide film, an inorganic nitride film, an inorganic oxynitride film, or the like, or a laminated material in which a plurality of selected from these are laminated more specifically, a silicon oxide film, a film containing acrylic, or A film containing polyimide or the like, or a laminated material obtained by laminating a plurality of films selected from these films can be used.
- the EL layer 103B is formed over the electrode 551B, the electrode 551G, the electrode 551R, and the partition 528 as shown in FIG. 5A.
- the EL layer 103B includes the hole injection/transport layer 104B, the light emitting layer, the first electron transport layer 108B-1, and the second electron transport layer 108B-2.
- the EL layer 103B is formed over the electrode 551B, the electrode 551G, the electrode 551R, and the partition 528 by vacuum evaporation so as to cover them.
- a sacrificial layer 110 is formed over the EL layer 103B.
- the sacrificial layer 110 a film having high resistance to the etching treatment of the EL layer 103B, that is, a film having a high etching selectivity can be used.
- the sacrificial layer 110 preferably has a laminated structure of a first sacrificial layer and a second sacrificial layer with different etching selectivity.
- a film that can be removed by a wet etching method that causes less damage to the EL layer 103B can be used.
- As an etching material used for wet etching oxalic acid or the like can be used.
- the sacrificial layer may be referred to as a mask layer in this specification and the like.
- the sacrificial layer 110 for example, an inorganic film such as a metal film, an alloy film, a metal oxide film, a semiconductor film, or an inorganic insulating film can be used. Also, the sacrificial layer 110 can be formed by various film forming methods such as sputtering, vapor deposition, CVD, and ALD.
- the sacrificial layer 110 for example, metal materials such as gold, silver, platinum, magnesium, nickel, tungsten, chromium, molybdenum, iron, cobalt, copper, palladium, titanium, aluminum, yttrium, zirconium, and tantalum, or the metal materials can be used.
- metal materials such as gold, silver, platinum, magnesium, nickel, tungsten, chromium, molybdenum, iron, cobalt, copper, palladium, titanium, aluminum, yttrium, zirconium, and tantalum, or the metal materials can be used.
- a low melting point material such as aluminum or silver.
- a metal oxide such as indium gallium zinc oxide (also referred to as In—Ga—Zn oxide, IGZO) can be used.
- indium oxide, indium zinc oxide (In—Zn oxide), indium tin oxide (In—Sn oxide), indium titanium oxide (In—Ti oxide), indium tin zinc oxide (In—Sn -Zn oxide), indium titanium zinc oxide (In-Ti-Zn oxide), indium gallium tin zinc oxide (In-Ga-Sn-Zn oxide), and the like can be used.
- indium tin oxide containing silicon or the like can be used.
- element M is aluminum, silicon, boron, yttrium, copper, vanadium, beryllium, titanium, iron, nickel, germanium, zirconium, molybdenum, lanthanum, cerium, neodymium, hafnium, tantalum, tungsten , or one or more selected from magnesium
- M is preferably one or more selected from gallium, aluminum, and yttrium.
- Inorganic insulating materials such as aluminum oxide, hafnium oxide, and silicon oxide can be used for the sacrificial layer 110 .
- the sacrificial layer 110 it is preferable to use a material that can be dissolved in a chemically stable solvent at least for the film (second electron-transport layer 108B-2) located at the top of the EL layer 103B. .
- a material that dissolves in water or alcohol can be suitably used for the sacrificial layer 110 .
- the sacrificial layer 110 has a stacked structure
- a layer formed using any of the above materials can be used as the first sacrificial layer, and the second sacrificial layer can be formed thereunder to form a stacked structure.
- the second sacrificial layer in this case is a film used as a hard mask when etching the first sacrificial layer. Also, the first sacrificial layer is exposed during the processing of the second sacrificial layer. Therefore, for the first sacrificial layer and the second sacrificial layer, a combination of films having a high etching selectivity is selected. Therefore, a film that can be used for the second sacrificial layer can be selected according to the etching conditions for the first sacrificial layer and the etching conditions for the second sacrificial layer.
- silicon, silicon nitride, silicon oxide, tungsten, titanium, molybdenum, tantalum, and nitride can be used.
- Tantalum, an alloy containing molybdenum and niobium, or an alloy containing molybdenum and tungsten, or the like can be used for the second sacrificial layer.
- a film capable of obtaining a high etching selectivity that is, capable of slowing the etching rate
- metal oxide films such as IGZO and ITO. can be used for the first sacrificial layer.
- the second sacrificial layer is not limited to this, and can be selected from various materials according to the etching conditions for the first sacrificial layer and the etching conditions for the second sacrificial layer. For example, it can be selected from films that can be used for the first sacrificial layer.
- a nitride film for example, can be used as the second sacrificial layer.
- nitride films such as silicon nitride, aluminum nitride, hafnium nitride, titanium nitride, tantalum nitride, tungsten nitride, gallium nitride, and germanium nitride can also be used.
- an oxide film can be used as the second sacrificial layer.
- an oxide film or an oxynitride film such as silicon oxide, silicon oxynitride, aluminum oxide, aluminum oxynitride, hafnium oxide, or hafnium oxynitride can be used.
- a resist mask REG is formed in a desired shape on the sacrificial layer 110 by photolithography.
- heat treatment steps such as heating after resist coating (PAB: Pre Applied Bake) and heating after exposure (PEB: Post Exposure Bake).
- PAB heating after resist coating
- PEB Heating after exposure
- the PAB temperature is around 100°C
- the PEB temperature is around 120°C. Therefore, a light-emitting device that can withstand these processing temperatures is required.
- the layer exposed to photolithography is specifically the layer containing the heteroaromatic compound and the organic compound, which is described in Embodiment 1, and has high heat resistance. Therefore, the influence of heat treatment is suppressed, and a highly reliable light-emitting device can be obtained.
- a portion of the sacrificial layer 110 that is not covered with the resist mask REG is removed by etching to form a sacrificial layer 110B, and the resist mask REG is removed. Remove. After that, a part of the EL layer 103B that is not covered with the sacrificial layer 110B is removed by etching, and the EL layer 103B over the electrode 551G and the EL layer 103B over the electrode 551R are removed by etching so as to have side surfaces (or have side surfaces exposed). ), or a band-like shape extending in a direction orthogonal to the drawing.
- dry etching is performed using a sacrificial layer 110B patterned over the EL layer 103B overlapping with the electrode 551B.
- the second sacrificial layer is partly etched using the resist mask REG, and then the resist mask REG is removed. It may be removed and part of the first sacrificial layer may be etched using the second sacrificial layer as a mask to process the EL layer 103B into a predetermined shape.
- the partition 528 can be used as an etching stopper.
- the EL layer 103G is formed over the sacrificial layer 110B, the electrodes 551G, the electrodes 551R, and the partition walls 528 while the sacrificial layer 110B is formed.
- the EL layer 103G is formed up to the hole injection/transport layer 104G, the light emitting layer, and the first electron transport layer 108G-1.
- the EL layer 103G is formed over the electrode 551G, the electrode 551R, and the partition 528 by vacuum evaporation so as to cover them.
- a sacrificial layer 110 is formed on the EL layer 103G.
- the EL layer 103G on the electrode 551G is processed into a predetermined shape.
- a sacrificial layer is formed over the EL layer 103G, a resist mask is formed in a desired shape thereon by photolithography, and part of the sacrificial layer that is not covered with the obtained resist mask is removed by etching. By doing so, a sacrificial layer 110G is formed, and the resist mask is removed.
- a part of the EL layer 103G that is not covered with the sacrificial layer 110G is removed by etching, and the EL layer 103G over the electrode 551B and the EL layer 103G over the electrode 551R are removed by etching so as to have side surfaces (or have side surfaces exposed). ), or a band-like shape extending in a direction orthogonal to the drawing.
- dry etching is performed using a sacrificial layer 110G patterned on the EL layer 103G overlapping with the electrode 551G.
- the resist mask is removed after part of the second sacrificial layer is etched using a resist mask.
- part of the first sacrificial layer may be etched to process the EL layer 103G into a predetermined shape.
- the partition 528 can be used as an etching stopper.
- the sacrificial layer 110B is formed on the second electron-transporting layer 108B-2, and the sacrificial layer 110G is formed on the electron-transporting layer 108G-2.
- An EL layer 103R is formed over the sacrificial layer 110G, the electrode 551R, and the partition 528.
- the EL layer 103R includes the hole injection/transport layer 104R, the light emitting layer, the first electron transport layer 108R-1, and the second electron transport layer 108R-2.
- the EL layer 103R is formed over the sacrificial layer 110B, the sacrificial layer 110G, the electrode 551R, and the partition 528 so as to cover them by vacuum evaporation. Subsequently, the EL layer 103R on the electrode 551R is processed into a predetermined shape. For example, a sacrificial layer is formed over the EL layer 103R, a resist is formed in a desired shape thereon by photolithography, and a part of the sacrificial layer that is not covered with the obtained resist mask is removed by etching. , the sacrificial layer 110R is formed by removing the resist mask.
- a portion of the EL layer 103R that is not covered with the sacrificial layer 110R is removed by etching, and the EL layer 103R over the electrode 551B and the EL layer 103R over the electrode 551G are removed by etching so as to have side surfaces (or have side surfaces). exposed), or a belt-like shape extending in a direction orthogonal to the drawing.
- dry etching is performed using the sacrificial layer 110R patterned on the EL layer 103R overlapping with the electrode 551R.
- the resist mask is removed after part of the second sacrificial layer is etched using a resist mask.
- part of the first sacrificial layer may be etched to process the EL layer 103R into a predetermined shape.
- the partition 528 can be used as an etching stopper.
- An insulating layer 107 is formed.
- the ALD method can be used to form the insulating layer 107 .
- the insulating layer 107 is formed in contact with the side surfaces of each EL layer (103B, 103G, 103R) as shown in FIG. 6C. As a result, it is possible to suppress the intrusion of oxygen, moisture, or constituent elements thereof from the side surfaces of the EL layers (103B, 103G, 103R).
- a material used for the insulating layer 107 for example, aluminum oxide, magnesium oxide, hafnium oxide, gallium oxide, indium gallium zinc oxide, silicon nitride, silicon nitride oxide, or the like can be used.
- the sacrificial layers (110B, 110G, 110R) are removed and part of the insulating layer 107 is removed to form insulating layers (107B, 107G, 107R).
- 109 is formed.
- the electron injection layer 109 is formed using, for example, a vacuum deposition method. Note that the electron injection layer 109 is formed on the second electron transport layers (108B-2, 108G-2, 108R-2). Note that the electron injection layer 109 includes each EL layer (103B, 103G, 103R) (however, the EL layers (103B, 103G, 103R) shown in FIG.
- hole injection/transport layers (104R, 104G, 104B), light emitting layer, including the first electron-transporting layer (108B-1, 108G-1, 108R-1) and the second electron-transporting layer (108B-2, 108G-2, 108R-2). part) and an insulating layer 107 interposed therebetween.
- electrodes 552 are formed.
- the electrodes 552 are formed using, for example, a vacuum deposition method. Note that the electrode 552 is formed over the electron injection layer 109 . Note that the electrode 552 is connected to each EL layer (103B, 103G, 103R) through the electron injection layer 109 and the insulating layer 107 (however, the EL layers (103B, 103G, 103R) shown in FIG. 7B are hole injection/transport layers).
- the EL layer 103B, the EL layer 103G, and the EL layer 103R in the light-emitting device 550B, the light-emitting device 550G, and the light-emitting device 550R can be separately processed.
- a pattern is formed using a photolithography method, so that a high-definition light-emitting device (display panel) can be manufactured. can do.
- the end portions (side surfaces) of the EL layer processed by pattern formation using a photolithography method have substantially the same surface (or are positioned substantially on the same plane).
- the hole-injecting layer contained in the hole-transporting region located between the anode and the light-emitting layer is often formed as a layer common to adjacent light-emitting devices because it often has high conductivity. , can cause crosstalk. Therefore, by separating the EL layers by patterning using photolithography as shown in this configuration example, it is possible to suppress the occurrence of crosstalk between adjacent light emitting devices.
- a light-emitting device 700 shown in FIG. 8 has a light-emitting device 550B, a light-emitting device 550G, a light-emitting device 550R, and a partition 528. Also, the light emitting device 550B, the light emitting device 550G, the light emitting device 550R, and the partition wall 528 are formed on the functional layer 520 provided on the first substrate 510.
- FIG. The functional layer 520 includes a driving circuit GD, a driving circuit SD, and the like, which are configured by a plurality of transistors, as well as wiring for electrically connecting them. Note that these drive circuits are electrically connected to, for example, the light emitting device 550B, the light emitting device 550G, and the light emitting device 550R, respectively, and can drive them.
- Light-emitting device 550B, light-emitting device 550G, and light-emitting device 550R have the device structure shown in the second embodiment. In particular, it illustrates the case where the EL layer 103 in the structure shown in FIG. 1A is different for each light emitting device.
- each light emitting device shown in FIG. 8 is the same as the light emitting device 550B, the light emitting device 550G, and the light emitting device 550R described with reference to FIG.
- the hole injection/transport layers (104B, 104G, 104R) of the EL layers (103B, 103G, 103R) of the respective light emitting devices (550B, 550G, 550R) constitute the EL layers. It is smaller than the functional layer of , and has a structure covered with stacked functional layers.
- each EL layer (EL layer 103B, EL layer 103G, and EL layer 103R) of this configuration is patterned using a photolithography method in separation processing, so that the processed EL layer ends (Side surfaces) have substantially the same surface (or are positioned substantially on the same plane).
- Each EL layer (EL layer 103B, EL layer 103G, and EL layer 103R) of each light emitting device has a gap 580 between adjacent light emitting devices.
- the distance SE the distance between the EL layers of the light-emitting devices adjacent to the gap 580.
- the smaller the distance SE the higher the aperture ratio and the higher the definition. can be done.
- the manufacturing yield can be increased because the influence of manufacturing process variations between adjacent light emitting devices can be tolerated.
- the distance SE between the EL layers of adjacent light-emitting devices is 0.5 ⁇ m or more and 5 ⁇ m or less, preferably 1 ⁇ m or more and 3 ⁇ m or less, more preferably It can be 1 ⁇ m or more and 2.5 ⁇ m or less, more preferably 1 ⁇ m or more and 2 ⁇ m or less. Note that, typically, it is preferable that the distance SE is 1 ⁇ m or more and 2 ⁇ m or less (for example, 1.5 ⁇ m or its vicinity).
- the hole-injecting layer contained in the hole-transporting region located between the anode and the light-emitting layer is often formed as a layer common to adjacent light-emitting devices because it often has high conductivity. , can cause crosstalk. Therefore, by separating the EL layers by patterning using photolithography as shown in this configuration example, it is possible to suppress the occurrence of crosstalk between adjacent light emitting devices.
- a device manufactured using a metal mask or FMM fine metal mask, high-definition metal mask
- a device with an MM (metal mask) structure is sometimes referred to as a device with an MM (metal mask) structure.
- a device manufactured without using a metal mask or FMM may be referred to as a device with an MML (metal maskless) structure. Since the light-emitting device with the MML structure is manufactured without using a metal mask, it has a higher degree of freedom in designing pixel arrangement, pixel shape, etc. than the light-emitting device with the FMM structure or the MM structure.
- the island-shaped EL layer included in the light-emitting device having the MML structure is not formed by the pattern of the metal mask, but is formed by processing the EL layer after it is formed. Therefore, a light emitting device with higher definition or a higher aperture ratio than ever before can be realized. Furthermore, since the EL layer can be separately formed for each color, a light-emitting device with extremely vivid, high-contrast, and high-quality display can be realized. Further, by providing the sacrificial layer over the EL layer, damage to the EL layer during the manufacturing process can be reduced; thus, the reliability of the light-emitting device can be improved.
- the light-emitting layer is processed into an island shape
- a structure in which the EL layer stacked up to the light-emitting layer is processed using a photolithography method is conceivable.
- the light-emitting layer may be damaged (damage due to processing, etc.) and the reliability may be significantly impaired. Therefore, when a display panel of one embodiment of the present invention is manufactured, a layer located above the light-emitting layer (for example, a carrier-transport layer or a carrier-injection layer, more specifically an electron-transport layer or an electron-injection layer) etc.) to form a sacrificial layer or the like to process the light-emitting layer into an island shape.
- a highly reliable display panel can be provided.
- FIGS. 9A to 11B a light-emitting device that is one embodiment of the present invention will be described with reference to FIGS. 9A to 11B.
- the light-emitting device 700 illustrated in FIGS. 9A to 11B includes the light-emitting device described in Embodiment 2.
- FIG. since the light-emitting device 700 described in this embodiment can be applied to a display portion of an electronic device or the like, it can also be called a display panel.
- the light-emitting device 700 described in this embodiment includes a display area 231, and the display area 231 has a set of pixels 703(i,j). It also has a set of pixels 703(i+1,j) adjacent to the set of pixels 703(i,j), as shown in FIG. 9B.
- a plurality of pixels can be used for the pixel 703(i, j). For example, a plurality of pixels displaying colors with different hues can be used. Note that each of the plurality of pixels can be called a sub-pixel. Alternatively, a set of sub-pixels can be called a pixel.
- the colors displayed by the plurality of pixels can be subjected to additive color mixture or subtractive color mixture.
- hues of colors that cannot be displayed by individual pixels can be displayed.
- a pixel 702B (i, j) displaying blue, a pixel 702G (i, j) displaying green, and a pixel 702R (i, j) displaying red are used as the pixel 703 (i, j). be able to. Also, each of the pixel 702B(i,j), the pixel 702G(i,j), and the pixel 702R(i,j) can be called a sub-pixel.
- a pixel displaying white or the like may be added to the above set and used for the pixel 703 (i, j).
- each of a pixel displaying cyan, a pixel displaying magenta, and a pixel displaying yellow may be used as a sub-pixel for the pixel 703(i,j).
- a pixel emitting infrared rays may be used for the pixel 703(i, j).
- a pixel that emits light including light having a wavelength of 650 nm to 1000 nm can be used as the pixel 703(i, j).
- a driving circuit GD and a driving circuit SD are provided around the display area 231 shown in FIG. 9A. It also has a terminal 519 electrically connected to the driver circuit GD, the driver circuit SD, and the like. The terminal 519 can be electrically connected to the flexible printed circuit FPC1, for example, as shown in FIG. 11A.
- the drive circuit GD has a function of supplying a first selection signal and a second selection signal.
- the drive circuit GD is electrically connected to a conductive film G1(i), which will be described later, to supply a first selection signal, and is electrically connected to a conductive film G2(i), which will be described later, to supply a second selection signal.
- the drive circuit SD has a function of supplying an image signal and a control signal, the control signal including a first level and a second level.
- the drive circuit SD is electrically connected to a conductive film S1g(j) described later to supply an image signal, and is electrically connected to a conductive film S2g(j) described later to supply a control signal.
- FIG. 11A shows a cross-sectional view of the light-emitting device taken along dashed-dotted line X1-X2 and dashed-dotted line X3-X4 shown in FIG. 9A.
- light emitting device 700 has functional layer 520 between first substrate 510 and second substrate 770 .
- the functional layer 520 includes the above-described drive circuit GD, drive circuit SD, and the like, as well as wiring that electrically connects them.
- the functional layer 520 shows a configuration including pixel circuits 530B(i,j) and pixel circuits 530G(i,j) and drive circuits GD, but is not limited to this.
- Each pixel circuit included in the functional layer 520 corresponds to each light emitting device (for example, , the light emitting device 550B(i,j) and the light emitting device 550G(i,j)) shown in FIG. 11A.
- light emitting device 550B(i,j) is electrically connected to pixel circuit 530B(i,j) through opening 591B
- light emitting device 550G(i,j) is electrically connected through opening 591G. It is electrically connected to the pixel circuit 530G(i,j).
- An insulating layer 705 is provided on the functional layer 520 and each light emitting device, and the insulating layer 705 has a function of bonding the second substrate 770 and the functional layer 520 together.
- a substrate provided with touch sensors in a matrix can be used as the second substrate 770 .
- a substrate with capacitive touch sensors or optical touch sensors can be used for the second substrate 770 .
- the light-emitting device of one embodiment of the present invention can be used as a touch panel.
- FIG. 10A A specific configuration of the pixel circuit 530G(i, j) is shown in FIG. 10A.
- the pixel circuit 530G(i,j) has a switch SW21, a switch SW22, a transistor M21, a capacitor C21 and a node N21. Also, the pixel circuit 530G(i,j) has a node N22, a capacitor C22 and a switch SW23.
- the transistor M21 has a gate electrode electrically connected to the node N21, a first electrode electrically connected to the light emitting device 550G(i,j), and a second electrode electrically connected to the conductive film ANO. and an electrode of
- the switch SW21 has a first terminal electrically connected to the node N21 and a second terminal electrically connected to the conductive film S1g(j). Moreover, the switch SW21 has a function of controlling a conducting state or a non-conducting state based on the potential of the conductive film G1(i).
- the switch SW22 has a first terminal electrically connected to the conductive film S2g(j). Moreover, the switch SW22 has a function of controlling a conducting state or a non-conducting state based on the potential of the conductive film G2(i).
- Capacitor C21 has a conductive film electrically connected to node N21 and a conductive film electrically connected to the second electrode of switch SW22.
- the image signal can be stored in the node N21.
- the potential of the node N21 can be changed using the switch SW22.
- the intensity of light emitted by the light emitting device 550G(i,j) can be controlled using the potential of the node N21.
- FIG. 10B shows an example of a specific structure of the transistor M21 described with reference to FIG. 10A. Note that a bottom-gate transistor, a top-gate transistor, or the like can be used as appropriate as the transistor M21.
- the transistor illustrated in FIG. 10B has a semiconductor film 508, a conductive film 504, an insulating film 506, a conductive film 512A, and a conductive film 512B.
- a transistor is formed, for example, on the insulating film 501C.
- the transistor also includes an insulating film 516 (an insulating film 516A and an insulating film 516B) and an insulating film 518 .
- the semiconductor film 508 has a region 508A electrically connected to the conductive film 512A and a region 508B electrically connected to the conductive film 512B.
- Semiconductor film 508 has a region 508C between regions 508A and 508B.
- the conductive film 504 has a region overlapping with the region 508C, and the conductive film 504 functions as a gate electrode.
- the insulating film 506 has a region sandwiched between the semiconductor film 508 and the conductive film 504 .
- the insulating film 506 functions as a first gate insulating film.
- the conductive film 512A has one of the function of the source electrode and the function of the drain electrode, and the conductive film 512B has the other of the function of the source electrode and the function of the drain electrode.
- the conductive film 524 can be used for a transistor.
- the conductive film 524 has a region that sandwiches the semiconductor film 508 with the conductive film 504 .
- the conductive film 524 functions as a second gate electrode.
- the insulating film 501D is sandwiched between the semiconductor film 508 and the conductive film 524 and functions as a second gate insulating film.
- the insulating film 516 functions, for example, as a protective film that covers the semiconductor film 508 .
- the insulating film 516 include a silicon oxide film, a silicon oxynitride film, a silicon nitride oxide film, a silicon nitride film, an aluminum oxide film, a hafnium oxide film, an yttrium oxide film, a zirconium oxide film, and a gallium oxide film.
- a tantalum oxide film, a magnesium oxide film, a lanthanum oxide film, a cerium oxide film, or a neodymium oxide film can be used.
- a material having a function of suppressing diffusion of oxygen, hydrogen, water, alkali metals, alkaline earth metals, or the like is preferably used.
- silicon nitride, silicon oxynitride, aluminum nitride, aluminum oxynitride, or the like can be used, for example.
- the number of oxygen atoms and the number of nitrogen atoms contained in each of silicon oxynitride and aluminum oxynitride are preferably larger than that of nitrogen atoms.
- a semiconductor film used for a driver circuit transistor can be formed in the step of forming the semiconductor film used for the pixel circuit transistor.
- a semiconductor film having the same composition as a semiconductor film used for a transistor in a pixel circuit can be used for a driver circuit.
- a semiconductor containing a Group 14 element can be used.
- a semiconductor containing silicon can be used for the semiconductor film 508 .
- Hydrogenated amorphous silicon can be used for the semiconductor film 508 .
- microcrystalline silicon or the like can be used for the semiconductor film 508 .
- a light-emitting device (or a display panel) using polysilicon for the semiconductor film 508, for example can provide a light-emitting device with less display unevenness. Alternatively, it is easy to increase the size of the light-emitting device.
- Polysilicon can be used for the semiconductor film 508 . Accordingly, the field-effect mobility of the transistor can be higher than that of a transistor using amorphous silicon hydride for the semiconductor film 508, for example. Alternatively, driving capability can be higher than that of a transistor using hydrogenated amorphous silicon for the semiconductor film 508, for example. Alternatively, for example, the aperture ratio of a pixel can be improved as compared with a transistor using hydrogenated amorphous silicon for the semiconductor film 508 .
- the reliability of the transistor can be higher than that of a transistor using hydrogenated amorphous silicon for the semiconductor film 508 .
- the temperature required for manufacturing a transistor can be lower than, for example, a transistor using single crystal silicon.
- a semiconductor film used for a transistor in a driver circuit can be formed in the same process as a semiconductor film used for a transistor in a pixel circuit.
- the driver circuit can be formed over the same substrate as the substrate forming the pixel circuit. Alternatively, the number of parts constituting the electronic device can be reduced.
- single crystal silicon can be used for the semiconductor film 508 .
- the definition can be higher than that of a light-emitting device (or a display panel) using hydrogenated amorphous silicon for the semiconductor film 508 .
- a light-emitting device with less display unevenness than a light-emitting device using polysilicon for the semiconductor film 508 can be provided.
- smart glasses or head-mounted displays can be provided.
- a metal oxide can be used for the semiconductor film 508 .
- the pixel circuit can hold an image signal for a longer time than a pixel circuit using a transistor using hydrogenated amorphous silicon for a semiconductor film.
- the selection signal can be supplied at a frequency of less than 30 Hz, preferably less than 1 Hz, more preferably less than once a minute, while suppressing flicker. As a result, fatigue accumulated in the user of the electronic device can be reduced. In addition, power consumption associated with driving can be reduced.
- An oxide semiconductor can be used for the semiconductor film 508 .
- an oxide semiconductor containing indium, an oxide semiconductor containing indium, gallium, and zinc, or an oxide semiconductor containing indium, gallium, zinc, and tin can be used for the semiconductor film 508 .
- a transistor with less leakage current in an off state than a transistor using hydrogenated amorphous silicon for a semiconductor film can be obtained. Therefore, it is preferable to use a transistor including an oxide semiconductor for a semiconductor film for a switch or the like. Note that a circuit using a transistor using an oxide semiconductor for a semiconductor film as a switch holds the potential of a floating node for a longer time than a circuit using a transistor using a semiconductor film using hydrogenated amorphous silicon as a switch. be able to.
- FIG. 11A shows a light-emitting device with a structure (top emission type) for extracting light from the second substrate 770 side, but as shown in FIG. 11B, a structure (bottom emission type) for extracting light from the first substrate 510 side. It is good also as a light-emitting device.
- the first electrode 101 is formed to function as a semi-transmissive/half-reflective electrode
- the second electrode 102 is formed to function as a reflective electrode.
- the active matrix light-emitting device is described, but the structure of the light-emitting device described in Embodiment 2 can also be applied to the passive matrix light-emitting device illustrated in FIGS. 12A and 12B. good.
- FIG. 12A is a perspective view showing a passive matrix light-emitting device
- FIG. 12B is a cross-sectional view of FIG. 12A taken along the dashed-dotted line XY. 12A and 12B
- an electrode 952 and an electrode 956 are provided over a substrate 951
- an EL layer 955 is provided between the electrode 952 and the electrode 956.
- FIG. The ends of the electrodes 952 are covered with an insulating layer 953 .
- a partition layer 954 is provided over the insulating layer 953 .
- the sidewalls of the partition layer 954 are inclined such that the distance between one sidewall and the other sidewall becomes narrower as the partition wall layer 954 approaches the substrate surface.
- the partition layer 954 has a trapezoidal cross section in the minor axis direction, and the lower base (the side facing the same plane direction as the insulating layer 953 and in contact with the insulating layer 953) is the upper base (the insulating layer 953). , and is shorter than the side not in contact with the insulating layer 953).
- FIGS. 13B to 13E are perspective views illustrating the configuration of the electronic device.
- 14A to 14E are perspective views explaining the configuration of the electronic device.
- 15A and 15B are perspective views explaining the configuration of the electronic device.
- An electronic device 5200B described in this embodiment includes an arithmetic device 5210 and an input/output device 5220 (see FIG. 13A).
- the computing device 5210 has a function of being supplied with operation information, and has a function of supplying image information based on the operation information.
- the input/output device 5220 has a display unit 5230, an input unit 5240, a detection unit 5250, a communication unit 5290, a function of supplying operation information, and a function of receiving image information. Also, the input/output device 5220 has a function of supplying detection information, a function of supplying communication information, and a function of being supplied with communication information.
- the input unit 5240 has a function of supplying operation information.
- the input unit 5240 supplies operation information based on the user's operation of the electronic device 5200B.
- a keyboard e.g., a keyboard, hardware buttons, pointing device, touch sensor, illuminance sensor, imaging device, voice input device, line-of-sight input device, posture detection device, or the like can be used for the input unit 5240 .
- the display portion 5230 has a display panel and a function of displaying image information.
- the display panel described in Embodiment 2 can be used for the display portion 5230 .
- the detection unit 5250 has a function of supplying detection information. For example, it has a function of detecting the surrounding environment in which the electronic device is used and supplying it as detection information.
- an illuminance sensor an imaging device, a posture detection device, a pressure sensor, a motion sensor, or the like can be used for the detection portion 5250 .
- the communication unit 5290 has a function of receiving and supplying communication information. For example, it has a function of connecting to other electronic devices or communication networks by wireless communication or wired communication. Specifically, it has functions such as wireless local communication, telephone communication, and short-range wireless communication.
- FIG. 13B shows an electronic device having a contour along a cylindrical post or the like.
- One example is digital signage.
- the display panel which is one embodiment of the present invention can be applied to the display portion 5230 .
- a function of changing the display method according to the illuminance of the usage environment may be provided. It also has a function of detecting the presence of a person and changing the display content. This allows it to be installed, for example, on a building pillar. Alternatively, advertisements, guidance, or the like can be displayed.
- FIG. 13C shows an electronic device having a function of generating image information based on the trajectory of the pointer used by the user.
- Examples include electronic blackboards, electronic bulletin boards, electronic signboards, and the like.
- a display panel with a diagonal length of 20 inches or more, preferably 40 inches or more, more preferably 55 inches or more can be used.
- a plurality of display panels can be arranged and used as one display area.
- a plurality of display panels can be arranged and used for a multi-screen.
- FIG. 13D shows an electronic device that can receive information from other devices and display it on display 5230 .
- wearable electronic devices Specifically, several options can be displayed or the user can select some of the options and send them back to the source of the information. Alternatively, for example, it has a function of changing the display method according to the illuminance of the usage environment. Thereby, for example, the power consumption of the wearable electronic device can be reduced.
- an image can be displayed on the display portion 5230 so that it can be used preferably even in an environment with strong external light, such as outdoors on a sunny day.
- FIG. 13E shows an electronic device having a display portion 5230 with a gently curved surface along the side of the housing.
- a display portion 5230 includes a display panel, and the display panel has a function of displaying on the front, side, top, and back, for example. This allows, for example, information to be displayed not only on the front of the mobile phone, but also on the sides, top and back.
- FIG. 14A shows an electronic device capable of receiving information from the Internet and displaying it on display 5230.
- FIG. A smart phone etc. are mentioned as an example.
- the created message can be confirmed on the display portion 5230 .
- it has a function of changing the display method according to the illuminance of the usage environment. As a result, power consumption of the smartphone can be reduced.
- an image can be displayed on the display portion 5230 so that it can be used preferably even in an environment with strong external light, such as outdoors on a sunny day.
- FIG. 14B shows an electronic device whose input unit 5240 can be a remote controller.
- An example is a television system.
- information can be received from a broadcasting station or the Internet and displayed on the display portion 5230 .
- the user can be photographed using the detection unit 5250 .
- the user's image can be transmitted.
- the user's viewing history can be obtained and provided to the cloud service.
- recommendation information can be acquired from a cloud service and displayed on the display unit 5230 .
- a program or video can be displayed based on the recommendation information.
- it has a function of changing the display method according to the illuminance of the usage environment. Accordingly, an image can be displayed on the display portion 5230 so that the image can be preferably used even when the strong external light that enters the room on a fine day hits.
- FIG. 14C shows an electronic device capable of receiving teaching materials from the Internet and displaying them on display unit 5230 .
- One example is a tablet computer.
- Input section 5240 can be used to input and send reports to the Internet.
- the report correction results or evaluation can be obtained from the cloud service and displayed on the display unit 5230 .
- suitable teaching materials can be selected and displayed based on the evaluation.
- an image signal can be received from another electronic device and displayed on the display portion 5230 .
- the display portion 5230 can be used as a sub-display by leaning it against a stand or the like.
- images can be displayed on the tablet computer so that the tablet computer can be suitably used even in an environment with strong external light, such as outdoors on a sunny day.
- FIG. 14D shows an electronic device with multiple displays 5230 .
- An example is a digital camera.
- an image can be displayed on the display portion 5230 while the detection portion 5250 captures an image.
- a captured image can be displayed on the display portion 5230 .
- the input unit 5240 can be used to decorate the captured image. Or you can attach a message to the captured video. Or you can send it to the internet. Alternatively, it has a function of changing the shooting conditions according to the illuminance of the usage environment.
- the subject can be displayed on the display unit 5230 so that it can be viewed preferably even in an environment with strong external light, such as outdoors on a sunny day.
- FIG. 14E shows an electronic device that can control other electronic devices by using another electronic device as a slave and using the electronic device of this embodiment as a master.
- One example is a portable personal computer.
- part of the image information can be displayed on the display portion 5230 and the other part of the image information can be displayed on the display portion of another electronic device.
- an image signal can be supplied.
- information to be written can be obtained from an input portion of another electronic device using the communication portion 5290 .
- a wide display area can be used, for example, by using a portable personal computer.
- FIG. 15A shows an electronic device having a sensing unit 5250 that senses acceleration or orientation.
- An example is a goggle-type electronic device.
- the sensing unit 5250 can provide information regarding the location of the user or the direction the user is facing.
- the electronic device can generate image information for the right eye and image information for the left eye based on the position of the user or the direction the user is facing.
- display unit 5230 has a display area for the right eye and a display area for the left eye. Accordingly, for example, an image of a virtual reality space that gives a sense of immersion can be displayed on the display portion 5230 .
- FIG. 15B shows an electronic device having an imaging device and a sensing unit 5250 that senses acceleration or orientation.
- An example is a glasses-type electronic device.
- the sensing unit 5250 can provide information regarding the location of the user or the direction the user is facing.
- the electronic device can generate image information based on the location of the user or the direction the user is facing. As a result, for example, it is possible to attach information to a real landscape and display it. Alternatively, an image of the augmented reality space can be displayed on a glasses-type electronic device.
- FIG. 16A is a cross-sectional view taken along line ef in the top view of the lighting device shown in FIG. 16B.
- a first electrode 401 is formed over a light-transmitting substrate 400 which is a support.
- a first electrode 401 corresponds to the first electrode 101 in the second embodiment.
- the first electrode 401 is formed using a light-transmitting material.
- a pad 412 is formed on the substrate 400 for supplying voltage to the second electrode 404 .
- An EL layer 403 is formed over the first electrode 401 .
- the EL layer 403 corresponds to the structure of the EL layer 103 in Embodiment Mode 2.
- FIG. please refer to the said description about these structures.
- a second electrode 404 is formed to cover the EL layer 403 .
- a second electrode 404 corresponds to the second electrode 102 in the second embodiment.
- the second electrode 404 is made of a highly reflective material.
- a voltage is supplied to the second electrode 404 by connecting it to the pad 412 .
- the lighting device described in this embodiment includes the light-emitting device including the first electrode 401 , the EL layer 403 , and the second electrode 404 . Since the light-emitting device has high emission efficiency, the lighting device in this embodiment can have low power consumption.
- the substrate 400 on which the light-emitting device having the above structure is formed and the sealing substrate 407 are fixed and sealed using the sealing materials 405 and 406 to complete the lighting device. Either one of the sealing materials 405 and 406 may be used. Also, a desiccant can be mixed in the inner sealing material 406 (not shown in FIG. 16B), which can absorb moisture, leading to improved reliability.
- an external input terminal can be formed.
- an IC chip 420 or the like having a converter or the like mounted thereon may be provided thereon.
- the ceiling light 8001 can be of a type directly attached to the ceiling or a type embedded in the ceiling. Note that such a lighting device is configured by combining a light-emitting device with a housing or a cover. In addition, application to a cord pendant type (a cord hanging type from the ceiling) is also possible.
- the foot light 8002 can illuminate the floor surface to enhance the safety of the foot. For example, it is effective for use in bedrooms, stairs, or corridors. In that case, the size and shape can be changed as appropriate according to the size and structure of the room.
- a stationary lighting device configured by combining a light emitting device and a support base is also possible.
- the sheet-like lighting 8003 is a thin sheet-like lighting device. Since it is attached to the wall, it does not take up much space and can be used for a wide range of purposes. In addition, it is easy to increase the area. In addition, it can also be used for a wall surface or a housing having a curved surface.
- a lighting device 8004 in which light from a light source is controlled only in a desired direction can also be used.
- the desk lamp 8005 includes a light source 8006, and as the light source 8006, a light-emitting device that is one embodiment of the present invention or a light-emitting device that is part thereof can be applied.
- a lighting device having a function as furniture can be obtained. can do.
- various lighting devices to which the light-emitting device is applied can be obtained. Note that these lighting devices are included in one embodiment of the present invention.
- films laminated films, mixed films, etc.
- films with different materials or structures were formed on glass substrates, and the results of heat resistance tests performed on the obtained samples (films) are shown.
- Six types of samples were prepared by changing the combination of multiple heteroaromatic compounds or changing the film structure. The structure of each sample is shown in Table 1 below together with the observation results. Chemical formulas of materials used in this example are shown below.
- a sample layer was formed on a glass substrate using a vacuum deposition apparatus, and cut into strips of 1 cm ⁇ 3 cm.
- the substrate was introduced into a bell jar type heater (Bell jar type vacuum oven BV-001 manufactured by Shibata Kagaku Co., Ltd.), the pressure was reduced to about 10 hPa, and the substrate was baked at a set temperature in the range of 80°C to 150°C for 1 hour. .
- Sample 1 is a single-layer film using one type of heteroaromatic compound, and 2,9-di(2-naphthyl)-4,7-diphenyl-1,10-phenanthroline (abbreviation: NBPhen) was deposited on a glass substrate. ) was vapor-deposited to a film thickness of 10 nm.
- NBPhen 2,9-di(2-naphthyl)-4,7-diphenyl-1,10-phenanthroline
- Sample 2 is a single layer film using one kind of heteroaromatic compound, and 2-[4'-(9-phenyl-9H-carbazol-3-yl)-3,1'-biphenyl -1-yl]dibenzo[f,h]quinoxaline (abbreviation: 2mpPCBPDBq) was evaporated to a thickness of 10 nm.
- Sample 3 is a mixed film using a plurality of heteroaromatic compounds.
- 9H-carbazol-3-yl)phenyl]-9,9-dimethyl-9H-fluoren-2-amine abbreviation: PCBBiF
- PCBBiF 9H-carbazol-3-yl)phenyl]-9,9-dimethyl-9H-fluoren-2-amine
- Ir(tBuppm) 3 tris(4-t-butyl-6-phenylpyrimidinato)iridium
- Sample 4 is a laminated film using a plurality of heteroaromatic compounds, and was formed by vapor-depositing 2mp PCBPDBq to 10 nm on a glass substrate and then vapor-depositing NBPhen to 10 nm.
- Sample 5 is a laminated film including a mixed film using a plurality of heteroaromatic compounds.
- Sample 6 is a single-layer film using one type of heteroaromatic compound, and was formed by vapor-depositing PCBBiF on a glass substrate so as to have a film thickness of 40 nm.
- Sample 9 is a laminated film containing a mixed film using a plurality of heteroaromatic compounds.
- Photographs (dark-field observation at 100-fold magnification) of samples manufactured in this example are shown in FIGS. 18A to 18E and FIGS. 19A to 19D.
- no bake (ref) of each sample is also shown.
- Table 1 shows the structure of the samples produced in this example and the observation results thereof.
- circles indicate that no crystals were formed
- triangles indicate that the appearance of the sample changed although crystals were not clearly formed
- crosses indicate that crystals were formed. indicate that In addition, triangular marks were given to those that could not be determined clearly.
- Sample 4 and Sample 7 although the same heteroaromatic compound is used, Sample 4, which is a laminated film, crystallized at 100°C, while Sample 7, which is a mixed film, crystallized up to 150°C. did not happen. From this, it was found that a mixed film using a plurality of ⁇ -electron-deficient heteroaromatic compounds is particularly effective in improving heat resistance.
- the heteroaromatic compound and the organic compound used in the electron-transporting layer of the light-emitting device which is one embodiment of the present invention were formed into a mixed film, and these single-layer films were laminated. Since it was found that the heat resistance is improved compared to the laminated film, the light-emitting device 1 using the mixed film of the heteroaromatic compound and the organic compound as the electron transport layer and the laminated film of the heteroaromatic compound and the organic compound were used. Comparative light-emitting devices 1 used were fabricated, and the characteristics of each device were compared. The element structure and its characteristics are described below. Table 2 shows specific configurations of the light-emitting device 1 and the comparative light-emitting device 1 used in this example. Chemical formulas of materials used in this example are shown below.
- a hole-injection layer 911, a hole-transport layer 912, a light-emitting layer 913, and an electron-transport layer 914 are formed on a first electrode 901 formed on a substrate 900 as shown in FIG. and an electron-injection layer 915 are sequentially stacked, and a second electrode 903 is stacked over the electron-injection layer 915 .
- a first electrode 901 was formed over a substrate 900 .
- the electrode area was 4 mm 2 (2 mm ⁇ 2 mm).
- a glass substrate was used as the substrate 900 .
- the first electrode 901 was formed by sputtering indium tin oxide containing silicon oxide (ITSO) to a thickness of 70 nm.
- ITSO indium tin oxide containing silicon oxide
- the surface of the substrate was washed with water, baked at 200° C. for 1 hour, and then subjected to UV ozone treatment for 370 seconds. After that, the substrate was introduced into a vacuum deposition apparatus whose interior was evacuated to about 10 ⁇ 4 Pa, vacuum baked at 170° C. for 60 minutes in a heating chamber in the vacuum deposition apparatus, and then exposed to heat for about 30 minutes. chilled.
- a hole-injection layer 911 was formed over the first electrode 901 .
- PCBBiF N-(1,1′-biphenyl-4-yl)-N-[4 -(9-Phenyl-9H-carbazol-3-yl)phenyl]-9,9-dimethyl-9H-fluoren-2
- a hole-transport layer 912 was formed over the hole-injection layer 911 .
- the hole transport layer 912 was formed by vapor deposition of 50 nm using PCBBiF.
- a light-emitting layer 913 was formed over the hole-transport layer 912 .
- the electron-transporting layer 914 was formed over the light-emitting layer 913 .
- the electron injection layer 915 was formed over the electron transport layer 914 .
- the electron injection layer 915 was formed by vapor deposition using lithium fluoride (LiF) to a thickness of 1 nm.
- a second electrode 903 was formed over the electron injection layer 915 .
- the second electrode 903 was formed by vapor deposition of aluminum so as to have a thickness of 200 nm. Note that the second electrode 903 functions as a cathode in this embodiment.
- the light-emitting device 1 having the EL layer sandwiched between the pair of electrodes was formed on the substrate 900 .
- the hole-injection layer 911, the hole-transport layer 912, the light-emitting layer 913, the electron-transport layer 914, and the electron-injection layer 915 described in the above steps are functional layers forming the EL layer in one embodiment of the present invention.
- a vapor deposition method using a resistance heating method was used in all cases.
- the fabricated light-emitting device 1 was sealed in a glove box in a nitrogen atmosphere so as not to be exposed to the atmosphere (a sealant was applied around the device, and UV treatment and heat treatment at 80° C. for 1 hour were performed at the time of sealing).
- Comparative light-emitting device 1 is fabricated in the same manner as light-emitting device 1 by vapor-depositing 2mpPCBPDBq to a thickness of 10 nm and then evaporating NBPhen to a thickness of 20 nm instead of co-evaporating 2mpPCBPDBq and NBPhen as the electron transport layer 914 . did.
- the luminance-current density characteristics of the light-emitting device 1 and the comparative light-emitting device 1 are shown in FIG. 21, the current efficiency-luminance characteristics are shown in FIG. 22, the luminance-voltage characteristics are shown in FIG. 23, and the current-voltage characteristics are shown in FIG. - Luminance characteristics are shown in FIG. 25 and emission spectra are shown in FIG. 26, respectively.
- Table 3 shows the main characteristics of light-emitting device 1 and comparative light-emitting device 1 near 1000 cd/m 2 .
- a spectroradiometer (SR-UL1R, manufactured by Topcon Corporation) was used to measure luminance, CIE chromaticity, and emission spectrum at room temperature.
- FIG. 27 shows the results of the reliability test of Light-Emitting Device 1 and Comparative Light-Emitting Device 1.
- FIG. 27 the vertical axis indicates the normalized luminance (%) when the initial luminance is 100%, and the horizontal axis indicates the driving time (h) of the device.
- each light-emitting device was subjected to a driving test at a constant current density of 50 mA/cm 2 .
- FIG. 27 The results shown in FIG. 27 indicate that light-emitting device 1, which is one embodiment of the present invention, has good reliability equivalent to that of comparative light-emitting device 1.
- the obtained solid was purified by sublimation by the train sublimation method. Sublimation purification was performed by heating 1.3 g of the obtained solid at 340° C. for 15 hours. The pressure during sublimation purification was 3.9 Pa, and the argon flow rate was 15 sccm. After purification by sublimation, 1.5 g of the desired solid was obtained with a recovery rate of 85%.
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Abstract
Description
図2Aおよび図2Bは、実施の形態に係る発光デバイスの構成を説明する図である。
図3Aおよび図3Bは、実施の形態に係る発光装置を説明する図である。
図4Aおよび図4Bは、実施の形態に係る発光装置の製造方法を説明する図である。
図5A乃至図5Cは、実施の形態に係る発光装置の製造方法を説明する図である。
図6A乃至図6Cは、実施の形態に係る発光装置の製造方法を説明する図である。
図7Aおよび図7Bは、実施の形態に係る発光装置の製造方法を説明する図である。
図8は、実施の形態に係る発光装置を説明する図である。
図9Aおよび図9Bは、実施の形態に係る発光装置を説明する図である。
図10Aおよび図10Bは、実施の形態に係る発光装置を説明する図である。
図11Aおよび図11Bは、実施の形態に係る発光装置を説明する図である。
図12Aおよび図12Bは、実施の形態に係る発光装置を説明する図である。
図13A乃至図13Eは、実施の形態に係る電子機器を説明する図である。
図14A乃至図14Eは、実施の形態に係る電子機器を説明する図である。
図15Aおよび図15Bは、実施の形態に係る電子機器を説明する図である。
図16Aおよび図16Bは、実施の形態に係る電子機器を説明する図である。
図17は、実施の形態に係る電子機器を説明する図である。
図18A乃至図18Eは、実施例に係る写真である。
図19A乃至図19Dは、実施例に係る写真である。
図20は、実施例に係る発光デバイスの構成を説明する図である。
図21は発光デバイス1および比較発光デバイス1の輝度−電流密度特性を示す図である。
図22は発光デバイス1および比較発光デバイス1の電流効率−輝度特性を示す図である。
図23は発光デバイス1および比較発光デバイス1の輝度−電圧特性を示す図である。
図24は発光デバイス1および比較発光デバイス1の電流−電圧特性を示す図である。
図25は発光デバイス1および比較発光デバイス1の外部量子効率−輝度特性を示す図である。
図26は発光デバイス1および比較発光デバイス1の発光スペクトルを示す図である。
図27は発光デバイス1および比較発光デバイス1の信頼性を示す図である。
本実施の形態では、本発明の一態様の発光デバイスの構成について、図1を参照しながら説明する。
本実施の形態では、実施の形態1で示した有機化合物を用いた発光デバイスについて、図2Aおよび図2Bを用いて説明する。
図2Aおよび図2Bに示す発光デバイスは、一対の電極間にEL層を挟んで構成される構造(シングル構造)である。
第1の電極101および第2の電極102を形成する材料としては、電極の機能が満たせるのであれば、以下に示す材料を適宜組み合わせて用いることができる。例えば、金属、合金、電気伝導性化合物、およびこれらの混合物などを適宜用いることができる。具体的には、In−Sn酸化物(ITOともいう)、In−Si−Sn酸化物(ITSOともいう)、In−Zn酸化物、In−W−Zn酸化物が挙げられる。その他、アルミニウム(Al)、チタン(Ti)、クロム(Cr)、マンガン(Mn)、鉄(Fe)、コバルト(Co)、ニッケル(Ni)、銅(Cu)、ガリウム(Ga)、亜鉛(Zn)、インジウム(In)、スズ(Sn)、モリブデン(Mo)、タンタル(Ta)、タングステン(W)、パラジウム(Pd)、金(Au)、白金(Pt)、銀(Ag)、イットリウム(Y)、ネオジム(Nd)などの金属、およびこれらを適宜組み合わせて含む合金を用いることもできる。その他、上記例示のない元素周期表の第1族または第2族に属する元素(例えば、リチウム(Li)、セシウム(Cs)、カルシウム(Ca)、ストロンチウム(Sr))、ユウロピウム(Eu)、イッテルビウム(Yb)などの希土類金属およびこれらを適宜組み合わせて含む合金、その他グラフェン等を用いることができる。
正孔注入層111は、陽極である第1の電極101からEL層103に正孔(ホール)を注入する層であり、有機アクセプター材料、または正孔注入性の高い材料を含む層である。
正孔輸送層112は、正孔注入層111によって、第1の電極101から注入された正孔を発光層113に輸送する層である。なお、正孔輸送層112は、正孔輸送性材料を含む層である。従って、正孔輸送層112には、正孔注入層111に用いることができる正孔輸送性材料を用いることができる。
発光層113は、発光物質を含む層である。なお、発光層113に用いることができる発光物質としては、青色、紫色、青紫色、緑色、黄緑色、黄色、橙色、赤色などの発光色を呈する物質を適宜用いることができる。また、発光層を複数有する場合には、各発光層に異なる発光物質を用いることにより異なる発光色を呈する構成(例えば、補色の関係にある発光色を組み合わせて得られる白色発光)とすることができる。さらに、一つの発光層が異なる発光物質を有する積層構造としてもよい。
発光層113に用いることのできる、一重項励起エネルギーを発光に変える発光物質としては、以下に示す蛍光を発する物質(蛍光発光物質)が挙げられる。例えば、ピレン誘導体、アントラセン誘導体、トリフェニレン誘導体、フルオレン誘導体、カルバゾール誘導体、ジベンゾチオフェン誘導体、ジベンゾフラン誘導体、ジベンゾキノキサリン誘導体、キノキサリン誘導体、ピリジン誘導体、ピリミジン誘導体、フェナントレン誘導体、ナフタレン誘導体などが挙げられる。特にピレン誘導体は発光量子収率が高いので好ましい。ピレン誘導体の具体例としては、N,N’−ビス(3−メチルフェニル)−N,N’−ビス3[−(9−フェニル−9H−フルオレン−9−イル)フェニル]ピレン−1,6−ジアミン(略称:1,6mMemFLPAPrn)、N,N’−ジフェニル−N,N’−ビス[4−(9−フェニル−9H−フルオレン−9−イル)フェニル]ピレン−1,6−ジアミン(略称:1,6FLPAPrn)、N,N’−ビス(ジベンゾフラン−2−イル)−N,N’−ジフェニルピレン−1,6−ジアミン(略称:1,6FrAPrn)、N,N’−ビス(ジベンゾチオフェン−2−イル)−N,N’−ジフェニルピレン−1,6−ジアミン(略称:1,6ThAPrn)、N,N’−(ピレン−1,6−ジイル)ビス[(N−フェニルベンゾ[b]ナフト[1,2−d]フラン)−6−アミン](略称:1,6BnfAPrn)、N,N’−(ピレン−1,6−ジイル)ビス[(N−フェニルベンゾ[b]ナフト[1,2−d]フラン)−8−アミン](略称:1,6BnfAPrn−02)、N,N’−(ピレン−1,6−ジイル)ビス[(6,N−ジフェニルベンゾ[b]ナフト[1,2−d]フラン)−8−アミン](略称:1,6BnfAPrn−03)などが挙げられる。
次に、発光層113に用いることのできる、三重項励起エネルギーを発光に変える発光物質としては、例えば、燐光を発する物質(燐光発光物質)、または熱活性化遅延蛍光を示す熱活性化遅延蛍光(Thermally activated delayed fluorescence:TADF)材料が挙げられる。
青色または緑色を呈し、発光スペクトルのピーク波長が450nm以上570nm以下である燐光発光物質としては、以下のような物質が挙げられる。
緑色または黄色を呈し、発光スペクトルのピーク波長が495nm以上590nm以下である燐光発光物質としては、以下のような物質が挙げられる。
黄色または赤色を呈し、発光スペクトルのピーク波長が570nm以上750nm以下である燐光発光物質としては、以下のような物質が挙げられる。
また、TADF材料としては、以下に示す材料を用いることができる。TADF材料とは、S1準位とT1準位との差が小さく(好ましくは、0.2eV以下)、三重項励起状態をわずかな熱エネルギーによって一重項励起状態にアップコンバート(逆項間交差)が可能で、一重項励起状態からの発光(蛍光)を効率よく呈する材料のことである。また、熱活性化遅延蛍光が効率良く得られる条件としては、三重項励起エネルギー準位と一重項励起エネルギー準位のエネルギー差が0eV以上0.2eV以下、好ましくは0eV以上0.1eV以下であることが挙げられる。また、TADF材料における遅延蛍光とは、通常の蛍光と同様のスペクトルを持ちながら、寿命が著しく長い発光をいう。その寿命は、1×10−6秒以上、好ましくは1×10−3秒以上である。
発光層113に用いる発光物質が蛍光発光物質である場合、組み合わせる有機化合物(ホスト材料)として、一重項励起状態のエネルギー準位が大きく、三重項励起状態のエネルギー準位が小さい有機化合物、または蛍光量子収率が高い有機化合物を用いるのが好ましい。したがって、このような条件を満たす有機化合物であれば、本実施の形態で示す、正孔輸送性材料(前述)または電子輸送性材料(後述)等を用いることができる。
また、発光層113に用いる発光物質が燐光発光物質である場合、組み合わせる有機化合物(ホスト材料)として、発光物質の三重項励起エネルギー(基底状態と三重項励起状態とのエネルギー差)よりも三重項励起エネルギーの大きい有機化合物を選択すれば良い。なお、励起錯体を形成させるべく複数の有機化合物(例えば、第1のホスト材料、および第2のホスト材料(またはアシスト材料ともいう)等)を発光物質と組み合わせて用いる場合は、これらの複数の有機化合物を燐光発光物質と混合して用いることが好ましい。
電子輸送層114は、後述する電子注入層115によって第2の電極102から注入された電子を発光層113に輸送する層である。なお、電子輸送層114は、電子輸送性材料を含む層である。電子輸送層114に用いる電子輸送性材料は、電界強度[V/cm]の平方根が600における電子移動度が、1×10−6cm2/Vs以上の電子移動度を有する物質が好ましい。なお、正孔よりも電子の輸送性の高い物質であれば、これら以外のものを用いることができる。また、電子輸送層114は、単層でも機能するが、本発明の一態様では、2層以上の積層構造とすることが好ましい。なお、電子輸送層114を積層構造とした場合、実施の形態1で説明したように複素芳香族化合物と有機化合物、または複数種の複素芳香族化合物を有する(好ましくは混合膜を有する)電子輸送層は、それ以外の構成を有する電子輸送層に比べて高い耐熱性を有するため、複素芳香族化合物と有機化合物、または複数種の複素芳香族化合物を有する電子輸送層上でフォトリソ工程を行うことにより、熱工程によるデバイス特性への影響を抑制することができる。
電子輸送層114に用いることができる電子輸送性材料としては、電子輸送性の高い有機化合物である、複素芳香族化合物を用いることができる。なお、複素芳香族化合物とは、環の中に少なくとも2種類の異なる元素を含む環式化合物である。なお、環構造としては、3員環、4員環、5員環、6員環等が含まれるが、特に5員環、または、6員環が好ましく、含まれる元素としては、炭素の他に窒素、酸素、または硫黄などのいずれか一又は複数を含む複素芳香族化合物が好ましい。特に窒素を含む複素芳香族化合物(含窒素複素芳香族化合物)が好ましく、含窒素複素芳香族化合物、またはこれを含むπ電子不足型複素芳香族化合物等の電子輸送性の高い材料(電子輸送性材料)を用いることが好ましい。
電子注入層115は、電子注入性の高い物質を含む層である。また、電子注入層115は、第2の電極102からの電子の注入効率を高めるための層であり、第2の電極102に用いる材料の仕事関数の値と、電子注入層115に用いる材料のLUMO準位の値とを比較した際、その差が小さい(0.5eV以下)材料を用いることが好ましい。従って、電子注入層115には、リチウム、セシウム、フッ化リチウム(LiF)、フッ化セシウム(CsF)、フッ化カルシウム(CaF2)、8−(キノリノラト)リチウム(略称:Liq)、2−(2−ピリジル)フェノラトリチウム(略称:LiPP)、2−(2−ピリジル)−3−ピリジノラトリチウム(略称:LiPPy)、4−フェニル−2−(2−ピリジル)フェノラトリチウム(略称:LiPPP)、リチウム酸化物(LiOx)、炭酸セシウム等のようなアルカリ金属、アルカリ土類金属、またはこれらの化合物を用いることができる。また、フッ化エルビウム(ErF3)、イッテルビウム(Yb)のような希土類金属化合物を用いることができる。また、電子注入層115にエレクトライドを用いてもよい。エレクトライドとしては、例えば、カルシウムとアルミニウムの混合酸化物に電子を高濃度添加した物質等が挙げられる。なお、上述した電子輸送層114を構成する物質を用いることもできる。
本実施の形態で示した発光デバイスは、様々な基板上に形成することができる。なお、基板の種類は、特定のものに限定されることはない。基板の一例としては、半導体基板(例えば単結晶基板又はシリコン基板)、SOI基板、ガラス基板、石英基板、プラスチック基板、金属基板、ステンレス・スチル基板、ステンレス・スチル・ホイルを有する基板、タングステン基板、タングステン・ホイルを有する基板、可撓性基板、貼り合わせフィルム、繊維状の材料を含む紙、又は基材フィルムなどが挙げられる。
本実施の形態では、本発明の一態様である発光装置(表示パネルともいう)の具体的な構成例、および製造方法について説明する。
図3Aに示す発光装置700は、発光デバイス550B、発光デバイス550G、発光デバイス550R、および隔壁528を有する。また、発光デバイス550B、発光デバイス550G、発光デバイス550R、および隔壁528は、第1の基板510上に設けられた機能層520上に形成される。機能層520には、複数のトランジスタで構成された駆動回路GD、駆動回路SDなどの他、これらを電気的に接続する配線等が含まれる。なお、これらの駆動回路は、一例として、発光デバイス550B、発光デバイス550G、および発光デバイス550Rと、それぞれ電気的に接続され、これらを駆動することができる。また、発光装置700は、機能層520および各発光デバイス上に絶縁層705を備え、絶縁層705は、第2の基板770と機能層520とを貼り合わせる機能を有する。また、駆動回路GD、駆動回路SDについては、実施の形態4で後述する。
図4Aに示すように、電極551B、電極551G、および電極551Rを形成する。例えば、第1の基板510上に形成された機能層520上に導電膜を形成し、フォトリソグラフィ法を用いて、所定の形状に加工する。
図8に示す発光装置700は、発光デバイス550B、発光デバイス550G、発光デバイス550R、および隔壁528を有する。また、発光デバイス550B、発光デバイス550G、発光デバイス550R、および隔壁528は、第1の基板510上に設けられた機能層520上に形成される。機能層520には、複数のトランジスタで構成された駆動回路GD、駆動回路SDなどの他、これらを電気的に接続する配線等が含まれる。なお、これらの駆動回路は、一例として、発光デバイス550B、発光デバイス550G、および発光デバイス550Rと、それぞれ電気的に接続され、これらを駆動することができる。
本実施の形態では、本発明の一態様である発光装置について図9A乃至図11Bを用いて説明する。なお、図9A乃至図11Bに示す発光装置700は、実施の形態2で示す発光デバイスを有する。また、本実施の形態で説明する発光装置700は、電子機器などの表示部に適用可能であることから表示パネルと呼ぶこともできる。
本実施の形態では、本発明の一態様の電子機器の構成について、図13A乃至図15Bにより説明する。
本実施の形態では、実施の形態2に記載の発光デバイスを照明装置として用いる構成について、図16により説明する。なお、図16Aは、図16Bに示す照明装置の上面図における線分e−fの断面図である。
本実施の形態では、本発明の一態様である発光装置、またはその一部である発光デバイスを適用して作製される照明装置の応用例について、図17を用いて説明する。
本実施例で示す発光デバイス1は、図20に示すように基板900上に形成された第1の電極901上に正孔注入層911、正孔輸送層912、発光層913、電子輸送層914および電子注入層915が順次積層され、電子注入層915上に第2の電極903が積層された構造を有する。
比較発光デバイス1は、電子輸送層914として2mpPCBPDBqと、NBPhenと、を共蒸着して形成する代わりに、2mpPCBPDBqを10nm蒸着した後、NBPhenを20nm蒸着して形成し、発光デバイス1と同様に作製した。
発光デバイス1および比較発光デバイス1の輝度−電流密度特性を図21に、電流効率−輝度特性を図22に、輝度−電圧特性を図23に、電流−電圧特性を図24に、外部量子効率−輝度特性を図25に、発光スペクトルを図26にそれぞれ示す。また、発光デバイス1および比較発光デバイス1の1000cd/m2付近における主な特性を表3に示す。なお、輝度、CIE色度、及び発光スペクトルの測定には分光放射計(トプコン社製、SR−UL1R)を用い、常温で測定した。
3−(4−ブロモフェニル)−9−フェニルカルバゾール6.9g(17mmol)と、ビス(ピナコレート)ジボラン4.4g(17mmol)と、2−ジ−tert−ブチルホスフィノ−2’,4’,6’−トリイソプロピルビフェニル(tBuXPhos)0.17g(0.4mmol)と、酢酸カリウム4.0g(40mmol)と、キシレン90mLと、を200mL三口フラスコに入れたのち、減圧脱気してから、系内を窒素気流下とした。この混合物を80℃に加熱した後、[1,1’−ビス(ジフェニルホスフィノ)フェロセン]パラジウム(II)ジクロリド(Pd(dppf)Cl2)0.17mg(0.2mmol)を加え、120℃で10時間撹拌した。
Claims (16)
- 第1の電極上にEL層を挟んで第2の電極を有し、
前記EL層は、発光層と、第1の電子輸送層と、第2の電子輸送層と、電子注入層と、を少なくとも有し、
前記発光層上に前記第1の電子輸送層を有し、
前記第1の電子輸送層上に前記第2の電子輸送層を有し、
前記発光層の側面、前記第1の電子輸送層の側面、および前記第2の電子輸送層の側面、と接して絶縁層を有し、
前記第2の電子輸送層上に前記電子注入層を有し、
前記絶縁層は、前記発光層の側面、前記第1の電子輸送層の側面、および前記第2の電子輸送層の側面と、前記電子注入層と、の間に位置し、
前記第2の電子輸送層は、少なくとも1つの複素芳香環を有する複素芳香族化合物と、前記複素芳香族化合物とは異なる有機化合物と、を有する発光デバイス。 - 第1の電極上にEL層を挟んで第2の電極を有し、
前記EL層は、発光層と、第1の電子輸送層と、第2の電子輸送層と、電子注入層と、を少なくとも有し、
前記発光層上に前記第1の電子輸送層を有し、
前記第1の電子輸送層上に前記第2の電子輸送層を有し、
前記発光層の側面、前記第1の電子輸送層の側面、および前記第2の電子輸送層の側面、と接して絶縁層を有し、
前記第2の電子輸送層上に前記電子注入層を有し、
前記絶縁層は、前記発光層の側面、前記第1の電子輸送層の側面、および前記第2の電子輸送層の側面と、前記電子注入層と、の間に位置し、
前記第2の電子輸送層は、少なくとも1つの複素芳香環を有する第1の複素芳香族化合物と、前記第1の複素芳香族化合物とは異なる有機化合物と、を有し、
前記第1の電子輸送層は、少なくとも1つの複素芳香環を有する第2の複素芳香族化合物と、を有する、発光デバイス。 - 請求項1または請求項2において、
前記有機化合物は、少なくとも1つの複素芳香環を有する発光デバイス。 - 請求項1乃至請求項3のいずれか一において、
前記複素芳香環は、ピリジン骨格、ジアジン骨格、トリアジン骨格、またはポリアゾール骨格のいずれか一を有する発光デバイス。 - 請求項1乃至請求項4のいずれか一において、
前記複素芳香環は、縮環構造を有する縮合複素芳香環である発光デバイス。 - 請求項5において、
前記縮合複素芳香環は、キノリン環、ベンゾキノリン環、キノキサリン環、ジベンゾキノキサリン環、キナゾリン環、ベンゾキナゾリン環、ジベンゾキナゾリン環、フェナントロリン環、フロジアジン環、ベンゾイミダゾール環、のいずれか一である発光デバイス。 - 請求項1乃至請求項6に記載の発光デバイスと、トランジスタ、または、基板と、を有する発光装置。
- 隣接する第1の発光デバイスと、第2の発光デバイスと、を有し、
前記第1の発光デバイスは、第1の電極上に第1のEL層を挟んで第2の電極を有し、
前記第1のEL層は、第1の発光層と、第1の電子輸送層と、第2の電子輸送層と、電子注入層と、を少なくとも有し、
前記第1の発光層上に前記第1の電子輸送層を有し、
前記第1の電子輸送層上に前記第2の電子輸送層を有し、
前記第1の発光層の側面、前記第1の電子輸送層の側面、および前記第2の電子輸送層の側面、と接して第1の絶縁層を有し、
前記第2の電子輸送層上に前記電子注入層を有し、
前記第1の絶縁層は、前記第1の発光層の側面、前記第1の電子輸送層の側面、および前記第2の電子輸送層の側面と、前記電子注入層と、の間に位置し、
前記第2の発光デバイスは、第3の電極上に第2のEL層を挟んで前記第2の電極を有し、
前記第2のEL層は、第2の発光層と、第3の電子輸送層と、第4の電子輸送層と、前記電子注入層と、を少なくとも有し、
前記第2の発光層上に前記第3の電子輸送層を有し、
前記第3の電子輸送層上に前記第4の電子輸送層を有し、
前記第2の発光層の側面および前記第3の電子輸送層の側面、と接して第2の絶縁層を有し、
前記第4の電子輸送層上に前記電子注入層を有し、
前記第2の絶縁層は、前記第2の発光層の側面および前記第3の電子輸送層の側面と、前記電子注入層と、の間に位置し、
前記第2の電子輸送層および第4の電子輸送層は、少なくとも1つの複素芳香環を有する複素芳香族化合物と、前記複素芳香族化合物とは異なる有機化合物と、を有する、発光装置。 - 隣接する第1の発光デバイスと、第2の発光デバイスと、を有し、
前記第1の発光デバイスは、第1の電極上に第1のEL層を挟んで第2の電極を有し、
前記第1のEL層は、第1の発光層と、第1の電子輸送層と、第2の電子輸送層と、電子注入層と、を少なくとも有し、
前記第1の発光層上に前記第1の電子輸送層を有し、
前記第1の電子輸送層上に前記第2の電子輸送層を有し、
前記第1の発光層の側面、前記第1の電子輸送層の側面、および前記第2の電子輸送層の側面、
と接して第1の絶縁層を有し、
前記第2の電子輸送層上に前記電子注入層を有し、
前記第1の絶縁層は、前記第1の発光層の側面、前記第1の電子輸送層の側面、および前記第2の電子輸送層の側面と、前記電子注入層と、の間に位置し、
前記第2の発光デバイスは、第3の電極上に第2のEL層を挟んで前記第2の電極を有し、
前記第2のEL層は、第2の発光層と、第3の電子輸送層と、第4の電子輸送層と、前記電子注入層と、を少なくとも有し、
前記第2の発光層上に前記第3の電子輸送層を有し、
前記第3の電子輸送層上に前記第4の電子輸送層を有し、
前記第2の発光層の側面および前記第3の電子輸送層の側面、と接して第2の絶縁層を有し、
前記第4の電子輸送層上に前記電子注入層を有し、
前記第2の絶縁層は、前記第2の発光層の側面および前記第3の電子輸送層の側面と、前記電子注入層と、の間に位置し、
前記第2の電子輸送層および第4の電子輸送層は、少なくとも1つの複素芳香環を有する第1の複素芳香族化合物と、前記第1の複素芳香族化合物とは異なる有機化合物と、を有し、
前記第1の電子輸送層および前記第3の電子輸送層は、少なくとも1つの複素芳香環を有する第2の複素芳香族化合物と、を有する、発光装置。 - 請求項8または請求項9において、
前記有機化合物は、少なくとも1つの複素芳香環を有する発光装置。 - 請求項8乃至請求項10のいずれか一において、
前記複素芳香環は、ピリジン骨格、ジアジン骨格、トリアジン骨格、またはポリアゾール骨格のいずれか一を有する発光装置。 - 請求項8乃至請求項11のいずれか一において、
前記複素芳香環は、縮環構造を有する縮合複素芳香環である発光装置。 - 請求項12において、
前記縮合複素芳香環は、キノリン環、ベンゾキノリン環、キノキサリン環、ジベンゾキノキサリン環、キナゾリン環、ベンゾキナゾリン環、ジベンゾキナゾリン環、フェナントロリン環、フロジアジン環、ベンゾイミダゾール環、のいずれか一である発光装置。 - 請求項8乃至請求項13のいずれか一において、
前記第2の電子輸送層は、第1の電子輸送層の側面、第3の電子輸送層の側面、前記第1の発光層の側面および前記第2の発光層の側面と、前記第2の電極と、の間に位置する、発光装置。 - 請求項8乃至請求項14のいずれか一に記載の発光装置と、検知部、入力部、または、通信部と、を有する電子機器。
- 請求項8乃至請求項14のいずれか一に記載の発光装置と、筐体と、を有する照明装置。
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KR20150038800A (ko) * | 2013-09-30 | 2015-04-09 | 엘지디스플레이 주식회사 | 대면적 유기발광 다이오드 표시장치 및 그 제조 방법 |
CN109509765A (zh) * | 2017-09-14 | 2019-03-22 | 黑牛食品股份有限公司 | 一种有机发光显示屏及其制造方法 |
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KR20150038800A (ko) * | 2013-09-30 | 2015-04-09 | 엘지디스플레이 주식회사 | 대면적 유기발광 다이오드 표시장치 및 그 제조 방법 |
CN109509765A (zh) * | 2017-09-14 | 2019-03-22 | 黑牛食品股份有限公司 | 一种有机发光显示屏及其制造方法 |
WO2020004086A1 (ja) * | 2018-06-25 | 2020-01-02 | ソニーセミコンダクタソリューションズ株式会社 | 有機el素子および有機el素子の製造方法 |
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