WO2022147919A1 - Spectromètre à large bande - Google Patents

Spectromètre à large bande Download PDF

Info

Publication number
WO2022147919A1
WO2022147919A1 PCT/CN2021/085492 CN2021085492W WO2022147919A1 WO 2022147919 A1 WO2022147919 A1 WO 2022147919A1 CN 2021085492 W CN2021085492 W CN 2021085492W WO 2022147919 A1 WO2022147919 A1 WO 2022147919A1
Authority
WO
WIPO (PCT)
Prior art keywords
flat glass
thickness
small
front surface
broadband spectrometer
Prior art date
Application number
PCT/CN2021/085492
Other languages
English (en)
Chinese (zh)
Inventor
陈利平
金镖
黄建军
胡海洋
廉哲
Original Assignee
苏州联讯仪器有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 苏州联讯仪器有限公司 filed Critical 苏州联讯仪器有限公司
Publication of WO2022147919A1 publication Critical patent/WO2022147919A1/fr

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12Generating the spectrum; Monochromators
    • G01J3/26Generating the spectrum; Monochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/20Filters
    • G02B5/28Interference filters

Definitions

  • the invention relates to a broadband spectrometer, which belongs to the technical field of light wavelength detection.
  • the purpose of the present invention is to provide a wide-band spectrometer, which does not increase the size of the optical path, has a wide detection spectral range and high measurement accuracy, achieves pm-level measurement accuracy, and reduces costs.
  • a broadband spectrometer comprising: an optical input port, a light shield, a beam collimator, a first flat glass, a second flat glass, at least two cylindrical lenses and at least two cylindrical lenses.
  • One side of the front surface of the first flat glass is provided with at least one small flat glass with a thickness and located in the sealed cavity, the other side of the front surface has a first reflective layer, and the thickness of the small flat glass is smaller than the thickness of the isolation frame , the back surface of the second flat glass has a second reflective layer, the surface of the small flat glass facing the second flat glass has a third reflective layer, and the light shield is arranged on the beam collimator and the first flat glass between the second flat glass and at least two linear photodetectors.
  • the number of the small flat glass is 2, and the thickness of one small flat glass is greater than the thickness of the other small flat glass.
  • the optical input port is an optical fiber input port.
  • the linear photodetector is a linear scanning image device.
  • the reflectivity of the first reflection layer, the second reflection layer and the third reflection layer is greater than 30%, and the transmittance is greater than 50%.
  • the shapes of the first flat glass, the second flat glass and the isolation frame are rectangles.
  • the present invention has the following advantages compared with the prior art:
  • an isolation frame with a hollow area in the center and a wedge angle is arranged between the first flat glass and the second flat glass, thereby forming a sealed cavity, on the front surface side of the first flat glass.
  • a small flat glass with at least one thickness and located in the sealed cavity is provided, the other side of the front surface has a first reflective layer, the thickness of the small flat glass is smaller than the thickness of the isolation frame, and the rear surface of the second flat glass has a second reflective layer , There is a third reflective layer on the surface of the small flat glass and the second flat glass.
  • Embodiment 3 is a schematic diagram of the decomposition structure of Embodiment 2 of the broadband spectrometer of the present invention.
  • connection should be understood in a broad sense, for example, it may be a fixed connection, a detachable connection, or an integral connection; it may be a mechanical connection or a Electrical connection; it can be directly connected, or indirectly connected through an intermediate medium, and it can be the internal connection of two components.
  • installation should be understood in a broad sense, for example, it may be a fixed connection, a detachable connection, or an integral connection; it may be a mechanical connection or a Electrical connection; it can be directly connected, or indirectly connected through an intermediate medium, and it can be the internal connection of two components.
  • Embodiment 1 A broadband spectrometer, comprising: an optical input port 1, a light shield 2, a beam collimator 3, a first flat glass 4, a second flat glass 5, 2 cylindrical lenses 6 and 2 linear photodetectors 7, between the first flat glass 4 and the second flat glass 5, an isolation frame 8 with a hollow area in the center and a wedge angle is arranged to form a sealed cavity, and the front surface of the first flat glass 4 arranged opposite to the rear surface of the second flat glass 5;
  • One side of the front surface of the first flat glass 4 is provided with a small flat glass 9 with a thickness and located in the sealed cavity, and the other side of the front surface has a first reflective layer 101, and the thickness of the small flat glass 9 is smaller than that of the isolation
  • the thickness of the frame 8 the rear surface of the second flat glass 5 has a second reflective layer 102, the surface of the small flat glass 9 facing the second flat glass 5 has a third reflective layer 103, and the light shield 2 is provided with between the beam collimator 3 and the first flat glass 4 or between the second flat glass 5 and at least two linear photodetectors 7 .
  • the above-mentioned optical input port 1 is an optical fiber input port.
  • the above-mentioned linear photodetector 7 is a linear scanning image device.
  • the reflectivity of the first reflective layer 101 , the second reflective layer 102 and the third reflective layer 103 is greater than 30%, and the transmittance is greater than 50%.
  • Embodiment 2 A broadband spectrometer, comprising: an optical input port 1, a light shield 2, a beam collimator 3, a first flat glass 4, a second flat glass 5, 2 cylindrical lenses 6 and 2 linear photodetectors 7, between the first flat glass 4 and the second flat glass 5, an isolation frame 8 with a hollow area in the center and a wedge angle is arranged to form a sealed cavity, and the front surface of the first flat glass 4 arranged opposite to the rear surface of the second flat glass 5;
  • One side of the front surface of the first flat glass 4 is provided with two small flat glasses 9 of thickness and located in the sealed cavity, and the other side of the front surface has a first reflective layer 101, and the thickness of the small flat glass 9 is less than The thickness of the isolation frame 8, wherein the thickness of one small flat glass 9 is greater than the thickness of the other small flat glass 9, the rear surface of the second flat glass 5 has a second reflective layer 102, the small flat glass 9 and the second The opposite surface of the flat glass 5 has a third reflective layer 103 , and the light shield 2 is disposed between the beam collimator 3 and the first flat glass 4 or between the second flat glass 5 and the two linear photodetectors 7 .
  • the above-mentioned optical input port 1 is an optical fiber input port.
  • the first flat glass 4 , the second flat glass 5 and the isolation frame 8 are rectangular in shape.
  • an isolation frame with a hollow area in the center and a wedge angle is arranged between the first flat glass and the second flat glass, so as to form a sealed cavity, and a front surface of the first flat glass is The side is provided with at least one small flat glass of thickness and located in the sealed cavity, the other side of the front surface has a first reflective layer, the thickness of the small flat glass is smaller than the thickness of the isolation frame, and the rear surface of the second flat glass has a second reflection layer There is a third reflective layer on the surface of the small flat glass facing the second flat glass.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

La présente invention concerne un spectromètre à large bande comprenant : un orifice d'entrée de lumière (1), un écran de protection contre la lumière (2), un collimateur de faisceau (3), un premier verre plat (4), un second verre plat (5), au moins deux lentilles cylindriques (6) et au moins deux photodétecteurs linéaires (7). Un cadre d'isolation (8) comportant une zone creuse au centre et doté d'un angle de coin est disposé entre le premier verre plat (4) et le second verre plat (5), de manière à former une cavité étanche. Une surface avant du premier verre plat (4) est disposée à l'opposé d'une surface arrière du second verre plat (5). Au moins un petit verre plat (9) ayant une épaisseur et situé à l'intérieur de la cavité étanche est disposé sur un côté de la surface avant du premier verre plat (4), et une première couche réfléchissante (101) est disposée sur l'autre côté de la surface avant. Une deuxième couche réfléchissante (102) est disposée sur la surface arrière du second verre plat (5). Une troisième couche réfléchissante (103) est disposée sur une surface du petit verre plat (9) opposée au second verre plat (5). Le spectromètre à large bande présente une large plage spectrale de mesure et une précision de mesure élevée, sans augmenter la taille d'un trajet de lumière.
PCT/CN2021/085492 2021-01-06 2021-04-03 Spectromètre à large bande WO2022147919A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN202120018933.9 2021-01-06
CN202120018933 2021-01-06

Publications (1)

Publication Number Publication Date
WO2022147919A1 true WO2022147919A1 (fr) 2022-07-14

Family

ID=82357054

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2021/085492 WO2022147919A1 (fr) 2021-01-06 2021-04-03 Spectromètre à large bande

Country Status (1)

Country Link
WO (1) WO2022147919A1 (fr)

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5144498A (en) * 1990-02-14 1992-09-01 Hewlett-Packard Company Variable wavelength light filter and sensor system
US5354989A (en) * 1992-12-28 1994-10-11 Advanced Fuel Research Inc. Superconducting detector assembly and apparatus utilizing same
US5784507A (en) * 1991-04-05 1998-07-21 Holm-Kennedy; James W. Integrated optical wavelength discrimination devices and methods for fabricating same
US20040032584A1 (en) * 2002-08-15 2004-02-19 Tokuyuki Honda Optical channel monitoring device
CN1498340A (zh) * 2001-03-16 2004-05-19 ��ѧͿ��ʵ�鹫˾ 基于可变滤波器的光学分光计
CN201331382Y (zh) * 2009-01-19 2009-10-21 杭州电子科技大学 一种阵列式微型光谱仪
CN104568826A (zh) * 2015-01-22 2015-04-29 天津大学 一种基于线性渐变滤光片的微型固化近红外光谱仪
CN110595616A (zh) * 2019-08-23 2019-12-20 南京理工大学 采用线性渐变滤光片和狭缝的高光谱成像装置及成像方法

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5144498A (en) * 1990-02-14 1992-09-01 Hewlett-Packard Company Variable wavelength light filter and sensor system
US5784507A (en) * 1991-04-05 1998-07-21 Holm-Kennedy; James W. Integrated optical wavelength discrimination devices and methods for fabricating same
US5354989A (en) * 1992-12-28 1994-10-11 Advanced Fuel Research Inc. Superconducting detector assembly and apparatus utilizing same
CN1498340A (zh) * 2001-03-16 2004-05-19 ��ѧͿ��ʵ�鹫˾ 基于可变滤波器的光学分光计
US20040032584A1 (en) * 2002-08-15 2004-02-19 Tokuyuki Honda Optical channel monitoring device
CN201331382Y (zh) * 2009-01-19 2009-10-21 杭州电子科技大学 一种阵列式微型光谱仪
CN104568826A (zh) * 2015-01-22 2015-04-29 天津大学 一种基于线性渐变滤光片的微型固化近红外光谱仪
CN110595616A (zh) * 2019-08-23 2019-12-20 南京理工大学 采用线性渐变滤光片和狭缝的高光谱成像装置及成像方法

Similar Documents

Publication Publication Date Title
JP7315557B2 (ja) 光共振器、表示パネル
CN102902061B (zh) 滤光器
KR20180105698A (ko) 근거리 광 증폭 모듈, 증폭 방법 및 증폭 시스템
WO2023093118A1 (fr) Lentille télécentrique et système d'émission et de réception de radar laser comprenant celle-ci
CN205385193U (zh) 一种激光光源
CN107728237B (zh) 抗眩及抗反射元件
US20240230953A1 (en) Relay redirector, display device and near-eye display system
US20240210689A1 (en) Image generator, head-up display and vehicle
WO2022147919A1 (fr) Spectromètre à large bande
JP3177318B2 (ja) 液晶表示装置
US10209616B2 (en) Mask plate
WO2022147918A1 (fr) Instrument de mesure de longueur d'onde de brouillage de grande précision
CN216012474U (zh) 宽波段光谱测量仪
CN212777926U (zh) 非接触操控式电热水器
CN210348187U (zh) 一种新型掩膜版
JP2898760B2 (ja) レセプタクル形半導体レ−ザモジュ−ル
CN216012477U (zh) 光通信用光谱测量仪
CN209992778U (zh) 一种液晶显示装置
CN216012505U (zh) 高可靠性光波长测量系统
CN110543079A (zh) 一种新型掩膜版
WO2020000776A1 (fr) Appareil optique
CN115223453B (zh) 一种阵列基板、显示面板及显示装置
US20240004173A1 (en) Optical assembly and optical apparatus
TW201520670A (zh) 具有抗反射鍍膜層之玻璃螢光體色輪
CN117374717B (zh) 一种无温漂的窄线宽激光器

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 21916969

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 21916969

Country of ref document: EP

Kind code of ref document: A1