WO2022052891A1 - Système et procédé d'inspection par rétrodiffusion - Google Patents

Système et procédé d'inspection par rétrodiffusion Download PDF

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Publication number
WO2022052891A1
WO2022052891A1 PCT/CN2021/116725 CN2021116725W WO2022052891A1 WO 2022052891 A1 WO2022052891 A1 WO 2022052891A1 CN 2021116725 W CN2021116725 W CN 2021116725W WO 2022052891 A1 WO2022052891 A1 WO 2022052891A1
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WIPO (PCT)
Prior art keywords
module
housing
flying spot
inspection system
detection module
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PCT/CN2021/116725
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English (en)
Chinese (zh)
Inventor
陈志强
李元景
吴万龙
唐晓
唐乐
沈宗俊
孙秀平
Original Assignee
同方威视技术股份有限公司
清华大学
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Publication of WO2022052891A1 publication Critical patent/WO2022052891A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/053—Investigating materials by wave or particle radiation by diffraction, scatter or reflection back scatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray

Definitions

  • the present invention relates to the field of X-ray inspection, in particular to a backscatter inspection system and method.
  • X-ray backscatter imaging technology has been widely used in the field of safety inspection of human body, goods and vehicles due to its advantages of low radiation dose, good safety and sensitivity to lightweight materials.
  • X-ray backscatter imaging technology obtains material images within a certain depth on the surface of the object by detecting the intensity of X-ray scattering by different materials.
  • the backscatter inspection system includes an X-ray source and a detector, wherein the X-rays emitted by the X-ray source are formed by a pencil beam forming device to form a pencil beam, and the surface of the object to be inspected is scanned point by point; the detector receives the scattering signal of the object to form the surface of the object depth image.
  • Existing portable backscatter inspection systems usually have a fixed functional mode. However, for different objects to be inspected, the fixed functional mode is difficult to adapt to the needs of various occasions. In some cases, there are higher requirements for the portability of the inspection system, and in some cases, there are higher requirements for the performance of image penetration and resolution. For example, for the inside of the wall and the metal with a certain thickness, a high-power, high-penetration inspection system is required to achieve sufficient penetration performance, and the inspection system that can meet the requirements is often difficult to achieve portability. When scanning and inspecting some thinner boxes or smaller-sized items, the requirements for penetration performance are not high, but the requirements for image resolution may be higher. At the same time, this situation may require greater portability of the inspection system for more flexible operation.
  • One aspect of the present invention provides a backscatter inspection system, comprising: one or more flying spot exit modules for emitting X-ray pencil beams, the flying spot exit modules have an exit side and include a first housing and a first connection portion, The first connecting part is connected to the first casing, the first casing includes a first slit on the exit side, and the X-ray pencil beam emitted by the flying spot exit module is emitted from the first slit; and one or more detection modules are used for Receiving X-rays backscattered from the object to be inspected, the detection module has an incident side and a receiving side and includes a second housing, two detectors disposed in the second housing, and a second connecting portion, the two detectors being spaced apart to A second slit is formed, the second slit penetrates the incident side and the receiving side, and the second connection portion is connected to the second housing, wherein the flying point emission module and the detection module are configured to be connectable through the first connection portion and the second connection portion.
  • the flying-spot extraction module and the detection module are configured such that when the flying-spot extraction module and the detection module are connected to each other, a second slit between the first slit of the flying-spot extraction module and the two detectors of the detection module is formed.
  • the slits are aligned so that the X-ray pencil beam emitted from the flying spot exit module can continuously pass through the first slit and the second slit and exit from the receiving side of the detection module.
  • the first connection part and the second connection part adopt any one of the following connection modes: fastener connection; hinge connection; slide groove connection; snap connection; or magnetic connection.
  • the first housing of the flying spot exit module includes a front panel, wherein the first slit is provided on the front panel.
  • the flying spot extraction module further includes a filter installed at the first slit of the front panel for changing the X-ray energy spectrum before the X-ray pencil beam is emitted from the flying spot extraction module.
  • the flying spot emission module further includes a first electrical connection terminal disposed on the first casing
  • the detection module further includes a second electrical connection terminal disposed on the second casing, wherein the flying spot emission module and the The detection module is configured such that when the flying-spot extraction module and the detection module are connected to each other, the first electrical connection terminal and the second electrical connection terminal are engaged with each other to achieve electrical connection and/or communication connection between the flying-spot extraction module and the detection module; or The flying spot emission module and the detection module are configured to communicate with each other through wireless communication.
  • the backscatter inspection system further includes a handle so that the backscatter inspection system can be operated by hand, wherein the handle is provided on the first housing or the second housing, and the handle is on the first housing or the second housing The position is adjustable.
  • the flying spot emission module includes a controller configured to generate a backscattered X-ray image according to the backscattered X-ray received by the detector.
  • the backscatter inspection system further includes a display for displaying the backscatter X-ray image generated by the controller, wherein the display is connected to and/or provided separately from the first housing.
  • the flying spot extraction module further includes an X-ray source and a pencil beam forming device disposed in the first housing, wherein the X-ray source is used to generate X-rays, and the pencil beam forming device is used to generate the X-ray source.
  • the X-rays are modulated into a rotating X-ray pencil beam.
  • Another aspect of the present invention provides a backscatter inspection method, including: providing a backscatter inspection system according to an embodiment of the present invention, which includes a plurality of flying spot emission modules and a plurality of detection modules; One of the flying spot ejection modules; select one of the multiple detection modules according to the detection requirements and the selected flying spot ejection module; detachably connect the selected flying spot ejection module and the selected detection module; use the connection The flying spot emission module and detection module are scanned and inspected.
  • a backscatter inspection system may include a detachable flying spot exit module and a detection module.
  • Different flying point emission modules and detection modules can meet different needs and adapt to different usage scenarios.
  • the combination of the flying spot emission module and the detection module can be flexibly selected to achieve a more ideal use state. Flying point emission module and detection module can be easily connected and removed. Therefore, the portability and operational flexibility of the backscatter inspection system can be improved.
  • the applicable scenarios of the backscatter inspection system can also be expanded, and the imaging quality and inspection accuracy of the backscatter inspection system can be improved.
  • FIG. 1 is a schematic diagram of a backscatter inspection system according to an embodiment of the present invention.
  • FIG. 2 is a schematic diagram of a fastener connection according to an embodiment of the present invention.
  • FIG 3 is a schematic diagram of a hinged connection according to an embodiment of the present invention.
  • FIG. 4 is a schematic diagram of a locking structure of a hinged connection according to an embodiment of the present invention.
  • FIG. 5 is a schematic diagram of a locking structure of a hinged connection according to an embodiment of the present invention.
  • FIG. 6 is a schematic diagram of a chute connection according to an embodiment of the present invention.
  • FIG. 7 is a schematic cross-sectional view of a chute connection according to an embodiment of the present invention.
  • FIG. 8 is a schematic diagram of a snap-fit connection according to an embodiment of the present invention.
  • FIG. 9 is a schematic diagram of a magnetic connection according to an embodiment of the present invention.
  • FIG. 10 is a schematic diagram of a backscatter inspection system with electrical connection terminals in accordance with an embodiment of the present invention.
  • FIG. 11 is a schematic diagram of a backscatter inspection system with a handle according to an embodiment of the present invention.
  • a portable backscatter inspection system may include a housing, an X-ray source, a pencil beam forming device, two detectors, a controller and a display, among others.
  • the X-ray source, pencil beam forming device, detector and controller are arranged inside the housing.
  • the X-ray source is located at the rear of the backscatter inspection system, the detector is located at the front, and the pencil beam forming device is located between the X-ray source and the detector.
  • An X-ray source is used to generate X-rays.
  • the pencil beam forming device is used to modulate the X-rays generated by the X-ray source into a rotating X-ray pencil beam.
  • the detector is used for receiving X-rays backscattered from the object to be inspected after the X-ray pencil beam modulated by the pencil beam forming device irradiates the object to be inspected.
  • the controller is configured to generate a backscattered X-ray image based on the backscattered X-ray received by the detector.
  • the display is used to display the backscattered X-ray image generated by the controller.
  • the X-ray source emits X-rays (such as wide-angle X-rays); the pencil beam forming device modulates the X-rays emitted by the X-ray source into a high-speed rotating X-ray pencil beam ; The X-ray pencil beam passes through the gap between the two detectors and finally irradiates on the object to be inspected.
  • the pencil beam forming device modulates the pencil beam so that its projection moves at a high speed along a straight line, thereby performing one-dimensional scanning of the object to be inspected.
  • the operator moves the backscatter inspection system in a direction perpendicular to the one-dimensional scanning direction, so that the backscatter inspection system scans through a certain area, and performs two-dimensional scanning of the object to be inspected.
  • the detector may receive X-rays backscattered from the object to be inspected during the scanning process and generate backscatter signals
  • the controller may acquire the backscatter signals from the detector and generate X-ray backscatter images, such as two-dimensional images with a certain depth.
  • the display can display the resulting X-ray backscattered image.
  • the outer surface of the backscatter inspection system adheres to the surface of the object to be inspected.
  • this portable backscatter inspection system integrates the X-ray source, the pencil beam forming device and the detector in one housing, so it can only provide a fixed function mode.
  • the backscatter inspection system includes a detachable flying spot emission module and a detection module, whereby different working modes of the backscatter inspection system can be switched through free combinations of different flying spot emission modules and different detection modules .
  • the backscatter inspection system according to the embodiment of the present invention can perform scanning inspection on objects, such as vehicles, building walls, or other objects that need to be identified for the safety of internal structures and internal items.
  • Backscatter inspection systems according to embodiments of the present invention are particularly suitable as portable backscatter inspection systems.
  • the backscatter inspection system may include a flying spot emission module 1 , a detection module 2 and a display 3 .
  • the flying spot emission module 1 is used to emit X-ray pencil beams.
  • the detection module 2 is configured to receive X-rays backscattered from the object to be inspected after the X-ray pencil beam emitted from the flying-point emission module 1 is irradiated to the object to be inspected.
  • the display 3 is used for displaying the generated backscattered X-ray image according to the backscattered X-ray received by the detection module 2 .
  • the flying spot extraction module 1 may include a housing 11 , an X-ray source 12 , a pencil beam forming device 13 , a controller 14 and a connection part 15 .
  • the X-ray source 12 , the pencil beam forming device 13 and the controller 14 may be provided inside the housing 11 .
  • the connection portion 15 is connected to the housing 11 for connection with a connection portion (described below) of the detection module 2 . It should be noted that Figure 1 shows the housing 11 in partial cross-section for ease of showing the components within the housing 11 .
  • the X-ray source 12 is used to generate X-rays.
  • the pencil beam forming device 13 is used to modulate the X-rays generated by the X-ray source 12 into a rotating X-ray pencil beam.
  • the pencil beam forming device 13 may take various forms, such as a rotary modulation device such as a disc type, a wheel type, and a column type.
  • the side that emits the X-ray pencil beam of the flying spot exit module 1 is the exit side.
  • the housing 11 includes a slit 16 on the exit side. The modulated X-ray pencil beam exits the flying spot exit module 1 from the slit 16 .
  • the X-ray source 12 is located at the rear of the backscatter inspection system, the slit 16 is located at the front, and the pencil beam forming device 13 is located between the X-ray source 12 and the slit 16 .
  • front and “front” refer to the side of the backscatter inspection system facing the object to be inspected, and “rear” and “rear” refer to the side of the backscatter inspection system that is remote from the object to be inspected.
  • the controller 14 is configured to generate a backscattered X-ray image according to the backscattered X-ray received by the detection module 2 .
  • the controller 14 may be disposed inside the casing 11 as shown in FIG. 1 , eg, disposed on the side of the casing 11 away from the pencil bundle forming device 13 , or may be disposed outside the casing 11 .
  • the controller 14 is connected in communication with the X-ray source 12, the detection module 2, the pencil beam forming device 13, etc., for example, by wired communication or wireless communication.
  • the housing 11 of the flying spot exit module 1 may include a front panel 17 .
  • the slit 16 is located on the front panel 17 .
  • the front panel 17 may be made of a material with an X-ray shielding effect, so that the scattering caused inside the flying spot exit module 1 before the X-ray pencil beam exits the slit 16 may be reduced to the detection module 2 In particular, the scattering reaching the back of the detection module 2 is effectively reduced.
  • the connection portion 15 may be provided on the front panel 17 .
  • the flying spot emission module 1 may further include a filter.
  • the filter is mounted at the slot 16 , for example at the slot 16 on the front panel 17 .
  • the filter can change the X-ray energy spectrum before the X-ray pencil beam is emitted from the flying spot exit module 1 . Thereby, the effective energy of the X-ray energy spectrum can be increased, and the performance of the backscatter inspection system, such as penetration and resolution, can be improved.
  • the filters can be of different materials and/or different thicknesses.
  • the detection module 2 may include a housing 21 , two detectors 22 and a connection part 23 .
  • the detector 22 is provided in the housing 21 .
  • the two detectors 22 are spaced apart such that a slit 24 is formed between the two detectors 22 .
  • the slit 24 is used for the X-ray pencil beam emitted from the flying spot extraction module 1 to pass through and reach the surface of the object to be inspected.
  • the detection module 2 includes an incident side and a receiving side.
  • the incident side of the detection module 2 is the side where the X-ray pencil beam emitted by the flying point exit module 1 enters the detection module 2, and the receiving side of the detection module 2 is the side facing the object to be inspected to receive backscattered X-rays.
  • the slit 24 penetrates the incident side and the receiving side of the detection module 2 .
  • the connection part 23 is connected to the housing 21 for connection with the connection part 15 of the flying point ejection module 1 . In some embodiments, as shown in FIG. 1 , the connecting portion 23 is provided on the incident side of the detection module 2 .
  • the flying spot emission module 1 and the detection module 2 may be detachably connected to each other through the respective connection parts 15 and 23 .
  • the slit 16 of the flying spot extraction module 1 is aligned with the slit 24 between the two detectors 22 of the detection module 2, namely the two slits 16 and 24 Form interconnected X-ray paths.
  • the X-ray pencil beam emitted from the flying spot emission module 1 can continuously pass through the slit 16 and the slit 24 and be emitted from the receiving side of the detection module 2, and finally reach the surface of the object to be inspected.
  • connection parts 15 and 23 of the flying-spot extraction module 1 and the detection module 2 can be detachably connected to the flying-spot extraction module 1 and the detection module 2 in various ways.
  • the connection parts 15 and 23 may adopt any one of the following connection methods: fastener connection, hinge connection, sliding groove connection, snap connection or magnetic connection, and the like.
  • the display 3 is used to display the backscatter X-ray image generated by the controller 14 .
  • the display 3 is communicatively connected to the controller 14, for example by wired or wireless communication.
  • the display 3 may be disposed outside the housing 11 , eg, separate from the housing 11 as shown in FIG. 1 , or the display 3 may be attached to the housing 11 , eg detachably.
  • the flying spot emission module 1 and the detection module 2 can be connected by bolts 51 and threaded holes 52 and so on to achieve detachable fastener connection.
  • the flying spot emission module 1 and the detection module 2 can be completely connected and fixed by fasteners.
  • the flying point ejection module 1 and the detection module 2 can also be positioned first through a partial chute, a card slot, etc., and then connected and fixed through fasteners.
  • FIG. 3 is a schematic diagram of a hinged connection according to an embodiment of the present invention.
  • the flying spot emission module 1 and the detection module 2 can be detachably connected by a hinge through the hinge shaft 53 and the clamping portion 54 .
  • the hinge shaft 53 can be fixed on one of the flying spot emission module 1 and the detection module 2, and the clamping part 54 can be fixed on the other.
  • the flying-point shooting module 1 and the detection module 2 can be rotated relative to each other through the hinge shaft 53 to achieve alignment of the respective slits.
  • the backscatter inspection system can also realize the fixing between the flying spot emission module 1 and the detection module 2 through various locking structures 55 .
  • the locking structure 55 may be disposed on a side away from the hinge shaft 53 and the clamping portion 54 on the opposite surface between the flying-point emission module 1 and the detection module 2 .
  • 4 is a schematic diagram of a locking structure of a hinged connection according to an embodiment of the present invention. As shown in FIG. 4 , the locking structure can adopt a ball-type lock 55A.
  • 5 is a schematic diagram of a locking structure of a hinge connection according to another embodiment of the present invention. As shown in FIG. 4, the locking structure may employ a locking pin 55C with a spring ball 55B.
  • FIG. 6 is a schematic diagram of a chute connection according to an embodiment of the present invention.
  • the flying spot ejection module 1 and the detection module 2 can be detachably connected by the chute through the chute 56 and the protruding slider 57 .
  • One of the flying spot ejection module 1 and the detection module 2 may include a chute 56 , and the other may include a slider 57 .
  • the detachable connection between the flying spot emission module 1 and the detection module 2 can be achieved by inserting the slider 57 into the sliding slot 56 .
  • the chute 56 and the sliding block 57 can be straight chute and straight sliding block, or, as shown in FIG.
  • the flying spot ejection module 1 and the detection module 2 can be detachably connected by a snap head 58 and a snap slot 59 .
  • One of the flying spot ejection module 1 and the detection module 2 may include a snap head 58 , and the other may include a snap slot 59 .
  • the snap head 58 can be stuck in the snap slot 59 and released from the snap slot 59 through elastic deformation, so as to realize the detachable connection between the flying spot shooting module 1 and the detection module 2 .
  • FIG. 9 is a schematic diagram of a magnetic connection according to an embodiment of the present invention.
  • the flying spot emission module 1 and the detection module 2 can be detachably connected by a magnetic body 61 .
  • the magnetic bodies 61 may be correspondingly disposed on the flying spot emission module 1 and the detection module 2 respectively. Through the magnetic attraction between different magnetic bodies 61 on the flying spot emission module 1 and the detection module 2, the detachable connection between the flying spot emission module 1 and the detection module 2 can be realized.
  • corresponding positioning structures may also be provided on the flying spot extraction module 1 and the detection module 2 to improve the distance between the flying spot extraction module 1 and the detection module 2 Connectivity and accuracy.
  • the flying spot emission module 1 and the detection module 2 may also implement communication connection and/or electrical connection.
  • 10 is a schematic diagram of a backscatter inspection system with electrical connection terminals in accordance with an embodiment of the present invention.
  • the flying spot emission module 1 may include electrical connection terminals 18 provided on the housing 11
  • the detection module 2 may include electrical connection terminals 25 provided on the housing 21 .
  • the electrical connection terminals 18 and 25 may be provided on the flying spot emission module 1 and the detection module 2 corresponding to each other.
  • the electrical connection terminals 18 and 25 can be engaged with each other, thereby realizing the communication between the flying spot emission module 1 and the detection module 2 connection and/or electrical connection.
  • the flying spot emission module 1 and the detection module 2 may also be connected by wireless communication.
  • the flying spot emission module 1 and the detection module 2 can be connected by wireless communication through WIFI, NFC, Bluetooth, and the like.
  • the X-ray signals collected by the detection module 2 by receiving the backscattered X-rays can be transmitted to the controller 14 of the flying spot emission module 1 to generate a backscattered image .
  • the detection module 2 may further include a preamplifier 26 for shaping and amplifying the X-ray signal received by the detector 22 .
  • the backscatter inspection system may further comprise a handle 5 for hand-held operation.
  • the handle 5 can be disposed on the housing 11 of the flying spot emission module 1 or the housing 21 of the detection module 2 .
  • the position of the handle 5 on the backscatter inspection system is adjustable.
  • the center of gravity of the installed backscatter inspection system may be different.
  • the position of the handle 15 can be adjusted according to the center of gravity of the backscatter inspection system, so as to improve the comfort and stability of the operator in the process of holding the backscatter inspection system for scanning inspection.
  • the backscatter inspection system may include a plurality of flying spot emission modules 1 and/or a plurality of detection modules 2 .
  • Different flying spot ejection modules 1 can provide different functions. For different usage scenarios, different flying point ejection modules 1 can be selected.
  • Different flying-spot emission modules 1 may have different X-ray energy, current, flying-spot scanning opening angle, and the like.
  • the flying spot emission module 1 with a low-power X-ray source can provide better portability and facilitate single-person operation.
  • the flying spot emission module 1 with a high-power X-ray source can achieve better penetration, resolution and other performances, but has poor portability, and can be operated with assistance such as a robotic arm.
  • the detection modules 2 can also provide different functions.
  • the low-energy detection module 2 is more efficient for low-energy X-rays, while the high-energy detection module 2 is more efficient for high-energy X-rays.
  • the large-sized detection module 2 has better spatial coverage for scattered rays, while the small-sized detection module 2 can be used in a narrower space.
  • different flying spot emission modules 1 and different detection modules 2 may all use the same connection mode, which is convenient for mutual switching and matching.
  • the controller 14 can have several built-in typical functional modes, and can provide suitable functional modes according to the selected flying spot emission module 1 and detection module 2, the type of the object to be inspected, etc., for example, including X-ray energy, detector gain, etc.
  • Embodiments of the present invention also provide a backscatter inspection method using the above-mentioned backscatter inspection system, wherein the backscatter inspection system includes a plurality of flying spot emission modules 1 and a plurality of detection modules 2 .
  • the backscatter inspection method may include the following steps: selecting a flying spot emission module 1 according to the flying spot emission requirements (for example, required portability, penetration performance, resolution performance, the material of the object to be inspected, etc.); according to the detection requirements (for example, the required space coverage, the size of the object to be inspected, etc.) and the selected flying spot extraction module 1, and one detection module 2 is selected; the selected flying spot extraction module 1 and the detection module 2 are detachably connected to each other; and Use the connected flying spot emission module 1 and detection module 2 for scanning inspection.
  • the backscatter inspection method may further set a suitable functional mode according to scanning requirements (eg, the type of the object to be inspected, etc.).
  • a backscatter inspection system may include a detachable flying spot exit module and a detection module.
  • Different flying point emission modules and detection modules can meet different needs and adapt to different usage scenarios.
  • the combination of the flying spot emission module and the detection module can be flexibly selected to achieve a more ideal use state. Flying point emission module and detection module can be easily connected and removed. Therefore, the portability and operational flexibility of the backscatter inspection system can be improved.
  • the applicable scenarios of the backscatter inspection system can also be expanded, and the imaging quality and inspection accuracy of the backscatter inspection system can be improved.

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  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

L'invention concerne un système d'inspection par rétrodiffusion comprenant : un ou plusieurs modules d'émission de points de vol (1), le ou les modules d'émission de points de vol (1) présentant un côté d'émission et comprenant un premier logement (11) et une première partie de liaison (15) reliée au premier logement (11), et le premier logement (11) comprenant une première fente (16) située sur le côté d'émission ; et un ou plusieurs modules de détection (2), le ou les modules de détection (2) présentant un côté incident et un côté récepteur, et comprenant un second logement (21) et deux détecteurs (22) et des secondes parties de liaison (23) prévues dans le second logement (21), les deux détecteurs (22) étant disposés de manière espacée de façon à former une seconde fente (24), la seconde fente (24) pénétrant le côté incident et le côté récepteur, et les secondes parties de liaison (23) étant reliées au second logement (21). Le module d'émission de points de vol (1) et le module de détection (2) peuvent être reliés de manière détachable l'un à l'autre à l'aide de la première partie de liaison (15) et des secondes parties de liaison (23). Lorsque le module d'émission de points de vol (1) et le module de détection (2) sont reliés l'un à l'autre, la première fente (16) est alignée avec la seconde fente (24), de telle sorte qu'un faisceau étroit à rayons X envoyé par le module d'émission de points de vol (1) peut traverser en continu la première fente (16) et la seconde fente (24) et être émis par le côté récepteur du module de détection (2). La présente invention concerne en outre un procédé d'inspection par rétrodiffusion utilisant un système d'inspection par rétrodiffusion. La portabilité et la flexibilité opérationnelle du système d'inspection par rétrodiffusion peuvent être améliorées, les scénarios applicables du système d'inspection par rétrodiffusion peuvent être élargis et la qualité d'imagerie et la précision d'inspection du système d'inspection par rétrodiffusion peuvent être améliorées.
PCT/CN2021/116725 2020-09-11 2021-09-06 Système et procédé d'inspection par rétrodiffusion WO2022052891A1 (fr)

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