WO2022004006A1 - Tilt measuring device and tilt measuring method - Google Patents

Tilt measuring device and tilt measuring method Download PDF

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Publication number
WO2022004006A1
WO2022004006A1 PCT/JP2020/047971 JP2020047971W WO2022004006A1 WO 2022004006 A1 WO2022004006 A1 WO 2022004006A1 JP 2020047971 W JP2020047971 W JP 2020047971W WO 2022004006 A1 WO2022004006 A1 WO 2022004006A1
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WO
WIPO (PCT)
Prior art keywords
laser beam
measurement object
laser
rotation axis
inclination
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PCT/JP2020/047971
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French (fr)
Japanese (ja)
Inventor
修之 牧野
浩二 村上
昂志 橘▲高▼
Original Assignee
日本電産株式会社
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Application filed by 日本電産株式会社 filed Critical 日本電産株式会社
Priority to JP2022533033A priority Critical patent/JPWO2022004006A1/ja
Priority to CN202080102462.8A priority patent/CN115917247A/en
Publication of WO2022004006A1 publication Critical patent/WO2022004006A1/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/26Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes

Definitions

  • This disclosure relates to a tilt measuring device and a tilt measuring method.
  • a conventional multipoint angle measuring device includes a rotating support for measuring the angle of rotation of a reference plane, an XY table attached to the rotating support, an X-ray table having a movable part, an X-ray source having a fixed radiation direction, and a receiving tube (for example,). , Patent Document 1). Then, two laser focus displacement meters each having a light source are installed above the crystal plate. An angle calculator is connected to the laser focus displacement meter. It was
  • the laser focus displacement meter measures the displacement in the direction perpendicular to the main surface at two points on the crystal plate. Then, the angle calculator calculates the slope between the two points by a trigonometric function from the preset distance between the light sources and the displacement difference between the two points. That is, the deviation angle from the reference plane between the two points of the crystal plate is obtained.
  • two laser focus displacement meters are prepared to calculate the inclination between two points. Therefore, for example, two laser focus displacement meters are additionally required to calculate the slope between the other two points. That is, four laser focus displacement meters are required. It was
  • the present disclosure has been made in view of the above problems, and the purpose of the present disclosure is to reduce the number of mounted laser displacement meters and to determine the inclination of the object to be measured around the rotation axis for each of a plurality of different rotation axes. It is an object of the present invention to provide a tilt measuring device and a tilt measuring method capable of measuring.
  • the exemplary tilt measuring device of the present disclosure measures the tilt of the object to be measured.
  • the tilt measuring device includes a first laser displacement meter, a second laser displacement meter, and a reflection member.
  • the first laser displacement meter irradiates the measurement object with the first laser beam and measures the displacement of the measurement object.
  • the second laser displacement meter irradiates the measurement object with the second laser beam and measures the displacement of the measurement object.
  • the reflecting member is located at a retracted position or an approaching position with respect to the optical path of the first laser beam and the optical path of the second laser beam.
  • the first laser displacement meter and the second laser displacement meter measure the displacement of the object to be measured in both the case where the reflection member is located at the retracted position and the case where the reflecting member is located at the approach position.
  • the reflecting member changes the traveling directions of the first laser beam and the second laser beam at the approach position, and reflects the first laser beam and the second laser beam toward the measurement object. It was
  • the tilt of the object to be measured is measured.
  • the measurement object when the reflecting member is located at a retracted position with respect to the optical path of the first laser beam and the optical path of the second laser beam, the measurement object is irradiated with the first laser beam to measure the object.
  • the step of moving the reflecting member to the approach position with respect to the optical path of the first laser beam and the optical path of the second laser beam, and when the reflecting member is located at the approaching position, the measurement object is described as described above.
  • a tilt measuring device and a tilt measuring method capable of measuring the tilt around a rotation axis of a measurement object for each of a plurality of different rotation axes while suppressing the number of mounted laser displacement meters. Can be provided.
  • FIG. 1A is a perspective view showing a tilt measuring device when the reflective member according to the embodiment of the present disclosure is located at a retracted position.
  • FIG. 1B is a side view showing a state in which the reflective member according to the present embodiment is located at the retracted position.
  • FIG. 2A is a perspective view showing a tilt measuring device when the reflective member according to the present embodiment is located at an approach position.
  • FIG. 2B is a side view showing a state in which the reflective member according to the present embodiment is located at the approach position.
  • FIG. 3 is a block diagram showing an inclination measuring device according to the present embodiment.
  • FIG. 1A is a perspective view showing a tilt measuring device when the reflective member according to the embodiment of the present disclosure is located at a retracted position.
  • FIG. 1B is a side view showing a state in which the reflective member according to the present embodiment is located at the retracted position.
  • FIG. 2A is a perspective view showing a tilt measuring device when the reflective member according
  • FIG. 4A is a perspective view showing the relationship between the second laser beam and the third laser beam and the measurement object when the inclination measuring device according to the present embodiment measures the inclination of the measurement object around the third rotation axis. It is a figure.
  • FIG. 4B shows the second laser beam and the third laser beam viewed from the third rotation axis direction when the inclination measuring device according to the present embodiment measures the inclination of the object to be measured around the third rotation axis. It is a figure which shows the measurement object.
  • FIG. 5A is a perspective view showing the relationship between the first laser beam and the second laser beam and the measurement object when the inclination measuring device according to the present embodiment measures the inclination around the first rotation axis of the measurement object. It is a figure.
  • FIG. 5A is a perspective view showing the relationship between the first laser beam and the second laser beam and the measurement object when the inclination measuring device according to the present embodiment measures the inclination around the first rotation axis of the measurement object. It is a figure
  • FIG. 5B shows the first laser beam and the second laser beam viewed from the direction of the first rotation axis when the inclination measuring device according to the present embodiment measures the inclination of the object to be measured around the first rotation axis. It is a figure which shows the measurement object.
  • FIG. 6A is a perspective view showing the relationship between the first laser beam and the second laser beam and the measurement object when the inclination measuring device according to the present embodiment measures the inclination of the measurement object around the second rotation axis. It is a figure.
  • FIG. 6B shows the first laser beam and the second laser beam viewed from the second rotation axis direction when the inclination measuring device according to the present embodiment measures the inclination of the object to be measured around the second rotation axis.
  • FIG. 7 is a diagram showing a state when the measurement object according to the present embodiment rotates around the third rotation axis.
  • FIG. 8 is a diagram showing a state when the measurement object according to the present embodiment rotates around the first rotation axis.
  • FIG. 9 is a diagram showing a state when the measurement object according to the present embodiment rotates around the second rotation axis.
  • FIG. 10 is a side view showing a moving mechanism of the tilt measuring device according to the present embodiment.
  • FIG. 11 is a flowchart showing the first stage of the inclination measuring method according to the present embodiment.
  • FIG. 12 is a flowchart showing the latter stage of the inclination measuring method according to the present embodiment.
  • the same or corresponding parts are designated by the same reference numerals and the description is not repeated.
  • the X-axis, Y-axis, and Z-axis of the three-dimensional Cartesian coordinate system are appropriately described.
  • the X-axis and the Y-axis are parallel in the horizontal direction
  • the Z-axis is parallel in the vertical direction.
  • the positive direction of the Z axis indicates the upward direction
  • the negative direction of the Z axis indicates the downward direction.
  • first rotation shaft AX1, the second rotation shaft AX2, and the third rotation shaft AX3 will be described, but the first rotation shaft is oriented in a direction parallel to the first rotation shaft AX1.
  • the direction may be described as the direction
  • the direction parallel to the second rotation axis AX2 may be described as the second rotation axis direction
  • the direction parallel to the third rotation axis AX3 may be described as the third rotation axis direction.
  • parallel includes substantially parallel
  • orthogonal includes substantially orthogonal. It was
  • FIG. 1A is a perspective view showing the inclination measuring device 100.
  • the inclination measuring device 100 shown in FIG. 1A measures the inclination of the object to be measured 200. It was
  • the measurement object 200 is affected by an action from the outside of the measurement object 200, rotates around the first rotation shaft AX1, and tilts around the first rotation shaft AX1 with respect to the reference state.
  • the reference state of the measurement object 200 indicates a state in which the measurement object 200 is not affected by an external action. It was
  • the measurement object 200 reflects light.
  • the surface of the object to be measured 200 is a mirror surface made of a metal surface, a tape surface, or the like.
  • the object to be measured 200 preferably performs specular reflection, but is not particularly limited as long as it can reflect incident light. It was
  • the measurement target object 200 includes a first irradiation target object 201 and a second irradiation target object 203.
  • the second irradiation target 203 is fixed to the first irradiation target 201.
  • the second irradiation target object 203 protrudes with respect to the first irradiation target object 201.
  • the first irradiation target object 201 and the second irradiation target object 203 will be described later. It was
  • the tilt measuring device 100 includes a first laser displacement meter 1, a second laser displacement meter 2, and a reflection member 5. It was
  • the first laser displacement meter 1 irradiates the measurement object 200 with the first laser beam B1 to measure the displacement of the measurement object 200. Specifically, the first laser displacement meter 1 irradiates the measurement object 200 with the first laser beam B1 and receives the first laser beam B1 reflected by the measurement object 200 to receive the measurement object 200. Measure the displacement. It was
  • the second laser displacement meter 2 irradiates the measurement object 200 with the second laser beam B2 to measure the displacement of the measurement object 200. Specifically, the second laser displacement meter 2 irradiates the measurement object 200 with the second laser beam B2, receives the second laser beam B2 reflected by the measurement object 200, and receives the second laser beam B2 of the measurement object 200. Measure the displacement. It was
  • the reflective member 5 reflects light.
  • the reflective member 5 is, for example, a mirror.
  • the surface of the reflective member 5 is a mirror surface such as a metal surface or a tape surface.
  • the reflecting member 5 preferably performs specular reflection, but is not particularly limited as long as it can refract the incident light and emit it. It was
  • the reflection member 5 is located at the retracted position P1 or the approach position P2 with respect to the optical path of the first laser beam B1 and the optical path of the second laser beam B2.
  • the reflective member 5 is located at the retracted position P1.
  • the retracted position P1 indicates a position deviated from the optical path of the first laser beam B1 and the optical path of the second laser beam B2. That is, the retracted position P1 indicates a position where the first laser beam B1 and the second laser beam B2 do not enter the reflecting member 5.
  • the reflective member 5 is separated from the object to be measured 200. It was
  • the first laser displacement meter 1 is the measurement object 200 in a state where the measurement object 200 is tilted and stopped around the first rotation axis AX1 with respect to the reference state. Is irradiated with the first laser beam B1 and receives the first laser beam B1 reflected by the measurement object 200 to measure the displacement of the measurement object 200 from the reference state.
  • the second laser displacement meter 2 measures in a state where the measurement object 200 is tilted and stopped around the first rotation axis AX1 with respect to the reference state.
  • the inclination measuring device 100 makes the first rotation of the object to be measured 200 based on the measurement results by the first laser displacement meter 1 and the second laser displacement meter 2 when the reflecting member 5 is located at the retracted position P1.
  • the slope around the axis AX1 can be calculated. It was
  • FIG. 2A is a perspective view showing a tilt measuring device 100 when the reflective member 5 is located at the approach position P2.
  • FIG. 2B shows the state of the reflective member 5 located at the approach position P2.
  • the approach position P2 indicates a position on the optical path of the first laser beam B1 and on the optical path of the second laser beam B2. That is, the approach position P2 indicates a position where the first laser beam B1 and the second laser beam B2 are incident on the reflection member 5.
  • the reflective member 5 is not in contact with the object to be measured 200. It was
  • the reflecting member 5 changes the traveling directions of the first laser beam B1 and the second laser beam B2 at the approach position P2, and reflects the first laser beam B1 and the second laser beam B2 toward the measurement object 200.
  • first laser beam B10 the first laser beam B1 after being reflected by the reflecting member 5
  • second laser beam B20 the second laser beam B2 after being reflected by the reflecting member 5
  • the first laser displacement meter 1 is the measurement object 200 in a state where the measurement object 200 is tilted and stopped around the second rotation axis AX2 with respect to the reference state.
  • the reference state of the measurement object 200 is increased. Measure the displacement of.
  • the second laser displacement meter 2 measures in a state where the measurement object 200 is tilted and stopped around the second rotation axis AX2 with respect to the reference state.
  • the object 200 is irradiated with the second laser beam B20 via the reflection member 5, and the second laser beam B20 reflected by the measurement object 200 is received through the reflection member 5, whereby the object 200 is measured. Measure the displacement from the reference state.
  • the inclination measuring device 100 makes a second rotation of the object to be measured 200 based on the measurement results by the first laser displacement meter 1 and the second laser displacement meter 2 when the reflecting member 5 is located at the approach position P2.
  • the slope around the axis AX2 can be calculated. It was
  • the inclination measuring device 100 includes the reflecting member 5, so that the retracting position P1 and the approaching position P2 of the reflecting member 5 are on the measurement object 200.
  • the irradiation positions of the first laser beam B1 and the second laser beam B2 can be different.
  • the first laser displacement meter 1 and the second laser displacement meter 2 measure the displacement of the measurement object 200 in both the case where the reflection member 5 is located at the retracted position P1 and the case where the reflecting member 5 is located at the approach position P2. ..
  • the first rotation of the object to be measured 200 is based on the measurement results of the first laser displacement meter 1 and the second laser displacement meter 2 when the reflection member 5 is located at the retracted position P1 (FIGS. 1A and 1B). Not only can the inclination around the axis AX1 be calculated, but also based on the measurement results by the first laser displacement meter 1 and the second laser displacement meter 2 when the reflecting member 5 is located at the approach position P2 (FIGS. 2A and 2B). , The inclination of the object to be measured 200 around the second rotation axis AX2 can also be calculated. It was
  • two different laser displacement meters (first laser displacement meter 1, second laser displacement meter 2) have two different rotation axes (first rotation axis AX1, second rotation axis).
  • the inclination of the object to be measured 200 can be measured for each AX2).
  • the tilt measuring device according to the comparative example does not include the reflective member 5. Therefore, in the inclination measuring device according to the comparative example, the two laser displacement meters for measuring the inclination around the first rotation axis AX1 of the measurement object 200 and the second rotation axis AX2 of the measurement object 200 It is essential to have two laser displacement meters to measure the tilt around. That is, in the inclination measuring device according to the comparative example, in order to measure the inclination of the measurement object 200 with respect to each of the two rotation axes (first rotation axis AX1 and second rotation axis AX2), a total of four It is required to have a laser displacement meter.
  • the inclination measuring device 100 measures the inclination of the measurement object 200 with respect to each of the two rotation axes (first rotation axis AX1 and second rotation axis AX2). It suffices to include a total of two laser displacement meters (first laser displacement meter 1 and second laser displacement meter 2). It was
  • the first virtual plane 11, the second virtual plane 12, the virtual intersection surface 15, the first direction D1, and the second direction D2 are defined. It was
  • the first virtual plane 11 is a virtual plane including an optical path of the first laser beam B1 and an optical path of the second laser beam B2 when the reflecting member 5 is located at the retracted position P1.
  • the first rotation axis AX1 of the measurement object 200 intersects the first virtual plane 11. Therefore, the first rotation axis AX1 is included in, for example, the virtual intersection surface 15.
  • the virtual intersection surface 15 is a virtual plane that intersects the first laser beam B1 and the second laser beam B2 when the reflection member 5 is located at the retracted position P1. Therefore, according to the present embodiment, when the reflection member 5 is located at the retracted position P1, the first laser displacement meter 1 and the second laser displacement meter 2 measure the displacement of the measurement object 200, thereby imaginary crossing.
  • the inclination of the object to be measured 200 around the first rotation axis AX1 included in the surface 15 can be calculated. It was
  • the virtual intersection surface 15 is substantially orthogonal to the first laser beam B1 and the second laser beam B2. It was
  • the first direction D1 indicates a direction that intersects the first virtual plane 11.
  • the first direction D1 is substantially orthogonal to the first virtual plane 11.
  • the first direction D1 is, for example, substantially parallel to the horizontal direction. It was
  • the second virtual plane 12 is a virtual plane including the optical path of the first laser beam B10 and the optical path of the second laser beam B20 after being reflected by the reflecting member 5.
  • the second rotation axis AX2 of the measurement object 200 intersects the second virtual plane 12. Since the second rotation axis AX2 intersects the virtual intersection surface 15, it is not included in the virtual intersection surface 15. Therefore, when the reflective member 5 is located at the approach position P2, the first laser displacement meter 1 and the second laser displacement meter 2 measure the displacement of the object to be measured 200, so that the second laser displacement meter 2 is not included in the virtual intersection surface 15. 2
  • the inclination of the object to be measured 200 around the rotation axis AX2 can be calculated. It was
  • the second direction D2 indicates a direction that intersects the second virtual plane 12.
  • the second direction D2 is substantially orthogonal to the second virtual plane 12.
  • the second direction D2 is, for example, substantially parallel to the vertical direction. It was
  • the inclination measuring device 100 includes the reflecting member 5, so that the first laser displacement meter 1 and the second laser displacement meter 100 are provided without using the four laser displacement meters.
  • the laser displacement meter 2 can be used to measure the inclination of the object to be measured 200 around the first rotation axis AX1 and the second rotation axis AX2, respectively. That is, while suppressing the number of mounted laser displacement meters, the inclination of the measurement object 200 around the first rotation axis AX1 included in the virtual intersection surface 15 and the second rotation axis not included in the virtual intersection surface 15. It is possible to measure the inclination of the measurement object 200 around the AX2. It was
  • the inclination angle of the reflective member 5 with respect to the first virtual plane 11 is approximately 45 degrees. Therefore, the reflecting member 5 refracts the first laser beam B1 and the second laser beam B2 by about 90 degrees and reflects them. It was
  • the measurement object 200 receives an action from the outside of the measurement object 200 and rotates around the third rotation axis AX3, and the third rotation axis with respect to the reference state. Tilt around AX3. It was
  • the tilt measuring device 100 further includes a third laser displacement meter 3.
  • the third laser displacement meter 3 irradiates the measurement object 200 with the third laser beam B3 to measure the displacement of the measurement object 200.
  • the third laser displacement meter 3 irradiates the measurement object 200 with the third laser beam B3, receives the third laser beam B3 reflected by the measurement object 200, and receives the third laser beam B3 of the measurement object 200. Measure the displacement. It was
  • the third laser displacement meter 3 is in a state where the measurement object 200 is tilted around the third rotation axis AX3 with respect to the reference state and stopped.
  • the measurement object 200 is irradiated with the third laser beam B3, and the displacement of the measurement object 200 from the reference state is measured.
  • the second laser displacement meter 2 measures in a state where the measurement object 200 is tilted and stopped around the third rotation axis AX3 with respect to the reference state.
  • the object 200 is irradiated with the second laser beam B2, and the displacement of the object 200 from the reference state is measured.
  • the inclination measuring device 100 makes a third rotation of the object to be measured 200 based on the measurement results by the second laser displacement meter 2 and the third laser displacement meter 3 when the reflecting member 5 is located at the retracted position P1.
  • the slope around the axis AX3 can be calculated. It was
  • the inclination measuring device 100 includes the reflecting member 5, so that the first laser displacement meter is not used.
  • the laser displacement meter 1, the second laser displacement meter 2, and the third laser displacement meter 3 the inclination of the object to be measured 200 around the first rotation axis AX1 and the circumference of the second rotation axis AX2.
  • the inclination of the measurement object 200 and the inclination of the measurement object 200 around the third rotation axis AX3 can be measured.
  • the inclination of the measurement object 200 around the first rotation axis AX1 to the third rotation axis AX3 can be measured while suppressing the number of mounted laser displacement meters.
  • the restriction on the shape of the measurement object 200 can be relaxed as compared with the case where the inclination of the measurement object 200 is measured by using the diffraction grating. .. It was
  • the tilt measuring device according to the comparative example does not include the reflective member 5. Therefore, in the inclination measuring device according to the comparative example, there are three laser displacement meters for measuring the inclination around the first rotation axis AX1 and the inclination around the third rotation axis AX3 of the measurement object 200, respectively. It is essential to have two laser displacement meters for measuring the inclination of the object to be measured 200 around the second rotation axis AX2.
  • the tilt measuring device 100 measures the object 200 for each of the three rotation axes (first rotation axis AX1, second rotation axis AX2, and third rotation axis AX3).
  • a total of three laser displacement meters (first laser displacement meter 1, second laser displacement meter 2, third laser displacement meter 3) may be provided. It was
  • the third virtual plane 13 is a virtual plane including the optical path of the second laser beam B2 and the optical path of the third laser beam B3 when the reflecting member 5 is located at the retracted position P1.
  • the third rotation axis AX3 of the measurement object 200 intersects the third virtual plane 13. It was
  • the first virtual plane 11 and the third virtual plane 13 are substantially orthogonal to each other.
  • the trigonometry makes it easy to tilt the objects 200 around the first rotation axis AX1 to the third rotation axis AX3, respectively. Can be calculated.
  • Trigonometry is an operation that uses trigonometric functions.
  • the first laser beam B1, the second laser beam B2, and the third laser beam B3 when the reflecting member 5 is located at the retracted position P1 are substantially parallel to each other. According to this preferred example, the adjustment of the optical system is even easier. It was
  • the first virtual plane 11 is substantially orthogonal to the first rotation axis AX1.
  • the third virtual plane 13 is substantially orthogonal to the third rotation axis AX3.
  • the second virtual plane 12 is substantially orthogonal to the second rotation axis AX2. According to this preferred example, the inclination of the object to be measured 200 around the first rotation axis AX1 to the third rotation axis AX3 can be calculated more easily by the trigonometry. It was
  • the virtual intersection surface 15 intersects the first laser beam B1, the second laser beam B2, and the third laser beam B3 when the reflection member 5 is located at the retracted position P1.
  • the virtual intersection surface 15 is substantially orthogonal to the first laser beam B1, the second laser beam B2, and the third laser beam B3. It was
  • FIG. 3 is a block diagram showing the inclination measuring device 100.
  • the tilt measuring device 100 further includes a moving mechanism 4, a driving mechanism 6, a control unit 10, and a storage unit 20.
  • the control unit 10 corresponds to an example of a “calculation unit”. It was
  • the control unit 10 includes a processor such as a CPU (Central Processing Unit).
  • the storage unit 20 includes a storage device and stores data and computer programs. Specifically, the storage unit 20 includes a main storage device such as a semiconductor memory and an auxiliary storage device such as a semiconductor memory, a solid state drive, and / or a hard disk drive. The storage unit 20 may include removable media.
  • the storage unit 20 corresponds to an example of a non-temporary computer-readable storage medium.
  • the processor of the control unit 10 executes a computer program stored in the storage device of the storage unit 20 to execute various calculations, and also executes the first laser displacement meter 1, the second laser displacement meter 2, and the third laser displacement meter. 3. Controls the moving mechanism 4 and the driving mechanism 6.
  • the control unit 10 and the storage unit 20 constitute, for example, a computer.
  • the moving mechanism 4 for moving the reflective member 5 and the driving mechanism 6 for driving the measurement object 200 will be described later. It was
  • the control unit 10 around the first rotation axis AX1 based on the measurement result by the first laser displacement meter 1 and the measurement result by the second laser displacement meter 2 when the reflection member 5 is located at the retracted position P1.
  • the inclination of the measurement object 200 is calculated.
  • the control unit 10 has the second rotation axis AX2 based on the measurement result by the first laser displacement meter 1 and the measurement result by the second laser displacement meter 2 when the reflection member 5 is located at the approach position P2. Calculate the inclination of the object to be measured 200 around. It was
  • control unit 10 uses the measurement results of the first laser displacement meter 1 and the second laser displacement meter 2 without using the measurement results of the four laser displacement meters.
  • the inclination of the measurement object 200 around the 1 rotation shaft AX1 and the 2nd rotation shaft AX2 can be calculated, respectively. It was
  • the control unit 10 has the third rotation axis AX3 based on the measurement result by the second laser displacement meter 2 and the measurement result by the third laser displacement meter 3 when the reflection member 5 is located at the retracted position P1. Calculate the inclination of the object to be measured 200 around.
  • the control unit 10 does not use the measurement results of the five laser displacement meters, but the measurement results of the first laser displacement meter 1, the second laser displacement meter 2, and the third laser displacement meter 3. Can be used to calculate the inclination of the measurement object 200 around the first rotation axis AX1 to the third rotation axis AX3, respectively. It was
  • FIG. 4A shows the relationship between the second laser beam B2 and the third laser beam B3 and the measurement object 200 when the inclination measuring device 100 measures the inclination of the measurement object 200 around the third rotation axis AX3. It is a perspective view.
  • FIG. 4B shows the second laser beam B2 and the third laser beam B3 viewed from the third rotation axis direction when the inclination measuring device 100 measures the inclination of the object 200 to be measured around the third rotation axis AX3. It is a figure which shows the measurement object 200.
  • the reflective member 5 and the second irradiation target 203 are omitted for the sake of simplification of the drawings. It was
  • the control unit 10 when the reflecting member 5 is located at the retracted position P1, the control unit 10 is in a reference state by trigonometry based on the laser spot distance L3 and the laser spot displacement amount d3.
  • a tilt angle ⁇ 3 indicating the tilt of the object to be measured 200 with respect to the target is calculated. Therefore, according to the present embodiment, the inclination angle ⁇ 3 of the object to be measured 200 can be calculated accurately by a simple calculation formula.
  • the tilt angle ⁇ 3 indicates the tilt of the object to be measured 200 with respect to the reference state around the third rotation axis AX3. It was
  • the laser spot distance L3 is the irradiation spot of the second laser beam B2 and the irradiation spot of the third laser beam B3 in the measurement object 200 in the reference state when the reflection member 5 is located at the retracted position P1. Shows the distance to T3. That is, the laser spot distance L3 indicates the distance between the second laser beam B2 and the third laser beam B3 when the reflecting member 5 is located at the retracted position P1.
  • the laser spot displacement amount d3 is a physical quantity corresponding to the inclination of the measurement object 200 with respect to the reference state when the reflection member 5 is located at the retracted position P1, and is a physical quantity of the irradiation spot T2 of the second laser beam B2 with respect to the reference state. The sum of the displacement amount and the displacement amount of the irradiation spot T3 of the third laser beam B3 is shown. It was
  • the second laser displacement meter 2 measures the amount of displacement of the irradiation spot T2 with respect to the reference state of the measurement object 200 in a state where the measurement object 200 is tilted around the third rotation axis AX3.
  • the third laser displacement meter 3 measures the displacement amount of the irradiation spot T3 with respect to the reference state of the measurement object 200 in a state where the measurement object 200 is tilted around the third rotation axis AX3.
  • the control unit 10 calculates the laser spot displacement amount d3, which is the sum of the displacement amount of the irradiation spot T2 and the displacement amount of the irradiation spot T3. It was
  • control unit 10 executes the calculation shown in the following equation to calculate the tilt angle ⁇ 3.
  • ⁇ 3 arc tan (d3 / L3)
  • the laser spot distance L3 when the reflection member 5 is located at the retracted position P1 is set in advance. That is, it is preferable to set the laser spot distance L3 required for the calculation formula by the trigonometry in advance and set it as a fixed value.
  • the work of measuring the laser spot distance L3 for each measurement object 200 is not required. That is, the work of measuring the laser spot distance L3 every time the measurement object 200 is replaced is not required. As a result, the measurement work for calculating the inclination angle ⁇ 3 of the measurement object 200 can be simplified. It was
  • the measurement object 200 includes a plane F1.
  • the first irradiation target object 201 of the measurement target object 200 includes a plane F1.
  • the first irradiation object 201 has, for example, a substantially flat plate shape.
  • the plane F1 of the measurement object 200 in the reference state is substantially parallel to the first direction D1 and is substantially orthogonal to the second direction D2.
  • the plane F1 includes a first irradiation surface TA1, a second irradiation surface TA2, and a third irradiation surface TA3.
  • the plane F1 of the measurement object 200 in the reference state is shown by the alternate long and short dash line. It was
  • the second laser displacement meter 2 irradiates the second irradiation surface TA2 of the measurement object 200 with the second laser beam B2 to obtain a second laser beam.
  • the displacement of the measurement object 200 around the third rotation axis AX3 with respect to the reference state is measured.
  • the third laser displacement meter 3 has the third laser beam B3 on the third irradiation surface TA3 on the same plane F1 as the second irradiation surface TA2 in the measurement object 200.
  • the displacement of the object to be measured 200 with respect to the reference state around the third rotation axis AX3 is measured.
  • the third rotation axis AX3 of the measurement object 200 can be accurately adjusted while facilitating the adjustment of the optical system. The tilt around the can be measured. It was
  • FIG. 5A shows the relationship between the first laser beam B1 and the second laser beam B2 and the measurement object 200 when the inclination measuring device 100 measures the inclination of the measurement object 200 around the first rotation axis AX1. It is a perspective view.
  • FIG. 5B shows the first laser beam B1 and the second laser beam B2 viewed from the direction of the first rotation axis when the inclination measuring device 100 measures the inclination of the object to be measured 200 around the first rotation axis AX1. It is a figure which shows the measurement object 200.
  • FIG. 5A shows the relationship between the first laser beam B1 and the second laser beam B2 and the measurement object 200 when the inclination measuring device 100 measures the inclination of the measurement object 200 around the first rotation axis AX1. It is a perspective view.
  • FIG. 5B shows the first laser beam B1 and the second laser beam B2 viewed from the direction of the first rotation axis when the inclination measuring device 100 measures the inclination of the object to be measured 200 around the first rotation
  • the plane F1 of the measurement object 200 in the reference state is shown by the alternate long and short dash line.
  • the reflective member 5 and the second irradiation target 203 are omitted for the sake of simplification of the drawings. It was
  • the control unit 10 when the reflecting member 5 is located at the retracted position P1, the control unit 10 is in a reference state by trigonometry based on the laser spot distance L1 and the laser spot displacement amount d1.
  • the inclination angle ⁇ 1 indicating the inclination of the object to be measured 200 with respect to the object 200 is calculated. Therefore, according to the present embodiment, the inclination angle ⁇ 1 of the measurement object 200 can be calculated accurately by a simple calculation formula.
  • the tilt angle ⁇ 1 indicates the tilt of the object to be measured 200 with respect to the reference state around the first rotation axis AX1. It was
  • the laser spot distance L1 is the irradiation spot of the first laser beam B1 and the irradiation spot of the second laser beam B2 in the measurement object 200 in the reference state when the reflection member 5 is located at the retracted position P1.
  • the distance to T2 is shown. That is, the laser spot distance L1 indicates the distance between the first laser beam B1 and the second laser beam B2 when the reflecting member 5 is located at the retracted position P1.
  • the laser spot displacement amount d1 is a physical quantity corresponding to the inclination of the measurement object 200 with respect to the reference state when the reflection member 5 is located at the retracted position P1, and is the physical quantity of the irradiation spot T1 of the first laser beam B1 with respect to the reference state.
  • the sum of the displacement amount and the displacement amount of the irradiation spot T2 of the second laser beam B2 is shown. It was
  • the first laser displacement meter 1 measures the amount of displacement of the irradiation spot T1 with respect to the reference state of the measurement object 200 in a state where the measurement object 200 is tilted around the first rotation axis AX1.
  • the second laser displacement meter 2 measures the displacement amount of the irradiation spot T2 with respect to the reference state of the measurement object 200 in a state where the measurement object 200 is tilted around the first rotation axis AX1.
  • the control unit 10 calculates the laser spot displacement amount d1, which is the sum of the displacement amount of the irradiation spot T1 and the displacement amount of the irradiation spot T2. It was
  • control unit 10 executes the calculation shown in the following equation to calculate the tilt angle ⁇ 1.
  • ⁇ 1 arc tan (d1 / L1)
  • the laser spot distance L1 when the reflection member 5 is located at the retracted position P1 is set in advance. That is, it is preferable to set the laser spot distance L1 required for the calculation formula by the trigonometry in advance and set it as a fixed value.
  • the work of measuring the laser spot distance L1 for each measurement object 200 is not required. That is, the work of measuring the laser spot distance L1 every time the measurement object 200 is replaced is not required. As a result, the measurement work for calculating the inclination angle ⁇ 1 of the measurement object 200 can be simplified. It was
  • the first laser displacement meter 1 irradiates the first irradiation surface TA1 of the measurement object 200 with the first laser beam B1 to obtain the first laser displacement meter 1.
  • the displacement of the measurement object 200 around the first rotation axis AX1 with respect to the reference state is measured.
  • the second laser displacement meter 2 has a second laser beam B2 on the second irradiation surface TA2 on the same plane F1 as the first irradiation surface TA1 in the measurement object 200.
  • the displacement of the object to be measured 200 with respect to the reference state around the first rotation axis AX1 is measured.
  • the first rotation axis AX1 of the measurement object 200 can be accurately adjusted while facilitating the adjustment of the optical system. The tilt around the can be measured. It was
  • FIG. 6A shows the relationship between the first laser beam B10 and the second laser beam B20 and the measurement object 200 when the inclination measuring device 100 measures the inclination of the measurement object 200 around the second rotation axis AX2. It is a perspective view.
  • FIG. 6B shows the first laser beam B10 and the second laser beam B20 viewed from the second rotation axis direction when the inclination measuring device 100 measures the inclination of the object 200 to be measured around the second rotation axis AX2. It is a figure which shows the measurement object 200.
  • the reflective member 5 is shown by a two-dot chain line in order to make the drawing easier to see. It was
  • the control unit 10 measures the reference state by trigonometry based on the laser spot distance L2 and the laser spot displacement amount d2.
  • the inclination angle ⁇ 2 indicating the inclination of the object 200 is calculated. Therefore, according to the present embodiment, the inclination angle ⁇ 2 of the object to be measured 200 can be calculated accurately by a simple calculation formula.
  • the tilt angle ⁇ 2 indicates the tilt of the object to be measured 200 with respect to the reference state around the second rotation axis AX2. It was
  • the laser spot distance L2 is the irradiation spot of the first laser beam B10 and the irradiation spot of the second laser beam B20 in the measurement object 200 in the reference state when the reflection member 5 is located at the approach position P2.
  • the distance to T20 is shown. That is, the laser spot distance L2 indicates the distance between the first laser beam B10 and the second laser beam B20 when the reflecting member 5 is located at the approach position P2.
  • the laser spot displacement amount d2 is a physical quantity corresponding to the inclination of the measurement object 200 with respect to the reference state when the reflection member 5 is located at the approach position P2, and is a physical quantity of the irradiation spot T10 of the first laser beam B10 with respect to the reference state.
  • the sum of the displacement amount and the displacement amount of the irradiation spot T20 of the second laser beam B20 is shown. It was
  • the first laser displacement meter 1 measures the amount of displacement of the irradiation spot T10 with respect to the reference state of the measurement object 200 in a state where the measurement object 200 is tilted around the second rotation axis AX2.
  • the second laser displacement meter 2 measures the amount of displacement of the irradiation spot T20 with respect to the reference state of the measurement object 200 in a state where the measurement object 200 is tilted around the second rotation axis AX2.
  • the control unit 10 calculates the laser spot displacement amount d2, which is the sum of the displacement amount of the irradiation spot T10 and the displacement amount of the irradiation spot T20. It was
  • control unit 10 executes the calculation shown in the following equation to calculate the tilt angle ⁇ 2.
  • ⁇ 2 arc tan (d2 / L2)
  • the laser spot distance L2 when the reflection member 5 is located at the approach position P2 is set in advance. That is, it is preferable to set the laser spot distance L2 required for the calculation formula by the trigonometry in advance and set it as a fixed value.
  • the work of measuring the laser spot distance L2 for each measurement object 200 is not required. That is, the work of measuring the laser spot distance L2 every time the measurement object 200 is replaced is not required. As a result, the measurement work for calculating the inclination angle ⁇ 2 of the measurement object 200 can be simplified. It was
  • the measurement object 200 includes a plane F2.
  • the second irradiation target 203 of the measurement target 200 includes a plane F2.
  • the second irradiation object 203 has, for example, a substantially flat plate shape.
  • the plane F2 intersects the plane F1.
  • the plane F2 is substantially orthogonal to the plane F1. That is, the second irradiation object 203 extends substantially vertically from the plane F1.
  • the plane F2 of the measurement object 200 in the reference state is substantially orthogonal to the first direction D1 and substantially parallel to the second direction D2.
  • the plane F2 includes a first cross-irradiation surface TA10 and a second cross-irradiation surface TA20.
  • FIG. 6B the plane F2 of the measurement object 200 in the reference state is shown by a alternate long and short dash line. It was
  • the reflecting member 5 When the reflecting member 5 is located at the approach position P2, the reflecting member 5 reflects the first laser beam B10 toward the first crossing irradiation surface TA10 intersecting the first irradiation surface TA1 in the measurement object 200. Then, the first laser displacement meter 1 receives the first laser beam B1 reflected by the first cross-irradiation surface TA10 through the reflection member 5, so that the second rotation shaft of the measurement object 200 with respect to the reference state is received. Measure the displacement around AX2. In addition, when the reflecting member 5 is located at the approach position P2, the reflecting member 5 emits a second laser beam toward the second crossing irradiation surface TA20 on the same plane F2 as the first crossing irradiation surface TA10 in the measurement object 200. Reflects B20.
  • the second laser displacement meter 2 receives the second laser beam B20 reflected by the second cross-irradiation surface TA20 via the reflection member 5, so that the second rotation axis of the measurement object 200 with respect to the reference state is received. Measure the displacement around AX2.
  • the second rotation of the measurement object 200 can be performed accurately while facilitating the adjustment of the optical system.
  • the inclination around the axis AX2 can be measured. It was
  • the first cross-irradiation surface TA10 is substantially orthogonal to the first irradiation surface TA1
  • the second cross-irradiation surface TA20 is substantially orthogonal to the second irradiation surface TA2. According to this preferred example, the adjustment of the optical system can be further facilitated. It was
  • the laser spot distance L1, the laser spot distance L2, and the laser spot distance L3 may be the same or different from each other, and can be set to arbitrary values.
  • the first irradiation surface TA1 and the second irradiation surface TA2 do not have to be on the same plane F1.
  • the second irradiation surface TA2 and the third irradiation surface TA3 do not have to be on the same plane F1.
  • the first cross-irradiation surface TA10 and the second cross-irradiation surface TA20 do not have to be on the same plane F2. It was
  • the displacement measurement method by the first laser displacement meter 1, the second laser displacement meter 2, and the third laser displacement meter 3 is not particularly limited, but may be, for example, a triangular distance measuring method.
  • Each of the first laser displacement meter 1 to the third laser displacement meter 3 may include, for example, at least a laser light source and a light receiving element.
  • the laser light source is, for example, a semiconductor laser.
  • the light receiving element is, for example, a position detection element (PSD: Position Sensitive Device) or a linear image sensor.
  • PSD Position Sensitive Device
  • each of the first laser displacement meter 1 to the third laser displacement meter 3 adopts, for example, a specular reflection method, but a diffuse reflection method may be adopted. It was
  • FIG. 7 is a diagram showing a state when the measurement object 200 rotates around the third rotation shaft AX3.
  • the measurement object 200 is viewed from the third rotation axis direction. Further, in FIG. 7, the state in which the measurement object 200 is tilted is shown by a broken line. It was
  • the inclination measuring device 100 further includes a mounting portion 300 for mounting the work W.
  • the mounting unit 300 is, for example, a stand.
  • the work W includes a measurement object 200 and a support 210.
  • the support 210 supports the measurement object 200 in a rotatable state.
  • the mounting portion 300 includes a reference surface 301.
  • the reference surface 301 is a flat surface.
  • the reference plane 301 is substantially parallel to the horizontal plane.
  • the work W is placed on the reference surface 301.
  • the bottom surface of the support 210 is a flat surface.
  • the bottom surface of the support 210 comes into contact with the reference surface 301.
  • the plane F1 of the measurement object 200 is substantially parallel to the reference surface 301
  • the plane F2 of the measurement object 200 is substantially orthogonal to the reference surface 301.
  • the measurement object 200 receives an external action from the drive mechanism 6 shown in FIG. 3, rotates around the third rotation shaft AX3 with respect to the reference state, and stops. As a result, the measurement object 200 is tilted around the third rotation axis AX3 with respect to the reference state. That is, the plane F1 of the object to be measured 200 is tilted around the third rotation axis AX3 with respect to the reference surface 301. It was
  • the drive mechanism 6 drives the measurement object 200 around the third rotation axis AX3 when the reflection member 5 is located at the retracted position P1 to bring the measurement object 200 to the reference state. And tilt it around the third rotation shaft AX3 to stop it. Then, the second laser displacement meter 2 and the third laser displacement meter 3 measure the displacement of the object to be measured 200 around the third rotation axis AX3.
  • the drive mechanism 6 includes, for example, a third coil (not shown) and a third magnet (not shown). Of the third coil and the third magnet, one is arranged on the object to be measured 200 and the other is arranged on the support 210.
  • the drive mechanism 6 drives the measurement object 200 around the third rotation shaft AX3 by passing a current through the third coil. It was
  • FIG. 8 is a diagram showing a state when the measurement object 200 rotates around the first rotation shaft AX1.
  • the measurement object 200 is viewed from the direction of the first rotation axis. Further, in FIG. 8, the state in which the measurement object 200 is tilted is shown by a broken line. It was
  • the measurement object 200 receives an external action from the drive mechanism 6 shown in FIG. 3, rotates around the first rotation shaft AX1 with respect to the reference state, and stops. As a result, the measurement object 200 is tilted around the first rotation axis AX1 with respect to the reference state. That is, the plane F1 of the object to be measured 200 is tilted around the first rotation axis AX1 with respect to the reference surface 301. It was
  • the drive mechanism 6 drives the measurement object 200 around the first rotation shaft AX1 when the reflection member 5 is located at the retracted position P1 to bring the measurement object 200 to the reference state. And tilt it around the first rotation shaft AX1 to stop it. Then, the first laser displacement meter 1 and the second laser displacement meter 2 measure the displacement of the object to be measured 200 around the first rotation axis AX1.
  • the drive mechanism 6 includes, for example, a first coil (not shown) and a first magnet (not shown). Of the first coil and the first magnet, one is arranged on the object to be measured 200 and the other is arranged on the support 210.
  • the drive mechanism 6 drives the measurement object 200 around the first rotation shaft AX1 by passing a current through the first coil. It was
  • FIG. 9 is a diagram showing a state when the measurement object 200 rotates around the second rotation shaft AX2.
  • the measurement object 200 is viewed from the second rotation axis direction.
  • the state in which the second irradiation target 203 of the measurement target 200 is tilted around the second rotation axis AX2 with respect to the reference state is shown by a broken line.
  • the first irradiation object 201 in a state of being tilted around the second rotation shaft AX2 is omitted. It was
  • the measurement object 200 receives an external action from the drive mechanism 6 shown in FIG. 3, rotates around the second rotation shaft AX2 with respect to the reference state, and stops. As a result, the measurement object 200 is tilted around the second rotation axis AX2 with respect to the reference state. That is, the plane F2 of the object to be measured 200 is tilted around the second rotation axis AX2 with respect to the reference state. It was
  • the drive mechanism 6 drives the measurement object 200 around the second rotation shaft AX2 to bring the measurement object 200 to the reference state. And tilt it around the second rotation shaft AX2 to stop it. Then, the first laser displacement meter 1 and the second laser displacement meter 2 measure the displacement of the object to be measured 200 around the second rotation axis AX2.
  • the drive mechanism 6 includes, for example, a second coil (not shown) and a second magnet (not shown). Of the second coil and the second magnet, one is arranged on the object to be measured 200 and the other is arranged on the support 210.
  • the drive mechanism 6 drives the measurement object 200 around the second rotation shaft AX2 by passing a current through the second coil. It was
  • the plane F1 of the measurement object 200 may have a shape that is inclined with respect to the reference surface 301 in the reference state, for example.
  • the plane F2 of the object to be measured 200 may have a shape inclined with respect to the reference surface 301 in the reference state, for example.
  • the first irradiation surface TA1 and / or the second irradiation surface TA2 of the measurement object 200 shown in FIG. 5A may have a shape inclined with respect to the reference surface 301 in the reference state.
  • the first crossing irradiation surface TA10 and / or the second crossing irradiation surface TA20 of the measurement object 200 shown in FIG. 6A may have a shape inclined with respect to the reference surface 301 in the reference state.
  • FIG. 10 is a side view showing the moving mechanism 4. As shown in FIG. 10, the moving mechanism 4 moves the reflecting member 5 along the first direction D1 and the second direction D2. It was
  • the reflective member 5 can be moved in the first direction D1, the reflective member 5 can be accurately arranged at the desired approach position P2 (FIG. 2B).
  • the first laser beam B10 and the second laser beam B20 can be moved to the measurement object 200 even if the length of the second direction D2 of the measurement object 200 is small.
  • the position of the reflective member 5 can be adjusted so that it is irradiated. That is, since the reflecting member 5 can be moved in the second direction D2, the first laser beam B10 and the second laser beam B20 are the second irradiation targets even when the length of the second direction D2 of the second irradiation object 203 is small.
  • the position of the reflective member 5 can be adjusted so that the object 203 is irradiated. It was
  • the moving mechanism 4 includes a first cylinder 401, a second cylinder 402, a first support body 404, a support member 405, a first guide rail 406, a first slider 408, and a second support. It includes a body 410, a second guide rail 412, a second slider 414, a connecting member 416, and a third support 418.
  • the first support body 404 includes a lower body 404A and an upper body 404B.
  • the moving mechanism 4 preferably further includes a columnar member 415, a stopper member 417, a compression coil spring 419, a stopper 420, and a tension spring 422. It was
  • the second support 410 extends along the second direction D2.
  • the second support 410 supports the second cylinder 402.
  • the second guide rail 412 is fixed to the second support 410.
  • the second guide rail 412 extends along the second direction D2. It was
  • the second slider 414 engages with the second guide rail 412.
  • the second slider 414 is fixed to the lower body 404A of the first support 404.
  • the lower body 404A extends along the second direction D2.
  • the lower body 404A and the second cylinder 402 are connected by a connecting member (not shown). Therefore, when the second cylinder 402 is driven along the second direction D2, the first support 404 moves along the second guide rail 412 via the second slider 414. That is, the second cylinder 402 moves the first support 404 along the second direction D2.
  • the second cylinder 402 is, for example, an air cylinder. It was
  • the stopper 420 contacts the bottom of the lower body 404A of the first support 404 and determines the lower limit position of the first support 404.
  • the tension spring 422 is connected to the lower body 404A and pulls the first support 404 downward. It was
  • the support member 405 is arranged on the upper body 404B of the first support body 404.
  • the support member 405 supports the first cylinder 401.
  • the upper body 404B extends along the first direction D1.
  • the first guide rail 406 is fixed to the upper body 404B.
  • the first guide rail 406 extends along the first direction D1. It was
  • the first slider 408 engages with the first guide rail 406.
  • the first slider 408 is fixed to the third support 418.
  • the third support 418 and the first cylinder 401 are connected by a connecting member 416. Therefore, when the first cylinder 401 is driven along the first direction D1, the third support 418 moves along the first guide rail 406 via the first slider 408. That is, the first cylinder 401 moves the third support 418 along the first direction D1.
  • the first cylinder 401 is, for example, an air cylinder. It was
  • the columnar member 415 is coupled to the base end portion 418B of the third support 418.
  • the columnar member 415 extends along the first direction D1.
  • the columnar member 415 has, for example, a substantially cylindrical shape.
  • the columnar member 415 is, for example, a hinge pin.
  • the columnar member 415 movably penetrates the support member 405 along the first direction D1.
  • the compression coil spring 419 is inserted into the columnar member 415 between the base end portion 418B of the third support 418 and the support member 405.
  • the compression coil spring 419 pushes the third support 418 in the direction D11.
  • the direction D11 is a direction parallel to the first direction D1 and indicates a direction from the support member 405 toward the base end portion 418B of the third support body 418.
  • a stopper member 417 is fixed to the columnar member 415.
  • the stopper member 417 regulates the movement of the columnar member 415 and the third support 418 in the direction D11 by coming into contact with the support member 405.
  • the stopper member 417 is, for example, a retaining ring. It was
  • the third support 418 moves in the direction D11 while receiving an urging force from the compression coil spring 419 toward the direction D11. Then, the movement of the third support 418 in the direction D11 is restricted by the stopper member 417. As a result, the reflective member 5 is stationary at a desired position. It was
  • the reflective member 5 is attached to the tip portion 418A of the third support 418. Therefore, the first cylinder 401 moves the reflective member 5 along the first direction D1 via the third support 418. In addition, the second cylinder 402 moves the reflective member 5 along the second direction D2 via the first support 404.
  • the control unit 10 controls the first cylinder 401 and the second cylinder 402 to move the reflective member 5 in the first direction D1 and the second direction D2. It was
  • the moving mechanism 4 in FIG. 10 is an example, and is not particularly limited as long as the reflective member 5 can be moved between the retracted position P1 and the approached position P2. Further, the retracted position P1 is not particularly limited as long as it is a position where the first laser beam B1 and the second laser beam B2 are not incident. It was
  • the inclination measuring method for measuring the inclination of the object to be measured 200 is executed by the inclination measuring device 100.
  • 11 and 12 are flowcharts showing the inclination measuring method according to the present embodiment. As shown in FIGS. 11 and 12, the inclination measuring method includes steps S1 to S19. Before the execution of step S1, the reflective member 5 is located at the retracted position P1. It was
  • step S1 the operator or the robot arm (not shown) arranges the work W including the measurement object 200 on the reference surface 301 of the mounting portion 300. It was
  • step S2 the drive mechanism 6 drives the measurement object 200 around the third rotation shaft AX3 from the reference state of the measurement object 200 and stops it. As a result, the measurement object 200 is in a state of being tilted around the third rotation axis AX3 with respect to the reference state. It was
  • step S3 when the reflection member 5 is located at the retracted position P1, the second laser displacement meter 2 irradiates the measurement object 200 with the second laser beam B2 to displace the measurement object 200. measure. It was
  • step S4 when the reflection member 5 is located at the retracted position P1, the third laser displacement meter 3 irradiates the measurement object 200 with the third laser beam B3 to displace the measurement object 200. measure. It was
  • step S5 the control unit 10 around the third rotation axis AX3 of the measurement object 200 based on the measurement result by the second laser displacement meter 2 and the measurement result by the third laser displacement meter 3. Calculate the slope. It was
  • step S6 the drive mechanism 6 releases the drive of the measurement object 200 and returns the measurement object 200 from the tilted state to the reference state. It was
  • step S7 the drive mechanism 6 drives the measurement object 200 around the first rotation shaft AX1 from the reference state of the measurement object 200 and stops it. As a result, the measurement object 200 is in a state of being tilted around the first rotation axis AX1 with respect to the reference state. It was
  • step S8 when the reflection member 5 is located at the retracted position P1, the first laser displacement meter 1 irradiates the measurement object 200 with the first laser beam B1 to displace the measurement object 200. measure. It was
  • step S9 when the reflection member 5 is located at the retracted position P1, the second laser displacement meter 2 irradiates the measurement object 200 with the second laser beam B2 to displace the measurement object 200. measure. It was
  • step S10 the control unit 10 around the first rotation axis AX1 of the measurement object 200 based on the measurement result by the first laser displacement meter 1 and the measurement result by the second laser displacement meter 2. Calculate the slope. It was
  • step S11 the drive mechanism 6 releases the drive of the measurement object 200 and returns the measurement object 200 from the tilted state to the reference state. It was
  • step S12 the moving mechanism 4 moves the reflecting member 5 from the retracting position P1 to the approaching position P2. It was
  • step S13 the drive mechanism 6 drives the measurement object 200 around the second rotation shaft AX2 from the reference state of the measurement object 200 and stops it. As a result, the measurement object 200 is in a state of being tilted around the second rotation axis AX2 with respect to the reference state. It was
  • step S14 when the reflective member 5 is located at the approach position P2, the first laser displacement meter 1 irradiates the measurement object 200 with the first laser beam B1 to displace the measurement object 200. measure. It was
  • step S15 when the reflective member 5 is located at the approach position P2, the second laser displacement meter 2 irradiates the measurement object 200 with the second laser beam B2 to displace the measurement object 200. measure. It was
  • step S16 the control unit 10 around the second rotation axis AX2 of the measurement object 200 based on the measurement result by the first laser displacement meter 1 and the measurement result by the second laser displacement meter 2. Calculate the slope. It was
  • step S17 the drive mechanism 6 releases the drive of the measurement object 200 and returns the measurement object 200 from the tilted state to the reference state. It was
  • step S18 the moving mechanism 4 moves the reflecting member 5 from the approaching position P2 to the retracting position P1. It was
  • step S19 the operator or the robot arm moves the work W including the measurement object 200 from the reference surface 301 of the mounting portion 300. Then, the inclination measurement method ends. It was
  • the retracted position P1 and the approach position P2 of the reflective member 5 are set.
  • the irradiation positions of the first laser beam B1 and the second laser beam B2 on the measurement object 200 can be made different. Therefore, while suppressing the number of mounted laser displacement meters, the inclination of the measurement object 200 around the first rotation axis AX1 and the second rotation axis AX2 in steps S8, S9, S10, S14, S15, and S16, respectively. Can be measured.
  • steps S3, S4, and S5 the inclination of the object to be measured 200 around the third rotation axis AX3 can also be measured. It was
  • the inclination measuring method it is possible to measure the inclination around the rotation axis of the measurement object 200 for each of a plurality of different rotation axes while suppressing the number of mounted laser displacement meters. It was
  • the order of each process in the tilt measurement method can be changed arbitrarily.
  • the order of the three series of processes of the series of processes of steps S2 to S6, the series of processes of steps S7 to S11, and the series of processes of steps S12 to S17 is not particularly limited, and is an arbitrary order. May be. It was
  • step S3 and step S4 may be reversed, or step S3 and step S4 may be executed in parallel.
  • step S8 and step S9 may be reversed, or step S8 and step S9 may be executed in parallel.
  • step S14 and step S15 may be reversed, or step S14 and step S15 may be executed in parallel.
  • step S12 and step S13 may be reversed, or step S12 and step S13 may be executed in parallel. It was
  • step S5 is not particularly limited as long as it is after steps S3 and S4.
  • the execution order of step S10 is not particularly limited as long as it is after steps S8 and S9.
  • the execution order of step S16 is not particularly limited as long as it is after steps S14 and S15. It was
  • the work W shown in FIG. 7 is used, for example, as a dummy unit of an optical unit.
  • the optical unit includes an optical module, a support, and a drive mechanism.
  • the measurement object 200 shown in FIG. 7 is used, for example, as a dummy module of an optical module.
  • the support and drive mechanism of the optical unit correspond to the support 210 shown in FIG. 7 and the drive mechanism 6 shown in FIG. 3, respectively. It was
  • the optical module is, for example, an image pickup device such as a thin camera mounted on an electronic device such as a mobile phone with a camera and a tablet PC.
  • the optical unit has a correction function for pitching (longitudinal runout), yawing (horizontal runout), and rolling (shake around the optical axis) of the optical module.
  • the optical module is rotatably supported by a support around a pitch axis, a yaw axis, and a roll axis.
  • the drive mechanism drives the optical module around the pitch axis, the yaw axis, and the roll axis in the same manner as the drive mechanism 6 shown in FIG. It was
  • the first rotation axis AX1 shown in FIG. 1A corresponds to, for example, a pitch axis
  • the third rotation axis AX3 corresponds to, for example, a yaw axis
  • the second rotation shaft AX2 shown in FIG. 2A corresponds to, for example, a roll shaft. It was
  • the present disclosure can be used, for example, for a tilt measuring device and a tilt measuring method.

Abstract

A tilt measuring device includes a first laser displacement meter, a second laser displacement meter, and a reflecting member. The first laser displacement meter irradiates an object to be measured with a first laser beam and measures the displacement of the object to be measured. The second laser displacement meter irradiates the object to be measured with a second laser beam and measures the displacement of the object to be measured. The reflecting member is located at a retracted position or an approach position with respect to the optical path of the first laser beam and the optical path of the second laser beam. The first laser displacement meter and the second laser displacement meter measure the displacement of the object to be measured in both the case where the reflecting member is located at the retracted position and the case where the reflecting member is located at the approach position. The reflecting member changes the traveling directions of the first laser beam and the second laser beam at the approach position to reflect the first laser beam and the second laser beam toward the object to be measured.

Description

傾き計測装置および傾き計測方法Tilt measuring device and tilt measuring method
 本開示は、傾き計測装置および傾き計測方法に関する。 This disclosure relates to a tilt measuring device and a tilt measuring method.
 従来の多点角度測定装置は、基準面の回転角を計測する回転支持体、これに取り付けられて可動部を有するXYテーブル、放射方向が固定されたX線源および受線管を備える(例えば、特許文献1)。そして、光源をそれぞれ有する2個のレーザーフォーカス変位計を、水晶板の上方に設置する。レーザーフォーカス変位計には角度演算器が接続する。  A conventional multipoint angle measuring device includes a rotating support for measuring the angle of rotation of a reference plane, an XY table attached to the rotating support, an X-ray table having a movable part, an X-ray source having a fixed radiation direction, and a receiving tube (for example,). , Patent Document 1). Then, two laser focus displacement meters each having a light source are installed above the crystal plate. An angle calculator is connected to the laser focus displacement meter. It was
 レーザーフォーカス変位計は、水晶板の2点における、主面に対して垂直方向の変位を計測する。そして、角度演算器は、予め設定された光源間の距離と2点間の変位差から、三角関数により2点間の傾きを計算する。すなわち、水晶板の2点間における基準面からのずれ角を得る。 The laser focus displacement meter measures the displacement in the direction perpendicular to the main surface at two points on the crystal plate. Then, the angle calculator calculates the slope between the two points by a trigonometric function from the preset distance between the light sources and the displacement difference between the two points. That is, the deviation angle from the reference plane between the two points of the crystal plate is obtained.
日本国公開公報:特開平11-63956号公報Japanese Publication: Japanese Patent Application Laid-Open No. 11-63956
 従来の多点角度測定装置では、2点間の傾きを計算するために、2個のレーザーフォーカス変位計が用意される。従って、例えば、他の2点間の傾きを計算するためには、2個のレーザーフォーカス変位計が追加で必要になる。すなわち、4個のレーザーフォーカス変位計が必要になる。  In the conventional multi-point angle measuring device, two laser focus displacement meters are prepared to calculate the inclination between two points. Therefore, for example, two laser focus displacement meters are additionally required to calculate the slope between the other two points. That is, four laser focus displacement meters are required. It was
 本開示は上記課題に鑑みてなされたものであり、その目的は、レーザ変位計の搭載数を抑制しつつ、異なる複数の回動軸ごとに、計測対象物の回動軸の周りの傾きを計測できる傾き計測装置および傾き計測方法を提供することにある。 The present disclosure has been made in view of the above problems, and the purpose of the present disclosure is to reduce the number of mounted laser displacement meters and to determine the inclination of the object to be measured around the rotation axis for each of a plurality of different rotation axes. It is an object of the present invention to provide a tilt measuring device and a tilt measuring method capable of measuring.
 本開示の例示的な傾き計測装置は、計測対象物の傾きを計測する。傾き計測装置は、第1レーザ変位計と、第2レーザ変位計と、反射部材とを備える。第1レーザ変位計は、前記計測対象物に第1レーザ光を照射して、前記計測対象物の変位を計測する。第2レーザ変位計は、前記計測対象物に第2レーザ光を照射して、前記計測対象物の変位を計測する。反射部材は、前記第1レーザ光の光路および前記第2レーザ光の光路に対する退避位置または進入位置に位置する。前記反射部材が前記退避位置に位置する場合と前記進入位置に位置する場合との双方において、前記第1レーザ変位計および前記第2レーザ変位計は、前記計測対象物の変位を計測する。前記反射部材は、前記進入位置において、前記第1レーザ光および前記第2レーザ光の進行方向を変えて、前記第1レーザ光および前記第2レーザ光を前記計測対象物に向けて反射する。  The exemplary tilt measuring device of the present disclosure measures the tilt of the object to be measured. The tilt measuring device includes a first laser displacement meter, a second laser displacement meter, and a reflection member. The first laser displacement meter irradiates the measurement object with the first laser beam and measures the displacement of the measurement object. The second laser displacement meter irradiates the measurement object with the second laser beam and measures the displacement of the measurement object. The reflecting member is located at a retracted position or an approaching position with respect to the optical path of the first laser beam and the optical path of the second laser beam. The first laser displacement meter and the second laser displacement meter measure the displacement of the object to be measured in both the case where the reflection member is located at the retracted position and the case where the reflecting member is located at the approach position. The reflecting member changes the traveling directions of the first laser beam and the second laser beam at the approach position, and reflects the first laser beam and the second laser beam toward the measurement object. It was
 本開示の例示的な傾き計測方法においては、計測対象物の傾きを計測する。傾き計測方法は、反射部材が第1レーザ光の光路および第2レーザ光の光路に対する退避位置に位置する場合に、前記計測対象物に前記第1レーザ光を照射して、前記計測対象物の変位を計測するステップと、前記反射部材が前記退避位置に位置する場合に、前記計測対象物に前記第2レーザ光を照射して、前記計測対象物の変位を計測するステップと、前記退避位置から、前記第1レーザ光の光路および前記第2レーザ光の光路に対する進入位置に、前記反射部材を移動させるステップと、前記反射部材が前記進入位置に位置する場合に、前記計測対象物に前記第1レーザ光を照射して、前記計測対象物の変位を計測するステップと、前記反射部材が前記進入位置に位置する場合に、前記計測対象物に前記第2レーザ光を照射して、前記計測対象物の変位を計測するステップとを含む。 In the exemplary tilt measurement method of the present disclosure, the tilt of the object to be measured is measured. In the tilt measurement method, when the reflecting member is located at a retracted position with respect to the optical path of the first laser beam and the optical path of the second laser beam, the measurement object is irradiated with the first laser beam to measure the object. A step of measuring the displacement, a step of irradiating the measurement object with the second laser beam when the reflection member is located at the retracted position, and a step of measuring the displacement of the object to be measured, and the retracted position. Therefore, the step of moving the reflecting member to the approach position with respect to the optical path of the first laser beam and the optical path of the second laser beam, and when the reflecting member is located at the approaching position, the measurement object is described as described above. The step of irradiating the measurement object with the first laser beam to measure the displacement of the measurement object, and when the reflection member is located at the approach position, the measurement object is irradiated with the second laser light to obtain the said. It includes a step of measuring the displacement of the object to be measured.
 例示的な本開示によれば、レーザ変位計の搭載数を抑制しつつ、異なる複数の回動軸ごとに、計測対象物の回動軸の周りの傾きを計測できる傾き計測装置および傾き計測方法を提供できる。 According to the present disclosure exemplary, a tilt measuring device and a tilt measuring method capable of measuring the tilt around a rotation axis of a measurement object for each of a plurality of different rotation axes while suppressing the number of mounted laser displacement meters. Can be provided.
図1Aは、本開示の実施形態に係る反射部材が退避位置に位置する場合の傾き計測装置を示す斜視図である。FIG. 1A is a perspective view showing a tilt measuring device when the reflective member according to the embodiment of the present disclosure is located at a retracted position. 図1Bは、本実施形態に係る反射部材が退避位置に位置する状態を示す側面図である。FIG. 1B is a side view showing a state in which the reflective member according to the present embodiment is located at the retracted position. 図2Aは、本実施形態に係る反射部材が進入位置に位置する場合の傾き計測装置を示す斜視図である。FIG. 2A is a perspective view showing a tilt measuring device when the reflective member according to the present embodiment is located at an approach position. 図2Bは、本実施形態に係る反射部材が進入位置に位置する状態を示す側面図である。FIG. 2B is a side view showing a state in which the reflective member according to the present embodiment is located at the approach position. 図3は、本実施形態に係る傾き計測装置を示すブロック図である。FIG. 3 is a block diagram showing an inclination measuring device according to the present embodiment. 図4Aは、本実施形態に係る傾き計測装置が計測対象物の第3回動軸の周りの傾きを計測する際の第2レーザ光および第3レーザ光と計測対象物との関係を示す斜視図である。FIG. 4A is a perspective view showing the relationship between the second laser beam and the third laser beam and the measurement object when the inclination measuring device according to the present embodiment measures the inclination of the measurement object around the third rotation axis. It is a figure. 図4Bは、本実施形態に係る傾き計測装置が計測対象物の第3回動軸の周りの傾きを計測する際に、第3回動軸方向から見た第2レーザ光と第3レーザ光と計測対象物とを示す図である。FIG. 4B shows the second laser beam and the third laser beam viewed from the third rotation axis direction when the inclination measuring device according to the present embodiment measures the inclination of the object to be measured around the third rotation axis. It is a figure which shows the measurement object. 図5Aは、本実施形態に係る傾き計測装置が計測対象物の第1回動軸の周りの傾きを計測する際の第1レーザ光および第2レーザ光と計測対象物との関係を示す斜視図である。FIG. 5A is a perspective view showing the relationship between the first laser beam and the second laser beam and the measurement object when the inclination measuring device according to the present embodiment measures the inclination around the first rotation axis of the measurement object. It is a figure. 図5Bは、本実施形態に係る傾き計測装置が計測対象物の第1回動軸の周りの傾きを計測する際に、第1回動軸方向から見た第1レーザ光と第2レーザ光と計測対象物とを示す図である。FIG. 5B shows the first laser beam and the second laser beam viewed from the direction of the first rotation axis when the inclination measuring device according to the present embodiment measures the inclination of the object to be measured around the first rotation axis. It is a figure which shows the measurement object. 図6Aは、本実施形態に係る傾き計測装置が計測対象物の第2回動軸の周りの傾きを計測する際の第1レーザ光および第2レーザ光と計測対象物との関係を示す斜視図である。FIG. 6A is a perspective view showing the relationship between the first laser beam and the second laser beam and the measurement object when the inclination measuring device according to the present embodiment measures the inclination of the measurement object around the second rotation axis. It is a figure. 図6Bは、本実施形態に係る傾き計測装置が計測対象物の第2回動軸の周りの傾きを計測する際に、第2回動軸方向から見た第1レーザ光と第2レーザ光と計測対象物とを示す図である。FIG. 6B shows the first laser beam and the second laser beam viewed from the second rotation axis direction when the inclination measuring device according to the present embodiment measures the inclination of the object to be measured around the second rotation axis. It is a figure which shows the measurement object. 図7は、本実施形態に係る計測対象物が第3回動軸の周りに回動するときの状態を示す図である。FIG. 7 is a diagram showing a state when the measurement object according to the present embodiment rotates around the third rotation axis. 図8は、本実施形態に係る計測対象物が第1回動軸の周りに回動するときの状態を示す図である。FIG. 8 is a diagram showing a state when the measurement object according to the present embodiment rotates around the first rotation axis. 図9は、本実施形態に係る計測対象物が第2回動軸の周りに回動するときの状態を示す図である。FIG. 9 is a diagram showing a state when the measurement object according to the present embodiment rotates around the second rotation axis. 図10は、本実施形態に係る傾き計測装置の移動機構を示す側面図である。FIG. 10 is a side view showing a moving mechanism of the tilt measuring device according to the present embodiment. 図11は、本実施形態に係る傾き計測方法の前段を示すフローチャートである。FIG. 11 is a flowchart showing the first stage of the inclination measuring method according to the present embodiment. 図12は、本実施形態に係る傾き計測方法の後段を示すフローチャートである。FIG. 12 is a flowchart showing the latter stage of the inclination measuring method according to the present embodiment.
 以下、本開示の例示的な実施形態について、図面を参照しながら説明する。なお、図中、同一または相当部分については同一の参照符号を付して説明を繰り返さない。また、図中、理解の容易のため、三次元直交座標系のX軸、Y軸、およびZ軸を適宜記載している。本明細書では、一例として、X軸およびY軸は水平方向に平行であり、Z軸は鉛直方向に平行である。この場合、Z軸の正方向は上方向を示し、Z軸の負方向は下方向を示す。また、実施形態では、第1回動軸AX1、第2回動軸AX2、および、第3回動軸AX3が説明されるが、第1回動軸AX1に平行な方向を第1回動軸方向と記載し、第2回動軸AX2に平行な方向を第2回動軸方向と記載し、第3回動軸AX3に平行な方向を第3回動軸方向と記載する場合がある。なお、本明細書において、「平行」は、略平行であることを含み、「直交」は、略直交することを含む。  Hereinafter, exemplary embodiments of the present disclosure will be described with reference to the drawings. In the figure, the same or corresponding parts are designated by the same reference numerals and the description is not repeated. Further, in the figure, for easy understanding, the X-axis, Y-axis, and Z-axis of the three-dimensional Cartesian coordinate system are appropriately described. In the present specification, as an example, the X-axis and the Y-axis are parallel in the horizontal direction, and the Z-axis is parallel in the vertical direction. In this case, the positive direction of the Z axis indicates the upward direction, and the negative direction of the Z axis indicates the downward direction. Further, in the embodiment, the first rotation shaft AX1, the second rotation shaft AX2, and the third rotation shaft AX3 will be described, but the first rotation shaft is oriented in a direction parallel to the first rotation shaft AX1. The direction may be described as the direction, the direction parallel to the second rotation axis AX2 may be described as the second rotation axis direction, and the direction parallel to the third rotation axis AX3 may be described as the third rotation axis direction. In the present specification, "parallel" includes substantially parallel, and "orthogonal" includes substantially orthogonal. It was
 まず、図1Aおよび図1Bを参照して、本開示の実施形態に係る傾き計測装置100を説明する。図1Aは、傾き計測装置100を示す斜視図である。図1Aに示す傾き計測装置100は、計測対象物200の傾きを計測する。  First, the inclination measuring device 100 according to the embodiment of the present disclosure will be described with reference to FIGS. 1A and 1B. FIG. 1A is a perspective view showing the inclination measuring device 100. The inclination measuring device 100 shown in FIG. 1A measures the inclination of the object to be measured 200. It was
 計測対象物200は、計測対象物200の外部からの作用を受けて、第1回動軸AX1の周りに回動して、基準状態に対して第1回動軸AX1の周りに傾く。計測対象物200の基準状態は、計測対象物200が外部からの作用を受けていない状態を示す。  The measurement object 200 is affected by an action from the outside of the measurement object 200, rotates around the first rotation shaft AX1, and tilts around the first rotation shaft AX1 with respect to the reference state. The reference state of the measurement object 200 indicates a state in which the measurement object 200 is not affected by an external action. It was
 計測対象物200は、光を反射する。例えば、計測対象物200の表面は、金属面またはテープ面等で構成されたミラー面である。計測対象物200は、鏡面反射を行うことが好ましいが、入射光を反射できる限りは、特に限定されない。  The measurement object 200 reflects light. For example, the surface of the object to be measured 200 is a mirror surface made of a metal surface, a tape surface, or the like. The object to be measured 200 preferably performs specular reflection, but is not particularly limited as long as it can reflect incident light. It was
 図1Aの例では、計測対象物200は、第1照射対象物201と、第2照射対象物203とを備える。第2照射対象物203は第1照射対象物201に固定される。第2照射対象物203は、第1照射対象物201に対して突出する。第1照射対象物201および第2照射対象物203については後述する。  In the example of FIG. 1A, the measurement target object 200 includes a first irradiation target object 201 and a second irradiation target object 203. The second irradiation target 203 is fixed to the first irradiation target 201. The second irradiation target object 203 protrudes with respect to the first irradiation target object 201. The first irradiation target object 201 and the second irradiation target object 203 will be described later. It was
 傾き計測装置100は、第1レーザ変位計1と、第2レーザ変位計2と、反射部材5とを備える。  The tilt measuring device 100 includes a first laser displacement meter 1, a second laser displacement meter 2, and a reflection member 5. It was
 第1レーザ変位計1は、計測対象物200に第1レーザ光B1を照射して、計測対象物200の変位を計測する。具体的には、第1レーザ変位計1は、計測対象物200に第1レーザ光B1を照射して、計測対象物200が反射した第1レーザ光B1を受光して、計測対象物200の変位を計測する。  The first laser displacement meter 1 irradiates the measurement object 200 with the first laser beam B1 to measure the displacement of the measurement object 200. Specifically, the first laser displacement meter 1 irradiates the measurement object 200 with the first laser beam B1 and receives the first laser beam B1 reflected by the measurement object 200 to receive the measurement object 200. Measure the displacement. It was
 第2レーザ変位計2は、計測対象物200に第2レーザ光B2を照射して、計測対象物200の変位を計測する。具体的には、第2レーザ変位計2は、計測対象物200に第2レーザ光B2を照射して、計測対象物200が反射した第2レーザ光B2を受光して、計測対象物200の変位を計測する。  The second laser displacement meter 2 irradiates the measurement object 200 with the second laser beam B2 to measure the displacement of the measurement object 200. Specifically, the second laser displacement meter 2 irradiates the measurement object 200 with the second laser beam B2, receives the second laser beam B2 reflected by the measurement object 200, and receives the second laser beam B2 of the measurement object 200. Measure the displacement. It was
 反射部材5は、光を反射する。反射部材5は、例えば、ミラーである。例えば、反射部材5の表面は、金属面またはテープ面等のミラー面である。反射部材5は、鏡面反射を行うことが好ましいが、入射光を屈折させて出射できる限りは、特に限定されない。  The reflective member 5 reflects light. The reflective member 5 is, for example, a mirror. For example, the surface of the reflective member 5 is a mirror surface such as a metal surface or a tape surface. The reflecting member 5 preferably performs specular reflection, but is not particularly limited as long as it can refract the incident light and emit it. It was
 反射部材5は、第1レーザ光B1の光路および第2レーザ光B2の光路に対する退避位置P1または進入位置P2に位置する。図1Aおよび図1Bでは、反射部材5は退避位置P1に位置する。退避位置P1は、第1レーザ光B1の光路および第2レーザ光B2の光路から外れた位置を示す。つまり、退避位置P1は、第1レーザ光B1および第2レーザ光B2が反射部材5に入射しない位置を示す。退避位置P1において、反射部材5は、計測対象物200から離隔している。  The reflection member 5 is located at the retracted position P1 or the approach position P2 with respect to the optical path of the first laser beam B1 and the optical path of the second laser beam B2. In FIGS. 1A and 1B, the reflective member 5 is located at the retracted position P1. The retracted position P1 indicates a position deviated from the optical path of the first laser beam B1 and the optical path of the second laser beam B2. That is, the retracted position P1 indicates a position where the first laser beam B1 and the second laser beam B2 do not enter the reflecting member 5. At the retracted position P1, the reflective member 5 is separated from the object to be measured 200. It was
 反射部材5が退避位置P1に位置する場合、計測対象物200が基準状態に対して第1回動軸AX1の周りに傾いて停止した状態において、第1レーザ変位計1は、計測対象物200に第1レーザ光B1を照射して、計測対象物200が反射した第1レーザ光B1を受光することで、計測対象物200の基準状態からの変位を計測する。加えて、反射部材5が退避位置P1に位置する場合、計測対象物200が基準状態に対して第1回動軸AX1の周りに傾いて停止した状態において、第2レーザ変位計2は、計測対象物200に第2レーザ光B2を照射して、計測対象物200が反射した第2レーザ光B2を受光することで、計測対象物200の基準状態からの変位を計測する。その結果、傾き計測装置100は、反射部材5が退避位置P1に位置する場合の第1レーザ変位計1および第2レーザ変位計2による計測結果に基づいて、計測対象物200の第1回動軸AX1の周りの傾きを算出できる。  When the reflective member 5 is located at the retracted position P1, the first laser displacement meter 1 is the measurement object 200 in a state where the measurement object 200 is tilted and stopped around the first rotation axis AX1 with respect to the reference state. Is irradiated with the first laser beam B1 and receives the first laser beam B1 reflected by the measurement object 200 to measure the displacement of the measurement object 200 from the reference state. In addition, when the reflective member 5 is located at the retracted position P1, the second laser displacement meter 2 measures in a state where the measurement object 200 is tilted and stopped around the first rotation axis AX1 with respect to the reference state. By irradiating the object 200 with the second laser beam B2 and receiving the second laser beam B2 reflected by the measurement object 200, the displacement of the measurement object 200 from the reference state is measured. As a result, the inclination measuring device 100 makes the first rotation of the object to be measured 200 based on the measurement results by the first laser displacement meter 1 and the second laser displacement meter 2 when the reflecting member 5 is located at the retracted position P1. The slope around the axis AX1 can be calculated. It was
 次に、図2Aおよび図2Bを参照して、傾き計測装置100を説明する。図2Aは、反射部材5が進入位置P2に位置する場合の傾き計測装置100を示す斜視図である。図2Bは、進入位置P2に位置する反射部材5の状態を示す。図2Aおよび図2Bに示すように、進入位置P2は、第1レーザ光B1の光路上および第2レーザ光B2の光路上の位置を示す。つまり、進入位置P2は、第1レーザ光B1および第2レーザ光B2が反射部材5に入射する位置を示す。進入位置P2では、反射部材5は、計測対象物200に接触していない。  Next, the inclination measuring device 100 will be described with reference to FIGS. 2A and 2B. FIG. 2A is a perspective view showing a tilt measuring device 100 when the reflective member 5 is located at the approach position P2. FIG. 2B shows the state of the reflective member 5 located at the approach position P2. As shown in FIGS. 2A and 2B, the approach position P2 indicates a position on the optical path of the first laser beam B1 and on the optical path of the second laser beam B2. That is, the approach position P2 indicates a position where the first laser beam B1 and the second laser beam B2 are incident on the reflection member 5. At the approach position P2, the reflective member 5 is not in contact with the object to be measured 200. It was
 反射部材5は、進入位置P2において、第1レーザ光B1および第2レーザ光B2の進行方向を変えて、第1レーザ光B1および第2レーザ光B2を計測対象物200に向けて反射する。以下、説明の便宜上、反射部材5による反射後の第1レーザ光B1を「第1レーザ光B10」と記載し、反射部材5による反射後の第2レーザ光B2を「第2レーザ光B20」と記載する場合がある。  The reflecting member 5 changes the traveling directions of the first laser beam B1 and the second laser beam B2 at the approach position P2, and reflects the first laser beam B1 and the second laser beam B2 toward the measurement object 200. Hereinafter, for convenience of explanation, the first laser beam B1 after being reflected by the reflecting member 5 is referred to as “first laser beam B10”, and the second laser beam B2 after being reflected by the reflecting member 5 is referred to as “second laser beam B20”. May be described as. It was
 反射部材5が進入位置P2に位置する場合、計測対象物200が基準状態に対して第2回動軸AX2の周りに傾いて停止した状態において、第1レーザ変位計1は、計測対象物200に反射部材5を介して第1レーザ光B10を照射して、計測対象物200によって反射された第1レーザ光B10を反射部材5を介して受光することで、計測対象物200の基準状態からの変位を計測する。加えて、反射部材5が進入位置P2に位置する場合、計測対象物200が基準状態に対して第2回動軸AX2の周りに傾いて停止した状態において、第2レーザ変位計2は、計測対象物200に反射部材5を介して第2レーザ光B20を照射して、計測対象物200によって反射された第2レーザ光B20を反射部材5を介して受光することで、計測対象物200の基準状態からの変位を計測する。その結果、傾き計測装置100は、反射部材5が進入位置P2に位置する場合の第1レーザ変位計1および第2レーザ変位計2による計測結果に基づいて、計測対象物200の第2回動軸AX2の周りの傾きを算出できる。  When the reflective member 5 is located at the approach position P2, the first laser displacement meter 1 is the measurement object 200 in a state where the measurement object 200 is tilted and stopped around the second rotation axis AX2 with respect to the reference state. By irradiating the first laser beam B10 through the reflection member 5 and receiving the first laser beam B10 reflected by the measurement object 200 through the reflection member 5, the reference state of the measurement object 200 is increased. Measure the displacement of. In addition, when the reflective member 5 is located at the approach position P2, the second laser displacement meter 2 measures in a state where the measurement object 200 is tilted and stopped around the second rotation axis AX2 with respect to the reference state. The object 200 is irradiated with the second laser beam B20 via the reflection member 5, and the second laser beam B20 reflected by the measurement object 200 is received through the reflection member 5, whereby the object 200 is measured. Measure the displacement from the reference state. As a result, the inclination measuring device 100 makes a second rotation of the object to be measured 200 based on the measurement results by the first laser displacement meter 1 and the second laser displacement meter 2 when the reflecting member 5 is located at the approach position P2. The slope around the axis AX2 can be calculated. It was
 以上、図1A~図2Bを参照して説明したように、傾き計測装置100が反射部材5を備えることで、反射部材5の退避位置P1と進入位置P2とで、計測対象物200上での第1レーザ光B1および第2レーザ光B2の照射位置を異ならせることができる。そして、反射部材5が退避位置P1に位置する場合と進入位置P2に位置する場合との双方において、第1レーザ変位計1および第2レーザ変位計2は、計測対象物200の変位を計測する。従って、反射部材5が退避位置P1に位置する場合(図1A、図1B)の第1レーザ変位計1および第2レーザ変位計2による計測結果に基づいて、計測対象物200の第1回動軸AX1の周りの傾きを算出できるだけでなく、反射部材5が進入位置P2に位置する場合(図2A、図2B)の第1レーザ変位計1および第2レーザ変位計2による計測結果に基づいて、計測対象物200の第2回動軸AX2の周りの傾きも算出できる。  As described above, as described with reference to FIGS. 1A to 2B, the inclination measuring device 100 includes the reflecting member 5, so that the retracting position P1 and the approaching position P2 of the reflecting member 5 are on the measurement object 200. The irradiation positions of the first laser beam B1 and the second laser beam B2 can be different. Then, the first laser displacement meter 1 and the second laser displacement meter 2 measure the displacement of the measurement object 200 in both the case where the reflection member 5 is located at the retracted position P1 and the case where the reflecting member 5 is located at the approach position P2. .. Therefore, the first rotation of the object to be measured 200 is based on the measurement results of the first laser displacement meter 1 and the second laser displacement meter 2 when the reflection member 5 is located at the retracted position P1 (FIGS. 1A and 1B). Not only can the inclination around the axis AX1 be calculated, but also based on the measurement results by the first laser displacement meter 1 and the second laser displacement meter 2 when the reflecting member 5 is located at the approach position P2 (FIGS. 2A and 2B). , The inclination of the object to be measured 200 around the second rotation axis AX2 can also be calculated. It was
 換言すれば、本実施形態では、2つのレーザ変位計(第1レーザ変位計1、第2レーザ変位計2)によって、異なる2つの回動軸(第1回動軸AX1、第2回動軸AX2)ごとに、計測対象物200の傾きを計測できる。更に換言すれば、レーザ変位計の搭載数を抑制しつつ、異なる複数の回動軸ごとに、計測対象物200の回動軸の周りの傾きを計測できる。  In other words, in the present embodiment, two different laser displacement meters (first laser displacement meter 1, second laser displacement meter 2) have two different rotation axes (first rotation axis AX1, second rotation axis). The inclination of the object to be measured 200 can be measured for each AX2). In other words, it is possible to measure the inclination of the object to be measured 200 around the rotation axis for each of a plurality of different rotation axes while suppressing the number of mounted laser displacement meters. It was
 ここで、比較例に係る傾き計測装置を説明する。比較例に係る傾き計測装置は反射部材5を備えない。従って、比較例に係る傾き計測装置では、計測対象物200の第1回動軸AX1の周りの傾きを計測するための2つのレーザ変位計と、計測対象物200の第2回動軸AX2の周りの傾きを計測するための2つのレーザ変位計とを備えることが必須になる。つまり、比較例に係る傾き計測装置では、2つの回動軸(第1回動軸AX1、第2回動軸AX2)のそれぞれに対する計測対象物200の傾きを計測するためには、計4つのレーザ変位計を備えることが要求される。これに対して、本実施形態では、傾き計測装置100は、2つの回動軸(第1回動軸AX1、第2回動軸AX2)のそれぞれに対する計測対象物200の傾きを計測するためには、計2つのレーザ変位計(第1レーザ変位計1、第2レーザ変位計2)を備えていればよい。  Here, the inclination measuring device according to the comparative example will be described. The tilt measuring device according to the comparative example does not include the reflective member 5. Therefore, in the inclination measuring device according to the comparative example, the two laser displacement meters for measuring the inclination around the first rotation axis AX1 of the measurement object 200 and the second rotation axis AX2 of the measurement object 200 It is essential to have two laser displacement meters to measure the tilt around. That is, in the inclination measuring device according to the comparative example, in order to measure the inclination of the measurement object 200 with respect to each of the two rotation axes (first rotation axis AX1 and second rotation axis AX2), a total of four It is required to have a laser displacement meter. On the other hand, in the present embodiment, the inclination measuring device 100 measures the inclination of the measurement object 200 with respect to each of the two rotation axes (first rotation axis AX1 and second rotation axis AX2). It suffices to include a total of two laser displacement meters (first laser displacement meter 1 and second laser displacement meter 2). It was
 次に、図1Aおよび図2Aを参照して、第1仮想平面11、第2仮想平面12、仮想交差面15、第1方向D1、および、第2方向D2を定義する。  Next, with reference to FIGS. 1A and 2A, the first virtual plane 11, the second virtual plane 12, the virtual intersection surface 15, the first direction D1, and the second direction D2 are defined. It was
 図1Aに示すように、第1仮想平面11は、反射部材5が退避位置P1に位置する場合の第1レーザ光B1の光路および第2レーザ光B2の光路を含む仮想平面である。第1仮想平面11に対して、計測対象物200の第1回動軸AX1が交差する。従って、第1回動軸AX1は、例えば、仮想交差面15に含まれる。仮想交差面15は、反射部材5が退避位置P1に位置する場合の第1レーザ光B1および第2レーザ光B2に交差する仮想平面である。従って、本実施形態によれば、反射部材5が退避位置P1に位置する場合に、第1レーザ変位計1および第2レーザ変位計2が計測対象物200の変位を計測することで、仮想交差面15に含まれる第1回動軸AX1の周りの計測対象物200の傾きを算出できる。  As shown in FIG. 1A, the first virtual plane 11 is a virtual plane including an optical path of the first laser beam B1 and an optical path of the second laser beam B2 when the reflecting member 5 is located at the retracted position P1. The first rotation axis AX1 of the measurement object 200 intersects the first virtual plane 11. Therefore, the first rotation axis AX1 is included in, for example, the virtual intersection surface 15. The virtual intersection surface 15 is a virtual plane that intersects the first laser beam B1 and the second laser beam B2 when the reflection member 5 is located at the retracted position P1. Therefore, according to the present embodiment, when the reflection member 5 is located at the retracted position P1, the first laser displacement meter 1 and the second laser displacement meter 2 measure the displacement of the measurement object 200, thereby imaginary crossing. The inclination of the object to be measured 200 around the first rotation axis AX1 included in the surface 15 can be calculated. It was
 図1Aの例では、仮想交差面15は、第1レーザ光B1および第2レーザ光B2に略直交する。  In the example of FIG. 1A, the virtual intersection surface 15 is substantially orthogonal to the first laser beam B1 and the second laser beam B2. It was
 第1方向D1は、第1仮想平面11に交差する方向を示す。図1Aの例では、第1方向D1は、第1仮想平面11に略直交する。第1方向D1は、例えば、水平方向に略平行である。  The first direction D1 indicates a direction that intersects the first virtual plane 11. In the example of FIG. 1A, the first direction D1 is substantially orthogonal to the first virtual plane 11. The first direction D1 is, for example, substantially parallel to the horizontal direction. It was
 図2Aに示すように、第2仮想平面12は、反射部材5による反射後の第1レーザ光B10の光路および第2レーザ光B20の光路を含む仮想平面である。第2仮想平面12に対して、計測対象物200の第2回動軸AX2が交差する。そして、第2回動軸AX2は、仮想交差面15に交差しているため、仮想交差面15に含まれない。従って、反射部材5が進入位置P2に位置する場合に、第1レーザ変位計1および第2レーザ変位計2が計測対象物200の変位を計測することで、仮想交差面15に含まれない第2回動軸AX2の周りの計測対象物200の傾きを算出できる。  As shown in FIG. 2A, the second virtual plane 12 is a virtual plane including the optical path of the first laser beam B10 and the optical path of the second laser beam B20 after being reflected by the reflecting member 5. The second rotation axis AX2 of the measurement object 200 intersects the second virtual plane 12. Since the second rotation axis AX2 intersects the virtual intersection surface 15, it is not included in the virtual intersection surface 15. Therefore, when the reflective member 5 is located at the approach position P2, the first laser displacement meter 1 and the second laser displacement meter 2 measure the displacement of the object to be measured 200, so that the second laser displacement meter 2 is not included in the virtual intersection surface 15. 2 The inclination of the object to be measured 200 around the rotation axis AX2 can be calculated. It was
 第2方向D2は、第2仮想平面12に交差する方向を示す。図2Aの例では、第2方向D2は、第2仮想平面12に略直交する。第2方向D2は、例えば、鉛直方向に略平行である。  The second direction D2 indicates a direction that intersects the second virtual plane 12. In the example of FIG. 2A, the second direction D2 is substantially orthogonal to the second virtual plane 12. The second direction D2 is, for example, substantially parallel to the vertical direction. It was
 以上、図1Aおよび図2Aを参照して説明したように、傾き計測装置100は、反射部材5を備えることで、4つのレーザ変位計を使用することなく、第1レーザ変位計1および第2レーザ変位計2を使用して、第1回動軸AX1および第2回動軸AX2の周りの計測対象物200の傾きをそれぞれ計測できる。つまり、レーザ変位計の搭載数を抑制しつつ、仮想交差面15に含まれる第1回動軸AX1の周りの計測対象物200の傾きと、仮想交差面15に含まれない第2回動軸AX2の周りの計測対象物200の傾きとを計測できる。  As described above, as described with reference to FIGS. 1A and 2A, the inclination measuring device 100 includes the reflecting member 5, so that the first laser displacement meter 1 and the second laser displacement meter 100 are provided without using the four laser displacement meters. The laser displacement meter 2 can be used to measure the inclination of the object to be measured 200 around the first rotation axis AX1 and the second rotation axis AX2, respectively. That is, while suppressing the number of mounted laser displacement meters, the inclination of the measurement object 200 around the first rotation axis AX1 included in the virtual intersection surface 15 and the second rotation axis not included in the virtual intersection surface 15. It is possible to measure the inclination of the measurement object 200 around the AX2. It was
 なお、図2Aの例では、第1仮想平面11に対する反射部材5の傾斜角度は、略45度である。従って、反射部材5は、第1レーザ光B1および第2レーザ光B2を略90度だけ屈折させて反射する。  In the example of FIG. 2A, the inclination angle of the reflective member 5 with respect to the first virtual plane 11 is approximately 45 degrees. Therefore, the reflecting member 5 refracts the first laser beam B1 and the second laser beam B2 by about 90 degrees and reflects them. It was
 次に、図1Aを参照して、本実施形態の好ましい例を説明する。図1Aに示すように、計測対象物200は、計測対象物200の外部からの作用を受けて、第3回動軸AX3の周りに回動して、基準状態に対して第3回動軸AX3の周りに傾く。  Next, a preferred example of the present embodiment will be described with reference to FIG. 1A. As shown in FIG. 1A, the measurement object 200 receives an action from the outside of the measurement object 200 and rotates around the third rotation axis AX3, and the third rotation axis with respect to the reference state. Tilt around AX3. It was
 傾き計測装置100は、第3レーザ変位計3をさらに備えることが好ましい。第3レーザ変位計3は、計測対象物200に第3レーザ光B3を照射して、計測対象物200の変位を計測する。具体的には、第3レーザ変位計3は、計測対象物200に第3レーザ光B3を照射して、計測対象物200が反射した第3レーザ光B3を受光して、計測対象物200の変位を計測する。  It is preferable that the tilt measuring device 100 further includes a third laser displacement meter 3. The third laser displacement meter 3 irradiates the measurement object 200 with the third laser beam B3 to measure the displacement of the measurement object 200. Specifically, the third laser displacement meter 3 irradiates the measurement object 200 with the third laser beam B3, receives the third laser beam B3 reflected by the measurement object 200, and receives the third laser beam B3 of the measurement object 200. Measure the displacement. It was
 具体的には、反射部材5が退避位置P1に位置する場合、計測対象物200が基準状態に対して第3回動軸AX3の周りに傾いて停止した状態において、第3レーザ変位計3は、計測対象物200に第3レーザ光B3を照射して、計測対象物200の基準状態からの変位を計測する。加えて、反射部材5が退避位置P1に位置する場合、計測対象物200が基準状態に対して第3回動軸AX3の周りに傾いて停止した状態において、第2レーザ変位計2は、計測対象物200に第2レーザ光B2を照射して、計測対象物200の基準状態からの変位を計測する。その結果、傾き計測装置100は、反射部材5が退避位置P1に位置する場合の第2レーザ変位計2および第3レーザ変位計3による計測結果に基づいて、計測対象物200の第3回動軸AX3の周りの傾きを算出できる。  Specifically, when the reflective member 5 is located at the retracted position P1, the third laser displacement meter 3 is in a state where the measurement object 200 is tilted around the third rotation axis AX3 with respect to the reference state and stopped. , The measurement object 200 is irradiated with the third laser beam B3, and the displacement of the measurement object 200 from the reference state is measured. In addition, when the reflective member 5 is located at the retracted position P1, the second laser displacement meter 2 measures in a state where the measurement object 200 is tilted and stopped around the third rotation axis AX3 with respect to the reference state. The object 200 is irradiated with the second laser beam B2, and the displacement of the object 200 from the reference state is measured. As a result, the inclination measuring device 100 makes a third rotation of the object to be measured 200 based on the measurement results by the second laser displacement meter 2 and the third laser displacement meter 3 when the reflecting member 5 is located at the retracted position P1. The slope around the axis AX3 can be calculated. It was
 以上、図1Aおよび図2Aを参照して説明したように、本実施形態によれば、傾き計測装置100は、反射部材5を備えることで、5つのレーザ変位計を使用することなく、第1レーザ変位計1、第2レーザ変位計2、および、第3レーザ変位計3を使用して、第1回動軸AX1の周りの計測対象物200の傾きと、第2回動軸AX2の周りの計測対象物200の傾きと、第3回動軸AX3の周りの計測対象物200の傾きとを計測できる。換言すれば、レーザ変位計の搭載数を抑制しつつ、第1回動軸AX1~第3回動軸AX3の周りの計測対象物200の傾きをそれぞれ計測できる。また、回折格子を計測対象物200に配置することが要求されないため、回折格子を利用して計測対象物200の傾きを計測する場合と比較して、計測対象物200の形状の制約を緩和できる。  As described above with reference to FIGS. 1A and 2A, according to the present embodiment, the inclination measuring device 100 includes the reflecting member 5, so that the first laser displacement meter is not used. Using the laser displacement meter 1, the second laser displacement meter 2, and the third laser displacement meter 3, the inclination of the object to be measured 200 around the first rotation axis AX1 and the circumference of the second rotation axis AX2. The inclination of the measurement object 200 and the inclination of the measurement object 200 around the third rotation axis AX3 can be measured. In other words, the inclination of the measurement object 200 around the first rotation axis AX1 to the third rotation axis AX3 can be measured while suppressing the number of mounted laser displacement meters. Further, since it is not required to arrange the diffraction grating on the measurement object 200, the restriction on the shape of the measurement object 200 can be relaxed as compared with the case where the inclination of the measurement object 200 is measured by using the diffraction grating. .. It was
 ここで、比較例に係る傾き計測装置を説明する。比較例に係る傾き計測装置は反射部材5を備えない。従って、比較例に係る傾き計測装置では、計測対象物200の第1回動軸AX1の周りの傾きと第3回動軸AX3の周りの傾きとをそれぞれ計測するための3つのレーザ変位計と、計測対象物200の第2回動軸AX2の周りの傾きを計測するための2つのレーザ変位計とを備えることが必須になる。つまり、比較例に係る傾き計測装置では、3つの回動軸(第1回動軸AX1、第2回動軸AX2、第3回動軸AX3)のそれぞれに対する計測対象物200の傾きを計測するためには、計5つのレーザ変位計を備えることが要求される。これに対して、本実施形態では、傾き計測装置100は、3つの回動軸(第1回動軸AX1、第2回動軸AX2、第3回動軸AX3)のそれぞれに対する計測対象物200の傾きを計測するためには、計3つのレーザ変位計(第1レーザ変位計1、第2レーザ変位計2、第3レーザ変位計3)を備えていればよい。  Here, the inclination measuring device according to the comparative example will be described. The tilt measuring device according to the comparative example does not include the reflective member 5. Therefore, in the inclination measuring device according to the comparative example, there are three laser displacement meters for measuring the inclination around the first rotation axis AX1 and the inclination around the third rotation axis AX3 of the measurement object 200, respectively. It is essential to have two laser displacement meters for measuring the inclination of the object to be measured 200 around the second rotation axis AX2. That is, in the inclination measuring device according to the comparative example, the inclination of the measurement object 200 with respect to each of the three rotation axes (first rotation axis AX1, second rotation axis AX2, third rotation axis AX3) is measured. Therefore, it is required to have a total of five laser displacement meters. On the other hand, in the present embodiment, the tilt measuring device 100 measures the object 200 for each of the three rotation axes (first rotation axis AX1, second rotation axis AX2, and third rotation axis AX3). In order to measure the inclination of the laser displacement meter, a total of three laser displacement meters (first laser displacement meter 1, second laser displacement meter 2, third laser displacement meter 3) may be provided. It was
 引き続き図1Aを参照して、第3仮想平面13を定義する。第3仮想平面13は、反射部材5が退避位置P1に位置する場合の第2レーザ光B2の光路および第3レーザ光B3の光路を含む仮想平面である。第3仮想平面13に対して、計測対象物200の第3回動軸AX3が交差する。  Continue to refer to FIG. 1A to define the third virtual plane 13. The third virtual plane 13 is a virtual plane including the optical path of the second laser beam B2 and the optical path of the third laser beam B3 when the reflecting member 5 is located at the retracted position P1. The third rotation axis AX3 of the measurement object 200 intersects the third virtual plane 13. It was
 特に、第1仮想平面11と第3仮想平面13とは略直交することが好ましい。この好ましい例によれば、光学系の調整が容易であることに加えて、三角法によって、第1回動軸AX1~第3回動軸AX3の周りの計測対象物200の傾きをそれぞれ容易に算出できる。三角法とは、三角関数を使用した演算のことである。また、反射部材5が退避位置P1に位置する場合の第1レーザ光B1と第2レーザ光B2と第3レーザ光B3とは略平行であることが好ましい。この好ましい例によれば、光学系の調整が更に容易である。  In particular, it is preferable that the first virtual plane 11 and the third virtual plane 13 are substantially orthogonal to each other. According to this preferred example, in addition to the ease of adjusting the optical system, the trigonometry makes it easy to tilt the objects 200 around the first rotation axis AX1 to the third rotation axis AX3, respectively. Can be calculated. Trigonometry is an operation that uses trigonometric functions. Further, it is preferable that the first laser beam B1, the second laser beam B2, and the third laser beam B3 when the reflecting member 5 is located at the retracted position P1 are substantially parallel to each other. According to this preferred example, the adjustment of the optical system is even easier. It was
 また、第1仮想平面11は第1回動軸AX1に略直交することが好ましい。また、第3仮想平面13は第3回動軸AX3に略直交することが好ましい。さらに、図2Aに示すように、第2仮想平面12は第2回動軸AX2に略直交することが好ましい。この好ましい例によれば、三角法によって、第1回動軸AX1~第3回動軸AX3の周りの計測対象物200の傾きをそれぞれ更に容易に算出できる。  Further, it is preferable that the first virtual plane 11 is substantially orthogonal to the first rotation axis AX1. Further, it is preferable that the third virtual plane 13 is substantially orthogonal to the third rotation axis AX3. Further, as shown in FIG. 2A, it is preferable that the second virtual plane 12 is substantially orthogonal to the second rotation axis AX2. According to this preferred example, the inclination of the object to be measured 200 around the first rotation axis AX1 to the third rotation axis AX3 can be calculated more easily by the trigonometry. It was
 なお、仮想交差面15は、反射部材5が退避位置P1に位置する場合の第1レーザ光B1と第2レーザ光B2と第3レーザ光B3とに交差する。図1Aの例では、仮想交差面15は、第1レーザ光B1と第2レーザ光B2と第3レーザ光B3とに略直交する。  The virtual intersection surface 15 intersects the first laser beam B1, the second laser beam B2, and the third laser beam B3 when the reflection member 5 is located at the retracted position P1. In the example of FIG. 1A, the virtual intersection surface 15 is substantially orthogonal to the first laser beam B1, the second laser beam B2, and the third laser beam B3. It was
 次に、図3を参照して、傾き計測装置100を説明する。図3は、傾き計測装置100を示すブロック図である。図3に示すように、傾き計測装置100は、移動機構4と、駆動機構6と、制御部10と、記憶部20とをさらに備える。制御部10は、「算出部」の一例に相当する。  Next, the inclination measuring device 100 will be described with reference to FIG. FIG. 3 is a block diagram showing the inclination measuring device 100. As shown in FIG. 3, the tilt measuring device 100 further includes a moving mechanism 4, a driving mechanism 6, a control unit 10, and a storage unit 20. The control unit 10 corresponds to an example of a “calculation unit”. It was
 制御部10は、CPU(Central Processing Unit)のようなプロセッサを含む。記憶部20は、記憶装置を含み、データおよびコンピュータプログラムを記憶する。具体的には、記憶部20は、半導体メモリのような主記憶装置と、半導体メモリ、ソリッドステートドライブ、および/または、ハードディスクドライブのような補助記憶装置とを含む。記憶部20は、リムーバブルメディアを含んでいてもよい。記憶部20は、非一時的コンピューター読取可能記憶媒体の一例に相当する。制御部10のプロセッサは、記憶部20の記憶装置に記憶されたコンピュータプログラムを実行して、各種演算を実行するとともに、第1レーザ変位計1、第2レーザ変位計2、第3レーザ変位計3、移動機構4、および、駆動機構6を制御する。制御部10および記憶部20は、例えば、コンピュータを構成する。反射部材5を移動する移動機構4および計測対象物200を駆動する駆動機構6については後述する。  The control unit 10 includes a processor such as a CPU (Central Processing Unit). The storage unit 20 includes a storage device and stores data and computer programs. Specifically, the storage unit 20 includes a main storage device such as a semiconductor memory and an auxiliary storage device such as a semiconductor memory, a solid state drive, and / or a hard disk drive. The storage unit 20 may include removable media. The storage unit 20 corresponds to an example of a non-temporary computer-readable storage medium. The processor of the control unit 10 executes a computer program stored in the storage device of the storage unit 20 to execute various calculations, and also executes the first laser displacement meter 1, the second laser displacement meter 2, and the third laser displacement meter. 3. Controls the moving mechanism 4 and the driving mechanism 6. The control unit 10 and the storage unit 20 constitute, for example, a computer. The moving mechanism 4 for moving the reflective member 5 and the driving mechanism 6 for driving the measurement object 200 will be described later. It was
 制御部10は、反射部材5が退避位置P1に位置する場合の第1レーザ変位計1による計測結果と第2レーザ変位計2による計測結果とに基づいて、第1回動軸AX1の周りの計測対象物200の傾きを算出する。加えて、制御部10は、反射部材5が進入位置P2に位置する場合の第1レーザ変位計1による計測結果と第2レーザ変位計2による計測結果とに基づいて、第2回動軸AX2の周りの計測対象物200の傾きを算出する。  The control unit 10 around the first rotation axis AX1 based on the measurement result by the first laser displacement meter 1 and the measurement result by the second laser displacement meter 2 when the reflection member 5 is located at the retracted position P1. The inclination of the measurement object 200 is calculated. In addition, the control unit 10 has the second rotation axis AX2 based on the measurement result by the first laser displacement meter 1 and the measurement result by the second laser displacement meter 2 when the reflection member 5 is located at the approach position P2. Calculate the inclination of the object to be measured 200 around. It was
 すなわち、本実施形態によれば、制御部10は、4つのレーザ変位計による計測結果を使用することなく、第1レーザ変位計1および第2レーザ変位計2による計測結果を使用して、第1回動軸AX1および第2回動軸AX2の周りの計測対象物200の傾きをそれぞれ算出できる。  That is, according to the present embodiment, the control unit 10 uses the measurement results of the first laser displacement meter 1 and the second laser displacement meter 2 without using the measurement results of the four laser displacement meters. The inclination of the measurement object 200 around the 1 rotation shaft AX1 and the 2nd rotation shaft AX2 can be calculated, respectively. It was
 好ましくは、制御部10は、反射部材5が退避位置P1に位置する場合の第2レーザ変位計2による計測結果と第3レーザ変位計3による計測結果とに基づいて、第3回動軸AX3の周りの計測対象物200の傾きを算出する。この好ましい例によれば、制御部10は、5つのレーザ変位計による計測結果を使用することなく、第1レーザ変位計1と第2レーザ変位計2と第3レーザ変位計3とによる計測結果を使用して、第1回動軸AX1~第3回動軸AX3の周りの計測対象物200の傾きをそれぞれ算出できる。  Preferably, the control unit 10 has the third rotation axis AX3 based on the measurement result by the second laser displacement meter 2 and the measurement result by the third laser displacement meter 3 when the reflection member 5 is located at the retracted position P1. Calculate the inclination of the object to be measured 200 around. According to this preferred example, the control unit 10 does not use the measurement results of the five laser displacement meters, but the measurement results of the first laser displacement meter 1, the second laser displacement meter 2, and the third laser displacement meter 3. Can be used to calculate the inclination of the measurement object 200 around the first rotation axis AX1 to the third rotation axis AX3, respectively. It was
 次に、図3、図4Aおよび図4Bを参照して、計測対象物200の第3回動軸AX3の周りの傾きの計測方法を説明する。図4Aは、傾き計測装置100が計測対象物200の第3回動軸AX3の周りの傾きを計測する際の第2レーザ光B2および第3レーザ光B3と計測対象物200との関係を示す斜視図である。図4Bは、傾き計測装置100が計測対象物200の第3回動軸AX3の周りの傾きを計測する際に、第3回動軸方向から見た第2レーザ光B2と第3レーザ光B3と計測対象物200とを示す図である。なお、図4Aおよび図4Bでは、図面の簡略化のために、反射部材5および第2照射対象物203(図1A)を省略する。  Next, with reference to FIGS. 3, 4A and 4B, a method of measuring the inclination of the measurement object 200 around the third rotation axis AX3 will be described. FIG. 4A shows the relationship between the second laser beam B2 and the third laser beam B3 and the measurement object 200 when the inclination measuring device 100 measures the inclination of the measurement object 200 around the third rotation axis AX3. It is a perspective view. FIG. 4B shows the second laser beam B2 and the third laser beam B3 viewed from the third rotation axis direction when the inclination measuring device 100 measures the inclination of the object 200 to be measured around the third rotation axis AX3. It is a figure which shows the measurement object 200. In FIGS. 4A and 4B, the reflective member 5 and the second irradiation target 203 (FIG. 1A) are omitted for the sake of simplification of the drawings. It was
 図3、図4Aおよび図4Bに示すように、反射部材5が退避位置P1に位置する場合、制御部10は、レーザスポット距離L3とレーザスポット変位量d3とに基づいて、三角法によって基準状態に対する計測対象物200の傾きを示す傾き角度θ3を算出する。従って、本実施形態によれば、計測対象物200の傾き角度θ3を、簡易な演算式によって精度良く算出できる。傾き角度θ3は、基準状態に対する計測対象物200の第3回動軸AX3の周りの傾きを示す。  As shown in FIGS. 3, 4A and 4B, when the reflecting member 5 is located at the retracted position P1, the control unit 10 is in a reference state by trigonometry based on the laser spot distance L3 and the laser spot displacement amount d3. A tilt angle θ3 indicating the tilt of the object to be measured 200 with respect to the target is calculated. Therefore, according to the present embodiment, the inclination angle θ3 of the object to be measured 200 can be calculated accurately by a simple calculation formula. The tilt angle θ3 indicates the tilt of the object to be measured 200 with respect to the reference state around the third rotation axis AX3. It was
 具体的には、レーザスポット距離L3は、反射部材5が退避位置P1に位置する場合において、基準状態の計測対象物200における第2レーザ光B2の照射スポットT2と第3レーザ光B3の照射スポットT3との間の距離を示す。つまり、レーザスポット距離L3は、反射部材5が退避位置P1に位置する場合において、第2レーザ光B2と第3レーザ光B3との間隔を示す。レーザスポット変位量d3は、反射部材5が退避位置P1に位置する場合において、基準状態に対する計測対象物200の傾きに応じた物理量であって、基準状態に対する第2レーザ光B2の照射スポットT2の変位量と第3レーザ光B3の照射スポットT3の変位量との和を示す。  Specifically, the laser spot distance L3 is the irradiation spot of the second laser beam B2 and the irradiation spot of the third laser beam B3 in the measurement object 200 in the reference state when the reflection member 5 is located at the retracted position P1. Shows the distance to T3. That is, the laser spot distance L3 indicates the distance between the second laser beam B2 and the third laser beam B3 when the reflecting member 5 is located at the retracted position P1. The laser spot displacement amount d3 is a physical quantity corresponding to the inclination of the measurement object 200 with respect to the reference state when the reflection member 5 is located at the retracted position P1, and is a physical quantity of the irradiation spot T2 of the second laser beam B2 with respect to the reference state. The sum of the displacement amount and the displacement amount of the irradiation spot T3 of the third laser beam B3 is shown. It was
 例えば、第2レーザ変位計2は、計測対象物200が第3回動軸AX3の周りに傾いた状態において、計測対象物200の基準状態に対する照射スポットT2の変位量を計測する。加えて、例えば、第3レーザ変位計3は、計測対象物200が第3回動軸AX3の周りに傾いた状態において、計測対象物200の基準状態に対する照射スポットT3の変位量を計測する。そして、例えば、制御部10は、照射スポットT2の変位量と照射スポットT3の変位量との和であるレーザスポット変位量d3を算出する。  For example, the second laser displacement meter 2 measures the amount of displacement of the irradiation spot T2 with respect to the reference state of the measurement object 200 in a state where the measurement object 200 is tilted around the third rotation axis AX3. In addition, for example, the third laser displacement meter 3 measures the displacement amount of the irradiation spot T3 with respect to the reference state of the measurement object 200 in a state where the measurement object 200 is tilted around the third rotation axis AX3. Then, for example, the control unit 10 calculates the laser spot displacement amount d3, which is the sum of the displacement amount of the irradiation spot T2 and the displacement amount of the irradiation spot T3. It was
 更に具体的には、制御部10は、次式に示す演算を実行して、傾き角度θ3を算出する。 
θ3=arc tan(d3/L3) 
More specifically, the control unit 10 executes the calculation shown in the following equation to calculate the tilt angle θ3.
θ3 = arc tan (d3 / L3)
 特に、反射部材5が退避位置P1に位置する場合のレーザスポット距離L3は、予め設定されることが好ましい。つまり、三角法による演算式に必要なレーザスポット距離L3を予め設定して固定値とすることが好ましい。この好ましい例によれば、計測対象物200ごとにレーザスポット距離L3を計測する作業が要求されない。つまり、計測対象物200を交換するたびにレーザスポット距離L3を計測する作業が要求されない。その結果、計測対象物200の傾き角度θ3を算出するための計測作業を簡素化できる。  In particular, it is preferable that the laser spot distance L3 when the reflection member 5 is located at the retracted position P1 is set in advance. That is, it is preferable to set the laser spot distance L3 required for the calculation formula by the trigonometry in advance and set it as a fixed value. According to this preferred example, the work of measuring the laser spot distance L3 for each measurement object 200 is not required. That is, the work of measuring the laser spot distance L3 every time the measurement object 200 is replaced is not required. As a result, the measurement work for calculating the inclination angle θ3 of the measurement object 200 can be simplified. It was
 また、本実施形態では、計測対象物200は平面F1を備える。具体的には、計測対象物200の第1照射対象物201は、平面F1を備える。第1照射対象物201は、例えば、略平板形状を有する。基準状態の計測対象物200の平面F1は、第1方向D1に略平行であり、第2方向D2に略直交する。平面F1は、第1照射面TA1と第2照射面TA2と第3照射面TA3とを含む。なお、図4Bでは、基準状態の計測対象物200の平面F1が一点鎖線によって示される。  Further, in the present embodiment, the measurement object 200 includes a plane F1. Specifically, the first irradiation target object 201 of the measurement target object 200 includes a plane F1. The first irradiation object 201 has, for example, a substantially flat plate shape. The plane F1 of the measurement object 200 in the reference state is substantially parallel to the first direction D1 and is substantially orthogonal to the second direction D2. The plane F1 includes a first irradiation surface TA1, a second irradiation surface TA2, and a third irradiation surface TA3. In FIG. 4B, the plane F1 of the measurement object 200 in the reference state is shown by the alternate long and short dash line. It was
 特に、本実施形態では、反射部材5が退避位置P1に位置する場合、第2レーザ変位計2は、計測対象物200の第2照射面TA2に第2レーザ光B2を照射して、第2照射面TA2によって反射された第2レーザ光B2を受光することで、基準状態に対する計測対象物200の第3回動軸AX3の周りの変位を計測する。加えて、反射部材5が退避位置P1に位置する場合、第3レーザ変位計3は、計測対象物200における第2照射面TA2と同一平面F1上の第3照射面TA3に第3レーザ光B3を照射して、第3照射面TA3によって反射された第3レーザ光B3を受光することで、基準状態に対する計測対象物200の第3回動軸AX3の周りの変位を計測する。本実施形態によれば、計測対象物200に第2照射面TA2および第3照射面TA3を設けることで、光学系の調整を容易にしつつ、精度良く計測対象物200の第3回動軸AX3の周りの傾きを計測できる。  In particular, in the present embodiment, when the reflective member 5 is located at the retracted position P1, the second laser displacement meter 2 irradiates the second irradiation surface TA2 of the measurement object 200 with the second laser beam B2 to obtain a second laser beam. By receiving the second laser beam B2 reflected by the irradiation surface TA2, the displacement of the measurement object 200 around the third rotation axis AX3 with respect to the reference state is measured. In addition, when the reflection member 5 is located at the retracted position P1, the third laser displacement meter 3 has the third laser beam B3 on the third irradiation surface TA3 on the same plane F1 as the second irradiation surface TA2 in the measurement object 200. By receiving the third laser beam B3 reflected by the third irradiation surface TA3, the displacement of the object to be measured 200 with respect to the reference state around the third rotation axis AX3 is measured. According to the present embodiment, by providing the second irradiation surface TA2 and the third irradiation surface TA3 on the measurement object 200, the third rotation axis AX3 of the measurement object 200 can be accurately adjusted while facilitating the adjustment of the optical system. The tilt around the can be measured. It was
 次に、図3、図5Aおよび図5Bを参照して、計測対象物200の第1回動軸AX1の周りの傾きの検出方法を説明する。図5Aは、傾き計測装置100が計測対象物200の第1回動軸AX1の周りの傾きを計測する際の第1レーザ光B1および第2レーザ光B2と計測対象物200との関係を示す斜視図である。図5Bは、傾き計測装置100が計測対象物200の第1回動軸AX1の周りの傾きを計測する際に、第1回動軸方向から見た第1レーザ光B1と第2レーザ光B2と計測対象物200とを示す図である。図5Bでは、基準状態の計測対象物200の平面F1が一点鎖線によって示される。なお、図5Aおよび図5Bでは、図面の簡略化のために、反射部材5および第2照射対象物203(図1A)を省略する。  Next, with reference to FIGS. 3, 5A and 5B, a method of detecting the inclination of the measurement object 200 around the first rotation axis AX1 will be described. FIG. 5A shows the relationship between the first laser beam B1 and the second laser beam B2 and the measurement object 200 when the inclination measuring device 100 measures the inclination of the measurement object 200 around the first rotation axis AX1. It is a perspective view. FIG. 5B shows the first laser beam B1 and the second laser beam B2 viewed from the direction of the first rotation axis when the inclination measuring device 100 measures the inclination of the object to be measured 200 around the first rotation axis AX1. It is a figure which shows the measurement object 200. In FIG. 5B, the plane F1 of the measurement object 200 in the reference state is shown by the alternate long and short dash line. In FIGS. 5A and 5B, the reflective member 5 and the second irradiation target 203 (FIG. 1A) are omitted for the sake of simplification of the drawings. It was
 図3、図5Aおよび図5Bに示すように、反射部材5が退避位置P1に位置する場合、制御部10は、レーザスポット距離L1とレーザスポット変位量d1とに基づいて、三角法によって基準状態に対する計測対象物200の傾きを示す傾き角度θ1を算出する。従って、本実施形態によれば、計測対象物200の傾き角度θ1を、簡易な演算式によって精度良く算出できる。傾き角度θ1は、基準状態に対する計測対象物200の第1回動軸AX1の周りの傾きを示す。  As shown in FIGS. 3, 5A and 5B, when the reflecting member 5 is located at the retracted position P1, the control unit 10 is in a reference state by trigonometry based on the laser spot distance L1 and the laser spot displacement amount d1. The inclination angle θ1 indicating the inclination of the object to be measured 200 with respect to the object 200 is calculated. Therefore, according to the present embodiment, the inclination angle θ1 of the measurement object 200 can be calculated accurately by a simple calculation formula. The tilt angle θ1 indicates the tilt of the object to be measured 200 with respect to the reference state around the first rotation axis AX1. It was
 具体的には、レーザスポット距離L1は、反射部材5が退避位置P1に位置する場合において、基準状態の計測対象物200における第1レーザ光B1の照射スポットT1と第2レーザ光B2の照射スポットT2との間の距離を示す。つまり、レーザスポット距離L1は、反射部材5が退避位置P1に位置する場合において、第1レーザ光B1と第2レーザ光B2との間隔を示す。レーザスポット変位量d1は、反射部材5が退避位置P1に位置する場合において、基準状態に対する計測対象物200の傾きに応じた物理量であって、基準状態に対する第1レーザ光B1の照射スポットT1の変位量と第2レーザ光B2の照射スポットT2の変位量との和を示す。  Specifically, the laser spot distance L1 is the irradiation spot of the first laser beam B1 and the irradiation spot of the second laser beam B2 in the measurement object 200 in the reference state when the reflection member 5 is located at the retracted position P1. The distance to T2 is shown. That is, the laser spot distance L1 indicates the distance between the first laser beam B1 and the second laser beam B2 when the reflecting member 5 is located at the retracted position P1. The laser spot displacement amount d1 is a physical quantity corresponding to the inclination of the measurement object 200 with respect to the reference state when the reflection member 5 is located at the retracted position P1, and is the physical quantity of the irradiation spot T1 of the first laser beam B1 with respect to the reference state. The sum of the displacement amount and the displacement amount of the irradiation spot T2 of the second laser beam B2 is shown. It was
 例えば、第1レーザ変位計1は、計測対象物200が第1回動軸AX1の周りに傾いた状態において、計測対象物200の基準状態に対する照射スポットT1の変位量を計測する。加えて、例えば、第2レーザ変位計2は、計測対象物200が第1回動軸AX1の周りに傾いた状態において、計測対象物200の基準状態に対する照射スポットT2の変位量を計測する。そして、例えば、制御部10は、照射スポットT1の変位量と照射スポットT2の変位量との和であるレーザスポット変位量d1を算出する。  For example, the first laser displacement meter 1 measures the amount of displacement of the irradiation spot T1 with respect to the reference state of the measurement object 200 in a state where the measurement object 200 is tilted around the first rotation axis AX1. In addition, for example, the second laser displacement meter 2 measures the displacement amount of the irradiation spot T2 with respect to the reference state of the measurement object 200 in a state where the measurement object 200 is tilted around the first rotation axis AX1. Then, for example, the control unit 10 calculates the laser spot displacement amount d1, which is the sum of the displacement amount of the irradiation spot T1 and the displacement amount of the irradiation spot T2. It was
 更に具体的には、制御部10は、次式に示す演算を実行して、傾き角度θ1を算出する。 
θ1=arc tan(d1/L1) 
More specifically, the control unit 10 executes the calculation shown in the following equation to calculate the tilt angle θ1.
θ1 = arc tan (d1 / L1)
 特に、反射部材5が退避位置P1に位置する場合のレーザスポット距離L1は、予め設定されることが好ましい。つまり、三角法による演算式に必要なレーザスポット距離L1を予め設定して固定値とすることが好ましい。この好ましい例によれば、計測対象物200ごとにレーザスポット距離L1を計測する作業が要求されない。つまり、計測対象物200を交換するたびにレーザスポット距離L1を計測する作業が要求されない。その結果、計測対象物200の傾き角度θ1を算出するための計測作業を簡素化できる。  In particular, it is preferable that the laser spot distance L1 when the reflection member 5 is located at the retracted position P1 is set in advance. That is, it is preferable to set the laser spot distance L1 required for the calculation formula by the trigonometry in advance and set it as a fixed value. According to this preferred example, the work of measuring the laser spot distance L1 for each measurement object 200 is not required. That is, the work of measuring the laser spot distance L1 every time the measurement object 200 is replaced is not required. As a result, the measurement work for calculating the inclination angle θ1 of the measurement object 200 can be simplified. It was
 また、本実施形態では、反射部材5が退避位置P1に位置する場合、第1レーザ変位計1は、計測対象物200の第1照射面TA1に第1レーザ光B1を照射して、第1照射面TA1によって反射された第1レーザ光B1を受光することで、基準状態に対する計測対象物200の第1回動軸AX1の周りの変位を計測する。加えて、反射部材5が退避位置P1に位置する場合、第2レーザ変位計2は、計測対象物200における第1照射面TA1と同一平面F1上の第2照射面TA2に第2レーザ光B2を照射して、第2照射面TA2によって反射された第2レーザ光B2を受光することで、基準状態に対する計測対象物200の第1回動軸AX1の周りの変位を計測する。本実施形態によれば、計測対象物200に第1照射面TA1および第2照射面TA2を設けることで、光学系の調整を容易にしつつ、精度良く計測対象物200の第1回動軸AX1の周りの傾きを計測できる。  Further, in the present embodiment, when the reflecting member 5 is located at the retracted position P1, the first laser displacement meter 1 irradiates the first irradiation surface TA1 of the measurement object 200 with the first laser beam B1 to obtain the first laser displacement meter 1. By receiving the first laser beam B1 reflected by the irradiation surface TA1, the displacement of the measurement object 200 around the first rotation axis AX1 with respect to the reference state is measured. In addition, when the reflecting member 5 is located at the retracted position P1, the second laser displacement meter 2 has a second laser beam B2 on the second irradiation surface TA2 on the same plane F1 as the first irradiation surface TA1 in the measurement object 200. By receiving the second laser beam B2 reflected by the second irradiation surface TA2, the displacement of the object to be measured 200 with respect to the reference state around the first rotation axis AX1 is measured. According to the present embodiment, by providing the first irradiation surface TA1 and the second irradiation surface TA2 on the measurement object 200, the first rotation axis AX1 of the measurement object 200 can be accurately adjusted while facilitating the adjustment of the optical system. The tilt around the can be measured. It was
 次に、図6Aおよび図6Bを参照して、計測対象物200の第2回動軸AX2の周りの傾きの計測方法を説明する。図6Aは、傾き計測装置100が計測対象物200の第2回動軸AX2の周りの傾きを計測する際の第1レーザ光B10および第2レーザ光B20と計測対象物200との関係を示す斜視図である。図6Bは、傾き計測装置100が計測対象物200の第2回動軸AX2の周りの傾きを計測する際に、第2回動軸方向から見た第1レーザ光B10と第2レーザ光B20と計測対象物200とを示す図である。なお、図6Bでは、図面を見易くするために、反射部材5を二点鎖線で示している。  Next, with reference to FIGS. 6A and 6B, a method of measuring the inclination of the object to be measured 200 around the second rotation axis AX2 will be described. FIG. 6A shows the relationship between the first laser beam B10 and the second laser beam B20 and the measurement object 200 when the inclination measuring device 100 measures the inclination of the measurement object 200 around the second rotation axis AX2. It is a perspective view. FIG. 6B shows the first laser beam B10 and the second laser beam B20 viewed from the second rotation axis direction when the inclination measuring device 100 measures the inclination of the object 200 to be measured around the second rotation axis AX2. It is a figure which shows the measurement object 200. In FIG. 6B, the reflective member 5 is shown by a two-dot chain line in order to make the drawing easier to see. It was
 図6Aおよび図6Bに示すように、反射部材5が進入位置P2に位置する場合、制御部10は、レーザスポット距離L2とレーザスポット変位量d2とに基づいて、三角法によって基準状態に対する計測対象物200の傾きを示す傾き角度θ2を算出する。従って、本実施形態によれば、計測対象物200の傾き角度θ2を、簡易な演算式によって精度良く算出できる。傾き角度θ2は、基準状態に対する計測対象物200の第2回動軸AX2の周りの傾きを示す。  As shown in FIGS. 6A and 6B, when the reflective member 5 is located at the approach position P2, the control unit 10 measures the reference state by trigonometry based on the laser spot distance L2 and the laser spot displacement amount d2. The inclination angle θ2 indicating the inclination of the object 200 is calculated. Therefore, according to the present embodiment, the inclination angle θ2 of the object to be measured 200 can be calculated accurately by a simple calculation formula. The tilt angle θ2 indicates the tilt of the object to be measured 200 with respect to the reference state around the second rotation axis AX2. It was
 具体的には、レーザスポット距離L2は、反射部材5が進入位置P2に位置する場合において、基準状態の計測対象物200における第1レーザ光B10の照射スポットT10と第2レーザ光B20の照射スポットT20との間の距離を示す。つまり、レーザスポット距離L2は、反射部材5が進入位置P2に位置する場合において、第1レーザ光B10と第2レーザ光B20との間隔を示す。レーザスポット変位量d2は、反射部材5が進入位置P2に位置する場合において、基準状態に対する計測対象物200の傾きに応じた物理量であって、基準状態に対する第1レーザ光B10の照射スポットT10の変位量と第2レーザ光B20の照射スポットT20の変位量との和を示す。  Specifically, the laser spot distance L2 is the irradiation spot of the first laser beam B10 and the irradiation spot of the second laser beam B20 in the measurement object 200 in the reference state when the reflection member 5 is located at the approach position P2. The distance to T20 is shown. That is, the laser spot distance L2 indicates the distance between the first laser beam B10 and the second laser beam B20 when the reflecting member 5 is located at the approach position P2. The laser spot displacement amount d2 is a physical quantity corresponding to the inclination of the measurement object 200 with respect to the reference state when the reflection member 5 is located at the approach position P2, and is a physical quantity of the irradiation spot T10 of the first laser beam B10 with respect to the reference state. The sum of the displacement amount and the displacement amount of the irradiation spot T20 of the second laser beam B20 is shown. It was
 例えば、第1レーザ変位計1は、計測対象物200が第2回動軸AX2の周りに傾いた状態において、計測対象物200の基準状態に対する照射スポットT10の変位量を計測する。加えて、例えば、第2レーザ変位計2は、計測対象物200が第2回動軸AX2の周りに傾いた状態において、計測対象物200の基準状態に対する照射スポットT20の変位量を計測する。そして、例えば、制御部10は、照射スポットT10の変位量と照射スポットT20の変位量との和であるレーザスポット変位量d2を算出する。  For example, the first laser displacement meter 1 measures the amount of displacement of the irradiation spot T10 with respect to the reference state of the measurement object 200 in a state where the measurement object 200 is tilted around the second rotation axis AX2. In addition, for example, the second laser displacement meter 2 measures the amount of displacement of the irradiation spot T20 with respect to the reference state of the measurement object 200 in a state where the measurement object 200 is tilted around the second rotation axis AX2. Then, for example, the control unit 10 calculates the laser spot displacement amount d2, which is the sum of the displacement amount of the irradiation spot T10 and the displacement amount of the irradiation spot T20. It was
 更に具体的には、制御部10は、次式に示す演算を実行して、傾き角度θ2を算出する。 
θ2=arc tan(d2/L2) 
More specifically, the control unit 10 executes the calculation shown in the following equation to calculate the tilt angle θ2.
θ2 = arc tan (d2 / L2)
 特に、反射部材5が進入位置P2に位置する場合のレーザスポット距離L2は、予め設定されることが好ましい。つまり、三角法による演算式に必要なレーザスポット距離L2を予め設定して固定値とすることが好ましい。この好ましい例によれば、計測対象物200ごとにレーザスポット距離L2を計測する作業が要求されない。つまり、計測対象物200を交換するたびにレーザスポット距離L2を計測する作業が要求されない。その結果、計測対象物200の傾き角度θ2を算出するための計測作業を簡素化できる。  In particular, it is preferable that the laser spot distance L2 when the reflection member 5 is located at the approach position P2 is set in advance. That is, it is preferable to set the laser spot distance L2 required for the calculation formula by the trigonometry in advance and set it as a fixed value. According to this preferred example, the work of measuring the laser spot distance L2 for each measurement object 200 is not required. That is, the work of measuring the laser spot distance L2 every time the measurement object 200 is replaced is not required. As a result, the measurement work for calculating the inclination angle θ2 of the measurement object 200 can be simplified. It was
 また、本実施形態では、計測対象物200は平面F2を備える。具体的には、計測対象物200の第2照射対象物203は、平面F2を備える。第2照射対象物203は、例えば、略平板形状を有する。平面F2は、平面F1に交差する。図6Aの例では、平面F2は平面F1に略直交する。つまり、第2照射対象物203は、平面F1から略垂直に延びる。基準状態の計測対象物200の平面F2は、第1方向D1に略直交し、第2方向D2に略平行である。平面F2は、第1交差照射面TA10と第2交差照射面TA20とを含む。なお、図6Bでは、基準状態の計測対象物200の平面F2が一点鎖線によって示される。  Further, in the present embodiment, the measurement object 200 includes a plane F2. Specifically, the second irradiation target 203 of the measurement target 200 includes a plane F2. The second irradiation object 203 has, for example, a substantially flat plate shape. The plane F2 intersects the plane F1. In the example of FIG. 6A, the plane F2 is substantially orthogonal to the plane F1. That is, the second irradiation object 203 extends substantially vertically from the plane F1. The plane F2 of the measurement object 200 in the reference state is substantially orthogonal to the first direction D1 and substantially parallel to the second direction D2. The plane F2 includes a first cross-irradiation surface TA10 and a second cross-irradiation surface TA20. In FIG. 6B, the plane F2 of the measurement object 200 in the reference state is shown by a alternate long and short dash line. It was
 反射部材5が進入位置P2に位置する場合、反射部材5は、計測対象物200における第1照射面TA1に交差する第1交差照射面TA10に向けて第1レーザ光B10を反射する。そして、第1レーザ変位計1は、第1交差照射面TA10によって反射された第1レーザ光B1を反射部材5を介して受光することで、基準状態に対する計測対象物200の第2回動軸AX2の周りの変位を計測する。加えて、反射部材5が進入位置P2に位置する場合、反射部材5は、計測対象物200における第1交差照射面TA10と同一平面F2上の第2交差照射面TA20に向けて第2レーザ光B20を反射する。そして、第2レーザ変位計2は、第2交差照射面TA20によって反射された第2レーザ光B20を反射部材5を介して受光することで、基準状態に対する計測対象物200の第2回動軸AX2の周りの変位を計測する。本実施形態によれば、計測対象物200に第1交差照射面TA10および第2交差照射面TA20を設けることで、光学系の調整を容易にしつつ、精度良く計測対象物200の第2回動軸AX2の周りの傾きを計測できる。  When the reflecting member 5 is located at the approach position P2, the reflecting member 5 reflects the first laser beam B10 toward the first crossing irradiation surface TA10 intersecting the first irradiation surface TA1 in the measurement object 200. Then, the first laser displacement meter 1 receives the first laser beam B1 reflected by the first cross-irradiation surface TA10 through the reflection member 5, so that the second rotation shaft of the measurement object 200 with respect to the reference state is received. Measure the displacement around AX2. In addition, when the reflecting member 5 is located at the approach position P2, the reflecting member 5 emits a second laser beam toward the second crossing irradiation surface TA20 on the same plane F2 as the first crossing irradiation surface TA10 in the measurement object 200. Reflects B20. Then, the second laser displacement meter 2 receives the second laser beam B20 reflected by the second cross-irradiation surface TA20 via the reflection member 5, so that the second rotation axis of the measurement object 200 with respect to the reference state is received. Measure the displacement around AX2. According to the present embodiment, by providing the first cross-irradiation surface TA10 and the second cross-irradiation surface TA20 on the measurement object 200, the second rotation of the measurement object 200 can be performed accurately while facilitating the adjustment of the optical system. The inclination around the axis AX2 can be measured. It was
 好ましくは、第1交差照射面TA10は第1照射面TA1に略直交し、第2交差照射面TA20は第2照射面TA2に略直交する。この好ましい例によれば、光学系の調整を更に容易にできる。  Preferably, the first cross-irradiation surface TA10 is substantially orthogonal to the first irradiation surface TA1, and the second cross-irradiation surface TA20 is substantially orthogonal to the second irradiation surface TA2. According to this preferred example, the adjustment of the optical system can be further facilitated. It was
 なお、図4A~図6Bにおいて、レーザスポット距離L1、レーザスポット距離L2、および、レーザスポット距離L3は、互いに同一であってもよいし、異なっていてもよく、任意の値に設定できる。また、第1照射面TA1と第2照射面TA2とは同一平面F1上になくてもよい。第2照射面TA2と第3照射面TA3とは同一平面F1上になくてもよい。第1交差照射面TA10と第2交差照射面TA20とは同一平面F2上になくてもよい。  Note that, in FIGS. 4A to 6B, the laser spot distance L1, the laser spot distance L2, and the laser spot distance L3 may be the same or different from each other, and can be set to arbitrary values. Further, the first irradiation surface TA1 and the second irradiation surface TA2 do not have to be on the same plane F1. The second irradiation surface TA2 and the third irradiation surface TA3 do not have to be on the same plane F1. The first cross-irradiation surface TA10 and the second cross-irradiation surface TA20 do not have to be on the same plane F2. It was
 また、第1レーザ変位計1、第2レーザ変位計2、および、第3レーザ変位計3による変位の計測方式は、特に限定されないが、例えば、三角測距方式でも良い。第1レーザ変位計1~第3レーザ変位計3の各々は、例えば、少なくともレーザ光源と受光素子とを備えても良い。レーザ光源は、例えば、半導体レーザである。受光素子は、例えば、位置検出素子(PSD : Position Sensitive Device)、または、リニアイメージセンサである。また、第1レーザ変位計1~第3レーザ変位計3の各々は、例えば、正反射方式を採用するが、拡散反射方式を採用してもよい。  The displacement measurement method by the first laser displacement meter 1, the second laser displacement meter 2, and the third laser displacement meter 3 is not particularly limited, but may be, for example, a triangular distance measuring method. Each of the first laser displacement meter 1 to the third laser displacement meter 3 may include, for example, at least a laser light source and a light receiving element. The laser light source is, for example, a semiconductor laser. The light receiving element is, for example, a position detection element (PSD: Position Sensitive Device) or a linear image sensor. Further, each of the first laser displacement meter 1 to the third laser displacement meter 3 adopts, for example, a specular reflection method, but a diffuse reflection method may be adopted. It was
 次に、図7を参照して、計測対象物200の第3回動軸AX3の周りの傾きを説明する。図7は、計測対象物200が第3回動軸AX3の周りに回動するときの状態を示す図である。図7では、第3回動軸方向から計測対象物200を見ている。また、図7では、計測対象物200が傾いた状態を破線で示している。  Next, with reference to FIG. 7, the inclination of the measurement object 200 around the third rotation axis AX3 will be described. FIG. 7 is a diagram showing a state when the measurement object 200 rotates around the third rotation shaft AX3. In FIG. 7, the measurement object 200 is viewed from the third rotation axis direction. Further, in FIG. 7, the state in which the measurement object 200 is tilted is shown by a broken line. It was
 図7に示すように、傾き計測装置100は、ワークWを載置するための載置部300をさらに備える。載置部300は、例えば、台である。ワークWは、計測対象物200と、支持体210とを備える。支持体210は、計測対象物200を回動可能な状態で支持する。載置部300は、基準面301を備える。基準面301は、平坦な面である。図7の例では、基準面301は、水平面に略平行である。ワークWは基準面301に載置される。具体的には、支持体210の底面は平坦な面である。そして、ワークWが基準面301に載置されると、支持体210の底面が基準面301に接触する。計測対象物200の基準状態では、計測対象物200の平面F1は基準面301に略平行であり、計測対象物200の平面F2は基準面301に略直交する。  As shown in FIG. 7, the inclination measuring device 100 further includes a mounting portion 300 for mounting the work W. The mounting unit 300 is, for example, a stand. The work W includes a measurement object 200 and a support 210. The support 210 supports the measurement object 200 in a rotatable state. The mounting portion 300 includes a reference surface 301. The reference surface 301 is a flat surface. In the example of FIG. 7, the reference plane 301 is substantially parallel to the horizontal plane. The work W is placed on the reference surface 301. Specifically, the bottom surface of the support 210 is a flat surface. Then, when the work W is placed on the reference surface 301, the bottom surface of the support 210 comes into contact with the reference surface 301. In the reference state of the measurement object 200, the plane F1 of the measurement object 200 is substantially parallel to the reference surface 301, and the plane F2 of the measurement object 200 is substantially orthogonal to the reference surface 301. It was
 計測対象物200は、図3に示す駆動機構6から外部作用を受けて、基準状態に対して第3回動軸AX3の周りに回動して停止する。その結果、計測対象物200は、基準状態に対して第3回動軸AX3の周りに傾く。つまり、計測対象物200の平面F1は、基準面301に対して第3回動軸AX3の周りに傾く。  The measurement object 200 receives an external action from the drive mechanism 6 shown in FIG. 3, rotates around the third rotation shaft AX3 with respect to the reference state, and stops. As a result, the measurement object 200 is tilted around the third rotation axis AX3 with respect to the reference state. That is, the plane F1 of the object to be measured 200 is tilted around the third rotation axis AX3 with respect to the reference surface 301. It was
 具体的には、駆動機構6は、反射部材5が退避位置P1に位置する場合に、計測対象物200を第3回動軸AX3の周りに駆動して、計測対象物200を基準状態に対して第3回動軸AX3の周りに傾けて停止させる。そして、第2レーザ変位計2および第3レーザ変位計3は、計測対象物200の第3回動軸AX3の周りの変位を計測する。駆動機構6は、例えば、第3コイル(不図示)および第3磁石(不図示)を備える。第3コイルおよび第3磁石のうち、一方が計測対象物200に配置され、他方が支持体210に配置される。駆動機構6は、第3コイルに電流を流すことで、計測対象物200を第3回動軸AX3の周りに駆動する。  Specifically, the drive mechanism 6 drives the measurement object 200 around the third rotation axis AX3 when the reflection member 5 is located at the retracted position P1 to bring the measurement object 200 to the reference state. And tilt it around the third rotation shaft AX3 to stop it. Then, the second laser displacement meter 2 and the third laser displacement meter 3 measure the displacement of the object to be measured 200 around the third rotation axis AX3. The drive mechanism 6 includes, for example, a third coil (not shown) and a third magnet (not shown). Of the third coil and the third magnet, one is arranged on the object to be measured 200 and the other is arranged on the support 210. The drive mechanism 6 drives the measurement object 200 around the third rotation shaft AX3 by passing a current through the third coil. It was
 次に、図8を参照して、計測対象物200の第1回動軸AX1の周りの傾きを説明する。図8は、計測対象物200が第1回動軸AX1の周りに回動するときの状態を示す図である。図8では、第1回動軸方向から計測対象物200を見ている。また、図8では、計測対象物200が傾いた状態を破線で示している。  Next, with reference to FIG. 8, the inclination of the measurement object 200 around the first rotation axis AX1 will be described. FIG. 8 is a diagram showing a state when the measurement object 200 rotates around the first rotation shaft AX1. In FIG. 8, the measurement object 200 is viewed from the direction of the first rotation axis. Further, in FIG. 8, the state in which the measurement object 200 is tilted is shown by a broken line. It was
 図8に示すように、計測対象物200は、図3に示す駆動機構6から外部作用を受けて、基準状態に対して第1回動軸AX1の周りに回動して停止する。その結果、計測対象物200は、基準状態に対して第1回動軸AX1の周りに傾く。つまり、計測対象物200の平面F1は、基準面301に対して第1回動軸AX1の周りに傾く。  As shown in FIG. 8, the measurement object 200 receives an external action from the drive mechanism 6 shown in FIG. 3, rotates around the first rotation shaft AX1 with respect to the reference state, and stops. As a result, the measurement object 200 is tilted around the first rotation axis AX1 with respect to the reference state. That is, the plane F1 of the object to be measured 200 is tilted around the first rotation axis AX1 with respect to the reference surface 301. It was
 具体的には、駆動機構6は、反射部材5が退避位置P1に位置する場合に、計測対象物200を第1回動軸AX1の周りに駆動して、計測対象物200を基準状態に対して第1回動軸AX1の周りに傾けて停止させる。そして、第1レーザ変位計1および第2レーザ変位計2は、計測対象物200の第1回動軸AX1の周りの変位を計測する。駆動機構6は、例えば、第1コイル(不図示)および第1磁石(不図示)を備える。第1コイルおよび第1磁石のうち、一方が計測対象物200に配置され、他方が支持体210に配置される。駆動機構6は、第1コイルに電流を流すことで、計測対象物200を第1回動軸AX1の周りに駆動する。  Specifically, the drive mechanism 6 drives the measurement object 200 around the first rotation shaft AX1 when the reflection member 5 is located at the retracted position P1 to bring the measurement object 200 to the reference state. And tilt it around the first rotation shaft AX1 to stop it. Then, the first laser displacement meter 1 and the second laser displacement meter 2 measure the displacement of the object to be measured 200 around the first rotation axis AX1. The drive mechanism 6 includes, for example, a first coil (not shown) and a first magnet (not shown). Of the first coil and the first magnet, one is arranged on the object to be measured 200 and the other is arranged on the support 210. The drive mechanism 6 drives the measurement object 200 around the first rotation shaft AX1 by passing a current through the first coil. It was
 次に、図9を参照して、計測対象物200の第2回動軸AX2の周りの傾きを説明する。図9は、計測対象物200が第2回動軸AX2の周りに回動するときの状態を示す図である。図9では、第2回動軸方向から計測対象物200を見ている。また、図9では、計測対象物200の第2照射対象物203が基準状態に対して第2回動軸AX2の周りに傾いた状態を破線で示している。なお、図面の簡略化のために、第2回動軸AX2の周りに傾いた状態の第1照射対象物201は省略されている。  Next, with reference to FIG. 9, the inclination of the measurement object 200 around the second rotation axis AX2 will be described. FIG. 9 is a diagram showing a state when the measurement object 200 rotates around the second rotation shaft AX2. In FIG. 9, the measurement object 200 is viewed from the second rotation axis direction. Further, in FIG. 9, the state in which the second irradiation target 203 of the measurement target 200 is tilted around the second rotation axis AX2 with respect to the reference state is shown by a broken line. For the sake of simplification of the drawing, the first irradiation object 201 in a state of being tilted around the second rotation shaft AX2 is omitted. It was
 図9に示すように、計測対象物200は、図3に示す駆動機構6から外部作用を受けて、基準状態に対して第2回動軸AX2の周りに回動して停止する。その結果、計測対象物200は、基準状態に対して第2回動軸AX2の周りに傾く。つまり、計測対象物200の平面F2は、基準状態に対して第2回動軸AX2の周りに傾く。  As shown in FIG. 9, the measurement object 200 receives an external action from the drive mechanism 6 shown in FIG. 3, rotates around the second rotation shaft AX2 with respect to the reference state, and stops. As a result, the measurement object 200 is tilted around the second rotation axis AX2 with respect to the reference state. That is, the plane F2 of the object to be measured 200 is tilted around the second rotation axis AX2 with respect to the reference state. It was
 具体的には、駆動機構6は、反射部材5が進入位置P2に位置する場合に、計測対象物200を第2回動軸AX2の周りに駆動して、計測対象物200を基準状態に対して第2回動軸AX2の周りに傾けて停止させる。そして、第1レーザ変位計1および第2レーザ変位計2は、計測対象物200の第2回動軸AX2の周りの変位を計測する。駆動機構6は、例えば、第2コイル(不図示)および第2磁石(不図示)を備える。第2コイルおよび第2磁石のうち、一方が計測対象物200に配置され、他方が支持体210に配置される。駆動機構6は、第2コイルに電流を流すことで、計測対象物200を第2回動軸AX2の周りに駆動する。  Specifically, when the reflective member 5 is located at the approach position P2, the drive mechanism 6 drives the measurement object 200 around the second rotation shaft AX2 to bring the measurement object 200 to the reference state. And tilt it around the second rotation shaft AX2 to stop it. Then, the first laser displacement meter 1 and the second laser displacement meter 2 measure the displacement of the object to be measured 200 around the second rotation axis AX2. The drive mechanism 6 includes, for example, a second coil (not shown) and a second magnet (not shown). Of the second coil and the second magnet, one is arranged on the object to be measured 200 and the other is arranged on the support 210. The drive mechanism 6 drives the measurement object 200 around the second rotation shaft AX2 by passing a current through the second coil. It was
 なお、図7~図9において、計測対象物200の平面F1は、基準状態において、例えば、基準面301に対して傾斜している形状であってもよい。また、計測対象物200の平面F2は、基準状態において、例えば、基準面301に対して傾斜している形状であってもよい。具体的には、図5Aに示す計測対象物200の第1照射面TA1および/または第2照射面TA2は、基準状態において、基準面301に対して傾斜している形状であってもよい。また、図6Aに示す計測対象物200の第1交差照射面TA10および/または第2交差照射面TA20は、基準状態において、基準面301に対して傾斜している形状であってもよい。  Note that, in FIGS. 7 to 9, the plane F1 of the measurement object 200 may have a shape that is inclined with respect to the reference surface 301 in the reference state, for example. Further, the plane F2 of the object to be measured 200 may have a shape inclined with respect to the reference surface 301 in the reference state, for example. Specifically, the first irradiation surface TA1 and / or the second irradiation surface TA2 of the measurement object 200 shown in FIG. 5A may have a shape inclined with respect to the reference surface 301 in the reference state. Further, the first crossing irradiation surface TA10 and / or the second crossing irradiation surface TA20 of the measurement object 200 shown in FIG. 6A may have a shape inclined with respect to the reference surface 301 in the reference state. It was
 次に、図10を参照して、移動機構4を説明する。図10は、移動機構4を示す側面図である。図10に示すように、移動機構4は、第1方向D1および第2方向D2に沿って反射部材5を移動する。  Next, the moving mechanism 4 will be described with reference to FIG. FIG. 10 is a side view showing the moving mechanism 4. As shown in FIG. 10, the moving mechanism 4 moves the reflecting member 5 along the first direction D1 and the second direction D2. It was
 すなわち、本実施形態によれば、反射部材5を第1方向D1に移動できるので、反射部材5を精度良く所望の進入位置P2(図2B)に配置できる。加えて、反射部材5を第2方向D2に移動できるので、計測対象物200の第2方向D2の長さが小さい場合でも、第1レーザ光B10および第2レーザ光B20が計測対象物200に照射されるように、反射部材5の位置を調整できる。つまり、反射部材5を第2方向D2に移動できるので、第2照射対象物203の第2方向D2の長さが小さい場合でも、第1レーザ光B10および第2レーザ光B20が第2照射対象物203に照射されるように、反射部材5の位置を調整できる。  That is, according to the present embodiment, since the reflective member 5 can be moved in the first direction D1, the reflective member 5 can be accurately arranged at the desired approach position P2 (FIG. 2B). In addition, since the reflective member 5 can be moved in the second direction D2, the first laser beam B10 and the second laser beam B20 can be moved to the measurement object 200 even if the length of the second direction D2 of the measurement object 200 is small. The position of the reflective member 5 can be adjusted so that it is irradiated. That is, since the reflecting member 5 can be moved in the second direction D2, the first laser beam B10 and the second laser beam B20 are the second irradiation targets even when the length of the second direction D2 of the second irradiation object 203 is small. The position of the reflective member 5 can be adjusted so that the object 203 is irradiated. It was
 具体的には、移動機構4は、第1シリンダ401と、第2シリンダ402と、第1支持体404と、支持部材405と、第1ガイドレール406と、第1スライダ408と、第2支持体410と、第2ガイドレール412と、第2スライダ414と、連結部材416と、第3支持体418とを備える。第1支持体404は、下部体404Aと、上部体404Bとを備える。移動機構4は、柱状部材415と、ストッパ部材417と、圧縮コイルばね419と、ストッパ420と、引っ張りばね422とをさらに備えることが好ましい。  Specifically, the moving mechanism 4 includes a first cylinder 401, a second cylinder 402, a first support body 404, a support member 405, a first guide rail 406, a first slider 408, and a second support. It includes a body 410, a second guide rail 412, a second slider 414, a connecting member 416, and a third support 418. The first support body 404 includes a lower body 404A and an upper body 404B. The moving mechanism 4 preferably further includes a columnar member 415, a stopper member 417, a compression coil spring 419, a stopper 420, and a tension spring 422. It was
 第2支持体410は、第2方向D2に沿って延びる。第2支持体410は第2シリンダ402を支持する。第2支持体410には、第2ガイドレール412が固定される。第2ガイドレール412は第2方向D2に沿って延びている。  The second support 410 extends along the second direction D2. The second support 410 supports the second cylinder 402. The second guide rail 412 is fixed to the second support 410. The second guide rail 412 extends along the second direction D2. It was
 第2スライダ414は、第2ガイドレール412に係合する。第2スライダ414は、第1支持体404の下部体404Aに固定される。下部体404Aは、第2方向D2に沿って延びる。下部体404Aと第2シリンダ402とは、連結部材(不図示)によって連結される。従って、第2シリンダ402が第2方向D2に沿って駆動されると、第1支持体404は、第2スライダ414を介して第2ガイドレール412に沿って移動する。つまり、第2シリンダ402は、第1支持体404を第2方向D2に沿って移動する。第2シリンダ402は、例えば、エアシリンダである。  The second slider 414 engages with the second guide rail 412. The second slider 414 is fixed to the lower body 404A of the first support 404. The lower body 404A extends along the second direction D2. The lower body 404A and the second cylinder 402 are connected by a connecting member (not shown). Therefore, when the second cylinder 402 is driven along the second direction D2, the first support 404 moves along the second guide rail 412 via the second slider 414. That is, the second cylinder 402 moves the first support 404 along the second direction D2. The second cylinder 402 is, for example, an air cylinder. It was
 ストッパ420は、第1支持体404の下部体404Aの底部に接触し、第1支持体404の下限位置を定める。引っ張りばね422は、下部体404Aに連結され、第1支持体404を下方向に引っ張る。  The stopper 420 contacts the bottom of the lower body 404A of the first support 404 and determines the lower limit position of the first support 404. The tension spring 422 is connected to the lower body 404A and pulls the first support 404 downward. It was
 支持部材405は、第1支持体404の上部体404Bに配置される。支持部材405は、第1シリンダ401を支持する。上部体404Bは、第1方向D1に沿って延びる。上部体404Bには、第1ガイドレール406が固定される。第1ガイドレール406は第1方向D1に沿って延びている。  The support member 405 is arranged on the upper body 404B of the first support body 404. The support member 405 supports the first cylinder 401. The upper body 404B extends along the first direction D1. The first guide rail 406 is fixed to the upper body 404B. The first guide rail 406 extends along the first direction D1. It was
 第1スライダ408は、第1ガイドレール406に係合する。第1スライダ408は、第3支持体418に固定される。第3支持体418と第1シリンダ401とは、連結部材416によって連結される。従って、第1シリンダ401が第1方向D1に沿って駆動されると、第3支持体418は、第1スライダ408を介して第1ガイドレール406に沿って移動する。つまり、第1シリンダ401は、第3支持体418を第1方向D1に沿って移動する。第1シリンダ401は、例えば、エアシリンダである。  The first slider 408 engages with the first guide rail 406. The first slider 408 is fixed to the third support 418. The third support 418 and the first cylinder 401 are connected by a connecting member 416. Therefore, when the first cylinder 401 is driven along the first direction D1, the third support 418 moves along the first guide rail 406 via the first slider 408. That is, the first cylinder 401 moves the third support 418 along the first direction D1. The first cylinder 401 is, for example, an air cylinder. It was
 具体的には、第3支持体418の基端部418Bには、柱状部材415が結合される。柱状部材415は、第1方向D1に沿って延びる。柱状部材415は、例えば、略円柱形状を有する。柱状部材415は、例えば、ヒンジピンである。柱状部材415は、第1方向D1に沿って移動自在に支持部材405を貫通する。圧縮コイルばね419は、第3支持体418の基端部418Bと支持部材405との間において、柱状部材415に挿入される。圧縮コイルばね419は、第3支持体418を方向D11に押し出す。方向D11は、第1方向D1に平行な方向であって、支持部材405から第3支持体418の基端部418Bに向かう方向を示す。柱状部材415には、ストッパ部材417が固定される。ストッパ部材417は、支持部材405に接触することで、柱状部材415および第3支持体418の方向D11への移動を規制する。ストッパ部材417は、例えば、止め輪である。  Specifically, the columnar member 415 is coupled to the base end portion 418B of the third support 418. The columnar member 415 extends along the first direction D1. The columnar member 415 has, for example, a substantially cylindrical shape. The columnar member 415 is, for example, a hinge pin. The columnar member 415 movably penetrates the support member 405 along the first direction D1. The compression coil spring 419 is inserted into the columnar member 415 between the base end portion 418B of the third support 418 and the support member 405. The compression coil spring 419 pushes the third support 418 in the direction D11. The direction D11 is a direction parallel to the first direction D1 and indicates a direction from the support member 405 toward the base end portion 418B of the third support body 418. A stopper member 417 is fixed to the columnar member 415. The stopper member 417 regulates the movement of the columnar member 415 and the third support 418 in the direction D11 by coming into contact with the support member 405. The stopper member 417 is, for example, a retaining ring. It was
 すなわち、第1シリンダ401を方向D11に押し出す際に、第3支持体418は、圧縮コイルばね419から方向D11に向かう付勢力を受けながら、方向D11に移動する。そして、ストッパ部材417によって、第3支持体418の方向D11への移動が規制される。その結果、反射部材5が所望の位置に静止される。  That is, when the first cylinder 401 is pushed out in the direction D11, the third support 418 moves in the direction D11 while receiving an urging force from the compression coil spring 419 toward the direction D11. Then, the movement of the third support 418 in the direction D11 is restricted by the stopper member 417. As a result, the reflective member 5 is stationary at a desired position. It was
 具体的には、第3支持体418の先端部418Aには、反射部材5が取り付けられる。従って、第1シリンダ401は、第3支持体418を介して反射部材5を第1方向D1に沿って移動する。加えて、第2シリンダ402は、第1支持体404を介して反射部材5を第2方向D2に沿って移動する。制御部10は、第1シリンダ401および第2シリンダ402を制御して、反射部材5を第1方向D1および第2方向D2に移動する。  Specifically, the reflective member 5 is attached to the tip portion 418A of the third support 418. Therefore, the first cylinder 401 moves the reflective member 5 along the first direction D1 via the third support 418. In addition, the second cylinder 402 moves the reflective member 5 along the second direction D2 via the first support 404. The control unit 10 controls the first cylinder 401 and the second cylinder 402 to move the reflective member 5 in the first direction D1 and the second direction D2. It was
 なお、図10の移動機構4は、一例であって、反射部材5を退避位置P1と進入位置P2との間で移動できる限りは、特に限定されない。また、退避位置P1は、第1レーザ光B1および第2レーザ光B2が入射しない位置である限りは、特に限定されない。  The moving mechanism 4 in FIG. 10 is an example, and is not particularly limited as long as the reflective member 5 can be moved between the retracted position P1 and the approached position P2. Further, the retracted position P1 is not particularly limited as long as it is a position where the first laser beam B1 and the second laser beam B2 are not incident. It was
 次に、図11および図12を参照して、本開示の実施形態に係る傾き計測方法を説明する。計測対象物200の傾きを計測するための傾き計測方法は、傾き計測装置100によって実行される。図11および図12は、本実施形態に係る傾き計測方法を示すフローチャートである。図11および図12に示すように、傾き計測方法は、ステップS1~ステップS19を含む。ステップS1の実行前では、反射部材5は退避位置P1に位置する。  Next, the inclination measurement method according to the embodiment of the present disclosure will be described with reference to FIGS. 11 and 12. The inclination measuring method for measuring the inclination of the object to be measured 200 is executed by the inclination measuring device 100. 11 and 12 are flowcharts showing the inclination measuring method according to the present embodiment. As shown in FIGS. 11 and 12, the inclination measuring method includes steps S1 to S19. Before the execution of step S1, the reflective member 5 is located at the retracted position P1. It was
 ステップS1において、作業者またはロボットアーム(不図示)は、計測対象物200を含むワークWを載置部300の基準面301に配置する。  In step S1, the operator or the robot arm (not shown) arranges the work W including the measurement object 200 on the reference surface 301 of the mounting portion 300. It was
 次に、ステップS2において、駆動機構6は、計測対象物200の基準状態から、計測対象物200を第3回動軸AX3の周りに駆動して停止させる。その結果、計測対象物200は、基準状態に対して第3回動軸AX3の周りに傾いた状態になる。  Next, in step S2, the drive mechanism 6 drives the measurement object 200 around the third rotation shaft AX3 from the reference state of the measurement object 200 and stops it. As a result, the measurement object 200 is in a state of being tilted around the third rotation axis AX3 with respect to the reference state. It was
 次に、ステップS3において、反射部材5が退避位置P1に位置する場合に、第2レーザ変位計2は、計測対象物200に第2レーザ光B2を照射して、計測対象物200の変位を計測する。  Next, in step S3, when the reflection member 5 is located at the retracted position P1, the second laser displacement meter 2 irradiates the measurement object 200 with the second laser beam B2 to displace the measurement object 200. measure. It was
 次に、ステップS4において、反射部材5が退避位置P1に位置する場合に、第3レーザ変位計3は、計測対象物200に第3レーザ光B3を照射して、計測対象物200の変位を計測する。  Next, in step S4, when the reflection member 5 is located at the retracted position P1, the third laser displacement meter 3 irradiates the measurement object 200 with the third laser beam B3 to displace the measurement object 200. measure. It was
 次に、ステップS5において、制御部10は、第2レーザ変位計2による計測結果と第3レーザ変位計3による計測結果とに基づいて、計測対象物200の第3回動軸AX3の周りの傾きを算出する。  Next, in step S5, the control unit 10 around the third rotation axis AX3 of the measurement object 200 based on the measurement result by the second laser displacement meter 2 and the measurement result by the third laser displacement meter 3. Calculate the slope. It was
 次に、ステップS6において、駆動機構6は、計測対象物200の駆動を解除して、計測対象物200を傾いた状態から基準状態に戻す。  Next, in step S6, the drive mechanism 6 releases the drive of the measurement object 200 and returns the measurement object 200 from the tilted state to the reference state. It was
 次に、ステップS7において、駆動機構6は、計測対象物200の基準状態から、計測対象物200を第1回動軸AX1の周りに駆動して停止させる。その結果、計測対象物200は、基準状態に対して第1回動軸AX1の周りに傾いた状態になる。  Next, in step S7, the drive mechanism 6 drives the measurement object 200 around the first rotation shaft AX1 from the reference state of the measurement object 200 and stops it. As a result, the measurement object 200 is in a state of being tilted around the first rotation axis AX1 with respect to the reference state. It was
 次に、ステップS8において、反射部材5が退避位置P1に位置する場合に、第1レーザ変位計1は、計測対象物200に第1レーザ光B1を照射して、計測対象物200の変位を計測する。  Next, in step S8, when the reflection member 5 is located at the retracted position P1, the first laser displacement meter 1 irradiates the measurement object 200 with the first laser beam B1 to displace the measurement object 200. measure. It was
 次に、ステップS9において、反射部材5が退避位置P1に位置する場合に、第2レーザ変位計2は、計測対象物200に第2レーザ光B2を照射して、計測対象物200の変位を計測する。  Next, in step S9, when the reflection member 5 is located at the retracted position P1, the second laser displacement meter 2 irradiates the measurement object 200 with the second laser beam B2 to displace the measurement object 200. measure. It was
 次に、ステップS10において、制御部10は、第1レーザ変位計1による計測結果と第2レーザ変位計2による計測結果とに基づいて、計測対象物200の第1回動軸AX1の周りの傾きを算出する。  Next, in step S10, the control unit 10 around the first rotation axis AX1 of the measurement object 200 based on the measurement result by the first laser displacement meter 1 and the measurement result by the second laser displacement meter 2. Calculate the slope. It was
 次に、ステップS11において、駆動機構6は、計測対象物200の駆動を解除して、計測対象物200を傾いた状態から基準状態に戻す。  Next, in step S11, the drive mechanism 6 releases the drive of the measurement object 200 and returns the measurement object 200 from the tilted state to the reference state. It was
 次に、図12に示すように、ステップS12において、移動機構4は、退避位置P1から進入位置P2に反射部材5を移動させる。  Next, as shown in FIG. 12, in step S12, the moving mechanism 4 moves the reflecting member 5 from the retracting position P1 to the approaching position P2. It was
 次に、ステップS13において、駆動機構6は、計測対象物200の基準状態から、計測対象物200を第2回動軸AX2の周りに駆動して停止させる。その結果、計測対象物200は、基準状態に対して第2回動軸AX2の周りに傾いた状態になる。  Next, in step S13, the drive mechanism 6 drives the measurement object 200 around the second rotation shaft AX2 from the reference state of the measurement object 200 and stops it. As a result, the measurement object 200 is in a state of being tilted around the second rotation axis AX2 with respect to the reference state. It was
 次に、ステップS14において、反射部材5が進入位置P2に位置する場合に、第1レーザ変位計1は、計測対象物200に第1レーザ光B1を照射して、計測対象物200の変位を計測する。  Next, in step S14, when the reflective member 5 is located at the approach position P2, the first laser displacement meter 1 irradiates the measurement object 200 with the first laser beam B1 to displace the measurement object 200. measure. It was
 次に、ステップS15において、反射部材5が進入位置P2に位置する場合に、第2レーザ変位計2は、計測対象物200に第2レーザ光B2を照射して、計測対象物200の変位を計測する。  Next, in step S15, when the reflective member 5 is located at the approach position P2, the second laser displacement meter 2 irradiates the measurement object 200 with the second laser beam B2 to displace the measurement object 200. measure. It was
 次に、ステップS16において、制御部10は、第1レーザ変位計1による計測結果と第2レーザ変位計2による計測結果とに基づいて、計測対象物200の第2回動軸AX2の周りの傾きを算出する。  Next, in step S16, the control unit 10 around the second rotation axis AX2 of the measurement object 200 based on the measurement result by the first laser displacement meter 1 and the measurement result by the second laser displacement meter 2. Calculate the slope. It was
 次に、ステップS17において、駆動機構6は、計測対象物200の駆動を解除して、計測対象物200を傾いた状態から基準状態に戻す。  Next, in step S17, the drive mechanism 6 releases the drive of the measurement object 200 and returns the measurement object 200 from the tilted state to the reference state. It was
 次に、ステップS18において、移動機構4は、進入位置P2から退避位置P1に反射部材5を移動させる。  Next, in step S18, the moving mechanism 4 moves the reflecting member 5 from the approaching position P2 to the retracting position P1. It was
 次に、ステップS19において、作業者またはロボットアームは、計測対象物200を含むワークWを載置部300の基準面301から移動させる。そして、傾き計測方法は終了する。  Next, in step S19, the operator or the robot arm moves the work W including the measurement object 200 from the reference surface 301 of the mounting portion 300. Then, the inclination measurement method ends. It was
 以上、図11および図12を参照して説明したように、本実施形態に係る傾き計測方法によれば、反射部材5を移動することで、反射部材5の退避位置P1と進入位置P2とで、計測対象物200上での第1レーザ光B1および第2レーザ光B2の照射位置を異ならせることができる。従って、レーザ変位計の搭載数を抑制しつつ、ステップS8、S9、S10、S14、S15、S16において第1回動軸AX1および第2回動軸AX2の周りの計測対象物200の傾きをそれぞれ計測できる。加えて、ステップS3、S4、S5において、第3回動軸AX3の周りの計測対象物200の傾きも計測できる。  As described above with reference to FIGS. 11 and 12, according to the inclination measuring method according to the present embodiment, by moving the reflective member 5, the retracted position P1 and the approach position P2 of the reflective member 5 are set. The irradiation positions of the first laser beam B1 and the second laser beam B2 on the measurement object 200 can be made different. Therefore, while suppressing the number of mounted laser displacement meters, the inclination of the measurement object 200 around the first rotation axis AX1 and the second rotation axis AX2 in steps S8, S9, S10, S14, S15, and S16, respectively. Can be measured. In addition, in steps S3, S4, and S5, the inclination of the object to be measured 200 around the third rotation axis AX3 can also be measured. It was
 すなわち、本実施形態に係る傾き計測方法によれば、レーザ変位計の搭載数を抑制しつつ、異なる複数の回動軸ごとに、計測対象物200の回動軸の周りの傾きを計測できる。  That is, according to the inclination measuring method according to the present embodiment, it is possible to measure the inclination around the rotation axis of the measurement object 200 for each of a plurality of different rotation axes while suppressing the number of mounted laser displacement meters. It was
 なお、傾き計測方法における各処理の順番は、任意に変更可能である。例えば、ステップS2~ステップS6の一連の処理とステップS7~ステップS11の一連の処理とステップS12~ステップS17の一連の処理との3つの一連の処理の順番は、特に限定されず、任意の順番であってもよい。  The order of each process in the tilt measurement method can be changed arbitrarily. For example, the order of the three series of processes of the series of processes of steps S2 to S6, the series of processes of steps S7 to S11, and the series of processes of steps S12 to S17 is not particularly limited, and is an arbitrary order. May be. It was
 また、例えば、ステップS3とステップS4との順番は逆でもよいし、ステップS3とステップS4とが並行して実行されてもよい。例えば、ステップS8とステップS9との順番は逆でもよいし、ステップS8とステップS9とが並行して実行されてもよい。例えば、ステップS14とステップS15との順番は逆でもよいし、ステップS14とステップS15とが並行して実行されてもよい。例えば、ステップS12とステップS13との順番は逆でもよいし、ステップS12とステップS13とが並行して実行されてもよい。  Further, for example, the order of step S3 and step S4 may be reversed, or step S3 and step S4 may be executed in parallel. For example, the order of step S8 and step S9 may be reversed, or step S8 and step S9 may be executed in parallel. For example, the order of step S14 and step S15 may be reversed, or step S14 and step S15 may be executed in parallel. For example, the order of step S12 and step S13 may be reversed, or step S12 and step S13 may be executed in parallel. It was
 さらに、例えば、ステップS5の実行順番は、ステップS3、S4よりも後である限りは、特に限定されない。例えば、ステップS10の実行順番は、ステップS8、S9よりも後である限りは、特に限定されない。例えば、ステップS16の実行順番は、ステップS14、S15よりも後である限りは、特に限定されない。  Further, for example, the execution order of step S5 is not particularly limited as long as it is after steps S3 and S4. For example, the execution order of step S10 is not particularly limited as long as it is after steps S8 and S9. For example, the execution order of step S16 is not particularly limited as long as it is after steps S14 and S15. It was
<適用例>  <Application example>
 図7に示すワークWは、例えば、光学ユニットのダミーユニットとして使用される。光学ユニットは、光学モジュールと、支持体と、駆動機構とを備える。図7に示す計測対象物200は、例えば、光学モジュールのダミーモジュールとして使用される。光学ユニットの支持体および駆動機構は、それぞれ、図7に示す支持体210および図3に示す駆動機構6に相当する。  The work W shown in FIG. 7 is used, for example, as a dummy unit of an optical unit. The optical unit includes an optical module, a support, and a drive mechanism. The measurement object 200 shown in FIG. 7 is used, for example, as a dummy module of an optical module. The support and drive mechanism of the optical unit correspond to the support 210 shown in FIG. 7 and the drive mechanism 6 shown in FIG. 3, respectively. It was
 光学モジュールは、例えば、カメラ付携帯電話機およびタブレット型PC等の電子機器に搭載される薄型カメラ等の撮像装置である。光学ユニットは、光学モジュールのピッチング(縦振れ)、ヨーイング(横振れ)およびローリング(光軸の周りの振れ)の補正機能を備える。光学モジュールは、支持体によって、ピッチ軸、ヨー軸、および、ロール軸の周りに回動可能な状態で支持される。駆動機構は、補正機能を実行する際に、図3に示す駆動機構6と同様にして、ピッチ軸、ヨー軸、および、ロール軸の周りに光学モジュールを駆動する。  The optical module is, for example, an image pickup device such as a thin camera mounted on an electronic device such as a mobile phone with a camera and a tablet PC. The optical unit has a correction function for pitching (longitudinal runout), yawing (horizontal runout), and rolling (shake around the optical axis) of the optical module. The optical module is rotatably supported by a support around a pitch axis, a yaw axis, and a roll axis. When performing the correction function, the drive mechanism drives the optical module around the pitch axis, the yaw axis, and the roll axis in the same manner as the drive mechanism 6 shown in FIG. It was
 図1Aに示す第1回動軸AX1は、例えば、ピッチ軸に相当し、第3回動軸AX3は、例えば、ヨー軸に相当する。また、図2Aに示す第2回動軸AX2は、例えば、ロール軸に相当する。  The first rotation axis AX1 shown in FIG. 1A corresponds to, for example, a pitch axis, and the third rotation axis AX3 corresponds to, for example, a yaw axis. Further, the second rotation shaft AX2 shown in FIG. 2A corresponds to, for example, a roll shaft. It was
 以上、図面を参照しながら本開示の実施形態について説明した。但し、本開示は、上記の実施形態に限られるものではなく、その要旨を逸脱しない範囲で種々の態様において実施することが可能である。また、上記の実施形態に開示されている複数の構成要素を適宜組み合わせることによって、種々の発明の形成が可能である。例えば、実施形態に示される全構成要素から幾つかの構成要素を削除してもよい。例えば、異なる実施形態にわたる構成要素を適宜組み合わせてもよい。図面は、理解しやすくするために、それぞれの構成要素を主体に模式的に示しており、図示された各構成要素の厚み、長さ、個数、間隔等は、図面作成の都合上から実際とは異なる場合もある。また、上記の実施形態で示す各構成要素の材質、形状、寸法等は一例であって、特に限定されるものではなく、本開示の効果から実質的に逸脱しない範囲で種々の変更が可能である。 The embodiment of the present disclosure has been described above with reference to the drawings. However, the present disclosure is not limited to the above embodiment, and can be carried out in various embodiments without departing from the gist thereof. In addition, various inventions can be formed by appropriately combining the plurality of components disclosed in the above embodiments. For example, some components may be removed from all the components shown in the embodiments. For example, components spanning different embodiments may be combined as appropriate. In order to make it easier to understand, the drawings are schematically shown with each component as the main component, and the thickness, length, number, spacing, etc. of each of the illustrated components are actual for the convenience of drawing creation. May be different. Further, the material, shape, dimensions, etc. of each component shown in the above embodiment are merely examples, and are not particularly limited, and various changes can be made without substantially deviating from the effects of the present disclosure. be.
 本開示は、例えば、傾き計測装置および傾き計測方法に利用できる。 The present disclosure can be used, for example, for a tilt measuring device and a tilt measuring method.
 1 第1レーザ変位計
 2 第2レーザ変位計
 3 第3レーザ変位計
 4 移動機構
 5 反射部材
 10 制御部(算出部)
 11 第1仮想平面
 12 第2仮想平面
 13 第3仮想平面
 100 傾き計測装置
 200 計測対象物
 AX1 第1回動軸
 AX2 第2回動軸
 AX3 第3回動軸
1 1st laser displacement meter 2 2nd laser displacement meter 3 3rd laser displacement meter 4 Moving mechanism 5 Reflective member 10 Control unit (calculation unit)
11 1st virtual plane 12 2nd virtual plane 13 3rd virtual plane 100 Tilt measuring device 200 Measurement target AX1 1st rotation axis AX2 2nd rotation axis AX3 3rd rotation axis

Claims (11)

  1.  計測対象物の傾きを計測する傾き計測装置であって、
     前記計測対象物に第1レーザ光を照射して、前記計測対象物の変位を計測する第1レーザ変位計と、
     前記計測対象物に第2レーザ光を照射して、前記計測対象物の変位を計測する第2レーザ変位計と、
     前記第1レーザ光の光路および前記第2レーザ光の光路に対する退避位置または進入位置に位置する反射部材と
     を備え、
     前記反射部材が前記退避位置に位置する場合と前記進入位置に位置する場合との双方において、前記第1レーザ変位計および前記第2レーザ変位計は、前記計測対象物の変位を計測し、
     前記反射部材は、前記進入位置において、前記第1レーザ光および前記第2レーザ光の進行方向を変えて、前記第1レーザ光および前記第2レーザ光を前記計測対象物に向けて反射する、傾き計測装置。
    A tilt measuring device that measures the tilt of an object to be measured.
    A first laser displacement meter that measures the displacement of the measurement object by irradiating the measurement object with the first laser beam,
    A second laser displacement meter that measures the displacement of the object to be measured by irradiating the object to be measured with a second laser beam.
    The optical path of the first laser beam and the reflecting member located at the retracted position or the approaching position with respect to the optical path of the second laser beam are provided.
    The first laser displacement meter and the second laser displacement meter measure the displacement of the object to be measured in both the case where the reflection member is located at the retracted position and the case where the reflecting member is located at the approach position.
    The reflecting member changes the traveling directions of the first laser beam and the second laser beam at the approach position, and reflects the first laser beam and the second laser beam toward the measurement object. Tilt measuring device.
  2.  前記反射部材が前記退避位置に位置する場合の前記第1レーザ光の光路および前記第2レーザ光の光路を含む第1仮想平面に対して、前記計測対象物の第1回動軸が交差し、
     前記反射部材による反射後の前記第1レーザ光の光路および前記第2レーザ光の光路を含む第2仮想平面に対して、前記計測対象物の第2回動軸が交差する、請求項1に記載の傾き計測装置。
    The first rotation axis of the object to be measured intersects the first virtual plane including the optical path of the first laser beam and the optical path of the second laser beam when the reflective member is located at the retracted position. ,
    The first aspect of the present invention, wherein the second rotation axis of the measurement object intersects the second virtual plane including the optical path of the first laser beam and the optical path of the second laser beam after being reflected by the reflecting member. The tilt measuring device described.
  3.  前記反射部材が前記退避位置に位置する場合の前記第1レーザ変位計による計測結果と前記第2レーザ変位計による計測結果とに基づいて、前記第1回動軸の周りの前記計測対象物の傾きを算出する算出部をさらに備え、
     前記反射部材が前記進入位置に位置する場合の前記第1レーザ変位計による計測結果と前記第2レーザ変位計による計測結果とに基づいて、前記算出部は、前記第2回動軸の周りの前記計測対象物の傾きを算出する、請求項2に記載の傾き計測装置。
    Based on the measurement result by the first laser displacement meter and the measurement result by the second laser displacement meter when the reflection member is located at the retracted position, the measurement object around the first rotation axis. It also has a calculation unit that calculates the inclination.
    Based on the measurement result by the first laser displacement meter and the measurement result by the second laser displacement meter when the reflection member is located at the approach position, the calculation unit is around the second rotation axis. The inclination measuring device according to claim 2, which calculates the inclination of the object to be measured.
  4.  レーザスポット距離は、基準状態の前記計測対象物における前記第1レーザ光の照射スポットと前記第2レーザ光の照射スポットとの間の距離を示し、
     レーザスポット変位量は、前記計測対象物の傾きに応じた物理量であって、前記第1レーザ光の前記照射スポットの変位量と前記第2レーザ光の前記照射スポットの変位量との和を示し、
     前記算出部は、前記レーザスポット距離と前記レーザスポット変位量とに基づいて、三角法によって前記基準状態に対する前記計測対象物の傾きを示す傾き角度を算出する、請求項3に記載の傾き計測装置。
    The laser spot distance indicates the distance between the irradiation spot of the first laser beam and the irradiation spot of the second laser beam in the measurement object in the reference state.
    The laser spot displacement amount is a physical quantity corresponding to the inclination of the measurement object, and indicates the sum of the displacement amount of the irradiation spot of the first laser beam and the displacement amount of the irradiation spot of the second laser beam. ,
    The inclination measuring device according to claim 3, wherein the calculation unit calculates an inclination angle indicating an inclination of the measurement object with respect to the reference state by a trigonometry based on the laser spot distance and the laser spot displacement amount. ..
  5.  前記反射部材が前記退避位置に位置する場合の前記レーザスポット距離は、予め設定される、請求項4に記載の傾き計測装置。 The inclination measuring device according to claim 4, wherein the laser spot distance when the reflecting member is located at the retracted position is set in advance.
  6.  前記計測対象物に第3レーザ光を照射して、前記計測対象物の変位を計測する第3レーザ変位計をさらに備え、
     前記反射部材が前記退避位置に位置する場合の前記第2レーザ光の光路および前記第3レーザ光の光路を含む第3仮想平面に対して、前記計測対象物の第3回動軸が交差する、
    請求項2から請求項5のいずれか1項に記載の傾き計測装置。
    A third laser displacement meter that irradiates the measurement object with a third laser beam and measures the displacement of the measurement object is further provided.
    The third rotation axis of the object to be measured intersects the third virtual plane including the optical path of the second laser beam and the optical path of the third laser beam when the reflective member is located at the retracted position. ,
    The inclination measuring device according to any one of claims 2 to 5.
  7.  前記第1レーザ光と前記第2レーザ光と前記第3レーザ光とは平行であり、
     前記第1仮想平面と前記第3仮想平面とは直交する、請求項6に記載の傾き計測装置。
    The first laser beam, the second laser beam, and the third laser beam are parallel to each other.
    The inclination measuring device according to claim 6, wherein the first virtual plane and the third virtual plane are orthogonal to each other.
  8.  前記第1仮想平面は、前記第1回動軸に直交し、
     前記第2仮想平面は、前記第2回動軸に直交し、
     前記第3仮想平面は、前記第3回動軸に直交する、請求項6または請求項7に記載の傾き計測装置。
    The first virtual plane is orthogonal to the first rotation axis and is orthogonal to the first rotation axis.
    The second virtual plane is orthogonal to the second rotation axis and is orthogonal to the second rotation axis.
    The inclination measuring device according to claim 6 or 7, wherein the third virtual plane is orthogonal to the third rotation axis.
  9.  第1方向は、前記第1仮想平面に交差する方向を示し、
     第2方向は、前記第2仮想平面に交差する方向を示し、
     前記第1方向および前記第2方向に沿って前記反射部材を移動する移動機構をさらに備える、請求項2から請求項8のいずれか1項に記載の傾き計測装置。
    The first direction indicates a direction that intersects the first virtual plane.
    The second direction indicates a direction that intersects the second virtual plane.
    The inclination measuring device according to any one of claims 2 to 8, further comprising a moving mechanism for moving the reflective member along the first direction and the second direction.
  10.  前記反射部材が前記退避位置に位置する場合、前記第1レーザ変位計は、前記計測対象物の第1照射面に前記第1レーザ光を照射し、
     前記反射部材が前記退避位置に位置する場合、前記第2レーザ変位計は、前記計測対象物における前記第1照射面と同一平面上の第2照射面に前記第2レーザ光を照射し、
     前記反射部材が前記進入位置に位置する場合、前記反射部材は、前記計測対象物における前記第1照射面に交差する第1交差照射面に向けて前記第1レーザ光を反射し、
     前記反射部材が前記進入位置に位置する場合、前記反射部材は、前記計測対象物における前記第1交差照射面と同一平面上の第2交差照射面に向けて前記第2レーザ光を反射する、請求項1から請求項9のいずれか1項に記載の傾き計測装置。
    When the reflecting member is located at the retracted position, the first laser displacement meter irradiates the first irradiation surface of the measurement object with the first laser beam.
    When the reflecting member is located at the retracted position, the second laser displacement meter irradiates the second laser beam on the second irradiation surface on the same plane as the first irradiation surface of the measurement object.
    When the reflecting member is located at the approach position, the reflecting member reflects the first laser beam toward the first crossing irradiation surface intersecting the first irradiation surface in the measurement object.
    When the reflecting member is located at the approach position, the reflecting member reflects the second laser beam toward the second crossing irradiation surface on the same plane as the first crossing irradiation surface of the measurement object. The inclination measuring device according to any one of claims 1 to 9.
  11.  計測対象物の傾きを計測するための傾き計測方法であって、
     反射部材が第1レーザ光の光路および第2レーザ光の光路に対する退避位置に位置する場合に、前記計測対象物に前記第1レーザ光を照射して、前記計測対象物の変位を計測するステップと、
     前記反射部材が前記退避位置に位置する場合に、前記計測対象物に前記第2レーザ光を照射して、前記計測対象物の変位を計測するステップと、
     前記退避位置から、前記第1レーザ光の光路および前記第2レーザ光の光路に対する進入位置に、前記反射部材を移動させるステップと、
     前記反射部材が前記進入位置に位置する場合に、前記計測対象物に前記第1レーザ光を照射して、前記計測対象物の変位を計測するステップと、
     前記反射部材が前記進入位置に位置する場合に、前記計測対象物に前記第2レーザ光を照射して、前記計測対象物の変位を計測するステップと
     を含む、傾き計測方法。
    It is a tilt measurement method for measuring the tilt of the object to be measured.
    When the reflecting member is located at the retracted position with respect to the optical path of the first laser beam and the optical path of the second laser beam, the step of irradiating the measurement object with the first laser beam and measuring the displacement of the measurement object. When,
    When the reflective member is located at the retracted position, the step of irradiating the measurement object with the second laser beam to measure the displacement of the measurement object, and
    A step of moving the reflecting member from the retracted position to an approach position with respect to the optical path of the first laser beam and the optical path of the second laser beam.
    A step of irradiating the measurement object with the first laser beam to measure the displacement of the measurement object when the reflection member is located at the approach position.
    A tilt measurement method comprising a step of irradiating the measurement object with the second laser beam to measure the displacement of the measurement object when the reflection member is located at the approach position.
PCT/JP2020/047971 2020-06-30 2020-12-22 Tilt measuring device and tilt measuring method WO2022004006A1 (en)

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