WO2021254297A1 - Oled显示面板制备方法及显示面板、显示装置 - Google Patents

Oled显示面板制备方法及显示面板、显示装置 Download PDF

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WO2021254297A1
WO2021254297A1 PCT/CN2021/099930 CN2021099930W WO2021254297A1 WO 2021254297 A1 WO2021254297 A1 WO 2021254297A1 CN 2021099930 W CN2021099930 W CN 2021099930W WO 2021254297 A1 WO2021254297 A1 WO 2021254297A1
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layer
display panel
oled display
manufacturing
organic layer
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PCT/CN2021/099930
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French (fr)
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李�杰
陈作
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京东方科技集团股份有限公司
重庆京东方显示技术有限公司
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Priority to US17/771,903 priority Critical patent/US20220376218A1/en
Publication of WO2021254297A1 publication Critical patent/WO2021254297A1/zh

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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/30Devices specially adapted for multicolour light emission
    • H10K59/38Devices specially adapted for multicolour light emission comprising colour filters or colour changing media [CCM]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10OLED displays
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K50/00Organic light-emitting devices
    • H10K50/80Constructional details
    • H10K50/85Arrangements for extracting light from the devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K50/00Organic light-emitting devices
    • H10K50/80Constructional details
    • H10K50/86Arrangements for improving contrast, e.g. preventing reflection of ambient light
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K50/00Organic light-emitting devices
    • H10K50/80Constructional details
    • H10K50/86Arrangements for improving contrast, e.g. preventing reflection of ambient light
    • H10K50/865Arrangements for improving contrast, e.g. preventing reflection of ambient light comprising light absorbing layers, e.g. light-blocking layers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/20Changing the shape of the active layer in the devices, e.g. patterning
    • H10K71/231Changing the shape of the active layer in the devices, e.g. patterning by etching of existing layers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K50/00Organic light-emitting devices
    • H10K50/80Constructional details
    • H10K50/84Passivation; Containers; Encapsulations
    • H10K50/844Encapsulations

Definitions

  • the present invention generally relates to the field of display technology, and particularly relates to a method for preparing an OLED display panel, a display panel, and a display device.
  • COE Color Film On Encapsulation, that is, the color film is directly made on the encapsulation layer
  • COE Color Film On Encapsulation, that is, the color film is directly made on the encapsulation layer
  • the thickness of the backplane also saves a lot of production costs and brings huge production benefits to the enterprise.
  • a method for manufacturing an OLED display panel including:
  • a backplane wherein a light-emitting layer is provided on the backplane, and an encapsulation layer is provided on the light-emitting layer;
  • a flat layer is formed, and the flat layer covers the color filter layer and the black mask layer.
  • the material of the organic layer is an organic material whose main chain is a molecular structure of a benzene ring.
  • the material of the organic layer is modified phenolic resin.
  • the etching is a dry etching process.
  • the gas environment of the dry etching process is an oxygen environment.
  • the oxygen flow rate of the dry engraving is 90 sccm-170 sccm.
  • the oxygen flow rate of the dry engraving is 150 sccm.
  • the pressure of the oxygen environment is 10 mmHg-30 mmHg.
  • the temperature of the dry etching treatment is 70°C-90°C.
  • the dry etching treatment time is 10s-20s.
  • filling metal in the plurality of pits to form a black mask layer includes:
  • the metal layer is etched, leaving only the metal in the pits.
  • the metal is selected from one of the following: titanium/aluminum/titanium, aluminum, molybdenum, copper, and silver.
  • an OLED display panel prepared using the above-mentioned method according to the present disclosure.
  • an OLED display device including the above-mentioned OLED display panel according to the present disclosure.
  • FIG. 1 is a flowchart of a method for manufacturing an OLED display panel in this embodiment
  • FIG. 2 is a schematic diagram of the structure of the OLED display panel in this embodiment
  • 3a-3h are schematic diagrams of the manufacturing process of the OLED display panel in this embodiment.
  • FIG. 4 is a schematic diagram of the structure of an organic layer material according to an embodiment of the present disclosure.
  • FIG. 5 is a schematic diagram of the structure of an organic layer material according to an embodiment of the present disclosure.
  • FIG. 6 is a schematic diagram of the light absorption principle of the organic layer and the black mask layer in this embodiment
  • FIG. 7 is a structural diagram of an OLED display device according to an embodiment of the present disclosure.
  • FIG. 1 shows a method for manufacturing an OLED display panel according to an embodiment of the present disclosure, including the following steps:
  • step 102 Use an organic material to form an organic layer on the side of the encapsulation layer away from the light-emitting layer (step 102);
  • Patterning the organic layer to form a first area covered by the organic layer and a second area not covered by the organic layer on the encapsulation layer (step 103);
  • Etching the organic layer in the first region to form a plurality of pits on the surface of the organic layer away from the encapsulation layer step 104;
  • step 105 Fill the plurality of pits with metal to form a black mask layer
  • a flat layer is formed, and the flat layer covers the color filter layer and the black mask layer (step 107).
  • FIG. 2 shows a schematic diagram of the structure of an OLED display panel according to an embodiment of the present disclosure.
  • 3a to 3f show schematic diagrams of a manufacturing process of an OLED display panel according to an embodiment of the present disclosure.
  • the OLED display panel 200 includes: a backplane 1, a light-emitting layer 2, an encapsulation layer 3, an organic layer 4, a black mask layer 5, a color film layer 6 and a flat layer 7.
  • a backplane 1 is provided, and a light-emitting layer 2 is provided on one side of the backplane 1, and the light-emitting layer 2
  • An encapsulation layer 3 is provided on the side away from the backplane (step 101).
  • the light-emitting layer 2 may have a multilayer structure.
  • the light-emitting layer 2 may include a cathode layer, one or more organic light-emitting layers, and an anode layer.
  • the encapsulation layer 3 may be formed of an insulating material.
  • an organic layer 4 is formed on the side of the encapsulation layer 3 away from the light-emitting layer using an organic material (step 102).
  • the organic material may be, for example, an organic material whose main chain is a benzene ring molecular structure as shown in FIG. 4, and the main chain is in a dashed frame.
  • the organic material may be a modified phenolic resin.
  • FIG. 5 shows a structural diagram of a modified phenolic resin according to an exemplary embodiment of the present disclosure, in which the modified phenolic resin has a photo-crosslinking group.
  • the organic material may be a photoresist.
  • the organic layer 4 is patterned to form a first area 41 covered by the organic layer 4 and a second area 41 not covered by the organic layer 4 on the encapsulation layer 3.
  • Area 42 (step 103).
  • the organic layer 4 can be patterned through conventional steps such as masking, exposure, and development, so as to form the first region 41 and the first region 41 described above. Two area 42. In the first region 41, the organic layer 4 above the encapsulation layer 3 is retained. In the second area 42, the organic layer 4 above the encapsulation layer 3 is removed.
  • the organic layer 4 is etched to form a plurality of pits 43 on the surface of the organic layer 4 away from the encapsulation layer 3 (step 104).
  • the surface of the organic layer 4 may be etched by dry etching to form the pits 43.
  • the organic layer 4 formed of the organic material according to the embodiment of the present disclosure described above is easily corroded by oxygen, so that pits 43 are formed on the organic layer 4.
  • oxygen can be used as an etching gas to perform an etching treatment on the organic layer 4.
  • the oxygen flow range is 90sccm-170sccm (standard cubic centimeters per minute)
  • the pressure of the oxygen environment in the reaction chamber is 10mmHg-30mmHg (millimeters of mercury)
  • the temperature is 70°C-90°C (degrees Celsius)
  • the time is 10s-20s (seconds). Table 1 shows various examples and comparative examples of the etching process.
  • metal is filled in the plurality of pits 43 to form a black mask layer 5 (step 105).
  • a metal layer may be formed in the first region 41 and the second region 42 by atomic layer deposition (ALD) or radio frequency sputtering physical vapor deposition (RFPVD) or the like.
  • ALD atomic layer deposition
  • RFPVD radio frequency sputtering physical vapor deposition
  • the metal here can be selected, for example, aluminum, molybdenum, copper, or silver.
  • the metal layer may be a multilayer structure, for example, a Ti/Al/Ti structure or the like.
  • the metal layer is etched to remove the metal layer in the second region 42 and the metal layer in the first region 41 covering the side of the organic layer 4 where the pits 43 are provided. In this way, as shown in FIG. 3f, only the metal in the pit 43 is retained. The metal remaining in the pit 43 and the organic material of the organic layer 4 in the first region 41 together constitute the black mask layer 5.
  • the inventor of the present disclosure found that the pits 43 formed on the organic layer 4 and the residual metal in the pits 43 can achieve diffuse reflection, effectively absorb light, and reduce reflectivity. As shown in Figure 6, after the light enters the pit, the light is continuously reflected and refracted in the pit, and is finally absorbed, thereby blocking the light and reducing the reflectivity.
  • the absorbance (OD) of the black mask layer 5 prepared according to the various embodiments of the present disclosure is above 0.70, and the transmittance (AVE) is less than 30.50%. Therefore, the black mask layer 5 can effectively block light.
  • the control of the surface etching of the organic layer 4 is achieved.
  • These parameters jointly determine the depth and range of the pits 43 on the surface of the organic layer 4, especially the size of the oxygen flow rate has a greater influence.
  • the depth, density and diameter of the pits 43 further affect the transmittance of the black mask layer 5. If the surface of the organic layer 4 is over-etched, the pits 43 will be larger and deeper, which will adversely affect the black mask layer 5. If the etching is not in place, there will not be enough pits 43 formed on the surface of the organic layer 4, and the black mask layer 5 formed further will not achieve the desired effect. Therefore, it is necessary to control the flow of oxygen, etc.
  • the parameters enable the pits 43 formed on the surface of the organic layer 4 and the black mask layer 5 to achieve sufficient light absorption.
  • the color filter layer 6 is formed in the second region 42 (step 106).
  • the color film layer 6 can filter the light emitted by the light-emitting layer 2 to obtain light of a desired color.
  • a flat layer 7 is formed on the color filter layer 6, and the flat layer 7 covers the color filter layer 6 and the black mask layer 5.
  • the flat layer 7 can protect the color film layer 6 and the black mask layer 5.
  • an organic material, an inorganic material, or the like can be used to form the flat layer 7.
  • the black mask layer between the color films, which can eliminate the process problems caused by the preparation of the black mask layer, such as alignment, residue, etc., and further Without using the corresponding light-shielding materials, it can save a lot of cost, and at the same time can effectively reduce the thickness of the film; further by forming an uneven structure on the organic layer and forming a black mask layer, the light is continuously reflected in the pits And refraction to absorb light and reduce reflectivity.
  • This embodiment also provides an OLED display panel, which is prepared by the above-mentioned preparation method.
  • the OLED display device 1200 includes an OLED display panel 1201, a control circuit 1202, and a power supply 1203.
  • the OLED display panel 1201 adopts the above-mentioned OLED display panel according to the present disclosure
  • the control circuit 1202 is configured to control the OLED display panel 1201.
  • the power supply 1203 is configured to supply power to the OLED display panel 1201 and the control circuit 1202.

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  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Electroluminescent Light Sources (AREA)

Abstract

一种OLED显示面板制备方法及显示面板、显示装置。一种OLED显示面板制备方法,包括:提供背板,其中所述背板上设置有发光层,所述发光层上设置有封装层(步骤101);使用有机材料在所述封装层远离所述发光层的一面形成有机层(步骤102);对所述有机层进行图案化,以在所述封装层上形成被所述有机层覆盖的第一区域和未被所述有机层覆盖的第二区域(步骤103);对所述第一区域中的所述有机层进行刻蚀,在所述有机层远离所述封装层的表面形成多个凹坑(步骤104);在所述多个凹坑内填充金属,以形成黑色掩膜层(步骤105);在所述第二区域中形成彩膜层(步骤106);以及形成平坦层,所述平坦层覆盖所述彩膜层和所述黑色掩膜层(步骤107)。

Description

OLED显示面板制备方法及显示面板、显示装置
相关申请的交叉引用
本申请要求2020年6月15日递交到中国国家知识产权局的、申请号为202010543462.3的发明专利申请的优先权,其全部内容通过引用包含于此。
技术领域
本发明一般涉及显示技术领域,尤其涉及OLED显示面板制备方法及显示面板、显示装置。
背景技术
COE(Color Film On Encapsulation,即把彩膜直接做在封装层上面)作为目前的新工艺,其代替了外挂的偏光片,是把滤光片功能直接集成在显示背板上,能够显著降低显示背板厚度的同时,节约了大量的生产成本,为企业带来了巨大的生产效益。但是,因为目前COE制作工艺本身的问题,比如对位,残留,Peeling等问题,导致项目产品良率比较低,因而如何有效的解决目前遇到的这些问题,成为目前COE研究的主要方向之一。
发明内容
根据本公开的一个方面,提供了一种OLED显示面板制备方法,包括:
提供背板,其中所述背板上设置有发光层,所述发光层上设置有封装层;
使用有机材料在所述封装层远离所述发光层的一面形成有机层;
对所述有机层进行图案化,以在所述封装层上形成被所述有机层覆盖的第一区域和未被所述有机层覆盖的第二区域;
对所述第一区域中的所述有机层进行刻蚀,在所述有机层远离所述封装层的表面形成多个凹坑;
在所述多个凹坑内填充金属,以形成黑色掩膜层;
在所述第二区域中形成彩膜层;
形成平坦层,所述平坦层覆盖所述彩膜层和所述黑色掩膜层。
在根据本公开的一些实施例中,所述有机层的材料为主链为苯环分子结构的有机材料。
在根据本公开的一些实施例中,所述有机层的材料为改性的酚醛树脂。
在根据本公开的一些实施例中,所述刻蚀为干刻处理。
在根据本公开的一些实施例中,所述干刻处理的气体环境为氧气环境。
在根据本公开的一些实施例中,所述干刻的氧气流量为90sccm-170sccm。
在根据本公开的一些实施例中,所述干刻的氧气流量为150sccm。
在根据本公开的一些实施例中,所述氧气环境的压强为10mmHg-30mmHg。
在根据本公开的一些实施例中,所述干刻处理的温度为70℃-90℃。
在根据本公开的一些实施例中,所述干刻处理的时间为10s-20s。
在根据本公开的一些实施例中,在所述多个凹坑内填充金属以形成黑色掩膜层包括:
在所述有机层上设有凹坑的一面形成金属层,
对所述金属层进行刻蚀处理,仅保留所述凹坑内的金属。
在根据本公开的一些实施例中,所述金属选自以下一种:钛/铝/钛、铝、钼、铜和银。
根据本公开的另一个方面,提供了一种使用上述根据本公开所述的方法制备的OLED显示面板。
根据本公开的又一个方面,提供了一种OLED显示装置,包括上述根据本公开所述的OLED显示面板。
附图说明
通过阅读参照以下附图所作的对非限制性实施例所作的详细描述,本申请的其它特征、目的和优点将会变得更明显:
图1为本实施例中OLED显示面板制备方法流程图;
图2为本实施例中OLED显示面板结构示意图;
图3a-图3h为本实施例中OLED显示面板制备过程示意图;
图4为根据本公开的实施例的有机层材料的结构示意图;
图5为根据本公开的实施例的有机层材料的结构示意图。
图6为本实施例中有机层和黑色掩膜层吸光原理示意图;
图7为根据本公开的实施例的OLED显示装置的结构图。
具体实施方式
下面结合附图和实施例对本申请作进一步的详细说明。可以理解的是,此处所描述的具体实施例仅仅用于解释相关发明,而非对该发明的限定。另外还需要说明的是,为了便于描述,附图中仅示出了与发明相关的部分。
需要说明的是,在不冲突的情况下,本申请中的实施例及实施例中的特征可以相互组合。下面将参考附图并结合实施例来详细说明本申请。
图1示出了根据本公开的实施例的一种OLED显示面板制备方法,包括以下步骤:
提供背板,其中所述背板上设置有发光层,所述发光层上设置有封装层(步骤101);
使用有机材料在所述封装层远离所述发光层的一面形成有机层(步骤102);
对所述有机层进行图案化,以在所述封装层上形成被所述有机层覆盖的第一区域和未被所述有机层覆盖的第二区域(步骤103);
对所述第一区域中的所述有机层进行刻蚀,在所述有机层远离所述封装层的表面形成多个凹坑(步骤104);
在所述多个凹坑内填充金属,以形成黑色掩膜层(步骤105);
在所述第二区域中形成彩膜层(步骤106);以及
形成平坦层,所述平坦层覆盖所述彩膜层和所述黑色掩膜层(步骤107)。
下面结合图2-图3f详细描述根据本公开的实施例的OLED显示面板的制备方法的各个步骤。图2示出了根据本公开的实施例的OLED显示面板的结构的示意图。图3a-图3f示出了根据本公开的实施例的OLED显示面板的制备过程的示意图。
如图2所示,根据本公开的实施例的OLED显示面板200包括:背板1、发光层2、封装层3、有机层4、黑色掩膜层5、彩膜层6以及平坦层7。
如图3a所示,在根据本公开的实施例的OLED显示面板的制备方法中,首先,提供背板1,在所述背板1的一侧设置有发光层2,在所述发光层2远离所述背板的一侧设置有封装层3(步骤101)。发光层2可以多层结构,例如发光层2可以包括阴极层、一层或多层有机发光层以及阳极层等结构。封装层3可以由绝缘材料形成。
然后,如图3b所示,使用有机材料在所述封装层3远离所述发光层的一面形成有机层4(步骤102)。在根据本公开的一些实施例中,有机材料可以为例如图4所示的主链为苯环分子结构的有机材料,在虚线框内为主链。
在根据本公开的另一些实施例中,有机材料可以为改性的酚醛树脂。例如图5示出了根据本公开的一个示例性实施例的改性的酚醛树脂的结构图,在该改性的酚醛树脂中,具有光交联基团。在根据本公开的一些实施例中,有机材料可以为光致抗蚀剂。
接下来,如图3c所示,对所述有机层4进行图案化,以在封装层3上形成被所述有机层4覆盖的第一区域41和未被所述有机层4覆盖的第二区域42(步骤103)。例如,在有机层4的材料为光致抗蚀剂的情况下,可以通过制作掩膜、曝光、显影等常规的步骤,对有机层4进行图案化处理,从而形成上述第一区域41和第二区域42。在第一区域41中,封装层3上方的有机层4被保留。在第二区域42中,封装层3上方的有机层4被去除。
随后,如图3d所示,对有机层4进行刻蚀,在有机层4远离所述封装层3的表面形成多个凹坑43(步骤104)。在根据本公开的一些实施例中,可以通过干刻的方式对有机层4的表面进行刻蚀,以形成凹坑43。上述根据本公开的实施例的有机材料形成的有机层4,容易被氧腐蚀,从而在有机层4上形成凹坑43。例如,在形成有机层4的有机材料为苯环分子结构的有机材料或改性的酚醛树脂的情况下,可以使用氧气作为刻蚀气体,对有机层4进行刻蚀处理。在刻蚀处理中,氧气的流量范围为90sccm-170sccm(标准立方厘米每分钟),反应室内的氧气环境的压强为10mmHg-30mmHg(毫米汞柱),温度为70℃-90℃(摄氏度),时间为10s-20s(秒)。表1示出了刻蚀处理的多个实施例和比较例。
表1
Figure PCTCN2021099930-appb-000001
接下来,如图3e所示,在所述多个凹坑43内填充金属,形成黑色掩膜(black mask)层5(步骤105)。
例如,在根据本公开的实施例中,可以通过原子层沉积(ALD)或射频溅射物理气 相沉积(RFPVD)等方式,在第一区域41和第二区域42中形成金属层。这里的金属可以选择例如铝、钼、铜或银等。此外,在根据本公开的一些实施例中,所述金属层可以为多层结构,例如可以为Ti/Al/Ti结构等。
然后,对金属层进行刻蚀,去除第二区域42中的金属层以及第一区域41中覆盖在有机层4的设有凹坑43的一侧的金属层。这样,如图3f所示,仅有凹坑43内的金属被保留下来。在凹坑43中残留的金属以及第一区域41中的有机层4的有机材料共同构成了黑色掩膜层5。
本公开的发明人发现,通过形成在有机层4上的凹坑43和凹坑43内的残留金属可以实现漫反射,有效的吸收光线,降低反射率。如图6所示,光线在进入凹坑后,光线在凹坑内不断的反射和折射,最终被吸收,从而起到了挡光和降低反射率的作用。
如上面的表1所示,按照本公开的各个实施例制备得到的黑色掩膜层5的吸光度(OD)在0.70以上,透过率(AVE)小于30.50%。因此,黑色掩膜层5可以起到良好的遮挡光线的作用。
此外,在根据本公开的本实施例中,通过控制氧气流量、压强、温度、反应时间等参数,实现对有机层4表面刻蚀情况的控制。这些参数共同决定了有机层4表面凹坑43的深度和范围,尤其是氧气流量的大小具有较大的影响。凹坑43的深度、密度和直径等进一步的影响了该黑色掩膜层5的透过率,若有机层4表面刻蚀过度,凹坑43较大较深,反而会影响黑色掩膜层5的透过率,若刻蚀不到位,有机层4表面没有形成足够多的凹坑43,进一步形成的黑色掩膜层5也达不到想要实现的效果,因此,需要控制氧气的流量等参数,使得有机层4表面形成的凹坑43和黑色掩膜层5能够实现对光线充分的吸收。
接下来,如图3g所示,在第二区域42中形成彩膜层6(步骤106)。彩膜层6可以对发光层2发出的光进行过滤,从而得到期望的颜色的光。
最后,如图3h所示,在所述彩膜层6上形成平坦层7,所述平坦层7覆盖所述彩膜层6和所述黑色掩膜层5。平坦层7可以起到保护彩膜层6和黑色掩膜层5的作用。例如,可以采用有机材料或无机材料等来形成平坦层7。
在根据本公开的实施例制备的OLED显示面板的过程中,并不需要单独提供黑色掩膜层,节省成本的同时能够有效的降低膜层的厚度。
根据本公开的实施例中提供的制备方法,不需要进行彩膜之间黑色掩膜层的设置,能够消除因为制备黑色掩膜层带来的工艺问题,例如对位、残留等问题,进一步的不使用相应的遮光材料,能够节省大量的成本,同时能够有效的减低膜层的厚度;更进 一步的通过在有机层上形成凹凸不平的结构并形成黑色掩膜层,光线在凹坑内不断的反射和折射,进行光的吸收,降低反射率。
本实施例还提供一种OLED显示面板,采用上述制备方法进行制备。
根据本公开的实施例,还提供了提供一种OLED显示装置。如图7所示,OLED显示装置1200包括OLED显示面板1201、控制电路1202以及电源1203。其中,OLED显示面板1201采用上述根据本公开的OLED显示面板,控制电路1202被配置为控制OLED显示面板1201。电源1203被配置为向OLED显示面板1201和控制电路1202供电。
以上描述仅为本申请的较佳实施例以及对所运用技术原理的说明。本领域技术人员应当理解,本申请中所涉及的发明范围,并不限于上述技术特征的特定组合而成的技术方案,同时也应涵盖在不脱离所述发明构思的情况下,由上述技术特征或其等同特征进行任意组合而形成的其它技术方案。例如上述特征与本申请中公开的(但不限于)具有类似功能的技术特征进行互相替换而形成的技术方案。

Claims (14)

  1. 一种OLED显示面板制备方法,包括:
    提供背板,其中所述背板上设置有发光层,所述发光层上设置有封装层;
    使用有机材料在所述封装层远离所述发光层的一面形成有机层;
    对所述有机层进行图案化,以在所述封装层上形成被所述有机层覆盖的第一区域和未被所述有机层覆盖的第二区域;
    对所述第一区域中的所述有机层进行刻蚀,在所述有机层远离所述封装层的表面形成多个凹坑;
    在所述多个凹坑内填充金属,以形成黑色掩膜层;
    在所述第二区域中形成彩膜层;
    形成平坦层,所述平坦层覆盖所述彩膜层和所述黑色掩膜层。
  2. 根据权利要求1所述的OLED显示面板制备方法,其中,所述有机层的材料为主链为苯环分子结构的有机材料。
  3. 根据权利要求1所述的OLED显示面板制备方法,其中,所述有机层的材料为改性的酚醛树脂。
  4. 根据权利要求1所述的OLED显示面板制备方法,其中,所述刻蚀为干刻处理。
  5. 根据权利要求4所述的OLED显示面板制备方法,其中,所述干刻处理的气体环境为氧气环境。
  6. 根据权利要求5所述的OLED显示面板制备方法,其中,所述干刻的氧气流量为90sccm-170sccm。
  7. 根据权利要求6所述的OLED显示面板制备方法,其中,所述干刻的氧气流量为150sccm。
  8. 根据权利要求5所述的OLED显示面板制备方法,其中,所述氧气环境的压强为10mmHg-30mmHg。
  9. 根据权利要求5所述的OLED显示面板制备方法,其中,所述干刻处理的温度为70℃-90℃。
  10. 根据权利要求5所述的OLED显示面板制备方法,其中,所述干刻处理的时间为10s-20s。
  11. 根据权利要求1所述的OLED显示面板制备方法,其中,在所述多个凹坑内填充金属以形成黑色掩膜层包括:
    在所述有机层上设有凹坑的一面形成金属层,
    对所述金属层进行刻蚀处理,仅保留所述凹坑内的金属。
  12. 根据权利要求11所述的OLED显示面板制备方法,其中,所述金属选自以下一种:钛/铝/钛、铝、钼、铜和银。
  13. 一种使用权利要求1-12中任一项所述的方法制备的OLED显示面板。
  14. 一种OLED显示装置,包括权利要求13所述的OLED显示面板。
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