WO2021100449A1 - ソケットおよび工具 - Google Patents

ソケットおよび工具 Download PDF

Info

Publication number
WO2021100449A1
WO2021100449A1 PCT/JP2020/041094 JP2020041094W WO2021100449A1 WO 2021100449 A1 WO2021100449 A1 WO 2021100449A1 JP 2020041094 W JP2020041094 W JP 2020041094W WO 2021100449 A1 WO2021100449 A1 WO 2021100449A1
Authority
WO
WIPO (PCT)
Prior art keywords
pin
engaging
pin plate
block
pin block
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2020/041094
Other languages
English (en)
French (fr)
Japanese (ja)
Inventor
康平 甘田
勇輝 松井
佳憲 白井
傑 松井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokowo Co Ltd
Original Assignee
Yokowo Co Ltd
Yokowo Mfg Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokowo Co Ltd, Yokowo Mfg Co Ltd filed Critical Yokowo Co Ltd
Priority to US17/777,636 priority Critical patent/US20230018510A1/en
Priority to JP2021558264A priority patent/JPWO2021100449A1/ja
Priority to CN202080080609.8A priority patent/CN114731019A/zh
Publication of WO2021100449A1 publication Critical patent/WO2021100449A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
    • H01R43/20—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors for assembling or disassembling contact members with insulating base, case or sleeve
    • H01R43/22—Hand tools
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/045—Sockets or component fixtures for RF or HF testing

Definitions

  • the present invention relates to a socket used for inspecting an IC (Integrated Circuit) package.
  • Sockets used for inspecting IC packages are known (see, for example, Patent Document 1).
  • the socket has a pin block in which a plurality of contact probes corresponding to each of the electrode terminals of the IC are erected, and a guide member provided above the pin block.
  • the IC package to be inspected is inserted into the guide member with the electrode terminal facing down, the IC package is guided on the contact probe in a predetermined posture.
  • the electrode terminals of the IC package come into contact with the contact probe, and an energizing path for inspection is secured.
  • An example of an object of the present invention is to realize a contact probe holding structure adapted to reduce the thickness of the socket.
  • One aspect of the present invention includes a pin block on which a plurality of contact probes are installed, a pin plate that holds the plurality of contact probes together with the pin block, and an engaging portion that engages the pin block and the pin plate. , A socket with.
  • FIG. 2 is a sectional view taken along line III-III in FIG. Top view of the pin plate in the first embodiment.
  • FIG. 4 is a sectional view taken along line VV in FIG.
  • the perspective view (the 1) which shows the structural example of the tool which concerns on 1st Embodiment.
  • FIG. 2 is a perspective external view showing a configuration example of a tool according to the first embodiment. Perspective external view of the left semifield and the fulcrum axis. The figure for demonstrating the assembly of a pin block and a pin plate in 1st Embodiment (the 1).
  • FIG. 3 is a diagram for explaining the assembly of the pin block and the pin plate in the first embodiment.
  • FIG. 14 is a cross-sectional view taken along the line XV-XV of FIG.
  • the exploded view which shows the structural example of the pin block and the pin plate in 2nd Embodiment.
  • FIG. 3 is an enlarged perspective sectional view around an engaging hook portion and an engaging protrusion portion during assembly of the second embodiment.
  • FIG. 1 is an enlarged cross-sectional view showing a connection portion between the block-side press-fitting hole and the plate-side press-fitting hole (No. 1).
  • FIG. 2 is an enlarged cross-sectional view showing a connection portion between the block-side press-fitting hole and the plate-side press-fitting hole (No. 2).
  • FIG. 1 is an external view showing a configuration example of the socket 10 of the present embodiment.
  • the socket 10 includes a socket body 12, a lid 14, and a pressurizing mechanism 16.
  • the socket body 12 is mounted on the inspection device 5 in which the IC package 9 to be inspected is inserted.
  • the lid body 14 is swingably supported by a lid body swing shaft 18 along the X-axis direction, and a pressurizing mechanism 16 is supported above the socket body 12.
  • the pressurizing mechanism 16 applies a load to the IC package 9 to be inspected contained in the socket body 12 from above to below.
  • a hook 20 is provided on the minus side in the Y-axis direction (to the right when viewed from the front of the paper in FIG. 1), which is the side of the lid 14 opposite to the side on which the lid swing shaft 18 is provided.
  • the hook 20 is swingably supported by the hook swing shaft 22 along the X-axis direction, and is urged by the coil spring 24 in the hook swing shaft 22 in the clockwise direction when viewed from the minus side in the X-axis direction. ing.
  • the hook 20 maintains a state in which the lid 14 covers the upper part of the socket body 12 by engaging the engaging claw 21 with the socket body 12.
  • the hook 20 is removed, and the lid 14 is rocked by the lid swing shaft 18, the inside of the socket body 12 is exposed and the IC package 9 to be inspected is taken in and out. Is possible.
  • the socket body 12 has a guide member 26, a contact probe array 28, a pin block 30, and a pin plate 50.
  • the guide member 26 guides the inspection target IC package 9 so that the inspection target IC package 9 inserted in the socket body 12 is in a predetermined relative position with respect to the contact probe array 28 in a predetermined posture.
  • the contact probe array 28 is configured by arranging a plurality of contact probes along the XY plane so as to correspond to the arrangement of the electrode terminals of the IC package 9 to be inspected. Each contact probe of the contact probe array 28 is held by the pin block 30 and the pin plate 50 so that the longitudinal direction is along the Z-axis direction.
  • FIG. 2 is a bottom view of the pin block 30.
  • FIG. 3 is a sectional view taken along line III-III in FIG.
  • the pin block 30 is a component made of an insulating elastic resin.
  • the pin block 30 has a central recess 31 in the central portion of the lower surface (side surface in the minus direction of the Z axis), and has a plurality of probe insertion portions 32 in the ceiling portion of the central recess 31.
  • Each probe insertion portion 32 is a portion corresponding to one-to-one with respect to the contact probes constituting the contact probe array 28, and functions to hold the upper end of the inserted contact probe with respect to the pin block 30.
  • One probe insertion portion 32 has a through hole 32a in the vertical direction (Z-axis direction), and has a stepped portion 32b around the through hole 32a (see FIG. 3).
  • the plunger of the contact probe penetrates the pin block 30 through the through hole 32a, but the barrel of the contact probe (larger in diameter than the plunger) abuts on the stepped portion 32b, so that the upper end of the contact probe is positioned and the pin block. Retained for 30.
  • the pin block 30 has positioning portions 33 on the X-axis plus side and the X-axis minus side, respectively, with the central recess 31 interposed therebetween.
  • the positioning portion 33 is a protrusion projecting downward (Z-axis minus direction).
  • the positioning portion 33 is fitted into a positioning hole 56 provided in the pin plate 50, which will be described later, to position the pin plate 50 with respect to the pin block 30 when assembling the pin block 30 and the pin plate 50, and to position the pin plate 50. It functions to suppress misalignment with respect to the pin block 30.
  • the pin block 30 has a comb-shaped engaging hole 36 that is long in the X-axis direction on the outside of each of the Y-axis plus side and the Y-axis minus side with the central recess 31 interposed therebetween.
  • Two engaging protrusions 37 extend outward along the Y-axis on the inner surface of each engaging hole 36 on the contact probe array 28 side. Since the engaging protrusions 37 are provided at predetermined intervals along the X axis, the engaging holes 36 look like comb teeth when viewed from the bottom.
  • the engaging protrusion 37 has an engaging claw portion 37a at the tip of the extended portion.
  • the engaging claw portion 37a has a tapered portion 37b at the lower portion and a stepped portion 37c at the upper portion (see FIG. 3).
  • the engaging protrusion 37 constitutes a part of the connecting portion 60 that detachably connects the pin block 30 and the pin plate 50.
  • FIG. 4 is a top view of the pin plate 50.
  • FIG. 5 is a sectional view taken along line VV in FIG.
  • the pin plate 50 is a component made of an insulating elastic resin.
  • the pin plate 50 is mounted on the lower surface of the pin block 30, penetrates through the through hole 32a of the pin block 30, and holds the lower end of each contact probe of the contact probe array 28 held by the pin block 30.
  • the pin plate 50 has an inner region portion 51, an outer region portion 52, and an extension portion 55.
  • the inner region portion 51 has a central recess 53 recessed so that the vertical thickness is thinner than the outer edge.
  • the central recess 53 opens upward (Z-axis plus direction) and has a flat bottom surface.
  • the central recess 53 is provided with a plurality of probe insertion portions 54 corresponding to each contact probe of the contact probe array 28. ing.
  • the probe insertion portion 54 has a one-to-one correspondence with the contact probes constituting the contact probe array 28.
  • the probe insertion portion 54 functions to hold the lower end of the inserted contact probe with respect to the pin plate 50 by inserting the lower end of the contact probe into the probe insertion portion 54.
  • One probe insertion portion 54 has a through hole 54a in the vertical direction, and has a stepped portion 54b around the through hole 54a (see FIG. 5).
  • the plunger of the contact probe penetrates the pin plate 50 through the through hole 54a, but the lower end of the contact probe is positioned when the barrel of the contact probe (larger in diameter than the plunger) abuts on the stepped portion 54b, and the pin plate is positioned. Retained for 50.
  • the outer region portion 52 is provided on each of the Y-axis plus side and the Y-axis minus side of the inner region portion 51.
  • a strip-shaped body having a rectangular cross section passes through a position separated from the side surface on the Y-axis plus side of the inner region portion 51 and is separated from the side surface on the X-axis plus side of the inner region portion 51. It is connected to the side surface of the inner region portion 51 on the minus side of the X axis.
  • a strip-shaped body having a rectangular cross section passes through a position separated from the side surface on the minus side of the Y axis of the inner region portion 51, and is on the plus side of the X axis of the inner region portion 51. It is connected to the side surface and the side surface of the inner region portion 51 on the minus side of the X axis.
  • the outer region portion 52 can also be said to be an outer edge portion separated from the inner region portion 51.
  • the outer region portion 52 is a pair of loop-shaped ear portions that form a gap between the outer region portion 52 and the inner region portion 51.
  • the outer region portion 52 includes an engaging hook portion 57 which is a linear portion along the X axis, and two flexible portions 58 connecting each end portion of the engaging hook portion 57 in the X-axis direction and the inner region portion 51. And have.
  • the outer region portion 52 constitutes a part of the engaging portion 60 that detachably engages the pin block 30 and the pin plate 50.
  • the vertical cross section of the engaging hook 57 is generally rectangular. As shown in FIG. 5, the engaged portion of the engaging hook portion 57 to which the engaging claw portion 37a of the engaging projection portion 37 (see FIGS. 2 and 3) of the pin block 30 engages is the tapered portion 57a. It has become.
  • the flexible portion 58 applies a flexural stress so that when an external force that displaces the engaging hook portion 57 in a direction away from the inner region portion 51 is applied, the flexible portion 58 is intentionally more easily elastically deformed than other portions. It is a part that has a shape that is easy to receive.
  • the flexible portion 58 has a semicircular curved portion 58c with a convex shape on the plus side or the minus side of the X axis.
  • the width W4 in the Y-axis direction of the engaging hook portion 57 is set smaller than the width W3 of the narrow portion in the Y-axis direction of the engaging hole 36 (see FIG. 2) of the pin block 30.
  • the engaging hook portion 57 which is a linear portion, is inserted into the narrow portion of the engaging hole 36, it interferes with the engaging protrusion portion 37. As will be described later, a configuration for reducing the interference is involved. It is provided on the hooking portion 57 and the engaging protrusion portion 37.
  • the width W3 is set so that the engaging claw portion 37a is securely engaged with the engaging hook portion 57.
  • the position of the engaging hook portion 57 in the Z-axis direction is set in the upward direction (Z-axis plus direction) from the positions of the inner region portion 51 and the flexible portion 58.
  • the pin plate 50 has a connection portion between the outer region portion 52 and the inner region portion 51 on the Y-axis plus side and a Y-axis minus side on each side surface of the inner region portion 51 on the X-axis plus side and the X-axis minus side.
  • An extension portion 55 extending in the X-axis direction is provided between the connection portion between the outer region portion 52 and the inner region portion 51.
  • Each of the extension portions 55 has a positioning hole 56 penetrating in the vertical direction. The inner diameter of the positioning hole 56 is adjusted to the outer diameter of the positioning portion 33 (see FIGS. 2 and 3).
  • FIG. 6 is a perspective external view showing a configuration example of the tool 100 used when assembling the pin block 30 and the pin plate 50, and corresponds to an external view seen from diagonally above for the tool 100.
  • FIG. 7 is the same perspective external view, and corresponds to an external view seen from diagonally below for the tool 100.
  • the three orthogonal axes of XtYtZt shown in FIGS. 6 and 7 are right-handed system coordinates indicating up, down, left, and right for the tool 100.
  • the three orthogonal axes of XYZ shown in the drawings relating to the socket 10 of FIGS. 1 to 5 are upside down.
  • a dedicated tool 100 is used for the work of assembling and disassembling the pin plate 50 with respect to the pin block 30.
  • the tool 100 has a structure in which a pair of handles 101 are pinched / opened by two fingers of an operator to widen / approach the distance between the pair of tip portions 103 with the fulcrum shaft 102 as a fulcrum. ing.
  • the tool 100 has a fulcrum shaft 102 provided along the Yt axis direction, a right semifield 110R, and a left semifield 110L.
  • FIG. 8 is a perspective external view of the left semifield 110L and the fulcrum shaft 102.
  • the left semifield 110L has one of the handles 101, one of the tip 103, and a bearing 112 having an insertion hole for inserting the fulcrum shaft 102.
  • the tip portion 103 has three key claw portions 105 projecting downward in a posture in which the claw protrusions are directed in the left-right outward direction (Xt axis direction orthogonal to the axial direction of the fulcrum shaft 102).
  • Each of the key claw portions 105 has a flat portion 105a.
  • the flat portion 105a exists above the nail protrusion (in the Zt axis direction) and becomes wider in the Xt axis direction in which the nail protrusion faces.
  • the installation intervals of the three key claws 105 are set according to the installation intervals of the engagement protrusions 37 of the engagement holes 36 of the pin block 30.
  • the width W7 (see FIG.
  • each key claw portion 105 in the Yt axis direction is the interval W2 between the two engaging protrusions 37 of the engaging hole 36 of the pin block 30 and the spacing between the two engaging protrusions 37.
  • the width of the gap provided on the opposite side of W2 is set to be smaller than W2'(see FIG. 2).
  • the bearing portion 112 has a first contact surface 114 and a second contact surface 116.
  • the first contact surface 114 shown in FIG. 8 is a surface parallel to the inner surface of the right semifield 110R in a state where the tool 100 is closed (a state in which the pair of handles 101 are most separated from each other), and is parallel to the inner surface. In the state, it abuts on the inner surface.
  • the tool 100 is opened (the pair of handles 101 are closest to each other)
  • the tool 100 is rotated by the fulcrum shaft 112 to form a predetermined angle (an angle larger than 0 °) with the inner surface of the right semifield 110R). It is a surface, and when a predetermined angle is formed, a gap is formed between the surface and the inner surface (does not abut on the inner surface).
  • the second contact surface 116 shown in FIG. 8 forms a predetermined angle (an angle larger than 0 °) with the inner surface of the right semifield 110R in a state where the tool 100 is closed (a state in which the pair of handles 101 are most separated from each other). It is a surface, and when a predetermined angle is formed, a gap is formed between the surface and the inner surface.
  • the surface is rotated by the fulcrum shaft 112 and abuts on the inner surface of the right semifield 110R.
  • the second contact surface 116 functions as a limiting portion that limits the approach interval of the pair of handles by contacting the inner surface of the right half body 110R.
  • the first contact surface 114 and the second contact surface 116 of the left half body 110L have been described, but the right half body 110R also has two contact surfaces corresponding to the contact surface 114 and the second contact surface 116. It has a surface and has a similar function.
  • An urging portion 120 is attached to the fulcrum shaft 102.
  • the urging portion 120 has a twisted portion and two urging rods extending upward from the twisted portion at substantially the center of the fulcrum shaft 102.
  • the two urging rods of the urging portion 120 have the left half body 110L and the right half body 110R in the direction of widening the distance between the pair of handles 101 (the direction in which the pair of tip portions 103 approach each other).
  • the urging portion 120 is illustrated as a torsion spring composed of a twisting portion and two urging rods, but the present invention is not limited to this, and for example, a leaf spring may be used.
  • the right semifield 110R has the other of the handle 101 and the other of the tip 103, except that the arrangement position of the bearing 112 is different from that of the left 110L, and the other of the tip 103 has three key claws. Has 105. These have the same shape except that the arrangement position of the bearing portion 112 is different from that of the left semifield 110L.
  • FIG. 9 is a diagram for explaining the assembly of the pin block 30 and the pin plate 50, and corresponds to a perspective view of the tool 100 as viewed from diagonally below for the tool.
  • the three orthogonal axes of XtYtZt are the coordinate system based on the vertical and horizontal directions for the tool 100, and the three orthogonal axes of XYZ are based on the vertical and horizontal directions for the pin block 30 and the pin plate 50 (the vertical and horizontal directions for the socket 10). It is a coordinate system. The same applies to the following figures.
  • the operator first attaches the pin plate 50 to the tip 103 of the tool 100, as shown in FIG. Specifically, the operator turns the lower surface of the pin plate 50 toward the tool 100 and inserts the tip portion 103 of the tool 100 into the gap between the inner region portion 51 and the outer region portion 52 of the pin plate 50. Then, by pressing the lower surface of the pin plate 50 in the direction opposite to the Zt axis direction by the flat portion 105a of the key claw portion 105, the key claw portion 105 (claw protrusion) of the tip portion 103 is engaged with the engaging hook portion 57. .. The operator sandwiches the pair of handles 101 with two fingers so as to approach each other (moving the pair of handles 101 in the direction indicated by the white arrow in FIG. 9) in the manner of opening the clothespin.
  • the force that brings the pair of handles 101 closer together is the force that widens the distance between the pair of tip portions 103 by the fulcrum axis 102 (the black force in FIG. 9). It acts as a force acting in the direction indicated by the thick arrow).
  • the key claw portion 105 engaged with the engaging hook portion 57 widens the gap between the inner region portion 51 and the outer region portion 52 of the pin plate 50.
  • the force that widens the distance between the pair of tip portions 103 acts as an external force that separates the engaging hook portion 57 from the inner region portion 51 via the three key claw portions 105. Since the flat portion 105a of the key claw portion 105 is pressed against the pin plate 50 to engage the key claw portion 105 (claw protrusion) with the engaging hook portion 57, the pin plate 50 is surely attached to the tool 100. Can be retained.
  • FIG. 10 is a view of the pin plate 50 attached to the tool 100 as viewed from the tip side of the tool 100.
  • the solid line shows the state before widening the distance between the tip portions 103 of the tool 100
  • the long broken line shows the state after widening the gap between the tip portions 103 of the tool 100.
  • the tip portion 103 (key claw portion 105) is shaded for easy identification.
  • the pin plate 50 By applying a force to a predetermined portion of the pin plate 50 (the inner region portion 51 side of the engaging hook portion 57) in which the key claw portion 105 is in contact with the side surface of the engaging hook portion 57 on the inner region portion 51 side and engaged. , The elastic portion (flexible portion 58) of the pin plate 50 is elastically deformed. The tool 100 holds the pin plate 50 in a state where the engaging hook 57 reaches the long broken line.
  • the external force acting on the engaging hook 57 via the key claw 105 causes the pin plate 50 to bend.
  • the flexible portion 58 bends to absorb an external force. Specifically, the curvature of the curved portion 58c curved in a semicircular shape in the bottom view is reduced, and the curvature is induced so that the arc of the curvature is extended. Therefore, the effect of bending the inner region portion 51 due to the external force becomes so small that it can be ignored.
  • the shape of the probe insertion portion 54 and the positional relationship of the adjacent probe insertion portions 54 do not change. As a result, the contact probe of the contact probe array 28 can be correctly inserted into the pin plate 50. No excessive force is applied to the contact probe in the XY plane direction.
  • the operator assembles the pin plate 50 to the pin block 30 with the distance between the pair of handles 101 being close to each other and the distance between the tip portions 103 being widened.
  • the pin plate 50 is temporarily fixed to a predetermined assembly jig 200 in a state of being turned upside down, and a corresponding contact probe is assembled to each probe insertion portion 54. Since the pin block 30 temporarily fixed to the assembly jig 200 has the positioning portion 33 facing upward (see FIG. 2), the operator can position the positioning hole 56 (see FIG. 4) of the pin plate 50 with the positioning portion. Assemble the pin plate 50 so as to cover the pin block 30 so as to fit in 33.
  • the pin block 30 and the pin plate 50 By fitting the positioning hole 56 and the positioning portion 33, the pin block 30 and the pin plate 50 have a correct relative positional relationship, and the through hole 32a of the probe insertion portion 32 of the pin block 30 and the probe insertion portion 543 of the pin plate 50.
  • the through hole 54a of the above has a correct positional relationship. In the process of assembling the pin plate 50 so as to cover the pin block 30, each contact probe of the contact probe array 28 is smoothly inserted into the probe insertion portion 54 of the pin plate 50.
  • FIG. 12 is an enlarged perspective view of an engaging portion 60 (engaging hook portion 57 and engaging protrusion 37) between the pin block 30 and the pin plate 50 during assembly, and the pin plate 50 is placed over the pin block 30. It is an enlarged view which enlarges and shows the circumference of the key claw part 105 of the tool 100 in the process of assembling. The pin plate 50 is shaded for easy identification.
  • the force that brings the pair of handles 101 closer to each other acts as an external force that widens the distance between the pair of tip portions 103 by the fulcrum shaft 102. Therefore, in the pin plate 50 in the assembly process, the engaging hook portion 57 is separated from the inner region portion 51 as compared with the free state in which no external force is applied.
  • the position of the engaging hook portion 57 in the Z-axis direction is above the engaging hole 36 (see FIGS. 2 and 3) (Z-axis plus direction).
  • the gap portion (width shown in FIGS.
  • the engaging hook portion 57 is located above (substantially directly above) the gap (W3).
  • the key claw portion 105 of the tool 100 engaged with the engaging hook portion 57 has a gap (width W2'shown in FIG. 2) in the engaging hole 36 in which the engaging protrusion portion 37 is not projected. It will be located above the void).
  • the engaging hook portion 57 and the tip portion 103 (key claw portion 105) of the tool 100 can be seen passing through the engaging hole 36 and being fixed to the surface side of the pin block 30 (fixed to the assembly jig 200). For example, the side opposite to the tool 100) is reached.
  • the central recess 53 (see FIG. 5) of the inner region portion 51 of the pin plate 50 fits into the central recess 31 (see FIGS. 2 and 3) of the pin block 30. This state is the state shown in FIG.
  • the operator then releases the force that brings the pair of handles 101 closer together. Due to the action of the urging portion 120 (see FIG. 8), the distance between the tip portions 103 of the tool 100 is naturally reduced, and the first contact surface 114 of the left semifield 110L abuts on the inner surface of the right semifield 110R, and the right The first contact surface 114 of the half body 110R abuts on the inner surface of the left half body 110L. As a result, the engagement between the key claw portion 105 and the engaging hook portion 57 is released. In the tool 100, the force acting on the predetermined portion (engagement hook portion 57) of the pin plate 50 is released, and the engagement between the key claw portion 105 and the engagement hook portion 57 is released, so that the pin plate 50 Will be released. Then, the operator lifts the tool 100 and separates the tool 100 from the pin plate 50. Since the pin block 30 is temporarily fixed to the assembly jig 200 and the pin plate 50 is assembled to the pin block 30, workability is improved.
  • FIG. 13 is an enlarged perspective view of the engaging portion when the assembly is completed, and is an enlarged view showing a state in which the tool 100 is separated from the pin plate 50.
  • the pin plate 50 is shaded for easy identification.
  • FIG. 14 is a bottom view of the pin block 30 and the pin plate 50 when the assembly is completed, and is a view of the state in which the tool 100 is lifted and separated from the pin plate 50 as viewed from the tip 103 side of the tool 100.
  • FIG. 15 is a cross-sectional view taken along the line XV-XV of FIG. However, the illustration of the contact probe is omitted.
  • the pin plate 50 When the operator separates the tool 100 from the pin plate 50, the pin plate 50 loses the external force acting on the engaging hook 57 by disengaging the key claw 105 and the engaging hook 57. , The outer region portion 52 is released from bending by the action of elasticity of the flexible portion 58 and returns to the original free state (states shown in FIGS. 4 and 5).
  • the corner portion on the back surface of the tapered portion 57a of the engaging hook portion 57 is caught by the stepped portion 37c (see FIG. 3) of the engaging protrusion portion 37.
  • the pin plate 50 is attached to the pin block 30 by engaging the engaging hook portion 57 and the engaging protrusion portion 37. That is, the engaging hook portion 57 and the engaging protrusion portion 37 exhibit a function as an engaging portion 60 that engages the pin block 30 and the pin plate 50.
  • the above procedure may be reversed using the tool 100.
  • the operator can use the tip 103 of the tool 100 with the inner region 51 and the outer region 52 of the pin plate 50 engaged with the pin block 30. It is inserted into the gap, and the lower surface of the pin plate 50 is pressed in the direction opposite to the Zt axis direction by the flat portion 105a of the key claw portion 105 of the tip portion 103. Then, the key claw portion 105 (claw protrusion) of the tip portion 103 can be engaged with the engaging hook portion 57, and the pin plate 50 can be reliably held by the tool 100. This improves workability.
  • FIG. 16 is an exploded view showing a configuration example of the pin block 30B and the pin plate 50B in the second embodiment.
  • the pin block 30B is shown in a posture in which the lower surface is facing toward the front
  • the pin plate 50 is shown in a posture in which the upper surface is facing toward the front.
  • the coordinate system in FIG. 16 indicates a direction aligned with the vertical and horizontal directions of the pin block 30.
  • the socket 10 in the second embodiment includes a pin block 30B in place of the pin block 30 in the first embodiment, and a pin plate 50B in place of the pin plate 50 in the first embodiment.
  • the pin block 30B is a component made of an insulating elastic resin.
  • the pin block 30B has a plurality of probe insertion portions 32 on the ceiling portion of the central recess 31 and a positioning portion 33B on the outer peripheral portion of the central recess 31.
  • the positioning portion 33B is a through hole provided in a position facing the positioning protrusion 59 provided on the upper surface of the pin plate 50B and penetrating in the vertical direction.
  • the inner diameter of the positioning portion 33B forms a fitting relationship sufficient to position the pin plate 50 with respect to the pin block 30 with respect to the outer diameter of the positioning protrusion 59 and further function as a suppression of misalignment with respect to the pin block 30. Is set to.
  • the pin block 30B has engagement holes 36B on the X-axis plus side and the X-axis minus side at the outer peripheral portion of the central recess 31.
  • the engaging hole 36B is a hole that penetrates in the vertical direction (Z-axis direction) of the top view rectangle.
  • An engaging protrusion 37 is provided on the outside of the engaging hole 36B in the X-axis direction (opposite the central recess 31).
  • a gap 38 is provided on the outer side in the X-axis direction (opposite side of the central recess 31) from the engaging protrusion 37.
  • the pin plate 50B is a component made of an insulating elastic resin.
  • the pin plate 50B has a plurality of probe insertion portions 54 at the bottom of the central recess 53, and has a positioning protrusion 59 that fits with the positioning portion 33B at the outer peripheral portion of the central recess 53.
  • the pin plate 50B has tongue-shaped extending portions 57 formed on the X-axis plus side and the X-axis minus side on the outer peripheral portion of the central recess 53, and a claw-shaped engaging hook portion 57B is provided at the tip thereof. There is.
  • Assembling the pin plate 50B to the pin block 30B is realized by fitting the positioning protrusion 59 into the positioning portion 33B and pressing the pin plate 50B against the pin block 30B.
  • the operator aligns the relative positions of the pin block 30B and the pin plate 50B so that the positioning protrusion 59 fits into the positioning portion 33. Then, the engaging hook portion 57B is abutted against the engaging protrusion portion 37B of the engaging hole 36B.
  • FIG. 17 is a view showing a state when the pin plate 50B is started to be pressed against the pin block 30B, and is an enlarged perspective sectional view around the engaging hook portion 57B and the engaging protrusion portion 37B. Since the operator applies the pressing load from top to bottom (the direction indicated by the thick black arrow F in FIG. 17), the top and bottom in FIG. 17 are opposite to the top and bottom of the socket 10 as shown by the coordinate axes. .. The pin plate 50B is shaded for easy identification.
  • the tip of the engaging hook 57B is provided with a tapered portion 57a whose normal is diagonally upward and outward (diagonally downward and outward during pressing work) and a stepped portion 57b.
  • the tapered portion 57a of the engaging hook portion 57B abuts against the surface of the tapered portion 37b of the engaging protrusion 37B.
  • the base of the engaging hook portion 57B begins to bend due to elasticity, and the state shown in FIG. 17 is obtained.
  • FIG. 18 is an enlarged perspective sectional view around the engaging hook portion 57B and the engaging protrusion portion 37B showing a state in which the pin plate 50B is assembled into the pin block 30B.
  • the vertical direction and shading on the pin plate 50B are the same as in FIG.
  • the stepped portion 57b of the engaging hook portion 57B is caught by the stepped portion 37c of the engaging protrusion portion 37B.
  • the engaging protrusion 37B and the engaging hook 57B function as an engaging portion 60 for engaging the pin block 30B and the pin plate 50B.
  • the operator When removing the pin plate 50B from the pin block 30B, the operator releases the engaging state with the engaging hook portion 57B while tilting the engaging protrusion 37B toward the gap 38. Then, the engaging hook portion 57B may be raised and removed.
  • FIG. 19 is a perspective view showing a configuration example of the pin block 30C and the pin plate 50C in the third embodiment.
  • the pin block 30C and the pin plate 50C are shown in a posture in which the lower surface faces upward.
  • the socket 10 in the third embodiment includes a pin block 30C instead of the pin block 30 of the first embodiment, and a pin plate 50C instead of the pin plate 50 of the first embodiment.
  • the pin block 30C and the pin plate 50C are connected via the press-fit pin 80, but in the state shown in FIG. 19, the pin plate 50C is attached to the pin block 30C, but the press-fit pin 80 is not yet attached.
  • FIG. 20 is a perspective external view showing a configuration example of the press-fit pin 80.
  • the press-fit pin 80 is a component made of an insulating elastic resin.
  • the press-fit pin 80 includes a flange portion 81 at one end of the shaft, and a groove portion 82 along the radial direction at the other end corresponding to the tip of the pin.
  • An annular protrusion 83 along the circumferential direction is formed on the outer periphery of the press-fit pin 80 near the tip of the shaft.
  • the pin block 30C has a plurality of probe insertion portions 32 at the bottom of the central recess 31 like the pin block 30 of the first embodiment and the pin block 30B of the second embodiment (FIG. 19). Then, it is hidden behind the pin plate 50C and cannot be seen).
  • the pin block 30C has a block-side press-fitting hole 90 for press-fitting the press-fitting pin 80 at each position on the X-axis plus side and the X-axis minus side at the outer edge portion of the central recess 31.
  • the pin plate 50C has a plurality of probe insertion portions 54 in the ceiling portion of the central recess 53, similarly to the pin plate 50 of the first embodiment and the pin plate 50B of the second embodiment. In FIG. 19, the central recess 53 is hidden because it is on the back side.
  • the pin plate 50C also has a plate-side press-fitting hole 92 for press-fitting the press-fitting pin 80 at each position on the X-axis plus side and the X-axis minus side at the outer edge portion of the central recess 53.
  • FIG. 21 is an enlarged cross-sectional view showing a connection portion between the block-side press-fitting hole 90 and the plate-side press-fitting hole 92.
  • a positioning portion 91 is provided on the pin plate 50C side of the block-side press-fitting hole 90.
  • the positioning portion 91 is, for example, a convex portion in which the periphery of the opening of the block-side press-fitting hole 90 is projected in an annular shape.
  • a tapered portion 91a whose diameter increases toward the open end (the end on the pin plate 50C side) is formed on the inner surface of the positioning portion 91.
  • the inner diameter of the open end of the tapered portion 91a is set to be larger than the outer diameter of the protrusion 83 of the press-fit pin 80 in the free state.
  • the block-side press-fitting hole 90 has a stepped portion 93 having an inner diameter slightly larger than the outer diameter of the protrusion 83 of the press-fitting pin 80 at an intermediate position of the hole.
  • the plate side press-fit hole 92 has a stepped portion 95.
  • the opening diameter of the step portion 95 and the inner diameter of the large diameter portion are matched with the outer diameter of the flange portion 81 of the press-fit pin 80.
  • the inner diameter of the small diameter portion of the step portion 95 is set so as to realize a fitting functioning as positioning with respect to the outer diameter of the positioning portion 91.
  • FIG. 22 is an enlarged cross-sectional view showing a connection portion between the block-side press-fitting hole 90 and the plate-side press-fitting hole 92, in which the press-fitting pin 80 is press-fitted into the positioned pin block 30C and pin plate 50C. It shows a fixed state.
  • the operator attaches the pin plate 50C to the pin block 30C by covering the positioning portion 91 with the plate-side press-fitting hole 92.
  • the block-side press-fitting hole 90 and the plate-side press-fitting hole 92 are positioned at appropriate relative positions to form continuous holes along the vertical direction.
  • the operator inserts the tip of the press-fit pin 80 having the groove 82 from the plate-side press-fit hole 92 and press-fits it.
  • the press-fit pin 80 is press-fitted while the side portion of the groove portion 82 is elastically deformed and squeezed.
  • the protrusion 83 reaches the step portion 93 of the block-side press-fit hole 90.
  • the drawing deformation of the side portion of the groove portion 82 is loosened, and a part of the elastic deformation generated at the end portion is released.
  • the protrusion 83 engages with the step portion 93, and the press-fit pin 80 press-contacts the inner surface of the block-side press-fit hole 90. This completes the assembly of the pin plate 50C on the pin block 30C.
  • aspects of the present disclosure include a pin block on which a plurality of contact probes are installed, a pin plate that holds the plurality of contact probes together with the pin block, and an engaging portion that engages the pin block and the pin plate.
  • a socket which is equipped with.
  • the engaging portion engages the pin block and the pin plate in a detachable manner.
  • the pin block has a positioning portion for positioning the pin plate, and the engaging portion engages the pin plate positioned by the positioning portion with the pin block.
  • the engaging portion is composed of an engaging hook formed on the pin plate and an engaging protrusion formed on the pin block, and the engaging hook and the engaging protrusion engage with each other.
  • the pin plate is attached to the pin block.
  • the pin plate is at least partially elastic. At least a part of the pin plate has elasticity, and the engagement hook portion and the engagement protrusion are engaged with each other by utilizing the elasticity.
  • the pin plate has an inner region portion provided with through holes through which the plurality of contact probes pass, and an elastic outer region portion including the engaging hook portion.
  • the deflection applied to the engagement is induced in the outer region portion, thereby suppressing the deflection in the inner region portion through which the contact probe is inserted, and the contact probe comes into contact with the pin plate during assembly and an unreasonable force acts. It is possible to prevent such an event as possible, and the assembly accuracy can be improved.
  • the outer region portion has a loop-shaped ear portion connected to the inner region portion.
  • the selvage portion has a linear portion that is an engaging hook portion and a flexible portion that acts on the elasticity, and is connected to the inner region portion via the flexible portion.
  • the outer region portion has a pair of the ear portions sandwiching the inner region portion.
  • the pin block has an engaging claw portion at the tip of the engaging protrusion, and the engaging hook portion is pressed against the engaging claw portion in a state of being in contact with the engaging claw portion. Engage.
  • the engaging claw portion has a tapered portion, and the engaging hook portion moves along the tapered portion by being pressed in a state of being in contact with the tapered portion and engages with the engaging claw portion. It fits.
  • the pin plate has a press-fitting hole, and the engaging portion has a step portion provided in the press-fitting hole and a protrusion formed on the press-fitting pin, and the press-fitting portion is press-fitted into the press-fitting hole.
  • the pin plate is attached to the pin block by engaging the protrusion of the pin with the step portion.
  • the tool used when assembling the socket of this embodiment elastically deforms the elastic portion of the pin plate by applying a load to a predetermined portion of the pin plate to hold the pin plate and release the load. This is a tool for releasing the holding of the pin plate.
  • the tool acts on a force that brings the pair of tips that come into contact with the pair of ears, the pair of handles, and the pair of handles closer to each other as a force that widens the gap between the pair of tips. It includes a fulcrum and an urging portion that urges the pair of handles in a direction that widens the distance between them.
  • the tool further includes a limiting portion that limits the approach distance between the pair of handles.

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Measuring Leads Or Probes (AREA)
PCT/JP2020/041094 2019-11-21 2020-11-02 ソケットおよび工具 Ceased WO2021100449A1 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
US17/777,636 US20230018510A1 (en) 2019-11-21 2020-11-02 Socket and tool
JP2021558264A JPWO2021100449A1 (https=) 2019-11-21 2020-11-02
CN202080080609.8A CN114731019A (zh) 2019-11-21 2020-11-02 插座及工具

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2019210244 2019-11-21
JP2019-210244 2019-11-21

Publications (1)

Publication Number Publication Date
WO2021100449A1 true WO2021100449A1 (ja) 2021-05-27

Family

ID=75980668

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2020/041094 Ceased WO2021100449A1 (ja) 2019-11-21 2020-11-02 ソケットおよび工具

Country Status (5)

Country Link
US (1) US20230018510A1 (https=)
JP (1) JPWO2021100449A1 (https=)
CN (1) CN114731019A (https=)
TW (1) TW202121778A (https=)
WO (1) WO2021100449A1 (https=)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20230018510A1 (en) * 2019-11-21 2023-01-19 Yokowo Co., Ltd. Socket and tool
WO2023007963A1 (ja) * 2021-07-26 2023-02-02 株式会社ヨコオ ソケット、治具、ソケットメンテナンスセット及び分解方法
TWI859603B (zh) * 2021-11-11 2024-10-21 日商歐姆龍股份有限公司 片材以及檢查插座

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI796167B (zh) * 2022-03-16 2023-03-11 四方自動化機械股份有限公司 可精確定位的測試座

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07505255A (ja) * 1992-03-27 1995-06-08 ミネソタ・マイニング・アンド・マニュファクチュアリング・カンパニー 集積回路用テストソケット
JPH11185911A (ja) * 1997-12-22 1999-07-09 Yokowo Co Ltd Ｉｃパッケージ測定用ソケット
JP2011214591A (ja) * 2010-03-31 2011-10-27 Inaba Denki Sangyo Co Ltd 重合部材の締結構造

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4460223A (en) * 1981-12-30 1984-07-17 Methode Electronics, Inc. Cover for chip carrier socket
US5469074A (en) * 1994-02-08 1995-11-21 The Whitaker Corporation Chip socket testing apparatus with adjustable contact force
KR100402448B1 (ko) * 1994-04-07 2003-10-22 가부시끼가이샤 엠푸라스 소켓 조립체
US20020004320A1 (en) * 1995-05-26 2002-01-10 David V. Pedersen Attaratus for socketably receiving interconnection elements of an electronic component
JPH09180846A (ja) * 1995-12-14 1997-07-11 Minnesota Mining & Mfg Co <3M> 集積回路試験用ソケット
US5647756A (en) * 1995-12-19 1997-07-15 Minnesota Mining And Manufacturing Integrated circuit test socket having toggle clamp lid
US5788526A (en) * 1996-07-17 1998-08-04 Minnesota Mining And Manufacturing Company Integrated circuit test socket having compliant lid and mechanical advantage latch
KR100470627B1 (ko) * 1997-12-29 2005-04-06 삼성전자주식회사 Dc 테스트 장치의 dc 접촉 베이스 및 dc 테스트부
AU4503000A (en) * 1999-05-04 2000-11-17 Wells-Cti, Inc. Chip carrier socket
US6297654B1 (en) * 1999-07-14 2001-10-02 Cerprobe Corporation Test socket and method for testing an IC device in a dead bug orientation
US6353329B1 (en) * 2000-03-14 2002-03-05 3M Innovative Properties Company Integrated circuit test socket lid assembly
US7400161B2 (en) * 2002-07-30 2008-07-15 Advantest Corporation Electronic device test system
JP4471941B2 (ja) * 2005-03-10 2010-06-02 山一電機株式会社 半導体装置用ソケット
JP4598614B2 (ja) * 2005-06-30 2010-12-15 富士通株式会社 ソケット及び電子機器
US20070103179A1 (en) * 2005-11-10 2007-05-10 Silicon Integrated Systems Corp. Socket base adaptable to a load board for testing ic
JP2010003511A (ja) * 2008-06-19 2010-01-07 Yokowo Co Ltd Ｉｃパッケージ検査用ソケット
US8979564B2 (en) * 2013-03-15 2015-03-17 Data I/O Corporation Socket having a pin plate with a port aligned with a dimple in a pocket of a base plate
JP6480798B2 (ja) * 2015-04-23 2019-03-13 株式会社ヨコオ ソケット
JP2018535418A (ja) * 2015-11-25 2018-11-29 フォームファクター， インコーポレイテッド テストソケットのための浮動入れ子
KR101780935B1 (ko) * 2016-03-30 2017-09-27 리노공업주식회사 검사소켓유니트
KR101887071B1 (ko) * 2016-09-01 2018-09-10 리노공업주식회사 검사장치의 슬라이더 조작기구
CN106483343A (zh) * 2016-11-03 2017-03-08 苏州创瑞机电科技有限公司 带加热功能的手动直针测试插座
US10473713B2 (en) * 2017-10-26 2019-11-12 Xilinx, Inc. Interposer block with retractable spring pin top cover plate
JP7091294B2 (ja) * 2019-08-30 2022-06-27 シャープ株式会社 テストソケット及びその製造方法
WO2021100449A1 (ja) * 2019-11-21 2021-05-27 株式会社ヨコオ ソケットおよび工具
US20220244291A1 (en) * 2022-04-25 2022-08-04 Ismael Franco Shielded fine-pitch high-performance impedance tunable interconnect
CN115459025B (zh) * 2022-10-26 2025-07-04 中船九江精达科技股份有限公司 一种圆感应同步器引出线接线方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07505255A (ja) * 1992-03-27 1995-06-08 ミネソタ・マイニング・アンド・マニュファクチュアリング・カンパニー 集積回路用テストソケット
JPH11185911A (ja) * 1997-12-22 1999-07-09 Yokowo Co Ltd Ｉｃパッケージ測定用ソケット
JP2011214591A (ja) * 2010-03-31 2011-10-27 Inaba Denki Sangyo Co Ltd 重合部材の締結構造

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20230018510A1 (en) * 2019-11-21 2023-01-19 Yokowo Co., Ltd. Socket and tool
WO2023007963A1 (ja) * 2021-07-26 2023-02-02 株式会社ヨコオ ソケット、治具、ソケットメンテナンスセット及び分解方法
JP2023017269A (ja) * 2021-07-26 2023-02-07 株式会社ヨコオ ソケット、治具、ソケットメンテナンスセット及び分解方法
JP7716919B2 (ja) 2021-07-26 2025-08-01 株式会社ヨコオ ソケット、治具、ソケットメンテナンスセット及び分解方法
TWI859603B (zh) * 2021-11-11 2024-10-21 日商歐姆龍股份有限公司 片材以及檢查插座

Also Published As

Publication number Publication date
JPWO2021100449A1 (https=) 2021-05-27
CN114731019A (zh) 2022-07-08
US20230018510A1 (en) 2023-01-19
TW202121778A (zh) 2021-06-01

Similar Documents

Publication Publication Date Title
WO2021100449A1 (ja) ソケットおよび工具
JP6572697B2 (ja) ソケット
JP2017059362A (ja) ソケット
WO2021029189A1 (ja) 雌端子
CN107689524A (zh) 连接器部件和连接器
CN107689518A (zh) 连接器部件和连接器
JPH09146321A (ja) 電子機器等のフレーム構造
CN101685924A (zh) 连接器用外壳
JP5567523B2 (ja) 接続ピン
JP2005123048A (ja) 接続端子及び該接続端子を用いるジョイントコネクタ
JP6186617B2 (ja) 光コネクタ
WO2023106057A1 (ja) 端子
JPH0960617A (ja) アルミ板と板金の結合部材及び結合方法
CN114810776A (zh) 固定结构
JP4261293B2 (ja) 固定具
JPH10293150A (ja) 電気部品用ソケット
JPH08162198A (ja) 基板用コネクタ
JP2003068419A (ja) 基板用コネクタ及び基板用コネクタの端子圧入用治具
CN221305181U (zh) 适配器
US20240291188A1 (en) Connection terminal
CN107689513A (zh) 连接器部件和连接器
JP5142688B2 (ja) クリップ
JPH0342637Y2 (https=)
JPH08121430A (ja) 部品組み付け構造
JP2009050862A (ja) 金属部材の接合構造，金属部材の接合に使用されるパンチ部材および固定構造，金属部材の接合方法

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 20891039

Country of ref document: EP

Kind code of ref document: A1

ENP Entry into the national phase

Ref document number: 2021558264

Country of ref document: JP

Kind code of ref document: A

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 20891039

Country of ref document: EP

Kind code of ref document: A1