WO2021093278A1 - 一种光谱-质谱联用装置及检测方法 - Google Patents

一种光谱-质谱联用装置及检测方法 Download PDF

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WO2021093278A1
WO2021093278A1 PCT/CN2020/087641 CN2020087641W WO2021093278A1 WO 2021093278 A1 WO2021093278 A1 WO 2021093278A1 CN 2020087641 W CN2020087641 W CN 2020087641W WO 2021093278 A1 WO2021093278 A1 WO 2021093278A1
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mass
mass spectrometry
analysis module
mixed gas
spectrum
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PCT/CN2020/087641
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French (fr)
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胡雪蛟
刘胜
向柳
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无锡米字科技有限公司
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers

Definitions

  • the invention relates to the field of gas analysis, in particular to a spectrum-mass spectrometry combined device and a detection method.
  • the commonly used mixed gas analysis methods include chromatography, spectroscopy and mass spectrometry.
  • Chromatography means "gas chromatography (GC)" for gas analysis.
  • the analysis process is to use a carrier gas to send a small amount of sample gas into a porous body called a chromatographic column, and use the difference in the diffusion speed of different component gases in the chromatographic column to realize the separation of the mixed gas, and finally achieve the gas analysis the goal of.
  • This is the current mainstream method of gas analysis, which is relatively mature and has relatively high accuracy.
  • the analysis cycle of this method is relatively long, and the response speed is slow during online measurement.
  • the carrier gas needs to be continuously consumed during the analysis process, and the chromatographic column needs to be replaced frequently. The operation is complicated, the operating environment is harsh, and the cost of use and maintenance is relatively high.
  • Spectroscopy is a gas analysis method that has developed rapidly in recent years.
  • the analysis is to determine the concentration of the gas to be measured by the absorption intensity of the gas to be measured at a specific characteristic absorption frequency. It has the advantages of fast analysis speed, non-contact measurement, simple use and maintenance, and with the development of semiconductor lasers, the price is also It is relatively inexpensive, so it has formed a trend to replace chromatography and other analytical methods in many occasions.
  • laser absorption spectroscopy usually has a single component for online detection, and when the mixed gas is more complex, there is a problem of cross-effects of different gases on the measurement results, and the accuracy is difficult to follow.
  • the chromatogram is comparable.
  • Mass spectrometry achieves the separation of gas components by ionizing gases and using different masses of charged ions in the electromagnetic field to move differently. This method can analyze almost infinite components at the same time, and the analysis speed is fast, the accuracy is high, and the use is relatively simple. However, what is directly obtained by this method is the relative proportion of each component, and it is difficult to obtain the absolute concentration of the component gas.
  • One of the ways to solve these problems is "chromatography-mass spectrometry (GC-MS)", but due to the use of chromatography, the analysis speed is greatly reduced, and the cost of use and maintenance is significantly increased. In addition, mass spectrometry has no way to distinguish gas components with the same or similar mass-to-charge ratios (such as CO and N 2 ).
  • the present invention provides a spectrometer-mass spectrometer combined device and detection method, which adopts the following technical solutions:
  • a spectrum-mass spectrometer combination device which includes a spectrum analysis module and a mass spectrum analysis module that are connected to each other.
  • the working negative pressure of the mass spectrum analysis module provides a vacuum environment for the spectrum analysis of the spectrum analysis module; a multi-component mixed gas passes through
  • the spectral analysis module performs spectral analysis to obtain the absolute concentration of a part of the components in the multi-component mixed gas sample, and then performs mass spectrometry on the multi-component mixed gas sample output from the spectral analysis module through the mass spectrometry module, To obtain the relative concentration of the component to be tested in the mixed gas sample.
  • the vacuum degree of the mass spectrometry module is lower than the vacuum degree of the spectrum analysis module.
  • the spectrum analysis module includes a spectrum analysis room and a spectrum analyzer connected to the spectrum analysis room, and the spectrum analysis room has a first access An air port and a first air outlet, the first air outlet is in communication with the mass spectrometry analysis module, so as to realize the vacuum environment for the spectrum analysis chamber through the working negative pressure of the mass spectrometry analysis module.
  • the spectrum analyzer is a TDLAS laser analyzer.
  • the mass spectrometry module includes a vacuum system and an ion source, a mass analyzer, and a detector connected in sequence, and the vacuum system is the ion source , The mass analyzer and the detector provide vacuum negative pressure required for work; the first air outlet is in communication with the second air inlet of the ion source.
  • a regulating valve is added to the passage between the first air outlet and the second air inlet, so as to realize the adjustment and control of the gas flow rate. State the pressure of the spectral analysis chamber.
  • the vacuum system includes a fore-stage pump and a post-stage pump, and one end of the inlet of the fore-stage pump is connected with the ion source to ensure that the ion source
  • the working vacuum reaches 10 -4 ⁇ 10 -5 Pa
  • the other end of the inlet is connected with the outlet of the post-stage pump
  • the inlet of the post-stage pump is connected with the mass analyzer and detector to ensure that the mass analyzer and
  • the working vacuum of the detector reaches 10 -5 ⁇ 10 -6 Pa.
  • a method for detecting multi-component mixed gas by spectroscopy and mass spectrometry includes the following steps: a multi-component mixed gas sample is first subjected to spectral analysis through a spectrum analysis module to obtain a part of the multi-component mixed gas sample.
  • the working negative pressure of the mass spectrum analysis module provides a vacuum environment for the spectrum analysis of the spectrum analysis module; the mixed gas sample after passing through the spectrum analysis module enters the mass analysis module for mass spectrometry analysis to obtain the mixed gas
  • the relative concentration of the component to be measured in the sample then, based on the absolute concentration of a component obtained by spectral analysis, the absolute concentration of each component is calculated according to the relative concentration of each component obtained by mass spectrometry; wherein, the A component is one of the components obtained by mass spectrometry.
  • a part of the components in the mixed gas are CH 4 , H 2 S, and CO 2 ; or, in the mixed gas Part of the components are CH 4 , CO and CO 2 .
  • the multi-component mixed gas is any one of petrochemical gas, natural gas gas and metallurgical industry gas.
  • the present invention has the following beneficial effects:
  • the spectrometer-mass spectrometer combined device provided by the invention can realize fast and convenient real-time online analysis of all components of mixed gas with higher precision (PPM ⁇ PPB level trace analysis) and high resolution (not interfered by background gas and impurities) Concentration, easy to use at the same time, no consumables, maintenance-free, long-term stable operation.
  • spectroscopy and mass spectrometry are combined for detection, and spectroscopy and mass spectrometry have a synergistic effect.
  • spectroscopy has three effects on mass spectrometry. One is to provide an absolute concentration standard for mass spectrometry; and the other is to distinguish quality.
  • Gas components with the same or similar charge ratios (such as CO and N 2 ) can be understood as conventional mass spectrometry analysis that is difficult to distinguish gas components with the same or similar mass-to-charge ratios.
  • the present invention can pass the concentration of the same or similar gas components Obtained by spectral analysis; the third is to realize the analysis of small molecules (molecular weight less than 40) components, and solve the problem that small molecular components cannot be applied to mass spectrometry.
  • Mass spectrometry is to ionize the molecules, but the mass is too small.
  • the molecular gas is deflected by the influence of the magnetic field before being detected by the detector, so the molecules are too small for mass spectrometry analysis.
  • Mass spectrometry also has two effects on spectroscopy.
  • the first is to provide a vacuum environment for spectroscopy through the working negative pressure of mass spectroscopy, that is, the external exhaust after spectroscopy is negative pressure, which reduces the broadening of spectral signals and improves the resolution of spectroscopy.
  • the gas spectrums originally combined can be independent of each other under vacuum, which provides conditions for realizing a laser wavelength to accurately detect the concentration of multi-component gases, and also avoids or reduces cross-interference of multi-component spectra, and further improves Analysis accuracy; the second is to achieve high-precision full-component analysis.
  • the combined device of the present invention can realize high-precision full-component analysis. Detect defects that cause a long inspection cycle (an analysis cycle is usually 5-10 minutes) and defects that significantly increase the cost of use and maintenance.
  • the combined device of the present invention has a fast analysis speed, and an analysis cycle can be completed within 1 second. Simple without special maintenance, no consumables (consumables for chromatography), and low operating cost.
  • Figure 1 is a schematic diagram of a spectrometer-mass spectrometer combined device of the present invention
  • Figure 2 is a schematic diagram of the connection of the spectrometer-mass spectrometer combined device of the present invention
  • FIG. 3 is a spectrum diagram of H 2 S/CO 2 /CH 4 obtained when the pressure of the spectrum analysis chamber of the laser absorption spectroscopy in the present invention is at normal pressure;
  • Fig. 4 is a spectrum diagram of H 2 S/CO 2 /CH 4 obtained when the pressure of the spectrum analysis chamber of the laser absorption spectroscopy in the present invention is 0.2 atm.
  • first and second are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features. Therefore, the features defined with “first” and “second” may explicitly or implicitly include at least one of the features. In the description of the present invention, “plurality” means at least two, such as two, three, etc., unless otherwise specifically defined.
  • the terms “installed”, “connected”, “connected”, “fixed” and other terms should be understood in a broad sense, for example, it can be a fixed connection or a detachable connection. , Or integrated; it can be mechanically connected, or it can be electrically connected or can communicate with each other; it can be directly connected, or indirectly connected through an intermediate medium, it can be the internal communication of two components or the interaction relationship between two components, Unless otherwise clearly defined.
  • the specific meanings of the above-mentioned terms in the present invention can be understood according to specific situations.
  • the present invention proposes a spectrum-mass spectrometry device, which includes a spectrum analysis module 1 and a mass spectrum analysis module 2 that are connected to each other.
  • the working negative pressure of the mass spectrum analysis module 2 provides a vacuum environment for the spectrum analysis of the spectrum analysis module 1; the multi-component mixed gas is subjected to spectral analysis through the spectrum analysis module to obtain a part of the multi-component mixed gas sample The absolute concentration of the component is then subjected to mass spectrometry on the multi-component mixed gas sample output from the spectral analysis module through the mass spectrometry analysis module to obtain the relative concentration of the component to be measured in the mixed gas sample.
  • the spectrum analysis module 1 includes a spectrum analysis chamber 11 having a first air inlet 12 and a first air outlet 13, and a spectrum analyzer connected to the spectrum analysis chamber 11; preferably, but not limited to, the The spectrum analyzer is a TDLAS laser analyzer, or other spectrum analyzers.
  • the TDLAS laser analyzer includes a laser 14 for emitting laser signals and a detector 15 for receiving laser signals scattered by gas particles.
  • the mass spectrometry module 2 includes a vacuum system and an ion source 21, a mass analyzer 23, and a detector 24 that are sequentially connected.
  • the vacuum system provides the ion source 21, the mass analyzer 23, and the detector 24 with all necessary work. Vacuum negative pressure, the ion source 21 is used to convert gas molecules into ions, the mass analyzer 23 is used to separate the gas sample ions according to the mass-to-charge ratio m/z, and the detector 24 is used to detect and record ions The intensity of the flow.
  • the vacuum system includes a fore pump 25 and a post pump 26. One end of the inlet of the fore pump 25 is connected to the ion source 21 to ensure that the working vacuum of the ion source reaches 10 -4 to 10 -5 Pa.
  • the other end is connected to the outlet of the post-stage pump 26, and the inlet of the post-stage pump 26 is connected to the mass analyzer 23 and the detector 24 to ensure that the working vacuum of the mass analyzer and detector reaches 10 -5 ⁇ 10 -6 Pa.
  • the front pump 25 is generally a mechanical pump (such as a rotary oil-sealed pump, etc.), and the rear pump 26 is generally a high vacuum pump (such as an oil diffusion pump, a mercury diffusion pump, a sputter ion pump, a turbo molecular pump, etc.).
  • the mechanical pump is used as the backing pump 25 to provide the backing vacuum required for the normal operation of the high vacuum pump, so that the high vacuum pump can reach and maintain the vacuum negative pressure of 10 -4 Pa ⁇ 10 -6 Pa required for the normal operation of the mass spectrometry analysis.
  • the ion source 21 of the mass spectrometry module 2 is pre-evacuated.
  • the second air inlet 211 of the ion source 21 communicates with the first air outlet 13 of the spectrum analysis chamber 11.
  • the spectrum analysis chamber 11 is also evacuated at the same time.
  • the analysis provides a vacuum environment, that is, the pressure of the first air outlet 13 is negative pressure, so the vacuum degree of the mass spectrum analysis work of the mass spectrometry module 2 is lower than the vacuum degree of the spectrum analysis work of the spectrum analysis module 1.
  • the working negative pressure of mass spectrometry provides a vacuum environment for spectroscopy, that is, the external exhaust after spectroscopy is negative pressure, which reduces the broadening of the spectrum signal, improves the resolution of spectroscopy, and the vacuum state of the gas spectrum that is originally combined It can be independent of each other and does not overlap each other, which provides conditions for realizing a laser wavelength to accurately detect the concentration of multi-component gases, and also avoids or reduces cross-interference of multi-component spectra, so that spectral analysis is not interfered by background gases and impurities , To further improve the accuracy of analysis.
  • a regulating valve is additionally provided in the passage between the first air outlet and the second air inlet to adjust the pressure of the spectrum analysis chamber through gas flow adjustment control.
  • the ion source 21 includes an ion generator 212 and an ion focus device 213, the ion focus device 213 is located between the ion generator 212 and the mass analyzer 23, and the ion generator 212 passes through the The gas sample after the spectral analysis chamber 11 is ionized and then enters the ion focus device 213 to focus the ionized sample into the mass analyzer.
  • the ion generator 212 is preferably but not limited to an aerodynamic auxiliary ionization source, and may also be an ion bombardment ionization source, a chemical ionization source or a field ionization source.
  • an ion transmission device 22 is also provided between the mass analyzer 23 and the ion focuser 213, wherein the ion transmission device 22 is preferably but not limited to an ion mobility spectrometer, and the mass analyzer 23 You can choose a magnetic analyzer, a time-of-flight (TOF) analyzer, a quadrupole analyzer, or an ion trap analyzer, etc.
  • TOF time-of-flight
  • the specific implementation of the spectroscopic analysis module 1 and the mass spectrometric analysis module 2 of the above-mentioned device may have various changes, which are not particularly limited.
  • the gas sample can pass through the spectroscopy module first. Perform spectroscopic analysis, and then ionize the ion source to obtain ionized samples and then perform mass spectrometry detection.
  • the specific arrangement of the above-mentioned device is not particularly limited. That is, in application, the spectrum analysis module 1 can be placed horizontally or vertically.
  • Those skilled in the art can set the specific setting mode of the above device according to actual needs, as long as the various components of the device meet the above-described relative position relationship.
  • the spectrometer-mass spectrometer combined device provided by the invention can realize fast and convenient real-time online analysis of all components of mixed gas with higher precision (PPM ⁇ PPB level trace analysis) and high resolution (not interfered by background gas and impurities) Concentration, easy to use at the same time, no consumables, maintenance-free, long-term stable operation.
  • spectroscopy and mass spectrometry are combined for detection, and spectroscopy and mass spectrometry have a synergistic effect.
  • spectroscopy has three effects on mass spectrometry. One is to provide an absolute concentration standard for mass spectrometry; and the other is to distinguish quality.
  • Gas components with the same or similar charge ratios (such as CO and N 2 ) can be understood as conventional mass spectrometry analysis that is difficult to distinguish gas components with the same or similar mass-to-charge ratios.
  • the present invention can pass the concentration of the same or similar gas components Obtained by spectral analysis; the third is to realize the analysis of small molecules (molecular weight less than 40) components, and solve the problem that small molecular components cannot be applied to mass spectrometry.
  • Mass spectrometry is to ionize the molecules, but the mass is too small.
  • the molecular gas is deflected by the influence of the magnetic field before being detected by the detector 24, so the molecules are too small to be analyzed by mass spectrometry.
  • Mass spectrometry also has two effects on spectroscopy.
  • the first is to provide a vacuum environment for spectroscopy, that is, after spectroscopy, the external exhaust is negative pressure, which reduces the broadening of spectral signals, improves the resolution of spectroscopy, and avoids or reduces multi-component spectra.
  • the cross-interference is improved, and the analysis accuracy is improved; the second is to achieve high-precision full-component analysis.
  • a part of the gas components that can be detected by spectral analysis overlaps with at least one of the components of the gas to be detected that can be detected by mass spectrometry.
  • Mass spectrometry analysis can obtain the value of the components to be tested in the multi-component mixed gas The relative concentration is based on the absolute concentration of the overlapping component obtained in the spectral analysis (the absolute concentration of the component is the same because of the same gas sample), and then the absolute concentration of the component to be measured is obtained.
  • Spectral analysis obtains the absolute concentration of a part of the gas components
  • mass spectrometry analysis obtains the absolute concentration of another part of the gas components to complete the full-component analysis.
  • the combined device of the present invention can realize high-precision full-component analysis. Compared with the existing mass spectrometry method, the trace gas needs to be added quantitatively. The combined device also does not need to add additional quantitative tracking gas for concentration calibration. Compared with the existing chromatographic method, the chromatographic-mass spectrometry method causes the long detection cycle (an analysis cycle is usually 5-10 minutes) defects and usage due to the existence of chromatograms. In addition to the disadvantages that the cost of maintenance is significantly increased, the combined device of the present invention has a fast analysis speed, an analysis cycle can be completed within 1 second, and has a simple structure without special maintenance, no consumables, and low operating cost.
  • the present invention proposes the application of the aforementioned spectrometer-mass spectrometry device in the detection of multi-component mixed gases.
  • the multi-component mixed gas is any one of petrochemical gas, natural gas gas and metallurgical industry gas.
  • the multi-component mixed gas is any one of converter gas in the metallurgical industry, natural gas, and coke oven gas in the petrochemical industry, but is not limited thereto.
  • the device with the above-mentioned advantages can be used for multi-component mixed gas sample detection.
  • the features and advantages of the device for gas sample detection have been described in detail above and will not be repeated here.
  • the present invention proposes a method for detecting multi-component mixed gas by combining spectroscopy and mass spectrometry.
  • the detection method includes the following steps: pre-processing the multi-component mixed gas, and then removing the pre-processed gas.
  • the multi-component mixed gas sample first passes through the spectral analysis module 1 for spectral analysis to obtain the absolute concentration of a part of the component in the multi-component mixed gas sample; the mixed gas sample after passing through the spectral analysis module 1 enters the mass spectrometry module 2 for Mass spectrometry analysis to obtain the relative concentration of the component to be tested in the mixed gas sample; then, based on the absolute concentration of a component obtained by spectral analysis, the relative concentration of each component obtained by the mass spectrometry analysis is calculated to obtain the relative concentration of each component Absolute concentration; wherein the one component is one of the components obtained by mass spectrometry analysis; wherein the working negative pressure of the mass spectrometry module 2 provides a vacuum environment for the spectral analysis of the spectrum analysis module 1 .
  • a part of the components in the mixed gas may be composed of CH 4 , H 2 S, and CO 2 , or composed of CH 4 , CO, and CO 2 , and so on.
  • the existing pretreatment method may include removing dust particles, removing water and oil, and cooling and heating. , Steady current and voltage stabilization measures.
  • this method is a method of detecting a multi-component mixed gas sample using the spectro-mass spectrometer combined device described above.
  • the features and advantages of using this device for gas sample detection have been described in detail above, and will not be repeated here.
  • the following uses natural gas as an example of a multi-component mixed gas sample to further illustrate the detection method using the above-mentioned spectro-mass spectrometry device.
  • the detection method by the combination of spectroscopy and mass spectrometry of the present invention specifically includes the following steps:
  • Step 1 After pre-processing the natural gas, enter the spectrum analysis room through the first air inlet, first use laser absorption spectroscopy to analyze the H 2 S/CO 2 /CH 4 in the sample gas with a laser with a center wavelength of 1572 nm , To obtain the absolute concentration of H 2 S/CO 2 /CH 4.
  • the algorithm for obtaining the absolute concentration of the gas components according to the spectrogram uses an existing algorithm, such as a harmonic height algorithm or a linear fitting algorithm.
  • the present invention does not improve this algorithm, so it will not be described in detail here.
  • the above 0.2 atm is only an example under a certain vacuum state, and the present invention does not specifically limit the pressure of the spectrum analysis chamber. In specific implementation, it is sufficient to ensure the vacuum negative pressure required for the operation of the mass spectrometry module.
  • the above-mentioned pretreatment is a conventional pretreatment method before industrial gas analysis, and the present invention does not limit it, so it will not be repeated here.
  • Step 2 After spectral analysis, the gas sample is transported through the first gas outlet to the second gas inlet of the ion source.
  • the gas sample is ionized by the ion generator to obtain an ionized sample, which is then focused by the ion focuser into Quality analyzer.
  • the above gas samples are not all gas samples ionized by the ion generator.
  • the ion generator only ionizes a part of the gas samples, and most of the gas is pumped out by the mechanical pump connected to the ion source , But does not affect the subsequent mass spectrometry analysis.
  • Step 3 The mass analyzer and detector perform mass spectrometry on the ionized sample to obtain the relative concentration of the component to be tested in the mixed gas sample. That is, the relative concentration of the component to be measured in the gas sample is analyzed according to the mass-to-charge ratio.
  • Step 4 Calculate the absolute concentration of C2 to C6+ components in natural gas based on the absolute concentration of carbon dioxide components obtained by spectral analysis and the relative concentration of each component obtained by mass spectrometry.
  • C1 methane
  • C2 ethane
  • propane C3
  • butane C4
  • pentane C5
  • hexane C6
  • nitrogen carbon dioxide
  • hydrogen sulfide Wait a general term for C6, C7 (heptane), and C8 (octane).
  • mass spectrometry analysis shows that the relative concentration of CO 2 is 1, the relative concentration of C2 is 1.2, and the relative concentration of C3 is 0.5.
  • Relative concentration refers to the relative ratio, not the true concentration.
  • Step 5 Calculate physical parameters such as calorific value and compressibility factor based on the percentage of combustible components C1 to C6+.
  • Step 6 Input the physical parameters obtained in step 5 into the flow/calorific value computer, and the flow signal measured by the flowmeter, as well as real-time gas, temperature and other information, to measure the accumulated calorific value of natural gas.

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Abstract

一种光谱-质谱联用装置及其检测方法，该光谱-质谱联用装置包括相互连通的光谱分析模块（1）和质谱分析模块（2），质谱分析模块（2）的工作负压为光谱分析模块（1）的光谱分析提供真空环境；多组分混合气体通过光谱分析模块（1）进行光谱分析，以获得多组分混合气体样品中的一部分组分的绝对浓度，再通过质谱分析模块（2）对从光谱分析模块（1）输出的多组分混合气体样品进行质谱分析，以获得混合气体样品中待测组分的相对浓度。该光谱-质谱联用装置可进行PPM~PPB级别痕量分析、且不受背景气体和杂质干扰，以较高的精度和高分辨率实时在线分析混合气体全部组分的浓度，使用便捷、无耗材、免维护、保持长期稳定运行。

Description

一种光谱-质谱联用装置及检测方法 【技术领域】
本发明涉及气体分析领域，具体涉及一种光谱-质谱联用装置及检测方法。
【背景技术】
在石油化工、天然气、冶金等行业气体在线或离线分析中，常用的混合气体分析方法有色谱法、光谱法和质谱法。
色谱法，对于气体分析即“气相色谱法(GC)”。其分析过程是用载气把少量样气送入一种被称之为色谱柱的多孔体，利用不同组分气体在色谱柱里扩散速度的不同，实现混合气体的分离，并最终达到气体分析的目的。这是目前气体分析的主流方法，发展比较成熟，精度也比较高。但是，这种方法分析周期比较长，在线测量时反应速度慢。而且分析过程中需要不断消耗载气，色谱柱也需要经常更换，操作复杂、操作环境严苛，使用和维护的成本都比较高。
光谱法，特别是可调谐激光吸收光谱法(TDLAS)，是近年来发展比较快的气体分析方法。其分析是利用待测气体在特定的特征吸收频率吸收的强度来确定待测气体的浓度，具有分析速度快，非接触测量，使用和维护简单等优势，而且随着半导体激光器的发展，价格也相对比较低廉，因此在很多场合形成了替代色谱等分析手段的趋势。但是激光吸收光谱法由于激光单色性的限制，在线检测的组分往往比较单一，而且在混合气体比较复杂的时候，存在着不同气体对测量结果交叉影响的问题，精度也很难做到跟色谱相当。
质谱法(MS)是通过把气体离子化，利用不同质量的带电离子在电磁场中的运动不同，实现气体组分的分离。该方法可以同时分析几乎无穷多的组分，而且分析速度快，精度高，使用也比较简单。但是用该方法直接获得的是各组分的相对比例，很难获得组分气体的绝对浓度。解决这些问题的方法之一就是“色谱-质谱联用(GC-MS)”，但是由于使用色谱的原因，使得分析速度大为降低，使用和维护的成本显著增加。另外质谱对于质荷比相同或者相近的气体组分(比如CO和N 2)，是没有办法区分的。
【发明内容】
基于此，有必要针对上述技术问题，提供了一种光谱-质谱联用装置及检测方法，以较高的精度和分辨率实现快速便捷地分析混合气体全部组分的浓度。
为了解决上述技术问题，本发明提供一种光谱-质谱联用装置及检测方法，采用了如下所述的技术方案：
一种光谱-质谱联用装置，其包括相互连通的光谱分析模块和质谱分析模块，所述质谱分析模块的工作负压为所述光谱分析模块的光谱分析提供真空环境；多组分混合气体通过所述光谱分析模块进行光谱分析，以获得多组分混合气体样品中的一部分组分的绝对浓度，再通过所述质谱分析模块对从光谱分析模块输出的多组分混合气体样品进行质谱分析，以获得混合气体样品中待测组分的相对浓度。
作为本发明提供的所述的光谱-质谱联用装置的一种改进，所述质谱分析模块的真空度低于所述光谱分析模块的真空度。
作为本发明提供的所述的光谱-质谱联用装置的一种改进，所述光谱分析模块包括光谱分析室和与所述光谱分析室相连的光谱分析器，所述光谱分析室具有第一进气口和第一出气口，所述第一出气口与所述质谱分析模块连通，以实现通过所述质谱分析模块的工作负压为所述光谱分析室提供真空环境。
作为本发明提供的所述的光谱-质谱联用装置的一种改进，所述光谱分析器为TDLAS激光分析器。
作为本发明提供的所述的光谱-质谱联用装置的一种改进，所述质谱分析模块包括真空系统和依次连接的离子源、质量分析器与检测器，所述真空系统为所述离子源、质量分析器和检测器提供工作所需的真空负压；所述第一出气口与所述离子源的第二进气口连通。
作为本发明提供的所述的光谱-质谱联用装置的一种改进，所述第一出气口和第二进气口之间的通路上增设有调节阀，以通过气体流量调节控制实现调节所述光谱分析室的压力。
作为本发明提供的所述的光谱-质谱联用装置的一种改进，所述真空系统包括前级泵和后级泵，所述前级泵进口的一端与所述离子源连接以保证离子源工作真空度达到10 -4～10 -5Pa，进口的另一端与所述后级泵的出口连接，所述后级泵进口均与所述质量分析器和检测器连接以保证质量分析器和检测器的工作真空度达到10 -5～10 -6Pa。
一种光谱-质谱联用检测多组分混合气体的方法，该检测方法包括以下步骤：多组分混合气体样品首先经过光谱分析模块进行光谱分析，以获得多组分混合气体样品中的一部分组分的绝对浓度，其中，所述质谱分析模块的工作负压为所述光谱分析模块的光谱分析提供真空环境；经过光谱分析模块之后的混合气体样品进入质谱分析模块进行质谱分析，以获得混合气体样品中待测组分的相对浓度；然后，以光谱分析得到的一个组分的绝对浓度为基准，根据质谱分析得到的各组分相对浓度，计算得到各组分的绝对浓度；其中，所述一个组分为质谱分析得到的各组分中的一种组分。
作为本发明提供的所述的光谱-质谱联用检测气体样品的方法的一种改进，所述混合气体中的一部分组分为CH 4、H 2S和CO 2；或者，所述混合气体中的一部分组分为CH 4、CO和CO 2。
作为本发明提供的所述的光谱-质谱联用检测气体样品的方法的一种改进，所述多组分混合气体为石油化工气体、天然气气体和冶金行业气体中的任一种。
有益效果
与现有技术相比，本发明有以下有益效果：
本发明提供的光谱-质谱联用装置可以以较高的精度(PPM～PPB级别痕量分析)和高分辨率(不受背景气体和杂质干扰)实现快速便捷地实时在线分析混合气体全部组分的浓度，同时使用便捷，无耗材，免维护，长期稳定运行。
本发明通过将光谱法和质谱法进行联用检测，光谱法和质谱法相互协同作用，其中：光谱分析对质谱分析的作用有三，其一为质谱分析提供绝对浓度的基准；其二为区分质荷比相同或者相近的气体组分(如CO和N 2)，可以理解为常规质谱分析难以区分质荷比相同或者相近的气体组分，本发明可将相同或 者相近的气体组分的浓度通过光谱分析获得；其三为实现小分子(分子量低于40)组分的分析，解决小分子组分无法适用质谱分析的问题，质谱分析是把分子离子化后打出去，但是质量太轻的小分子气体，刚打出去还没有被检测器检测到就受磁场影响偏转了，所以分子太小不适合用质谱分析。质谱分析对光谱分析的作用也有二，其一为通过质谱分析的工作负压为光谱分析提供真空环境，即光谱分析后对外排气为负压，进而减少光谱信号的展宽，提高光谱分析的分辨率，再者本来糅合在一起的气体光谱真空状态下能够互相独立开，为实现一种激光波长准确检测多组分气体浓度提供了条件，也避免或者减少多组分光谱的交叉干扰，进一步提高分析精度；其二为实现高精度全组分分析。
相比现有激光吸收光谱法通常只能分析单一组分的缺陷而本发明联用装置可实现高精度的全组分分析，相比现有色谱法、色谱-质谱联用中由于存在色谱法检测造成检测周期漫长(一个分析周期通常5-10分钟)的缺陷以及使用和维护的成本显著增加的缺陷而本发明联用装置分析速度快，一个分析周期可以在1秒之内完成，同时结构简单无需专门维护，无耗材(色谱法有耗材)，运行成本低。
【附图说明】
为了更清楚地说明本申请或现有技术中的方案，下面将对实施例或现有技术描述中所需要使用的附图作一个简单介绍，显而易见地，下面描述中的附图是本申请的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以根据这些附图获得其他的附图。
图1为本发明光谱-质谱联用装置的示意图；
图2为本发明光谱-质谱联用装置的连接示意图；
图3为本发明中激光吸收光谱法的光谱分析室压力为常压时，所获得的H 2S/CO 2/CH 4的光谱图；
图4为本发明中激光吸收光谱法的光谱分析室压力为0.2atm时，所获得的H 2S/CO 2/CH 4的光谱图。
【具体实施方式】
为了使本技术领域的人员更好地理解本发明方案，下面将结合本发明实施例中的附图，对本发明实施例中的技术方案进行清楚、完整地描述，显然，所描述的实施例仅仅是本发明一部分的实施例，而不是全部的实施例。基于本发明中的实施例，本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例，都应当属于本发明保护的范围。
在本发明的描述中，需要理解的是，术语“中心”、“纵向”、“横向”、“长度”、“宽度”、“厚度”、“上”、“下”、“前”、“后”、“左”、“右”、“竖直”、“水平”、“顶”、“底”“内”、“外”、“顺时针”、“逆时针”、“轴向”、“径向”、“周向”等指示的方位或位置关系为基于附图所示的方位或位置关系，仅是为了便于描述本发明和简化描述，而不是指示或暗示所指的装置或元件必须具有特定的方位、以特定的方位构造和操作，因此不能理解为对本发明的限制。
此外，术语“第一”、“第二”仅用于描述目的，而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量。由此，限定有“第一”、“第二”的特征可以明示或者隐含地包括至少一个该特征。在本发明的描述中，“多个”的含义是至少两个，例如两个，三个等，除非另有明确具体的限定。
在本发明中，除非另有明确的规定和限定，术语“安装”、“相连”、“连接”、“固定”等术语应做广义理解，例如，可以是固定连接，也可以是可拆卸连接，或成一体；可以是机械连接，也可以是电连接或彼此可通讯；可以是直接相连，也可以通过中间媒介间接相连，可以是两个元件内部的连通或两个元件的相互作用关系，除非另有明确的限定。对于本领域的普通技术人员而言，可以根据具体情况理解上述术语在本发明中的具体含义。
为了解决上述背景技术的问题，在本发明一方面，如图1、2所示，本发明提出了一种光谱-质谱联用装置，其包括相互连通的光谱分析模块1和质谱分析模块2，所述质谱分析模块2的工作负压为所述光谱分析模块1的光谱分析提供真空环境；多组分混合气体通过所述光谱分析模块进行光谱分析，以获得多组 分混合气体样品中的一部分组分的绝对浓度，再通过所述质谱分析模块对从光谱分析模块输出的多组分混合气体样品进行质谱分析，以获得混合气体样品中待测组分的相对浓度。
其中，所述光谱分析模块1包括具有第一进气口12和第一出气口13的光谱分析室11，以及与所述光谱分析室11相连的光谱分析器；优选但不限定地，所述光谱分析器为TDLAS激光分析器，也可以是其他光谱分析器。其中TDLAS激光分析器包括用于发射激光信号的激光器14和用于接收经过气体颗粒散射后的激光信号的探测器15。
所述质谱分析模块2包括真空系统和依次连接的离子源21、质量分析器23、检测器24，所述真空系统为所述离子源21、质量分析器23和检测器24提供工作所需的真空负压，所述离子源21用于将气体分子转化为离子，所述质量分析器23用于将气体样品离子按质荷比m/z分开，所述检测器24用于检测和记录离子流的强度。所述真空系统包括前级泵25和后级泵26，所述前级泵25进口的一端与所述离子源21连接以保证离子源工作真空度达到10 -4～10 -5Pa，进口的另一端与所述后级泵26的出口连接，所述后级泵26进口均与所述质量分析器23和检测器24连接以保证质量分析器和检测器的工作真空度达到10 -5～10 -6Pa。所述前级泵25一般为机械泵(如旋转式油封泵等)，所述后级泵26一般为高真空泵(如油扩散泵、汞扩散泵、溅射离子泵、涡轮分子泵等)。
机械泵作为前级泵25用于提供高真空泵正常工作所需要的前级真空使得高真空泵达到和维持质谱分析正常工作所需要的10 -4Pa～10 -6Pa的真空负压，同时也为质谱分析模块2的离子源21进行预抽真空。离子源21的第二进气口211与所述光谱分析室11的第一出气口13连通，在对离子源21进行抽真空的时候也同时对所述光谱分析室11进行抽真空，以为光谱分析提供真空环境，即第一出气口13的压力为负压，故所述质谱分析模块2的质谱分析工作的真空度低于所述光谱分析模块1的光谱分析工作的真空度。
通过质谱分析的工作负压为光谱分析提供真空环境，即光谱分析后对外排气为负压，进而减少光谱信号的展宽，提高光谱分析的分辨率，再者本来糅合 在一起的气体光谱真空状态下能够互相独立开，互不重叠，为实现一种激光波长准确检测多组分气体浓度提供了条件，也避免或者减少多组分光谱的交叉干扰，使得光谱分析不受背景气体和杂质的干扰，进一步提高分析精度。
进一步地，所述第一出气口和第二进气口之间的通路上增设有调节阀，以通过气体流量调节控制实现调节所述光谱分析室的压力。
进一步地，所述离子源21包括离子发生器212和离子聚焦器213，所述离子聚焦器213位于所述离子发生器212和质量分析器23之间，所述离子发生器212将经过所述光谱分析室11后的气体样品进行离子化后进入所述离子聚焦器213，以将离子化样品聚焦进入到质谱分析器中。其中所述离子发生器212优选但不限定为空气动力辅助电离源，也可以是离子轰击电离源、化学电离源或场致电离源。
进一步地，所述质量分析器23与所述离子聚焦器213之间还设置有离子传输装置22，其中，所述离子传输装置22优选但不限定为离子迁移谱仪，所述质量分析器23可选择磁分析器、飞行时间(TOF)分析器或四级杆分析器或离子阱分析器等等。
本领域技术人可以理解，在实际应用中，上述装置的光谱分析模块1和质谱分析模块2的具体实现方式可能有各种变化，不受特别限制，换句话说，气体样品能够首先经过光谱模块进行光谱法分析，然后离子源电离获得离子化样品再进行质谱检测即可。当然，上述装置的具体设置方式也不受特别限制。即，在应用中，光谱分析模块1可以水平放置，可以垂直放置。本领域技术人员可以根据实际需要，对上述装置的具体设置方式进行设置，只要该装置的各个部件之间满足前面描述的相对位置关系即可。
本发明提供的光谱-质谱联用装置可以以较高的精度(PPM～PPB级别痕量分析)和高分辨率(不受背景气体和杂质干扰)实现快速便捷地实时在线分析混合气体全部组分的浓度，同时使用便捷，无耗材，免维护，长期稳定运行。
本发明通过将光谱法和质谱法进行联用检测，光谱法和质谱法相互协同作用，其中：光谱分析对质谱分析的作用有三，其一为质谱分析提供绝对浓度的 基准；其二为区分质荷比相同或者相近的气体组分(如CO和N 2)，可以理解为常规质谱分析难以区分质荷比相同或者相近的气体组分，本发明可将相同或者相近的气体组分的浓度通过光谱分析获得；其三为实现小分子(分子量低于40)组分的分析，解决小分子组分无法适用质谱分析的问题，质谱分析是把分子离子化后打出去，但是质量太轻的小分子气体，刚打出去还没有被检测器24检测到就受磁场影响偏转了，所以分子太小不适合用质谱分析。质谱分析对光谱分析的作用也有二，其一为光谱提供真空环境，即光谱分析后对外排气为负压，进而减少光谱信号的展宽，提高光谱分析的分辨率，避免或者减少多组分光谱的交叉干扰，提高分析精度；其二为实现高精度全组分分析。
具体检测时，光谱分析可检测到的一部分气体组分与质谱分析可检测到的待测气体组分中至少有一种组分重叠即可，质谱分析获得多组分混合气体中待测组分的相对浓度，再以该重叠组分在光谱分析获得的绝对浓度为基准(由于同一气体样品故组分的绝对浓度是一致的)，进而获得待测组分的绝对浓度。光谱分析获得一部分气体组分的绝对浓度，质谱分析再获得另一部分气体组分的绝对浓度，即可完成全组分分析。
相比现有激光吸收光谱法通常只能分析单一组分的缺陷而本发明联用装置可实现高精度的全组分分析，相比现有质谱法需要定量添加追踪气体而本发明光谱-质谱联用装置也无需额外定量添加用于浓度标定的追踪气体，相比现有色谱法、色谱-质谱联用中由于存在色谱造成检测周期漫长(一个分析周期通常5-10分钟)的缺陷以及使用和维护的成本显著增加的缺陷，而本发明联用装置分析速度快，一个分析周期可以在1秒之内完成，同时结构简单无需专门维护，无耗材，运行成本低。
在本发明的另一方面，本发明提出了前面描述的上述光谱-质谱联用装置在检测多组分混合气体中的应用。其中所述多组分混合气体为石油化工气体、天然气气体和冶金行业气体中的任一种。具体地，所述多组分混合气体为冶金行业的转炉煤气、天然气和石油化工行业的焦炉煤气中的任一种，但不局限于此。
由此，可以利用具有上述优点的装置进行多组分混合气体样品检测，采用 该装置进行气体样品检测的特征以及优点在前面已经进行了详尽的描述，在此不再赘述。
在本发明的又一方面，本发明提出了一种光谱-质谱联用检测多组分混合气体的方法，该检测方法包括以下步骤：对多组分混合气体进行预处理，然后将预处理后的多组分混合气体样品首先经过光谱分析模块1进行光谱分析，以获得多组分混合气体样品中的一部分组分的绝对浓度；经过光谱分析模块1之后的混合气体样品进入质谱分析模块2进行质谱分析，以获得混合气体样品中待测组分的相对浓度；然后，以光谱分析得到的一个组分的绝对浓度为基准，根据质谱分析得到的各组分相对浓度，计算得到各组分的绝对浓度；其中，所述一个组分为质谱分析得到的各组分中的一种组分；其中，所述质谱分析模块2的工作负压为所述光谱分析模块1的光谱分析提供真空环境。
具体地，所述混合气体中的一部分组分可以是由CH 4、H 2S和CO 2构成，或者由CH 4、CO和CO 2构成，等等。
值得注意的是，上述预处理为现有气体检测前的常规预处理方法，本发明并未对其进行特别的限制，现有预处理方法可以包含除粉尘颗粒物、除水除油、降温伴热、稳流稳压等措施。
可以理解为，此方法为利用前面描述的光谱-质谱联用装置检测多组分混合气体样品的方法。采用该装置进行气体样品检测的特征以及优点在前面已经进行了详尽的描述，在此不再赘述。
下面以天然气作为多组分混合气体样品为例进一步对利用上述的光谱-质谱联用装置的检测方法的说明。
在进行天然气的热值计量时，需要对天然气的组分进行精确分析。目前使用的方法是气相色谱。但是色谱分析的速度跟流量计相比慢很多，不能实时反应流量变化时组分的变化，特别是多个气源混合的时候，而且使用和维护困难。
而通过本发明光谱-质谱联用的检测方法具体包括如下步骤：
步骤1.将天然气进行预处理后经第一进气口进入到光谱分析室，先使用激光吸收光谱法用中心波长为1572nm的激光器对样气中的H 2S/CO 2/CH 4进行分 析，获得H 2S/CO 2/CH 4的绝对浓度。
该步骤中根据光谱图获得气体组分的绝对浓度算法采用现有算法，如谐波高度算法或线性拟合算法，本发明并未对此算法进行改进，故在此不再详述。
常规的激光分析光谱法对外排气为常压，H 2S/CO 2/CH 4的光谱由于展宽的原因，会发生互相交叉干扰，如图3所示。然而，当本光谱-质谱联用装置启动后，前级泵进行抽真空的时候，也同时将光谱分析室的压力降低至真空状态，即光谱分析室里的分析环境压力为负压，则H 2S/CO 2/CH 4的吸收峰变窄，互相独立，可以实现无干扰的同时测量，如图4所示，当光谱分析室压力在0.2atm时H 2S/CO 2/CH 4的吸收峰谱图。
值得注意的是，上述0.2atm仅仅是某一真空状态下的举例，本发明并未对光谱分析室的压力进行特别限制，具体实现时，保证质谱分析模块工作所需的真空负压即可。
上述的预处理是行业气体分析之前的常规预处理方式，本发明并未对其进行限制，故在此不再赘述。
步骤2.经过光谱分析后，气体样品经第一出气口输送到离子源的第二进气口处，气体样品被离子发生器进行电离以获得离子化样品，再经过离子聚焦器进行聚焦进入到质量分析器。
需要说明的是，上述气体样品被离子发生器电离并不是全部的气体样品，具体实现时，离子发生器仅对其中一部分气体样品进行电离，而大部分气体是由与离子源连接的机械泵抽出，但并不影响后续的质谱分析。
步骤3.质量分析器和检测器对离子化样品进行质谱分析以获得混合气体样品中待测组分的相对浓度。即按质荷比对气体样品中待测组分的相对浓度进行分析。
步骤4.以光谱分析得到的二氧化碳组分的绝对浓度为基准，根据质谱分析得到的各组分相对浓度，计算天然气中C2至C6+的组分的绝对浓度。
一般而言，天然气中以甲烷(C1)为主，含有乙烷(C2)、丙烷(C3)、丁烷(C4)、戊烷(C5)、己烷(C6)以及氮气、二氧化碳和硫化氢等。上述C6+是对C6、 C7(庚烷)、C8(辛烷)的总称。
比如，质谱分析得到CO 2相对浓度是1，C2相对浓度是1.2，C3相对浓度是0.5。相对浓度是指相对的比值，并不是真实的浓度。而前面光谱分析得到CO 2的绝对浓度是2％，则系数为2％/1＝2％，其中，绝对浓度就是真实的浓度值。由此可以得到C2绝对浓度是1.2*2％＝2.4％，C3绝对浓度是0.5*2％＝1％。C4至C6+以此类推。
步骤5.根据可燃组分C1至C6+的百分含量计算热值以及压缩因子等物理参数。
步骤6.将步骤5得到的物理参数输入流量/热值计算机，与流量计测量得到的流量信号，以及实时的气体、温度等信息，对天然气累计的热值进行计量。
上述步骤5、6涉及到的计算过程均为现有算法，也不是本发明的改进点，故不再详述。
显然，以上所描述的实施例仅仅是本申请一部分实施例，而不是全部的实施例，附图中给出了本申请的较佳实施例，但并不限制本申请的专利范围。本申请可以以许多不同的形式来实现，相反地，提供这些实施例的目的是使对本申请的公开内容的理解更加透彻全面。尽管参照前述实施例对本申请进行了详细的说明，对于本领域的技术人员来而言，其依然可以对前述各具体实施方式所记载的技术方案进行修改，或者对其中部分技术特征进行等效替换。凡是利用本申请说明书及附图内容所做的等效结构，直接或间接运用在其他相关的技术领域，均同理在本申请专利保护范围之内。

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  1. 一种光谱-质谱联用装置，其特征在于，其包括相互连通的光谱分析模块和质谱分析模块，所述质谱分析模块的工作负压为所述光谱分析模块的光谱分析提供真空环境；多组分混合气体通过所述光谱分析模块进行光谱分析，以获得多组分混合气体样品中的一部分组分的绝对浓度，再通过所述质谱分析模块对从光谱分析模块输出的多组分混合气体样品进行质谱分析，以获得混合气体样品中待测组分的相对浓度。
  2. 根据权利要求1所述的光谱-质谱联用装置，其特征在于，所述质谱分析模块的真空度低于所述光谱分析模块的真空度。
  3. 根据权利要求1所述的光谱-质谱联用装置，其特征在于，所述光谱分析模块包括光谱分析室和与所述光谱分析室相连的光谱分析器，所述光谱分析室具有第一进气口和第一出气口，所述第一出气口与所述质谱分析模块连通，以实现通过所述质谱分析模块的工作负压为所述光谱分析室提供真空环境。
  4. 根据权利要求3所述的光谱-质谱联用装置，其特征在于，所述光谱分析器为TDLAS激光分析器。
  5. 根据权利要求3或4所述的光谱-质谱联用装置，其特征在于，所述质谱分析模块包括真空系统和依次连接的离子源、质量分析器与检测器，所述真空系统为所述离子源、质量分析器和检测器提供工作所需的真空负压；所述第一出气口与所述离子源的第二进气口连通；所述离子源将气体分子转化为离子，所述质量分析器用于将离子化的气体按质荷比分开，通过所述检测器以检测和记录离子流的强度。
  6. 根据权利要求5所述的光谱-质谱联用装置，其特征在于，所述真空系统包括前级泵和后级泵，所述前级泵进口的一端与所述离子源连接，进口的另一端与所述后级泵的出口连接，所述后级泵进口均与所述质量分析器和检测器连接；所述前级泵用于提供后级泵正常工作所需要的前级真空，使得所述后级泵达到和维持质谱分析正常工作所需要的真空负压。
  7. 根据权利要求1所述的光谱-质谱联用装置，其特征在于，所述第一出气口和第二进气口之间的通路上增设有调节阀，以调节所述光谱分析室的压力。
  8. 一种利用权利要求1-7任意一项所述光谱-质谱联用装置的检测方法，其特征在于，该检测方法包括以下步骤：
    将多组分混合气体输入到光谱分析模块进行光谱分析，以获得多组分混合气体样品中的一部分组分的绝对浓度，其中，所述质谱分析模块的工作负压为所述光谱分析模块的光谱分析提供真空环境；
    经过光谱分析模块之后的混合气体样品进入质谱分析模块进行质谱分析，以获得混合气体样品中待测组分的相对浓度；
    以光谱分析得到的一个组分的绝对浓度为基准，根据质谱分析得到的各组分相对浓度，计算得到各组分的绝对浓度；其中，所述一个组分为质谱分析得到的各组分中的一种组分。
  9. 根据权利要求8所述的检测方法，其特征在于，所述混合气体中的一部分组分为CH 4、H 2S和CO 2；或者，所述混合气体中的一部分组分为CH 4、CO和CO 2。
  10. 根据权利要求8或9所述的检测方法，其特征在于，所述多组分混合气体为石油化工气体、天然气气体和冶金行业气体中的任一种。
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