WO2021088376A1 - 一种利用散射光的偏振差异测量颗粒折射率的方法及系统 - Google Patents
一种利用散射光的偏振差异测量颗粒折射率的方法及系统 Download PDFInfo
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- 239000011159 matrix material Substances 0.000 claims abstract description 18
- 230000008569 process Effects 0.000 claims abstract description 3
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- 230000015654 memory Effects 0.000 claims description 5
- 230000008859 change Effects 0.000 claims description 3
- 238000001514 detection method Methods 0.000 description 9
- 238000003860 storage Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 3
- 238000003921 particle size analysis Methods 0.000 description 2
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- 238000001370 static light scattering Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
- G01N15/0211—Investigating a scatter or diffraction pattern
Definitions
- the invention relates to the technical field of particle characterization, in particular to a method and system for measuring the refractive index of particles by using the polarization difference of scattered light.
- Particles refer to geometric bodies with specific shapes generally ranging in size from millimeters to nanometers. Particles not only refer to solid particles, but also fluid particles such as droplets and bubbles. Particles are ubiquitous in nature, and are widely affected or used in industrial production and scientific research. Particle size is one of the most important parameters of particles. In recent years, the application of various new granular materials has placed higher demands on particle size measurement. Laser particle size analyzers based on the principle of static light scattering have been more and more widely used.
- the scattering light receiving angle of the measuring device (laser particle sizer) is limited to a small angle range, such as 5° or less, the laser particle sizer based on Fraunhofer diffraction theory can be used without input refraction
- the particle size analysis of the sample is carried out under the condition of low rate; but now the lower limit of the commercial particle size analyzer is as small as 0.1 ⁇ m, so the maximum scattering angle receiving range must reach 60° or more.
- the scattered light energy distribution of particles of any size is The refractive index is related. If the refractive index of the particles of the same particle size is different, the light energy distribution will have a significant difference. Therefore, when using the laser particle size analyzer based on the Mie scattering theory for particle size analysis, the accurate refractive index of the sample must be input in advance to calculate the corresponding scattering Light energy matrix, and then calculate the particle size distribution according to the scattered light distribution. If the refractive index value entered is wrong, it will lead to wrong analysis results.
- the refractive index value of the sample is mostly obtained by looking up the table when using the laser particle size analyzer to measure the sample.
- the refractive index of the actual sample is related to factors such as incident light wavelength and impurity content, so it is difficult to determine the accurate refractive index of the particles, which often leads to large errors between the measurement results of the sample and the actual particle size distribution.
- the present invention proposes a method and system for measuring the refractive index of particles by using the polarization difference of scattered light.
- the refractive index and particle size distribution of the measured sample particles are both unknown, only the scattered light signal of the measured particle is used.
- the refractive index of the particles can be calculated, and then the measured refractive index can be used to obtain an accurate particle size distribution.
- a method for measuring the refractive index of particles by using the polarization difference of scattered light including the steps:
- the detector is an array composed of multiple independent detection units, all units are located in the XOZ plane, and each unit corresponds to a different scattering angle. Let the total number of detection units be k.
- the polarization direction of the scattered light received by each detection unit is perpendicular to the XOZ plane, that is, the scattering surface.
- are input to the processor.
- [E d1 ,E d2 ,...,E dk ] T , which is obtained by the calculation of the processor.
- n (i) set a particle refractive index n (i) , according to Mie theory, calculate the vertical polarization scattering light energy matrix with dimension k ⁇ l And scattered light polarization difference matrix Among them, k is the number of detector units, l is the number of segments representing the particle size of the particles, and i is the number of refractive index values;
- a system for measuring the refractive index of particles by using the polarization difference of scattered light which is characterized in that it includes a laser light source module, photodetectors arranged in an array, a processor for receiving and processing information from the photodetectors, and storage processing Program memory.
- the laser light source module includes a linearly polarized light source and a half-wave plate arranged at the exit end of the linearly polarized light source, or the laser light source module includes a natural light source and a polarizer arranged at the exit end of the natural light source.
- the beneficial effects of the present invention are: when the refractive index and particle size distribution of the measured particle sample are both unknown, the scattered light signal itself obtained by the laser particle size analyzer can be used to obtain the refractive index of the sample, thereby obtaining an accurate particle size distribution of the sample. .
- Figure 1 is a schematic diagram of the present invention
- Figure 2 is a schematic diagram of the first laser light source module to realize the optical path
- Figure 3 is a schematic diagram of the second type of laser light source module to realize the optical path
- Fig. 4 is a schematic diagram of the optical path realized by the third laser light source module.
- a method for measuring the refractive index of particles by using the polarization difference of scattered light including the steps:
- the detector is an array composed of multiple independent detection units, all units are located in the XOZ plane, and each unit corresponds to a different scattering angle. Let the total number of detection units be k.
- the polarization direction of the scattered light received by each detection unit is perpendicular to the XOZ plane, that is, the scattering surface.
- are input to the computer.
- [E d1 ,E d2 ,...,E dk ] T , obtained by computer calculation.
- the scattered light signal itself obtained by the laser particle size analyzer can be used to calculate the refractive index of the sample, thereby obtaining an accurate particle size distribution of the sample.
- the measurement system for measuring the refractive index of particles by using the polarization difference of scattered light of this embodiment includes a laser light source module, photodetectors arranged in an array, a processor that receives and processes information from the photodetectors, and a storage processing program Memory.
- the incident light 1 travels along the Z axis and irradiates the particle 7 located at the origin of the coordinate O (only one is drawn schematically here).
- Particles in reality, are a group of particles composed of multiple particles of different sizes). After light wave 1 encounters particles 7, it scatters, as shown in the figure, light 2 is scattered.
- a series of detectors 5 an array composed of multiple independent detectors, each corresponding to a scattering angle 6.
- the laser particle sizer is placed in the XOZ plane, along the scattering
- the electric field vector of the scattered light wave propagating on the surface can be decomposed into component 3 that vibrates perpendicular to the XOZ plane (referred to as “vertical polarization component”) and component 4 that vibrates parallel to the XOZ plane (referred to as “horizontal polarization component”).
- Different detectors are used to receive scattered light with different scattering angles.
- the vertical polarization components received by each detector are arranged in the order of the detectors from the inside to the outside, respectively denoted as E ⁇ 1 , E ⁇ 2 , ..., E ⁇ k , which are called the distribution of vertically polarized scattered light energy, for simplicity
- E ⁇ [E ⁇ 1 ,E ⁇ 2 ,...,E ⁇ k ] T
- k is the total number of independent detection units of the detector.
- the horizontal component of the scattered light signal is called "horizontal polarization light scatter profile", represented by ⁇
- [E
- are input to the computer.
- the difference between the vertical polarization scattered light energy distribution and the horizontal polarization scattered light energy distribution is called the polarization difference of the scattered light, denoted as E d .
- E d E ⁇ -E
- E d is obtained by computer calculation.
- embodiment can have the following three ways:
- the laser light source 8 is a linearly polarized light source.
- the linearly polarized light source is rotated around the Z axis through a rotating mechanism, and the polarization direction of the emitted light is first made parallel to the Y axis. Then the detector 5 measures The scattered light energy distribution is the vertical polarization scattered light distribution E ⁇ . Then, the light source is rotated 90° around the Z axis, and the scattered light energy distribution measured by the detector 5 at this time is the horizontally polarized scattered light energy distribution E
- the laser light source 8 is linearly polarized light, and the polarization direction is parallel to the Y axis.
- a half-wave plate 9 is placed on the exit light path, which can rotate around the Z axis.
- measured scattering detector 5 that is vertically polarized optical energy distribution of scattered optical energy distribution ⁇ ⁇ .
- the half-wave plate 9 is rotated by 45°.
- the scattered light energy distribution measured by the detector 5 is the horizontally polarized scattered light energy distribution E
- the laser light source 8 is non-polarized (natural) light, and a polarizer 10 is placed on the exit light path, which can rotate around the Z axis.
- the scattered light energy distribution measured by the detector 5 is the vertical polarization scattered light energy distribution E ⁇ .
- the polarizer is rotated 90°, and the scattered light energy distribution measured by the detector at this time is the horizontally polarized scattered light energy distribution E
- the memory stores a computer-readable storage medium.
- the readable storage medium can be various storage media with data storage functions, including but not limited to non-volatile memories such as FIASH and EEPROM.
- the processor executes the computer During the program, the above-mentioned method for measuring the refractive index of particles can be realized.
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Abstract
Description
Claims (6)
- 一种利用散射光的偏振差异测量颗粒折射率的方法,其特征在于,包括步骤:S1,分别获取光波照射到位于坐标原点O的颗粒样品上后产生的垂直偏振散射光能分布E ⊥=[E ⊥1,E ⊥2,…,E ⊥k] T和水平偏振散射光能分布E ||=[E ||1,E ||2,…,E ||k] T,计算散射光的偏振差E d=E ⊥-E ||=[E d1,E d2,…,E dk] T;S6,将S2中的颗粒折射率变为n (j),重复步骤2-5,计算均方差σ (j)。找到均方差最小时对应的折射率即为颗粒的真实折射率,该折射率对应的粒度分布即为真实的粒度分布。
- 如权利要求1所述的散射光的偏振差异测量颗粒折射率的方法,其特征在于,所述S1中垂直偏振散射光能分布Ε ⊥和水平偏振散射光能分布Ε ||分别由成阵列式排布的激光探测器获得。
- 一种利用散射光的偏振差异测量颗粒折射率的系统,其特征在于:包括激光光源模组、成阵列式排布的多个光电探测器和接收并处理探测器输出的电信号的处理器、及存储处理程序的存储器。
- 如权利要求4所述的利用散射光的偏振差异测量颗粒折射率的系统,其特征在于:所述激光光源模组包括线偏振激光光源及光源旋转装置,或线偏振光光源与设置在线偏振光光源出射端的可旋转45°或以上的半波片。
- 如权利要求4所述的利用散射光的偏振差异测量颗粒折射率的系统,其特征在于:所述激光光源模组包括非偏振激光光源及设置在光源出射端的可旋转90°或以上的起偏器。
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CN113533216A (zh) * | 2021-08-16 | 2021-10-22 | 中国人民解放军63921部队 | 一种水体偏振散射特性测量装置 |
CN113720744A (zh) * | 2021-11-04 | 2021-11-30 | 碧兴物联科技(深圳)股份有限公司 | 一种基于偏振检测技术的大气颗粒物含量实时监测方法 |
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CN110687022B (zh) * | 2019-11-05 | 2021-09-24 | 珠海真理光学仪器有限公司 | 一种利用散射光的偏振差异测量颗粒折射率的方法及系统 |
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