WO2021060727A1 - Foreign substance cleaning sheet for test socket - Google Patents

Foreign substance cleaning sheet for test socket Download PDF

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Publication number
WO2021060727A1
WO2021060727A1 PCT/KR2020/011649 KR2020011649W WO2021060727A1 WO 2021060727 A1 WO2021060727 A1 WO 2021060727A1 KR 2020011649 W KR2020011649 W KR 2020011649W WO 2021060727 A1 WO2021060727 A1 WO 2021060727A1
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WO
WIPO (PCT)
Prior art keywords
sheet
adhesive
foreign matter
socket
cleaning sheet
Prior art date
Application number
PCT/KR2020/011649
Other languages
French (fr)
Korean (ko)
Inventor
정영배
Original Assignee
주식회사 아이에스시
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Filing date
Publication date
Application filed by 주식회사 아이에스시 filed Critical 주식회사 아이에스시
Publication of WO2021060727A1 publication Critical patent/WO2021060727A1/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/04Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
    • B32B15/08Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/20Layered products comprising a layer of metal comprising aluminium or copper
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B7/00Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
    • B32B7/04Interconnection of layers
    • B32B7/12Interconnection of layers using interposed adhesives or interposed materials with bonding properties
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433Sockets for IC's or transistors

Definitions

  • the present invention relates to a foreign material cleaning sheet for an inspection socket, and more particularly, to a foreign material cleaning sheet for an inspection socket that has excellent foreign material removal ability and is easily detachable from the inspection socket.
  • an inspection socket is used in an inspection process to determine whether a manufactured device to be inspected is defective. That is, the manufactured device under test performs a predetermined electrical test to determine whether it is defective. At this time, the device to be tested and the test device for inspection do not directly contact each other, but indirectly through the test socket. Will be connected. The reason is that because the inspection apparatus for inspection is relatively expensive, it is not easy to replace when worn or damaged due to frequent contact with the device to be inspected, and the replacement cost is high. Accordingly, the test socket is mounted on the upper side of the test device so that the device to be tested is electrically connected to the test device by contacting the test socket, not the test device. Accordingly, the test signal from the test apparatus is transmitted to the device under test through the test socket.
  • the test socket is disposed between the device under test 140 and the test device 130, as shown in FIGS. 1 and 2, and the terminal 141 of the device under test 140 and the test device 130
  • the conductive part 110 is elastic
  • an insulating support part 120 that supports and insulates each of the conductive parts 110.
  • test socket 100 is in a state mounted on the test device 130, the pad 131 of the test device 130 and the conductive part 110 are in contact with each other, and the device to be tested 140 is It is configured to be in contact with the conductive part 110 of the test socket 100.
  • the device to be inspected 140 which is moved by the insert, comes into contact with the conductive part 110 of the socket for inspection 100, so that it is seated on the socket for inspection 100, and then is determined from the inspection device 130.
  • the electrical signal of is applied, the signal is transmitted to the device 140 for testing via the socket for testing 100 to perform a predetermined electrical test.
  • test sockets are contaminated by foreign substances buried in the devices to be tested in the process of performing tests on numerous devices to be tested. Specifically, Sn buried in the terminal of the device under test is deposited on the surface of the test socket during the movement and contact process.If foreign matter is excessively accumulated in the test socket, it becomes a problem in terms of reliability of the test. It becomes necessary to clean it.
  • Freon cleaning and cleaning with a cleaning sheet are used as cleaning methods.
  • the cleaning sheet 200 includes a PCB substrate 201 as a support, and after applying an adhesive 202 to the lower surface of the PCB substrate 201, the cleaning substrate 203 made of a silicon sheet. ) Is attached. Since the cleaning substrate 203 has adhesive strength, in the process of repeatedly contacting the inspection socket, foreign substances on the surface of the inspection socket 100 are adhered to and removed.
  • FIGS. 4 to 7 show a state in which the socket for inspection is cleaned using a conventional cleaning sheet.
  • 4 and 5 are a case where a cleaning sheet having low adhesive strength is used, and FIG. 4 is a photograph of the surface of the cleaning sheet after cleaning, and FIG. 5 is a photograph of the surface of the inspection socket.
  • FIGS. 6 and 7 are cases in which a cleaning sheet having high adhesive strength is used, and FIG. 6 is a photograph of the surface of the cleaning sheet after cleaning, and FIG. 7 is a photograph of the surface of the inspection socket.
  • an object of the present invention is to provide a foreign matter cleaning sheet for an inspection socket that is excellent in removing foreign matter and is easily detachable from the inspection socket.
  • a plurality of conductive particles are fused to the silicon rubber at each position corresponding to the terminal of the device under test, and a plurality of conductive parts arranged in the thickness direction, and each conductive part while supporting each conductive part. It is used for inspection sockets having an insulating part for insulation,
  • a pressure-sensitive adhesive sheet disposed on one surface of the base sheet and having adhesive strength to remove foreign matters adhering to the surface of the test socket;
  • the adhesive sheet is provided at each position corresponding to the conductive portion of the test socket, and includes a protruding adhesive portion protruding from the surface of the adhesive sheet and having a hemispherical shape and having adhesive force.
  • the adhesive sheet and the protruding adhesive part may be made of different materials, and the protruding adhesive part may be made of a material having a lower hardness and higher elasticity than the adhesive sheet.
  • the protruding adhesive portion may be made of a material having higher adhesive strength than the adhesive sheet.
  • the protruding adhesive part When the protruding adhesive part is in contact with the conductive part, it is elastically deformed to increase the contact area, thereby removing foreign substances from the surface of the conductive part and the peripheral surface of the conductive part.
  • a flat adhesive portion is provided at a position corresponding to the insulating portion in the adhesive sheet of the foreign matter cleaning sheet, and foreign matter buried on the surface of the insulating portion may be removed by the flat adhesive portion.
  • the base sheet may be made of a PCB, a metal or a hard non-metal material.
  • the adhesive sheet may be rubber or silicone.
  • An antistatic sheet for preventing static electricity may be disposed on one side or the other side of the base sheet.
  • the antistatic sheet may be made of a copper material.
  • An adhesive layer is formed between the base sheet and the adhesive sheet, and the adhesive sheet may be attached to one surface of the base sheet by the adhesive layer.
  • the protruding adhesive portion may have a hemispherical shape.
  • the protruding adhesive portion may have a shape of any one of a columnar shape, a cone shape, a polygonal pyramidal shape, a truncated cone shape, and a polygonal pyramidal shape.
  • the cross-sectional shape of the protruding adhesive portion may have a shape corresponding to the cross-sectional shape of the conductive portion.
  • the foreign matter cleaning sheet of the present invention for achieving the above object is for inspection having a conductive portion provided by fusing a plurality of conductive particles with silicone rubber at each position corresponding to a terminal of a device under test, and an insulating portion for supporting the conductive portion.
  • a conductive portion provided by fusing a plurality of conductive particles with silicone rubber at each position corresponding to a terminal of a device under test, and an insulating portion for supporting the conductive portion.
  • a pressure-sensitive adhesive sheet disposed on one surface of the base sheet and having adhesive strength to remove foreign matters adhering to the surface of the test socket;
  • an antistatic sheet disposed between the base sheet and the adhesive sheet to prevent the adhesive sheet from sticking to the test socket due to static electricity caused by contact with the repeated test socket.
  • the antistatic sheet may be made of a copper material.
  • An adhesive layer is formed between the antistatic sheet and the adhesive sheet, and the adhesive sheet may be attached to the antistatic sheet by the adhesive layer.
  • the part in contact with the conductive part on the lower surface of the cleaning sheet forms a hemispherical cleaning ball.
  • the hemispherical cleaning ball is compressed to reliably clean the conductive part and the vicinity of the conductive part. It has an effect that can be.
  • the compression-deformed hemispherical cleaning ball is elastically restored, and the cleaning sheet can be easily separated from the inspection socket by the elastic recovery force.
  • 1 and 2 are views showing an electrical inspection state using a conventional inspection socket.
  • FIG. 3 is a view showing a state in which a cleaning operation is performed using a conventional cleaning sheet.
  • 4 to 7 are photographs showing the state after washing using a conventional cleaning sheet.
  • FIG 8 and 9 are views showing a state in which a cleaning operation is performed using a cleaning sheet according to an embodiment of the present invention.
  • Fig. 10 is a view showing a state when the cleaning sheet of Fig. 8 is brought into close contact with an inspection socket.
  • 11 to 14 are photographs showing a state after washing using the cleaning sheet of FIG. 8.
  • 15 and 16 are views showing a cleaning sheet according to another embodiment of the present invention.
  • Embodiments of the present disclosure are illustrated for the purpose of describing the technical idea of the present disclosure.
  • the scope of the rights according to the present disclosure is not limited to the embodiments presented below or specific descriptions of these embodiments.
  • a component when referred to as being "connected” or “connected” to another component, the component may be directly connected to or connected to the other component, or It is to be understood that it may be connected or may be connected via other components.
  • the meaning of correspondence does not mean only that the two components have the same shape and shape, but may include both components having a similar shape and a similar shape, and at this time, a similar shape It should be understood that the and shape include those that can be easily substituted and changed by those skilled in the art within a range having the same effect in terms of functionality.
  • the foreign matter cleaning sheet 10 is for removing foreign matter from the surface of the test socket 20 used to perform an electrical test of a device to be tested.
  • the test socket 20 includes a plurality of conductive parts 21 arranged in the thickness direction by fusion of a plurality of conductive particles with silicon rubber at each position corresponding to the terminal of the device under test, and each conductive part 21 It includes an insulating portion 22 for insulating each conductive portion 21 while supporting it, and since it is a known technique, a detailed description thereof will be omitted.
  • the cleaning sheet 10 of the present invention includes a base sheet 11, an adhesive layer 12, an adhesive sheet 13, and a protruding adhesive portion 14.
  • the base sheet 11 has a size corresponding to the surface of the inspection socket 20 on which foreign substances are buried, and functions as a support for supporting the adhesive sheet 13 and the protruding adhesive portion 14.
  • the base sheet 11 is not particularly limited, but may be made of a PCB, a metal or a hard non-metal material.
  • the hard non-metallic material include plastic films such as polyethylene, polyethylene terephthalate, acetyl cellulose, polycarbonate, polypropylene, and polyamide.
  • the thickness of the base sheet 11 is usually about 0,05 to 2.0 mm.
  • the adhesive layer 12 is for attaching the adhesive sheet 13 to one surface of the base sheet 11, and any adhesive that is generally widely used may be used.
  • the adhesive sheet 13 can be reliably attached to the base sheet 11 by the adhesive layer 12.
  • the adhesive sheet 13 is attached to one surface of the base sheet 11 by the adhesive layer 12 and has adhesive strength so as to remove foreign substances on the surface of the test socket 20.
  • the adhesive sheet 13 may be in contact with the insulating part 22 of the inspection socket 20 to remove foreign substances that are buried in the insulating part 22.
  • a flat adhesive portion is provided at a position corresponding to the insulating portion 22, and foreign substances buried on the surface of the insulating portion 22 can be removed at the flat adhesive portion.
  • the pressure-sensitive adhesive sheet 13 is not particularly limited as long as it is capable of attaching foreign substances, but in particular, if its surface resistivity is 1 ⁇ 10 13 ⁇ or more, the material and the like are not particularly limited.
  • the pressure-sensitive adhesive sheet 13 By designing the pressure-sensitive adhesive sheet 13 to have a surface resistivity equal to or higher than this specific value, and making the pressure-sensitive adhesive sheet 13 an insulator as much as possible, the effect of trapping and adsorbing foreign substances by static electricity can be obtained. Therefore, when the surface resistivity is less than 1 ⁇ 10 13 ⁇ , there is a concern that the performance of removing foreign matters may deteriorate.
  • the material or the like is not particularly limited, but it is preferable that the adhesive sheet 13 does not contain a conductive material such as an additive having a conductive function.
  • the crosslinking reaction and curing are promoted by an active energy source such as ultraviolet rays or heat, and that the tensile modulus of elasticity can be increased.
  • the tensile modulus of the pressure-sensitive adhesive sheet 13 (according to the test method JIS K7127) is 0.98 to 4900 N/cm 2 , preferably 9.8 to 3000 N/cm 2 .
  • a pressure-sensitive adhesive in which the molecular structure is formed into a three-dimensional network by crosslinking or curing and its adhesion is lowered is preferable.
  • the adhesive force of 180 peeling to the silicon wafer (mirror surface) is 0.20 N (20 g) / 10 mm or less, preferably Is about 0.010 ⁇ 0.10N (1 ⁇ 10g) / 10 mm. If this adhesive force exceeds 0.20 N (20 g)/mm, there is a fear that it adheres to the part to be cleaned in the device during transport, resulting in a transport problem.
  • a pressure-sensitive adhesive polymer contains a compound having one or more unsaturated double bonds in the molecule.
  • examples of such pressure-sensitive adhesive polymers include acrylic polymers containing (meth) acrylic acid and/or (meth) acrylic acid ester selected from acrylic acid, acrylic acid ester, methacrylic acid, and methacrylic acid ester as the main monomer. .
  • acrylic polymers containing (meth) acrylic acid and/or (meth) acrylic acid ester selected from acrylic acid, acrylic acid ester, methacrylic acid, and methacrylic acid ester as the main monomer.
  • a compound having two or more unsaturated double bonds in the molecule is used as a copolymerization monomer, or a compound having an unsaturated double bond in the molecule is chemically bonded to the synthesized acrylic polymer through a reaction between functional groups.
  • the polymer itself can also be involved in the polymerization and curing reaction by active energy.
  • the compound having at least one unsaturated double bond in the molecule (hereinafter referred to as a polymerizable unsaturated compound) is preferably a nonvolatile and low molecular weight having a weight average molecular weight of 10000 or less. , It is preferable to have a molecular weight of 5000 or less.
  • the polymerization initiator added to the adhesive sheet 13 is not particularly limited, and a known one can be used.
  • a thermal polymerization initiator such as benzoyl peroxide and azobis isobutyronitrile
  • the protruding adhesive portion 14 is provided at each position corresponding to the conductive portion 21 of the test socket 20 in the adhesive sheet 13, and protrudes from the surface of the adhesive sheet 13 and has a hemispherical shape. It has adhesive power while having it. Specifically, the protruding adhesive portion 14 is formed to protrude from the surface of the adhesive sheet 13, and is disposed at each position corresponding to the conductive portion 21 and is in contact with the conductive portion 21 to form the upper surface of the conductive portion 21 It is to remove foreign substances on the surface
  • the protruding adhesive portion 14 may be made of a material different from the pressure-sensitive adhesive sheet 13, and specifically, may be made of a material that can be easily elastically deformed because it has a lower hardness than the pressure-sensitive adhesive sheet 13 and has good elasticity. In addition, the protruding adhesive portion 14 has higher adhesive strength than the adhesive sheet 13, so that foreign matters adhering to the conductive portion 21 can be easily removed. On the other hand, the protruding adhesive portion 14 may be made of the same material as the adhesive sheet 13, but in this case, it is preferable to have different hardness or adhesive strength.
  • both the protruding adhesive portion 14 and the adhesive sheet 13 can be made of silicone rubber, but even at this time, the protruding adhesive portion 14 has different physical properties from the adhesive sheet 13 in terms of hardness, elasticity, and adhesive force. It is possible for eggplants to be applied with silicone rubber.
  • the protruding adhesive portion 14 When the cleaning sheet 10 is pressed against the inspection socket 20 by a predetermined pressing device, the protruding adhesive portion 14 is pressed while contacting the conductive portion 21.
  • the protruding adhesive part 14 When the protruding adhesive part 14 is pressed in this way, the ball area of the adhesive sheet 13 is enlarged in the left and right direction, and the area in contact with the conductive part 21 is increased by pressing rather than the initial contact area.
  • An area may be enlarged not only to the conductive part 21 but also to a peripheral part of the conductive part 21. As the area of the protruding adhesive portion 14 is enlarged to the conductive portion 21 and the peripheral portion of the conductive portion 21, foreign matters buried in the peripheral portion of the conductive portion 21 and the conductive portion 21 can be reliably attached.
  • the pressing force applied to the cleaning sheet 10 is applied to the entire surface, so that the pressing force applied to the conductive part 21 cannot be increased unless excessive pressing force is applied.
  • the pressure sensitive adhesive sheet As the pressing force is concentrated on the protruding adhesive portion 14 protruding from the surface of 13), the portion that is in contact with the protruding adhesive portion 14, that is, the conductive portion 21 and its adjacent portions, removes foreign matter by a more reliable pressing force. It will be able to attach it securely.
  • the protruding adhesive portion 14 is in close contact with the conductive portion 21 of the inspection socket 20 as the spherical ball area is enlarged by the pressing force.
  • the pressing force applied to the cleaning sheet 10 is removed, the spherical ball area While restoring to this original state, the function of pushing the socket for inspection 20 by the elastic restoring force is also performed.
  • the elastic restoration force is very excellent, and even if the adhesive force of the protruding adhesive portion 14 is strong, the socket for inspection by the elastic restoration force of the protruding adhesive portion 14 The cleaning sheet 10 can be easily separated from the 20.
  • the hardness of the protruding adhesive portion 14 is lower than that of the adhesive sheet 13, it is easy to elastically deform, so when it comes into contact with the conductive portion 21, it is easy to expand the area, and the elastic restoration force is more excellent It is done.
  • the supporting force for supporting the protruding adhesive portion 14 increases, so that the protruding adhesive portion 14 contacts and presses the conductive portion 21. It supports the protruding adhesive part 14 so that it can be easily elastically deformed when it is formed.
  • the shape of the protruding adhesive portion 14 has the same cross-sectional shape as the conductive portion of the inspection socket, a hemispherical shape having excellent elastic repulsion is most suitable, but various other shapes are possible.
  • the shape of the protruding adhesive portion 14 is a pill type, a cylinder type, a polygonal column type, a cone type, a polygonal pyramid type, a cone type, a polygonal pyramid type, etc.
  • the area is enlarged during the pressing process, and accordingly, it is easy to separate by the elastic repulsion force. It can be applied in various ways if it is a shape that allows you to
  • the cleaning sheet 10 according to an embodiment of the present invention has the following effects.
  • the cleaning sheet 10 is placed on the inspection socket 20 where foreign substances are stained on the surface during the repeated inspection process.
  • the cleaning sheet 10 is pressed while contacting the surface of the inspection socket 20.
  • the pressing of the cleaning sheet 10 is performed by a separate pressing device (not shown).
  • the protruding adhesive portion 14 protruding from the adhesive sheet 13 comes into contact with the conductive portion 21, and at this time, the protruding adhesive portion 14 supported by the adhesive sheet 13 ), the area is expanded to the periphery of the conductive part 21 and the conductive part 21 as the area is widened in the left and right direction.
  • the adhesive sheet 13 may also contact the insulating part 22 of the test socket 20 as shown in FIG. 10.
  • the conductive part 21 and the periphery of the conductive part 21 come into contact with the surface of the pressed protruding adhesive part 14, and in this process, the protruding adhesive part ( 14) It is possible to reliably remove foreign matters buried around the conductive part 21 and the conductive part 21.
  • FIGS. 11 to 14 show a state in which the inspection socket 20 is cleaned using the cleaning sheet 10 of the present invention.
  • 11 and 12 are a case in which the cleaning sheet 10 having low adhesive strength is used, and FIG. 11 is a photograph of the surface of the cleaning sheet 10 after cleaning, and FIG. 12 is a photograph of the surface of the inspection socket 20 will be.
  • FIGS. 13 and 14 show a case of using the cleaning sheet 10 having high adhesive strength, and FIG. 13 is a photograph of the surface of the cleaning sheet 10 after cleaning, and FIG. 14 shows the surface of the inspection socket 20. It was filmed.
  • the case of using the cleaning sheet having high adhesive strength is more advantageous in terms of the ability to remove foreign substances than the case of using the cleaning sheet having low adhesive strength.
  • the cleaning ability it can be seen that the adhesive force of the adhesive sheet, the presence or absence of the protruding adhesive portion, and the adhesive force of the protruding adhesive portion act in combination.
  • the present invention even when a protruding adhesive portion having a high adhesive force as well as a foreign substance removal ability is used, the area having a high adhesive force is small, so that it can be easily separated from the inspection socket.
  • the adhesive sheet functions as a support, and the protruding adhesive portion is supported by the adhesive sheet to reliably elastically deform, resulting in more reliable elastic deformation, and also elastic deformation.
  • the elastic restoring force since the elastic restoring force is excellent, the elastic restoring force has the advantage of acting to easily separate the cleaning sheet from the inspection socket.
  • the cleaning sheet according to the present invention when used, it is possible to more reliably remove the conductive part and the foreign matter around it, and it has the advantage that it can be easily separated by the elastic restoring force of the protruding adhesive part.
  • the cleaning sheet of the present invention can be modified as follows.
  • the cleaning sheet and the inspection socket are cleaned by repeated contact instead of once.In this repeated contact process, static electricity is generated, causing the cleaning sheet to stick to the inspection socket. There will be.
  • an antistatic sheet made of a material such as copper is additionally disposed.
  • the cleaning sheet 10 ′ of the present invention includes the base sheet 11 ′ and the adhesive sheet 13 ′ in addition to the base sheet 11 ′, the adhesive layer 12 ′, and the adhesive sheet 13 ′.
  • An antistatic sheet 15' is provided between them.
  • the adhesive sheet 13 ′ is attached to the antistatic sheet 15 ′ by an adhesive layer 12 ′.
  • the adhesive sheet 13 ′ is transferred to the test socket due to static electricity caused by contact with the repeated test socket 20. It can prevent sticking.
  • FIG. 16 illustrates that a protruding adhesive portion is additionally formed on the cleaning sheet of FIG. 15.
  • the adhesive sheet and the protruding adhesive portion are made of different materials.
  • the present invention is not limited thereto, and the adhesive sheet and the protruding adhesive portion may be made of the same material.
  • the adhesive sheet and the protruding adhesive portion may be made of silicone rubber having the same physical properties.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

The present invention relates to a foreign substance cleaning sheet for a test socket and, more specifically, to a foreign substance cleaning sheet for a test socket, the foreign substance cleaning sheet being used in a test socket in order to remove foreign substances from the surface of the test socket, the test socket comprising a plurality of conductive portions in which a plurality of conductive particles are blended with silicone rubber and are arranged in the thickness direction at locations corresponding to terminals of a device to be tested, and insulation portions respectively supporting and insulating the conductive portions, and the foreign substance cleaning sheet comprising: a base sheet having a size corresponding to the size of the surface having foreign substances in the test socket; an adhesive sheet arranged on a surface of the base sheet and having adhesive strength so as to remove the foreign substances from the surface of the test socket; and protruding adhesive portions which are provided at each one of the positions on the adhesive sheet corresponding to the conductive portions of the test socket, and which protrude from the surface of the adhesive sheet and have a hemispherical shape and adhesive strength.

Description

검사용 소켓의 이물질 세정시트Washing sheet for foreign matter in the inspection socket
본 발명은 검사용 소켓의 이물질 세정시트에 대한 것으로서, 더욱 상세하게는 이물질 제거능력이 우수하고 검사용 소켓으로부터 쉽게 분리가능한 검사용 소켓의 이물질 세정시트에 대한 것이다.The present invention relates to a foreign material cleaning sheet for an inspection socket, and more particularly, to a foreign material cleaning sheet for an inspection socket that has excellent foreign material removal ability and is easily detachable from the inspection socket.
일반적으로 검사용 소켓은, 제조된 피검사 디바이스의 불량여부를 판단하기 위한 검사과정에서 사용되는 것이다. 즉, 제조된 피검사 디바이스는 불량여부를 판단하기 위하여 소정의 전기적 검사를 수행하게 되는데, 이때 검사가 요구되는 피검사 디바이스와 검사를 위한 검사장치는 서로 직접 접촉되는 것이 아니라 검사용 소켓을 통하여 간접적으로 접속되게 된다. 그 이유는 검사를 위한 검사장치는 비교적 고가이기 때문에 빈번한 피검사 디바이스와의 접촉으로 인한 마모 또는 손상시 교체가 용이하지 않고 교체비용이 많이 들기 때문이다. 이에 따라 검사용 소켓은 검사장치의 상측에 교체가능하게 장착되고 상기 피검사 디바이스는 검사장치가 아닌 검사용 소켓과 접촉함으로서 상기 검사장치와 전기적으로 연결되게 된다. 따라서, 검사장치로부터 나오는 검사신호는 상기 검사용 소켓을 통하여 상기 피검사 디바이스로 전달되게 되는 것이다.In general, an inspection socket is used in an inspection process to determine whether a manufactured device to be inspected is defective. That is, the manufactured device under test performs a predetermined electrical test to determine whether it is defective. At this time, the device to be tested and the test device for inspection do not directly contact each other, but indirectly through the test socket. Will be connected. The reason is that because the inspection apparatus for inspection is relatively expensive, it is not easy to replace when worn or damaged due to frequent contact with the device to be inspected, and the replacement cost is high. Accordingly, the test socket is mounted on the upper side of the test device so that the device to be tested is electrically connected to the test device by contacting the test socket, not the test device. Accordingly, the test signal from the test apparatus is transmitted to the device under test through the test socket.
이러한 검사용 소켓은, 도 1 및 도 2에 도시된 바와 같이, 피검사 디바이스(140)와 검사장치(130)의 사이에 배치되어 피검사 디바이스(140)의 단자(141)와 검사장치(130)의 패드(131)를 서로 전기적으로 연결시키는 검사용 소켓에 있어서, 상기 피검사 디바이스의 단자와 대응되는 위치마다 배치되고 두께방향으로의 도전성을 나타내는 도전부로서, 상기 도전부(110)는 탄성 절연물질 내에 다수의 도전성 입자(111)가 두께방향으로 배열되어 배치되는 도전부(110); 및 상기 각각의 도전부(110)를 지지하면서 절연시키는 절연성 지지부(120)를 포함하여 구성된다. 이때, 상기 검사용 소켓(100)은 검사장치(130)에 탑재된 상태에서 검사장치(130)의 패드(131)와 상기 도전부(110)가 서로 접촉되어 있으며, 피검사 디바이스(140)는 검사용 소켓(100)의 도전부(110)에 접촉될 수 있도록 구성된다.The test socket is disposed between the device under test 140 and the test device 130, as shown in FIGS. 1 and 2, and the terminal 141 of the device under test 140 and the test device 130 In the test socket for electrically connecting the pads 131 of) to each other, as a conductive part disposed at a position corresponding to a terminal of the device under test and exhibiting conductivity in a thickness direction, the conductive part 110 is elastic A conductive part 110 in which a plurality of conductive particles 111 are arranged and disposed in the thickness direction in the insulating material; And an insulating support part 120 that supports and insulates each of the conductive parts 110. At this time, the test socket 100 is in a state mounted on the test device 130, the pad 131 of the test device 130 and the conductive part 110 are in contact with each other, and the device to be tested 140 is It is configured to be in contact with the conductive part 110 of the test socket 100.
인서트에 의하여 이동되어 오는 피검사용 디바이스(140)는 상기 검사용 소켓(100)의 도전부(110)에 접촉됨으로서, 상기 검사용 소켓(100)에 안착되고, 이후에 검사장치(130)로부터 소정의 전기적인 신호가 인가되면 그 신호는 검사용 소켓(100)을 거쳐서 피검사용 디바이스(140)로 전달됨으로서 소정의 전기적인 검사가 수행된다.The device to be inspected 140, which is moved by the insert, comes into contact with the conductive part 110 of the socket for inspection 100, so that it is seated on the socket for inspection 100, and then is determined from the inspection device 130. When the electrical signal of is applied, the signal is transmitted to the device 140 for testing via the socket for testing 100 to perform a predetermined electrical test.
이러한 검사용 소켓은 수많은 피검사 디바이스에 대한 검사를 수행하는 과정에서 피검사 디바이스에 묻어 있는 이물질에 의하여 오염이 되게 된다. 구체적으로 피검사 디바이스의 단자에 묻어 있는 Sn이 이동 및 접촉과정에서 검사용 소켓의 표면에 묻게 되는데, 이물질이 검사용 소켓에 과다하게 쌓이게 되는 경우에는 검사의 신뢰성면에서 문제가 되고 이러한 검사용 소켓을 세정(cleaning)할 필요가 있게 된다.These test sockets are contaminated by foreign substances buried in the devices to be tested in the process of performing tests on numerous devices to be tested. Specifically, Sn buried in the terminal of the device under test is deposited on the surface of the test socket during the movement and contact process.If foreign matter is excessively accumulated in the test socket, it becomes a problem in terms of reliability of the test. It becomes necessary to clean it.
세정방법으로는 프레온 세정과, 세정시트에 의한 세정이 활용된다. Freon cleaning and cleaning with a cleaning sheet are used as cleaning methods.
이중에서 프레온 세정의 경우 처리시간이 길고 단위면적당 처리능력이 낮으며 불순물이 잔존하게 쉬으며 프레온이나 유기용제 의한 환경오염, 세척에 견딜수 없는 재질에는 적용할 수 없는 점, 웨트 방법이기 때문에 장치의 공간이 크게 필요하다는 문제점이 있다. 이에 반해서, 세정시트에 의한 세정은 간편하면서도 환경오염의 문제가 없고 공간을 비교적 넓게 차지하지 않아 검사용 소켓의 세정방법으로 바람직하다.Of these, in the case of Freon cleaning, the treatment time is long, the treatment capacity per unit area is low, impurities remain at rest, and it cannot be applied to materials that cannot withstand environmental pollution or washing by freon or organic solvents. Because of the wet method, the space of the device There is a problem that this is greatly needed. On the other hand, cleaning by the cleaning sheet is convenient, there is no problem of environmental pollution, and does not occupy a relatively large space, so it is preferable as a cleaning method for the inspection socket.
세정시트(200)는, 도 3에 도시된 바와 같이 PCB 기판(201)을 지지체로 하여, 그 PCB 기판(201)의 하면에 접착제(202)를 도포한 후에, 실리콘 시트로 이루어지는 세정기판(203)을 부착하여 구성된다. 세정기판(203)은 점착력을 가지고 있어서 검사용 소켓에 반복적으로 접촉하는 과정에서 검사용 소켓(100)의 표면에 묻어 있는 이물질을 부착시켜 제거하게 된다.As shown in FIG. 3, the cleaning sheet 200 includes a PCB substrate 201 as a support, and after applying an adhesive 202 to the lower surface of the PCB substrate 201, the cleaning substrate 203 made of a silicon sheet. ) Is attached. Since the cleaning substrate 203 has adhesive strength, in the process of repeatedly contacting the inspection socket, foreign substances on the surface of the inspection socket 100 are adhered to and removed.
이러한 종래의 세정시트(200)는 도전부(110)의 표면에 절연부(120)에 비하여 돌출된 검사용 소켓(100)에 적용되는 경우에는 세정능력을 어느정도 확보할 수 있으나, 도전부(110)와 절연부(120)가 평면상태인 도 3에 도시된 검사용 소켓(100)에 적용시에는 확실한 세정효과를 얻을 수 없는 단점이 있다.When the conventional cleaning sheet 200 is applied to the test socket 100 protruding from the insulating part 120 on the surface of the conductive part 110, the cleaning ability can be secured to some extent, but the conductive part 110 ) And the insulating portion 120 is applied to the inspection socket 100 shown in FIG. 3 in a flat state, there is a disadvantage that a reliable cleaning effect cannot be obtained.
구체적으로 반복되는 검사과정에서 피검사 디바이스의 단자에 묻어있는 이물질은 도전부 상면 뿐 아니라 도전부의 주변에 많이 묻어있게 되는데, 도전부 주변의 이물질의 경우 세정작업시 잘 흡착되지 않게 되며 이에 따라서 세정효과는 크게 저하되게 된다.Specifically, in the repeated inspection process, foreign substances on the terminals of the device under test are often buried not only on the upper surface of the conductive part, but also around the conductive part. Is greatly degraded.
구체적으로 도 4 내지 도 7에서는 종래의 세정시트를 이용하여 검사용 소켓을 세정한 모습을 나타내고 있다. 도 4 및 도 5는 점착력이 낮은 세정시트를 사용한 경우로서, 도 4는 세정후의 세정시트의 표면을 촬영한 것이고, 도 5는 검사용 소켓의 표면을 촬영한 것이다. 또한, 도 6 및 도 7는 점착력이 높은 세정시트를 사용한 경우로서, 도 6은 세정후의 세정시트의 표면을 촬영한 것이고, 도 7는 검사용 소켓의 표면을 촬영한 것이다.Specifically, FIGS. 4 to 7 show a state in which the socket for inspection is cleaned using a conventional cleaning sheet. 4 and 5 are a case where a cleaning sheet having low adhesive strength is used, and FIG. 4 is a photograph of the surface of the cleaning sheet after cleaning, and FIG. 5 is a photograph of the surface of the inspection socket. In addition, FIGS. 6 and 7 are cases in which a cleaning sheet having high adhesive strength is used, and FIG. 6 is a photograph of the surface of the cleaning sheet after cleaning, and FIG. 7 is a photograph of the surface of the inspection socket.
점착력이 낮은 세정시트를 사용한 경우에는 도 4에 나타나는 바와 같이 세정시트에서 도전부가 위치되는 부분과, 그 주변의 이물질은 묻어 있지 않는다는 것을 알 수 있으며, 도 5를 통해서 확인되는 바와 같이, 검사용 소켓에서도 도전부와 그 주변에서는 이물질이 제거되지 않았다는 것을 확인할 수 있다.In the case of using a cleaning sheet with low adhesive strength, it can be seen that the part where the conductive part is located in the cleaning sheet and foreign substances around the cleaning sheet are not stained, as shown in FIG. 4. As shown in FIG. 5, the test socket It can also be seen that foreign matter was not removed from the conductive part and its surroundings.
또한, 도 6에서 확인되는 바와 같이, 점착력이 높은 세정시트를 사용한 경우에도 도전부가 위치되는 부분과 그 주변은 이물질이 묻어 있지 않는 것을 확인할 수 있고, 도 7에서 볼 수 있는 바와 같이, 검사용 소켓의 도전부와 바로 인접한 부분은 이물질이 충분하게 제거되지 않음을 확인할 수 있다.In addition, as shown in Fig. 6, even when a cleaning sheet having high adhesive strength is used, it can be confirmed that the part where the conductive part is located and the surrounding area are not stained with foreign substances. As can be seen in Fig. 7, the inspection socket It can be seen that the foreign matter is not sufficiently removed from the part immediately adjacent to the conductive part of.
이와 같이, 종래의 평면형태의 세정시트를 이용하여 세정작업을 수행하면 도전부와, 바로 인접한 부분에서는 이물질이 충분하게 제거되지 않는다는 것을 알 수 있다. 이와 같이 이물질이 잘 제거되지 않는 경우에는 전기적 검사의 신뢰성이 매우 떨어지게 되는 문제점이 있다.As described above, it can be seen that when the cleaning operation is performed using a conventional planar cleaning sheet, foreign matter is not sufficiently removed from the conductive part and the immediately adjacent part. When the foreign matter is not easily removed as described above, there is a problem in that the reliability of the electrical test is very deteriorated.
한편, 종래기술의 경우 점착력을 매우 높게 하는 경우에는 가압에 의하여 세정시트가 검사용 소켓의 표면에 접촉한 후에 상기 세정시트를 검사용 소켓으로부터 분리하기 어렵게 되는 문제점도 있다.On the other hand, in the case of the prior art, when the adhesive strength is very high, there is a problem in that it becomes difficult to separate the cleaning sheet from the inspection socket after the cleaning sheet contacts the surface of the inspection socket by pressure.
본 발명은 상술한 문제점을 해결하기 위하여 창출된 것으로서, 더욱 상세하게는 이물질 제거능력이 우수하고 검사용 소켓으로부터 쉽게 분리가능한 검사용 소켓의 이물질 세정시트를 제공하는 것을 목적으로 한다.The present invention has been created in order to solve the above-described problems, and more particularly, an object of the present invention is to provide a foreign matter cleaning sheet for an inspection socket that is excellent in removing foreign matter and is easily detachable from the inspection socket.
상술한 목적을 달성하기 위한 본 발명의 피검사 디바이스의 단자와 대응되는 위치마다 다수의 도전성 입자가 실리콘 고무에 융합되어 두께방향으로 배열되는 복수의 도전부와, 각각의 도전부를 지지하면서 각 도전부를 절연하기 위한 절연부를 가지는 검사용 소켓에 사용되며,In order to achieve the above object, a plurality of conductive particles are fused to the silicon rubber at each position corresponding to the terminal of the device under test, and a plurality of conductive parts arranged in the thickness direction, and each conductive part while supporting each conductive part. It is used for inspection sockets having an insulating part for insulation,
상기 검사용 소켓의 표면에 묻어 있는 이물질을 제거하기 위한 이물질 세정시트에 있어서,In the foreign matter cleaning sheet for removing foreign matter adhering to the surface of the inspection socket,
검사용 소켓에서 이물질이 묻어 있는 표면과 대응되는 크기를 가지는 베이스 시트;A base sheet having a size corresponding to a surface on which foreign substances are buried in the inspection socket;
상기 베이스 시트의 일면에 배치되고 검사용 소켓의 표면에 묻어 있는 이물질을 제거할 수 있도록 점착력을 가지는 점착시트; 및A pressure-sensitive adhesive sheet disposed on one surface of the base sheet and having adhesive strength to remove foreign matters adhering to the surface of the test socket; And
상기 점착시트에서 검사용 소켓의 도전부와 대응되는 위치마다 마련되며, 상기 점착시트의 표면에서 돌출되고 반구형상을 가지면서 점착력이 있는 돌출점착부를 포함한다.The adhesive sheet is provided at each position corresponding to the conductive portion of the test socket, and includes a protruding adhesive portion protruding from the surface of the adhesive sheet and having a hemispherical shape and having adhesive force.
상기 이물질 세정시트에서,In the foreign matter cleaning sheet,
상기 점착시트와 상기 돌출점착부는 서로 다른 소재로 이루어지되, 상기 돌출점착부는, 상기 점착시트보다 경도가 낮고 탄성력이 좋은 소재로 이루어질 수 있다.The adhesive sheet and the protruding adhesive part may be made of different materials, and the protruding adhesive part may be made of a material having a lower hardness and higher elasticity than the adhesive sheet.
상기 이물질 세정시트에서,In the foreign matter cleaning sheet,
상기 돌출점착부는, 상기 점착시트보다 점착력이 높은 소재로 이루어질 수 있다.The protruding adhesive portion may be made of a material having higher adhesive strength than the adhesive sheet.
상기 이물질 세정시트에서,In the foreign matter cleaning sheet,
상기 돌출점착부는 도전부와 접촉시 탄성변형되어 접촉면적이 커지면서 도전부의 표면과 도전부의 주변 표면에 묻어 있는 이물질을 제거할 수 있다.When the protruding adhesive part is in contact with the conductive part, it is elastically deformed to increase the contact area, thereby removing foreign substances from the surface of the conductive part and the peripheral surface of the conductive part.
상기 이물질 세정시트의 상기 점착시트에서 절연부와 대응되는 위치에는 평면점착부가 마련되고, 상기 절연부의 표면에 묻어 있는 이물질은 상기 평면점착부에 의하여 제거될 수 있다.A flat adhesive portion is provided at a position corresponding to the insulating portion in the adhesive sheet of the foreign matter cleaning sheet, and foreign matter buried on the surface of the insulating portion may be removed by the flat adhesive portion.
상기 이물질 세정시트에서,In the foreign matter cleaning sheet,
상기 베이스 시트는, PCB, 금속 또는 경질의 비금속소재로 이루어질 수 있다.The base sheet may be made of a PCB, a metal or a hard non-metal material.
상기 이물질 세정시트에서,In the foreign matter cleaning sheet,
상기 점착시트는 고무 또는 실리콘일 수 있다.The adhesive sheet may be rubber or silicone.
상기 이물질 세정시트에서,In the foreign matter cleaning sheet,
상기 베이스 시트의 일면 또는 타면에는 정전기 방지를 위한 정전기 방지시트가 배치될 수 있다.An antistatic sheet for preventing static electricity may be disposed on one side or the other side of the base sheet.
상기 이물질 세정시트에서,In the foreign matter cleaning sheet,
상기 정전기 방지시트는, 구리소재로 이루어질 수 있다.The antistatic sheet may be made of a copper material.
상기 이물질 세정시트에는,In the foreign matter cleaning sheet,
상기 베이스 시트와, 상기 점착시트의 사이에는 접착제층이 형성되어 있으며, 상기 접착제층에 의하여 상기 점착시트가 상기 베이스 시트의 일면에 부착될 수 있다.An adhesive layer is formed between the base sheet and the adhesive sheet, and the adhesive sheet may be attached to one surface of the base sheet by the adhesive layer.
상기 이물질 세정시트에서, 상기 돌출점착부는 반구형상을 가질 수 있다.In the foreign matter cleaning sheet, the protruding adhesive portion may have a hemispherical shape.
상기 이물질 세정시트에서,In the foreign matter cleaning sheet,
상기 돌출점착부는, 기둥형, 원뿔형, 다각뿔형, 원뿔대형, 다각뿔대형 중 어느 하나의 형상을 가질 수 있다.The protruding adhesive portion may have a shape of any one of a columnar shape, a cone shape, a polygonal pyramidal shape, a truncated cone shape, and a polygonal pyramidal shape.
상기 이물질 세정시트에서,In the foreign matter cleaning sheet,
상기 돌출점착부의 단면형상은, 상기 도전부의 단면형상과 대응되는 형상을 가질 수 있다.The cross-sectional shape of the protruding adhesive portion may have a shape corresponding to the cross-sectional shape of the conductive portion.
상술한 목적을 달성하기 위한 본 발명의 이물질 세정시트는, 피검사 디바이스의 단자와 대응되는 위치마다 다수의 도전성 입자가 실리콘 고무에 융합되어 마련된 도전부와 상기 도전부를 지지하기 위한 절연부를 가지는 검사용 소켓에 사용되며, 상기 검사용 소켓에 묻어 있는 이물질을 제거하기 위한 이물질 세정시트에 있어서,The foreign matter cleaning sheet of the present invention for achieving the above object is for inspection having a conductive portion provided by fusing a plurality of conductive particles with silicone rubber at each position corresponding to a terminal of a device under test, and an insulating portion for supporting the conductive portion. In the foreign matter cleaning sheet used for the socket and for removing foreign matters adhering to the inspection socket,
검사용 소켓에서 이물질이 묻어 있는 표면과 대응되는 크기를 가지는 베이스 시트;A base sheet having a size corresponding to a surface on which foreign substances are buried in the inspection socket;
상기 베이스 시트의 일면에 배치되고 검사용 소켓의 표면에 묻어 있는 이물질을 제거할 수 있도록 점착력을 가지는 점착시트; 및A pressure-sensitive adhesive sheet disposed on one surface of the base sheet and having adhesive strength to remove foreign matters adhering to the surface of the test socket; And
상기 베이스 시트와 상기 점착시트 사이에 배치되고 반복되는 검사용 소켓과의 접촉에 의하여 유발되는 정전기에 의하여 점착시트가 검사용 소켓에 달라붙는 것을 방지하기 위한 정전기 방지시트;를 포함한다.And an antistatic sheet disposed between the base sheet and the adhesive sheet to prevent the adhesive sheet from sticking to the test socket due to static electricity caused by contact with the repeated test socket.
상기 이물질 세정시트에서,In the foreign matter cleaning sheet,
상기 정전기 방지시트는, 구리소재로 이루어질 수 있다.The antistatic sheet may be made of a copper material.
상기 이물질 세정시트에서,In the foreign matter cleaning sheet,
상기 정전기 방지시트와 상기 점착시트의 사이에는 접착제층이 형성되고, 상기 접착제층에 의하여 상기 점착시트가 상기 정전기 방지시트에 부착될 수 있다.An adhesive layer is formed between the antistatic sheet and the adhesive sheet, and the adhesive sheet may be attached to the antistatic sheet by the adhesive layer.
본 발명은 세정시트의 하면에서 도전부와 접촉되는 부분이 반구형 세정볼을 형성함으로서, 세정시트를 검사용 소켓 측으로 가압하는 과정에서 반구형 세정볼이 압착되면서 도전부와 도전부 주변을 확실하게 세정할 수 있는 효과를 가진다.In the present invention, the part in contact with the conductive part on the lower surface of the cleaning sheet forms a hemispherical cleaning ball. In the process of pressing the cleaning sheet toward the socket for inspection, the hemispherical cleaning ball is compressed to reliably clean the conductive part and the vicinity of the conductive part. It has an effect that can be.
또한 세정시트의 점착력이 높아져도 압축변형된 반구형 세정볼이 탄성복원되면서 그 탄성복원력에 의하여 세정시트가 검사용 소켓으로부터 쉽게 분리될 수 있게 하는 효과를 가진다.In addition, even when the adhesion of the cleaning sheet is increased, the compression-deformed hemispherical cleaning ball is elastically restored, and the cleaning sheet can be easily separated from the inspection socket by the elastic recovery force.
도 1 및 도 2는 종래의 검사용 소켓을 이용한 전기적 검사모습을 도시한 도면.1 and 2 are views showing an electrical inspection state using a conventional inspection socket.
도 3은 종래의 세정시트를 이용하여 세정작업을 수행하는 모습을 나타내는 도면.3 is a view showing a state in which a cleaning operation is performed using a conventional cleaning sheet.
도 4 내지 7는 종래의 세정시트를 이용하여 세정하고 난 후의 모습을 나타내는 사진.4 to 7 are photographs showing the state after washing using a conventional cleaning sheet.
도 8 및 도 9은 본 발명의 일 실시예에 따른 세정시트를 이용하여 세정작업을 수행하는 모습을 나타내는 도면.8 and 9 are views showing a state in which a cleaning operation is performed using a cleaning sheet according to an embodiment of the present invention.
도 10은 도 8의 세정시트를 검사용 소켓에 밀착시켰을 때의 모습을 나타내는 도면.Fig. 10 is a view showing a state when the cleaning sheet of Fig. 8 is brought into close contact with an inspection socket.
도 11 내지 도 14는 도 8의 세정시트를 이용하여 세정하고 난 후의 모습을 나타내는 사진.11 to 14 are photographs showing a state after washing using the cleaning sheet of FIG. 8.
도 15 및 도 16는 본 발명의 다른 실시예에 따른 세정시트를 나타내는 도면.15 and 16 are views showing a cleaning sheet according to another embodiment of the present invention.
본 개시의 실시예들은 본 개시의 기술적 사상을 설명하기 위한 목적으로 예시된 것이다. 본 개시에 따른 권리범위가 이하에 제시되는 실시예들이나 이들 실시예들에 대한 구체적 설명으로 한정되는 것은 아니다.Embodiments of the present disclosure are illustrated for the purpose of describing the technical idea of the present disclosure. The scope of the rights according to the present disclosure is not limited to the embodiments presented below or specific descriptions of these embodiments.
본 개시에 사용되는 모든 기술적 용어들 및 과학적 용어들은, 달리 정의되지 않는 한, 본 개시가 속하는 기술분야에서 통상의 지식을 가진 자에게 일반적으로 이해되는 의미를 갖는다. 본 개시에 사용되는 모든 용어들은 본 개시를 더욱 명확히 설명하기 위한 목적으로 선택된 것이며 본 개시에 따른 권리범위를 제한하기 위해 선택된 것이 아니다.All technical and scientific terms used in the present disclosure have meanings generally understood by those of ordinary skill in the art, unless otherwise defined. All terms used in the present disclosure are selected for the purpose of more clearly describing the present disclosure, and are not selected to limit the scope of the rights according to the present disclosure.
본 개시에서 사용되는 "포함하는", "구비하는", "갖는" 등과 같은 표현은, 해당 표현이 포함되는 어구 또는 문장에서 달리 언급되지 않는 한, 다른 실시예를 포함할 가능성을 내포하는 개방형 용어(open-ended terms)로 이해되어야 한다.Expressions such as "comprising", "having", "having" and the like used in the present disclosure are open terms that imply the possibility of including other embodiments, unless otherwise stated in the phrase or sentence in which the expression is included. It should be understood as (open-ended terms).
본 개시에서 기술된 단수형의 표현은 달리 언급하지 않는 한 복수형의 의미를 포함할 수 있으며, 이는 청구범위에 기재된 단수형의 표현에도 마찬가지로 적용된다.Expressions in the singular form described in the present disclosure may include the meaning of the plural form unless otherwise stated, and the same applies to the expression in the singular form described in the claims.
본 개시에서, 어떤 구성요소가 다른 구성요소에 "연결되어" 있다거나 "접속되어" 있다고 언급된 경우, 상기 어떤 구성요소가 상기 다른 구성요소에 직접적으로 연결될 수 있거나 접속될 수 있는 것으로, 또는 새로운 다른 구성요소를 매개로 하여 연결될 수 있거나 접속될 수 있는 것으로 이해되어야 한다.In the present disclosure, when a component is referred to as being "connected" or "connected" to another component, the component may be directly connected to or connected to the other component, or It is to be understood that it may be connected or may be connected via other components.
또한, 본 개시에서, 대응된다는 의미는 2개의 구성들이 서로 동일한 형상과 모양을 가지는 것만을 의미하는 것이 아니라, 2개의 구성들이 서로 유사한 형상과 유사한 모양을 가지는 것을 모두 포함할 수 있으며, 이때 유사한 모양과 형상이란 기능적인 측면에서 동일한 효과를 가지는 범위 내에서 당업자가 쉽게 치환변경할 수 있는 것을 포함하는 것으로 이해되어야 한다.In addition, in the present disclosure, the meaning of correspondence does not mean only that the two components have the same shape and shape, but may include both components having a similar shape and a similar shape, and at this time, a similar shape It should be understood that the and shape include those that can be easily substituted and changed by those skilled in the art within a range having the same effect in terms of functionality.
이하, 첨부한 도면들을 참조하여, 실시예들을 설명한다. 첨부된 도면에서, 동일하거나 대응하는 구성요소에는 동일한 참조부호가 부여되어 있다. 또한, 이하의 실시예들의 설명에 있어서, 동일하거나 대응하는 구성요소를 중복하여 기술하는 것이 생략될 수 있다. 그러나 구성요소에 관한 기술이 생략되어도, 그러한 구성요소가 어떤 실시예에 포함되지 않는 것으로 의도되지는 않는다.Hereinafter, embodiments will be described with reference to the accompanying drawings. In the accompanying drawings, the same or corresponding elements are denoted with the same reference numerals. In addition, in the description of the following embodiments, overlapping descriptions of the same or corresponding components may be omitted. However, even if description of a component is omitted, it is not intended that such component is not included in any embodiment.
본 발명의 일 실시예에 따른 이물질 세정시트(10)는 피검사 디바이스의 전기적 검사를 수행하는데 사용되는 검사용 소켓(20)의 표면에 묻어 있는 이물질을 제거하기 위한 것이다. The foreign matter cleaning sheet 10 according to an embodiment of the present invention is for removing foreign matter from the surface of the test socket 20 used to perform an electrical test of a device to be tested.
이때 검사용 소켓(20)은, 피검사 디바이스의 단자와 대응되는 위치마다 다수의 도전성 입자가 실리콘 고무에 융합되어 두께방향으로 배열되는 복수의 도전부(21)와, 각각의 도전부(21)를 지지하면서 각 도전부(21)를 절연하기 위한 절연부(22)를 포함하는 것으로서 공지의 기술이므로 구체적인 설명은 생략한다.At this time, the test socket 20 includes a plurality of conductive parts 21 arranged in the thickness direction by fusion of a plurality of conductive particles with silicon rubber at each position corresponding to the terminal of the device under test, and each conductive part 21 It includes an insulating portion 22 for insulating each conductive portion 21 while supporting it, and since it is a known technique, a detailed description thereof will be omitted.
본 발명의 세정시트(10)는, 베이스 시트(11), 접착제층(12), 점착시트(13) 및 돌출점착부(14)를 포함하여 구성된다.The cleaning sheet 10 of the present invention includes a base sheet 11, an adhesive layer 12, an adhesive sheet 13, and a protruding adhesive portion 14.
상기 베이스 시트(11)는, 검사용 소켓(20)에서 이물질이 묻어 있는 표면과 대응되는 크기를 가지는 것으로서, 점착시트(13) 및 돌출점착부(14)를 지지하는 지지체로서 기능을 수행한다.The base sheet 11 has a size corresponding to the surface of the inspection socket 20 on which foreign substances are buried, and functions as a support for supporting the adhesive sheet 13 and the protruding adhesive portion 14.
베이스 시트(11)는 특별히 제한되지 않지만 PCB, 금속 또는 경질의 비금속소재로 이루어질 수 있다. 경질의 비금속소재로서는 예를 들면 폴리에틸렌, 폴리에틸렌 테레프탈레이트, 아세틸셀룰로오스, 폴리카보네이트, 폴리프로필렌, 폴리아미드 등의 플라스틱 필름 등을 들 수 있다. 베이스 시트(11)의 두께는 통상 0,05 ~ 2.0mm정도이다. The base sheet 11 is not particularly limited, but may be made of a PCB, a metal or a hard non-metal material. Examples of the hard non-metallic material include plastic films such as polyethylene, polyethylene terephthalate, acetyl cellulose, polycarbonate, polypropylene, and polyamide. The thickness of the base sheet 11 is usually about 0,05 to 2.0 mm.
상기 접착제층(12)은, 점착시트(13)를 베이스 시트(11)의 일면에 부착시키기 위한 것으로서, 통상적으로 널리 활용되는 접착제라면 무엇이나 가능하다. 이러한 접착제층(12)에 의하여 점착시트(13)가 상기 베이스 시트(11)에 확실하게 부착될 수 있다.The adhesive layer 12 is for attaching the adhesive sheet 13 to one surface of the base sheet 11, and any adhesive that is generally widely used may be used. The adhesive sheet 13 can be reliably attached to the base sheet 11 by the adhesive layer 12.
상기 점착시트(13)는, 상기 접착제층(12)에 의하여 상기 베이스 시트(11)의 일면에 부착되고 검사용 소켓(20)의 표면에 묻어 있는 이물질을 제거할 수 있도록 점착력을 가지는 것이다. 점착시트(13)는, 검사용 소켓(20)의 절연부(22)에 접촉되어 절연부(22)에 묻어 있는 이물질을 제거할 수 있다. 구체적으로 점착시트(13)에서 절연부(22)와 대응되는 위치에는 평면점착부가 마련되고, 평면점착부에는 절연부(22) 표면에 묻어 있는 이물질이 제거될 수 있게 된다.The adhesive sheet 13 is attached to one surface of the base sheet 11 by the adhesive layer 12 and has adhesive strength so as to remove foreign substances on the surface of the test socket 20. The adhesive sheet 13 may be in contact with the insulating part 22 of the inspection socket 20 to remove foreign substances that are buried in the insulating part 22. Specifically, in the adhesive sheet 13, a flat adhesive portion is provided at a position corresponding to the insulating portion 22, and foreign substances buried on the surface of the insulating portion 22 can be removed at the flat adhesive portion.
상기 점착시트(13)는 이물질을 부착할 수 있는 한 특별히 제한되지 않지만 특히 그 표면 저항률이 1×1013 Ω 이상이면 특히 그 재료 등은 한정되지 않는다. 점착시트(13)의 표면 저항률을 이러한 특정값 이상이 되도록 설계하여 점착시트(13)을 가능한 한 절연체로 함으로써 정전기에 의한 이물질의 포획, 흡착도 할 수 있다고 하는 효과를 얻을 수 있다. 따라서, 표면 저항률이 1×1013 Ω미만일 경우는 이물질 제거 성능이 저하할 우려가 있다. The pressure-sensitive adhesive sheet 13 is not particularly limited as long as it is capable of attaching foreign substances, but in particular, if its surface resistivity is 1×10 13 Ω or more, the material and the like are not particularly limited. By designing the pressure-sensitive adhesive sheet 13 to have a surface resistivity equal to or higher than this specific value, and making the pressure-sensitive adhesive sheet 13 an insulator as much as possible, the effect of trapping and adsorbing foreign substances by static electricity can be obtained. Therefore, when the surface resistivity is less than 1×10 13 Ω, there is a concern that the performance of removing foreign matters may deteriorate.
이러한 점착시트(13)는 바람직하게는 그 표면 저항률이 상기 범위 내인 한 그 재료 등은 특별히 제한되지 않지만 도전 기능을 가지는 첨가제 등의 도전성 물질을 포함하지 않는 것이 바람직하다. 예를 들면 자외선이나 열 등의 활성 에너지원에 의해 가교 반응이나 경화가 촉진되고, 그 인장 탄성률을 크게 할 수 있는 것이 바람직하다. As long as the surface resistivity of the pressure-sensitive adhesive sheet 13 is within the above range, the material or the like is not particularly limited, but it is preferable that the adhesive sheet 13 does not contain a conductive material such as an additive having a conductive function. For example, it is preferable that the crosslinking reaction and curing are promoted by an active energy source such as ultraviolet rays or heat, and that the tensile modulus of elasticity can be increased.
상기 점착시트(13)의 인장 탄성률(시험법 JIS K7127에 준한다)은 0.98 ~ 4900 N/cm2, 바람직하게는 9.8 ~ 3000 N/cm2가 바람직하다. 점착시트(13)의 인장 탄성률을 이러한 특정 범위 내에 설계함으로써, 반송 트러블을 발생시키지 않고 이물질을 더욱 확실하게 제거할 수 있다. The tensile modulus of the pressure-sensitive adhesive sheet 13 (according to the test method JIS K7127) is 0.98 to 4900 N/cm 2 , preferably 9.8 to 3000 N/cm 2 . By designing the tensile modulus of the pressure-sensitive adhesive sheet 13 within such a specific range, foreign matter can be more reliably removed without causing a transport problem.
또한, 이러한 가교나 경화에 의해 분자 구조가 삼차원 망형화해 그 점착력이 저하한 점착제가 바람직하고 예를 들면 실리콘 웨이퍼(미러면)에 대한 180박리 점착력이 0.20N(20g)/10 mm이하, 바람직하게는 0.010 ~ 0.10N(1~10g)/10 mm정도이다. 이 점착력이 0.20N(20g)/mm를 초과하면, 이송 시에 장치 내의 피클리닝부에 접착하여 반송 트러블이 될 우려가 있다. In addition, a pressure-sensitive adhesive in which the molecular structure is formed into a three-dimensional network by crosslinking or curing and its adhesion is lowered is preferable. For example, the adhesive force of 180 peeling to the silicon wafer (mirror surface) is 0.20 N (20 g) / 10 mm or less, preferably Is about 0.010 ~ 0.10N (1 ~ 10g) / 10 mm. If this adhesive force exceeds 0.20 N (20 g)/mm, there is a fear that it adheres to the part to be cleaned in the device during transport, resulting in a transport problem.
이러한 점착시트(13)의 구체적인 예로서는 예를 들면 감압 접착성 폴리머에 분자 내에 불포화 이중 결합을 하나 이상 가지는 화합물을 함유시켜서 이루어지는 것이 바람직하다. As a specific example of such an adhesive sheet 13, it is preferable that, for example, a pressure-sensitive adhesive polymer contains a compound having one or more unsaturated double bonds in the molecule.
또한, 이러한 감압 접착성 폴리머로서는 예를 들면 아크릴산, 아크릴산 에스테르, 메타크릴산, 메타크릴산 에스테르에서 선택되는(메타) 아크릴산 및/또는(메타) 아크릴산 에스테르를 주모노머로 한 아크릴계 폴리머를 들 수 있다. 이 아크릴계 폴리머의 합성 시, 공중합 모노머로서 분자 내에 불포화 이중 결합을 2개 이상 가지는 화합물을 이용하거나, 혹은 합성 후의 아크릴계 폴리머에 분자 내에 불포화 이중 결합을 가지는 화합물을 작용기 간의 반응으로 화학 결합시키는 등, 아크릴계 폴리머의 분자 내에 불포화 이중 결합을 도입해 둠으로써, 이 폴리머 자체도 활성 에너지에 의해 중합 경화 반응에 관여시키도록 할 수도 있다.In addition, examples of such pressure-sensitive adhesive polymers include acrylic polymers containing (meth) acrylic acid and/or (meth) acrylic acid ester selected from acrylic acid, acrylic acid ester, methacrylic acid, and methacrylic acid ester as the main monomer. . When synthesizing this acrylic polymer, a compound having two or more unsaturated double bonds in the molecule is used as a copolymerization monomer, or a compound having an unsaturated double bond in the molecule is chemically bonded to the synthesized acrylic polymer through a reaction between functional groups. By introducing an unsaturated double bond in the molecule of the polymer, the polymer itself can also be involved in the polymerization and curing reaction by active energy.
여기서 분자 내에 불포화 이중 결합을 하나 이상 가지는 화합물(이하, 중합성 불포화 화합물이라고 한다)로서는 비휘발성이며 중량 평균 분자량이 10000 이하의 저분자량체인 것이 좋고 특히 경화 시의 점착제층의 삼차원 망형화가 효율적으로 되도록, 5000 이하의 분자량을 가지고 있는 것이 바람직하다. Here, the compound having at least one unsaturated double bond in the molecule (hereinafter referred to as a polymerizable unsaturated compound) is preferably a nonvolatile and low molecular weight having a weight average molecular weight of 10000 or less. , It is preferable to have a molecular weight of 5000 or less.
또한 점착시트(13)에 첨가되는 중합 개시제는 특별히 제한되지 않고 공지의 것을 사용할 수 있고 예를 들면 활성 에너지원에 열을 이용할 경우에는 벤조일 퍼옥사이드, 아조비스 이소부티로니트릴 등의 열중합 개시제, 또한 광을 이용할 경우에는 벤조일, 벤조인 에틸에테르, 시벤질, 이소프로필 벤조인에테르, 벤조페논, 미히라즈케톤크로로치오키산톤, 도데실 티오 키산톤, 디메틸티옥산톤, 아세토페논 디에틸 케탈, 벤질디메틸케탈, -히드르키시시크로히키시르페니르케톤,2-하이드록시디메틸페닐 프로판, 2,2-디메톡시-2-페닐아세토페논 등의 광중합 개시제를 들 수 있다. In addition, the polymerization initiator added to the adhesive sheet 13 is not particularly limited, and a known one can be used. For example, when heat is used as an active energy source, a thermal polymerization initiator such as benzoyl peroxide and azobis isobutyronitrile, In addition, in the case of using light, benzoyl, benzoin ethyl ether, cybenzyl, isopropyl benzoin ether, benzophenone, mihiraz ketone chromothioxanthone, dodecyl thioxanthone, dimethyl thioxanthone, acetophenone diethyl ketal , Benzyl dimethyl ketal, -hydroxycyclohikisirphenirketone, 2-hydroxydimethylphenyl propane, 2,2-dimethoxy-2-phenylacetophenone, and other photoinitiators.
상기 돌출점착부(14)는, 상기 점착시트(13)에서 검사용 소켓(20)의 도전부(21)와 대응되는 위치마다 마련되며, 상기 점착시트(13)의 표면에서 돌출되고 반구형상을 가지면서 점착력이 있는 것이다. 구체적으로 돌출점착부(14)는 점착시트(13)의 표면에서 돌출되어 형성되는 것으로서, 도전부(21)와 대응되는 위치마다 배치되고 도전부(21)와 접촉하여 도전부(21)의 상면에 묻어 있는 이물질을 제거하기 위한 것이다.The protruding adhesive portion 14 is provided at each position corresponding to the conductive portion 21 of the test socket 20 in the adhesive sheet 13, and protrudes from the surface of the adhesive sheet 13 and has a hemispherical shape. It has adhesive power while having it. Specifically, the protruding adhesive portion 14 is formed to protrude from the surface of the adhesive sheet 13, and is disposed at each position corresponding to the conductive portion 21 and is in contact with the conductive portion 21 to form the upper surface of the conductive portion 21 It is to remove foreign substances on the surface
이러한 돌출점착부(14)는 점착시트(13)와는 다른 소재로 이루어질 수 있으며, 구체적으로는 점착시트(13)보다 경도가 낮으면서 탄성력이 좋아서 쉽게 탄성변형될 수 있는 소재로 이루어질 수 있다. 또한, 돌출점착부(14)는 점착시트(13)보다 점착력이 높아서 도전부(21)에 묻어 있는 이물질을 쉽게 제거할 수 있다. 한편, 돌출점착부(14)는 점착시트(13)와 동일한 소재로 이루어질 수 있으나, 이때에도 경도나 점착력은 다르게 하는 것이 바람직하다. 예를 들어 돌출점착부(14)와 점착시트(13)가 모두 실리콘 고무로 이루어지는 것이 가능하나, 이때에도 돌출점착부(14)는 경도, 탄성력, 점착력면에서 점착시트(13)와 다른 물성을 가지는 실리콘 고무가 적용되는 것이 가능하다.The protruding adhesive portion 14 may be made of a material different from the pressure-sensitive adhesive sheet 13, and specifically, may be made of a material that can be easily elastically deformed because it has a lower hardness than the pressure-sensitive adhesive sheet 13 and has good elasticity. In addition, the protruding adhesive portion 14 has higher adhesive strength than the adhesive sheet 13, so that foreign matters adhering to the conductive portion 21 can be easily removed. On the other hand, the protruding adhesive portion 14 may be made of the same material as the adhesive sheet 13, but in this case, it is preferable to have different hardness or adhesive strength. For example, it is possible for both the protruding adhesive portion 14 and the adhesive sheet 13 to be made of silicone rubber, but even at this time, the protruding adhesive portion 14 has different physical properties from the adhesive sheet 13 in terms of hardness, elasticity, and adhesive force. It is possible for eggplants to be applied with silicone rubber.
이러한 돌출점착부(14)는, 소정의 가압장치에 의하여 세정시트(10)를 검사용 소켓(20)에 가압하였을 때, 도전부(21)와 접촉하면서 눌리게 된다. 이와 같이 돌출점착부(14)가 눌리게 되면, 점착시트(13)는 볼면적이 좌우방향으로 확대되면서 최초 접촉면적보다 가압에 의하여 도전부(21)와 접촉되는 면적이 커지게 되고, 이에 따라서 도전부(21) 뿐 아니라 도전부(21)의 주변부분까지 면적이 확대될 수 있다. 돌출점착부(14)가 도전부(21)와 도전부(21) 주변부까지 면적이 확대됨으로서 도전부(21), 도전부(21)의 주변부에 묻어 있는 이물질을 확실하게 부착시킬 수 있다.When the cleaning sheet 10 is pressed against the inspection socket 20 by a predetermined pressing device, the protruding adhesive portion 14 is pressed while contacting the conductive portion 21. When the protruding adhesive part 14 is pressed in this way, the ball area of the adhesive sheet 13 is enlarged in the left and right direction, and the area in contact with the conductive part 21 is increased by pressing rather than the initial contact area. An area may be enlarged not only to the conductive part 21 but also to a peripheral part of the conductive part 21. As the area of the protruding adhesive portion 14 is enlarged to the conductive portion 21 and the peripheral portion of the conductive portion 21, foreign matters buried in the peripheral portion of the conductive portion 21 and the conductive portion 21 can be reliably attached.
특히, 종래의 평면형 시트에서는 세정시트(10)에 가해지는 가압력이 면전체에 가해져서 과도한 가압력을 가하지 않는 이상 도전부(21)에 가해지는 가압력을 크게 할 수 없었으나, 본 발명에서는 점착시트(13)의 표면에서 돌출된 돌출점착부(14)에 가압력이 집중됨으로서 돌출점착부(14)에 의하여 접촉되는 부분, 즉, 도전부(21)와 그 인접부에 대해서는 보다 확실한 가압력에 의하여 이물질을 확실하게 부착시킬 수 있게 되는 것이다.In particular, in the conventional flat sheet, the pressing force applied to the cleaning sheet 10 is applied to the entire surface, so that the pressing force applied to the conductive part 21 cannot be increased unless excessive pressing force is applied. However, in the present invention, the pressure sensitive adhesive sheet ( As the pressing force is concentrated on the protruding adhesive portion 14 protruding from the surface of 13), the portion that is in contact with the protruding adhesive portion 14, that is, the conductive portion 21 and its adjacent portions, removes foreign matter by a more reliable pressing force. It will be able to attach it securely.
또한 돌출점착부(14)는 가압력에 의하여 구형상의 볼면적이 확대되면서 검사용 소켓(20)의 도전부(21)에 밀착접촉되는데, 세정시트(10)에 가해진 가압력을 제거하면 구형상의 볼면적이 원래상태로 복원되면서 탄성복원력에 의하여 검사용 소켓(20)을 밀어내는 기능도 수행하게 된다. 특히, 구형상의 특성상 볼면적의 확대 및 축소면적이 다른 형상에 비해서 크기 때문에, 탄성복원력이 매우 우수하여 돌출점착부(14)의 점착력이 강해도 돌출점착부(14)의 탄성복원력에 의하여 검사용 소켓(20)으로부터 세정시트(10)가 쉽게 분리될 수 있게 된다.In addition, the protruding adhesive portion 14 is in close contact with the conductive portion 21 of the inspection socket 20 as the spherical ball area is enlarged by the pressing force. When the pressing force applied to the cleaning sheet 10 is removed, the spherical ball area While restoring to this original state, the function of pushing the socket for inspection 20 by the elastic restoring force is also performed. In particular, since the expansion and reduction area of the ball area is larger than other shapes due to the characteristic of the spherical shape, the elastic restoration force is very excellent, and even if the adhesive force of the protruding adhesive portion 14 is strong, the socket for inspection by the elastic restoration force of the protruding adhesive portion 14 The cleaning sheet 10 can be easily separated from the 20.
한편, 본 발명에서는 돌출점착부(14)의 경도가 점착시트(13)보다 낮아서 탄성변형이 용이하기 때문에, 도전부(21)에 접촉되었을 때 면적의 확대가 용이하고, 또한 탄성복원력이 보다 우수하게 된다. 또한, 점착시트(13)의 경도를 돌출점착부(14)보다 높게 함으로서, 돌출점착부(14)를 지지하는 지지력이 커지게 되어 돌출점착부(14)가 도전부(21)에 접촉하여 가압되었을 때 쉽게 탄성변형될 수 있게 돌출점착부(14)를 지지한다.On the other hand, in the present invention, since the hardness of the protruding adhesive portion 14 is lower than that of the adhesive sheet 13, it is easy to elastically deform, so when it comes into contact with the conductive portion 21, it is easy to expand the area, and the elastic restoration force is more excellent It is done. In addition, by making the hardness of the adhesive sheet 13 higher than that of the protruding adhesive portion 14, the supporting force for supporting the protruding adhesive portion 14 increases, so that the protruding adhesive portion 14 contacts and presses the conductive portion 21. It supports the protruding adhesive part 14 so that it can be easily elastically deformed when it is formed.
한편, 돌출점착부(14)의 형상은 검사용 소켓의 도전부와 동일한 단면형상을 가지면 탄성반발력이 우수한 반구형이 가장 적합하나 기타 다양한 형상이 가능하다. 예를 들어, 돌출점착부(14)의 형상은 알약형, 원기둥형, 다각기둥형, 원뿔형, 다각뿔형, 원뿔대형, 다각뿔대형 등 가압과정에서 면적이 확대되고 이에 따라서 탄성반발력에 의하여 분리를 용이하게 하는 형상이라면 다양하게 적용될 수 있다. On the other hand, if the shape of the protruding adhesive portion 14 has the same cross-sectional shape as the conductive portion of the inspection socket, a hemispherical shape having excellent elastic repulsion is most suitable, but various other shapes are possible. For example, the shape of the protruding adhesive portion 14 is a pill type, a cylinder type, a polygonal column type, a cone type, a polygonal pyramid type, a cone type, a polygonal pyramid type, etc. The area is enlarged during the pressing process, and accordingly, it is easy to separate by the elastic repulsion force. It can be applied in various ways if it is a shape that allows you to
이러한 본 발명의 일 실시예에 따른 세정시트(10)는 다음과 같은 작용효과를 가진다.The cleaning sheet 10 according to an embodiment of the present invention has the following effects.
먼저, 도 8에 도시된 바와 같이 반복된 검사과정에서 이물질이 표면에 많이 묻어 있는 검사용 소켓(20) 위에 세정시트(10)를 위치시킨다.First, as shown in FIG. 8, the cleaning sheet 10 is placed on the inspection socket 20 where foreign substances are stained on the surface during the repeated inspection process.
이후에, 도 9에 도시된 바와 같이 세정시트(10)를 검사용 소켓(20)의 표면에 접촉하면서 가압하게 된다. 이때 세정시트(10)의 가압은 별도의 가압장치(미도시)에 의하여 이루어지도록 한다. 세정시트(10)를 가압하는 경우, 점착시트(13)에서 돌출된 돌출점착부(14)가 도전부(21)에 접촉하게 되고, 이때 점착시트(13)에 의하여 지지된 돌출점착부(14)는 그 면적이 좌우방향으로 넓어지면서 도전부(21)와 도전부(21) 주변까지 면적이 확대된다. 한편, 세정시트(10)를 추가적으로 가압하게 되면 도 10에 도시된 바와 같이 점착시트(13)도 검사용 소켓(20)의 절연부(22)에 접촉할 수 있다.Thereafter, as shown in FIG. 9, the cleaning sheet 10 is pressed while contacting the surface of the inspection socket 20. At this time, the pressing of the cleaning sheet 10 is performed by a separate pressing device (not shown). When pressing the cleaning sheet 10, the protruding adhesive portion 14 protruding from the adhesive sheet 13 comes into contact with the conductive portion 21, and at this time, the protruding adhesive portion 14 supported by the adhesive sheet 13 ), the area is expanded to the periphery of the conductive part 21 and the conductive part 21 as the area is widened in the left and right direction. On the other hand, when the cleaning sheet 10 is additionally pressed, the adhesive sheet 13 may also contact the insulating part 22 of the test socket 20 as shown in FIG. 10.
한편, 세정시트(10)를 가압하게 되면, 도전부(21)와 도전부(21)의 주변은 눌려진 돌출점착부(14)의 표면에 접촉하게 되고, 이 과정에서 점착력이 좋은 돌출점착부(14)가 도전부(21)와 도전부(21) 주변에 묻어 있는 이물질을 확실하게 제거할 수 있게 된다.On the other hand, when the cleaning sheet 10 is pressed, the conductive part 21 and the periphery of the conductive part 21 come into contact with the surface of the pressed protruding adhesive part 14, and in this process, the protruding adhesive part ( 14) It is possible to reliably remove foreign matters buried around the conductive part 21 and the conductive part 21.
먼저, 구체적으로 도 11 내지 도 14에서는 본 발명의 세정시트(10)를 이용하여 검사용 소켓(20)을 세정한 모습을 나타내고 있다. 도 11 및 도 12는 점착력이 낮은 세정시트(10)를 사용한 경우로서, 도 11는 세정후의 세정시트(10)의 표면을 촬영한 것이고, 도 12는 검사용 소켓(20)의 표면을 촬영한 것이다. 또한, 도 13 및 도 14는 점착력이 높은 세정시트(10)를 사용한 경우로서, 도 13은 세정후의 세정시트(10)의 표면을 촬영한 것이고, 도 14는 검사용 소켓(20)의 표면을 촬영한 것이다.First, specifically, FIGS. 11 to 14 show a state in which the inspection socket 20 is cleaned using the cleaning sheet 10 of the present invention. 11 and 12 are a case in which the cleaning sheet 10 having low adhesive strength is used, and FIG. 11 is a photograph of the surface of the cleaning sheet 10 after cleaning, and FIG. 12 is a photograph of the surface of the inspection socket 20 will be. In addition, FIGS. 13 and 14 show a case of using the cleaning sheet 10 having high adhesive strength, and FIG. 13 is a photograph of the surface of the cleaning sheet 10 after cleaning, and FIG. 14 shows the surface of the inspection socket 20. It was filmed.
먼저, 도 11을 통해서 확인되는 바와 같이, 점착력이 낮은 세정시트(10)를 사용한 경우에도 볼에는 많은 양의 이물질이 묻어 있다는 것을 확인할 수 있으며, 도 12를 통해서 확인되는 바와 같이, 도전부(21)와 그 주변에는 이물질이 제거된 모습이 확인되었다. First, as confirmed through FIG. 11, even when the cleaning sheet 10 having low adhesive strength is used, it can be confirmed that a large amount of foreign matter is buried in the ball. As confirmed through FIG. 12, the conductive part 21 ) And its surroundings were confirmed to have foreign substances removed.
또한, 도 13에서 확인되는 바와 같이, 점착력이 높은 세정시트(10)를 사용한 경우에도 돌출점착부(14) 주변에 많은 양의 이물질이 묻어 있는 것이 확인되고, 도 14에서 볼 수 있는 바와 같이, 검사용 소켓(20)의 도전부(21)와, 도전부(21) 주변에는 이물질이 거의 남아 있지 않은 것을 확인할 수 있다.In addition, as shown in FIG. 13, even when the cleaning sheet 10 having high adhesive strength was used, it was confirmed that a large amount of foreign matter was buried around the protruding adhesive portion 14, and as can be seen in FIG. 14, It can be seen that almost no foreign matter remains around the conductive part 21 and the conductive part 21 of the test socket 20.
도 11, 도 12와 도 13, 도 14를 서로 비교하면 점착력이 높은 세정시트를 사용한 경우가 점착력이 낮은 세정시트를 사용한 경우보다 이물질의 제거능력면에서 더 유리하다는 점을 알 수 있다, 이를 통해 세정능력은 점착시트의 점착력, 돌출점착부의 유무, 돌출점착부의 점착력이 복합적으로 작용한다는 점을 알 수 있다. 한편, 세정능력만 고려하여 점착력을 상당하게 높이는 것은 바람직하지 않다. 그 이유는 점착력이 높으면 세정능력면에서는 우수하나 세정시트를 검사용 소켓으로부터 제거하는 것이 쉽지 않기 때문이다. 따라서 검사용 소켓에서 제거가 용이하면서도 세정능력이 우수한 적절한 점착도를 유지하는 것이 중요하다.When comparing FIGS. 11, 12, 13, and 14 with each other, it can be seen that the case of using the cleaning sheet having high adhesive strength is more advantageous in terms of the ability to remove foreign substances than the case of using the cleaning sheet having low adhesive strength. As for the cleaning ability, it can be seen that the adhesive force of the adhesive sheet, the presence or absence of the protruding adhesive portion, and the adhesive force of the protruding adhesive portion act in combination. On the other hand, it is not desirable to considerably increase the adhesive strength by considering only the cleaning ability. The reason is that high adhesion is excellent in cleaning ability, but it is not easy to remove the cleaning sheet from the inspection socket. Therefore, it is important to maintain proper adhesion with excellent cleaning ability while being easy to remove from the inspection socket.
결국, 종래의 세정시트(10)를 사용하여 세정작업을 수행한 모습(도 4, 도 5)와 대비하였을 때 본 발명에 따른 세정시트(10)를 사용하는 경우에는 도전부(21)와 그 주변이 확실하게 이물질이 제거되는 것을 확인할 수 있다.As a result, when the cleaning sheet 10 according to the present invention is used as compared to the state in which the cleaning operation is performed using the conventional cleaning sheet 10 (Figs. 4 and 5), the conductive part 21 and its It can be seen that the foreign matter is removed reliably around the area.
종래기술에서는 도전부와 그 주변의 이물질이 잘 제거되지 않았던 것에 비하여 본 발명의 세정시트를 이용하는 경우에는 도전부와 그 주변은 보다 확실하게 이물질이 제거됨을 알 수 있다.It can be seen that in the prior art, the conductive portion and the foreign matter around it were not easily removed, whereas when the cleaning sheet of the present invention was used, the conductive portion and the surrounding foreign matter were more reliably removed.
한편, 본 발명은 이물질 제거능력과 아울러 높은 점착력을 가지는 돌출점착부를 사용해도 점착력이 높은 면적이 작아서 검사용 소켓으로부터 쉽게 분리될 수 있다.On the other hand, in the present invention, even when a protruding adhesive portion having a high adhesive force as well as a foreign substance removal ability is used, the area having a high adhesive force is small, so that it can be easily separated from the inspection socket.
또한, 종래의 세정시트는 가압해도 변형면적에 한계가 있었으나, 본 발명에서는 점착시트는 지지대로서 기능하고, 돌출점착부는 점착시트에 지지되어 확실하게 탄성변형되면서 보다 확실한 탄성변형되고, 또한 탄성변형된 후에는 탄성복원력이 우수하기 때문에, 그 탄성복원력이 검사용 소켓으로부터 세정시트를 쉽게 분리할 수 있게 작용하는 장점이 있게 된다.In addition, although the conventional cleaning sheet had a limit on the deformable area even when pressed, in the present invention, the adhesive sheet functions as a support, and the protruding adhesive portion is supported by the adhesive sheet to reliably elastically deform, resulting in more reliable elastic deformation, and also elastic deformation. Later, since the elastic restoring force is excellent, the elastic restoring force has the advantage of acting to easily separate the cleaning sheet from the inspection socket.
결국, 본 발명에 따른 세정시트를 사용하는 경우에는 도전부와 그 주변의 이물질을 보다 확실하게 제거할 수 있을 뿐 아니라, 돌출점착부의 탄성복원력에 의하여 쉽게 분리될 수 있는 장점을 가진다.As a result, when the cleaning sheet according to the present invention is used, it is possible to more reliably remove the conductive part and the foreign matter around it, and it has the advantage that it can be easily separated by the elastic restoring force of the protruding adhesive part.
이러한 본 발명의 세정시트는 다음과 같이 변형되는 것이 가능하다.The cleaning sheet of the present invention can be modified as follows.
일반적으로 세정시트와 검사용 소켓은 1회가 아닌 반복적인 접촉에 의하여 세정작업을 수행하게 되는데, 이러한 반복적인 접촉과정에서 정전기가 발생하여 세정시트가 검사용 소켓에 달라붙는 현상이 발생하는 경우가 있게 된다.In general, the cleaning sheet and the inspection socket are cleaned by repeated contact instead of once.In this repeated contact process, static electricity is generated, causing the cleaning sheet to stick to the inspection socket. There will be.
이러한 정전기력에 의해 달라붙는 현상이 발생하게 되면 세정시트를 검사용 소켓으로부터 분리하는 것이 어렵게 되어 세정시간을 지연시키는 요인이 된다.When the sticking phenomenon occurs due to such an electrostatic force, it becomes difficult to separate the cleaning sheet from the inspection socket, which causes a delay in cleaning time.
본 발명의 변형실시예에서는 도 15에 도시된 바와 같이, 구리와 같은 소재로 이루어지는 정전기 방지시트를 추가로 배치하게 된다.In a modified embodiment of the present invention, as shown in FIG. 15, an antistatic sheet made of a material such as copper is additionally disposed.
구체적으로 본 발명의 세정시트(10')는 베이스 시트(11'), 접착제층(12') 및 점착시트(13')에 추가로 상기 베이스 시트(11')과 점착시트(13')의 사이에 정전기 방지시트(15')를 마련하게 된다. 점착시트(13')는 접착제층(12')에 의하여 상기 정전기 방지시트(15')에 부착되어 있게 된다. 이와 같이 점착시트(13')에 정전기 방지시트(15')가 마련되는 경우에는 반복되는 검사용 소켓(20)과의 접촉에 의하여 유발되는 정전기에 의하여 점착시트(13')가 검사용 소켓에 달라붙는 것을 방지할 수 있다.Specifically, the cleaning sheet 10 ′ of the present invention includes the base sheet 11 ′ and the adhesive sheet 13 ′ in addition to the base sheet 11 ′, the adhesive layer 12 ′, and the adhesive sheet 13 ′. An antistatic sheet 15' is provided between them. The adhesive sheet 13 ′ is attached to the antistatic sheet 15 ′ by an adhesive layer 12 ′. When the antistatic sheet 15 ′ is provided on the adhesive sheet 13 ′ as described above, the adhesive sheet 13 ′ is transferred to the test socket due to static electricity caused by contact with the repeated test socket 20. It can prevent sticking.
도 16는 도 15의 세정시트에 돌출점착부를 추가로 형성한 것을 예시한다. 이와 같이 돌출점착부(14'')과, 정전기 방지시트(15'')를 함께 마련하는 경우에는 정전기력을 제거함으로서 세정시트(10'')가 검사용 소켓에 달라붙는 것을 보다 확실하게 방지할 수 있게 된다.16 illustrates that a protruding adhesive portion is additionally formed on the cleaning sheet of FIG. 15. When the protruding adhesive part (14'') and the antistatic sheet (15'') are provided in this way, it is possible to more reliably prevent the cleaning sheet (10'') from sticking to the inspection socket by removing the electrostatic force. You will be able to.
한편, 상술한 실시예에서는 점착시트와 돌출점착부가 다른 소재로 이루어지는 것을 예시하였다. 그러나 이에 한정되는 것은 아니며 점착시트와 돌출점착부가 서로 동일한 소재로 이루어지는 것이 가능하다. 예를 들어 동일한 물성을 가지는 실리콘 고무로 이루어지는 것이 가능하므로, 경도와, 점착력이 모두 동일한 실리콘 고무를 이용하여 점착시트와 돌출점착부를 구성하는 것이 가능하다.Meanwhile, in the above-described embodiment, it is exemplified that the adhesive sheet and the protruding adhesive portion are made of different materials. However, the present invention is not limited thereto, and the adhesive sheet and the protruding adhesive portion may be made of the same material. For example, since it is possible to be made of silicone rubber having the same physical properties, it is possible to configure the adhesive sheet and the protruding adhesive portion using silicone rubber having the same hardness and adhesive strength.
이상에서 바람직한 실시예를 들어 본 발명을 상세하게 설명하였으나, 본 발명은 반드시 이러한 실시예들 및 변형예에 한정되는 것은 아니고 본 발명의 기술사상을 벗어나지 않는 범위 내에서 다양하게 변형 실시될 수 있다.Although the present invention has been described in detail with reference to a preferred embodiment above, the present invention is not necessarily limited to these embodiments and modifications, and various modifications may be made without departing from the spirit of the present invention.

Claims (16)

  1. 피검사 디바이스의 단자와 대응되는 위치마다 다수의 도전성 입자가 실리콘 고무에 융합되어 두께방향으로 배열되는 복수의 도전부와, 각각의 도전부를 지지하면서 각 도전부를 절연하기 위한 절연부를 가지는 검사용 소켓에 사용되며,In the test socket having a plurality of conductive parts arranged in the thickness direction by fusion of a number of conductive particles at each position corresponding to the terminal of the device under test, and an insulating part for insulating each conductive part while supporting each conductive part. Is used,
    상기 검사용 소켓의 표면에 묻어 있는 이물질을 제거하기 위한 이물질 세정시트에 있어서,In the foreign matter cleaning sheet for removing foreign matter adhering to the surface of the inspection socket,
    검사용 소켓에서 이물질이 묻어 있는 표면과 대응되는 크기를 가지는 베이스 시트;A base sheet having a size corresponding to a surface on which foreign substances are buried in the inspection socket;
    상기 베이스 시트의 일면에 배치되고 검사용 소켓의 표면에 묻어 있는 이물질을 제거할 수 있도록 점착력을 가지는 점착시트; 및A pressure-sensitive adhesive sheet disposed on one surface of the base sheet and having adhesive strength to remove foreign matters adhering to the surface of the test socket; And
    상기 점착시트에서 검사용 소켓의 도전부와 대응되는 위치마다 마련되며, 상기 점착시트의 표면에서 돌출되고 점착력이 있는 돌출점착부를 포함하는 것을 특징으로 하는 검사용 소켓의 이물질 세정시트.The foreign matter cleaning sheet of the inspection socket, wherein the adhesive sheet is provided at each position corresponding to the conductive portion of the inspection socket, and includes a protruding adhesive portion protruding from the surface of the adhesive sheet and having adhesive force.
  2. 제1항에 있어서,The method of claim 1,
    상기 점착시트와 상기 돌출점착부는 서로 다른 소재로 이루어지되, 상기 돌출점착부는, 상기 점착시트보다 경도가 낮고 탄성력이 좋은 소재로 이루어지는 것을 특징으로 하는 검사용 소켓의 이물질 세정시트.The adhesive sheet and the protruding adhesive part are made of different materials, and the protruding adhesive part is made of a material having a lower hardness and higher elasticity than the adhesive sheet.
  3. 제2항에 있어서,The method of claim 2,
    상기 돌출점착부는, 상기 점착시트보다 점착력이 높은 소재로 이루어지는 것을 특징으로 하는 검사용 소켓의 이물질 세정시트.The protruding adhesive portion, the foreign matter cleaning sheet of the inspection socket, characterized in that made of a material having a higher adhesive strength than the adhesive sheet.
  4. 제1항에 있어서,The method of claim 1,
    상기 돌출점착부는 도전부와 접촉시 탄성변형되어 접촉면적이 커지면서 도전부의 표면과 도전부의 주변 표면에 묻어 있는 이물질을 제거하는 것을 특징으로 하는 검사용 소켓의 이물질 세정시트.The protruding adhesive portion is elastically deformed when in contact with the conductive portion, thereby increasing the contact area, thereby removing foreign matter from the surface of the conductive portion and the peripheral surface of the conductive portion.
  5. 제1항에 있어서,The method of claim 1,
    상기 점착시트에서 절연부와 대응되는 위치에는 평면점착부가 마련되고, 상기 절연부의 표면에 묻어 있는 이물질은 상기 평면점착부에 의하여 제거되는 것을 특징으로 하는 검사용 소켓의 이물질 세정시트.A foreign matter cleaning sheet for an inspection socket, wherein a flat adhesive portion is provided at a position corresponding to the insulating portion in the adhesive sheet, and foreign matters buried on the surface of the insulating portion are removed by the flat adhesive portion.
  6. 제1항에 있어서,The method of claim 1,
    상기 베이스 시트는, PCB, 금속 또는 경질의 비금속소재로 이루어지는 것을 특징으로 하는 검사용 소켓의 이물질 세정시트.The base sheet is a cleaning sheet for foreign matter of the inspection socket, characterized in that the PCB, metal or hard non-metallic material.
  7. 제1항에 있어서,The method of claim 1,
    상기 점착시트는 고무 또는 실리콘인 것을 특징으로 하는 검사용 소켓의 이물질 세정시트.The adhesive sheet is a foreign matter cleaning sheet of the inspection socket, characterized in that the rubber or silicone.
  8. 제1항에 있어서,The method of claim 1,
    상기 베이스 시트의 일면 또는 타면에는 정전기 방지를 위한 정전기 방지시트가 배치되어 있는 것을 특징으로 하는 검사용 소켓의 이물질 세정시트.A foreign matter cleaning sheet for an inspection socket, wherein an antistatic sheet for preventing static electricity is disposed on one side or the other side of the base sheet.
  9. 제8항에 있어서,The method of claim 8,
    상기 정전기 방지시트는, 구리소재로 이루어지는 것을 특징으로 하는 검사용 소켓의 이물질 세정시트.The antistatic sheet is a foreign material cleaning sheet for the inspection socket, characterized in that made of a copper material.
  10. 제1항에 있어서,The method of claim 1,
    상기 베이스 시트와, 상기 점착시트의 사이에는 접착제층이 형성되어 있으며, 상기 접착제층에 의하여 상기 점착시트가 상기 베이스 시트의 일면에 부착되는 것을 특징으로 하는 검사용 소켓의 이물질 세정시트.An adhesive layer is formed between the base sheet and the adhesive sheet, and the adhesive sheet is attached to one surface of the base sheet by the adhesive layer.
  11. 제1항에 있어서,The method of claim 1,
    상기 돌출점착부는 반구형상을 가지는 것을 특징으로 하는 검사용 소켓의 이물질 세정시트.The foreign matter cleaning sheet of the inspection socket, characterized in that the protruding adhesive portion has a hemispherical shape.
  12. 제1항에 있어서,The method of claim 1,
    상기 돌출점착부는, 기둥형, 원뿔형, 다각뿔형, 원뿔대형, 다각뿔대형 중 어느 하나의 형상을 가지는 것을 특징으로 하는 검사용 소켓의 이물질 세정시트.The protruding adhesive portion, the foreign matter cleaning sheet of the inspection socket, characterized in that it has any one shape of a column-shaped, conical, polygonal pyramidal, truncated cone, and polygonal pyramidal shape.
  13. 제1항에 있어서,The method of claim 1,
    상기 돌출점착부의 단면형상은, 상기 도전부의 단면형상과 대응되는 형상을 가지는 것을 특징으로 하는 검사용 소켓의 이물질 세정시트.The cross-sectional shape of the protruding adhesive portion has a shape corresponding to the cross-sectional shape of the conductive portion.
  14. 피검사 디바이스의 단자와 대응되는 위치마다 다수의 도전성 입자가 실리콘 고무에 융합되어 마련된 도전부와 상기 도전부를 지지하기 위한 절연부를 가지는 검사용 소켓에 사용되며, 상기 검사용 소켓에 묻어 있는 이물질을 제거하기 위한 이물질 세정시트에 있어서,Used in a test socket having a conductive part prepared by fusing a plurality of conductive particles in a position corresponding to the terminal of the device under test and an insulating part for supporting the conductive part, and removing foreign matters from the test socket. In the foreign matter cleaning sheet for,
    검사용 소켓에서 이물질이 묻어 있는 표면과 대응되는 크기를 가지는 베이스 시트;A base sheet having a size corresponding to a surface on which foreign substances are buried in the inspection socket;
    상기 베이스 시트의 일면에 배치되고 검사용 소켓의 표면에 묻어 있는 이물질을 제거할 수 있도록 점착력을 가지는 점착시트; 및A pressure-sensitive adhesive sheet disposed on one surface of the base sheet and having adhesive strength to remove foreign matters adhering to the surface of the test socket; And
    상기 베이스 시트와 상기 점착시트 사이에 배치되고 반복되는 검사용 소켓과의 접촉에 의하여 유발되는 정전기에 의하여 점착시트가 검사용 소켓에 달라붙는 것을 방지하기 위한 정전기 방지시트;를 포함하는 것을 특징으로 하는 검사용 소켓의 이물질 세정시트.And an antistatic sheet disposed between the base sheet and the adhesive sheet and configured to prevent the adhesive sheet from sticking to the test socket due to static electricity caused by contact with the repeated test socket. Washing sheet for foreign matter in the inspection socket.
  15. 제14항에 있어서,The method of claim 14,
    상기 정전기 방지시트는, 구리소재로 이루어지는 것을 특징으로 하는 검사용 소켓의 이물질 세정시트.The antistatic sheet is a foreign material cleaning sheet for the inspection socket, characterized in that made of a copper material.
  16. 제14항에 있어서,The method of claim 14,
    상기 정전기 방지시트와 상기 점착시트의 사이에는 접착제층이 형성되고, 상기 접착제층에 의하여 상기 점착시트가 상기 정전기 방지시트에 부착되는 것을 특징으로 하는 검사용 소켓의 이물질 세정시트.An adhesive layer is formed between the antistatic sheet and the adhesive sheet, and the adhesive sheet is attached to the antistatic sheet by the adhesive layer.
PCT/KR2020/011649 2019-09-23 2020-08-31 Foreign substance cleaning sheet for test socket WO2021060727A1 (en)

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KR1020190116881A KR102187264B1 (en) 2019-09-23 2019-09-23 Apparatus for cleaning impurity of test socket
KR10-2019-0116881 2019-09-23

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WO2021060727A1 true WO2021060727A1 (en) 2021-04-01

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KR20050094099A (en) * 2004-03-22 2005-09-27 주식회사 디스텍 Cleaning method for test socket of semiconductor and its clean chip
JP2006153673A (en) * 2004-11-29 2006-06-15 Apic Yamada Corp Cleaning member for semiconductor test device, semiconductor manufacturing apparatus, and semiconductor test system
KR20110063275A (en) * 2009-12-03 2011-06-10 인터내셔널 테스트 솔루션즈, 인크. Apparatuses, device, and methods for cleaning tester interface contact elements and support hardware
KR101374842B1 (en) * 2013-11-15 2014-03-18 하동호 Cleaning device, test handler, and mothod for cleaning a test socket
JP2016065209A (en) * 2014-09-25 2016-04-28 日東電工株式会社 Heat peelable adhesive sheet

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EP1456342B1 (en) * 2001-12-19 2008-04-30 Nitto Denko Corporation Cleaning sheet and process for cleaning substrate treatment device
US20180122679A1 (en) * 2016-10-28 2018-05-03 Applied Materials, Inc. Stress balanced electrostatic substrate carrier with contacts

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Publication number Priority date Publication date Assignee Title
KR20050094099A (en) * 2004-03-22 2005-09-27 주식회사 디스텍 Cleaning method for test socket of semiconductor and its clean chip
JP2006153673A (en) * 2004-11-29 2006-06-15 Apic Yamada Corp Cleaning member for semiconductor test device, semiconductor manufacturing apparatus, and semiconductor test system
KR20110063275A (en) * 2009-12-03 2011-06-10 인터내셔널 테스트 솔루션즈, 인크. Apparatuses, device, and methods for cleaning tester interface contact elements and support hardware
KR101374842B1 (en) * 2013-11-15 2014-03-18 하동호 Cleaning device, test handler, and mothod for cleaning a test socket
JP2016065209A (en) * 2014-09-25 2016-04-28 日東電工株式会社 Heat peelable adhesive sheet

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