WO2020066135A1 - Dispositif d'imagerie en phase à rayons x - Google Patents

Dispositif d'imagerie en phase à rayons x Download PDF

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Publication number
WO2020066135A1
WO2020066135A1 PCT/JP2019/022384 JP2019022384W WO2020066135A1 WO 2020066135 A1 WO2020066135 A1 WO 2020066135A1 JP 2019022384 W JP2019022384 W JP 2019022384W WO 2020066135 A1 WO2020066135 A1 WO 2020066135A1
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Prior art keywords
image
information
relative angle
ray
phase contrast
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PCT/JP2019/022384
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English (en)
Japanese (ja)
Inventor
木村　健士
太郎 白井
貴弘 土岐
哲 佐野
日明 堀場
直樹 森本
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株式会社島津製作所
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Publication of WO2020066135A1 publication Critical patent/WO2020066135A1/fr

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    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/06—Diaphragms
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/041—Phase-contrast imaging, e.g. using grating interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]

Definitions

  • the present invention relates to an X-ray phase imaging apparatus, and more particularly, to an X-ray phase imaging apparatus including a rotation mechanism that changes a relative angle between a subject and a plurality of gratings around an X-ray optical axis.
  • an X-ray phase imaging apparatus imaging is performed while changing the relative angle between a subject and a plurality of gratings around the optical axis of X-rays, and a plurality of imagings having different relative angles between the obtained subject and the plurality of gratings.
  • a technique for performing image analysis from a result is known.
  • Such an X-ray phase imaging apparatus is disclosed in, for example, Jensen T H, et al., “Directional x-ray dark-field imaging of strongly ordered systems”, PHYSICAL REVIEW B 82, 214103 (2010).
  • the Jensen T H, et al., “Directional x-ray dark-field imaging of strong ordered systems” PHYSICAL REVIEW B 82, 214103 (2010) has an X-ray source, a plurality of gratings, It has a detector and an image processing device. X-rays from the X-ray source pass through a plurality of gratings via the subject and irradiate the detector. An absorption image, a phase differential image, and a dark-field image are generated by the image processing device based on the signal detected by the detector.
  • the X-ray phase imaging apparatus focuses on the X-ray optical axis.
  • an imaging method for changing an angle of a subject with respect to a plurality of grids is disclosed.
  • a dark-field image or the like (hereinafter simply referred to as an image) is generated by the image processing device.
  • the image processing apparatus is configured to perform image analysis such as the directivity and angle of minute angle scattering based on each of the plurality of generated images and the corresponding relative angle.
  • an advantage of some aspects of the invention is that image analysis is performed based on an incorrect relative angle between a subject and a plurality of grids. Accordingly, an object of the present invention is to provide an X-ray phase imaging apparatus capable of suppressing information of analysis results from becoming inappropriate due to the above.
  • an X-ray phase imaging apparatus includes an X-ray source, a detector that detects X-rays emitted from the X-ray source, an X-ray source and a detector. And a plurality of gratings including a first grating for forming a self-image by X-rays emitted from the X-ray source, and a second grating for causing interference with the self-image of the first grating.
  • Rotating at least one of a subject disposed between the X-ray source and the detector and the plurality of gratings about the optical axis of the X-ray to change the relative angle between the subject and the plurality of gratings A first rotation mechanism; and an image processing unit that generates a phase contrast image based on a signal detected by the detector at each of the plurality of relative angles changed by the rotation of the first rotation mechanism.
  • the relative angle information is stored in the corresponding position. It is configured to store in association with the contrast image.
  • the X-ray phase imaging apparatus by storing information of each of a plurality of relative angles in association with a corresponding phase contrast image, image analysis of the plurality of phase contrast images is performed. At this time, image analysis can be performed using the relative angles stored in association with each phase contrast image. As a result, unlike the case where the corresponding relative angle is calculated from each phase contrast image, it is possible to suppress the use of the wrong relative angle in the image analysis. Thus, it is possible to prevent the information of the analysis result from being inappropriate due to the image analysis being performed based on the erroneous relative angle between the subject and the plurality of grids.
  • the relative angle information stored in association with each of the plurality of phase contrast images is read, and the image is formed based on the read relative angle information. It is configured to perform the analysis.
  • image analysis can be performed only by reading out the relative angle. The control load on the phase imaging device can be reduced.
  • the phase contrast image and the information on the relative angle are associated with each other by including the information on the relative angle in each file name of the plurality of phase contrast images. It is configured to memorize. With this configuration, unlike the case where the corresponding phase contrast image and the information on the relative angle are stored in a common folder to associate them with each other, it is not necessary to newly generate a folder. Further, unlike the case where the information on the relative angles of the corresponding phase contrast images is described in a file to associate them with each other, it is not necessary to newly generate a file.
  • phase contrast image with the information on the relative angle only by giving the information on the relative angle to the file name without generating a new folder and file, so that the data used in the memory etc. An increase in capacity can be suppressed.
  • the supplementary data section included in each of the plurality of phase contrast images includes information on the corresponding relative angle, thereby obtaining information on the phase contrast image and the relative angle.
  • the corresponding phase contrast image and the information on the relative angle are stored in a common folder to associate them with each other, it is not necessary to newly generate a folder.
  • the information on the relative angles of the corresponding phase contrast images is described in a file to associate them with each other, it is not necessary to newly generate a file.
  • phase contrast image with the information on the relative angle only by providing the information on the relative angle in the supplementary data section without generating a new folder and file, and thus it is used in a memory or the like. An increase in data capacity can be suppressed.
  • each of the plurality of phase contrast images is stored in a separate folder from each other, and information on the relative angle corresponding to each of the plurality of phase contrast images is shared.
  • the phase contrast image and the information on the relative angle are stored in association with each other.
  • a management file different from the plurality of phase contrast images which indicates a relationship between each of the plurality of phase contrast images and information on a corresponding relative angle, is created.
  • the phase contrast image and the information on the relative angle are stored in association with each other.
  • the data capacity of the phase contrast image can be reduced as compared with the case where the information of the relative angle is provided in the phase contrast image itself.
  • by associating the phase contrast image with the information on the relative angle based on the management file it is possible to collectively associate each of the plurality of dark field images with the information on the corresponding relative angle by the management file. it can. As a result, it is not necessary to generate a file for describing information on the corresponding relative angle for each dark-field image, so that the number of files stored in a memory or the like can be reduced.
  • the X-ray phase imaging apparatus further includes a control unit that controls the first rotation mechanism so as to change a relative angle between the subject and the plurality of gratings, and the plurality of the plurality of grids generated by the image processing unit. Is stored in association with the information on the relative angle transmitted from the control unit.
  • the control load on the image processing unit can be reduced as compared with the case where both the generation of the phase contrast image and the acquisition of the information on the relative angle are performed by the image processing unit.
  • the subject and an imaging system including an X-ray source, a detector, and a plurality of gratings are relatively rotated about a direction orthogonal to the optical axis.
  • the image processing unit further includes a second rotation mechanism that causes the first rotation mechanism to rotate the subject and causes the second rotation mechanism to relatively move the subject and the imaging system at each of the plurality of relative angles changed.
  • a three-dimensional phase contrast image is generated at each of the plurality of relative angles, and information of each of the plurality of relative angles is stored in association with a corresponding three-dimensional phase contrast image. It is configured. With this configuration, when a three-dimensional phase contrast image is generated using the second rotation mechanism, image analysis is performed based on an incorrect relative angle between the subject and the plurality of grids. Thus, it is possible to prevent the information of the analysis result from becoming inappropriate.
  • the relative angle information stored in association with each of the plurality of three-dimensional phase contrast images is read, and the corresponding three-dimensional phase contrast image is rotated based on the read relative angle information.
  • the plurality of three-dimensional phase contrast images are configured to be oriented in the same direction.
  • the three-dimensional phase contrast image generated at each of the plurality of relative angles is displaced by an amount corresponding to the difference in the relative angles, so that image analysis cannot be performed properly.
  • the corresponding three-dimensional phase contrast images are rotated about the optical axis, and the orientations of the plurality of three-dimensional phase contrast images are aligned to thereby obtain a plurality of rotated three-dimensional phase contrast images.
  • Image analysis can be appropriately performed using the two-dimensional phase contrast image.
  • the image processing unit is configured to generate a dark field image at each of the plurality of relative angles
  • the plurality of dark field images generated by the image processing unit Is configured to calculate the relationship between the orientation angle of the subject and the scattering intensity by performing image analysis based on each of the above and information on the corresponding relative angle.
  • FIG. 1 is a diagram illustrating a configuration of an X-ray phase imaging apparatus according to a first embodiment.
  • FIG. 3 is a diagram showing a subject imaged by the X-ray phase imaging apparatus according to the first and second embodiments. 5 is a dark-field image taken at each of a plurality of relative angles by the X-ray phase imaging apparatus according to the first embodiment.
  • FIG. 3 is a diagram illustrating data of a plurality of dark-field images stored in a memory in the X-ray phase imaging apparatus according to the first embodiment.
  • FIG. 3 is a diagram illustrating a relationship between pixel values and a relative angle of a dark-field image captured by the X-ray phase imaging apparatus according to the first embodiment.
  • FIG. 2 is a diagram illustrating images acquired from a plurality of dark-field images captured by the X-ray phase imaging apparatus according to the first embodiment.
  • FIG. 6A is a diagram illustrating an image of the orientation angle of the subject
  • FIG. 6B is a diagram illustrating an image of the anisotropy of X-ray scattering in the subject.
  • FIG. 5 is a flowchart illustrating control in the image processing unit according to the first embodiment. It is a figure showing the composition of the X-ray phase imaging device by a 2nd embodiment.
  • FIG. 11 is a flowchart illustrating control in an image processing unit according to a second embodiment.
  • FIG. 11 is a diagram illustrating a plurality of dark-field images stored in a memory in the X-ray phase imaging apparatus according to the first modification.
  • FIG. 13 is a diagram illustrating a file in which data of a dark field image and information of a relative angle stored in a memory in an X-ray phase imaging apparatus according to a second modified example.
  • FIG. 13 is a diagram showing dark field image data and a management file stored in a memory in an X-ray phase imaging apparatus according to a third modification.
  • the X-ray phase imaging apparatus 100 generates a dark-field image of the subject T using the diffusion (scattering) of the X-rays that have passed through the subject T. Specifically, the X-ray phase imaging apparatus 100 generates a dark-field image of the subject T using the Talbot effect.
  • the X-ray phase imaging apparatus 100 can be used for imaging the inside of an object in, for example, non-destructive inspection applications.
  • the dark field image is an example of the “phase contrast image” in the claims.
  • the subject T includes the fiber bundle 11 (see FIG. 2) inside.
  • the subject T is, for example, a carbon fiber reinforced plastic (CFRP) in which carbon fibers are used as the fiber bundle 11.
  • CFRP carbon fiber reinforced plastic
  • the fiber bundle is a bundle of a large number of fibers.
  • the fiber bundle 11 is formed in a plate shape by a large number of fibers.
  • the subject T is arranged between an X-ray source 1 and a detector 5 described later. Specifically, the subject T is arranged between a first grid 2 and a third grid 4 described later.
  • FIG. 1 is a diagram of the X-ray phase imaging apparatus 100 viewed from the X direction.
  • the X-ray phase imaging apparatus 100 includes an X-ray source 1, a first grating 2, a second grating 3, a third grating 4, a detector 5, a PC 6, a control unit 7, , A grid rotating mechanism 8 and a grid moving mechanism 9.
  • a direction from the X-ray source 1 toward the first grating 2 is defined as a Z2 direction
  • a direction opposite thereto is defined as a Z1 direction.
  • a left-right direction in a plane orthogonal to the Z direction is defined as an X direction
  • a direction toward the back of the paper is defined as an X2 direction
  • a direction toward the near side of the paper is defined as an X1 direction
  • a vertical direction in a plane orthogonal to the Z direction is defined as a Y direction
  • an upward direction is defined as a Y1 direction
  • a downward direction is defined as a Y2 direction.
  • the lattice rotating mechanism 8 is an example of the “first rotating mechanism” in the claims.
  • the X-ray source 1 is configured to generate X-rays when a high voltage is applied, and to irradiate the generated X-rays in the Z2 direction.
  • the first grating 2 has a plurality of slits 2a arranged at a predetermined period (pitch) d1 in the Y direction and an X-ray phase changing section 2b. Each slit 2a and X-ray phase changing portion 2b are formed so as to extend linearly. The slits 2a and the X-ray phase changing portions 2b are formed so as to extend in parallel.
  • the first grating 2 is a so-called phase grating.
  • the first grating 2 is disposed between the X-ray source 1 and the second grating 3, and is irradiated with X-rays from the X-ray source 1.
  • the first grating 2 is provided for forming a self-image (indicated by a broken line in FIG. 1) of the first grating 2 by the Talbot effect.
  • a self-image indicated by a broken line in FIG. 1
  • Talbot distance This is called the Talbot effect.
  • the second grating 3 has a plurality of X-ray transmitting portions 3a and X-ray absorbing portions 3b arranged at a predetermined period (pitch) d2 in the Y direction.
  • the X-ray absorbing section 3b extends along the direction in which the X-ray phase changing section 2b extends.
  • Each of the X-ray transmitting portions 3a and the X-ray absorbing portions 3b is formed to extend linearly. Further, each of the X-ray transmitting portions 3a and the X-ray absorbing portions 3b is formed so as to extend in parallel.
  • the second grating 3 is a so-called absorption grating.
  • the first grating 2 and the second grating 3 are gratings having different roles, respectively, but the slit 2a and the X-ray transmitting portion 3a respectively transmit X-rays.
  • the X-ray absorbing section 3b has a role of blocking X-rays, and the X-ray phase changing section 2b changes the phase of X-rays depending on the difference in refractive index from the slit 2a.
  • the second grating 3 is arranged between the first grating 2 and the detector 5, and is irradiated with X-rays that have passed through the first grating 2.
  • the second grating 3 is arranged at a position away from the first grating 2 by a Talbot distance.
  • the second grating 3 interferes with the self-image of the first grating 2 and forms moiré fringes (not shown) on the detection surface of the detector 5.
  • the third grating 4 has a plurality of X-ray transmitting portions 4a and X-ray absorbing portions 4b arranged at a predetermined period (pitch) d3 in the Y direction. Each of the X-ray transmitting portions 4a and the X-ray absorbing portions 4b is formed so as to extend linearly. Further, each of the X-ray transmitting portions 4a and the X-ray absorbing portions 4b is formed so as to extend in parallel.
  • the third grating 4 is a so-called multi-slit.
  • the third grating 4 is arranged between the X-ray source 1 and the first grating 2.
  • the third grating 4 is configured to convert the X-rays from the X-ray source 1 into a multi-point light source by using the X-rays that have passed through the respective X-ray transmitting sections 4a as a line light source.
  • the pitch of the three gratings (the first grating 2, the second grating 3, and the third grating 4) and the distance between the gratings satisfy certain conditions, the X-rays emitted from the X-ray source 1 It is possible to increase coherence. Thereby, the interference intensity can be maintained even if the focal size of the tube of the X-ray source 1 is large.
  • the detector 5 is configured to detect X-rays, convert the detected X-rays into electric signals, and read the converted electric signals as image signals.
  • the detector 5 is, for example, an FPD (Flat @ Panel @ Detector).
  • the detector 5 includes a plurality of conversion elements (not shown) and pixel electrodes (not shown) arranged on the plurality of conversion elements.
  • the plurality of conversion elements and the pixel electrodes are arranged in an array in the X direction and the Y direction at a predetermined cycle (pixel pitch).
  • the detector 5 is configured to output the acquired image signal to the PC 6.
  • the PC 6 includes an image processing unit 60 and a memory 61.
  • the image processing unit 60 has an image generation unit 60a and a post-processing unit 60b.
  • the image processing unit 60 (image generation unit 60a) is configured to generate an absorption image (not shown) based on the image signal output from the detector 5.
  • the image processing unit 60 (image generation unit 60a) generates a dark-field image (see FIG. 3) due to X-ray scattering based on the X-ray intensity distribution detected by the detector 5.
  • the absorption image is an image of a contrast generated by a difference in X-ray absorption by the subject T.
  • the dark field image is an image of a contrast generated by minute angle scattering of X-rays by a fine structure inside the subject T.
  • the image processing unit 60 includes, for example, a CPU (Central Processing Unit) and a processor such as a GPU (Graphics Processing Unit) and an FPGA (Field-Programmable Gate Array) configured for image processing.
  • the control unit 7 calculates the relative angle ⁇ between the subject T and the first grid 2, the second grid 3, and the third grid 4 (hereinafter, three grids are collectively referred to as a plurality of grids).
  • the lattice rotating mechanism 8 is controlled to change. Specifically, the relative angle ⁇ is changed by rotating a plurality of gratings around the optical axis ⁇ of the X-ray by the grating rotating mechanism 8. A plurality of gratings may be rotated simultaneously or sequentially.
  • the grating rotating mechanism 8 includes a rotating mechanism 8a for rotating the first grating 2, a rotating mechanism 8b for rotating the second grating 3, and a rotating mechanism 8c for rotating the third grating 4.
  • the X-ray phase imaging apparatus 100 includes a rotating grating unit 20 including the first grating 2, the rotating mechanism 8a, and the grating moving mechanism 9. Further, the X-ray phase imaging apparatus 100 includes a rotating grating unit 30 including the second grating 3 and the rotating mechanism 8b. Further, the X-ray phase imaging apparatus 100 includes a rotating grating unit 40 including the third grating 4 and the rotating mechanism 8c.
  • the controller 7 is configured to control the grid moving mechanism 9 to move the first grid 2 stepwise in the grid plane in a direction orthogonal to the grid direction.
  • the X-ray phase imaging apparatus 100 uses a technique (fringe scanning method) of acquiring a reconstructed image from a plurality of moiré fringes (images) obtained by scanning the first grating 2 at regular intervals.
  • Control unit 7 includes a processor such as a CPU (Central Processing Unit), for example.
  • the lattice direction is a direction in which the lattice pattern of the lattice extends.
  • the grating pattern is a slit 2a, an X-ray phase changing unit 2b, an X-ray transmitting unit 3a, an X-ray absorbing unit 3b, and the like of each grating.
  • the lattice moving mechanism 9 is configured to move the first lattice 2 stepwise in a direction orthogonal to the lattice direction in the lattice plane (XY plane) (Y direction in FIG. 1) based on a signal from the control unit 7. Have been. Specifically, the grating moving mechanism 9 divides the period d1 of the first grating 2 by n, and moves the first grating 2 stepwise by d1 / n. The grating moving mechanism 9 is configured to move the first grating 2 stepwise at least for one period d1 of the first grating 2. Note that n is a positive integer, for example, 9 or the like.
  • the grid moving mechanism 9 includes, for example, a stepping motor, a piezo actuator, and the like. In the case where the first grating 2 is rotated by the grating rotating mechanism 8, the direction of the step movement changes along with the direction orthogonal to the grating direction.
  • the image processing unit 60 performs darkening based on the signal detected by the detector 5 at each of the plurality of relative angles ⁇ changed by the rotation of the grid rotation mechanism 8. Generate a field image. Specifically, the image processing unit 60 (image generation unit 60a) generates a dark-field image in each of the states where the relative angle ⁇ is 0 degree, 45 degrees, 90 degrees, and 135 degrees. Note that the relative angle ⁇ is an angle between the direction of the plurality of gratings (for example, the direction in which the X-ray phase changing unit 2b extends) and the X direction. Further, as shown in FIG. 3, in each dark-field image, the scattering intensity of the fiber bundle 11 extending in parallel with the directions of the plurality of lattices is displayed strong (darker black).
  • the X-ray phase imaging apparatus 100 is configured to store information of each of the plurality of relative angles ⁇ in association with the corresponding dark field image. Specifically, the data of each dark field image associated with the information of the corresponding relative angle ⁇ is stored (stored) in the memory 61 of the PC 6.
  • the X-ray phase imaging apparatus 100 includes the information of the relative angle ⁇ in each of the file names of the plurality of dark-field images, so that the The image and the information on the relative angle are stored in association with each other.
  • the user of the X-ray phase imaging apparatus 100 arbitrarily specifies the file name (eg, test_0deg).
  • the X-ray phase imaging apparatus 100 reads information on the relative angle ⁇ stored in association with each of the plurality of dark field images, and performs image analysis based on the read information on the plurality of relative angles ⁇ . It is configured as follows. Specifically, the image processing unit 60 (post-processing unit 60b) searches for and reads out the file names of the data of the plurality of dark field images stored in the memory 61, and associates the data with the data of each dark field image. Of the obtained relative angle ⁇ .
  • the X-ray phase imaging apparatus 100 performs image analysis based on each of the plurality of dark-field images generated by the image processing unit 60 (image generation unit 60a) and information on the corresponding relative angle ⁇ . , And is configured to calculate the relationship between the orientation angle of the subject T and the scattering intensity.
  • the image processing unit 60 (post-processing unit 60b) plots the value of the pixel value (the value based on the scattering intensity) with respect to the relative angle ⁇ in each pixel of the dark field image. . Then, the image processing unit 60 (post-processing unit 60b) approximates the waveform created by plotting by the expression A + Bcos [2 ( ⁇ ) + ⁇ ].
  • A is offset information in the waveform.
  • B is information on the amplitude in the waveform.
  • ⁇ which is the orientation angle of the fiber bundle 11 of the subject T, is calculated based on the values of A, B, and ⁇ .
  • FIG. 6A shows an image obtained by imaging the calculated orientation angle ⁇ .
  • FIG. 6B shows an image obtained by imaging B / A, which is the anisotropy of X-ray scattering. Then, information indicating the direction of the fiber bundle 11 (see FIG. 7) can be obtained by coloring the pixel positions of only the portion having a high numerical value of B / A with ⁇ , which is information on the orientation angle, and displaying them.
  • FIG. 7 shows that the color of the image of the fiber bundle 11 changes in accordance with the orientation angle of the fiber bundle 11. Thereby, it is possible to analyze the orientation of the fiber bundle 11 visually and quantitatively.
  • step S1 a dark-field image is generated at each of the plurality of relative angles ⁇ .
  • step S2 information of the relative angle ⁇ is included in the file names of the plurality of dark field images and stored (stored) in the memory 61.
  • step S3 information on the relative angle ⁇ is read from each file name of the plurality of dark field images stored (stored) in the memory 61, and based on the dark field image and the read relative angle ⁇ . Perform image analysis.
  • the X-ray phase imaging apparatus 100 is configured to store information on each of the plurality of relative angles ⁇ in association with the corresponding dark-field image. Accordingly, when performing image analysis on a plurality of dark field images, image analysis can be performed using the relative angle ⁇ stored in association with each dark field image. As a result, unlike the case where the corresponding relative angle ⁇ is calculated from each dark field image, it is possible to suppress the use of the wrong relative angle in the image processing. As a result, it is possible to prevent the information of the analysis result from becoming inappropriate due to the image analysis being performed based on the erroneous relative angle ⁇ between the subject T and the plurality of grids.
  • the information on the relative angle ⁇ stored in association with each of the plurality of dark field images is read, and the image based on the read information on the plurality of relative angles ⁇ is read.
  • the X-ray phase imaging apparatus 100 is configured to perform the analysis.
  • image analysis can be performed only by reading out the relative angle ⁇ .
  • the control load on the imaging device 100 can be reduced.
  • the file name of each of the plurality of dark field images includes the information of the corresponding relative angle ⁇ , thereby associating the dark field image with the information of the relative angle.
  • the X-ray phase imaging apparatus 100 is configured to store the information. Accordingly, unlike the case where the corresponding dark-field image and the information of the relative angle ⁇ are stored in a common folder and are associated with each other, it is not necessary to newly generate a folder. Also, unlike the case where the information on the relative angle ⁇ of the corresponding dark-field image is described in a file to associate them with each other, it is not necessary to newly generate a file.
  • the plurality of dark-field images generated by the image processing unit 60 and the information on the corresponding relative angles ⁇ transmitted from the control unit 7 are stored in association with each other.
  • the X-ray phase imaging apparatus 100 The control load on the image processing unit 60 can be reduced as compared with the case where both the generation of the dark field image and the acquisition of the information on the relative angle ⁇ are performed by the image processing unit 60.
  • the subject T is analyzed by performing image analysis based on each of the plurality of dark-field images generated by the image processing unit 60 and information on the corresponding relative angle ⁇ .
  • the X-ray phase imaging apparatus 100 is configured so as to calculate the relationship between the orientation angle and the scattering intensity. Accordingly, when performing image analysis on a plurality of dark field images, image analysis can be performed using the relative angle ⁇ stored in association with each dark field image. As a result, unlike the case where the corresponding relative angle ⁇ is calculated from each dark field image, it is possible to suppress the use of the wrong relative angle ⁇ in the image analysis.
  • the X-ray phase imaging apparatus 200 of the second embodiment is different from the X-ray phase imaging apparatus 100 of the first embodiment in that it is configured to generate a three-dimensional dark field image at each of a plurality of relative angles. I have.
  • the same components as those in the first embodiment are denoted by the same reference numerals as those in the first embodiment, and are not described.
  • the X-ray phase imaging apparatus 200 includes a PC 16, a control unit 17, a subject rotation mechanism 18, and a CT rotation mechanism.
  • the PC 16 includes an image processing unit 160 and a memory 161.
  • the image processing section 160 has an image generation section 160a and a post-processing section 160b.
  • the CT rotation mechanism 28 includes, for example, a rotation stage 28a driven by a motor or the like.
  • the subject rotation mechanism 18 and the CT rotation mechanism 28 are examples of the “first rotation mechanism” and the “second rotation mechanism” in the claims, respectively.
  • the subject rotating mechanism 18 changes the relative angle ⁇ between the subject T and the plurality of grids by rotating the subject T about the optical axis ⁇ of the X-ray.
  • the CT rotation mechanism 28 relatively rotates the subject T, the X-ray source 1, the detector 5, and the imaging system 300 including a plurality of gratings based on a signal from the control unit 17. It is configured. Specifically, the CT rotation mechanism 28 is configured to rotate the subject T about an axis ⁇ orthogonal to the optical axis ⁇ , thereby rotating the subject T relative to the imaging system 300.
  • the X-ray phase imaging apparatus 200 includes a grating unit 120 including the first grating 2 and the grating moving mechanism 9. Further, the X-ray phase imaging apparatus 200 includes a grating unit 130 including the second grating 3. Further, the X-ray phase imaging apparatus 200 includes a grating unit 140 including the third grating 4. Further, the X-ray phase imaging apparatus 200 includes a subject holding unit 150 including the subject rotation mechanism 18 and the CT rotation mechanism 28.
  • the image processing unit 16 reconstructs a plurality of absorption images and a plurality of dark-field images captured at each of the plurality of rotation angles while rotating the CT rotation mechanism 28. Generates a three-dimensional absorption image (not shown) and a three-dimensional dark-field image (not shown). Note that the three-dimensional dark-field image is an example of the “three-dimensional phase contrast image” in the claims.
  • the image processing unit 16 (the image generation unit 160 a) performs the CT rotation at each of the plurality of relative angles ⁇ changed by rotating the subject T by the subject rotation mechanism 18.
  • a three-dimensional dark-field image is generated at each of the plurality of relative angles ⁇ .
  • the image processing unit 16 (image generation unit 160a) generates a three-dimensional dark field image in each of the cases where the relative angle ⁇ is 45 °, 0 °, and ⁇ 45 °.
  • the image of the subject T is shown in a simplified manner.
  • the X-ray phase imaging apparatus 200 is configured to store information of each of the plurality of relative angles ⁇ in association with a corresponding three-dimensional dark field image. Specifically, the data of each three-dimensional dark field image associated with the information of the corresponding relative angle ⁇ is stored (stored) in the memory 161 of the PC 16.
  • the X-ray phase imaging apparatus 200 reads the information on the relative angle ⁇ stored in association with each of the plurality of three-dimensional dark field images, and also reads the information on the read relative angle ⁇ .
  • the corresponding three-dimensional dark-field images are rotated about the optical axis ⁇ to align the directions of the plurality of three-dimensional dark-field images.
  • the image processing unit 160 (post-processing unit 160b) is configured to perform image analysis using each slice image of the plurality of three-dimensional dark field images in a state where the directions of the plurality of three-dimensional dark field images are aligned. ing.
  • the slice image means a cross-sectional image in a three-dimensional dark field image.
  • a plurality of slice images are acquired in a three-dimensional dark field image.
  • the orientation of the fiber bundle 11 can be visually and quantitatively analyzed for each of the plurality of slice images.
  • step S11 a three-dimensional dark field image is generated at each of the plurality of relative angles ⁇ .
  • step S12 the file names of the plurality of three-dimensional dark field images are stored (stored) in the memory 161 with the corresponding information of the relative angle ⁇ included.
  • step S13 information on the relative angle ⁇ is read from each file name of the plurality of three-dimensional dark-field images, and at least two of the three-dimensional dark-field images are rotated to align their directions.
  • step S14 image analysis is performed for each slice image of the three-dimensional dark field image based on the information of the associated relative angle ⁇ .
  • the X-ray phase imaging apparatus 200 is configured to store the information of each of the plurality of relative angles ⁇ in association with the corresponding three-dimensional dark field image. Thereby, when a three-dimensional dark-field image is generated using the CT rotation mechanism 28, image analysis is performed based on an incorrect relative angle ⁇ between the subject T and a plurality of grids. It is possible to prevent the information of the analysis result from becoming inappropriate.
  • the information of the relative angle ⁇ stored in association with each of the plurality of three-dimensional dark field images is read, and based on the read information of the relative angle ⁇ ,
  • the X-ray phase imaging apparatus 200 is configured to rotate the corresponding three-dimensional dark-field image so that the directions of the plurality of three-dimensional dark-field images are aligned.
  • the three-dimensional dark field image generated at each of the plurality of relative angles ⁇ is displaced by an amount corresponding to the difference between the relative angles ⁇ , so that image analysis cannot be appropriately performed. Then, based on the read information on the relative angle ⁇ , the corresponding three-dimensional dark-field images are rotated to align the directions of the plurality of three-dimensional dark-field images. Image processing can be appropriately performed using the image.
  • the X-ray phase imaging apparatus 400 includes a header included in each of the plurality of dark-field images, by including information of the corresponding relative angle ⁇ , thereby obtaining a
  • the information on the relative angle ⁇ is stored in association with the information.
  • the dark field image including the information of the relative angle ⁇ in the header is stored (stored) in the memory 261.
  • the header is not actually displayed in the dark field image, it is illustrated in FIG. 13 as being displayed for explanation.
  • the header is an example of the “supplementary data section” in the claims.
  • the X-ray phase imaging apparatus 500 stores each of the plurality of dark-field images in a separate folder from each other, and stores information on each of the plurality of dark-field images and the corresponding relative angle ⁇ .
  • a folder 361a, a folder 361b, a folder 361c, and a folder 361d are created in the memory 361.
  • the file 500c
  • ° and a file 500b are stored.
  • the files 500b to 500d are the same as the file 500a, and a detailed description will be omitted.
  • the X-ray phase imaging apparatus 600 includes a management file 600a that indicates the relationship between each of the plurality of dark-field images and the information of the corresponding relative angle ⁇ and is different from the plurality of dark-field images.
  • the dark field image and the information on the relative angle ⁇ are stored in association with each other.
  • the memory 461 stores a management file 600a (for example, a text file or a binary file) in which the correspondence between each of the plurality of dark-field images and the relative angle ⁇ is described.
  • data of a plurality of dark field images may be stored in separate folders, and the correspondence between the folder name and the relative angle ⁇ may be described in the management file 600a.
  • the management file 600a collectively associates each of the plurality of dark field images with the corresponding information of the relative angle ⁇ . It can be performed. As a result, it is not necessary to generate a file for describing the information of the corresponding relative angle ⁇ for each dark-field image, so that the number of files stored in the memory 461 can be reduced.
  • information on a plurality of relative angles ⁇ is stored in association with a corresponding dark-field image
  • the present invention is not limited to this.
  • information on a plurality of relative angles ⁇ may be stored in association with an absorption image or a phase differential image.
  • the relative angle ⁇ is changed by rotating a plurality of gratings, but the present invention is not limited to this.
  • the relative angle ⁇ may be changed by rotating the subject T.
  • both the plurality of grids and the subject T may be rotated.
  • the present invention is not limited to this.
  • a plurality of gratings may be rotated to change the relative angle ⁇ .
  • the example in which the subject T is arranged between the first grid 2 and the third grid 4 has been described. May be arranged between them.
  • CT imaging may be performed by rotating the imaging system 300.
  • the present invention is not limited to this.
  • the third grating 4 may not be provided.
  • a dark-field image is generated by the fringe scanning method
  • the present invention is not limited to this.
  • a method of rotating any one of the first grating 2, the second grating 3, and the third grating 4 on a plane orthogonal to the direction in which the optical axis ⁇ of the X-ray extends (so-called single moire shooting) Method), a dark field image may be generated.
  • the first grating 2 is a phase grating
  • the present invention is not limited to this.
  • the first grating 2 may be an absorption grating.
  • the present invention is not limited to this. Any of the plurality of grids may be moved stepwise.
  • CFRP carbon fiber reinforced plastic
  • GFRP glass fiber reinforced plastic
  • the relative angle ⁇ between the subject T and the plurality of grids is included in the file name of the data of the dark field image, but the present invention is not limited to this.
  • both the subject T and the rotation angles of each of the plurality of grids may be included in the file name.
  • only the rotation angle of the rotation may be included in the file name.
  • the image processing unit 60 (160) associates the corresponding dark-field image with the relative angle ⁇
  • the present invention is not limited to this.
  • the control unit 7 (17) may associate the corresponding dark-field image with the relative angle ⁇ .
  • the processing of the image processing unit 60 (160) has been described with reference to the flow-driven type flowchart for convenience of description, but the present invention is not limited to this.
  • the processing of the image processing unit 60 (160) may be performed by an “event driven type” in which the processing is performed in event units. In this case, it may be performed in a completely event-driven manner, or may be performed in a combination of event-driven and flow-driven.

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Abstract

Dispositif d'imagerie en phase à rayons X (100) constitué de manière à stocker chaque information d'un angle relatif (θ) entre un sujet cible (T) et une pluralité de grilles en association avec une image en champ sombre correspondante.
PCT/JP2019/022384 2018-09-25 2019-06-05 Dispositif d'imagerie en phase à rayons x WO2020066135A1 (fr)

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JP7460577B2 (ja) 2020-06-03 2024-04-02 株式会社リガク Ｘ線画像生成装置
WO2024070777A1 (fr) * 2022-09-30 2024-04-04 コニカミノルタ株式会社 Dispositif d'affichage d'image, système d'affichage d'image, procédé d'affichage d'image, dispositif de traitement d'image et programme
WO2024070776A1 (fr) * 2022-09-30 2024-04-04 コニカミノルタ株式会社 Dispositif, système et procédé d'affichage d'images, dispositif de traitement d'images et programme

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JP2017147532A (ja) * 2016-02-16 2017-08-24 大日本印刷株式会社 撮像装置、表示装置、撮像装置のプログラム、撮像システム、表示装置のプログラム及び携帯端末
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JP2012189446A (ja) * 2011-03-10 2012-10-04 Canon Inc 撮像装置及び撮像方法
WO2012128335A1 (fr) * 2011-03-23 2012-09-27 コニカミノルタエムジー株式会社 Système d'affichage d'image médicale
JP2017072399A (ja) * 2015-10-05 2017-04-13 株式会社日立ハイテクサイエンス Ｘ線検査装置及びｘ線検査方法
JP2017147532A (ja) * 2016-02-16 2017-08-24 大日本印刷株式会社 撮像装置、表示装置、撮像装置のプログラム、撮像システム、表示装置のプログラム及び携帯端末
WO2017216178A1 (fr) * 2016-06-13 2017-12-21 Technische Universität München Système de tomographie à rayons x à tenseur
WO2018096759A1 (fr) * 2016-11-22 2018-05-31 株式会社島津製作所 Dispositif d'imagerie en phase à rayons x

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JP7460577B2 (ja) 2020-06-03 2024-04-02 株式会社リガク Ｘ線画像生成装置
WO2024070777A1 (fr) * 2022-09-30 2024-04-04 コニカミノルタ株式会社 Dispositif d'affichage d'image, système d'affichage d'image, procédé d'affichage d'image, dispositif de traitement d'image et programme
WO2024070776A1 (fr) * 2022-09-30 2024-04-04 コニカミノルタ株式会社 Dispositif, système et procédé d'affichage d'images, dispositif de traitement d'images et programme

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