WO2020024477A1 - 一种测试装置及测试设备 - Google Patents

一种测试装置及测试设备 Download PDF

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Publication number
WO2020024477A1
WO2020024477A1 PCT/CN2018/115114 CN2018115114W WO2020024477A1 WO 2020024477 A1 WO2020024477 A1 WO 2020024477A1 CN 2018115114 W CN2018115114 W CN 2018115114W WO 2020024477 A1 WO2020024477 A1 WO 2020024477A1
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Prior art keywords
transfer
array substrate
metal plates
test
metal plate
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PCT/CN2018/115114
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English (en)
French (fr)
Inventor
何怀亮
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HKC Co Ltd
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HKC Co Ltd
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Priority to US16/255,862 priority Critical patent/US20200041542A1/en
Publication of WO2020024477A1 publication Critical patent/WO2020024477A1/zh
Anticipated expiration legal-status Critical
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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing

Definitions

  • the embodiments of the present application relate to the field of display test technology, and in particular, to a test device and a test device.
  • Liquid crystal display panel Liquid Crystal Display (LCD) is currently the most common type of display. With the continuous improvement of manufacturing technology, the manufacturing yield of liquid crystal display panels has also increased. However, it is inevitable that the current yield of liquid crystal display panels still cannot reach 100%. Based on the consideration of yield, in the manufacturing process, a detection mechanism is usually added to improve the yield of the liquid crystal display panel.
  • the tester can detect the pixel array on the LCD panel.
  • the carrier plate on the stage test device in the testing machine is assembled by multiple metal plates arranged in multiple rows and columns, and two adjacent metal plates in each column are connected by a buckle.
  • the gap between the adjacent two metal plates in each column needs to be adjusted, and each time the chamber of the test machine is opened, Both need to measure the resistance value at the connection, which is time-consuming; when the resistance value at the connection is too large, it will cause static electricity accumulation, there is a risk of electrostatic discharge, and it may damage the product under test.
  • the flatness of the entire stage test device cannot be guaranteed, which affects the detection of the product to be tested.
  • the purpose of this application is to propose a test device and test equipment to improve the test efficiency, reduce the risk of electrostatic discharge, and ensure the flatness of the test device.
  • the present application provides a test device, including:
  • a carrier plate is fixed on the upper surface of the platform body and is configured to carry an array substrate.
  • the carrier plate includes a plurality of metal plates arranged in a first direction, and each of the metal plates extends in a second direction. The direction intersects the second direction;
  • a transfer device is configured to transfer the array substrate.
  • the present application provides a test device, including the test device provided in the embodiment of the present application and a control device connected to the test device;
  • the control device is configured to control the test device to test the array substrate.
  • the advantage of this application is that the test device and the test equipment provided by this application, by setting the carrier plate into a plurality of metal plates arranged in the first direction, and each metal plate extends in the second direction, that is, each metal plate is in the Compared with the arrangement of a plurality of metal plates assembled by snaps in the second direction, the metal plates in the embodiment of the present application do not need to be assembled, eliminating the gap adjustment and resistance between the metal plates.
  • the value measurement procedure saves a lot of time and improves the overall test efficiency.
  • the metal plate is a single piece in the second direction, and there is no problem of excessive resistance at some positions, which reduces the risk of electrostatic discharge.
  • the metal plate is a single piece in the second direction, which avoids the problems of individual differences in the metal plates and different assembly methods, and ensures the flatness of the entire test device.
  • FIG. 1 is a schematic plan view of the test device
  • FIG. 2 is a schematic plan structural view of a test device provided by an embodiment of the present application.
  • FIG. 3 is a schematic cross-sectional structure view taken along the direction A1-A2 in FIG. 2;
  • FIG. 4 is a schematic cross-sectional structure diagram along the direction A1-A2 in FIG. 2;
  • FIG. 5 is a schematic diagram when a carrier plate provided by an embodiment of the present application carries an array substrate
  • FIG. 6 is a schematic cross-sectional structure view taken along the direction B1-B2 in FIG. 5;
  • FIG. 7 is a schematic structural diagram of a test device according to an embodiment of the present application.
  • the carrier plate on the stage test device in the testing machine is assembled by multiple metal plates arranged in multiple rows and columns, and two adjacent metal plates in each column are connected by a buckle.
  • the test device in the testing machine includes a platform body 10, a carrier plate 20, and a conveying device (not shown in the figure), where the carrier plate 20 is fixed on the upper surface of the platform body 10, It is set to carry the array substrate, and the transfer device is set to transfer the array substrate.
  • the carrier plate 20 includes a plurality of metal plates 21 arranged in an array along rows and columns. There is a certain gap 22 between two adjacent metal plates 21 in the same column, and two adjacent metal plates 21 in the same column pass through the gap 22.
  • the snap (not shown) is connected.
  • the gap 22 between the two adjacent metal plates 21 in the same row needs to be adjusted, and the cavity of the test machine is opened each time Behind the chamber, it is necessary to measure the resistance value at the connection, which is time-consuming.
  • the resistance value at the connection is too large, it will cause static electricity accumulation, there is a risk of electrostatic discharge, and the product under test (array substrate) may be damaged.
  • the individual difference of the metal plate 21 and the influence of assembly cannot guarantee the flatness of the entire test device, which affects the detection of the product to be tested.
  • FIG. 2 is a schematic plan structural view of a test device provided in an embodiment of the present application. As shown in FIG. 2, the test device includes:
  • the carrier plate 20 is fixed on the upper surface of the platform body 10 and is configured to carry an array substrate.
  • the carrier plate 20 includes a plurality of metal plates 21 arranged along the first direction x, and each metal plate 21 extends along the second direction y, the first direction x intersects the second direction y;
  • the transfer device is configured to transfer the array substrate.
  • the transmission device includes a plurality of transmission shafts 30, and a transmission shaft 30 is provided between any two adjacent metal plates 21;
  • the transfer shaft 30 is fixed to the upper surface of the platform body 10, and the transfer shaft 30 rotates around the central axis, and is arranged to transfer the array substrate along the first direction x.
  • the test device is located in the vacuum chamber of the test equipment. Open the vacuum chamber and start the transfer device.
  • the transfer shaft 30 rotates, and the array substrate to be tested is pushed in from the side of the carrier plate 20 in the first direction x, and the array substrate is mounted on the transfer.
  • the transfer shaft 30 transfers the array substrate in the first direction x until the array substrate is all located on the carrier plate 20. Adjust the transfer device appropriately so that the array substrate is located in the detection area.
  • the carrier plate is arranged into a plurality of metal plates arranged along the first direction, and each metal plate extends along the second direction, that is, each metal plate is arranged as a whole in the second direction.
  • the metal plates in the embodiment of the present application do not need to be assembled, and the procedures for adjusting the gap between the metal plates and measuring the resistance value are omitted, which saves a lot of time.
  • the metal plate is a whole in the second direction, there is no problem of excessive resistance at some positions, reducing the risk of electrostatic discharge, and because the metal plate in the second direction is The whole piece avoids the problems of individual differences in metal plates and different assembly methods, and ensures the flatness of the entire test device.
  • the transmission device further includes a transmission driving device, and the transmission driving device is electrically connected to the plurality of transmission shafts and is configured to drive the plurality of transmission shafts to rotate.
  • the portion of the transfer shaft 30 that is in contact with the array substrate is flush with the surface of the metal plate 21 away from the platform body 10. Therefore, the flatness of the entire testing device can be ensured, and the array substrate can be transported in the first direction, and the array substrate can be attached to the surface of the metal plate 21 away from the platform body 10 to detect the array substrate.
  • FIG. 4 is another schematic cross-sectional structure diagram along the direction A1-A2 in FIG. 2.
  • the electrostatic tape 40 may include an electrostatic film and an antistatic film.
  • the electrostatic film is electrostatically bonded to the surface of the metal plate 21 away from the platform body 10.
  • the antistatic film has an antistatic effect, which can prevent the array substrate from being subjected to static electricity during the detection process. damage.
  • the portion of the transfer shaft 30 that is in contact with the array substrate can be flush with the surface of the metal plate 21 away from the platform body 10; of course, to prevent the transfer shaft 30 from slipping when rotating, The height or size of the transfer shaft 30 is adjusted so that the portion of the transfer shaft 30 that is in contact with the array substrate is flush with the surface of the electrostatic tape 40 away from the platform body 10.
  • both ends of the transmission shaft 30 may be rotatably disposed on a liftable support, and the transmission shaft 30 is fixed on the upper surface of the platform body 10 through the support.
  • the conveying shaft 30 can be adjusted to a desired height by adjusting the lifting of the support, so that the reliability of the conveying shaft 30 is improved while ensuring the flatness of the entire testing device.
  • the length of the metal plate 21 in the second direction y is greater than the length of the metal plate 21 in the first direction x.
  • the length of the metal plate 21 in the second direction y is greater than or equal to the length of the array substrate 100 in the second direction y after being placed, so that the array substrate 100 can be completely conveyed against the carrier plate.
  • the length of the carrier plate in the first direction x is greater than or equal to the length of the array substrate 100 in the first direction x after being placed, so that the array substrate 100 can be completely placed on the carrier plate so as to align the array substrate 100. Check it out.
  • the shape of the metal plate 21 is rectangular.
  • the metal plates 21 are arranged in parallel along the first direction x, and the first direction x is perpendicular to the second direction y. Therefore, the shape of the bearing plate composed of the metal plate 21 is rectangular, and the effective bearing area of the bearing plate can be increased.
  • each metal plate 21 can be prepared by the same mold, which can ensure the thickness and flatness of each metal plate 21 to be consistent, and further improve the flatness of the entire testing device.
  • each metal plate 21 can be divided into a single metal plate, which can also ensure that the thickness and flatness of each metal plate 21 are consistent, thereby improving the flatness of the entire testing device.
  • test device includes the test device in any of the foregoing embodiments and a control device 50 connected to the test device.
  • the control device 50 is configured to control the test device to test the array substrate.
  • the test device includes: the platform body 10, the carrier plate 20, and a transmission device; the carrier plate 20 is fixed on the upper surface of the platform body 10 and is configured to carry an array substrate; the carrier plate 20 includes a plurality of metal plates arranged along the first direction 21, each metal plate 21 extends in the second direction; the transfer device is configured to transfer the array substrate.
  • the transmission device includes a transmission driving device 31 and a plurality of transmission shafts 30.
  • the transmission driving device 31 is electrically connected to the plurality of transmission shafts 30 and is configured to drive the plurality of transmission shafts 30 to rotate; between any two adjacent metal plates 21 A transfer shaft 30 is provided; the transfer shaft 30 is fixed to the upper surface of the platform body 10, and the transfer shaft 30 rotates about its central axis, and is arranged to transfer the array substrate along the first direction x.
  • control device 50 is electrically connected to the transmission driving device 31 and is configured to send a driving control signal to the transmission driving device 31, and the transmission driving device 31 drives the plurality of transmission shafts 30 to rotate correspondingly according to the driving control signal.
  • each metal plate is arranged as a whole in the second direction.
  • the metal plates in the embodiment of the present application do not need to be assembled, and the procedures for adjusting the gap between the metal plates and measuring the resistance value are saved, which saves A large amount of time improves the overall test efficiency; at the same time, the metal plate is a whole piece in the second direction, and there is no problem of excessive resistance at some positions, which reduces the risk of electrostatic discharge, and because the metal plate is in the second direction As a whole, the problems of individual differences in metal plates and different assembly methods are avoided, and the flatness of the entire test device is guaranteed.
  • the array substrate in the above solution is a part of a display panel, and the display panel may be configured to prepare a mobile terminal.
  • the mobile terminal may be a smart phone, a tablet computer, or a personal digital assistant.

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

一种测试装置及测试设备，其中，测试装置包括：平台本体（10），承载板（20），固定于平台本体（10）上表面，设置为承载阵列基板（100），承载板（20）包括多个沿第一方向排列的金属板（21），每个金属板（21）沿第二方向延伸，其中第一方向与第二方向相交；还包括传送装置（30），设置为传送阵列基板（100）；其中测试设备包括该测试装置和与该测试装置连接的控制装置（50）。

Description

一种测试装置及测试设备
技术领域
本申请实施例涉及显示测试技术领域，尤其涉及一种测试装置及测试设备。
背景技术
液晶显示面板(Liquid Crystal Display，LCD)是目前最为普遍的显示器类型，在制造技术不断进步下，液晶显示面板的制造良率也随着提高，然而不可避免的，目前液晶显示面板的良率仍无法到达百分之百。基于良率上的考虑，在制造过程中，通常会加入检测机制以提高液晶显示面板的良率。
测试机可对液晶显示面板上像素阵列进行检测。目前，测试机中的stage测试装置上的承载板是由多行多列排布的多个金属板拼装而成的，每列相邻两个金属板通过卡扣连接。但由于每列相邻两个金属板连接处的电阻值无法保证都在规定范围内，因此需要调整每列相邻两个金属板之间的间隙，且每次打开测试机的腔室后，都需测量连接处的电阻值，比较耗时；在连接处的电阻值过大时，会造成静电聚集，存在静电释放的风险，可能损伤待测产品；另外，由于金属板的个体差异性和受拼装的影响，无法保证整个stage测试装置的平整度，影响对待测产品的检测。
发明内容
有鉴于此，本申请的目的是提出一种测试装置及测试设备，以提高测试效率，降低静电释放的风险，保证测试装置的平整度。
为实现上述目的，本申请采用如下技术方案：
在一个实施例中，本申请提供了一种测试装置，包括：
平台本体；
承载板，固定于所述平台本体上表面，设置为承载阵列基板，所述承载板包括多个沿第一方向排列的金属板，每个所述金属板沿第二方向延伸，所述第一方向与所述第二方向相交；
传送装置，设置为传送所述阵列基板。
在另一个实施例中，本申请提供了一种测试设备，包括本申请实施例提供的测试装置以及与所述测试装置连接的控制装置；
所述控制装置设置为控制所述测试装置对所述阵列基板进行测试。
本申请的优点是：本申请提供的测试装置及测试设备，通过将承载板设置成多个沿第一方向排列的金属板，且每个金属板沿第二方向延伸，即将每个金属板在第二方向上设置成一整块，与在第二方向上设置多个通过卡扣拼装的金属板相比，本申请实施例中的金属板无需拼装，省去了金属板之间间隙调整以及电阻值测量的程序，节省了大量时间，提高了整体测试效率；同时，金属板在第二方向上为一整块，不存在部分位置电阻值过大的问题，降低了静电释放的风险，而且由于金属板在第二方向上为一整块，避免了金属板个体差异以及拼装手法不同的问题，保证了整个测试装置的平整度。
附图说明
下面将通过参照附图详细描述本申请的示例性实施例，使本领域的普通技术人员更清楚本申请的上述及其他特征和优点，附图中：
图1是测试装置的平面结构示意图；
图2是本申请实施例提供的测试装置的平面结构示意图；
图3是沿图2中A1-A2方向的剖面结构示意图；
图4是沿图2中A1-A2方向的另一剖面结构示意图；
图5是本申请实施例提供的承载板承载阵列基板时的示意图；
图6是沿图5中B1-B2方向的剖面结构示意图；
图7是本申请实施例提供的测试设备的结构示意图。
具体实施方式
下面结合附图并通过具体实施方式来进一步说明本申请的技术方案。可以理解的是，此处所描述的具体实施例仅仅设置为解释本申请，而非对本申请的限定。另外还需要说明的是，为了便于描述，附图中仅示出了与本申请相关的部分而非全部结构。
目前，测试机中的stage测试装置上的承载板是由多行多列排布的多个金属板拼装而成的，每列相邻两个金属板通过卡扣连接。示例性的，如图1所示，通常，测试机中的测试装置包括平台本体10、承载板20和传送装置（图中未示出），其中，承载板20固定于平台本体10上表面，设置为承载阵列基板，传送装置，设置为传送阵列基板。承载板20包括多个沿行列呈阵列排布的金属板21，同一列相邻两个金属板21之间具有一定的间隙22，且同一列相邻两个金属板21通过位于间隙22处的卡扣（图中未示出）连接。但由于同一列相邻两个金属板21连接处的电阻值无法保证都在规定范围内，因此需要调整同一列相邻两个金属板21之间的间隙22，且每次打开测试机的腔室后，都需测量连接处的电阻值，比较耗时；在连接处的电阻值过大时，会造成静电聚集，存在静电释放的风险，可能损伤待测产品（阵列基板）；另外，由于金属板21的个体差异性和受拼装的影响，无法保证整个测试装置的平整度，影响对待测产品的检测。
针对上述问题，本申请实施例提供了一种测试装置，该测试装置可实现阵列组件效能测试。图2是本申请实施例提供的测试装置的平面结构示意图，如图2所示，该测试装置包括：
平台本体10；
承载板20，固定于平台本体10上表面，设置为承载阵列基板，承载板20包括多个沿第一方向x排列的金属板21，每个金属板21沿第二方向y延伸，第一方向x与第二方向y相交；
传送装置，设置为传送阵列基板。
其中，传送装置包括多个传送轴30,任意相邻两个金属板21之间设置有传送轴30；
传送轴30固定于平台本体10上表面，传送轴30绕中心轴转动，设置为沿第一方向x传送阵列基板。
测试装置位于测试设备的真空舱中，打开真空舱，启动传送装置，传送轴30转动，将待检测的阵列基板从承载板20位于第一方向x上的一侧推入，阵列基板搭载到传送轴30上时，传送轴30将阵列基板沿第一方向x传送，直至阵列基板全部位于承载板20上。适当调节传送装置，使阵列基板位于检测区域。
本实施例提供的测试装置，通过将承载板设置成多个沿第一方向排列的金属板，且每个金属板沿第二方向延伸，即将每个金属板在第二方向上设置成一整块，与在第二方向上设置多个通过卡扣拼装的金属板相比，本申请实施例中的金属板无需拼装，省去了金属板之间间隙调整以及电阻值测量的程序，节省了大量时间，提高了整体测试效率；同时，金属板在第二方向上为一整块，不存在部分位置电阻值过大的问题，降低了静电释放的风险，而且由于金属板在第二方向上为一整块，避免了金属板个体差异以及拼装手法不同的问题，保证了整个测试装置的平整度。
可选的，传送装置包括还包括传送驱动装置，传送驱动装置与多个传送轴电性连接，设置为驱动多个传送轴转动。
可选的，参考图3，上述方案中，传送轴30与阵列基板接触的部分，和金属板21远离平台本体10一侧的表面相齐平。由此，可以保证整个测试装置的平整度，既可使阵列基板沿第一方向传送，又可使阵列基板贴附于金属板21远离平台本体10一侧的表面，以对阵列基板进行检测。
图4是沿图2中A1-A2方向的另一剖面结构示意图，如图4所示，本实施例中，金属板21远离平台本体10一侧的表面贴有静电胶带40。该静电胶带40可包括静电膜和防静电膜，静电膜通过静电贴合在金属板21远离平台本体10一侧的表面，防静电膜具有抗静电作用，可避免阵列基板在检测过程中受到静电损伤。另外，由于静电胶带40很薄，传送轴30与阵列基板接触的部分，可以和金属板21远离平台本体10一侧的表面相齐平；当然，为防止传送轴30转动时打滑，也可以对传送轴30的高度或大小进行调整，使得传送轴30与阵列基板接触的部分，和静电胶带40远离平台本体10一侧的表面相齐平。
可选的，传送轴30的两端可以可转动地设置于可升降的支架上，传送轴30通过支架固定在平台本体10上表面。通过调节支架升降可调节传送轴30至所需高度，因此在提高传送轴30可靠性的同时保证整个测试装置的平整度。
可选的，可继续参考图2，金属板21在第二方向y上的长度大于金属板21在第一方向x上的长度。
示例性的，参考图5，金属板21在第二方向y上的长度大于或等于放置后的阵列基板100在第二方向y上的长度，以使阵列基板100可以完全贴着承载板传送。参考图6，承载板在第一方向x上的长度大于或等于放置后的阵列基板100在第一方向x上的长度，以使阵列基板100可以完全置于承载板上，以便对阵列基板100进行检测。
可选的，金属板21的形状为矩形，金属板21沿第一方向x平行排列，第一方向x与第二方向y相垂直。由此，由金属板21组成的承载板的形状为矩形，可增加承载板的有效承载面积。
可选的，上述方案中，各金属板21的大小相同。此时，各金属板21可由同一模具制备，可以保证各金属板21的厚度及平整度一致，进一步提高整个测试装置的平整度。另外，各金属板21可由一整块金属板分割而成，也可以保证各金属板21的厚度及平整度一致，提高整个测试装置的平整度。
本申请实施例还提供了一种测试设备，如图7所示，该测试设备包括上述任一实施例中的测试装置以及与测试装置连接的控制装置50；
控制装置50设置为控制测试装置对阵列基板进行测试。
可选的，测试装置包括：平台本体10、承载板20和传送装置；承载板20固定于平台本体10上表面，设置为承载阵列基板；承载板20包括多个沿第一方向排列的金属板21，每个金属板21沿第二方向延伸；传送装置设置为传送阵列基板。其中，传送装置包括传送驱动装置31和多个传送轴30，传送驱动装置31与多个传送轴30电性连接，设置为驱动多个传送轴30转动；任意相邻两个金属板21之间设置有传送轴30；传送轴30固定于平台本体10上表面，传送轴30绕其中心轴转动，设置为沿第一方向x传送阵列基板。
可选的，控制装置50与传送驱动装置31电性连接，设置为向传送驱动装置31发送驱动控制信号，传送驱动装置31根据驱动控制信号驱动多个传送轴30相应转动。
本实施例提供的测试设备中，通过将承载板设置成多个沿第一方向排列的金属板，且每个金属板沿第二方向延伸，即将每个金属板在第二方向上设置成一整块，与在第二方向上设置多个通过卡扣拼装的金属板相比，本申请实施例中的金属板无需拼装，省去了金属板之间间隙调整以及电阻值测量的程序，节省了大量时间，提高了整体测试效率；同时，金属板在第二方向上为一整块，不存在部分位置电阻值过大的问题，降低了静电释放的风险，而且由于金属板在第二方向上为一整块，避免了金属板个体差异以及拼装手法不同的问题，保证了整个测试装置的平整度。
上述方案中的阵列基板为显示面板的一部分，该显示面板可设置为制备移动终端，移动终端可以为智能手机、平板电脑或个人数字助理等。
注意，上述仅为本申请的较佳实施例及所运用技术原理。本领域技术人员会理解，本申请不限于这里所述的特定实施例，对本领域技术人员来说能够进行各种明显的变化、重新调整、相互结合和替代而不会脱离本申请的保护范围。因此，虽然通过以上实施例对本申请进行了较为详细的说明，但是本申请不仅仅限于以上实施例，在不脱离本申请构思的情况下，还可以包括更多其他等效实施例，而本申请的范围由所附的权利要求范围决定。

Claims (20)

  1. 一种测试装置，其中，包括：
    平台本体；
    承载板，固定于所述平台本体上表面，设置为承载阵列基板，所述承载板包括多个沿第一方向排列的金属板，每个所述金属板沿第二方向延伸，所述第一方向与所述第二方向相交；以及
    传送装置，设置为传送所述阵列基板。
  2. 根据权利要求1所述的测试装置，其中，所述传送装置包括多个传送轴,任意相邻两个所述金属板之间设置有所述传送轴；
    所述传送轴固定于所述平台本体上表面，所述传送轴绕中心轴转动，设置为沿所述第一方向传送所述阵列基板。
  3. 根据权利要求2所述的测试装置，其中，所述传送轴与所述阵列基板接触的部分，和所述金属板远离所述平台本体一侧的表面相齐平。
  4. 根据权利要求1所述的测试装置，其中，所述金属板远离所述平台本体一侧的表面贴有静电胶带。
  5. 根据权利要求1所述的测试装置，其中，所述金属板在所述第二方向上的长度大于所述金属板在所述第一方向上的长度。
  6. 根据权利要求5所述的测试装置，其中，所述金属板在所述第二方向上的长度大于或等于放置后的所述阵列基板在所述第二方向上的长度。
  7. 根据权利要求1所述的测试装置，其中，所述金属板的形状为矩形，所述金属板沿所述第一方向平行排列。
  8. 根据权利要求1所述的测试装置，其中，所述第一方向与所述第二方向相垂直。
  9. 根据权利要求1所述的测试装置，其中，各所述金属板的大小相同。
  10. 一种测试装置，其中，包括：
    平台本体；
    承载板，固定于所述平台本体上表面，设置为承载阵列基板，所述承载板包括多个沿第一方向排列的金属板，每个所述金属板沿第二方向延伸，所述第一方向与所述第二方向相交；以及
    传送装置，设置为传送所述阵列基板，所述传送装置包括多个传送轴,任意相邻两个所述金属板之间设置有所述传送轴；
    所述传送轴固定于所述平台本体上表面，所述传送轴绕中心轴转动，设置为沿所述第一方向传送所述阵列基板，所述金属板远离所述平台本体一侧的表面贴有静电胶带。
  11. 一种测试设备，其中，包括所述的测试装置以及与所述测试装置连接的控制装置；所述测试装置包括：
    平台本体；
    承载板，固定于所述平台本体上表面，设置为承载阵列基板，所述承载板包括多个沿第一方向排列的金属板，每个所述金属板沿第二方向延伸，所述第一方向与所述第二方向相交；以及
    传送装置，设置为传送所述阵列基板；
    所述控制装置设置为控制所述测试装置对所述阵列基板进行测试。
  12. 根据权利要求11所述的测试设备，其中，所述传送装置包括多个传送轴,任意相邻两个所述金属板之间设置有所述传送轴；
    所述传送轴固定于所述平台本体上表面，所述传送轴绕中心轴转动，设置为沿所述第一方向传送所述阵列基板。
  13. 根据权利要求12所述的测试设备，其中，所述传送轴与所述阵列基板接触的部分，和所述金属板远离所述平台本体一侧的表面相齐平。
  14. 根据权利要求11所述的测试设备，其中，所述金属板远离所述平台本体一侧的表面贴有静电胶带。
  15. 根据权利要求11所述的测试设备，其中，所述金属板在所述第二方向上的长度大于所述金属板在所述第一方向上的长度。
  16. 根据权利要求15所述的测试设备，其中，所述金属板在所述第二方向上的长度大于或等于放置后的所述阵列基板在所述第二方向上的长度。
  17. 根据权利要求11所述的测试设备，其中，所述金属板的形状为矩形，所述金属板沿所述第一方向平行排列。
  18. 根据权利要求11所述的测试设备，其中，所述第一方向与所述第二方向相垂直。
  19. 根据权利要求11所述的测试设备，其中，各所述金属板的大小相同。
  20. 根据权利要求11所述的测试设备，其中，所述测试装置包括：
    所述传送轴固定于所述平台本体上表面，所述传送轴绕中心轴转动，设置为沿所述第一方向传送所述阵列基板，所述金属板远离所述平台本体一侧的表面贴有静电胶带。
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