WO2019163055A1 - Dispositif de mesure - Google Patents

Dispositif de mesure Download PDF

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Publication number
WO2019163055A1
WO2019163055A1 PCT/JP2018/006479 JP2018006479W WO2019163055A1 WO 2019163055 A1 WO2019163055 A1 WO 2019163055A1 JP 2018006479 W JP2018006479 W JP 2018006479W WO 2019163055 A1 WO2019163055 A1 WO 2019163055A1
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WO
WIPO (PCT)
Prior art keywords
current
voltage
measurement
input terminal
terminal
Prior art date
Application number
PCT/JP2018/006479
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English (en)
Japanese (ja)
Inventor
佑司 直海
浩靖 高田
哲 石坂
Original Assignee
三菱電機株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 三菱電機株式会社 filed Critical 三菱電機株式会社
Priority to PCT/JP2018/006479 priority Critical patent/WO2019163055A1/fr
Priority to DE112018000383.3T priority patent/DE112018000383B4/de
Priority to JP2018554119A priority patent/JP6465262B1/ja
Priority to CN201880011298.2A priority patent/CN110392837B/zh
Publication of WO2019163055A1 publication Critical patent/WO2019163055A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/2506—Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
    • G01F15/00—Details of, or accessories for, apparatus of groups G01F1/00 - G01F13/00 insofar as such details or appliances are not adapted to particular types of such apparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/36—Overload-protection arrangements or circuits for electric measuring instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16504—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the components employed
    • G01R19/16519—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the components employed using FET's

Definitions

  • the present invention relates to a measuring apparatus that measures analog signals input from various circuits to be measured, such as a flow sensor, a pressure sensor, and a displacement sensor.
  • measuring apparatuses that measure analog signals input from various circuits to be measured using a single AD conversion unit, such as the apparatuses described in Patent Document 1 and Patent Document 2, are known.
  • FIG. 4 shows the configuration of the apparatus described in Patent Document 1.
  • a circuit to be measured such as a sensor (not shown)
  • the connection destination and the connection corresponding to the rated input voltage of the AD conversion unit By changing the circuit, AD conversion corresponding to various analog input signals is performed.
  • the switch SW41 when measuring the input voltage within the range of the rated input voltage of the AD converter, the input voltage is applied to the voltage input terminal TB1 and the common terminal TB3, the switch SW41 is switched, and the input voltage input is changed. Measured directly by the AD converter. Further, when measuring an input voltage equal to or higher than the rated input voltage of the AD converter, an input voltage is applied to the voltage input terminal TB1 and the common terminal TB3, and the switch SW41 is switched to connect to the voltage measuring resistor R41. By opening SW42, the input voltage between the voltage input terminal TB1 and the common terminal TB3 is measured by the AD converter.
  • the apparatus described in Patent Document 2 includes an abnormality determination circuit B53 in addition to a single AD conversion unit.
  • the input voltage is applied to the input terminal TB51 and the equipotential terminal TB52, and the first switch circuit SW51 is switched to connect to the voltage measurement circuit B52.
  • the second switch circuit SW52 is switched to connect the connection point N11 and the channel CH2.
  • the first switch circuit SW51 is switched to connect to the current measurement circuit B51 (resistor R51), and the second switch circuit.
  • the switch 52 is switched to connect to the abnormality determination circuit B53 (connection point N12).
  • the voltage between the input terminal TB51 and the equipotential terminal TB52 is applied to the current measurement circuit B51, and the input current between the input terminal TB51 and the equipotential terminal TB52 is AD converted by measuring the voltage drop across the resistor R51. Measured by part.
  • the voltage at the connection point N21 is monitored, and when a voltage higher than a predetermined value is measured, the first switch circuit SW51 is switched and connected to the voltage measurement circuit B52. In this way, overheating of the current measuring circuit B51 (resistor R51) is reduced.
  • an abnormality determination circuit and a switch are separated from the voltage measurement circuit and the current measurement circuit for the purpose of monitoring whether or not a current exceeding a specified value flows in the current detection circuit. Since a circuit is provided separately, two double-throw switch circuits are required to measure the voltage or current of one circuit under test. The double throw type switch circuit must maintain a certain distance in order to insulate the two switching destinations from each other in the internal configuration, and is difficult to be integrated and thus downsized.
  • the present invention has been made in view of the above, and an object of the present invention is to provide a measuring apparatus capable of reducing the size of the entire circuit.
  • the apparatus includes a current input terminal for connecting to one end of the circuit under test at the time of current measurement, and other than the circuit under test at the time of current measurement.
  • a common terminal for connection to the end, an AD converter for current measurement for converting the magnitude of the current flowing between the current input terminal and the common terminal from an analog value to a digital value, and the common terminal and the AD conversion for current measurement
  • an overcurrent that is a current of a specified magnitude or greater has flowed between the current input terminal and the common terminal.
  • a control unit that disconnects the connection between the common terminal and the current measurement AD conversion unit.
  • the number of switch circuits to be used can be reduced, and as a result, the entire circuit can be reduced in size.
  • FIG. 3 is a schematic diagram illustrating a configuration example of a switch circuit configuring the first embodiment. It is a block diagram of the voltage-current measuring apparatus of Embodiment 2 which concerns on this invention. It is a block diagram of the conventional voltage current measuring apparatus. It is a block diagram of the other conventional voltage / current measuring apparatus.
  • FIG. 1 is a diagram showing a configuration example of Embodiment 1 of a measuring apparatus according to the present invention.
  • the measuring device is configured as a voltage / current measuring device, and the voltage / current measuring device 100 is not shown, for example, such as a flow sensor, a pressure sensor, or a displacement sensor via the input terminal block 2 of the device.
  • the voltage / current measuring device 100 is not shown, for example, such as a flow sensor, a pressure sensor, or a displacement sensor via the input terminal block 2 of the device.
  • Connected to various circuits under test measures the voltage of the analog signal input from the circuit under test via the input terminal block 2, and digitally measures the voltage or current measurement result of the analog signal from the output terminal block not shown. The signal is output.
  • the voltage / current measuring apparatus 100 basically includes an analog-digital conversion circuit 1 (hereinafter referred to as an AD conversion circuit), an input terminal block 2 (hereinafter simply referred to as a terminal block), A voltage measurement circuit 3, a current measurement circuit 4, a switch circuit 5, an FET 6, a protection diode 7, and a protection diode 8 are provided. Note that in this embodiment mode, each circuit is manufactured over the same semiconductor substrate, but may be formed over a plurality of semiconductor substrates and electrically connected to each other.
  • the AD conversion circuit 1 includes a voltage measurement AD conversion unit 1a, a current measurement AD conversion unit 1b, and a control unit 1c.
  • the voltage measurement AD converter 1a is configured by, for example, an operational amplifier (op-amp), and has a positive analog input terminal Ain1 (+), a negative analog input terminal Ain1 ( ⁇ ), and a digital output terminal Dout1.
  • the voltage measurement AD conversion unit 1a converts a potential difference between analog values of voltages applied to the positive analog input terminal Ain1 (+) and the negative analog input terminal Ain1 ( ⁇ ) into a digital value and outputs the digital value from the digital output terminal Dout1.
  • the value output from the digital output terminal Dout1 is the measurement result of the voltage of the circuit under measurement (not shown).
  • the AD converter 1b for current measurement is configured by, for example, an operational amplifier (operational amplifier), and includes a positive analog input terminal Ain2 (+), a negative analog input terminal Ain2 ( ⁇ ), and a digital output terminal Dout2. And have.
  • the AD converter 1b for current measurement converts the potential difference between the analog values of the voltages applied to the positive analog input terminal Ain2 (+) and the negative analog input terminal Ain2 ( ⁇ ) into a digital value, and outputs the digital value from the digital output terminal Dout2. .
  • the value output from the digital output terminal Dout2 is the measurement result of the current of the circuit under measurement (not shown).
  • the control unit 1c is constituted by a microcomputer, for example, and has a digital input terminal Din1, a digital input terminal Din2, and a digital output terminal Dout.
  • the digital input terminal Din1 is connected to the digital output terminal Dout1 of the voltage measurement AD converter 1a, and receives the voltage measurement result of the circuit under test.
  • the digital input terminal Din2 is connected to the digital output terminal Dout2 of the current measurement AD converter 1b, and receives the current measurement result of the circuit under test.
  • the digital output terminal Dout is connected to the switch circuit 5 and the FET 6, and a later-described control signal for controlling on / off of the switch circuit 5 and the FET 6 is output.
  • control unit 1c executes a program stored therein to measure the voltage of the circuit under measurement, and when the voltage is measured, the control unit 1c turns off the switch circuit 5 and the FET 6 and is a logic L level (for example, “0 V”). Are output from the digital output terminal Dout.
  • control unit 1c executes a program stored therein to measure the current of the circuit under measurement, so that the control circuit 1c turns on the switch circuit 5 and the FET 6 at a logic H level (for example, “5V”). A control signal is generated and output from the digital output terminal Dout.
  • the control unit 1c compares the measured current value with a predetermined value (for example, 30 mA) stored in the control unit 1c. . Then, the control unit 1c outputs a logic L level control signal for turning off the switch circuit 5 and the FET 6 when the current value being measured is a current larger than a predetermined magnitude, that is, when an overcurrent flows. And output from the digital output terminal Dout. On the other hand, the control unit 1c generates a logic L level control signal for turning on the switch circuit 5 and the FET 6 when the measured current value is equal to or less than the predetermined value, that is, when a normal current is flowing, The current measurement is continued by outputting from the output terminal Dout.
  • a predetermined value for example, 30 mA
  • the terminal block 2 includes a voltage input terminal V + for connecting to one end of the circuit under measurement when measuring the voltage of the circuit under measurement (not shown), and a current for connecting to one end of the circuit under measurement when measuring the current of the circuit under measurement. It has an input terminal I + and a common terminal COM for connecting to the other end of the circuit under test when measuring the voltage or current of the circuit under test.
  • the voltage input terminal V + is connected to the input terminal Ain1 (+) through the voltage measurement circuit 3.
  • the current input terminal I + is connected to the input terminal Ain2 (+) via the current measurement circuit 4.
  • the common terminal COM is connected to the input terminal Ain1 ( ⁇ ) via the voltage measurement circuit 3, and is connected to the input terminal Ain2 ( ⁇ ) via the current measurement circuit 4 and the switch circuit 5.
  • the voltage measurement circuit 3 includes a resistor R1, a resistor R2, a resistor R3, and a resistor R4, and is disposed between the terminal block 2 and the voltage measurement AD converter 1a.
  • the resistor R1 is disposed between the voltage input terminal V + and the input terminal Ain1 (+)
  • the resistor R4 is disposed between the common terminal COM of the terminal block 2 and the input terminal Ain1 ( ⁇ ).
  • Resistors R2 and R3 are arranged in series between the resistors R1 and R4.
  • the voltage of the circuit under test is input between the voltage input terminal V + of the terminal block 2 and the common input terminal COM, and is divided by the resistors R1 to R4, whereby the input terminal Ain1 (+) and the input terminal This voltage can be input to Ain1 ( ⁇ ).
  • the resistors R1 and R4 have a resistance value of “several tens k ⁇ ”, for example, and the resistors R2 and R3 have a resistance value of “several hundred k ⁇ ”, for example.
  • the resistance values of these resistors R1 to R4 are the voltage inputs of the voltage measuring AD converter 1a even when the maximum voltage within the rating is applied between the voltage input terminal V + of the terminal block 2 and the common terminal COM.
  • the voltage input between the terminal Ain (+) and the voltage input terminal Ain ( ⁇ ) is selected so as to be within a rating (for example, “5V”).
  • the current measurement circuit 4 includes a resistor Rs and a resistor R5, and is disposed between the terminal block 2 and the current measurement AD converter 1b. Specifically, a resistor R5 is disposed between the current input terminal I + and the input terminal Ain2 (+), and a resistor Rs is disposed between the resistor R5 and the input terminal Ain2 ( ⁇ ).
  • the voltage of the circuit under test is input between the current input terminal I + of the terminal block 2 and the common terminal COM, and is divided by the resistor R5 and the resistor Rs, whereby the input terminal Ain2 (+) and the input are input. The voltage can be input to the terminal Ain2 ( ⁇ ).
  • the resistor Rs has a resistance value of “several tens of ohms”, for example, and the resistor R5 has a resistance value of “several hundreds ⁇ ”, for example.
  • the resistance values of these resistors R1 to R4 are the same as the current input of the AD converter 1b for current measurement even when the maximum voltage within the rating is applied between the current input terminal I + of the terminal block 2 and the common terminal COM.
  • the voltage input between the terminal Ain (+) and the current input terminal Ain ( ⁇ ) is selected so as to be within a rating (for example, “5V”).
  • FIG. 2 is a schematic diagram showing one configuration of the switch circuit 5 shown in FIG. The switch circuit 5 and the FET 6 will be described with reference to FIG.
  • the switch circuit 5 includes a multiplexer 5a, a control input terminal 5b, a power supply terminal 5c, a protection diode 5d, and a protection diode 5e.
  • the multiplexer 5a is, for example, a single throw multiplexer, and is configured to include an analog switch and a switch driver, and is arranged between the current input terminal I + of the terminal block 2 and the common terminal COM.
  • the multiplexer 5a (specifically, an analog switch) is directly connected to the current input terminal I + and the common terminal COM.
  • a current measurement circuit 4 is interposed between the current input terminal I +.
  • control input terminal 5b is connected to the output terminal Dout and receives the control signal.
  • the power supply terminal 5c is connected to the power supply E through the FET 6 which is a semiconductor switch, and the power supply is supplied from the power supply E.
  • the protection diode 5d is disposed between the connection point N1 and the ground, and the protection diode 5e is disposed between the power supply terminal 5c and the connection point N1.
  • the FET 6 is disposed between the switch circuit 5 and the power source E, the gate terminal G is connected to the output terminal Dout, and the control signal is input thereto.
  • a logic L level control signal is output from the output terminal Dout of the control unit 1c to each of the gate G of the FET 6 and the control input terminal 5b of the switch circuit 5. Entered. At this time, since the FET 6 is not driven, no power is supplied from the power source E to the switch circuit 5. At this time, since the multiplexer 5a is off, the current input terminal I + of the terminal block 2 and the common terminal COM are not connected and disconnected. Therefore, the common terminal COM is connected only to the voltage measurement AD converter 1a.
  • the logic H level control is performed for each of the gate G of the FET 6 and the control input terminal 5b of the switch circuit 5 from the output terminal Dout of the control unit 1c. A signal is input.
  • the FET 6 since the FET 6 is driven, power is supplied to the switch circuit 5 from the power supply E. Since the multiplexer 5a is turned on while the power is supplied to the switch circuit 5, the current input terminal I + of the terminal block 2 and the common terminal COM are connected. Therefore, the common terminal COM is connected not only to the voltage measurement AD converter 1a but also to the current measurement AD converter 1b.
  • the switch circuit 5 can switch the connection destination of the common terminal COM between only the voltage measurement AD converter 1a and both the voltage measurement AD converter 1a and the current measurement AD converter 1b. It is configured.
  • the FET 6 is configured to be able to cut off the power supply from the power source E to the switch circuit 5.
  • the FET 6 is arranged between the switch circuit 5 constituted by the multiplexer 5a and the power source E.
  • the switch circuit 5 is on standby (while it is turned off)
  • a voltage is applied between the voltage input terminal V + of the terminal block 2 and the common terminal COM, or between the current input terminal I + and the common terminal COM.
  • a leakage current may flow through the protection diodes 5d and 5e of the switch circuit 5.
  • the leakage current flows, current continues to flow from the voltage input terminal V + to the common terminal COM or from the current input terminal I + to the common terminal COM.
  • the FET 6 is disposed between the switch circuit 5 and the power source E, when the switch circuit 5 is on standby, the voltage input terminal V + and the common terminal COM, or the current input Even if a voltage is input between the terminal I + and the common terminal COM, the leakage current of the switch circuit 5 can be cut off. As a result, it is possible to prevent a situation in which a current continues to flow from the voltage input terminal V + to the common terminal COM or from the current input terminal I + to the common terminal COM.
  • the FET 6 is not necessarily provided and may be omitted.
  • the protective diode 7 is connected between the voltage input terminal V + and the resistor R1, and the protective diode 8 is connected between the common terminal COM and the resistor R4.
  • the control unit 1c When measuring the voltage or current of the circuit under test using the voltage / current measuring apparatus 100 configured as described above, first, an engine tool (not shown) is connected to the voltage / current measuring apparatus 100, and the controller 1c is set. Is called. Specifically, the control unit 1c is set to output a logic L level control signal from the output terminal Dout when measuring the voltage of the circuit under measurement, and when measuring the current of the circuit under measurement, the control unit 1c performs a logic operation from the output terminal Dout. It is set to output an H level control signal.
  • one end and the other end of the circuit under test are connected to the voltage input terminal V + and the common terminal COM of the terminal block 2, respectively.
  • the control signal of logic L level is output from the output terminal Dout of the control unit 1c to the gate G of the FET 6 and the control input terminal 5b of the switch circuit 5, the switch circuit 5 and the FET 6 are turned off.
  • the input voltage between the power supply input terminal V + and the common terminal COM is measured by the voltage measurement AD converter 1a.
  • control unit 1c detects whether or not an overcurrent flows based on the output value of the current measurement AD conversion unit 1b.
  • the gate G of the FET 6 and the switch circuit are detected. 5 to output a logic L level control signal to the control input terminal 5b and turn it off, thereby disconnecting the connection between the common terminal COM and the input terminal Ain2 ( ⁇ ) of the current measuring AD converter 1b.
  • the current measuring circuit 4 is protected.
  • the voltage / current measuring apparatus of the first embodiment although only two operational amplifiers are required for one circuit to be measured, only one switch circuit is required. Since the operational amplifier can be integrated more than the switch circuit, and thus can be downsized, the entire circuit can be downsized.
  • the FET 6 capable of cutting off the power supply to the switch circuit 5 is provided, and the control unit 1c cuts off the power supply to the switch circuit 5 by the FET 6. As a result, it is possible to prevent a leakage current from occurring when the switch circuit 5 is on standby.
  • FIG. 3 The measuring apparatus according to the present invention is not limited to the configuration of the first embodiment.
  • the voltage / current measuring apparatus 100a has a configuration similar to that of the voltage / current measuring apparatus 100 shown in FIG.
  • differences from the configuration of the first embodiment will be mainly described, and the same reference numerals are given to the same configurations.
  • the terminal block 2a is connected to a voltage input terminal V ⁇ connected to a circuit to be measured (not shown), a current input terminal I ⁇ connected to the circuit to be measured, a voltage input terminal V + and a current input terminal I +. And a common terminal COM to be connected.
  • the voltage input terminal V ⁇ is connected to the input terminal Ain1 ( ⁇ ) via the voltage measurement circuit 3.
  • the current input terminal I ⁇ is connected to the input terminal Ain2 ( ⁇ ) via the current measurement circuit 4.
  • the common terminal COM is connected to the input terminal Ain1 (+) through the voltage measurement circuit 3, and is connected to the input terminal Ain2 (+) through the current measurement circuit 4 and the switch circuit 5.
  • the polarity of the voltage input terminal V + of the terminal block 2 is inverted to the voltage input terminal V ⁇ of the terminal block 2a
  • the polarity of the current input terminal I + of the terminal block 2 is inverted to the current input terminal I ⁇ of the terminal block 2a.
  • the protection diode 7a is connected between the voltage input terminal V ⁇ and the resistor R4, and the protection diode 8a is connected between the common terminal COM and the resistor R1. Even with such a configuration, the same effect as that of the voltage / current measuring apparatus 100 can be obtained.
  • the switch circuit 5 is configured by a single throw type multiplexer, but the present invention is not limited thereto. Instead, it may be composed of a single throw type analog switch. In short, a single-throw switch circuit can produce the same effect.
  • the measuring device is realized as a voltage / current measuring device that measures the voltage or current of the circuit under measurement.
  • a configuration for measuring the voltage of the circuit may not be provided. That is, a voltage input terminal for connecting to one end of the circuit under test at the time of voltage measurement, and for voltage measurement that converts the magnitude of the voltage applied between the voltage input terminal and the common terminal from an analog value to a digital value
  • the AD converter may be omitted, and the measuring apparatus may be configured to measure only the current of the circuit under measurement. Since the single throw type switch circuit can be reduced in size compared with the double throw type switch circuit, the intended purpose of downsizing the entire circuit can be achieved.
  • the configuration of the embodiment described above shows an example of the content of the present invention, and can be combined with another known technique, or a part of the configuration without departing from the gist of the present invention. Can be omitted or changed.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Fluid Mechanics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

Le dispositif de mesure de tension et de courant (100) d'après la présente invention comprend : une borne d'entrée de courant I+ conçue pour se connecter à une extrémité d'un circuit soumis à une mesure pendant une mesure de courant ; une borne commune COM conçue pour se connecter à l'autre extrémité dudit circuit pendant une mesure de courant ; une unité de conversion A/N de mesure de courant (1b) conçue pour convertir l'intensité du courant circulant entre la borne d'entrée de courant I+ et la borne commune COM d'une valeur analogique en une valeur numérique ; un circuit de commutation (5) situé entre la borne commune COM et l'unité de conversion A/N de mesure de courant (1b) ; et une unité de commande (1c) conçue pour interrompre la connexion entre la borne commune COM et l'unité de conversion A/N de mesure de courant (1b) lorsqu'elle détecte, sur la base d'une valeur de sortie provenant de l'unité de conversion A/N de mesure de courant (1b), qu'une surintensité, à savoir un courant supérieur ou égal à une intensité spécifiée, a circulé entre la borne d'entrée de courant I+ et la borne commune COM.
PCT/JP2018/006479 2018-02-22 2018-02-22 Dispositif de mesure WO2019163055A1 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
PCT/JP2018/006479 WO2019163055A1 (fr) 2018-02-22 2018-02-22 Dispositif de mesure
DE112018000383.3T DE112018000383B4 (de) 2018-02-22 2018-02-22 Messvorrichtung
JP2018554119A JP6465262B1 (ja) 2018-02-22 2018-02-22 測定装置
CN201880011298.2A CN110392837B (zh) 2018-02-22 2018-02-22 测定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2018/006479 WO2019163055A1 (fr) 2018-02-22 2018-02-22 Dispositif de mesure

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WO2019163055A1 true WO2019163055A1 (fr) 2019-08-29

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JP (1) JP6465262B1 (fr)
CN (1) CN110392837B (fr)
DE (1) DE112018000383B4 (fr)
WO (1) WO2019163055A1 (fr)

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JP2007333574A (ja) * 2006-06-15 2007-12-27 Sanyo Electric Co Ltd センシング装置
WO2015025709A1 (fr) * 2013-08-23 2015-02-26 日立オートモティブシステムズ株式会社 Dispositif de surveillance de batterie
JP2017034792A (ja) * 2015-07-30 2017-02-09 ミツミ電機株式会社 マルチチップ、電池保護装置及び電池パック

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DE112018000383T5 (de) 2019-10-10
CN110392837A (zh) 2019-10-29
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JPWO2019163055A1 (ja) 2020-02-27
JP6465262B1 (ja) 2019-02-06

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