WO2019127910A1 - Thinning machine - Google Patents

Thinning machine Download PDF

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Publication number
WO2019127910A1
WO2019127910A1 PCT/CN2018/078721 CN2018078721W WO2019127910A1 WO 2019127910 A1 WO2019127910 A1 WO 2019127910A1 CN 2018078721 W CN2018078721 W CN 2018078721W WO 2019127910 A1 WO2019127910 A1 WO 2019127910A1
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WIPO (PCT)
Prior art keywords
stage
tray
thinning machine
rotating tray
grinding
Prior art date
Application number
PCT/CN2018/078721
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French (fr)
Chinese (zh)
Inventor
杨生荣
贺东葛
姚立新
王仲康
衣忠波
刘宇光
张盼
Original Assignee
北京中电科电子装备有限公司
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Publication of WO2019127910A1 publication Critical patent/WO2019127910A1/en

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B7/00Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
    • B24B7/20Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
    • B24B7/22Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
    • B24B7/228Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding thin, brittle parts, e.g. semiconductors, wafers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B41/00Component parts such as frames, beds, carriages, headstocks
    • B24B41/02Frames; Beds; Carriages
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B41/00Component parts such as frames, beds, carriages, headstocks
    • B24B41/06Work supports, e.g. adjustable steadies

Definitions

  • the present disclosure relates to the field of semiconductor processing equipment, and more particularly to a thinning machine.
  • wafer grinding technology belongs to nano-plastic grinding technology, most hard and brittle materials can only be processed by grinding, and plastic grinding can improve surface quality, but Low efficiency and poor economy.
  • One of the ways to increase the plastic deformation to obtain a higher removal rate is to increase the grinding wheel speed. Due to the limitation of mechanical rigidity and the heat resistance temperature of the diamond abrasive, the rotation speed of the grinding wheel will be limited, so the way to improve the grinding efficiency can be carried out from the structural layout design of the grinding system.
  • the present disclosure provides a thinning machine.
  • Rotating the tray, the rotating tray is rotatably disposed on the body and below the feed grinding shaft;
  • each of the stage systems for respectively absorbing a wafer by vacuum, a plurality of the stage systems being respectively disposed on the rotating tray and driven by the rotating tray to switch each a station of the stage system, a plurality of the stage systems are spaced apart, and the rotating tray is rotated to any working position, two of the plurality of said stage systems
  • the table system corresponds to the position of the two feed grinding axes;
  • a driving member connected to the rotating tray to drive the rotating tray to rotate.
  • the rotating tray is formed in a circular shape, and the rotating tray is rotatably provided on the body about an axis thereof.
  • the plurality of said stage systems are three, and the three said stage systems are evenly spaced apart on the rotating tray, and the distance between any two of the stage systems is equal to two The distance between the feed grinding axes.
  • each of the carrier system includes:
  • stage the stage being detachably disposed on the spindle for absorbing the wafer by vacuum.
  • the stage is formed in a disc shape, and the stage is detachably connected to the main shaft by bolts.
  • the thinning machine further includes:
  • a tenter provided on the body adjacent to the feed grinding shaft for clamping a non-standard wafer to prevent the advancement when a non-standard wafer is placed on the stage
  • the grinding shaft drives non-standard wafer activity during operation.
  • the rotating tray is formed as an air floating tray, and the rotating tray and the body are compressed air as a gas film.
  • the thinning machine further includes:
  • the drive shaft being disposed on a lower surface of the rotating tray and coupled to the rotating tray and the driving member, the driving shaft being coaxially disposed with the rotating tray to drive the driving member Rotate the tray to rotate.
  • the drive shaft extends in a vertical direction
  • the driving member is formed as a motor extending in a horizontal direction
  • the thinning machine further includes:
  • the speed reducer is formed in an L shape, one end of the speed reducer is connected to the motor, and the other end of the speed reducer is connected to the drive shaft.
  • the drive shaft is integrally formed with the rotating tray.
  • the thinning machine according to the embodiment of the present disclosure can effectively improve the production efficiency of wafer grinding and reduce energy consumption, and the thinning machine can be widely used for grinding of various standard or non-standard wafers, conforming to wafer grinding processing. According to the process requirements, the thinning machine has a compact overall structure, simple installation, reliable structure and stable operation.
  • FIG. 1 is a schematic structural view of a thinning machine according to an embodiment of the present disclosure
  • FIG. 2 is another schematic structural view of a thinning machine according to an embodiment of the present disclosure
  • FIG. 3 is a top plan view of a thinning machine of an embodiment of the present disclosure.
  • FIG. 4 is a schematic structural view of a carrier of a thinning machine according to an embodiment of the present disclosure
  • FIG. 5 is another schematic structural view of a stage of a thinning machine according to an embodiment of the present disclosure.
  • Figure 6 is a schematic view showing the operation of the film stage of the thinning machine of the embodiment of the present disclosure
  • Figure 7 is a schematic view showing another operation of the film stage of the thinning machine of the embodiment of the present disclosure.
  • FIG. 8 is still another schematic view of the working table of the thinning machine of the thinning machine according to the embodiment of the present disclosure.
  • Fig. 9 is a schematic view showing still another operation of the stage of the thinning machine of the embodiment of the present disclosure.
  • Body 10 feed grinding shaft 11;
  • a bearing table system 30 a main shaft 31; a bearing table 32; a first receiving table 32a; a second receiving table 32b; a third receiving table 32c;
  • the thinning machine 100 according to an embodiment of the present disclosure will be specifically described below with reference to the accompanying drawings.
  • a thinning machine 100 includes a body 10, a rotating tray 20, a plurality of stage systems 30, and a drive member 40.
  • the body 10 has two feed grinding shafts 11 that are rotatably disposed on the body 10 and below the feed grinding shaft 11, each of which is used for vacuum suction
  • a plurality of wafer stage systems 30 are respectively disposed on the rotating tray 20 and driven by the rotating tray 20 to switch the stations of each of the stage systems 30.
  • the plurality of stage systems 30 are spaced apart and the rotating tray 20 is When rotated to any working position, two of the plurality of stage systems 30 correspond to the positions of the two feed grinding shafts 11, and the drive member 40 is coupled to the rotating tray 20 to drive the rotating tray 20. Turn.
  • the thinning machine 100 is mainly composed of the body 10, the rotating tray 20, the plurality of stage systems 30, and the driving member 40.
  • Two feeding grinding shafts 11 can be mounted on the body 10, and the two feeding grinding shafts 11 can respectively perform rough grinding and fine grinding on the wafer, and the same wafer can first be ground through a coarse grinding wheel to remove more matrix materials. The finer grinding wheel then grinds off less matrix material.
  • the time for rough grinding and fine grinding of the two feed grinding shafts 11 is close, and there is no time waiting between the stations, so that the processing of the coarse grinding station and the fine grinding station can be realized simultaneously for different wafers, and the processing can be improved. The efficiency of the equipment.
  • the rotating tray 20 may be disposed on the body 10, and the rotating tray 20 may be rotated on the body 10.
  • the mounting position of the rotating tray 20 on the body 10 may be located below the feeding grinding shaft 11.
  • Each of the stage systems 30 can be used to vacuum-adsorb the wafers, respectively, and the plurality of stage systems 30 can be mounted on the rotating tray 20, respectively, the driving member 40 can be mounted under the rotating tray 20, and the driving member 40 can drive the rotating tray 20 turns.
  • the rotary tray 20 can be driven by the drive member 40 to rotate each of the stage system 30, and the rotation of the rotary tray 20 can switch the station of each of the stage systems 30.
  • a plurality of stage systems 30 can be mounted on the rotating tray 20 at intervals, and when the rotating tray 20 is rotated to any working position, two of the plurality of stage systems 30 can be separately and two The position of the feed grinding shaft 11 corresponds to that the two feed grinding shafts 11 can simultaneously grind the wafer, wherein one feed grinding shaft 11 can be used for rough grinding of the wafer, and another feed grinding The shaft 11 can be used to finely grind the wafer.
  • the thinning machine 100 can effectively improve the production efficiency of wafer grinding and reduce energy consumption.
  • the rotary tray 20 is formed in a circular shape, and the rotary tray 20 is rotatably provided on the body 10 about its axis.
  • the rotary tray 20 can be machined into a circular shape, and the rotary tray 20 can be rotated on the body 10, and the position of each of the stage system 30 can be switched by rotating the rotary tray 20.
  • the plurality of stage systems 30 are three, and the three stage systems 30 are evenly spaced apart on the rotating tray 20. The distance between any two of the stage systems 30 is equal to two. The distance between the feed grinding shafts 11 is spaced.
  • the stage system 30 can be formed in three, and the three stage systems 30 can be mounted evenly spaced on the rotating tray 20.
  • the distance between any two of the stage systems 30 may be equal to the distance between the two feed grinding shafts 11, and the three stage systems 30 may be mounted/unloaded on the thinning machine 100, respectively.
  • An orderly switching between the bit, the roughing station and the finishing station ensures that any two of the stage systems 30 can be fed to the two grinding axes 11 respectively when the rotating tray 20 is rotated to any working position.
  • the two feed grinding shafts 11 can simultaneously grind the wafers on any two of the stage systems 30 to improve the grinding efficiency of the thinning machine 100.
  • each of the stage systems 30 includes a main shaft 31 and a stage 32, respectively.
  • the main shaft 31 is provided on the rotary tray 20, and the stage 32 is detachably provided on the main shaft 31 for absorbing the wafer by vacuum.
  • each of the stage systems 30 is mainly composed of a main shaft 31 and a stage 32.
  • the spindle 31 can be mounted on the rotary tray 20, and the carrier 32 can be detachably mounted with the spindle 31.
  • the wafer can be mounted on the carrier 32 to effectively improve the assembly efficiency between the carrier 32 and the spindle 31.
  • the stage 32 is formed in the shape of a disk, and the stage 32 is detachably coupled to the spindle 31 by bolts.
  • the carrier 32 can be processed into a disk shape, and the carrier 32 can be detachably connected by a bolt and a spindle 31, and the assembly efficiency between the carrier 32 and the spindle 31 can be effectively improved by bolting. .
  • the thinning machine 100 further includes a stretcher 50.
  • the stretcher 50 is disposed on the body 10 adjacent to the feed grinding shaft 11, and the stretcher 50 is used to hold the non-standard wafer when the non-standard wafer is placed on the stage 32 to prevent the feed grinding shaft 11 from being fed. Work with non-standard wafer activities.
  • the thinning machine 100 can also include a stretcher 50.
  • the stretcher 50 can be mounted on the body 10, and the mounting position of the stretcher 50 on the body 10 can be adjacent to the feed grinding shaft 11.
  • the standard wafer and the non-standard wafer can be separately ground.
  • the thinning machine 100 grinds the standard wafer, the standard wafer can be placed directly on the wafer stage 32, and the wafer stage 32 can be rotated to the roughing station of the thinning machine 100 by adsorption or The grinding station is used for grinding.
  • the stretcher 50 can be used to clamp a non-standard wafer, preventing the feed grinding shaft 11 from driving non-standard wafer activities during operation, and improving the thinning machine 100 to non-standard
  • the polishing efficiency of the wafer greatly increases the range of use of the thinning machine 100, and realizes the processing requirements for different wafers.
  • the rotating tray 20 is formed as an air floating tray, and between the rotating tray 20 and the body 10, compressed air is used as a gas film.
  • the rotating tray 20 can be processed into an air floating tray, and the compressed air can be used as a gas film between the rotating tray 20 and the body 10 to prevent the friction between the rotating tray 20 and the body 10 from being caused by the rotation of the rotating tray 20. dead.
  • the thinning machine 100 further includes a drive shaft 60.
  • the drive shaft 60 is provided on the lower surface of the rotary tray 20 and is coupled to the rotary tray 20 and the drive member 40.
  • the drive shaft 60 is disposed coaxially with the rotary tray 20 to drive the rotary tray 20 to be rotated by the drive member 40.
  • the thinning machine 100 also includes a drive shaft 60.
  • the drive shaft 60 can be mounted on the lower surface of the rotary tray 20.
  • the drive shaft 60 can be coupled to the rotary tray 20 and the drive member 40.
  • the drive shaft 60 can be disposed coaxially with the rotary tray 20 to facilitate the drive member 40 to drive the rotary tray 20 to rotate.
  • the thinning machine 100 further includes a speed reducer 70.
  • the speed reducer 70 is formed in an L shape, one end of the speed reducer 70 is connected to the motor, and the other end of the speed reducer 70 is connected to the drive shaft 60.
  • the thinning machine 100 further includes a speed reducer 70
  • the drive shaft 60 can be vertically mounted on the lower surface of the rotating tray 20
  • the driving member 40 can be formed as a motor
  • the speed reducer 70 can be processed into an L shape
  • the speed reducer 70 One end may be connected to the motor, and the motor may be mounted at one end of the speed reducer 70 in the horizontal direction.
  • One end of the speed reducer 70 in the vertical direction may be connected to the drive shaft 60, and the cooperation between the speed reducer 70 and the drive member 40 may be effective.
  • the rotational speed of the rotating tray 20 is controlled.
  • the drive shaft 60 is integrally formed with the rotary tray 20, which improves the stability of the overall structure of the drive shaft 60 and the rotary tray 20, and reduces molding difficulty and molding cost.
  • two thinner grinding shafts 11 can be mounted on the thinning machine 100, and the two feed grinding shafts 11 can perform rough grinding and fine grinding of the wafer at the same time.
  • the three carrier system 30 can be evenly spaced apart and mounted on the rotating tray 20.
  • the three carrier systems 30 can be respectively mounted/unloaded at the thinning machine 100, the roughing station and the finishing station.
  • the three stage system 30 can transmit 120° or 240° at three working positions, ensuring that the wafers of the two feed grinding axes 11 are always at the same time. Grinding and fine grinding. That is to say, each of the stage system 30 can realize two processing processes - rough grinding and fine grinding.
  • the first stage 32a, the second stage 32b, and the third stage 32c may be respectively mounted/unloaded at the thinning machine 100, the rough grinding station, and Ordered switching between fine grinding stations.
  • the corresponding feed grinding shaft 11 at the finishing grinding station can perform fine grinding on the non-standard wafer.
  • the first stage 32a can be rotated 120° counterclockwise and then placed at the loading/unloading station.
  • the worker can grind the loading/unloading station.
  • the film is loaded to ensure the uninterrupted cycle of the grinding machine 100 grinding process.
  • the first stage 32a can continue to rotate 120° counterclockwise and then be in the rough grinding station, as shown in FIG. 8 , corresponding to the feed grinding shaft in the rough grinding station.
  • the first stage 32a can be rotated 240° clockwise, as shown in Fig. 9, the first stage 32a can be returned to the fine grinding station.
  • the second stage 32b and the third stage 32c can be changed according to the change of the position of the first stage 32a, respectively, to ensure that the three stage systems 30 can simultaneously realize two processing processes - coarse Grinding and fine grinding.
  • the thinning machine 100 can effectively improve the production efficiency of wafer grinding, reduce energy consumption, and the thinning machine 100 can be widely used for grinding of various standard or non-standard wafers, in accordance with The process requirement of the wafer grinding process is that the thinning machine 100 has a compact structure, simple installation, reliable structure and stable operation.

Abstract

A thinning machine (100), comprising: a body (10), the body being provided with two feeding and grinding shafts (11); a rotary tray (20), the rotary tray being rotationally disposed on the body and located below the feeding and grinding shafts; a plurality of wafer chuck systems (30), each wafer chuck system being used for sucking wafers by means of vacuum, the multiple wafer chuck systems being separately disposed on the rotary tray and driven by the rotary tray so that the stations of the wafer chuck systems are switched, the multiple wafer chuck systems being arranged at intervals, and when the rotary tray rotates to any working position, two of the multiple wafer chuck systems corresponding to the positions of the two feeding and grinding shafts; and a drive member (40), the drive member is connected to the rotary tray so as to drive the rotary tray to rotate. According to the thinning machine, the production efficiency of wafer grinding can be effectively improved, and energy consumption is reduced.

Description

减薄机Thinning machine
相关申请的交叉引用Cross-reference to related applications
本申请主张在2017年12月26日在中国提交的中国专利申请号No.201711430682.X的优先权,其全部内容通过引用包含于此。The present application claims priority to Chinese Patent Application No. 2017.
技术领域Technical field
本公开涉及半导体加工设备技术领域,更具体地,涉及一种减薄机。The present disclosure relates to the field of semiconductor processing equipment, and more particularly to a thinning machine.
背景技术Background technique
半导体专用设备在对晶片进行加工的过程中,由于晶片磨削技术属于纳米塑性磨削技术,因此,大多数硬脆材料只能通过磨削的办法进行加工,塑性磨削可以提高表面质量,但效率低,经济性差。Semiconductor-specific equipment In the process of processing wafers, since wafer grinding technology belongs to nano-plastic grinding technology, most hard and brittle materials can only be processed by grinding, and plastic grinding can improve surface quality, but Low efficiency and poor economy.
提高塑性变形以获得较高去除率的方法之一就是提高砂轮转速。由于受机械刚度的限制和金刚石磨料耐热温度的影响,磨削砂轮的转速将受到限制,所以提高磨削效率的途径可以从磨削系统结构布局设计着手进行。One of the ways to increase the plastic deformation to obtain a higher removal rate is to increase the grinding wheel speed. Due to the limitation of mechanical rigidity and the heat resistance temperature of the diamond abrasive, the rotation speed of the grinding wheel will be limited, so the way to improve the grinding efficiency can be carried out from the structural layout design of the grinding system.
发明内容Summary of the invention
有鉴于此,本公开提供减薄机。In view of this, the present disclosure provides a thinning machine.
为解决上述技术问题,本公开采用以下技术方案:In order to solve the above technical problem, the present disclosure adopts the following technical solutions:
根据本公开实施例的减薄机,包括:A thinning machine according to an embodiment of the present disclosure includes:
机体,所述机体具有两个进给磨削轴;a body having two feed grinding shafts;
旋转托盘,所述旋转托盘可转动地设在所述机体上且位于所述进给磨削轴下方;Rotating the tray, the rotating tray is rotatably disposed on the body and below the feed grinding shaft;
多个承片台系统,每个所述承片台系统分别用于通过真空吸附晶片,多个所述承片台系统分别设在所述旋转托盘上且由所述旋转托盘驱动以切换每个所述承片台系统的工位,多个所述承片台系统间隔开布置且所述旋转托盘在旋转至任意工作位置时,多个所述承片台系统中的两个所述承片台系统与两个所述进给磨削轴的位置相对应;a plurality of stage systems, each of the stage systems for respectively absorbing a wafer by vacuum, a plurality of the stage systems being respectively disposed on the rotating tray and driven by the rotating tray to switch each a station of the stage system, a plurality of the stage systems are spaced apart, and the rotating tray is rotated to any working position, two of the plurality of said stage systems The table system corresponds to the position of the two feed grinding axes;
驱动件,所述驱动件与所述旋转托盘相连以驱动所述旋转托盘转动。a driving member connected to the rotating tray to drive the rotating tray to rotate.
进一步地,所述旋转托盘形成为圆形,所述旋转托盘绕其轴线可转动地设在所述机体上。Further, the rotating tray is formed in a circular shape, and the rotating tray is rotatably provided on the body about an axis thereof.
进一步地,所述承片台系统为三个,三个所述承片台系统均匀间隔开设在所述旋转托盘上,任意两个所述承片台系统之间间隔的距离等于两个所述进给磨削轴之间间隔的距离。Further, the plurality of said stage systems are three, and the three said stage systems are evenly spaced apart on the rotating tray, and the distance between any two of the stage systems is equal to two The distance between the feed grinding axes.
进一步地,每个所述承片台系统分别包括:Further, each of the carrier system includes:
主轴,所述主轴设在所述旋转托盘上;a spindle, the spindle being disposed on the rotating tray;
承片台,所述承片台可拆卸地设在所述主轴上以用于通过真空吸附晶片。a stage, the stage being detachably disposed on the spindle for absorbing the wafer by vacuum.
进一步地,所述承片台形成为圆盘形,所述承片台通过螺栓与所述主轴可拆卸地相连。Further, the stage is formed in a disc shape, and the stage is detachably connected to the main shaft by bolts.
进一步地,所述减薄机还包括:Further, the thinning machine further includes:
绷架,所述绷架设在所述机体上且邻近所述进给磨削轴,所述绷架用于在所述承片台上放置非标准晶片时夹持非标准晶片以防止所述进给磨削轴在工作时带动非标准晶片活动。a tenter provided on the body adjacent to the feed grinding shaft for clamping a non-standard wafer to prevent the advancement when a non-standard wafer is placed on the stage The grinding shaft drives non-standard wafer activity during operation.
进一步地,所述旋转托盘形成为气浮盘,所述旋转托盘与所述机体之间通过压缩空气作为形成气膜。Further, the rotating tray is formed as an air floating tray, and the rotating tray and the body are compressed air as a gas film.
进一步地,所述减薄机还包括:Further, the thinning machine further includes:
驱动轴,所述驱动轴设在所述旋转托盘的下表面且与所述旋转托盘和所述驱动件相连,所述驱动轴与所述旋转托盘同轴设置以由所述驱动件驱动所述旋转托盘转动。a drive shaft, the drive shaft being disposed on a lower surface of the rotating tray and coupled to the rotating tray and the driving member, the driving shaft being coaxially disposed with the rotating tray to drive the driving member Rotate the tray to rotate.
进一步地,所述驱动轴沿竖直方向延伸,所述驱动件形成为沿水平方向延伸的电机,所述减薄机还包括:Further, the drive shaft extends in a vertical direction, and the driving member is formed as a motor extending in a horizontal direction, and the thinning machine further includes:
减速器,所述减速器形成为L形,所述减速器的一端与所述电机相连,所述减速器的另一端与所述驱动轴相连。The speed reducer is formed in an L shape, one end of the speed reducer is connected to the motor, and the other end of the speed reducer is connected to the drive shaft.
进一步地,所述驱动轴与所述旋转托盘一体成型。Further, the drive shaft is integrally formed with the rotating tray.
本公开的上述技术方案的有益效果如下:The beneficial effects of the above technical solutions of the present disclosure are as follows:
根据本公开实施例的减薄机,能有效提高晶片磨削的生产效率,降低能源消耗,并且该减薄机能广泛用于各种标准或非标准晶片的磨削加工,符合 晶片磨削加工的工艺要求,该减薄机整体结构紧凑、安装简单,结构可靠,运行平稳。The thinning machine according to the embodiment of the present disclosure can effectively improve the production efficiency of wafer grinding and reduce energy consumption, and the thinning machine can be widely used for grinding of various standard or non-standard wafers, conforming to wafer grinding processing. According to the process requirements, the thinning machine has a compact overall structure, simple installation, reliable structure and stable operation.
附图说明DRAWINGS
图1为本公开实施例的减薄机的一个结构示意图;1 is a schematic structural view of a thinning machine according to an embodiment of the present disclosure;
图2为本公开实施例的减薄机的另一个结构示意图;2 is another schematic structural view of a thinning machine according to an embodiment of the present disclosure;
图3为本公开实施例的减薄机的俯视图;3 is a top plan view of a thinning machine of an embodiment of the present disclosure;
图4为本公开实施例的减薄机的承片台的一个结构示意图;4 is a schematic structural view of a carrier of a thinning machine according to an embodiment of the present disclosure;
图5为本公开实施例的减薄机的承片台的另一个结构示意图;FIG. 5 is another schematic structural view of a stage of a thinning machine according to an embodiment of the present disclosure; FIG.
图6为本公开实施例的减薄机的承片台的一个工作示意图;Figure 6 is a schematic view showing the operation of the film stage of the thinning machine of the embodiment of the present disclosure;
图7为本公开实施例的减薄机的承片台的另一个工作示意图;Figure 7 is a schematic view showing another operation of the film stage of the thinning machine of the embodiment of the present disclosure;
图8为本公开实施例的减薄机的承片台的又一个工作示意图;FIG. 8 is still another schematic view of the working table of the thinning machine of the thinning machine according to the embodiment of the present disclosure; FIG.
图9为本公开实施例的减薄机的承片台的再一个工作示意图。Fig. 9 is a schematic view showing still another operation of the stage of the thinning machine of the embodiment of the present disclosure.
附图标记:Reference mark:
减薄机100; Thinning machine 100;
机体10;进给磨削轴11; Body 10; feed grinding shaft 11;
旋转托盘20; Rotating tray 20;
承片台系统30;主轴31;承片台32;第一承片台32a;第二承片台32b;第三承片台32c;a bearing table system 30; a main shaft 31; a bearing table 32; a first receiving table 32a; a second receiving table 32b; a third receiving table 32c;
驱动件40; Drive member 40;
绷架50;Stretcher 50;
驱动轴60; Drive shaft 60;
减速器70。Reducer 70.
具体实施方式Detailed ways
为使本公开实施例的目的、技术方案和优点更加清楚,下面将结合本公开实施例的附图,对本公开实施例的技术方案进行清楚、完整地描述。显然,所描述的实施例是本公开的一部分实施例,而不是全部的实施例。基于所描 述的本公开的实施例,本领域普通技术人员所获得的所有其他实施例,都属于本公开保护的范围。The technical solutions of the embodiments of the present disclosure will be clearly and completely described below in conjunction with the drawings of the embodiments of the present disclosure. It is apparent that the described embodiments are part of the embodiments of the present disclosure, and not all of the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the described embodiments of the present disclosure are within the scope of the disclosure.
下面结合附图具体描述根据本公开实施例的减薄机100。The thinning machine 100 according to an embodiment of the present disclosure will be specifically described below with reference to the accompanying drawings.
如图1至图9所示,根据本公开实施例的减薄机100包括机体10、旋转托盘20、多个承片台系统30和驱动件40。As shown in FIGS. 1 through 9, a thinning machine 100 according to an embodiment of the present disclosure includes a body 10, a rotating tray 20, a plurality of stage systems 30, and a drive member 40.
具体而言,机体10具有两个进给磨削轴11,旋转托盘20可转动地设在机体10上且位于进给磨削轴11下方,每个承片台系统30分别用于通过真空吸附晶片,多个承片台系统30分别设在旋转托盘20上且由旋转托盘20驱动以切换每个承片台系统30的工位,多个承片台系统30间隔开布置且旋转托盘20在旋转至任意工作位置时,多个承片台系统30中的两个承片台系统30与两个进给磨削轴11的位置相对应,驱动件40与旋转托盘20相连以驱动旋转托盘20转动。Specifically, the body 10 has two feed grinding shafts 11 that are rotatably disposed on the body 10 and below the feed grinding shaft 11, each of which is used for vacuum suction A plurality of wafer stage systems 30 are respectively disposed on the rotating tray 20 and driven by the rotating tray 20 to switch the stations of each of the stage systems 30. The plurality of stage systems 30 are spaced apart and the rotating tray 20 is When rotated to any working position, two of the plurality of stage systems 30 correspond to the positions of the two feed grinding shafts 11, and the drive member 40 is coupled to the rotating tray 20 to drive the rotating tray 20. Turn.
换言之,根据本公开实施例的减薄机100主要由机体10、旋转托盘20、多个承片台系统30和驱动件40组成。机体10上可以安装两个进给磨削轴11,两个进给磨削轴11可以分别对晶片进行粗磨和精磨,同一个晶片首先可以通过粗磨轮磨去较多的基体材料后,再由精磨轮磨去较少的基体材料。两个进给磨削轴11的粗磨和精磨所耗时间接近,不存在工位之间的时间等待,可以实现不同晶片同时进行粗磨削工位和精磨削工位的加工,提高了设备的工作效率。In other words, the thinning machine 100 according to an embodiment of the present disclosure is mainly composed of the body 10, the rotating tray 20, the plurality of stage systems 30, and the driving member 40. Two feeding grinding shafts 11 can be mounted on the body 10, and the two feeding grinding shafts 11 can respectively perform rough grinding and fine grinding on the wafer, and the same wafer can first be ground through a coarse grinding wheel to remove more matrix materials. The finer grinding wheel then grinds off less matrix material. The time for rough grinding and fine grinding of the two feed grinding shafts 11 is close, and there is no time waiting between the stations, so that the processing of the coarse grinding station and the fine grinding station can be realized simultaneously for different wafers, and the processing can be improved. The efficiency of the equipment.
旋转托盘20可以设置在机体10上,旋转托盘20可以在机体10上转动,旋转托盘20在机体10上的安装位置可以位于进给磨削轴11下方。每个承片台系统30可以分别用于通过真空吸附晶片,多个承片台系统30可以分别安装在旋转托盘20上,驱动件40可以安装在旋转托盘20下方,驱动件40可以驱动旋转托盘20转动。The rotating tray 20 may be disposed on the body 10, and the rotating tray 20 may be rotated on the body 10. The mounting position of the rotating tray 20 on the body 10 may be located below the feeding grinding shaft 11. Each of the stage systems 30 can be used to vacuum-adsorb the wafers, respectively, and the plurality of stage systems 30 can be mounted on the rotating tray 20, respectively, the driving member 40 can be mounted under the rotating tray 20, and the driving member 40 can drive the rotating tray 20 turns.
旋转托盘20可以通过驱动件40驱动使每个承片台系统30旋转,并且通过旋转托盘20旋转可以使每个承片台系统30的工位进行切换。多个承片台系统30可以间隔开安装在旋转托盘20上,并且在旋转托盘20旋转至任意工作位置时,多个承片台系统30中的两个承片台系统30可以分别和两个进给磨削轴11的位置相对应,两个进给磨削轴11可以同时对晶片进行磨削,其 中一个进给磨削轴11可以用于对晶片进行粗磨,另一个进给磨削轴11可以用于对晶片进行细磨。The rotary tray 20 can be driven by the drive member 40 to rotate each of the stage system 30, and the rotation of the rotary tray 20 can switch the station of each of the stage systems 30. A plurality of stage systems 30 can be mounted on the rotating tray 20 at intervals, and when the rotating tray 20 is rotated to any working position, two of the plurality of stage systems 30 can be separately and two The position of the feed grinding shaft 11 corresponds to that the two feed grinding shafts 11 can simultaneously grind the wafer, wherein one feed grinding shaft 11 can be used for rough grinding of the wafer, and another feed grinding The shaft 11 can be used to finely grind the wafer.
由此,根据本公开实施例的减薄机100,能有效提高晶片磨削的生产效率,降低能源消耗。Thus, the thinning machine 100 according to the embodiment of the present disclosure can effectively improve the production efficiency of wafer grinding and reduce energy consumption.
根据本公开的一个实施例,旋转托盘20形成为圆形,旋转托盘20绕其轴线可转动地设在机体10上。According to an embodiment of the present disclosure, the rotary tray 20 is formed in a circular shape, and the rotary tray 20 is rotatably provided on the body 10 about its axis.
也就是说,旋转托盘20可以加工成圆形,旋转托盘20可以在机体10上转动,通过旋转托盘20旋转可以使每个承片台系统30的工位进行切换。That is, the rotary tray 20 can be machined into a circular shape, and the rotary tray 20 can be rotated on the body 10, and the position of each of the stage system 30 can be switched by rotating the rotary tray 20.
在本公开的一些具体实施方式中,承片台系统30为三个,三个承片台系统30均匀间隔开设在旋转托盘20上,任意两个承片台系统30之间间隔的距离等于两个进给磨削轴11之间间隔的距离。In some embodiments of the present disclosure, the plurality of stage systems 30 are three, and the three stage systems 30 are evenly spaced apart on the rotating tray 20. The distance between any two of the stage systems 30 is equal to two. The distance between the feed grinding shafts 11 is spaced.
换句话说,承片台系统30可以形成为三个,三个承片台系统30可以均匀间隔开安装在旋转托盘20上。任意两个承片台系统30之间间隔的距离可以与两个进给磨削轴11之间间隔的距离相等,三个承片台系统30可以分别在减薄机100的装/卸片工位、粗磨工位和精磨工位之间进行有序切换,保证任意两个承片台系统30在旋转托盘20旋转至任意工作位置时,可以分别和两个进给磨削轴11的位置相对应,便于两个进给磨削轴11可以同时对任意两个承片台系统30上的晶片进行磨削,提高减薄机100的磨削效率。In other words, the stage system 30 can be formed in three, and the three stage systems 30 can be mounted evenly spaced on the rotating tray 20. The distance between any two of the stage systems 30 may be equal to the distance between the two feed grinding shafts 11, and the three stage systems 30 may be mounted/unloaded on the thinning machine 100, respectively. An orderly switching between the bit, the roughing station and the finishing station ensures that any two of the stage systems 30 can be fed to the two grinding axes 11 respectively when the rotating tray 20 is rotated to any working position. Corresponding to the position, the two feed grinding shafts 11 can simultaneously grind the wafers on any two of the stage systems 30 to improve the grinding efficiency of the thinning machine 100.
根据本公开的一个实施例,每个承片台系统30分别包括主轴31和承片台32。According to one embodiment of the present disclosure, each of the stage systems 30 includes a main shaft 31 and a stage 32, respectively.
具体地,主轴31设在旋转托盘20上,承片台32可拆卸地设在主轴31上以用于通过真空吸附晶片。Specifically, the main shaft 31 is provided on the rotary tray 20, and the stage 32 is detachably provided on the main shaft 31 for absorbing the wafer by vacuum.
也就是说,每个承片台系统30主要由主轴31和承片台32组成。主轴31可以安装在旋转托盘20上,承片台32可以和主轴31可拆卸地安装,晶片可以安装在承片台32上,有效提高承片台32和主轴31之间的装配效率,。That is, each of the stage systems 30 is mainly composed of a main shaft 31 and a stage 32. The spindle 31 can be mounted on the rotary tray 20, and the carrier 32 can be detachably mounted with the spindle 31. The wafer can be mounted on the carrier 32 to effectively improve the assembly efficiency between the carrier 32 and the spindle 31.
在本公开的一些具体实施方式中,承片台32形成为圆盘形,承片台32通过螺栓与主轴31可拆卸地相连。In some embodiments of the present disclosure, the stage 32 is formed in the shape of a disk, and the stage 32 is detachably coupled to the spindle 31 by bolts.
换句话说,承片台32可以加工成圆盘形,承片台32可以通过螺栓和主轴31可拆卸地相连,通过螺栓连接的方式,有效提高承片台32和主轴31之 间的装配效率。In other words, the carrier 32 can be processed into a disk shape, and the carrier 32 can be detachably connected by a bolt and a spindle 31, and the assembly efficiency between the carrier 32 and the spindle 31 can be effectively improved by bolting. .
根据本公开的一个实施例,减薄机100还包括绷架50。According to one embodiment of the present disclosure, the thinning machine 100 further includes a stretcher 50.
具体地,绷架50设在机体10上且邻近进给磨削轴11,绷架50用于在承片台32上放置非标准晶片时夹持非标准晶片以防止进给磨削轴11在工作时带动非标准晶片活动。Specifically, the stretcher 50 is disposed on the body 10 adjacent to the feed grinding shaft 11, and the stretcher 50 is used to hold the non-standard wafer when the non-standard wafer is placed on the stage 32 to prevent the feed grinding shaft 11 from being fed. Work with non-standard wafer activities.
也就是说,减薄机100还可以包括绷架50。绷架50可以安装在机体10上,绷架50在机体10上的安装位置可以邻近进给磨削轴11。减薄机100工作时可以分别对标准晶片和非标准晶片进行磨削。当减薄机100对标准晶片进行磨削时,可以将标准晶片直接放置在承片台32上,承片台32可以通过吸附的方式将标准晶片旋转至减薄机100的粗磨工位或精磨工位进行磨削交工。当减薄机100对非标准晶片进行磨削时,绷架50可以用于夹持非标准晶片,防止进给磨削轴11在工作时带动非标准晶片活动,提高减薄机100对非标准晶片的研磨效率,大大提高了减薄机100使用范围,实现对不同晶片的加工工艺的要求。That is, the thinning machine 100 can also include a stretcher 50. The stretcher 50 can be mounted on the body 10, and the mounting position of the stretcher 50 on the body 10 can be adjacent to the feed grinding shaft 11. When the thinning machine 100 is in operation, the standard wafer and the non-standard wafer can be separately ground. When the thinning machine 100 grinds the standard wafer, the standard wafer can be placed directly on the wafer stage 32, and the wafer stage 32 can be rotated to the roughing station of the thinning machine 100 by adsorption or The grinding station is used for grinding. When the thinning machine 100 grinds a non-standard wafer, the stretcher 50 can be used to clamp a non-standard wafer, preventing the feed grinding shaft 11 from driving non-standard wafer activities during operation, and improving the thinning machine 100 to non-standard The polishing efficiency of the wafer greatly increases the range of use of the thinning machine 100, and realizes the processing requirements for different wafers.
在本公开的一些具体实施方式中,旋转托盘20形成为气浮盘,旋转托盘20与机体10之间通过压缩空气作为形成气膜。In some embodiments of the present disclosure, the rotating tray 20 is formed as an air floating tray, and between the rotating tray 20 and the body 10, compressed air is used as a gas film.
换句话说,旋转托盘20可以加工成气浮盘,旋转托盘20与机体10之间可以通过压缩空气作为形成气膜,避免旋转托盘20旋转时因旋转托盘20与机体10之间的摩擦导致抱死。In other words, the rotating tray 20 can be processed into an air floating tray, and the compressed air can be used as a gas film between the rotating tray 20 and the body 10 to prevent the friction between the rotating tray 20 and the body 10 from being caused by the rotation of the rotating tray 20. dead.
根据本公开的一个实施例,减薄机100还包括驱动轴60。According to one embodiment of the present disclosure, the thinning machine 100 further includes a drive shaft 60.
具体地,驱动轴60设在旋转托盘20的下表面且与旋转托盘20和驱动件40相连,驱动轴60与旋转托盘20同轴设置以由驱动件40驱动旋转托盘20转动。Specifically, the drive shaft 60 is provided on the lower surface of the rotary tray 20 and is coupled to the rotary tray 20 and the drive member 40. The drive shaft 60 is disposed coaxially with the rotary tray 20 to drive the rotary tray 20 to be rotated by the drive member 40.
也就是说,减薄机100还包括驱动轴60。驱动轴60可以安装在旋转托盘20的下表面,驱动轴60可以与旋转托盘20和驱动件40相连,驱动轴60与旋转托盘20可以同轴设置,便于驱动件40驱动旋转托盘20转动。That is, the thinning machine 100 also includes a drive shaft 60. The drive shaft 60 can be mounted on the lower surface of the rotary tray 20. The drive shaft 60 can be coupled to the rotary tray 20 and the drive member 40. The drive shaft 60 can be disposed coaxially with the rotary tray 20 to facilitate the drive member 40 to drive the rotary tray 20 to rotate.
在本公开的一些具体实施方式中,减薄机100还包括减速器70。In some embodiments of the present disclosure, the thinning machine 100 further includes a speed reducer 70.
具体地,减速器70形成为L形,减速器70的一端与电机相连,减速器70的另一端与驱动轴60相连。Specifically, the speed reducer 70 is formed in an L shape, one end of the speed reducer 70 is connected to the motor, and the other end of the speed reducer 70 is connected to the drive shaft 60.
换句话说,减薄机100还包括减速器70,驱动轴60可以竖直安装在旋转托盘20的下表面,驱动件40可以形成为电机,减速器70可以加工成L形,减速器70的一端可以与电机相连,电机可以安装在减速器70的沿水平方向的一端,减速器70的竖直方向的一端可以与驱动轴60相连,通过减速器70和驱动件40之间的配合可以有效控制旋转托盘20的转速。In other words, the thinning machine 100 further includes a speed reducer 70, the drive shaft 60 can be vertically mounted on the lower surface of the rotating tray 20, the driving member 40 can be formed as a motor, and the speed reducer 70 can be processed into an L shape, the speed reducer 70 One end may be connected to the motor, and the motor may be mounted at one end of the speed reducer 70 in the horizontal direction. One end of the speed reducer 70 in the vertical direction may be connected to the drive shaft 60, and the cooperation between the speed reducer 70 and the drive member 40 may be effective. The rotational speed of the rotating tray 20 is controlled.
根据本公开的一个实施例,驱动轴60与旋转托盘20一体成型,提高驱动轴60与旋转托盘20整体结构的稳固性,降低成型难度和成型成本。According to an embodiment of the present disclosure, the drive shaft 60 is integrally formed with the rotary tray 20, which improves the stability of the overall structure of the drive shaft 60 and the rotary tray 20, and reduces molding difficulty and molding cost.
下面参照附图并结合具体实施例描述本公开的减薄机100的工作原理。The working principle of the thinning machine 100 of the present disclosure will be described below with reference to the accompanying drawings in conjunction with the specific embodiments.
如图1至图9所示,减薄机100上可以安装两个进给磨削轴11,两个进给磨削轴11可以同时对晶片进行粗磨和精磨。三个承片台系统30可以均匀间隔开安装在旋转托盘20上,三个承片台系统30可以分别在减薄机100的装/卸片工位、粗磨工位和精磨工位之间进行有序切换,三个承片台系统30在三个工作位置的传递角度可以使120°或240°,保证两个进给磨削轴11的工位下方总是在同时进行晶片的粗磨削加工和精磨削加工。也就是说,每个承片台系统30可以实现两道加工工艺——粗磨削加工和精磨削加工。As shown in FIGS. 1 to 9, two thinner grinding shafts 11 can be mounted on the thinning machine 100, and the two feed grinding shafts 11 can perform rough grinding and fine grinding of the wafer at the same time. The three carrier system 30 can be evenly spaced apart and mounted on the rotating tray 20. The three carrier systems 30 can be respectively mounted/unloaded at the thinning machine 100, the roughing station and the finishing station. During the orderly switching, the three stage system 30 can transmit 120° or 240° at three working positions, ensuring that the wafers of the two feed grinding axes 11 are always at the same time. Grinding and fine grinding. That is to say, each of the stage system 30 can realize two processing processes - rough grinding and fine grinding.
下面以减薄机100对非标准晶片的磨削加工为例,描述三个承片台系统30在三个工作位置的之间的传递过程。In the following, taking the grinding process of the non-standard wafer by the thinning machine 100 as an example, the transfer process of the three stage system 30 between the three working positions will be described.
如图6至图9所示,第一承片台32a、第二承片台32b和第三承片台32c可以分别在减薄机100的装/卸片工位、粗磨削工位和精磨削工位之间进行有序切换。As shown in FIGS. 6 to 9, the first stage 32a, the second stage 32b, and the third stage 32c may be respectively mounted/unloaded at the thinning machine 100, the rough grinding station, and Ordered switching between fine grinding stations.
首先,如图6所示,当第一承片台32a处于精磨削工位时,相对应的处于精磨削工位的进给磨削轴11可以对非标准晶片进行精磨削加工。精磨削加工完成后,第一承片台32a可以逆时针旋转120°后位于装/卸片工位,如图7所示,工作人员在这个装/卸片工位上可以对磨削加工后的非标准晶片进行卸片,同时卸片完成后再进行装片,保证减薄机100磨削加工的不间断循环。待操作人员装片完成后,第一承片台32a可以继续逆时针旋转120°后处于粗磨削工位,如图8所示,相对应的处于粗磨削工位的进给磨削轴11可以对非标准晶片进行粗磨削加工。待粗磨削加工完成后,第一承片台32a可以顺时 针旋转240°,如图9所示,第一承片台32a又可以返回精磨削工位。同理,第二承片台32b和第三承片台32c可以分别跟随第一承片台32a的工位变化而变化,保证三个承片台系统30可以同时实现两道加工工艺——粗磨削加工和精磨削加工。First, as shown in FIG. 6, when the first stage 32a is in the fine grinding station, the corresponding feed grinding shaft 11 at the finishing grinding station can perform fine grinding on the non-standard wafer. After the finish grinding process is completed, the first stage 32a can be rotated 120° counterclockwise and then placed at the loading/unloading station. As shown in Fig. 7, the worker can grind the loading/unloading station. After the non-standard wafer is unloaded, and the unloading is completed, the film is loaded to ensure the uninterrupted cycle of the grinding machine 100 grinding process. After the operator installs the sheet, the first stage 32a can continue to rotate 120° counterclockwise and then be in the rough grinding station, as shown in FIG. 8 , corresponding to the feed grinding shaft in the rough grinding station. 11 can be used for rough grinding of non-standard wafers. After the rough grinding process is completed, the first stage 32a can be rotated 240° clockwise, as shown in Fig. 9, the first stage 32a can be returned to the fine grinding station. Similarly, the second stage 32b and the third stage 32c can be changed according to the change of the position of the first stage 32a, respectively, to ensure that the three stage systems 30 can simultaneously realize two processing processes - coarse Grinding and fine grinding.
总而言之,根据本公开实施例的减薄机100,能有效提高晶片磨削的生产效率,降低能源消耗,并且该减薄机100能广泛用于各种标准或非标准晶片的磨削加工,符合晶片磨削加工的工艺要求,该减薄机100整体结构紧凑、安装简单,结构可靠,运行平稳。In summary, the thinning machine 100 according to an embodiment of the present disclosure can effectively improve the production efficiency of wafer grinding, reduce energy consumption, and the thinning machine 100 can be widely used for grinding of various standard or non-standard wafers, in accordance with The process requirement of the wafer grinding process is that the thinning machine 100 has a compact structure, simple installation, reliable structure and stable operation.
以上所述是本公开的可选实施方式,应当指出,对于本技术领域的普通技术人员来说,在不脱离本公开所述原理的前提下,还可以作出若干改进和润饰,这些改进和润饰也应视为本公开的保护范围。The above is an alternative embodiment of the present disclosure, and it should be noted that those skilled in the art can also make several improvements and retouchings without departing from the principles of the present disclosure. It should also be considered as the scope of protection of the present disclosure.

Claims (10)

  1. 一种减薄机,包括:A thinning machine comprising:
    机体,所述机体具有两个进给磨削轴;a body having two feed grinding shafts;
    旋转托盘,所述旋转托盘可转动地设在所述机体上且位于所述进给磨削轴下方;Rotating the tray, the rotating tray is rotatably disposed on the body and below the feed grinding shaft;
    多个承片台系统,每个所述承片台系统分别用于通过真空吸附晶片,多个所述承片台系统分别设在所述旋转托盘上且由所述旋转托盘驱动以切换每个所述承片台系统的工位,多个所述承片台系统间隔开布置且所述旋转托盘在旋转至任意工作位置时,多个所述承片台系统中的两个所述承片台系统与两个所述进给磨削轴的位置相对应;a plurality of stage systems, each of the stage systems for respectively absorbing a wafer by vacuum, a plurality of the stage systems being respectively disposed on the rotating tray and driven by the rotating tray to switch each a station of the stage system, a plurality of the stage systems are spaced apart, and the rotating tray is rotated to any working position, two of the plurality of said stage systems The table system corresponds to the position of the two feed grinding axes;
    驱动件,所述驱动件与所述旋转托盘相连以驱动所述旋转托盘转动。a driving member connected to the rotating tray to drive the rotating tray to rotate.
  2. 根据权利要求1所述的减薄机,其中,所述旋转托盘形成为圆形,所述旋转托盘绕其轴线可转动地设在所述机体上。The thinning machine according to claim 1, wherein the rotating tray is formed in a circular shape, and the rotating tray is rotatably provided on the body about an axis thereof.
  3. 根据权利要求2所述的减薄机,其中,所述承片台系统为三个,三个所述承片台系统均匀间隔开设在所述旋转托盘上,任意两个所述承片台系统之间间隔的距离等于两个所述进给磨削轴之间间隔的距离。The thinning machine according to claim 2, wherein said stage system is three, and said three stage systems are evenly spaced apart on said rotating tray, any two of said stage systems The distance between the intervals is equal to the distance between the two feed grinding axes.
  4. 根据权利要求1所述的减薄机,其中,每个所述承片台系统分别包括:The thinning machine of claim 1 wherein each of said stage systems comprises:
    主轴,所述主轴设在所述旋转托盘上;a spindle, the spindle being disposed on the rotating tray;
    承片台,所述承片台可拆卸地设在所述主轴上以用于通过真空吸附晶片。a stage, the stage being detachably disposed on the spindle for absorbing the wafer by vacuum.
  5. 根据权利要求4所述的减薄机,其中,所述承片台形成为圆盘形,所述承片台通过螺栓与所述主轴可拆卸地相连。The thinning machine according to claim 4, wherein the stage is formed in a disk shape, and the stage is detachably coupled to the spindle by bolts.
  6. 根据权利要求4所述的减薄机,还包括:The thinning machine of claim 4, further comprising:
    绷架,所述绷架设在所述机体上且邻近所述进给磨削轴,所述绷架用于在所述承片台上放置非标准晶片时夹持非标准晶片以防止所述进给磨削轴在工作时带动非标准晶片活动。a tenter provided on the body adjacent to the feed grinding shaft for clamping a non-standard wafer to prevent the advancement when a non-standard wafer is placed on the stage The grinding shaft drives non-standard wafer activity during operation.
  7. 根据权利要求1所述的减薄机,其中,所述旋转托盘形成为气浮盘,所述旋转托盘与所述机体之间通过压缩空气形成气膜。The thinning machine according to claim 1, wherein the rotary tray is formed as an air floating tray, and a gas film is formed between the rotary tray and the body by compressed air.
  8. 根据权利要求1所述的减薄机,还包括:The thinning machine of claim 1 further comprising:
    驱动轴,所述驱动轴设在所述旋转托盘的下表面且与所述旋转托盘和所述驱动件相连,所述驱动轴与所述旋转托盘同轴设置以由所述驱动件驱动所述旋转托盘转动。a drive shaft, the drive shaft being disposed on a lower surface of the rotating tray and coupled to the rotating tray and the driving member, the driving shaft being coaxially disposed with the rotating tray to drive the driving member Rotate the tray to rotate.
  9. 根据权利要求8所述的减薄机,其中,所述驱动轴沿竖直方向延伸,所述驱动件形成为沿水平方向延伸的电机,所述减薄机还包括:The thinning machine according to claim 8, wherein the drive shaft extends in a vertical direction, the driving member is formed as a motor extending in a horizontal direction, and the thinning machine further comprises:
    减速器,所述减速器形成为L形,所述减速器的一端与所述电机相连,所述减速器的另一端与所述驱动轴相连。The speed reducer is formed in an L shape, one end of the speed reducer is connected to the motor, and the other end of the speed reducer is connected to the drive shaft.
  10. 根据权利要求8所述的减薄机,其中,所述驱动轴与所述旋转托盘一体成型。The thinning machine according to claim 8, wherein the drive shaft is integrally formed with the rotary tray.
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