WO2019035306A1 - Procédé de calcul d'indice de croissance de plante, programme de calcul d'indice de croissance de plante et système de calcul d'indice de croissance de plante - Google Patents

Procédé de calcul d'indice de croissance de plante, programme de calcul d'indice de croissance de plante et système de calcul d'indice de croissance de plante Download PDF

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Publication number
WO2019035306A1
WO2019035306A1 PCT/JP2018/026850 JP2018026850W WO2019035306A1 WO 2019035306 A1 WO2019035306 A1 WO 2019035306A1 JP 2018026850 W JP2018026850 W JP 2018026850W WO 2019035306 A1 WO2019035306 A1 WO 2019035306A1
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Prior art keywords
sunlight
light intensity
plant growth
reflected light
growth index
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PCT/JP2018/026850
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English (en)
Japanese (ja)
Inventor
義朗 平原
片桐　哲也
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コニカミノルタ株式会社
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Priority to JP2019536448A priority Critical patent/JP6988898B2/ja
Publication of WO2019035306A1 publication Critical patent/WO2019035306A1/fr

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    • A—HUMAN NECESSITIES
    • A01—AGRICULTURE; FORESTRY; ANIMAL HUSBANDRY; HUNTING; TRAPPING; FISHING
    • A01G—HORTICULTURE; CULTIVATION OF VEGETABLES, FLOWERS, RICE, FRUIT, VINES, HOPS OR SEAWEED; FORESTRY; WATERING
    • A01G7/00—Botany in general
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration

Definitions

  • the present invention relates to a plant growth index calculation method, a plant growth index calculation program, and a plant growth index calculation system, and in particular, a plant growth index for calculating a plant growth index using light intensity information of sunlight and correction information on plants and fields.
  • the present invention relates to an index calculation method, a plant growth index calculation program, and a plant growth index calculation system.
  • Patent Document 1 discloses an apparatus for optically measuring the degree of plant growth.
  • This plant growth measuring apparatus causes the sunlight reflected by the plant to be incident and spectrally split, and the first light receiving unit for measuring the reflection intensity of light of two or more specific wavelengths to directly enter the sunlight.
  • a second light receiving portion that splits the light into the same wavelength as the first light receiving portion and measures the light receiving intensity as the reference light, and the reflection intensity of the specific wavelength detected by the first light receiving portion Corrected based on the received light intensity of the reference light detected by the light receiving part of the plant, and measured the leaf color (SPAD value) of the measured plant, plant height, dry weight, (plant height ⁇ number of stems), ⁇ plant height ⁇ based on the corrected reflection intensity
  • a computing unit for obtaining at least one of leaf color (SPAD value) and ⁇ plant height ⁇ number of stems ⁇ leaf color (SPAD value) ⁇ .
  • the measuring device disclosed in Patent Document 1 determines the incident light intensity of sunlight incident on a plant and the reflected light intensity of sunlight reflected by the plant, and estimates the growth state of the plant from the reflected light intensity to the incident light intensity.
  • the calculation accuracy of the plant growth index can be enhanced by utilizing reflected light of light of two or more specific wavelengths such as visible light and infrared light.
  • the growth state of a plant can be estimated from the reflected light intensity with respect to the incident light intensity, but it is known that the characteristic of the reflected light differs depending on the incident light, that is, the component of sunlight.
  • the components of this sunlight are the direct achievement and the scattering component, and in particular, the direct achievement greatly affects the specular reflection component, so it is assumed that the growth state is estimated using the incident light intensity in which the direct achievement and the scattering component are mixed. , The estimation accuracy may be reduced.
  • the ratio of the direct achievement and the scattering component changes depending on the degree of the cloud, so the growing condition is determined using the incident light intensity where the direct achievement and the scattering component are mixed. If estimated, the estimation accuracy may be reduced.
  • the measuring device disclosed in Patent Document 1 separates sunlight and acquires a spectrum, but the reflection intensity of light of each specific wavelength is a combination of a direct achievement component and a scattering component. Data, it is impossible to suppress the decrease in the estimation accuracy of the growth state. Moreover, in this method, the ratio of the directly achieved component to the weather change and the scattered component can not be obtained, and therefore, it is not possible to suppress the decrease in the estimation accuracy of the growth state.
  • an apparatus for separating the directly achieved component and the scattered component is also marketed (for example, the Routing Shadow Blade PRB-100 of Preed Co., Ltd.).
  • This device is equipped with a shielding blade, and by intermittently driving the shielding blade in a state of being inclined according to the latitude of the installation position, it is possible to simultaneously measure total solar radiation and scattered solar radiation.
  • this device uses a full solar radiation meter, a wide-angle lens must be used. Therefore, it is necessary to correct information which changes according to the characteristics of the lens periphery, which complicates the processing.
  • the device since the device is basically always installed for the purpose of use, it is necessary to accurately obtain the latitude and longitude after the installation of the device and to calculate the control position of the light shielding blade. Therefore, calibration is required every time the installation position of the apparatus is changed, and the operation becomes complicated.
  • the main purpose is the plant growth index calculation method which can calculate appropriately the plant growth index showing the degree of growth in a plant, plant growth index calculation It is providing a program and a plant growth index calculation system.
  • One aspect of the present invention is a control device, a reflected light measurement device that measures the reflected light intensity of a measurement object having a plurality of leaves based on an instruction of the control device, and a sun based on the instruction of the control device
  • a method for calculating a plant growth index in a system including a solar light measurement device for measuring light intensity of light, wherein the reflected light measurement device measures the first wavelength and the second wavelength different from the first wavelength.
  • a first process of measuring the reflected light intensity of the object a second process of measuring the light intensity of the sunlight at a fourth wavelength different from the third wavelength and the third wavelength;
  • the control device represents the degree of growth in the measurement object using the reflected light intensity information of the measurement object acquired from the reflected light measurement device and the light intensity information of the sunlight acquired from the sunlight measurement device.
  • the plant growth index is calculated by correcting the intensity information.
  • One aspect of the present invention is a control device, a reflected light measurement device that measures the reflected light intensity of a measurement object having a plurality of leaves based on an instruction of the control device, and a sun based on the instruction of the control device
  • a first process of acquiring reflected light intensity information of the object to be measured measured at a second wavelength different from one wavelength, measured at a fourth wavelength different from the third wavelength and the third wavelength from the solar light measuring device The second process of acquiring the light intensity information of the sunlight, the plant growth index indicating the degree of growth in the measurement object is calculated using the reflected light intensity information of the measurement object and the light intensity information of the sunlight
  • Third process And in the third processing, the reflected light intensity information of the measurement object is corrected based on the light intensity information of the sunlight, the correction object related to at least one of
  • a plant growth index calculation system comprising: a sunlight measurement device that measures light intensity of light, wherein the reflected light measurement device is a measurement target of a first wavelength and a second wavelength different from the first wavelength.
  • the reflected light intensity can be measured, and the sunlight measuring device can measure the light intensity of the sunlight at a third wavelength and a fourth wavelength different from the third wavelength, and the control device can measure the reflected light.
  • a plant growth index indicating the degree of growth in the measurement object is calculated.
  • An arithmetic unit The part corrects the reflected light intensity information of the measuring object based on the light intensity information of the sunlight, the correction information on at least one of the measuring object and the field where the measuring object is grown, and the plant growth index Calculate
  • the plant growth index calculation method it is possible to appropriately calculate a plant growth index that indicates the degree of growth in plants.
  • the control device the reflected light measurement device which measures the reflected light intensity of the measuring object having a plurality of leaves based on the instruction of the control device, and the light intensity of the sunlight based on the instruction of the control device It is because the following processes are performed in the system containing a sunlight measuring device. That is, the first process in which the reflected light measuring device measures the reflected light intensity of the measuring object at the first wavelength and the second wavelength, and the sunlight measuring device measures the light intensity of the sunlight at the third wavelength and the fourth wavelength.
  • the incident light intensity of the sunlight incident on the plant and the reflected light intensity of the sunlight reflected by the plant can be determined, and the growth state of the plant can be estimated from the reflected light intensity with respect to the incident light intensity.
  • the calculation accuracy of the plant growth index can be enhanced by utilizing reflected light of light of two or more specific wavelengths such as light and infrared light.
  • the above method is based on the case of growing a plant having general characteristics in a field having general characteristics, it varies in the fields of various characteristics (for example, the state of the soil, the ratio of the water surface).
  • various characteristics for example, variety, planting interval, planting depth, plant coverage
  • the reflected light intensity in a plant changes depending on the physical characteristics specific to the plant variety, the plant variety is not considered in calculating the plant growth index.
  • the density of plants increases and the reflected light intensity in plants also increases as the growth progresses, however, when calculating the plant growth index , Planting condition of the plant is not considered.
  • the thickness of the strain and the amount of leaves increase, and the area ratio of leaves to soil (plant coverage rate) increases and the reflected light intensity in plants also increases, but calculation of plant growth index At that time, changes in vegetation coverage were not taken into consideration.
  • the reflected light intensity to be measured is not only the reflection component of light that sunlight directly enters the plant, but also the reflection component on the soil or water surface, or the component of light reflected on the soil or water surface and incident on the plant. Therefore, correction is required to increase the calculation accuracy of the plant growth index.
  • sunlight contains a direct achievement component and a scattering component
  • the estimation accuracy of the growth state fluctuates depending on the component of sunlight.
  • the directly achieved component greatly affects the specular reflection component, and there is a possibility that the estimation accuracy of the growth state may be lowered by the fluctuation of the reflected light intensity.
  • the ratio between the directly achieved component and the scattering component also changes, which may lower the estimation accuracy of the growth state.
  • the measuring device disclosed in Patent Document 1 makes sunlight reflected by plants incident and spectrally separates, measures reflection intensity of light of two or more specific wavelengths, and directly converts sunlight into sunlight. It is incident and spectrally separated, its received light intensity is measured as the reference light, the reflection intensity of the specific wavelength is corrected based on the received light intensity of the reference light, and the plant growth rate is determined based on the corrected reflection intensity.
  • the sunlight spectrum acquired by this method is data in which the directly achieved component and the scattered component are combined, it is not possible to suppress the decrease in the estimation accuracy of the growth state.
  • the ratio of the directly achieved component to the weather change and the scattered component can not be obtained, it is not possible to suppress a decrease in the estimation accuracy of the growth state.
  • a device for example, a measuring device whose side view and plan view are shown in FIGS. 15A and 15B
  • a device that separates the directly achieved component and the scattering component by intermittently driving the shielding blade
  • a device for example, a measuring device whose side view and plan view are shown in FIGS. 15A and 15B
  • a device that separates the directly achieved component and the scattering component by intermittently driving the shielding blade
  • an actinometer it is necessary to use a wide-angle lens, and it is necessary to correct information that changes according to the characteristics of the lens periphery, which complicates processing.
  • the latitude and longitude must be accurately determined to calculate the control position of the light shielding blade, and calibration is required each time the installation position of the device is changed, which makes the operation complicated.
  • a control device a reflected light measurement device that measures the reflected light intensity of a measurement object having a plurality of leaves based on an instruction of the control device, and an instruction of the control device.
  • the reflected light measurement device measures the reflected light intensity of the measuring object at a first wavelength and a second wavelength different from the first wavelength.
  • the sunlight measuring device measures the light intensity of the sunlight at the fourth wavelength different from the third wavelength and the third wavelength
  • the control device determines the reflected light intensity information of the measuring object obtained from the reflected light measuring device and the sun
  • a plant growth index representing the degree of growth in a measurement object using light intensity information of sunlight obtained from a light measurement device, a field where the light intensity information of sunlight, the measurement object and the measurement object grow About at least one of Based on the correction information, to correct the reflected light intensity information of the measurement object, it calculates a plant growth index.
  • the control device when calculating a plant growth index, separates the light intensity information of sunlight into a direct achievement component and a scattering component, and based on the direct achievement component and the scattering component, the reflected light intensity information of the measuring object Is corrected to calculate a plant growth index that indicates the degree of growth in the measurement target.
  • a scattering reflection plate (preferably having ideal Lambertian reflection characteristics) for scattering and reflecting the incident sunlight into the sunlight measuring device (a light receiving reflector installed at a predetermined position with respect to the scattering reflection plate) And a light shielding portion capable of shielding sunlight incident on the scattering reflection plate, and the sunlight measuring apparatus is configured in a state where the sunlight incident on the scattering reflection plate is shielded by the light shielding portion
  • the light amount QA of the sunlight incident on the light receiving portion and the light amount QB of the sunlight incident on the light receiving portion in a state where the sunlight incident on the scattering reflection plate is not blocked by the light shielding portion are measured.
  • the control device sets the light quantity QA as the scattering component of the light quantity incident on the light receiving part of sunlight, and directly achieves the light quantity QC obtained by subtracting the light quantity QA from the light quantity QB entering the light receiving part of sunlight Set to Then, when calculating the plant growth index, the control device corrects the reflected light intensity based on the direct achievement and the scattering component.
  • the control device may calculate the degree of diffusion based on the direct achievement and the scattering component when calculating the plant growth index, and the control device may calculate the longitude and latitude of the installation position of the sunlight measurement device.
  • the sun height is calculated based on the date and time information when the sun light measuring device measured the light intensity of the sun light, and the reflected light intensity information of the measurement object, the directly achieved part of the sun light and the scattered component, or the diffusivity
  • the plant growth index may be calculated on the basis of and the sun height.
  • the information depending on the direct achievement component is calculated using the direct achievement component to calculate the plant growth index. It is possible to judge the influence of sunlight in the simple and appropriate manner.
  • correction information on at least one of the measurement target and the field where the measurement target is grown is created in advance, and the control device calculates the plant growth index based on the correction information when calculating the plant growth index.
  • the reflected light intensity information of is corrected to calculate a plant growth index that represents the degree of growth in the measurement object.
  • the correction information includes, for example, variety information indicating the reflected light intensity according to the variety of the plant, planting information indicating the reflected light intensity according to at least one of the planting interval and planting depth of the plant, and the soil of the field.
  • the reflected light intensity is obtained in advance when each element is changed such as plant variety, planting interval, planting depth, plant coverage, soil condition, water surface ratio, and correction information is created. deep.
  • the reflected light intensity of each product is measured and stored by an experiment using a plurality of samples of different products, or the experiment using a plurality of samples of planting intervals and planting depths Measuring and storing the reflected light intensity at the planting interval of the planting depth and the planting depth, or measuring and storing the reflected light intensity in each soil state by an experiment using a plurality of soil samples, etc.
  • the reflected light intensity at each water surface ratio is measured and stored, for example, by an experiment using a plurality of water surface ratio samples.
  • the reflected light measurement device measures the reflected light intensity of the measurement target (reflected light intensity of the two wavelengths of the first wavelength and the second wavelength), and the sunlight measurement device measures the light intensity of the sunlight (third wavelength and the third wavelength
  • the light intensity of two wavelengths of four wavelengths is measured, and the control device uses the reflected light intensity information of the measuring object obtained from the reflected light measuring device and the light intensity information of sunlight obtained from the sunlight measuring device, A plant growth index that represents the degree of growth in the measurement target is calculated.
  • the control device corrects the reflected light intensity of the measurement target based on the correction information stored in advance to calculate a plant growth index.
  • the reflected light intensity corresponding to at least one of the measurement object and the field in the correction information corresponds to a predetermined reference with respect to at least one of the above elements.
  • a correction amount for matching with the reflected light intensity to be calculated is calculated, and the reflected light intensity of the measuring object is corrected using the calculated correction amount to calculate a plant growth index.
  • FIGS. 1 to 7 are schematic diagrams showing an example of the plant growth index calculation system of the present embodiment
  • FIG. 4 is a block diagram showing the configuration of the plant growth index calculation system of the present embodiment
  • FIG. 6A, 6B and 6C are three side views (a front view, a side view, and a plan view) showing the configuration of the solar light measurement device of the present embodiment
  • FIG. 7 is a flowchart showing the operation (growth index calculation processing) of the control unit of this embodiment.
  • the plant growth index calculation system 10 of this example is a reflection that measures the light intensity of the reflected light of the measuring object having a plurality of leaves at a second wavelength different from the first wavelength and the first wavelength.
  • a flying object such as a remote-controlled or autonomous multicopter or unmanned aerial vehicle (so-called drone) Ru.
  • the plant growth index calculation system 10 includes a reflected light measurement unit 20 (corresponding to the reflected light measurement device 11 in FIG. 1), a GPS (Global Positioning System) unit 21 and An azimuth meter 22, an inclinometer 23, a sunlight measurement unit 30 (corresponding to the sunlight measurement device 12 in FIG. 1), a control unit 40 (corresponding to the control unit 13 in FIG. 1), a storage unit 50, A clock unit 60, an I / F unit 70, a power supply unit 80 and the like are included.
  • FIG. 1 illustrates a system in which the reflected light measurement device 11, the sunlight measurement device 12, and the control device 13 are integrally configured and mounted on an airborne flight vehicle, the plant growth index calculation system 10, the reflected light measurement device 11 and the solar light measurement device 12 are separately configured, the reflected light measurement device 11 is mounted on an aerial capable flight object, and the sunlight measurement device 12 is installed on the ground It is good also as a system mounted in.
  • the reflected light measurement device 11 and the sunlight measurement device 12 may be mounted on a flying object, and the control device 13 may be configured as an independent device.
  • the reflected light measurement device 11 measures the light intensity of the reflected light to be measured based on the instruction of the control device 13 and the solar light measurement device 12 measures the sun based on the instruction of the control device 13.
  • the light intensity of the light is measured, and the control device 13 acquires the reflected light intensity information of the measurement object from the reflected light measurement device 11, and acquires the sunlight intensity information from the sunlight measurement device 12, and performs measurement using these Calculate the target plant growth index.
  • the plant growth index calculation system 10 may be a system in which the reflected light measurement device 11, the sunlight measurement device 12, and the control device 13 are configured as separate devices.
  • the reflected light measurement device 11 is mounted on the flying object, the light intensity of the reflected light to be measured is measured based on the instruction of the control device 13, and the sunlight measurement device 12 is installed on the ground.
  • the light intensity of the sunlight is measured based on the instruction of the control device 13 (preferably, measurement is performed so that the sunlight can be separated into the directly achieved component and the scattering component).
  • the control apparatus 13 acquires sunlight intensity information from the solar light measuring device 12, and uses these for the plant growth index of a measuring object. calculate.
  • the reflected light measurement device 11 has the functions of a reflected light measurement unit 20, a GPS unit 21, an azimuth meter 22, an inclinometer 23, an I / F unit 70, and a power supply unit 80.
  • the measuring device 12 may have the functions of a sunlight measurement unit 30, an I / F unit 70, and a power supply unit 80 shown in FIG.
  • the control device 13 may be a computer device having the functions of the control unit 40, the clock unit 60, the storage unit 50, the I / F unit 70, and the power supply unit 80 shown in FIG.
  • the reflected light measurement unit 20 is connected to the control unit 40, and is a device that measures the light intensity of the reflected light of the measurement target at different first and second wavelengths under the control of the control unit 40, and the measurement results are It is output to the control unit 40 as reflected light intensity information.
  • the first wavelength and the second wavelength can be appropriately set according to the desired plant growth index, and for example, in the case of obtaining an NDVI (Normalized Difference Vegetation Index) value, the wavelength of visible light near 650 nm and 750 nm or more The wavelength of infrared light can be used.
  • NDVI Normalized Difference Vegetation Index
  • the reflected light measurement unit 20 includes a first visible imaging unit that generates an image of visible light (visible image), and a first infrared imaging unit that generates an image of infrared light (infrared image). , And outputs image data of visible light and image data of infrared light to the control unit 40 as reflected light intensity information.
  • the first visible imaging unit is a so-called visible camera or the like, for example, a first band pass filter transmitting light in a relatively narrow band having a central wavelength of 650 nm, a visible light to be measured which has passed through the first band pass filter.
  • a first imaging optical system for forming an optical image of light on a predetermined imaging surface, a light receiving surface being disposed to coincide with the first imaging surface, and an optical image of visible light to be measured being electrically
  • a first image sensor that converts signals into signals
  • a first digital signal processor (DSP) that performs known image processing on the output of the first image sensor to generate first image data Rv of visible light, etc.
  • the image data Rv is output to the control unit 40.
  • the second infrared imaging unit is a so-called infrared camera or the like, and for example, transmits a second band pass filter and a second band pass filter that transmit light in a relatively narrow band having a central wavelength of 800 nm.
  • a second imaging optical system for forming an optical image of infrared light to be measured on a predetermined imaging surface, a light receiving surface being disposed to coincide with the second imaging surface, and infrared light of the measurement target
  • the second image sensor that converts an optical image into an electrical signal
  • the second DSP that generates the second image data Ri of infrared light by applying known image processing to the output of the second image sensor, etc.
  • the second image data Ri is output to the control unit 40.
  • the reflected light measurement unit 20 includes the first visible imaging unit and the first infrared imaging unit.
  • the reflected light measurement unit 20 is configured to receive red light, R pixels, and green light.
  • Image sensor RGB Ir image sensor
  • RGB Ir image sensor RGB Ir image sensor
  • IR pixels IR pixels to receive infrared light are arranged in 2 rows and 2 columns
  • white light is received
  • Image sensor WYRIr image sensor
  • W pixels, Y pixels that receive yellow light, R pixels that receive red light, and IR pixels that receive infrared light are arranged in 2 rows and 2 columns It is good also as composition provided with one imaging part.
  • the reflected light measurement unit 20 may be configured to include a spectroscope.
  • the GPS unit 21 is connected to the control unit 40, and the satellite positioning system for measuring the current position on the earth according to the control of the control unit 40 determines the position of the plant growth index calculation system 10 (see FIGS. 2 and 3). In the case of the configuration, it is a device that measures the position of the reflected light measurement device 11, and outputs the positioning result (latitude X, longitude Y, height Z) to the control unit 40.
  • the GPS unit 21 may be a GPS having a correction function of correcting an error such as DGSP (Differential GSP).
  • An azimuth meter (compass) 22 is connected to the control unit 40, and according to the control of the control unit 40, measures the orientation based on geomagnetism etc., thereby determining the orientation of the measurement direction of the plant growth index calculation system 10 (FIG.
  • the azimuth of the measurement direction of the reflected light measurement device 11 is measured, and the measured azimuth ⁇ C is output to the control unit 40.
  • the azimuth CC is represented as 0 degree in the north, 90 degrees in the east, 180 degrees in the south, and 270 degrees in the west.
  • the inclinometer 23 is connected to the control unit 40, and measures the inclination according to the control of the control unit 40 to measure the angle of the measurement direction of the plant growth index calculation system 10 (in the case of the configuration of FIG. 2 and FIG. It is a device that measures the angle of the measurement direction of the light measurement device 11, and outputs the measured angle ⁇ to the control unit 40.
  • the sunlight measurement unit 30 is connected to the control unit 40, and is a device that measures the light intensity of sunlight at the third and fourth wavelengths different from each other according to the control of the control unit 40.
  • the light intensity information is output to the control unit 40.
  • the third and fourth wavelengths can be appropriately set according to the plant growth index to be determined, but in the present embodiment, the third wavelength is the first wavelength described above, and the fourth wavelength is the second wavelength described above. There is.
  • the sunlight measurement unit 30 has a second visible imaging unit having the same configuration as the first visible imaging unit of the reflected light measurement unit 20 and a second infrared imaging unit having the same configuration as the first infrared imaging unit of the reflected light measurement unit 20.
  • a two-infrared imaging unit and outputs image data of visible light and image data of infrared light to the control unit 40 as light intensity information of sunlight.
  • the second visible imaging unit generates third image data Sv of visible light and outputs the third image data Sv to the control unit 40
  • the second infrared imaging unit generates fourth image data Si of infrared light. Output to the control unit 40.
  • FIG. 5 is a perspective view showing an appearance configuration of the sunlight measurement unit 30, and FIGS. 6A, 6B, and 6C are three views (a front view, a side view, a plan view) showing the configuration of the sunlight measurement unit 30. As shown in FIG. 5 and FIGS.
  • the sunlight measurement unit 30 of the present embodiment scatters and reflects the incident sunlight (preferably, it has an ideal Lambertian reflection characteristic) and a scattering reflector 31
  • a light receiving unit 32 (a second visible imaging unit and a second infrared imaging unit) installed at a predetermined position with respect to the scattering / reflecting plate 31 and shielding sunlight incident on the scattering / reflecting plate 31
  • the light shielding part 33 which can be provided, the housing
  • the scattering / reflecting plate 31 is supported by the housing 34, and the light receiving unit 32 is supported by the support column 35. They are arranged oppositely (the opposite sides are arranged horizontally) such that the central axes coincide.
  • the light shielding portion 33 is rotatably supported by the housing 34 and the support column 35 with the central axes of the scattering / reflecting plate 31 and the light receiving portion 32 as the rotation axis O, by a motor disposed inside the housing 34 Rotate at a high speed (preferably repeat 180 ° forward / reverse rotation).
  • the light shielding portion 33 includes two portions facing each other across the rotation axis O. These portions shield the sunlight incident on the scattering / reflecting plate 31 according to the rotation angle, and the amount of the sunlight is It is arranged to change.
  • the solar light measurement unit 30 is arranged on the straight line connecting the sun and the scattering / reflecting plate 31 in the first state in which the light shielding unit 33 is disposed on the straight line connecting the sun and the scattering / reflecting plate 31. And a second state in which is not arranged.
  • the light shielding unit 33 is installed so that one part of the light shielding unit 33 is substantially on the north side, and the light reflected by the scattering / reflecting plate 31 is imaged by the light receiving unit 32 while rotating the light shielding unit 33.
  • the light amount QA of sunlight incident on the light receiving portion 32 in a state where the sunlight incident on the scattering / reflecting plate 31 is blocked by the light blocking portion 33, and The light amount QB of the sunlight incident on the light receiving unit 32 in a state where the sunlight incident on the scattering / reflecting plate 31 is not shielded by the light shielding unit 33 is measured.
  • the light quantity QA is a scattering component of the light quantity incident on the light receiving unit 32
  • the light quantity QC is one of the light quantities incident on the light receiving unit 32. It will be directly achieved.
  • Control part 40 controls each part of plant growth index calculation system 10, and calculates a plant growth index.
  • the control unit 40 is configured to include, for example, a central processing unit (CPU) and peripheral circuits thereof.
  • the control unit 40 executes the program (plant growth index calculation program) recorded in the computer readable recording medium by the CPU, whereby the control unit 40 controls the information acquisition unit 41, the sun angle calculation unit 42, the sun direction calculation unit 43, and the diffusion. It functions as a degree calculating unit 44, a leaf density calculating unit 45, and a growth index calculating unit 46.
  • the information acquisition unit 41 causes the reflected light measurement unit 20 to generate the first image data Rv of visible light and the second image data Ri (reflected light intensity information) of infrared light. 1. Acquire image data Rv and second image data Ri of infrared light. Further, the information acquisition unit 41 causes the sunlight measurement unit 30 to generate third image data Sv of visible light and fourth image data Si (light intensity information of sunlight) of infrared light, and the sunlight measurement unit 30 The third image data Sv of visible light and the fourth image data Si of infrared light are acquired.
  • the information acquiring unit 41 receives the light intensity of each pixel of the third image data Sv and the fourth image data Si in a state in which the sunlight that enters the scattering / reflecting plate 31 is shielded by the light shielding unit 33
  • the light quantity QA of the sunlight incident on the light source 32 and the light quantity QB of sunlight incident on the light receiving section 32 in a state where the light incident on the scattering / reflecting plate 31 is not blocked by the light shielding section 33 are acquired separately.
  • ⁇ 1 arctan [cos (Y) cos ( ⁇ ) sin (h) / [sin (Y) sin ( ⁇ ) -sin ( ⁇ )]] (5)
  • the diffusion degree calculation unit 44 obtains the diffusion degree W based on the measurement result of the sunlight measurement unit 30. For example, the diffusivity calculating unit 44 calculates the amount of light QA of sunlight incident on the light receiving unit 32 in a state where sunlight incident on the scattering / reflecting plate 31 is blocked by the light shielding unit 33, and The light quantity QC is obtained by subtracting the light quantity QA from the light quantity QB using the light quantity QB of sunlight incident on the light receiving part 32 in a state where the light is not blocked by the light shielding part 33.
  • the light amount QA is a scattering component of the light amount incident on the light receiving portion 32
  • the light amount QC is a direct achievement of the light amount incident on the light receiving portion 32
  • the diffusion degree W is light amount QA / light amount QB or light amount QA / It becomes the light quantity QC.
  • the leaf density calculation unit 45 obtains the leaf density based on the growth information stored in the growth information storage unit 52 described later. For example, when the growth information is information indicating the correspondence between the number of days from planting (for example, rice planting) and the leaf density L, the leaf density calculator 45 uses the planting information acquired through the I / F unit 70. The leaf density corresponding to the number of days is calculated from the growth information stored in the growth information storage unit 52.
  • the plant growth index calculation system 10 may further include an input unit (for example, a ten key or a keyboard) for inputting data from the outside, and may be configured to input the number of days since planting via the input unit.
  • the growth index calculation unit 46 is the light intensity information of the reflected light of the first wavelength and the second wavelength acquired by the information acquisition unit 41, the light intensity information of the sunlight of the third wavelength and the fourth wavelength, and the sun angle calculation unit 42. Based on the determined sun height A or the sun angle ⁇ , a plant growth index indicating the degree of growth in the measurement object is determined.
  • the growth index computing unit 46 further performs measurement based on the sun direction ⁇ obtained by the sun direction computing unit 43, the measurement angle ⁇ obtained by the inclinometer 23, and the leaf density L obtained by the leaf density computing unit 45. Determine a plant growth index that indicates the degree of growth in the subject.
  • the information acquiring unit 41 of the present embodiment separates and acquires the light intensity information of sunlight into the direct achievement component and the scattering component.
  • the plant growth index can be accurately calculated by correcting the light intensity information of the reflected light based on the directly achieved component and the scattering component (or the diffusivity W calculated by the diffusivity calculating unit 44).
  • the storage unit 50 is connected to the control unit 40, and stores various programs and various data under the control of the control unit 40.
  • the various programs include, for example, a control program for controlling each part of the plant growth index calculation system 10, a plant growth index calculation program for obtaining a plant growth index to be measured, and the like.
  • the various data described above include data necessary for calculation of a plant growth index, such as growth information for obtaining leaf density.
  • the storage unit 50 includes, for example, a storage device such as a ROM (Read Only Memory), which is a nonvolatile storage element, or an EEPROM (Electrically Erasable Programmable Read Only Memory), which is a rewritable nonvolatile storage element.
  • the storage unit 50 includes a RAM (Random Access Memory) as a working memory of the control unit 40, which stores data and the like generated during execution of the program.
  • the storage unit 50 may include a relatively large-capacity HDD (Hard Disk Drive), an SSD (Solid State Drive), or the like.
  • the storage unit 50 includes a growth information storage unit 52 that stores growth information.
  • This growth information is, for example, information indicating the correspondence between the number of days since planting (for example, rice planting) and the leaf density L. Instead of the number of days since planting, any of date, leaf age, average plant height and average number of stems may be used.
  • the growth information is created in advance based on the average value or the like obtained from a plurality of samples, and is stored in, for example, the growth information storage unit 52 as a look-up table.
  • the clock unit 60 is connected to the control unit 40, measures the date and time, and the minutes according to the control of the control unit 40, and outputs the measured current date and time information T to the control unit 40.
  • the I / F unit 70 is connected to the control unit 40, and between the control unit 40 and an external device under the control of the control unit 40 (in the case of the configuration of FIG. 2, the reflected light measurement device 11 and the control device 13, Between the sunlight measurement device 12 and the control device 13 and between the reflected light measurement device 11 and the control device 13 and between the sunlight measurement device 12 and the control device 13 in the case of the configuration of FIG. It is a circuit to do.
  • an interface circuit of RS232C which is a serial communication method, an interface circuit using Bluetooth (registered trademark) standard, an interface circuit for performing infrared communication such as IrDA (Infrared Data Association) standard, USB (Universal Serial Bus) standard
  • the I / F unit 70 is a communication card or the like that communicates by wire or wirelessly, and may communicate with an external device via a communication network such as Ethernet (registered trademark) environment, for example.
  • the power supply unit 80 supplies power to each part of the plant growth index calculation system 10 (each part of the reflected light measurement device 11, the solar light measurement device 12 and the control device 13 in the case of the configuration of FIG. It is a circuit to supply.
  • or FIG. 4 is an example of the plant growth index calculation system 10 of a present Example,
  • the structure and control are changeable suitably.
  • the plant growth index calculation system 10 may be provided with an input unit for inputting various commands, various data, etc. as necessary, and output various commands, various data, measurement results, etc. input by the input unit.
  • An output unit or the like may be provided.
  • the CPU of the control unit 40 develops a plant growth index calculation program stored in a computer readable recording medium such as the storage unit 50 (ROM, EEPROM, HDD, SSD, etc.) in the storage unit 50 (RAM) and executes it.
  • a plant growth index calculation program stored in a computer readable recording medium such as the storage unit 50 (ROM, EEPROM, HDD, SSD, etc.) in the storage unit 50 (RAM) and executes it.
  • the plant growth index calculation system 10 is arranged such that the reflected light measurement unit 20 is directed to the foliage to be measured by the user (operator).
  • the control unit 40 executes initialization of necessary parts, and the control unit 40 executes an information acquisition unit 41, a sun angle calculation unit 42, and the like by executing the plant growth index calculation program. It functions as a sun direction calculation unit 43, a diffusion degree calculation unit 44, a leaf density calculation unit 45, and a growth index calculation unit 46.
  • plant growth index calculation system 10 operates as follows.
  • the control unit 40 acquires light intensity information from the reflected light measurement unit 20 and the sunlight measurement unit 30 (S101). Specifically, the control unit 40 (the information acquisition unit 41) causes the reflected light measurement unit 20 to measure the light intensity of the reflected light to be measured, and the first image data Rv and visible light from the reflected light measurement unit 20 The second image data Ri in infrared light is acquired. In addition, the control unit 40 (the information acquisition unit 41) causes the sunlight measurement unit 30 to measure the light intensity of sunlight, and the third image data Sv in visible light and the third in infrared light from the sunlight measurement unit 30. 4 Acquire image data Si.
  • the control unit 40 (the information acquisition unit 41) blocks the sunlight incident on the scattering / reflecting plate 31 by the light shielding unit 33 as the light intensity of each pixel of the third image data Sv and the fourth image data Si. Acquires the light quantity QA of sunlight incident on the light receiving section 32 in a lighted state and the light quantity QB of sunlight incident on the light receiving section 32 in a state where the sunlight incident on the scattering / reflection plate 31 is not blocked by the light shielding section 33 Do.
  • the control unit 40 acquires various types of information from the GPS unit 21, the azimuth meter 22 and the inclinometer 23 (S102). Specifically, the control unit 40 (information acquisition unit 41) acquires the latitude X and the longitude Y from the GPS unit 21. Further, the control unit 40 (information acquisition unit 41) acquires the azimuth ⁇ C from the azimuth meter 22. Further, the control unit 40 (the information acquisition unit 41) acquires the measurement angle ⁇ from the inclinometer 23.
  • control unit 40 acquires date and time information T from the clock unit 60 (S103).
  • the control unit 40 receives the light amount QA of the sunlight incident on the light receiving unit 32 in a state where the sunlight incident on the scattering and reflecting plate 31 is blocked by the light shielding unit 33; 31 using the light amount QB of the sunlight incident on the light receiving unit 32 in a state where the sunlight incident on 31 is not blocked by the light shielding unit 33, and calculating the light intensity QC obtained by subtracting the light intensity QA from the light intensity QB.
  • the image data Sv and the fourth image data Si are separated into direct achievement components (Svd, Sid) and scattering components (Svs, Sis) (S104).
  • control unit 40 obtains the diffusion degree W (S105). Specifically, the control unit 40 (the diffusion degree calculation unit 44) obtains the diffusion degree W by dividing the light amount QA by the light amount QB or dividing the light amount QA by the light amount QC.
  • control unit 40 calculates the sun height A or the sun angle ⁇ based on the latitude X and longitude Y acquired by the GPS unit 21 and the date and time information T measured by the clock unit 60. It asks for (S106).
  • control unit 40 (the sun direction calculation unit 43), if necessary, the relative direction of the sun and the camera based on the azimuth ⁇ C measured by the azimuth meter 22 and the date and time information T measured by the clock unit 60. Determine ⁇ (S107).
  • control unit 40 (the leaf density calculation unit 45) generates, from the planting based on the growth information G stored in the growth information storage unit 51 and the date and time information T measured by the clock unit 60, as necessary.
  • the leaf density L corresponding to the number of days is calculated (S108).
  • control unit 40 determines the reflection of the measurement target acquired in S101 based on the direct achievement of the sunlight intensity obtained in S104 and the scattering component (or the diffusivity W calculated in S105).
  • the light intensity is corrected to calculate a plant growth index (S109).
  • control unit 40 determines the reflected light intensity of the measurement target acquired in S101, the direct achievement of the sunlight intensity determined in S104, and the scattering component (or the diffusivity calculated in S105) W), the sun height A (or the sun angle ⁇ ) obtained in S106, and, if necessary, the plant growth index based on the relative direction ⁇ of the sun and the camera calculated in S107 and the leaf density L calculated in S108 Calculate For example, according to Equation 11, a plant growth index can be calculated using the reflected light intensity of the measurement object, the direct achievement of the sunlight intensity, the scattering component, and the sun height A.
  • control unit 40 stores the plant growth index calculated in S109 in the storage unit 50 in association with the date and time information T acquired in S103, or via the I / F unit 70.
  • the data describing the plant growth index at each position of the field is output to an image forming apparatus such as MFP (Multi-Functional Peripherals) so that the map of plant growth index can be printed or output to an external computer device. Make it possible to display a map of plant growth indicators.
  • MFP Multi-Functional Peripherals
  • the information depending on the direct achievement component is calculated using the direct achievement component.
  • FIG. 8 is a block diagram showing the configuration of the plant growth index calculation system of the present embodiment
  • FIGS. 9 to 14 are tables used in the plant growth index calculation method of the present embodiment.
  • the control unit 40 of the plant growth index calculation system 10 separates the light intensity information of sunlight obtained by the measurement into the direct achievement component and the scattering component, and calculates the plant growth index.
  • the control unit 40 of the plant growth index calculation system 10 performs measurement when calculating the plant growth index. The case where the reflected light intensity information of the measurement object is corrected based on the correction information on the field where the object and / or the measurement object are grown will be described.
  • the plant growth index calculation system 10 of this embodiment can be configured as shown in FIG. 1 to FIG. 3 as in the first embodiment. However, based on the configuration of FIG.
  • the plant growth index calculation system 10 includes the reflected light measurement unit 20 (corresponding to the reflected light measurement device 11 in FIG. 1), the GPS unit 21, and the orientation as in the first embodiment.
  • a total of 22 an inclinometer 23, a sunlight measurement unit 30 (corresponding to the sunlight measurement device 12 in FIG. 1), a control unit 40 (corresponding to the control unit 13 in FIG. 1), a storage unit 50, and a timepiece unit 60, an I / F unit 70, a power supply unit 80 and the like.
  • the sunlight measuring unit 30 When the sunlight measuring unit 30 is installed on the ground like the sunlight measuring device 12 of FIG. 3, the sunlight is incident on the scattering and reflecting plate 31 as a structure as shown in FIG. 5 as in the first embodiment.
  • the amount of light QB of sunlight can be measured.
  • the light quantity QA is a scattering component of the light quantity incident on the light receiving unit 32
  • the light quantity QC is one of the light quantities incident on the light receiving unit 32. It will be directly achieved.
  • Control part 40 controls each part of plant growth index calculation system 10, and calculates a plant growth index.
  • the control unit 40 is configured to include, for example, a central processing unit (CPU) and peripheral circuits thereof. By executing a program (plant growth index calculation program) recorded in a computer readable recording medium by the CPU, the control unit 40 controls the information acquisition unit 41, the sun angle calculation unit 42, and the sun as in the first embodiment. It functions as a direction calculation unit 43, a diffusion degree calculation unit 44, a leaf density calculation unit 45, and a growth index calculation unit 46.
  • the information acquisition unit 41 acquires the first image data Rv of visible light and the second image data Ri (reflected light intensity information) of infrared light from the reflected light measurement unit 20. In addition, the information acquisition unit 41 acquires, from the sunlight measurement unit 30, the third image data Sv of visible light and the fourth image data Si (light intensity information of sunlight) of infrared light. At that time, when the sunlight measurement unit 30 has the structure shown in FIG. 5, the information acquisition unit 41 causes the light intensity of each pixel of the third image data Sv and the fourth image data Si to be incident on the scattering reflection plate 31.
  • the light quantity QB of the sun light is separately acquired.
  • the diffusion degree calculation unit 44 obtains the diffusion degree W based on the measurement result of the sunlight measurement unit 30. For example, the diffusion degree calculation unit 44 obtains the standard deviation ⁇ sv of the third image data Sv in the visible light generated by the second visible image pickup unit, and divides the diffusion coefficient W by this standard deviation ⁇ sv. Ask for Alternatively, for example, the diffusivity calculating unit 44 obtains the standard deviation ⁇ si of the fourth image data Si in the infrared light generated by the second infrared imaging unit, and divides the predetermined coefficient K by the standard deviation ⁇ si.
  • the diffusion degree W is determined by The predetermined coefficient K is a coefficient for normalizing so that the diffusivity W becomes 0 in the case of clear weather without clouds, and becomes 1 in the case of cloudy weather. Also, for example, the diffusion degree calculation unit 44 acquires the shutter speed (for example, the shutter speed of the first visible image pickup unit) ss of the reflected light measurement unit 20 from the reflected light measurement unit 20 and It can also be done.
  • the shutter speed for example, the shutter speed of the first visible image pickup unit
  • the diffusivity calculation unit 44 makes the sunlight incident on the scattering / reflecting plate 31 incident on the light receiving unit 32 in a state of being shielded by the light shielding unit 33
  • the light quantity QA is subtracted from the light quantity QB using the light quantity QA of sunlight and the light quantity QB of sunlight incident on the light receiving part 32 in a state where the sunlight entering the scattering reflection plate 31 is not blocked by the light shielding part 33 Determine the light quantity QC.
  • the light amount QA is a scattering component of the light amount incident on the light receiving portion 32
  • the light amount QC is a direct achievement of the light amount incident on the light receiving portion 32
  • the diffusion degree W is light amount QA / light amount QB or light amount QA / It becomes the light quantity QC.
  • the leaf density calculation unit 45 obtains the leaf density based on the growth information stored in the growth information storage unit 52 described later. For example, when the growth information is information indicating the correspondence between the number of days from planting (for example, rice planting) and the leaf density L, the leaf density calculator 45 uses the planting information acquired through the I / F unit 70. The leaf density corresponding to the number of days is calculated from the growth information stored in the growth information storage unit 52.
  • the plant growth index calculation system 10 may further include an input unit (for example, a ten key or a keyboard) for inputting data from the outside, and may be configured to input the number of days since planting via the input unit.
  • the growth index calculation unit 46 is the light intensity information of the reflected light of the first wavelength and the second wavelength acquired by the information acquisition unit 41, the light intensity information of the sunlight of the third wavelength and the fourth wavelength, and the sun angle calculation unit 42. Based on the determined sun height A or the sun angle ⁇ , a plant growth index indicating the degree of growth in the measurement object is determined.
  • the growth index computing unit 46 further performs measurement based on the sun direction ⁇ obtained by the sun direction computing unit 43, the measurement angle ⁇ obtained by the inclinometer 23, and the leaf density L obtained by the leaf density computing unit 45. Determine a plant growth index that indicates the degree of growth in the subject.
  • the growth index calculation unit 46 calculates the direct achievement of the light amount incident on the light reception unit 32 and the scattering component (or the diffusivity calculated by the diffusivity).
  • the plant growth index can also be calculated by correcting the light intensity information of the reflected light based on W). For example, when NDVI is determined as a plant growth index, the plant growth index can be calculated according to Equation 11.
  • the growth index computation unit 46 corrects the correction information (type information indicating reflected light intensity according to the type of plant, planting interval of plant, and planting depth). Planting information showing reflected light intensity according to at least one of them, vegetation coverage information showing reflected light intensity according to vegetation coverage, soil information showing reflected light intensity according to the condition of soil in the field, percentage of water surface in the field The light intensity information of the reflected light is corrected based on water surface information etc. indicating the reflected light intensity according to the above, and the plant growth index is calculated (or the plant growth index calculated once is corrected).
  • the correction information type information indicating reflected light intensity according to the type of plant, planting interval of plant, and planting depth. Planting information showing reflected light intensity according to at least one of them, vegetation coverage information showing reflected light intensity according to vegetation coverage, soil information showing reflected light intensity according to the condition of soil in the field, percentage of water surface in the field.
  • the growth index computing unit 46 corrects the information with reference to the correction information (reflected light intensity corresponding to various kinds).
  • the correction information reflected light intensity corresponding to various kinds.
  • a correction amount for matching the reflected light intensity corresponding to the type with the reflected light intensity corresponding to the reference type is calculated, and the light intensity information of the reflected light is corrected using the calculated correction amount. , Calculate or correct plant growth index.
  • At least one of the planting interval and planting depth of the plant to be measured is obtained in advance from the producer etc., and the growth index computing unit 46 corrects the correction information (according to various planting intervals and / or planting depth Reflected light intensity), among the correction information, the reflected light intensity corresponding to at least one of the planting interval and planting depth corresponds to at least one of the reference planting interval and planting depth
  • a plant growth index is calculated or corrected by calculating a correction amount to match the reflected light intensity and correcting the light intensity information of the reflected light using the calculated correction amount.
  • the growth index computing unit 46 determines the coverage rate (area ratio of leaves to soil) of the field to be measured from the variety of the plant to be measured and at least one of the planting interval and the planting depth, The standard deviation ⁇ of the external reflected light intensity is determined, and the predetermined coefficient K is divided by the determined standard deviation ⁇ to determine the coverage rate of the field to be measured, and correction information (reflected light according to various coverage rates) Of the correction information, the correction amount is calculated using the correction amount calculated to match the reflected light intensity corresponding to the coverage with the reflected light intensity corresponding to the reference coverage. The plant growth index is calculated or corrected by correcting the light intensity information of light.
  • the type of soil is obtained in advance from a producer or the like, the reflectance of the soil is measured in advance, and the like to obtain the state of the soil of the field to be measured.
  • Correction light intensity corresponding to the state of the soil with reference to the reflected light intensity corresponding to the state of the soil) and the correction amount for adjusting the reflected light intensity corresponding to the state of the soil to the reflected light intensity corresponding to the state of the reference soil The plant growth index is calculated or corrected by correcting the light intensity information of the reflected light using the calculated and calculated correction amount.
  • the growth index calculation unit 46 corrects the information (reflected light intensity according to the ratio of various water surfaces)
  • the correction amount for adjusting the reflected light intensity corresponding to the ratio of the water surface to the reflected light intensity corresponding to the ratio of the reference water surface among the correction information is calculated with reference to
  • the plant growth index is calculated or corrected by correcting the light intensity information of light.
  • the correction amount can be calculated for at least one element.
  • criteria of each element of variety, planting interval, planting depth, plant coverage rate, soil condition, water surface ratio can be set appropriately, for example, average information of each element or information with high frequency It is defined as a reference, and the reflected light intensity corresponding to at least one of the measurement target and the field where the measurement target is grown in the correction information for at least one element by the growth index calculation unit 46 The amount of correction to match the corresponding reflected light intensity can be calculated.
  • the storage unit 50 is connected to the control unit 40, and stores various programs and various data under the control of the control unit 40.
  • the various programs include, for example, a control program for controlling each part of the plant growth index calculation system 10, a plant growth index calculation program for obtaining a plant growth index to be measured, and the like.
  • the various data include correction information, growth information and the like.
  • the storage unit 50 includes, for example, a storage device such as a ROM, which is a nonvolatile storage element, and an EEPROM, which is a rewritable nonvolatile storage element.
  • the storage unit 50 includes a RAM or the like which is a working memory of a so-called control unit 40 which stores data and the like generated during execution of the program.
  • the storage unit 50 may include a relatively large capacity HDD, an SSD, or the like.
  • the storage unit 50 functionally includes a correction information storage unit 51 and a growth information storage unit 52 in order to store the information.
  • the correction information is information describing the reflected light intensity when each element such as the kind, planting interval, planting depth, plant coverage, soil condition, water surface ratio is changed, for example, various kinds or varieties It is the information which described visible and infrared catoptric light intensity at the time of changing the number of days from planting and accumulated sunshine time to planting interval and planting depth. Further, the correction information is, for example, information describing visible and infrared reflected light intensities when the solar altitude is changed with respect to various coverage rates, soil conditions, and water surface ratios.
  • FIG. 9 is an example of the variety information, and when the number of days from planting and the cumulative sunshine duration are changed for various varieties (in FIG. 9, varieties 1 to n) (days 1 to days i in FIG. 9) , Visible and infrared reflected light intensities of cumulative sunshine time 1 to cumulative sunshine time i) are described.
  • FIG. 10 is an example of planting information, and when the number of days from planting and the cumulative sunshine duration are changed with respect to various planting intervals (interval 1 to interval n in FIG. 10) (days 1 in FIG. 10) The visible and infrared reflected light intensities of ⁇ days i, cumulative sunshine hours 1 ⁇ cumulative sunshine hours i) are described.
  • FIG. 9 is an example of the variety information, and when the number of days from planting and the cumulative sunshine duration are changed for various varieties (in FIG. 9, varieties 1 to n) (days 1 to days i in FIG. 9) , Visible and infrared reflected light intensities of cumulative sunshine time 1 to cumulative sunshine time i) are
  • FIG. 11 shows another example of planting information, in which the number of days since planting and the cumulative sunshine duration are changed with respect to various planting depths (depth 1 to depth n in FIG. 11) (in FIG. 11)
  • the visible and infrared reflected light intensities of days 1 to i, cumulative sunshine hours 1 to cumulative sunshine hours i) are described.
  • FIG. 12 is an example of vegetation coverage information, and when the solar altitude is changed with respect to various vegetation coverages (in FIG. 12, vegetation coverage 1 to vegetation coverage n) (in FIG. 12, solar altitude 1 to solar altitude i)
  • FIG. 13 is an example of soil information, and is visible when the solar altitude is changed (in FIG.
  • FIG. 14 is an example of water surface information, and is visible when the solar altitude is changed for various water surface ratios (ratio 1 to ratio n in FIG. 14) (in FIG. 14, solar altitude 1 to solar altitude i) And infrared reflected light intensity is described.
  • the growth information is, for example, information indicating the correspondence between the number of days since planting (for example, rice planting) and the leaf density L. Instead of the number of days since planting, any of date, leaf age, average plant height and average number of stems may be used.
  • the growth information is created in advance based on the average value or the like obtained from a plurality of samples, and is stored in, for example, the growth information storage unit 52 as a look-up table.
  • the control unit 40 (the control device 13 in the case of the system configurations of FIG. 2 and FIG. 3) of the plant growth index calculation system 10 of the present embodiment will be described.
  • the CPU of the control unit 40 stores a plant growth index calculation program stored in a computer readable recording medium such as the storage unit 50 (ROM, EEPROM, HDD, SSD, etc.) as the storage unit 50 (RAM).
  • ROM read-only memory
  • EEPROM electrically erasable programmable read-only memory
  • HDD high-d-only memory
  • SSD storage unit 50
  • the plant growth index calculation system 10 is arranged such that the reflected light measurement unit 20 is directed to the foliage to be measured by the user (operator).
  • the control unit 40 executes initialization of necessary parts, and the control unit 40 executes an information acquisition unit 41, a sun angle calculation unit 42, and the like by executing the plant growth index calculation program. It functions as a sun direction calculation unit 43, a diffusion degree calculation unit 44, a leaf density calculation unit 45, and a growth index calculation unit 46.
  • plant growth index calculation system 10 operates as follows.
  • the sunlight measuring unit 30 has a structure as shown in FIG. 5, and the amount of light in the state where sunlight incident on the scattering / reflecting plate 31 is blocked by the light shielding unit 33 It is assumed that the amount of sunlight in a state where the sunlight is not blocked by the light blocking portion 33 is measured.
  • the control unit 40 acquires light intensity information from the reflected light measurement unit 20 and the sunlight measurement unit 30 (S101). Specifically, the control unit 40 (the information acquisition unit 41) causes the reflected light measurement unit 20 to measure the light intensity of the reflected light to be measured, and the first image data Rv and visible light from the reflected light measurement unit 20 The second image data Ri in infrared light is acquired. In addition, the control unit 40 (the information acquisition unit 41) causes the sunlight measurement unit 30 to measure the light intensity of sunlight, and the third image data Sv in visible light and the third in infrared light from the sunlight measurement unit 30. 4 Acquire image data Si.
  • the control unit 40 (the information acquisition unit 41) blocks the sunlight incident on the scattering / reflecting plate 31 by the light shielding unit 33 as the light intensity of each pixel of the third image data Sv and the fourth image data Si. Acquires the light quantity QA of sunlight incident on the light receiving section 32 in a lighted state and the light quantity QB of sunlight incident on the light receiving section 32 in a state where the sunlight incident on the scattering / reflection plate 31 is not blocked by the light shielding section 33 Do.
  • the control unit 40 acquires various types of information from the GPS unit 21, the azimuth meter 22 and the inclinometer 23 (S102). Specifically, the control unit 40 (information acquisition unit 41) acquires the latitude X and the longitude Y from the GPS unit 21. Further, the control unit 40 (information acquisition unit 41) acquires the azimuth ⁇ C from the azimuth meter 22. Further, the control unit 40 (the information acquisition unit 41) acquires the measurement angle ⁇ from the inclinometer 23.
  • control unit 40 acquires date and time information T from the clock unit 60 (S103).
  • the control unit 40 receives the light amount QA of the sunlight incident on the light receiving unit 32 in a state where the sunlight incident on the scattering and reflecting plate 31 is blocked by the light shielding unit 33; 31 using the light amount QB of the sunlight incident on the light receiving unit 32 in a state where the sunlight incident on 31 is not blocked by the light shielding unit 33, and calculating the light intensity QC obtained by subtracting the light intensity QA from the light intensity QB.
  • the image data Sv and the fourth image data Si are separated into direct achievement components (Svd, Sid) and scattering components (Svs, Sis) (S104).
  • control unit 40 obtains the diffusion degree W (S105). Specifically, the control unit 40 (the diffusion degree calculation unit 44) obtains the diffusion degree W by dividing the light amount QA by the light amount QB or dividing the light amount QA by the light amount QC.
  • control unit 40 calculates the sun height A or the sun angle ⁇ based on the latitude X and longitude Y acquired by the GPS unit 21 and the date and time information T measured by the clock unit 60. It asks for (S106).
  • control unit 40 (the sun direction calculation unit 43), if necessary, the relative direction of the sun and the camera based on the azimuth ⁇ C measured by the azimuth meter 22 and the date and time information T measured by the clock unit 60. Determine ⁇ (S107).
  • control unit 40 (the leaf density calculation unit 45) generates, from the planting information, based on the growth information G stored in the growth information storage unit 52 and the date and time information T measured by the clock unit 60, as necessary.
  • the leaf density L corresponding to the number of days is calculated (S108).
  • the control unit 40 outputs the reflected light intensity of the measurement target obtained in S101 and the direct achievement component of the sunlight intensity obtained in S104 and the scattering component (or the diffusivity W calculated in S105)
  • the plant growth index is calculated based on the sun height A (or the sun angle ⁇ ) obtained in S106 and, if necessary, the relative direction ⁇ between the sun and the camera calculated in S107 and the leaf density L calculated in S108 (S109).
  • a plant growth index can be calculated using the reflected light intensity of the measurement object, the direct achievement of the sunlight intensity, the scattering component, and the sun height A.
  • the reflected light intensity is obtained in advance when each element of variety, planting interval, planting depth, plant coverage rate, soil condition, water surface ratio is changed, and correction information is created, and the storage unit 50 (
  • the control information stored in the correction information storage unit 51), the control unit 40 (growth index calculation unit 46) refers to the correction information stored in the storage unit 50 (correction information storage unit 51), the type, planting interval, At least one element selected from planting depth, plant coverage, soil condition, and water surface ratio, among the correction information, the reflected light intensity corresponding to at least one of the target plant and the field
  • the amount of correction to match the reflected light intensity corresponding to a predetermined reference is calculated, and the reflected light intensity of the measuring object obtained in S101 is corrected using the calculated amount of correction, to calculate or correct the plant growth index Do.
  • control unit 40 stores the plant growth index calculated or corrected in S109 in the storage unit 50 in association with the date and time information T acquired in S103, or the I / F unit 70.
  • the data is output to the outside through (S110).
  • the data describing the plant growth index at each position of the field is output to an image forming apparatus such as MFP (Multi-Functional Peripherals) so that the map of plant growth index can be printed or output to an external computer device. Make it possible to display a map of plant growth indicators.
  • MFP Multi-Functional Peripherals
  • the reflected light intensity is obtained in advance when each element of plant variety, planting interval, planting depth, plant coverage rate, soil condition, and water surface ratio is changed. Correction information is prepared and corrected when calculating a plant growth index using the reflected light intensity information of the measuring object obtained from the reflected light measuring device and the light intensity information of sunlight obtained from the sunlight measuring device.
  • At least one of the plant variety, planting interval, planting depth, plant coverage, soil condition, water surface ratio, among the correction information, the plant to be measured and the measurement target A correction amount for matching the reflected light intensity corresponding to at least one of the fields in which the plant is grown with the reflected light intensity corresponding to a predetermined reference is calculated, and the reflected light intensity of the measuring object is calculated using the calculated correction amount.
  • Correct and calculate plant growth index or correct The Rukoto, in the case of growing a plant of various properties in the field of various properties, it is possible to properly calculate the plant growth index.
  • the plant variety, planting interval, planting depth, plant coverage rate, soil condition, water surface ratio are exemplified as the correction information on plants and fields, but the correction information on plants and fields is not limited to these It is not limited to.
  • the third wavelength is the first wavelength
  • the fourth wavelength is the second wavelength
  • the sunlight measurement unit 30 measures the light intensity of sunlight at the third wavelength and the fourth wavelength.
  • the 3rd wavelength and the 4th wavelength are not limited to these.
  • the sunlight measurement unit 30 is an arbitrary third wavelength and fourth wavelength.
  • the light intensity of sunlight is measured by two wavelengths, and the light intensity of sunlight is calculated by calculating the light intensity of sunlight of the first wavelength and the second wavelength based on the wavelength characteristics of the light intensity of each light intensity.
  • Information may be output, and the control unit 40 (control device 13) may perform calculation for obtaining the NDVI value.
  • the NDVI value is obtained as the plant growth index, but, for example, RVI (Ratio Vegetation Index, Specific Vegetation Index), DVI (Difference Vegetation Index, Differential Vegetation Index), TVI (Transformed Vegetation Index)
  • RVI Rotary Vegetation Index
  • DVI Difference Vegetation Index
  • TVI Transformed Vegetation Index
  • IPVI Intelligent Vegetation Index
  • the present invention relates to a plant growth index calculation method for calculating a plant growth index using correction information on plants and fields, a plant growth index calculation program, a recording medium recording the plant growth index calculation program, and a plant growth index calculation system It is available.

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Abstract

L'invention concerne un procédé de calcul d'indice de croissance de plante, un programme de calcul d'indice de croissance de plante et un système de calcul d'indice de croissance de plante qui sont capables de calculer de manière appropriée un indice de croissance de plante qui indique le degré de croissance de plante. Ce système comprend : un dispositif de commande ; un dispositif de mesure de lumière de réflexion qui mesure l'intensité de la lumière de réflexion d'une cible de mesure ayant une pluralité de feuilles sur la base d'une instruction du dispositif de commande ; et un dispositif de mesure de lumière solaire qui mesure l'intensité lumineuse de la lumière solaire sur la base de l'instruction du dispositif de commande. Le dispositif de mesure de lumière de réflexion exécute un premier processus pour mesurer l'intensité de la lumière de réflexion de la cible de mesure à des première et seconde longueurs d'onde ; le dispositif de mesure de lumière solaire exécute un second processus pour mesurer l'intensité de lumière de la lumière solaire à des troisième et quatrième longueurs d'onde ; le dispositif de commande exécute un troisième processus pour calculer un indice de croissance de plante qui indique le degré de croissance de la cible de mesure à l'aide d'informations d'intensité de lumière de réflexion qui se rapportent à la cible de mesure et sont acquises par le dispositif de mesure de lumière de réflexion, et des informations d'intensité lumineuse qui se rapportent à la lumière solaire et sont acquises à partir du dispositif de mesure de lumière solaire. Dans le troisième processus, l'indice de croissance de plante est calculé par correction de l'intensité de lumière de réflexion de la cible de mesure sur la base d'informations de correction sur au moins une parmi la cible de mesure et un champ dans lequel la cible de mesure est développée.
PCT/JP2018/026850 2017-08-18 2018-07-18 Procédé de calcul d'indice de croissance de plante, programme de calcul d'indice de croissance de plante et système de calcul d'indice de croissance de plante WO2019035306A1 (fr)

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JP7075127B2 (ja) * 2019-02-22 2022-05-25 株式会社ナイルワークス 圃場分析方法、圃場分析プログラム、圃場分析装置、ドローンシステムおよびドローン
JP7185233B2 (ja) * 2019-06-07 2022-12-07 静岡県 植物群落透過光センサユニット及び植物の生育状態判定方法

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