WO2019028870A1 - 测试辅助装置 - Google Patents

测试辅助装置 Download PDF

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Publication number
WO2019028870A1
WO2019028870A1 PCT/CN2017/097187 CN2017097187W WO2019028870A1 WO 2019028870 A1 WO2019028870 A1 WO 2019028870A1 CN 2017097187 W CN2017097187 W CN 2017097187W WO 2019028870 A1 WO2019028870 A1 WO 2019028870A1
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WIPO (PCT)
Prior art keywords
test
carrier
light source
power mechanism
test board
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PCT/CN2017/097187
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English (en)
French (fr)
Inventor
谷志伟
侯忠良
李亮
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深圳市汇顶科技股份有限公司
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Application filed by 深圳市汇顶科技股份有限公司 filed Critical 深圳市汇顶科技股份有限公司
Priority to PCT/CN2017/097187 priority Critical patent/WO2019028870A1/zh
Publication of WO2019028870A1 publication Critical patent/WO2019028870A1/zh

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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition

Definitions

  • the present invention relates to the field of test equipment, and in particular, to a test auxiliary device.
  • the fingerprint sensor as a widely used sensor can realize automatic fingerprint collection; and the fingerprint sensor manufacturing technology is a high-tech with high comprehensiveness, high technical complexity and difficult manufacturing process.
  • CP/FT test is an essential production process for optical fingerprint sensor products
  • Chart test pattern quality test
  • the invention provides a test auxiliary device, which is required to be implemented by using different test devices when performing different Chart tests in the prior art, thereby increasing the complexity of the test process and improving the test cost. problem.
  • the invention provides a test auxiliary device, comprising: a test board, a carrier plate and a power mechanism connected with the light source;
  • the power mechanism is fixedly connected to the carrier for driving/moving the carrier relative to the light source;
  • At least a portion of the carrier is disposed at a lower end of the light source, and includes a plurality of And an adjustment area of the adjusting member, wherein the adjusting member is used for adjusting the light intensity passing through the carrier;
  • the test board is disposed at a lower end of the carrier, and corresponding to a position of the light source, the test board is provided with a through hole for allowing light to pass through; the test board is electrically connected to the device to be tested, The device to be tested is disposed under the test board for receiving light passing through the through hole to test the device to be tested through the test board.
  • a probe is disposed on the test board, and a contact point is disposed on the test object, and the probe is in contact with the contact point.
  • the power mechanism is connected to the light source through a transmission mechanism.
  • the transmission mechanism includes a first sliding component, and the power mechanism is movable up, down, left, and right relative to the light source by the first sliding component.
  • the transmission mechanism includes a second sliding component, and the power mechanism is movable up and down relative to the light source by the second sliding component.
  • the transmission mechanism further includes a telescopic member connected to the second sliding member, and the telescopic member is configured to adjust a distance between the power mechanism and the light source.
  • the device further includes a hood, and the hood is provided with a accommodating cavity for accommodating the test board, the carrier, and a power mechanism connected to the light source.
  • the power mechanism includes at least one of the following: a motor, a lead screw, and a worm gear.
  • the motor includes a housing, and the telescopic member is coupled to the housing.
  • the motor further includes an output shaft disposed inside the housing, and the output shaft is fixedly coupled to the carrier.
  • the motor further includes a motor control line disposed at an upper end of the housing, the motor control line for receiving a control signal for driving the motor to rotate.
  • the power mechanism is fixedly coupled to a center position of the carrier.
  • the carrier is ultra-thin glass.
  • the adjusting member is pasted on the carrier.
  • test board is a PCB board, and the PCB board is electrically connected to the test machine.
  • the adjusting component comprises at least one of the following: a preset pattern, an attenuating sheet.
  • the device to be tested includes a wafer.
  • the invention provides a test auxiliary device, which comprises a carrier plate comprising a plurality of adjustment regions, and the adjustment region can be used for carrying different adjustment members, and the power carrier drives the carrier plate relative to the light source.
  • the movement/rotation can effectively realize that different adjustment areas on the carrier can be set at the lower end of the light source, so that the test piece can perform different light intensity performance tests, and the same device can be used to perform the CP test/ Different Chart tests in the FT test effectively simplify the test process, save test cost, improve test efficiency, effectively ensure the practicability of the test aid, and facilitate market promotion and application.
  • FIG. 1 is a schematic structural diagram of a test auxiliary device according to an embodiment of the present invention.
  • FIG. 2 is a schematic structural diagram of still another test auxiliary device according to an embodiment of the present invention.
  • FIG. 3 is a schematic structural diagram of a carrier according to an embodiment of the present invention.
  • Test board 9. Test piece;
  • connection may be a fixed connection, a detachable connection, or an integral connection.
  • connection may be a fixed connection, a detachable connection, or an integral connection.
  • first and second are used merely to facilitate the description of different components, and are not to be construed as indicating or implying a sequence relationship, relative importance or implicit indication.
  • features defining “first” and “second” may include at least one of the features, either explicitly or implicitly.
  • CP test, Circuit Probing test also known as wafer test, refers to the needle test of each die on the wafer, and the probe is mounted with a gold wire to make a fine hair probe, and the die. The upper pad is contacted and tested for electrical characteristics. Unqualified dies are marked, and then when the wafer is diced into individual dies according to the die, the unqualified dies marked with marks will be Eliminate the next process, so as not to increase manufacturing costs.
  • Wafer testing is for the following three objectives: first, identify the qualified chip before the wafer is sent to the packaging factory; second, evaluate the characteristics of the device/circuit electrical parameters. Engineers need to monitor the distribution of parameters to maintain the quality level of the process; third, the chip's quality and defective product accounting will provide wafer producers with comprehensive performance feedback.
  • the FT test is to test the packaged chip after the CP test is passed, in order to filter the damaged chip.
  • Chart test Insert a pattern between the light source and the Senser to achieve a pattern quality test.
  • test auxiliary device includes: a test board 8, a carrier 7 and a power mechanism 6 connected to the light source 1;
  • the power mechanism 6 is fixedly connected to the carrier 7 for driving the carrier 7 to move relative to the light source 1 Rotating;
  • the light source 1 is a device structure that can emit light of a fixed light intensity, for example, an electric lamp.
  • the specific shape and structure of the power mechanism 6 are not limited, and those skilled in the art may set according to specific design requirements.
  • the power mechanism 6 may include at least one of the following: a motor, a screw, and a worm.
  • the power mechanism 6 when the power mechanism 6 is a motor, the power mechanism 6 is fixedly connected to the carrier 7 to drive the carrier 7 to rotate relative to the light source 1, so that the carrier 7 is between the light source 1 and the test board 8.
  • At least a portion of the carrier 7 is disposed at a lower end of the light source 1, and includes a plurality of adjustment regions that can be used to carry different adjustment members for adjusting the intensity of light passing through the carrier 7;
  • the specific shape and structure of the carrier 7 are not limited in this embodiment, and those skilled in the art can select and set according to the size of the light source 1 and the number of measurements of the device 9 to be tested, for example, specific to the carrier 7
  • the carrier 7 can be disposed in a rectangular structure, a circular structure, an elliptical structure, a triangular structure, or the like, as long as a plurality of adjustment regions can be disposed on the carrier 7;
  • the number of adjustment zones can be set according to specific design requirements.
  • the adjustment zone can be set to 3, 4, 5, 6 or more, etc. It should be noted that in order to meet the needs of different Chart tests.
  • the tray 7 is provided with at least two adjustment areas; further, the size of each adjustment area may be the same or different, since the power mechanism 6 can drive the carrier 7 to move/rotate relative to the light source 1, at this time, for convenience
  • the tray 7 is controlled and adjusted, and the carrier 7 can be arranged in a square structure as shown in FIG. 3.
  • the carrier 7 of the square structure is symmetrically arranged with four adjustment regions.
  • the adjustment areas a, the adjustment area b, the adjustment area c, and the adjustment area d are respectively the same size of the above adjustment areas; of course, those skilled in the art can also adjust the number and size of the adjustment areas according to specific design requirements. Arbitrary settings are not limited to the above examples.
  • the specific material of the carrier 7 and the adjusting member is not limited, and those skilled in the art can set according to specific design requirements.
  • the carrier 7 the light emitted by the light source 1 can pass through the carrier 7 . Therefore, the carrier 7 needs to be composed of a light-transmitting material.
  • the carrier 7 can be ultra-thin glass, wherein the ultra-thin glass generally refers to a glass having a thickness of 0.1 to 1.1 mm, which can effectively ensure light.
  • the quality and efficiency of passing through the carrier 7; and for the adjustment member, the adjustment member is used to adjust the intensity of light passing through the carrier 7, and thus, those skilled in the art can It is arbitrarily set according to the function of its implementation.
  • the adjusting member may include at least one of the following: a preset pattern, an attenuating sheet. It should be noted that different adjustment members may be provided on different adjustment regions of the carrier 7 , and the adjustment member may be disposed above or below the carrier 7; however, in order to avoid the thickness of the carrier 7 affecting the adjustment member For the effect of adjusting the light intensity, it is preferable that the adjusting member can be attached above the carrier 7.
  • the adjustment area a may be provided with a first preset pattern
  • the adjustment area b is provided with a first attenuation sheet
  • the adjustment area c is provided with a second preset pattern
  • the adjustment area d is provided with a second attenuation a sheet, wherein the first preset pattern is different from the second preset pattern, and the ability to adjust the light intensity is different; the first attenuating sheet is different from the second attenuating sheet, and the ability to adjust the light intensity is different;
  • the performance of 9 is accurately and efficiently tested to improve the accuracy of the test.
  • the test board 8 is disposed at the lower end of the carrier 7 and corresponds to the position of the light source 1.
  • the test board 8 is provided with a through hole for the light to pass through; the test board 8 is electrically connected with the test piece 9 and the test piece 9 It is disposed under the test board 8 for receiving light passing through the through hole to test the test piece 9 through the test board 8.
  • the test board 8 can receive the light emitted by the light source 1, and the received light can be irradiated to the device under test 9 through the through hole, so that the test object 9 can receive the light passing through the through hole, and further The test board 8 can be tested for the performance of the test piece 9.
  • the test board 8 can be a function board having a memory, and the test program can be stored in the memory; or the test board 8 can also be a PCB board, and the PCB board can be electrically connected to the test machine in the test machine.
  • a test program is stored to test the performance of the device to be tested 9 through the test program; in addition, for the test piece, it may be a wafer or a wafer, etc.
  • the method may be that the test board 8 is provided with a probe, and the contact point 9 is provided with a contact point, and the probe is in contact with the contact point. This can effectively and accurately test the performance of the device to be tested 9.
  • the test auxiliary device provided in this embodiment is provided with a carrier 7 including a plurality of adjustment regions, and the adjustment region can be used to carry different adjustment members, and the power tray 6 drives the carrier 7 to move/rotate relative to the light source 1 . It can be effectively realized that different adjustment areas on the carrier 7 can be set on The lower end of the light source 1 allows the test object 9 to perform different light intensity performance tests, thereby realizing different Chart tests in the CP test/FT test by the same device, which simplifies the test process and saves The test cost increases the test efficiency, effectively guarantees the practicability of the test aid, and is beneficial to the promotion and application of the market.
  • connection manner of the power mechanism 6 and the light source 1 is not limited in this embodiment, and those skilled in the art can set according to specific design requirements.
  • the power mechanism 6 can be connected to the light source 1 via a transmission mechanism 2.
  • the transmission structure may include a first sliding member 31 through which the power mechanism 6 is opposed to the light source through the first sliding member 31. 1 can move up, down, left and right.
  • the first sliding component 31 may include an upper glide path, a left and right sliding channel, and a slider disposed in the sliding channel.
  • the first sliding component 31 is required to realize the vertical movement of the power mechanism 6 and the light source 1
  • the The slider is locked on the left and right slides by the left and right locking mechanisms, so that the slider cannot move on the left and right slides, and can only move on the upper and lower slides;
  • the first sliding member 31 is required to realize the left and right of the power mechanism 6 and the light source 1
  • the slider can be locked on the upper glide path by the upper and lower locking mechanism, so that the slider can not move on the upper glide path, and can only move on the left and right slides.
  • the distance between the power mechanism 6 and the light source 1 and the upper and lower positions can be adjusted, so that the test assisting device can be applied to the light source 1 structure of different structure types and different sizes.
  • those skilled in the art can also set the first sliding component 31 to other specific structures, as long as the power mechanism 6 can be moved up and down and left and right relative to the light source 1 through the first sliding component 31, and no longer Narration.
  • the transmission mechanism 2 may include a second sliding member 32 through which the power mechanism 6 passes.
  • the sliding member 32 is movable up and down with respect to the light source 1.
  • the second sliding component 32 can include an upper glide path and a slider disposed in the sliding channel, and the vertical movement between the power mechanism 6 and the light source 1 can be realized by sliding the slider in the upper glide path.
  • the upper and lower positions between the power mechanism 6 and the light source 1 can be effectively adjusted by the provided transmission structure, so that the test auxiliary device can be applied to the structure of the light source 1 of different height sizes.
  • the transmission mechanism 2 may further include a telescopic member 4 connected to the second sliding member 32 for adjusting the distance between the power mechanism 6 and the light source 1.
  • the telescopic member 4 can be a spring or other device having a telescopic function; by providing the telescopic member 4 and the second sliding member 32, the distance between the power mechanism 6 and the light source 1 and the up and down position can be effectively adjusted. .
  • the transmission mechanism 2 can include a second sliding member 32 that can be adjusted in the vertical direction and a telescopic member 4 that can be adjusted in the horizontal direction, such that the adjustment is made by vertical and horizontal directions.
  • the test aid can be compatible with different light source 1 models and different sizes of product testing, further improving the scope of application of the test aid.
  • the specific connection manner of the power mechanism 6 and the telescopic member 4 and the carrier 7 is not limited in this embodiment, and those skilled in the art may
  • the power mechanism 6 is a motor
  • the motor may include a housing 12 to which the telescoping member 4 may be directly coupled.
  • the power mechanism 6 can be fixedly coupled to the center position of the carrier 7 for the manner in which the power mechanism 6 and the carrier 7 are connected.
  • the motor when the power mechanism 6 is a motor, the motor may further include an output shaft 13 disposed inside the casing 12, and the output shaft 13 is fixedly connected with the carrier 7; further, the output shaft 13 of the motor and the center of the carrier 7 The location is fixedly connected.
  • the motor may further include a motor control line 5 disposed at an upper end of the housing 12 for receiving a control signal for driving the motor to rotate.
  • the light source 1 can emit light of a fixed intensity.
  • the motor control line 5 receives the control signal, the output shaft 13 is driven to rotate, so that the output shaft 13 drives the carrier 7 fixedly connected to the output shaft 13 to rotate.
  • the outer casing of the motor remains fixed, thereby realizing the operation of the motor to drive the carrier 7 to rotate relative to the light source 1.
  • the carrier 7 can be rotated to a certain position below the light source 1, specifically, the load can be made At least one of the adjustment areas a/b/c/d of the disk 7 stays under the light source 1 as needed, and the light emitted by the light source 1 passes through the through holes of the carrier 7 and the test board 8 and then is irradiated to the device under test 9
  • the surface of the test piece 9 can be tested by the test board 8 connected to the test piece 9.
  • the adjustment can be performed by the expansion device and/or the second sliding member 32, thereby effectively improving the use of the test auxiliary device. Convenient and reliable.
  • the adjustment area of the carrier 7 stays at the light source 1 and the test board 8 according to requirements.
  • the preset pattern Chart or the attenuating sheet or the like may be disposed on the carrier 7 according to the test requirements.
  • attenuating sheets of different transmittances are selected, light of different intensities can be provided when the light source 1 of fixed light intensity is selected, which satisfies the requirement of switching light intensity in the actual test; and when a preset pattern is set on the carrier 7 Comparing the test results with Chart with the test results without Chart, this has a very important role in the testing of optical fingerprint sensors.
  • the test auxiliary device may further include a hood in order to further improve the accuracy of the test when testing the performance of the device 9 to be tested.
  • the hood 10 may have a circular or elliptical structure, and the hood 10 is provided with a receiving cavity 11 for accommodating the test board 8, the carrier 7 and the power connected to the light source 1. Agency 6. Through the hood 10 provided, the test process can be performed in the darkroom to avoid interference of external natural light, further improving the accuracy of the test.
  • the test auxiliary device provided by the application has the advantages of simple structure, low production cost, strong universal performance, flexible configuration, can be applied to CP/FT test, and can provide various Chart, attenuator and other switching, and the device 9 to be tested is ensured. Based on the accurate performance test, the practicality of the test aid is also effectively improved, which is beneficial to the promotion and application of the market.

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Abstract

一种测试辅助装置，包括：测试板（8）、载盘（7）以及与光源（1）相连接的动力机构；动力机构与载盘（7）固定连接，用于带动载盘（7）相对于光源（1）进行移动/转动；载盘（7）的至少一部分设置于光源（1）的下端，包括多个可用于承载不同调节件的调节区域，调节件用于调节穿过载盘（7）的光线强度；测试板（8）设置于载盘（7）的下端，且与光源（1）的位置相对应，测试板（8）上设置有用于供光线穿过的通孔；测试板（8）电连接有待测件（9），待测件（9）设置于测试板（8）的下方，用于接收穿过通孔的光线，以通过测试板（8）对待测件（9）进行测试。测试辅助装置，实现了在进行CP/FT测试中的不同Chart测试时，可采用同一个装置即可实现，有效地简化了测试流程，节约了测试成本，提高了测试效率。

Description

测试辅助装置 技术领域
本发明涉及测试设备技术领域，尤其涉及一种测试辅助装置。
背景技术
随着科学技术的飞速发展，传感器技术不断成熟，并且，传感器的应用领域和种类也越来越广多，其中，应用领域可以涉及工业、汽车、电子产品和零售自动化等等；而对于传感器的种类而言，通常根据传感器的基本感知功能可以分为热敏、光敏、气敏、力敏元件、磁敏、湿敏、声敏、放射线敏感、色敏和味敏等十大类型。
其中，指纹传感器作为一种应用较为广泛的传感器，可以实现指纹的自动采集；而指纹传感器的制造技术是一项综合性强、技术复杂度高、制造工艺难的高新技术。尤其是对于光学指纹传感器而言，CP/FT测试是光学指纹传感器产品必备的生产流程，而Chart测试(图案质量测试)是其中一个重要环节，目前，在进行不同的Chart测试时，需要利用不同的测试装置来实现，从而增加了测试流程的复杂程度，并且也提高了测试成本。
发明内容
本发明提供了一种测试辅助装置，针对现有技术中存在的在进行不同的Chart测试时，需要利用不同的测试装置来实现，从而增加了测试流程的复杂程度，并且也提高了测试成本的问题。
本发明提供了一种测试辅助装置，包括：测试板、载盘以及与光源相连接的动力机构；
所述动力机构与所述载盘固定连接，用于带动所述载盘相对于所述光源进行移动/转动；
所述载盘的至少一部分设置于所述光源的下端，包括多个可用于承载不 同调节件的调节区域，所述调节件用于调节穿过所述载盘的光线强度；
所述测试板设置于所述载盘的下端，且与所述光源的位置相对应，所述测试板上设置有用于供光线穿过的通孔；所述测试板电连接有待测件，所述待测件设置于所述测试板的下方，用于接收穿过所述通孔的光线，以通过所述测试板对所述待测件进行测试。
进一步的，所述测试板上设置有探针，所述待测件上设置有接触点，所述探针与所述接触点相接触。
进一步的，所述动力机构通过传动机构与所述光源相连接。
进一步的，所述传动机构包括第一滑动部件，所述动力机构通过所述第一滑动部件相对于所述光源可进行上下左右移动。
进一步的，所述传动机构包括第二滑动部件，所述动力机构通过所述第二滑动部件相对于所述光源可进行上下移动。
进一步的，所述传动机构还包括与所述第二滑动部件相连接的伸缩部件，所述伸缩部件用于调整所述动力机构与所述光源之间的距离。
进一步的，所述装置还包括遮光罩，所述遮光罩内设置有容纳腔，所述容纳腔用于容置所述测试板、载盘以及与光源相连接的动力机构。
进一步的，所述动力机构包括以下至少之一：电机、丝杠、蜗轮蜗杆。
进一步的，所述电机包括壳体，所述伸缩部件与所述壳体相连接。
进一步的，所述电机还包括设置于壳体内部的输出轴，所述输出轴与所述载盘固定连接。
进一步的，所述电机还包括设置于壳体上端的电机控制线，所述电机控制线用于接收驱动所述电机进行转动的控制信号。
进一步的，所述动力机构与所述载盘的中心位置固定连接。
进一步的，所述载盘为超薄玻璃。
进一步的，所述调节件粘贴在所述载盘的上方。
进一步的，所述测试板为PCB板，所述PCB板电连接有测试机。
进一步的，所述调节件包括以下至少之一：预设图案、衰减片。
进一步的，所述待测件包括晶圆。
本发明提供的测试辅助装置，通过设置的包括多个调节区域的载盘，并且调节区域可用于承载不同的调节件，通过动力机构带动载盘相对于光源进 行移动/转动，可以有效地实现载盘上不同的调节区域可以设置于光源的下端，从而对待测件可以进行不同光线强度的性能测试，实现了采用同一个装置即可完成在进行CP测试/FT测试中的不同Chart测试，有效地简化了测试流程，并且节约了测试成本，提高了测试效率，有效地保证了该测试辅助装置的实用性，有利于市场的推广与应用。
附图说明
图1为本发明实施例提供的一种测试辅助装置的结构示意图；
图2为本发明实施例提供的又一种测试辅助装置的结构示意图；
图3为本发明实施例提供的载盘的结构示意图。
图中：
1、光源；                                2、传动机构；
31、第一滑动部件；                       32、第二滑动部件；
4、伸缩部件；                            5、电机控制线；
6、动力机构；                            7、载盘；
8、测试板；                              9、待测件；
10、遮光罩；                             11、容纳腔；
12、壳体；                               13、输出轴。
具体实施方式
为使本发明实施例的目的、技术方案和优点更加清楚，下面将结合本发明实施例中的附图，对本发明实施例中的技术方案进行清楚、完整地描述，显然，所描述的实施例是本发明一部分实施例，而不是全部的实施例。基于本发明中的实施例，本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例，都属于本发明保护的范围。
在本发明中，术语“安装”、“连接”、“固定”等术语均应广义理解，例如，“连接”可以是固定连接，也可以是可拆卸连接，或一体地连接。对于本领域的普通技术人员而言，可以根据具体情况理解上述术语在本发明中的具体含义。
需要说明的是，在本发明的描述中，术语“第一”、“第二”仅用于方便描述不同的部件，而不能理解为指示或暗示顺序关系、相对重要性或者隐含指明所指示的技术特征的数量。由此，限定有“第一”、“第二”的特征可以明示或者隐含地包括至少一个该特征。
除非另有定义，本文所使用的所有的技术和科学术语与属于本发明的技术领域的技术人员通常理解的含义相同。本文中在本发明的说明书中所使用的术语只是为了描述具体的实施例的目的，不是旨在于限制本发明。
下面结合附图，对本发明的一些实施方式作详细说明。在各实施例之间不冲突的情况下，下述的实施例及实施例中的特征可以相互组合。
为了更加清楚地了解本申请的技术方案，下面对CP测试和FT测试进行简要说明：
CP测试，Circuit Probing测试，又称晶圆测试，是指对晶片上的每个晶粒进行针测，在检测头装上以金线制成细如毛发之探针(probe)，与晶粒上的接点(pad)接触，测试其电气特性，不合格的晶粒会被标上记号，而后当晶片依晶粒为单位切割成独立的晶粒时，标有记号的不合格晶粒会被洮汰，不再进行下一个制程，以免徒增制造成本。
晶圆测试是为了以下三个目标：第一，在晶圆送到封装工厂之前，鉴别出合格的芯片；第二，器件/电路的电性参数进行特性评估。工程师需要监测参数的分布状态来保持工艺的质量水平；第三，芯片的合格品与不良品的核算会给晶圆生产人员提供全面业绩的反馈。
FT测试是在CP测试通过之后，对封装好的chip来进行测试，目的是要把损坏的chip筛选出来。
Chart测试：在光源与Senser之间插入Chart(图案)，以实现图案质量测试。
图1为本发明实施例提供的一种测试辅助装置的结构示意图；结合上述陈述内容，参考附图1所示，本实施例提供了一种测试辅助装置，该测试辅助装置用于在进行CP测试/FT测试中的不同Chart测试时，简化测试流程，节约测试成本，具体的，该测试辅助装置包括：测试板8、载盘7以及与光源1相连接的动力机构6；
动力机构6与载盘7固定连接，用于带动载盘7相对于光源1进行移动/ 转动；光源1为可以发固定光强度的光的装置结构，例如，电灯。
其中，本实施例对于动力机构6的具体形状结构不做限定，本领域技术人员可以根据具体的设计需求进行设置，例如，动力机构6可以包括以下至少之一：电机、丝杠、蜗轮蜗杆。具体的，当动力机构6为电机时，通过该动力机构6与载盘7固定连接，可以带动载盘7相对于光源1进行转动，从而使载盘7处于光源1和测试板8之间的理想位置；当动力机构6为丝杠或者蜗轮蜗杆时，通过该动力机构6与载盘7固定连接，可以带动载盘7相对于光源1进行移动，从而使载盘7处于光源1和测试板8之间的理想位置。
载盘7的至少一部分设置于光源1的下端，包括多个可用于承载不同调节件的调节区域，调节件用于调节穿过载盘7的光线强度；
另外，本实施例对于载盘7的具体形状结构不做限定，本领域技术人员可以根据光源1的大小以及待测件9同测数的多少进行选择、设置，例如，对于载盘7的具体形状而言，可以将载盘7设置为矩形结构、圆形结构、椭圆形结构、三角形结构等等，只要能够使得载盘7上可以设置有多个调节区域即可；此外，本实施例中调节区域的数量可以根据具体的设计需求进行设置，例如，可以将调节区域设置为3个、4个、5个、6个或者更多等等，需要注意的是，为了满足不同Chart测试的需求，该载盘7上设置有至少两个调节区域；进一步的，各个调节区域的大小可以相同或不同，由于动力机构6可以带动载盘7相对于光源1进行移动/转动，此时，为了方便对载盘7进行控制与调节，可以将载盘7设置为如图3所示的方形结构，此时，方形结构的载盘7上对称设置有4个调节区域，分别为调节区域a、调节区域b、调节区域c以及调节区域d，上述的四个调节区域的大小相同；当然的，本领域技术人员还可以根据具体的设计需求对调节区域的数量以及大小进行任意设置，并不限于上述举例说明。
此外，对于载盘7以及调节件的具体材质不做限定，本领域技术人员可以根据具体的设计需求进行设置，其中，对于载盘7而言，由于光源1所发出的光线可以穿过载盘7，因此，该载盘7需要由透光材料构成，较为优选的，该载盘7可以为超薄玻璃，其中，超薄玻璃一般是指0.1～1.1mm厚度的玻璃，这样可以有效地保证光线穿过载盘7的质量和效率；而对于调节件而言，该调节件用于调节穿过载盘7的光线强度，因此，本领域技术人员可以 根据其实现的功能作用对其进行任意设置，较为优选的，该调节件可以包括以下至少之一：预设图案、衰减片。需要注意的是，在载盘7的不同调节区域上，可以设置有不同的调节件，并且，调节件可以设置于在载盘7的上方或者下方；然而，为了避免载盘7厚度影响调节件对光线强度进行调整的效果，较为优选的，调节件可以粘贴在载盘7的上方。
进一步的，参考附图3所示，在载盘7上设置有调节区域a、调节区域b、调节区域c以及调节区域d四个调节区域，若需要在上述各个调节区域内设置调节件，那么，可以将调节区域a上设置有第一预设图案，在调节区域b上设置有第一衰减片，在调节区域c上设置有第二预设图案，在调节区域d上设置有第二衰减片，其中，第一预设图案与第二预设图案不同，并且调节光线强度的能力不同；第一衰减片与第二衰减片不同，并且调节光线强度的能力不同；从而可以实现对待测件9的性能进行精确、有效地测试，提高了测试的精确度。
测试板8设置于载盘7的下端，且与光源1的位置相对应，测试板8上设置有用于供光线穿过的通孔；测试板8电连接有待测件9，待测件9设置于测试板8的下方，用于接收穿过通孔的光线，以通过测试板8对待测件9进行测试。
其中，测试板8可以接收到光源1所发出的光线，并且，接收到的光线可以穿过通孔照射到待测件9上，使得待测件9可以接收到穿过通孔的光线，进而可以测试板8对待测件9的性能进行测试。具体应用时，该测试板8可以为具有存储器的功能板，该存储器中可以存储有测试程序；或者，该测试板8也可以为PCB板，该PCB板可以电连接有测试机，测试机中存储有测试程序，以通过测试程序实现对待测件9性能的测试；另外，对于测试件而言，可以为晶圆或者晶片等等，进一步的，测试板8与待测件9电连接的实现方式可以为：测试板8上设置有探针，待测件9上设置有接触点，探针与接触点相接触。这样可以有效地实现对待测件9的性能进行准确、有效地测试。
本实施例提供的测试辅助装置，通过设置的包括多个调节区域的载盘7，并且调节区域可用于承载不同的调节件，通过动力机构6带动载盘7相对于光源1进行移动/转动，可以有效地实现载盘7上不同的调节区域可以设置于 光源1的下端，从而对待测件9可以进行不同光线强度的性能测试，实现了采用同一个装置即可完成在进行CP测试/FT测试中的不同Chart测试，有效地简化了测试流程，并且节约了测试成本，提高了测试效率，有效地保证了该测试辅助装置的实用性，有利于市场的推广与应用。
在上述实施例的基础上，继续参考附图1可知，本实施例对于动力机构6与光源1的连接方式不做限定，本领域技术人员可以根据具体的设计需求进行设置，较为优选的，该动力机构6可以通过传动机构2与光源1相连接。
其中，对于传动机构2的具体结构而言，一种可实现的方式为：参考附图1所示，该传动结构可以包括第一滑动部件31，动力机构6通过第一滑动部件31相对于光源1可进行上下左右移动。
具体的，该第一滑动部件31可以包括上下滑道、左右滑道以及设置于上述滑道中的滑块，当需要利用第一滑动部件31实现动力机构6与光源1的上下移动时，可以将滑块通过左右锁止机构在左右滑道上进行锁定，使得滑块不能在左右滑道上移动，只能在上下滑道上进行移动；当需要利用第一滑动部件31实现动力机构6与光源1的左右移动时，可以将滑块通过上下锁止机构在上下滑道上进行锁定，使得该滑块不能在上下滑道上进行移动，只能在左右滑道上进行移动。此时，可以对动力机构6与光源1之间的远近距离以及上下位置进行调节，这样使得该测试辅助装置可以适用于不同结构类型、不同尺寸的光源1结构。当然的，本领域技术人员还可以将第一滑动部件31设置为其他具体结构，只要能够使得该动力机构6可以通过第一滑动部件31相对于光源1进行上下左右移动即可，在此不再赘述。
此外，对于传动机构2的具体结构而言，还存在另一种可实现的方式，参考附图2所示，具体的，该传动机构2可以包括第二滑动部件32，动力机构6通过第二滑动部件32相对于光源1可进行上下移动。
具体的，该第二滑动部件32可以包括上下滑道以及设置于滑道内的滑块，通过滑块在上下滑道内进行滑动即可实现动力机构6与光源1之间的上下移动。此时，通过设置的传动结构，可以有效地对动力机构6与光源1之间的上下位置进行调节，从而可以使得该测试辅助装置可以适用于不同高度尺寸的光源1结构。
为了进一步提高该测试辅助装置的适用范围，继续参考附图2可知，该 传动机构2还可以包括与第二滑动部件32相连接的伸缩部件4，伸缩部件4用于调整动力机构6与光源1之间的距离。
其中，伸缩部件4可以为弹簧或者其他具有伸缩功能的装置；通过设置的伸缩部件4和第二滑动部件32，可以有效地实现对动力机构6与光源1之间的远近距离以及上下位置进行调节。
通过设置的传动机构2，具体的，该传动机构2可以包括可在垂直方向进行调节的第二滑动部件32和可在水平方向进行调节的伸缩部件4，通过垂直和水平方向的调整，使得该测试辅助装置可以兼容不同光源1型号、不同尺寸的产品测试，进一步提高了该测试辅助装置的适用范围。
在上述任意一个实施例的基础上，继续参考附图1或2可知，本实施例对于动力机构6与伸缩部件4、载盘7的具体连接方式不做限定，本领域技术人员可以根据具体的设计需求进行设置，其中，在动力机构6为电机时，该电机可以包括壳体12，伸缩部件4可以直接与壳体12相连接。进一步的，对于动力机构6与载盘7的连接方式而言，动力机构6可以与载盘7的中心位置固定连接。具体的，在动力机构6为电机时，电机还可以包括设置于壳体12内部的输出轴13，输出轴13与载盘7固定连接；进一步的，电机的输出轴13与载盘7的中心位置固定连接。在具体应用时，电机还可以包括设置于壳体12上端的电机控制线5，电机控制线5用于接收驱动电机进行转动的控制信号。
在测试过程中，光源1可以发出固定强度的光，在电机控制线5接收到控制信号之后，驱动输出轴13进行旋转，从而使得输出轴13带动与输出轴13固定连接的载盘7进行转动，而电机的外壳保持固定不动，从而实现了电机带动载盘7相对于光源1进行转动的操作，此时，载盘7转动可以到光源1下方的一定位置处，具体的，可以使得载盘7的调节区域a/b/c/d中的至少一个根据需要停留在光源1的正下方，光源1发射的光透过载盘7、测试板8上的通孔之后照射到待测件9的表面，通过与待测件9相连接的测试板8可以实现对待测件9性能的测试。其中，当电机需要连接不同结构类型的光源1或者调整光源1与电机之间的相对位置时，可以通过伸缩装置和/或第二滑动部件32进行调节，从而有效地提高了该测试辅助装置使用的方便可靠性。
需要注意的是，在载盘7的调节区域根据需求停留在光源1与测试板8 之间时，可根据测试需求在载盘7上设置有预设图案Chart或者衰减片等。当选择不同透光率的衰减片，在选定固定光强的光源1时能够提供不同强度的光，满足实际测试中切换光强的需求；而在载盘7上设置预设图案时，可以将有Chart的测试结果与无Chart情况下的测试结果进行对比，这在光学指纹传感器的测试中有着非常重要的作用。
进一步的，在上述任意一个实施例的基础上，继续参考附图1或2可知，在对待测件9的性能进行测试时，为了进一步提高测试的精确程度，该测试辅助装置还可以包括遮光罩10，该遮光罩10可以为圆形或者椭圆形结构，并且，该遮光罩10内设置有容纳腔11，容纳腔11用于容置测试板8、载盘7以及与光源1相连接的动力机构6。通过设置的遮光罩10，可以使得测试过程在暗室中进行，避免外界自然光的干扰，进一步提高了测试的准确性。
本申请提供的测试辅助装置，结构简单，制作成本低，通用性能强，配置灵活，可应用于CP/FT测试，并可以提供多种Chart、衰减片等切换，在保证了对待测件9的性能进行精确测试的基础上，还有效地提高了该测试辅助装置的实用性，有利于市场的推广与应用。
最后应说明的是：以上各实施例仅用以说明本发明的技术方案，而非对其限制；尽管参照前述各实施例对本发明进行了详细的说明，本领域的普通技术人员应当理解：其依然可以对前述各实施例所记载的技术方案进行修改，或者对其中部分或者全部技术特征进行等同替换；而这些修改或者替换，并不使相应技术方案的本质脱离本发明各实施例技术方案的范围。

Claims (16)

  1. 一种测试辅助装置，其特征在于，包括：测试板、载盘以及与光源相连接的动力机构；
    所述动力机构与所述载盘固定连接，用于带动所述载盘相对于所述光源进行移动/转动；
    所述载盘的至少一部分设置于所述光源的下端，包括多个可用于承载不同调节件的调节区域，所述调节件用于调节穿过所述载盘的光线强度；
    所述测试板设置于所述载盘的下端，且与所述光源的位置相对应，所述测试板上设置有用于供光线穿过的通孔；所述测试板电连接有待测件，所述待测件设置于所述测试板的下方，用于接收穿过所述通孔的光线，以通过所述测试板对所述待测件进行测试。
  2. 根据权利要求1所述的装置，其特征在于，所述测试板上设置有探针，所述待测件上设置有接触点，所述探针与所述接触点相接触。
  3. 根据权利要求1所述的装置，其特征在于，所述动力机构通过传动机构与所述光源相连接。
  4. 根据权利要求3所述的装置，其特征在于，所述传动机构包括第一滑动部件，所述动力机构通过所述第一滑动部件相对于所述光源可进行上下左右移动。
  5. 根据权利要求3所述的装置，其特征在于，所述传动机构包括第二滑动部件，所述动力机构通过所述第二滑动部件相对于所述光源可进行上下移动。
  6. 根据权利要求5所述的装置，其特征在于，所述传动机构还包括与所述第二滑动部件相连接的伸缩部件，所述伸缩部件用于调整所述动力机构与所述光源之间的距离。
  7. 根据权利要求1所述的装置，其特征在于，所述装置还包括遮光罩，所述遮光罩内设置有容纳腔，所述容纳腔用于容置所述测试板、载盘以及与光源相连接的动力机构。
  8. 根据权利要求6所述的装置，其特征在于，所述动力机构包括以下至少之一：电机、丝杠、蜗轮蜗杆。
  9. 根据权利要求8所述的装置，其特征在于，所述电机包括壳体，所述伸缩部件与所述壳体相连接。
  10. 根据权利要求9所述的装置，其特征在于，所述电机还包括设置于壳体内部的输出轴，所述输出轴与所述载盘固定连接。
  11. 根据权利要求9所述的装置，其特征在于，所述电机还包括设置于壳体上端的电机控制线，所述电机控制线用于接收驱动所述电机进行转动的控制信号。
  12. 根据权利要求1-11中任意一项所述的装置，其特征在于，所述动力机构与所述载盘的中心位置固定连接。
  13. 根据权利要求1-11中任意一项所述的装置，其特征在于，所述载盘为超薄玻璃。
  14. 根据权利要求1-11中任意一项所述的装置，其特征在于，所述调节件粘贴在所述载盘的上方。
  15. 根据权利要求1-11中任意一项所述的装置，其特征在于，所述测试板为PCB板，所述PCB板电连接有测试机。
  16. 根据权利要求1-11中任意一项所述的装置，其特征在于，所述调节件包括以下至少之一：预设图案、衰减片。
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CN203606103U (zh) * 2013-10-30 2014-05-21 湖南长步道光学科技有限公司 光学镜头的测试装置
CN203618088U (zh) * 2013-11-27 2014-05-28 深圳市华德森电子科技有限公司 一种检测设备
CN205449797U (zh) * 2015-12-09 2016-08-10 深圳市骏达光电股份有限公司 一种环境光孔透过率测试装置
CN205450430U (zh) * 2016-03-18 2016-08-10 东方宏海新能源科技发展有限公司 导光板和碟式聚光镜片调焦系统
CN106483688A (zh) * 2016-10-09 2017-03-08 京东方科技集团股份有限公司 一种显示面板测试设备及测试方法
CN207198869U (zh) * 2017-08-11 2018-04-06 深圳市汇顶科技股份有限公司 测试辅助装置

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5760748A (en) * 1996-05-28 1998-06-02 Trimble Navigation Limited Pivoting support bracket to mount a GPS antenna above a theodolite or a total station mounted on a tripod
CN203606103U (zh) * 2013-10-30 2014-05-21 湖南长步道光学科技有限公司 光学镜头的测试装置
CN203618088U (zh) * 2013-11-27 2014-05-28 深圳市华德森电子科技有限公司 一种检测设备
CN205449797U (zh) * 2015-12-09 2016-08-10 深圳市骏达光电股份有限公司 一种环境光孔透过率测试装置
CN205450430U (zh) * 2016-03-18 2016-08-10 东方宏海新能源科技发展有限公司 导光板和碟式聚光镜片调焦系统
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