WO2018232802A1 - 光配向装置及其去除光配向杂质的组件和方法 - Google Patents

光配向装置及其去除光配向杂质的组件和方法 Download PDF

Info

Publication number
WO2018232802A1
WO2018232802A1 PCT/CN2017/093070 CN2017093070W WO2018232802A1 WO 2018232802 A1 WO2018232802 A1 WO 2018232802A1 CN 2017093070 W CN2017093070 W CN 2017093070W WO 2018232802 A1 WO2018232802 A1 WO 2018232802A1
Authority
WO
WIPO (PCT)
Prior art keywords
light
alignment
alignment film
dust removing
removing mechanism
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/CN2017/093070
Other languages
English (en)
French (fr)
Inventor
宋彦君
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenzhen China Star Optoelectronics Semiconductor Display Technology Co Ltd
Original Assignee
Shenzhen China Star Optoelectronics Semiconductor Display Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenzhen China Star Optoelectronics Semiconductor Display Technology Co Ltd filed Critical Shenzhen China Star Optoelectronics Semiconductor Display Technology Co Ltd
Priority to US15/576,963 priority Critical patent/US10421105B2/en
Publication of WO2018232802A1 publication Critical patent/WO2018232802A1/zh
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1337—Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers
    • G02F1/13378—Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers by treatment of the surface, e.g. embossing, rubbing or light irradiation
    • G02F1/133788—Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers by treatment of the surface, e.g. embossing, rubbing or light irradiation by light irradiation, e.g. linearly polarised light photo-polymerisation
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1337—Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers
    • G02F1/13378—Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers by treatment of the surface, e.g. embossing, rubbing or light irradiation

Definitions

  • the present invention relates to the field of display technologies, and in particular, to a light alignment device and an assembly and method for removing light alignment impurities.
  • the liquid crystal is required to be aligned, and the initial arrangement of the liquid crystal molecules in the LCD is controlled, thereby precisely controlling the arrangement of the liquid crystal molecules in the LCD display process to achieve the display effect.
  • the existing alignment process generally adopts a photo-alignment method. As shown in FIG. 1, the light emitted from the light source 11 passes through the filter 12 and the polarizer 13 and becomes linear ultraviolet light. When the linear ultraviolet light is irradiated onto the alignment film 14 having the photosensitive agent, the portion of the alignment film 14 is irradiated. The molecular chain is broken, thereby producing small molecular impurities 15 .
  • a light transmissive glass 16 is generally disposed between the polarizer 13 and the alignment film 14 in the prior art, but as more and more impurities 15 are collected on the light transmissive glass 16, the light transmissive glass The light transmittance of 16 is getting lower and lower, which will inevitably affect the quality of light alignment.
  • the present invention provides a photo-alignment device and an assembly and method for removing photo-alignment impurities, which are capable of removing impurities generated by an alignment film during photo-alignment and ensuring optical alignment quality.
  • An assembly for removing light-aligning impurities includes a dust removing mechanism.
  • the dust removing mechanism is internally provided with a gas conveying pipe. One end of the gas conveying pipe is disposed above the alignment film, and the dust removing mechanism is used for the negative pressure difference. Under the action of the light distribution impurities into the gas pipeline.
  • An optical alignment device includes an assembly for removing light alignment impurities, the component for removing light alignment impurities includes a dust removing mechanism, and the dust removing mechanism is internally provided with a gas pipeline, and one end of the gas pipeline is spaced apart from Above the alignment film, the dust removal mechanism is used to draw light into the gas pipeline under the action of a negative pressure difference.
  • the dust removing mechanism is disposed above the alignment film such that one end of the gas pipeline disposed inside the dust removing mechanism is disposed above the alignment film;
  • the dust removing mechanism sucks the light into the gas pipeline under the action of the negative pressure difference.
  • the present invention can remove the impurities generated by the alignment film in the photo-alignment process by the dust-removing mechanism, and can remove the impurities generated by the alignment film in the photo-alignment process, and avoid the accumulation of these impurities in the direction of the ultraviolet light of the polarized light, thereby ensuring the optical alignment quality.
  • FIG. 1 is a cross-sectional view showing the structure of a prior art optical alignment device
  • Figure 2 is a cross-sectional view showing the structure of an optical alignment device according to an embodiment of the present invention.
  • Figure 3 is a cross-sectional view showing the structure of a light alignment device according to another embodiment of the present invention.
  • FIG. 4 is a schematic flow chart of an embodiment of a method for removing light alignment impurities according to the present invention.
  • the light alignment device 20 may include a light reflecting plate 21, a light source 22, a filter 23, a polarizing plate 24, an alignment film 25, and an assembly 26 for removing light alignment impurities.
  • Light source 22 can be used to emit ultraviolet light.
  • the reflector 21 is used to reflect the ultraviolet light away from the alignment film 25, so that the ultraviolet light is reflected and then directed to the alignment film 25 to improve the utilization of ultraviolet light.
  • the filter 23 is disposed under the light source 22 for adjusting the wavelength of the ultraviolet light such that ultraviolet light of a predetermined wavelength (for example, 200 to 500 nm) enters the polarizer 24.
  • a predetermined wavelength for example, 200 to 500 nm
  • the polarizer 24 is disposed under the filter 23, and the polarizer 24 is used to obtain linear ultraviolet light to be based on IPS (In-Plane) Switching, Transverse Electric Field Effect Display) Technology and FFS (Fringe Field Switching, As an example of the photo-alignment process of the fringe field switch technology, the polarizer 24 allows only the ultraviolet light parallel to the polarizer 24 to pass.
  • IPS In-Plane
  • FFS Frringe Field Switching
  • the alignment film 25 includes a high molecular polymer such as PI (Polyimide, Polyimide), after the high molecular weight polymer is irradiated by the linear ultraviolet light, a long bond molecule is formed, so that the alignment film 25 has an anisotropy, and the liquid crystal molecules are arranged along the molecular direction of the long bond, thereby realizing light alignment.
  • PI Polyimide, Polyimide
  • the assembly for removing light-aligning impurities (hereinafter referred to as assembly) 26 may include a dust removing mechanism 261 and a dust collecting mechanism 262.
  • the inside of the dust removing mechanism 261 is provided with a gas transmission pipe that is open at both ends, and one end of the gas transmission pipe is disposed above the alignment film 25 at intervals.
  • the dust collecting mechanism 262 is internally provided with a storage space that communicates with the other end of the gas transmission pipe.
  • the ultraviolet light emitted from the light source 22 passes through the filter 23 and the polarizer 24, and becomes linear ultraviolet light.
  • the alignment film 25 After the linear ultraviolet light is irradiated to the alignment film 25 having the photosensitive agent, the alignment film 25 is disposed. Part of the molecular chain is broken, thereby producing small molecular impurities, which may be referred to as photoalignment impurities 27.
  • the dust removing mechanism 261 sucks the light distribution impurity 27 into the gas transmission pipe by the negative pressure difference, and then the light distribution impurity 27 enters the storage space of the dust collecting mechanism 262 from the other end of the gas transmission pipe.
  • the interior of the dust removing mechanism 261 may be provided with a fan impeller and an electric motor.
  • the blades of the fan impeller continuously work on the air, so that the air in the corresponding area of the blade is discharged from the other end of the gas transmission pipe (the rear end of the fan impeller) at a very high speed, so that the inside of the gas transmission pipe is formed.
  • Instantaneous vacuum while the air at one end of the gas pipeline (the front end of the fan impeller) is continuously replenished into the impeller, and the inside of the gas pipeline forms a relatively high negative pressure difference with the outside atmospheric pressure.
  • the light distribution impurity 27 at one end of the gas transmission pipe enters the gas transmission pipe with the gas flow, and then passes through the filter inside the dust collecting mechanism 262, and the light distribution impurity 27 remains in the dust collecting mechanism 262. Inside the storage space, the air is filtered and discharged.
  • the assembly 26 of the present embodiment is capable of removing the light-aligning impurities 27 generated by the alignment film 25 in the photo-alignment process, thereby preventing the light-aligning impurities 27 from accumulating in the direction of the polarized ultraviolet light, thereby ensuring the utilization of the ultraviolet light, thereby ensuring the utilization of the ultraviolet light.
  • Light alignment quality is capable of removing the light-aligning impurities 27 generated by the alignment film 25 in the photo-alignment process, thereby preventing the light-aligning impurities 27 from accumulating in the direction of the polarized ultraviolet light, thereby ensuring the utilization of the ultraviolet light, thereby ensuring the utilization of the ultraviolet light.
  • the light alignment device 30 may include a light reflecting plate 31, a light source 32, a filter 33, a polarizer 34, an alignment film 35, and an assembly 36 for removing light alignment impurities.
  • the structural components of the optical alignment device 30 can be the same as those of the optical alignment device 20, and the functions of the various structural components of the optical alignment device 30 can be referred to the above, and will not be described herein. .
  • the component 36 for removing light-aligning impurities of the present embodiment includes not only the dust removing mechanism 361 and the dust collecting mechanism 362 but also the light sensor 363 and the moving mechanism 364 connected to the dust removing mechanism 361.
  • the photo sensor 363 is used to detect whether the alignment film 35 is irradiated with ultraviolet light.
  • the moving mechanism 364 is used to control the movement of the dust removing mechanism 361.
  • the moving mechanism 364 may be an electric motor that controls the dust removing mechanism 361 at the upper edge of the alignment film 35. Simultaneously moving in the direction parallel to the alignment film 35, at the same time, one end of the gas supply duct inside the dust removing mechanism 361 moves in a direction parallel to the alignment film 35, so that the light alignment impurity 37 can be removed in time.
  • the dust removing mechanism 361 may be provided with a control element 365 at one end of the gas transmission pipe, and the control element 365 is connected to the light sensor 363 and used to control the conduction and the cutoff of the gas pipeline according to the detection result of the light sensor 363.
  • the control element 365 can control the gas pipeline to be cut off, the moving mechanism 364 controls the dust removing mechanism 361 not to move, and the motor and the fan impeller inside the dust removing mechanism 361 are stopped.
  • the control element 365 controls the gas conduit to be turned on, and the moving mechanism 364 controls the dust removing mechanism 361 to move.
  • the dust removing mechanism 261 In the movement of the dust removing mechanism 361, in order to prevent the dust removing mechanism 261 from hitting the alignment film 25 and the PI in the intake alignment film 25 due to various shaking, the dust removing mechanism 261 is provided with the dust removing mechanism 261.
  • One end of the pipe has a predetermined distance from the alignment film 35, and for example, the predetermined distance may be 5 to 400 mm.
  • FIG. 4 illustrates a method for removing light alignment impurities according to an embodiment of the present invention.
  • the method of removing light alignment impurities may include steps S41 to S42.
  • the dust removing mechanism is disposed above the alignment film such that one end of the gas pipeline disposed inside the dust removing mechanism is disposed above the alignment film.
  • the dust removing mechanism may be connected with a dust collecting mechanism that communicates with the other end of the gas conveying pipe.
  • the optical alignment impurity 27 enters the storage space of the dust collecting mechanism 262 from the other end of the gas transmission pipe.
  • the dust removing mechanism may be connected with a moving mechanism, and the moving mechanism is connected with a light sensor.
  • the light sensor detects whether the alignment film is irradiated with ultraviolet light. If the light sensor detects that the alignment film is irradiated with ultraviolet light, while the step S42 is performed, the moving mechanism controls the movement of the dust removing mechanism such that one end of the gas conveying pipe moves in a direction parallel to the alignment film.
  • the dust removing mechanism may be provided with a control component at one end of the gas pipeline, and the control component is connected with the light sensor, and the control component controls the conduction and the cutoff of the gas pipeline according to the detection result of the light sensor.
  • the control element can control the gas pipeline to be cut off, the moving mechanism controls the dust removing mechanism not to move, the dust removing mechanism stops sucking the light alignment impurity; when the light sensor detects the alignment
  • the control element controls the gas pipeline to be turned on, the dust removing mechanism sucks the light to the impurity, and the moving mechanism controls the movement of the dust removing mechanism.
  • the method of the present embodiment can be based on the above-described components 20, 30 for removing light-aligned impurities, and thus has the same advantageous effects.

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Mathematical Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Liquid Crystal (AREA)

Abstract

一种光配向装置及其去除光配向杂质的组件(26)和方法，该组件(26)包括除尘机构(261)，除尘机构(261)的内部设置有输气管道，输气管道的一端间隔设置于配向膜(25)的上方，除尘机构(261)用于在负压差的作用下将光配向杂质(27)吸入输气管道内。

Description

光配向装置及其去除光配向杂质的组件和方法
【技术领域】
本发明涉及显示技术领域，具体涉及一种光配向装置及其去除光配向杂质的组件和方法。
【背景技术】
在LCD（Liquid Crystal Display, 液晶显示装置）的制造过程中需要对液晶进行配向制程，控制液晶分子在LCD中的初始排列方式，从而精确控制液晶分子在LCD显示过程中的排列方式，以实现显示效果。现有的配向制程一般采用光配向方法。结合图1所示，光源11发出的光经过滤光片12和偏光片13后变为线偏极紫外光，线偏极紫外光照射到具有感光剂的配向膜14时，配向膜14的部分分子链断裂，从而产生小分子杂质15。这些杂质15会在LCD显示时形成异物型亮点，影响LCD的显示品质。为了避免这些杂质15进入LCD内部，现有技术一般在偏光片13和配向膜14之间设置一透光玻璃16，但是随着透光玻璃16上聚集的杂质15越来越多，透光玻璃16的光穿透率越来越低，势必会影响光配向品质。
【发明内容】
鉴于此，本发明提供一种光配向装置及其去除光配向杂质的组件和方法，能够去除光配向过程中配向膜产生的杂质，确保光配向品质。
本发明一实施例的去除光配向杂质的组件，包括除尘机构，所述除尘机构的内部设置有输气管道，输气管道的一端间隔设置于配向膜的上方，除尘机构用于在负压差的作用下将光配向杂质吸入输气管道内。
本发明一实施例的光配向装置，包括去除光配向杂质的组件，所述去除光配向杂质的组件包括除尘机构，所述除尘机构的内部设置有输气管道，输气管道的一端间隔设置于配向膜的上方，除尘机构用于在负压差的作用下将光配向杂质吸入输气管道内。
本发明一实施例的去除光配向杂质的方法，包括：
将除尘机构设置于配向膜的上方，使得除尘机构内部设置的输气管道的一端间隔设置于配向膜的上方；
除尘机构在负压差的作用下将光配向杂质吸入输气管道内。
有益效果：本发明通过除尘机构将光配向杂质吸入输气管道内，能够去除光配向过程中配向膜产生的杂质，并且避免这些杂质在线偏极紫外光的照射方向上聚集，从而确保光配向品质。
【附图说明】
图1是现有技术的光配向装置的结构剖示图；
图2是本发明一实施例的光配向装置的结构剖示图；
图3是本发明另一实施例的光配向装置的结构剖示图；
图4是本发明去除光配向杂质的方法一实施例的流程示意图。
【具体实施方式】
下面将结合本发明实施例中的附图，对本发明所提供的各个示例性的实施例的技术方案进行清楚、完整地描述。在不冲突的情况下，下述各个实施例及其技术特征可以相互组合。
请参阅图2，为本发明一实施例的光配向装置。所述光配向装置20可以包括反光板21、光源22、滤光片23、偏光片24、配向膜25以及去除光配向杂质的组件26。
光源22可用于发出紫外光。
反光板21用于对远离配向膜25的紫外光进行反射，使得紫外光经过反射后照向配向膜25，提高紫外光利用率。
滤光片23设置于光源22的下方，用于调整紫外光的波长，使得预定波长（例如200~500纳米）的紫外光进入偏光片24。
偏光片24设置于滤光片23的下方，偏光片24用于获取线偏极紫外光，以基于IPS（In-Plane Switching, 横向电场效应显示）技术和FFS（Fringe Field Switching, 边缘场开关）技术的光配向制程为例，偏光片24仅允许平行于偏光片24的紫外光通过。
配向膜25包括高分子聚合物，例如PI（Polyimide, 聚酰亚胺），高分子聚合物被线偏极紫外光照射之后会形成长键分子，使得配向膜25具有异方性，液晶分子会沿着长键分子方向排列，从而实现光配向。
所述去除光配向杂质的组件（下文简称组件）26可以包括除尘机构261和集尘机构262。除尘机构261的内部设置有两端开口的输气管道，输气管道的一端间隔设置于配向膜25的上方。集尘机构262的内部设置有存储空间，该存储空间与输气管道的另一端连通。
在光配向制程中，光源22发出的紫外光经过滤光片23和偏光片24之后变为线偏极紫外光，线偏极紫外光照射到具有感光剂的配向膜25之后，配向膜25中的部分分子链断裂，从而产生小分子杂质，这些小分子杂质可称为光配向杂质27。此时，除尘机构261在负压差的作用下将光配向杂质27吸入输气管道内，而后，光配向杂质27从输气管道的另一端进入集尘机构262的存储空间。
在本发明一实施例中，除尘机构261的内部可以设置有风机叶轮和电动机。在电动机的高速驱动下，风机叶轮的叶片不断对空气做功，使得叶片对应区域中的空气以极高的速度从输气管道的另一端（风机叶轮的后端）排出，使得输气管道内部形成瞬时真空，同时输气管道的一端（风机叶轮的前端）的空气不断地补充入叶轮中，输气管道的内部与外界大气压形成一个相当高的负压差。在此负压差的作用下，位于输气管道的一端处的光配向杂质27随气流进入输气管道，而后在集尘机构262内部经过过滤器，光配向杂质27留在集尘机构262的存储空间内，而空气经过滤后排出。
基于上述，本实施例的组件26能够去除光配向制程中配向膜25产生的光配向杂质27，避免光配向杂质27在线偏极紫外光的照射方向上聚集，确保紫外光的利用率，从而确保光配向品质。
请参阅图3，为本发明另一实施例的光配向装置。所述光配向装置30可以包括反光板31、光源32、滤光片33、偏光片34、配向膜35以及去除光配向杂质的组件36。其中，除去除光配向杂质的组件36之外，光配向装置30的各个结构元件可以与上述光配向装置20的相同，光配向装置30的各个结构元件的作用可参阅上述，此处不再赘述。
与图2所示实施例不同的是，本实施例的去除光配向杂质的组件36不仅包括除尘机构361和集尘机构362，还包括光感应器363以及与除尘机构361连接的移动机构364。
在光配向制程中，光感应器363用于检测配向膜35是否被紫外光照射。在光感应器363检测到配向膜35被紫外光照射时，移动机构364用于控制除尘机构361移动，具体地，移动机构364可以为电动马达，其控制除尘机构361在配向膜35的上方沿平行于配向膜35的方向移动，与此同时，除尘机构361内部输气管道的一端沿平行于配向膜35的方向移动，从而能够及时的去除光配向杂质37。
进一步地，除尘机构361可以在输气管道的一端设置控制元件365，该控制元件365与光感应器363连接，并用于根据光感应器363的检测结果控制输气管道的导通和截止。其中，当光感应器363检测到配向膜35未被紫外光照射时，控制元件365可以控制输气管道截止，移动机构364控制除尘机构361不移动，除尘机构361内部的电动机和风机叶轮停止运行；当光感应器363检测到配向膜35被紫外光照射时，控制元件365控制输气管道导通，移动机构364控制除尘机构361移动。
在除尘机构361的移动过程中，为了避免除尘机构261因各种晃动撞向配向膜25、吸入配向膜25中的PI等影响光配向品质的因素，本实施例设置除尘机构261（的输气管道的一端）与配向膜35之间具有预定距离，例如，该预定距离可以为5~400毫米。
请参阅图4，为本发明一实施例的去除光配向杂质的方法。所述去除光配向杂质的方法可以包括步骤S41~S42。
S41：将除尘机构设置于配向膜的上方，使得除尘机构内部设置的输气管道的一端间隔设置于配向膜的上方。
S42：除尘机构在负压差的作用下将光配向杂质吸入输气管道内。
在光配向制程之前，除尘机构可以连接有集尘机构，该集尘机构与输气管道的另一端连通。在光配向制程中，光配向杂质27从输气管道的另一端进入集尘机构262的存储空间。
另外，除尘机构还可以连接有移动机构，移动机构连接有光感应器。在步骤S42之前，光感应器检测配向膜是否被紫外光照射。若光感应器检测到配向膜被紫外光照射，则在执行步骤S42的同时，移动机构控制除尘机构移动，使得输气管道的一端沿平行于配向膜的方向移动。
其中，除尘机构的在输气管道的一端可以设置控制元件，该控制元件与光感应器连接，根据光感应器的检测结果，控制元件控制输气管道的导通和截止。具体地，当光感应器检测到配向膜未被紫外光照射时，控制元件可以控制输气管道截止，移动机构控制除尘机构不移动，除尘机构停止吸入光配向杂质；当光感应器检测到配向膜被紫外光照射时，控制元件控制输气管道导通，除尘机构吸入光配向杂质，移动机构控制除尘机构移动。
本实施例的方法可以基于上述去除光配向杂质的组件20、30，因此具有与其相同的有益效果。
以上所述仅为本发明的实施例，并非因此限制本发明的专利范围，凡是利用本发明说明书及附图内容所作的等效结构或等效流程变换，例如各实施例之间技术特征的相互结合，或直接或间接运用在其他相关的技术领域，均同理包括在本发明的专利保护范围内。

Claims (14)

  1. 一种去除光配向杂质的组件，所述光配向杂质包括配向膜在液晶显示面板的光配向制程中产生的杂质，其中，所述组件包括除尘机构，所述除尘机构的内部设置有输气管道，所述输气管道的一端间隔设置于所述配向膜的上方，所述除尘机构用于在负压差的作用下将所述光配向杂质吸入所述输气管道内。
  2. 根据权利要求1所述的组件，其中，所述组件还包括集尘机构，所述集尘机构与所述输气管道的另一端连通。
  3. 根据权利要求1所述的组件，其中，所述组件还包括光感应器以及与所述除尘机构连接的移动机构，所述光感应器用于检测所述配向膜是否被紫外光照射，在所述光感应器检测到所述配向膜被紫外光照射时，所述移动机构用于控制所述除尘机构移动，使得所述输气管道的一端沿平行于所述配向膜的方向移动。
  4. 根据权利要求3所述的组件，其中，所述除尘机构包括设置于所述输气管道一端的控制元件，所述控制元件与所述光感应器连接，并用于根据光感应器的检测结果控制所述输气管道的导通和截止。
  5. 根据权利要求1所述的组件，其中，所述输气管道的一端与所述配向膜的间距为5~400毫米。
  6. 一种光配向装置，其中，所述光配向装置包括去除光配向杂质的组件，所述光配向杂质包括配向膜在液晶显示面板的光配向制程中产生的杂质，所述组件包括除尘机构，所述除尘机构的内部设置有输气管道，所述输气管道的一端间隔设置于所述配向膜的上方，所述除尘机构用于在负压差的作用下将所述光配向杂质吸入所述输气管道内。
  7. 根据权利要求6所述的光配向装置，其中，所述组件还包括集尘机构，所述集尘机构与所述输气管道的另一端连通。
  8. 根据权利要求6所述的光配向装置，其中，所述组件还包括光感应器以及与所述除尘机构连接的移动机构，所述光感应器用于检测所述配向膜是否被紫外光照射，在所述光感应器检测到所述配向膜被紫外光照射时，所述移动机构用于控制所述除尘机构移动，使得所述输气管道的一端沿平行于所述配向膜的方向移动。
  9. 根据权利要求8所述的光配向装置，其中，所述除尘机构包括设置于所述输气管道一端的控制元件，所述控制元件与所述光感应器连接，并用于根据光感应器的检测结果控制所述输气管道的导通和截止。
  10. 根据权利要求6所述的光配向装置，其中，所述输气管道的一端与所述配向膜的间距为5~400毫米。
  11. 一种去除光配向杂质的方法，所述光配向杂质包括配向膜在液晶显示面板的光配向制程中产生的杂质，其中，所述方法包括：
    将除尘机构设置于所述配向膜的上方，使得所述除尘机构内部设置的输气管道的一端间隔设置于所述配向膜的上方；
    所述除尘机构在负压差的作用下将所述光配向杂质吸入所述输气管道内。
  12. 根据权利要求11所述的方法，其中，在所述光配向制程之前，所述方法还包括：
    在所述输气管道的另一端连通一集尘机构。
  13. 根据权利要求11所述的方法，其中，所述除尘机构连接有移动机构，所述移动机构连接有光感应器，
    所述除尘机构在负压差的作用下将所述光配向杂质吸入所述输气管道内之前，所述方法还包括：
    所述光感应器检测所述配向膜是否被紫外光照射；
    若所述光感应器检测到所述配向膜被紫外光照射，则在所述除尘机构在负压差的作用下将所述光配向杂质吸入所述输气管道内的同时，所述方法还包括：
    所述移动机构控制所述除尘机构移动，使得所述输气管道的一端沿平行于所述配向膜的方向移动。
  14. 根据权利要求13所述的方法，其中，所述除尘机构包括设置于所述输气管道一端的控制元件，所述控制元件与所述光感应器连接，并根据光感应器的检测结果控制所述输气管道的导通和截止。
PCT/CN2017/093070 2017-06-19 2017-07-17 光配向装置及其去除光配向杂质的组件和方法 Ceased WO2018232802A1 (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US15/576,963 US10421105B2 (en) 2017-06-19 2017-07-17 Light alignment device, assembly and method for removing light alignment impurities

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201710463534.1 2017-06-19
CN201710463534.1A CN107121845A (zh) 2017-06-19 2017-06-19 光配向装置及其去除光配向杂质的组件和方法

Publications (1)

Publication Number Publication Date
WO2018232802A1 true WO2018232802A1 (zh) 2018-12-27

Family

ID=59718560

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2017/093070 Ceased WO2018232802A1 (zh) 2017-06-19 2017-07-17 光配向装置及其去除光配向杂质的组件和方法

Country Status (2)

Country Link
CN (1) CN107121845A (zh)
WO (1) WO2018232802A1 (zh)

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000107715A (ja) * 1998-10-07 2000-04-18 Sharp Corp 基板クリーニング装置
JP2004078244A (ja) * 1997-01-08 2004-03-11 Seiko Epson Corp 基板のラビング方法及びラビング装置
CN1645194A (zh) * 2004-01-19 2005-07-27 Nec液晶技术株式会社 制造液晶显示设备的方法
CN101840110A (zh) * 2009-03-20 2010-09-22 北京京东方光电科技有限公司 液晶显示装置用摩擦装置
CN103676329A (zh) * 2013-12-20 2014-03-26 深圳市华星光电技术有限公司 液晶光配向设备

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005189788A (ja) * 2003-12-25 2005-07-14 Mikuni Denshi Kk 配向処理装置と配向膜
CN102662273A (zh) * 2012-05-11 2012-09-12 昆山天卓贸易有限公司 一种配向微尘清洁装置
CN203299496U (zh) * 2013-05-27 2013-11-20 京东方科技集团股份有限公司 一种摩擦取向装置
CN105093699A (zh) * 2015-09-02 2015-11-25 武汉华星光电技术有限公司 一种光配向装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004078244A (ja) * 1997-01-08 2004-03-11 Seiko Epson Corp 基板のラビング方法及びラビング装置
JP2000107715A (ja) * 1998-10-07 2000-04-18 Sharp Corp 基板クリーニング装置
CN1645194A (zh) * 2004-01-19 2005-07-27 Nec液晶技术株式会社 制造液晶显示设备的方法
CN101840110A (zh) * 2009-03-20 2010-09-22 北京京东方光电科技有限公司 液晶显示装置用摩擦装置
CN103676329A (zh) * 2013-12-20 2014-03-26 深圳市华星光电技术有限公司 液晶光配向设备

Also Published As

Publication number Publication date
CN107121845A (zh) 2017-09-01

Similar Documents

Publication Publication Date Title
TWI333092B (zh)
JP2015093827A (ja) 切断集塵装置及び切断方法
CN101825780B (zh) 液晶面板周边残材检出和去除的装置及其方法
CN105467777A (zh) 曝光机及光罩洁净设备
CN108554846A (zh) 环保机械手分拣垃圾装置
WO2009088013A1 (ja) 光学表示ユニットの製造システムおよび搬送機構
CN201145792Y (zh) 液晶显示屏取放装置
CN101634768A (zh) 液晶显示屏取放装置
WO2018232802A1 (zh) 光配向装置及其去除光配向杂质的组件和方法
WO2013010347A1 (zh) 一种检测吸嘴故障的方法及其装置
CN205333544U (zh) 玻璃基板的颗粒检查系统
CN206588103U (zh) 一种背光源除尘装置
JP2000288483A (ja) 長尺状可撓性シートの除塵方法
CN109304333A (zh) 一种背光源光学膜除尘装置
CN202886295U (zh) 破损检测装置
CN208037187U (zh) 一种新型服务器触摸屏固定装置
CN105600446A (zh) 基板缓存装置
CN217731978U (zh) 一种光学透镜生产输送机构
CN107272329B (zh) 掩膜版清洁装置
CN216066136U (zh) 一种3d玻璃夹紧治具
WO2014047971A1 (zh) 玻璃基板切割机的防尘方法
CN102092170A (zh) 离型膜回收装置及回收方法
CN201867499U (zh) 一种电池叠片机的极片检测装置
US7895704B2 (en) Apparatus of cleaning rubbing-cloth
CN207789727U (zh) 一种高速列车组外风挡的快速贴膜装置

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 17914222

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 17914222

Country of ref document: EP

Kind code of ref document: A1