WO2018218906A1 - 太阳电池光衰测试的快速制样设备 - Google Patents

太阳电池光衰测试的快速制样设备 Download PDF

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WO2018218906A1
WO2018218906A1 PCT/CN2017/113855 CN2017113855W WO2018218906A1 WO 2018218906 A1 WO2018218906 A1 WO 2018218906A1 CN 2017113855 W CN2017113855 W CN 2017113855W WO 2018218906 A1 WO2018218906 A1 WO 2018218906A1
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electrode plate
lower electrode
longitudinal
decay test
sample preparation
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PCT/CN2017/113855
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English (en)
French (fr)
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任常瑞
王敏
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常州时创能源科技有限公司
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10—Measuring as part of the manufacturing process
    • H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10—Measuring as part of the manufacturing process
    • H01L22/14—Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means

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  • the invention relates to a rapid sample preparation device for solar cell light decay test.
  • the solar cell light decay test generally uses a process of first performing light treatment on the battery sheet, and obtaining light decay data by comparing the battery efficiency before and after the illumination.
  • the illumination test is illuminated by light, and the illumination time is generally long.
  • the illumination of the p-type battery is generally between 6 and 24 hours, while the illumination of the n-type battery may take 48 hours or even 240 hours or more.
  • Long-term exposure results in a long light decay test period and high energy consumption during the light decay test process (generally greater than 100 W/piece).
  • the process variation of the production line and the batch variation of the silicon wafer have a great influence on the light decay rate of the battery, and the components require the customer to have stricter control requirements on the light decay, while the conventional The test method has seriously lag behind the production requirements, so whether to find a fast and efficient method for the line light decay test is of great significance for the control of the battery production process and the evaluation of the quality stability.
  • the object of the present invention is to provide a rapid sample preparation device for solar cell light decay test, which replaces the traditional illumination treatment method by means of electric injection, and realizes rapid processing of the solar cell to be measured and measured, and the treatment effect is equivalent to the conventional one.
  • Long-time illumination technology to achieve rapid response to light decay testing for real-time monitoring of production processes. Since the processing adopts the electric injection method, the carrier injection efficiency is high and the time is short, thereby greatly reducing the power consumption, shortening the light decay test period, greatly improving the productivity of the light decay test, and providing great quality control. convenient.
  • the technical solution of the present invention is to design a rapid sample preparation device for solar cell light decay test, including:
  • a telescopic strut that stands upright and supports the upper electrode plate
  • a lateral drive device that drives the lower electrode plate to move along the transverse rail
  • a current detecting module that detects an output current of a DC power source
  • a current output control module that controls the output current of the DC power supply
  • An infrared temperature measuring module for detecting the temperature of the stacked solar cells on the lower electrode plate
  • the rapid sample preparation device for the solar cell light decay test further comprises: a heating device for heating the stacked solar cell sheets on the lower electrode plate.
  • the sliding seat is provided with an vertical longitudinal rack;
  • the longitudinal driving device comprises: a longitudinal driving gear that meshes with the longitudinal rack, and a longitudinal driving motor that drives the rotation of the longitudinal driving gear.
  • the lower electrode plate is provided with a horizontal transverse rack, the horizontal rack is parallel with the transverse rail;
  • the lateral driving device comprises: a transverse driving gear meshing with the horizontal rack, and driving the lateral driving gear to rotate Drive the motor laterally.
  • the drive motor and the lateral drive motor are stepper motors.
  • the working process of the rapid sample preparation device for the solar cell light decay test of the present invention is as follows:
  • the battery cells to be tested are stacked on the top surface of the lower electrode plate, and the lateral driving motor drives the lateral driving gear to rotate, and the lower electrode plate is driven to slide along the horizontal rail, and the battery piece to be tested moves along the horizontal rail along with the lower electrode plate;
  • the lateral drive motor stops working, and the longitudinal drive motor drives the longitudinal drive gear to rotate, and the upper electrode plate is driven to slide along the vertical guide rail, so that the upper electrode plate is lowered to contact
  • the battery piece to be tested, and the spring telescopic pressure bar is in a compressed state, and the spring telescopic pressure bar presses the upper electrode plate against the battery piece to be tested to solve the problem that the contact due to the uneven thickness of the battery piece is not tight enough;
  • the DC power source applies a forward bias to the battery piece through the upper electrode plate and the lower electrode plate, and heats the battery piece to a predetermined temperature (the battery piece is forward-biased by the forward bias current) Heating to a predetermined temperature, or heating the battery sheet to a predetermined temperature by a heating device;
  • the current detecting module monitors the output current of the DC power source in real time, and feeds back to the current output control module, and the current output control module adjusts the output current of the DC power source in real time;
  • infrared temperature measurement The module performs real-time temperature detection on the battery; when the battery is at a predetermined temperature and the forward biasing energization time reaches a predetermined value, the DC power is turned off, the fan operates, and the battery is cooled by air until the battery is cooled to room temperature.
  • the invention can quickly process the crystal silicon solar cell before the light decay test, and replace the light irradiation with the appropriate temperature and current, and the processing time can be reduced to less than 5 min (the current conventional illumination usually needs 6h or more), can better monitor the production process; and the equipment energy consumption is low, the single-chip processing energy consumption is only one percent of the lighting processing equipment.
  • Figure 1 is a schematic illustration of the invention.
  • a rapid sample preparation device for solar cell light decay testing includes:
  • a telescopic strut 2 that vertically supports and supports the upper electrode plate 1,
  • a longitudinal driving device for driving the carriage 3 to move along the longitudinal rail 4,
  • a lateral driving device that drives the lower electrode plate 5 to move along the lateral rails 6,
  • a current detecting module that detects an output current of a DC power source
  • a current output control module that controls the output current of the DC power supply
  • An infrared temperature measuring module for performing temperature detection on the solar cell sheets stacked on the lower electrode plate 5
  • the carriage 3 is provided with an upright longitudinal rack 9; the longitudinal drive means comprises a longitudinal drive gear 10 meshing with the longitudinal rack 9 and a longitudinal drive motor 11 for driving the longitudinal drive gear 10 to rotate.
  • the lower electrode plate 5 is provided with a horizontal transverse rack, and the horizontal rack is parallel to the transverse rail 6;
  • the lateral driving device comprises: A lateral drive gear 7 that meshes with the transverse rack, and a lateral drive motor 8 that drives the lateral drive gear 7 to rotate.
  • the drive motor and the lateral drive motor 8 are stepper motors.
  • the rapid sample preparation device for the solar cell light decay test further comprises: a heating device for heating the solar cell sheets stacked on the lower electrode plate 5.
  • the working process of the rapid sample preparation device for the solar cell light decay test of the present invention is as follows:
  • the battery piece to be tested is stacked on the top surface of the lower electrode plate 5, and the lateral driving motor 8 drives the lateral driving gear 7 to rotate, and the lower electrode plate 5 is driven to slide along the horizontal rail 6.
  • the battery piece to be tested is along the lower electrode plate 5 along with the lower electrode plate 5.
  • the lateral drive motor 8 stops working, and the longitudinal drive motor 11 drives the longitudinal drive gear 10 to rotate, so that the upper electrode plate 1 slides along the vertical guide rail 4, so that The upper electrode plate 1 is lowered to contact the battery piece to be tested, and the spring telescopic pressing rod 2 is in a compressed state, and the spring telescopic pressing rod 2 presses the upper electrode plate 1 against the battery piece to be tested to solve the problem of uneven thickness due to the thickness of the battery piece. The problem of insufficient contact is coming;
  • the direct current power source applies a forward bias to the battery piece through the upper electrode plate 1 and the lower electrode plate 5, and heats the battery piece to a predetermined temperature (through a forward bias current)
  • the battery piece is heated to a predetermined temperature, or the battery piece is heated to a predetermined temperature by a heating device;
  • the current detecting module monitors the output current of the DC power source in real time, and feeds back to the current output control module, and the current output control module adjusts the DC power supply in real time.
  • the infrared temperature measuring module performs real-time temperature detection on the battery; when the battery is at a predetermined temperature and the forward biasing power-on time reaches a predetermined value, the DC power is turned off, the fan works, and the battery is cooled by the air until the battery The sheet was cooled to room temperature.
  • the invention can quickly process the crystal silicon solar cell before the light decay test, and replace the light irradiation with the appropriate temperature and current, and the processing time can be reduced to less than 5 min (the current conventional illumination usually needs 6h or more), can better monitor the production process; and the equipment energy consumption is low, the single-chip processing energy consumption is only one percent of the lighting processing equipment.

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Photovoltaic Devices (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

一种太阳电池光衰测试的快速制样设备，包括：上电极板（1），支承上电极板（1）的伸缩压杆（2），支承伸缩压杆（2）的滑座（3），引导滑座（3）升降的纵导轨（4），驱动滑座（3）沿纵导轨（4）移动的纵向驱动装置，位于上电极板（1）正下方的下电极板（5），支承下电极板（5）的横导轨（6），驱动下电极板（5）沿横导轨（6）移动的横向驱动装置，正负极分别与下电极板（5）、上电极板（1）电连接的直流电源，电流检测模块，电流输出控制模块，红外测温模块，以及风机。该快速制样设备能在较低的能耗下，快速对待测光衰的太阳电池进行处理，处理效果等同于传统技术的光照处理，且能降低能源成本、提高光衰测试前的电池片处理速度，从而提高光衰测试的产能，达到实时监控生产工艺的目的。

Description

太阳电池光衰测试的快速制样设备 技术领域
本发明涉及太阳电池光衰测试的快速制样设备。
背景技术
随着光伏应用案例的增加，人们对光伏应用有了更加理性的认识，不再单纯地追求电池效率的提升，而是重视组件和电站在实际工作过程中的发电情况。因为电池在长时间光照情况下会形成一定的效率衰减，因此人们开始对电池光衰进行了广泛的研究。影响电池光衰的因素很多，不同电池的衰减机理和衰减量也不同，例如相同结构的n型电池衰减明显低于p型电池；在p型电池中，单晶电池的光衰率显著高于多晶电池，并且PERC电池的光衰率明显高于常规电池。
目前太阳能电池的光衰测试，通常使用的流程是先对电池片进行光照处理，通过对比光照前后的电池效率，得到光衰数据。光照测试采用灯光照射，照射时间普遍比较长，例如，p型电池的光照一般在6-24h之间，而n型电池的光照可能需要48小时，甚至240小时以上。长时间的照射，导致光衰测试周期长，并且光衰测试过程能耗大(一般大于100W/片)。
对于电池产线来说，由于产线的工艺变化和硅片的批次变化对电池的光衰率有很大的影响，而组件要求客户对光衰的控制要求越来越严格，而传统的测试方法已经严重滞后生产的需求，因此能否找到一种快速高效的适用于产线光衰测试的方法，对于电池生产工艺的控制和质量稳定性的评估，具有重要的意义。
发明内容
本发明的目的在于提供一种太阳电池光衰测试的快速制样设备，通过电注入的方式，取代传统的光照处理方式，实现了对待测光衰的太阳电池进行快速处理，处理效果等同于传统的长时间光照处理技术，从而达到光衰测试的快速响应，以实现实时监控生产工艺的目的。由于处理过程采用电注入方式，载流子注入效率高，时间短，因此，大大降低了电能消耗，缩短了光衰测试周期，大大提高了光衰测试的产能，为质量控制提供了极大的便利。
为实现上述目的，本发明的技术方案是设计一种太阳电池光衰测试的快速制样设备，包括：
平置且可升降的上电极板，
竖置且支承上电极板的伸缩压杆，
支承伸缩压杆的滑座，
引导滑座升降的纵导轨，
驱动滑座沿纵导轨移动的纵向驱动装置，
位于上电极板正下方且用于叠放太阳能电池片的平置下电极板，
支承下电极板的横导轨，
驱动下电极板沿横导轨移动的横向驱动装置，
正负极分别与下电极板、上电极板电连接的直流电源，
对直流电源的输出电流进行检测的电流检测模块，
控制直流电源输出电流的电流输出控制模块，
对下电极板上叠放的太阳能电池片进行温度检测的红外测温模块，
以及对下电极板上叠放的太阳能电池片进行吹风降温的风机。
优选的，所述太阳电池光衰测试的快速制样设备还包括：对下电极板上叠放的太阳能电池片进行加热的加热装置。
优选的，所述滑座上设有竖置的纵齿条；所述纵向驱动装置包括：与纵齿条啮合的纵向驱动齿轮，以及驱动纵向驱动齿轮转动的纵向驱动电机。
优选的，所述下电极板上设有平置的横齿条，横齿条与横导轨平行；所述横向驱动装置包括：与横齿条啮合的横向驱动齿轮，以及驱动横向驱动齿轮转动的横向驱动电机。
优选的，所述驱动电机和横向驱动电机为步进电机。
本发明太阳电池光衰测试的快速制样设备的工作过程如下：
将待测电池片叠放于下电极板顶面，横向驱动电机驱动横向驱动齿轮转动，带动下电极板沿横导轨滑动，待测电池片随下电极板沿横导轨移动；
当待测电池片(下电极板)处于上电极板正下方时，横向驱动电机停止工作，纵向驱动电机驱动纵向驱动齿轮转动，带动上电极板沿纵导轨滑动，使上电极板下降至接触到待测电池片，且弹簧伸缩压杆处于压缩状态，弹簧伸缩压杆将上电极板压紧在待测电池片上，以解决因电池片厚薄不均带来的接触不够紧密的问题；
当上电极板压紧在待测电池片上后，直流电源通过上电极板和下电极板对电池片施加正向偏压，且将电池片加热至预定温度(通过正向偏压电流将电池片加热至预定温度，或者，通过加热装置将电池片加热至预定温度)；电流检测模块实时监控直流电源的输出电流，并反馈给电流输出控制模块，电流输出控制模块实时调整直流电源的输出电流；同时，红外测温 模块对电池片进行实时温度检测；当电池片处于预定温度且正向偏压通电时间达到预定值，直流电源关闭，风机工作，对电池片进行吹风降温，直至电池片冷却至室温。
本发明能快速的对晶体硅太阳电池进行光衰测试前的等同于光照的处理，用合适的温度和电流对电池片处理取代灯光照射，处理时间可降低到小于5min(目前常规的光照通常需要6h以上)，能更好的对生产过程进行监控；且设备能耗低，单片处理能耗仅为光照处理设备的百分之一。
附图说明
图1是本发明的示意图。
具体实施方式
下面结合附图和实施例，对本发明的具体实施方式作进一步描述。以下实施例仅用于更加清楚地说明本发明的技术方案，而不能以此来限制本发明的保护范围。
本发明具体实施的技术方案是：
如图1所示，一种太阳电池光衰测试的快速制样设备，包括：
平置且可升降的上电极板1，
竖置且支承上电极板1的伸缩压杆2，
支承伸缩压杆2的滑座3，
引导滑座3升降的纵导轨4，
驱动滑座3沿纵导轨4移动的纵向驱动装置，
位于上电极板1正下方且用于叠放太阳能电池片的平置下电极板5，
支承下电极板5的横导轨6，
驱动下电极板5沿横导轨6移动的横向驱动装置，
正负极分别与下电极板5、上电极板1电连接的直流电源，
对直流电源的输出电流进行检测的电流检测模块，
控制直流电源输出电流的电流输出控制模块，
对下电极板5上叠放的太阳能电池片进行温度检测的红外测温模块，
以及对下电极板5上叠放的太阳能电池片进行吹风降温的风机。
所述滑座3上设有竖置的纵齿条9；所述纵向驱动装置包括：与纵齿条9啮合的纵向驱动齿轮10，以及驱动纵向驱动齿轮10转动的纵向驱动电机11。
所述下电极板5上设有平置的横齿条，横齿条与横导轨6平行；所述横向驱动装置包括： 与横齿条啮合的横向驱动齿轮7，以及驱动横向驱动齿轮7转动的横向驱动电机8。
所述驱动电机和横向驱动电机8为步进电机。
优选的，所述太阳电池光衰测试的快速制样设备还包括：对下电极板5上叠放的太阳能电池片进行加热的加热装置。
本发明太阳电池光衰测试的快速制样设备的工作过程如下：
将待测电池片叠放于下电极板5顶面，横向驱动电机8驱动横向驱动齿轮7转动，带动下电极板5沿横导轨6滑动，待测电池片随下电极板5沿横导轨6移动；
当待测电池片(下电极板5)处于上电极板1正下方时，横向驱动电机8停止工作，纵向驱动电机11驱动纵向驱动齿轮10转动，带动上电极板1沿纵导轨4滑动，使上电极板1下降至接触到待测电池片，且弹簧伸缩压杆2处于压缩状态，弹簧伸缩压杆2将上电极板1压紧在待测电池片上，以解决因电池片厚薄不均带来的接触不够紧密的问题；
当上电极板1压紧在待测电池片上后，直流电源通过上电极板1和下电极板5对电池片施加正向偏压，且将电池片加热至预定温度(通过正向偏压电流将电池片加热至预定温度，或者，通过加热装置将电池片加热至预定温度)；电流检测模块实时监控直流电源的输出电流，并反馈给电流输出控制模块，电流输出控制模块实时调整直流电源的输出电流；同时，红外测温模块对电池片进行实时温度检测；当电池片处于预定温度且正向偏压通电时间达到预定值，直流电源关闭，风机工作，对电池片进行吹风降温，直至电池片冷却至室温。
本发明能快速的对晶体硅太阳电池进行光衰测试前的等同于光照的处理，用合适的温度和电流对电池片处理取代灯光照射，处理时间可降低到小于5min(目前常规的光照通常需要6h以上)，能更好的对生产过程进行监控；且设备能耗低，单片处理能耗仅为光照处理设备的百分之一。
以上所述仅是本发明的优选实施方式，应当指出，对于本技术领域的普通技术人员来说，在不脱离本发明技术原理的前提下，还可以做出若干改进和润饰，这些改进和润饰也应视为本发明的保护范围。

Claims (5)

  1. 太阳电池光衰测试的快速制样设备，其特征在于，包括：
    平置且可升降的上电极板，
    竖置且支承上电极板的伸缩压杆，
    支承伸缩压杆的滑座，
    引导滑座升降的纵导轨，
    驱动滑座沿纵导轨移动的纵向驱动装置，
    位于上电极板正下方且用于叠放太阳能电池片的平置下电极板，
    支承下电极板的横导轨，
    驱动下电极板沿横导轨移动的横向驱动装置，
    正负极分别与下电极板、上电极板电连接的直流电源，
    对直流电源的输出电流进行检测的电流检测模块，
    控制直流电源输出电流的电流输出控制模块，
    对下电极板上叠放的太阳能电池片进行温度检测的红外测温模块，
    以及对下电极板上叠放的太阳能电池片进行吹风降温的风机。
  2. 根据权利要求1所述的太阳电池光衰测试的快速制样设备，其特征在于，还包括：对下电极板上叠放的太阳能电池片进行加热的加热装置。
  3. 根据权利要求1或2所述的太阳电池光衰测试的快速制样设备，其特征在于，所述滑座上设有竖置的纵齿条；所述纵向驱动装置包括：与纵齿条啮合的纵向驱动齿轮，以及驱动纵向驱动齿轮转动的纵向驱动电机。
  4. 根据权利要求3所述的太阳电池光衰测试的快速制样设备，其特征在于，所述下电极板上设有平置的横齿条，横齿条与横导轨平行；所述横向驱动装置包括：与横齿条啮合的横向驱动齿轮，以及驱动横向驱动齿轮转动的横向驱动电机。
  5. 根据权利要求4所述的太阳电池光衰测试的快速制样设备，其特征在于，所述纵向驱动电机和横向驱动电机为步进电机。
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Publication number Priority date Publication date Assignee Title
CN107230650B (zh) * 2017-06-01 2020-09-11 常州时创能源股份有限公司 太阳电池光衰测试的快速制样设备
CN108630772B (zh) * 2018-05-04 2019-09-20 江西展宇新能源股份有限公司 一种改善单晶太阳电池光衰问题的氢钝化工艺
CN109379045A (zh) * 2018-11-27 2019-02-22 中节能太阳能科技（镇江）有限公司 一种检测晶硅电池光致衰减的设备和方法
CN113895131B (zh) * 2021-12-13 2022-03-01 成都中建材光电材料有限公司 光伏组件层压装置

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201845071U (zh) * 2010-10-09 2011-05-25 中国电子科技集团公司第四十八研究所 一种用于测试晶体硅太阳能电池的电动测试台
US20120223733A1 (en) * 2011-03-03 2012-09-06 International Business Machines Corporation Solar Cell Characterization System with an Automated Continuous Neutral Density Filter
CN103336236A (zh) * 2013-06-14 2013-10-02 晶澳（扬州）太阳能科技有限公司 一种太阳能电池长期光致衰减性能的监控测试方法
CN104201242A (zh) * 2014-09-03 2014-12-10 常州天合光能有限公司 改善硼掺杂p型单晶硅电池光致衰减装置及其使用方法
CN104795466A (zh) * 2015-04-13 2015-07-22 陈恩深 一种太阳能电池的氢钝化设备
CN105140347A (zh) * 2015-09-21 2015-12-09 中节能太阳能科技（镇江）有限公司 快速改善p型晶硅电池光致衰减的量产装置及其使用方法
CN105634408A (zh) * 2014-11-26 2016-06-01 中电电气(上海)太阳能科技有限公司 太阳能光伏电池片的光之衰减试验设备
CN107230650A (zh) * 2017-06-01 2017-10-03 常州时创能源科技有限公司 太阳电池光衰测试的快速制样设备

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI407576B (zh) * 2010-12-22 2013-09-01 Big Sun Energy Tech Inc 具有差異性摻雜之太陽能電池的製造方法
CN105470351B (zh) * 2014-01-17 2019-04-19 盐城阿特斯阳光能源科技有限公司 一种减少晶体硅太阳能电池片衰减的方法
CN104505426B (zh) * 2014-10-24 2016-09-28 横店集团东磁股份有限公司 一种改善晶体硅太阳能电池组件光致衰减的方法及装置
CN106601868A (zh) * 2016-12-05 2017-04-26 湖南红太阳光电科技有限公司 太阳能电池抗光衰方法及抗光衰退火炉

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201845071U (zh) * 2010-10-09 2011-05-25 中国电子科技集团公司第四十八研究所 一种用于测试晶体硅太阳能电池的电动测试台
US20120223733A1 (en) * 2011-03-03 2012-09-06 International Business Machines Corporation Solar Cell Characterization System with an Automated Continuous Neutral Density Filter
CN103336236A (zh) * 2013-06-14 2013-10-02 晶澳（扬州）太阳能科技有限公司 一种太阳能电池长期光致衰减性能的监控测试方法
CN104201242A (zh) * 2014-09-03 2014-12-10 常州天合光能有限公司 改善硼掺杂p型单晶硅电池光致衰减装置及其使用方法
CN105634408A (zh) * 2014-11-26 2016-06-01 中电电气(上海)太阳能科技有限公司 太阳能光伏电池片的光之衰减试验设备
CN104795466A (zh) * 2015-04-13 2015-07-22 陈恩深 一种太阳能电池的氢钝化设备
CN105140347A (zh) * 2015-09-21 2015-12-09 中节能太阳能科技（镇江）有限公司 快速改善p型晶硅电池光致衰减的量产装置及其使用方法
CN107230650A (zh) * 2017-06-01 2017-10-03 常州时创能源科技有限公司 太阳电池光衰测试的快速制样设备

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