WO2018216802A1 - 三次元積層造形物製造装置、三次元積層造形物製造方法及び探傷器 - Google Patents
三次元積層造形物製造装置、三次元積層造形物製造方法及び探傷器 Download PDFInfo
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- WO2018216802A1 WO2018216802A1 PCT/JP2018/020175 JP2018020175W WO2018216802A1 WO 2018216802 A1 WO2018216802 A1 WO 2018216802A1 JP 2018020175 W JP2018020175 W JP 2018020175W WO 2018216802 A1 WO2018216802 A1 WO 2018216802A1
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- probe
- surface layer
- layered object
- dimensional layered
- powder
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- 238000004519 manufacturing process Methods 0.000 title claims description 111
- 239000000523 sample Substances 0.000 claims abstract description 215
- 239000000843 powder Substances 0.000 claims abstract description 185
- 238000001514 detection method Methods 0.000 claims abstract description 117
- 239000002344 surface layer Substances 0.000 claims abstract description 80
- 230000007246 mechanism Effects 0.000 claims abstract description 55
- 230000005284 excitation Effects 0.000 claims abstract description 53
- 230000008859 change Effects 0.000 claims abstract description 15
- 238000002844 melting Methods 0.000 claims abstract description 14
- 230000008018 melting Effects 0.000 claims abstract description 14
- 238000005245 sintering Methods 0.000 claims abstract description 9
- 238000001723 curing Methods 0.000 claims abstract 2
- 238000000034 method Methods 0.000 claims description 83
- 239000004020 conductor Substances 0.000 claims description 58
- 239000010410 layer Substances 0.000 claims description 38
- 230000001105 regulatory effect Effects 0.000 claims description 9
- 230000008569 process Effects 0.000 description 71
- 229910052751 metal Inorganic materials 0.000 description 48
- 239000002184 metal Substances 0.000 description 48
- 230000007547 defect Effects 0.000 description 38
- 230000005855 radiation Effects 0.000 description 14
- 239000000463 material Substances 0.000 description 12
- 238000002347 injection Methods 0.000 description 11
- 239000007924 injection Substances 0.000 description 11
- 238000010586 diagram Methods 0.000 description 8
- 230000008439 repair process Effects 0.000 description 7
- 238000007689 inspection Methods 0.000 description 6
- 238000000576 coating method Methods 0.000 description 5
- 229910000859 α-Fe Inorganic materials 0.000 description 5
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical group [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 4
- 238000010894 electron beam technology Methods 0.000 description 4
- 230000002411 adverse Effects 0.000 description 3
- 239000011248 coating agent Substances 0.000 description 3
- 230000001678 irradiating effect Effects 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 239000004918 carbon fiber reinforced polymer Substances 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 229910052742 iron Inorganic materials 0.000 description 2
- 238000010030 laminating Methods 0.000 description 2
- 239000002994 raw material Substances 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 229920000049 Carbon (fiber) Polymers 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000000149 argon plasma sintering Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 239000004917 carbon fiber Substances 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 230000005288 electromagnetic effect Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- 229910001026 inconel Inorganic materials 0.000 description 1
- 239000002923 metal particle Substances 0.000 description 1
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000000110 selective laser sintering Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C64/00—Additive manufacturing, i.e. manufacturing of three-dimensional [3D] objects by additive deposition, additive agglomeration or additive layering, e.g. by 3D printing, stereolithography or selective laser sintering
- B29C64/10—Processes of additive manufacturing
- B29C64/141—Processes of additive manufacturing using only solid materials
- B29C64/153—Processes of additive manufacturing using only solid materials using layers of powder being selectively joined, e.g. by selective laser sintering or melting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22F—WORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
- B22F10/00—Additive manufacturing of workpieces or articles from metallic powder
- B22F10/20—Direct sintering or melting
- B22F10/28—Powder bed fusion, e.g. selective laser melting [SLM] or electron beam melting [EBM]
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22F—WORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
- B22F10/00—Additive manufacturing of workpieces or articles from metallic powder
- B22F10/80—Data acquisition or data processing
- B22F10/85—Data acquisition or data processing for controlling or regulating additive manufacturing processes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22F—WORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
- B22F12/00—Apparatus or devices specially adapted for additive manufacturing; Auxiliary means for additive manufacturing; Combinations of additive manufacturing apparatus or devices with other processing apparatus or devices
- B22F12/90—Means for process control, e.g. cameras or sensors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22F—WORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
- B22F3/00—Manufacture of workpieces or articles from metallic powder characterised by the manner of compacting or sintering; Apparatus specially adapted therefor ; Presses and furnaces
- B22F3/003—Apparatus, e.g. furnaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C64/00—Additive manufacturing, i.e. manufacturing of three-dimensional [3D] objects by additive deposition, additive agglomeration or additive layering, e.g. by 3D printing, stereolithography or selective laser sintering
- B29C64/20—Apparatus for additive manufacturing; Details thereof or accessories therefor
- B29C64/227—Driving means
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C64/00—Additive manufacturing, i.e. manufacturing of three-dimensional [3D] objects by additive deposition, additive agglomeration or additive layering, e.g. by 3D printing, stereolithography or selective laser sintering
- B29C64/20—Apparatus for additive manufacturing; Details thereof or accessories therefor
- B29C64/255—Enclosures for the building material, e.g. powder containers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C64/00—Additive manufacturing, i.e. manufacturing of three-dimensional [3D] objects by additive deposition, additive agglomeration or additive layering, e.g. by 3D printing, stereolithography or selective laser sintering
- B29C64/30—Auxiliary operations or equipment
- B29C64/386—Data acquisition or data processing for additive manufacturing
- B29C64/393—Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B33—ADDITIVE MANUFACTURING TECHNOLOGY
- B33Y—ADDITIVE MANUFACTURING, i.e. MANUFACTURING OF THREE-DIMENSIONAL [3-D] OBJECTS BY ADDITIVE DEPOSITION, ADDITIVE AGGLOMERATION OR ADDITIVE LAYERING, e.g. BY 3-D PRINTING, STEREOLITHOGRAPHY OR SELECTIVE LASER SINTERING
- B33Y10/00—Processes of additive manufacturing
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B33—ADDITIVE MANUFACTURING TECHNOLOGY
- B33Y—ADDITIVE MANUFACTURING, i.e. MANUFACTURING OF THREE-DIMENSIONAL [3-D] OBJECTS BY ADDITIVE DEPOSITION, ADDITIVE AGGLOMERATION OR ADDITIVE LAYERING, e.g. BY 3-D PRINTING, STEREOLITHOGRAPHY OR SELECTIVE LASER SINTERING
- B33Y30/00—Apparatus for additive manufacturing; Details thereof or accessories therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B33—ADDITIVE MANUFACTURING TECHNOLOGY
- B33Y—ADDITIVE MANUFACTURING, i.e. MANUFACTURING OF THREE-DIMENSIONAL [3-D] OBJECTS BY ADDITIVE DEPOSITION, ADDITIVE AGGLOMERATION OR ADDITIVE LAYERING, e.g. BY 3-D PRINTING, STEREOLITHOGRAPHY OR SELECTIVE LASER SINTERING
- B33Y50/00—Data acquisition or data processing for additive manufacturing
- B33Y50/02—Data acquisition or data processing for additive manufacturing for controlling or regulating additive manufacturing processes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9093—Arrangements for supporting the sensor; Combinations of eddy-current sensors and auxiliary arrangements for marking or for rejecting
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22F—WORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
- B22F10/00—Additive manufacturing of workpieces or articles from metallic powder
- B22F10/30—Process control
- B22F10/36—Process control of energy beam parameters
- B22F10/366—Scanning parameters, e.g. hatch distance or scanning strategy
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22F—WORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
- B22F12/00—Apparatus or devices specially adapted for additive manufacturing; Auxiliary means for additive manufacturing; Combinations of additive manufacturing apparatus or devices with other processing apparatus or devices
- B22F12/22—Driving means
- B22F12/226—Driving means for rotary motion
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P10/00—Technologies related to metal processing
- Y02P10/25—Process efficiency
Definitions
- the present disclosure relates to a three-dimensional layered object manufacturing apparatus, a three-dimensional layered object manufacturing method, and a flaw detector.
- Patent Document 1 there is an apparatus for manufacturing a three-dimensional product by arranging powder as a raw material on a work table in layers, applying energy to selected portions of the powder layer and sequentially melting the powder.
- Patent Document 1 an apparatus for manufacturing such a three-dimensional product, one powder layer is partially melted, and after the melted powder is cured, another powder layer is formed thereon, and a selected portion is further removed. It is melted and cured, and this is repeated to produce a three-dimensional product.
- This disclosure describes a three-dimensional layered object manufacturing apparatus, a three-dimensional layered object manufacturing method, and a flaw detector capable of flaw detection of the three-dimensional layered object during the manufacturing of the three-dimensional layered object.
- the three-dimensional layered object manufacturing apparatus is a tertiary that manufactures a three-dimensional layered object by partially applying energy to the conductor powder, melting or sintering the conductor powder, and curing the conductor powder.
- An original layered object manufacturing apparatus that holds a conductor powder and holds a cured three-dimensional layered object, and applies energy to a laminate of the conductor powder held in the holder
- the probe includes an exciting coil that generates an eddy current in the surface layer portion, and a detection coil that detects a change in the magnetic field in the surface layer portion.
- the three-dimensional layered object can be flawed during the production of the three-dimensional layered object.
- FIG. 1 is a schematic configuration diagram illustrating a three-dimensional layered object manufacturing apparatus according to a first embodiment of the present disclosure.
- FIG. 2 is a schematic configuration diagram illustrating the flaw detection apparatus according to the first embodiment of the present disclosure.
- FIG. 3 is a diagram illustrating an arrangement of a plurality of coil units in the probe according to the first embodiment of the present disclosure from above.
- FIG. 4 is a bottom view showing the coil unit in FIG. 3.
- FIG. 5 is a diagram illustrating an example of a flaw detection result by the flaw detection apparatus.
- FIG. 6 is a diagram illustrating an example of a flaw detection result obtained by the flaw detection apparatus.
- FIG. 7 is a process diagram showing the procedure of the method for producing a three-dimensional layered object.
- FIG. 1 is a schematic configuration diagram illustrating a three-dimensional layered object manufacturing apparatus according to a first embodiment of the present disclosure.
- FIG. 2 is a schematic configuration diagram illustrating the flaw detection apparatus according to the first embodiment of
- FIG. 8 is a diagram showing the arrangement of a plurality of coil units in the probe of the second embodiment from above.
- FIG. 9 is a plan view showing a movement path of the probe according to the second embodiment.
- FIG. 10 is a plan view showing another movement path of the probe.
- FIG. 11 is a plan view showing the three-dimensional layered object manufacturing apparatus of the third embodiment.
- FIG. 12 is a plan view showing the three-dimensional layered object manufacturing apparatus of the fourth embodiment.
- FIG. 13 is a plan view showing the three-dimensional layered object manufacturing apparatus of the fifth embodiment.
- 14 is a cross-sectional view of the three-dimensional layered object manufacturing apparatus shown in FIG.
- the three-dimensional layered object manufacturing apparatus is a tertiary that manufactures a three-dimensional layered object by partially applying energy to the conductor powder, melting or sintering the conductor powder, and curing the conductor powder.
- the original layered object manufacturing apparatus which holds the conductor powder and holds the cured three-dimensional layered object, an energy applying part that applies energy to the conductor powder held in the holding part,
- a probe that is arranged apart from the surface layer portion of the cured three-dimensional layered object and that detects the surface layer portion and a probe moving mechanism that moves the probe relative to the surface layer portion are provided.
- the probe includes an exciting coil that generates an eddy current in the surface layer portion, and a detection coil that detects a change in the magnetic field in the surface layer portion.
- the surface layer part of the three-dimensional layered object being manufactured can be flawed by moving the probe relatively in the scanning direction, so that there is no defect in the surface layer part.
- a conductor powder can be further laminated to produce a three-dimensional layered object.
- the probe relative to the surface layer includes “move the probe” and “move the surface layer”.
- the surface layer portion can be moved by moving the holding portion.
- the three-dimensional layered object manufacturing apparatus includes a restriction part that leveles the upper surface of the laminate of the conductor powder held by the holding part, a restriction part moving mechanism that moves the restriction part relative to the conductor powder, May be provided.
- “Move the regulating portion relative to the conductor powder” includes “move the regulating portion” and “move the conductor powder”. For example, the conductor powder can be moved by moving the holding portion.
- the bottom surface of the probe may be arranged above the lower end of the restricting portion.
- the surface layer portion can be flaw-detected by reliably making the probe non-contact with the conductor powder.
- the restricting portion moving mechanism may also serve as a probe moving mechanism. Thereby, a control part and a probe can be moved using a control part movement mechanism. The movement of the probe can be linked to the movement of the restricting portion.
- the probe may be arranged on the rear side of the restricting portion in the movement direction of the restricting portion. Thereby, after leveling the upper surface of the laminate of the conductor powder by the restricting portion, the probe can be passed.
- the probe may be attached to the restricting portion.
- the probe can be moved together with the restricting portion to detect the surface layer portion, so there is no need to separately move the restricting portion and the probe, and the entire manufacturing time including the inspection process Can be shortened.
- the three-dimensional layered object manufacturing method is a tertiary method of manufacturing a three-dimensional layered object by partially applying energy to the conductor powder, melting or sintering the conductor powder, and curing the conductor powder.
- This is an original layered object manufacturing method, wherein energy is applied to the conductor powder to melt or sinter the conductor powder, and the surface layer portion of the cured three-dimensional layered object is separated.
- the flaw detection process includes an excitation process that generates an eddy current in the surface layer part, and a detection process that detects a change in the magnetic field in the surface layer part.
- a conductor powder can be further laminated to produce a three-dimensional layered object. For example, when a defect is detected in the surface layer portion, the defect is repaired at that point, and after the repair, a conductor powder can be further laminated to manufacture a three-dimensional layered object.
- the method may further include a step of moving the regulating portion relative to the conductor powder and leveling the upper surface of the conductor powder held by the holding portion.
- the flaw detection process may be performed when the leveling process is performed.
- the bottom surface of the probe may be disposed above the lower end of the restricting portion, and the surface layer portion may be flawed by moving the probe relative to the restricting portion.
- the surface layer portion can be flaw-detected by reliably making the probe non-contact with the conductor powder.
- the surface layer portion may be flawed by arranging a probe behind the restriction portion in the relative movement direction of the restriction portion. Thereby, after leveling the upper surface of the laminate of the conductor powder by the restricting portion, the probe can be passed.
- the flaw detection process may be performed on the surface layer portions of a plurality of layers.
- a flaw detector is a flaw detector that flaws a surface layer portion of a three-dimensional layered object that is being manufactured, and includes a probe that extends in a second direction that intersects a first direction that is a scanning direction.
- the probe includes a plurality of coil units arranged side by side in the second direction.
- the coil unit includes an excitation coil that generates an eddy current in the surface layer portion, and a pair of detection coils arranged side by side inside the excitation coil.
- the flaw detector of the present disclosure by moving the probe in the scanning direction, a wide range can be flawed in the second direction, and the flaw detection time can be reduced.
- the surface layer part of the three-dimensional layered object in the middle of manufacturing, it is possible to manufacture a three-dimensional layered object by further laminating the conductor powder after confirming that there is no defect in the surface layer part. .
- the conductor powder can be further laminated to produce a three-dimensional layered object. Thereby, it is not necessary to repair defects inside the three-dimensional layered object after the manufacture of the three-dimensional layered object is completed.
- the flaw detector may further include a restricting portion attached to the probe. Thereby, the upper surface of the laminate of the conductor powder can be leveled while moving the probe and performing flaw detection.
- the pair of detection coils may be arranged at positions overlapping in the first direction. Thereby, by calculating the difference between the signals detected by the pair of detection coils, the influence of noise can be reduced and the defect can be detected with high accuracy.
- a three-dimensional layered object manufacturing apparatus (hereinafter referred to as “manufacturing apparatus”) 1 of the first embodiment shown in FIG. 1 is a so-called 3D printer, and is partially applied to metal powder (conductor powder) 2 arranged in layers. The metal powder 2 is melted and cured, and this is repeated a plurality of times to produce a three-dimensional part (three-dimensional layered object) 3.
- the three-dimensional part 3 is, for example, a machine part or the like, and may be another structure.
- the metal powder include titanium metal powder, Inconel (registered trademark) powder, aluminum powder and the like.
- the conductor powder is not limited to a metal powder, and may be a powder containing carbon fiber and resin, such as CFRP (Carbon Fiber Reinforced Plastics), or other conductive powder.
- the manufacturing apparatus 1 includes a work table (holding unit) 4, a vertical position adjusting mechanism 5, a brush unit (regulating unit) 6, a first moving mechanism (regulating unit moving mechanism) 7, and a radiation gun (energy applying unit) 8. Prepare.
- the work table 4 has, for example, a plate shape, on which the metal powder 2 that is a raw material of the three-dimensional component 3 is arranged.
- the metal powder 2 on the work table 4 is arranged in a plurality of times, for example, in layers.
- a laminate of the metal powder 2 on the work table 4 is referred to as a powder bed 25.
- the work table 4 has, for example, a rectangular shape in plan view.
- the work table 4 is movable in the Z direction (up and down direction) and descends sequentially according to the number of layers of the metal powder 2.
- a guide portion 9 that guides the movement of the work table 4 is provided on the outer periphery of the work table 4.
- the guide portion 9 has a rectangular tube shape corresponding to the outer shape of the work table 4.
- the rectangular tube-shaped guide portion 9 and the work table 4 are box-shaped and form an accommodating portion that accommodates the powder bed 25.
- the work table 4 is movable in the Z direction inside the guide portion 9.
- the vertical position adjustment mechanism 5 is, for example, a rack and pinion type drive mechanism, and moves the work table 4 in the Z direction.
- the vertical position adjustment mechanism 5 includes a bar-shaped vertical member (rack) 10 that is connected to the bottom surface of the work table 4 and extends downward, and a drive source 11 for driving the vertical member 10.
- an electric motor can be used as the drive source 11.
- the output shaft of the electric motor is provided with a pinion, and the side surface of the vertical member 10 is provided with a tooth shape that meshes with the pinion.
- the electric motor is driven, the pinion rotates to transmit power, and the vertical member 10 moves in the vertical direction.
- the vertical position adjustment mechanism 5 is not limited to a rack and pinion type drive mechanism, and may include other drive mechanisms such as a ball screw and a cylinder.
- the vertical position adjustment mechanism 5 can lower the holding portion and hold the position of the holding portion in the vertical direction.
- the brush portion 6 is disposed above the work table 4 and leveles the uppermost surface (upper surface) 2 a of the powder bed 25 placed on the work table 4.
- the brush portion 6 is movable in the Y direction (first direction) intersecting with the Z direction, and leveles the surface 2a of the powder bed 25.
- the lower end part of the brush part 6 contacts the surface 2a of the powder bed 25 to make the height uniform.
- the brush portion 6 has a predetermined width in the X direction (second direction) and corresponds to the entire length of the work table 4 in the X direction.
- the X direction is a direction that intersects the Z direction and the Y direction.
- the manufacturing apparatus 1 may be configured to include other restricting portions such as a roller portion and a plate-like member instead of the brush portion 6.
- the restricting portion may be anything that can level the surface of the powder bed 25.
- the first moving mechanism 7 is, for example, a rack and pinion type driving mechanism, and moves the brush portion 6 in the Y direction.
- the first moving mechanism 7 includes a pair of guide rails 12 extending in the Y direction on both sides in the X direction, and a drive source 13 attached to the brush unit 6.
- the application mechanism that applies the powder includes a restricting portion and a first moving mechanism. The first moving mechanism 7 moves the brush portion 6 relative to the powder bed 25.
- an electric motor can be used as the drive source 13, for example, an electric motor can be used.
- a pinion is provided on the output shaft of the electric motor, and one guide rail 12 is provided with a tooth profile (rack) that meshes with the pinion.
- the pair of guide rails 12 are attached to, for example, a housing (frame body) of the manufacturing apparatus 1.
- a follower roller that rotates and moves along the other guide rail 12 is attached to the brush portion 6.
- the electric motor is driven to rotate the pinion, and the brush portion 6 moves along the guide rail 12 in the Y direction.
- the radiation gun 8 irradiates the metal powder 2 with radiation from above the work table 4 to melt the metal powder 2.
- the radiation gun 8 is movable to a predetermined position, and the metal powder 2 is locally melted by irradiating with radiation according to the position.
- the radiation gun 8 emits radiation as an energy beam.
- the manufacturing apparatus 1 may be configured to include other energy applying units instead of the radiation gun 8.
- the energy beam may be a charged particle beam such as an electron beam or a laser beam.
- the energy applying unit is for melting the conductive powder by, for example, an electron beam method (EBM), but the energy applying unit is not limited to the one using the electron beam method.
- EBM electron beam method
- the energy application unit is a laser melting method (SLM: Selective Laser Melting) in which the conductive powder is melted by irradiating the conductive powder with laser light as an energy beam, and the conductive powder is irradiated by irradiating the powder with laser light.
- SLM Selective Laser Melting
- a laser sintering method (SLS: selective laser sintering) for sintering may be used.
- the energy applying unit may apply energy to the conductor powder by other methods, heat the conductor powder, and melt or sinter and solidify (harden) it.
- the manufacturing apparatus 1 includes a control unit 14 that controls the manufacturing apparatus 1.
- the control unit 14 controls the vertical position adjustment mechanism 5, the first movement mechanism 7, and the radiation gun 8.
- the control unit 14 is a computer composed of hardware such as a CPU (Central Processing Unit), ROM (Read Only Memory), and RAM (Random Access Memory), and software such as a program stored in the ROM.
- the control unit 14 controls the vertical position adjustment mechanism 5 to control the position of the work table 4 in the Z direction.
- the control unit 14 controls the first moving mechanism 7 to control the movement of the brush unit 6.
- the control unit 14 controls the radiation gun 8 to control the irradiation position and irradiation time of the radiation.
- the manufacturing apparatus 1 includes a flaw detector (flaw detector) 15 that flaws the surface layer portion 3 a of the three-dimensional component 3.
- the flaw detection apparatus 15 includes a probe 16, a calculation unit 17, a power supply circuit 18, and a display unit 19.
- the probe 16 is attached to the brush portion 6 and can move together with the brush portion 6 in the Y direction.
- the first moving mechanism 7 also serves as a probe moving mechanism that moves the probe 16 in the Y direction.
- the bottom surface 16 a of the probe 16 is disposed above the lower end 6 a of the brush portion 6.
- a gap is formed between the bottom surface 16 a of the probe 16 and the surface 2 a of the powder bed 25.
- the probe 16 is not in contact with the metal powder 2 and the three-dimensional component 3.
- the probe 16 is disposed on the rear side of the brush portion 6 in the scanning direction.
- the scanning direction is a direction from the left side to the right side in FIGS. 1 and 2, for example.
- the scanning direction is not limited to this direction and may be any direction.
- the probe 16 extends in the X direction that intersects the Y direction that is the scanning direction.
- the probe 16 includes a plurality of coil units 20 arranged side by side in the X direction. For example, eight coil units 20 are arranged in the X direction.
- a plurality of coil units 20 arranged in the X direction are arranged in a row.
- the plurality of coil units 20 form a row along virtual straight lines X1 to X4 extending in the X direction.
- a plurality of rows (for example, 4 rows) are arranged side by side in the Y direction.
- the virtual straight lines X1 to X4 are spaced apart in the Y direction.
- the probe 16 includes, for example, a total of 32 coil units 20.
- the coil unit 20 of the probe 16 is accommodated in, for example, a box-shaped case.
- the plurality of coil units 20 are arranged along a virtual straight line T.
- the straight line T is disposed obliquely with respect to the X direction and the Y direction.
- four coil units 20 are arranged along the straight line T.
- the plurality of coil units 20 are arranged at different positions in the X direction.
- the plurality of coil units 20 may be arranged without a gap when viewed from the Y direction.
- FIG. 3 virtual straight lines Y1 to Y4 extending in the Y direction are shown.
- the straight lines Y1 to Y4 are spaced apart in the X direction.
- a coil unit 20A is disposed at the intersection of the straight line X1 and the straight line Y1.
- a coil unit 20B is disposed at the intersection of the straight line X2 and the straight line Y2.
- a coil unit 20C is disposed at the intersection of the straight line X3 and the straight line Y3.
- a coil unit 20D is disposed at the intersection of the straight line X4 and the straight line Y4.
- the plurality of coil units 20 includes coil units 20A to 20D.
- One coil unit 20 is arranged on each of the straight lines Y1 to Y4.
- no other coil unit 20 is arranged behind the coil unit 20 in the scanning direction.
- the straight lines X1 to X4 are arranged in the order of X4, X3, X2, and X1 in the Y direction.
- the straight lines Y1 to Y4 are repeatedly arranged in the order of Y4, Y3, Y2, and Y1 in the X direction.
- the interval between the straight lines X1 to X4 is wider than the interval between the straight lines Y1 to Y4.
- the interval in the X direction between the straight lines T is wider than the interval between the straight lines X1 to X4.
- the coil unit 20 includes an excitation coil 21, a pair of detection coils 22, and a ferrite core (iron core) 23.
- the exciting coil 21 is supplied with an alternating current from the power supply circuit 18 to generate a magnetic field, and generates an eddy current in the surface layer portion 3 a of the three-dimensional component 3.
- the exciting coil 21 is formed, for example, around an axis extending in the Z direction.
- the pair of detection coils 22 are arranged inside the excitation coil 21.
- the detection coil 22 is formed around an axis extending in the Z direction, for example.
- a ferrite core 23 is disposed inside the detection coil 22.
- the ferrite core 23 has a rod shape, for example, and extends in the Z direction.
- the ferrite core 23 may be cylindrical or prismatic.
- the pair of detection coils 22 are arranged adjacent to each other in the Y direction when viewed from the Z direction, and are arranged so that their positions in the X direction are deviated so as to partially overlap in the X direction. That is, when viewed from the Y direction, the pair of detection coils 22 are arranged such that some of them overlap each other in the X direction and the remaining portions do not overlap.
- the pair of detection coils 22 detects a change in the magnetic field due to the eddy current of the surface layer portion 3a.
- the presence or absence of the defect can be detected by detecting the change in the magnetic field by the detection coil 22.
- the change in the magnetic field is accurately detected by calculating the difference between the signals detected by these. be able to.
- the signal difference becomes the largest when the probe passes over the defect, so that electrical noise can be suppressed and the defect can be detected accurately. can do.
- Defects detected by the detection coil 22 include, for example, poor penetration, cracks, fusion, and porosity (voids).
- the calculation unit 17 is electrically connected to the pair of detection coils 22 and calculates a difference between signals detected by the pair of detection coils 22.
- the computing unit 17 is a computer configured by hardware such as a CPU, a ROM, and a RAM, and software such as a program stored in the ROM.
- the calculation unit 17 may be configured separately from the control unit 14 or may be included in the control unit 14.
- the power supply circuit 18 supplies an alternating current to the exciting coil 21.
- the frequency of the alternating current supplied to the exciting coil 21 may be, for example, 500 kHz to 2 MHz, or another frequency.
- an eddy current is generated in the surface layer portion 3 a of the three-dimensional component 3.
- the surface layer portion 3a includes the surface of the three-dimensional component 3 and an internal portion in the vicinity of the surface, and may include, for example, a region from the surface to a depth of 1 mm.
- the surface layer portion may include, for example, a region up to a depth of 2 mm, or may include a region up to another depth.
- the probe 16 can detect flaws up to the depth of a plurality of layers (for example, five layers) of the metal powder 2 as the surface layer portion 3 a of the three-dimensional component 3.
- the display unit 19 displays image information related to the flaw detection result output from the calculation unit 17.
- the display unit 19 can display the position where the defect exists and the position where the defect does not exist by using light and shade.
- 5 and 6 show an example of image information related to the flaw detection result.
- FIG. 5 and FIG. 6 show the results of flaw detection on a test piece having a surface layer with a defect.
- a region where the difference between detection signals is large is shown darkly.
- a defect exists at a position of 75 mm in the X direction and 65 mm in the Y direction
- a defect exists at a position of 60 mm in the X direction and 30 mm in the Y direction.
- the signal difference is large, and therefore, it is shown in a dark color in FIGS.
- FIG. 7 is a flowchart showing a procedure of a method for manufacturing a three-dimensional part.
- the manufacturing method of a three-dimensional component is performed using the manufacturing apparatus 1, for example.
- a first powder layer is formed.
- the first layer of metal powder 2 is supplied onto the work table 4, the brush portion 6 is moved in the Y direction, and the surface 2a of the powder bed 25 is leveled (step S1).
- This step S1 is included in the coating process for coating the metal powder 2.
- the metal powder 2 is supplied onto the work table 4 from a powder storage tank (not shown), for example.
- a melting step (energy applying step) is performed in which the metal powder 2 on the work table 4 is irradiated with radiation to melt it (step S2).
- a sintering step (energy applying step) may be performed in which energy is partially applied to the conductor powder to sinter the conductor powder.
- a preheating step of applying energy to the metal powder 2 to raise the temperature may be performed.
- the work table 4 is lowered (step S3). By lowering the work table 4, a space for laminating the second metal powder 2 is secured.
- a second (n + 1) layer powder layer is formed.
- the second layer (n + 1 layer) metal powder 2 is placed on the work table 4 (on the nth layer metal powder).
- the brush portion 6 is moved in the Y direction to level the surface 2a of the laminate (n + 1 layer) of the metal powder 2 (step S4).
- This step S4 is included in the coating process for coating the metal powder 2.
- a flaw detection process is performed when the brush part 6 is moved. For example, the surface 2a of the metal powder 2 of the second layer (n + 1 layer) is leveled, and a flaw detection process is performed on the surface layer portion 3a of the first layer (n layer).
- an excitation process and a detection process are performed.
- the surface layer portion 3a for one layer may be executed.
- the surface layer portion 3a of a plurality of layers (2 to 4 layers) may be executed.
- the flaw detection process may be performed collectively.
- the flaw detection process and the work table lowering process and the metal powder leveling process are performed a plurality of times, and in the process of leveling the last metal powder, the flaw detection process may be performed collectively for the surface layer portion 3a for a plurality of layers. Good.
- the excitation order may be different for each of the plurality of excitation coils 21.
- the excitation order may be changed according to the position of the excitation coil 21 in the scanning direction.
- the excitation order may be set for each coil unit 20 on the straight lines X1 to X4 shown in FIG.
- the excitation coil 21 may be excited in the order of the coil unit 20A on the straight line X1, the coil unit 20B on the straight line X2, the coil unit 20C on the straight line X3, and the coil unit 20D on the straight line X4.
- the order of exciting the exciting coil 21 may be other orders.
- the exciting coil 21 may be excited in the order of the coil unit 20A on the straight line X1, the coil unit 20C on the straight line X3, the coil unit 20B on the straight line X2, and the coil unit 20D on the straight line X4.
- the plurality of coil units 20 arranged on the same straight line among the straight lines X1 to X4 may be excited simultaneously. That is, for example, first, the plurality of coil units 20A on the straight line X1 are simultaneously excited. Next, the plurality of coil units 20B on the straight line X2 are excited simultaneously. Next, the plurality of coil units 20C on the straight line X3 are excited simultaneously. Next, the plurality of coil units 20D on the straight line X4 are excited simultaneously. Hereinafter, the same excitation may be repeatedly performed.
- the distance between adjacent coil units 20 on the same straight lines X1 to X4 (the distance in the X direction between the straight lines T) is set to a sufficient distance, the adjacent coil units 20 can be excited simultaneously. The coil units 20 can be prevented from adversely affecting each other's detection.
- a change in the magnetic field in the surface layer portion 3a is detected.
- a change in the magnetic field due to a change in eddy current in the surface layer portion 3a is detected. For example, when the surface layer portion 3a has a defect, a shape discontinuity portion, or the like, the eddy current changes around and changes the magnetic field.
- the calculation unit 17 calculates the difference between the signals detected by the pair of detection coils 22.
- the calculation unit 17 generates image information indicating the inspection result based on the calculated result.
- the image information indicating the inspection result is output and displayed on the display unit 19. In the image information indicating the inspection result, the position, size, orientation, etc. of the defect may be displayed.
- the presence / absence of a defect is determined based on the inspection result (step S6).
- the calculation unit 17 may determine the presence / absence of a defect based on the difference between the signals from the pair of detection coils 22, and the user can check the presence / absence of the defect by looking at the image information displayed on the display unit 19. You may judge.
- step S9 If no defect is detected, the process proceeds to step S9. If a defect is detected, the process proceeds to step S7.
- step S7 a repair process is performed.
- the metal powder is supplied again, and the defective portion is melted and cured.
- the flaw detection process is performed again (step S8).
- flaw detection step here, for example, similarly to step S5, flaw detection may be performed on the entire surface layer portion 3a, or flaw detection may be performed only on the region corresponding to the repaired portion.
- step S9 it is determined whether or not the manufacture of all layers of the three-dimensional component 3 has been completed and the component has been completed. For example, it is determined whether or not the production of the layer as designed is finished. If the manufacture of the three-dimensional part is not completed, the process returns to step S2. In step S2, energy is partially applied to the second layer (n + 1 layer) metal powder (powder layer) formed in step S4 described above to perform melting. Thereafter, the same process is repeated to manufacture the three-dimensional component 3.
- the probe 16 of the flaw detector 15 includes a plurality of coil units 20 arranged side by side in the X direction that intersects the scanning direction.
- the flaw detection apparatus 15 by moving the probe 16 in the scanning direction, a wide range can be detected in the X direction, and the flaw detection time can be reduced. Since the surface layer portion 3a of the three-dimensional component 3 being manufactured can be inspected, it is confirmed that the surface layer portion 3a is free of defects, and then the metal powder 2 is further laminated to manufacture the three-dimensional component 3. Can do.
- the pair of detection coils 22 are arranged side by side in the scanning direction and are arranged at positions overlapping in the Y direction.
- the flaw detector 15 can detect the defect with high accuracy by calculating the difference between the signals detected by the pair of detection coils 22 to reduce the influence of noise.
- the metal powder 2 can be further laminated after the defect is repaired to manufacture the three-dimensional component 3. Accordingly, it is not necessary to perform flaw detection after the manufacture of the three-dimensional part 3 is completed, and to repair a defect inside the three-dimensional part 3 in response to the result.
- the bottom surface 16 a of the probe 16 is disposed above the lower end 6 a of the brush portion 6. Thereby, the probe 16 can detect the surface layer portion 3a of the three-dimensional component 3 without contacting the metal powder 2. Since the probe 16 is not in contact with the metal powder 2, it is possible to prevent the laminated metal powder 2 from being disturbed and reduce the possibility of occurrence of defects. Since the probe 16 is not in contact with the three-dimensional component 3, the risk of damage to the three-dimensional component 3 can be reduced.
- the probe 16 Since the probe 16 is arranged on the rear side of the brush portion 6 in the moving direction of the brush portion 6, the metal powder 2 is leveled by the brush portion 6 and then passes over the metal powder 2. Therefore, the possibility that the probe 16 contacts the metal powder 2 can be further reduced.
- the probe 16 since the probe 16 is attached to the brush portion 6, the probe 16 can be moved together with the brush portion 6 by the first moving mechanism 7. Thereby, it is not necessary to move the brush part 6 and the probe 16 separately, and the manufacturing time as a whole including the inspection process can be shortened.
- no other coil unit 20 is arranged behind one coil unit 20 on the straight lines Y1 to Y4 extending in the scanning direction. Thereby, the influence on the excitation by the rear excitation coil 21 and the detection by the detection coil 22 in the scanning direction is reduced. In the probe 16, the coil units 20 are prevented from adversely affecting each other electromagnetically. Therefore, a large number of coil units 20 can be arranged in the probe 16 to detect a wide range in the X direction.
- the order of excitation by the excitation coil 21 is changed according to the position of the coil units 20A to 20D in the scanning direction. Thereby, interference between the coil units 20 adjacent in the scanning direction can be suppressed. For example, excitation and detection by the coil unit 20B are not easily affected by excitation by the adjacent coil unit 20A.
- the coil units 20 can be prevented from having an adverse electromagnetic effect. Therefore, a large number of coil units 20 can be arranged in the probe 16 to detect a wide range in the X direction.
- the brush portion 6 and the probe 16 are moved with respect to the powder bed 25, but the brush portion 6 and the probe 16 may be stationary and the powder bed 25 may be moved.
- the work table 4 holding the powder bed 25 and the three-dimensional component 3 and the guide unit 9 may be moved in the X direction and the Y direction.
- “Move the brush portion 6 relative to the powder bed 25” means “when the brush portion 6 is moved while the work table 4 is stationary” and “when the brush portion 6 is stationary” "When moving table 4”. “Move the probe 16 relative to the surface layer portion 3a of the three-dimensional component 3” means “when the probe 16 is moved while the work table 4 is stationary” and “the probe 16 is stationary. “When the work table 4 is moved in the state”.
- the probe 31 is different from the probe 16 in that the length in the X direction and the number of coil units 20 are different.
- the probe 31 is shorter in the X direction than the probe 16.
- four coil units 20 are arranged in the X direction.
- FIG. 8 shows virtual straight lines T1 to T4 extending obliquely with respect to the X direction and the Y direction.
- Four coil units 20A to 20D are arranged on the straight lines T1 to T4, respectively.
- the flaw detection apparatus including the probe 31 may include a probe moving mechanism that moves the probe 31 in the X direction and the Y direction.
- the probe moving mechanism includes a first guide rail extending in the Y direction and a second guide rail extending in the X direction.
- the probe moving mechanism moves the second guide rail along the first guide rail and moves the probe 31 along the second guide rail.
- the probe moving mechanism may include a rack and pinion type driving mechanism.
- the probe moving mechanism may include other drive mechanisms such as a cylinder or a ball screw, for example.
- FIG. 9 is a plan view showing the movement path of the probe 31.
- the powder bed 25 follows the shape of the guide portion 9 and has, for example, a rectangular shape in plan view.
- the three-dimensional part 3 is present in the powder bed 25.
- the length of the probe 31 in the X direction is shorter than the length of the powder bed 25 in the X direction.
- the length of the probe 31 in the Y direction is shorter than the length of the powder bed 25 in the Y direction.
- the movement path of the probe 31 is indicated by an arrow.
- the probe 31 Prior to the start of the flaw detection process, the probe 31 is disposed at a position corresponding to one corner of the powder bed 25. In the flaw detection process, the probe 31 moves in the X direction, and the excitation process and the detection process are executed. The probe 31 moves by the length of the powder bed 25 in the X direction. Next, the probe 31 moves in the Y direction. For example, the probe 31 is moved corresponding to the length of the probe 31 in the Y direction. Next, the probe 31 moves in the X direction in the opposite direction to the previous time. During this movement, an excitation process and a detection process are executed. The probe 31 moves again in the Y direction. In this way, the excitation process and the detection process are executed while moving the probe 31.
- the excitation process and the detection process are executed for all areas of the powder bed 25.
- the movement path of the probe is not limited to a line along a straight line, and may be curved along an arc.
- the powder bed 25 is stopped and the probe 31 is moved. Thereby, the probe 31 is moved relative to the powder bed 25.
- the coil unit 20 on the straight line T1 when the probe 31 is moved in the X direction (rightward), the coil unit 20 on the straight line T1, the coil unit 20 on the straight line T2, the coil unit 20 on the straight line T3, the straight line shown in FIG. Excitation by the excitation coil 21 can be performed in the order of the coil units 20 on T4.
- the coil unit 20 on the straight line T4 when the probe 31 is moved in the opposite direction (leftward) in the X direction, the coil unit 20 on the straight line T4, the coil unit 20 on the straight line T3, the coil unit 20 on the straight line T2, and the straight line Excitation by the excitation coil 21 can be performed in the order of the coil units 20 on T1.
- excitation may be performed in other order.
- the movement path of the probe 31 is not limited to that shown in FIG. For example, the following modifications may be made.
- the probe 31 Prior to the start of the flaw detection process, the probe 31 is disposed at a position corresponding to one corner of the powder bed 25.
- the probe 31 moves in the Y direction, and the excitation process and the detection process are executed.
- the probe 31 moves by the length of the powder bed 25 in the Y direction.
- the probe 31 moves in the X direction.
- the probe 31 is moved corresponding to the length of the probe 31 in the X direction.
- the probe 31 moves in the direction opposite to the previous direction in the Y direction.
- an excitation process and a detection process are executed.
- the probe 31 moves again in the X direction. In this way, the excitation process and the detection process are executed while moving the probe 31.
- the excitation order of the coil unit 20 may be the same order as in the first embodiment.
- FIG. 10 is a plan view showing another movement path of the probe 31.
- the movement path of the probe 31 is indicated by an arrow.
- the three-dimensional part 3 is arranged in the powder bed 25.
- the length in the X direction of the three-dimensional component 3 is not constant and varies depending on the position in the Y direction.
- the length in the Y direction of the three-dimensional component 3 is not constant and varies depending on the position in the X direction.
- the probe 31 may be moved according to the shape of the three-dimensional component 3.
- the probe 31 may not be moved over the entire powder bed 25.
- the probe 31 may be moved corresponding to only the portion where the three-dimensional component 3 exists.
- the plurality of coil units 20 may not be arranged along the straight lines X1 to X4.
- a probe including a plurality of coil units 20 arranged side by side along a plurality of straight lines inclined with respect to the X direction may be used.
- the manufacturing apparatus 41 is different from the manufacturing apparatus 1 of the first embodiment in that a circular powder bed 42 is held and a work table that holds the powder bed 42 rotates. In the description of the manufacturing apparatus 41, the same description as in the above embodiment is omitted.
- the manufacturing apparatus 41 includes a work table and a guide unit 43 that hold a circular powder bed 42.
- the guide part 43 has a cylindrical shape.
- the work table is disposed in the guide portion 43 and can be moved up and down.
- the three-dimensional part and the powder bed 42 exist on the work table.
- the manufacturing apparatus 41 includes a work table rotation mechanism that rotates the work table around the center O.
- the work table rotating mechanism can include, for example, an electric motor, a rotating shaft, a gear, a power transmission belt, and the like.
- the manufacturing apparatus 41 includes a powder supply unit (application mechanism) that supplies the metal powder 2 to the supply region on the work table (powder bed 42) (forms a powder layer).
- the powder supply unit includes a brush unit 6.
- the brush portion 6 extends from the center O in the radial direction of the work table.
- the powder bed 42 and the three-dimensional component move as the work table rotates.
- the guide part 43 rotates with a work table, for example.
- the rotation direction R of the work table is indicated by an arrow.
- the work table may rotate in the direction opposite to the rotation direction R.
- the length of the brush portion 6 corresponds to the length of the radius of the work table or guide portion 43, for example.
- the brush portion may be longer than the diameter of the work table or guide portion 43, for example.
- the manufacturing apparatus 41 includes an energy applying unit.
- the energy applying unit may be, for example, a radiation gun (electron gun) that irradiates an electron beam as an energy beam, or a laser irradiation unit that irradiates a laser beam as an energy beam, similarly to the energy applying unit in the first embodiment. It may be.
- An energy provision part irradiates an energy beam with respect to the irradiation area
- region is set to the downstream in the rotation direction R with respect to a powder supply part.
- the manufacturing apparatus 41 includes a flaw detection apparatus 44 including the probe 16.
- the longitudinal direction of the probe 16 is arranged along the radial direction of the work table.
- the probe 16 is disposed behind the brush portion 6 in the rotation direction R of the work table.
- the length in the X direction of the probe 16 corresponds to the length of the radius of the work table or the guide part 43, for example.
- the probe 16 may be longer than the diameter of the work table or the guide part 43, for example.
- the length of the probe 16 may be the same as the length of the brush portion 6 or may be shorter than the length of the brush portion 6.
- the probe 16 may be attached to the brush portion 6 or may be disposed at a position away from the brush portion 6.
- the probe 16 may also serve as a restricting unit.
- an energy provision process a powder supply process (a process of leveling the upper surface of the conductor powder), and a flaw detection process can be repeatedly performed in this order.
- the energy application step the metal powder 2 is melted or sintered by applying energy to the metal powder 2 while rotating the work table.
- the powder supply process the metal powder 2 is supplied to the supply area on the work table.
- the flaw detection process the surface layer portion of the three-dimensional part on the work table is detected.
- the brush portion 6 can be moved relative to the powder bed 42 on the work table. Thereby, the surface of the powder bed 42 can be leveled.
- the flaw detector 44 can be moved relative to the three-dimensional part on the work table. Thereby, it is possible to detect a three-dimensional part using the probe 16.
- the direction opposite to the rotation direction R of the work table is the scanning direction. This scanning direction is not along a straight line, but along a curved line that curves along an arc.
- the probe 16 may also serve as the brush portion 6.
- the manufacturing apparatus 41 rotates the work table to move the brush unit 6 and the probe 16 relative to the powder bed 42. However, the work table is stopped and the brush unit 6 and the probe 16 are powdered. You may move with respect to the floor 42.
- FIG. 12 is a plan view of the manufacturing apparatus 45 according to the fourth embodiment.
- the difference between the manufacturing apparatus 45 and the manufacturing apparatus 41 of the third embodiment is that a probe 31 is provided instead of the probe 16.
- the manufacturing apparatus 45 includes a flaw detection apparatus 46 provided with the probe 31.
- the probe 31 is the probe described in the second embodiment.
- the probe 31 is shorter than the brush portion 6 in the longitudinal direction (X direction in the drawing).
- the probe 31 is movable in the longitudinal direction with respect to the brush portion 6.
- the manufacturing apparatus 45 may include a probe moving mechanism that moves the probe 31 in the radial direction of the work table.
- the probe moving mechanism may include, for example, an electric motor, a hydraulic cylinder, a rack and pinion, a guide rail, a ball screw, and the like.
- a cylindrical three-dimensional part 3 is arranged on the work table.
- the probe moving mechanism can move the probe 31 onto the three-dimensional component 3.
- the probe 31 can be moved relative to the three-dimensional component 3 to detect flaws by rotating the work table.
- the flaw detector 46 may perform flaw detection by relatively moving the probe 31 in the circumferential direction of the three-dimensional component 3.
- FIG. 13 and 14 are diagrams showing a manufacturing apparatus 51 according to the fifth embodiment.
- the difference between the manufacturing apparatus 51 and the manufacturing apparatus 41 of the third embodiment shown in FIG. 11 is that a powder bed 42 having an opening formed in the center is held.
- the opening formed in the center of the powder bed 42 penetrates in the Z direction.
- the work table 4 has an annular shape in plan view.
- the guide part 43 includes a cylindrical outer wall 43a and an inner wall 43b.
- the powder bed 42 and the three-dimensional component 3 are arranged in a region between the outer wall 43a and the inner wall 43b.
- the manufacturing apparatus 51 includes a support portion 52 that supports the brush portion 6 and the probe 16.
- the support portion 52 has, for example, a rod shape and extends in the Z direction.
- the support portion 52 is disposed so as to penetrate the central opening of the powder bed 42.
- the end of the probe 16 on the center side is connected to the support portion 52.
- the support part 52 is arrange
- the support part 52 may be arrange
- the work table 4 and the guide part 43 can be rotated.
- the flaw detector 44 can detect the powder bed 42 using the probe 16.
- the probe 16 may also be configured to serve as a brush portion.
- the manufacturing apparatus 51 may include a probe 31 instead of the probe 16.
- the probe 31 can move in the radial direction of the powder bed 42, for example, along the brush portion 6.
- the configuration in which the probe is attached to the restricting portion is described, but the probe may be not attached to the restricting portion.
- the probe may be movable by a probe moving mechanism that is supported by another member and moves the probe in the scanning direction.
- the scanning direction of the probe may be the same as the moving direction of the restricting portion, or may be a direction intersecting with the moving direction of the restricting portion.
- the scanning direction is not limited to one direction, and may be a plurality of directions. For example, the structure provided with the some probe from which a scanning direction differs may be sufficient.
- the probe may be arranged on both sides in the movement direction of the restricting portion. For example, in FIG. 2, when the brush portion 6 moves to the right side, flaw detection can be performed by the probe 16 provided on the left side of the brush portion 6. When the brush portion 6 moves to the left side, the flaw can be detected by the probe 16 provided on the right side of the brush portion 6.
- the probe is attached to the restricting portion, but the probe may be attached to the front side of the restricting portion or may be built in the restricting portion.
- the probe itself may function as a regulating portion that levels the conductor powder.
- the probe should just be spaced apart and non-contacted with respect to a three-dimensional layered object.
- the work table 4 is rectangular, but the work table 4 is not limited to a rectangular one.
- the manufacturing apparatus 1 may include, for example, a circular work table and a circular guide part, and may include a circular storage part constituted by these work table and guide part.
- the mechanism for forming the powder layer in steps S1 and S4 is not limited to the above embodiment.
- the regulating unit may regulate the amount of the conductive powder to be supplied to be uniform and level the surface of the laminate.
- the manufacturing apparatus 1 may include a supply unit that supplies a certain amount of conductor powder while moving in one direction, and a probe is attached to the supply unit.
- the probe is not limited to the one attached to the restriction part.
- the probe may detect the flaw while moving following the movement of the restricting portion.
- the probe may move regardless of the movement of the restricting portion.
- the manufacturing apparatus may not include a restriction unit.
- the manufacturing apparatus and manufacturing method of the present disclosure are not limited to the powder bed type.
- the manufacturing apparatus and manufacturing method may be a powder deposition type.
- a probe can be provided in the material injection part (nozzle) that injects the conductor powder (material).
- the probe can be moved together with the material injection unit. Thereby, after injecting conductor powder from a material injection part and fusing or sintering, flaws can be detected by the probe.
- the probe is not limited to the one attached to the material injection unit.
- positioned in the position away from the material injection part may be sufficient. Thereby, even if the temperature of a material injection part rises at the time of beam irradiation, the heat transfer from a material injection part to a probe can be suppressed. As a result, the temperature rise of the probe is suppressed.
- the probe may be used for flaw detection while moving following the movement of the material injection unit. For example, the probe may be moved regardless of the movement of the material injection unit.
- the probe 16 including the pair of detection coils 22 disposed at positions overlapping the scanning direction inside the excitation coil 21 has been described. It does not need to be arranged at a position overlapping with.
- the pair of detection coils 22 may be arranged at positions overlapping in the direction intersecting the scanning direction.
- the position overlapping in the scanning direction includes the case where a part of the pair of detection coils 22 is arranged so as to overlap in the scanning direction.
- the center positions of the pair of detection coils 22 may not be arranged at the same position in the direction intersecting the scanning direction.
- the flaw detector may have a configuration in which three or more detection coils 22 are arranged inside the excitation coil 21.
- the manufacturing apparatuses 1, 41, 45, 51 and the three-dimensional layered object manufacturing method using the probes 16, 31 in which the pair of detection coils 22 are arranged inside the excitation coil 21 are described.
- flaw detection can be performed using other probes.
- flaw detection may be performed using a probe in which one detection coil is disposed inside the excitation coil, or flaw detection may be performed using a probe in which the detection coil is disposed outside the excitation coil.
- a three-dimensional layered object manufacturing apparatus a three-dimensional layered object manufacturing method, and flaw detection capable of flaw detection of the three-dimensional layered object during the manufacturing of the three-dimensional layered object Can be provided.
- Manufacturing device three-dimensional layered object manufacturing device 2 Metal powder (conductor powder) 3 Three-dimensional parts (three-dimensional layered objects) 3a Surface layer part 4 Work table (holding part) 5 Vertical position adjustment mechanism 6 Brush part (regulation part) 7 First moving mechanism (regulator moving mechanism, probe moving mechanism) 8 Radiation gun (energy application part) 15 Flaw detector 16, 31 Probe (flaw detector) 16a Probe bottom surface 20 Coil unit 21 Excitation coil 22 Detection coil 23 Ferrite core (iron core) 25, 42 Powder bed (laminated metal powder) XX direction (second direction) Y Y direction (first direction) Z Z direction (vertical direction)
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Abstract
Description
2 金属粉末(導電体粉末)
3 三次元部品(三次元積層造形物)
3a 表層部
4 作業テーブル(保持部)
5 上下方向位置調整機構
6 刷毛部(規制部)
7 第1移動機構(規制部移動機構、プローブ移動機構)
8 放射線銃(エネルギ付与部)
15 探傷装置
16、31 プローブ(探傷器)
16a プローブの底面
20 コイルユニット
21 励磁コイル
22 検出コイル
23 フェライトコア(鉄心)
25、42 粉末床(金属粉体の積層物)
X X方向(第2方向)
Y Y方向(第1方向)
Z Z方向(上下方向)
Claims (15)
- 導電体粉末に部分的にエネルギを付与して、前記導電体粉末を溶融又は焼結し硬化させ、三次元積層造形物を製造する三次元積層造形物製造装置であって、
前記導電体粉末を保持すると共に硬化した前記三次元積層造形物を保持する保持部と、
前記保持部に保持された前記導電体粉末にエネルギを付与するエネルギ付与部と、
硬化した前記三次元積層造形物の表層部に対して、離間して配置され、前記表層部を探傷するプローブと、
前記表層部に対して前記プローブを相対的に移動させるプローブ移動機構と、を備え、
前記プローブは、前記表層部に渦電流を生じさせる励磁コイルと、
前記表層部における磁界の変化を検出する検出コイルと、を含む三次元積層造形物製造装置。 - 前記保持部に保持された前記導電体粉末の上面を均す規制部と、
前記導電体粉末に対して前記規制部を相対的に移動させる規制部移動機構と、を更に備える請求項1に記載の三次元積層造形物製造装置。 - 前記プローブの底面が前記規制部の下端よりも上方に配置されている請求項2に記載の三次元積層造形物製造装置。
- 前記規制部移動機構は前記プローブ移動機構を兼ねている請求項2又は3に記載の三次元積層造形物製造装置。
- 前記プローブは、前記規制部の移動方向において、前記規制部の後側に配置されている請求項3に記載の三次元積層造形物製造装置。
- 前記プローブが前記規制部に取り付けられている請求項4又は5に記載の三次元積層造形物製造装置。
- 導電体粉末に部分的にエネルギを付与して、前記導電体粉末を溶融又は焼結し硬化させ、三次元積層造形物を製造する三次元積層造形物製造方法であって、
前記導電体粉末にエネルギを付与して、前記導電体粉末を溶融又は焼結させるエネルギ付与工程と、
硬化した前記三次元積層造形物の表層部に対して、離間して配置されたプローブを相対的に移動させて、前記表層部を探傷する探傷工程と、を含み、
前記探傷工程は、前記表層部に渦電流を生じさせる励磁工程と、
前記表層部における磁界の変化を検出する検出工程と、を含む三次元積層造形物製造方法。 - 前記導電体粉末に対して規制部を相対的に移動させ、保持部に保持された前記導電体粉末の上面を均す工程を更に含む請求項7に記載の三次元積層造形物製造方法。
- 前記均す工程を実行する際に、前記探傷工程を実行する請求項8に記載の三次元積層造形物製造方法。
- 前記探傷工程では、前記プローブの底面を前記規制部の下端よりも上方に配置して、前記規制部と共に前記プローブを相対的に移動させて、前記表層部を探傷する請求項9に記載の三次元積層造形物製造方法。
- 前記探傷工程では、前記規制部の相対的な移動方向において、前記規制部の後側に前記プローブを配置して、前記表層部を探傷する請求項10に記載の三次元積層造形物製造方法。
- 前記エネルギ付与工程を複数回実行した後に、複数層分の前記表層部について前記探傷工程を実行する請求項7~11の何れか一項に記載の三次元積層造形物製造方法。
- 製造途中の三次元積層造形物の表層部を探傷する探傷器であって、
走査方向である第1方向と交差する第2方向に延在するプローブを備え、
前記プローブは、前記第2方向に並んで配置された複数のコイルユニットを含み、
前記コイルユニットは、前記表層部に渦電流を生じさせる励磁コイルと、
前記励磁コイルの内側で並んで配置された一対の検出コイルと、を備える探傷器。 - 前記プローブに対して取り付けられた規制部を更に備える請求項13に記載の探傷器。
- 前記一対の検出コイルは、前記第1方向に重なる位置に配置されている請求項13又は14に記載の探傷器。
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CA3064833A CA3064833A1 (en) | 2017-05-26 | 2018-05-25 | Apparatus for producing three-dimensional multilayer model, method for producing three-dimensional multilayer model, and flaw detector |
US16/616,660 US11766824B2 (en) | 2017-05-26 | 2018-05-25 | Apparatus for producing three-dimensional multilayer model, method for producing three-dimensional multilayer model, and flaw detector |
CN201880034525.3A CN110678282B (zh) | 2017-05-26 | 2018-05-25 | 三维层叠造形物制造装置、三维层叠造形物制造方法以及探伤器 |
EP18805148.6A EP3632595A4 (en) | 2017-05-26 | 2018-05-25 | APPARATUS FOR PRODUCING A THREE-DIMENSIONAL MULTILAYER MODEL, PROCESS FOR PRODUCING A THREE-DIMENSIONAL MULTI-LAYER MODEL, AND FAULT DETECTOR |
JP2019520328A JP6885464B2 (ja) | 2017-05-26 | 2018-05-25 | 三次元積層造形物製造装置、三次元積層造形物製造方法及び探傷器 |
US17/513,375 US20220048108A1 (en) | 2017-05-26 | 2021-10-28 | Apparatus for producing three-dimensional multilayer model, method for producing three-dimensional multilayer model, and flaw detector |
US17/513,371 US11833748B2 (en) | 2017-05-26 | 2021-10-28 | Apparatus for producing three-dimensional multilayer model, method for producing three-dimensional multilayer model, and flaw detector |
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US17/513,371 Division US11833748B2 (en) | 2017-05-26 | 2021-10-28 | Apparatus for producing three-dimensional multilayer model, method for producing three-dimensional multilayer model, and flaw detector |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPWO2019077778A1 (ja) * | 2017-10-20 | 2020-11-05 | 国立大学法人 岡山大学 | 渦電流探傷法及び渦電流探傷装置 |
JP2021041568A (ja) * | 2019-09-09 | 2021-03-18 | 日本電子株式会社 | 3次元積層造形装置及び3次元積層造形方法 |
CN112548119A (zh) * | 2020-12-02 | 2021-03-26 | 中国科学院金属研究所 | 一种基于缺陷形态调控激光选区熔化成形钛合金工艺的方法 |
WO2024047903A1 (ja) * | 2022-08-30 | 2024-03-07 | 三菱重工業株式会社 | コイルモジュール、アレイプローブ、及び渦電流探傷装置 |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112238610A (zh) * | 2020-09-25 | 2021-01-19 | 杭州德迪智能科技有限公司 | 铺粉设备、3d打印装置及铺粉方法 |
CN114472920B (zh) * | 2021-12-31 | 2024-02-02 | 广东中科半导体微纳制造技术研究院 | 一种用于探针卡的探针的加工方法 |
DE102022130223A1 (de) | 2022-11-15 | 2024-05-16 | Bundesanstalt für Materialforschung und -Prüfung (BAM) | Prüfsystem und Verfahren zur in-situ Erkennung von Eigenschaften innerhalb eines verfestigten Pulvermaterials |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003240762A (ja) * | 2002-02-19 | 2003-08-27 | Univ Nihon | 渦電流探傷用プローブとそのプローブを用いた渦電流探傷装置 |
JP2003531034A (ja) | 2000-04-27 | 2003-10-21 | アルカム アーベー | 三次元製品を製造する装置及び方法 |
JP2010117370A (ja) * | 2010-02-22 | 2010-05-27 | Hitachi-Ge Nuclear Energy Ltd | 渦電流検査装置 |
JP2012247377A (ja) * | 2011-05-31 | 2012-12-13 | Hitachi Ltd | 渦電流検査装置及びそれを用いた検査方法 |
US20140159266A1 (en) * | 2011-08-27 | 2014-06-12 | MTU Aero Engines AG | Method and device for the generative production of a component |
US20150017054A1 (en) * | 2013-07-09 | 2015-01-15 | MTU Aero Engines AG | Control in generative production |
JP2016533432A (ja) * | 2013-09-09 | 2016-10-27 | カンパニー ジェネラレ デ エスタブリシュメンツ ミシュラン | 電磁応答プローブを備えた表面上に粉体床を堆積するための装置、及び対応する方法 |
Family Cites Families (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06342715A (ja) * | 1993-05-31 | 1994-12-13 | Tokin Corp | 圧粉磁芯およびその製造方法 |
US5659248A (en) * | 1994-10-17 | 1997-08-19 | General Electric Company | Multilayer eddy current probe array for complete coverage of an inspection surface without mechanical scanning |
JP3332215B2 (ja) | 1998-07-13 | 2002-10-07 | トヨタ自動車株式会社 | 積層造形鋳型、積層造形鋳型を用いた鋳造方法 |
CA2299373C (en) | 1998-08-06 | 2003-10-14 | Mitsubishi Heavy Industries, Ltd. | Eddy-current testing probe |
DE10235434A1 (de) | 2002-08-02 | 2004-02-12 | Eos Gmbh Electro Optical Systems | Vorrichtung und Verfahren zum Herstellen eins dreidimensionalen Objekts mittels eines generativen Fertigungsverfahrens |
JP4575029B2 (ja) * | 2004-05-27 | 2010-11-04 | オリンパス株式会社 | 渦流探傷装置のマルチコイル式プローブ |
ATE443587T1 (de) | 2005-05-11 | 2009-10-15 | Arcam Ab | Pulverauftragssystem |
JP2007106070A (ja) | 2005-10-17 | 2007-04-26 | Kokusai Kiban Zairyo Kenkyusho:Kk | 3次元積層造形方法とその装置 |
JP4866145B2 (ja) | 2006-05-17 | 2012-02-01 | 株式会社アスペクト | 粉末焼結積層造形装置及びその使用方法 |
DE102007056984A1 (de) | 2007-11-27 | 2009-05-28 | Eos Gmbh Electro Optical Systems | Verfahren zum Herstellen eines dreidimensionalen Objekts mittels Lasersintern |
US8018228B2 (en) * | 2008-06-13 | 2011-09-13 | Olympus Ndt | High resolution and flexible eddy current array probe |
WO2010095987A1 (en) | 2009-02-18 | 2010-08-26 | Arcam Ab | Apparatus for producing a three-dimensional object |
JP5562629B2 (ja) | 2009-12-22 | 2014-07-30 | 三菱重工業株式会社 | 探傷装置及び探傷方法 |
US8896300B2 (en) | 2010-07-08 | 2014-11-25 | Olympus Ndt Inc. | 2D coil and a method of obtaining EC response of 3D coils using the 2D coil configuration |
JP2012242358A (ja) * | 2011-05-24 | 2012-12-10 | Kobe Steel Ltd | 渦流探傷装置 |
JP5861829B2 (ja) | 2012-02-20 | 2016-02-16 | 株式会社Ihi | 渦流探傷方法および装置 |
FR2991208B1 (fr) | 2012-06-01 | 2014-06-06 | Michelin & Cie | Machine et procede pour la fabrication additive a base de poudre |
EP2916980B1 (en) | 2012-11-06 | 2016-06-01 | Arcam Ab | Powder pre-processing for additive manufacturing |
WO2015118508A1 (en) * | 2014-02-07 | 2015-08-13 | Instituto De Engenharia De Sistemas E Computadores - Investigação E Desenvolvimento | Eddy current probe with differential magnetic field sensors |
JP6421192B2 (ja) | 2014-09-17 | 2018-11-07 | 株式会社Fuji | 立体造形物の識別方法 |
CN111687416A (zh) | 2014-11-14 | 2020-09-22 | 株式会社尼康 | 造型装置及造型方法 |
US10786865B2 (en) | 2014-12-15 | 2020-09-29 | Arcam Ab | Method for additive manufacturing |
US20160349215A1 (en) * | 2014-12-23 | 2016-12-01 | Edison Welding Institute, Inc. | Non-destructive evaluation of additive manufacturing components using an eddy current array system and method |
US20180266993A1 (en) * | 2014-12-23 | 2018-09-20 | Edison Welding Institute, Inc. | Non-destructive evaluation of additive manufacturing components |
EP3159145B1 (en) | 2015-03-24 | 2020-07-01 | Technology Research Association for Future Additive Manufacturing | Powder supplying device, method for controlling powder supplying device,and three-dimensional shaping device |
US20160339519A1 (en) * | 2015-05-19 | 2016-11-24 | Lockheed Martin Corporation | In-process monitoring of powder bed additive manufacturing |
JP6472334B2 (ja) | 2015-06-03 | 2019-02-20 | 日立Geニュークリア・エナジー株式会社 | 渦電流検査装置 |
DE102016201290A1 (de) * | 2016-01-28 | 2017-08-17 | Siemens Aktiengesellschaft | Verfahren zur Qualitätssicherung und Vorrichtung |
JP6200599B1 (ja) | 2016-03-25 | 2017-09-20 | 技術研究組合次世代3D積層造形技術総合開発機構 | 3次元積層造形装置、3次元積層造形装置の制御方法および3次元積層造形装置の制御プログラム |
US20180036964A1 (en) | 2016-08-08 | 2018-02-08 | General Electric Company | Method and system for inspection of additive manufactured parts |
US11268933B2 (en) * | 2016-10-27 | 2022-03-08 | Jentek Sensors, Inc. | In-process quality assessment for additive manufacturing |
-
2018
- 2018-05-25 WO PCT/JP2018/020175 patent/WO2018216802A1/ja active Application Filing
- 2018-05-25 CA CA3064833A patent/CA3064833A1/en not_active Abandoned
- 2018-05-25 EP EP18805148.6A patent/EP3632595A4/en active Pending
- 2018-05-25 JP JP2019520328A patent/JP6885464B2/ja active Active
- 2018-05-25 US US16/616,660 patent/US11766824B2/en active Active
- 2018-05-25 CN CN201880034525.3A patent/CN110678282B/zh active Active
-
2021
- 2021-10-28 US US17/513,371 patent/US11833748B2/en active Active
- 2021-10-28 US US17/513,375 patent/US20220048108A1/en not_active Abandoned
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003531034A (ja) | 2000-04-27 | 2003-10-21 | アルカム アーベー | 三次元製品を製造する装置及び方法 |
JP2003240762A (ja) * | 2002-02-19 | 2003-08-27 | Univ Nihon | 渦電流探傷用プローブとそのプローブを用いた渦電流探傷装置 |
JP2010117370A (ja) * | 2010-02-22 | 2010-05-27 | Hitachi-Ge Nuclear Energy Ltd | 渦電流検査装置 |
JP2012247377A (ja) * | 2011-05-31 | 2012-12-13 | Hitachi Ltd | 渦電流検査装置及びそれを用いた検査方法 |
US20140159266A1 (en) * | 2011-08-27 | 2014-06-12 | MTU Aero Engines AG | Method and device for the generative production of a component |
US20150017054A1 (en) * | 2013-07-09 | 2015-01-15 | MTU Aero Engines AG | Control in generative production |
JP2016533432A (ja) * | 2013-09-09 | 2016-10-27 | カンパニー ジェネラレ デ エスタブリシュメンツ ミシュラン | 電磁応答プローブを備えた表面上に粉体床を堆積するための装置、及び対応する方法 |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPWO2019077778A1 (ja) * | 2017-10-20 | 2020-11-05 | 国立大学法人 岡山大学 | 渦電流探傷法及び渦電流探傷装置 |
JP2021041568A (ja) * | 2019-09-09 | 2021-03-18 | 日本電子株式会社 | 3次元積層造形装置及び3次元積層造形方法 |
JP7008669B2 (ja) | 2019-09-09 | 2022-01-25 | 日本電子株式会社 | 3次元積層造形装置及び3次元積層造形方法 |
CN112548119A (zh) * | 2020-12-02 | 2021-03-26 | 中国科学院金属研究所 | 一种基于缺陷形态调控激光选区熔化成形钛合金工艺的方法 |
WO2024047903A1 (ja) * | 2022-08-30 | 2024-03-07 | 三菱重工業株式会社 | コイルモジュール、アレイプローブ、及び渦電流探傷装置 |
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CA3064833A1 (en) | 2018-11-29 |
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