WO2018167714A1 - Procédé et dispositif de mesure d'aberration optique - Google Patents

Procédé et dispositif de mesure d'aberration optique Download PDF

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Publication number
WO2018167714A1
WO2018167714A1 PCT/IB2018/051749 IB2018051749W WO2018167714A1 WO 2018167714 A1 WO2018167714 A1 WO 2018167714A1 IB 2018051749 W IB2018051749 W IB 2018051749W WO 2018167714 A1 WO2018167714 A1 WO 2018167714A1
Authority
WO
WIPO (PCT)
Prior art keywords
article
image
projecting
conductive pattern
line
Prior art date
Application number
PCT/IB2018/051749
Other languages
English (en)
Inventor
Saleh AL-KARRI
Original Assignee
Sabic Global Technologies B.V.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sabic Global Technologies B.V. filed Critical Sabic Global Technologies B.V.
Publication of WO2018167714A1 publication Critical patent/WO2018167714A1/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/167—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by projecting a pattern on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
    • G01M11/0264—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested by using targets or reference patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G01N2021/9586—Windscreens

Definitions

  • This disclosure relates to methods and devices for measuring optical aberration, specifically to methods and devices for measuring optical aberration in transparent plastic articles that include a conductive pattern.
  • Transparent plastic articles such as polycarbonate glazing articles
  • polycarbonate glazing articles can include sun/moon roofs and windows.
  • the windows can include conductive pattern, such a defroster or an antenna.
  • Defroster applications of the polycarbonate glazing articles can have problems.
  • the conductive pattern can non-uniformly (e.g., heterogeneously) heats the polycarbonate glazing article which can lead to a non-uniform thermal expansion and cause optical aberration.
  • a method of measuring optical aberration caused by non-uniform or heterogeneous heating of a plastic article preferably a polycarbonate glazing article, having a plurality of edges enclosing an area with two opposite sides, at least one of the opposite sides comprising a conductive pattern for defrosting the article, and the method comprising: projecting an image from a projecting source through the article onto a projecting surface before activating the conductive pattern, such that a base image is created on the projecting surface, wherein the projecting surface and the projecting source are each at a distance different from zero from the article; locally heating the article through activation of the conductive pattern; subsequently projecting the image through the article onto the projecting surface such that an active image is created on the projecting surface; and comparing the base image and the active image to determine the optical distortion.
  • FIG. 2 is a top view of the apparatus of FIG. 1 ;
  • FIG. 3 is the apparatus of FIG. 1 with an image projected through a polycarbonate glazing article at an angle;
  • FIG. 4A is a base image
  • FIG. 4C is a close up view of a portion of the active image and the base image
  • FIG. 4D is a magnified view of section 4d from FIG. 4C;
  • FIG. 5 is the apparatus of FIG. 1 with an image projected through the polycarbonate glazing article at an angle perpendicular to a conductive pattern;
  • Fig. 6A is a base image
  • Fig. 6B is an active image
  • Fig. 6C is a comparison of the base image to the active image
  • a method and device for measuring optical aberration in a plastic article e.g., a transparent plastic article such as a polycarbonate glazing article.
  • An example of a plastic article affected by optical aberration is a
  • a method for measuring optical aberration comprises obtaining a base image and an active image and comparing the images.
  • the base images can be obtained by projecting an image through the article onto a projecting surface before the conductive pattern is activated; i.e., while it is deactivated.
  • the image can be projected from a projecting source, for example a laser, through the article onto a projecting surface.
  • the article, projecting source, and projecting surface can be mounted on a support or supports. The support(s) maintain the distance between the projecting source, the article, and the projecting surface for the generation of both the base image and the active image.
  • the article can be mounted to the support in a variety of ways, for example using a frame, a moveable frame, clamp, and so forth.
  • the article, the projecting source, and the projecting surface can be moveable relative to each other, or fixed in place on the support.
  • the article, the projecting source, and the projecting surface can also be moveable relative to the support, i.e. vertically.
  • the projecting source and projecting surface are located on opposite sides of the article.
  • the projecting source and the article can be arranged on the support such that an image can be projected from the projecting source through the desired portion of the article and onto the projecting surface.
  • the article can be mounted in between the projecting source and the projecting surface at a distance greater than zero.
  • the image can be projected from the projecting source at a predetermined angle with respect to the conductive pattern in the article, for example, the image can be projected perpendicular to the conductive pattern.
  • the image can form an angle from 0 to 90 degrees, for example an angle from 5 to 85 degrees, for example from 25 to 55 degrees, with a line of the conductive pattern. (See FIG. 3, angle ⁇ )
  • the projected image can cross the conductive pattern, at least partially, or the image can cross the entire conductive pattern.
  • the image can be any shape, preferably the image is a line.
  • the resulting image can be the base image, i.e. when the conductive pattern is not activated.
  • the base image can be recorded onto the projecting surface.
  • the conductive pattern can be activated, for example, by turning the on/off switch to on, thereby providing power to the conductive lines.
  • an active image can be obtained.
  • the temperature of the article can be monitored such that one the article attains a desired temperature, the active image can be formed.
  • the article can be heated by the conductive pattern to a temperature of less than or equal to 70°C.
  • the temperature of the article can be detected with a temperature detector (such as an infrared camera).
  • the temperature detector can be mounted on a support, or can be separate from a support.
  • the projecting source can project the image through the article onto the projecting surface, creating an active image.
  • the active image can be recorded onto the projecting surface.
  • the active image can be overlaid on the base image.
  • the active image can include interruptions from thermal expansion caused by the activation of the conductive pattern. In other words, the active image can be in segments. (See FIG. 6)
  • the active image can be compared to the base image to determine optical aberration, for example optical distortion. If the base image and the active images were formed from a projected image that was oriented at a non- parallel and non-perpendicular angle with respect to the conductive lines (e.g., at an angle of other than 90 degrees and 0 degrees), then an angle of distortion can be determined. In such a case, the base image is formed, and the active image is formed over the base image. The active image, although formed from a projected image that was projected at the same angle for producing the base image and the active image, if there is optical aberration the active image will have a different angle than the base image.
  • optical aberration for example optical distortion.
  • the angle of distortion is the angle between the base image and the segments of the active image. (See for example, FIG. 4D)
  • the angle of distortion between one, multiple, or all of the active image segments and the base image segments can be measured. If the angle of distortion is measured between more than one active image segment and base image segment, the angles of distortion can be compared and statistically analyzed to determine the effect of the conductive pattern for defrosting on optical aberration, for example optical distortion.
  • FIG. A more complete understanding of the components, processes, and apparatuses disclosed herein can be obtained by reference to the accompanying drawings.
  • FIG. These figures (also referred to herein as "FIG.") are merely schematic representations based on convenience and the ease of demonstrating the present disclosure, and are, therefore, not intended to indicate relative size and dimensions of the devices or components thereof and/or to define or limit the scope of the exemplary embodiments.
  • specific terms are used in the following description for the sake of clarity, these terms are intended to refer only to the particular structure of the embodiments selected for illustration in the drawings, and are not intended to define or limit the scope of the disclosure.
  • FIG. In the drawings and the following description below, it is to be understood that like numeric designations refer to components of like function.
  • FIG. 1 shows a device for measuring optical aberration.
  • a projecting source (1) can be mounted to an end of a support (30).
  • An article (10) can be mounted to the opposite end of the support (30).
  • the projecting source (1) can be mounted a distance (12) from the article (10).
  • a projecting surface (40) can be provided opposite the projecting source (1).
  • a temperature detector (35) can be arranged, as shown in FIG. 2, on the same side of the support (30) as the projecting source (1) such that the temperature detector can determine the temperature of the article (10).
  • the projecting source (1) can project an image (15) through the article (10).
  • the article (10) can include a conductive pattern for defrosting (20).
  • the image (15) can be projected from the projecting source (1) at a predetermined angle relative to one edge of the article (10).
  • the image (15) can be projected through the article (10), such that the image (15) can be recorded onto the projecting surface (40).
  • FIG. 4A depicts a base image (110).
  • FIG. 4B depicts an active image (105). The angle of distortion (100) between the active image (105) and the base image (110) can be measured, as shown in FIGS. 4C and 4D.
  • the projecting source (1) can project the image (15) at an angle perpendicular to the conductive pattern (210).
  • the base image (310) can appear broken into multiple segments, as shown in FIG. 6A.
  • the active image (300) can be broken into multiple segments, as shown in FIG. 6B.
  • This active image (300) can include line segments and interruptions of different lengths than those of the base image (310), as shown in FIG. 6C.
  • a method of measuring optical aberration caused by non-uniform or heterogeneous heating of an article preferably a plastic article such as a polycarbonate glazing article, having a plurality of edges enclosing an area with two opposite sides, at least one of the opposite sides comprising a conductive pattern for defrosting the article, and the method comprising: projecting an image from a projecting source through the article onto a projecting surface before activating the conductive pattern, such that a base image is created on the projecting surface, wherein the projecting surface and the projecting source are each at a distance different from zero (e.g., a distance greater than zero) from the article; locally heating the article through activation of the conductive pattern; subsequently projecting the image through the article onto the projecting surface such that an active image is created on the projecting surface; and comparing the base image and the active image to determine the optical distortion.
  • a plastic article such as a polycarbonate glazing article, having a plurality of edges enclosing an area with two opposite sides,
  • Aspect 2 The method of Aspect 1, wherein the image is projected through the article in a perpendicular direction to the conductive pattern.
  • Aspect 3 The method of Aspect 1 or 2, wherein the conductive pattern comprises a plurality of parallel lines that are parallel to at least one of the enclosing edges.
  • Aspect 4 The method of any of the preceding Aspects, further comprising recording the base image on the projecting surface, and overlaying the active image on the base image before comparing the base image and the active image.
  • Aspect 5 The method of any of the preceding Aspects, wherein the image is a line that crosses the conductive pattern at least partly, thereby forming a projected line with at least one interruption on the projecting surface.
  • Aspect 6 The method of Aspect 5, wherein the line forms an angle between 0 to 90 degrees, preferably an angle between 5 and 85 degrees, more preferably between 25 and 55 degrees with a line of the conductive pattern.
  • Aspect 7 The method of Aspect 6, wherein the line forms an angle different from 0 degrees or from 90 degrees with a line of the conductive pattern, and the method further comprises determining the angle enclosed between a line of the base image and a line of the active image.
  • Aspect 8 The method of Aspect 6, wherein the line and a line the conductive pattern are perpendicular to each other, and the method further comprises comparing the average length of the interruptions of a line of the base image with the average length of the interruptions of a line of the active image.
  • Aspect 9 The method of any of the preceding aspects, wherein the conductive pattern is connected to a power source, and wherein activation of the conductive pattern is achieved by switching on the power source.
  • Aspect 10 The method of any of the preceding aspects, wherein the distance between the glazing device and the projecting source is between 100 and 300 cm, preferably around 200 cm.
  • Aspect 11 The method of any of the preceding aspects, further comprising monitoring the local heating of the conductive pattern by means of a temperature detector.
  • Aspect 12 The method of any of the preceding aspects, wherein the article is a polycarbonate rear window for a vehicle.
  • Aspect 13 The method of any of the preceding aspects, wherein the optical aberration is at least one of optical distortion, color shifting, defocusing and polarization effect.
  • Aspect 14 The method of any of the preceding aspects, wherein the article is a polycarbonate glazing article with a defroster.
  • Aspect 15 The method of any of the preceding aspects, wherein the distance between the glazing device and the projecting source is between is greater than 10 cm, preferably 25 cm to 400 cm, or 50 cm to 300 cm.
  • an article preferably a plastic article, having a plurality of edges enclosing an area with two opposite sides, at least one of the opposite sides comprising a conductive pattern for defrosting the article, and the device comprising: a projecting source to project an image through the article; and a projecting surface for projecting the image thereupon; wherein the article is mounted between the projecting source and the projecting surface at a distance different from zero from each.
  • Aspect 17 The device of Aspect 16, further comprising a power source to activate the conductive pattern and non-uniformly heat the article.
  • Aspect 18 The device of Aspect 16 or 17, wherein the two opposite sides of the article each face either the projecting source or the projecting surface, such that a plane of the article is perpendicular to a projecting direction.
  • transparent refers to sufficient transparency such that the projecting source can project an image through the article to form an image on the projecting surface.
  • the invention may alternately comprise, consist of, or consist essentially of, any appropriate components herein disclosed.
  • the invention may additionally, or alternatively, be formulated so as to be devoid, or substantially free, of any components, materials, ingredients, adjuvants or species used in the prior art compositions or that are otherwise not necessary to the achievement of the function and/or objectives of the present invention.
  • the endpoints of all ranges directed to the same component or property are inclusive and independently combinable (e.g., ranges of "less than or equal to 25 wt , or 5 wt% to 20 wt ,” is inclusive of the endpoints and all intermediate values of the ranges of "5 wt% to 25 wt ,” etc.).
  • any reference to standards, regulations, testing methods and the like such as ASTM D1003, ASTM D4935, ASTM 1746, FCC part 18, CISPRl l, and CISPR 19 refer to the standard, regulation, guidance or method that is in force at the time of filing of the present application.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Geometry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

L'invention concerne un procédé de mesure d'aberration optique provoquée par un chauffage non uniforme ou hétérogène d'un article, de préférence un article en plastique, ayant une pluralité de bords entourant une zone avec deux côtés opposés, au moins l'un des côtés opposés comprenant un motif conducteur pour dégivrer l'article, et le procédé comprenant les étapes consistant à : projeter une image à partir d'une source de projection à travers l'article sur une surface de projection avant l'activation du motif conducteur, de telle sorte qu'une image de base est créée sur la surface de projection, la surface de projection et la source de projection étant chacune à une distance différente de zéro de l'article ; chauffer localement l'article par activation du motif conducteur; projeter ensuite l'image à travers l'article sur la surface de projection de telle sorte qu'une image active soit créée sur la surface de projection ; et comparer l'image de base et l'image active pour déterminer la distorsion optique.
PCT/IB2018/051749 2017-03-15 2018-03-15 Procédé et dispositif de mesure d'aberration optique WO2018167714A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201762471670P 2017-03-15 2017-03-15
US62/471,670 2017-03-15

Publications (1)

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WO2018167714A1 true WO2018167714A1 (fr) 2018-09-20

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110530278A (zh) * 2019-10-09 2019-12-03 易思维（杭州）科技有限公司 利用多线结构光测量间隙面差的方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07306152A (ja) * 1994-03-16 1995-11-21 Sekisui Chem Co Ltd 光学的歪検査装置
US20090282871A1 (en) * 2008-04-15 2009-11-19 Glasstech, Inc. Method and apparatus for measuring transmitted optical distortion in glass sheets
US20100252544A1 (en) * 2007-10-26 2010-10-07 Agc Flat Glass Europe Sa Glazing comprising a network of conducting wires
US20130228365A1 (en) * 2012-03-02 2013-09-05 Krishna K. Uprety Transparent laminates comprising inkjet printed conductive lines and methods of forming the same

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07306152A (ja) * 1994-03-16 1995-11-21 Sekisui Chem Co Ltd 光学的歪検査装置
US20100252544A1 (en) * 2007-10-26 2010-10-07 Agc Flat Glass Europe Sa Glazing comprising a network of conducting wires
US20090282871A1 (en) * 2008-04-15 2009-11-19 Glasstech, Inc. Method and apparatus for measuring transmitted optical distortion in glass sheets
US20130228365A1 (en) * 2012-03-02 2013-09-05 Krishna K. Uprety Transparent laminates comprising inkjet printed conductive lines and methods of forming the same

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110530278A (zh) * 2019-10-09 2019-12-03 易思维（杭州）科技有限公司 利用多线结构光测量间隙面差的方法
CN110530278B (zh) * 2019-10-09 2021-02-02 易思维（杭州）科技有限公司 利用多线结构光测量间隙面差的方法

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