WO2017206549A1 - 显示不良的维修方法 - Google Patents

显示不良的维修方法 Download PDF

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Publication number
WO2017206549A1
WO2017206549A1 PCT/CN2017/073886 CN2017073886W WO2017206549A1 WO 2017206549 A1 WO2017206549 A1 WO 2017206549A1 CN 2017073886 W CN2017073886 W CN 2017073886W WO 2017206549 A1 WO2017206549 A1 WO 2017206549A1
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Prior art keywords
pixel
repairing
display
poor
remaining structure
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PCT/CN2017/073886
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English (en)
French (fr)
Inventor
郝金刚
尚建兴
张惠博
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京东方科技集团股份有限公司
北京京东方光电科技有限公司
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Priority to US15/551,617 priority Critical patent/US20180236598A1/en
Publication of WO2017206549A1 publication Critical patent/WO2017206549A1/zh

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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K26/00—Working by laser beam, e.g. welding, cutting or boring
    • B23K26/352—Working by laser beam, e.g. welding, cutting or boring for surface treatment
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23P—METAL-WORKING NOT OTHERWISE PROVIDED FOR; COMBINED OPERATIONS; UNIVERSAL MACHINE TOOLS
    • B23P6/00—Restoring or reconditioning objects
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K2101/00—Articles made by soldering, welding or cutting
    • B23K2101/36—Electric or electronic devices
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
    • G09G2330/08—Fault-tolerant or redundant circuits, or circuits in which repair of defects is prepared
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
    • G09G2330/10—Dealing with defective pixels

Definitions

  • the present invention relates to the field of display technologies, and in particular, to a maintenance method that displays poorly.
  • Dot defects In the field of display technology, there are two types of dot (Dot) defects: one is poor pixel (pixel), and the other is bad in foreign matter in the cell.
  • the pixel defect is all parts of the whole pixel are bright or dark, that is: the pixel defect is divided into bright or dark spots, the customer has a number of requirements for the bright point and the dark point; the foreign object defect is usually a bad point with irregular shape.
  • the dead pixel does not occupy the entire pixel, and the customer has a requirement for the diameter D of the foreign object.
  • the difference between the pixel defect described above and the foreign matter defect is whether the bright spot fills the entire pixel.
  • the present invention provides a poorly displayed maintenance method for maintaining poor display to an acceptable level to a customer.
  • the present invention provides a maintenance method that is poorly displayed, including:
  • a display failure of the display panel is detected
  • the poorly displayed partial structure is repaired so that the size of the remaining structure that is poorly displayed is smaller than the inspection standard value.
  • the detecting that the display defect of the display panel comprises: detecting that the display failure of the display panel is a pixel defect;
  • the repairing the partial structure that is poorly displayed includes: repairing a part of the structure in which the pixel is poor, so that the size of the remaining structure of the pixel is smaller than the inspection standard value.
  • the pixel defect is a bright spot
  • the repairing the partial structure of the pixel is performed by: repairing a partial structure of the pixel defect to a partial dark spot, and the remaining structure of the poor display is a partial bright spot.
  • the partial dark spots comprise an annular structure, an inverted L-shaped structure, one or more rectangular structures or one or more circular structures.
  • the area of the remaining structure of the pixel defect is 1/6 to 1/2 of the total area of the pixel defect.
  • the area of the remaining structure of the poor pixel is 1/5 to 1/3 of the total area of the pixel defect.
  • the detecting that the display defect of the display panel comprises: detecting that the display failure of the display panel is a foreign matter defect;
  • the repairing the partial structure that is poorly displayed includes: repairing a part of the structure in which the foreign matter is bad, so that the size of the remaining structure of the foreign matter is less than the inspection standard value.
  • the diameter of the remaining poorly displayed structure is less than a test standard value.
  • the repairing the partially displayed poor structure comprises: performing laser repair on the poorly displayed partial structure.
  • the display failure of the display panel is detected, and the partial structure with poor display is repaired so that the size of the remaining structure that is poorly displayed is smaller than the inspection standard value, thereby achieving poor display. Repair to an acceptable level to the customer.
  • FIG. 1 is a schematic view of a bright spot in the prior art
  • Figure 2 is a schematic view of the dark spots repaired in Figure 1;
  • FIG. 3 is a schematic view of a foreign matter in the prior art
  • Figure 4 is a diameter dimension view of the foreign matter in Figure 3;
  • FIG. 5 is a flowchart of a method for repairing poor display according to Embodiment 1 of the present invention.
  • FIG. 6 is a flowchart of a poor display maintenance method according to Embodiment 2 of the present invention.
  • FIG. 7 is a schematic diagram of a pixel defect in the second embodiment
  • FIG. 8 is a schematic diagram of a remaining structure of a pixel defect in the second embodiment
  • FIG. 9 is a schematic view showing a shape of a remaining structure of a pixel in the second embodiment.
  • FIG. 10 is another schematic diagram showing the shape of the remaining structure of the pixel in the second embodiment
  • FIG. 11 is another schematic diagram showing the shape of the remaining structure of the pixel in the second embodiment
  • FIG. 12 is another schematic diagram showing the shape of the remaining structure of the pixel in the second embodiment
  • FIG. 13 is another schematic diagram showing the shape of the remaining structure of the pixel in the second embodiment
  • Figure 16 is a schematic view showing the defect of foreign matter in the third embodiment
  • Fig. 17 is a schematic view showing the remaining structure of the foreign matter in the third embodiment.
  • FIG. 1 is a schematic diagram of a bright spot in the prior art.
  • the pixels in the second row and the third column of the screen display green, and the remaining pixels display black, and the pixels in the second row and the third column show green highlights.
  • the pixel will also have red highlights or blue highlights.
  • the entire bright spot can now be turned into a dark spot by laser repair (for example, the green highlight in Figure 1 can be repaired as a dark spot).
  • 2 is a schematic view of the dark spots repaired in FIG. 1 , as shown in FIG.
  • the pixels in the second row and the third column display black, and the remaining pixels display in green, then the second row and the third column
  • the pixel is a dark spot formed after repairing the entire bright spot in Figure 1, which is displayed in black on a green screen.
  • a certain number of red and blue screens can be accepted, but dark spots in the green screen cannot be accepted, and the customer cannot accept a certain number of green highlights.
  • all customers have requirements for the number of dark spots that the entire spot is repaired. Usually, the number of such dark spots that the customer can accept is no more than two to five. Therefore, if there are too many bright spots, each will If the highlights are repaired to a dark spot, there is also a risk that the customer will not accept the number of dark spots.
  • the prior art maintenance method can not completely reach the customer's acceptance level by merely repairing the entire bright spot to a dark spot.
  • FIG. 3 is a schematic view showing a foreign matter defect in the prior art
  • FIG. 4 is a diameter dimension view of the foreign matter in FIG. 3, as shown in FIG. 3 and FIG. 4, a foreign matter defect occurs in a part of the pixels in the screen, and the foreign matter is defective in FIG. Displayed in white.
  • the diameter of the foreign matter is D.
  • the diameter D of the foreign matter is large, and the customer does not accept the foreign matter having a large diameter D.
  • FIG. 5 is a flowchart of a poor display maintenance method according to Embodiment 1 of the present invention. As shown in FIG. 5, the method includes:
  • step 101 the display failure of the display panel is detected.
  • the display panel can be detected to detect a display failure of the display panel.
  • Step 102 Perform maintenance on a part of the structure that is poorly displayed, so that the size of the remaining structure that is poorly displayed is smaller than the inspection standard value.
  • the burn-in maintenance can be performed on a portion of the structure that is poorly displayed.
  • the size of the remaining structure may be the diameter of the remaining structure, that is, whether the remaining structure after the repair can be accepted by the customer through the diameter of the remaining structure, and the diameter of the remaining structure showing poor performance after maintenance in this embodiment is smaller than The standard value is checked so that the poor display after repair is accepted by the customer.
  • the display panel is poorly displayed, and the poorly displayed partial structure is repaired so that the size of the remaining structure that is poorly displayed is smaller than the inspection standard value, thereby achieving poor display and maintenance to the customer. Degree.
  • FIG. 6 is a flowchart of a poor display maintenance method according to Embodiment 2 of the present invention. As shown in FIG. 6, the method includes:
  • Step 201 It is detected that the display failure of the display panel is a pixel defect.
  • the display panel includes a plurality of pixels. After detecting the display panel, it is detected that the display failure of the pixels in the second row and the third column is pixel defect M, and the pixel defect is a bright spot.
  • the bright spot is a green highlight, that is, the second row and the third column The entire pixel is shown in green.
  • Step 202 Perform maintenance on a part of the structure in which the pixel is defective, so that the size of the remaining structure of the pixel is smaller than the inspection standard value.
  • FIG. 8 is a schematic diagram showing the remaining structure of the pixel defect in the second embodiment.
  • the defective portion of the pixel structure can be repaired as a partial dark spot, and the defective remaining structure N is a partial bright spot.
  • a part of the structure in which the pixel is poor may be burned and repaired to repair the defective portion of the pixel into a partial dark spot. That is to say, in the present embodiment, the entire structure of the pixel defect is not repaired, but only the defective structure of the pixel is repaired.
  • the diameter of the remaining structure N is smaller than the inspection standard value, so as to meet the customer's requirements.
  • the inspection standard value can be set according to the customer's requirements.
  • the inspection standard value can be 0.1 mm to 0.5 mm.
  • the diameter of the remaining structure N may be the length of the diagonal.
  • the pixel defect no longer fills the entire pixel.
  • only part of the remaining structure is a part of the bright spot, and the part of the bright spot is no longer a bad pixel but becomes a foreign matter defect, so the foreign matter can be followed.
  • the bad criteria determine the size of the remaining structure. If the size of the remaining structure is smaller than the inspection standard value, it indicates that the remaining structure as a foreign matter is acceptable to the customer.
  • the area of the remaining structure N of the pixel defect is 1/6 to 1/2 of the total area of the pixel defect M.
  • the area of the remaining structure N of the pixel defect is 1/6 to 1/3 of the total area of the pixel defect M.
  • the area of the remaining structure N in which the pixel is poor in FIG. 8 is 1/ of the total area of the pixel defect M. 3. This allows customers to better accept pixel defects after repair.
  • the partial dark spots include an annular structure, an inverted L-shaped structure, one or more rectangular structures, or one or more circular structures.
  • the specific structure can be as shown in FIGS. 8 to 14.
  • part of the dark spots are rectangular structures, and the remaining structure N is a rectangular structure, and the remaining structure N is located at a lower portion of the pixel.
  • FIG. 9 is a schematic view showing a shape of a remaining structure of a pixel in the second embodiment. As shown in FIG. 9, a part of the dark point is a ring structure, and the remaining structure N is a rectangular structure, and the remaining structure N is located in the middle of the pixel. A portion of the dark spots surround the remaining structure N.
  • FIG. 10 is another schematic diagram of the remaining structure of the pixel defect in the second embodiment. As shown in FIG. 10, the partial dark point is a rectangular structure, and the remaining structure N is a rectangular structure, and the remaining structure N is located at an upper portion of the pixel.
  • FIG. 11 is another schematic diagram of the remaining structure of the pixel defect in the second embodiment.
  • the partial dark point is an inverted L-shaped structure
  • the remaining structure N is a rectangular structure, and a part of the dark point is located at the upper left of the pixel.
  • the remaining structure N is located at the lower right of the pixel.
  • FIG. 12 is another schematic diagram of the remaining structure of the pixel defect in the second embodiment.
  • a part of the dark spots includes two rectangular structures disposed oppositely, and the remaining structure N includes two rectangular knots disposed opposite each other.
  • the two rectangular structures in the partial dark spots are respectively located at the upper left corner and the lower right corner of the pixel, and the two rectangular structures in the remaining structure N are respectively located at the lower right corner and the lower left corner of the pixel.
  • FIG. 13 is another schematic diagram of the remaining structure of the pixel defect in the second embodiment.
  • the partial dark point includes two rectangular structures
  • the remaining structure N includes two rectangular structures, and the rectangular structure in a part of the dark dots.
  • the rectangular structure in the remaining structure N is alternately arranged.
  • FIG. 14 is another schematic diagram of the remaining structure of the pixel defect in the second embodiment. As shown in FIG. 14, a part of the dark spots includes one or more circular structures, and the remaining structure N is a circle surrounded by a plurality of circular structures. The structure in which the number of circular structures is three.
  • FIGS. 9 to 14 Only one pixel in which a pixel defect occurs in the display panel is shown in FIGS. 9 to 14 described above, and the remaining pixels are not specifically drawn. Moreover, the structures of some dark spots in FIG. 8 to FIG. 14 are only a few examples. In practical applications, some dark dots may also adopt other structures, which are not enumerated here.
  • the display failure of the display panel is a pixel defect
  • the defective structure of the pixel is repaired so that the size of the remaining structure of the pixel is smaller than the inspection standard value, thereby achieving poor pixel repair to The extent to which the customer is acceptable.
  • FIG. 15 is a flowchart of a poor display maintenance method according to Embodiment 3 of the present invention. As shown in FIG. 15, the method includes:
  • step 301 it is detected that the display failure of the display panel is a foreign matter defect.
  • Fig. 16 is a view showing a defect of foreign matter in the third embodiment. As shown in Fig. 16, the display failure detected by the display panel is a foreign matter defect A.
  • step 302 the partial structure of the foreign matter is repaired, so that the size of the remaining structure of the foreign matter is less than the inspection standard value.
  • FIG. 17 is a schematic view showing the remaining structure of the foreign matter in the third embodiment.
  • the part of the structure in which the foreign matter is defective can be subjected to buring maintenance, so that the diameter of the remaining structure B having the foreign matter is less than the inspection standard value, thereby satisfying the customer.
  • the test standard value can be set according to customer requirements.
  • the display failure of the display panel is a foreign matter defect
  • the partial structure of the foreign matter is repaired so that the size of the remaining structure of the foreign matter is less than the inspection standard value, thereby realizing the maintenance of the foreign matter to the defective The extent to which the customer is acceptable.

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Abstract

一种显示不良的维修方法。该方法包括：检测出显示面板的显示不良（101）；对所述显示不良的部分结构进行维修，以使显示不良的剩余结构的尺寸小于检验标准值（102），从而实现了将显示不良维修至客户可接受的程度。

Description

显示不良的维修方法
交叉引用
本申请要求于2016年6月1日提交的申请号为201610382226.1、名称为“显示不良的维修方法”的中国专利申请的优先权，该中国专利申请的全部内容通过引用全部并入本文。
技术领域
本发明涉及显示技术领域，特别涉及一种显示不良的维修方法。
背景技术
在显示技术领域，点(Dot)类不良有两种：一种是像素(pixel)不良，另一种是盒内(cell)的异物不良。其中，像素不良为整个像素所有部分均发亮或者发暗，即：像素不良分为亮点或者暗点，客户对亮点和暗点均有个数要求；异物不良通常为形状不规则的坏点，该坏点不会占满整个像素，客户对异物不良的直径D有要求。上述像素不良和异物不良的区别在于亮点是否占满整个像素。
现有技术中无论是像素不良还是异物不良，均没有一种维修方式能够将不良维修至客户可接受的程度。
发明内容
本发明提供一种显示不良的维修方法，用于将显示不良维修至客户可接受的程度。
为实现上述目的，本发明提供了一种显示不良的维修方法，包括：
检测出显示面板的显示不良；
对所述显示不良的部分结构进行维修，以使显示不良的剩余结构的尺寸小于检验标准值。
可选地，所述检测出显示面板的显示不良包括：检测出显示面板的显示不良为像素不良；
所述对所述显示不良的部分结构进行维修包括：对所述像素不良的部分结构进行维修，以使像素不良的剩余结构的尺寸小于检验标准值。
可选地，所述像素不良为亮点；所述对所述像素不良的部分结构进行维修包括：将像素不良的部分结构维修成部分暗点，所述显示不良的剩余结构为部分亮点。
可选地，所述部分暗点包括环形结构、倒L形结构、一个或者多个长方形结构或者一个或多个圆形结构。
可选地，所述像素不良的剩余结构的面积为像素不良的总面积的1/6至1/2。
可选地，所述像素不良的剩余结构的面积为像素不良的总面积的1/5至1/3。
可选地，所述检测出显示面板的显示不良包括：检测出显示面板的显示不良为异物不良；
所述对所述显示不良的部分结构进行维修包括：对所述异物不良的部分结构进行维修，以使异物不良的剩余结构的尺寸小于检验标准值。
可选地，所述显示不良的剩余结构的直径小于检验标准值。
可选地，所述对所述显示不良的部分结构进行维修包括：对所述显示不良的部分结构进行激光维修。
本发明具有以下有益效果：
本发明提供的显示不良的维修方法的技术方案中，检测出显示面板的显示不良，对显示不良的部分结构进行维修以使显示不良的剩余结构的尺寸小于检验标准值，从而实现了将显示不良维修至客户可接受的程度。
附图说明
图1为现有技术中亮点的示意图；
图2为图1中亮点维修成的暗点的示意图；
图3为现有技术中异物不良的示意图；
图4为图3中异物不良的直径尺寸图；
图5为本发明实施例一提供的一种显示不良的维修方法的流程图；
图6为本发明实施例二提供的一种显示不良的维修方法的流程图；
图7为实施例二中像素不良的示意图；
图8为实施例二中像素不良的剩余结构的示意图；
图9为实施例二中像素不良的剩余结构的一种形状示意图；
图10为实施例二中像素不良的剩余结构的另一种形状示意图；
图11为实施例二中像素不良的剩余结构的另一种形状示意图；
图12为实施例二中像素不良的剩余结构的另一种形状示意图；
图13为实施例二中像素不良的剩余结构的另一种形状示意图；
图14为实施例二中像素不良的剩余结构的另一种形状示意图；
图15为本发明实施三提供的一种显示不良的维修方法的流程图；
图16为实施例三中异物不良的示意图；
图17为实施例三中异物不良的剩余结构的示意图。
具体实施方式
为使本领域的技术人员更好地理解本发明的技术方案，下面结合附图对本发明提 供的显示不良的维修方法的进行详细描述。
图1为现有技术中亮点的示意图，如图1所示，在画面下第2行第3列的像素显示绿色，而其余像素显示黑色，则第2行第3列的像素出现绿色亮点。同理，像素还会出现红色亮点或者蓝色亮点的情况。目前可通过激光维修(burning维修)方式将整个亮点变为暗点，例如：图1中的绿色亮点可被维修为暗点。图2为图1中亮点维修成的暗点的示意图，如图2所示，在绿色画面下第2行第3列的像素显示黑色，而其余像素显示绿色，则第2行第3列的像素为图1中的整个亮点维修后形成的暗点，该暗点在绿色画面中显示为黑色。对于有些客户而言，可以接受一定数量的红色画面和蓝色画面中出现暗点，但是无法接受绿色画面中出点暗点，并且客户也无法接受一定数量的绿色亮点。此外，所有客户都对整个亮点维修成的暗点的个数有要求，通常客户可接受的此种暗点的个数不超过两个至五个，因此，如果亮点数量过多而将每个亮点都维修成暗点的话，也会存在因暗点个数超标而导致客户不接受的风险。综上所述，现有技术中的维修方法仅靠将整个亮点维修成暗点还无法彻底达到客户接受的程度。
图3为现有技术中异物不良的示意图，图4为图3中异物不良的直径尺寸图，如图3和图4所示，在画面下部分像素中出现异物不良，图3中该异物不良显示为白色。如图4所示，该异物不良的直径为D。该异物不良的直径D较大，而客户对于直径D较大的异物不良不接受。
图5为本发明实施例一提供的一种显示不良的维修方法的流程图，如图5所示，该方法包括：
步骤101、检测出显示面板的显示不良。
具体地，可对显示面板进行检测，检测出显示面板的显示不良。
步骤102、对显示不良的部分结构进行维修，以使显示不良的剩余结构的尺寸小于检验标准值。
具体地，可对显示不良的部分结构进行burning维修。优选地，剩余结构的尺寸可以为剩余结构的直径，也就是说，可通过剩余结构的直径判定维修后的剩余结构是否被客户所接受，本实施例中维修后显示不良的剩余结构的直径小于检验标准值，从而使得维修后的显示不良被客户接受。
本实施例提供的技术方案中，检测出显示面板的显示不良，对显示不良的部分结构进行维修以使显示不良的剩余结构的尺寸小于检验标准值，从而实现了将显示不良维修至客户可接受的程度。
图6为本发明实施例二提供的一种显示不良的维修方法的流程图，如图6所示，该方法包括：
步骤201、检测出显示面板的显示不良为像素不良。
图7为实施例二中像素不良的示意图，如图7所示，显示面板包括多个像素，通 过对显示面板进行检测，检测出第2行第3列像素出现的显示不良为像素不良M，该像素不良为亮点，本实施例中，该亮点为绿色亮点，即：第2行第3列的整个像素显示为绿色。
步骤202、对像素不良的部分结构进行维修，以使像素不良的剩余结构的尺寸小于检验标准值。
图8为实施例二中像素不良的剩余结构的示意图，如图8所示，可将像素不良的部分结构维修成部分暗点，显示不良的剩余结构N为部分亮点。具体地，可对像素不良的部分结构进行burning维修，以将像素不良的部分结构维修成部分暗点。也就是说，本实施例中并非对像素不良的整个结构进行维修，而是仅对像素不良的部分结构进行维修。维修后剩余结构N的直径小于检验标准值，从而满足客户要求，该检验标准值可根据客户要求进行设置，例如：检验标准值可以为0.1mm至0.5mm。其中，剩余结构N的直径可以为对角线的长度。当对像素不良的部分结构进行维修后，该像素不良不再占满整个像素，此时仅有部分剩余结构为部分亮点，该部分亮点不再为像素不良而是成为异物不良，因此可以按照异物不良的判定标准对剩余结构的尺寸进行判定。若剩余结构的尺寸小于检验标准值，表明作为异物不良的剩余结构对于客户来说是可接受的。
如图7和图8所示，像素不良的剩余结构N的面积为像素不良M的总面积的1/6至1/2。优选地，像素不良的剩余结构N的面积为像素不良M的总面积的1/6至1/3，例如：图8中像素不良的剩余结构N的面积为像素不良M的总面积的1/3。从而使得客户能够更好的接受维修后的像素不良。
本实施例中，部分暗点包括环形结构、倒L形结构、一个或者多个长方形结构或者一个或多个圆形结构。具体结构可如图8至图14所示。
如图8所示，本实施例中，部分暗点为长方形结构，则剩余结构N为长方形结构，且该剩余结构N位于像素的下部。
图9为实施例二中像素不良的剩余结构的一种形状示意图，如图9所示，部分暗点为环形结构，则剩余结构N为长方形结构，且剩余结构N位于像素的中部，所述部分暗点环绕所述剩余结构N。
图10为实施例二中像素不良的剩余结构的另一种形状示意图，如图10所示，部分暗点为长方形结构，则剩余结构N为长方形结构，且该剩余结构N位于像素的上部。
图11为实施例二中像素不良的剩余结构的另一种形状示意图，如图11所示，部分暗点为倒L形结构，则剩余结构N为长方形结构，且部分暗点位于像素的左上方，剩余结构N位于像素的右下方。
图12为实施例二中像素不良的剩余结构的另一种形状示意图，如图12所示，部分暗点包括相对设置的二个长方形结构，剩余结构N包括相对设置的二个长方形结 构，部分暗点中的二个长方形结构分别位于像素的左上角和右下角，剩余结构N中的二个长方形结构分别位于像素的右下角和左下角。
图13为实施例二中像素不良的剩余结构的另一种形状示意图，如图13所示，部分暗点包括二个长方形结构，剩余结构N包括二个长方形结构，部分暗点中的长方形结构和剩余结构N中的长方形结构交替设置。
图14为实施例二中像素不良的剩余结构的另一种形状示意图，如图14所示，部分暗点包括一个或多个圆形结构，剩余结构N为像素中环绕多个圆形结构设置的结构，其中圆形结构的数量为三个。
上述图9至图14中仅示出了显示面板中出现像素不良的一个像素，其余像素未具体画出。并且图8至图14中部分暗点的结构仅为几种示例，在实际应用中，部分暗点还可以采用其它结构，此处不再一一列举。
本实施例提供的技术方案中，检测出显示面板的显示不良为像素不良，对像素不良的部分结构进行维修以使像素不良的剩余结构的尺寸小于检验标准值，从而实现了将像素不良维修至客户可接受的程度。
图15为本发明实施三提供的一种显示不良的维修方法的流程图，如图15所示，该方法包括：
步骤301、检测出显示面板的显示不良为异物不良。
图16为实施例三中异物不良的示意图，如图16所示，通过对显示面板进行检测，检测出的显示不良为异物不良A。
步骤302、对异物不良的部分结构进行维修，以使异物不良的剩余结构的尺寸小于检验标准值。
图17为实施例三中异物不良的剩余结构的示意图，如图17所示，可对异物不良的部分结构进行buring维修，以使异物不良的剩余结构B的直径小于检验标准值，从而满足客户要求，该检验标准值可根据客户要求进行设置。
本实施例提供的技术方案中，检测出显示面板的显示不良为异物不良，对异物不良的部分结构进行维修以使异物不良的剩余结构的尺寸小于检验标准值，从而实现了将异物不良维修至客户可接受的程度。
可以理解的是，以上实施方式仅仅是为了说明本发明的原理而采用的示例性实施方式，然而本发明并不局限于此。对于本领域内的普通技术人员而言，在不脱离本发明的精神和实质的情况下，可以做出各种变型和改进，这些变型和改进也视为本发明的保护范围。

Claims (9)

  1. 一种显示不良的维修方法，其特征在于，包括：
    检测出显示面板的显示不良；
    对所述显示不良的部分结构进行维修，以使显示不良的剩余结构的尺寸小于检验标准值。
  2. 根据权利要求1所述的显示不良的维修方法，其特征在于，所述检测出显示面板的显示不良包括：检测出显示面板的显示不良为像素不良；
    所述对所述显示不良的部分结构进行维修包括：对所述像素不良的部分结构进行维修，以使像素不良的剩余结构的尺寸小于检验标准值。
  3. 根据权利要求2所述的显示不良的维修方法，其特征在于，所述像素不良为亮点；所述对所述像素不良的部分结构进行维修包括：将像素不良的部分结构维修成部分暗点，所述显示不良的剩余结构为部分亮点。
  4. 根据权利要求3所述的显示不良的维修方法，其特征在于，所述部分暗点包括环形结构、倒L形结构、一个或者多个长方形结构或者一个或多个圆形结构。
  5. 根据权利要求2所述的显示不良的维修方法，其特征在于，所述像素不良的剩余结构的面积为像素不良的总面积的1/6至1/2。
  6. 根据权利要求5所述的显示不良的维修方法，其特征在于，所述像素不良的剩余结构的面积为像素不良的总面积的1/5至1/3。
  7. 根据权利要求1所述的显示不良的维修方法，其特征在于，所述检测出显示面板的显示不良包括：检测出显示面板的显示不良为异物不良；
    所述对所述显示不良的部分结构进行维修包括：对所述异物不良的部分结构进行维修，以使异物不良的剩余结构的尺寸小于检验标准值。
  8. 根据权利要求1至7任一所述的显示不良的维修方法，其特征在于，所述显示不良的剩余结构的直径小于检验标准值。
  9. 根据权利要求1至8任一所述的显示不良的维修方法，其特征在于，所述对所述显示不良的部分结构进行维修包括：对所述显示不良的部分结构进行激光维修。
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