WO2017181755A1 - 用于点灯测试的调节装置和点灯测试装置 - Google Patents

用于点灯测试的调节装置和点灯测试装置 Download PDF

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Publication number
WO2017181755A1
WO2017181755A1 PCT/CN2017/072461 CN2017072461W WO2017181755A1 WO 2017181755 A1 WO2017181755 A1 WO 2017181755A1 CN 2017072461 W CN2017072461 W CN 2017072461W WO 2017181755 A1 WO2017181755 A1 WO 2017181755A1
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WO
WIPO (PCT)
Prior art keywords
probe
lighting test
indenter
test according
adjusting device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/CN2017/072461
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English (en)
French (fr)
Inventor
韩龙
刘利宾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BOE Technology Group Co Ltd
Ordos Yuansheng Optoelectronics Co Ltd
Original Assignee
BOE Technology Group Co Ltd
Ordos Yuansheng Optoelectronics Co Ltd
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Publication date
Application filed by BOE Technology Group Co Ltd, Ordos Yuansheng Optoelectronics Co Ltd filed Critical BOE Technology Group Co Ltd
Priority to US15/549,303 priority Critical patent/US10565910B2/en
Publication of WO2017181755A1 publication Critical patent/WO2017181755A1/zh
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets

Definitions

  • At least one embodiment of the present disclosure is directed to an adjustment device and a lighting test device for a lighting test.
  • the display products include, for example, a liquid crystal display (LCD) and an Active-Matrix Organic Light Emitting Diode (AMOLED) display.
  • LCD liquid crystal display
  • AMOLED Active-Matrix Organic Light Emitting Diode
  • At least one embodiment of the present disclosure is directed to an adjustment device and a lighting test device for a lighting test to facilitate testing different types of to-be-lighted test products.
  • At least one embodiment of the present disclosure provides an adjustment apparatus for a lighting test, including a substrate and first and second indenters disposed on the substrate, the first indenter and the second indenter
  • the substrate may be disposed on the substrate so as to be movable relative to each other such that the distance between the two is adjustable, and the first indenter and the second indenter are respectively provided with probes for contacting the product to be lit.
  • At least one embodiment of the present disclosure also provides a lighting test apparatus comprising any of the adjustment devices for lighting test described in the embodiments of the present disclosure.
  • FIG. 1 is a front view of an adjusting device for a lighting test according to an embodiment of the present disclosure
  • FIG. 2 is a schematic diagram of an adjustment device for testing a to-be-lighted test product for a lighting test according to an example of the present disclosure
  • FIG. 3 is a top plan view of an adjusting device for a lighting test according to an example of the present disclosure
  • Figure 4a is a cross-sectional view taken along line A-A' of Figure 3 (the first indenter is mated with the substrate);
  • Figure 4b is a cross-sectional view taken along line A-A' of Figure 3 (the first indenter is mated with the substrate);
  • Figure 4c is a cross-sectional view taken along line A-A' of Figure 3 (the first indenter is mated with the substrate);
  • Figure 4d is a cross-sectional view taken along line A-A' of Figure 3 (the first indenter is mated with the substrate);
  • FIG. 5 is a top plan view of an adjustment device for a lighting test provided by another example of the present disclosure.
  • Figure 6a is a cross-sectional view taken along line C-C' of Figure 5 (the first indenter is mated with the substrate);
  • Figure 6b is a cross-sectional view taken along line C-C' of Figure 5 (the first indenter is mated with the substrate);
  • Figure 7a is a cross-sectional view taken along line B-B' of Figure 3 (the second indenter is mated with the substrate);
  • Figure 7b is a cross-sectional view taken along line B-B' of Figure 3 (the second indenter is mated with the substrate);
  • Figure 8a is a cross-sectional view taken along line D-D' of Figure 5 (the second indenter is mated with the substrate);
  • Figure 8b is a cross-sectional view taken along line D-D' of Figure 5 (the second indenter is mated with the substrate);
  • 9a is a schematic diagram of a first probe adjustment mechanism disposed on an adjustment device for a lighting test according to an example of the present disclosure
  • Figure 9b is a cross-sectional view taken along line E-E' of Figure 9a;
  • 9c is a schematic diagram of a first probe strip of an adjustment device for a lighting test according to an example of the present disclosure
  • FIG. 9d is a schematic diagram of a first driving rod of an adjusting device for a lighting test according to an example of the present disclosure.
  • FIG. 10a is a schematic diagram of a second probe adjustment mechanism disposed on an adjustment device for a lighting test according to an example of the present disclosure
  • Figure 10b is a cross-sectional view taken along the line F-F' of Figure 10a;
  • FIG. 10c is a schematic diagram of a second probe strip of an adjusting device for a lighting test according to an example of the present disclosure
  • FIG. 10d is a schematic diagram of a second driving rod of an adjusting device for a lighting test according to an example of the present disclosure.
  • each fixed type of display product needs to be customized to correspond to the lighting machine.
  • Each lighting machine can only be used for one or two fixed models, and cannot correspond to other different models.
  • At least one embodiment of the present disclosure provides an adjustment device for a lighting test for a lighting test device, which can correspond to lighting tests of different types of products.
  • an embodiment of the present disclosure provides an adjustment apparatus for a lighting test, comprising a substrate 01 and a first indenter 02 and a second indenter 03 disposed on the substrate 01, the first indenter 02 and The second indenter 03 can be disposed on the substrate 01 so as to be movable relative to each other such that the distance between the two is adjustable, and the first indenter 02 and the second indenter 03 are respectively provided to contact the to-be-lighted test product 09 (
  • the lamp test product 09 please refer to the probe 08 of Fig. 2) (see Fig. 3 for the probe 08).
  • the distance between the first indenter 02 and the second indenter 03 can be adjusted, so that different types of to-be-lighted test products can be tested.
  • first indenter 02 and the second indenter 03 may be disposed on the substrate 01 so as to be movable relative to each other.
  • the first indenter 02 or the second indenter 03 may be moved on the substrate 01, or both. Both can be moved on the substrate 01 so that the distance between the first indenter 02 and the second indenter 03 can be adjusted.
  • FIG. 3 and 5 show the mating structures of the two first indenters 02 and the second indenter 03 with the substrate. It should be noted that FIG. 3 and FIG. 5 are only schematic representations. In the embodiment of the present disclosure, the mating structures of the first indenter 02 and the second indenter 03 and the substrate are not limited.
  • the substrate 01 is provided with a first moving mechanism 011
  • the first pressing head 02 is provided with a second moving mechanism 021 matching the first moving mechanism 011, So that the first indenter 02 can move relative to the substrate 01.
  • one of the first moving mechanism 011 and the second moving mechanism 021 is a first groove 0111, and the other is a first protrusion 0211.
  • the first groove 0111 and the first protrusion 0211 are coupled to each other so as to be relatively movable.
  • first moving mechanism 011 first groove 0111
  • second moving mechanism 021 the first A protrusion 0211
  • first indenter 02 first indenter 02
  • first moving mechanism 011 first groove 0111
  • second moving mechanism 021 first protrusion 0211
  • the first protrusion in order to better move the first indenter along a plane on the substrate 01, the first protrusion may have a protrusion thereon, and correspondingly, have a first in the first groove.
  • a raised groove on the projection As shown in Fig. 4d, the first protrusion may have a groove thereon, and correspondingly, a protrusion matching the groove on the first protrusion may be formed in the first groove.
  • the groove and the protrusion can form a card slot structure, and the groove and the protrusion can be relatively moved.
  • the cooperation of the grooves and the projections of other portions can be referred to the above description and illustration.
  • the adjustment device for the lighting test may further include a first bolt 04 for fixing the first ram 02 on the substrate 01. After the first indenter is moved to a suitable position, the first bolt 04 can be fastened to fix the first indenter 02 on the substrate 01.
  • a third moving mechanism 0011 is disposed on the substrate 01, and a fourth moving mechanism matched with the third moving mechanism 0011 is disposed on the second pressing head 03. 031, so that the second indenter 03 can move relative to the substrate 01.
  • one of the third moving mechanism 0011 and the fourth moving mechanism 031 is the second groove 00111, and the other is the second protrusion 0311.
  • the second groove 00111 and the second protrusion 0311 are coupled to each other so as to be relatively movable.
  • the third moving mechanism 0011 (second groove 00111) may also be disposed on the second ram 03, and correspondingly, the fourth moving mechanism 031 (second protrusion 0311) is disposed on the substrate 01.
  • the structural design and the matching of the second recess 00111 and the second protrusion 0311 reference may be made to the descriptions of the first recess 0111 and the first protrusion 0211, and details are not described herein again.
  • the adjustment device for the lighting test may further include a second bolt 05 for fixing the second ram 03 on the substrate 01. After the second ram is moved to the proper position, the second bolt 05 can be fastened to fix the second ram 03 on the substrate 01.
  • Both the first indenter 02 and the second indenter 03 can be moved (slid) on the substrate 01, and the first bolt 04 and the second bolt 05 are provided as an example to test the test products of different sizes to be lit. Different distances are obtained by adjusting (for example, manually adjusting) the positions of the first indenter 02 and the second indenter 03 (between To adapt to the size of the different test products to be lit, corresponding to the cell test pad area, after the position adjustment of the first indenter 02 and the second indenter 03 is completed, the first indenter 02 and the first The second rams 03 are fixed to the substrate 01 by the first bolts 04 and the second bolts 05, respectively. For example, the first bolt 04 can be screwed into the corresponding position of the long hole on the first ram 02, and the second bolt 05 can be screwed into the corresponding position of the long hole on the second ram 03.
  • first probe adjustment mechanism 10 on the first indenter 02, or to provide the second probe adjustment mechanism 210 on the second indenter 03, or both on the first indenter 02.
  • the first probe adjustment mechanism 10 is disposed, and the second probe adjustment mechanism 210 is also disposed on the second ram 03. This embodiment of the present disclosure does not limit this. The details are described below.
  • a first probe adjustment mechanism 10 is provided on the first ram 02, and the first probe adjustment mechanism 10 is movable along the surface of the first ram 02.
  • the first probe adjustment mechanism 10 includes a plurality of first probe strips 101, each of which includes a plurality of probes 08 (eg, a plurality of probes 08 can be secured to the first probe strip 101)
  • the plurality of first probe strips 101 are relatively movable to adjust the distance at which the probes 08 on the different first probe strips 101 are staggered.
  • the position of the probe 08 on the first probe adjusting mechanism 10 can be adjusted, and thus the test product to be lit can be corresponding to the test area (pad area).
  • the application of the adjustment device for the lighting test can be further extended. It should be noted that, during the lighting test, the probe structure of the same structure as that of the pad area of the product to be lighted can be formed by adjusting the first probe strip to complete the lighting test.
  • a third groove 022 is disposed on one of each of the first probe strips 101 and the first indenter 02, and a third protrusion 1012, a third groove 022 is disposed on the other.
  • the third protrusions 1012 are coupled to each other so as to be relatively movable.
  • the third recess 022 is disposed on the first indenter 02
  • the third protrusion 1012 is disposed on the first probe strip 101 as an example.
  • the three grooves 022 may also be disposed on the first probe strip 101, and correspondingly, the third protrusions 1012 are disposed on the first indenter 02.
  • the structural design and the matching of the third recess 022 and the third protrusion 1012 reference may be made to the description of the first recess 0111 and the first protrusion 0211, and details are not described herein again.
  • the adjustment means for the lighting test may further comprise a first drive rod 15, each The first probe strip 101 is further provided with a first threaded hole 1013, and the first screw on the first driving rod 15 The rib 151 is engaged with the first threaded hole 1013 so that the first probe strip 101 can be moved in the extending direction of the first driving rod 15 by rotating the first driving rod 15, thereby adjusting the adjacent first probe strip 101
  • the distance of the probe 08 is staggered.
  • a first knob 16 can also be provided on the first drive rod 15 for ease of adjustment.
  • the first drive rod 15 can be rotated by the first knob 16 such that the gears between adjacent first probe strips 101 rotate, such that the probes on adjacent first probe strips 101 move relative to each other.
  • a first gearing mechanism 13 is disposed between adjacent first probe strips 101.
  • the first gear transmission mechanism 13 includes a first gear set 131 and a second gear set 132 that are matched with each other.
  • the first gear set 131 and the second gear set 132 are respectively disposed on the adjacent first probe strips 101, first Gear set 131 and second gear set 132 each include at least one gear 130.
  • the gear 130 can be mounted on the first probe strip 101 by a first gear shaft 1015.
  • the gears in the first gear set 131 and the second gear set 132 mesh, so that the adjacent two first probe strips 101 can be moved on the first indenter 02 by gear transmission, thereby adjusting the adjacent two rows of probes. The distance between the staggered.
  • the first drive rod 15 can be mated with the first gear transmission mechanism 13 to precisely adjust the distance of the probe misalignment between the different first probe strips 101, for example, by adjusting the rotation of the first drive rod 15
  • the number further adjusts the degree of travel of the gear 130.
  • the gear 130 also rotates once when the first drive lever 15 rotates one revolution, but is not limited thereto.
  • a second probe adjustment mechanism 210 is provided on the second ram 03, and the second probe adjustment mechanism 210 is movable along the surface of the second ram 03.
  • the second probe adjustment mechanism 210 includes a plurality of second probe strips 2101, each of the second probe strips 2101 includes a plurality of probes 08 (eg, a plurality of probes 08 can be secured to the second probe strip 2101
  • the plurality of second probe strips 2101 are relatively movable to adjust the distance at which the probes on the different second probe strips 2101 are staggered. Thereby, the position of the probe 08 on the second probe adjusting mechanism 210 can be adjusted, and thus the product to be tested can be tested corresponding to different test areas.
  • the application of the adjustment device for the lighting test can be further extended.
  • a fourth groove 032 is disposed on one of each of the second probe strips 2101 and the second rams 03, and a fourth protrusion 21012, a fourth groove 032 and The fourth protrusions 21012 are mated to each other so as to be relatively movable, thereby adjusting the distance at which the probes 08 on the adjacent second probe strips 2101 are staggered.
  • the fourth groove 032 is disposed on the second ram 03 in FIG. 10b.
  • the fourth protrusion 21012 is disposed on the second probe strip 2101 as an example.
  • the fourth groove 032 may also be disposed on the second probe strip 2101, correspondingly
  • the fourth protrusion 21012 is disposed on the second indenter 03.
  • the adjustment means for the lighting test may further include a second drive rod 215, each of which The second probe strip 2101 is further provided with a second threaded hole 21013, and the second thread 2151 on the second driving rod 215 is engaged with the second threaded hole 21013 so that the second probe strip 2101 can be made by rotating the second driving rod 215. It is movable along the extending direction of the second driving rod 215.
  • a second knob 216 can also be provided on the second drive rod 215 to facilitate adjustment.
  • the second drive rod 215 can be rotated by rotating the second knob 216 such that the gears between the adjacent second probe strips 2101 are rotated, so that the probes on the adjacent second probe strips 2101 of 21015 are relatively moved. .
  • a second gear transmission mechanism 213 is disposed between adjacent second probe strips 2101.
  • the second gear transmission mechanism 213 includes a third gear set 2131 and a fourth gear set 2132 that are matched with each other.
  • the third gear set 2131 and the fourth gear set 2132 are respectively disposed on the adjacent second probe strips 2101, and the third Gear set 2131 and fourth gear set 2132 each include at least one gear 130.
  • the gear 130 can be mounted on the second probe strip 2101 via the second gear shaft 21015.
  • the gears in the third gear set 2131 and the fourth gear set 2132 are meshed, so that the adjacent two second probe bars 2101 can be moved on the third ram 03 by gear transmission, thereby adjusting the adjacent two rows of probes. Staggered distance.
  • the second drive rod 215 can be mated with the second gear transmission mechanism 213 to precisely adjust the distance of the probe misalignment between the different second probe strips 2101, for example, by adjusting the rotation of the second drive rod 215
  • the number further adjusts the degree of travel of the gear 130.
  • the gear 130 also rotates once when the second drive lever 215 rotates one revolution, but is not limited thereto.
  • the scale 17 may be provided on at least one of the first indenter 02 and the second indenter 03.
  • the setting of the scale 17 can observe the displacement between any two rows of probes, which can make the adjustment of the probe staggering distance more convenient and more basis.
  • the distance between adjacent scales may be 0.1 mm, but is not limited thereto.
  • the adjustment device for the lighting test can also include a fixture 06 for connection to the lighting test device.
  • the fixture 06 can be configured to secure the adjustment device for the lighting test to the lighting test device.
  • At least one embodiment of the present disclosure provides a lighting test apparatus including any of the adjustment devices for lighting test described in the embodiments of the present disclosure.
  • the adjusting device and the lighting test device for the lighting test provided by the embodiments of the present disclosure solve the problem that the lighting test device corresponding to each model product needs to be specially customized, and can be corresponding to the lighting test of different types of products, and can effectively Save on the cost of lighting testing.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Non-Portable Lighting Devices Or Systems Thereof (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

一种用于点灯测试的调节装置和包括点灯测试的调节装置的点灯测试装置。用于点灯测试的调节装置包括基板（01）以及设置在基板（01）上的第一压头（02）和第二压头（03），第一压头（02）和第二压头（03）可彼此相对移动地设置在基板（01）上，因此二者之间的距离可调节，并且第一压头（02）和第二压头（03）上分别设置有用以接触待点灯测试产品的探针（08）。

Description

用于点灯测试的调节装置和点灯测试装置 技术领域
本公开至少一实施例涉及一种用于点灯测试的调节装置和点灯测试装置。
背景技术
在显示产品的制造过程中，对于完成背板工艺和封装的产品需要应用点灯机进行点亮测试。显示产品例如包括液晶显示器(Liquid Crystal Display，LCD)和有源矩阵有机发光二极管(Active-Matrix Organic Light Emitting Diode，AMOLED)显示器。
发明内容
本公开的至少一实施例涉及一种用于点灯测试的调节装置和点灯测试装置，以便于测试不同型号的待点灯测试产品。
本公开至少一实施例提供一种用于点灯测试的调节装置，包括基板以及设置在所述基板上的第一压头和第二压头，所述第一压头和所述第二压头可彼此相对移动地设置在所述基板上由此二者之间的距离可调节，并且所述第一压头和所述第二压头上分别设置有用以接触待点灯测试产品的探针。
本公开至少一实施例还提供一种点灯测试装置，包括本公开实施例所述的任一用于点灯测试的调节装置。
附图说明
为了更清楚地说明本公开实施例的技术方案，下面将对实施例的附图作简单地介绍，显而易见地，下面描述中的附图仅仅涉及本公开的一些实施例，而非对本公开的限制。
图1为本公开一实施例提供的用于点灯测试的调节装置的主视图；
图2为本公开一示例提供的用于点灯测试的调节装置测试待点灯测试产品的示意图；
图3为本公开一示例提供的一种用于点灯测试的调节装置的俯视图；
图4a为本公开一示例提供的图3中A-A’向的剖视图(第一压头与基板配合连接)；
图4b为本公开另一示例提供的图3中A-A’向的剖视图(第一压头与基板配合连接)；
图4c为本公开另一示例提供的图3中A-A’向的剖视图(第一压头与基板配合连接)；
图4d为本公开另一示例提供的图3中A-A’向的剖视图(第一压头与基板配合连接)；
图5为本公开另一示例提供的用于点灯测试的调节装置的俯视图；
图6a为本公开一示例提供的图5中C-C’向的剖视图(第一压头与基板配合连接)；
图6b为本公开另一示例提供的图5中C-C’向的剖视图(第一压头与基板配合连接)；
图7a为本公开一示例提供的图3中B-B’向的剖视图(第二压头与基板配合连接)；
图7b为本公开另一示例提供的图3中B-B’向的剖视图(第二压头与基板配合连接)；
图8a为本公开一示例提供的图5中D-D’向的剖视图(第二压头与基板配合连接)；
图8b为本公开另一示例提供的图5中D-D’向的剖视图(第二压头与基板配合连接)；
图9a为本公开一示例提供的用于点灯测试的调节装置上设置的第一探针调节机构示意图；
图9b为图9a的E-E’向的剖视示意图；
图9c为本公开一示例提供的用于点灯测试的调节装置的第一探针条的示意图；
图9d为本公开一示例提供的用于点灯测试的调节装置的第一驱动杆的示意图；
图10a为本公开一示例提供的用于点灯测试的调节装置上设置的第二探针调节机构示意图；
图10b为图10a的F-F’向的剖视示意图；
图10c为本公开一示例提供的用于点灯测试的调节装置的第二探针条的示意图；
图10d为本公开一示例提供的用于点灯测试的调节装置的第二驱动杆的示意图。
附图标记：
01-基板；02-第一压头；03-第二压头；04-第一螺栓；05-第二螺栓；06-固定件；08-探针；09-待点灯测试产品；10-第一探针调节机构；13-第一齿轮传动机构；131-第一齿轮组；132-第二齿轮组；130-齿轮；15-第一驱动杆；151-第一螺纹；16-第一旋钮；011-第一移动机构；021-第二移动机构；0111-第一凹槽；0211-第一凸起；0011-第三移动机构；031-第四移动机构；00111-第二凹槽；0311-第二凸起；101-第一探针条；022-第三凹槽；1012-第三凸起；1013-第一螺纹孔；1015-第一齿轮轴；210-第二探针调节机构；2101-第二探针条；21012-第四凸起；21013-第二螺纹孔；21015-第二齿轮轴；215-第二驱动杆；2151-第二螺纹；032-第四凹槽；213-第二齿轮传动机构；2131-第三齿轮组；2132-第四齿轮组；17-刻度尺；216-第二旋钮。
具体实施方式
为使本公开实施例的目的、技术方案和优点更加清楚，下面将结合本公开实施例的附图，对本公开实施例的技术方案进行清楚、完整地描述。显然，所描述的实施例是本公开的一部分实施例，而不是全部的实施例。基于所描述的本公开的实施例，本领域普通技术人员在无需创造性劳动的前提下所获得的所有其他实施例，都属于本公开保护的范围。
除非另外定义，本公开使用的技术术语或者科学术语应当为本公开所属领域内具有一般技能的人士所理解的通常意义。本公开中使用的“第一”、“第二”以及类似的词语并不表示任何顺序、数量或者重要性，而只是用来区分不同的组成部分。同样，“一个”、“一”或者“该”等类似词语也不表示数量限制，而是表示存在至少一个。“包括”或者“包含”等类似的词语意指出现该词前面的元件或者物件涵盖出现在该词后面列举的元件或者物件及其等同，而不排除其他元件或者物件。“连接”或者“相连”等类似的词语并非限定于物理的或 者机械的连接，而是可以包括电性的连接，不管是直接的还是间接的。“上”、“下”、“左”、“右”等仅用于表示相对位置关系，当被描述对象的绝对位置改变后，则该相对位置关系也可能相应地改变。
点灯测试时，由于不同型号的显示产品尺寸形状各不相同，各产品针对点灯测试的测试区版图设计存在差异。因此，每个固定型号的显示产品均需要定制与之相对应的点灯机。而每个点灯机只能适用于一、两个固定型号的产品，无法对应其他不同型号的产品。
本公开至少一实施例提供一种用于点灯测试装置的用于点灯测试的调节装置，可以对应不同型号产品的点灯测试。
如图1所示，本公开一实施例提供一种用于点灯测试的调节装置，包括基板01以及设置在基板01上的第一压头02和第二压头03，第一压头02和第二压头03可彼此相对移动地设置在基板01上由此二者之间的距离可调节，并且第一压头02和第二压头03上分别设置有用以接触待点灯测试产品09(待点灯测试产品09请参见图2)的探针08(探针08可参见图3)。
本公开一实施例提供的用于点灯测试的调节装置，第一压头02和第二压头03之间的距离可调节，从而可以测试不同型号的待点灯测试产品。
需要说明的是，第一压头02和第二压头03可彼此相对移动地设置在基板01上可以是第一压头02或者第二压头03可在基板01上移动，也可以两者都可以在基板01上移动，从而使得第一压头02和第二压头03之间的距离可调节。
图1的俯视图可如图3和图5所示。图3和图5示出了两种第一压头02和第二压头03与基板的配合结构。需要说明的是，图3和图5只是示意性的表示，本公开的实施例中对于第一压头02和第二压头03与基板的配合结构不作限定。
如图4a-4d、6a-6b所示，一些示例中，基板01上设有第一移动机构011，在第一压头02上设置有与第一移动机构011匹配的第二移动机构021，以使第一压头02可相对于基板01移动。例如，第一移动机构011和第二移动机构021之一为第一凹槽0111，另一个为第一凸起0211，第一凹槽0111和第一凸起0211彼此配合连接从而可相对移动。图4a-4d、6a和图6b中均以第一移动机构011(第一凹槽0111)设置在基板01上，第二移动机构021(第 一凸起0211)设置在第一压头02上为例进行说明。需要说明的是，本公开的实施例不限于此。例如，第一移动机构011(第一凹槽0111)还可以设置在第一压头02上，相应的，第二移动机构021(第一凸起0211)设置在基板01上。如图4b-4c所示，为了更好的使得第一压头在基板01上沿一个平面移动，可使第一凸起上具有凸起，相应的，在第一凹槽中具有与第一凸起上的凸起配合的凹槽。或者，也可以如图4d所示，可使第一凸起上具有凹槽，相应的，在第一凹槽中具有与第一凸起上的凹槽配合的凸起。需要说明的是，本公开的实施例中凹槽和凸起配合可形成卡槽结构，并且凹槽和凸起之间可相对移动。并且，其他部位的凹槽和凸起的配合可参照上述叙述和图示说明。
一个示例中，用于点灯测试的调节装置还可包括第一螺栓04用以在基板01上固定第一压头02。当第一压头移动到合适的位置后，可以紧固第一螺栓04用以在基板01上固定第一压头02。
一个示例中，如图7a、图7b、8a、图8b所示，基板01上设有第三移动机构0011，在第二压头03上设置有与第三移动机构0011匹配的第四移动机构031，以使第二压头03可相对于基板01移动。例如，第三移动机构0011和第四移动机构031之一为第二凹槽00111，另一个为第二凸起0311，第二凹槽00111和第二凸起0311彼此配合连接从而可相对移动。图7a和图7b、图8a和图8b中均以第三移动机构0011(第二凹槽00111)设置在基板01上，第四移动机构031(第二凸起0311)设置在第二压头03上为例进行说明。需要说明的是，本公开的实施例不限于此。例如，第三移动机构0011(第二凹槽00111)还可以设置在第二压头03上，相应的，第四移动机构031(第二凸起0311)设置在基板01上。第二凹槽00111和第二凸起0311的结构设计以及配合情况可参照之前第一凹槽0111和第一凸起0211的描述，在此不再赘述。
一个示例中，用于点灯测试的调节装置还可包括第二螺栓05用以在基板01上固定第二压头03。当第二压头移动到合适的位置后，可以紧固第二螺栓05用以在基板01上固定第二压头03。
以第一压头02和第二压头03均可在基板01上移动(滑动)，并且设置第一螺栓04和第二螺栓05为例说明测试不同尺寸的待点灯测试产品。通过调整(例如手动调整)第一压头02和第二压头03的位置得到不同的距离(间 距)，以适应不同待点灯测试产品的尺寸，与产品的测试区(cell test pad area)对应，第一压头02和第二压头03位置调整完成后，将第一压头02和第二压头03分别用第一螺栓04和第二螺栓05固定在基板01上。例如，可将第一螺栓04旋入到第一压头02上的长孔对应的位置，第二螺栓05旋入到第二压头03上的长孔对应的位置。
在此基础上，还可以在第一压头02上设置第一探针调节机构10，或者在第二压头03上设置第二探针调节机构210，或者，既在第一压头02上设置第一探针调节机构10，也在第二压头03上设置第二探针调节机构210，本公开的实施例对此不作限定。以下进行详细描述。
一个示例中，如图9a所示，在第一压头02上设置有第一探针调节机构10，第一探针调节机构10可沿第一压头02的表面移动。例如，第一探针调节机构10包括多个第一探针条101，每个第一探针条101包括多个探针08(例如，多个探针08可固定在第一探针条101上，但不限于此)，多个第一探针条101之间可相对移动，以调节不同的第一探针条101上的探针08错开的距离。从而，可以使得第一探针调节机构10上的探针08位置可调节，进而可以对应测试区(pad区)不同的待点灯测试产品。可以进一步扩展用于点灯测试的调节装置的应用。需要说明的是，在点灯测试的过程中，可通过调整第一探针条来形成与待点灯测试产品的pad区的结构相同的探针结构，以完成点灯测试。
一个示例中，如图9b所示，每个第一探针条101和第一压头02之一上设置第三凹槽022，另一个上设置第三凸起1012，第三凹槽022和第三凸起1012彼此配合连接从而可相对移动。图9b中以第三凹槽022设置在第一压头02上，第三凸起1012设置在第一探针条101上为例进行说明，与前述描述类似，本公开的实施例中，第三凹槽022还可以设置在第一探针条101上，相应的，第三凸起1012设置在第一压头02上。第三凹槽022和第三凸起1012的结构设计以及配合情况可参照之前第一凹槽0111和第一凸起0211的描述，在此不再赘述。
一个示例中，如图9a-9d所示，为了精确调整不同第一探针条101之间的探针错开的距离，用于点灯测试的调节装置还可还包括第一驱动杆15，每个第一探针条101内还设置有第一螺纹孔1013，第一驱动杆15上的第一螺 纹151与第一螺纹孔1013配合，从而可通过旋转第一驱动杆15使得第一探针条101可沿第一驱动杆15的延伸方向移动，从而调节相邻的第一探针条101上的探针08错开的距离。例如，在第一驱动杆15上还可以设置第一旋钮16以方便调节。例如，可通过第一旋钮16旋转第一驱动杆15，使得相邻的第一探针条101之间的齿轮转动，从而相邻的第一探针条101上的探针发生相对移动。
一个示例中，如图9a-9d所示，为了精确调整不同第一探针条101之间的探针错开的距离，相邻的第一探针条101之间设置有第一齿轮传动机构13，第一齿轮传动机构13包括互相匹配的第一齿轮组131和第二齿轮组132，第一齿轮组131和第二齿轮组132分别设置在相邻的第一探针条101上，第一齿轮组131和第二齿轮组132分别包括至少一个齿轮130。如图9b所示，齿轮130可以通过第一齿轮轴1015安装在第一探针条101上。第一齿轮组131和第二齿轮组132中的齿轮啮合，从而，相邻两个第一探针条101可通过齿轮传动在第一压头02上移动，进而可调节相邻两排探针之间错开的距离。
例如，可以第一驱动杆15与第一齿轮传动机构13相配合，以精确调整不同第一探针条101之间的探针错开的距离，例如，可以通过调整第一驱动杆15的旋转圈数进而调节齿轮130的行进程度，例如，第一驱动杆15旋转一周时齿轮130也旋转一周，但不限于此。
一个示例中，如图10a所示，在第二压头03上设置有第二探针调节机构210，第二探针调节机构210可沿第二压头03的表面移动。例如，第二探针调节机构210包括多个第二探针条2101，每个第二探针条2101包括多个探针08(例如，多个探针08可固定在第二探针条2101上，但不限于此)，多个第二探针条2101之间可相对移动，以调节不同的第二探针条2101上的探针错开的距离。从而，可以使得第二探针调节机构210上的探针08位置可调节，进而可以对应测试区不同的待点灯测试产品。可以进一步扩展用于点灯测试的调节装置的应用。
一个示例中，如图10b所示，每个第二探针条2101和第二压头03之一上设置第四凹槽032，另一个上设置第四凸起21012，第四凹槽032和第四凸起21012彼此配合连接从而可相对移动，从而调节相邻的第二探针条2101上的探针08错开的距离。图10b中以第四凹槽032设置在第二压头03上， 第四凸起21012设置在第二探针条2101上为例进行说明，与前述描述类似，本公开的实施例中，第四凹槽032还可以设置在第二探针条2101上，相应的，第四凸起21012设置在第二压头03上。第四凹槽032和第四凸起21012的结构设计以及配合情况可参照之前第一凹槽0111和第一凸起0211的描述，在此不再赘述。
一个示例中，如图10a-10d所示，为了精确调整不同第二探针条2101之间的探针错开的距离，用于点灯测试的调节装置还可包括第二驱动杆215，每个第二探针条2101上还设置有第二螺纹孔21013，第二驱动杆215上的第二螺纹2151与第二螺纹孔21013配合，从而可通过旋转第二驱动杆215使得第二探针条2101可沿第二驱动杆215的延伸方向移动。例如，在第二驱动杆215上还可以设置第二旋钮216以方便调节。例如，可通过旋转第二旋钮216旋转第二驱动杆215，使得相邻的第二探针条2101之间的齿轮转动，从而21015相邻的第二探针条2101上的探针发生相对移动。
一个示例中，如图10a-10d所示，为了精确调整不同第二探针条2101之间的探针错开的距离，相邻的第二探针条2101之间设置有第二齿轮传动机构213，第二齿轮传动机构213包括互相匹配的第三齿轮组2131和第四齿轮组2132，第三齿轮组2131和第四齿轮组2132分别设置在相邻的第二探针条2101上，第三齿轮组2131和第四齿轮组2132分别包括至少一个齿轮130。如图10b所示，齿轮130可以通过第二齿轮轴21015安装在第二探针条2101上。第三齿轮组2131和第四齿轮组2132中的齿轮啮合，从而，相邻两个第二探针条2101可通过齿轮传动在第三压头03上移动，进而调节相邻两排探针之间错开的距离。
例如，可以第二驱动杆215与第二齿轮传动机构213相配合，以精确调整不同第二探针条2101之间的探针错开的距离，例如，可以通过调整第二驱动杆215的旋转圈数进而调节齿轮130的行进程度，例如，第二驱动杆215旋转一周时齿轮130也旋转一周，但不限于此。
一个示例中，可在第一压头02和第二压头03至少之一上设置刻度尺17。刻度尺17的设置，可观测出任意两排探针之间的位移量，可以使得探针错开距离的调节更方便，更有依据。例如，相邻刻度之间的距离可为0.1mm，但不限于此。
一个示例中，如图1-2所示，用于点灯测试的调节装置还可包括用于与点灯测试装置连接的固定件06。固定件06可被配置来将用于点灯测试的调节装置固定在点灯测试装置上。
本公开至少一实施例提供一种点灯测试装置，包括本公开实施例所述的任一用于点灯测试的调节装置。
本公开的实施例提供的用于点灯测试的调节装置和点灯测试装置，解决每个型号产品都需要特别定制与之相对应的点灯测试装置的问题，可对应不同型号产品的点灯测试，可有效节省用于点灯测试的成本。
有以下几点需要说明：
(1)除非另作定义，本公开实施例附图中，同一标号代表同一含义。
(2)本公开实施例附图中，只涉及到与本公开实施例涉及到的结构，其他结构可参考通常设计。
(3)为了清晰起见，在用于描述本公开的实施例的附图中，层或区域的厚度被放大。可以理解，当诸如层、膜、区域或基板之类的元件被称作位于另一元件“上”或“下”时，该元件可以“直接”位于另一元件“上”或“下”，或者可以存在中间元件。
(4)在不冲突的情况下，本公开的实施例及实施例中的特征可以相互组合。
以上所述，仅为本公开的具体实施方式，但本公开的保护范围并不局限于此，任何熟悉本技术领域的技术人员在本公开揭露的技术范围内，可轻易想到变化或替换，都应涵盖在本公开的保护范围之内。因此，本公开的保护范围应以所述权利要求的保护范围为准。
本专利申请要求于2016年4月19日递交的中国专利申请第201620332985.2号的优先权，在此全文引用上述中国专利申请公开的内容以作为本申请的一部分。

Claims (20)

  1. 一种用于点灯测试的调节装置，包括基板以及设置在所述基板上的第一压头和第二压头，其中，
    所述第一压头和所述第二压头可彼此相对移动地设置在所述基板上由此二者之间的距离可调节，并且
    所述第一压头和所述第二压头上分别设置有用以接触待点灯测试产品的探针。
  2. 根据权利要求1所述的用于点灯测试的调节装置，其中，所述基板上设有第一移动机构，在所述第一压头上设置有与所述第一移动机构匹配的第二移动机构，以使所述第一压头可相对于所述基板移动。
  3. 根据权利要求2所述的用于点灯测试的调节装置，其中，所述第一移动机构和所述第二移动机构之一为第一凹槽，另一个为第一凸起，所述第一凹槽和所述第一凸起彼此配合连接从而可相对移动。
  4. 根据权利要求2所述的用于点灯测试的调节装置，其中，还包括第一螺栓，用以在所述基板上固定所述第一压头。
  5. 根据权利要求1-4任一项所述的用于点灯测试的调节装置，其中，所述基板上设有第三移动机构，在所述第二压头上设置有与所述第三移动机构匹配的第四移动机构，以使所述第二压头可相对于所述基板移动。
  6. 根据权利要求5所述的用于点灯测试的调节装置，其中，所述第三移动机构和所述第四移动机构之一为第二凹槽，另一个为第二凸起，所述第二凹槽和所述第二凸起彼此配合连接从而可相对移动。
  7. 根据权利要求5所述的用于点灯测试的调节装置，其中，还包括第二螺栓，用以在所述基板上固定所述第二压头。
  8. 根据权利要求1-4任一项所述的用于点灯测试的调节装置，其中，在所述第一压头上设置有第一探针调节机构，所述第一探针调节机构可沿所述第一压头的表面移动。
  9. 根据权利要求8所述的用于点灯测试的调节装置，其中，所述第一探针调节机构包括多个第一探针条，每个所述第一探针条包括多个探针，所述多个第一探针条之间可相对移动，以调节不同的第一探针条上的探针错开的 距离。
  10. 根据权利要求9所述的用于点灯测试的调节装置，其中，每个所述第一探针条和所述第一压头之一上设置第三凹槽，另一个上设置第三凸起，所述第三凹槽和所述第三凸起彼此配合连接从而可相对移动。
  11. 根据权利要求10所述的用于点灯测试的调节装置，其中，还包括第一驱动杆，每个所述第一探针条内还设置有第一螺纹孔，所述第一驱动杆上的第一螺纹与所述第一螺纹孔配合，从而可通过旋转所述第一驱动杆使得所述第一探针条可沿所述第一驱动杆的延伸方向移动，从而调节相邻的所述第一探针条上的探针错开的距离。
  12. 根据权利要求11所述的用于点灯测试的调节装置，其中，相邻的所述第一探针条之间设置有第一齿轮传动机构，所述第一齿轮传动机构包括互相匹配的第一齿轮组和第二齿轮组，所述第一齿轮组和所述第二齿轮组分别设置在相邻的所述第一探针条上，所述第一齿轮组和所述第二齿轮组分别包括至少一个齿轮。
  13. 根据权利要求8所述的用于点灯测试的调节装置，其中，在所述第二压头上设置有第二探针调节机构，所述第二探针调节机构可沿所述第二压头的表面移动。
  14. 根据权利要求13所述的用于点灯测试的调节装置，其中，所述第二探针调节机构包括多个第二探针条，每个所述第二探针条包括多个探针，所述多个第二探针条之间可相对移动，以调节不同的第二探针条上的探针错开的距离。
  15. 根据权利要求14所述的用于点灯测试的调节装置，其中，每个所述第二探针条和所述第二压头之一上设置第四凹槽，另一个上设置第四凸起，所述第四凹槽和所述第四凸起彼此配合连接从而可相对移动。
  16. 根据权利要求15所述的用于点灯测试的调节装置，其中，还包括第二驱动杆，每个所述第二探针条上还设置有第二螺纹孔，所述第二驱动杆上的第二螺纹与所述第二螺纹孔配合，从而可通过旋转所述第二驱动杆使得所述第二探针条可沿所述第二驱动杆的延伸方向移动，从而调节相邻的所述第二探针条上的探针错开的距离。
  17. 根据权利要求16所述的用于点灯测试的调节装置，其中，相邻的所 述第二探针条之间设置有第二齿轮传动机构，所述第二齿轮传动机构包括互相匹配的第三齿轮组和第四齿轮组，所述第三齿轮组和所述第四齿轮组分别设置在相邻的所述第二探针条上，所述第三齿轮组和所述第四齿轮组分别包括至少一个齿轮。
  18. 根据权利要求1-4任一项所述的用于点灯测试的调节装置，其中，在所述第一压头和所述第二压头至少之一上设置刻度尺。
  19. 根据权利要求3所述的用于点灯测试的调节装置，其中，所述第一凸起上具有凸起，所述第一凹槽具有与所述第一凸起上的凸起配合的凹槽；或者，所述第一凸起上具有凹槽，所述第一凹槽具有与所述第一凸起上的凹槽配合的凸起。
  20. 一种点灯测试装置，其中，包括权利要求1-19任一项所述的用于点灯测试的调节装置。
PCT/CN2017/072461 2016-04-19 2017-01-24 用于点灯测试的调节装置和点灯测试装置 Ceased WO2017181755A1 (zh)

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CN111965474B (zh) * 2020-08-18 2022-09-16 安徽美拓照明有限公司 一种节能灯泡生产用成品老化测试设备

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