WO2017161870A1 - 一种频率调节的方法及装置 - Google Patents

一种频率调节的方法及装置 Download PDF

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Publication number
WO2017161870A1
WO2017161870A1 PCT/CN2016/102460 CN2016102460W WO2017161870A1 WO 2017161870 A1 WO2017161870 A1 WO 2017161870A1 CN 2016102460 W CN2016102460 W CN 2016102460W WO 2017161870 A1 WO2017161870 A1 WO 2017161870A1
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Prior art keywords
voltage
sampling
frequency
functional relationship
time
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PCT/CN2016/102460
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English (en)
French (fr)
Inventor
杨瑞
吴志伟
莫维
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华为技术有限公司
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Priority to EP16895217.4A priority Critical patent/EP3422025B1/en
Publication of WO2017161870A1 publication Critical patent/WO2017161870A1/zh
Priority to US16/137,126 priority patent/US11150284B2/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/16—Measuring impedance of element or network through which a current is passing from another source, e.g. cable, power line
    • G01R27/18—Measuring resistance to earth, i.e. line to ground
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/28—Provision in measuring instruments for reference values, e.g. standard voltage, standard waveform
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/025—Measuring very high resistances, e.g. isolation resistances, i.e. megohm-meters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

Definitions

  • the invention relates to the technical field of safety monitoring of a direct current electrical system, and in particular to a method and a device for frequency adjustment.
  • systems such as photovoltaic power generation systems and pure electric vehicles have DC power supply systems that provide high DC voltage.
  • DC In order to avoid the use of the process or the leakage of the DC power supply system during the normal maintenance of the DC power supply system, DC needs to be made.
  • the corresponding insulation level is maintained between the high voltage end of the power supply system and the reference ground.
  • the parameter for measuring the insulation level of the DC power supply system is the insulation resistance value between the high voltage end of the DC power supply system and the reference ground, and the magnitude of the impedance value directly reflects The insulation state of the DC power system is good or bad.
  • the parasitic capacitance between the high voltage end of the DC power supply system and the reference ground can be neglected, and the insulation resistance value can be obtained quickly by the existing method, and the obtained insulation resistance is obtained.
  • the value has higher accuracy, but in the actual system, due to the layout of the DC power system and the power equipment connected to the DC power system, the parasitic capacitance is often large and cannot be ignored.
  • the parasitic capacitance present at the high voltage side of the DC power system and the reference ground affects the accuracy of the insulation resistance calculated from the voltage at the sampling point.
  • the present invention provides a method and apparatus for frequency adjustment that achieves a reduction in the duration of insulation resistance detection while ensuring the accuracy of the measured insulation resistance.
  • a method for frequency adjustment for use in an insulation resistance detecting device in a DC power supply system, the method comprising:
  • the method for determining the voltage frequency is to maintain the voltage frequency unchanged; at least three voltages obtained by sampling
  • the adjustment method of the voltage frequency is determined to increase the voltage frequency according to the set first step length; the at least three voltages obtained by sampling are not satisfied.
  • a function relationship satisfies the third function relationship it is determined that the voltage frequency is adjusted by decreasing the voltage frequency according to the set second step.
  • the sampling voltages of the sampling point are respectively collected, which are respectively the first sampling voltage at the first moment, the second sampling voltage at the second moment, and the third sampling at the third moment. Voltage.
  • the voltage period of the power source in the insulation resistance detecting device is T; respectively, collecting the first sampling voltage of the sampling point at the zero time of the voltage cycle, and the T of the voltage period a second sampled voltage at time /4, a third sampled voltage at time T/2 of the voltage cycle; or
  • a first sampling voltage at a T/2 time of the voltage cycle, a second sampling voltage at a 3T/4 time of the voltage cycle, and a third sampling voltage at a T time of the voltage cycle are respectively acquired.
  • the first functional relationship is The second function relationship is The third function relationship is Wherein V 1 is the first sampling voltage, V 2 is the second sampling voltage, V 3 is the third sampling voltage, k 1 ⁇ (0,1), k 2 ⁇ (0,1), and k 2 ⁇ k 1 .
  • the first functional relationship is
  • the second functional relationship is
  • the third functional relationship is
  • a frequency adjustment device for use in an insulation resistance detecting device in a DC power supply system, comprising: a sampling unit configured to respectively acquire sampling voltages of sampling points at least three times; and a processing unit for And adjusting the voltage frequency according to the sampled at least three sampling voltages; and an adjusting unit, configured to adjust a voltage frequency of the power source in the insulation resistance detecting device according to the determined adjustment manner of the voltage frequency.
  • the processing unit is specifically configured to determine that the voltage frequency is adjusted to maintain the voltage frequency when the first functional relationship is satisfied between the sampled at least three sampling voltages;
  • the method for determining the voltage frequency is to increase the voltage frequency according to the set first step length;
  • the adjustment of the voltage frequency is determined by decreasing the voltage frequency according to the set second step.
  • the sampling unit is specifically configured to separately collect sampling voltages at three times of the sampling point, which are respectively the first sampling voltage at the first moment, the second sampling voltage at the second moment, and the third The third sampled voltage at the moment.
  • the voltage period of the power source in the insulation resistance detecting device is T; the sampling unit is specifically configured to separately collect the first sampling voltage of the sampling point at the zero time of the voltage cycle, in the voltage cycle a second sampled voltage at time T/4, a third sampled voltage at time T/2 of the voltage cycle; or
  • the first functional relationship is The second function relationship is The third function relationship is Wherein V 1 is the first sampling voltage, V 2 is the second sampling voltage, V 3 is the third sampling voltage, k 1 ⁇ (0,1), k 2 ⁇ (0,1), and k 2 ⁇ k 1 .
  • the first functional relationship is
  • the second functional relationship is
  • the third functional relationship is
  • a frequency adjustment device for use in an insulation resistance detecting device in a DC power system, comprising: a processor and a memory; wherein the processor is configured to separately collect sampling voltages of the sampling point for at least three times, The sampled at least three sampling voltages are respectively stored in the memory, and the voltage frequency adjustment manner is determined according to the at least three sampling voltages obtained by the sampling; and the power supply in the insulation resistance detecting device is adjusted according to the determined adjustment manner of the voltage frequency Voltage frequency.
  • the processor is specifically configured to determine that the voltage frequency is adjusted to maintain the voltage frequency when the first functional relationship is satisfied between the sampled at least three sampling voltages;
  • the method for determining the voltage frequency is to increase the voltage frequency according to the set first step length;
  • the adjustment of the voltage frequency is determined by decreasing the voltage frequency according to the set second step.
  • the processor is specifically configured to separately collect sampling voltages at three times of the sampling point, which are respectively the first sampling voltage at the first moment and the second sampling voltage at the second moment, The third sampled voltage at the third moment.
  • the voltage period of the power source in the insulation resistance detecting device is T
  • the processor is specifically configured to separately collect the first sampling voltage of the sampling point at the zero time of the voltage cycle, in the voltage cycle.
  • the second sampling voltage at time T/4, the third sampling voltage at time T/2 of the voltage period, or, respectively, the first sampling voltage of the sampling point at time T/2 of the voltage period, 3T at the voltage period The second sampling voltage at time /4, the third sampling voltage at time T of the voltage cycle, and storing the first sampling voltage, the second sampling voltage, and the third sampling voltage into the memory.
  • the first functional relationship is The second function relationship is The third function relationship is Wherein V 1 is the first sampling voltage, V 2 is the second sampling voltage, V 3 is the third sampling voltage, k 1 ⁇ (0,1), k 2 ⁇ (0,1), and k 2 ⁇ k 1 .
  • the first functional relationship is
  • the second functional relationship is
  • the third functional relationship is
  • the voltage frequency of the power source can be determined according to the sampled at least three sampling voltages, and the determined voltage frequency is determined according to the determined voltage frequency.
  • the adjustment mode adjusts the voltage frequency of the power supply so that the voltage period of the obtained power source is approximately equal to the insulation time constant of the insulation detecting device. Therefore, the insulation resistance obtained by the sampling voltage at the adjusted voltage frequency is not only accurate.
  • FIG. 2 is a schematic diagram showing a connection manner between a frequency adjustment device and an insulation resistance detecting device according to an embodiment of the present invention
  • FIG. 3 is a schematic flowchart of a method for frequency adjustment according to an embodiment of the present invention.
  • FIG. 4(a) is a schematic diagram of a power supply voltage when a voltage of a power supply is a square wave according to an embodiment of the present invention
  • 4(b) is a schematic diagram of a sampling point voltage when a voltage of a power source is a square wave according to an embodiment of the present invention
  • 5(a), 5(b), and 5(c) are schematic diagrams showing distributions of a first sampling voltage, a second sampling voltage, and a third sampling voltage in different cases;
  • FIG. 6 is a schematic flow chart of a method for frequency adjustment according to an embodiment of the present invention.
  • FIG. 7 is a schematic flow chart of a method for frequency adjustment according to an embodiment of the present invention.
  • FIG. 8(a) shows an insulation resistance detecting device in a DC power supply system to which the embodiment of the present invention can be applied;
  • FIG. 8(b) is another example of an insulation resistance detecting device in a DC power supply system to which the embodiment of the present invention can be applied;
  • FIG. 9 is a schematic diagram of an apparatus for frequency adjustment according to an embodiment of the present invention.
  • FIG. 10 is a schematic structural diagram of hardware of an apparatus for frequency adjustment according to an embodiment of the present invention.
  • the method for frequency adjustment according to the embodiment of the present invention can be applied to an insulation resistance detecting device in a DC power supply system, as shown in FIG. 1 , which is an insulation resistance detecting device in a DC power supply system, wherein 100 is an insulation resistance detecting device.
  • 110 is the detecting part in the insulation resistance detecting device
  • 100 includes a DC power source VB, an equivalent resistance Rbus at the positive and negative terminals of the DC power source, a capacitance Cbus between the positive and negative electrodes, and a resistance Rp of the positive electrode to the reference ground
  • the capacitor Cp, the resistor Rn of the anode to the reference ground, and the capacitor Rn, 110 include the auxiliary sense resistors R1, R2 and the power source Vsq.
  • connection mode of the frequency adjustment device and the insulation resistance detecting device in the embodiment of the present invention is as shown in FIG. 2 .
  • FIG. 1 A method for frequency adjustment according to an embodiment of the present invention will be described by taking FIG. 1 as an example.
  • a method for frequency adjustment according to an embodiment of the present invention includes:
  • step 300 sampling voltages of at least three moments of the sampling point are respectively collected.
  • the sampling point can be set as needed. Taking FIG. 1 as an example, the position between R1 and R2 can be used as a sampling point, or both ends of R2 can be used as sampling points, as long as the voltage of the sampling point can be reflected. It can be changed according to the change in the parasitic capacitance.
  • the sampling time of the sampling point is at least three times that need to be set according to actual conditions. Preferably, the sampling voltages of the three moments are respectively collected, such as the first sampling voltage at the first moment and the second sampling voltage at the second moment, The third sampled voltage at the third moment.
  • the relationship between the voltage frequency of the power source and the insulation time constant by the relationship between the first sampling voltage, the second sampling voltage, and the third sampling voltage, preferably, in the insulation resistance detecting device
  • Step 301 Determine, according to the sampled at least three sampling voltages, a manner of adjusting the voltage frequency.
  • an optional implementation manner is: determining whether the at least three sampling voltages obtained by the sampling satisfy the first function relationship, and if the at least three sampling voltages obtained by the sampling satisfy the first functional relationship, the voltage frequency is adjusted. To maintain the voltage frequency unchanged;
  • determining that the voltage frequency is adjusted is to increase the voltage frequency according to the set first step length;
  • the voltage frequency is determined to be adjusted according to the set second step.
  • first step length and the second step length may be set according to actual needs, and the first step length and the second step length may be the same or different.
  • the second sampling voltage at the T/4 time of the voltage cycle when respectively collecting the first sampling voltage of the sampling point at the zero time of the voltage cycle, the second sampling voltage at the T/4 time of the voltage cycle, the third sampling voltage at the time T/2 of the voltage cycle, or when The first sampling voltage of the sampling point at the time T/2 of the voltage cycle, the second sampling voltage at the time of the 3T/4 voltage cycle, and the sampling voltage at the time T of the voltage cycle are respectively collected.
  • the second function relationship is The third function relationship is Wherein V 1 is the first sampling voltage, V 2 is the second sampling voltage, V 3 is the third sampling voltage, k 1 ⁇ (0,1), k 2 ⁇ (0,1), and k 2 ⁇ k 1 If the first function relationship is
  • ⁇ ⁇ V b where V 1 is the first sampling voltage, V 2 is the second sampling voltage, and V 3 is the third sampling voltage, ⁇ V a , ⁇ V b A constant that is not less than the absolute value of the detection error in the voltage sampling.
  • Step 302 adjusting the voltage frequency of the power source in the insulation resistance detecting device according to the determined adjustment manner of the voltage frequency.
  • the frequency adjustment method of the embodiment of the present invention may be implemented by a separate microprocessor, or may be implemented by a microprocessor in combination with an analog circuit, or may be separately implemented by an analog circuit.
  • the first time is the zero time of the voltage cycle of the power source Vsq
  • the second time is At the T/4 time of the voltage cycle of the power supply Vsq
  • the third time is the T/2 time of the voltage cycle of the power supply Vsp, and is illustrated by taking FIG. 4(a) and FIG. 4(b) as an example, as shown in FIG. 4(a).
  • the voltage waveform diagram shown as the power supply is shown in Figure 4(b) as the voltage waveform of the sampling point.
  • the insulation resistance R p is calculated from the first sampling voltage V 1 , the second sampling voltage V 2 , and the third sampling voltage V 3 , in order to make the calculated R p more accurate, it is necessary to select a suitable voltage of the power source Vsp.
  • the frequency is such that the voltage half period of the power source Vsp is approximately equal to the insulation time constant.
  • V 2 and V 3 are approximately equal; half cycle when the voltage of the power supply is far less than - insulating time constant, the sampling point a sampling voltage V 1, V 2 and V 3 waveform diagram in FIG. 5 ( b) shows that, in this case, V 1 is approximately the average value of V 2 and V 3 ; when the voltage half period of the power supply is approximately equal to the insulation time constant, the sampling voltages V 1 , V 2 of the sampling point and The waveform of V 3 is shown in Figure 5(c).
  • the voltage frequency of the power supply can be adjusted according to the distribution of the sampling voltages V 1 , V 2 , and V 3 .
  • the method for frequency adjustment according to the embodiment of the present invention includes:
  • Step 600 reading the voltage frequency of the power source in the insulation resistance detecting device.
  • Step 601 for a voltage period T of a power source, respectively acquiring a first sampling voltage V 1 at a zero point of the sampling period in the voltage period, and a second sampling voltage V 2 at a time T/4 in the voltage period, in the voltage period T The third sampling voltage V 3 at time /2.
  • Step 602 determining whether the sampled V 1 , V 2 , and V 3 satisfy the first functional relationship Where k 1 ⁇ (0,1), k 2 ⁇ (0,1), and k 2 ⁇ k 1 , if yes, step 603 is performed, otherwise step 604 is performed.
  • Step 603 Determine that the voltage rate adjustment mode of the power source in the insulation resistance detecting device is to maintain the voltage frequency of the power source unchanged, and step 605 is performed.
  • Step 604 if it is determined that the sampled V 1 , V 2 , and V 3 satisfy the second functional relationship Then, the voltage frequency of the power source is determined by increasing the voltage frequency of the power supply according to the set first step length; if it is determined that the sampled V 1 , V 2 , and V 3 satisfy the third function relationship Then, the voltage frequency of the power source is determined by adjusting the voltage frequency of the power supply according to the set second step.
  • Step 605 adjusting the voltage frequency of the power source in the insulation resistance detecting device according to the determined adjustment manner of the voltage frequency.
  • first step length and the second step length may be set according to actual needs, and the first step length and the second step length may be the same or different.
  • the embodiment of the invention further provides a method for frequency adjustment, as shown in FIG. 7, the method includes:
  • Step 700 reading the voltage frequency of the power source in the insulation resistance detecting device.
  • Step 701 for a voltage period T of a power source, respectively acquiring a first sampling voltage V 1 at a zero point of the sampling period in the voltage period, and a second sampling voltage V 2 at a time T/4 in the voltage period, in the voltage period T The third sampling voltage V 3 at time /2.
  • Step 702 Determine whether the sampled V 1 , V 2 , and V 3 satisfy a preset first functional relationship
  • Step 703 determining that the voltage rate adjustment mode of the power source in the insulation resistance detecting device is to maintain the voltage frequency of the power source unchanged, and executing step 705.
  • Step 704 if it is determined that the sampled V 1 , V 2 , and V 3 satisfy the second functional relationship
  • the step size increases the voltage frequency of the power supply; if it is determined that the sampled V 1 , V 2 , and V 3 satisfy the third functional relationship
  • Step 705 the frequency adjusting device adjusts the voltage frequency of the power source in the insulation resistance detecting device according to the determined adjustment manner of the voltage frequency.
  • the sampling point is at both ends of R2 as shown in FIG. 1, that is, when the sampling voltage is the voltage across R2, and the sampling point is the position 1 between R1 and R2 as shown in FIG. 1, the frequency is adjusted.
  • the method is similar and will not be described here.
  • the voltage frequency of the power supply can be adjusted by the frequency adjustment method of the embodiment of the present invention. It should be noted that the application of the frequency adjustment method of the embodiment of the present invention is not limited to the insulation resistance detecting device as shown in FIG. 1 and FIGS. 8(a) and 8(b).
  • a specific first functional relationship can also be set according to a specific sampling point.
  • the frequency adjustment method of the embodiment of the present invention may further adjust the voltage frequency of the power supply according to different detection precision requirements or different detection duration requirements.
  • the insulation resistance detection when the DC power system is initially started, the insulation resistance detection must be quickly responded to avoid the hazard caused by the poor insulation state at the time of starting. At this time, the insulation resistance detection accuracy can be lowered, and the detection time is required to be short enough to pass.
  • the values of k1 and k2 in the present invention are adjusted to increase the voltage frequency of the power source. In the operation process of the DC power system, when the insulation resistance is close to the alarm value, in order to avoid false alarms, the requirement of the resistance detection accuracy can be improved at this time, and the detection time length can be extended, and the values of k1 and k2 in the present invention can be reduced.
  • the power frequency of the power supply when the insulation resistance is close to the alarm value, in order to avoid false alarms, the requirement of the resistance detection accuracy can be improved at this time, and the detection time length can be extended, and the values of k1 and k2 in the present invention can be reduced.
  • the embodiment of the present invention further provides a frequency adjustment device. Since the method corresponding to the frequency adjustment device is the frequency adjustment method of the embodiment of the present invention, the implementation of the frequency adjustment device in the embodiment of the present invention may be See the implementation of this method, and the repetitions are not repeated here.
  • the apparatus for frequency adjustment is applied to an insulation resistance detecting apparatus in a DC power supply system, and includes: a sampling unit 900, a processing unit 901, and an adjustment unit 902; wherein the sampling unit 900 is configured to respectively Collecting a sampling voltage of at least three times of the sampling point; the processing unit 901 is configured to determine a adjusting manner of the voltage frequency according to the sampling voltage of the at least three times obtained by the sampling; and the adjusting unit 902 is configured to adjust the voltage frequency according to the determined manner And adjusting a voltage frequency of the power source in the insulation resistance detecting device.
  • the processing unit 901 is specifically configured to: when the first functional relationship is satisfied between the sampled at least three sampling voltages, determine that the voltage frequency is adjusted by maintaining the voltage frequency; and at least three sampling voltages obtained by sampling.
  • the adjustment method of determining the voltage frequency is to increase the voltage frequency according to the set first step length; between the sampled at least three sampling voltages
  • the adjustment of the voltage frequency is determined by decreasing the voltage frequency according to the set second step.
  • the sampling unit 900 is specifically configured to separately collect sampling voltages at three times of the sampling point, which are a first sampling voltage at a first moment, a second sampling voltage at a second moment, and a third sampling voltage at a third moment.
  • the voltage period of the power source in the insulation resistance detecting device is T; the sampling unit 900 is specifically configured to separately collect the first sampling voltage of the sampling point at the zero time of the voltage cycle, and the second time at the T/4 time of the voltage cycle. a sampling voltage, a third sampling voltage at a time T/2 of the voltage cycle; or respectively acquiring a first sampling voltage of the sampling point at a time T/2 of the voltage cycle, and a second sampling voltage at a time of 3T/4 of the voltage cycle, The third sampled voltage at time T of the voltage cycle.
  • the first functional relationship is The second function relationship is The third function relationship is Wherein V 1 is the first sampling voltage, V 2 is the second sampling voltage, V 3 is the third sampling voltage, k 1 ⁇ (0,1), k 2 ⁇ (0,1), and k 2 ⁇ k 1 .
  • the first functional relationship is
  • the second functional relationship is
  • the third functional relationship is
  • the sampling unit 900, the processing unit 901, and the adjusting unit 902 can be integrated in the same microprocessor when the specific hardware is implemented, and the voltage frequency of the power source can be adjusted together, or can be an analog circuit capable of implementing the corresponding function. Or one or two of the units are implemented by analog circuits of corresponding functions, one of which is implemented by a microprocessor.
  • a schematic diagram of a hardware device implemented by a frequency adjustment apparatus includes: a processor 1000 and a memory 1100, and the processor 1000 can be a general-purpose central processing unit (Central Processing Unit)
  • the CPU, the microprocessor, the Application Specific Integrated Circuit (ASIC), or one or more integrated circuits are used to execute the related programs to implement the technical solutions provided by the embodiments of the present invention.
  • the memory 1100 may be a read only memory (ROM), a static storage device, a dynamic storage device, or a random access memory (RAM).
  • the memory 1100 can store an operating system, other applications, and operational data.
  • the program code for implementing the technical solution provided by the embodiment of the present invention is saved in the memory 1100 and executed by the processor 1000.
  • the device may also include hardware devices that implement other additional functions, depending on the particular needs.
  • the device may also include only the devices or modules necessary to implement the embodiments of the present invention, and do not necessarily include all of the devices shown in FIG.
  • the method for frequency adjustment in the embodiment of the present invention is applied to an insulation resistance detecting device in a DC power supply system, and respectively collects sampling voltages of sampling points at least three times; and at least three times according to sampling.
  • the sampling voltage determines the adjustment mode of the voltage frequency; then adjusts the voltage of the power supply in the insulation resistance detecting device according to the determined adjustment method of the voltage frequency frequency.
  • the technical solution can determine the adjustment mode of the voltage frequency of the power supply according to at least three sampling voltages obtained by sampling, and adjust the voltage frequency of the power supply according to the determined adjustment manner of the voltage frequency, so that the obtained power supply voltage period and insulation detection
  • the insulation time constants of the devices are approximately equal.
  • the insulation resistance obtained by the sampling voltage at the adjusted voltage frequency is not only more accurate, but also reduces the detection duration of the insulation resistance, and can be dynamic when the parasitic capacitance changes. Adjusting the voltage frequency of the power supply avoids the problem of improving the accuracy of the insulation resistance calculation by setting the voltage frequency of the power supply to a small value and delaying the detection duration of the insulation resistance in the prior art.
  • embodiments of the present invention can be provided as a method, system, or computer program product. Accordingly, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment, or a combination of software and hardware. Moreover, the invention can take the form of a computer program product embodied on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) including computer usable program code.
  • computer-usable storage media including but not limited to disk storage, CD-ROM, optical storage, etc.
  • the computer program instructions can also be stored in a computer readable memory that can direct a computer or other programmable data processing device to operate in a particular manner, such that the instructions stored in the computer readable memory produce an article of manufacture comprising the instruction device.
  • the apparatus implements the functions specified in one or more blocks of a flow or a flow and/or block diagram of the flowchart.
  • These computer program instructions can also be loaded onto a computer or other programmable data processing device such that a series of operational steps are performed on a computer or other programmable device to produce computer-implemented processing for execution on a computer or other programmable device. Instructions are provided for implementation in the flowchart The steps of a process or a plurality of processes and/or block diagrams of a function specified in a block or blocks.

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Abstract

一种频率调节的方法及装置，应用于直流电源系统中的绝缘阻抗检测装置中，涉及直流电气系统安全监控技术领域，该方法包括：分别采集采样点至少三个时刻的采样电压(300)；并根据采样得到的至少三个时刻的采样电压，确定电压频率的调节方式(301)；然后按照确定的电压频率的调节方式，调节电源的电压频率(302)。由于能够根据采样得到的至少三个采样电压，调节电源的电压频率，使得绝缘阻抗检测装置在确保测量的绝缘阻抗的准确性的同时，降低了绝缘阻抗检测的时长。

Description

一种频率调节的方法及装置
本申请要求在2016年3月21日提交中国专利局、申请号为201610162367.2、申请名称为“一种频率调节的方法及装置”的中国专利申请的优先权，其全部内容通过引用结合在本申请中。
技术领域
本发明涉及直流电气系统安全监控技术领域，特别涉及一种频率调节的方法及装置。
背景技术
目前，如光伏发电系统、纯电动汽车等系统中都具有提供较高的直流电压的直流电源系统，为避免使用过程或对直流电源系统正常维护过程中直流电源系统出现漏电的情况，需要使得直流电源系统的高压端与参考地之间维持相应的绝缘水平，其中，衡量直流电源系统绝缘水平的参数为直流电源系统的高压端与参考地之间的绝缘阻抗值，该阻抗值的大小直接反映直流电源系统中绝缘状态的好坏。
在测量绝缘阻抗值的过程中，在直流电源系统的高压端与参考地之间的寄生电容可忽略不计时，通过现有的方法，能够较快的得到绝缘阻抗值，并且得到的该绝缘阻抗值有较高的精度，但在实际系统中，受直流电源系统走线布局及连接在直流电源系统中的用电设备的影响，该寄生电容往往较大，并不能忽略不计。直流电源系统的高压端与参考地存在的寄生电容会影响通过采样点的电压计算得到的绝缘阻抗的准确性。
现有技术中，通过将绝缘阻抗检测系统中注入的电压频率设置为一个较小的值，来降低寄生电容对绝缘阻抗准确性的影响，虽然提高了测量的绝缘阻抗的准确性，但是大大延迟了绝缘阻抗检测的时长。
发明内容
本发明提供一种频率调节的方法及装置，实现了在确保测量的绝缘阻抗的准确性的同时，降低了绝缘阻抗检测的时长。
第一方面，提供了一种频率调节的方法，应用于直流电源系统中的绝缘阻抗检测装置中，该方法包括：
分别采集采样点至少三个时刻的采样电压；并根据采样得到的至少三个采样电压，确定电压频率的调节方式；然后按照确定的电压频率的调节方式，调节绝缘阻抗检测装置中的电源的电压频率。
在第一方面的基础上，可选的，在采样得到的至少三个电压之间满足第一函数关系时，确定电压频率的调节方式为维持电压频率不变；在采样得到的至少三个电压之间不满足第一函数关系、满足第二函数关系时，则确定电压频率的调节方式为按照设定的第一步长增大电压频率；在采样得到的至少三个电压之间不满足第一函数关系、满足第三函数关系时，则确定电压频率的调节方式为按照设定的第二步长减小电压频率。
在第一方面的基础上，可选的，分别采集采样点三个时刻的采样电压，分别为第一时刻的第一采样电压、第二时刻的第二采样电压、第三时刻的第三采样电压。
在第一方面的基础上，可选的，绝缘阻抗检测装置中的电源的电压周期为T；分别采集采样点在所述电压周期的零时刻的第一采样电压、在所述电压周期的T/4时刻的第二采样电压、在所述电压周期的T/2时刻的第三采样电压；或者
分别采集采样点在所述电压周期的T/2时刻的第一采样电压、在所述电压周期的3T/4时刻的第二采样电压，在所述电压周期的T时刻的第三采样电压。
在第一方面的基础上，可选的，第一函数关系为
Figure PCTCN2016102460-appb-000001
第二函数关系为
Figure PCTCN2016102460-appb-000002
第三函数关系为
Figure PCTCN2016102460-appb-000003
其中， V1为第一采样电压，V2为第二采样电压，V3为第三采样电压，k1∈(0,1)，k2∈(0,1)，且k2＜k1。
在第一方面的基础上，可选的，第一函数关系为|V3|-|V2|＞ΔVa且|V2|-|V1|＞ΔVb；第二函数关系为|V3|-|V2|＜ΔVa；第三函数关系为|V2|-|V0|＜ΔVb；其中，V1为第一采样电压，V2为第二采样电压，V3为第三采样电压，ΔVa、ΔVb为不小于电压采样中的检测误差的绝对值的常数。
第二方面，提供了一种频率调节的装置，应用于直流电源系统中的绝缘阻抗检测装置中，包括：采样单元，用于分别采集采样点至少三个时刻的采样电压；处理单元，用于根据采样得到的至少三个采样电压，确定电压频率的调节方式；调节单元，用于根据确定的所述电压频率的调节方式，调节所述绝缘阻抗检测装置中的电源的电压频率。
在第二方面的基础上，可选的，处理单元具体用于在采样得到的至少三个采样电压之间满足第一函数关系时，确定电压频率的调节方式为维持电压频率不变；在采样得到的至少三个采样电压之间不满足所述第一函数关系、满足第二函数关系时，确定电压频率的调节方式为按照设定的第一步长增大电压频率；在采样得到的至少三个采样电压之间不满足所述第一函数关系、满足第三函数关系时，确定电压频率的调节方式为按照设定的第二步长减小电压频率。
在第二方面的基础上，可选的，采样单元具体用于分别采集采样点三个时刻的采样电压，分别为第一时刻的第一采样电压、第二时刻的第二采样电压、第三时刻的第三采样电压。
在第二方面的基础上，可选的，绝缘阻抗检测装置中的电源的电压周期为T；采样单元具体用于分别采集采样点在电压周期的零时刻的第一采样电压、在电压周期的T/4时刻的第二采样电压、在电压周期的T/2时刻的第三采样电压；或者
分别采集采样点在所述电压周期的T/2时刻的第一采样电压、在所述电压 周期的3T/4时刻的第二采样电压、在所述电压周期的T时刻的第三采样电压。
在第二方面的基础上，可选的，第一函数关系为
Figure PCTCN2016102460-appb-000004
第二函数关系为
Figure PCTCN2016102460-appb-000005
第三函数关系为
Figure PCTCN2016102460-appb-000006
其中，V1为第一采样电压，V2为第二采样电压，V3为第三采样电压，k1∈(0,1)，k2∈(0,1)，且k2＜k1。
在第二方面的基础上，可选的，第一函数关系为|V3|-|V2|＞ΔVa且|V2|-|V1|＞ΔVb；第二函数关系为|V3|-|V2|＜ΔVa；第三函数关系为|V2|-|V0|＜ΔVb；其中，V1为第一采样电压，V2为第二采样电压，V3为第三采样电压，ΔVa、ΔVb为不小于电压采样中的检测误差的绝对值的常数。
第三方面，提供了一种频率调节的装置，应用于直流电源系统中的绝缘阻抗检测装置中，包括：处理器和存储器；其中，处理器用于分别采集采样点至少三个时刻的采样电压，将采样得到的至少三个采样电压分别存储到存储器中，并根据采样得到的至少三个采样电压，确定电压频率的调节方式；根据确定的电压频率的调节方式，调节绝缘阻抗检测装置中的电源的电压频率。
在第三方面的基础上，可选的，处理器具体用于在采样得到的至少三个采样电压之间满足第一函数关系时，确定电压频率的调节方式为维持电压频率不变；在采样得到的至少三个采样电压之间不满足所述第一函数关系、满足第二函数关系时，确定电压频率的调节方式为按照设定的第一步长增大电压频率；在采样得到的至少三个采样电压之间不满足所述第一函数关系、满足第三函数关系时，确定电压频率的调节方式为按照设定的第二步长减小电压频率。
在第三方面的基础上，可选的，处理器具体用于分别采集采样点三个时刻的采样电压，分别为第一时刻的第一采样电压、第二时刻的第二采样电压、 第三时刻的第三采样电压。
在第三方面的基础上，可选的，绝缘阻抗检测装置中的电源的电压周期为T，处理器具体用于分别采集采样点在电压周期的零时刻的第一采样电压、在电压周期的T/4时刻的第二采样电压、在电压周期的T/2时刻的第三采样电压，或者，或者分别采集采样点在电压周期的T/2时刻的第一采样电压、在电压周期的3T/4时刻的第二采样电压，在电压周期的T时刻的第三采样电压，并将第一采样电压、第二采样电压、第三采样电压存储到存储器中。
在第三方面的基础上，可选的，第一函数关系为
Figure PCTCN2016102460-appb-000007
第二函数关系为
Figure PCTCN2016102460-appb-000008
第三函数关系为
Figure PCTCN2016102460-appb-000009
其中，V1为第一采样电压，V2为第二采样电压，V3为第三采样电压，k1∈(0,1)，k2∈(0,1)，且k2＜k1。
在第一方面的基础上，可选的，第一函数关系为|V3|-|V2|＞ΔVa且|V2|-|V1|＞ΔVb；第二函数关系为|V3|-|V2|＜ΔVa；第三函数关系为|V2|-|V0|＜ΔVb；其中，V1为第一采样电压，V2为第二采样电压，V3为第三采样电压，ΔVa、ΔVb为不小于电压采样中的检测误差的绝对值的常数。
由于寄生电容的变化能够影响采样得到的至少三个采样电压的大小，在本发明实施例中能够根据采样得到的至少三个采样电压，确定电源的电压频率的调节方式，并按照确定的电压频率的调节方式，调节电源的电压频率，使得得到的电源的电压周期与绝缘检测装置的绝缘时间常数近似相等，因而，通过在调节后的电压频率下的采样电压得到的绝缘阻抗不但的精确度较高，而且降低了绝缘阻抗的检测时长，并且能够在寄生电容发生变化时动态调节电源的电压频率，避免了现有技术中通过将电源的电压频率设置为一个较小的值，延迟绝缘阻抗的检测时长来提高绝缘阻抗计算的精度的问题。
附图说明
图1为现有技术中一种直流电源系统中的绝缘阻抗检测装置；
图2为本发明实施例中的频率调节的装置与绝缘阻抗检测装置的连接方式的示意图；
图3为本发明实施例频率调节的方法的流程示意图；
图4(a)为本发明实施例电源的电压为方波时的电源电压的示意图；
图4(b)为本发明实施例电源的电压为方波时采样点电压的示意图；
图5(a)、图5(b)、图5(c)分别为在不同情况下第一采样电压、第二采样电压和第三采样电压的分布示意图；
图6为本发明实施例频率调节的方法的流程示意图；
图7为本发明实施例频率调节的方法的流程示意图；
图8(a)本发明实施例可以应用的一种直流电源系统中的绝缘阻抗检测装置；
图8(b)本发明实施例可以应用的另一种直流电源系统中的绝缘阻抗检测装置；
图9为本发明实施例频率调节的装置的示意图；
图10为本发明实施例频率调节的装置的硬件结构示意图。
具体实施方式
为了使本发明的目的、技术方案和优点更加清楚，下面将结合附图对本发明作进一步地详细描述。
本发明实施例的频率调节的方法，可以应用于直流电源系统中的绝缘阻抗检测装置，如图1所示，为一种直流电源系统中的绝缘阻抗检测装置，其中，100为绝缘阻抗检测装置中的被检测部分，110为绝缘阻抗检测装置中的检测部分，100包括直流电源VB，直流电源正负极两端等效电阻Rbus，正负极间电容Cbus，正极对参考地的电阻Rp、电容Cp，负极对参考地的电阻Rn、电容Rn，110包括辅助检测电阻R1、R2和电源Vsq。
其中，本发明实施例中的频率调节的装置与绝缘阻抗检测装置的连接方式如图2所示。
以图1为例对本发明实施例频率调节的方法进行说明。
如图3所示，本发明实施例频率调节的方法，包括：
步骤300，分别采集采样点至少三个时刻的采样电压。
需要说明的是，采样点可以根据需要进行设置，以图1为例，可以将R1与R2之间的位置作为采样点，也可以将R2两端作为采样点，只要能够体现该采样点的电压能够根据寄生电容的变化而变化即可。采样点的采样时刻为根据实际情况需要设定的至少三个时刻，较佳的，分别采集三个时刻的采样电压，如第一时刻的第一采样电压、第二时刻的第二采样电压、第三时刻的第三采样电压。
其中，为更方便的通过第一采样电压、第二采样电压、第三采样电压之间的关系描述电源的电压频率与绝缘时间常数之间的关系，较佳地，当绝缘阻抗检测装置中的电源的电压周期为T时，分别采集采样点在电压周期的零时刻的第一采样电压，在电压周期的T/4时刻的第二采样电压，在电压周期的T/2时刻的第三采样电压，或者分别采集采样点在电压周期的T/2时刻的第一采样电压、在电压周期的3T/4时刻的第二采样电压，在电压周期的T时刻的采样电压。
步骤301，根据采样得到的至少三个采样电压，确定电压频率的调节方式。
具体的，一种可选的实现方式为：判断采样得到的至少三个采样电压是否满足第一函数关系，若确定采样得到的至少三个采样电压满足第一函数关系，则电压频率的调节方式为维持电压频率不变；
在确定采样得到的至少三个采样电压之间不满足第一函数关系、满足第二函数关系，则确定电压频率的调节方式为按照设定的第一步长增大电压频率；在确定采样得到的至少三个采样电压之间不满足第一函数关系、满足第三函数关系时，确定电压频率的调节方式为按照设定的第二步长减小电压频率。
需要说明的是，第一步长和第二步长可以根据实际需要进行设定，第一步长与第二步长可以相同，也可以不同。
具体的，当分别采集采样点在电压周期的零时刻的第一采样电压，在电压周期的T/4时刻的第二采样电压，在电压周期的T/2时刻的第三采样电压，或者当分别采集采样点在电压周期的T/2时刻的第一采样电压、在电压周期的3T/4时刻的第二采样电压，在电压周期的T时刻的采样电压时，若第一函数关系为
Figure PCTCN2016102460-appb-000010
第二函数关系为
Figure PCTCN2016102460-appb-000011
第三函数关系为
Figure PCTCN2016102460-appb-000012
其中，V1为第一采样电压，V2为第二采样电压，V3为第三采样电压，k1∈(0,1)，k2∈(0,1)，且k2＜k1；若第一函数关系为|V3|-|V2|＞ΔVa且|V2|-|V1|＞ΔVb，第二函数关系为|V3|-|V2|＜ΔVa，第三函数关系为|V2|-|V0|＜ΔVb，其中，V1为第一采样电压，V2为第二采样电压，V3为第三采样电压，ΔVa、ΔVb为不小于电压采样中的检测误差的绝对值的常数。
步骤302，根据确定的电压频率的调节方式，调节绝缘阻抗检测装置中的电源的电压频率。
其中，本发明实施例的频率调节方法可以由单独的微处理器实现，也可以由微处理器结合模拟电路实现，还可以由模拟电路单独实现。
当电源Vsq的电压为方波电压，其电压的周期为T，采样点设置在图1中R1与R2之间的位置1，第一时刻为电源Vsq的电压周期的零时刻，第二时刻为电源Vsq的电压周期的T/4时刻，第三时刻为电源Vsp的电压周期的T/2时刻，以图4(a)和图4(b)为例进行说明，如图4(a)所示为电源的电压波形示意图，如图4(b)所示为采样点的电压波形图。
当绝缘阻抗Rp由第一采样电压V1、第二采样电压V2、第三采样电压V3计算得到时，为使得计算得到的Rp更加准确，则需要选择一个合适的电源Vsp的 电压频率，使得该电源Vsp的电压半周期与绝缘时间常数近似相等。
通过直接测量绝缘时间常数，来调节电源的电压频率实现较为困难。但是，当电源的电压半周期与绝缘时间常数的关系，影响采样电压V1、V2和V3之间的关系，通过V1、V2和V3之间的关系可以间接反映电源的电压半周期与绝缘时间常数的关系，具体的，当电源的电压半周期远大于绝缘时间常数时，其采样点的采样电压V1、V2和V3的波形图如图5(a)所示，在这种情况下，V2与V3近似相等；当电源的电压半周期远小于-绝缘时间常数时，其采样点的采样电压V1、V2和V3的波形图如图5(b)所示，在这种情况下，V1近似为V2和V3的平均值；当电源的电压半周期与绝缘时间常数近似相等时，其采样点的采样电压V1、V2和V3的波形图如图5(c)所示。
因此，可以根据采样电压V1、V2和V3的分布情况对电源的电压频率进行调节。
当采样点设置在图1所示的R1和R2之间的位置1，电源的电压周期为T时，如图6所示，本发明实施例频率调节的方法，包括：
步骤600，读取绝缘阻抗检测装置中电源的电压频率。
步骤601，针对一个电源的电压周期T，分别采集采样点在电压周期中零时刻的第一采样电压V1、在电压周期中T/4时刻的第二采样电压V2，在电压周期中T/2时刻的第三采样电压V3。
步骤602，判断采样得到的V1、V2、V3是否满足第一函数关系
Figure PCTCN2016102460-appb-000013
其中，k1∈(0,1)，k2∈(0,1)，且k2＜k1，若是，则执行步骤603，否则执行步骤604。
步骤603，确定绝缘阻抗检测装置中电源的电压率调节方式为维持电源的电压频率不变，执行步骤605。
步骤604，若确定采样得到的V1、V2、V3满足第二函数关系
Figure PCTCN2016102460-appb-000014
则确定电源的电压频率的调节方式为按照设定的第一步长增大电源的电压频率；若确定采样得到的V1、V2、V3满足第三函数关系
Figure PCTCN2016102460-appb-000015
则确定电源的电压频率的调节方式为按照设定的第二步长减小电源的电压频率。
步骤605，根据确定的电压频率的调节方式，调节绝缘阻抗检测装置中电源的电压频率。
当分别采集采样点在电压周期中T/2时刻的第一采样电压V1、在电压周期中3T/4时刻的第二采样电压V2，在电压周期中T时刻的第三采样电压V3时，其频率调节的方法的步骤与图6所示的步骤类似，在此不再赘述。
需要说明的是，第一步长和第二步长可以根据实际需要进行设定，第一步长与第二步长可以相同，也可以不同。
本发明实施例还提供了一种频率调节的方法，如图7所示，该方法包括：
步骤700，读取绝缘阻抗检测装置中电源的电压频率。
步骤701，针对一个电源的电压周期T，分别采集采样点在电压周期中零时刻的第一采样电压V1、在电压周期中T/4时刻的第二采样电压V2，在电压周期中T/2时刻的第三采样电压V3。
步骤702，判断采样得到的V1、V2、V3是否满足预设的第一函数关系|V3|-|V2|＞ΔVa且|V2|-|V1|＞ΔVb，其中ΔVa、ΔVb为不小于电压采样中的检测误差的绝对值的常数，若是，则执行步骤703，否则执行步骤704。
步骤703，确定绝缘阻抗检测装置中电源的电压率调节方式为维持电源的电压频率不变，执行步骤705。
步骤704，若确定采样得到的V1、V2、V3满足第二函数关系|V3|-|V2|＜ΔVa，则确定电源的电压频率的调节方式为按照设定的第一步长增大电源的电压频率；若确定采样得到的V1、V2、V3满足第三函数关系|V2|-|V0|＜ΔVb，则确定电源 的电压频率的调节方式为按照设定的第二步长减小电源的电压频率。
步骤705，频率调节装置根据确定的电压频率的调节方式，调节绝缘阻抗检测装置中电源的电压频率。
当分别采集采样点在电压周期中T/2时刻的第一采样电压V1、在电压周期中3T/4时刻的第二采样电压V2，在电压周期中T时刻的第三采样电压V3时，其频率调节的方法的步骤与图7所示的步骤类似，在此不再赘述。
此外，当采样点为如图1所示的R2两端，即采样电压为R2两端的电压时，与采样点为如图1所示的R1与R2之间的位置1时，其频率调节的方法类似，在此不再赘述。
其中，由于绝缘阻抗检测装置的实现方式有多种，还可以如图8(a)、图8(b)所示，也可以通过本发明实施例的频率调节的方法对电源的电压频率进行调节，需要说明的是，本发明实施例的频率调节的方法的应用不限于如1以及图8(a)和图8(b)所示的绝缘阻抗检测装置。
在实际应用中，还可以根据具体采样点，设置具体的第一函数关系。
此外，需要说明的是，除上述实施例外，本发明实施例的频率调节的方法，还可以根据不同检测精度要求或不同检测时长要求，对电源的电压频率进行相应的调节。
例如，当在直流电源系统初始启动时，要求绝缘阻抗检测必须快速响应，以避免启动时绝缘状态恶劣引起的危害，此时可以放低绝缘阻抗检测精度的要求，要求检测时长足够短，可以通过调节本发明中k1、k2值，增加电源的电压频率。而在直流电源系统运行过程中，当绝缘电阻临近报警值时，为了避免误报，此时可以提高电阻检测精度的要求，允许延长检测时长，可以通过调节本发明中k1、k2值，减小电源的电源频率。
基于同一发明构思，本发明实施例中还提供了一种频率调节的装置，由于频率调节的装置对应的方法为本发明实施例频率调节的方法，因此本发明实施例频率调节的装置的实施可以参见该方法的实施，重复之处不再赘述。
如图9所示，本发明实施例频率调节的装置，应用于直流电源系统中的绝缘阻抗检测装置中，包括：采样单元900、处理单元901和调节单元902；其中，采样单元900用于分别采集采样点至少三个时刻的采样电压；处理单元901用于根据采样得到的至少三个时刻的采样电压，确定电压频率的调节方式；调节单元902用于根据确定的所述电压频率的调节方式，调节所述绝缘阻抗检测装置中的电源的电压频率。
可选的，处理单元901具体用于在采样得到的至少三个采样电压之间满足第一函数关系时，确定电压频率的调节方式为维持电压频率不变；在采样得到的至少三个采样电压之间不满足所述第一函数关系、满足第二函数关系时，确定电压频率的调节方式为按照设定的第一步长增大电压频率；在采样得到的至少三个采样电压之间不满足所述第一函数关系、满足第三函数关系时，确定电压频率的调节方式为按照设定的第二步长减小电压频率。
可选的，采样单元900具体用于分别采集采样点三个时刻的采样电压，分别为第一时刻的第一采样电压、第二时刻的第二采样电压、第三时刻的第三采样电压。
可选的，绝缘阻抗检测装置中的电源的电压周期为T；采样单元900具体用于分别采集采样点在电压周期的零时刻的第一采样电压、在电压周期的T/4时刻的第二采样电压、在电压周期的T/2时刻的第三采样电压；或者分别采集采样点在电压周期的T/2时刻的第一采样电压，在电压周期的3T/4时刻的第二采样电压，在电压周期的T时刻的第三采样电压。
可选的，第一函数关系为
Figure PCTCN2016102460-appb-000016
第二函数关系为
Figure PCTCN2016102460-appb-000017
第三函数关系为
Figure PCTCN2016102460-appb-000018
其中，V1为第一采样电压，V2为第二采样电压，V3为第三采样电压，k1∈(0,1)，k2∈(0,1)，且k2＜k1。
可选的，第一函数关系为|V3|-|V2|＞ΔVa且|V2|-|V1|＞ΔVb；第二函数关系为|V3|-|V2|＜ΔVa；第三函数关系为|V2|-|V0|＜ΔVb；其中，V1为第一采样电压，V2为第二采样电压，V3为第三采样电压，ΔVa、ΔVb为不小于电压采样中的检测误差的绝对值的常数。
其中，采样单元900、处理单元901、调节单元902在具体硬件实现时可以集成在同一个微处理器中，共同实现对电源的电压频率的调节，也可以分别为能够实现相应功能的模拟电路，亦或是其中一个或两个单元通过相应功能的模拟电路实现，其中一个单元通过微处理器实现。
如图10所示，本发明实施例频率调节装置一种实现的硬件装置示意图，其中，该频率调节装置包括：处理器1000和存储器1100，处理器1000可以为通用的中央处理器(Central Processing Unit，CPU)，微处理器，应用专用集成电路(Application Specific Integrated Circuit，ASIC)，或者一个或多个集成电路，用于执行相关程序，以实现本发明实施例所提供的技术方案。存储器1100可以是只读存储器(Read Only Memory，ROM)，静态存储设备，动态存储设备或者随机存取存储器(Random Access Memory，RAM)。存储器1100可以存储操作系统、其他应用程序和运算数据。在通过软件或者固件来实现本发明实施例提供的技术方案时，用于实现本发明实施例提供的技术方案的程序代码保存在存储器1100中，并由处理器1000来执行。
同时，根据具体需要，本领域的技术人员应当明白，该装置还可包含实现其他附加功能的硬件器件。此外，本领域的技术人员应当明白，该设备也可仅仅包含实现本发明实施例所必须的器件或模块，而不必包含图10中所示的全部器件。
从上述内容可以看出：本发明实施例频率调节的方法，应用于直流电源系统中的绝缘阻抗检测装置中，分别采集采样点至少三个时刻的采样电压；并根据采样得到的至少三个时刻的采样电压，确定电压频率的调节方式；然后按照确定的电压频率的调节方式，调节绝缘阻抗检测装置中的电源的电压 频率。这种技术方案能够根据采样得到的至少三个采样电压，确定电源的电压频率的调节方式，并按照确定的电压频率的调节方式，调节电源的电压频率，使得得到的电源的电压周期与绝缘检测装置的绝缘时间常数近似相等，因而，通过在调节后的电压频率下的采样电压得到的绝缘阻抗不但的精确度较高，而且降低了绝缘阻抗的检测时长，并且能够在寄生电容发生变化时动态调节电源的电压频率，避免了现有技术中通过将电源的电压频率设置为一个较小的值，延迟绝缘阻抗的检测时长来提高绝缘阻抗计算的精度的问题。
本领域内的技术人员应明白，本发明的实施例可提供为方法、系统、或计算机程序产品。因此，本发明可采用完全硬件实施例、完全软件实施例、或结合软件和硬件方面的实施例的形式。而且，本发明可采用在一个或多个其中包含有计算机可用程序代码的计算机可用存储介质(包括但不限于磁盘存储器、CD-ROM、光学存储器等)上实施的计算机程序产品的形式。
本发明是参照根据本发明实施例的方法、设备(系统)、和计算机程序产品的流程图和/或方框图来描述的。应理解可由计算机程序指令实现流程图和/或方框图中的每一流程和/或方框、以及流程图和/或方框图中的流程和/或方框的结合。可提供这些计算机程序指令到通用计算机、专用计算机、嵌入式处理机或其他可编程数据处理设备的处理器以产生一个机器，使得通过计算机或其他可编程数据处理设备的处理器执行的指令产生用于实现在流程图一个流程或多个流程和/或方框图一个方框或多个方框中指定的功能的装置。
这些计算机程序指令也可存储在能引导计算机或其他可编程数据处理设备以特定方式工作的计算机可读存储器中，使得存储在该计算机可读存储器中的指令产生包括指令装置的制造品，该指令装置实现在流程图一个流程或多个流程和/或方框图一个方框或多个方框中指定的功能。
这些计算机程序指令也可装载到计算机或其他可编程数据处理设备上，使得在计算机或其他可编程设备上执行一系列操作步骤以产生计算机实现的处理，从而在计算机或其他可编程设备上执行的指令提供用于实现在流程图 一个流程或多个流程和/或方框图一个方框或多个方框中指定的功能的步骤。
尽管已描述了本发明的优选实施例，但本领域内的技术人员一旦得知了基本创造性概念，则可对这些实施例作出另外的变更和修改。所以，所附权利要求意欲解释为包括优选实施例以及落入本发明范围的所有变更和修改。
显然，本领域的技术人员可以对本发明进行各种改动和变型而不脱离本发明的精神和范围。这样，倘若本发明的这些修改和变型属于本发明权利要求及其等同技术的范围之内，则本发明也意图包含这些改动和变型在内。

Claims (10)

  1. 一种频率调节的方法，应用于直流电源系统中的绝缘阻抗检测装置中，其特征在于，该方法包括：
    分别采集采样点至少三个时刻的采样电压；
    根据采样得到的至少三个采样电压，确定电压频率的调节方式；
    根据确定的所述电压频率的调节方式，调节所述绝缘阻抗检测装置中的电源的电压频率。
  2. 如权利要求1所述的方法，其特征在于，根据采样得到的至少三个采样电压，确定电压频率的调节方式，包括：
    在所述采样得到的至少三个采样电压之间满足第一函数关系时，确定电压频率的调节方式为维持电压频率不变；
    在所述采样得到的至少三个采样电压之间不满足所述第一函数关系、满足第二函数关系时，确定电压频率的调节方式为按照设定的第一步长增大电压频率；
    在所述采样得到的至少三个采样电压之间不满足所述第一函数关系、满足第三函数关系时，确定电压频率的调节方式为按照设定的第二步长减小电压频率。
  3. 如权利要求2所述的方法，其特征在于，所述绝缘阻抗检测装置中的电源的电压周期为T；
    分别采集采样点至少三个时刻的采样电压，包括：
    分别采集采样点在所述电压周期的零时刻的第一采样电压、在所述电压周期的T/4时刻的第二采样电压、在所述电压周期的T/2时刻的第三采样电压；或者
    分别采集采样点在所述电压周期的T/2时刻的第一采样电压、在所述电压周期的3T/4时刻的第二采样电压、在所述电压周期的T时刻的第三采样电压。
  4. 如权利要求3所述的方法，其特征在于，所述第一函数关系为
    Figure PCTCN2016102460-appb-100001
    所述第二函数关系为
    Figure PCTCN2016102460-appb-100002
    所述第三函数关系为
    Figure PCTCN2016102460-appb-100003
    其中，V1为第一采样电压，V2为第二采样电压，V3为第三采样电压，k1∈(0,1)，k2∈(0,1)，且k2＜k1。
  5. 如权利要求3所述的方法，其特征在于，所述第一函数关系为|V3|-|V2|＞ΔVa且|V2|-|V1|＞ΔVb；
    所述第二函数关系为|V3|-|V2|＜ΔVa；
    所述第三函数关系为|V2|-|V0|＜ΔVb；
    其中，V1为第一采样电压，V2为第二采样电压，V3为第三采样电压，ΔVa、ΔVb为不小于电压采样中的检测误差的绝对值的常数。
  6. 一种频率调节的装置，应用于直流电源系统中的绝缘阻抗检测装置中，其特征在于，包括：
    采样单元，用于分别采集采样点至少三个时刻的采样电压；
    处理单元，用于根据采样得到的至少三个采样电压，确定电压频率的调节方式；
    调节单元，用于根据确定的所述电压频率的调节方式，调节所述绝缘阻抗检测装置中的电源的电压频率。
  7. 如权利要求6所述的装置，其特征在于，所述处理单元，具体用于：
    在所述采样得到的至少三个采样电压之间满足第一函数关系时，确定电压频率的调节方式为维持电压频率不变；在所述采样得到的至少三个采样电压之间不满足所述第一函数关系、满足第二函数关系时，确定电压频率的调节方式为按照设定的第一步长增大电压频率；在所述采样得到的至少三个采样电压之间不满足所述第一函数关系、满足第三函数关系时，确定电压频率 的调节方式为按照设定的第二步长减小电压频率。
  8. 如权利要求7所述的装置，其特征在于，所述绝缘阻抗检测装置中的电源的电压周期为T；所述采样单元，具体用于：
    分别采集采样点在所述电压周期的零时刻的第一采样电压、在所述电压周期的T/4时刻的第二采样电压、在所述电压周期的T/2时刻的第三采样电压；或者
    分别采集采样点在所述电压周期的T/2时刻的第一采样电压、在所述电压周期的3T/4时刻的第二采样电压、在所述电压周期的T时刻的第三采样电压。
  9. 如权利要求8所述的装置，其特征在于，所述第一函数关系为
    Figure PCTCN2016102460-appb-100004
    所述第二函数关系为
    Figure PCTCN2016102460-appb-100005
    所述第三函数关系为
    Figure PCTCN2016102460-appb-100006
    其中，V1为第一采样电压，V2为第二采样电压，V3为第三采样电压，k1∈(0,1)，k2∈(0,1)，且k2＜k1。
  10. 如权利要求8所述的装置，其特征在于，所述第一函数关系为|V3|-|V2|＞ΔVa且|V2|-|V1|＞ΔVb；
    所述第二函数关系为|V3|-|V2|＜ΔVa；
    所述第三函数关系为|V2|-|V0|＜ΔVb；
    其中，V1为第一采样电压，V2为第二采样电压，V3为第三采样电压，ΔVa、ΔVb为不小于电压采样中的检测误差的绝对值的常数。
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