WO2017094751A1 - Inspection device - Google Patents

Inspection device Download PDF

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Publication number
WO2017094751A1
WO2017094751A1 PCT/JP2016/085484 JP2016085484W WO2017094751A1 WO 2017094751 A1 WO2017094751 A1 WO 2017094751A1 JP 2016085484 W JP2016085484 W JP 2016085484W WO 2017094751 A1 WO2017094751 A1 WO 2017094751A1
Authority
WO
WIPO (PCT)
Prior art keywords
air pad
guide member
inspection apparatus
groove
air
Prior art date
Application number
PCT/JP2016/085484
Other languages
French (fr)
Japanese (ja)
Inventor
米澤 良
Original Assignee
株式会社ブイ・テクノロジー
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社ブイ・テクノロジー filed Critical 株式会社ブイ・テクノロジー
Priority to KR1020187014169A priority Critical patent/KR102644488B1/en
Priority to CN201680067587.5A priority patent/CN108351312B/en
Publication of WO2017094751A1 publication Critical patent/WO2017094751A1/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N2021/95676Masks, reticles, shadow masks

Definitions

  • the present invention relates to an inspection apparatus.
  • Patent Document 1 discloses a pattern inspection apparatus that supports a photomask in a vertical direction and inspects a pattern formed on the photomask.
  • the present invention has been made in view of such circumstances.
  • an inspection apparatus that supports a photomask in the vertical direction
  • the center of gravity of the apparatus can be lowered while providing a vibration isolation table under the surface plate.
  • An object is to provide an inspection device.
  • an inspection apparatus is, for example, a mask inspection apparatus that inspects a mask to be inspected supported in a vertical direction, and a lower surface, an upper surface parallel to the lower surface, A surface plate formed such that a distance between the lower surface and the upper surface is shorter than a short side of the upper surface, a column provided on the surface plate so as to protrude upward from the upper surface, An imaging unit provided on a column; and a vibration isolation table placed on an installation surface, and the lower surface is formed with substantially cubic recesses at four corners, and the vibration isolation table includes the recesses The height is higher than the depth, and the bottom surfaces of the recesses are respectively supported by the vibration isolation table.
  • substantially cubic concave portions are formed at the four corners on the lower surface of the surface plate, and the bottom surface of the concave portion is supported by the vibration isolation table placed on the installation surface.
  • a board is placed on the installation surface.
  • a mask support portion that supports the mask in the vertical direction is provided, and a groove is formed on the upper surface along the longitudinal direction of the surface plate at a position that does not overlap the concave portion in plan view.
  • the support portion may move inside the groove. Thereby, a gravity center position can be made low, maintaining the intensity
  • the depth of the recess may be formed to be 0.3 to 0.5 times the distance between the lower surface and the upper surface. Thereby, the strength of the surface plate can be maintained.
  • the imaging unit is provided movably along the pillar, and the groove is a lower end surface of an opening formed in the mask support unit when the imaging unit abuts on the surface plate. May be formed at such a depth that substantially matches the height of the optical axis of the imaging unit. Thereby, the gravity center position can be made the lowest.
  • the concave portion includes four first concave portions provided at the four corners of the lower surface, and two second concave portions respectively provided along the long sides of the lower surface, and the second One of the recesses may be formed at a position where a part thereof overlaps a part of the pillar in plan view.
  • a 2nd recessed part can be provided in the position nearer to the center of gravity, and as a result, the less distorted second recessed part can support the stone surface plate with less distortion.
  • the mask support portion has a guide member that moves inside the groove, and the guide member has a bottom air pad that discharges air toward the bottom surface of the groove, and air toward the side surface of the groove. And a guide member main body provided with the bottom surface air pad and the side surface air pad. Thereby, an air layer is formed between the guide member and the groove (side surface and bottom surface). Therefore, the guide member can be easily moved.
  • the side air pad is a first side air pad fixed to the first side surface of the guide member body, and a second side air pad provided in a hole formed in the second side surface opposite to the first side surface.
  • a second side air pad that is movably provided with respect to the guide member body, the guide member body includes a through-hole formed in the first side air pad, and the second side air pad.
  • a formed through-hole and a flow path for supplying air to the space between the hole and the second side air pad are formed, and the second side air pad is formed between the hole and the second side air pad.
  • the guide member main body may be moved by air supplied to the space.
  • channel and the front end surface of a 2nd side surface air pad can be adjusted automatically.
  • the mask support portion includes a frame that holds the mask, and an adjustment mechanism that is provided on the lower side of the frame and adjusts the height of the frame, and the guide
  • the member main body is provided with a pin penetrating in the vertical direction and having an upper end surface that is substantially hemispherical.
  • the lower end of the pin is provided on the bottom surface air pad, and the upper end is contacted with the bottom surface of the adjustment mechanism. You may touch. Thereby, a heavy mask support part is supported by a highly rigid groove, and an undesired uneven load on the air pad can be avoided.
  • the position of the center of gravity of the apparatus can be lowered while providing the vibration isolation table under the surface plate.
  • FIG. 1 is a plan view showing an outline of an inspection apparatus 1.
  • FIG. 1 is a perspective view showing an outline of an inspection apparatus 1.
  • FIG. 5 is a schematic diagram for explaining a guide member 33, and is a cross-sectional view taken along the line AA in FIG.
  • FIG. 1 is a front view showing an outline of an inspection apparatus 1 according to the first embodiment.
  • FIG. 2 is a plan view showing an outline of the inspection apparatus 1.
  • FIG. 3 is a perspective view showing an outline of the inspection apparatus 1.
  • a direction perpendicular to the paper surface in FIG. 1 is defined as an x direction
  • a vertical direction on the paper surface is defined as a y direction (vertical direction)
  • a direction orthogonal to the x direction and the y direction is defined as a z direction. 2 and 3 illustration of a part of the configuration is omitted.
  • the inspection apparatus 1 is, for example, an inspection apparatus that supports a photomask M to be inspected in a substantially vertical direction, and inspects a pattern or the like formed on the photomask M by moving a camera or the like in the vertical direction.
  • the photomask M to be inspected in this embodiment is an exposure mask used for manufacturing a substrate for a display device of a liquid crystal display device, for example.
  • the photomask M is obtained by forming one or a plurality of image device transfer patterns on a large, substantially rectangular substrate having a side exceeding, for example, 1 m.
  • the inspection apparatus 1 mainly includes a surface plate 10, an imaging unit 20, a mask support unit 30, and a vibration isolation table 50 (including vibration isolation tables 51 and 52, see FIG. 3).
  • the surface plate 10 is configured as a stage and is supported on vibration isolation tables 51 and 52 installed at a plurality of locations (six locations) on the installation surface F.
  • the surface plate 10 is a substantially rectangular parallelepiped (thick plate) stone member having a width W of about 1200 mm and a thickness T of about 400 mm.
  • the surface plate 10 has a lower surface 10a and an upper surface 10e parallel to the lower surface 10a, and the distance between the lower surface 10a and the upper surface 10e is shorter than the short side of the upper surface 10e.
  • concave portions 10 b and 10 c having a substantially cubic shape are formed on the lower surface 10 a of the surface plate 10.
  • the recess 10b is formed at one place at each of the four corners of the lower surface 10a.
  • the recessed part 10c is formed in two places, one each along the long side of the lower surface 10a.
  • the recesses 10b and 10c are formed in a total of six places. Distortion of the stone surface plate 10 can be reduced by providing the recess 10c in addition to the recess 10b.
  • the recess 10c formed on the + z side is formed at a position overlapping with a part of the column 21 (detailed later) in plan view (when viewed from above (+ y direction)). .
  • the recessed part 10c can be provided in the position nearer to the center of gravity, and the distortion of the stone surface plate 10 can be reduced.
  • the two concave portions 10c are formed at positions that are point-symmetric with respect to the gravity center position G of the inspection apparatus 1 in plan view (see FIG. 2).
  • the recess 10c has a larger lateral dimension (dimension in the x direction) than the recess 10b for maintenance of the vibration isolation table 52 and the like.
  • the recessed part 10c is not essential, in order to provide as many vibration isolation stands 50 as possible, it is desirable to form at least two recessed parts 10c. As in the present embodiment, by forming the recesses 10c one by one along the long side of the lower surface 10a, the stone platen 10 with less distortion can be supported with fewer recesses 10c. Moreover, the recessed part 10c is not limited to the position shown in figure, For example, the position of the x direction of the two recessed parts 10c may differ. However, considering the control of the vibration isolation table 50 and the like, it is desirable that the positions of the two concave portions 10c in the x direction be the same.
  • a vibration isolation table 51 placed on the installation surface F is provided inside the recess 10b (see FIG. 3).
  • An anti-vibration table 52 placed on the installation surface F is provided inside the recess 10c (see FIG. 3).
  • the bottom surfaces of the recesses 10b and 10c are support surfaces 10d supported by the vibration isolation tables 51 and 52.
  • the vibration isolation tables 51 and 52 are higher than the depth D1 of the recesses 10b and 10c. Accordingly, the vibration isolating bases 51 and 52 support the support surface 10 d, so that the surface plate 10 is placed on the installation surface F via the vibration isolating bases 51 and 52.
  • the stability of the inspection apparatus 1 is based on the position of the support surface 10d.
  • the concave portions 10b and 10c are formed in the thick surface plate 10, and the vibration isolation tables 51 and 52 are provided inside the concave portions 10b and 10c, whereby the center of gravity position of the inspection apparatus 1 when the support surface 10d is used as a reference. G becomes lower.
  • the center-of-gravity position G can be lowered by increasing the thickness T of the surface plate 10 or increasing the depth of the recesses 10b and 10c.
  • the depth D1 of the recesses 10b and 10c is 0.3 to 0.5 times the thickness T of the surface plate 10 in order to maintain the strength of the surface plate 10.
  • the depth D1 of the recesses 10b and 10c that is, the height of the support surface 10d is set so that the angle ⁇ (see FIG. 1) looking up the center of gravity G of the entire inspection apparatus 1 from the support surface 10d is 60 degrees or less. Is done.
  • the angle at which the center of gravity position G is looked up from the support surface 10d is smaller.
  • the recesses 10b and 10c are formed so that the angle ⁇ at which the center of gravity position G is looked up from the support surface 10d is about 45 degrees.
  • the recesses 10b and 10c are formed such that the height H1 of the lower surface 10a is about 100 mm.
  • a groove 10 f is formed on the upper surface 10 e of the surface plate 10.
  • the groove 10f is formed along the longitudinal direction (x direction) of the surface plate 10 at a position that does not overlap with the recesses 10b and 10c in plan view (see FIG. 2).
  • the thickness of the portion below the groove 10f of the surface plate 10 is increased, and the strength of the surface plate 10 is increased. Can be high.
  • the depth D2 of the groove 10f is sufficiently smaller than the thickness T of the surface plate 10.
  • the depth D2 of the groove 10f is about 60 mm, and the thickness of the portion below the groove 10f is about 340 mm. Therefore, even if the groove 10f is formed, the rigidity of the surface plate 10 can be made sufficiently high.
  • the groove 10f supports the mask support 30 so as to be movable in the x direction.
  • the groove 10f as a guide when moving the mask support part 30, the height of the imaging part 20 and the mask support part 30 can be lowered, and thereby the gravity center position G can be lowered.
  • the depth D2 of the groove 10f is the lower end of the photomask M in which the optical axis ax of the camera 22 when the camera 22a (detailed later) contacts the upper surface 10e is supported by the mask support 30 (detailed later). Is set to match.
  • This state is a state where the gravity center position G is lowest.
  • the depth D2 of the groove 10f is about 60 mm, and the height (pass line) H2 of the lower end of the photomask M at this time is about 680 mm.
  • the imaging unit 20 mainly includes a column 21 provided so as to protrude upward from the surface plate 10, a camera 22 provided on the column 21, and a support unit 23 that supports the mask support unit 30 at the inspection position ( (See FIG. 1).
  • the pillar 21 is attached to the upper surface 10e so as to protrude upward (+ y direction) from the upper surface 10e.
  • the column 21 is made of ceramic or the like. In order to lower the gravity center position G, the column 21 is preferably hollow.
  • the camera 22 is a TDI camera which is a CCD camera or a special CCD camera, for example, and has two cameras 22a and 22b. Two cameras 22a and 22b are provided adjacent to each other along the y direction. A moving part (not shown) including an air pad (not shown) is provided between the camera 22 and the column 21. The camera 22 is provided in a moving unit (not shown) so that its optical axis ax is parallel to the z-axis.
  • the moving unit moves in the vertical direction (y direction).
  • the moving unit includes two cameras 22a and 22b, an initial position where the camera 22a contacts the upper surface 10e of the surface plate 10, and an upper end position where the camera 22b is positioned near the upper end of the column 21 (see the two-dot chain line in FIG. 1). Are moved along the column 21.
  • the gravity center position G can be lowered.
  • the imaging unit 20 includes a transmission illumination light source and a reflection illumination light source (not shown).
  • the transmitted illumination light source is provided on the back side ( ⁇ z side) of the photomask M, and irradiates so-called g-line (for example, light having a wavelength of 435.84 [nm]).
  • the reflected illumination light source is provided on the surface side (+ z side) of the photomask M and irradiates so-called e-line (for example, light having a wavelength of 546.07 [nm]).
  • the camera 22 simultaneously receives and images the g-line irradiated from the transmitted illumination light source and the e-line irradiated from the reflected illumination light source.
  • Each of the cameras 22a and 22b includes an objective lens that converts g-line and e-line into parallel light, and an optical member that separates g-line and e-line that have passed through the objective lens (for example, a polarizing beam splitter and a dichroic filter). Member having both functions), two sets of imaging lenses that respectively image g-line and e-line separated by the optical member, and g-line and e-line imaged by the two sets of imaging lenses, respectively.
  • An imaging device As described above, the cameras 22a and 22b can simultaneously image the transmitted light and the reflected light.
  • the cameras 22a and 22b can use known techniques and will not be described in detail.
  • the camera 22 has two cameras 22a and 22b provided adjacent to each other in the y direction in case one of the cameras 22a and 22b breaks down.
  • the support unit 23 supports the mask support unit 30 so that the mask support unit 30 does not tilt in the horizontal direction when the mask support unit 30 is moved to the inspection position.
  • the well-known technique can be used for the support part 23, detailed description is abbreviate
  • the mask support unit 30 supports the photomask M.
  • the mask support unit 30 includes a frame 31, an adjustment mechanism 32, and a guide member 33.
  • the frame 31 is formed in a frame shape so as to surround the outer periphery of the photomask M supported vertically.
  • the frame 31 supports the photomask M so that the surface (the surface on which the pattern is formed) of the photomask M is parallel to the xy plane.
  • the adjustment mechanism 32 is provided below the frame 31.
  • the adjustment mechanism 32 changes the position of the lower side of the photomask M in the height direction (y direction). Since the adjustment mechanism 32 is already known, a detailed description thereof will be omitted.
  • the guide member 33 is a member that moves inside the groove 10f. As shown in FIG. 3, the guide member 33 mainly includes a guide member main body 331, side air pads 332 and 333, a lower surface air pad 334, and a pin 335.
  • the guide member main body 331 is a rod-like member on which the frame 31 and the adjustment mechanism 32 are provided.
  • the guide member main body 331 is provided with side air pads 332 and 333 and pins 335.
  • the guide member main body 331 is provided with a bottom surface air pad 334 via a pin 335.
  • FIG. 4 is a schematic view for explaining the guide member 33 and is a plan view in which the inspection apparatus 1 is partially enlarged.
  • the flow of air is indicated by thick broken line arrows.
  • Side air pads 332 and 333 are substantially cylindrical members (see FIG. 3).
  • the side air pad 332 is provided on the side surface 331a of the guide member main body 331, and the side air pad 333 is provided on the side surface 331b opposite to the side surface 331a.
  • the front end surface 332a of the side air pad 332 faces the side surface 10g of the groove 10f
  • the front end surface 333a of the side air pad 333 faces the side surface 10h of the groove 10f.
  • the side surface 10g facing the tip surface 332a is a reference surface, and is formed with high accuracy (for example, the surface accuracy is about 2 ⁇ m, and the surface accuracy of the side surface 10h that is not the reference surface is about 5 ⁇ m). Therefore, the position of the guide member main body 331 in the z direction and the angle with respect to the xz plane are determined by the tip surface 332a facing the side surface 10g with the thin air layer interposed therebetween.
  • the side surface air pad 332 has a substantially cylindrical coupling portion 332b and a substantially cylindrical air pad portion 332c.
  • the diameter of the coupling portion 332b is smaller than the diameter of the air pad portion 332c.
  • the coupling portion 332b is provided inside a hole 331c formed in the guide member main body 331.
  • An elastic member (for example, an O-ring) 341 is provided between the outer peripheral surface of the coupling portion 332b and the inner peripheral surface of the hole 331c. Further, since the diameter of the coupling portion 332b is smaller than the diameter of the air pad portion 332c, the state where the front end surface of the coupling portion 332b is in contact with the bottom surface of the hole 331c is maintained. Thereby, the angle of the side air pad 332 with respect to the guide member main body 331 is maintained in a constant state.
  • the side surface air pad 333 includes a substantially circular cylindrical sliding portion 333b and a substantially circular cylindrical air pad portion 333c.
  • the diameter of the sliding part 333b is smaller than the diameter of the air pad part 333c.
  • the sliding portion 333b is provided in a hole 331d having a diameter larger than the diameter of the sliding portion 333b so as to be movable with respect to the guide member body 331 (details will be described later).
  • An elastic member 342 is provided between the outer peripheral surface of the sliding portion 333b and the inner peripheral surface of the hole 331d so that the supplied air does not escape (detailed later).
  • through holes 332d and 333d are formed, respectively.
  • orifices 332e and 333e are formed in the through holes 332d and 333d.
  • the through holes 332d and 333d are connected to a tubular hole 331e formed in the guide member main body 331.
  • the hole 331e is a passage for air supplied from a pump (not shown), one end is covered with a plug 343, and the other end is connected to a pipe 351 connected to the pump or the like. As a result, air is supplied to the space between the hole 331d and the sliding portion 333b and the through holes 332d and 333d via the pipe 351.
  • the air supplied to the through-hole 332d passes through the orifice 332e and is discharged toward the side surface 10g from the opening on the tip surface 332a side of the through-hole 332d (see the thick broken line arrow in FIG. 4).
  • the air supplied to the through-hole 333d passes through the orifice 333e and is discharged from the opening on the distal end surface 333a side of the through-hole 333d toward the side surface 10h (see thick broken line arrow in FIG. 4).
  • a thin air layer is formed between the side surface 10 g and the front end surface 332 a of the side air pad 332 and between the side surface 10 h and the front end surface 333 a of the side air pad 333.
  • the distance between the side surface 10g and the tip surface 332a and the distance between the side surface 10h and the tip surface 333a are automatically adjusted. For example, when the width of the groove 10f is wide, the side surface air pad 333 is moved in the direction in which the side surface air pad 333 protrudes from the guide member main body 331 ( ⁇ z direction), and the front end surface 333a of the side surface air pad 333 is brought closer to the side surface 10h.
  • Area of the side surface air pads 332, i.e. the distal end surface 332a is the same area S Pd as the area of the distal end surface 333a, the guide member body 331 is automatically positioned in the groove 10f is maintained.
  • the central axis of the sliding portion 333b is the central axis of the hole 331d (the normal direction of the side surface where the hole 331d of the guide member main body 331 is formed). Can be tilted against. Therefore, even when the side surface 10g and the side surface 10h are not parallel, the side surface 10g and the front end surface 332a can be made parallel, and the side surface 10h and the front end surface 333a can be made parallel.
  • the side surface air pads 332 and 333 spread the side surface of the groove 10f through the thin air layer formed between the side surface 10g and the front end surface 332a and between the side surface 10h and the front end surface 333a. Since the groove 10f is made of stone and does not change in size, the side air pads 332 and 333, that is, the guide member 33 are guided by the groove 10f.
  • the pressure of the air that presses the distal end surface 333f, and the through hole may be different from the pressure of the air supplied to the through hole 333d.
  • the air flow path supplied from the hole 331e in the space between the sliding portion 333b and the hole 331d is partially different from the air flow path supplied from the hole 331e to the through-hole 333d, and Different regulators may be provided in different portions.
  • the lower surface air pad 334 is a substantially rectangular member in plan view (viewed from the top (+ y direction)), and is provided on the lower side ( ⁇ y side) of the guide member main body 331 via a pin 335 (see FIGS. 3 and 5).
  • the lower surface air pad 334 has a tubular through hole 334a formed therein.
  • the through hole 334a is a passage for air supplied from a pump or the like (not shown).
  • One end of the through hole 334a opens to the lower surface 334c (see FIG. 5), and the other end opens to the side surface 334d.
  • An opening portion opened to the side surface 334d of the through hole 334a is connected to a pipe 352 connected to a pump or the like. As a result, air is supplied to the through hole 334a through the pipe 352.
  • FIG. 5 is a schematic diagram for explaining the guide member 33, and is a cross-sectional view taken along the line AA in FIG. In FIG. 5, the air flow is indicated by thick dashed arrows.
  • the pin 335 is a rod-like member having a substantially hemispherical surface in the vertical direction.
  • the pin 335 penetrates the guide member main body 331 in the vertical direction (y direction).
  • a male screw (not shown) is formed on the outer peripheral surface of the pin 335, and this male screw is a female screw (not shown) formed in a hole 331f penetrating the guide member main body 331 in the y direction. ). Thereby, the pin 335 is fixed to the guide member main body 331.
  • the lower end of the pin 335 is provided in a hole 334e formed in the upper surface of the lower air pad 334.
  • the bottom surface of the hole 334e is substantially hemispherical, and the bottom surface of the hole 334e and the substantially hemispherical surface at the lower end of the pin 335 are in contact with each other.
  • the upper end of the pin 335 is an end surface 335a which is a substantially hemispherical surface.
  • the end surface 335 a contacts the bottom surface 32 a of the adjustment mechanism 32.
  • the end surface 335a abuts on the recess 32b formed on the bottom surface 32a. Since the end surface 335a is substantially hemispherical, even if the adjustment mechanism 32 is inclined with respect to the pin 335, the position of the adjustment mechanism 32 can be determined with respect to the position of the end surface 335a, and is inconvenient for the air pads 332 and 334. Uneven load can be avoided.
  • the recess 32b is not essential, and the shape of the recess 32b is not limited to this.
  • the pin 335 is provided for each lower surface air pad 334. Therefore, the frame 31 and the adjustment mechanism 32 are supported by the two lower surface air pads 334 via the two pins 335.
  • An orifice 334b is formed inside the through hole 334a.
  • the air supplied from the pipe 352 (see FIG. 4) to the through hole 334a passes through the orifice 334b and is discharged from the opening on the lower surface 334c side of the lower surface air pad 334 toward the bottom surface 10i of the groove 10f.
  • a thin air layer is formed between the bottom surface 10i and the bottom surface 334c by the air discharged from the through hole 334a (see the broken line arrow in FIG. 5).
  • the lower surface air pad 334 that is, the guide member 33 is lifted from the bottom surface of the groove 10f against the weight of the frame 31, the adjustment mechanism 32, the photomask M, and the like.
  • the heavy frame 31 and the adjustment mechanism 32 can be supported by the highly rigid groove 10f.
  • the vibration isolation table 50 includes a vibration isolation table 51 that is an active vibration isolation table, and a vibration isolation table 52 that is a passive vibration isolation table supported by weight.
  • the vibration isolation table 52 has a passive spring element that can move in the z direction.
  • the anti-vibration table 51 is provided on the anti-vibration table 52 with actuators 51a and 51b movable in the x-direction and y-direction, respectively, and sensors provided in the actuators 51a and 51b for controlling the actuators 51a and 51b ( (Not shown) and a control circuit (not shown) for controlling the actuators 51a and 51b so as to suppress vibrations input from the outside based on a signal from a sensor (not shown) are added. Since the vibration isolation tables 51 and 52 are already known, a detailed description thereof will be omitted.
  • the vibration isolation tables 51 and 52 support the support surface 10d, the height of the vibration isolation tables 51 and 52 is higher than the depth D1 of the recesses 10b and 10c.
  • the diameter of the vibration isolation tables 51 and 52 is equal to or less than the length of the side of the support surface 10d.
  • the vibration isolation bases 51 and 52 are accommodated in the recesses 10b and 10c, so that space can be saved.
  • the diameter of the vibration isolation tables 51 and 52 may not be less than or equal to the length of the sides of the recesses 10b and 10c.
  • the photomask M is attached to the frame 31, and the position of the lower side of the photomask M in the height direction (y direction) is adjusted by the adjusting mechanism 32.
  • the mask support portion 30 is located at an attachment position near the end of the surface plate 10 in the + direction.
  • the guide member 33 is moved in the ⁇ x direction along the groove 10f, and the photomask M is moved from the mounting position to the inspection position.
  • air is supplied to the side air pads 332 and 333 from a pump (not shown) of the guide member 33 and the air is discharged from the through holes 332d and 333d. Further, air is supplied to the lower surface air pad 334 from a pump or the like (not shown) of the guide member 33, and the air is discharged from the through hole 334a.
  • a force in the ⁇ x direction is applied to the guide member main body 331 by a drive mechanism (for example, a linear motor) (not shown) of the guide member 33. Since air layers are formed between the side air pads 332 and 333 and the side surfaces 10g and 10h of the groove 10f and between the lower surface air pad 334 and the bottom surface 10i of the groove 10f, a force is applied to the guide member main body 331. As a result, the guide member 33 can be easily moved.
  • a drive mechanism for example, a linear motor
  • the image mask 20 inspects the photomask M.
  • g-line is simultaneously emitted from the transmitted illumination light source and e-line is emitted from the reflected illumination light source, and these are simultaneously received and imaged by the cameras 22a and 22b.
  • the difference between the two images is obtained by subtracting the image captured by the camera 22a from the image captured by the camera 22b, thereby finding a pattern defect or the like.
  • the method of finding a pattern defect or the like is not limited to this.
  • a pattern defect or the like may be found by comparing each of the image captured by the camera 22a and the image captured by the camera 22b with an image generated based on the design data.
  • the inspection can be performed quickly and various defects can be found.
  • this inspection is performed at an initial position where the camera 22a contacts the upper surface 10e of the surface plate 10.
  • the imaging unit 20 irradiates the transmission illumination light source, the reflection illumination light source, and the cameras 22a and 22b upward (+ y direction) along the column 21 while simultaneously irradiating the transmission illumination light source with g-line and the reflection illumination light source with e-line. Move. In this manner, the pattern formed on the photomask M supported by the mask support unit 30 is sequentially imaged.
  • the imaging unit 20 when the images are taken while moving the cameras 22a and 22b from the initial position to the upper end position, the imaging unit 20 returns the cameras 22a and 22b to the initial position. Then, the guide member 33, that is, the photomask M is moved in the ⁇ x direction by a predetermined distance. Similarly, the imaging unit 20 captures an image while moving the cameras 22a and 22b.
  • the entire surface of the photomask M can be inspected by repeating such an operation.
  • the moving speed in the vertical direction of the cameras 22a and 22b and the moving speed in the horizontal direction of the guide member 33 are adjusted according to the field of view range and performance of the cameras 22a and 22b.
  • the recesses 10b and 10c are formed on the lower surface 10a of the surface plate 10, and the vibration isolation tables 51 and 52 placed on the installation surface F are the bottom surfaces (support surfaces 10d) of the recesses 10b and 10c.
  • the gravity center position G of the inspection apparatus 1 when the support surface 10d is used as a reference can be lowered. Since the inspection apparatus 1 supports the photomask M in the vertical direction, the gravity center position G tends to be high.
  • the vibration isolation tables 51 and 52 inside the recesses 10b and 10c the center of gravity G of the inspection apparatus 1 can be lowered while providing the vibration isolation tables 51 and 52 below the surface plate 10. . Further, since the vibration isolation tables 51 and 52 are provided, the vibration resistance of the inspection apparatus 1 can be increased. Further, by providing the vibration isolation tables 51 and 52 inside the recesses 10b and 10c, the inspection apparatus 1 can be saved in space.
  • the vibration isolation tables 51 and 52 are provided on the lower side of the surface plate where no concave portion is formed, the gravity center position G becomes high.
  • the vibration isolation tables 51 and 52 are provided outside the surface plate where no concave portion is formed, the outer shape of the inspection apparatus becomes large.
  • the inspection apparatus 1 can be made smaller while the center of gravity G is lowered. it can.
  • the groove 10f is formed on the upper surface 10e of the surface plate 10 at a position that does not overlap with the recesses 10b and 10c in plan view, so that the center of gravity position G is maintained while maintaining the strength of the surface plate 10. Can be lowered. For example, if a rail is formed on the upper surface 10e of the surface plate 10 and a mask support portion is provided thereon, the center of gravity position G is increased. On the other hand, the center of gravity position G can be lowered by providing the mask support 30 in the groove 10f.
  • the air is discharged from the side air pads 332 and 333 and the lower surface air pad 334, so that the gap between the side air pads 332 and 333 and the side surfaces 10g and 10h of the groove 10f is obtained.
  • an air layer can be formed between the lower surface air pad 334 and the bottom surface 10i of the groove 10f.
  • the rigidity is low and the dimensional accuracy is lowered.
  • the installation position becomes high.
  • the groove 10f is formed on the surface plate 10
  • the rigidity is high and the dimensional accuracy is also high. Therefore, the guide member 33 can be moved smoothly with less vibration.
  • the groove 10f is strong, air can be discharged from the through holes 332d, 333d, and 334a with high pressure. Therefore, the guide member 33 can be reliably floated from the groove 10f, and the guide member 33 can be moved more smoothly.
  • the installation position of the mask support portion 30 can be lowered.
  • substantially is a concept that includes not only a case where they are exactly the same but also errors and deformations that do not lose the identity.
  • the substantially cubic shape is not limited to a strictly cubic shape.
  • the surface plate 10 is formed with a recess 10b and the like, but the surface plate 10 as a whole has a substantially cubic shape.
  • the expression is simply vertical, coincidence, etc., not only strictly vertical, coincidence, but also the case of substantially vertical, substantially coincidence, etc. is included.
  • the “neighborhood” is a concept indicating that when it is in the vicinity of A, for example, it is near A and may or may not contain A.
  • Inspection apparatus 10 Surface plate 10a: Lower surface 10b, 10c: Recess 10d: Support surface 10e: Upper surface 10f: Groove 10g, 10h: Side surface 10i: Bottom surface 20: Imaging unit 21: Pillar 22: Cameras 22a, 22b: Camera 23 : Support portion 30: mask support portion 31: frame 32: adjustment mechanism 32a: bottom surface 32b: concave portion 33: guide member 50: vibration isolation table 51: vibration isolation table 51a, 51b: actuator 52: vibration isolation table 331: guide member main body 331a: Side 331b: Side 331c: Hole 331d: Hole 331e: Hole 331f: Hole 332: Side air pad 332a: Tip surface 332b: Coupling portion 332c: Air pad portion 332d: Through hole 332e: Orifice 333: Side air pad 3 33a: tip surface 333b: sliding portion 333c: air pad portion 333d: through hole 333e: orifice 333f: tip surface 334: bottom

Abstract

An inspection device in which a photomask is supported in the vertical direction, wherein the center-of-gravity position of the device can be lowered even when an anti-vibration stage is provided below a surface plate. A substantially cube-shaped recess 10b is formed at each of the four corners of the lower surface 10a of the surface plate 10. The bottom surfaces of the recesses 10b are supported by an anti-vibration stage 51, which is higher than the recess is deep.

Description

検査装置Inspection device
 本発明は、検査装置に関する。 The present invention relates to an inspection apparatus.
 特許文献1には、鉛直方向にフォトマスクを支持して、フォトマスクに形成されたパターンを検査するパターン検査装置が開示されている。 Patent Document 1 discloses a pattern inspection apparatus that supports a photomask in a vertical direction and inspects a pattern formed on the photomask.
特開2010-181296号公報JP 2010-181296 A
 特許文献1に記載の発明では、鉛直方向にフォトマスクを支持するため、水平方向にフォトマスクを指示する装置に比べて、装置の重心位置が高くなってしまう。その結果、装置が安定しないという問題がある。 In the invention described in Patent Document 1, since the photomask is supported in the vertical direction, the position of the center of gravity of the apparatus becomes higher than that of the apparatus that instructs the photomask in the horizontal direction. As a result, there is a problem that the apparatus is not stable.
 また、特許文献1に記載の発明では、ステージが設置面(例えば、床)に直接載置されているため、装置駆動時に振動が発生しても、その振動を抑えることができないという問題がある。なお、装置の振動を抑えるため、ステージの下に除振台を設ける場合があるが、この場合には、装置の重心位置が更に高くなってしまう。 Further, in the invention described in Patent Document 1, since the stage is placed directly on the installation surface (for example, the floor), there is a problem that even if vibration occurs when the apparatus is driven, the vibration cannot be suppressed. . In order to suppress the vibration of the apparatus, a vibration isolation table may be provided under the stage. In this case, the position of the center of gravity of the apparatus is further increased.
 本発明はこのような事情に鑑みてなされたもので、鉛直方向にフォトマスクを支持する検査装置において、定盤の下に除振台を設けつつも、装置の重心位置を低くすることができる検査装置を提供することを目的とする。 The present invention has been made in view of such circumstances. In an inspection apparatus that supports a photomask in the vertical direction, the center of gravity of the apparatus can be lowered while providing a vibration isolation table under the surface plate. An object is to provide an inspection device.
 上記課題を解決するために、本発明に係る検査装置は、例えば、鉛直方向に支持された被検査対象のマスクを検査するマスク検査装置であって、下面と、前記下面と平行な上面と、を有し、前記下面と前記上面との距離が前記上面の短辺より短くなるように形成された定盤と、前記上面から上方に突出するように前記定盤に設けられた柱と、前記柱に設けられた撮像部と、設置面上に載置された除振台と、を備え、前記下面には、四隅にそれぞれ略立方体形状の凹部が形成され、前記除振台は、前記凹部の深さより高さが高く、前記凹部の底面は、それぞれ前記除振台により支持されることを特徴とする。 In order to solve the above problems, an inspection apparatus according to the present invention is, for example, a mask inspection apparatus that inspects a mask to be inspected supported in a vertical direction, and a lower surface, an upper surface parallel to the lower surface, A surface plate formed such that a distance between the lower surface and the upper surface is shorter than a short side of the upper surface, a column provided on the surface plate so as to protrude upward from the upper surface, An imaging unit provided on a column; and a vibration isolation table placed on an installation surface, and the lower surface is formed with substantially cubic recesses at four corners, and the vibration isolation table includes the recesses The height is higher than the depth, and the bottom surfaces of the recesses are respectively supported by the vibration isolation table.
 本発明に係る検査装置によれば、定盤の下面に、四隅にそれぞれ略立方体形状の凹部を形成し、設置面上に載置された除振台により凹部の底面を支持することで、定盤が設置面上に載置される。これにより、鉛直方向にフォトマスクを支持する検査装置において、定盤の下に除振台を設けつつも、装置の重心位置を低くすることができる。 According to the inspection apparatus of the present invention, substantially cubic concave portions are formed at the four corners on the lower surface of the surface plate, and the bottom surface of the concave portion is supported by the vibration isolation table placed on the installation surface. A board is placed on the installation surface. Thereby, in the inspection apparatus that supports the photomask in the vertical direction, the center of gravity of the apparatus can be lowered while providing the vibration isolation table under the surface plate.
 ここで、前記マスクを鉛直方向に支持するマスク支持部を備え、前記上面には、平面視において、前記凹部と重ならない位置に、前記定盤の長手方向に沿った溝が形成され、前記マスク支持部は、前記溝の内部を移動するようにしてもよい。これにより、定盤の強度を保ちつつ、重心位置を低くすることができる。 Here, a mask support portion that supports the mask in the vertical direction is provided, and a groove is formed on the upper surface along the longitudinal direction of the surface plate at a position that does not overlap the concave portion in plan view. The support portion may move inside the groove. Thereby, a gravity center position can be made low, maintaining the intensity | strength of a surface plate.
 ここで、前記凹部の深さは、前記下面と前記上面との距離の0.3~0.5倍となるように形成されてもよい。これにより、定盤の強度を保つことができる。 Here, the depth of the recess may be formed to be 0.3 to 0.5 times the distance between the lower surface and the upper surface. Thereby, the strength of the surface plate can be maintained.
 ここで、前記撮像部は、前記柱に沿って移動可能に設けられ、前記溝は、前記撮像部が前記定盤に当接したときに、前記マスク支持部に形成された開口部の下端面の高さが、前記撮像部の光軸の高さと略一致するような深さで形成されてもよい。これにより、重心位置を最も低くすることができる。 Here, the imaging unit is provided movably along the pillar, and the groove is a lower end surface of an opening formed in the mask support unit when the imaging unit abuts on the surface plate. May be formed at such a depth that substantially matches the height of the optical axis of the imaging unit. Thereby, the gravity center position can be made the lowest.
 ここで、前記凹部は、前記下面の前記四隅に設けられる4つの第1の凹部と、前記下面の長辺に沿ってそれぞれ設けられる2つの第2の凹部と、を有し、前記第2の凹部のうちの1つは、平面視において、一部が前記柱の一部と重なる位置に形成されてもよい。これにより、より重心に近い位置に第2の凹部を設けることができ、その結果少ない第2の凹部で、より歪みの少ない石定盤の支持ができる。 Here, the concave portion includes four first concave portions provided at the four corners of the lower surface, and two second concave portions respectively provided along the long sides of the lower surface, and the second One of the recesses may be formed at a position where a part thereof overlaps a part of the pillar in plan view. Thereby, a 2nd recessed part can be provided in the position nearer to the center of gravity, and as a result, the less distorted second recessed part can support the stone surface plate with less distortion.
 ここで、前記マスク支持部は、前記溝の内部を移動するガイド部材を有し、前記ガイド部材は、前記溝の底面に向けて空気を吐出する底面エアパッドと、前記溝の側面に向けて空気を吐出する側面エアパッドと、前記底面エアパッド及び前記側面エアパッドが設けられるガイド部材本体と、を有してもよい。これにより、ガイド部材と溝(側面及び底面)との間に空気の層が形成される。したがって、ガイド部材を容易に移動させることができる。 Here, the mask support portion has a guide member that moves inside the groove, and the guide member has a bottom air pad that discharges air toward the bottom surface of the groove, and air toward the side surface of the groove. And a guide member main body provided with the bottom surface air pad and the side surface air pad. Thereby, an air layer is formed between the guide member and the groove (side surface and bottom surface). Therefore, the guide member can be easily moved.
 ここで、前記側面エアパッドは、前記ガイド部材本体の第1側面に固定される第1側面エアパッドと、前記第1側面と反対側の第2側面に形成された穴に設けられる第2側面エアパッドであって、前記ガイド部材本体に対して移動可能に設けられる第2側面エアパッドと、を有し、前記ガイド部材本体には、前記第1側面エアパッドに形成された貫通孔、前記第2側面エアパッドに形成された貫通孔、及び前記穴と前記第2側面エアパッドとの間の空間に空気を供給する流路が形成され、前記第2側面エアパッドは、前記穴と前記第2側面エアパッドとの間の空間に供給される空気により前記ガイド部材本体に対して移動されてもよい。これにより、溝の第1側面と第1側面エアパッドの先端面との間隔及び溝の第2側面と第2側面エアパッドの先端面との間隔を自動的に調整することができる。 Here, the side air pad is a first side air pad fixed to the first side surface of the guide member body, and a second side air pad provided in a hole formed in the second side surface opposite to the first side surface. A second side air pad that is movably provided with respect to the guide member body, the guide member body includes a through-hole formed in the first side air pad, and the second side air pad. A formed through-hole and a flow path for supplying air to the space between the hole and the second side air pad are formed, and the second side air pad is formed between the hole and the second side air pad. The guide member main body may be moved by air supplied to the space. Thereby, the space | interval of the 1st side surface of a groove | channel and the front end surface of a 1st side surface air pad and the space | interval of the 2nd side surface of a groove | channel and the front end surface of a 2nd side surface air pad can be adjusted automatically.
 ここで、前記マスク支持部は、前記マスクを保持するフレームと、前記フレームの下側に設けられた調整機構であって、前記フレームの高さを調整する調整機構と、を有し、前記ガイド部材本体には、上下方向に貫通するピンであって、上端面が略半球面であるピンが設けられ、前記ピンは、下端が前記底面エアパッドに設けられ、上端が前記調整機構の底面に当接してもよい。これにより、重いマスク支持部を、剛性の高い溝で支え、かつエアパッドに不都合な偏荷重を避けることができる。 Here, the mask support portion includes a frame that holds the mask, and an adjustment mechanism that is provided on the lower side of the frame and adjusts the height of the frame, and the guide The member main body is provided with a pin penetrating in the vertical direction and having an upper end surface that is substantially hemispherical. The lower end of the pin is provided on the bottom surface air pad, and the upper end is contacted with the bottom surface of the adjustment mechanism. You may touch. Thereby, a heavy mask support part is supported by a highly rigid groove, and an undesired uneven load on the air pad can be avoided.
 本発明によれば、鉛直方向にフォトマスクを支持する検査装置において、定盤の下に除振台を設けつつも、装置の重心位置を低くすることができる。 According to the present invention, in the inspection apparatus that supports the photomask in the vertical direction, the position of the center of gravity of the apparatus can be lowered while providing the vibration isolation table under the surface plate.
第1の実施の形態に係る検査装置1の概略を示す正面図である。It is a front view showing the outline of inspection device 1 concerning a 1st embodiment. 検査装置1の概略を示す平面図である。1 is a plan view showing an outline of an inspection apparatus 1. FIG. 検査装置1の概略を示す斜視図である。1 is a perspective view showing an outline of an inspection apparatus 1. FIG. ガイド部材33を説明するための概略図であり、検査装置1を部分的に拡大した平面図である。It is the schematic for demonstrating the guide member 33, and is the top view which expanded the inspection apparatus 1 partially. ガイド部材33を説明するための概略図であり、図4のA-A断面図である。FIG. 5 is a schematic diagram for explaining a guide member 33, and is a cross-sectional view taken along the line AA in FIG.
 以下、本発明の実施形態を、図面を参照して詳細に説明する。 Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.
 <第1の実施の形態>
 図1は、第1の実施の形態に係る検査装置1の概略を示す正面図である。図2は、検査装置1の概略を示す平面図である。図3は、検査装置1の概略を示す斜視図である。本明細書においては、図1で紙面に垂直な方向をx方向と定義し、紙面上下方向をy方向(鉛直方向)とし、x方向及びy方向と直交する方向をz方向と定義する。なお、図2、3においては、一部の構成について図示を省略している。
<First Embodiment>
FIG. 1 is a front view showing an outline of an inspection apparatus 1 according to the first embodiment. FIG. 2 is a plan view showing an outline of the inspection apparatus 1. FIG. 3 is a perspective view showing an outline of the inspection apparatus 1. In this specification, a direction perpendicular to the paper surface in FIG. 1 is defined as an x direction, a vertical direction on the paper surface is defined as a y direction (vertical direction), and a direction orthogonal to the x direction and the y direction is defined as a z direction. 2 and 3, illustration of a part of the configuration is omitted.
 検査装置1は、例えば、略鉛直方向に被検査対象のフォトマスクMを支持し、カメラ等を鉛直方向に移動させてフォトマスクMに形成されたパターン等を検査する検査装置である。 The inspection apparatus 1 is, for example, an inspection apparatus that supports a photomask M to be inspected in a substantially vertical direction, and inspects a pattern or the like formed on the photomask M by moving a camera or the like in the vertical direction.
 本実施形態において検査対象とされるフォトマスクMは、例えば液晶表示装置の表示装置用の基板を製造するために用いられる露光用マスクである。フォトマスクMは、一辺が例えば1mを超える大型な略矩形形状の基板上に、1個または複数個のイメージデバイス用転写パターンが形成されたものである。 The photomask M to be inspected in this embodiment is an exposure mask used for manufacturing a substrate for a display device of a liquid crystal display device, for example. The photomask M is obtained by forming one or a plurality of image device transfer patterns on a large, substantially rectangular substrate having a side exceeding, for example, 1 m.
 検査装置1は、主として、定盤10と、撮像部20と、マスク支持部30と、除振台50(除振台51、52を含む。図3参照)と、を有する。 The inspection apparatus 1 mainly includes a surface plate 10, an imaging unit 20, a mask support unit 30, and a vibration isolation table 50 (including vibration isolation tables 51 and 52, see FIG. 3).
 定盤10は、ステージとして構成されており、設置面F上の複数箇所(6箇所)に設置されている除振台51、52の上に支持される。 The surface plate 10 is configured as a stage and is supported on vibration isolation tables 51 and 52 installed at a plurality of locations (six locations) on the installation surface F.
 定盤10は、幅Wが1200mm程度、厚さTが400mm程度の略直方体形状(厚板状)の石製の部材である。言い換えると、定盤10は、下面10aと、下面10aと平行な上面10eと、を有し、下面10aと上面10eとの距離は、上面10eの短辺より短い。 The surface plate 10 is a substantially rectangular parallelepiped (thick plate) stone member having a width W of about 1200 mm and a thickness T of about 400 mm. In other words, the surface plate 10 has a lower surface 10a and an upper surface 10e parallel to the lower surface 10a, and the distance between the lower surface 10a and the upper surface 10e is shorter than the short side of the upper surface 10e.
 定盤10の下面10aには、略立方体形状の凹部10b、10cが形成される。凹部10bは、下面10aの4つの隅のそれぞれに一箇所ずつ形成される。凹部10cは、下面10aの長辺に沿ってそれぞれ一箇所ずつ、合計2箇所形成される。このように、凹部10b、10cは、合計6箇所形成される。凹部10bに加えて凹部10cを設けることで、石定盤10の歪みを少なくすることができる。 On the lower surface 10 a of the surface plate 10, concave portions 10 b and 10 c having a substantially cubic shape are formed. The recess 10b is formed at one place at each of the four corners of the lower surface 10a. The recessed part 10c is formed in two places, one each along the long side of the lower surface 10a. Thus, the recesses 10b and 10c are formed in a total of six places. Distortion of the stone surface plate 10 can be reduced by providing the recess 10c in addition to the recess 10b.
 2つの凹部10cのうちの、+z側に形成される凹部10cは、平面視(上(+y方向)から見たとき)において、柱21(後に詳述)の一部と重なる位置に形成される。これにより、より重心に近い位置に凹部10cを設け、石定盤10の歪みをより少なくすることができる。また、2つの凹部10cは、平面視(図2参照)において、検査装置1の重心位置Gを挟んで点対称となる位置に形成される。凹部10cは、除振台52のメンテナンス等のため、凹部10bより横寸法(x方向の寸法)が大きい。 Of the two recesses 10c, the recess 10c formed on the + z side is formed at a position overlapping with a part of the column 21 (detailed later) in plan view (when viewed from above (+ y direction)). . Thereby, the recessed part 10c can be provided in the position nearer to the center of gravity, and the distortion of the stone surface plate 10 can be reduced. In addition, the two concave portions 10c are formed at positions that are point-symmetric with respect to the gravity center position G of the inspection apparatus 1 in plan view (see FIG. 2). The recess 10c has a larger lateral dimension (dimension in the x direction) than the recess 10b for maintenance of the vibration isolation table 52 and the like.
 なお、凹部10cは必須ではないが、なるべく多くの除振台50を設けるためには、凹部10cを少なくとも2つは形成することが望ましい。本実施の形態のように、凹部10cを下面10aの長辺に沿ってそれぞれ一箇所ずつ形成することで、少ない凹部10cでより歪みの少ない石定盤10の支持ができる。また、凹部10cは、図示された位置に限定されず、例えば、2個の凹部10cのx方向の位置が異なっていてもよい。ただし、除振台50の制御等を考慮すると、2つの凹部10cのx方向の位置を同じにすることが望ましい。 In addition, although the recessed part 10c is not essential, in order to provide as many vibration isolation stands 50 as possible, it is desirable to form at least two recessed parts 10c. As in the present embodiment, by forming the recesses 10c one by one along the long side of the lower surface 10a, the stone platen 10 with less distortion can be supported with fewer recesses 10c. Moreover, the recessed part 10c is not limited to the position shown in figure, For example, the position of the x direction of the two recessed parts 10c may differ. However, considering the control of the vibration isolation table 50 and the like, it is desirable that the positions of the two concave portions 10c in the x direction be the same.
 凹部10bの内部には、設置面F上に載置された除振台51が設けられる(図3参照)。凹部10cの内部には、設置面F上に載置された除振台52が設けられる(図3参照)。凹部10b、10cの底面は、除振台51、52により支持される支持面10dである。 A vibration isolation table 51 placed on the installation surface F is provided inside the recess 10b (see FIG. 3). An anti-vibration table 52 placed on the installation surface F is provided inside the recess 10c (see FIG. 3). The bottom surfaces of the recesses 10b and 10c are support surfaces 10d supported by the vibration isolation tables 51 and 52.
 図1に示すとおり、凹部10b、10cの深さD1より、除振台51、52の高さが高い。したがって、除振台51、52が支持面10dを支持することで、定盤10が除振台51、52を介して設置面F上に載置される。検査装置1の安定性は、この支持面10dの位置が基準となる。 As shown in FIG. 1, the vibration isolation tables 51 and 52 are higher than the depth D1 of the recesses 10b and 10c. Accordingly, the vibration isolating bases 51 and 52 support the support surface 10 d, so that the surface plate 10 is placed on the installation surface F via the vibration isolating bases 51 and 52. The stability of the inspection apparatus 1 is based on the position of the support surface 10d.
 このように、厚い定盤10に凹部10b、10cを形成し、凹部10b、10cの内部に除振台51、52を設けることで、支持面10dを基準とした時の検査装置1の重心位置Gが低くなる。定盤10の厚さTを厚くしたり、凹部10b、10cの深さを深くしたりすることで、重心位置Gを低くすることができる。 In this way, the concave portions 10b and 10c are formed in the thick surface plate 10, and the vibration isolation tables 51 and 52 are provided inside the concave portions 10b and 10c, whereby the center of gravity position of the inspection apparatus 1 when the support surface 10d is used as a reference. G becomes lower. The center-of-gravity position G can be lowered by increasing the thickness T of the surface plate 10 or increasing the depth of the recesses 10b and 10c.
 ただし、凹部10b、10cの深さD1は、定盤10の強度を保つため、定盤10の厚さTの0.3~0.5倍とする。 However, the depth D1 of the recesses 10b and 10c is 0.3 to 0.5 times the thickness T of the surface plate 10 in order to maintain the strength of the surface plate 10.
 また、凹部10b、10cの深さD1、すなわち支持面10dの高さは、支持面10dから検査装置1全体の重心位置Gを見上げる角度θ(図1参照)が60度以下となるように設定される。 Further, the depth D1 of the recesses 10b and 10c, that is, the height of the support surface 10d is set so that the angle θ (see FIG. 1) looking up the center of gravity G of the entire inspection apparatus 1 from the support surface 10d is 60 degrees or less. Is done.
 ただし、支持面10dから重心位置Gを見上げる角度は、小さい方が望ましい。本実施の形態では、支持面10dから重心位置Gを見上げる角度θが略45度程度となるように、凹部10b、10cが形成される。 However, it is desirable that the angle at which the center of gravity position G is looked up from the support surface 10d is smaller. In the present embodiment, the recesses 10b and 10c are formed so that the angle θ at which the center of gravity position G is looked up from the support surface 10d is about 45 degrees.
 また、本実施の形態では、検査装置1の安定性及び輸送時・設置時の利便性により、凹部10b、10cは、下面10aの高さH1が100mm程度となるように形成される。 Further, in the present embodiment, due to the stability of the inspection apparatus 1 and the convenience during transportation and installation, the recesses 10b and 10c are formed such that the height H1 of the lower surface 10a is about 100 mm.
 定盤10の上面10eには、溝10fが形成される。溝10fは、平面視(図2参照)において、凹部10b、10cと重ならない位置に、定盤10の長手方向(x方向)に沿って形成される。このように、溝10fの水平方向の位置と、凹部10b、10cの水平方向との位置をずらすことで、定盤10の溝10fより下の部分の厚さを厚くし、定盤10の強度を高くすることができる。 A groove 10 f is formed on the upper surface 10 e of the surface plate 10. The groove 10f is formed along the longitudinal direction (x direction) of the surface plate 10 at a position that does not overlap with the recesses 10b and 10c in plan view (see FIG. 2). Thus, by shifting the position of the groove 10f in the horizontal direction and the position of the recesses 10b and 10c in the horizontal direction, the thickness of the portion below the groove 10f of the surface plate 10 is increased, and the strength of the surface plate 10 is increased. Can be high.
 溝10fの深さD2は、定盤10の厚さTに比べて十分に小さい。本実施の形態では、溝10fの深さD2は60mm程度であり、溝10fより下の部分の厚さは略340mm程度である。したがって、溝10fを形成したとしても、定盤10の剛性を十分に高い状態とすることができる。 The depth D2 of the groove 10f is sufficiently smaller than the thickness T of the surface plate 10. In the present embodiment, the depth D2 of the groove 10f is about 60 mm, and the thickness of the portion below the groove 10f is about 340 mm. Therefore, even if the groove 10f is formed, the rigidity of the surface plate 10 can be made sufficiently high.
 溝10fは、マスク支持部30をx方向に移動自在に支持する。溝10fをマスク支持部30を移動させる時のガイドとすることで、撮像部20やマスク支持部30の高さを低くし、これにより重心位置Gを低くすることができる。 The groove 10f supports the mask support 30 so as to be movable in the x direction. By using the groove 10f as a guide when moving the mask support part 30, the height of the imaging part 20 and the mask support part 30 can be lowered, and thereby the gravity center position G can be lowered.
 溝10fの深さD2は、カメラ22a(後に詳述)が上面10eに当接した時のカメラ22の光軸axが、マスク支持部30(後に詳述)に支持されたフォトマスクMの下端と一致するように設定される。この状態が、最も重心位置Gが低くなる状態である。本実施の形態では、溝10fの深さD2は60mm程度であり、このときのフォトマスクMの下端の高さ(パスライン)H2は680mm程度である。 The depth D2 of the groove 10f is the lower end of the photomask M in which the optical axis ax of the camera 22 when the camera 22a (detailed later) contacts the upper surface 10e is supported by the mask support 30 (detailed later). Is set to match. This state is a state where the gravity center position G is lowest. In the present embodiment, the depth D2 of the groove 10f is about 60 mm, and the height (pass line) H2 of the lower end of the photomask M at this time is about 680 mm.
 撮像部20は、主として、定盤10から上方に突出して設けられた柱21と、柱21に設けられたカメラ22と、検査位置においてマスク支持部30を支持する支持部23と、を有する(図1参照)。 The imaging unit 20 mainly includes a column 21 provided so as to protrude upward from the surface plate 10, a camera 22 provided on the column 21, and a support unit 23 that supports the mask support unit 30 at the inspection position ( (See FIG. 1).
 柱21は、上面10eから上方(+y方向)に突出するように、上面10eに取り付けられる。柱21は、セラミック等により形成される。重心位置Gを低くするため、柱21は中空とすることが好ましい。 The pillar 21 is attached to the upper surface 10e so as to protrude upward (+ y direction) from the upper surface 10e. The column 21 is made of ceramic or the like. In order to lower the gravity center position G, the column 21 is preferably hollow.
 カメラ22は、例えばCCDカメラや特殊なCCDカメラであるTDIカメラであり、2個のカメラ22a、22bを有する。カメラ22a、22bは、y方向に沿って2個隣接して設けられる。カメラ22と柱21との間にはエアパッド(図示せず)を含む移動部(図示せず)が設けられる。カメラ22は、その光軸axがz軸と平行となるように、移動部(図示せず)に設けられる。 The camera 22 is a TDI camera which is a CCD camera or a special CCD camera, for example, and has two cameras 22a and 22b. Two cameras 22a and 22b are provided adjacent to each other along the y direction. A moving part (not shown) including an air pad (not shown) is provided between the camera 22 and the column 21. The camera 22 is provided in a moving unit (not shown) so that its optical axis ax is parallel to the z-axis.
 移動部が上下方向(y方向)に移動することにより、カメラ22が上下方向(y方向)に移動する。移動部は、2個のカメラ22a、22bを、カメラ22aが定盤10の上面10eに当接する初期位置と、カメラ22bが柱21の上端近傍の位置する上端位置(図1二点鎖線参照)との間を、柱21に沿って移動させる。カメラ22aを上面10eに当接可能な構成とすることで、重心位置Gを低くすることができる。 When the moving unit moves in the vertical direction (y direction), the camera 22 moves in the vertical direction (y direction). The moving unit includes two cameras 22a and 22b, an initial position where the camera 22a contacts the upper surface 10e of the surface plate 10, and an upper end position where the camera 22b is positioned near the upper end of the column 21 (see the two-dot chain line in FIG. 1). Are moved along the column 21. By adopting a configuration in which the camera 22a can be brought into contact with the upper surface 10e, the gravity center position G can be lowered.
 また、撮像部20は、図示しない透過照明光源と、反射照明光源と、を有する。透過照明光源は、フォトマスクMの背面側(-z側)に設けられ、いわゆるg線(例えば波長が435.84[nm]の光)を照射する。反射照明光源は、フォトマスクMの表面側(+z側)に設けられ、いわゆるe線(例えば波長が546.07[nm]の光)を照射する。カメラ22は、透過照明光源から照射されたg線と、反射照明光源から照射されたe線とを同時に受光し、画像化する。 Moreover, the imaging unit 20 includes a transmission illumination light source and a reflection illumination light source (not shown). The transmitted illumination light source is provided on the back side (−z side) of the photomask M, and irradiates so-called g-line (for example, light having a wavelength of 435.84 [nm]). The reflected illumination light source is provided on the surface side (+ z side) of the photomask M and irradiates so-called e-line (for example, light having a wavelength of 546.07 [nm]). The camera 22 simultaneously receives and images the g-line irradiated from the transmitted illumination light source and the e-line irradiated from the reflected illumination light source.
 次に、カメラ22の構成について説明する。カメラ22a、22bは、それぞれ、g線及びe線を平行光に変換する対物レンズと、対物レンズを通過したg線とe線とを分離する光学部材(例えば、偏光ビームスプリッタとダイクロイックフィルタとの機能を併せ持つ部材)と、光学部材で分離されたg線及びe線をそれぞれ結像する2組の結像レンズと、2組の結像レンズで結像されたg線及びe線をそれぞれ画像化する撮像素子と、を有する。このように、カメラ22a、22bは、透過光と反射光とを同時に画像化することができる。なお、カメラ22a、22bは、すでに公知の技術を用いることができるため、詳細な説明を省略する。 Next, the configuration of the camera 22 will be described. Each of the cameras 22a and 22b includes an objective lens that converts g-line and e-line into parallel light, and an optical member that separates g-line and e-line that have passed through the objective lens (for example, a polarizing beam splitter and a dichroic filter). Member having both functions), two sets of imaging lenses that respectively image g-line and e-line separated by the optical member, and g-line and e-line imaged by the two sets of imaging lenses, respectively. An imaging device. As described above, the cameras 22a and 22b can simultaneously image the transmitted light and the reflected light. The cameras 22a and 22b can use known techniques and will not be described in detail.
 ただし、カメラ22a、22bの一方が故障等した場合に備えて、カメラ22は、y方向に隣接して設けられた2個のカメラ22a、22bを有することが望ましい。 However, it is desirable that the camera 22 has two cameras 22a and 22b provided adjacent to each other in the y direction in case one of the cameras 22a and 22b breaks down.
 支持部23は、マスク支持部30が検査位置に移動されたときに、マスク支持部30が水平方向に傾かないようにマスク支持部30を支持する。なお、支持部23は、すでに公知の技術を用いることができるため、詳細な説明を省略する。 The support unit 23 supports the mask support unit 30 so that the mask support unit 30 does not tilt in the horizontal direction when the mask support unit 30 is moved to the inspection position. In addition, since the well-known technique can be used for the support part 23, detailed description is abbreviate | omitted.
 マスク支持部30は、フォトマスクMを支持する。マスク支持部30は、フレーム31と、調整機構32と、ガイド部材33と、を有する。 The mask support unit 30 supports the photomask M. The mask support unit 30 includes a frame 31, an adjustment mechanism 32, and a guide member 33.
 フレーム31は、鉛直に支持されるフォトマスクMの外周を囲むよう、枠状に形成される。フレーム31は、フォトマスクMの表面(パターンが形成された面)がxy平面と平行となるようにフォトマスクMを支持する。 The frame 31 is formed in a frame shape so as to surround the outer periphery of the photomask M supported vertically. The frame 31 supports the photomask M so that the surface (the surface on which the pattern is formed) of the photomask M is parallel to the xy plane.
 フレーム31の下方には、調整機構32が設けられる。調整機構32は、フォトマスクMの下辺の高さ方向(y方向)の位置を変更する。調整機構32はすでに公知であるため、詳細な説明は省略する。 The adjustment mechanism 32 is provided below the frame 31. The adjustment mechanism 32 changes the position of the lower side of the photomask M in the height direction (y direction). Since the adjustment mechanism 32 is already known, a detailed description thereof will be omitted.
 ガイド部材33は、溝10fの内部を移動する部材である。ガイド部材33は、図3に示すように、主として、ガイド部材本体331と、側面エアパッド332、333と、下面エアパッド334と、ピン335と、を有する。 The guide member 33 is a member that moves inside the groove 10f. As shown in FIG. 3, the guide member 33 mainly includes a guide member main body 331, side air pads 332 and 333, a lower surface air pad 334, and a pin 335.
 ガイド部材本体331は、上方にフレーム31及び調整機構32が設けられる棒状の部材である。ガイド部材本体331には、側面エアパッド332、333及びピン335が設けられる。また、ガイド部材本体331には、ピン335を介して底面エアパッド334が設けられる。 The guide member main body 331 is a rod-like member on which the frame 31 and the adjustment mechanism 32 are provided. The guide member main body 331 is provided with side air pads 332 and 333 and pins 335. The guide member main body 331 is provided with a bottom surface air pad 334 via a pin 335.
 図4は、ガイド部材33を説明するための概略図であり、検査装置1を部分的に拡大した平面図である。図4において、空気の流れを太破線矢印で示す。 FIG. 4 is a schematic view for explaining the guide member 33 and is a plan view in which the inspection apparatus 1 is partially enlarged. In FIG. 4, the flow of air is indicated by thick broken line arrows.
 側面エアパッド332、333は、略円筒形状の部材(図3参照)である。側面エアパッド332は、ガイド部材本体331の側面331aに設けられ、側面エアパッド333は、側面331aと反対側の側面331bに設けられる。側面エアパッド332の先端面332aは溝10fの側面10gと対向し、側面エアパッド333の先端面333aは溝10fの側面10hと対向する。 Side air pads 332 and 333 are substantially cylindrical members (see FIG. 3). The side air pad 332 is provided on the side surface 331a of the guide member main body 331, and the side air pad 333 is provided on the side surface 331b opposite to the side surface 331a. The front end surface 332a of the side air pad 332 faces the side surface 10g of the groove 10f, and the front end surface 333a of the side air pad 333 faces the side surface 10h of the groove 10f.
 先端面332aが対向する側面10gは基準面であり、高い精度(例えば、面精度が2μm程度、基準面ではない側面10hの面精度は5μm程度)で形成される。したがって、先端面332aが、薄い空気の層を挟んで側面10gと対向することで、ガイド部材本体331のz方向の位置及びxz平面に対する角度が決められる。 The side surface 10g facing the tip surface 332a is a reference surface, and is formed with high accuracy (for example, the surface accuracy is about 2 μm, and the surface accuracy of the side surface 10h that is not the reference surface is about 5 μm). Therefore, the position of the guide member main body 331 in the z direction and the angle with respect to the xz plane are determined by the tip surface 332a facing the side surface 10g with the thin air layer interposed therebetween.
 側面エアパッド332は、略円筒形状の結合部332bと、略円筒形状のエアパッド部332cと、を有する。結合部332bの直径は、エアパッド部332cの直径より小さい。結合部332bは、ガイド部材本体331に形成された穴331cの内部に設けられる。結合部332bの外周面と、穴331cの内周面との間には、弾性部材(例えば、Oリング)341が設けられる。また、結合部332bの直径がエアパッド部332cの直径より小さいため、結合部332bの先端面が穴331cの底面と当接した状態が保たれる。これにより、ガイド部材本体331に対する側面エアパッド332の角度が一定の状態で維持される。 The side surface air pad 332 has a substantially cylindrical coupling portion 332b and a substantially cylindrical air pad portion 332c. The diameter of the coupling portion 332b is smaller than the diameter of the air pad portion 332c. The coupling portion 332b is provided inside a hole 331c formed in the guide member main body 331. An elastic member (for example, an O-ring) 341 is provided between the outer peripheral surface of the coupling portion 332b and the inner peripheral surface of the hole 331c. Further, since the diameter of the coupling portion 332b is smaller than the diameter of the air pad portion 332c, the state where the front end surface of the coupling portion 332b is in contact with the bottom surface of the hole 331c is maintained. Thereby, the angle of the side air pad 332 with respect to the guide member main body 331 is maintained in a constant state.
 側面エアパッド333は、略円円筒形状の摺動部333bと、略円円筒形状のエアパッド部333cと、を有する。摺動部333bの直径は、エアパッド部333cの直径より小さい。また、摺動部333bは、摺動部333bの直径より大きい直径を有する穴331dの内部に、ガイド部材本体331に対して移動可能に設けられる(後に詳述)。摺動部333bの外周面と、穴331dの内周面との間には、供給された空気が逃げないように(後に詳述)弾性部材342が設けられる。 The side surface air pad 333 includes a substantially circular cylindrical sliding portion 333b and a substantially circular cylindrical air pad portion 333c. The diameter of the sliding part 333b is smaller than the diameter of the air pad part 333c. The sliding portion 333b is provided in a hole 331d having a diameter larger than the diameter of the sliding portion 333b so as to be movable with respect to the guide member body 331 (details will be described later). An elastic member 342 is provided between the outer peripheral surface of the sliding portion 333b and the inner peripheral surface of the hole 331d so that the supplied air does not escape (detailed later).
 側面エアパッド332、333には、それぞれ内部に貫通孔332d、333dが形成される。貫通孔332d、333dの内部には、オリフィス332e、333eが形成されている。貫通孔332d、333dは、ガイド部材本体331に形成された管状の孔331eに接続されている。孔331eは、図示しないポンプ等から供給される空気を通路であり、一端はプラグ343により覆われており、他端はポンプ等と連結された配管351と連結されている。その結果、配管351を介して、穴331dと摺動部333bとの間の空間及び貫通孔332d、333dに空気が供給される。 In the side air pads 332 and 333, through holes 332d and 333d are formed, respectively. In the through holes 332d and 333d, orifices 332e and 333e are formed. The through holes 332d and 333d are connected to a tubular hole 331e formed in the guide member main body 331. The hole 331e is a passage for air supplied from a pump (not shown), one end is covered with a plug 343, and the other end is connected to a pipe 351 connected to the pump or the like. As a result, air is supplied to the space between the hole 331d and the sliding portion 333b and the through holes 332d and 333d via the pipe 351.
 貫通孔332dに供給された空気は、オリフィス332eを通って、貫通孔332dの先端面332a側の開口部から側面10gに向けて吐出される(図4太破線矢印参照)。また、貫通孔333dに供給された空気は、オリフィス333eを通って、貫通孔333dの先端面333a側の開口部から側面10hに向けて吐出される(図4太破線矢印参照)。これにより、側面10gと側面エアパッド332の先端面332aとの間及び側面10hと側面エアパッド333の先端面333aとの間に薄い空気の層が形成される。 The air supplied to the through-hole 332d passes through the orifice 332e and is discharged toward the side surface 10g from the opening on the tip surface 332a side of the through-hole 332d (see the thick broken line arrow in FIG. 4). The air supplied to the through-hole 333d passes through the orifice 333e and is discharged from the opening on the distal end surface 333a side of the through-hole 333d toward the side surface 10h (see thick broken line arrow in FIG. 4). Thereby, a thin air layer is formed between the side surface 10 g and the front end surface 332 a of the side air pad 332 and between the side surface 10 h and the front end surface 333 a of the side air pad 333.
 摺動部333bと穴331dとの間の空間に供給された空気は、摺動部333bの先端面333fを押圧し、摺動部333bを、側面331bの法線方向(z方向)に移動させる。摺動部333bがz方向に移動することにより、側面10gと先端面332aとの間隔及び側面10hと先端面333aとの間隔が自動的に調整される。例えば、溝10fの幅が広い場合には、側面エアパッド333をガイド部材本体331から突出させる方向(-z方向)に移動させて、側面エアパッド333の先端面333aを側面10hに近づける。 The air supplied to the space between the sliding portion 333b and the hole 331d presses the distal end surface 333f of the sliding portion 333b, and moves the sliding portion 333b in the normal direction (z direction) of the side surface 331b. . As the sliding portion 333b moves in the z direction, the distance between the side surface 10g and the tip surface 332a and the distance between the side surface 10h and the tip surface 333a are automatically adjusted. For example, when the width of the groove 10f is wide, the side surface air pad 333 is moved in the direction in which the side surface air pad 333 protrudes from the guide member main body 331 (−z direction), and the front end surface 333a of the side surface air pad 333 is brought closer to the side surface 10h.
 先端面333fの面積をSPIをとし、貫通孔332d、333dから吐出する空気の圧力をPPIとすると、摺動部333b、すなわち側面エアパッド333に加えられる力fは、SPIとPPIとの積(f=SPI×PPI)である。溝10fの幅に合わせて側面エアパッド333を移動させるためには、側面エアパッド333、すなわち先端面333aの面積SPdより先端面333fの面積SPIを小さくする必要がある。本実施の形態では、面積SPIは、面積SPdの0.5~0.8倍程度である。 City area of S PI of the distal end surface 333f, through holes 332d, when the pressure of the air discharged with P PI from 333d, the sliding portion 333b, i.e. the force f exerted on the side air pad 333, and S PI and P PI Product (f = S PI × P PI ). In order to move the side air pad 333 to the width of the groove 10f is a side air pads 333, i.e., it is necessary to reduce the area S PI of the front end surface 333f than the area S Pd of the distal end surface 333a. In the present embodiment, the area SPI is about 0.5 to 0.8 times the area SPd .
 側面エアパッド332、すなわち先端面332aの面積は、先端面333aの面積と同じ面積SPdであるため、ガイド部材本体331は、溝10fの中で自動的に位置が保たれる。 Area of the side surface air pads 332, i.e. the distal end surface 332a is the same area S Pd as the area of the distal end surface 333a, the guide member body 331 is automatically positioned in the groove 10f is maintained.
 このとき、摺動部333bの直径が穴331dの直径より小さいため、摺動部333bの中心軸は、穴331dの中心軸(ガイド部材本体331の穴331dが形成された側面の法線方向)に対して傾くことができる。そのため、側面10gと側面10hとが平行でない場合にも、側面10gと先端面332aとを平行にし、側面10hと先端面333aとを平行にすることができる。 At this time, since the diameter of the sliding portion 333b is smaller than the diameter of the hole 331d, the central axis of the sliding portion 333b is the central axis of the hole 331d (the normal direction of the side surface where the hole 331d of the guide member main body 331 is formed). Can be tilted against. Therefore, even when the side surface 10g and the side surface 10h are not parallel, the side surface 10g and the front end surface 332a can be made parallel, and the side surface 10h and the front end surface 333a can be made parallel.
 側面10gと先端面332aとの間及び側面10hと先端面333aとの間に形成された薄い空気の層を介して、側面エアパッド332、333が溝10fの側面をおし広げるようにする。溝10fは石製であり寸法が変化しないため、側面エアパッド332、333、すなわちガイド部材33は、溝10fによりガイドされる。 The side surface air pads 332 and 333 spread the side surface of the groove 10f through the thin air layer formed between the side surface 10g and the front end surface 332a and between the side surface 10h and the front end surface 333a. Since the groove 10f is made of stone and does not change in size, the side air pads 332 and 333, that is, the guide member 33 are guided by the groove 10f.
 なお、図4に示す形態では、摺動部333bと穴331dとの間の空間及び貫通孔333dには孔331eから空気が供給されるため、先端面333fを押圧する空気の圧力と、貫通孔333dに供給される空気の圧力とが同じであるが、先端面333fにかかる空気の圧力と、貫通孔333dに供給される空気の圧力とを異ならせてもよい。例えば、摺動部333bと穴331dとの間の空間に孔331eから供給される空気の流路と、貫通孔333dに孔331eから供給される空気の流路とを部分的に異ならせ、その異なる部分に別々のレギュレータを設けるようにしてもよい。 In the form shown in FIG. 4, since air is supplied from the hole 331e to the space between the sliding portion 333b and the hole 331d and the through hole 333d, the pressure of the air that presses the distal end surface 333f, and the through hole Although the pressure of the air supplied to 333d is the same, the pressure of the air applied to the distal end surface 333f may be different from the pressure of the air supplied to the through hole 333d. For example, the air flow path supplied from the hole 331e in the space between the sliding portion 333b and the hole 331d is partially different from the air flow path supplied from the hole 331e to the through-hole 333d, and Different regulators may be provided in different portions.
 下面エアパッド334は、平面視(上(+y方向)から見て)略矩形形状の部材であり、ガイド部材本体331の下側(-y側)にピン335(図3、5参照)を介して設けられる。下面エアパッド334には、内部に管状の貫通孔334aが形成される。貫通孔334aは、図示しないポンプ等から供給される空気の通路である。貫通孔334aは、一端は下面334c(図5参照)に開口し、他端は側面334dに開口する。貫通孔334aの側面334dに開口した開口部は、ポンプ等と連結された配管352と連結されている。その結果、配管352を介して貫通孔334aに空気が供給される。 The lower surface air pad 334 is a substantially rectangular member in plan view (viewed from the top (+ y direction)), and is provided on the lower side (−y side) of the guide member main body 331 via a pin 335 (see FIGS. 3 and 5). Provided. The lower surface air pad 334 has a tubular through hole 334a formed therein. The through hole 334a is a passage for air supplied from a pump or the like (not shown). One end of the through hole 334a opens to the lower surface 334c (see FIG. 5), and the other end opens to the side surface 334d. An opening portion opened to the side surface 334d of the through hole 334a is connected to a pipe 352 connected to a pump or the like. As a result, air is supplied to the through hole 334a through the pipe 352.
 図5は、ガイド部材33を説明するための概略図であり、図4のA-A断面図である。図5において、空気の流れを太破線矢印で示す。 FIG. 5 is a schematic diagram for explaining the guide member 33, and is a cross-sectional view taken along the line AA in FIG. In FIG. 5, the air flow is indicated by thick dashed arrows.
 ピン335は、上下に略半球面を持つ棒状の部材である。ピン335は、ガイド部材本体331を上下方向(y方向)に貫通する。本実施の形態では、ピン335の外周面には雄ネジ(図示せず)が形成され、この雄ネジがガイド部材本体331をy方向に貫通する孔331fに形成された雌ネジ(図示せず)に螺合される。これにより、ピン335がガイド部材本体331に固定される。 The pin 335 is a rod-like member having a substantially hemispherical surface in the vertical direction. The pin 335 penetrates the guide member main body 331 in the vertical direction (y direction). In the present embodiment, a male screw (not shown) is formed on the outer peripheral surface of the pin 335, and this male screw is a female screw (not shown) formed in a hole 331f penetrating the guide member main body 331 in the y direction. ). Thereby, the pin 335 is fixed to the guide member main body 331.
 ピン335の下端部は、下面エアパッド334の上面に形成された穴334eに設けられる。穴334eの底面は略半球面であり、穴334eの底面とピン335の下端の略半球面とが当接する。 The lower end of the pin 335 is provided in a hole 334e formed in the upper surface of the lower air pad 334. The bottom surface of the hole 334e is substantially hemispherical, and the bottom surface of the hole 334e and the substantially hemispherical surface at the lower end of the pin 335 are in contact with each other.
 ピン335の上端は、略半球面である端面335aである。端面335aは、調整機構32の底面32aと当接する。本実施の形態では、端面335aは、底面32aに形成された凹部32bに当接する。端面335aが略半球面であるため、調整機構32がピン335に対して傾いたとしても、端面335aの位置に対して調整機構32の位置を決めることができ、かつエアパッド332、334に不都合な偏荷重を避けることができる。なお、凹部32bは必須ではないし、凹部32bの形状もこれに限られない。 The upper end of the pin 335 is an end surface 335a which is a substantially hemispherical surface. The end surface 335 a contacts the bottom surface 32 a of the adjustment mechanism 32. In the present embodiment, the end surface 335a abuts on the recess 32b formed on the bottom surface 32a. Since the end surface 335a is substantially hemispherical, even if the adjustment mechanism 32 is inclined with respect to the pin 335, the position of the adjustment mechanism 32 can be determined with respect to the position of the end surface 335a, and is inconvenient for the air pads 332 and 334. Uneven load can be avoided. The recess 32b is not essential, and the shape of the recess 32b is not limited to this.
 ピン335は、下面エアパッド334毎に設けられる。したがって、フレーム31及び調整機構32は、2本のピン335を介して、2個の下面エアパッド334により支持される。 The pin 335 is provided for each lower surface air pad 334. Therefore, the frame 31 and the adjustment mechanism 32 are supported by the two lower surface air pads 334 via the two pins 335.
 貫通孔334aの内部には、オリフィス334bが形成される。配管352(図4参照)から貫通孔334aに供給された空気は、オリフィス334bを通って、下面エアパッド334の下面334c側の開口部から、溝10fの底面10iに向けて吐出される。その結果、貫通孔334aから吐出した空気により、底面10iと下面334cとの間に薄い空気の層を形成する(図5破線矢印参照)。これにより、フレーム31、調整機構32、フォトマスクM等の自重に抗して、下面エアパッド334、すなわちガイド部材33が溝10fの底面から浮き上がる。このように、重いフレーム31及び調整機構32を、剛性の高い溝10fで支えることができる。 An orifice 334b is formed inside the through hole 334a. The air supplied from the pipe 352 (see FIG. 4) to the through hole 334a passes through the orifice 334b and is discharged from the opening on the lower surface 334c side of the lower surface air pad 334 toward the bottom surface 10i of the groove 10f. As a result, a thin air layer is formed between the bottom surface 10i and the bottom surface 334c by the air discharged from the through hole 334a (see the broken line arrow in FIG. 5). Accordingly, the lower surface air pad 334, that is, the guide member 33 is lifted from the bottom surface of the groove 10f against the weight of the frame 31, the adjustment mechanism 32, the photomask M, and the like. Thus, the heavy frame 31 and the adjustment mechanism 32 can be supported by the highly rigid groove 10f.
 図1~3の説明に戻る。除振台50は、図3に示すように、アクティブ除振台である除振台51と、重さ支えのパッシブ除振台である除振台52と、を有する。 Return to the explanation of Figs. As shown in FIG. 3, the vibration isolation table 50 includes a vibration isolation table 51 that is an active vibration isolation table, and a vibration isolation table 52 that is a passive vibration isolation table supported by weight.
 除振台52は、z方向に移動可能な受動型バネ要素を有する。除振台51は、除振台52に、x方向及びy方向のそれぞれに移動可能なアクチュエータ51a、51bと、アクチュエータ51a、51bを制御するためにアクチュエータ51a、51bのそれぞれに設けられたセンサ(図示せず)と、図示しないセンサからの信号に基づいて外部から入力する振動を抑制するようにアクチュエータ51a、51bを制御する制御回路(図示せず)と、を追加したものである。除振台51、52については、すでに公知であるため、詳細な説明を省略する。 The vibration isolation table 52 has a passive spring element that can move in the z direction. The anti-vibration table 51 is provided on the anti-vibration table 52 with actuators 51a and 51b movable in the x-direction and y-direction, respectively, and sensors provided in the actuators 51a and 51b for controlling the actuators 51a and 51b ( (Not shown) and a control circuit (not shown) for controlling the actuators 51a and 51b so as to suppress vibrations input from the outside based on a signal from a sensor (not shown) are added. Since the vibration isolation tables 51 and 52 are already known, a detailed description thereof will be omitted.
 図1に示すように、除振台51、52が支持面10dを支持するため、除振台51、52の高さは、凹部10b、10cの深さD1より高い。また、除振台51、52の直径は、支持面10dの辺の長さ以下である。これにより、除振台51、52が凹部10b、10cの内部に収まるため、省スペース化することができる。ただし、除振台51、52の直径は、凹部10b、10cの辺の長さ以下でなくてもよい。 As shown in FIG. 1, since the vibration isolation tables 51 and 52 support the support surface 10d, the height of the vibration isolation tables 51 and 52 is higher than the depth D1 of the recesses 10b and 10c. The diameter of the vibration isolation tables 51 and 52 is equal to or less than the length of the side of the support surface 10d. As a result, the vibration isolation bases 51 and 52 are accommodated in the recesses 10b and 10c, so that space can be saved. However, the diameter of the vibration isolation tables 51 and 52 may not be less than or equal to the length of the sides of the recesses 10b and 10c.
 次に、検査装置1の動作について説明する。まず、フレーム31にフォトマスクMを取り付けて、調整機構32によりフォトマスクMの下辺の高さ方向(y方向)の位置を調整する。このときは、マスク支持部30は、定盤10の+方向の端近傍の取付位置に位置する。 Next, the operation of the inspection apparatus 1 will be described. First, the photomask M is attached to the frame 31, and the position of the lower side of the photomask M in the height direction (y direction) is adjusted by the adjusting mechanism 32. At this time, the mask support portion 30 is located at an attachment position near the end of the surface plate 10 in the + direction.
 次に、ガイド部材33を溝10fに沿って-x方向に移動させて、フォトマスクMを取付位置から検査位置に移動させる。 Next, the guide member 33 is moved in the −x direction along the groove 10f, and the photomask M is moved from the mounting position to the inspection position.
 具体的には、ガイド部材33の図示しないポンプ等から側面エアパッド332、333に空気を供給して、貫通孔332d、333dから空気を吐出する。また、ガイド部材33の図示しないポンプ等から下面エアパッド334に空気を供給して、貫通孔334aから空気を吐出する。 Specifically, air is supplied to the side air pads 332 and 333 from a pump (not shown) of the guide member 33 and the air is discharged from the through holes 332d and 333d. Further, air is supplied to the lower surface air pad 334 from a pump or the like (not shown) of the guide member 33, and the air is discharged from the through hole 334a.
 そしてガイド部材33の図示しない駆動機構(例えば、リニアモーター等)により、ガイド部材本体331に-x方向の力を付勢する。側面エアパッド332、333と溝10fの側面10g、10hとの間、及び下面エアパッド334と溝10fの底面10iとの間に空気の層が形成されているため、ガイド部材本体331に力が付勢されることにより、ガイド部材33を容易に移動させることができる。 Then, a force in the −x direction is applied to the guide member main body 331 by a drive mechanism (for example, a linear motor) (not shown) of the guide member 33. Since air layers are formed between the side air pads 332 and 333 and the side surfaces 10g and 10h of the groove 10f and between the lower surface air pad 334 and the bottom surface 10i of the groove 10f, a force is applied to the guide member main body 331. As a result, the guide member 33 can be easily moved.
 フォトマスクMが検査位置に移動したら、撮像部20によりフォトマスクMの検査を行う。本実施の形態では、透過照明光源からg線を、反射照明光源からe線を同時に照射し、これらをカメラ22a、22bで同時に受光して画像化する。そして、カメラ22aで撮像された画像と、カメラ22bで撮像された画像とを差分して、2枚の画像の差異を求めることで、パターンの欠陥等を発見する。ただし、パターンの欠陥等を発見する方法はこれに限られない。例えば、カメラ22aで撮像された画像と、カメラ22bで撮像された画像とのそれぞれを設計データに基づいて生成された画像と比較することで、パターンの欠陥等を発見してもよい。 When the photomask M moves to the inspection position, the image mask 20 inspects the photomask M. In the present embodiment, g-line is simultaneously emitted from the transmitted illumination light source and e-line is emitted from the reflected illumination light source, and these are simultaneously received and imaged by the cameras 22a and 22b. Then, the difference between the two images is obtained by subtracting the image captured by the camera 22a from the image captured by the camera 22b, thereby finding a pattern defect or the like. However, the method of finding a pattern defect or the like is not limited to this. For example, a pattern defect or the like may be found by comparing each of the image captured by the camera 22a and the image captured by the camera 22b with an image generated based on the design data.
 このように、透過光による画像と反射光による画像とを用いて検査を行うことで、検査を迅速に行うことができると共に、様々な欠陥を発見することができる。 Thus, by performing an inspection using an image by transmitted light and an image by reflected light, the inspection can be performed quickly and various defects can be found.
 この検査を、まず、カメラ22aが定盤10の上面10eに当接する初期位置で行う。撮像部20は、透過照明光源からg線を、反射照明光源からe線を同時に照射しながら、透過照明光源、反射照明光源及びカメラ22a、22bを、柱21に沿って上方(+y方向)に移動させる。このようにして、マスク支持部30に支持されたフォトマスクMに形成されたパターンを順次撮像していく。 First, this inspection is performed at an initial position where the camera 22a contacts the upper surface 10e of the surface plate 10. The imaging unit 20 irradiates the transmission illumination light source, the reflection illumination light source, and the cameras 22a and 22b upward (+ y direction) along the column 21 while simultaneously irradiating the transmission illumination light source with g-line and the reflection illumination light source with e-line. Move. In this manner, the pattern formed on the photomask M supported by the mask support unit 30 is sequentially imaged.
 このように、初期位置から上端位置へとカメラ22a、22bを移動させつつ画像を撮像したら、撮像部20は、カメラ22a、22bを初期位置へ戻す。そして、ガイド部材33、すなわちフォトマスクMを所定距離だけ-x方向に移動させる。撮像部20は、同様に、カメラ22a、22bを移動させつつ画像を撮像する。 Thus, when the images are taken while moving the cameras 22a and 22b from the initial position to the upper end position, the imaging unit 20 returns the cameras 22a and 22b to the initial position. Then, the guide member 33, that is, the photomask M is moved in the −x direction by a predetermined distance. Similarly, the imaging unit 20 captures an image while moving the cameras 22a and 22b.
 このような動作を繰り返し行うことにより、フォトマスクMの全面が検査できる。カメラ22a、22bの鉛直方向の移動速度や、ガイド部材33の水平方向の移動速度はカメラ22a、22bの視野範囲及び性能等により調整される。 The entire surface of the photomask M can be inspected by repeating such an operation. The moving speed in the vertical direction of the cameras 22a and 22b and the moving speed in the horizontal direction of the guide member 33 are adjusted according to the field of view range and performance of the cameras 22a and 22b.
 フォトマスクM全面の検査が終了したら、ガイド部材33の図示しない駆動機構によりガイド部材本体331に+x方向の力を付勢して、マスク支持部30を取付位置へ移動させる。そして、フォトマスクMを交換して、次のフォトマスクMの検査へと移る。 When the inspection of the entire surface of the photomask M is completed, a force in the + x direction is applied to the guide member main body 331 by a drive mechanism (not shown) of the guide member 33 to move the mask support portion 30 to the mounting position. Then, the photomask M is replaced, and the next photomask M inspection is started.
 本実施の形態によれば、定盤10の下面10aに凹部10b、10cを形成し、設置面F上に載置された除振台51、52が凹部10b、10cの底面(支持面10d)を支持することで、支持面10dを基準としたときの検査装置1の重心位置Gを低くすることができる。検査装置1は、鉛直方向にフォトマスクMを支持するため、重心位置Gが高くなりやすい。しかしながら、凹部10b、10cの内部に除振台51、52を設けることで、定盤10の下に除振台51、52を設けつつも、検査装置1の重心位置Gを低くすることができる。また、除振台51、52を設けるため、検査装置1の耐振動性を高くすることができる。また、凹部10b、10cの内部に除振台51、52を設けることで、検査装置1を省スペース化することができる。 According to the present embodiment, the recesses 10b and 10c are formed on the lower surface 10a of the surface plate 10, and the vibration isolation tables 51 and 52 placed on the installation surface F are the bottom surfaces (support surfaces 10d) of the recesses 10b and 10c. , The gravity center position G of the inspection apparatus 1 when the support surface 10d is used as a reference can be lowered. Since the inspection apparatus 1 supports the photomask M in the vertical direction, the gravity center position G tends to be high. However, by providing the vibration isolation tables 51 and 52 inside the recesses 10b and 10c, the center of gravity G of the inspection apparatus 1 can be lowered while providing the vibration isolation tables 51 and 52 below the surface plate 10. . Further, since the vibration isolation tables 51 and 52 are provided, the vibration resistance of the inspection apparatus 1 can be increased. Further, by providing the vibration isolation tables 51 and 52 inside the recesses 10b and 10c, the inspection apparatus 1 can be saved in space.
 例えば、凹部が形成されていない定盤の下側に除振台51、52を設ける場合には、重心位置Gが高くなってしまう。また、凹部が形成されていない定盤の外側に除振台51、52を設ける場合には、検査装置の外形が大きくなってしまう。それに対し、厚い定盤10に凹部10b、10cを形成し、凹部10b、10cの内部に除振台51、52を設けることで、重心位置Gを低くしつつ、検査装置1を小さくすることができる。 For example, when the vibration isolation tables 51 and 52 are provided on the lower side of the surface plate where no concave portion is formed, the gravity center position G becomes high. In addition, when the vibration isolation tables 51 and 52 are provided outside the surface plate where no concave portion is formed, the outer shape of the inspection apparatus becomes large. On the other hand, by forming the recesses 10b and 10c on the thick surface plate 10 and providing the vibration isolation tables 51 and 52 inside the recesses 10b and 10c, the inspection apparatus 1 can be made smaller while the center of gravity G is lowered. it can.
 また、本実施の形態によれば、定盤10の上面10eに、平面視において凹部10b、10cと重ならない位置に溝10fを形成することで、定盤10の強度を保ちつつ、重心位置Gを低くすることができる。例えば、定盤10の上面10eにレールを形成し、その上にマスク支持部を設けると、重心位置Gが高くなってしまう。それに対し、溝10fにマスク支持部30を設けることで、重心位置Gを低くすることができる。 Further, according to the present embodiment, the groove 10f is formed on the upper surface 10e of the surface plate 10 at a position that does not overlap with the recesses 10b and 10c in plan view, so that the center of gravity position G is maintained while maintaining the strength of the surface plate 10. Can be lowered. For example, if a rail is formed on the upper surface 10e of the surface plate 10 and a mask support portion is provided thereon, the center of gravity position G is increased. On the other hand, the center of gravity position G can be lowered by providing the mask support 30 in the groove 10f.
 また、本実施の形態によれば、溝10fを形成するため、側面エアパッド332、333及び下面エアパッド334から空気を吐出することで、側面エアパッド332、333と溝10fの側面10g、10hとの間、及び下面エアパッド334と溝10fの底面10iとの間に空気の層を形成することができる。これにより、ガイド部材33を溝10fから浮かし、ガイド部材33を容易に移動させることができる。このような構成及び効果は、定盤10という硬い素材に溝10fを直接形成することにより始めて実現可能である。 Further, according to the present embodiment, in order to form the groove 10f, the air is discharged from the side air pads 332 and 333 and the lower surface air pad 334, so that the gap between the side air pads 332 and 333 and the side surfaces 10g and 10h of the groove 10f is obtained. In addition, an air layer can be formed between the lower surface air pad 334 and the bottom surface 10i of the groove 10f. Thereby, the guide member 33 can be lifted from the groove 10f, and the guide member 33 can be easily moved. Such a configuration and effect can be realized only by directly forming the groove 10 f in a hard material called the surface plate 10.
 例えば、定盤10の上面10eにセラミック製又は石製の凸形状のレールを形成し、その上にマスク支持部を設ける場合には、剛性が低く、寸法精度が落ちるうえ、マスク支持部30の設置位置が高くなってしまうという問題がある。それに対し、溝10fを定盤10に形成する場合には、剛性が高いうえ、寸法精度も高い。したがって、少ない振動で滑らかにガイド部材33を移動させることができる。さらに、溝10fは丈夫であるため、貫通孔332d、333d、334aから高い圧力で空気を吐出することができる。したがって、ガイド部材33を溝10fから確実に浮かし、ガイド部材33をより滑らかに移動させることができる。また、定盤10に溝10fを形成することで、マスク支持部30の設置位置を低くすることができる。 For example, when a ceramic or stone convex rail is formed on the upper surface 10e of the surface plate 10 and a mask support portion is provided on the rail, the rigidity is low and the dimensional accuracy is lowered. There is a problem that the installation position becomes high. On the other hand, when the groove 10f is formed on the surface plate 10, the rigidity is high and the dimensional accuracy is also high. Therefore, the guide member 33 can be moved smoothly with less vibration. Furthermore, since the groove 10f is strong, air can be discharged from the through holes 332d, 333d, and 334a with high pressure. Therefore, the guide member 33 can be reliably floated from the groove 10f, and the guide member 33 can be moved more smoothly. In addition, by forming the groove 10f in the surface plate 10, the installation position of the mask support portion 30 can be lowered.
 以上、この発明の実施形態を、図面を参照して詳述してきたが、具体的な構成はこの実施形態に限られるものではなく、この発明の要旨を逸脱しない範囲の設計変更等も含まれる。 The embodiment of the present invention has been described in detail with reference to the drawings. However, the specific configuration is not limited to this embodiment, and design changes and the like within a scope not departing from the gist of the present invention are included. .
 また、本発明において、「略」とは、厳密に同一である場合のみでなく、同一性を失わない程度の誤差や変形を含む概念である。例えば、略立方体形状とは、厳密に立方体形状の場合に限られない。例えば、定盤10には凹部10b等が形成されているが、定盤10を全体としてみれば略立方体形状である。また、例えば、単に鉛直、一致等と表現する場合において、厳密に鉛直、一致等の場合のみでなく、略鉛直、略一致等の場合を含むものとする。 Further, in the present invention, “substantially” is a concept that includes not only a case where they are exactly the same but also errors and deformations that do not lose the identity. For example, the substantially cubic shape is not limited to a strictly cubic shape. For example, the surface plate 10 is formed with a recess 10b and the like, but the surface plate 10 as a whole has a substantially cubic shape. Further, for example, in the case where the expression is simply vertical, coincidence, etc., not only strictly vertical, coincidence, but also the case of substantially vertical, substantially coincidence, etc. is included.
 また、本発明において「近傍」とは、例えばAの近傍であるときに、Aの近くであって、Aを含んでもいても含んでいなくてもよいことを示す概念である。 Further, in the present invention, the “neighborhood” is a concept indicating that when it is in the vicinity of A, for example, it is near A and may or may not contain A.
1      :検査装置
10     :定盤
10a    :下面
10b、10c:凹部
10d    :支持面
10e    :上面
10f    :溝
10g、10h:側面
10i    :底面
20     :撮像部
21     :柱
22     :カメラ
22a、22b:カメラ
23     :支持部
30     :マスク支持部
31     :フレーム
32     :調整機構
32a    :底面
32b    :凹部
33     :ガイド部材
50     :除振台
51     :除振台
51a、51b:アクチュエータ
52     :除振台
331    :ガイド部材本体
331a   :側面
331b   :側面
331c   :穴
331d   :穴
331e   :孔
331f   :孔
332    :側面エアパッド
332a   :先端面
332b   :結合部
332c   :エアパッド部
332d   :貫通孔
332e   :オリフィス
333    :側面エアパッド
333a   :先端面
333b   :摺動部
333c   :エアパッド部
333d   :貫通孔
333e   :オリフィス
333f   :先端面
334    :下面エアパッド
334a   :貫通孔
334b   :オリフィス
334c   :下面
334d   :側面
334e   :穴
335    :ピン
335a   :端面
343    :プラグ
341、342:弾性部材
351、352:配管
M      :フォトマスク
1: Inspection apparatus 10: Surface plate 10a: Lower surface 10b, 10c: Recess 10d: Support surface 10e: Upper surface 10f: Groove 10g, 10h: Side surface 10i: Bottom surface 20: Imaging unit 21: Pillar 22: Cameras 22a, 22b: Camera 23 : Support portion 30: mask support portion 31: frame 32: adjustment mechanism 32a: bottom surface 32b: concave portion 33: guide member 50: vibration isolation table 51: vibration isolation table 51a, 51b: actuator 52: vibration isolation table 331: guide member main body 331a: Side 331b: Side 331c: Hole 331d: Hole 331e: Hole 331f: Hole 332: Side air pad 332a: Tip surface 332b: Coupling portion 332c: Air pad portion 332d: Through hole 332e: Orifice 333: Side air pad 3 33a: tip surface 333b: sliding portion 333c: air pad portion 333d: through hole 333e: orifice 333f: tip surface 334: bottom air pad 334a: through hole 334b: orifice 334c: bottom surface 334d: side surface 334e: hole 335: pin 335a: end surface 343: Plugs 341, 342: Elastic members 351, 352: Pipe M: Photomask

Claims (8)

  1.  略鉛直方向に支持された被検査対象のマスクを検査するマスク検査装置であって、
     下面と、前記下面と平行な上面と、を有し、前記下面と前記上面との距離が前記上面の短辺より短くなるように形成された定盤と、
     前記上面から上方に突出するように前記上面に設けられた柱と、
     前記柱に設けられた撮像部と、
     設置面上に載置された除振台と、
     を備え、
     前記下面には、四隅にそれぞれ略立方体形状の凹部が形成され、
     前記除振台は、前記凹部の深さより高さが高く、
     前記凹部の底面は、それぞれ前記除振台により支持される
     ことを特徴とする検査装置。
    A mask inspection apparatus for inspecting a mask to be inspected supported in a substantially vertical direction,
    A platen having a lower surface and an upper surface parallel to the lower surface, the distance between the lower surface and the upper surface being shorter than the short side of the upper surface;
    A pillar provided on the upper surface so as to protrude upward from the upper surface;
    An imaging unit provided on the pillar;
    A vibration isolation table placed on the installation surface;
    With
    On the lower surface, concave portions each having a substantially cubic shape are formed at the four corners,
    The vibration isolation table is higher than the depth of the recess,
    The inspection apparatus characterized in that the bottom surfaces of the recesses are each supported by the vibration isolation table.
  2.  前記マスクを略鉛直方向に支持するマスク支持部を備え、
     前記上面には、平面視において、前記凹部と重ならない位置に、前記定盤の長手方向に沿った溝が形成され、
     前記マスク支持部は、前記溝の内部を移動する
     ことを特徴とする請求項1に記載の検査装置。
    A mask support part for supporting the mask in a substantially vertical direction;
    On the upper surface, a groove along the longitudinal direction of the surface plate is formed at a position that does not overlap the concave portion in plan view,
    The inspection apparatus according to claim 1, wherein the mask support part moves inside the groove.
  3.  前記凹部の深さは、前記下面と前記上面との距離の0.3~0.5倍となるように形成される
     ことを特徴とする請求項1又は2に記載の検査装置。
    The inspection apparatus according to claim 1 or 2, wherein the depth of the concave portion is formed to be 0.3 to 0.5 times the distance between the lower surface and the upper surface.
  4.  前記撮像部は、前記柱に沿って移動可能に設けられ、
     前記溝は、前記撮像部が前記定盤に当接したときに、前記マスク支持部に形成された開口部の下端面の高さが、前記撮像部の光軸の高さと略一致するような深さで形成されることを特徴とする請求項2に記載の検査装置。
    The imaging unit is provided to be movable along the pillar,
    The groove is configured such that when the imaging unit comes into contact with the surface plate, the height of the lower end surface of the opening formed in the mask support unit substantially matches the height of the optical axis of the imaging unit. The inspection apparatus according to claim 2, wherein the inspection apparatus is formed with a depth.
  5.  前記凹部は、前記下面の前記四隅に設けられる4つの第1の凹部と、前記下面の長辺に沿ってそれぞれ設けられる2つの第2の凹部と、を有し、
     前記第2の凹部のうちの1つは、平面視において、一部が前記柱の一部と重なる位置に形成されることを特徴とする請求項1から4のいずれかに記載の検査装置。
    The recess has four first recesses provided at the four corners of the lower surface, and two second recesses provided respectively along the long side of the lower surface,
    5. The inspection apparatus according to claim 1, wherein one of the second recesses is formed at a position where a part thereof overlaps a part of the column in plan view.
  6.  前記マスク支持部は、前記溝の内部を移動するガイド部材を有し、
     前記ガイド部材は、前記溝の底面に向けて空気を吐出する底面エアパッドと、前記溝の側面に向けて空気を吐出する側面エアパッドと、前記底面エアパッド及び前記側面エアパッドが設けられるガイド部材本体と、を有することを特徴とする請求項2に記載の検査装置。
    The mask support portion has a guide member that moves inside the groove,
    The guide member includes a bottom surface air pad that discharges air toward the bottom surface of the groove, a side surface air pad that discharges air toward the side surface of the groove, a guide member body provided with the bottom surface air pad and the side surface air pad, The inspection apparatus according to claim 2, further comprising:
  7.  前記側面エアパッドは、前記ガイド部材本体の第1側面に固定される第1側面エアパッドと、前記第1側面と反対側の第2側面に形成された穴に設けられる第2側面エアパッドであって、前記ガイド部材本体に対して移動可能に設けられる第2側面エアパッドと、を有し、
     前記ガイド部材本体には、前記第1側面エアパッドに形成された貫通孔、前記第2側面エアパッドに形成された貫通孔、及び前記穴と前記第2側面エアパッドとの間の空間に空気を供給する流路が形成され、
     前記第2側面エアパッドは、前記穴と前記第2側面エアパッドとの間の空間に供給される空気により前記ガイド部材本体に対して移動されることを特徴とする請求項6に記載の検査装置。
    The side air pad is a first side air pad fixed to the first side surface of the guide member main body, and a second side air pad provided in a hole formed in the second side surface opposite to the first side surface, A second side air pad provided movably with respect to the guide member body,
    Air is supplied to the guide member body through a through hole formed in the first side air pad, a through hole formed in the second side air pad, and a space between the hole and the second side air pad. A flow path is formed,
    The inspection apparatus according to claim 6, wherein the second side air pad is moved relative to the guide member main body by air supplied to a space between the hole and the second side air pad.
  8.  前記マスク支持部は、前記マスクを保持するフレームと、前記フレームの下側に設けられた調整機構であって、前記フレームの高さを調整する調整機構と、を有し、
     前記ガイド部材本体には、上下方向に貫通するピンであって、上端面が略半球面であるピンが設けられ、
     前記ピンは、下端が前記底面エアパッドに設けられ、上端が前記調整機構の底面に当接することを特徴とする請求項6又は7に記載の検査装置。
    The mask support portion includes a frame that holds the mask, and an adjustment mechanism that is provided on the lower side of the frame and adjusts the height of the frame,
    The guide member main body is provided with a pin penetrating in the vertical direction, the upper end surface being a substantially hemispherical surface,
    The inspection device according to claim 6 or 7, wherein the pin has a lower end provided on the bottom surface air pad and an upper end contacting the bottom surface of the adjustment mechanism.
PCT/JP2016/085484 2015-12-04 2016-11-30 Inspection device WO2017094751A1 (en)

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