WO2017090406A1 - ウェーハ研磨方法 - Google Patents
ウェーハ研磨方法 Download PDFInfo
- Publication number
- WO2017090406A1 WO2017090406A1 PCT/JP2016/082763 JP2016082763W WO2017090406A1 WO 2017090406 A1 WO2017090406 A1 WO 2017090406A1 JP 2016082763 W JP2016082763 W JP 2016082763W WO 2017090406 A1 WO2017090406 A1 WO 2017090406A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- wafer
- polishing
- pressure
- nanotopography
- zone
- Prior art date
Links
- 238000005498 polishing Methods 0.000 title claims abstract description 179
- 238000000034 method Methods 0.000 title claims abstract description 39
- 238000005259 measurement Methods 0.000 claims abstract description 14
- 238000006243 chemical reaction Methods 0.000 claims description 12
- 238000007517 polishing process Methods 0.000 abstract description 3
- 235000012431 wafers Nutrition 0.000 description 152
- 239000012528 membrane Substances 0.000 description 19
- 238000003754 machining Methods 0.000 description 12
- 238000003825 pressing Methods 0.000 description 12
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 8
- 229910052710 silicon Inorganic materials 0.000 description 8
- 239000010703 silicon Substances 0.000 description 8
- 230000006866 deterioration Effects 0.000 description 5
- 230000008569 process Effects 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 239000013078 crystal Substances 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000002002 slurry Substances 0.000 description 2
- 230000008859 change Effects 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 230000009191 jumping Effects 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/30625—With simultaneous mechanical treatment, e.g. mechanico-chemical polishing
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B1/00—Processes of grinding or polishing; Use of auxiliary equipment in connection with such processes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
- B24B37/013—Devices or means for detecting lapping completion
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/12—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving optical means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
- H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
- H01L21/0274—Photolithographic processes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
Definitions
- the present invention relates to a wafer polishing method, and more particularly to a method for polishing a wafer having nanotopography formed on the surface.
- Silicon wafers are widely used as substrate materials for semiconductor devices.
- a silicon wafer is manufactured by sequentially performing peripheral grinding, slicing, lapping, etching, double-side polishing, single-side polishing, cleaning, and the like on a silicon single crystal ingot.
- the single-side polishing step is a step necessary for removing the irregularities and undulations on the wafer surface to increase the flatness, and mirror processing is performed by a CMP (Chemical Mechanical Polishing) method.
- CMP Chemical Mechanical Polishing
- the polishing pressure ratio needs to be a value that is inversely proportional to nanotopography.
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Abstract
Description
10 研磨ヘッド
11 回転軸
12 加圧フランジ
14 リテーナリング
16 メンブレン
18 メンブレン加圧ライン
21 回転定盤
22 研磨パッド
W ウェーハ
Z1-Z7 圧力ゾーン
Claims (5)
- ウェーハの押圧面が複数の圧力ゾーンに区画され、各圧力ゾーンを独立に加圧制御可能なマルチゾーン加圧方式の研磨ヘッドを備えたウェーハ研磨装置を用いてウェーハの表面を鏡面研磨するウェーハ研磨方法であって、
ウェーハの表面のナノトポグラフィマップを測定する測定ステップと、
前記ナノトポグラフィマップの測定結果に基づいて前記ウェーハに対する前記研磨ヘッドの研磨圧力を圧力ゾーンごとに設定して研磨加工を実施する研磨ステップとを有することを特徴とするウェーハ研磨方法。 - ナノトポグラフィが大きい領域ほど当該領域に対する前記研磨圧力が小さくなるように当該研磨圧力を制御する、請求項1に記載のウェーハ研磨方法。
- ナノトポグラフィの大きさと当該ナノトポグラフィが形成されたウェーハに対する適切な研磨圧力との換算式を予め用意しておき、前記ナノトポグラフィマップの測定結果と前記換算式から各圧力ゾーンの研磨圧力を算出する、請求項1または2に記載のウェーハ研磨方法。
- 同じ圧力ゾーンに属する複数のサイトナノトポグラフィの平均値から当該圧力ゾーンの研磨圧力を算出する、請求項1ないし3のいずれか一項に記載のウェーハ研磨方法。
- 前記複数の圧力ゾーンは同心円状に区画されている、請求項1ないし4のいずれか一項に記載のウェーハ研磨方法。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020187013751A KR102047814B1 (ko) | 2015-11-26 | 2016-11-04 | 웨이퍼 연마 방법 |
DE112016005417.3T DE112016005417B4 (de) | 2015-11-26 | 2016-11-04 | Waferpolierverfahren |
US15/776,266 US11075085B2 (en) | 2015-11-26 | 2016-11-04 | Wafer polishing method |
CN201680066639.7A CN108475627B (zh) | 2015-11-26 | 2016-11-04 | 晶圆抛光方法 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015230350A JP6447472B2 (ja) | 2015-11-26 | 2015-11-26 | ウェーハ研磨方法 |
JP2015-230350 | 2015-11-26 |
Publications (1)
Publication Number | Publication Date |
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WO2017090406A1 true WO2017090406A1 (ja) | 2017-06-01 |
Family
ID=58763989
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2016/082763 WO2017090406A1 (ja) | 2015-11-26 | 2016-11-04 | ウェーハ研磨方法 |
Country Status (7)
Country | Link |
---|---|
US (1) | US11075085B2 (ja) |
JP (1) | JP6447472B2 (ja) |
KR (1) | KR102047814B1 (ja) |
CN (1) | CN108475627B (ja) |
DE (1) | DE112016005417B4 (ja) |
TW (1) | TWI680507B (ja) |
WO (1) | WO2017090406A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2022054380A1 (ja) * | 2020-09-09 | 2022-03-17 | 株式会社Sumco | ウェーハ研磨方法およびウェーハ研磨装置 |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102017210450A1 (de) * | 2017-06-21 | 2018-12-27 | Siltronic Ag | Verfahren, Steuerungssystem und Anlage zum Bearbeiten einer Halbleiterscheibe sowie Halbleiterscheibe |
CN108908063A (zh) * | 2018-07-20 | 2018-11-30 | 清华大学 | 根据耗材生命周期调整抛光压力的控制方法和控制系统 |
CN110962039A (zh) * | 2018-09-29 | 2020-04-07 | 康宁股份有限公司 | 载体晶片和形成载体晶片的方法 |
DE102018221922A1 (de) * | 2018-12-17 | 2020-06-18 | Siltronic Ag | Verfahren zur Herstellung von Halbleiterscheiben mittels einer Drahtsäge, Drahtsäge und Halbleiterscheibe aus einkristallinem Silizium |
CN110193776B (zh) * | 2019-06-11 | 2020-07-03 | 英特尔半导体(大连)有限公司 | 晶圆抛光的抛光压力控制方法、装置和设备 |
CN111496665A (zh) * | 2020-04-24 | 2020-08-07 | 华海清科股份有限公司 | 一种化学机械抛光控制方法及控制系统 |
JP6844733B1 (ja) | 2020-05-21 | 2021-03-17 | 信越半導体株式会社 | 基板ウェーハの製造方法、及び基板ウェーハ |
CN115122230A (zh) * | 2021-03-11 | 2022-09-30 | 中国科学院微电子研究所 | 抛光头、抛光装置和抛光方法 |
CN115401587B (zh) * | 2022-09-28 | 2023-06-27 | 浙江芯晖装备技术有限公司 | 一种抛光头及半导体晶圆平坦化设备 |
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JP2012235072A (ja) * | 2011-05-09 | 2012-11-29 | Sumco Corp | ウェーハ表面処理方法 |
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US20070167110A1 (en) * | 2006-01-16 | 2007-07-19 | Yu-Hsiang Tseng | Multi-zone carrier head for chemical mechanical polishing and cmp method thereof |
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US7503833B2 (en) * | 2006-02-16 | 2009-03-17 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Three-dimensional network for chemical mechanical polishing |
US20100330890A1 (en) | 2009-06-30 | 2010-12-30 | Zine-Eddine Boutaghou | Polishing pad with array of fluidized gimballed abrasive members |
DE102009051007B4 (de) | 2009-10-28 | 2011-12-22 | Siltronic Ag | Verfahren zum Polieren einer Halbleiterscheibe |
US8712575B2 (en) * | 2010-03-26 | 2014-04-29 | Memc Electronic Materials, Inc. | Hydrostatic pad pressure modulation in a simultaneous double side wafer grinder |
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2015
- 2015-11-26 JP JP2015230350A patent/JP6447472B2/ja active Active
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2016
- 2016-10-21 TW TW105134002A patent/TWI680507B/zh active
- 2016-11-04 CN CN201680066639.7A patent/CN108475627B/zh active Active
- 2016-11-04 KR KR1020187013751A patent/KR102047814B1/ko active IP Right Grant
- 2016-11-04 US US15/776,266 patent/US11075085B2/en active Active
- 2016-11-04 WO PCT/JP2016/082763 patent/WO2017090406A1/ja active Application Filing
- 2016-11-04 DE DE112016005417.3T patent/DE112016005417B4/de active Active
Patent Citations (2)
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JP2006524588A (ja) * | 2003-04-28 | 2006-11-02 | マイクロン・テクノロジー・インコーポレーテッド | 微細形状ワークピースを機械的及び/又は化学機械的に研磨するためのシステム及び方法 |
JP2012235072A (ja) * | 2011-05-09 | 2012-11-29 | Sumco Corp | ウェーハ表面処理方法 |
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WO2022054380A1 (ja) * | 2020-09-09 | 2022-03-17 | 株式会社Sumco | ウェーハ研磨方法およびウェーハ研磨装置 |
JP2022045720A (ja) * | 2020-09-09 | 2022-03-22 | 株式会社Sumco | ウェーハ研磨方法およびウェーハ研磨装置 |
JP7290140B2 (ja) | 2020-09-09 | 2023-06-13 | 株式会社Sumco | ウェーハ研磨方法およびウェーハ研磨装置 |
Also Published As
Publication number | Publication date |
---|---|
KR20180067657A (ko) | 2018-06-20 |
DE112016005417B4 (de) | 2023-11-23 |
US11075085B2 (en) | 2021-07-27 |
TW201730949A (zh) | 2017-09-01 |
US20190333775A1 (en) | 2019-10-31 |
TWI680507B (zh) | 2019-12-21 |
JP2017098446A (ja) | 2017-06-01 |
KR102047814B1 (ko) | 2019-11-22 |
DE112016005417T5 (de) | 2018-08-02 |
CN108475627B (zh) | 2022-11-08 |
JP6447472B2 (ja) | 2019-01-09 |
CN108475627A (zh) | 2018-08-31 |
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