WO2017086588A1 - Deposition apparatus and deposition system using induction heating - Google Patents

Deposition apparatus and deposition system using induction heating Download PDF

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Publication number
WO2017086588A1
WO2017086588A1 PCT/KR2016/010765 KR2016010765W WO2017086588A1 WO 2017086588 A1 WO2017086588 A1 WO 2017086588A1 KR 2016010765 W KR2016010765 W KR 2016010765W WO 2017086588 A1 WO2017086588 A1 WO 2017086588A1
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deposition
source substrate
substrate
induction heating
material layer
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PCT/KR2016/010765
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French (fr)
Korean (ko)
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박선순
이해룡
김영도
지성훈
홍원의
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주식회사 다원시스
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Publication of WO2017086588A1 publication Critical patent/WO2017086588A1/en

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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/04Coating on selected surface areas, e.g. using masks
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/24Vacuum evaporation
    • C23C14/26Vacuum evaporation by resistance or inductive heating of the source
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/12Organic material

Definitions

  • the present invention relates to a deposition apparatus and deposition system using induction heating. More specifically, a deposition apparatus and a deposition system using induction heating to perform deposition by contactless heating using induction heating to implement deposition on a large area substrate, and improve the use efficiency of the deposition material and the uniformity of the deposition film. will be.
  • a process of depositing a thin film required on a substrate is indispensable.
  • the manufacture of a flat panel display includes the process of depositing an organic substance or an inorganic substance, and the manufacture of a semiconductor element a metal.
  • Organic materials include liquid crystal display (LCD), organic electroluminescence display (OELD), and inorganic devices include plasma display panel (PDP) and field emission display.
  • Field emission display (FED) is indispensable.
  • Deposition methods are largely classified into chemical vapor deposition (CVD) and physical vapor deposition (PVD).
  • Chemical vapor deposition utilizes chemical reactions of source gases.
  • physical vapor deposition uses a physical apparatus, and includes vacuum thermal evaporation, ion-plating, sputtering, and the like. Such a deposition method may be selectively used according to the type of the deposition target and the conditions of the process, and each method requires a different deposition apparatus.
  • a conventional deposition apparatus 1 is disposed in a chamber 2, a lower portion of the chamber 2, and a steam by heating the crucible 3 and the crucible 3 to receive the deposition material 5.
  • the oxidized deposition material 5 includes a substrate 10 that adheres to the surface, and a mask 4 disposed between the substrate 10 and the crucible 3 to expose a portion to be deposited of the substrate 10.
  • the conventional deposition apparatus 1 as described above has to repeat the process of heating and depositing the crucible, there is a problem in that continuous deposition cannot be performed.
  • the larger the substrate, the larger the mask 4 should be. At this time, the larger the mask 4, the larger the deflection phenomenon, and the alignment of the mask 4 is not performed properly. There was a problem that it is difficult to form a thin film.
  • the consumption amount of the deposition material 5 is large, in particular, the organic material used for the deposition of the OLED is more expensive, there is a problem that the increase in the use of the organic material immediately leads to an increase in the production cost.
  • wet coating may be used.
  • the wet process has advantages in that a thin film is easily formed on a large area substrate and the production cost is reduced because the amount of the thin film forming material is consumed less.
  • the wet process has a lot of limitations in material selection, and there is a problem in that the properties of the device manufactured by the wet process are not good.
  • an object of the present invention is to provide a deposition apparatus and a deposition system capable of realizing large-area deposition with a simple equipment configuration, which are devised to solve the above problems of the prior art.
  • an object of the present invention is to provide a deposition apparatus and a deposition system that can improve the deposition process speed and the quality of the deposited film.
  • the above object of the present invention is a deposition apparatus using induction heating, comprising a chamber and an induction heating unit, wherein a source substrate is inductively heated by the induction heating unit, and the deposition material layer formed on at least one surface of the source substrate on the one surface. It achieves by the vapor deposition apparatus characterized by depositing on the target board
  • the chamber interior may be a vacuum atmosphere.
  • the material of the source substrate may be a conductor or a semiconductor, and the deposition material layer may be vaporized by the induction heating to be deposited on the target substrate.
  • a shadow mask may be interposed between the source substrate and the target substrate.
  • the deposition material layer of the source substrate may be formed using wet coating.
  • the deposition material layer may be formed on the source substrate in a pattern.
  • a deposition pattern layer may be further formed between the source substrate and the deposition material layer.
  • the material of the deposition pattern layer may be a conductor or a semiconductor, and the material of the source substrate may be an insulator, and the deposition material layer existing on the deposition pattern layer may be vaporized and deposited on the target substrate by the induction heating. .
  • the source substrate may have a size equal to or larger than that of the target substrate.
  • a deposition system using induction heating comprising a source coating apparatus, a deposition apparatus and a transfer unit, the source coating apparatus using at least one surface of the source substrate using wet coating (Wet Coating) A layer of a deposition material, wherein the transfer unit transfers the source substrate from the source coating apparatus to the deposition apparatus, the deposition apparatus including a chamber and an induction heating unit, wherein the source substrate is inductively heated by the induction heating unit. And depositing a deposition material layer formed on at least one surface of the source substrate onto a target substrate disposed to face the one surface.
  • wet Coating wet coating
  • the above object of the present invention is a deposition method using induction heating, comprising: (a) forming a deposition material layer on at least one surface of a source substrate using a wet coating; (b) placing the source substrate in a chamber in a vacuum atmosphere; And (c) inductively heating the source substrate to deposit the vaporized deposition material layer on a target substrate disposed opposite the source substrate.
  • FIG. 1 is a schematic view of a conventional deposition apparatus.
  • FIG. 2 is a schematic view showing a deposition apparatus using induction heating according to an embodiment of the present invention.
  • FIG 3 is a view showing a deposition process according to an embodiment of the present invention.
  • FIG. 4 is a schematic view showing a deposition apparatus using induction heating according to another embodiment of the present invention.
  • FIG. 5 is a view showing a deposition process according to another embodiment of the present invention.
  • FIG. 6 is a schematic diagram illustrating a deposition system according to an embodiment of the present invention.
  • the target substrate on which deposition is performed should be understood as a concept including all substrates used for flat panel displays, semiconductor devices, and the like. However, in the present specification, a substrate applied to the OLED is described.
  • the deposition material is to be understood as a concept including all materials capable of performing deposition such as organic materials, inorganic materials, and metals.
  • an organic material (organic material) for an organic light emitting display device will be described.
  • induction heating refers to a high frequency alternating current flowing through the coil to form a magnetic field that changes within the coil, and an induction current (eddy current) is formed in the material affected by the magnetic field. It should be understood that it means a phenomenon in which heat is generated.
  • FIG. 2 is a schematic view showing a deposition apparatus using induction heating according to an embodiment of the present invention.
  • the deposition apparatus 100 includes a chamber 110 and an induction heating unit 140.
  • the chamber 110 provides a space in which deposition is performed, and the inside of the chamber 110 is preferably a vacuum atmosphere.
  • a vacuum pump (not shown) may be connected to one side of the chamber 110 to form a vacuum atmosphere.
  • the deposition material to be described later may vaporize and diffuse with straightness.
  • an entrance which is a passage for loading / unloading the source substrate 120 and the target substrate 130, may be formed at one side of the chamber 110, and a door (not shown) opening or closing the entrance may be provided. More can be installed.
  • a sealing member (not shown) may be interposed between the door and the entrance to seal the inside of the chamber 110 from the outside.
  • the source substrate 120 is a substrate that provides a deposition material deposited on the target substrate 130, and may be electromagnetic induction from the induction heating unit 140, which will be described later.
  • the source substrate 120 is electromagnetically induced, it should be understood that the source substrate 120 itself is not only electromagnetically induced, but also includes a material formed on the source substrate 120 is electromagnetically induced.
  • the material of the source substrate 120 may be a conductor or a semiconductor.
  • the material formed on the source substrate 120 may be a conductor or a semiconductor. Examples of the conductor include metal, carbon, and the like, and semiconductors include silicon, germanium, gallium arsenide, and molten silica.
  • the deposition material layer 125 may be formed on at least one surface of the source substrate 120.
  • FIG. 2 illustrates that the deposition material layer 125 is formed on the top surface of the source substrate 120, but if the surface on which the deposition material layer 125 is formed is within a range disposed to face the target substrate 130 to be described later. It may be formed in part or in whole.
  • the deposition material layer 125 may be formed in a pattern on the source substrate 120. The pattern is preferably the same as the pattern of the deposition film 131 (see FIG. 3B) to be formed on the target substrate 130.
  • a deposition film 131 having a pattern may be formed between the source substrate 120 and the target substrate 130 through a shadow mask (not shown).
  • the deposition material layer 125 may be formed of an organic material, an inorganic material, a metal, or the like, which is vaporized to perform deposition, and the thickness of the deposition material layer 125 may be set according to the thickness of the deposition film to be performed.
  • the deposition material layer 125 may be formed using a wet coating so that the deposition material layer 125 may be uniformly formed on the large-area source substrate 120 while using less deposition material. It is preferable to form at 120.
  • the wet coating can use any known method such as spin coating and Dr. blade without limitation.
  • the deposition material layer 125 may be heated to vaporize, and the vaporized deposition material may be deposited on the target substrate 130.
  • the target substrate 130 is a substrate on which the deposition material is deposited and may be disposed to face one surface of the source substrate 120 on which the deposition material layer 125 is formed.
  • the target substrate 130 is preferably disposed close to the source substrate 120 to several tens of micrometers or less.
  • the source substrate 120 also preferably has a corresponding large area.
  • the source substrate 120 is formed to be the same as or larger than the target substrate 130, all of the deposition materials vaporized from the source substrate 120 may be deposited on the target substrate 130.
  • Induction heating unit 140 may electromagnetically induce the source substrate 120.
  • the induction heating unit 140 may be installed in a form in which a coil is wound therein.
  • the induction heating unit 140 may electromagnetically induce the source substrate 120 in a state of being spaced or in contact with the source substrate 120.
  • the induction heating unit 140 may be connected to an external power supply unit (not shown) to receive energy for electromagnetic induction.
  • the induction heating unit 140 may be configured in a shape in which the center is in communication (ring, donut, cylindrical shape, etc.), the source substrate 120 may be located in the communication center.
  • a source substrate elevating unit for moving the source substrate 120 up and down may be further disposed in the chamber 110 so that the source substrate 120 may be located at the communication center of the induction heating unit 140.
  • FIG. 3 is a view showing a deposition process according to an embodiment of the present invention.
  • FIG. 3 only portions of the source substrate 120 and the target substrate 130 are illustrated and the remaining components are not shown for convenience of description.
  • the source substrate 120 and the target substrate 130 may be disposed to face each other.
  • the deposition material layer 125 may be formed on at least one surface of the source substrate 120.
  • the source substrate 120 is disposed below the target substrate 130, but the positions thereof may be interchanged.
  • the source substrate 120 When the source substrate 120 is electromagnetically induced through the induction heating unit 140, an induction current is formed inside the source substrate 120 formed of a conductor or a semiconductor, and the source substrate 120 may be inductively heated to a high temperature. . Thus, the deposition material layer 125 on the source substrate 120 may be vaporized by induction heating of the source substrate 120.
  • the vaporized deposition material layer 125 may be diffused in a vacuum atmosphere within the chamber 110. Since the deposition material vaporized in a vacuum state is linear and diffuses, the deposition material may be deposited on the lower surface of the target substrate 130 as it is. In this case, when the deposition material layer 125 is formed on the source substrate 120 in a pattern, the deposition film 131 may be formed on the lower surface of the target substrate 130 as it is. In addition, when a shadow mask (not shown) is further interposed between the source substrate 120 and the target substrate 130, a deposition film 131 corresponding to the pattern of the shadow mask may be formed.
  • FIG. 4 is a schematic view showing a deposition apparatus 100 using induction heating according to another embodiment of the present invention.
  • the chamber 110, the target substrate 130, and the induction heating unit 140 are the same as the embodiment of FIG. 2, and thus detailed description thereof will be omitted.
  • a deposition pattern layer 129 may be further formed between the source substrate 120 and the deposition material layer 127. Specifically, after the deposition pattern layer 129 is first formed on the source substrate 120, the deposition material layer 127 may be formed thereon.
  • the pattern shape of the deposition pattern layer 129 is preferably the same as the pattern of the deposition film 132 (refer to FIG. 5B) to be formed.
  • the deposition pattern layer 129 may be a conductor or a semiconductor. Examples of the conductor include metal, carbon, and the like, and semiconductors include silicon, germanium, gallium arsenide, and molten silica. In this case, the material of the source substrate 120 is preferably a non-conductor.
  • the deposition pattern layer 129 may use any known thin film formation method without limitation. However, when the deposition material layer 127 is formed after the deposition pattern layer 129 is formed, the deposition material layer 127 is uniformly formed on the large-scale source substrate 120 while using less deposition material. In order to do so, it is preferable to use wet coating.
  • FIG. 5 is a view showing a deposition process according to another embodiment of the present invention.
  • FIG. 5 only portions of the source substrate 120 and the target substrate 130 are illustrated and the remaining components are not shown for convenience of description.
  • the source substrate 120 and the target substrate 130 may be disposed to face each other.
  • the deposition pattern layer 129 is formed on one surface of the source substrate 120, and the surface on which the deposition pattern layer 129 is formed should face the target substrate 130.
  • the source substrate 120 is disposed below the target substrate 130 in the drawing, the source substrate 120 and the target may be in a range where the surface on which the deposition pattern layer 129 is formed faces the target substrate 130.
  • the position of the substrate 130 may be interchanged.
  • the deposition pattern layer 129 except for the source substrate 120 is electromagnetically induced through the induction heating unit 140, an induction current may be heated in the deposition pattern layer 129 made of a conductor or a semiconductor.
  • the deposition material layer 127 ′ positioned directly on the deposition pattern layer 129 may be vaporized by induction heating of the deposition pattern layer 129.
  • the vaporized deposition material layer 127 ′ may be diffused in a vacuum atmosphere within the chamber 110. Since the deposition material vaporized in a vacuum state is linear and diffuses, the deposition material may be deposited on the lower surface of the target substrate 130 as it is. As the pattern of the deposition pattern layer 129 is deposited, the deposition material layer 127 ′ may be vaporized to form a deposition layer 132.
  • FIG. 6 is a schematic diagram illustrating a deposition system according to an embodiment of the present invention.
  • the deposition system includes a deposition apparatus 100, a source coating apparatus 200, and a transfer unit 300.
  • the deposition apparatus 100 of the present embodiment has the same configuration as the deposition apparatus 100 of FIG. 2, a detailed description thereof will be omitted.
  • the chamber 210 of the source coating apparatus 200 provides a space in which the wet coating is performed.
  • a process of forming the deposition material layers 125 and 127 on at least one surface of the source substrate 120 may be performed.
  • the deposition material layers 125 and 127 may be formed by using wet coating. It is preferable to form the source substrate 120.
  • the wet coating can use any known method such as spin coating and Dr. blade without limitation.
  • the deposition material layers 125 and 127 are formed on the top surface of the source substrate 120, but the deposition material layers 125 and 127 may be formed on a portion or the entire surface of the source substrate 120 during the wet coating process. It may be formed. Even in this case, since the deposition material vaporized in a vacuum state is diffused in a straight line, only the deposition material layers 125 and 127 of the source substrate 120 formed on the surface facing the target substrate 130 are the target substrate 130. It may be deposited on the lower surface of the) as it is.
  • the transfer unit 300 may load the source substrate 120 on which the deposition material layer 125 is formed from the source coating apparatus 200 to the deposition apparatus 100, and the target substrate on which the deposition process is completed from the deposition apparatus 100 ( 130 can be unloaded.
  • the transfer unit 300 may be implemented in various forms. That is, the transfer unit 300 may be configured of a linear motor, a guide rail, a transfer robot, a conveyor belt, a transfer roller, a vacuum chuck, air transfer, and the like.
  • the deposition apparatus 100 using the induction heating of the present invention heats the source substrate 120 on which the deposition material layer 125 is formed to vaporize the deposition material layer 125, and thus with a small amount of deposition material. There is also an effect that can perform deposition.
  • the deposition apparatus 100 using the induction heating of the present invention can quickly increase only a desired heating target by using the induction heating method, the deposition process may be performed quickly.
  • the deposition material layer 125 may be easily formed on the source substrate 120 having a large area by using a wet coating in the source coating apparatus 200. It is effective to realize large area deposition by using a simple equipment configuration.

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  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
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  • Metallurgy (AREA)
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Abstract

The present invention relates to a deposition apparatus and deposition system using induction heating. A deposition apparatus (100) according to the present invention is a deposition apparatus (100) using induction heating, and comprises a chamber (110) and an induction heating part (140), wherein a source substrate (120) is induction-heated by the induction heating part (140), and a deposition material layer (125) formed on at least one surface of the source substrate (120) is deposited on a substrate (130) to be deposited, which is disposed to be opposite to the one surface.

Description

유도 가열을 이용한 증착 장치 및 증착 시스템Deposition Apparatus and Deposition System Using Induction Heating
본 발명은 유도 가열을 이용한 증착 장치 및 증착 시스템에 관한 것이다. 보다 상세하게는, 유도 가열을 이용한 비접촉식 가열로 증착을 수행하여, 대면적 기판에 대한 증착을 구현하고, 증착 물질의 사용 효율과 증착막의 균일도를 향상시킨 유도 가열을 이용한 증착 장치 및 증착 시스템에 관한 것이다.The present invention relates to a deposition apparatus and deposition system using induction heating. More specifically, a deposition apparatus and a deposition system using induction heating to perform deposition by contactless heating using induction heating to implement deposition on a large area substrate, and improve the use efficiency of the deposition material and the uniformity of the deposition film. will be.
평판 디스플레이, 반도체 소자 등을 제조하기 위해서는 기판 상에 필요한 박막을 증착시키는 공정이 필수적으로 진행된다. 평판 디스플레이의 제조에는 유기물 또는 무기물을, 반도체 소자의 제조에는 금속을 증착하는 공정이 포함된다. 유기물 사용소자는 액정 표시장치(LCD: Liquid Crystal Display), 유기전계발광 표시장치(OELD: Organic Electro Luminescence Display) 등이 있으며, 무기물 사용소자는 플라스마 표시장치(PDP: Plasma Display Panel), 전계방출 표시장치(FED: Field Emission Display) 등이 있다.In order to manufacture a flat panel display, a semiconductor device, and the like, a process of depositing a thin film required on a substrate is indispensable. The manufacture of a flat panel display includes the process of depositing an organic substance or an inorganic substance, and the manufacture of a semiconductor element a metal. Organic materials include liquid crystal display (LCD), organic electroluminescence display (OELD), and inorganic devices include plasma display panel (PDP) and field emission display. Field emission display (FED).
증착 방법은 크게 화학기상증착(CVD: Chemical Vapor Deposition)과 물리기상증착(PVD: Physical Vapor Deposition) 등으로 분류된다. 화학기상증착은 소스 가스의 화학적 반응을 이용한다. 또한, 물리기상증착은 물리적 기구를 이용하는 것으로, 진공 열 증착(Evaporation), 이온 플레이팅(Ion-plating) 및 스퍼터링(Sputtering) 등을 포함한다. 이러한 증착 방법은 증착 대상물의 종류 및 공정의 조건에 따라 선택적으로 사용될 수 있으며, 각 방법은 각기 다른 증착 장치를 필요로 한다.Deposition methods are largely classified into chemical vapor deposition (CVD) and physical vapor deposition (PVD). Chemical vapor deposition utilizes chemical reactions of source gases. In addition, physical vapor deposition uses a physical apparatus, and includes vacuum thermal evaporation, ion-plating, sputtering, and the like. Such a deposition method may be selectively used according to the type of the deposition target and the conditions of the process, and each method requires a different deposition apparatus.
도 1은 종래의 증착 장치(1)의 개략적인 구성을 도시한 것이다. 도 1을 참조하면, 종래의 증착 장치(1)는 챔버(2), 챔버(2)의 하부에 배치되어 증착 물질(5)을 수용하는 도가니(3), 도가니(3)의 가열에 의해 증기화된 증착 물질(5)이 표면에 달라붙는 기판(10) 및, 기판(10)과 도가니(3) 사이에 배치되어 기판(10)의 증착될 부위를 노출시키는 마스크(4)를 포함한다.1 shows a schematic configuration of a conventional deposition apparatus 1. Referring to FIG. 1, a conventional deposition apparatus 1 is disposed in a chamber 2, a lower portion of the chamber 2, and a steam by heating the crucible 3 and the crucible 3 to receive the deposition material 5. The oxidized deposition material 5 includes a substrate 10 that adheres to the surface, and a mask 4 disposed between the substrate 10 and the crucible 3 to expose a portion to be deposited of the substrate 10.
위와 같은 종래의 증착 장치(1)는 도가니를 가열하고 증착하는 과정을 반복해야 하므로, 연속적인 증착을 수행할 수 없는 문제점이 있었다. 그리고, 기판이 대형화 될수록 마스크(4)도 대형화가 되어야 하며, 이때, 마스크(4)가 대형화 될수록 처짐 현상이 발생하는 문제점이 있었고, 마스크(4)의 얼라인이 제대로 이루어 지지 않게 되어 원하는 패턴을 박막을 형성하기 어려운 문제점이 있었다. 그리고, 증착 물질(5)의 소모량이 큰 문제점이 있는데, 특히, OLED의 증착에 사용되는 유기물은 단가가 비싼 편이며, 유기물 사용의 증대는 곧바로 생산원가의 증대로 이어지는 문제점이 있었다.Since the conventional deposition apparatus 1 as described above has to repeat the process of heating and depositing the crucible, there is a problem in that continuous deposition cannot be performed. In addition, the larger the substrate, the larger the mask 4 should be. At this time, the larger the mask 4, the larger the deflection phenomenon, and the alignment of the mask 4 is not performed properly. There was a problem that it is difficult to form a thin film. In addition, there is a problem in that the consumption amount of the deposition material 5 is large, in particular, the organic material used for the deposition of the OLED is more expensive, there is a problem that the increase in the use of the organic material immediately leads to an increase in the production cost.
한편, 상기 문제를 피하기 위해, 습식 공정(Wet Coating)을 사용할 수도 있다. 습식 공정은 대면적 기판에 대하여 박막 형성이 용이하며, 박막 형성 물질의 소모량이 적어 생산원가를 낮출 수 있는 장점이 있다. 하지만, 습식 공정은 재료 선택에 있어서 많은 제한을 받고, 습식 공정에 의해 제조된 소자의 특성이 좋지 않은 문제점이 있었다.Meanwhile, in order to avoid the above problem, wet coating may be used. The wet process has advantages in that a thin film is easily formed on a large area substrate and the production cost is reduced because the amount of the thin film forming material is consumed less. However, the wet process has a lot of limitations in material selection, and there is a problem in that the properties of the device manufactured by the wet process are not good.
따라서, 대면적의 기판에 적용 가능하고, 생산원가를 낮출 수 있으며, 박막의 품질을 향상시킬 수 있는 증착 장치가 필요한 실정이다.Therefore, there is a need for a deposition apparatus that can be applied to a large-area substrate, can lower production costs, and can improve thin film quality.
따라서, 본 발명은 상기와 같은 종래 기술의 제반 문제점을 해결하기 위하여 안출된 것으로서, 대면적 증착을 간단한 장비 구성으로 실현할 수 있는 증착 장치 및 증착 시스템을 제공하는 것을 그 목적으로 한다.Accordingly, an object of the present invention is to provide a deposition apparatus and a deposition system capable of realizing large-area deposition with a simple equipment configuration, which are devised to solve the above problems of the prior art.
또한, 본 발명은 증착 재료의 사용 효율을 향상시킬 수 있는 증착 장치 및 증착 시스템을 제공하는 것을 그 목적으로 한다.It is also an object of the present invention to provide a deposition apparatus and a deposition system capable of improving the use efficiency of the deposition material.
또한, 본 발명은 증착 공정 속도와 증착막의 품질을 향상시킬 수 있는 증착 장치 및 증착 시스템을 제공하는 것을 그 목적으로 한다.In addition, an object of the present invention is to provide a deposition apparatus and a deposition system that can improve the deposition process speed and the quality of the deposited film.
본 발명의 상기의 목적은, 유도 가열을 이용한 증착 장치로서, 챔버 및 유도 가열부를 포함하며, 상기 유도 가열부의 의해 소스 기판이 유도 가열되고, 상기 소스 기판의 적어도 일면에 형성된 증착 물질층을 상기 일면과 대향되게 배치되는 대상 기판에 증착하는 것을 특징으로 하는 증착 장치에 의해 달성된다.The above object of the present invention is a deposition apparatus using induction heating, comprising a chamber and an induction heating unit, wherein a source substrate is inductively heated by the induction heating unit, and the deposition material layer formed on at least one surface of the source substrate on the one surface. It achieves by the vapor deposition apparatus characterized by depositing on the target board | substrate arrange | positioned opposingly.
상기 챔버 내부는 진공 분위기일 수 있다.The chamber interior may be a vacuum atmosphere.
상기 소스 기판의 재질은 전도체 또는 반도체이고, 상기 유도 가열에 의해 상기 증착 물질층이 증기화되어 상기 대상 기판에 증착될 수 있다.The material of the source substrate may be a conductor or a semiconductor, and the deposition material layer may be vaporized by the induction heating to be deposited on the target substrate.
상기 소스 기판과 상기 대상 기판 사이에 섀도우 마스크(Shadow Mask)가 개재될 수 있다.A shadow mask may be interposed between the source substrate and the target substrate.
상기 소스 기판의 상기 증착 물질층은 습식 코팅(Wet Coating)을 이용하여 형성될 수 있다.The deposition material layer of the source substrate may be formed using wet coating.
상기 증착 물질층은 패턴을 이루며 상기 소스 기판 상에 형성될 수 있다.The deposition material layer may be formed on the source substrate in a pattern.
상기 소스 기판과 상기 증착 물질층 사이에는 증착 패턴층이 더 형성될 수 있다.A deposition pattern layer may be further formed between the source substrate and the deposition material layer.
상기 증착 패턴층의 재질은 전도체 또는 반도체이고, 상기 소스 기판의 재질은 부도체이며, 상기 유도 가열에 의해 상기 증착 패턴층 상에 존재하는 상기 증착 물질층이 증기화되어 상기 대상 기판에 증착될 수 있다.The material of the deposition pattern layer may be a conductor or a semiconductor, and the material of the source substrate may be an insulator, and the deposition material layer existing on the deposition pattern layer may be vaporized and deposited on the target substrate by the induction heating. .
상기 소스 기판은 크기는 상기 대상 기판의 크기와 같거나 클 수 있다.The source substrate may have a size equal to or larger than that of the target substrate.
그리고, 본 발명의 상기의 목적은, 유도 가열을 이용한 증착 시스템으로서, 소스 코팅 장치, 증착 장치 및 이송부를 포함하고, 상기 소스 코팅 장치는 습식 코팅(Wet Coating)을 이용하여 소스 기판의 적어도 일면에 증착 물질층을 형성하며, 상기 이송부는 상기 소스 기판을 상기 소스 코팅 장치로부터 상기 증착 장치로 이송하고, 상기 증착 장치는, 챔버 및 유도 가열부를 포함하며, 상기 유도 가열부의 의해 상기 소스 기판이 유도 가열되고, 상기 소스 기판의 적어도 일면에 형성된 증착 물질층을 상기 일면과 대향되게 배치되는 대상 기판에 증착하는 것을 특징으로 하는 증착 시스템에 의해 달성된다.In addition, the above object of the present invention, a deposition system using induction heating, comprising a source coating apparatus, a deposition apparatus and a transfer unit, the source coating apparatus using at least one surface of the source substrate using wet coating (Wet Coating) A layer of a deposition material, wherein the transfer unit transfers the source substrate from the source coating apparatus to the deposition apparatus, the deposition apparatus including a chamber and an induction heating unit, wherein the source substrate is inductively heated by the induction heating unit. And depositing a deposition material layer formed on at least one surface of the source substrate onto a target substrate disposed to face the one surface.
그리고, 본 발명의 상기의 목적은, 유도 가열을 이용한 증착 방법으로서, (a) 습식 코팅을 이용하여 소스 기판의 적어도 일면에 증착 물질층을 형성하는 단계; (b) 상기 소스 기판을 진공 분위기의 챔버 내에 배치하는 단계; 및 (c) 상기 소스 기판을 유도 가열하여, 상기 소스 기판에 대향하게 배치된 대상 기판에 증기화된 상기 증착 물질층을 증착하는 단계를 포함하는 것을 특징으로 하는 증착 방법에 의해 달성된다.In addition, the above object of the present invention is a deposition method using induction heating, comprising: (a) forming a deposition material layer on at least one surface of a source substrate using a wet coating; (b) placing the source substrate in a chamber in a vacuum atmosphere; And (c) inductively heating the source substrate to deposit the vaporized deposition material layer on a target substrate disposed opposite the source substrate.
상기와 같이 구성된 본 발명에 따르면, 대면적 증착을 간단한 장비 구성으로 실현할 수 있는 효과가 있다.According to the present invention configured as described above, there is an effect that can realize a large area deposition in a simple equipment configuration.
또한, 본 발명에 따르면, 증착 재료의 사용 효율을 향상시킬 수 있는 효과가 있다.In addition, according to the present invention, there is an effect that can improve the use efficiency of the deposition material.
또한, 본 발명에 따르면, 증착 공정 속도와 증착막의 품질을 향상시킬 수 있는 효과가 있다.In addition, according to the present invention, there is an effect that can improve the deposition process speed and the quality of the deposited film.
도 1은 종래의 증착 장치의 개략도이다.1 is a schematic view of a conventional deposition apparatus.
도 2는 본 발명의 일 실시예에 따른 유도 가열을 이용한 증착 장치를 나타내는 개략도이다.2 is a schematic view showing a deposition apparatus using induction heating according to an embodiment of the present invention.
도 3은 본 발명의 일 실시예에 따른 증착 과정을 나타내는 도면이다.3 is a view showing a deposition process according to an embodiment of the present invention.
도 4는 본 발명의 다른 실시예에 따른 유도 가열을 이용한 증착 장치를 나타내는 개략도이다.4 is a schematic view showing a deposition apparatus using induction heating according to another embodiment of the present invention.
도 5는 본 발명의 다른 실시예에 따른 증착 과정을 나타내는 도면이다.5 is a view showing a deposition process according to another embodiment of the present invention.
도 6은 본 발명의 일 실시예에 따른 증착 시스템을 나타내는 개략도이다.6 is a schematic diagram illustrating a deposition system according to an embodiment of the present invention.
<부호의 설명><Description of the code>
100: 증착 장치100: deposition apparatus
110, 210: 챔버110, 210: chamber
120: 소스 기판120: source substrate
125, 127: 증착 물질층125, 127: deposition material layer
129: 증착 패턴층129: deposition pattern layer
130: 대상 기판130: target substrate
140: 유도 가열부140: induction heating part
200: 소스 코팅 장치200: source coating device
300: 이송부300: transfer unit
후술하는 본 발명에 대한 상세한 설명은, 본 발명이 실시될 수 있는 특정 실시예를 예시로서 도시하는 첨부 도면을 참조한다. 이들 실시예는 당업자가 본 발명을 실시할 수 있기에 충분하도록 상세히 설명된다. 본 발명의 다양한 실시예는 서로 다르지만 상호 배타적일 필요는 없음이 이해되어야 한다. 예를 들어, 여기에 기재되어 있는 특정 형상, 구조 및 특성은 일 실시예에 관련하여 본 발명의 정신 및 범위를 벗어나지 않으면서 다른 실시예로 구현될 수 있다. 또한, 각각의 개시된 실시예 내의 개별 구성요소의 위치 또는 배치는 본 발명의 정신 및 범위를 벗어나지 않으면서 변경될 수 있음이 이해되어야 한다. 따라서, 후술하는 상세한 설명은 한정적인 의미로서 취하려는 것이 아니며, 본 발명의 범위는, 적절하게 설명된다면, 그 청구항들이 주장하는 것과 균등한 모든 범위와 더불어 첨부된 청구항에 의해서만 한정된다. 도면에서 유사한 참조부호는 여러 측면에 걸쳐서 동일하거나 유사한 기능을 지칭하며, 길이 및 면적, 두께 등과 그 형태는 편의를 위하여 과장되어 표현될 수도 있다.DETAILED DESCRIPTION The following detailed description of the invention refers to the accompanying drawings that show, by way of illustration, specific embodiments in which the invention may be practiced. These embodiments are described in sufficient detail to enable those skilled in the art to practice the invention. It should be understood that the various embodiments of the present invention are different but need not be mutually exclusive. For example, certain shapes, structures, and characteristics described herein may be embodied in other embodiments without departing from the spirit and scope of the invention with respect to one embodiment. In addition, it is to be understood that the location or arrangement of individual components within each disclosed embodiment may be changed without departing from the spirit and scope of the invention. The following detailed description, therefore, is not to be taken in a limiting sense, and the scope of the present invention, if properly described, is defined only by the appended claims, along with the full range of equivalents to which such claims are entitled. In the drawings, like reference numerals refer to the same or similar functions throughout the several aspects, and length, area, thickness, and the like may be exaggerated for convenience.
이하에서는, 본 발명이 속하는 기술분야에서 통상의 지식을 가진 자가 본 발명을 용이하게 실시할 수 있도록 하기 위하여, 본 발명의 바람직한 실시예들에 관하여 첨부된 도면을 참조하여 상세히 설명하기로 한다.DETAILED DESCRIPTION Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings so that those skilled in the art can easily implement the present invention.
본 명세서에서 증착이 수행되는 대상 기판은 평판 디스플레이, 반도체 소자 등에 사용되는 기판을 모두 포함하는 개념으로 이해되어야 한다. 단, 본 명세서에서는 유기발광표시장치(OLED)에 적용되는 기판을 상정하여 설명한다.In the present specification, the target substrate on which deposition is performed should be understood as a concept including all substrates used for flat panel displays, semiconductor devices, and the like. However, in the present specification, a substrate applied to the OLED is described.
또한, 본 명세서에서 증착 물질은 유기물, 무기물, 금속 등의 증착이 수행될 수 있는 물질을 모두 포함하는 개념으로 이해되어야 한다. 단, 본 명세서에서는 유기발광표시장치용 유기 재료(유기물)를 상정하여 설명한다.In addition, in the present specification, the deposition material is to be understood as a concept including all materials capable of performing deposition such as organic materials, inorganic materials, and metals. In the present specification, an organic material (organic material) for an organic light emitting display device will be described.
또한, 본 명세서에서 유도 가열(Induction Heating)이라 함은 감겨진 코일에 고주파 교류 전류를 흘려 코일 내부에 변화하는 자기장을 형성시키고, 자기장에 영향을 받는 재료에 유도전류(맴돌이 전류)가 형성되어 재료가 발열되는 현상을 의미하는 것으로 이해되어야 한다.In addition, in the present specification, induction heating refers to a high frequency alternating current flowing through the coil to form a magnetic field that changes within the coil, and an induction current (eddy current) is formed in the material affected by the magnetic field. It should be understood that it means a phenomenon in which heat is generated.
도 2는 본 발명의 일 실시예에 따른 유도 가열을 이용한 증착 장치를 나타내는 개략도이다.2 is a schematic view showing a deposition apparatus using induction heating according to an embodiment of the present invention.
도 2를 참조하면, 증착 장치(100)는 챔버(110) 및 유도 가열부(140)를 포함한다.2, the deposition apparatus 100 includes a chamber 110 and an induction heating unit 140.
챔버(110)는 증착이 수행되는 공간을 제공하며, 챔버(110) 내부는 진공 분위기인 것이 바람직하다. 진공 분위기를 형성하기 위해 챔버(110)의 일측에는 진공 펌프(미도시)가 연결될 수 있다. 진공 분위기에서 후술할 증착 물질이 증기화되어 직진성을 가지며 확산될 수 있다.The chamber 110 provides a space in which deposition is performed, and the inside of the chamber 110 is preferably a vacuum atmosphere. A vacuum pump (not shown) may be connected to one side of the chamber 110 to form a vacuum atmosphere. In a vacuum atmosphere, the deposition material to be described later may vaporize and diffuse with straightness.
한편, 소스 기판(120), 대상 기판(130)을 로딩/언로딩하기 위한 통로인 출입구(미도시)가 챔버(110)의 일측에 형성될 수 있으며, 출입구를 개폐하는 도어(미도시)가 더 설치될 수 있다. 도어와 출입구의 사이는 실링 부재(미도시)가 개재되어 챔버(110) 내부를 외부로부터 밀폐시키는 것이 바람직하다.Meanwhile, an entrance (not shown), which is a passage for loading / unloading the source substrate 120 and the target substrate 130, may be formed at one side of the chamber 110, and a door (not shown) opening or closing the entrance may be provided. More can be installed. A sealing member (not shown) may be interposed between the door and the entrance to seal the inside of the chamber 110 from the outside.
소스 기판(120)은 대상 기판(130)에 증착되는 증착 물질을 제공하는 기판으로, 후술할 유도 가열부(140)로부터 전자기 유도(Electromagnetic Induction)될 수 있다. 본 명세서에서 소스 기판(120)이 전자기 유도된다 함은, 소스 기판(120) 자체가 전자기 유도되는 것뿐만 아니라, 소스 기판(120)에 형성된 물질이 전자기 유도되는 것까지 포함하는 의미로 이해되어야 한다. 이를 위해, 소스 기판(120)의 재질은 전도체 또는 반도체일 수 있고, 소스 기판(120)의 재질이 부도체인 경우, 소스 기판(120)에 형성된 물질이 전도체 또는 반도체일 수 있다. 전도체로는 금속, 탄소 등이 있으며, 반도체로는 실리콘, 게르마늄, 갈륨비소, 용융실리카 등이 있다.The source substrate 120 is a substrate that provides a deposition material deposited on the target substrate 130, and may be electromagnetic induction from the induction heating unit 140, which will be described later. In this specification, the source substrate 120 is electromagnetically induced, it should be understood that the source substrate 120 itself is not only electromagnetically induced, but also includes a material formed on the source substrate 120 is electromagnetically induced. . To this end, the material of the source substrate 120 may be a conductor or a semiconductor. When the material of the source substrate 120 is a non-conductor, the material formed on the source substrate 120 may be a conductor or a semiconductor. Examples of the conductor include metal, carbon, and the like, and semiconductors include silicon, germanium, gallium arsenide, and molten silica.
소스 기판(120)의 적어도 일면에는 증착 물질층(125)이 형성될 수 있다. 도 2에는 소스 기판(120)의 상부면에 증착 물질층(125)이 형성된 것이 도시되어 있으나, 증착 물질층(125)이 형성된 면이 후술할 대상 기판(130)에 대향되게 배치되는 범위 내라면, 일부 또는 전면적에 형성될 수도 있다. 또한, 증착 물질층(125)은 소스 기판(120) 상에서 패턴을 이루며 형성될 수도 있다. 패턴은 대상 기판(130)에 형성하려는 증착막(131)[도 3의 (b) 참조]의 패턴과 동일한 것이 바람직하다. 또는, 소스 기판(120)과 대상 기판(130) 사이에 섀도우 마스크(미도시)를 더 개재하여 패턴을 가지는 증착막(131)을 형성할 수도 있다.The deposition material layer 125 may be formed on at least one surface of the source substrate 120. FIG. 2 illustrates that the deposition material layer 125 is formed on the top surface of the source substrate 120, but if the surface on which the deposition material layer 125 is formed is within a range disposed to face the target substrate 130 to be described later. It may be formed in part or in whole. In addition, the deposition material layer 125 may be formed in a pattern on the source substrate 120. The pattern is preferably the same as the pattern of the deposition film 131 (see FIG. 3B) to be formed on the target substrate 130. Alternatively, a deposition film 131 having a pattern may be formed between the source substrate 120 and the target substrate 130 through a shadow mask (not shown).
증착 물질층(125)은 증기화되어 증착을 수행하는 물질인 유기물, 무기물, 금속 등으로 구성될 수 있으며, 수행하고자 하는 증착막의 두께에 따라서 증착 물질층(125)의 두께가 설정될 수 있다. 그리고, 증착 물질을 적게 사용하면서 동시에 대면적의 소스 기판(120)에 균일하게 증착 물질층(125)을 형성할 수 있도록, 증착 물질층(125)은 습식 코팅(Wet Coating)을 이용하여 소스 기판(120)에 형성하는 것이 바람직하다. 습식 코팅은 스핀 코팅(Spin Coating), 닥터블레이드(Dr. Blade) 등 공지의 방법을 제한없이 사용할 수 있다.The deposition material layer 125 may be formed of an organic material, an inorganic material, a metal, or the like, which is vaporized to perform deposition, and the thickness of the deposition material layer 125 may be set according to the thickness of the deposition film to be performed. In addition, the deposition material layer 125 may be formed using a wet coating so that the deposition material layer 125 may be uniformly formed on the large-area source substrate 120 while using less deposition material. It is preferable to form at 120. The wet coating can use any known method such as spin coating and Dr. blade without limitation.
소스 기판(120)이 전자기 유도에 의해 가열됨에 따라, 증착 물질층(125)이 가열되어 증기화되고, 증기화된 증착 물질이 대상 기판(130)에 증착될 수 있다.As the source substrate 120 is heated by electromagnetic induction, the deposition material layer 125 may be heated to vaporize, and the vaporized deposition material may be deposited on the target substrate 130.
대상 기판(130)은 증착 물질이 증착되는 기판이며, 증착 물질층(125)이 형성된 소스 기판(120)의 일면과 대향되게 배치될 수 있다. 대상 기판(130)은 소스 기판(120)과 수십 ㎛ 이하로 근접 배치되는 것이 바람직하다.The target substrate 130 is a substrate on which the deposition material is deposited and may be disposed to face one surface of the source substrate 120 on which the deposition material layer 125 is formed. The target substrate 130 is preferably disposed close to the source substrate 120 to several tens of micrometers or less.
대상 기판(130)이 평판 디스플레이에 사용되는 대면적 기판이라면, 소스 기판(120)도 그에 상응하는 대면적을 가지는 것이 바람직하다. 바람직하게는, 소스 기판(120)은 대상 기판(130)보다 동일하거나 크게 형성됨에 따라, 소스 기판(120)에서 증기화된 증착 물질이 모두 대상 기판(130)에 증착될 수 있다.If the target substrate 130 is a large area substrate used for a flat panel display, the source substrate 120 also preferably has a corresponding large area. Preferably, since the source substrate 120 is formed to be the same as or larger than the target substrate 130, all of the deposition materials vaporized from the source substrate 120 may be deposited on the target substrate 130.
유도 가열부(140)는 소스 기판(120)을 전자기 유도할 수 있다. 이를 위해 유도 가열부(140)는 내부에 코일이 감겨진 형태로 설치될 수 있다. 유도 가열부(140)는 소스 기판(120)과 이격된 상태 또는 접촉된 상태에서 소스 기판(120)을 전자기 유도할 수 있다. 유도 가열부(140)는 외부의 전력 공급부(미도시)에 연결되어 전자기 유도를 위한 에너지를 공급받을 수 있다. Induction heating unit 140 may electromagnetically induce the source substrate 120. To this end, the induction heating unit 140 may be installed in a form in which a coil is wound therein. The induction heating unit 140 may electromagnetically induce the source substrate 120 in a state of being spaced or in contact with the source substrate 120. The induction heating unit 140 may be connected to an external power supply unit (not shown) to receive energy for electromagnetic induction.
한편, 유도 가열부(140)는 중심이 연통된 형상(링, 도넛, 연통된 원기둥 형상 등)으로 구성되어, 연통된 중심부에 소스 기판(120)이 위치하게 될 수도 있다. 이 경우, 소스 기판(120)을 유도 가열부(140)의 연통된 중심에 위치시킬 수 있도록, 소스 기판(120)을 상하이동시키는 소스 기판 승강 유닛이 챔버(110) 내에 더 배치될 수 있다.On the other hand, the induction heating unit 140 may be configured in a shape in which the center is in communication (ring, donut, cylindrical shape, etc.), the source substrate 120 may be located in the communication center. In this case, a source substrate elevating unit for moving the source substrate 120 up and down may be further disposed in the chamber 110 so that the source substrate 120 may be located at the communication center of the induction heating unit 140.
도 3은 본 발명의 일 실시예에 따른 증착 과정을 나타내는 도면이다. 도 3에서는 설명의 편의상 소스 기판(120)과 대상 기판(130) 부분만을 도시하고 나머지 구성요소는 도시를 생략하였다.3 is a view showing a deposition process according to an embodiment of the present invention. In FIG. 3, only portions of the source substrate 120 and the target substrate 130 are illustrated and the remaining components are not shown for convenience of description.
도 3의 (a)에 도시된 바와 같이, 소스 기판(120)과 대상 기판(130)이 마주보게 배치될 수 있다. 소스 기판(120)의 적어도 일면에는 증착 물질층(125)이 형성될 수 있다. 도면에는 소스 기판(120)이 대상 기판(130)의 하부에 배치되어 있으나, 위치는 상호 바뀔 수 있다.As shown in FIG. 3A, the source substrate 120 and the target substrate 130 may be disposed to face each other. The deposition material layer 125 may be formed on at least one surface of the source substrate 120. In the drawing, the source substrate 120 is disposed below the target substrate 130, but the positions thereof may be interchanged.
유도 가열부(140)를 통해 소스 기판(120)이 전자기 유도되면, 전도체 또는 반도체로 구성되는 소스 기판(120) 내부에는 유도전류가 형성되어, 소스 기판(120)은 고온으로 유도 가열될 수 있다. 그리하여, 소스 기판(120) 상의 증착 물질층(125)은 소스 기판(120)의 유도 가열에 의해 증기화될 수 있다.When the source substrate 120 is electromagnetically induced through the induction heating unit 140, an induction current is formed inside the source substrate 120 formed of a conductor or a semiconductor, and the source substrate 120 may be inductively heated to a high temperature. . Thus, the deposition material layer 125 on the source substrate 120 may be vaporized by induction heating of the source substrate 120.
이어서, 도 3의 (b)에 도시된 바와 같이, 증기화된 증착 물질층(125)은 챔버(110) 내의 진공 분위기에서 확산될 수 있다. 진공 상태에서 증기화된 증착 물질은 직진성을 가지며 확산되기 때문에, 대상 기판(130)의 하부면에 그대로 증착될 수 있다. 이때, 증착 물질층(125)이 패턴을 이루며 소스 기판(120) 상에 형성된 경우라면, 대상 기판(130)의 하부면에도 패턴 그대로 증착막(131)이 형성될 수 있다. 또한, 소스 기판(120)과 대상 기판(130) 사이에 섀도우 마스크(미도시)를 더 개재한 경우라면, 섀도우 마스크의 패턴에 해당하는 증착막(131)이 형성될 수 있다.Subsequently, as shown in FIG. 3B, the vaporized deposition material layer 125 may be diffused in a vacuum atmosphere within the chamber 110. Since the deposition material vaporized in a vacuum state is linear and diffuses, the deposition material may be deposited on the lower surface of the target substrate 130 as it is. In this case, when the deposition material layer 125 is formed on the source substrate 120 in a pattern, the deposition film 131 may be formed on the lower surface of the target substrate 130 as it is. In addition, when a shadow mask (not shown) is further interposed between the source substrate 120 and the target substrate 130, a deposition film 131 corresponding to the pattern of the shadow mask may be formed.
도 4는 본 발명의 다른 실시예에 따른 유도 가열을 이용한 증착 장치(100)를 나타내는 개략도이다. 도 4의 실시예에서 챔버(110), 대상 기판(130), 유도 가열부(140)는 도 2의 실시예와 동일하므로 자세한 설명은 생략한다.4 is a schematic view showing a deposition apparatus 100 using induction heating according to another embodiment of the present invention. In the embodiment of FIG. 4, the chamber 110, the target substrate 130, and the induction heating unit 140 are the same as the embodiment of FIG. 2, and thus detailed description thereof will be omitted.
도 4를 참조하면, 소스 기판(120)과 증착 물질층(127) 사이에는 증착 패턴층(129)이 더 형성될 수 있다. 구체적으로, 소스 기판(120) 상에 먼저 증착 패턴층(129)이 형성된 후에, 증착 물질층(127)이 상부에 형성될 수 있다.Referring to FIG. 4, a deposition pattern layer 129 may be further formed between the source substrate 120 and the deposition material layer 127. Specifically, after the deposition pattern layer 129 is first formed on the source substrate 120, the deposition material layer 127 may be formed thereon.
증착 패턴층(129)의 패턴 형태는 형성하고자 하는 증착막(132)[도 5의 (b) 참조]의 패턴과 동일한 것이 바람직하다. 유도 가열부(140)에서 소스 기판(120)을 제외한, 증착 물질층(127)만 전자기 유도하기 위해서, 증착 패턴층(129)은 재질은 전도체 또는 반도체일 수 있다. 전도체로는 금속, 탄소 등이 있으며, 반도체로는 실리콘, 게르마늄, 갈륨비소, 용융실리카 등이 있다. 이때, 소스 기판(120)의 재질은 부도체인 것이 바람직하다.The pattern shape of the deposition pattern layer 129 is preferably the same as the pattern of the deposition film 132 (refer to FIG. 5B) to be formed. In order to electromagnetically induce only the deposition material layer 127 except for the source substrate 120 in the induction heating unit 140, the deposition pattern layer 129 may be a conductor or a semiconductor. Examples of the conductor include metal, carbon, and the like, and semiconductors include silicon, germanium, gallium arsenide, and molten silica. In this case, the material of the source substrate 120 is preferably a non-conductor.
증착 패턴층(129)은 공지의 박막 형성방법을 제한없이 사용할 수 있다. 다만, 증착 패턴층(129)을 형성한 후, 증착 물질층(127)을 형성할 때에는, 증착 물질을 적게 사용하면서 동시에 대면적의 소스 기판(120)에 균일하게 증착 물질층(127)을 형성할 수 있도록, 습식 코팅(Wet Coating)을 이용하는 것이 바람직하다.The deposition pattern layer 129 may use any known thin film formation method without limitation. However, when the deposition material layer 127 is formed after the deposition pattern layer 129 is formed, the deposition material layer 127 is uniformly formed on the large-scale source substrate 120 while using less deposition material. In order to do so, it is preferable to use wet coating.
도 5는 본 발명의 다른 실시예에 따른 증착 과정을 나타내는 도면이다. 도 5에서는 설명의 편의상 소스 기판(120)과 대상 기판(130) 부분만을 도시하고 나머지 구성요소는 도시를 생략하였다.5 is a view showing a deposition process according to another embodiment of the present invention. In FIG. 5, only portions of the source substrate 120 and the target substrate 130 are illustrated and the remaining components are not shown for convenience of description.
도 5의 (a)에 도시된 바와 같이, 소스 기판(120)과 대상 기판(130)이 마주보게 배치될 수 있다. 소스 기판(120)의 일면에는 증착 패턴층(129)이 형성되고, 증착 패턴층(129)이 형성된 면이 대상 기판(130)과 마주보게 되어야 한다. 도면에는 소스 기판(120)이 대상 기판(130)의 하부에 배치되어 있으나, 증착 패턴층(129)이 형성된 면이 대상 기판(130)과 마주보게 되는 범위 내에서, 소스 기판(120)과 대상 기판(130)의 위치는 상호 바뀔 수 있다.As shown in FIG. 5A, the source substrate 120 and the target substrate 130 may be disposed to face each other. The deposition pattern layer 129 is formed on one surface of the source substrate 120, and the surface on which the deposition pattern layer 129 is formed should face the target substrate 130. Although the source substrate 120 is disposed below the target substrate 130 in the drawing, the source substrate 120 and the target may be in a range where the surface on which the deposition pattern layer 129 is formed faces the target substrate 130. The position of the substrate 130 may be interchanged.
유도 가열부(140)를 통해 소스 기판(120)을 제외한 증착 패턴층(129)이 전자기 유도되면, 전도체 또는 반도체로 구성되는 증착 패턴층(129) 내부에는 유도전류가 가열될 수 있다. 그리하여, 증착 패턴층(129)의 직상면에 위치한 증착 물질층(127')은 증착 패턴층(129)의 유도 가열에 의해 증기화될 수 있다.When the deposition pattern layer 129 except for the source substrate 120 is electromagnetically induced through the induction heating unit 140, an induction current may be heated in the deposition pattern layer 129 made of a conductor or a semiconductor. Thus, the deposition material layer 127 ′ positioned directly on the deposition pattern layer 129 may be vaporized by induction heating of the deposition pattern layer 129.
이어서, 도 5의 (b)에 도시된 바와 같이, 증기화된 증착 물질층(127')은 챔버(110) 내의 진공 분위기에서 확산될 수 있다. 진공 상태에서 증기화된 증착 물질은 직진성을 가지며 확산되기 때문에, 대상 기판(130)의 하부면에 그대로 증착될 수 있다. 증착 패턴층(129)의 패턴 그대로 증착 물질층(127')이 증기화되어 증착막(132)이 형성될 수 있다.Subsequently, as shown in FIG. 5B, the vaporized deposition material layer 127 ′ may be diffused in a vacuum atmosphere within the chamber 110. Since the deposition material vaporized in a vacuum state is linear and diffuses, the deposition material may be deposited on the lower surface of the target substrate 130 as it is. As the pattern of the deposition pattern layer 129 is deposited, the deposition material layer 127 ′ may be vaporized to form a deposition layer 132.
이하에서는 본 발명의 증착 장치(100)를 포함하는 증착 시스템에 대해서 설명한다.Hereinafter, a deposition system including the deposition apparatus 100 of the present invention will be described.
도 6은 본 발명의 일 실시예에 따른 증착 시스템을 나타내는 개략도이다.6 is a schematic diagram illustrating a deposition system according to an embodiment of the present invention.
도 6을 참조하면, 증착 시스템은 증착 장치(100), 소스 코팅 장치(200) 및 이송부(300)를 포함한다.Referring to FIG. 6, the deposition system includes a deposition apparatus 100, a source coating apparatus 200, and a transfer unit 300.
본 실시예의 증착 장치(100)는 도 2의 증착 장치(100)와 동일한 구성을 가지므로 상세한 설명은 생략한다.Since the deposition apparatus 100 of the present embodiment has the same configuration as the deposition apparatus 100 of FIG. 2, a detailed description thereof will be omitted.
소스 코팅 장치(200)의 챔버(210)는 습식 코팅이 수행되는 공간을 제공한다. 챔버(210) 내에서는 소스 기판(120)의 적어도 일면에 증착 물질층(125, 127)이 형성되는 공정이 수행될 수 있다. 증착 물질을 적게 사용하면서 동시에 대면적의 소스 기판(120)에 균일하게 증착 물질층(125, 127)을 형성할 수 있도록, 증착 물질층(125, 127)은 습식 코팅(Wet Coating)을 이용하여 소스 기판(120)에 형성하는 것이 바람직하다. 습식 코팅은 스핀 코팅(Spin Coating), 닥터블레이드(Dr. Blade) 등 공지의 방법을 제한없이 사용할 수 있다. 도 6에는 소스 기판(120)의 상부면에 증착 물질층(125, 127)이 형성된 것이 도시되어 있으나, 습식 코팅 과정에서 소스 기판(120)의 일부 또는 전면적에 증착 물질층(125, 127)이 형성될 수도 있다. 이 경우에도, 진공 상태에서 증기화된 증착 물질은 직진성을 가지며 확산되기 때문에, 대상 기판(130)과 대향하는 면에 형성된 소스 기판(120)의 증착 물질층(125, 127)만이 대상 기판(130)의 하부면에 그대로 증착될 수 있다.The chamber 210 of the source coating apparatus 200 provides a space in which the wet coating is performed. In the chamber 210, a process of forming the deposition material layers 125 and 127 on at least one surface of the source substrate 120 may be performed. In order to form the deposition material layers 125 and 127 uniformly on the large-area source substrate 120 while using less deposition material, the deposition material layers 125 and 127 may be formed by using wet coating. It is preferable to form the source substrate 120. The wet coating can use any known method such as spin coating and Dr. blade without limitation. 6, the deposition material layers 125 and 127 are formed on the top surface of the source substrate 120, but the deposition material layers 125 and 127 may be formed on a portion or the entire surface of the source substrate 120 during the wet coating process. It may be formed. Even in this case, since the deposition material vaporized in a vacuum state is diffused in a straight line, only the deposition material layers 125 and 127 of the source substrate 120 formed on the surface facing the target substrate 130 are the target substrate 130. It may be deposited on the lower surface of the) as it is.
이송부(300)는 증착 물질층(125)이 형성된 소스 기판(120)을 소스 코팅 장치(200)로부터 증착 장치(100)로 로딩할 수 있고, 증착 장치(100)로부터 증착 공정이 완료된 대상 기판(130)을 언로딩할 수 있다. 이송부(300)는 다양한 형태로 구현될 수 있다. 즉, 이송부(300)는 리니어 모터, 안내레일, 이송 로봇, 컨베이어 벨트, 이송 롤러, 진공척, 에어 이송 등의 구성으로 이루어질 수 있다.The transfer unit 300 may load the source substrate 120 on which the deposition material layer 125 is formed from the source coating apparatus 200 to the deposition apparatus 100, and the target substrate on which the deposition process is completed from the deposition apparatus 100 ( 130 can be unloaded. The transfer unit 300 may be implemented in various forms. That is, the transfer unit 300 may be configured of a linear motor, a guide rail, a transfer robot, a conveyor belt, a transfer roller, a vacuum chuck, air transfer, and the like.
위와 같이, 본 발명의 유도 가열을 이용한 증착 장치(100)는, 증착 물질층(125)이 형성된 소스 기판(120)을 가열하여 증착 물질층(125)을 증기화시키므로, 적은 양의 증착 물질로도 증착을 수행할 수 있는 효과가 있다.As described above, the deposition apparatus 100 using the induction heating of the present invention heats the source substrate 120 on which the deposition material layer 125 is formed to vaporize the deposition material layer 125, and thus with a small amount of deposition material. There is also an effect that can perform deposition.
그리고, 본 발명의 유도 가열을 이용한 증착 장치(100)는, 유도 가열 방식을 이용하여 목적하는 가열 대상물만을 빠르게 승온시킬 수 있으므로, 증착 공정이 신속하게 수행될 수 있는 효과가 있다.In addition, since the deposition apparatus 100 using the induction heating of the present invention can quickly increase only a desired heating target by using the induction heating method, the deposition process may be performed quickly.
그리고, 본 발명의 유도 가열을 이용한 증착 시스템은, 소스 코팅 장치(200) 내에서 습식 코팅을 이용하여 대면적의 소스 기판(120)에 증착 물질층(125)을 용이하게 형성할 수 있으며, 이를 이용하여 대면적 증착을 간단한 장비 구성으로 실현할 수 있는 효과가 있다.In addition, in the deposition system using the induction heating of the present invention, the deposition material layer 125 may be easily formed on the source substrate 120 having a large area by using a wet coating in the source coating apparatus 200. It is effective to realize large area deposition by using a simple equipment configuration.
본 발명은 상술한 바와 같이 바람직한 실시예를 들어 도시하고 설명하였으나, 상기 실시예에 한정되지 아니하며 본 발명의 정신을 벗어나지 않는 범위 내에서 당해 발명이 속하는 기술분야에서 통상의 지식을 가진 자에 의해 다양한 변형과 변경이 가능하다. 그러한 변형예 및 변경예는 본 발명과 첨부된 특허청구범위의 범위 내에 속하는 것으로 보아야 한다.Although the present invention has been shown and described with reference to preferred embodiments as described above, it is not limited to the above embodiments and various modifications made by those skilled in the art without departing from the spirit of the present invention. Modifications and variations are possible. Such modifications and variations are intended to fall within the scope of the invention and the appended claims.

Claims (17)

  1. 유도 가열을 이용한 증착 장치로서,A vapor deposition apparatus using induction heating,
    챔버 및 유도 가열부를 포함하며,Chamber and induction heating,
    상기 유도 가열부의 의해 소스 기판이 유도 가열되고, 상기 소스 기판의 적어도 일면에 형성된 증착 물질층을 상기 일면과 대향되게 배치되는 대상 기판에 증착하는 것을 특징으로 하는 증착 장치.And a source substrate is inductively heated by the induction heating unit, and a deposition material layer formed on at least one surface of the source substrate is deposited on a target substrate disposed to face the one surface.
  2. 제1항에 있어서,The method of claim 1,
    상기 챔버 내부는 진공 분위기인 것을 특징으로 하는 증착 장치.Deposition apparatus, characterized in that the inside of the chamber is a vacuum atmosphere.
  3. 제1항에 있어서,The method of claim 1,
    상기 소스 기판의 재질은 전도체 또는 반도체이고,The material of the source substrate is a conductor or a semiconductor,
    상기 유도 가열에 의해 상기 증착 물질층이 증기화되어 상기 대상 기판에 증착되는 것을 특징으로 하는 증착 장치.And the deposition material layer is vaporized by the induction heating and deposited on the target substrate.
  4. 제1항에 있어서,The method of claim 1,
    상기 소스 기판과 상기 대상 기판 사이에 섀도우 마스크(Shadow Mask)가 개재되는 것을 특징으로 하는 증착 장치.And a shadow mask is interposed between the source substrate and the target substrate.
  5. 제1항에 있어서,The method of claim 1,
    상기 소스 기판의 상기 증착 물질층은 습식 코팅(Wet Coating)을 이용하여 형성된 것을 특징으로 하는 증착 장치.And the deposition material layer of the source substrate is formed using wet coating.
  6. 제1항에 있어서,The method of claim 1,
    상기 증착 물질층은 패턴을 이루며 상기 소스 기판 상에 형성된 것을 특징으로 하는 증착 장치.And the deposition material layer is formed on the source substrate in a pattern.
  7. 제1항에 있어서,The method of claim 1,
    상기 소스 기판과 상기 증착 물질층 사이에는 증착 패턴층이 더 형성된 것을 특징으로 하는 증착 장치.And a deposition pattern layer is further formed between the source substrate and the deposition material layer.
  8. 제7항에 있어서,The method of claim 7, wherein
    상기 증착 패턴층의 재질은 전도체 또는 반도체이고,The material of the deposition pattern layer is a conductor or a semiconductor,
    상기 소스 기판의 재질은 부도체이며,The material of the source substrate is an insulator,
    상기 유도 가열에 의해 상기 증착 패턴층 상에 존재하는 상기 증착 물질층이 증기화되어 상기 대상 기판에 증착되는 것을 특징으로 하는 증착 장치.And the deposition material layer existing on the deposition pattern layer is vaporized and deposited on the target substrate by the induction heating.
  9. 제1항에 있어서,The method of claim 1,
    상기 소스 기판은 크기는 상기 대상 기판의 크기와 같거나 큰 것을 특징으로 하는 증착 장치.And the source substrate has a size equal to or larger than that of the target substrate.
  10. 유도 가열을 이용한 증착 시스템으로서,A deposition system using induction heating,
    소스 코팅 장치, 증착 장치 및 이송부를 포함하고,A source coating apparatus, a deposition apparatus and a conveying unit,
    상기 소스 코팅 장치는 습식 코팅(Wet Coating)을 이용하여 소스 기판의 적어도 일면에 증착 물질층을 형성하며,The source coating apparatus forms a deposition material layer on at least one surface of the source substrate by using wet coating,
    상기 이송부는 상기 소스 기판을 상기 소스 코팅 장치로부터 상기 증착 장치로 이송하고,The transfer unit transfers the source substrate from the source coating apparatus to the deposition apparatus,
    상기 증착 장치는,The vapor deposition apparatus,
    챔버 및 유도 가열부를 포함하며,Chamber and induction heating,
    상기 유도 가열부의 의해 상기 소스 기판이 유도 가열되고, 상기 소스 기판의 적어도 일면에 형성된 증착 물질층을 상기 일면과 대향되게 배치되는 대상 기판에 증착하는 것을 특징으로 하는 증착 시스템.And the source substrate is inductively heated by the induction heating unit, and deposits a deposition material layer formed on at least one surface of the source substrate to a target substrate disposed to face the one surface.
  11. 제10항에 있어서,The method of claim 10,
    상기 증착 장치의 상기 챔버 내부는 진공 분위기인 것을 특징으로 하는 증착 시스템.The chamber interior of the deposition apparatus is a vacuum atmosphere.
  12. 제10항에 있어서,The method of claim 10,
    상기 소스 기판의 재질은 전도체 또는 반도체이고,The material of the source substrate is a conductor or a semiconductor,
    상기 유도 가열에 의해 상기 증착 물질층이 증기화되어 상기 대상 기판에 증착되는 것을 특징으로 하는 증착 시스템.And the deposition material layer is vaporized by the induction heating and deposited on the target substrate.
  13. 제10항에 있어서,The method of claim 10,
    상기 소스 기판과 상기 대상 기판 사이에 섀도우 마스크(Shadow Mask)가 개재되는 것을 특징으로 하는 증착 시스템.And a shadow mask is interposed between the source substrate and the target substrate.
  14. 제10항에 있어서,The method of claim 10,
    상기 증착 물질층은 패턴을 이루며 상기 소스 기판 상에 형성된 것을 특징으로 하는 증착 시스템.And the deposition material layer is formed on the source substrate in a pattern.
  15. 제10항에 있어서,The method of claim 10,
    상기 소스 기판과 상기 증착 물질층 사이에는 증착 패턴층이 더 형성된 것을 특징으로 하는 증착 시스템.And a deposition pattern layer is further formed between the source substrate and the deposition material layer.
  16. 제15항에 있어서,The method of claim 15,
    상기 증착 패턴층의 재질은 전도체 또는 반도체이고,The material of the deposition pattern layer is a conductor or a semiconductor,
    상기 소스 기판의 재질은 부도체이며,The material of the source substrate is an insulator,
    상기 유도 가열에 의해 상기 증착 패턴층 상에 존재하는 상기 증착 물질층이 증기화되어 상기 대상 기판에 증착되는 것을 특징으로 하는 증착 시스템.And the deposition material layer present on the deposition pattern layer is vaporized and deposited on the target substrate by the induction heating.
  17. 유도 가열을 이용한 증착 방법으로서,As a deposition method using induction heating,
    (a) 습식 코팅을 이용하여 소스 기판의 적어도 일면에 증착 물질층을 형성하는 단계;(a) forming a layer of deposition material on at least one side of the source substrate using a wet coating;
    (b) 상기 소스 기판을 진공 분위기의 챔버 내에 배치하는 단계; 및(b) placing the source substrate in a chamber in a vacuum atmosphere; And
    (c) 상기 소스 기판을 유도 가열하여, 상기 소스 기판에 대향하게 배치된 대상 기판에 증기화된 상기 증착 물질층을 증착하는 단계(c) inductively heating the source substrate to deposit the vaporized deposition material layer on a target substrate disposed opposite the source substrate;
    를 포함하는 것을 특징으로 하는 증착 방법.Deposition method comprising a.
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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005154903A (en) * 2003-11-26 2005-06-16 Samsung Sdi Co Ltd Method and apparatus for forming vapor-deposited film
JP2008274322A (en) * 2007-04-26 2008-11-13 Sony Corp Vapor deposition apparatus
KR20110016767A (en) * 2009-08-12 2011-02-18 주식회사 엔씰텍 Apparatus and method for deposition via joule heating
KR20110016768A (en) * 2009-08-12 2011-02-18 주식회사 엔씰텍 Apparatus and method for deposition via joule heating
KR20110016769A (en) * 2009-08-12 2011-02-18 주식회사 엔씰텍 Apparatus and method for deposition via joule heating

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100685809B1 (en) * 2005-01-20 2007-02-22 삼성에스디아이 주식회사 Chemical vapor deposition device
KR101370326B1 (en) * 2012-08-07 2014-03-05 한국표준과학연구원 Evaporation Deposition Apparatus

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005154903A (en) * 2003-11-26 2005-06-16 Samsung Sdi Co Ltd Method and apparatus for forming vapor-deposited film
JP2008274322A (en) * 2007-04-26 2008-11-13 Sony Corp Vapor deposition apparatus
KR20110016767A (en) * 2009-08-12 2011-02-18 주식회사 엔씰텍 Apparatus and method for deposition via joule heating
KR20110016768A (en) * 2009-08-12 2011-02-18 주식회사 엔씰텍 Apparatus and method for deposition via joule heating
KR20110016769A (en) * 2009-08-12 2011-02-18 주식회사 엔씰텍 Apparatus and method for deposition via joule heating

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