WO2017075850A1 - 自电容触控面板的缺陷检测装置与检测方法 - Google Patents

自电容触控面板的缺陷检测装置与检测方法 Download PDF

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Publication number
WO2017075850A1
WO2017075850A1 PCT/CN2015/095311 CN2015095311W WO2017075850A1 WO 2017075850 A1 WO2017075850 A1 WO 2017075850A1 CN 2015095311 W CN2015095311 W CN 2015095311W WO 2017075850 A1 WO2017075850 A1 WO 2017075850A1
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Prior art keywords
row
unit
voltage
touch
touch electrodes
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PCT/CN2015/095311
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English (en)
French (fr)
Inventor
龚强
王超
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深圳市华星光电技术有限公司
武汉华星光电技术有限公司
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Priority to US14/907,967 priority Critical patent/US10025438B2/en
Publication of WO2017075850A1 publication Critical patent/WO2017075850A1/zh

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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/0412—Digitisers structurally integrated in a display
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
    • G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
    • G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
    • G06F3/0443—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means using a single layer of sensing electrodes
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2203/00—Indexing scheme relating to G06F3/00 - G06F3/048
    • G06F2203/041—Indexing scheme relating to G06F3/041 - G06F3/045
    • G06F2203/04103—Manufacturing, i.e. details related to manufacturing processes specially suited for touch sensitive devices
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2203/00—Indexing scheme relating to G06F3/00 - G06F3/048
    • G06F2203/041—Indexing scheme relating to G06F3/041 - G06F3/045
    • G06F2203/04112—Electrode mesh in capacitive digitiser: electrode for touch sensing is formed of a mesh of very fine, normally metallic, interconnected lines that are almost invisible to see. This provides a quite large but transparent electrode surface, without need for ITO or similar transparent conductive material
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2310/00—Command of the display device
    • G09G2310/02—Addressing, scanning or driving the display screen or processing steps related thereto
    • G09G2310/0264—Details of driving circuits

Definitions

  • the present invention relates to the field of in-cell touch panels, and in particular, to a defect detecting device and a detecting method for a self-capacitance touch panel.
  • a plurality of cell blocks divided by a common electrode layer (COM layer) in the touch operation region are generally used to form a touch electrode.
  • COM layer common electrode layer
  • FIG. 1 is a schematic structural view of a self-capacitance touch panel of a prior art IPS liquid crystal display
  • FIG. 2 is a schematic diagram of a defect detection scheme for a self-capacitance touch panel of the prior art.
  • 11 is a touch electrode formed by dividing a common electrode layer
  • 12 is a signal line for connecting each touch electrode and a detecting circuit
  • an insulating layer is further disposed between the touch electrode 11 and the signal line 12 .
  • the touch electrodes 11 and the corresponding signal lines 12 are electrically connected through the via holes 14 on the insulating layer 13.
  • the signal line 12 Since the voltage Vcom signal of the common electrode is transmitted through the signal line 12 for each touch electrode 11 during display, the signal line 12 generally extends through the entire touch operation area.
  • the touch panel having the above structure is short-circuited between the signal line 12 and the touch electrodes 11 connected thereto, and the other touch electrodes 11 in the same column, so that the detection circuit cannot correctly recognize the touch.
  • the location and display are abnormal.
  • the signal line 12a is used to connect the touch electrodes a11 located in the first row of the first row of the touch electrode matrix, and it will penetrate the other touch electrodes located in the first column, and the signal line 12a and the touch control A short circuit is likely to occur between the touch electrodes other than the electrode a11.
  • FIG. 2 a detection scheme for detecting whether the short-circuit defect exists between the signal line 12 and the touch electrode 11 is as shown in FIG. 2 .
  • Each odd-numbered column signal line 12 is connected to the detection data line T1, and each even-numbered column signal Lines 12 are all connected to the detection data line T2.
  • the touch electrodes 11 on the odd-numbered rows of the touch electrode matrix are all connected to the detection data line T1
  • the touch electrodes 11 on the even-numbered rows of the touch electrode matrix are all connected to the detection data line T2.
  • the switching element is used to control the turning on and off of the signal line 12 and the detecting data lines T1 and T2.
  • the above detection scheme can only detect the occurrence of a short circuit between all the odd rows and all the even rows, and cannot further determine the specific range of the short defect.
  • One of the technical problems to be solved by the present invention is to provide a new detection scheme to determine the specific range of short-circuit defects of the self-capacitance touch panel.
  • the embodiment of the present application first provides a defect detecting device for a self-capacitive touch panel, and is provided with a plurality of driving circuits respectively connected to the plurality of rows of touch electrodes, and the driving circuit includes: pre-charging a unit for generating a charging control signal for simultaneously presetting a first voltage for each touch electrode; a synchronization unit for generating a charging control signal for applying a second voltage to each touch electrode row by row; and an output unit according to the charging The control signal respectively outputs a first voltage and a second voltage to charge the touch electrode; and the cut-off unit controls the opening of the charging path of the touch electrode located in a row in front of the row of touch electrodes according to the voltage of each row of touch electrodes With off.
  • the driving circuit further includes: a latch unit connected to the synchronization unit, and stores a trigger signal for starting each driving circuit row by row.
  • the input terminal of the latch unit is connected to the output terminal of the latch unit located in a row in front of the latch unit.
  • the cut-off unit is connected in series between the synchronization unit and the output unit, and the control signal input end of the cut-off unit is connected to the output end of the output unit located in a row behind the cut-off unit.
  • the cut-off unit is turned on by the first voltage signal of the touch electrode, and the second voltage signal passing through the touch electrode is turned off.
  • the cutoff unit comprises a switching element.
  • the clock signal input end of the synchronization unit and the clock signal input end of the latch unit are interleaved between two adjacent rows.
  • the embodiment of the present application further provides a method for detecting a defect of a self-capacitive touch panel, comprising: charging each pixel electrode in the self-capacitive touch panel region to a third voltage; and simultaneously charging each touch electrode to The first voltage is used to turn on the charging path of each touch electrode; the touch electrodes are charged to the second voltage row by row, and whether there is a short circuit defect according to the display screen corresponding to each row of the touch electrode blocks.
  • the step of determining whether there is a short-circuit defect according to the display screen corresponding to each row of the touch electrode block comprises: when the display screen corresponding to the one or more rows of the touch electrode block does not display the preset image, Then determining that the touch electrodes located in a row behind the one or more rows of touch electrodes in each row and the one or more rows of touch electrodes and/or in front of the one or more rows of touch electrodes There is a short circuit defect between at least one row of touch electrodes.
  • the third voltage is equal to the first voltage.
  • the initial screen includes a black screen
  • the test screen includes a white screen
  • the device can further detect the short-circuit defect existing between the rows of touch electrodes in the touch electrode matrix, and the device has a simple structure and high reliability.
  • FIG. 1 is a schematic structural view of a self-capacitive touch panel of a prior art IPS liquid crystal display
  • FIG. 2 is a schematic diagram of a defect detection scheme for a self-capacitive touch panel in the prior art
  • FIG. 3 is a schematic structural diagram of a driving circuit of a defect detecting device of a self-capacitive touch panel of the present application
  • FIG. 4 is a schematic diagram of connection between a defect detecting device and a touch electrode matrix of the self-capacitance touch panel of the present application;
  • FIG. 5 is a diagram of a driving circuit of a defect detecting device of a self-capacitive touch panel according to an embodiment of the present application.
  • FIG. 6 is a timing chart of detecting a defect detecting device of the self-capacitive touch panel of the present application.
  • FIG. 7 is a schematic structural diagram of a driving circuit of a defect detecting device of a self-capacitance touch panel according to another embodiment of the present application.
  • FIG. 8 is a schematic flow chart of a defect detecting method of a self-capacitive touch panel of the present application.
  • FIG. 3 is a schematic structural view of a driving circuit of a defect detecting device of a self-capacitance touch panel of the present application
  • FIG. 4 is a schematic diagram of a connection between a defect detecting device and a touch electrode matrix of the self-capacitive touch panel of the present application.
  • the defect detecting device of the self-capacitive touch panel includes a plurality of driving circuits 30 respectively connected to the plurality of rows of touch electrodes at the edge of the touch electrode matrix 41 , and each driving circuit The 30 includes a precharge unit 31, a synchronization unit 32, an output unit 33, an off unit 34, and a latch unit 35.
  • FIG. 5 illustrates an embodiment of the present application. In this embodiment, two control paths connected in parallel are commonly connected to a control signal input terminal of the output unit 33.
  • the structure of the drive circuit 30 will be described in detail below with reference to FIGS. 4 and 5. .
  • the pre-charging unit 31 is configured to generate a charging control signal for simultaneously presetting the first voltage for each of the touch electrodes 11 .
  • the pre-charging unit 31 includes a switching element 311, and the signal input end of the switching element 311 is connected to the SW signal, and the control terminal is connected to the GAS signal.
  • the GAS signal is at a high level, the switching element 311 is turned on, and the SW signal is applied to the control signal input terminal of the output unit 33 through the signal output terminal of the switching element 311 (as indicated by point A in FIG. 5).
  • the switching element 311 When the GAS signal is low, the switching element 311 is turned off, and the branch in which it is located is in a high impedance state, and does not affect other parts of the driving circuit 30. Under the action of the charging control signal of the pre-charging unit 31, all the touch electrodes 11 of the touch electrode matrix can be charged to the first voltage at the initial timing.
  • the synchronization unit 32 is configured to generate a charging control signal for applying a second voltage to each touch electrode 11 row by row.
  • the synchronization unit 32 includes a NAND gate 321 and two NAND gates 321
  • the signal input terminals are respectively in contact with the signal ST and the clock signal CK1.
  • the trigger signal ST is used to activate the driving circuit 30 to charge the touch electrodes 11 located in the row, and the clock signal CK1 is used to form a synchronous trigger signal.
  • the synchronizing unit 32 outputs a low-level charging control signal Sel on the rising edge of the clock signal CK1, and the touch electrode 11 is charged line by line to the second voltage under the action of the Sel signal.
  • the output unit 33 outputs the first voltage and the second voltage according to the charging control signals generated by the pre-charging unit 31 and the synchronization unit 32 to charge the touch electrodes 11 respectively.
  • the output unit 33 includes two inverters 331 and 332 and a transmission gate 333.
  • the inverters 331 and 332 are connected in series to form a control signal input end of the output unit 33, and the charging control signal is connected to the control signal input end of the output unit 33 via the A point, and passes through the inverters 331 and 332 and the transmission gate 333, respectively.
  • the two control terminals are connected.
  • the transmission gate 333 When the charging control signal (Sel signal or SW signal) is at a low level, the transmission gate 333 is turned on, and the signal Rx is output to the touch electrode 11 via the transmission gate 333. When the charging control signal is at a high level, the transmission gate 333 is closed, and the voltage of the touch electrode 11 remains unchanged.
  • the signal Rx is a voltage signal having a first voltage value or a second voltage value.
  • the cut-off unit 34 is configured to control the conduction and the turn-off of the charging path.
  • the cut-off unit 34 located in a row in front of the row of touch electrodes is turned off in front of the row of touch electrodes.
  • the charging path of the touch electrodes of one row includes a switching element 341 connected in series between the synchronization unit 32 and the output unit 33, that is, its signal input terminal is connected to the output end of the synchronization unit 32, and its signal The output terminal is connected to a control signal input terminal of the output unit 33, and the switching element 341 provides a transmission path of the charging control signal Sel to the output unit 33.
  • the control end of the switching element 341 is connected to the output end of the output unit 33 located in a row behind the switching element, that is, the switching element 341 located in the [n]th row is the touch electrode 11 of the [n+1]th row.
  • the voltage signal Out[n+1] is controlled.
  • Out[n+1] is at a high level
  • the transmission path of the Sel signal to the output unit 33 is turned on, and under the action of the Sel signal, the output unit 33 outputs a second voltage for charging the row of touch electrodes 11.
  • Out[n+1] is low, the transmission path of the Sel signal to the output unit 33 is turned off, and the row of the touch electrodes 11 cannot be charged and maintained at the first voltage.
  • the cut-off unit 34 By the blocking action of the cut-off unit 34, the display screen corresponding to the [n+1]th touch electrode block and the [n]th touch electrode block can be different, and the short circuit can be further determined. The location of the defect.
  • the latch unit 35 is composed of four inverters for storing the trigger signal ST.
  • the output end of the latch unit 35 is connected to one input end of the synchronization unit 32.
  • the charging timing of the electrodes 11 (progressive charging timing) is provided for the synchronization unit 32 of each row, respectively.
  • the effective trigger signal ST that is, during the charging period of the [n]th row of touch electrodes, outputs a high level signal to the synchronization unit 32, and during the non-charging period of the [n]th row of touch electrodes, to the synchronization unit 32 Continuously output a low level signal.
  • the input terminal of the latch unit 35 is connected to the output terminal of the latch unit located in the row of the latch unit, that is, the output terminal of the latch unit 35 of the [n]th row.
  • the trigger signal ST[n] (shown as point B in Fig. 5) serves as the input signal of the latch unit 35 of the [n+1]th row, thereby implementing shift latching of the trigger signal.
  • the low level output signal of each latch unit 35 can be preset by the asynchronous reset terminal RST.
  • each row of driving circuits 30 is as shown in FIG. 4, corresponding to each row of touch electrodes, a driving circuit 30 is provided for the row of touch electrodes, and the output of each driving circuit 30 is provided.
  • the output signal of the unit 33 is fed back to the control terminal of the off unit 34 of the drive circuit 30 located in the preceding row, and the output terminals of the respective latch units 35 are respectively connected to the input terminals of the latch unit 35 located in the subsequent row.
  • the clock signal CK1 (i.e., the first clock signal input terminal) of the synchronization unit 32 between the adjacent two rows is interleaved with the clock signal CK2 (i.e., the second clock signal input terminal) of the latch unit 35.
  • the first clock signal clock1 is connected to the parallel end of the CK1 end of the first row, the CK2 end of the second row, and the CK1 end of the third row, respectively, at the CK2 end of the first row, the CK1 end of the second row, and the The parallel line of the CK2 terminal of the three lines is connected to the second clock signal clock2.
  • the control terminal of the precharge unit 31 of each drive circuit 30 is connected to the signal input terminal and the asynchronous reset terminal of the latch unit 35 of each drive circuit 30, respectively.
  • the defect detecting device of the embodiment of the present invention can implement the following functions: preset a first voltage for each touch electrode, and apply a second voltage to each touch electrode row by row. Each drive circuit is detected line by line by the trigger signal ST[0] at the initial time for detection. When the touch electrode located in the back row is charged to the second voltage before the touch electrode in the front row due to the short-circuit defect, the charging path of the touch electrode of the previous row is turned off.
  • the driving circuit 30 needs to be pre-charged to turn on the charging path of each row of touch electrodes.
  • the switching element 311 is turned on by the high level of the GAS signal, during which the SW signal is kept at a low level, thereby causing the transmission gate 333 to be turned on, the Rx signal is output through the transmission gate 333, and the touch electrode driven by the transmission gate 333 is charged.
  • the touch electrodes of each row can be charged to a high level, as shown by Out[1], Out[2], and Out[3] in FIG. . Since the voltages of the touch electrodes are all at a high level, the switching elements 341 of each row are turned on, that is, the charging paths of all the touch electrodes are in an on state.
  • the transfer gate 333 is adjusted to a stable closed state.
  • the switching element 311 is opened During the start, the SW signal is first turned high to close the transfer gate 333, and then the latch unit 35 is reset by the negative pulse reset signal RST.
  • the VGH high level signal causes the output terminals of the respective latch units 35 to be low level, as shown by ST[1] and ST[2] in FIG. ST[1] and ST[2] are transmitted to the control signal input terminal of the output unit 33 through the synchronization unit 32 and the off unit 34, so that the transmission gate 333 is closed, so that after the GAS returns to the low level, the transmission gate 333 can still It is in a stable closed state.
  • the second clock signal clock2 is applied to the input terminal of the latch unit 35 of the first row, while the initial trigger signal ST[0] is maintained at a stable high level at the rising edge of clock2, Under the action of the rising edge of clock2, the first row of latch unit 35 stores the positive pulse of ST[0], that is, ST[1] becomes a high level at the rising edge of clock2.
  • the ST[1] signal is applied to the input terminal of the second row latch unit 35, and is latched to the output terminal of the second row latch unit 35 at the rising edge of the first clock signal clock1 at time T1, that is, ST [2] goes high.
  • each row driving circuit obtains the trigger signals ST[0], ST[1], ST[2], ..., row by row, as shown in FIG. 6. Shown.
  • the synchronization unit 32 of the first row outputs a synchronous trigger signal Sel under the action of the first clock signal clock1, and Sel controls the transmission gate 333 to be opened via the conduction path of the conduction, and at this time, the input of the transmission gate 333 is transmitted.
  • Signal Rx has returned to low level, so the Out[1] output is low.
  • the synchronization unit 32 of the second row outputs the synchronized trigger signal Sel under the action of the second clock signal clock2 and controls the Out[2] output to be low. And so on, each row of touch electrodes output signals Out[1], Out[2], Out[3], etc. line by line, that is, to the second voltage, as shown in FIG. 6.
  • the defect monitoring device does not need a complicated scanning mode, and only needs to perform corresponding initial setting, and the defect of the touch electrode can be performed under the action of the initial trigger signal ST[0] and the clock signal. Detection, test signals are simple and easy to implement, and the reliability is higher.
  • the structure of the driving circuit of the defect monitoring device of the present application may be other forms, as shown in FIG. 7.
  • the synchronization unit 32 is composed of an inverter 322 and a switching element. 323 and transmission gate 324 are formed.
  • the transmission gate 324 is turned on, the switching element 323 is turned off, and the clock signal CK1 is output via the transmission gate 324.
  • the switching element 323 is turned on, the transfer gate 324 is turned off, and the low level VGL is output via the switching element 323.
  • the polarities of the signals in the foregoing embodiments may be interchanged, and may also be used to implement the present application, and details are not described herein.
  • the method for detecting defects by using the defect detecting device of the self-capacitive touch panel described above is as shown in FIG. 8, and the method includes the following steps:
  • Step S810 charging each pixel electrode in the self-capacitive touch panel area to a third voltage.
  • Step S820 simultaneously charging each touch electrode to a first voltage to turn on a charging path of each touch electrode.
  • Step S830 charging each touch electrode to the second voltage row by row, and determining whether there is a short circuit defect according to the display screen corresponding to each row of the touch electrode block. Description will be made below with reference to FIG. 3.
  • each pixel electrode in the region is charged to a third voltage, for example, 4.5V, through all data lines (data lines) in the self-capacitance touch operation region.
  • each touch electrode is charged to the first voltage, and the first voltage can be equal to the third voltage, that is, the first voltage is also taken as 4.5V.
  • the charging of the pixel electrode can be completed by the driving circuit of the liquid crystal display panel, and the charging of the touch electrode can be completed by the pre-charging timing of the defect detecting device described above.
  • the initial screen corresponding to each row of touch electrode blocks in the IPS liquid crystal display is displayed in black. Further, under the action of the first voltage signal, the charging paths of the rows of touch electrodes are all turned on.
  • each of the touch electrodes for example, 0 V
  • each pixel electrode is maintained at the third voltage before being charged.
  • the charging process can be completed by the defect detecting device after the detection timing after the time T0. . Since each row of charging paths is in an on state, each row of touch electrodes can be sequentially charged to 0V, and the screen displayed by the corresponding block will change from a black screen to a white screen. If there is a short-circuit defect between the touch electrode and the signal line in different rows, the position of the defect can be determined according to the change of the display screen.
  • the touch electrode in the row behind one or more rows of touch electrodes is in contact with the one or more rows.
  • the touch electrode of the third row cannot be charged to the specified 0V, and the third The screen corresponding to the touch electrode block remains black, and according to the display condition of the above screen, it can be determined that the fourth line may be touched with one of the first row, the second row or the third row or some rows. A short circuit has occurred in the control electrode (or the signal line of the touch electrode).
  • the touch electrode of the third row starts charging simultaneously with the touch electrode of the fourth row, and the touch electrode of the fourth row
  • the charging path of the third row of the touch electrodes is turned off by the off-cell 34 of the third row, and the touch electrode of the third row is not yet charged to the set second voltage, so the first 3 rows of touch electrodes corresponding to the block A gray screen between the white screen and the black screen is displayed, that is, it can be judged that there is a defect between two adjacent lines.
  • a specific short circuit between the touch electrodes may be further performed within the determined range. Detection to eliminate defects.
  • the first voltage and the third voltage are respectively taken as 4.5V, and the second voltage is taken as 0V, so that the difference of the picture is more significant, which is advantageous for observation.
  • the first voltage, the second voltage, and the third voltage may be taken as other set values as long as the conduction and the off of the charging path can be controlled by the values of the first voltage and the second voltage. It is also possible to take the first voltage and the third voltage to different values, both of which can be used to implement the present invention.

Abstract

本发明公开了一种自电容触控面板的缺陷检测装置与检测方法，该缺陷检测装置设置有与多行触控电极分别连接的多个驱动电路，所述驱动电路，包括：预充单元、同步单元、输出单元以及截止单元。该装置能够进一步检测出存在于触控电极矩阵中各行触控电极之间的短路缺陷的情况。

Description

自电容触控面板的缺陷检测装置与检测方法
相关申请的交叉引用
本申请要求享有2015年11月05日提交的名称为“自电容触控面板的缺陷检测装置与检测方法”的中国专利申请CN201510746158.8的优先权，该申请的全部内容通过引用并入本文中。
技术领域
本发明涉及内嵌式触摸屏领域，尤其涉及一种自电容触控面板的缺陷检测装置与检测方法。
背景技术
目前，自电容触控面板因其具有结构简单、响应速度快以及灵敏度高等优点而获得了越来越广泛的应用，特别是在便携式移动设备等对体积要求较严格的场合中。为了进一步缩小触控面板的尺寸，现有技术中一般利用触控操作区域内的公共电极层(COM层)分割成的多个小区块来形成触控电极。
图1为现有技术的IPS液晶显示器的自电容触控面板的结构示意图，图2为现有技术的用于自电容触控面板的缺陷检测方案的示意图。在图1中，11为由公共电极层分割形成的触控电极，12为用于连接每个触控电极与探测电路的信号线，在触控电极11与信号线12之间还设置有绝缘层13，各触控电极11与对应的信号线12通过绝缘层13上的过孔14电连接。由于需要在显示时通过信号线12为每个触控电极11传输公共电极的电压Vcom信号，因此信号线12一般会贯穿整个触控操作区域。具有上述结构的触控面板，易在信号线12和与其连接的触控电极11以外的，且位于同一列的其他触控电极11之间发生短路，进而导致探测电路不能正确识别出触碰的位置以及显示异常。例如在图2中，信号线12a用于连接位于触控电极矩阵第一行第一列的触控电极a11，它将贯穿位于第一列的其他触控电极，在信号线12a与除触控电极a11以外的其他触控电极之间易发生短路。
现有技术中检测信号线12与触控电极11之间是否存在上述短路缺陷的检测方案如图2所示。将各奇数列信号线12均连接于检测数据线T1，各偶数列信号 线12均连接于检测数据线T2。实际上，是将触控电极矩阵的各奇数行上的触控电极11均连接于检测数据线T1，将触控电极矩阵的各偶数行上的触控电极11均连接于检测数据线T2，开关元件用于控制信号线12与检测数据线T1和T2的接通与断开。可以通过对T1和T2分别施加检测信号，根据各行触控电极所对应的区块所显示出的画面来判断是否存在短路缺陷。但上述检测方案只能检测出全部奇数行与全部偶数行之间发生短路的情况，而无法进一步确定短路缺陷的具体范围。
综上，亟需一种新的检测方案以解决上述问题。
发明内容
本发明所要解决的技术问题之一是需要提供一种新的检测方案以确定自电容触控面板的短路缺陷的具体范围。
为了解决上述技术问题，本申请的实施例首先提供了一种自电容触控面板的缺陷检测装置，设置有与多行触控电极分别连接的多个驱动电路，所述驱动电路包括：预充单元，用于产生为各触控电极同时预置第一电压的充电控制信号；同步单元，用于产生为各触控电极逐行施加第二电压的充电控制信号；输出单元，根据所述充电控制信号分别输出第一电压与第二电压对所述触控电极进行充电；截止单元，根据各行触控电极所具有的电压控制位于该行触控电极前面一行的触控电极的充电路径的开启与关闭。
优选地，所述驱动电路还包括：锁存单元，与所述同步单元相连接，存储用于逐行启动各驱动电路的触发信号。
优选地，所述锁存单元的输入端与位于该锁存单元前面一行的锁存单元的输出端相连接。
优选地，所述截止单元串联接于所述同步单元与所述输出单元之间，所述截止单元的控制信号输入端与位于该截止单元后面一行的输出单元的输出端相连接。
优选地，所述截止单元通过所述触控电极的第一电压信号开启，通过所述触控电极的第二电压信号关闭。
优选地，所述截止单元包括开关元件。
优选地，所述同步单元的时钟信号输入端与所述锁存单元的时钟信号输入端在相邻的两行之间交错连接。
本申请的实施例还提供了一种自电容触控面板的缺陷检测方法，包括：将所述自电容触控面板区域内的各像素电极充电到第三电压；将各触控电极同时充电到第一电压以开启各触控电极的充电路径；将各触控电极逐行充电到第二电压，并根据各行触控电极区块所对应的显示画面来判断是否存在短路缺陷。
优选地，在根据各行触控电极区块所对应的显示画面来判断是否存在短路缺陷的步骤中包括：当一行或多行触控电极区块所对应的显示画面未显示预设的画面时，则判断为在位于每一行所述一行或多行触控电极后面一行的触控电极与所述一行或多行触控电极之间和/或与位于所述一行或多行触控电极前面的至少一行触控电极之间存在短路缺陷。
优选地，所述第三电压等于所述第一电压。
优选地，所述初始画面包括黑色画面，所述测试画面包括白色画面。
与现有技术相比，上述方案中的一个或多个实施例可以具有如下优点或有益效果：
该装置能够进一步检测出存在于触控电极矩阵中各行触控电极之间的短路缺陷的情况，且该装置结构简单，可靠性高。
本发明的其他优点、目标，和特征在某种程度上将在随后的说明书中进行阐述，并且在某种程度上，基于对下文的考察研究对本领域技术人员而言将是显而易见的，或者可以从本发明的实践中得到教导。本发明的目标和其他优点可以通过下面的说明书，权利要求书，以及附图中所特别指出的结构来实现和获得。
附图说明
附图用来提供对本申请的技术方案或现有技术的进一步理解，并且构成说明书的一部分。其中，表达本申请实施例的附图与本申请的实施例一起用于解释本申请的技术方案，但并不构成对本申请技术方案的限制。
图1为现有技术的IPS液晶显示器的自电容触控面板的结构示意图；
图2为现有技术的用于自电容触控面板的缺陷检测方案的示意图；
图3为本申请的自电容触控面板的缺陷检测装置的驱动电路的结构示意图；
图4为本申请的自电容触控面板的缺陷检测装置与触控电极矩阵的连接示意图；
图5为本申请一实施例的自电容触控面板的缺陷检测装置的驱动电路的结 构示意图；
图6为本申请的自电容触控面板的缺陷检测装置的检测时序图；
图7为本申请另一实施例的自电容触控面板的缺陷检测装置的驱动电路的结构示意图；
图8为本申请的自电容触控面板的缺陷检测方法的流程示意图。
具体实施方式
以下将结合附图及实施例来详细说明本发明的实施方式，借此对本发明如何应用技术手段来解决技术问题，并达成相应技术效果的实现过程能充分理解并据以实施。本申请实施例以及实施例中的各个特征，在不相冲突前提下可以相互结合，所形成的技术方案均在本发明的保护范围之内。
图3为本申请的自电容触控面板的缺陷检测装置的驱动电路的结构示意图，图4为本申请的自电容触控面板的缺陷检测装置与触控电极矩阵的连接示意图。结合图3和图4可以看出，该自电容触控面板的缺陷检测装置包含设置在触控电极矩阵41的边缘处与多行触控电极分别连接的多个驱动电路30，每个驱动电路30包括预充单元31、同步单元32、输出单元33、截止单元34与锁存单元35。其中，锁存单元35、同步单元32与截止单元34依次串联形成主充电控制路径，预充单元31与上述串联支路并联接于输出单元33，形成辅充电控制路径。图5为根据本申请的一具体实施例，在该实施例中，并联的两条控制路径共同连接于输出单元33的控制信号输入端，下面结合图4和图5详细说明驱动电路30的结构。
预充单元31用于产生为各触控电极11同时预置第一电压的充电控制信号。具体的，如图5所示，预充单元31包含一个开关元件311，该开关元件311的信号输入端接SW信号，控制端接GAS信号。当GAS信号为高电平时，开关元件311开启，SW信号通过开关元件311的信号输出端施加于输出单元33的控制信号输入端(如图5中的A点所示)。当GAS信号为低电平时，开关元件311关闭，其所在的支路呈高阻状态，不会对驱动电路30的其他部分产生影响。在预充单元31的充电控制信号的作用下，可以使触控电极矩阵的所有触控电极11在初始时刻被充电至第一电压。
同步单元32用于产生为各触控电极11逐行施加第二电压的充电控制信号。具体的，如图5所示，同步单元32包含一个与非门321，该与非门321的两个 信号输入端分别接触发信号ST与时钟信号CK1。触发信号ST用于启动驱动电路30对位于该行的各触控电极11进行充电，时钟信号CK1用于形成同步的触发信号。当触发信号ST为高电平时，同步单元32在时钟信号CK1的上升沿输出一个低电平的充电控制信号Sel，触控电极11在Sel信号的作用下被逐行充电至第二电压。
输出单元33根据预充单元31和同步单元32产生的充电控制信号分别输出第一电压与第二电压来对各触控电极11进行充电。具体的，如图5所示，输出单元33包含两个反相器331和332以及一个传输门333。其中，反相器331和332串联组成输出单元33的控制信号输入端，充电控制信号经由A点接入输出单元33的控制信号输入端，并分别通过反相器331和332与传输门333的两个控制端相连接。当充电控制信号(Sel信号或SW信号)为低电平时，传输门333开启，信号Rx经传输门333输出给触控电极11。当充电控制信号为高电平时，传输门333关闭，触控电极11的电压维持不变。此处，信号Rx为具有第一电压值或第二电压值的电压信号。
截止单元34用于控制充电路径的导通与关闭，当某一行的触控电极被充电为第二电压时，位于该行触控电极前面一行的截止单元34将关闭位于该行触控电极前面一行的触控电极的充电路径。具体的，如图5所示，截止单元34包含一个开关元件341，该开关元件341串联接于同步单元32与输出单元33之间，即其信号输入端接同步单元32的输出端，其信号输出端接输出单元33的控制信号输入端，该开关元件341提供充电控制信号Sel到输出单元33的传输路径。
进一步地，开关元件341的控制端与位于该开关元件后面一行的输出单元33的输出端相连接，即位于第[n]行的开关元件341由第[n+1]行的触控电极11的电压信号Out[n+1]控制。当Out[n+1]为高电平时，Sel信号到输出单元33的传输路径导通，在Sel信号的作用下，输出单元33输出第二电压为该行触控电极11进行充电。当Out[n+1]为低电平时，Sel信号到输出单元33的传输路径关闭，该行触控电极11不能被充电，维持为第一电压。通过截止单元34的阻断作用，可以使第[n+1]行触控电极区块与第[n]行触控电极区块所对应的显示画面表现出不同，并可以籍此进一步确定短路缺陷的位置。
锁存单元35由四个反相器组成，用于存储触发信号ST，锁存单元35的输出端与同步单元32的一个输入端相连接，在时钟信号CK2的作用下，可以依据各行触控电极11的充电时序(逐行充电时序)分别为各行的同步单元32提供有 效的触发信号ST，即在第[n]行触控电极的充电期间内，向同步单元32输出高电平信号，在第[n]行触控电极的非充电期间内，向同步单元32持续输出低电平信号。
具体的，如图5所示，锁存单元35的输入端与位于该锁存单元前面一行的锁存单元的输出端相连接,，即以第[n]行的锁存单元35的输出端(如图5中B点所示)的触发信号ST[n]作为第[n+1]行的锁存单元35的输入端信号，进而实现触发信号的移位锁存。各锁存单元35的低电平输出信号可以通过异步复位端RST进行预先设置。
在本申请实施例的缺陷检测装置中，各行驱动电路30的连接方式如图4所示，对应于每行触控电极，为该行触控电极设置一个驱动电路30，各驱动电路30的输出单元33的输出信号反馈到位于其前面一行的驱动电路30的截止单元34的控制端，各锁存单元35的输出端分别与位于其后面一行的锁存单元35的输入端相连接。在相邻的两行之间同步单元32的时钟信号CK1(即第一时钟信号输入端)与锁存单元35的时钟信号CK2(即第二时钟信号输入端)交错连接。并分别在第一行的CK1端、第二行的CK2端、第三行的CK1端等并联端接入第一时钟信号clock1，在第一行的CK2端、第二行的CK1端、第三行的CK2端等并联端接入第二时钟信号clock2。各驱动电路30的预充单元31的控制端与信号输入端、各驱动电路30的锁存单元35的异步复位端分别并接在一起。
本申请实施例的缺陷检测装置能够实现以下功能，为各触控电极同时预置第一电压，为各触控电极逐行施加第二电压。通过初始时刻的触发信号ST[0]逐行启动各驱动电路进行检测。当由于短路缺陷致使位于后面行的触控电极先于其前面的触控电极被充电为第二电压时，关闭前一行触控电极的充电路径。下面结合图6的时序图详细说明上述过程。
首先，需要先对驱动电路30进行预充电以开启各行触控电极的充电路径。通过GAS信号的高电平开启开关元件311，期间使SW信号保持低电平，进而使传输门333导通，Rx信号通过传输门333输出，并对由传输门333驱动的触控电极进行充电。在SW信号的低电平期间使Rx信号为高电平，可以使各行触控电极均充电到高电平，如图6中的Out[1]、Out[2]及Out[3]所示。由于各触控电极的电压均为高电平，所以每一行的开关元件341均被开启，即所有触控电极的充电路径均处于导通的状态。
然后，将传输门333调整为稳定的关闭状态。分为两步，在开关元件311开 启期间，先使SW信号变为高电平来关闭传输门333，再通过负脉冲复位信号RST将锁存单元35复位。VGH高电平信号使各锁存单元35的输出端均为低电平，如图6中的ST[1]和ST[2]所示。ST[1]和ST[2]通过同步单元32与截止单元34传输到输出单元33的控制信号输入端，使传输门333关闭，因此，在GAS回到低电平后，传输门333仍然可以处于稳定的关闭状态。
接下来，在T0时刻，使第二时钟信号clock2作用于第1行的锁存单元35的输入端，同时使初始触发信号ST[0]在clock2的上升沿处保持稳定的高电平，则在clock2的上升沿作用下，第1行锁存单元35将ST[0]的正脉冲进行存储，即ST[1]在clock2的上升沿处变为高电平。该ST[1]信号施加于第2行锁存单元35的输入端，并在T1时刻的第一时钟信号clock1的上升沿处，锁存到第2行锁存单元35的输出端，即ST[2]变为高电平。也就是说，在第一时钟信号clock1和第二时钟信号clock2的交错作用下，各行驱动电路逐行获得触发信号ST[0]、ST[1]、ST[2]、……，如图6所示。同样的在T1时刻，第1行的同步单元32在第一时钟信号clock1的作用下，输出同步的触发信号Sel，Sel经由导通的充电路径控制传输门333开启，此时传输门333的输入信号Rx已经回到低电平，因此Out[1]输出为低电平。进一步地，第2行的同步单元32在第二时钟信号clock2的作用下输出同步的触发信号Sel并控制Out[2]输出为低电平。依此类推，各行触控电极逐行地输出信号Out[1]、Out[2]、Out[3]等……即充电至第二电压，如图6所示。
从上述工作过程可以看出，该缺陷监测装置无需复杂的扫描方式，只需进行相应的初始设置，就可以在初始的触发信号ST[0]和时钟信号的作用下对触控电极的缺陷进行检测，测试信号简单易实施，可靠性更高。
需要注意的是，本申请的缺陷监测装置的驱动电路的结构还可以为其他的形式，如图7所示，在本申请的另一实施例中，同步单元32由反相器322、开关元件323以及传输门324组成。当输入同步单元32的触发信号为高电平时，传输门324导通，开关元件323关闭，时钟信号CK1经由传输门324输出。当输入同步单元32的触发信号为低电平时，开关元件323开启，传输门324关闭，低电平VGL经由开关元件323输出。另外，可以理解的是，还可以将上述各实施例中的各信号的极性互换，也可以用于实现本申请，不再赘述。
利用上述自电容触控面板的缺陷检测装置进行缺陷检测的方法如图8所示，该方法包括以下步骤：
步骤S810、将自电容触控面板区域内的各像素电极充电到第三电压。步骤S820、将各触控电极同时充电到第一电压以开启各触控电极的充电路径。步骤S830、将各触控电极逐行充电到第二电压，并根据各行触控电极区块所对应的显示画面来判断是否存在短路缺陷。下面结合图3进行说明。
首先，通过自电容触控操作区域内的所有数据线(data线)将该区域内的各像素电极充电到第三电压，例如4.5V。然后，再将各触控电极充电到第一电压，第一电压可以与第三电压相等，即第一电压也取为4.5V。对像素电极的充电可以通过液晶显示面板的驱动电路完成，对触控电极的充电则可以通过上述的缺陷检测装置的预充电时序完成。当像素电极与触控电极所具有的电压相等时，IPS液晶显示器中与各行触控电极区块所对应的初始画面显示为黑色。进一步地，在第一电压信号的作用下，各行触控电极的充电路径均被开启。
接下来，开始逐行对各触控电极施加第二电压，例如0V，在没有被充电之前各像素电极仍维持在第三电压，上述充电过程可以通过缺陷检测装置在T0时刻之后的检测时序完成。由于各行充电路径均处于开启状态，因此各行触控电极可以被依次充电到0V，其对应的区块显示的画面将由黑色画面变成白色画面。若有不同行的触控电极与信号线之间发生短路缺陷，则可以根据显示画面发生变化的情况来确定缺陷的位置。
具体的，当一行或多行触控电极区块所对应的画面未显示预设的画面时，则判断为在位于一行或多行触控电极后面一行的触控电极与该一行或多行触控电极之间和/或与位于该一行或多行触控电极前面的至少一行触控电极之间存在短路缺陷。举例而言，假设位于第1行的触控电极的信号线与位于第4行的触控电极发生短路，那么在给第1行触控电极充电时会同时给第4行的触控电极充电。而当第4行的触控电极被充电到0V后，将导致第3行触控电极的充电路径被关闭，因此，第3行触控电极就不能被充电到指定的0V，与该第3行触控电极区块所对应的画面仍保持为黑色，进而根据上述画面的显示情况，可以确定第4行可能与第1行、第2行或第3行中的某一行或某几行触控电极(或触控电极的信号线)发生了短路。
再例如，当短路缺陷存在于第3行触控电极与第4行触控电极之间时，第3行触控电极将与第4行触控电极同时开始充电，当第4行触控电极的电压增加至一定值时将通过第3行的截止单元34关闭第3行触控电极的充电路径，而此时第3行触控电极还未被充电到设定的第二电压，因此第3行触控电极对应的区块 会显示出介于白色画面和黑色画面之间的灰色画面，即可以判断在相邻的两行之间存在缺陷。
需要注意的是，在确定上述缺陷发生的范围后，具体是哪几行触控电极(或触控电极与触控电极的信号线)之间发生了短路，可以在已经确定的范围内进行进一步的检测以消除缺陷。
还需要注意的是，在上述实施例中，为了便于操作，分别将第一电压与第三电压取为4.5V，将第二电压取为0V，这样画面的区别更显著，有利于观测。当然也可以将第一电压、第二电压与第三电压取为其他设定的值，只要保证能够通过第一电压和第二电压的值控制充电路径的导通与关闭即可。还可以将第一电压与第三电压取为不同的值，均可以用于实现本发明。
虽然本发明所揭露的实施方式如上，但所述的内容只是为了便于理解本发明而采用的实施方式，并非用以限定本发明。任何本发明所属技术领域内的技术人员，在不脱离本发明所揭露的精神和范围的前提下，可以在实施的形式上及细节上作任何的修改与变化，但本发明的专利保护范围，仍须以所附的权利要求书所界定的范围为准。

Claims (10)

  1. 一种自电容触控面板的缺陷检测装置，设置有与多行触控电极分别连接的多个驱动电路，所述驱动电路包括：
    预充单元，用于产生为各触控电极同时预置第一电压的充电控制信号；
    同步单元，用于产生为各触控电极逐行施加第二电压的充电控制信号；
    输出单元，根据所述充电控制信号分别输出第一电压与第二电压对所述触控电极进行充电；
    截止单元，根据各行触控电极所具有的电压控制位于该行触控电极前面一行的触控电极的充电路径的开启与关闭。
  2. 根据权利要求1所述的缺陷检测装置，其中，所述驱动电路还包括：
    锁存单元，与所述同步单元相连接，存储用于逐行启动各驱动电路的触发信号。
  3. 根据权利要求2所述的缺陷检测装置，其中，所述锁存单元的输入端与位于该锁存单元前面一行的锁存单元的输出端相连接。
  4. 根据权利要求3所述的缺陷检测装置，其中，所述截止单元串联接于所述同步单元与所述输出单元之间，所述截止单元的控制信号输入端与位于该截止单元后面一行的输出单元的输出端相连接。
  5. 根据权利要求4所述的缺陷检测装置，其中，所述截止单元通过所述触控电极的第一电压信号开启，通过所述触控电极的第二电压信号关闭。
  6. 根据权利要求5所述的缺陷检测装置，其中，所述截止单元包括开关元件。
  7. 根据权利要求3所述的缺陷检测装置，其中，所述同步单元的时钟信号输入端与所述锁存单元的时钟信号输入端在相邻的两行之间交错连接。
  8. 一种自电容触控面板的缺陷检测方法，包括：
    将所述自电容触控面板区域内的各像素电极充电到第三电压；
    将各触控电极同时充电到第一电压以开启各触控电极的充电路径；
    将各触控电极逐行充电到第二电压，并根据各行触控电极区块所对应的显示画面来判断是否存在短路缺陷。
  9. 根据权利要求8所述的缺陷检测方法，其中，在根据各行触控电极区块所对应的显示画面来判断是否存在短路缺陷的步骤中包括：
    当一行或多行触控电极区块所对应的显示画面未显示预设的画面时，则判断为在位于每一行所述一行或多行触控电极后面一行的触控电极与所述一行或多行触控电极之间和/或与位于所述一行或多行触控电极前面的至少一行触控电极之间存在短路缺陷。
  10. 根据权利要求8所述的缺陷检测方法，其中，所述第三电压等于所述第一电压。
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