WO2017067511A1 - 一种超导线圈缺陷位置检测系统 - Google Patents

一种超导线圈缺陷位置检测系统 Download PDF

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Publication number
WO2017067511A1
WO2017067511A1 PCT/CN2016/102898 CN2016102898W WO2017067511A1 WO 2017067511 A1 WO2017067511 A1 WO 2017067511A1 CN 2016102898 W CN2016102898 W CN 2016102898W WO 2017067511 A1 WO2017067511 A1 WO 2017067511A1
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superconducting coil
tested
coil
magnetic circuit
magnetic field
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PCT/CN2016/102898
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English (en)
French (fr)
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高琦
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北京原力辰超导技术有限公司
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Publication of WO2017067511A1 publication Critical patent/WO2017067511A1/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws

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  • Embodiments of the present invention relate to the field of superconducting electrical engineering, and in particular, to a superconducting coil defect position detecting system.
  • Superconducting materials can be widely used in large-scale power installations because of their unimpeded and high current characteristics. With the continuous rise of green environmental protection industry, with the continuous improvement of the production and stability of superconducting strips, large-scale use of high-temperature super can be expected. The age of the materials is coming soon. In most power equipment applications, high-temperature superconducting wires exist in the form of coils, in which the coil is the basic unit of electrical equipment, the quality of the coil also directly determines the quality of the electrical equipment, because the high-temperature superconducting material is a For ceramic materials, the strip itself is easy to introduce defects during production and use. It is necessary to carry out quality monitoring on all processes of coil production.
  • Embodiments of the present invention provide a superconducting coil defect position detecting system, which realizes detection of a defect position of a superconducting coil.
  • the embodiment of the invention provides a superconducting coil defect position detecting system, comprising:
  • Magnetic circuit, multi-degree of freedom mobile platform, detection device, excitation coil and power supply the magnetic circuit is opened a magnetic circuit window, a superconducting coil to be tested is disposed between the magnetic circuit windows, the power source is connected to the exciting coil, the exciting coil is wound on the magnetic circuit, and the magnetic circuit is fixed at the plurality of The detection device is disposed on a surface of the superconducting coil to be tested;
  • the magnetic circuit window for radially exciting along a winding of the superconducting coil to be tested
  • the multi-degree-of-freedom mobile platform is configured to adjust a position between the magnetic circuit window and the superconducting coil to be tested;
  • the detecting device is configured to detect a magnetic field or a temperature of the surface of the superconducting coil to be tested, to determine whether the superconducting coil to be tested has defects according to a change of a magnetic field or a temperature of the superconducting coil surface to be tested The location of the defect.
  • the detecting device comprises an infrared imaging device, and the probe of the infrared imaging device is disposed at a preset distance of the surface of the superconducting coil to be tested.
  • the detecting device comprises a temperature measuring matrix, and the temperature measuring matrix covers the surface of the superconducting coil to be tested and is in contact with the superconducting coil to be tested.
  • the temperature measurement matrix and the superconducting coil to be tested are filled with thermal grease.
  • the detecting device includes a magnetic field measuring matrix or a magnetic field scanning platform, and the magnetic field measuring matrix or the magnetic field scanning platform is disposed on a part of the surface of the superconducting coil to be tested, and the partial surface is not disposed in the Part of the surface of the magnetic circuit window.
  • the detecting device further includes: a magnetocaloric film disposed on a surface of the superconducting coil to be tested, the magnetocaloric film covering a surface of the superconducting coil to be tested.
  • the detecting device comprises a magneto-optical film and a magneto-optical observation device, the magneto-optical film covering a surface of the superconducting coil to be tested, wherein the magneto-optical observation device is disposed on the magneto-optical film The preset distance.
  • the shape of the magnetic circuit is C-type, E-type or D-type.
  • the system further includes a contact cooling cold head disposed on a surface of the superconducting coil to be tested that is not provided with the detecting device.
  • the system further includes a signal collecting device and a terminal, wherein the signal collecting device is connected to the detecting device at one end and connected to the terminal at the other end.
  • Embodiments of the present invention provide a superconducting coil defect position detecting system, including: a magnetic circuit, a multi-degree-of-freedom moving platform, a detecting device, an exciting coil, and a power source, wherein the magnetic circuit is provided with a magnetic circuit window, and the magnetic circuit window Between the superconducting coil to be tested, the power source is connected to the exciting coil, The excitation coil is connected to the magnetic circuit, the magnetic circuit is fixed on the multi-degree-of-freedom moving platform, the detecting device is disposed on one surface of the superconducting coil to be tested; and the detecting device is configured to Detecting a magnetic field or a temperature of the surface of the superconducting coil to be tested to determine whether the superconducting coil to be tested has defects and defects according to a change in a magnetic field or temperature of the surface of the superconducting coil to be tested, thereby realizing Detection of the position of the lead coil defect.
  • FIG. 1 is a schematic structural diagram of a superconducting coil defect position detecting system according to an embodiment of the present invention
  • FIG. 2 is a schematic structural diagram of a superconducting coil defect position detecting system according to another embodiment of the present invention.
  • FIG. 3 is a schematic structural diagram of a superconducting coil defect position detecting system according to another embodiment of the present invention.
  • FIG. 4 is a schematic plan view of a superconducting coil defect position detecting system according to another embodiment of the present invention.
  • FIG. 5 is a schematic structural diagram of a superconducting coil defect position detecting system according to another embodiment of the present invention.
  • FIG. 6 is a schematic structural diagram of a superconducting coil defect position detecting system according to another embodiment of the present invention.
  • a magnetic circuit a multi-degree-of-freedom moving platform, a detecting device, an exciting coil and a power source
  • the magnetic circuit is provided with a magnetic circuit window, and a superconducting coil to be tested is disposed between the magnetic circuit windows, the power source and the exciting coil Connected, the exciting coil is wound on the magnetic circuit, the magnetic circuit is fixed on the multi-degree-of-freedom moving platform, and the detecting device is disposed on one surface of the superconducting coil to be tested;
  • the magnetic circuit window for radially exciting along a winding of the superconducting coil to be tested
  • the multi-degree-of-freedom mobile platform is configured to adjust a position between the magnetic circuit window and the superconducting coil to be tested;
  • the detecting device is configured to detect a magnetic field or a temperature of the surface of the superconducting coil to be tested, to determine whether the superconducting coil to be tested has defects according to a change of a magnetic field or a temperature of the superconducting coil surface to be tested The location of the defect.
  • Embodiments of the present invention provide a superconducting coil defect position detecting system capable of detecting local defects and thermal stability of a high temperature superconducting coil, which utilizes a magnetic field and a temperature probe to observe a winding of a coil under a through current and an external magnetic field.
  • the magnetic field and temperature change caused by internal defects detect the defect position and defect degree.
  • the cryogenic refrigeration device and the multi-degree of freedom adjustment platform are combined to form a coil quality monitoring system.
  • the system includes a magnetic circuit with a window for radially exciting the superconducting coil along the winding.
  • the magnetic circuit is fixed on the multi-degree of freedom moving platform for adjusting the mutual position and degree between the superconducting coil and the continuous scanning of the coil winding.
  • a magnetic field temperature probe is placed on the surface of the winding to observe the magnetic field or temperature distribution of the coil winding after passing or excitation to determine the specific position and extent of the winding defect.
  • These magnetic field and temperature probes include a probe matrix or probe scanning platform for detecting a magnetic field; a magneto-optical film for detecting a magnetic field and a corresponding magneto-optical detection device; an infrared thermal imaging probe for detecting the surface temperature of the winding; Temperature measurement matrix of winding temperature; magnetocaloric film used to reflect temperature changes.
  • the system also includes a coil cooling and maintenance system, a signal acquisition system that cooperates with the probe, and a corresponding acquisition computer.
  • Embodiments of the present invention provide a system that can detect and detect defects and stability of a high temperature superconducting coil without lossless continuous detection.
  • the above detecting device includes an infrared imaging device, and a probe of the infrared imaging device is disposed at a preset distance of a surface of the superconducting coil to be tested.
  • the coil to be tested is a 50 ⁇ YBCO high temperature superconducting cake coil, the inner radius of the coil is 0.03 m, the outer radius is 0.035 m, and the total wire amount is 10.2 m.
  • the cold head 3 cools the coil 1 to 70K.
  • the coil 1 is excited by the current lead 2, and the winding is excited by the C-type magnetic field path.
  • the infrared imager is used to observe the coil through different currents, and the winding is applied under different magnetic fields.
  • the surface is heated. If there is a defect inside the coil, it will be heated and will be detected by the infrared imaging device. According to the temperature rise, the thermal stability of the coil under different current conditions and different external magnetic fields and the position and extent of the defect can be quantitatively determined.
  • Drive multi-degree of freedom platform 7 for continuous measurement of all windings.
  • the detecting device in the above system includes a temperature measuring matrix covering the surface of the superconducting coil to be tested and in contact with the superconducting coil to be tested.
  • a thermal grease is filled between the temperature measurement matrix and the superconducting coil to be tested.
  • the main components are the same as those in Fig. 1, except that a temperature measurement matrix 9 is added to the winding surface of the coil 1. As shown in Fig. 2, the temperature distribution of the winding under operating conditions is further observed by contact with the winding.
  • the temperature measurement matrix may be composed of a fiber optic temperature probe, and may also be composed of a thermocouple, a platinum resistor, a yttria resistor or a silicon diode temperature probe.
  • a platinum resistance thermometer is used to form a temperature measurement matrix.
  • the temperature measurement matrix is in close contact with the coil winding. Usually, some thermal grease is coated between the temperature measurement matrix and the coil winding to increase the thermal conductivity.
  • the cooling probe 3 works to drive the coil to cool to 70K.
  • the current lead 2 is used to excite the coil, and the C-type magnetic circuit is used to apply a magnetic field to the winding.
  • the temperature measuring matrix 9 is used to observe the coil current with different currents and different magnetic fields.
  • the surface heat condition if there is a defect inside the coil, it will generate heat, which will be detected by the temperature measurement matrix probe. According to the temperature rise, the thermal stability of the coil under different working conditions and the position and extent of the defect can be quantitatively determined.
  • the detecting device includes a magnetic field measuring matrix or a magnetic field scanning platform, and the magnetic field measuring matrix or the magnetic field scanning platform is disposed on a part of the surface of the superconducting coil to be tested, and the partial surface is not disposed in the magnetic circuit window Part of the surface.
  • the main components are the same as in the first embodiment, except that the magnetic field measurement matrix is added or the magnetic field scanning platform 10 is placed outside the window 6 in the winding winding direction, such as As shown in FIG. 3 and FIG. 4, the measurement matrix may be composed of a Hall component, or may be a magnetic field measuring element such as a giant magnetoresistance, a fluxgate magnetometer, or a Squids principle.
  • the C-type magnetic circuit When in use, the C-type magnetic circuit first applies a 2 times penetration magnetic field to the winding at the window 6, and the 2 times penetration magnetic field can be estimated according to 2*N*Jc*T, where N is the number of turns of the coil, and Jc is the winding of the coil.
  • the critical current density of the high-temperature superconducting tape, T is the thickness of the high-temperature superconducting tape.
  • the multi-degree-of-freedom platform 7 is driven to slowly move the excited winding out of the window.
  • the magnetic field measurement matrix outside the window or the scanning platform 10 detects the magnetic field on the surface of the winding.
  • the magnetic field scanning platform is used to scan the magnetic field of the winding surface of the removal window. If there is a defect in the winding, the surface magnetic field is scanned and inversely generated. The specific state and extent of the defect can be obtained by the current of the magnetic field.
  • the detecting device further includes: a magnetocaloric film disposed on a surface of the superconducting coil to be tested, the magnetocaloric film covering a surface of the superconducting coil to be tested.
  • the main components are basically the same as those in the third embodiment, except that the magnetocaloric film 11 is added on the surface of the magnet winding.
  • the magnetic film is relatively low in temperature from the Curie temperature. When the coil is excited by the flow, If there is a local heating point that causes the temperature to rise, the magnetic properties of the upper magnetocaloric film are destroyed. In use, the coil flows, and the position and extent of the response defect point can be obtained by scanning the magnetic field measurement matrix 10 along the surface of the magnetocaloric film.
  • the detecting device includes a magneto-optical film and a magneto-optical observation device, the magneto-optical film covering a surface of the superconducting coil to be tested, and the magneto-optical observation device is disposed at a preset distance of the magneto-optical film .
  • the main components are the same as those in Embodiment 1, except that a magneto-optical film 12 is added to the surface of the magnet winding, and a corresponding magneto-optical observation device 13 is provided.
  • the magneto-optical film causes light under a magnetic field.
  • the polarization plane is rotated, and the magnetic field distribution of the coil winding under the magneto-optical film can be observed by the magneto-optical observation device 13.
  • the C-type magnetic circuit first applies a sufficiently large magnetic field to the window 6 along the winding stacking direction.
  • the specific applied magnetic field can be estimated according to 2*N*Jc*T, where N is the number of turns of the coil, and Jc is the coil wound.
  • the critical current density of the high-temperature superconducting tape, T is the thickness of the high-temperature superconducting tape.
  • the multi-degree-of-freedom platform 7 is driven to slowly move the already excited winding out of the window.
  • the magneto-optical detecting device 13 outside the window observes the reflection of the light reflected from the magnetic field thin film 12 above the window winding. If there is a defect in the winding, the magnetic field is distorted, and the magnetic field acts on the magneto-optical film through the magneto-optical observation device. , you can get the specific location of the defect and the specific extent of the defect.
  • the above embodiment only exemplifies a structure in which a magnetic field is applied to a coil winding based on a C-type magnetic circuit.
  • the actual magnetic circuit form may be other forms such as an E-type D type, or the magnetic path magnetic field is provided by a corresponding permanent magnet magnetic circuit, but As long as the magnetic field window is used to apply a magnetic field to the magnet winding, and the magnetic field and the temperature probe are used to measure the magnetic and thermal effects of the winding, the method of detecting the position and extent of the defect should be included in the protection range required by the embodiment of the present invention. .
  • the multi-degree-of-freedom platform is connected with the C-type magnetic circuit to realize the mutual position adjustment between the magnetic circuit and the coil winding.
  • the multi-degree-of-freedom platform can also be connected with the coil winding to realize the relationship between the magnetic circuit and the magnetic circuit.
  • Mutual position adjustment Such a manner of adjusting the mutual position between the coil and the magnetic circuit by means of a mechanical transmission to achieve continuous full scanning of the coil should be included within the scope of protection required by embodiments of the present invention.
  • the upper system further includes a contact cooling cold head disposed on a surface of the superconducting coil to be tested that is not provided with the detecting device.
  • the magnetic field matrix is used to measure the surface magnetic field of the coil winding, and the refrigerant can be cooled by liquid nitrogen, cold nitrogen, liquid helium, cold helium gas, etc., which are commonly used for cooling superconducting magnets.
  • the method is not described in the examples, but should be included in the scope of the present invention.
  • the system further includes a signal acquisition device and a terminal, the signal acquisition device having one end connected to the detection device and the other end connected to the terminal.
  • the user can directly observe the temperature data of the superconducting coil through the terminal and determine the position of the defect.

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Abstract

一种超导线圈缺陷位置检测系统，包括：磁路（4）、多自由度移动平台（7）、检测装置、励磁线圈（5）及电源，磁路（4）开设有磁路窗口（6），所述磁路窗口（6）之间设置有待测超导线圈（1），电源与所述励磁线圈（5）相连，所述励磁线圈（5）缠绕在所述磁路（4）上，磁路（4）固定在所述多自由度移动平台（7）上，检测装置设置在待测超导线圈（1）的一个表面上；磁路窗口（6），用于沿着所述待测超导线圈（1）的绕组径向励磁；多自由度移动平台（7），用于调节磁路窗口（6）与所述待测超导线圈（1）之间的位置；检测装置，用于检测所述待测超导线圈（1）表面的磁场或温度，以根据所述待测超导线圈（1）表面的磁场或温度的变化，判断所述待测超导线圈（1）是否存在缺陷以及缺陷的位置，实现了超导线圈（1）缺陷位置的检测。

Description

一种超导线圈缺陷位置检测系统
交叉引用
本申请引用于2015年10月21日提交的专利名称为“一种超导线圈缺陷位置检测系统”的第2015106890995号中国专利申请，其通过引用被全部并入本申请。
技术领域
本发明实施例涉及超导电工技术领域，特别是一种超导线圈缺陷位置检测系统。
背景技术
超导材料因其无阻可携带大电流的特性可广泛应用于大型电力装置，随着绿色环保产业的不断兴起，随着超导带材产量与稳定性的不断提高，可以预期大规模使用高温超导材料的年代即将到来。在大部分电力装备应用当中，高温超导导线都是以线圈的形式存在的，这其中线圈是电工器件的基本单元，线圈的质量也直接决定了电工器件的质量，由于高温超导材料是一种陶瓷材料，带材本身很容易在生产和使用过程中引入缺陷，很有必要对线圈生产的全部流程进行质量监控，但带材绕制成线圈的过程，仍存在诸多不确定因素，很可能在线圈制备过程中引入各种缺陷，目前检测线圈质量的唯一方法是整体测量线圈伏安特性，但这种方法无法对线圈局部缺陷的位置和程度形成有效检测，而高温超导线圈的局部缺陷往往是引起高温超导器件严重故障，甚至烧毁的重要因素，因此十分有必要设计一种检测高温超导线圈局部缺陷和热稳定性的设备。
发明内容
本发明实施例提供了一种超导线圈缺陷位置检测系统，实现了超导线圈缺陷位置的检测。
本发明实施例提出一种超导线圈缺陷位置检测系统，包括：
磁路、多自由度移动平台、检测装置、励磁线圈及电源，所述磁路开设 有磁路窗口，所述磁路窗口之间设置有待测超导线圈，所述电源与所述励磁线圈相连，所述励磁线圈缠绕在所述磁路上，所述磁路固定在所述多自由度移动平台上，所述检测装置设置在所述待测超导线圈的一个表面上；
所述磁路窗口，用于沿着所述待测超导线圈的绕组径向励磁；
所述多自由度移动平台，用于调节所述磁路窗口与所述待测超导线圈之间的位置；
所述检测装置，用于检测所述待测超导线圈表面的磁场或温度，以根据所述待测超导线圈表面的磁场或温度的变化，判断所述待测超导线圈是否存在缺陷以及缺陷的位置。
可选的，所述检测装置包括红外成像装置，所述红外成像装置的探头设置在所述待测超导线圈表面的预设距离处。
可选的，所述检测装置包括测温矩阵，所述测温矩阵覆盖在所述待测超导线圈的表面上，且与所述待测超导线圈接触。
可选的，所述测温矩阵与所述待测超导线圈之间填充有导热硅脂。
可选的，所述检测装置包括磁场测量矩阵或磁场扫描平台，所述磁场测量矩阵或磁场扫描平台设置在所述待测超导线圈的部分表面上，所述部分表面为未设置在所述磁路窗口的部分表面。
可选的，所述检测装置还包括：设置在所述待测超导线圈的表面上的磁热薄膜，所述磁热薄膜覆盖在所述待测超导线圈的表面上。
可选的，所述检测装置包括磁光薄膜和磁光观测装置，所述磁光薄膜覆盖在所述待测超导线圈的表面上，所述磁光观测装置设置在所述磁光薄膜的预设距离处。
可选的，所述磁路的形状为C型、E型或D型。
可选的，所述系统还包括接触制冷冷头，所述接触制冷冷头设置于所述待测超导线圈中未设置检测装置的一个表面上。
可选的，所述系统还包括信号采集装置和终端，所述信号采集装置一端与所述检测装置相连，另一端与所述终端相连。
本发明实施例提供了一种超导线圈缺陷位置检测系统，包括：磁路、多自由度移动平台、检测装置、励磁线圈及电源，所述磁路开设有磁路窗口，所述磁路窗口之间设置有待测超导线圈，所述电源与所述励磁线圈相连，所 述励磁线圈与所述磁路相连，所述磁路固定在所述多自由度移动平台上，所述检测装置设置在所述待测超导线圈的一个表面上；所述检测装置，用于检测所述待测超导线圈表面的磁场或温度，以根据所述待测超导线圈表面的磁场或温度的变化，判断所述待测超导线圈是否存在缺陷以及缺陷的位置，实现了超导线圈缺陷位置的检测。
附图说明
为了更清楚地说明本发明实施例或现有技术中的技术方案，下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍，显而易见地，下面描述中的附图仅仅是本发明中记载的一些实施例，对于本领域普通技术人员来讲，还可以根据这些附图获得其他的附图。
图1为本发明一实施例提供的超导线圈缺陷位置检测系统的结构示意图；
图2为本发明另一实施例提供的超导线圈缺陷位置检测系统的结构示意图；
图3为本发明另一实施例提供的超导线圈缺陷位置检测系统的结构示意图；
图4为本发明另一实施例提供的超导线圈缺陷位置检测系统的平面示意图；
图5为本发明另一实施例提供的超导线圈缺陷位置检测系统的结构示意图；
图6为本发明另一实施例提供的超导线圈缺陷位置检测系统的结构示意图。
具体实施方式
为使本发明实施例的目的、技术方案和优点更加清楚，下面将结合本发明实施例中的附图，对本发明实施例中的技术方案进行清楚地描述，显然，所描述的实施例是本发明一部分实施例，而不是全部的实施例。基于本发明中的实施例，本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例，都属于本发明保护的范围。
本发明一实施例提供的一种超导线圈缺陷位置检测系统，该系统包括：
磁路、多自由度移动平台、检测装置、励磁线圈及电源，所述磁路开设有磁路窗口，所述磁路窗口之间设置有待测超导线圈，所述电源与所述励磁线圈相连，所述励磁线圈缠绕在所述磁路上，所述磁路固定在所述多自由度移动平台上，所述检测装置设置在所述待测超导线圈的一个表面上；
所述磁路窗口，用于沿着所述待测超导线圈的绕组径向励磁；
所述多自由度移动平台，用于调节所述磁路窗口与所述待测超导线圈之间的位置；
所述检测装置，用于检测所述待测超导线圈表面的磁场或温度，以根据所述待测超导线圈表面的磁场或温度的变化，判断所述待测超导线圈是否存在缺陷以及缺陷的位置。
本发明实施例提供了一种超导线圈缺陷位置检测系统，能够对高温超导线圈局部缺陷，热稳定性进行检测，它利用磁场和温度探头观测线圈在通流和施加外磁场下绕组因绕组内部缺陷引起的磁场和温度时空变化检测缺陷位置和缺陷程度，同时作为超导检测系统配备低温制冷装置和多自由度调整平台共同组成线圈质量监控系统。
该统包含一个磁路，磁路开有窗口用以对超导线圈沿着绕组径向励磁。磁路固定在多自由度移动平台之上用以调节与超导线圈之间的相互位置和程度，实现对线圈绕组的连续扫描。绕组表面放置磁场温度探头观测线圈绕组在通流或者励磁之后的磁场或者温度分布用以判断绕组缺陷的具体位置和程度。这些磁场和温度探头包含，用于探测磁场的探头矩阵或者探头扫描平台；用于探测磁场的磁光薄膜以及相应的磁光检测设备；用于探测绕组表面温度的红外热成像探头；用于探测绕组温度的测温矩阵；用于反映温度变化的磁热薄膜。除了以上核心部件，系统还包括线圈制冷及维持系统，与探头配合的信号采集系统和相应的采集电脑。
下面通过具体的实施例对上述系统进行详细说明。
实施例1
本发明实施例提供一种系统，可无损连续检测检测高温超导线圈缺陷及稳定性。上述检测装置包括红外成像装置，所述红外成像装置的探头设置在所述待测超导线圈表面的预设距离处。如图1所示，包括待测多匝高温超导 线圈1；待测线圈电流引线2；制冷线圈的冷头3通过接触制冷冷却线圈；磁路4用以对线圈绕组励磁，实施例一中选用C型磁路；励磁线圈5及其配套电源；C型磁路窗口6，窗口间距根据绕组厚度可调；多自由度平台7为调整C型磁路与线圈的相对位置；红外成像装置8。实施例1种，待测线圈为50匝YBCO高温超导饼状线圈，该线圈内半径为0.03m,外半径为0.035m，总计用线量10.2米。检测时候，冷头3冷却线圈1至70K，此时通过电流引线2为线圈1励磁，利用C型磁场路对绕组励磁，同时利用红外成像仪观测线圈通以不同电流，施加不同磁场情况下绕组表面发热状况，如果线圈内部存在缺陷则会发热，会被红外成像设备探测到，根据温度升高情况可定量判定线圈在不同通流情况和不同外磁场下的热稳定性和缺陷位置及程度。驱动多自由度平台7，可对全部绕组实现连续测量。
实施例2
上述系统中的检测装置包括测温矩阵，所述测温矩阵覆盖在所述待测超导线圈的表面上，且与所述待测超导线圈接触。在所述测温矩阵与所述待测超导线圈之间填充有导热硅脂。主要部件与上述图1相同，不同的是在线圈1绕组表面添加了测温矩阵9，如图2所示，通过与绕组接触的方式进一步观测绕组在工况下的温度分布。该测温矩阵可由光纤测温探头组成，还可以由热电偶，铂电阻，氧化钌电阻或者硅二极管测温探头构成。实施例二中，采用铂电阻温度计构成测温矩阵。测温矩阵与线圈绕组紧密接触，通常可在测温矩阵与线圈绕组之间涂膜一些导热硅脂增加热导。检测时候，制冷探头3工作带动线圈冷却至70K，此时通过电流引线2为线圈励磁，利用C型磁路对绕组施加磁场，利用测温矩阵9观测线圈通以不同电流，施加不同磁场情况下的表面发热状况，如果线圈内部存在缺陷会产生发热，会被测温矩阵探头探测到，根据温度升高情况可定量判定线圈在不同工作条件下的热稳定性和缺陷位置及程度。
实施例3
所述检测装置包括磁场测量矩阵或磁场扫描平台，所述磁场测量矩阵或磁场扫描平台设置在所述待测超导线圈的部分表面上，所述部分表面为未设置在所述磁路窗口的部分表面。主要部件与实施例一中相同，不同的是增加了磁场测量矩阵或者磁场扫描平台10放置在窗口6之外沿绕组绕制方向，如 图3和图4所示，测量矩阵可以是Hall元器件构成的，也可以是巨磁阻，磁通门磁强计，Squids等原理的磁场测量元件构成的。使用时C型磁路首先对窗口6处的绕组施加一个2倍穿透磁场，2倍穿透磁场可按照2*N*Jc*T估算，其中N为线圈匝数，Jc是绕制线圈的高温超导带材的临界电流密度，T是高温超导带材厚度，施加磁场后，驱动多自由度平台7，将已经励磁绕组缓慢移出窗口。在窗口外的磁场测量矩阵或者扫描平台10探测绕组表面的磁场，实施例3中采用磁场扫描平台对移出窗口的绕组表面磁场实施扫描，如果绕组中存在缺陷，通过扫描表面磁场，并反算产生磁场的电流，就可以得到缺陷的具体位置和程度。
实施例4
所述检测装置还包括：设置在所述待测超导线圈的表面上的磁热薄膜，所述磁热薄膜覆盖在所述待测超导线圈的表面上。主要部件与实施例三中基本相同，不同的是在磁体绕组表面增加了磁热薄膜11，如图5所示，这种磁性薄膜距离温度居里温度比较低，当线圈通流励磁的时候，如果有局部发热点导致升温，就会破坏上方磁热薄膜的磁性。使用时，线圈通流，利用磁场测量矩阵10沿着磁热薄膜表面扫描就可以得到响应缺陷点的位置和程度。
实施例5
所述检测装置包括磁光薄膜和磁光观测装置，所述磁光薄膜覆盖在所述待测超导线圈的表面上，所述磁光观测装置设置在所述磁光薄膜的预设距离处。主要部件与实施例1中相同，不同的是在磁体绕组表面增加了磁光薄膜12，并配备相应的磁光观测装置13，如图6所示，这种磁光薄膜在磁场下会引起光的偏振面发生旋转，利用磁光观测装置13就可以观测到磁光薄膜下方线圈绕组的磁场分布情况。具体使用时C型磁路首先对窗口6沿着绕组叠放方向施加一个足够大的磁场，具体施加磁场可按照2*N*Jc*T估算，其中N为线圈匝数，Jc是绕制线圈高温超导带材的临界电流密度，T是高温超导带材厚度，施加磁场后，驱动多自由度平台7，将已经励磁过后的绕组缓慢移出窗口。在窗口外的磁光探测装置13观测移出窗口绕组上方磁场磁光薄膜12的光线反射情况，如果绕组中存在缺陷，会引起磁场畸变，而磁场又会作用到磁光薄膜，通过磁光观测设备，就可以得到缺陷的具体位置和缺陷具体的程度。
以上实施例仅列举一种基于C型磁路对线圈绕组施加磁场的结构，实际的磁路形式还可以是E型D型等其它形式，或者磁路磁场由相应的永磁体磁路提供，但只要是利用磁路窗口对磁体绕组径向施加磁场，同时通过磁场、测温探头测量绕组的磁、热效应的方式检测缺陷位置和程度的方法均应包含在本发明实施例要求的保护的范围内。
以上实施例中多自由度平台与C型磁路相连，实现磁路与线圈绕组之间的相互位置的调节，实际实现过程中多自由度平台也可以与线圈绕组相连，实现与磁路之间的相互位置调整。这种利用机械传动装置调整线圈与磁路之间的相互位置，实现对线圈的连续全面扫描的方式都应包含在本发明实施例所要求的保护的范围内。
上系统还包括接触制冷冷头，所述接触制冷冷头设置于所述待测超导线圈中未设置检测装置的一个表面上。但实际使用时候，特别实施例3中利用磁场矩阵测量线圈绕组表面磁场的应用场合，也可以采用液氮，冷氮气，液氦，冷氦气等冷媒制冷，这都属于冷却超导磁体的常用方法，不在实施例中赘述，但都应包含在本发明所要求保护的范围内。
所述系统还包括信号采集装置和终端，所述信号采集装置一端与所述检测装置相连，另一端与所述终端相连。用户可以通过终端直接对待测超导线圈的温度数据进行观测并确定缺陷的位置。
此外，本领域的技术人员能够理解，尽管在此所述的一些实施例包括其它实施例中所包括的某些特征而不是其它特征，但是不同实施例的特征的组合意味着处于本发明的范围之内并且形成不同的实施例。
虽然结合附图描述了本发明的实施方式，但是本领域技术人员可以在不脱离本发明的精神和范围的情况下做出各种修改和变型，这样的修改和变型均落入由所附权利要求所限定的范围之内。

Claims (10)

  1. 一种超导线圈缺陷位置检测系统，其特征在于，包括：
    磁路、多自由度移动平台、检测装置、励磁线圈及电源，所述磁路开设有磁路窗口，所述磁路窗口之间设置有待测超导线圈，所述电源与所述励磁线圈相连，所述励磁线圈缠绕在所述磁路上，所述磁路固定在所述多自由度移动平台上，所述检测装置设置在所述待测超导线圈的一个表面上；
    所述磁路窗口，用于沿着所述待测超导线圈的绕组径向励磁；
    所述多自由度移动平台，用于调节所述磁路窗口与所述待测超导线圈之间的位置；
    所述检测装置，用于检测所述待测超导线圈表面的磁场或温度，以根据所述待测超导线圈表面的磁场或温度的变化，判断所述待测超导线圈是否存在缺陷以及缺陷的位置。
  2. 根据权利要求1所述的系统，其特征在于，所述检测装置包括红外成像装置，所述红外成像装置的探头设置在所述待测超导线圈表面的预设距离处。
  3. 根据权利要求1所述的系统，其特征在于，所述检测装置包括测温矩阵，所述测温矩阵覆盖在所述待测超导线圈的表面上，且与所述待测超导线圈接触。
  4. 根据权利要求3所述的系统，其特征在于，所述测温矩阵与所述待测超导线圈之间的填充有导热硅脂。
  5. 根据权利要求1所述的系统，其特征在于，所述检测装置包括磁场测量矩阵或磁场扫描平台，所述磁场测量矩阵或磁场扫描平台设置在所述待测超导线圈的部分表面上，所述部分表面为未设置在所述磁路窗口的部分表面。
  6. 根据权利要求5所述的系统，其特征在于，所述检测装置还包括：设置在所述待测超导线圈的表面上的磁热薄膜，所述磁热薄膜覆盖在所述待测超导线圈的表面上。
  7. 根据权利要求1所述的系统，其特征在于，所述检测装置包括磁光薄膜和磁光观测装置，所述磁光薄膜覆盖在所述待测超导线圈的表面上，所述磁光观测装置设置在所述磁光薄膜的预设距离处。
  8. 根据权利要求1所述的系统，其特征在于，所述磁路的形状为C型、E 型或D型。
  9. 根据权利要求1-8中任一项所述的系统，其特征在于，所述系统还包括接触制冷冷头，所述接触制冷冷头设置于所述待测超导线圈中未设置检测装置的一个表面上。
  10. 根据权利要求9所述的系统，其特征在于，所述系统还包括信号采集装置和终端，所述信号采集装置一端与所述检测装置相连，另一端与所述终端相连。
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