WO2017051794A1 - 冷却器付き発光モジュールおよび冷却器付き発光モジュールの製造方法 - Google Patents
冷却器付き発光モジュールおよび冷却器付き発光モジュールの製造方法 Download PDFInfo
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- WO2017051794A1 WO2017051794A1 PCT/JP2016/077657 JP2016077657W WO2017051794A1 WO 2017051794 A1 WO2017051794 A1 WO 2017051794A1 JP 2016077657 W JP2016077657 W JP 2016077657W WO 2017051794 A1 WO2017051794 A1 WO 2017051794A1
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- cooler
- layer
- light emitting
- metal layer
- insulating layer
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Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/64—Heat extraction or cooling elements
- H01L33/644—Heat extraction or cooling elements in intimate contact or integrated with parts of the device other than the semiconductor body
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/64—Heat extraction or cooling elements
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
- B23K1/0008—Soldering, e.g. brazing, or unsoldering specially adapted for particular articles or work
- B23K1/0016—Brazing of electronic components
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/22—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by the composition or nature of the material
- B23K35/24—Selection of soldering or welding materials proper
- B23K35/28—Selection of soldering or welding materials proper with the principal constituent melting at less than 950 degrees C
- B23K35/286—Al as the principal constituent
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/22—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by the composition or nature of the material
- B23K35/24—Selection of soldering or welding materials proper
- B23K35/30—Selection of soldering or welding materials proper with the principal constituent melting at less than 1550 degrees C
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C5/00—Alloys based on noble metals
- C22C5/02—Alloys based on gold
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/40—Mountings or securing means for detachable cooling or heating arrangements ; fixed by friction, plugs or springs
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
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- H01L33/486—Containers adapted for surface mounting
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/62—Arrangements for conducting electric current to or from the semiconductor body, e.g. lead-frames, wire-bonds or solder balls
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
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- H01L33/641—Heat extraction or cooling elements characterized by the materials
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/64—Heat extraction or cooling elements
- H01L33/647—Heat extraction or cooling elements the elements conducting electric current to or from the semiconductor body
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2101/00—Articles made by soldering, welding or cutting
- B23K2101/36—Electric or electronic devices
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- H—ELECTRICITY
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/831—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector the layer connector being supplied to the parts to be connected in the bonding apparatus
- H01L2224/83101—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector the layer connector being supplied to the parts to be connected in the bonding apparatus as prepeg comprising a layer connector, e.g. provided in an insulating plate member
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
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- H—ELECTRICITY
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- H01L2933/0008—Processes
- H01L2933/0033—Processes relating to semiconductor body packages
- H01L2933/0075—Processes relating to semiconductor body packages relating to heat extraction or cooling elements
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/64—Heat extraction or cooling elements
- H01L33/642—Heat extraction or cooling elements characterized by the shape
Definitions
- the present invention relates to a light emitting module with a cooler excellent in heat resistance and a method for manufacturing the light emitting module with a cooler.
- the light emitting diode (LED) element is widely used for various light sources due to its long life and stable light emission characteristics.
- the light conversion efficiency of such an LED element is about 20 to 30%, and the remaining 70 to 80% of energy is directly heated by the LED element.
- the LED element is a heat-sensitive device, and a general operation guarantee temperature is about ⁇ 10 to 85 ° C.
- the LED module substrate for mounting the LED element is provided with a heat radiating plate for efficiently diffusing heat generated by the LED element, a cooler for performing heat exchange, and the like. These are the same for not only LEDs but also light emitting elements.
- an insulating layer which is an insulating substrate, and a heat sink are joined by Au—Sn alloy solder due to high thermal conductivity and ease of joining.
- a Cu thin plate is formed on the AlN insulating layer, and the Cu thin plate and the heat sink are joined by Au—Sn alloy solder.
- JP 2008-240007 A Japanese Patent Laying-Open No. 2015-070199 JP 2013-153157 A
- an insulating layer made of ceramics and a heat sink made of metal have greatly different coefficients of thermal expansion.
- Au—Sn alloys have high hardness and poor spreadability. For this reason, when the insulating layer and the heat sink are joined by the Au—Sn alloy, the Au—Sn alloy cannot absorb the difference in thermal expansion between the insulating layer and the heat sink due to the heat generated in the light emitting element. As a result, cracks occurred in the Au—Sn alloy, and there was a concern that the insulating layer and the heat radiating plate were peeled off or the joint portion was damaged.
- the substrate for a light emitting module with a cooler in which a cooler is further connected to the heat sink via thermal grease, etc., increases the thermal resistance due to the presence of a bonding material such as an Au-Sn alloy or thermal grease, resulting in heat dissipation characteristics There is a problem that it is low.
- the present invention has been made in view of the above-described circumstances, and prevents a light-emitting element from being damaged by a heat generation of a light-emitting element and can improve heat dissipation characteristics and a light-emitting module with a cooler and cooling It aims at providing the manufacturing method of a light emitting module with a vessel.
- a light-emitting module with a cooler includes a circuit layer on which a light-emitting element is mounted on one surface side of an insulating layer, and the other surface of the insulating layer.
- the metal layer and the cooler when the metal layer and the cooler are directly bonded, the metal layer is subjected to a thermal cycle by repeatedly turning on and off the light emitting element. It can prevent that the junction part between a layer and a cooler peels or damages. That is, when the insulating layer and the cooler are bonded using a bonding material having a high hardness such as an Au—Sn alloy as in the prior art, the insulating layer and the cooler cannot be absorbed without absorbing the stress caused by the difference in thermal expansion coefficient.
- the metal layer disposed between the insulating layer and the cooler and the cooler are directly joined using a brazing material or the like, so that the cooler And the metal layer are firmly bonded, and peeling at the bonded portion can be reliably prevented.
- the circuit layer so as to have a thickness of 0.1 mm or less, a circuit pattern for mounting a light emitting element can be formed finely.
- the thickness of the circuit layer exceeds 0.1 mm, the stress buffering effect cannot be obtained unless the thickness of the metal layer serving as the stress buffer layer is increased to, for example, 0.6 mm or more, and the stress applied to the ceramics. Increases and ceramic cracks occur.
- A: B is 1:20. It is characterized by being within a range of ⁇ 1: 400.
- the thermal resistance increases as A: B is less than 1:20, that is, as the area of one surface of the insulating layer becomes smaller than the area of the light-emitting element.
- the warpage of the light emitting module with a cooler increases as A: B exceeds 1: 400, that is, as the area of one surface of the insulating layer becomes larger than the area of the light emitting element.
- A: B within the range of 1:20 to 1: 400, heat generated by lighting of the light emitting element can be efficiently propagated toward the cooler, and the cooler has excellent cooling performance.
- An attached light emitting module can be realized.
- a light emitting element mounting portion corresponding to the area of the light emitting element may be formed on one surface of the circuit layer. The size of the light emitting element to be mounted may be determined by the light emitting element mounting portion.
- the warpage amount at + 25 ° C. to + 175 ° C. of the element mounting surface for bonding the light emitting element to the circuit layer is 5 ⁇ m / 10 mm or less. .
- a metal block that increases the heat capacity of the cooler is directly bonded to the cooler.
- the heat capacity of the cooler can be increased, the heat propagated from the metal layer can be absorbed more efficiently, and the cooling capacity of the cooler can be further enhanced.
- the said cooler is provided with the recessed part which can engage
- the side surface along the thickness direction of the metal layer is also in contact with the cooler, so that the cooling characteristics by the cooler are enhanced.
- the side surface along the thickness direction of the metal layer is also fixed in contact with the cooler, so that the strength of the light emitting module substrate with a cooler can be increased. it can.
- the circuit layer and the light emitting element are bonded via an Ag layer.
- Ag with a low electrical resistance for joining the circuit layer and the light emitting element, the circuit layer and the light emitting element can be reliably joined and the electrical resistance between the circuit layer and the light emitting element can be reduced.
- the circuit layer and the light emitting element are bonded via an Au—Sn alloy layer.
- an Au—Sn alloy having a low electrical resistance and a high hardness for joining the circuit layer and the light emitting element, the circuit layer and the light emitting element are securely joined, and the electrical resistance between the circuit layer and the light emitting element. Can be reduced.
- a circuit layer on which a light-emitting element is mounted is formed on one surface side of an insulating layer, and a metal layer is formed on the other surface side of the insulating layer.
- the cooler and the metal layer are strengthened by including a step of directly joining the metal layer and the cooler using a brazing material or the like. It becomes possible to manufacture a substrate for a light emitting module with a cooler that is bonded and can reliably prevent peeling at the bonded portion.
- the joining step is a step of joining the metal layer and the cooler using an Al—Si brazing material.
- an Al-Si brazing material for direct bonding between the metal layer and the cooler, the diffusibility of the brazing material is increased at each joint surface of the metal layer and the cooler, making the metal layer and the cooler extremely strong. It becomes possible to bond directly to
- a light emitting module substrate with a cooler, a light emitting module, and a light emitting module substrate with a cooler capable of preventing a joint portion from being damaged by heat generation of a light emitting element and improving heat dissipation characteristics.
- a manufacturing method can be provided.
- FIG. 1 is a cross-sectional view showing a light emitting module (LED module) according to a first embodiment of the present invention.
- FIG. 2 is a plan view showing the LED module of the first embodiment of the present invention.
- the LED module 10 includes a light emitting element 11 (LED element 11) and an LED module substrate 20 with a cooler.
- the light emitting element 11 can be an LED element, a laser diode element, a semiconductor laser element, or the like. In the present embodiment, an LED element is used as the light emitting element 11.
- the LED module substrate 20 with a cooler includes an insulating layer 31 which is an insulating substrate, a circuit layer 32 stacked on one surface (one surface) side 31 a of the insulating layer 31, and the other surface of the insulating layer 31 ( The metal layer 33 laminated
- the insulating layer 31 is made of ceramics such as Si 3 N 4 (silicon nitride), AlN (aluminum nitride), and Al 2 O 3 (alumina), which are excellent in insulation and heat dissipation.
- the insulating layer 31 is made of AlN.
- the thickness of the insulating layer 31 is set within a range of 0.2 to 1.5 mm, for example, and is set to 0.635 mm in this embodiment.
- the circuit layer 32 is a conductive plate that is electrically connected to the LED element 11 and is formed of aluminum, copper, or an alloy thereof having excellent conductivity.
- the circuit layer 32 is made of an aluminum plate having a purity of 99.0 mass% or more.
- the thickness of the circuit layer 32 is formed to be 0.1 mm or less. If the thickness of the circuit layer 32 exceeds 0.1 mm, the circuit pattern for mounting the LED element cannot be formed finely. Further, unless the thickness of the metal layer 33 to be described later as a stress buffer layer is increased to, for example, 0.6 mm or more, the stress buffer effect is insufficient, the stress applied to the ceramic increases, and ceramic cracks occur.
- the thickness of the circuit layer 32 is preferably 0.01 mm or more and 0.09 mm or less, and more preferably 0.01 mm or more and 0.07 mm or less, but is not limited thereto.
- the element mounting surface 32a for joining the LED element 11 to the circuit layer 32 has a warp amount of 5 ⁇ m / 10 mm or less (a warp amount per 10 mm length of 5 ⁇ m or less) in a temperature range of + 25 ° C. to + 175 ° C. Is formed.
- the warpage amount of the element mounting surface 32a of the circuit layer 32 is set to 5 ⁇ m / 10 mm or less, and the bending stress applied to the LED element 11 is suppressed in the temperature range of + 25 ° C.
- the warpage amount in the range of + 25 ° C. to + 175 ° C. of the element mounting surface 32a is preferably 0 ⁇ m / 10 mm or more and 3 ⁇ m / 10 mm or less, but is not limited thereto.
- the amount of warping after bonding to the element mounting surface 32a side using a jig that forms a concave shape at the time of bonding and cooling to room temperature is set. Try to be within range.
- the insulating layer 31 and the circuit layer 32 are directly joined using a brazing material.
- the brazing material include an Al—Cu based brazing material and an Al—Si based brazing material.
- an Al—Si brazing material is used.
- the circuit layer 32 can be formed with a predetermined circuit pattern by, for example, etching after bonding a conductive metal plate to the insulating layer 31 with a brazing material.
- the metal layer 33 is made of aluminum or an aluminum alloy.
- a plate-like member made of high-purity aluminum having a purity of 99.98 mass% or more is used as the metal layer 33.
- the thickness of this metal layer 33 should just be 0.4 mm or more and 2.5 mm or less, for example.
- the metal layer 33 functions as a stress buffer layer. That is, the formation of the metal layer 33 absorbs thermal stress caused by the difference in thermal expansion coefficient between the insulating layer 31 made of ceramics and the cooler 21 made of aluminum or aluminum alloy, and prevents the insulating layer 31 from being damaged. Can do.
- the thickness of the metal layer 33 is preferably 0.6 mm or more and 2.0 mm or less, and more preferably 0.9 mm or more and 1.6 mm or less, but is not limited thereto.
- the metal layer 33 is formed of high-purity aluminum having a purity of 99.98 mass% or more, the deformation resistance is reduced, and the insulating layer 31 is subjected to a thermal cycle by repeatedly turning on and off the LED element 11. The generated thermal stress can be effectively absorbed by the metal layer 33.
- the insulating layer 31 and the metal layer 33 are directly joined using a brazing material.
- the brazing material include an Al—Cu based brazing material and an Al—Si based brazing material.
- an Al—Si brazing material is used.
- the cooler 21 is a member that cools heat generated by light emission of the LED element 11 by positive heat exchange, for example, by circulating a refrigerant such as gas or liquid in the flow path. And fins for increasing the surface area in contact with the refrigerant. For this reason, it is set as the member formed in the shape suitable for heat exchange rather than a simple plate-shaped heat sink.
- the cooler 21 includes a top plate portion 22 and a plurality of fins 23 formed on the other surface 22b of the top plate portion 22.
- the fins 23 are plate-like members arranged at a predetermined interval from each other.
- Such a cooler 21 is a so-called air-cooled cooler that efficiently cools the heat generated by light emission of the LED element 11 when air as a refrigerant flows through the gaps (flow paths) between the fins 23. is there.
- the cooler 21 may be, for example, a so-called water-cooled cooler in which a plurality of channels for circulating cooling water, for example, are integrally formed on the top plate portion 22.
- the top plate 22 and the fins 23 constituting the cooler 21 are made of, for example, aluminum or an aluminum alloy. Specific examples include A3003, A1050, 4N-Al, A6063, and the like. In this embodiment, a rolled plate of A1050 is used.
- the top plate portion 22 and the fins 23 may be configured as an integral member, or may be configured such that a plurality of fins 23 are joined to the other surface 22b of the top plate portion 22 with a brazing material or the like. .
- the top plate portion 22 and the plurality of fins 23 may be formed using materials having different Al compositions.
- the top plate portion 22 may be configured by A3003, and the plurality of fins 23 may be configured by A1050.
- the metal layer 33 and the one surface 22a of the top plate portion 22 are directly joined to each other.
- direct bonding using an Al—Si brazing material can be applied.
- an Al—Si brazing filler metal for example, an Al—Si brazing foil is disposed between the metal layer 33 and the one surface 22a of the top plate portion 22 and heated at about 640 ° C.
- the Al—Si brazing material diffuses into the metal layer 33 and the top plate portion 22, and the metal layer 33 and the top plate portion 22 are directly joined.
- the direct bonding is bonding by brazing, and it is preferable that a eutectic structure is formed at the bonding interface.
- joining is performed by brazing using an Al—Si brazing material and a flux containing F (fluorine), for example, a flux mainly composed of KAlF 4. You can also When the flux is used, it is not necessary to remove the oxide film between the metal layer 33 and the top plate portion 22 at the time of joining.
- F fluorine
- bonding can be performed by fluxless brazing in which brazing is performed using an Al—Si—Mg brazing material in a nitrogen atmosphere. .
- the LED module 10 is obtained by mounting the LED element 11 on the cooler-equipped LED module substrate 20 having the above-described configuration.
- the Ag layer 19 is made of, for example, a sintered body of Ag powder.
- the Ag bonding layer 19 includes two layers, an Ag bonding layer 19A and an Ag fired layer 19B.
- the Ag fired layer 19B is preferably obtained by applying a paste made of Ag powder and glass powder on the circuit layer 32, drying, and firing.
- the Ag bonding layer 19A may be sintered at 300 ° C. or lower. For example, a paste made of nano Ag powder is applied, sintered, and joined.
- A: B is in the range of 1:20 to 1: 400. Yes.
- the thermal resistance increases as A: B is less than 1:20, that is, the area of one surface of the insulating layer 31 is smaller than the area of the LED element 11.
- the warpage of the LED module with a cooler increases as A: B exceeds 1: 400, that is, as the area of one surface of the insulating layer 31 becomes larger than the area of the LED element 11. Therefore, by setting A: B within the range of 1:20 to 1: 400, the heat generated by the lighting of the LED element 11 can be efficiently propagated toward the cooler 21, and the cooling performance is excellent.
- the LED module 10 with a cooler can be realized.
- A: B is preferably 1:30 to 1: 200, more preferably 1:50 to 1: 150, but is not limited thereto.
- the area A of the LED element 11 is the sum total of the area of each LED element 11 joined.
- a light emitting element mounting portion corresponding to the area A of the LED element 11 may be formed on one surface of the circuit layer 32. The size of the light emitting element 11 to be mounted may be determined by the light emitting element mounting portion.
- the LED layer 11 can be turned on and off by directly joining the metal layer 33 and the cooler 21. It is possible to prevent the joint between the metal layer 33 and the cooler 21 from being peeled off or damaged when a repetitive cooling cycle is applied.
- the insulating layer and the cooler are bonded using a bonding material having a high hardness such as an Au—Sn alloy as in the prior art, the insulating layer and the cooler cannot be absorbed without absorbing the stress caused by the difference in thermal expansion coefficient.
- the metal layer 33 disposed between the insulating layer 31 and the cooler 21 and the cooler are directly bonded using a brazing material or the like.
- the cooler 21 and the metal layer 33 are firmly bonded, and peeling at the bonded portion can be reliably prevented.
- the metal layer 33 serving as a stress buffer layer between the insulating layer 31 and the cooler 21
- the thermal stress generated in the insulating layer 31 can be effectively absorbed by the metal layer 33. Cracks and cracks can be prevented from occurring.
- FIG. 3 is a cross-sectional view showing the LED module of the second embodiment of the present invention.
- symbol is attached
- the LED module 40 of the second embodiment includes the light emitting element 11 (LED element 11) and the LED module substrate 20 with a cooler.
- the LED module substrate 20 with a cooler includes an insulating layer 31 that is an insulating substrate, a circuit layer 44 laminated on one surface (one surface) side 31a of the insulating layer 31, and the other surface ( The metal layer 33 and the cooler 21 are sequentially stacked on the other surface) side 31b.
- the LED element 11 is bonded (mounted) to a circuit layer 44 made of a Cu plate via an Au—Sn alloy layer 43. That is, the circuit layer 44 of this embodiment is formed of a copper plate with high adhesion to the Au—Sn alloy layer 43.
- the Au—Sn alloy layer 43 is formed by melting Au—Sn alloy solder (for example, Au-20 mass% Sn) at about 330 ° C.
- the circuit layer 44 can be a copper plate having a thickness of about 40 to 85 ⁇ m.
- the metal layer 33 disposed between the insulating layer 31 and the cooler 21 having greatly different thermal expansion coefficients and the cooler 21 are made of, for example, Si—Al brazing material.
- the LED element 11 is bonded to the circuit layer 44 using the Au—Sn alloy layer 43 having a high hardness, but the bonding portion of the LED element 11 has a small area, Since the influence of thermal stress due to the difference in thermal expansion coefficient from the circuit layer 44 side is small, there is little risk of damage to the Au—Sn alloy layer 43 due to the load of the thermal cycle.
- FIG. 4 is a cross-sectional view showing the LED module of the third embodiment of the present invention.
- FIG. 5 is a plan view showing the LED module of the third embodiment of the present invention.
- symbol is attached
- the LED module 50 according to the third embodiment includes the LED element 11 and the LED module substrate 20 with a cooler.
- This LED module substrate 20 with a cooler includes an insulating layer 31 that is an insulating substrate, a circuit layer 32 laminated on one surface (one surface) side 31a of the insulating layer 31, and the other surface of the insulating layer 31.
- the metal layer 33 and the cooler 21 are sequentially laminated on the (other surface) side 31b.
- the metal block 55 is bonded to the outside of the area where the metal layer 33 is directly bonded on the one surface 22a of the top plate portion 22 of the cooler 21 that is directly bonded to the metal layer 33. ing. Similar to the cooler 21, the metal block 55 is made of aluminum or an aluminum alloy. By joining such a metal block 55 to the one surface 22a of the cooler 21, the heat capacity of the cooler 21 can be increased. Therefore, the heat generated by lighting the LED element 11 can be absorbed more efficiently, and the cooling capacity of the cooler 21 can be further enhanced.
- One surface 22a of the cooler 21 and the metal block 55 are joined by direct joining.
- the cooler 21 and the metal block 55 are directly joined using an Al—Si brazing material.
- the cooler 21 and the metal block 55 are directly joined by brazing using a flux containing KAlF 4 as a main component, or by fluxless brazing using an Al—Si—Mg based brazing material in a nitrogen atmosphere. It can also be joined directly.
- FIG. 6 is a cross-sectional view showing an LED module according to a fourth embodiment of the present invention.
- the LED module 60 of the fourth embodiment includes the LED element 11 and the LED module substrate 20 with a cooler.
- This LED module substrate 20 with a cooler includes an insulating layer 31 that is an insulating substrate, a circuit layer 32 laminated on one surface (one surface) side 31a of the insulating layer 31, and the other surface of the insulating layer 31.
- the metal layer 33 and the cooler 61 are sequentially stacked on the (other surface) side 31b.
- the cooler 61 is formed with a recess 65 into which at least a part of the metal layer 33 can be fitted. That is, the cooler 61 includes a top plate portion 62 and a plurality of fins 63 formed on the top plate portion 62. The cooler 61 has a recess 65 so as to be dug down from one surface 62 a of the top plate portion 62 toward the fin 63. Is formed.
- Such a recess 65 may be formed in a size that can accommodate at least a part of the metal layer 33.
- the recess 65 is formed to a depth that can be accommodated up to the vicinity of the joint surface between the metal layer 33 and the insulating layer 31.
- the concave portion 65 is formed such that the side surface thereof is in contact with the side surface along the thickness direction of the metal layer 33.
- the side surface along the thickness direction of the metal layer 33 is also in contact with the cooler 61, so that the cooling characteristics of the cooler 61 are further enhanced. Further, by accommodating the side of the metal layer 33 in contact with the recess 65, the metal layer 33 is more stably fixed to the cooler 61, and the strength of the LED module substrate 20 with the cooler can be increased. .
- Drawing 7 is a sectional view showing an example of a manufacturing method of a LED module with a cooler in steps.
- the circuit layer 32 is joined to one surface (one surface) side 31a of the insulating layer 31, and the other surface (the other surface) of the insulating layer 31.
- a metal layer 33 is bonded to the side 31b (see FIG. 7A).
- 4N—Al having a thickness of about 0.1 mm can be used as the circuit layer 32
- 4N—Al having a thickness of about 0.9 mm can be used as the metal layer 33.
- the brazing material foil F is arranged between the insulating layer 31 and the circuit layer 32 and between the insulating layer 31 and the metal layer 33, and the brazing material foil is pressed while pressing this laminate in the laminating direction. Heat to F melting temperature.
- the brazing material foil F for example, an Al—Si based brazing material can be used. What is necessary is just to set the heating temperature at the time of joining to 640 degreeC, for example. As a result, the circuit layer 32 and the metal layer 33 are directly bonded to the insulating layer 31.
- the brazing filler metal foil F is disposed between the metal layer 33 and the cooler 21 made of Al or Al alloy, and the laminate is heated in the laminating direction and heated to the melting temperature of the brazing filler metal foil F.
- the brazing material foil F for example, an Al—Si based brazing material can be used. What is necessary is just to set the heating temperature at the time of joining to 640 degreeC, for example. Thereby, the metal layer 33 and the cooler 21 are directly joined (joining process: refer FIG.7 (b)).
- the metal layer 33 and the cooler 21 are directly joined by brazing using a flux mainly composed of KAlF 4 or by fluxless brazing using an Al—Si—Mg based brazing material in a nitrogen atmosphere. It can also be joined directly.
- a glass-containing Ag paste is applied to the circuit layer 32 and fired at 567 ° C. to 620 ° C. to form an Ag fired layer 19B made of an Ag sintered body (see FIG. 7C).
- the glass-containing Ag paste contains an Ag powder, a glass powder, a resin, a solvent, and a dispersant, and the content of the powder component composed of the Ag powder and the glass powder is the total amount of the glass-containing Ag paste.
- the paste is 60% by mass or more and 90% by mass or less, and the remainder is a resin, a solvent, or a dispersant.
- Ag powder having a particle size of 0.05 ⁇ m to 1.0 ⁇ m can be used.
- the glass powder contains, for example, one or more of lead oxide, zinc oxide, silicon oxide, boron oxide, phosphorus oxide, and bismuth oxide, and a softening temperature of 600 ° C. or lower is used. Can do.
- the weight ratio A / G between the weight A of the Ag powder and the weight G of the glass powder is preferably in the range of 80/20 to 99/1.
- the LED module substrate 20 with a cooler shown in FIG. 1 can be obtained.
- the light emitting element 11 in this embodiment, the LED element 11
- the LED element 11 is mounted on the circuit layer 32 of the LED module substrate 20 with a cooler, for example, Ag containing Ag particles having a particle diameter of 50 nm to 350 nm is used.
- the LED element 11 can be mounted on the Ag fired layer 19B via the Ag bonding layer 19A. In this case, the LED element 11 is bonded to the circuit layer 32 via the Ag layer 19.
- Example 1 A 4N-Al plate (thickness 0.1 mm) is bonded to one side of an AlN substrate 10 mm ⁇ 10 mm (insulating layer) having a thickness of 1.0 mm, and the other side of the AlN substrate (insulating layer) is A 4N—Al plate (thickness 1.5 mm) was joined. The bonding was performed by melting at 640 ° C. using an Al—Si brazing foil and directly bonding. Thereafter, a circuit for an LED element was formed by etching on the surface of the 4N—Al plate bonded to one side of the AlN substrate to form a circuit layer.
- a cooler (A1050) made of Al was directly bonded to the surface of the 4N—Al plate (metal layer) bonded to the other surface side of the AlN substrate.
- Al—Si brazing foil was melted at 610 ° C. and directly bonded.
- the glass-containing Ag paste described in the above embodiment was applied to the circuit layer and fired at 500 ° C. to form an Ag fired layer.
- the LED element was bonded to the circuit layer at 200 ° C. using the Ag paste described in the above embodiment. This obtained the LED module of Example 1 (equivalent to the structure of 1st embodiment).
- Example 2 A Cu thin plate (thickness 0.05 mm) is placed on one side of an AlN substrate (insulating layer) having a thickness of 1.0 mm, and an AlN substrate (insulating layer) 820 using an active metal brazing material (Ag—Cu—Ti). After joining at 0 ° C., a 4N—Al plate (thickness 1.5 mm) was melted at 640 ° C. using an Al—Si based brazing foil and joined directly to the other surface side. Thereafter, a circuit for an LED element was formed by etching on the surface of the Cu thin plate bonded to one surface side of the AlN substrate to form a circuit layer.
- an active metal brazing material Alg—Cu—Ti
- a cooler (A1050) made of Al was directly bonded to the surface of the 4N—Al plate (metal layer) bonded to the other surface side of the AlN substrate.
- an Al—Si—Mg based brazing foil was melted at 610 ° C. in a nitrogen atmosphere and directly bonded.
- the LED element was bonded to the circuit layer at 330 ° C. using Au—Sn alloy solder. This obtained the LED module of Example 2 (equivalent to the structure of 2nd embodiment).
- Example 3 An Ag-Pd thick film circuit (with a thickness of 0.1 mm) is printed on one side of an AlN substrate (insulating layer) having a thickness of 1.0 mm by printing an Ag-Pd thick film paste and drying it at 850 ° C. in the air. 01Nm), 4N-Al plate (thickness 1.5mm) is melted at 640 ° C and directly joined to the other side of the AlN substrate (insulating layer) using an Al-Si brazing foil, It was set as the board
- the Ag paste described in the above embodiment was applied on the circuit layer, LED elements were mounted on the applied Ag paste, and the LED elements were bonded to the circuit layer by sintering them at 200 ° C. This obtained the LED module of Example 3 (equivalent to the structure of 3rd embodiment).
- Example 4 After forming a Cu thin film circuit (thickness 0.005 mm) on one surface side of an AlN substrate (insulating layer) having a thickness of 1.0 mm by plating after sputtering, a 4N-Al plate (thickness) is formed on the other surface side. 1.5 mm) was melted at 640 ° C. using an Al—Si brazing foil and directly joined. Thereafter, a circuit for an LED element was formed by etching on the surface of the Cu thin plate bonded to one side of the AlN substrate to form a circuit layer.
- a cooler (A1050) having a dug portion (concave portion) made of Al was directly joined to the surface of the 4N—Al plate (metal layer) joined to the other surface side of the AlN substrate.
- an Al—Si—Mg based brazing foil was melted at 610 ° C. in a nitrogen atmosphere and directly bonded.
- the LED element was bonded to the circuit layer at 330 ° C. using Au—Sn alloy solder. This obtained the LED module of Example 4 (equivalent to the structure of 4th embodiment).
- Example 5 The LED module of Example 5 was obtained by changing the shape of the AlN substrate to 5 mm ⁇ 4 mm in Example 1.
- Example 6 The LED module of Example 6 was obtained by changing the shape of the AlN substrate to 20 mm ⁇ 20 mm in Example 1.
- a 4N-Al plate (thickness 0.2 mm) is bonded to one side of an AlN substrate (3 mm ⁇ 3 mm) (insulating layer) having a thickness of 1.0 mm, and the other side of the AlN substrate (insulating layer) is joined.
- a 4N—Al plate (thickness 1.5 mm) was bonded to the substrate. The bonding was performed by melting at 640 ° C. using an Al—Si brazing foil and directly bonding. Thereafter, a circuit for an LED element was formed by etching on the surface of the 4N—Al plate bonded to one side of the AlN substrate to form a circuit layer.
- a cooler (A1050) made of Al was directly bonded to the surface of the 4N—Al plate (metal layer) bonded to the other surface side of the AlN substrate.
- Al—Si brazing foil was melted at 610 ° C. and directly bonded.
- the glass-containing Ag paste described in the above embodiment was applied to the circuit layer and fired at 500 ° C. to form an Ag fired layer.
- the LED element was bonded to the circuit layer at 200 ° C. using the Ag paste described in the above embodiment. This obtained the LED module of the comparative example 3.
- Comparative Example 4 In Comparative Example 3, the shape of AlN was changed to 30 mm ⁇ 30 mm to obtain an LED module of Comparative Example 4.
- the initial bonding area is the area to be bonded before bonding, that is, the area of the element in the case of evaluating the element / circuit layer junction, and the metal layer in the case of evaluating the metal layer / cooler junction.
- the area. In an image obtained by binarizing an ultrasonic flaw detection image, peeling is indicated by a white portion, and thus the area of the white portion is defined as a peeling area.
- Bonding area (%) ⁇ (initial bonding area) ⁇ (peeling area) ⁇ / (initial bonding area) ⁇ 100
- Thermal resistance When the fin of the cooler of the LED module is cooled by a fan, a current is passed through the LED element so as to generate a heating value of 16 W, and when the difference between the temperature of the LED element and the ambient temperature (ambient temperature) is ⁇ T, ⁇ T (° C.) / Heat generation amount (W) was defined as the value of thermal resistance.
- the applied voltage was 12 V
- the element temperature was 70 ° C.
- the temperature was measured with a thermo viewer in a steady state after 5 minutes.
- warp The maximum warpage when the LED module was heated from + 25 ° C. to + 175 ° C. was measured with a thermometer manufactured by Akrotrix, and the amount of warpage per 10 mm was measured. The measurement was performed on the circuit layer, and the warpage was the warpage of the circuit layer.
- Comparative Example 1 using grease without directly joining the metal layer and the cooler has high thermal resistance
- Comparative Example 2 using soldering has lowered the joining property of the metal layer / cooler joint.
- Comparative Example 3 in which A: B is less than 1:20 and 1: 9 when the area of the LED element is A and the area of one surface of the insulating layer is B the thermal resistance is increased.
- Comparative Example 4 in which A: B exceeded 1: 400 and 1: 900 the amount of warpage was large.
- the method for manufacturing a light emitting module with a cooler and a substrate for a light emitting module with a cooler according to the present invention, it is possible to prevent the joining portion from being damaged by the heat generated by the light emitting element and to improve the heat dissipation characteristics.
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Abstract
Description
本願は、2015年9月25日に、日本に出願された特願2015-188346号に基づき優先権を主張し、その内容をここに援用する。
即ち、従来のように絶縁層と冷却器とをAu-Sn合金など硬度の高い接合材料を用いて接合した場合には、熱膨張係数の違いによって生じる応力を吸収できずに絶縁層と冷却器とが剥離することがあったが、本発明のように、絶縁層と冷却器との間に配した金属層と、冷却器とを、ろう材などを用いて直接接合することで、冷却器と金属層と強固に接合され、接合部分での剥離を確実に防止することができる。
また、回路層の厚みを0.1mm以下になるように形成することによって、発光素子搭載用の回路パターンを微細に形成することができる。さらに、回路層の厚さが0.1mmを超えると、応力緩衝層となる金属層の厚みを、例えば0.6mm以上などに厚くしないと応力緩衝効果を得ることができず、セラミックスにかかる応力が増加し、セラミックス割れが発生する。
A:Bが1:20を下回る、すなわち、前記絶縁層の一方の面の面積が発光素子の面積に比べ小さくなるほど、熱抵抗が上昇する。
A:Bが1:400を上回る、すなわち、前記絶縁層の一方の面の面積が発光素子の面積に比べ大きくなるほど、冷却器付発光モジュールの反りが大きくなる。
よって、A:Bが1:20~1:400の範囲内にすることにより、発光素子の点灯によって生じた熱が冷却器に向けて効率よく伝搬させることができ、冷却性能に優れた冷却器付き発光モジュールを実現することができる。
前記回路層の一方の面には、発光素子の面積に対応した発光素子搭載部が形成されていてもよい。前記発光素子搭載部によって、搭載される発光素子のサイズが決定されてもよい。
これによって、発光素子が点灯、消灯を繰り返して温度サイクルが加わっても、発光素子の湾曲による照度の低下や照射範囲の変動を抑制することができる。
こうした金属ブロックを冷却器に接合することによって、冷却器の熱容量を増加させ、金属層から伝搬する熱をより一層効率的に吸収して、冷却器の冷却能力をより一層高めることができる。
冷却器に凹部を形成することによって、金属層の厚み方向に沿った側面も冷却器に接するので、冷却器による冷却特性が高められる。また、凹部に金属層の一部を嵌め込み可能にすることによって、金属層の厚み方向に沿った側面も冷却器に接して固定されるので、冷却器付き発光モジュール用基板の強度を高めることができる。
回路層と発光素子との接合に電気抵抗の低いAgを用いることによって、回路層と発光素子とが確実に接合され、かつ回路層と発光素子との間の電気抵抗を低減することができる。
回路層と発光素子との接合に電気抵抗が低く、硬度の高いAu-Sn合金を用いることによって、回路層と発光素子とが確実に接合され、かつ回路層と発光素子との間の電気抵抗を低減することができる。
第一実施形態の発光モジュール(LEDモジュール)について、図1を参照して説明する。
図1は、本発明の第一実施形態の発光モジュール(LEDモジュール)を示す断面図である。図2は、本発明の第一実施形態のLEDモジュールを示す平面図である。
LEDモジュール10は、発光素子11(LED素子11)と、冷却器付きLEDモジュール用基板20とからなる。
発光素子11は、LED素子、レーザーダイオード素子、半導体レーザー素子等とすることができる。
本実施形態では、発光素子11としてLED素子を用いた。
本実施形態では、絶縁層31は、AlNで構成されている。また、絶縁層31はの厚さは、例えば、0.2~1.5mmの範囲内に設定されており、本実施形態では、0.635mmに設定されている。
なお、冷却器21は、例えば、天板部22に例えば冷却水を流通させる複数の流路を一体に形成した、いわゆる水冷式の冷却器であってもよい。
なお、回路層32に複数個のLED素子11が接合されている場合、LED素子11の面積Aは接合されている各LED素子11の面積の合計である。また、回路層32の一方の面には、LED素子11の面積Aに対応した発光素子搭載部が形成されていてもよい。発光素子搭載部によって、搭載される発光素子11のサイズが決定されてもよい。
第二実施形態の発光モジュール(LEDモジュール)について、図3を参照して説明する。
図3は、本発明の第二実施形態のLEDモジュールを示す断面図である。なお、第一実施形態のLEDモジュールと同一構成の部材には同一の符号を付し、その詳細な構造や作用の説明を省略する。
第二実施形態のLEDモジュール40は、発光素子11(LED素子11)と、冷却器付きLEDモジュール用基板20とからなる。冷却器付きLEDモジュール用基板20は、絶縁性の基板である絶縁層31と、この絶縁層31の一面(一方の面)側31aに積層された回路層44と、絶縁層31の他面(他方の面)側31bに順に積層された金属層33および冷却器21とを有する。
第三実施形態の発光モジュール(LEDモジュール)について、図4を参照して説明する。
図4は、本発明の第三実施形態のLEDモジュールを示す断面図である。図5は、本発明の第三実施形態のLEDモジュールを示す平面図である。なお、第一実施形態のLEDモジュールと同一構成の部材には同一の符号を付し、その詳細な構造や作用の説明を省略する。
第三実施形態のLEDモジュール50は、LED素子11と、冷却器付きLEDモジュール用基板20とからなる。この冷却器付きLEDモジュール用基板20は、絶縁性の基板である絶縁層31と、この絶縁層31の一面(一方の面)側31aに積層された回路層32と、絶縁層31の他面(他方の面)側31bに順に積層された金属層33および冷却器21とを有する。
第四実施形態の発光モジュール(LEDモジュール)について、図6を参照して説明する。
図6は、本発明の第四実施形態のLEDモジュールを示す断面図である。なお、第一実施形態のLEDモジュールと同一構成の部材には同一の符号を付し、その詳細な構造や作用の説明を省略する。
第四実施形態のLEDモジュール60は、LED素子11と、冷却器付きLEDモジュール用基板20とからなる。この冷却器付きLEDモジュール用基板20は、絶縁性の基板である絶縁層31と、この絶縁層31の一面(一方の面)側31aに積層された回路層32と、絶縁層31の他面(他方の面)側31bに順に積層された金属層33および冷却器61とを有する。
本発明の冷却器付きLEDモジュールの製造方法の一例を説明する。
図7は、冷却器付きLEDモジュールの製造方法の一例を段階的に示した断面図である。
本発明の冷却器付きLEDモジュールを製造する際には、まず、絶縁層31の一面(一方の面)側31aに回路層32を接合し、また、絶縁層31の他面(他方の面)側31bに金属層33を接合する(図7(a)参照)。回路層32としては、例えば、厚みが0.1mm程度の4N-Alを、また、金属層33としては例えば、厚みが0.9mm程度の4N-Alを用いることができる。
なお、この冷却器付きLEDモジュール用基板20の回路層32に発光素子11(本実施形態においては、LED素子11)を実装する際には、例えば、粒径50nm~350nmのAg粒子を含むAgペーストをLED素子11とAg焼成層19Bの間に介在させ、200℃~300℃で焼成することでAg焼成層19B上にAg接合層19Aを介してLED素子11を実装することができる。この場合、LED素子11はAg層19を介して回路層32に接合している。
[実施例1]
厚み1.0mmのAlN基板10mm×10mm(絶縁層)の一方の面側に、4N-Al板(厚み0.1mm)を接合し、また、AlN基板(絶縁層)の他方の面側に、4N-Al板(厚み1.5mm)を接合した。接合には、Al-Si系ろう材箔を用いて640℃で溶融させ直接接合した。その後、AlN基板の一面側に接合した4N-Al板の表面に、エッチングによりLED素子用の回路を形成して回路層とした。次に、AlN基板の他方の面側に接合した4N-Al板(金属層)の表面に、Alからなる冷却器(A1050)を直接接合した。接合には、Al-Si系ろう材箔を用いて610℃で溶融させ直接接合した。さらに、回路層に上記実施形態に記載したガラス含有Agペーストを塗布し500℃で焼成し、Ag焼成層を形成した。その後、LED素子を上記実施形態に記載したAgペーストを用いて200℃で回路層に接合した。これにより、実施例1のLEDモジュールを得た(第一実施形態の構成に相当)。
厚み1.0mmのAlN基板(絶縁層)の一方の面側に、Cu薄板(厚み0.05mm)を、活性金属ろう材(Ag-Cu-Ti)を用いてAlN基板(絶縁層)に820℃で接合した後、他方の面側に、4N-Al板(厚み1.5mm)をAl-Si系ろう材箔を用いて640℃で溶融させ直接接合した。その後、AlN基板の一方の面側に接合したCu薄板の表面に、エッチングによりLED素子用の回路を形成して回路層とした。次に、AlN基板の他方の面側に接合した4N-Al板(金属層)の表面に、Alからなる冷却器(A1050)を直接接合した。接合には、Al-Si-Mg系ろう材箔を用いて、610℃で窒素雰囲気中で溶融させ直接接合した。さらに、LED素子をAu-Sn合金はんだを用いて330℃で回路層に接合した。これにより、実施例2のLEDモジュールを得た(第二実施形態の構成に相当)。
厚み1.0mmのAlN基板(絶縁層)の一方の面側に、Ag-Pd厚膜ペーストを印刷し、乾燥後850℃で大気中で焼成することでAg-Pd厚膜回路(厚み0.01mm)を形成した後、AlN基板(絶縁層)の他方の面側に、4N-Al板(厚み1.5mm)をAl-Si系ろう材箔を用いて640℃で溶融させ直接接合し、LEDモジュール用基板とした。その後、冷却器上にAl-Si系ろう材箔を介して、LEDモジュール用基板の金属層を冷却器に向けて積層するとともに、Al-Si系ろう材箔を介して金属ブロック(A6063合金、厚さ2.5mm)を積層し、610℃で接合した。さらに、上記実施形態に記載したAgペーストを回路層上に塗布し、塗布したAgペースト上にLED素子を搭載し、それらを200℃で焼結させることでLED素子を回路層に接合した。これにより、実施例3のLEDモジュールを得た(第三実施形態の構成に相当)。
厚み1.0mmのAlN基板(絶縁層)の一方の面側に、Cu薄膜回路(厚み0.005mm)をスパッタ後にめっきすることにより形成した後、他方の面側に、4N-Al板(厚み1.5mm)をAl-Si系ろう材箔を用いて640℃で溶融させ直接接合した。その後、AlN基板の一面側に接合したCu薄板の表面に、エッチングによりLED素子用の回路を形成して回路層とした。次に、AlN基板の他方の面側に接合した4N-Al板(金属層)の表面に、Alからなる掘り込み部(凹部)を有する冷却器(A1050)を直接接合した。接合には、Al-Si-Mg系ろう材箔を用いて、610℃で窒素雰囲気中で溶融させ直接接合した。さらに、LED素子をAu-Sn合金はんだを用いて330℃で回路層に接合した。これにより、実施例4のLEDモジュールを得た(第四実施形態の構成に相当)。
実施例1でAlN基板の形状を5mm×4mmに変更して、実施例5のLEDモジュールを得た。
実施例1でAlN基板の形状を20mm×20mmに変更して、実施例6のLEDモジュールを得た。
厚み1.0mmのAlN基板(絶縁層)の両面に、Cu薄板(厚み0.05mm)を、活性金属ろう材(Ag-Cu-Ti)を用いてAlN基板(絶縁層)に820℃で接合した。その後、AlN基板の一方の面側に接合したCu薄板の表面に、エッチングによりLED素子用の回路を形成して回路層とした。次に、LED素子をAu-Sn合金はんだを用いて330℃で回路層に接合した。これを冷却器にグリース(信越シリコーン製G-747)を用いて取り付け、比較例1のLEDモジュールを得た。
厚み1.0mmのAlN基板(絶縁層)の両面に、Cu薄板(厚み0.05mm)を、活性金属ろう材(Ag-Cu-Ti)を用いてAlN基板(絶縁層)に820℃で接合した。その後、AlN基板の一方の面側に接合したCu薄板の表面に、エッチングによりLED素子用の回路を形成して回路層とした。次に、LED素子をAu-Sn合金はんだを用いて330℃で回路層に接合した。これを冷却器にSn-Ag-Cuはんだを用いて接合し、比較例2のLEDモジュールを得た。
厚み1.0mmのAlN基板(3mm×3mm)(絶縁層)の一方の面側に、4N-Al板(厚み0.2mm)を接合し、また、AlN基板(絶縁層)の他方の面側に、4N-Al板(厚み1.5mm)を接合した。接合には、Al-Si系ろう材箔を用いて640℃で溶融させ直接接合した。その後、AlN基板の一方の面側に接合した4N-Al板の表面に、エッチングによりLED素子用の回路を形成して回路層とした。次に、AlN基板の他方の面側に接合した4N-Al板(金属層)の表面に、Alからなる冷却器(A1050)を直接接合した。接合には、Al-Si系ろう材箔を用いて610℃で溶融させ直接接合した。さらに、回路層に上記実施形態に記載したガラス含有Agペーストを塗布し500℃で焼成し、Ag焼成層を形成した。その後、LED素子を上記実施形態に記載したAgペーストを用いて200℃で回路層に接合した。これにより、比較例3のLEDモジュールを得た。
比較例3でAlNの形状を30mm×30mmに変更して、比較例4のLEDモジュールを得た。
上述した実施例1~実施例6および比較例1~比較例4のそれぞれのLEDモジュールを用いて、温度サイクル後の接合性、熱抵抗、反りを評価した。
(温度サイクル後の接合性)
温度サイクル試験は、各LEDモジュールに対し、-40℃にて30分と+175℃にて30分の温度サイクルを気相温度サイクル試験機(エスペック社製TSD-100)にて2000サイクル行った。2000サイクル後、素子/回路層接合部及び金属層/冷却器接合部の接合性を超音波検査装置(日立建機社製FineSAT FS200)で、以下の接合面積を表す式から接合面積を算出し、評価した。ここで、初期接合面積とは、接合前における接合すべき面積、すなわち、素子/回路層接合部の評価の場合は素子の面積、金属層/冷却器接合部の評価の場合は、金属層の面積とした。超音波探傷像を二値化処理した画像において剥離は白色部で示されることから、この白色部の面積を剥離面積とした。
接合面積(%)={(初期接合面積)-(剥離面積)}/(初期接合面積)×100
サイクル後の接合面積がサイクル前の接合面積の60%未満である場合をC、60%以上80%未満である場合をB、80%以上の場合をAと評価した。
(熱抵抗)
LEDモジュールの冷却器のフィンをファンで冷却するとともに、LED素子に16Wの発熱量となるよう電流を流し、その際のLED素子の温度と雰囲気温度(周囲温度)の差をΔTとしたとき、ΔT(℃)/発熱量(W)を熱抵抗の値とした。なお、印加電圧:12V、素子温度:70℃、温度はサーモビューアで、5分後の定常状態で測定した。
(反り)
LEDモジュールを+25℃から+175℃まで加熱した際の最大反りをAkrometrix社製サーモレイで測定し、10mm当たりの反り量を測定した。測定は回路層上から行い、反りは回路層の反りとした。 これらの評価結果を表1に示す。
また、LED素子の面積をAとし、絶縁層の一方の面の面積をBとしたときのA:Bが1:20を下回る、1:9とした比較例3では、熱抵抗が大きくなった。また、A:Bが1:400を上回る、1:900とした比較例4では、反り量が大きくなった。
一方、金属層と冷却器が直接接合され、A:Bが1:20~1:400の範囲内とされた実施例1~実施例6では、熱抵抗や反りが小さく、接合性に優れたLEDモジュールが得られることが確認された。
11 LED素子
20 冷却器付きLEDモジュール用基板
21 冷却器
31 絶縁層
32 回路層
33 金属層
Claims (8)
- 絶縁層の一方の面側に、発光素子が搭載される回路層が形成され、前記絶縁層の他方の面側に金属層と冷却器とが順に積層されてなる冷却器付き発光モジュールであって、
前記回路層は銅、銅合金、アルミニウム、アルミニウム合金のいずれかからなり、かつ厚みが0.1mm以下であり、
前記金属層および前記冷却器はアルミニウムまたはアルミニウム合金からなり、
前記発光素子の面積:前記絶縁層の一方の面の面積が1:20~1:400の範囲内とされ、
前記金属層と前記冷却器とが直接接合されていることを特徴とする冷却器付き発光モジュール。 - 前記回路層に発光素子を接合させる素子搭載面の+25℃~+175℃における反り量が5μm/10mm以下であることを特徴とする請求項1に記載の冷却器付き発光モジュール。
- 前記冷却器には、前記冷却器の熱容量を増加させる金属ブロックが直接接合されていることを特徴とする請求項1又は2に記載の冷却器付き発光モジュール。
- 前記冷却器には、少なくとも前記金属層の一部を嵌め込み可能な凹部を備えていることを特徴とする請求項1又は2に記載の冷却器付き発光モジュール。
- 前記回路層と前記発光素子は、Ag層を介して接合されていることを特徴とする請求項1ないし4のいずれか一項に記載の冷却器付き発光モジュール。
- 前記回路層と前記発光素子は、Au-Sn合金層を介して接合されていることを特徴とする請求項1ないし4のいずれか一項に記載の冷却器付き発光モジュール。
- 絶縁層の一方の面側に、発光素子が搭載される回路層が形成され、前記絶縁層の他方の面側に金属層と冷却器とが順に積層されてなる冷却器付き発光モジュールの製造方法であって、
前記回路層を厚みが0.1mm以下の銅、銅合金、アルミニウム、アルミニウム合金のいずれかからなる材料によって形成し、
前記金属層および前記冷却器を、アルミニウムまたはアルミニウム合金によって形成し、
前記発光素子の面積:前記絶縁層の一方の面の面積が1:20~1:400の範囲内とされ、
前記金属層と前記冷却器とを直接接合する接合工程を備えたことを特徴とする冷却器付き発光モジュールの製造方法。 - 前記接合工程は、前記金属層と前記冷却器とを、Al-Si系ろう材を用いて接合する工程であることを特徴とする請求項7に記載の冷却器付き発光モジュールの製造方法。
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- 2016-09-20 WO PCT/JP2016/077657 patent/WO2017051794A1/ja active Application Filing
- 2016-09-20 KR KR1020187008244A patent/KR102542686B1/ko active IP Right Grant
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Also Published As
Publication number | Publication date |
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EP3355372A4 (en) | 2019-05-08 |
EP3355372B1 (en) | 2020-10-28 |
CN108140706B (zh) | 2021-07-09 |
CN108140706A (zh) | 2018-06-08 |
EP3355372A1 (en) | 2018-08-01 |
KR20180059777A (ko) | 2018-06-05 |
KR102542686B1 (ko) | 2023-06-12 |
JP2017063143A (ja) | 2017-03-30 |
US20180277730A1 (en) | 2018-09-27 |
JP6638282B2 (ja) | 2020-01-29 |
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