WO2017000843A1 - 板卡的自动化测试方法及装置 - Google Patents

板卡的自动化测试方法及装置 Download PDF

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Publication number
WO2017000843A1
WO2017000843A1 PCT/CN2016/087104 CN2016087104W WO2017000843A1 WO 2017000843 A1 WO2017000843 A1 WO 2017000843A1 CN 2016087104 W CN2016087104 W CN 2016087104W WO 2017000843 A1 WO2017000843 A1 WO 2017000843A1
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WIPO (PCT)
Prior art keywords
test
tested
control unit
card
board
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PCT/CN2016/087104
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English (en)
French (fr)
Inventor
赵焕成
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中兴通讯股份有限公司
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Publication of WO2017000843A1 publication Critical patent/WO2017000843A1/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L43/00—Arrangements for monitoring or testing data switching networks

Definitions

  • This document relates to, but is not limited to, the field of communication technology, and in particular to an automated test method and apparatus for a board.
  • the test is performed manually, and the test result is greatly affected by the human factor, resulting in insufficient test strength, and the quality and reliability of the communication device cannot be guaranteed.
  • the embodiment of the invention provides an automatic testing method and device for a card, which can ensure the quality and reliability of the card without being affected by human factors.
  • An automatic testing method for a board provided by an embodiment of the present invention, the method for automatically testing the board includes the following steps:
  • the test case is obtained based on the test environment parameter of the board to be tested and the parameter information of the board to be tested;
  • test environment parameter based on the to-be-tested card and the parameter information of the to-be-tested card The steps to get a test case include:
  • test case family includes the test service of the to-be-tested card and the corresponding test service Test information
  • test case in the test case family based on the test environment parameter, parameter information of the to-be-tested card, and slot information.
  • the automated test method of the board further includes:
  • the method includes:
  • the automated test method of the board further includes:
  • the alarm information is output.
  • the embodiment of the invention further provides an automatic testing device for a card, wherein the automatic testing device of the card comprises:
  • the first obtaining module is configured to obtain a test case based on the test environment parameter of the board to be tested and the parameter information of the board to be tested;
  • the first sending module is configured to send the test case to the control unit, so that the control unit controls the to-be-tested card to test based on the test case and feed back the test result;
  • a second sending module configured to send a test result obtaining request to the control unit when detecting that the to-be-tested card test is completed, and receive the test result that the control unit obtains the request feedback based on the test result .
  • the first obtaining module includes:
  • the first obtaining unit is configured to obtain a test case family, a test environment parameter of the to-be-tested card, parameter information of the to-be-tested card, and slot information, where the test case family includes the test service of the to-be-tested card And test information corresponding to the test service;
  • the second obtaining unit is configured to obtain the test case in the test case family by using the test environment parameter, parameter information of the to-be-tested card, and slot information.
  • the automated test device of the card further includes:
  • a second acquiring module configured to obtain a test state of the to-be-tested card
  • Determining a module configured to determine whether the to-be-tested card is in a test based on the obtained test state of the to-be-tested card
  • the first sending module is configured to send the test case to the control unit when the to-be-tested card is not in the test, so that the control unit controls the to-be-tested card based on the test Use the case to test and feedback the test results.
  • the automated test device of the card further includes:
  • a third sending module configured to send control information of the test stop to the control unit when the test stop command is detected or when the duration of the current test reaches a preset duration, for the control list
  • the element stops testing the board to be tested based on the control information.
  • the automated test device of the card further includes:
  • a determining module configured to determine whether the test result meets a preset condition when receiving the test result of the feedback of the to-be-tested card
  • the output module is configured to output an alarm message when the test result does not satisfy the preset condition.
  • the test case obtained based on the parameter information of the board to be tested and the test environment parameter is sent to the control unit, so that the control unit controls the board to be tested for testing, and then detects the board to be tested.
  • the test result acquisition request is sent to the control unit, and the control unit obtains the test result of the request feedback based on the test result; the automatic test of the board is realized, and the test result is not affected by the human factor when the test is performed manually. Impact, improved test efficiency and test results, thereby improving the quality and reliability of the board.
  • FIG. 1 is a schematic flow chart of a first embodiment of an automated test method for a card of the present invention
  • FIG. 2 is a schematic flowchart of a process of obtaining a test case according to an embodiment of the present invention
  • FIG. 3 is a schematic flow chart of a second embodiment of an automated test method for a card of the present invention.
  • FIG. 4 is a schematic flow chart of a third embodiment of an automated test method for a card according to the present invention.
  • FIG. 5 is a schematic flow chart of a fourth embodiment of an automated test method for a card of the present invention.
  • FIG. 6 is a schematic diagram of functional modules of a first embodiment of an automated testing device for a card of the present invention
  • FIG. 7 is a schematic diagram of a refinement function module of the first acquisition module in FIG. 6;
  • FIG. 8 is a schematic diagram of functional modules of a second embodiment of an automated test apparatus for a card of the present invention.
  • FIG. 9 is a schematic diagram of functional modules of a third embodiment of an automated test apparatus for a card of the present invention.
  • FIG. 10 is a schematic diagram of functional modules of a fourth embodiment of an automated test apparatus for a card of the present invention.
  • the invention provides an automated test method for a board.
  • FIG. 1 is a schematic flow chart of a first embodiment of an automated test method for a board according to the present invention.
  • the automated test method of the board includes:
  • Step S10 Obtain a test case based on test environment parameters of the board to be tested and parameter information of the board to be tested;
  • the test environment parameter includes information about the high and low temperature test environment in which the board to be tested is located, and the parameter information of the board to be tested includes the card serial number of the board to be tested and the Internet protocol (IP, corresponding to the device to be tested). Internet Protocol) address, etc.
  • IP Internet protocol
  • the test cases are pre-set, and different test cases are set for different boards.
  • the test cases include the test service of the board to be tested, the test information corresponding to the test service, test parameters, test time, and the board to be tested. Parameter information, etc.
  • test cases include software test cases, hardware test cases, and drive test cases.
  • Step S20 Send the test case to the control unit, so that the control unit controls the to-be-tested card to test based on the test case and feed back test results;
  • the control unit is a separate device.
  • the control unit receives the test case, set the test environment parameters first, and then send the test case to the board to be tested for testing.
  • the test case includes at least two test case files
  • the control unit sends the first test case to the to-be-tested card, and the to-be-tested card is receiving
  • the test is performed based on the first test case, and the first test result is fed back to the control unit when the test is completed;
  • the control unit stores the first test
  • the second test case is sent to the to-be-tested card, so that the to-be-tested card is tested based on the second test case, and the second test is fed back when the test is completed.
  • the test results may also include information such as test time, number of tests, test case number, slot, and the like.
  • Step S30 after detecting that the test of the to-be-tested card is completed, sending a test result acquisition request to the control unit, and receiving the test result that the control unit obtains the feedback based on the test result.
  • the host computer sends a message to the control unit to query the current test state of the board to be tested. If the control unit returns to the test, the board to be tested is displayed. The card is still in the test state. If the control unit returns to the test completion, it indicates that the board to be tested is currently tested.
  • the test result acquisition request is sent to the control unit, and the control unit acquires the test result corresponding to the test test case based on the test result.
  • the host computer can obtain the test result file from the control unit according to the preset time. If the host computer interrupts the communication with the control unit within a certain period of time (the upper computer is not closed), then the communication connection is established again with the control unit.
  • the automatic test method of the card in this embodiment is mainly used for testing the card of the communication device, and can implement the test of the software function of the communication device, such as the self-test process of the card, the active/standby switchover, the H-port test, etc.
  • Hardware and driver testing such as testing each port of the board, such as the network port of the panel, the Ethernet port of the backplane, the electrical port, the optical port, etc.
  • the test and the IIC bus test and the like are not further limited.
  • FIG. 2 is a schematic diagram showing the refinement process of the steps of obtaining a test case according to the present invention.
  • step S10 includes:
  • step S11 the test case family, the test environment parameters of the to-be-tested card, the parameter information of the to-be-tested card, and the slot information are obtained, where the test case family includes the test service of the to-be-tested card and the test. Test information corresponding to the business;
  • the test environment parameter includes information about the high and low temperature test environment in which the board to be tested is located, and the parameter information of the board to be tested includes the card serial number of the board to be tested and the IP address of the device corresponding to the board to be tested, etc.
  • the bit information includes the position of the test slot of the board to be tested in the test fixture.
  • the test case family can also include test time and/or number of tests, and the like.
  • Step S12 Acquire the test case in the test case family based on the test environment parameter, the parameter information of the board to be tested, and the slot information.
  • the host computer searches for and obtains test cases in the test case family based on the test environment parameters, the parameter information of the board to be tested, and the slot information. It is easy to understand that when the parameter information of the board to be tested is different, the host computer is in the test case family.
  • the test cases obtained in the test cases are also different, and different test cases can be obtained according to a plurality of different parameter information, so that the test tool can support the board of a plurality of different communication devices or the different boards of the same communication device to be mixed and realized. Simultaneous testing of many different boards.
  • the test case family includes a test environment parameter, parameter information of the board to be tested, slot information, and a correspondence between the test cases.
  • the test case is obtained in the test case family based on the obtained test environment parameter, the parameter information of the board to be tested, and the slot information, thereby implementing multiple types of communication devices or communication devices.
  • slot information and test case family A plurality of different test cases are obtained, so that the test method of the embodiment can support multiple boards of different communication devices or different boards of the same communication device to perform simultaneous testing of multiple different boards.
  • a second embodiment of the method for automatically testing the card of the present invention is provided based on the first embodiment.
  • the automated test method of the card before the step S20, the automated test method of the card further includes:
  • Step S40 obtaining a test state of the to-be-tested card
  • the host computer sends a test status acquisition request of the to-be-tested card to the control unit.
  • the control unit monitors the test status of the board to be tested, and sends the test status to the upper computer, wherein The test status includes both test and non-test.
  • Step S50 determining, according to the obtained test state of the to-be-tested card, whether the to-be-tested card is in a test;
  • step S20 is performed.
  • the host computer can intermittently obtain the test status of the board to be tested until the board to be tested is not in the test.
  • FIG. 4 is a schematic flow chart of a third embodiment of an automated test method for a card of the present invention.
  • a third embodiment of the automated test method for the card of the present invention is provided based on the first embodiment.
  • the automated test method of the card further includes:
  • Step S60 when the test stop instruction is detected or when the duration of the current test reaches the preset duration, the control information of the test stop is sent to the control unit, so that the control unit stops the Test of the board to be tested.
  • the test stop instruction includes an instruction sent by the user (tester) according to the need, and the preset duration includes an optimal duration for testing the board to be tested in the high and low temperature test environment.
  • the host computer may also send control information of the test stop to the control unit when the number of current tests reaches a preset number for the control.
  • the unit stops testing the board to be tested based on the control information, where the preset number includes the optimal number of times the board to be tested is tested in the high and low temperature test environment; of course, in practical applications, the control unit may The test of the test board is directly stopped when the current test duration reaches the preset duration or the current number of tests reaches the preset number of times.
  • the control information of the test stop is sent to the control unit to stop testing the board to be tested, and the implementation is implemented.
  • the timely stop of the test of the board to be tested avoids unnecessary testing and further improves the efficiency of the test.
  • FIG. 5 is a schematic flow chart of a fourth embodiment of an automated test method for a board according to the present invention.
  • a fourth embodiment of the method for automatically testing the card of the present invention is provided based on the above embodiment.
  • the automated test method of the card further includes:
  • Step S70 when receiving the test result of the feedback of the to-be-tested card, determining whether the test result meets a preset condition
  • the host computer determines whether the test result satisfies the preset condition when receiving the test result, wherein the preset condition includes the expected target of the board test to be tested, that is, when the board to be tested is qualified, the same test environment and test case are used. The expected test results obtained.
  • Step S80 output an alarm message when the test result does not meet the preset condition
  • the host computer When the test result does not meet the preset condition, the host computer outputs an alarm message to remind the user (tester) that the test card to be tested is unqualified, and the alarm information includes text information, voice information or ringing.
  • the host computer may store the test result and the parameter information of the to-be-tested card corresponding to the test result, so that the user (tester) finds the to-be-tested card.
  • the alarm information is output, so that when the test of the test card to be tested is abnormal, the tester can timely understand the abnormality and the board to be tested corresponding to the abnormality, so as to facilitate subsequent
  • the monitoring of the test boards further improves the efficiency of the test.
  • the above method can be implemented by a host computer.
  • Embodiments of the present invention also provide a computer readable storage medium storing computer executable instructions for performing any of the methods described above.
  • the invention further provides an automated test device for a card.
  • FIG. 6 is a schematic diagram of functional modules of a first embodiment of an automatic testing device for a card of the present invention.
  • the automated test device of the card includes:
  • the first obtaining module 10 is configured to obtain a test case based on the test environment parameter of the board to be tested and the parameter information of the board to be tested;
  • the test environment parameter includes information about the high and low temperature test environment in which the board to be tested is located.
  • the parameter information of the board to be tested includes the card serial number of the board to be tested and the IP address of the device corresponding to the board to be tested.
  • the test cases are pre-set, and different test cases are set for different boards.
  • the test cases include the test service of the board to be tested, the test information corresponding to the test service, test parameters, test time, and the board to be tested. Parameter information, etc.
  • the first obtaining module 10 is configured to generate different test cases according to different boards to be tested.
  • the board can be supported by a plurality of different communication devices or different boards of the same communication device to implement simultaneous testing of various boards.
  • the test cases include software test cases. Hardware test cases and driver test cases.
  • the first sending module 20 is configured to send the test case to the control unit, so that the control unit controls the to-be-tested card to test based on the test case and feed back test results;
  • the first sending module 20 is configured to send the test case to the control unit.
  • the control unit obtains pre-configuration information by parsing the test case, and then determines whether the to-be-tested card of the to-be-tested card is based on the pre-configured information. You need to perform the pre-configuration.
  • the board to be tested needs to be pre-configured, configure the test board based on the pre-configuration information, and then send the test case to the board to be tested for testing.
  • the pre-configuration includes test cases. The function corresponding to the configuration information to shield the board to be tested or the board to be tested.
  • the second sending module 30 is configured to, when detecting that the test of the to-be-tested card is completed, send a test result acquisition request to the control unit, and receive the test that the control unit obtains the request feedback based on the test result result.
  • the first sending module 20 is configured to send the test case based on the parameter information of the board to be tested and the test environment parameter first obtaining module 10 to the control unit, so that the control unit controls the board to be tested for testing. Then, after detecting that the test of the to-be-tested card is completed, the second sending module 30 sends a test result acquisition request to the control unit, and receives the test result of the request feedback based on the test result; and implements automatic test of the card to avoid When the test is performed manually, the test result is affected by the human factor, which improves the test efficiency and the test effect, thereby improving the quality and reliability of the board.
  • FIG. 7 is a schematic diagram of a refinement function module of the first acquisition module in FIG.
  • the first acquisition module 10 includes:
  • the first obtaining unit 11 is configured to acquire a test case family, a test environment parameter of the to-be-tested card, parameter information of the to-be-tested card, and slot information, where the test case family includes the to-be-tested Test service of the board and test information corresponding to the test service;
  • the test environment parameter includes information about the high and low temperature test environment in which the board to be tested is located, and the parameter information of the board to be tested includes the card serial number of the board to be tested and the IP address of the device corresponding to the board to be tested, etc.
  • the bit information includes the position of the test slot of the board to be tested in the test fixture.
  • the test case family can also include test time and/or number of tests, and the like.
  • the second obtaining unit 12 is configured to obtain the test case in the test case family based on the test environment parameter, parameter information of the to-be-tested card, and slot information.
  • the second obtaining unit 12 is configured to search for and obtain test cases in the test case family based on the test environment parameters, the parameter information of the board to be tested, and the slot information. It is easy to understand that when the parameter information of the board to be tested is different, The test cases obtained by the second obtaining unit 12 in the test case family are also different, and different test cases can be obtained according to a plurality of different parameter information, further enabling the test tool to support a plurality of different communication device boards or the same communication device. The different boards are mixed and inserted to realize simultaneous testing of many different boards.
  • the second acquisition unit 12 obtains the test case in the test case family based on the test environment parameter, the parameter information of the board to be tested, and the slot information acquired by the first acquiring unit 11, and implements the test case.
  • a plurality of different test cases are obtained according to the slot information and the test case family, so that the test method of the embodiment can support a plurality of different communication.
  • the board of the device or the different boards of the same communication device are mixed and inserted to realize simultaneous testing of a plurality of different boards.
  • FIG. 8 is a schematic diagram of functional modules of a second embodiment of an automatic testing device for a card of the present invention.
  • a second embodiment of the automatic test device for the card of the present invention is proposed based on the first embodiment.
  • the automatic test device for the card further includes:
  • the second obtaining module 40 is configured to obtain a test state of the to-be-tested card
  • the second obtaining module 40 is configured to send a test status acquisition request of the to-be-tested card to the control unit.
  • the control unit monitors the test status of the board to be tested, and the test status is obtained. Sending to the second obtaining module 40, wherein the test status includes In test and non-test.
  • the determining module 50 is configured to determine whether the to-be-tested card is in the test based on the obtained test state of the to-be-tested card;
  • the first sending module 20 is configured to send the test case to the control unit when the to-be-tested card is not in the test, so that the control unit controls the to-be-tested card based on the test case Test and feedback test results.
  • the determining module 50 determines whether the to-be-tested card is in the test based on the test state of the to-be-tested card acquired by the second obtaining module 40, and then first sends when the to-be-tested card is not in the test.
  • the module 20 sends the test case to the control unit, and determines that the board to be tested is not in the test before issuing the test case to the control unit, thereby ensuring that the board to be tested can be successfully tested according to the test case, thereby improving the efficiency of the test. .
  • FIG. 9 is a schematic diagram of functional modules of a third embodiment of an automatic testing device for a card of the present invention.
  • a third embodiment of the automatic testing device for the card of the present invention is proposed based on the first embodiment.
  • the automated testing device for the card further includes:
  • the third sending module 60 is configured to send control information of the test stop to the control unit when the test stop command is detected or when the duration of the current test reaches a preset duration, for the control unit to be based on the control The information stops testing the board to be tested.
  • the test stop instruction includes an instruction sent by the user (tester) according to the need, and the preset duration includes an optimal duration for testing the board to be tested in the high and low temperature test environment.
  • the third sending module 60 sends the control information of the test stop to the control unit to stop the board to be tested.
  • the test realizes the timely stop of the test of the board to be tested, avoids unnecessary testing, and further improves the efficiency of the test.
  • FIG. 10 is a schematic diagram of functional modules of a fourth embodiment of an automated test apparatus for a card of the present invention.
  • the fourth embodiment of the automatic test device for the card of the present invention is proposed based on the above embodiment.
  • the automatic test device for the card further includes:
  • the determining module 70 is configured to determine whether the test result meets a preset condition when receiving the test result of the feedback of the to-be-tested card;
  • the determining module 70 is configured to determine whether the test result meets the preset condition when the test result is received, wherein the preset condition includes an expected target of the board test to be tested, that is, if the board to be tested is qualified, the same test environment is adopted. And the expected test results obtained from the test cases.
  • the output module 80 is configured to output an alarm message when the test result does not meet the preset condition
  • the output module 80 When the test result does not meet the preset condition, the output module 80 outputs an alarm message to remind the user (tester) that the test card to be tested is unqualified, and the alarm information includes text information, voice information, and ringing.
  • the output module 80 when the determining module 70 determines that the test result does not meet the preset condition, the output module 80 outputs the alarm information, so that when the test of the test card to be tested is abnormal, the tester can timely understand the abnormality and the corresponding abnormality.
  • the board to be tested facilitates the subsequent monitoring of the test board, further improving the efficiency of the test.
  • each module/unit in the foregoing embodiment may be implemented in the form of hardware, for example, by implementing an integrated circuit to implement its corresponding function, or may be implemented in the form of a software function module, for example, executing a program in a storage and a memory by a processor. / instruction to achieve its corresponding function.
  • the invention is not limited to any specific form of combination of hardware and software.
  • the above technical solution realizes the automatic test of the board, and avoids the test result being affected by the human factor when the test is performed manually, improves the test efficiency and the test effect, thereby improving the quality and reliability of the board.

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Abstract

一种板卡的自动化测试方法和装置，方法包括：基于待测试板卡的测试环境参数及待测试板卡的参数信息获取测试用例(S10)；发送所述测试用例至控制单元，以供所述控制单元控制所述待测试板卡基于所述测试用例进行测试并反馈测试结果(S20)；在检测到所述待测试板卡测试完成时，发送测试结果获取请求至所述控制单元，并接收所述控制单元基于所述测试结果获取请求反馈的所述测试结果(S30)。

Description

板卡的自动化测试方法及装置 技术领域
本文涉及但不限于通信技术领域，尤指一种板卡的自动化测试方法及装置。
背景技术
随着通信技术的不断进步，越来越多的通信设备进入人们的生活，于是，人们对通信产品的质量和可靠性提出越来越高的要求，因此，对通信设备提出了更高的质量要求。
当前，在通信设备的板卡出厂前的测试过程中，采用人工的方式进行测试，测试结果受人力因素的影响较大，导致测试力度不足，无法保证通信设备的板卡质量和可靠性。
发明内容
以下是对本文详细描述的主题的概述。本概述并非是为了限制权利要求的保护范围。
本发明实施例提供一种板卡的自动化测试方法及装置，能够在不受人力因素的影响的情况下保证板卡的质量和可靠性。
本发明实施例提供的一种板卡的自动化测试方法，所述板卡的自动化测试方法包括以下步骤：
基于待测试板卡的测试环境参数及待测试板卡的参数信息获取测试用例；
发送所述测试用例至控制单元，以供所述控制单元控制所述待测试板卡基于所述测试用例进行测试并反馈测试结果；
在检测到所述待测试板卡测试完成时，发送测试结果获取请求至所述控制单元，并接收所述控制单元基于所述测试结果获取请求反馈的所述测试结果。
可选地，所述基于待测试板卡的测试环境参数及待测试板卡的参数信息 获取测试用例的步骤包括：
获取测试用例族、待测试板卡的测试环境参数、待测试板卡的参数信息及槽位信息，其中，所述测试用例族包括所述待测试板卡的测试业务及所述测试业务对应的测试信息；
基于所述测试环境参数、待测试板卡的参数信息及槽位信息在所述测试用例族中获取所述测试用例。
可选地，所述板卡的自动化测试方法还包括：
在所述发送所述测试用例至控制单元，以供所述控制单元控制所述待测试板卡基于所述测试用例进行测试并反馈测试结果的步骤之后，
获取所述待测试板卡的测试状态；
基于获取到的所述待测试板卡的测试状态确定所述待测试板卡是否处于测试中；
在所述待测试板卡未处于测试中时，执行发送所述测试用例至所述控制单元，以供所述控制单元控制所述待测试板卡基于所述测试用例进行测试并反馈测试结果的步骤。
可选地，所述方法包括：
在所述在检测到所述待测试板卡测试完成时，发送测试结果获取请求至所述控制单元，并接收所述控制单元基于所述测试结果获取请求反馈的所述测试结果的步骤之后，
在侦测到测试停止指令时或在当前测试的时长达到预设时长时，发送测试停止的控制信息至所述控制单元，以供所述控制单元基于所述控制信息停止对所述待测试板卡的测试。
可选地，所述板卡的自动化测试方法还包括：
在所述在侦测到所述待测试板卡测试完成时，发送测试结果获取请求至所述控制单元，以供所述控制单元反馈所述测试用例对应的测试结果的步骤之后，
在接收到所述待测试板卡反馈的测试结果时，判断所述测试结果是否满 足预设条件；
在所述测试结果未满足预设条件时，输出报警信息。
本发明实施例还提供一种板卡的自动化测试装置，所述板卡的自动化测试装置包括：
第一获取模块，设置为基于待测试板卡的测试环境参数及待测试板卡的参数信息获取测试用例；
第一发送模块，设置为发送所述测试用例至控制单元，以供所述控制单元控制所述待测试板卡基于所述测试用例进行测试并反馈测试结果；
第二发送模块，设置为在检测到所述待测试板卡测试完成时，发送测试结果获取请求至所述控制单元，并接收所述控制单元基于所述测试结果获取请求反馈的所述测试结果。
可选地，所述第一获取模块包括：
第一获取单元，设置为获取测试用例族、待测试板卡的测试环境参数、待测试板卡的参数信息及槽位信息，其中，所述测试用例族包括所述待测试板卡的测试业务及所述测试业务对应的测试信息；
第二获取单元，设置为所述测试环境参数、待测试板卡的参数信息及槽位信息在所述测试用例族中获取所述测试用例。
可选地，所述板卡的自动化测试装置还包括：
第二获取模块，设置为获取所述待测试板卡的测试状态；
确定模块，设置为基于获取到的所述待测试板卡的测试状态确定所述待测试板卡是否处于测试中；
所述第一发送模块是设置为在所述待测试板卡未处于测试中时，发送所述测试用例至所述控制单元，以供所述控制单元控制所述待测试板卡基于所述测试用例进行测试并反馈测试结果。
可选地，所述板卡的自动化测试装置还包括：
第三发送模块，设置为在侦测到测试停止指令时或在当前测试的时长达到预设时长时，发送测试停止的控制信息至所述控制单元，以供所述控制单 元基于所述控制信息停止对所述待测试板卡的测试。
可选地，所述板卡的自动化测试装置还包括：
判断模块，设置为在接收到所述待测试板卡反馈的测试结果时，判断所述测试结果是否满足预设条件；
输出模块，设置为在所述测试结果未满足预设条件时，输出报警信息。
本发明实施例中，通过将基于待测试板卡的参数信息及测试环境参数获取到的测试用例发送至控制单元，以供控制单元控制待测试板卡进行测试，然后在检测到待测试板卡测试完成时，发送测试结果获取请求至控制单元，并接收控制单元基于测试结果获取请求反馈的测试结果；实现了板卡的自动化测试，避免了采用人工的方式进行测试时测试结果受人力因素的影响，提高了测试效率以及测试效果，进而提高了板卡的质量和可靠性。
在阅读并理解了附图和详细描述后，可以明白其他方面。
附图概述
图1为本发明板卡的自动化测试方法第一实施例的流程示意图；
图2为本发明实施例获取测试用例的步骤的细化流程示意图；
图3为本发明板卡的自动化测试方法第二实施例的流程示意图；
图4为本发明板卡的自动化测试方法第三实施例的流程示意图；
图5为本发明板卡的自动化测试方法第四实施例的流程示意图；
图6为本发明板卡的自动化测试装置第一实施例的功能模块示意图；
图7为图6中第一获取模块的细化功能模块示意图；
图8为本发明板卡的自动化测试装置第二实施例的功能模块示意图；
图9为本发明板卡的自动化测试装置第三实施例的功能模块示意图；
图10为本发明板卡的自动化测试装置第四实施例的功能模块示意图。
本发明的实施方式
应当理解，此处所描述的具体实施例仅仅用以解释本发明，并不用于限 定本发明。
本发明提供一种板卡的自动化测试方法。
参照图1，图1为本发明板卡的自动化测试方法第一实施例的流程示意图。
在本实施例中，该板卡的自动化测试方法包括：
步骤S10，基于待测试板卡的测试环境参数及待测试板卡的参数信息获取测试用例；
其中，测试环境参数包括待测试板卡所处的高低温测试环境的信息，待测试板卡的参数信息包括待测试板卡的板卡序列号及待测试板卡对应设备的互联网协议(IP，Internet Protocol)地址等。测试用例为预先设置的，且针对不同的板卡设置不同的测试用例，其中，测试用例包括待测试板卡的测试业务、测试业务对应的测试信息、测试参数、测试时间以及待测试板卡的参数信息等。
上位机根据待测试板卡的不同能够获取到不同的测试用例，进而能够支持多种不同的通信设备的板卡或者同一通信设备的不同板卡混插，实现多种板卡的同时测试，本实施例中，测试用例包括软件测试用例、硬件测试用例以及驱动测试用例。
步骤S20，发送所述测试用例至所述控制单元，以供所述控制单元控制所述待测试板卡基于所述测试用例进行测试并反馈测试结果；
其中，控制单元为一个独立的设备。
发送测试用例至控制单元，控制单元在接收到测试用例时，先设置测试环境参数，然后将测试用例下发至待测试板卡进行测试。当然，在测试用例包括至少两个测试用例文件时，譬如，测试用例包括至少第一测试用例及第二测试用例时，控制单元发送第一测试用例至待测试板卡，待测试板卡在接收到第一测试用例时基于第一测试用例进行测试，并在完成测试时反馈第一测试结果至控制单元；在接收到待测试板卡反馈的第一测试结果时，控制单元存储该第一测试结果，并发送所述第二测试用例至待测试板卡，以供所述待测试板卡基于所述第二测试用例进行测试，并在完成测试时反馈第二测试 结果，测试结果还可以包括测试时间、测试次数、测试用例编号、槽位等信息。
步骤S30，在检测到所述待测试板卡测试完成时，发送测试结果获取请求至所述控制单元，并接收所述控制单元基于所述测试结果获取请求反馈的所述测试结果。
本步骤中，每隔一定的时间间隔(时间间隔可以预先设置)，上位机给控制单元下发一个查询当前待测试板卡测试状态的消息，如果控制单元返回测试进行中，则表示待测试板卡当前还处于测试状态，如果控制单元返回测试完成，则表示待测试板卡当前已测试完成。
在检测到控制单元接收到待测试板卡反馈的测试结果时，发送测试结果获取请求至控制单元，控制单元基于测试结果获取请求反馈测试用例对应的测试结果。一般情况下，上位机可以按照预设的时间从控制单元获取测试结果文件，若上位机在某段时间内和控制单元中断了通讯(上位机没有关闭)，则再次与控制单元建立通讯连接后，发送测试结果获取请求至所述控制单元，控制单元反馈上位机上次获取的结测试结果的时间点之后的所有测试结果；若在待测试板卡测试过程中上位机被关闭了，在上位机再次打开并发送测试结果获取请求至所述控制单元，控制单元发送从测试开始到当前时间的时间段内所有的测试结果，有效的避免了因为误操作关闭上位机，需要重新开始测试的问题，提高了测试效率。
本实施例板卡的自动化测试方法，主要用于通信设备的板卡的测试，可以实现通信设备软件功能的测试，比如板卡自检流程、主备倒换、H口测试等，还可以实现设备的硬件和驱动的测试，比如板卡的每一种端口的测试，如面板的网口、背板以太网端口、电口、光口等测试，当然，还可以测试芯片的温度、风扇控速测试以及IIC总线测试等，本发明不作进一步限定。
本实施例中，通过将基于待测试板卡的参数信息及测试环境参数获取到的测试用例发送至控制单元，以供控制单元控制待测试板卡进行测试，然后在检测到待测试板卡测试完成时，发送测试结果获取请求至控制单元，并接收控制单元基于测试结果获取请求反馈的测试结果；实现了板卡的自动化测试，避免了采用人工的方式进行测试时测试结果受人力因素的影响，提高了 测试效率以及测试效果，进而提高了板卡的质量和可靠性。
参照图2，图2为本发明获取测试用例的步骤的细化流程示意图。
基于第一实施例提出本发明步骤S10的细化流程实施例，在本实施例中，步骤S10包括：
步骤S11，获取测试用例族、待测试板卡的测试环境参数、待测试板卡的参数信息及槽位信息，其中，所述测试用例族包括所述待测试板卡的测试业务及所述测试业务对应的测试信息；
其中，可以通过解析配置文件来获取测试用例族、待测试板卡的测试环境参数、待测试板卡的参数信息及槽位信息的，配置文件的制式是和上位机约定好的，解析其中的字段，就能获取相应的信息，比如测试那些槽位，测试那个测试用例项，设定的测试超时时间等。
其中，测试环境参数包括待测试板卡所处的高低温测试环境的信息，待测试板卡的参数信息包括待测试板卡的板卡序列号及待测试板卡对应设备的IP地址等，槽位信息包括待测试板卡在测试工装中测试槽的位置。当然，测试用例族还可以包括测试时间和/或测试次数等。
步骤S12，基于所述测试环境参数、待测试板卡的参数信息及槽位信息在所述测试用例族中获取所述测试用例。
上位机基于测试环境参数、待测试板卡的参数信息及槽位信息在测试用例族中查找并获取测试用例，容易理解，在待测试板卡的参数信息的不同时，上位机在测试用例族中获取到的测试用例也不同，可以根据多种不同的参数信息获取不同的测试用例，进一步使得测试工装能够支持多种不同的通信设备的板卡或者同一通信设备的不同板卡混插，实现多种不同板卡的同时测试。
可选的，测试用例族包括测试环境参数、待测试板卡的参数信息、槽位信息和测试用例之间的对应关系。
本实施例中，通过基于获取到的测试环境参数、待测试板卡的参数信息及槽位信息在所述测试用例族中获取测试用例，实现了在对多种通信设备或者通信设备的多种不同板卡进行测试时，根据槽位信息及测试用例族的不同 获取多种不同的测试用例，进而使得本实施例的测试方法能够支持多种不同的通信设备的板卡或者同一通信设备的不同板卡混插，实现多种不同板卡的同时测试。
参照图3，图3为本发明板卡的自动化测试方法第二实施例的流程示意图。
基于第一实施例提出本发明板卡的自动化测试方法的第二实施例，在本实施例中，在步骤S20之前，该板卡的自动化测试方法还包括：
步骤S40，获取所述待测试板卡的测试状态；
上位机发送待测试板卡的测试状态获取请求至控制单元，控制单元在接收到上位机发送的获取请求时，监测获取待测试板卡的测试状态，并将该测试状态发送至上位机，其中，测试状态包括测试中及非测试中。
步骤S50，基于获取到的所述待测试板卡的测试状态确定所述待测试板卡是否处于测试中；
即根据获取到的测试状态确定待测试板卡是否处于测试中。
在所述待测试板卡未处于测试中时，执行发送所述测试用例至所述控制单元，以供所述控制单元控制所述待测试板卡基于所述测试用例进行测试并反馈测试结果的步骤，即在待测试板卡未处于测试中时，执行步骤S20。
当然，在待测试板卡处于测试中时，上位机可以间断获取待测试板卡的测试状态，直至待测试板卡未处于测试中。
本实施例中，通过基于获取到的待测试板卡的测试状态确定待测试板卡是否处于测试中，然后在待测试板卡未处于测试中时，执行发送测试用例至控制单元的步骤，实现了在下发测试用例至控制单元之前确定待测试板卡是未处于测试中，进而保证待测试板卡能够顺利的根据测试用例完成测试，提高了测试的效率。
参照图4，图4为本发明板卡的自动化测试方法第三实施例的流程示意图。
基于第一实施例提出本发明板卡的自动化测试方法的第三实施例，在本实施例中，在步骤S30之后，该板卡的自动化测试方法还包括：
步骤S60，在侦测到测试停止指令时或在当前测试的时长达到预设时长时，发送测试停止的控制信息至所述控制单元，以供所述控制单元基于所述控制信息停止对所述待测试板卡的测试。
其中，测试停止指令包括用户(测试人员)根据需要发送的指令，预设时长包括在高低温测试环境中待测试板卡进行测试的最优时长。
一般情况下，在待测试板卡设置了测试的预设次数时，上位机还可以在当前测试的次数达到预设次数时，发送测试停止的控制信息至所述控制单元，以供所述控制单元基于所述控制信息停止对所述待测试板卡的测试，其中，预设次数包括在高低温测试环境中待测试板卡进行测试的最佳次数；当然，在实际应用中，控制单元可以通过在当前测试的时长达到预设时长或当前测试的次数达到预设次数时，直接停止对待测试板卡的测试。
本实施例中，在侦测到测试停止指令时或在当前测试的时长达到预设时长时，发送测试停止的控制信息至所述控制单元以停止对所述待测试板卡的测试，实现了待测试板卡测试的及时停止，避免了不必要的测试，进一步提高了测试的效率。
参照图5，图5为本发明板卡的自动化测试方法第四实施例的流程示意图。
基于上述实施例提出本发明板卡的自动化测试方法的第四实施例，在本实施例中，在步骤S30之后，该板卡的自动化测试方法还包括：
步骤S70，在接收到所述待测试板卡反馈的测试结果时，判断所述测试结果是否满足预设条件；
上位机在接收到测试结果时判断测试结果是否满足预设条件，其中，预设条件包括待测试板卡测试的预期目标，即待测试板卡合格的情况下，采用相同的测试环境及测试用例得到的预期测试结果。
步骤S80，在所述测试结果未满足预设条件时，输出报警信息；
在测试结果未满足预设条件时，上位机输出报警信息，以提醒用户(测试人员)该待测试板卡测试不合格，报警信息包括文字信息、语音信息或响铃等。
当然，在测试结果未满足预设条件时，上位机可以存储所述测试结果及所述测试结果对应的待测试板卡的参数信息，以便于用户(测试人员)查找该待测试板卡。
当然，本实施例中，可以在测试过程中，待测试板卡实时监测测试是否发生异常或误码，在发生异常或误码时发送警报信息至控制单元，控制单元在接收到待测试板卡发送的警报信息时，记录警报信息对应的待测试板卡并输出报警信息。
本实施例中，通过在测试结果未满足预设条件时，输出报警信息，使得在待测试板卡测试发送异常时，测试人员能够及时理解该异常以及该异常对应的待测试板卡，便于后续对待测试板卡的监测，进一步提高了测试的效率。
上述方法可以通过上位机实现。
本发明实施例还提出了一种计算机可读存储介质，存储有计算机可执行指令，计算机可执行指令用于执行上述描述的任意一个方法。
本发明进一步提供一种板卡的自动化测试装置。
参照图6，图6为本发明板卡的自动化测试装置第一实施例的功能模块示意图。
在本实施例中，该板卡的自动化测试装置包括：
第一获取模块10，设置为基于待测试板卡的测试环境参数及待测试板卡的参数信息获取测试用例；
其中，测试环境参数包括待测试板卡所处的高低温测试环境的信息，待测试板卡的参数信息包括待测试板卡的板卡序列号及待测试板卡对应设备的IP地址等。测试用例为预先设置的，且针对不同的板卡设置不同的测试用例，其中，测试用例包括待测试板卡的测试业务、测试业务对应的测试信息、测试参数、测试时间以及待测试板卡的参数信息等。
第一获取模块10设置为根据待测试板卡的不同生成不同的测试用例，进 而能够支持多种不同的通信设备的板卡或者同一通信设备的不同板卡混插，实现多种板卡的同时测试，本实施例中，测试用例包括软件测试用例。硬件测试用例以及驱动测试用例。
第一发送模块20，设置为发送所述测试用例至所述控制单元，以供所述控制单元控制所述待测试板卡基于所述测试用例进行测试并反馈测试结果；
第一发送模块20设置为发送所述测试用例至控制单元，控制单元在接收到测试用例时，通过解析测试用例获得预配置信息，然后基于预配置信息判断待测试板卡的待测试板卡是否需要进行预配置，在待测试板卡需要进行预配置时，基于预配置信息对待测试板卡进行配置操作，然后将测试用例下发至待测试板卡进行测试，其中预配置包括基于测试用例的与配置信息屏蔽待测试板卡或待测试板卡对应的功能。
第二发送模块30，设置为在检测到所述待测试板卡测试完成时，发送测试结果获取请求至所述控制单元，并接收所述控制单元基于所述测试结果获取请求反馈的所述测试结果。
本实施例中，通过第一发送模块20设置为将基于待测试板卡的参数信息及测试环境参数第一获取模块10的测试用例发送至控制单元，以供控制单元控制待测试板卡进行测试，然后在检测到待测试板卡测试完成时，第二发送模块30发送测试结果获取请求至控制单元，并接收控制单元基于测试结果获取请求反馈的测试结果；实现了板卡的自动化测试，避免了采用人工的方式进行测试时测试结果受人力因素的影响，提高了测试效率以及测试效果，进而提高了板卡的质量和可靠性。
参照图7，图7为图6中第一获取模块的细化功能模块示意图。
基于第一实施例提出本发明第一获取模块的细化功能模块实施例，在本实施例中，第一获取模块10包括：
第一获取单元11，设置为获取测试用例族、待测试板卡的测试环境参数、待测试板卡的参数信息及槽位信息，其中，所述测试用例族包括所述待测试 板卡的测试业务及所述测试业务对应的测试信息；
其中，测试环境参数包括待测试板卡所处的高低温测试环境的信息，待测试板卡的参数信息包括待测试板卡的板卡序列号及待测试板卡对应设备的IP地址等，槽位信息包括待测试板卡在测试工装中测试槽的位置。当然，测试用例族还可以包括测试时间和/或测试次数等。
第二获取单元12，设置为基于所述测试环境参数、待测试板卡的参数信息及槽位信息在所述测试用例族中获取所述测试用例。
第二获取单元12设置为基于测试环境参数、待测试板卡的参数信息及槽位信息在测试用例族中查找并获取测试用例，容易理解，在待测试板卡的参数信息的不同时，第二获取单元12在测试用例族中获取到的测试用例也不同，可以根据多种不同的参数信息获取不同的测试用例，进一步使得测试工装能够支持多种不同的通信设备的板卡或者同一通信设备的不同板卡混插，实现多种不同板卡的同时测试。
本实施例中，通过第二获取单元12基于第一获取单元11获取到的测试环境参数、待测试板卡的参数信息及槽位信息在所述测试用例族中获取测试用例，实现了在对多种通信设备或者通信设备的多种不同板卡进行测试时，根据槽位信息及测试用例族的不同获取多种不同的测试用例，进而使得本实施例的测试方法能够支持多种不同的通信设备的板卡或者同一通信设备的不同板卡混插，实现多种不同板卡的同时测试。
参照图8，图8为本发明板卡的自动化测试装置第二实施例的功能模块示意图。
基于第一实施例提出本发明板卡的自动化测试装置的第二实施例，在本实施例中，板卡的自动化测试装置还包括：
第二获取模块40，设置为获取所述待测试板卡的测试状态；
第二获取模块40设置为发送待测试板卡的测试状态获取请求至控制单元，控制单元在接收到获取模块40发送的获取请求时，监测获取待测试板卡的测试状态，并将该测试状态发送至第二获取模块40，其中，测试状态包括 测试中及非测试中。
确定模块50，设置为基于获取到的所述待测试板卡的测试状态确定所述待测试板卡是否处于测试中；
第一发送模块20是设置为在所述待测试板卡未处于测试中时，发送所述测试用例至所述控制单元，以供所述控制单元控制所述待测试板卡基于所述测试用例进行测试并反馈测试结果。
本实施例中，通过确定模块50基于第二获取模块40获取到的待测试板卡的测试状态确定待测试板卡是否处于测试中，然后在待测试板卡未处于测试中时，第一发送模块20发送测试用例至控制单元，实现了在下发测试用例至控制单元之前确定待测试板卡是未处于测试中，进而保证待测试板卡能够顺利的根据测试用例完成测试，提高了测试的效率。
参照图9，图9为本发明板卡的自动化测试装置第三实施例的功能模块示意图。
基于第一实施例提出本发明板卡的自动化测试装置的第三实施例，在本实施例中，板卡的自动化测试装置还包括：
第三发送模块60，设置为在侦测到测试停止指令时或在当前测试的时长达到预设时长时，发送测试停止的控制信息至所述控制单元，以供所述控制单元基于所述控制信息停止对所述待测试板卡的测试。
其中，测试停止指令包括用户(测试人员)根据需要发送的指令，预设时长包括在高低温测试环境中待测试板卡进行测试的最优时长。
本实施例中，在侦测到测试停止指令时或在当前测试的时长达到预设时长时，第三发送模块60发送测试停止的控制信息至所述控制单元以停止对所述待测试板卡的测试，实现了待测试板卡测试的及时停止，避免了不必要的测试，进一步提高了测试的效率。
参照图10，图10为本发明板卡的自动化测试装置第四实施例的功能模块示意图。
基于上述实施例提出本发明板卡的自动化测试装置的第四实施例，在本实施例中，板卡的自动化测试装置还包括：
判断模块70，设置为在接收到所述待测试板卡反馈的测试结果时，判断所述测试结果是否满足预设条件；
判断模块70设置为在接收到测试结果时判断测试结果是否满足预设条件，其中，预设条件包括待测试板卡测试的预期目标，即待测试板卡合格的情况下，采用相同的测试环境及测试用例得到的预期测试结果。
输出模块80，设置为在所述测试结果未满足预设条件时，输出报警信息；
在测试结果未满足预设条件时，输出模块80输出报警信息，以提醒用户(测试人员)该待测试板卡测试不合格，报警信息包括文字信息、语音信息及响铃等。
本实施例中，通过在判断模块70判断测试结果未满足预设条件时，输出模块80输出报警信息，使得在待测试板卡测试发送异常时，测试人员能够及时理解该异常以及该异常对应的待测试板卡，便于后续对待测试板卡的监测，进一步提高了测试的效率。
本领域普通技术人员可以理解上述方法中的全部或部分步骤可通过程序来指令相关硬件(例如处理器)完成，所述程序可以存储于计算机可读存储介质中，如只读存储器、磁盘或光盘等。可选地，上述实施例的全部或部分步骤也可以使用一个或多个集成电路来实现。相应地，上述实施例中的各模块/单元可以采用硬件的形式实现，例如通过集成电路来实现其相应功能，也可以采用软件功能模块的形式实现，例如通过处理器执行存储与存储器中的程序/指令来实现其相应功能。本发明不限于任何特定形式的硬件和软件的结合。
以上仅为本发明的可选实施例，并非因此限制本发明的专利范围，凡是利用本发明说明书及附图内容所作的等效结构或等效流程变换，或直接或间接运用在其他相关的技术领域，均同理包括在本发明的专利保护范围内。
工业实用性
上述技术方案实现了板卡的自动化测试，避免了采用人工的方式进行测试时测试结果受人力因素的影响，提高了测试效率以及测试效果，进而提高了板卡的质量和可靠性。

Claims (10)

  1. 一种板卡的自动化测试方法，所述板卡的自动化测试方法包括以下步骤：
    基于待测试板卡的测试环境参数及待测试板卡的参数信息获取测试用例；
    发送所述测试用例至控制单元，以供所述控制单元控制所述待测试板卡基于所述测试用例进行测试并反馈测试结果；
    在检测到所述待测试板卡测试完成时，发送测试结果获取请求至所述控制单元，并接收所述控制单元基于所述测试结果获取请求反馈的所述测试结果。
  2. 如权利要求1所述的板卡的自动化测试方法，其中，所述基于待测试板卡的测试环境参数及待测试板卡的参数信息获取测试用例的步骤包括：
    获取测试用例族、待测试板卡的测试环境参数、待测试板卡的参数信息及槽位信息，其中，所述测试用例族包括所述待测试板卡的测试业务及所述测试业务对应的测试信息；
    基于所述测试环境参数、待测试板卡的参数信息及槽位信息在所述测试用例族中获取所述测试用例。
  3. 如权利要求1所述的板卡的自动化测试方法，所述板卡的自动化测试方法还包括：
    在所述发送所述测试用例至控制单元，以供所述控制单元控制所述待测试板卡基于所述测试用例进行测试并反馈测试结果的步骤之前，获取所述待测试板卡的测试状态；
    基于获取到的所述待测试板卡的测试状态确定所述待测试板卡是否处于测试中；
    在所述待测试板卡未处于测试中时，执行发送所述测试用例至所述控制单元，以供所述控制单元控制所述待测试板卡基于所述测试用例进行测试并反馈测试结果的步骤。
  4. 如权利要求1所述的板卡的自动化测试方法，所述方法包括：
    在所述在检测到所述待测试板卡测试完成时，发送测试结果获取请求至所述控制单元，并接收所述控制单元基于所述测试结果获取请求反馈的所述测试结果的步骤之后，
    在侦测到测试停止指令时或在当前测试的时长达到预设时长时，发送测试停止的控制信息至所述控制单元，以供所述控制单元基于所述控制信息停止对所述待测试板卡的测试。
  5. 如权利要求1至4任一项所述的板卡的自动化测试方法，所述板卡的自动化测试方法还包括：
    在检测到所述待测试板卡测试完成时，发送测试结果获取请求至所述控制单元，并接收所述控制单元基于所述测试结果获取请求反馈的所述测试结果的步骤之后，
    在接收到所述待测试板卡反馈的测试结果时，判断所述测试结果是否满足预设条件；
    在所述测试结果未满足预设条件时，输出报警信息。
  6. 一种板卡的自动化测试装置，所述板卡的自动化测试装置包括：
    第一获取模块，设置为基于待测试板卡的测试环境参数及待测试板卡的参数信息获取测试用例；
    第一发送模块，设置为发送所述测试用例至控制单元，以供所述控制单元控制所述待测试板卡基于所述测试用例进行测试并反馈测试结果；
    第二发送模块，设置为在检测到所述待测试板卡测试完成时，发送测试结果获取请求至所述控制单元，并接收所述控制单元基于所述测试结果获取请求反馈的所述测试结果。
  7. 如权利要求6所述的板卡的自动化测试装置，其中，所述第一获取模块包括：
    第一获取单元，设置为获取测试用例族、待测试板卡的测试环境参数、待测试板卡的参数信息及槽位信息，其中，所述测试用例族包括所述待测试板卡的测试业务及所述测试业务对应的测试信息；
    第二获取单元，设置为基于所述测试环境参数、待测试板卡的参数信息及槽位信息在所述测试用例族中获取所述测试用例。
  8. 如权利要求6所述的板卡的自动化测试装置，所述板卡的自动化测试装置还包括：
    第二获取模块，设置为获取所述待测试板卡的测试状态；
    确定模块，设置为基于获取到的所述待测试板卡的测试状态确定所述待测试板卡是否处于测试中；
    所述第一发送模块是设置为在所述待测试板卡未处于测试中时，发送所述测试用例至所述控制单元，以供所述控制单元控制所述待测试板卡基于所述测试用例进行测试并反馈测试结果。
  9. 如权利要求6所述的板卡的自动化测试装置，所述板卡的自动化测试装置还包括：
    第三发送模块，设置为在侦测到测试停止指令时或在当前测试的时长达到预设时长时，发送测试停止的控制信息至所述控制单元，以供所述控制单元基于所述控制信息停止对所述待测试板卡的测试。
  10. 如权利要求6至9任一项所述的板卡的自动化测试装置，所述板卡的自动化测试装置还包括：
    判断模块，设置为在接收到所述待测试板卡反馈的测试结果时，判断所述测试结果是否满足预设条件；
    输出模块，设置为在所述测试结果未满足预设条件时，输出报警信息。
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Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109813524A (zh) * 2018-12-03 2019-05-28 深圳市天视通电子科技有限公司 一种模组批量测试的方法、装置及系统
CN111831495A (zh) * 2020-06-23 2020-10-27 惠州市博实结科技有限公司 生产自动化测试方法及系统
CN112039690A (zh) * 2020-07-28 2020-12-04 福建星云电子股份有限公司 一种系统数据流跟踪监控方法及系统
CN112362360A (zh) * 2020-11-10 2021-02-12 广州小鹏汽车科技有限公司 车辆部件测试方法、装置、系统、测试板卡以及存储介质
CN112860559A (zh) * 2021-02-19 2021-05-28 一汽解放汽车有限公司 升级测试系统和方法
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Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106872882A (zh) * 2017-03-10 2017-06-20 四川鸿创电子科技有限公司 一种适用于高低温试验的板卡批量测试方法
CN106980058B (zh) * 2017-03-31 2019-10-15 东莞华贝电子科技有限公司 一种自动化测试系统及方法
CN108519935B (zh) * 2018-03-15 2021-09-24 广州视源电子科技股份有限公司 板卡测试方法、装置、可读存储介质及计算机设备
CN109040336A (zh) * 2018-07-17 2018-12-18 格力电器（武汉）有限公司 一种查找工装的方法及装置
CN110907801A (zh) * 2019-11-08 2020-03-24 惠州拓邦电气技术有限公司 一种pcb测试方法及装置
TWI710778B (zh) 2019-12-04 2020-11-21 瑞軒科技股份有限公司 自動化測試系統及其裝置
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TWI777552B (zh) * 2019-12-04 2022-09-11 瑞軒科技股份有限公司 自動化測試方法
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CN111397657A (zh) * 2020-03-20 2020-07-10 苏州浪潮智能科技有限公司 一种板卡出货风险的测试方法及装置
CN112024446A (zh) * 2020-08-18 2020-12-04 南京市嘉隆电气科技股份有限公司 一种电力设备全自动测试的实现方法
CN112345916A (zh) * 2020-10-26 2021-02-09 西安西电电力系统有限公司 高电位板卡测试系统及测试方法
CN114675209A (zh) * 2022-04-22 2022-06-28 北京中轻联认证中心有限公司 一种儿童玩具多性能检测装置及检测方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1790957A (zh) * 2004-12-14 2006-06-21 华为技术有限公司 设备测试方法
CN101009853A (zh) * 2007-01-30 2007-08-01 中兴通讯股份有限公司 一种手机单板自动测试系统及其方法
CN101145984A (zh) * 2007-04-12 2008-03-19 中兴通讯股份有限公司 基于参数自适应的自动化测试方法
CN101170785A (zh) * 2006-10-24 2008-04-30 中兴通讯股份有限公司 使用tcl进行基站软件测试的装置和方法
US8433953B1 (en) * 2007-08-13 2013-04-30 The Mathworks, Inc. Automatic configuration of a test environment
CN104198868A (zh) * 2014-09-23 2014-12-10 厦门雅迅网络股份有限公司 一种可灵活扩展和动态配置的智能工装

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101697599B (zh) * 2009-10-16 2013-02-20 惠州Tcl移动通信有限公司 多媒体数据卡、手机多媒体数据卡的测试装置及测试方法
CN102338854B (zh) * 2010-07-27 2015-04-15 迈普通信技术股份有限公司 电路板测试用例生成系统及方法
CN101986279B (zh) * 2010-11-17 2013-01-16 许继集团有限公司 一种板卡测试系统

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1790957A (zh) * 2004-12-14 2006-06-21 华为技术有限公司 设备测试方法
CN101170785A (zh) * 2006-10-24 2008-04-30 中兴通讯股份有限公司 使用tcl进行基站软件测试的装置和方法
CN101009853A (zh) * 2007-01-30 2007-08-01 中兴通讯股份有限公司 一种手机单板自动测试系统及其方法
CN101145984A (zh) * 2007-04-12 2008-03-19 中兴通讯股份有限公司 基于参数自适应的自动化测试方法
US8433953B1 (en) * 2007-08-13 2013-04-30 The Mathworks, Inc. Automatic configuration of a test environment
CN104198868A (zh) * 2014-09-23 2014-12-10 厦门雅迅网络股份有限公司 一种可灵活扩展和动态配置的智能工装

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109813524A (zh) * 2018-12-03 2019-05-28 深圳市天视通电子科技有限公司 一种模组批量测试的方法、装置及系统
CN111831495A (zh) * 2020-06-23 2020-10-27 惠州市博实结科技有限公司 生产自动化测试方法及系统
CN112039690B (zh) * 2020-07-28 2023-03-24 福建星云电子股份有限公司 一种系统数据流跟踪监控方法及系统
CN112039690A (zh) * 2020-07-28 2020-12-04 福建星云电子股份有限公司 一种系统数据流跟踪监控方法及系统
CN112362360A (zh) * 2020-11-10 2021-02-12 广州小鹏汽车科技有限公司 车辆部件测试方法、装置、系统、测试板卡以及存储介质
CN112362360B (zh) * 2020-11-10 2023-03-31 广州小鹏汽车科技有限公司 车辆部件测试方法、装置、系统、测试板卡以及存储介质
CN112860559A (zh) * 2021-02-19 2021-05-28 一汽解放汽车有限公司 升级测试系统和方法
CN112860559B (zh) * 2021-02-19 2024-05-28 一汽解放汽车有限公司 升级测试系统和方法
CN113219319A (zh) * 2021-04-07 2021-08-06 苏州华兴源创科技股份有限公司 集成测试板卡、芯片测试系统及芯片测试方法
CN113219319B (zh) * 2021-04-07 2024-03-12 苏州华兴源创科技股份有限公司 集成测试板卡、芯片测试系统及芯片测试方法
CN113595818A (zh) * 2021-07-22 2021-11-02 云尖信息技术有限公司 一种用于检测框式线卡板流量的测试方法
CN113595818B (zh) * 2021-07-22 2022-08-26 云尖信息技术有限公司 一种用于检测框式线卡板流量的测试方法
CN113613099A (zh) * 2021-08-06 2021-11-05 国网浙江省电力有限公司检修分公司 一种基于物联网技术的二次设备测试系统

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