WO2016199307A1 - Système optique de détection de propriété optique, sonde de mesure et dispositif de détection de propriété optique - Google Patents

Système optique de détection de propriété optique, sonde de mesure et dispositif de détection de propriété optique Download PDF

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Publication number
WO2016199307A1
WO2016199307A1 PCT/JP2015/067089 JP2015067089W WO2016199307A1 WO 2016199307 A1 WO2016199307 A1 WO 2016199307A1 JP 2015067089 W JP2015067089 W JP 2015067089W WO 2016199307 A1 WO2016199307 A1 WO 2016199307A1
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WIPO (PCT)
Prior art keywords
light
detection
optical
unit
refractive index
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PCT/JP2015/067089
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English (en)
Japanese (ja)
Inventor
哲大 岡
花野　和成
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オリンパス株式会社
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Priority to PCT/JP2015/067089 priority Critical patent/WO2016199307A1/fr
Publication of WO2016199307A1 publication Critical patent/WO2016199307A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection

Definitions

  • the present invention relates to an optical characteristic detection optical system used when detecting the refractive index of a test object such as a living body, a measurement probe including the optical characteristic detection optical system, and an optical characteristic detection device.
  • the refractive index of the test object is obtained using the attenuated total reflection method or the surface plasmon resonance method, and the characteristics of the test object are determined based on the obtained refractive index.
  • Devices for analysis are known.
  • the attenuated total reflection method or surface plasmon resonance method information on the angle of incidence of light on the test surface of the specimen is usually obtained, and the total reflection critical angle or plasmon resonance angle is calculated based on the obtained angle of incidence information.
  • the optical characteristics of the test object are analyzed using either the calculation method for calculating the wavelength, the wavelength information, and the calculation method for calculating the total reflection critical angle or the plasmon resonance angle based on the acquired wavelength information. That is, in the attenuated total reflection method or the surface plasmon resonance method, a method of acquiring either the incident angle information or the wavelength information is common.
  • Patent Document 1 describes a technique for analyzing the characteristics of a test object by simultaneously acquiring incident angle information and wavelength information.
  • a white light source a prism with a test object attached to the bottom surface, a spectral slit, a spectroscope, a two-dimensional photodetector, which are arranged in parallel with the angular spread direction of the reflected light reflected from the prism, And analyzing the characteristics of the test object by obtaining a two-dimensional image showing the incident angle information and the wavelength information at the same time.
  • the penetration depth of the evanescent wave on the detection surface used for detection greatly depends on the wavelength. Therefore, when only the incident angle information is acquired, there is a problem that it is not possible to deal with test objects of various sizes in the measurement at a single wavelength.
  • the calculation method for calculating the total reflection critical angle or the plasmon resonance angle based on the wavelength information requires a spectroscope and a high-intensity white light source, which increases the size of the apparatus. was there.
  • the present invention has been made in view of the above, and an optical characteristic detection optical system, a measurement probe, and an optical characteristic detection that can be downsized even when incident angle information and wavelength information are acquired simultaneously.
  • An object is to provide an apparatus.
  • an optical characteristic detection optical system includes a light source unit in which a plurality of light emitting points that emit light having different wavelength bands are arranged, and a predetermined refraction.
  • a detection unit having a detection surface that is formed by using a member having a rate and that contacts a test object; and a first optical member that condenses light emitted from each of the plurality of light emission points on the detection surface;
  • a light receiving unit capable of receiving light from the detection surface, and a second optical member for guiding light from the detection surface to the light receiving unit.
  • the detection unit is characterized in that a metal film is formed on the detection surface.
  • the optical characteristic detection optical system is the above invention, wherein the incident angle of the light emitted from each of the plurality of light emitting points to the detection surface is between the maximum angle and the minimum angle, It includes an angle satisfying a plasmon resonance condition determined from a refractive index of the test object, a refractive index of the detection unit, a material of the metal film, a film thickness, and a wavelength emitted from each of the plurality of light emitting points. .
  • the optical characteristic detection optical system is the above invention, wherein the incident angle of the light emitted from each of the plurality of light emitting points to the detection surface is between the maximum angle and the minimum angle, It includes an angle that satisfies a total reflection condition determined from a refractive index of the test object, a refractive index of the detection unit, and a wavelength emitted from each of the plurality of light emitting points.
  • each of the light emitting points and the detection surface are in an optically conjugate positional relationship.
  • the light source section includes a surface emitting laser array in which the plurality of light emitting points are two-dimensionally arranged.
  • the light source unit includes a plurality of light sources that emit light in different wavelength bands, and one end of the light emitted from each of the plurality of light sources. And a plurality of irradiation fibers that propagate the received light and emit the light from the other end.
  • the measurement probe according to the present invention is characterized in that the detection surface provided with the optical characteristic optical system described above is capable of contacting the test object.
  • An optical property detection apparatus includes the optical property detection optical system described above, a calculation unit that calculates a refractive index of the test object based on intensity information of the light received by the light receiving unit, It is provided with.
  • the size can be reduced.
  • FIG. 1 is a schematic diagram showing a schematic configuration of an optical property detection apparatus according to Embodiment 1 of the present invention.
  • FIG. 2 is a diagram schematically showing a detection result of the light receiving unit in the optical property detection apparatus according to Embodiment 1 of the present invention.
  • FIG. 3 is a schematic diagram showing a schematic configuration of an optical characteristic detection device according to a modification of the first embodiment of the present invention.
  • FIG. 4 is a diagram schematically showing a detection result of the light receiving unit in the optical characteristic detection device according to the modification of the first embodiment of the present invention.
  • FIG. 5 is a schematic diagram showing a schematic configuration of an optical property detection apparatus according to Embodiment 2 of the present invention.
  • FIG. 6 is a schematic diagram showing a schematic configuration of an optical characteristic detection apparatus according to Embodiment 3 of the present invention.
  • FIG. 1 is a schematic diagram showing a schematic configuration of a refractive index detection apparatus according to Embodiment 1 of the present invention.
  • a refractive index detection device that detects the refractive index of a test object will be described as an optical property detection device.
  • the refractive index detection apparatus 1 shown in FIG. 1 has a light source unit 2 in which a plurality of light emitting points that emit light in different wavelength bands are arranged in a two-dimensional manner, and each of the plurality of light emitting points in the light source unit 2 is emitted.
  • a first optical member 3 that collects light
  • a polarizing member 4 that transmits a specific polarization component of light components emitted from the light source unit 2
  • a detection unit 5 that has a detection surface that contacts the specimen SP
  • a second optical member 6 that guides the light from the detection unit 5, a light receiving unit 7 that detects the amount of light received from the second optical member 6, and a control unit 8 that controls each part of the refractive index detection device 1; .
  • the light source unit 2, the first optical member 3, the polarizing member 4, the detection unit 5, the second optical member 6, and the light receiving unit 7 function as an optical characteristic detection optical system.
  • the light source unit 2 is configured by using a surface emitting laser array, and light sources 21 to 29 that emit light having different wavelength bands are arranged two-dimensionally.
  • the light sources 21 to 29 emit light in a time division manner under the control of the control unit 8.
  • the number of light sources of the light source unit 2 is nine.
  • the present invention is not limited to this.
  • the first optical member 3 condenses the light emitted from each of the light sources 21 to 29 of the light source unit 2 and causes the light to enter the detection unit 5.
  • the first optical member 3 converts light emitted from each of the light sources 21 to 29 of the light source unit 2 into substantially parallel light, and enters the light through the collimating lens 31 that emits the substantially parallel light and the polarization member 4.
  • a condensing lens 32 that focuses the light and forms an image on the detection surface 521 of the detection unit 5.
  • the incident angle of the light emitted from each of the light sources 21 to 29 in the light source unit 2 to the detection surface 521 in the detection unit 5 is between the maximum angle and the minimum angle, and the refractive index and detection of the test object SP. It includes an angle that satisfies the plasmon resonance condition determined from the refractive index of the part 5, the material of the metal film 52, the film thickness, and the wavelength emitted from each of the light sources 21 to 29 in the light source part 2.
  • the incident angle to the detection surface 521 includes 68 to 75 degrees between the maximum angle and the minimum angle.
  • the incident angle on the detection surface 521 includes 67 to 76 degrees between the maximum angle and the minimum angle.
  • the refractive index of the specimen SP is assumed to be 1.3 to 1.4, and more specifically 1.33 to 1.38.
  • the refractive index of the detection unit 5 is 1.38 to 1.80, preferably 1.43 to 1.49.
  • the wavelength emitted from each of the light sources 21 to 29 in the light source unit 2 is 405 nm to 2000 nm, preferably 1500 nm to 1600 nm.
  • the polarizing member 4 is disposed on the optical path between the collimating lens 31 and the condenser lens 32.
  • the polarization member 4 transmits a specific polarization component among the substantially parallel light components converted by the collimator lens 31.
  • the polarizing member 4 is configured using a polarizing plate.
  • the detection unit 5 is arranged so as to have different predetermined angles with respect to each of the first optical member 3 and the second optical member 6. Specifically, the detection unit 5 is arranged such that the optical axes of the first optical member 3 and the polarization member 4 and the surface on which light is incident or emitted in the detection unit 5 are approximately 45 degrees, and the second It arrange
  • the detection unit 5 includes a prism 51 and a metal film 52 formed on the detection surface 521 in contact with the test object SP. As described above, the refractive index of the prism 51 is 1.38 to 1.80, preferably 1.43 to 1.49.
  • the metal film 52 is configured by, for example, gold, silver and platinum alone or in combination.
  • the thickness of the metal film 52 is 10 to 200 nm, preferably 10 to 50 nm, and more preferably 32 nm. In this case, the reflected light intensity due to resonance can be reduced to near zero.
  • the detection surface 521 is disposed so as to be optically substantially conjugate with the light sources 21 to 29 of the light source unit 2.
  • the metal film 52 is disposed at a substantially optical imaging position 522 formed by the first optical member 3 with each of the light sources 21 to 29 of the light source unit 2 as object planes.
  • the second optical member 6 guides the light from the detection unit 5 to the light receiving unit 7.
  • the second optical member 6 includes a collimator lens 61 and a condenser lens 62.
  • the condenser lens 62 forms an image of the detection surface.
  • the condenser lens 62 may not be provided, and collimated light may be incident on the light receiving unit 7.
  • the light receiving unit 7 detects the amount of light received from the second optical member 6 and outputs the detection result to the control unit 8.
  • the light receiving unit 7 is configured using a light receiving sensor having a two-dimensional light receiving element array such as a CCD (Charge Coupled Device) or a CMOS (Complementary Metal Oxide Semiconductor).
  • the light receiving surface 7a of the light receiving unit 7 and the detection surface 521 of the detecting unit 5 are not in an optically conjugate positional relationship.
  • the light receiving surface 7a is disposed behind the position where the conjugate image of the detection surface 521 is formed (image forming position by the condensing lens 62).
  • the incident angle of the light beam on the detection surface 521 is related to the light incident position on the light receiving surface 7a.
  • the control unit 8 is configured using a CPU (Central Processing Unit) or the like, and controls each unit of the refractive index detection apparatus 1.
  • the control unit 8 includes a calculation unit 81 that calculates the refractive index of the test object SP based on the light intensity information input from the light receiving unit 7.
  • the light sources 21 to 29 of the light source unit 2 have different wavelength bands under the control of the control unit 8 (for example, the light sources 21, 22, and 23). , Red light (620 nm to 750 nm), green light (495 nm to 570 nm) from the light sources 24, 25 and 26, and blue light (405 nm to 495 nm) from the light sources 27, 28 and 29 are sequentially emitted at different timings.
  • the light emitted from the light source 21 of the light source unit 2 is converted into substantially parallel light by the collimator lens 31.
  • the substantially parallel light converted by the collimator lens 31 enters the condenser lens 32 via the polarizing member 4.
  • the light incident on the condenser lens 32 is condensed and forms an image on the detection surface 521 of the detection unit 5.
  • the light incident on the detection unit 5 is reflected by the detection surface 521.
  • the light reflected by the detection surface 521 of the detection unit 5 is guided to the light receiving unit 7 by the second optical member 6.
  • the light guided by the second optical member 6 is detected by the light receiving unit 7. Further, light emitted from each of the light sources 22 to 29 of the light source unit 2 passes through the same optical path as the light emitted from the light source 21 described above, and is detected by the light receiving unit 7.
  • FIG. 2 is a diagram schematically illustrating a detection result of the light receiving unit 7.
  • the horizontal axis represents the incident angle
  • the vertical axis represents the amount of received light.
  • Curve L1 represents a resonance curve between the amount of received light having a red wavelength band and the incident angle
  • curve L2 represents a resonance curve between the amount of received light having a green wavelength band and the incident angle
  • curve L3. Shows a resonance curve between the amount of received light having a blue wavelength band and the incident angle.
  • the refractive index detection apparatus 1 can acquire discrete wavelength information and continuous angle information. For this reason, the calculation unit 81 can detect the refractive index, optical dispersion, and the like of the test object SP based on the intensity information from the light receiving unit 7.
  • the detection includes the light source unit 2 in which a plurality of light emitting points that emit light having different wavelength bands are arranged, and the detection surface 521 that contacts the test object SP.
  • the first optical member 3 that focuses the light emitted from each of the light source 21, the light source 21 to the light source 29 and forms an image on the detection surface 521 of the detection unit 5, and the light from the detection surface 521 to the light receiving unit 7.
  • the second optical member 6 that guides light, it is possible to reduce the size even when continuous incident angle information and discrete wavelength information are acquired.
  • the incident position on the detection surface 521 of the detection unit 5 can be changed according to the positions of the light sources 21 to 29.
  • the refractive index of the test object SP the refractive index of the detection unit 5, between the maximum angle and the minimum angle of the incident angle to the detection surface 521 in the detection unit 5, Since the angle includes the angle that satisfies the surface plasmon resonance condition determined from the material and film thickness of the metal film 52 and the wavelength of the light emitted from the light source unit 2, highly sensitive detection by surface plasmon resonance can be performed with a simple configuration.
  • the refractive index is detected as the optical characteristic of the test object SP by surface plasmon resonance.
  • the optical property of the test object SP is determined by the attenuated total reflection method. Detect as a characteristic.
  • an optical property detection apparatus according to a modification of the first embodiment will be described.
  • symbol is attached
  • FIG. 3 is a schematic diagram showing a schematic configuration of an optical characteristic detection device according to a modification of the first embodiment of the present invention.
  • an optical characteristic a refractive index detection apparatus that detects the refractive index of the test object SP will be described as an optical characteristic detection apparatus.
  • the polarizing member 4 is deleted from the configuration of the refractive index detection device 1 according to Embodiment 1 described above.
  • the detection unit 5a is arranged so as to have different predetermined angles with respect to each of the first optical member 3 and the second optical member 6. Specifically, the detection unit 5a is arranged such that the optical axis of the first optical member 3 and the surface on which light is incident or emitted from the detection unit 5a are approximately 45 degrees, and the second optical member 6 The optical axis and the surface on which light enters or exits in the detection unit 5a are arranged to be approximately 45 degrees.
  • the detection unit 5a is configured using a prism.
  • the refractive index of the detector 5a is 1.38 to 1.80, more preferably 1.43 to 1.49.
  • the detection surface 5a1 is disposed so as to be optically substantially conjugate with the light sources 21 to 29 of the light source unit 2.
  • the detection surface 5a1 of the detection unit 5a is disposed at a substantially optical imaging position 5a2 formed by the first optical member 3 with each of the light sources 21 to 29 of the light source unit 2 as object surfaces. Furthermore, the detection surface 5a1 of the detection unit 5a and the light reception surface 7a of the light reception unit 7 are not in an optically conjugate positional relationship.
  • the light receiving surface 7a is disposed on the rear side of the position where the conjugate image of the detection surface 5a1 is formed.
  • the incident angle of the light beam on the detection surface 5a1 is arranged in relation to the light beam incident position on the light receiving surface 7a.
  • the light emitted from each of the light sources 21 to 29 in the light source unit 2 is condensed on the detection surface 5a1 by the condenser lens 32.
  • the incident angle of the light emitted from each of the light sources 21 to 29 in the light source unit 2 to the detection surface 5a1 of the detection unit 5a (hereinafter simply referred to as “incident angle to the detection surface 5a1”) is the maximum angle and the minimum angle.
  • the angle between the refractive index of the object SP and the refractive index of the detector 5a and the angle satisfying the total reflection condition determined from the wavelengths of the light emitted from each of the light sources 21 to 29 in the light source unit 2 is included.
  • the incident angle to the detection surface 5a1 includes 68 degrees and 75 degrees, preferably 67 degrees and 76 degrees, between the maximum angle and the minimum angle.
  • the refractive index detection device 1a configured in this manner sequentially emits light having different wavelength bands from each of the light sources 21 to 29 in the light source unit 2 at different timings under the control of the control unit 8.
  • the light emitted from the light source 21 of the light source unit 2 is converted into substantially parallel light by the collimator lens 31.
  • the substantially parallel light converted by the collimator lens 31 is condensed by the condenser lens 32 and imaged on the detection surface 5a1 of the detector 5a.
  • the light condensed by the condenser lens 32 is reflected by the detection surface 5a1 of the detection unit 5a.
  • the light reflected by the detection surface 5a1 of the detection unit 5a is guided by the second optical member 6.
  • the light guided by the second optical member 6 is detected by the light receiving unit 7. Further, light emitted from each of the light sources 22 to 29 of the light source unit 2 passes through the same optical path as the light emitted from the light source 21 described above, and is detected by the light receiving unit 7.
  • FIG. 4 is a diagram schematically showing the detection result of the light receiving unit 7.
  • the horizontal axis indicates the incident angle
  • the vertical axis indicates the amount of received light.
  • Curve L11 shows the relationship between the amount of received light having the red wavelength band and the incident angle
  • curve L12 shows the relationship between the amount of received light having the green wavelength band and the incident angle
  • curve L13 shows the blue color. The relationship between the amount of light received in the wavelength band and the incident angle is shown.
  • the refractive index detection device 1a can acquire discrete wavelength information and continuous angle information. For this reason, the calculation unit 81 can detect the refractive index, optical dispersion, and the like of the test object SP based on the intensity information from the light receiving unit 7.
  • the refractive index of the test object SP the refractive index of the detection unit 5a, and the refractive index between the maximum angle and the minimum angle of the incident angle on the detection surface 5a1. Since the angle that satisfies the total reflection condition determined from the wavelength of the light emitted from the light source unit 2 is included, even when continuous incident angle information and discrete wavelength information are acquired by the total reflection critical method, the size can be reduced. Can be achieved.
  • the incident position on the detection surface 5a1 of the detection unit 5a can be changed according to the position of each of the light sources 21 to 29.
  • FIG. 5 is a schematic diagram showing a schematic configuration of an optical property detection apparatus according to Embodiment 2 of the present invention.
  • an optical characteristic a refractive index detection apparatus that detects the refractive index of the test object SP will be described as an optical characteristic detection apparatus.
  • the light source unit 2 b includes a light source 201 and a light emitting member 202.
  • the light source 201 emits light having different predetermined wavelengths to each of a plurality of optical fibers constituting a light emitting member 202 described later.
  • the light source 201 is configured using a plurality of light sources (semiconductor lasers) such as a laser light source.
  • the light emitting member 202 is configured using a plurality of optical fibers. In the second embodiment, the light emitting member 202 is configured using two or more optical fibers. Specifically, the light emitting member 202 includes a first irradiation fiber 21b to a ninth irradiation fiber 29b. Each of the first irradiation fiber 21b to the ninth irradiation fiber 29b receives light having different wavelength bands emitted from the light source 201 and emits the light from the emission end 202b. Further, the emission end 202b of each of the first irradiation fiber 21b to the ninth irradiation fiber 29b and the detection surface 521 of the detection unit 5 are in an optically conjugate positional relationship.
  • the light source 201 emits light having different wavelength bands under the control of the control unit 8.
  • the light emitted from the light source 201 is emitted from the emission end 202b of the first irradiation fiber 21b.
  • the light emitted from the emission end 202b of the first irradiation fiber 21b is converted into substantially parallel light by the collimator lens 31.
  • the substantially parallel light converted by the collimator lens 31 enters the condenser lens 32 via the polarizing member 4.
  • the light incident on the condenser lens 32 is condensed and forms an image on the detection surface 521 of the detection unit 5.
  • the light incident on the detection unit 5 is reflected by the detection surface 521 of the detection unit 5.
  • the light reflected by the detection surface 521 of the detection unit 5 enters the light receiving unit 7 through the second optical member 6.
  • the light emitted from each of the second irradiation fiber 22b to the ninth irradiation fiber 29b passes through the same optical path as the light emitted from the first irradiation fiber 21b described above, and is detected by the light receiving unit 7.
  • the light source unit 2b is configured by using the light source 201 and the first irradiation fiber 21b to the ninth irradiation fiber 29b, thereby making it possible to narrow the vicinity of the emission end of the light source unit 2b. Diameter can be achieved.
  • the incident position on the detection surface 521 of the detection unit 5 can be changed according to the position of each of the first irradiation fiber 21b to the ninth irradiation fiber 29b.
  • the metal film 52 is not used, and the refraction of the test object SP is performed when the incident angles of the plurality of lights on the detection surface 521 of the detection unit 5 are between the maximum angle and the minimum angle. And an angle that satisfies the total reflection condition determined from the wavelength emitted from each of the first irradiating fiber 21b to the ninth irradiating fiber 29b can be easily detected by the attenuated total reflection method. It can be performed.
  • FIG. 6 is a schematic diagram showing a schematic configuration of an optical characteristic detection apparatus according to Embodiment 3 of the present invention.
  • an optical characteristic a refractive index detection apparatus that detects the refractive index of the test object SP will be described as an optical characteristic apparatus.
  • the measurement probe 70 includes a light source unit 2, a first optical member 3d, a polarizing member 4, a detection unit 5d, a second optical member 6, and a light receiving unit 7.
  • 1st optical member 3d is comprised using a condensing lens.
  • the first optical member 3d collects light emitted from each of the light sources 21 to 29 of the light source unit 2 and having different wavelength bands.
  • the detection unit 5d is configured using a prism having a substantially trapezoidal cross section.
  • the detection unit 5d has a detection surface 5d1 that comes into contact with the test object.
  • a metal film 5d2 is formed on the detection surface 5d1.
  • the detection surface 5d1 is disposed at an optically substantially conjugate position with the light sources 21 to 29 of the light source unit 2.
  • the detection unit 5 d reflects the light emitted from the first optical member 3 d toward the second optical member 6.
  • the light receiving unit 7 is disposed at a position behind the imaging position by the second optical member 6 so that the incident angle of the light beam on the detection surface 5d1 is related to the light beam incident position on the light receiving surface 7a. .
  • the light source unit 2 sequentially emits light having different wavelength bands at different timings under the control of the control unit 8.
  • the light emitted from the light source 21 of the light source unit 2 is collected by the first optical member 3d.
  • the light condensed by the first optical member 3d enters the detection unit 5d via the polarizing member 4.
  • the light incident on the detection unit 5d is reflected by the detection surface 5d1.
  • the amount of light reflected by the detection surface 5 d 1 of the detection unit 5 d is guided by the second optical member 6 and detected by the light receiving unit 7.
  • light emitted from each of the light sources 22 to 29 of the light source unit 2 passes through the same optical path as the light emitted from the light source 21 described above, and is detected by the light receiving unit 7.
  • the present invention is not limited to the above-described embodiments and modifications as they are, and in the implementation stage, the constituent elements can be modified and embodied without departing from the spirit of the invention.
  • Various inventions can be formed by appropriately combining a plurality of constituent elements disclosed in the above-described embodiments. For example, some constituent elements may be deleted from all the constituent elements described in the above-described embodiments and modifications. Furthermore, you may combine suitably the component demonstrated by each embodiment and the modification.

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Abstract

L'invention concerne un système optique de détection de propriété optique qui peut être amené à être compact même lorsqu'il est conçu de façon à obtenir simultanément des informations d'angle d'incidence et des informations de longueur d'onde, une sonde de mesure et un dispositif de détection de propriété optique. Le système optique de détection de propriété optique de l'invention est équipé de : une unité de source de lumière (2) ayant une pluralité de points électroluminescents agencés sur celle-ci qui émettent de la lumière dans des bandes de longueur d'onde qui diffèrent entre elles; une unité de détection (5) ayant une surface de détection (521) qui est en contact avec une cible de détection et formée à l'aide d'un élément ayant un indice de réfraction prescrit; un premier élément optique (3) pour concentrer la lumière émise par chaque source de la pluralité de sources de lumière (21 à 29) et pour former une image sur la surface de détection (521); une unité de réception de lumière (7) susceptible de recevoir la lumière provenant de la surface de détection (521); et un second élément optique (6) pour guider la lumière provenant de la surface de détection (521) vers l'unité de réception de lumière (7).
PCT/JP2015/067089 2015-06-12 2015-06-12 Système optique de détection de propriété optique, sonde de mesure et dispositif de détection de propriété optique WO2016199307A1 (fr)

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PCT/JP2015/067089 WO2016199307A1 (fr) 2015-06-12 2015-06-12 Système optique de détection de propriété optique, sonde de mesure et dispositif de détection de propriété optique

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PCT/JP2015/067089 WO2016199307A1 (fr) 2015-06-12 2015-06-12 Système optique de détection de propriété optique, sonde de mesure et dispositif de détection de propriété optique

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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003185569A (ja) * 2001-12-14 2003-07-03 Mitsubishi Chemicals Corp 表面プラズモン共鳴を利用した試料の分析装置及び表面プラズモン共鳴分析用センサチップ
JP2003262586A (ja) * 2002-03-08 2003-09-19 Stanley Electric Co Ltd 表面プラズモン共鳴センサ

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003185569A (ja) * 2001-12-14 2003-07-03 Mitsubishi Chemicals Corp 表面プラズモン共鳴を利用した試料の分析装置及び表面プラズモン共鳴分析用センサチップ
JP2003262586A (ja) * 2002-03-08 2003-09-19 Stanley Electric Co Ltd 表面プラズモン共鳴センサ

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