WO2016114151A1 - 質量分析装置 - Google Patents
質量分析装置 Download PDFInfo
- Publication number
- WO2016114151A1 WO2016114151A1 PCT/JP2016/050002 JP2016050002W WO2016114151A1 WO 2016114151 A1 WO2016114151 A1 WO 2016114151A1 JP 2016050002 W JP2016050002 W JP 2016050002W WO 2016114151 A1 WO2016114151 A1 WO 2016114151A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- mass
- stage
- value
- mass spectrometer
- rod
- Prior art date
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
- H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
- H01J49/0063—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by applying a resonant excitation voltage
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/421—Mass filters, i.e. deviating unwanted ions without trapping
- H01J49/4215—Quadrupole mass filters
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
- H01J49/4205—Device types
- H01J49/4255—Device types with particular constructional features
Definitions
- the present invention relates to a mass spectrometer using a tandem-type quadrupole mass spectrometer, and particularly to a mass spectrometer that requires high sensitivity, such as in the case of analysis of a sample in a living body.
- a quadrupole mass spectrometer consisting of at least four rod-shaped electrodes, to which a DC voltage U and a high-frequency voltage Vcos ( ⁇ t + ⁇ 0 ) are applied, is generated between the electrodes.
- the stability of the ion trajectory passing through the electric field is determined in the stable transmission region by the stability parameter a and q values shown in FIG.
- the stability parameters a and q are expressed by the following equations.
- the mass-to-charge ratio of the target ion is m / Z
- r 0 is the half value of the distance between the opposing rod electrodes
- e is the elementary charge
- U is the DC voltage
- V is the DC voltage
- ⁇ are the amplitude of the high frequency voltage
- the angular vibration frequency is m / Z
- r 0 is the half value of the distance between the opposing rod electrodes
- e is the elementary charge
- U is the DC voltage
- V and ⁇ are the amplitude of the high frequency voltage
- the angular vibration frequency To express.
- the high frequency voltage is The same voltage Vcos ( ⁇ t + ⁇ 0 ) as Q1 was applied, and as shown in FIG. 4a, the q value was almost the same between Q1 and Q2.
- the first stage QMS selects and separates the parent ion mass
- the second stage QMS dissociates the parent ion and removes the daughter ion.
- Q1 In a tandem mass spectrometer consisting of three stages of QMS, the first stage QMS (Q1) selects and separates the parent ion mass, and the second stage QMS (Q2) dissociates the parent ion and removes the daughter ion. Generated, stably transmitted, and mass spectrum analysis of various daughter ions with the third-stage QMS (Q3).
- Q1 Conventionally, as shown in FIG. 4a, in Q1, only an ion species having a specific mass-to-charge ratio m / z passes Q1, so that the operating point comes to a point near the vertex of the stable transmission region.
- the stability parameter q value of the parent ion does not substantially change, the daughter ion generated by dissociating the parent ion has a lower mass number than the parent ion, so m / Z is As a result, the q value of the daughter ions becomes larger than the q value of the parent ions as shown in the equation (2), and some of the daughter ions go out of the stable region and cannot be transmitted stably ( Not detected), the sensitivity may decrease.
- the DC voltage U 0, and the amplitude V is Q1 with respect to the high-frequency voltage Vcos ( ⁇ t + ⁇ 0 ).
- the parent ion's q value decreases and the daughter ion's q value also decreases.
- simply reducing the q value of the parent ion decreases the fundamental vibration frequency (equation (3)) of the parent ion, as shown in FIG. 5a.
- the conventional method has the following two problems. (1) Decrease in sensitivity due to destabilization of daughter ion trajectory (going out of stable region) (2) Decrease in sensitivity due to decrease in daughter ion production efficiency (decrease in parent ion oscillation frequency) To solve the above problems Therefore, it is necessary to provide a means for reducing the fundamental vibration frequency of the parent ion while lowering the q value of the parent ion.
- the q value of the parent ion in Q1 is used as a means for lowering the fundamental vibration frequency of the parent ion while lowering the q value of the parent ion in order to solve the above problem.
- Is q1 the q value of the parent ion in Q2 is q2
- the fundamental vibration frequency of the parent ion in Q1 and Q2 is ⁇ 1, ⁇ 2,
- the mass number range of daughter ions that can be stably transmitted is expanded by the means of the present invention, and it can be expected that the generation efficiency of daughter ions is not reduced (the number of oscillations of the parent ions is almost the same as Q1).
- the mass number range of daughter ions that can be stably transmitted is expanded, and the generation efficiency of daughter ions is not reduced (the vibration of parent ions).
- the number of times is almost the same as Q1).
- FIG. 1 is a schematic view of each electrode arrangement and structure of the tandem quadrupole mass spectrometer according to the first embodiment of the present invention.
- FIG. 2 is a schematic diagram of the entire mass spectrometry system for measuring mass spectrometry data according to the present invention.
- FIG. 3 is a stable ion transmission region diagram in the quadrupole electric field.
- FIG. 4 is a conceptual diagram of operating points in the first and second QMS in the ion stable transmission region diagram of the quadrupole mass spectrometer.
- FIG. 5 is a conceptual diagram of parent ion trajectories in the first and second stage QMS.
- FIG. 6 shows the potential distribution and the cumulative ion destabilization loss generated by simulation in the case of the electrode arrangement and shape of the ion guide and the mass spectrometer according to the second embodiment of the present invention. It is the figure which put together the result.
- FIG. 7 is a schematic view of each electrode arrangement and structure of the tandem quadrupole mass spectrometer in the second embodiment of the present invention.
- FIG. 8 is a conceptual diagram of operating points in the first and second QMS in the ion stable transmission region diagram of the quadrupole mass spectrometer according to the third embodiment of the present invention.
- FIG. 9 is a schematic diagram of each electrode arrangement and structure of the tandem-type quadrupole mass spectrometer.
- FIG. 1 is a view showing a tandem quadrupole mass spectrometer composed of three stages of QMS, which is a feature of the first embodiment
- FIG. 2 is an overall configuration diagram of the mass spectrometer system of this embodiment.
- an analysis flow is shown for the mass spectrometry system 11.
- Samples subject to mass spectrometry are samples that are separated and fractionated in time in a pretreatment system 1 such as gas chromatography (GC) or liquid chromatography (LC), and are ionized one after another in the ionization unit 2.
- a pretreatment system 1 such as gas chromatography (GC) or liquid chromatography (LC)
- the ions pass through the ion transport unit 3 and enter the mass analysis unit 4 to be separated by mass.
- m is the ion mass
- Z is the charge valence of the ion.
- the voltage to the mass separation unit 4 is applied from the voltage source 9 while being controlled by the control unit 8.
- the ions finally separated and passed are detected by the ion detector 5 and organized and processed by the data processor 6, and the mass analysis data as the analysis result is displayed on the display unit 7.
- Control unit for the whole of this series of mass analysis processes (sample ionization, transport and incidence of sample ion beam to mass analysis unit 3, mass separation process, ion detection, data processing, command processing of user input unit 10) Controlled by 8.
- the mass separation unit 4 includes three stages of quadrupole mass spectrometers (QMS) composed of four rod-shaped electrodes, which are substantially coaxially arranged.
- QMS quadrupole mass spectrometers
- the four rod-shaped electrodes are cylindrical as shown in the x, y sectional view of the rod-shaped electrode. It may be an electrode, or may be a rod-like electrode having a bipolar surface shape as indicated by a dotted line.
- the four electrodes of the i-th stage QMS have a pair of electrodes facing each other, and the electrodes 4-i-a and 4-i-c have a voltage in which a DC voltage and a high-frequency voltage are superimposed. : + (U i + Vicos ⁇ i t), the electrode 4-i-b and 4-i-d, the voltages of opposite phases :-( U i + Vicos ⁇ i t) is applied, between the four rod-like electrodes
- the high frequency electric fields Exi and Eyi shown in the equation (8) are generated.
- i the number of stages of QMS.
- i 1 to 3.
- the ionized sample ions are introduced along the central axis (z direction) between the rod-shaped electrodes, and pass through the high-frequency electric field of equation (8).
- the stability of the ion trajectory in the x and y directions at this time is determined by the following dimensionless parameters a i and q i derived from the equation of motion of ions between the rod-shaped electrodes (Mathieu equation).
- the dimensionless parameters a i and q i are stability parameters in the i-th stage QMS.
- r in (10) 0 half the distance between opposing rod electrodes, e is elementary charge, m / Z is the mass-to-charge ratio of ions, U is the DC voltage applied to the rod electrodes , V and ⁇ are the amplitude and angular vibration frequency of the high frequency voltage.
- each ion species corresponds to a different (a i , q i ) point on the aq plane of FIG. 3 according to its mass-to-charge ratio m / Z.
- all the different (a i , q i ) points of each ion species exist on the straight line of the following expression (11).
- FIG. 3 shows the quantitative range (stable transmission region) of a i and q i giving a stable solution for ion trajectories in both the x and y directions.
- the stable transmission region of FIG. It is necessary to adjust the U / V ratio so that it intersects the vicinity of the apex (Fig. 3). While stably transmitting ions pass between the rod-like electrodes in the z direction while vibrating, the destabilized ions radiate the vibrations and exit in the x and y directions.
- the applied voltage to the electrode is adjusted so that the operating point comes to the point near the vertex of the stable transmission region, and the second-stage QMS (Q2) Collision chamber 13 filled with gas or other buffer gas is installed, and the specific ion species (parent ion) that has passed through Q1 is destroyed by collision dissociation (dissociation ion), etc., and dissociated ions (daughter ions) And mass spectrum analysis of various daughter ions using QMS (Q3) at the third stage.
- Q2 the second-stage QMS
- the voltage applied to the QMS of the i-th stage (DC voltage U i and a high-frequency voltage V i cos .omega i t), in Figure 1, as shown in control content 12, and controls.
- the voltage U 1 + V 1 cos ⁇ 1 t applied to Q1 is stable based on the equations (8) and (9) as shown in FIG. 4b so that only a specific parent ion passes by mass separation.
- U 1 , V 1 , and ⁇ 1 are adjusted so as to be the vertices of the region.
- the mass number range of daughter ions that can be stably transmitted can be expanded simply by adjusting the applied voltages of Q1 and Q2, and the number of oscillations of the parent ions is almost the same as Q1, and the daughter ions We think that the effect that the generation efficiency does not decrease can be expected.
- the parent ion is charged with multiple charges (Z> 1).
- the mass-to-charge ratio m / z of the daughter ions generated by dissociating the parent ions is not necessarily smaller than the mass-to-charge ratio m / z of the parent ions.
- the mass-to-charge ratio m / z 2000 from the parent ion, and the mass-to-charge ratio increases.
- q 2 value of the parent ions in Q2 is set to be larger than q 1 value of the parent ion when the Q1.
- the control of the applied voltage of Q2 and the distance between the electrodes at this time may be replaced with ⁇ ⁇ 1 in the control content 12 in FIGS. According to this example, it can be expected that the same effects as those of the first and second examples can be expected even when the parent ion is multivalent and the daughter ion has a larger mass-to-charge ratio.
- the optimal value of the ⁇ value is automatically derived and automatically corrected to the optimal ⁇ value. It is characterized by. According to the present embodiment, since the optimum value of ⁇ is derived and set systematically without the user inputting the optimum ⁇ value, it is considered that analysis with high accuracy can be easily performed.
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Electron Tubes For Measurement (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Abstract
Description
従来は、図4aに示すように、Q1では、特定の質量対電荷比m/zを持つイオン種のみがQ1を通過させるため、安定透過領域の頂点付近の点に操作点が来るように、電極への印加電圧を調整し、Q2では、Q1を通過した親イオンを壊して生成される娘イオンを安定に通過させるため、操作点がa=0軸上になるように、直流電圧に対してのみU=0に変更し、高周波電圧に関しては変更されない。このとき、図4aに示すように、親イオンの安定性パラメータq値はほぼ変わらないため、親イオンを解離して生成される娘イオンは親イオンより低質量数であるため、m/Zが小さくなり、その結果、娘イオンのq値は(2)式に示すように、親イオンのq値より大きくなり、娘イオンの一部が安定領域外に出てしまい、安定に透過できず(検出されず)、感度が低下する可能性がある。
つまり、従来の方法では、次の2つの課題があると考える。
(1)娘イオンの軌道の不安定化(安定領域外に出ること)による感度低下
(2)娘イオンの生成効率低下(親イオンの振動回数低下)による感度低下
上記の課題を解決するためには、親イオンのq値を下げつつ、親イオンの基本振動周波数を下げない手段が必要となる。
まず、第一の実施例について、図1~5を用いて説明する。図1は第一実施例の特徴である、3段のQMSから成るタンデム型四重極質量分析装置を示す図であり、図2は、本実施例の質量分析システムの全体構成図である。まず、質量分析システム11に対して、分析フローを示す。質量分析対象の試料は、ガスクロマトグラフィー(GC)又は液体クロマトグラフィー(LC)などの前処理系1にて、時間的に分離・分画され、次々とイオン化部2にて、イオン化された試料イオンは、イオン輸送部3を通って、質量分析部4に入射され、質量分離される。ここで、mはイオン質量、Zはイオンの帯電価数である。質量分離部4への電圧は、制御部8から制御されながら、電圧源9から印加される。最終的に分離され通過してきたイオンは、イオン検出部5で検出され、データ処理部6でデータ整理・処理され、その分析結果である質量分析データは表示部7にて表示される。この一連の質量分析過程(試料のイオン化、試料イオンビームの質量分析部3への輸送及び入射、質量分離過程、及び、イオン検出、データ処理、ユーザ入力部10の指令処理)の全体を制御部8で制御している。ここで、質量分離部4は、図1に示すように、4本の棒状電極から成る四重極質量分析計(QMS)がほぼ同軸上に、3段連なって構成されている。ここで、4本以上の棒状電極から構成する多重極質量分析計としてもよい。また、図1に示すように、棒状電極の長手方向をz方向、断面方向をx,y平面とすると、棒状電極のx,y断面図にて示すように、4本の棒状電極は、円柱電極でも良く、また、点線で示したような双極面形状をした棒状電極でも良い。
2 イオン化部
3 イオン輸送部
4 質量分析部
5 イオン検出部
6 データ処理部
7 表示部
8 制御部
9 電圧源
10 ユーザ入力部
11 タンデム型質量分析システム全体
12 印加電圧制御内容
13 衝突室
14 第二実施例における印加電圧制御内容
15 第二実施例におけるQ2の電極
16 γ最適値導出部
Claims (12)
- 少なくとも4本の棒状電極を有し、前記棒状電極に直流電圧Uと高周波電圧VcosΩtとを印加して、前記棒状電極間に高周波の四重極以上の多重極電界を生成させ、特定の質量対電荷比m/zを持つイオン種を質量選択・分離する質量分析部と、当該質量分析部を通過したイオンを検出する検出器を有する、質量分析装置において、
前記質量分析部は、少なくとも2段以上同軸上に連ねて設けられており、
1段目の質量分析部と、2段目の質量分析部とで、ある特定のイオン種の基本振動周波数が1段目と2段目でほぼ同じとなるように、質量分析部の電極への印加電圧、または、電極間距離の半値r0を1段目と2段目で制御することを特徴とする質量分析装置。 - 請求項1に記載の質量分析装置において、
質量分析部を少なくとも3段持ち、1段目の質量分析部では、ある特定の質量対電荷比のイオン種のみを通過させ、2段目の質量分析部では、1段目を通過したある特定イオンに対して衝突解離などにより解離イオンを生成し、3段目の質量分析部で、解離イオンを質量分析することを特徴とする質量分析装置。 - 請求項1に記載の質量分析装置において、
1段目と2段目で、V/(r0 2Ω)の値がほぼ同じとなるように、1段目の質量分析部と、2段目の質量分析部とで、質量分析部の電極への印加電圧または前記棒状電極間距離を制御することを特徴とする質量分析装置。 - 請求項1に記載の質量分析装置において、
1段目と2段目で、高周波電圧の振幅値Vと角振動周波数Ωの比V/Ωの値がほぼ同じとなるように、1段目の質量分析部と、2段目の質量分析部とで、質量分析部の電極への印加電圧を制御することを特徴とする質量分析装置。 - 請求項1に記載の質量分析装置において、
前記棒状電極に印加する高周波電圧VcosΩtと前記棒状電極間距離の半値r0に対して、V/(r0 2Ω2)の値が、1段目の質量分析部の値と、2段目の質量分析部の値で、2段目の値の方がγ倍小さくなるように、質量分析部の電極への印加電圧または前記棒状電極間距離を制御することを特徴とする質量分析装置。 - 請求項1に記載の質量分析装置において、
前記棒状電極に印加する高周波電圧VcosΩtと前記棒状電極間距離の半値r0に対して、V/(r0 2Ω2)の値が、1段目の質量分析部の値と、2段目の質量分析部の値で、2段目の値の方がγ倍大きくなるように、質量分析部の電極への印加電圧または前記棒状電極間距離を制御することを特徴とする質量分析装置。 - 請求項1に記載の質量分析装置において、
前記棒状電極に印加する高周波電圧VcosΩtに対して、Ωの値が、1段目の質量分析部の値と、2段目の質量分析部の値で、2段目の値の方がγ倍大きくなるように、質量分析部の電極への印加電圧を制御することを特徴とする質量分析装置。 - 請求項1に記載の質量分析装置において、
前記棒状電極に印加する高周波電圧VcosΩtに対して、Ωの値が、1段目の質量分析部の値と、2段目の質量分析部の値で、2段目の値の方がγ倍小さくなるように、質量分析部の電極への印加電圧を制御することを特徴とする質量分析装置。 - 請求項5から8のいずれかに記載の質量分析装置において、
前記、γの値をある範囲内で振って、最適な分析結果が得られる最適なγの値を自動導出することを特徴とする質量分析装置。 - 少なくとも4本の棒状電極を有し、前記棒状電極に直流電圧Uと高周波電圧VcosΩtとを印加して、前記棒状電極間に高周波の四重極以上の多重極電界を生成させ、特定の質量対電荷比m/zを持つイオン種を質量選択・分離する質量分析部と、当該質量分析部を通過したイオンを検出する検出器を有する、質量分析装置において、
前記質量分析部は、少なくとも2段以上同軸上に連ねて設けられており、
1段目の質量分析部の安定性パラメータが2段目の質量分析部の安定性パラメータのγ倍(γ>1)となるように設定し、かつ、1段目の質量分析部の角振動周波数Ω1と2段目の質量分析部の角振動周波数Ω2とが以下の関係を満たすように設定されていることを特徴とする、質量分析装置。
Ω2=Ω1・γ’ 1<γ’≦γ
(安定パラメータ)=4eZV/Ω2mr0 2 (r0は対向する棒状電極間距離の半値、eは素電荷、Vは高周波電圧の振幅、Ωは角振動周波数) - 請求項10において、
上記安定パラメータの設定を棒状電極間距離の変更により行うことを特徴とする、質量分析装置。 - 請求項10において、
上記安定パラメータの設定を棒状電極への印加電極への制御により行うことを特徴とする、質量分析装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE112016000226.2T DE112016000226B4 (de) | 2015-01-15 | 2016-01-04 | Massenspektrometrievorrichtung |
GB1710781.4A GB2549645B (en) | 2015-01-15 | 2016-01-04 | Mass spectrometry device |
US15/542,505 US10229821B2 (en) | 2015-01-15 | 2016-01-04 | Mass spectrometry device |
JP2016569296A JP6315732B2 (ja) | 2015-01-15 | 2016-01-04 | 質量分析装置 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015-005481 | 2015-01-15 | ||
JP2015005481 | 2015-01-15 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2016114151A1 true WO2016114151A1 (ja) | 2016-07-21 |
Family
ID=56405699
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2016/050002 WO2016114151A1 (ja) | 2015-01-15 | 2016-01-04 | 質量分析装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US10229821B2 (ja) |
JP (1) | JP6315732B2 (ja) |
DE (1) | DE112016000226B4 (ja) |
GB (1) | GB2549645B (ja) |
WO (1) | WO2016114151A1 (ja) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005522845A (ja) * | 2002-04-05 | 2005-07-28 | エムディーエス インコーポレイテッド ドゥーイング ビジネス アズ エムディーエス サイエックス | 高次の多重極電界、低圧イオン・トラップ内での共振励起によるイオンのフラグメンテーション |
JP2007171200A (ja) * | 2005-12-23 | 2007-07-05 | Varian Inc | イオン断片化パラメータ選択システムおよび方法 |
JP2011511274A (ja) * | 2008-01-31 | 2011-04-07 | ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド | パルス圧力による低圧短時間高振幅励起を提供するための線形イオントラップの動作方法 |
JP2011511401A (ja) * | 2008-01-31 | 2011-04-07 | ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド | 低圧力短時間高振幅励起を提供するために線形イオントラップを動作する方法 |
JP2012516013A (ja) * | 2009-01-21 | 2012-07-12 | マイクロマス・ユーケイ・リミテッド | Ms/ms/msを行なう質量分析計 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CA2256028C (en) * | 1996-06-06 | 2007-01-16 | Mds Inc. | Axial ejection in a multipole mass spectrometer |
US5998787A (en) * | 1997-10-31 | 1999-12-07 | Mds Inc. | Method of operating a mass spectrometer including a low level resolving DC input to improve signal to noise ratio |
US6060705A (en) * | 1997-12-10 | 2000-05-09 | Analytica Of Branford, Inc. | Electrospray and atmospheric pressure chemical ionization sources |
JP2000105220A (ja) * | 1998-09-29 | 2000-04-11 | Ebara Corp | 芳香族有機塩素化合物の質量分析方法 |
US20030189168A1 (en) | 2002-04-05 | 2003-10-09 | Frank Londry | Fragmentation of ions by resonant excitation in a low pressure ion trap |
JP4687787B2 (ja) * | 2006-02-23 | 2011-05-25 | 株式会社島津製作所 | 質量分析方法及び質量分析装置 |
JP4947061B2 (ja) * | 2007-01-23 | 2012-06-06 | 株式会社島津製作所 | 質量分析装置 |
JP5124293B2 (ja) * | 2008-01-11 | 2013-01-23 | 株式会社日立ハイテクノロジーズ | 質量分析計および質量分析方法 |
CN102169791B (zh) * | 2010-02-05 | 2015-11-25 | 岛津分析技术研发(上海)有限公司 | 一种串级质谱分析装置及质谱分析方法 |
JP2012234632A (ja) * | 2011-04-28 | 2012-11-29 | Shimadzu Corp | 質量分析装置 |
-
2016
- 2016-01-04 DE DE112016000226.2T patent/DE112016000226B4/de active Active
- 2016-01-04 WO PCT/JP2016/050002 patent/WO2016114151A1/ja active Application Filing
- 2016-01-04 US US15/542,505 patent/US10229821B2/en active Active
- 2016-01-04 GB GB1710781.4A patent/GB2549645B/en active Active
- 2016-01-04 JP JP2016569296A patent/JP6315732B2/ja active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005522845A (ja) * | 2002-04-05 | 2005-07-28 | エムディーエス インコーポレイテッド ドゥーイング ビジネス アズ エムディーエス サイエックス | 高次の多重極電界、低圧イオン・トラップ内での共振励起によるイオンのフラグメンテーション |
JP2007171200A (ja) * | 2005-12-23 | 2007-07-05 | Varian Inc | イオン断片化パラメータ選択システムおよび方法 |
JP2011511274A (ja) * | 2008-01-31 | 2011-04-07 | ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド | パルス圧力による低圧短時間高振幅励起を提供するための線形イオントラップの動作方法 |
JP2011511401A (ja) * | 2008-01-31 | 2011-04-07 | ディーエイチ テクノロジーズ デベロップメント プライベート リミテッド | 低圧力短時間高振幅励起を提供するために線形イオントラップを動作する方法 |
JP2012516013A (ja) * | 2009-01-21 | 2012-07-12 | マイクロマス・ユーケイ・リミテッド | Ms/ms/msを行なう質量分析計 |
Also Published As
Publication number | Publication date |
---|---|
GB2549645A (en) | 2017-10-25 |
US10229821B2 (en) | 2019-03-12 |
GB201710781D0 (en) | 2017-08-16 |
DE112016000226B4 (de) | 2020-10-15 |
US20180269049A1 (en) | 2018-09-20 |
GB2549645B (en) | 2020-09-16 |
JPWO2016114151A1 (ja) | 2017-12-21 |
DE112016000226T5 (de) | 2017-09-07 |
JP6315732B2 (ja) | 2018-04-25 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP3038134A1 (en) | Multipole ion guides utilizing segmented and helical electrodes, and related systems and methods | |
JP5376468B2 (ja) | 高速振動する電場によるイオンの閉じ込め | |
CN108369890B (zh) | 质量分析装置 | |
JP2001351571A (ja) | イオントラップ型質量分析方法及び質量分析装置 | |
JP6022383B2 (ja) | 質量分析システム、及び方法 | |
JP6277272B2 (ja) | 質量分析装置 | |
WO2016174990A1 (ja) | 質量分析装置 | |
WO2018193637A1 (en) | Ion guide device with dc field and associated methods | |
JP6315732B2 (ja) | 質量分析装置 | |
JP2005259616A (ja) | 四重極質量分析装置 | |
JP6593451B2 (ja) | 四重極マスフィルタ及び四重極型質量分析装置 | |
JP6711407B2 (ja) | イオンガイド及び質量分析装置 | |
US9799503B2 (en) | Traveling-well ion guides and related systems and methods | |
US11087968B2 (en) | Traveling wave multipole | |
JP2012234632A (ja) | 質量分析装置 | |
EP0023826B1 (en) | Tandem quadrupole mass spectrometer system | |
JP6735620B2 (ja) | 質量分析装置 | |
CN111816543A (zh) | 一种棱柱离子导引系统 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 16737222 Country of ref document: EP Kind code of ref document: A1 |
|
ENP | Entry into the national phase |
Ref document number: 2016569296 Country of ref document: JP Kind code of ref document: A |
|
ENP | Entry into the national phase |
Ref document number: 201710781 Country of ref document: GB Kind code of ref document: A Free format text: PCT FILING DATE = 20160104 |
|
WWE | Wipo information: entry into national phase |
Ref document number: 15542505 Country of ref document: US |
|
WWE | Wipo information: entry into national phase |
Ref document number: 112016000226 Country of ref document: DE |
|
122 | Ep: pct application non-entry in european phase |
Ref document number: 16737222 Country of ref document: EP Kind code of ref document: A1 |