WO2016090843A1 - 测试探头及测试设备 - Google Patents

测试探头及测试设备 Download PDF

Info

Publication number
WO2016090843A1
WO2016090843A1 PCT/CN2015/078861 CN2015078861W WO2016090843A1 WO 2016090843 A1 WO2016090843 A1 WO 2016090843A1 CN 2015078861 W CN2015078861 W CN 2015078861W WO 2016090843 A1 WO2016090843 A1 WO 2016090843A1
Authority
WO
WIPO (PCT)
Prior art keywords
probe
test
base
elastically stretchable
test probe
Prior art date
Application number
PCT/CN2015/078861
Other languages
English (en)
French (fr)
Inventor
王雪鹏
殷兆伟
Original Assignee
京东方科技集团股份有限公司
北京京东方光电科技有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 京东方科技集团股份有限公司, 北京京东方光电科技有限公司 filed Critical 京东方科技集团股份有限公司
Priority to US14/769,782 priority Critical patent/US10281490B2/en
Publication of WO2016090843A1 publication Critical patent/WO2016090843A1/zh

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0207—Details of measuring devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card

Definitions

  • the invention relates to the field of display testing, in particular to a test probe and a test device.
  • connection mode is as shown in FIG. Specifically, first, a silver paste 300' is applied to the test area of the liquid crystal panel 100', then a solder wire 400' is fabricated, and the solder wire 400' is fixed with a paper tape, and finally the detection signal line 200' of the optical device is passed through the test clip 500'. Connected to the solder wire 400'.
  • the technical problem to be solved by the present invention is to provide a test probe and a test device, which can simplify the preparation work before the test and improve the test efficiency.
  • the present invention provides a test probe comprising a base, an elastic expansion element, and a probe, the probe being disposed on the base by the elastic expansion element, and the elasticity
  • the telescopic element is in a stretched state.
  • the probe is in contact with the base under the force of the elastic expansion element.
  • the base has a recess and the elastic expansion element is disposed at the recess.
  • the depth of the recess is greater than the height of the elastically stretchable element in its natural state.
  • the longitudinal section of the base is L-shaped or concave.
  • the test probe comprises a plurality of the elastically stretchable elements.
  • the probe is disposed on the base by the first elastically stretchable element being stretched and the second elastically stretchable element being compressed.
  • the probe includes a needle shaft portion and a needle head, and an angle between the needle shaft portion and the needle head ranges from 90 degrees to 160 degrees.
  • the tip of the probe is at or below the level of the bottom surface of the base.
  • the test probe further comprises a probe carrier for carrying the probe, the probe being connected to the elastic expansion element via the probe holder and disposed on the base.
  • the present invention also provides a test apparatus comprising any one of the above test probes.
  • the test probe provided by the invention only needs to apply silver glue in the test area of the liquid crystal screen in advance, and no need to make solder wire, fixed solder wire, etc., so that the preparation work before the test can be greatly simplified, and the connection can be ensured. Reliability, which greatly reduces test time and improves test efficiency.
  • FIG. 1 is a schematic diagram of testing a liquid crystal panel using an optical device in the prior art
  • FIG. 2 is a schematic diagram of a first test probe provided by an embodiment of the present invention.
  • FIG. 3 is a schematic diagram of testing a liquid crystal panel by using a test probe provided by an embodiment of the present invention
  • FIG. 4 is a schematic diagram of a second test probe according to an embodiment of the present invention.
  • FIG. 5 is a schematic diagram of a third test probe according to an embodiment of the present invention.
  • FIG. 6 is a schematic diagram of a fourth test probe according to an embodiment of the present invention.
  • FIG. 7 is a schematic diagram of a fifth test probe according to an embodiment of the present invention.
  • FIG. 8 is a schematic diagram of a probe provided by an embodiment of the present invention.
  • Embodiments of the present invention provide a test probe including a base, an elastic expansion element, and a probe, the probe being disposed on the base by the elastic expansion element, and the elastic expansion element being pulled Stretched state.
  • the base has a recess having a depth greater than a height of the elastic expansion element in a natural state, one end of the elastic expansion element is disposed at the recess, and the other end of the elastic expansion element is The probes are coupled such that the probe contacts the base under the force of the elastic expansion element.
  • the test probe includes a base 1, an elastic expansion element 3, and a probe 2.
  • the base has an L-shaped longitudinal section, and includes a lateral portion 1a and a longitudinal portion 1b which together form a recess together with the longitudinal portion 1b.
  • One end of the elastically stretchable element 3 is connected to the recess, and the other end of the elastically stretchable element 3 is connected to the probe 2.
  • the elastically stretchable element 3 can be a spring or any other element made of an elastic material. Since the depth of the recess is greater than the height of the elastically stretchable element 3 in the natural state, the probe 2 comes into contact with the base 1 under the tensile force of the elastically stretchable element 3.
  • the probe 2 is connected to the detection signal line 200 of the optical device.
  • the silver paste 300 may be coated on the test area of the liquid crystal panel 100 before the liquid crystal panel 100 is tested. During the testing of the liquid crystal panel 100, the tip of the probe 2 was moved over the test area coated with the silver paste 300. The tip of the probe 2 is inserted into the coated silver paste 300 under the tensile force of the elastically stretchable member 3, thereby achieving connection of the optical device to the liquid crystal panel to be tested.
  • the needle tip 2c of the needle head 2b is located at the same level as the bottom surface 1c of the base 1, thereby facilitating the smoothing of the tip of the probe during testing of the liquid crystal panel.
  • the needle tip 2c of the needle head 2b is below the horizontal plane in which the bottom surface 1c of the base 1 is located.
  • the reliability of the connection is improved, and the probe 2 is in the elastic expansion element without testing the liquid crystal screen.
  • the tensile force of 3 is in contact with the base 1, that is, the elastically stretchable member 3 is in a stretched state.
  • the elastically stretchable member 3 is further stretched to increase the tension applied to the probe, thereby increasing the extent to which the tip 2c is inserted into the silver paste applied to the test area.
  • the probe 2 can be disposed on the base 1 through a plurality of elastic expansion elements 3.
  • the tension applied to the probe can be greatly improved.
  • the degree to which the probe tip 2c of the probe is stuck into the silver paste applied on the test area during the test of the liquid crystal panel is further increased.
  • the test probe provided by the embodiment of the invention only needs to apply silver glue on the test area of the liquid crystal screen in advance, and no need to make solder wire, fixed solder wire, etc., so that the preparation work before the test can be greatly simplified, and It can ensure the reliability of the connection, which greatly shortens the test time and improves the test efficiency.
  • FIG. 5 is a schematic diagram of another test probe provided by an embodiment of the present invention.
  • the test probe includes a base 1 having a rectangular cross-sectional shape, a first elastically stretchable member 31, a second elastically stretchable member 32, and a probe 2.
  • the probe 2 is disposed on the base by the first elastically stretchable element 31 that is stretched and the second elastically stretchable element 32 that is compressed.
  • the first elastically stretchable member 31 when not tested, the first elastically stretchable member 31 is in a stretched state, the second elastically stretchable member 32 is in a compressed state, and at the same time the probe is in contact with one end of the base 1 by the two elastically stretchable members. Thereby, it is supported by the base 1 to maintain balance.
  • the premise of this balance is that the two elastically stretchable members can only maintain the vertical expansion and contraction in the drawing without bending left and right.
  • FIG. 6 is a schematic diagram of still another test probe according to an embodiment of the present invention.
  • the test probe includes a base 1 having a longitudinal cross-sectional shape of a concave shape, an elastically stretchable member 3, and a probe 2.
  • the elastically stretchable member 3 is disposed at a recess of the base 1.
  • the elastically stretchable member 3 is in a stretched state, and the probe 2 is balanced under the tensile force of the elastically stretchable member 3 and the supporting force of the base 1.
  • the tip of the probe is raised, so that the elastically stretchable element is further stretched, so that the probe can be pulled into the silver paste coated on the test area under the force of its tension.
  • the above test probe further includes a probe holder for carrying the probe.
  • the probe 2 is disposed on the probe holder 4.
  • one end of the elastic expansion element 3 can be connected to the base 1, and the other end of the elastic expansion element 3 can be connected to the probe 2 through the probe holder 4.
  • the probe holder 4 can not only improve the stability of the probe during testing on the liquid crystal panel, but also facilitate the replacement of the probe.
  • the probe 2 includes a needle bar portion 2a and a needle portion 2b.
  • the angle ⁇ between the needle bar portion 2a and the needle portion 2b may range from 90 degrees to 160 degrees, for example, 100 degrees and 130 degrees. , 150 degrees, etc.
  • the angle of the angle ⁇ can be set according to the specific situation. For example, an appropriate angle can be set so that the tip of the probe is at the same level as the bottom surface of the base without testing the liquid crystal panel. Alternatively, the angle may not be set so that the tip of the probe is below the level of the bottom surface of the base without testing the liquid crystal panel.
  • embodiments of the present invention also provide a test apparatus including any of the test probes described above.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Analytical Chemistry (AREA)
  • Liquid Crystal (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

一种测试探头，该测试探头包括底座、弹性伸缩元件以及探针，所述探针通过所述弹性伸缩元件设置在所述底座上，并且所述弹性伸缩元件处于被拉伸状态。一种测试设备，包括上述测试探头。

Description

测试探头及测试设备 技术领域
本发明涉及显示器测试领域，尤其涉及一种测试探头及测试设备。
背景技术
在液晶显示器的生产过程中，为保证产品的质量，通常需要对产品的光学参数(如VT、RT等)进行测试。目前，通常采用光学设备(如DMS900)进行测试，在测试前需要进行准备工作以便将光学设备的检测信号线连接至液晶屏的测试区域，其连接方式如图1所示。具体地，首先在液晶屏100’的测试区域涂覆银胶300’，而后制作焊锡丝400’，并用纸胶带固定焊锡丝400’，最后通过测试夹500’将光学设备的检测信号线200’与焊锡丝400’连接。上述的测试前的准备工作异常繁琐，而且在准备工作完成之后，也不能确保在测试期间电路完全导通和准确无误，反而经常出现断路、短路等现象，继而出现无测试数据或测试数据不准确等现象。
发明内容
(一)要解决的技术问题
本发明要解决的技术问题是提供一种测试探头及测试设备，能够简化测试前的准备工作并提高测试效率。
(二)技术方案
为解决上述技术问题，本发明提供了一种测试探头，其特征在于，包括底座、弹性伸缩元件以及探针，所述探针通过所述弹性伸缩元件设置在所述底座上，并且所述弹性伸缩元件处于被拉伸状态。
根据一个实施例，所述探针在所述弹性伸缩元件的拉力的作用下与所述底座相接触。
根据一个实施例，所述底座具有凹陷，并且所述弹性伸缩元件设置于所述凹陷处。
根据一个实施例，所述凹陷的深度大于所述弹性伸缩元件在自然状态下的高度。
根据一个实施例，所述底座的纵向截面为L形或凹形。
根据一个实施例，所述测试探头包括多个所述弹性伸缩元件。
根据一个实施例，所述探针通过被拉伸的第一弹性伸缩元件以及被压缩的第二弹性伸缩元件设置在所述底座上。
根据一个实施例，所述探针包括针杆部和针头部，所述针杆部与针头部之间的夹角的范围为90度～160度。
根据一个实施例，所述探针的针尖与所述底座的底面位于同一水平面或处于该水平面之下。
根据一个实施例，所述测试探头还包括用于承载所述探针的探针托架，所述探针经由所述探针托架与所述弹性伸缩元件相连并且设置在所述底座上。
为解决上述技术问题，本发明还提供了一种测试设备，包括上述的测试探头中的任一种。
(三)有益效果
本发明提供的测试探头，只需事先在液晶屏的测试区域涂覆银胶，而不再需要制作焊锡丝、固定焊锡丝等步骤，因此不但能够大大简化测试前的准备工作，还能保证连接的可靠性，从而大大缩短测试时间，提高测试效率。
附图说明
图1为现有技术中利用光学设备对液晶屏进行测试的示意图；
图2为本发明的实施方式提供的第一种测试探头的示意图；
图3为利用本发明的实施方式提供的测试探头对液晶屏进行测试的示意图；
图4为本发明的实施方式提供的第二种测试探头的示意图；
图5为本发明的实施方式提供的第三种测试探头的示意图；
图6为本发明的实施方式提供的第四种测试探头的示意图；
图7为本发明的实施方式提供的第五种测试探头的示意图；
图8为本发明的实施方式提供的一种探针的示意图。
具体实施方式
下面结合附图和实施例，对本发明的具体实施方式作进一步的详细描述。以下实施例用于说明本发明，而不用来限制本发明的范围。
本发明实施方式提供了一种测试探头，该测试探头包括底座、弹性伸缩元件以及探针，所述探针通过所述弹性伸缩元件设置在所述底座上，并且所述弹性伸缩元件处于被拉伸状态。具体地，所述底座具有凹陷，所述凹陷的深度大于所述弹性伸缩元件在自然状态下的高度，所述弹性伸缩元件的一端设置于所述凹陷处，所述弹性伸缩元件的另一端与所述探针相连接，从而使得所述探针在所述弹性伸缩元件的拉力的作用下与所述底座相接触。
如图2所示，该测试探头包括底座1、弹性伸缩元件3以及探针2。所述底座的纵向截面为L形，包括横向部分1a和纵向部分1b，该横向部分1a和纵向部分1b一起形成凹陷。该弹性伸缩元件3的一端连接至该凹陷处，弹性伸缩元件3的另一端连接至所述探针2。
弹性伸缩元件3可以为弹簧或者任何其他由弹性材料制作的元件。由于凹陷的深度大于弹性伸缩元件3在自然状态下的高度，因此所述探针2在所述弹性伸缩元件3的拉力的作用下与所述底座1相接触。
如图3所示，探针2与光学设备的检测信号线200连接。在对液晶屏100进行测试之前，可在液晶屏100的测试区域上涂覆银胶300。在对液晶屏100进行测试期间，使探针2的针尖移动至涂覆有银胶300的测试区域上方。探针2的针尖在弹性伸缩元件3的拉力的作用下扎入涂覆的银胶300中，从而实现光学设备与被测试的液晶屏的连接。
如图2所示，在未对液晶屏进行测试的情况下，针头部2b的针尖2c与底座1的底面1c位于同一水平面，从而有利于在对液晶屏进行测试期间使探针的针尖顺利扎入液晶屏的测试区域上涂覆的银胶中。可替换地，在未对液晶屏进行测试的情况下，针头部2b的针尖2c处于底座1的底面1c所在的水平面之下。
此外，为了增加针尖2c在对液晶屏进行测试期间扎入测试区域上涂覆的银胶的程度，提高连接的可靠性，在未对液晶屏进行测试的情况下，探针2在弹性伸缩元件3的拉力的作用下与底座1相接触，即弹性伸缩元件3处于被拉伸状态。在对液晶屏进行测试期间，弹性伸缩元件3进一步被拉伸，从而增加探针所受到的拉力，进而增加针尖2c扎入测试区域上涂覆的银胶的程度。
如图4所示，探针2可通过多个弹性伸缩元件3设置在所述底座1上。通过设置多个弹性伸缩元件，能够大大提高探针所受到的拉力， 从而进一步地增加探针的针尖2c在对液晶屏进行测试期间扎入测试区域上涂覆的银胶的程度。
本发明实施方式提供的测试探头，只需事先在液晶屏的测试区域上涂覆银胶，而不再需要制作焊锡丝、固定焊锡丝等步骤，因此不但能够大大简化测试前的准备工作，还能保证连接的可靠性，从而大大缩短测试时间，提高测试效率。
此外，本发明的实施方式中的底座的截面形状不但可以为如图2所示的L形，还可以为其他形状。参见图5，图5是本发明的实施方式提供的另一种测试探头的示意图。该测试探头包括截面形状为矩形的底座1、第一弹性伸缩元件31、第二弹性伸缩元件32以及探针2。其中，探针2通过被拉伸的第一弹性伸缩元件31以及被压缩的第二弹性伸缩元件32设置在所述底座上。具体地，在未进行测试时，第一弹性伸缩元件31处于被拉伸状态，第二弹性伸缩元件32处于压缩状态并且同时探针在两个弹性伸缩元件的作用下与底座1的一端相接触，由此受到底座1的支撑力以保持平衡。当然如本领域技术人员容易理解的，这种平衡的前提是该两个弹性伸缩元件只能保持在图中的竖直方向的伸缩，而不会左右弯曲。在进行测试时，探针的针尖被抬高，使得第一弹性伸缩元件31进一步被拉伸，进而使得探针在其拉力的作用下能够扎入测试区域中。
参见图6，图6是本发明的实施方式提供的又一种测试探头的示意图。该测试探头包括纵向截面形状为凹形的底座1、弹性伸缩元件3以及探针2。弹性伸缩元件3设置在该底座1的凹陷处。当未对液晶屏进行测试时，弹性伸缩元件3处于被拉伸状态，并且探针2在弹性伸缩元件3的拉力以及底座1的支撑力下保持平衡。当对液晶屏进行测试期间，探针的针尖被抬高，从而使得弹性伸缩元件进一步被拉伸，进而使得探针在其拉力的作用下能够扎入测试区域上涂覆的银胶中。
为了提高探针在对液晶屏进行测试期间的稳固性，上述的测试探头还包括用于承载所述探针的探针托架。如图7所示，探针2设置在探针托架4上。例如，可使弹性伸缩元件3的一端连接至底座1，弹性伸缩元件3的另一端通过探针托架4连接探针2。通过该探针托架4，不但能够提高探针在对液晶屏进行测试期间的稳固性，还能够便于更换探针。
对于上述所有实施方式中的探针，如图8所示，探针2包括针杆部分2a和针头部分2b。为了便于探针的针尖扎入测试区域上涂覆的银胶中，针杆部分2a与针头部分2b之间的夹角θ的范围可以为90度～160度，例如可以为100度、130度、150度等。可以根据具体情况设置夹角θ的角度。例如，可设置适当的角度，以使在未对液晶屏进行测试的情况下探针的针尖与底座的底面位于同一水平面。可替换地，也可没置适当的角度，以使在未对液晶屏进行测试的情况下，探针的针尖处于底座的底面所在的水平面之下。
此外，本发明的实施方式还提供了一种测试设备，该测试设备包括上述的测试探头中的任一种。
以上实施方式仅用于说明本发明，而并非对本发明的限制。有关技术领域的普通技术人员，在不脱离本发明的精神和范围的情况下，还可以做出各种变化和变型。因此所有等同的技术方案也落入本发明的范围，本发明的专利保护范围应由所附的权利要求限定。

Claims (11)

  1. 一种测试探头，其特征在于，包括底座、弹性伸缩元件以及探针，所述探针通过所述弹性伸缩元件设置在所述底座上，并且所述弹性伸缩元件处于被拉伸状态。
  2. 根据权利要求1所述的测试探头，其特征在于，所述探针在所述弹性伸缩元件的拉力的作用下与所述底座相接触。
  3. 根据权利要求2所述的测试探头，其特征在于，所述底座具有凹陷，并且所述弹性伸缩元件设置于所述凹陷处。
  4. 根据权利要求3所述的测试探头，其特征在于，所述凹陷的深度大于所述弹性伸缩元件在自然状态下的高度。
  5. 根据权利要求4所述的测试探头，其特征在于，所述底座的纵向截面为L形或凹形。
  6. 根据权利要求1所述的测试探头，其特征在于，包括多个所述弹性伸缩元件。
  7. 根据权利要求1所述的测试探头，其特征在于，所述探针通过被拉伸的第一弹性伸缩元件以及被压缩的第二弹性伸缩元件设置在所述底座上。
  8. 根据权利要求1-7中任一项所述的测试探头，其特征在于，所述探针包括针杆部和针头部，所述针杆部与针头部之间的夹角的范围为90度～160度。
  9. 根据权利要求1-7中任一项所述的测试探头，其特征在于，所述探针的针尖与所述底座的底面位于同一水平面或处于该水平面之下。
  10. 根据权利要求1-7中任一项所述的测试探头，其特征在于，还包括用于承载所述探针的探针托架，所述探针经由所述探针托架与所述弹性伸缩元件相连并且设置在所述底座上。
  11. 一种测试设备，其特征在于，包括如权利要求1-10中任一项所述的测试探头。
PCT/CN2015/078861 2014-12-09 2015-05-13 测试探头及测试设备 WO2016090843A1 (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US14/769,782 US10281490B2 (en) 2014-12-09 2015-05-13 Testing probe for testing liquid crystal screen and testing device comprising the same

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201410748723.X 2014-12-09
CN201410748723.XA CN104460061B (zh) 2014-12-09 2014-12-09 测试探头及测试设备

Publications (1)

Publication Number Publication Date
WO2016090843A1 true WO2016090843A1 (zh) 2016-06-16

Family

ID=52906361

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2015/078861 WO2016090843A1 (zh) 2014-12-09 2015-05-13 测试探头及测试设备

Country Status (3)

Country Link
US (1) US10281490B2 (zh)
CN (1) CN104460061B (zh)
WO (1) WO2016090843A1 (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104460061B (zh) * 2014-12-09 2018-06-05 京东方科技集团股份有限公司 测试探头及测试设备
CN108022848B (zh) * 2016-11-01 2020-10-27 稳懋半导体股份有限公司 改良式同轴探针结构
CN107402318A (zh) * 2017-08-31 2017-11-28 京东方科技集团股份有限公司 探针组件及测试设备

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09251033A (ja) * 1996-03-15 1997-09-22 Sharp Corp 液晶表示パネルの検査装置
CN101604499A (zh) * 2009-07-17 2009-12-16 友达光电股份有限公司 测试装置
CN102289090A (zh) * 2011-08-24 2011-12-21 深圳市华星光电技术有限公司 玻璃基板的检测装置
CN202650485U (zh) * 2012-07-06 2013-01-02 北京京东方光电科技有限公司 一种电压测试调节工具
CN203011958U (zh) * 2012-12-26 2013-06-19 深圳市华星光电技术有限公司 用于液晶显示面板的测试夹具
CN104460061A (zh) * 2014-12-09 2015-03-25 京东方科技集团股份有限公司 测试探头及测试设备
CN204241796U (zh) * 2014-12-09 2015-04-01 京东方科技集团股份有限公司 测试探头及测试设备

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5295839A (en) * 1993-03-16 1994-03-22 Hewlett-Packard Company Method and system for interconnectingly engaging circuits
EP0616395B1 (en) * 1993-03-16 1997-09-10 Hewlett-Packard Company Method and system for producing electrically interconnected circuits
JPH09211048A (ja) * 1996-01-30 1997-08-15 Sanyo Electric Co Ltd 液晶表示パネル検査装置
US5733151A (en) * 1996-08-23 1998-03-31 Edsall; David Electrical clamping connection device
US6287126B1 (en) * 1999-06-25 2001-09-11 International Business Machines Corporation Mechanical attachment means used as electrical connection
KR100745104B1 (ko) * 2000-06-16 2007-08-01 니혼 하츠쵸 가부시키가이샤 컨택터 프로브, 전기 프로브 유닛, 컨택터 프로브를 위한 프로브 어셈블리와 절연체의 조합체 및 컨택터 프로브를 위한 탄성의 도전성 프로브 어셈블리
US8963571B2 (en) 2011-08-24 2015-02-24 Shenzhen China Star Optoelectronics Technology Co., Ltd. Inspection device for glass substrate
US9674943B2 (en) * 2012-12-06 2017-06-06 Intel Corporation Actuation mechanisms for electrical interconnections

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09251033A (ja) * 1996-03-15 1997-09-22 Sharp Corp 液晶表示パネルの検査装置
CN101604499A (zh) * 2009-07-17 2009-12-16 友达光电股份有限公司 测试装置
CN102289090A (zh) * 2011-08-24 2011-12-21 深圳市华星光电技术有限公司 玻璃基板的检测装置
CN202650485U (zh) * 2012-07-06 2013-01-02 北京京东方光电科技有限公司 一种电压测试调节工具
CN203011958U (zh) * 2012-12-26 2013-06-19 深圳市华星光电技术有限公司 用于液晶显示面板的测试夹具
CN104460061A (zh) * 2014-12-09 2015-03-25 京东方科技集团股份有限公司 测试探头及测试设备
CN204241796U (zh) * 2014-12-09 2015-04-01 京东方科技集团股份有限公司 测试探头及测试设备

Also Published As

Publication number Publication date
US10281490B2 (en) 2019-05-07
CN104460061B (zh) 2018-06-05
CN104460061A (zh) 2015-03-25
US20170315151A1 (en) 2017-11-02

Similar Documents

Publication Publication Date Title
TWI558992B (zh) Flexible screen bending test methods and systems
KR102229364B1 (ko) 표시장치의 테스트 장치 및 그 장치를 이용한 테스트 방법
WO2016090843A1 (zh) 测试探头及测试设备
CN106124291B (zh) 一种连续测量薄膜变形的装置及方法
CN105892112B (zh) 一种用于液晶显示的框胶粘合力检测装置
CN205333413U (zh) 一种环状试样拉伸卡具
CN207662362U (zh) 一种用于手机玻璃基板的平面度和电性能测试装置
KR101189666B1 (ko) 평판디스플레이 검사용 프로브 유닛
CN205809175U (zh) 一种pcb板阻抗测试探头
KR101235076B1 (ko) 필름타입 프로브유닛
KR101255095B1 (ko) 필름 타입 핀 보드
CN205353505U (zh) 一种液晶显示模组的测试治具
CN204241796U (zh) 测试探头及测试设备
CN203894259U (zh) 装pin式lcd显示屏的便捷式测试夹具
CN208889303U (zh) 用于检测显示面板的机构
CN206863064U (zh) 显示屏测试治具
CN207704155U (zh) 一种主动式循环tft测试架
CN104464583B (zh) 一种点灯检测装置以及方法
CN206177553U (zh) 一种led灯条的测试装置
CN207663177U (zh) 一种用于手机玻璃基板的tft测试装置
CN206945749U (zh) 一种用于检测电容器的导针与极箔铆接阻抗的测试治具
CN205909957U (zh) 一种测试架转盘装置
KR100999862B1 (ko) 액정디스플레이 검사용 프로브블록
CN105204199B (zh) 测试机台及测试装置
KR100899978B1 (ko) 프로브유닛과 니들

Legal Events

Date Code Title Description
WWE Wipo information: entry into national phase

Ref document number: 14769782

Country of ref document: US

121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 15868303

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 15868303

Country of ref document: EP

Kind code of ref document: A1