WO2016088644A1 - Dispositif d'imagerie à semi-conducteurs - Google Patents

Dispositif d'imagerie à semi-conducteurs Download PDF

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Publication number
WO2016088644A1
WO2016088644A1 PCT/JP2015/083239 JP2015083239W WO2016088644A1 WO 2016088644 A1 WO2016088644 A1 WO 2016088644A1 JP 2015083239 W JP2015083239 W JP 2015083239W WO 2016088644 A1 WO2016088644 A1 WO 2016088644A1
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WO
WIPO (PCT)
Prior art keywords
optical layer
wavelength
compound
solid
imaging device
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PCT/JP2015/083239
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English (en)
Japanese (ja)
Inventor
勝也 長屋
坪内 孝史
遵生子 嶋田
耕治 畠山
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Jsr株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Jsr株式会社 filed Critical Jsr株式会社
Priority to JP2016562404A priority Critical patent/JP6669079B2/ja
Publication of WO2016088644A1 publication Critical patent/WO2016088644A1/fr

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/14601Structural or functional details thereof
    • H01L27/14625Optical elements or arrangements associated with the device
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/20Filters
    • G02B5/22Absorbing filters
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N5/00Details of television systems
    • H04N5/30Transforming light or analogous information into electric information
    • H04N5/33Transforming infrared radiation

Abstract

La présente invention aborde le problème de la fourniture d'un dispositif d'imagerie à semi-conducteurs qui minimise les coûts de production et qui présente une haute précision de détection. Un dispositif d'imagerie à semi-conducteurs est pourvu : d'une première couche optique qui transmet la lumière visible et au moins une partie de la lumière proche infrarouge; une seconde couche optique qui absorbe au moins une partie de la lumière proche infrarouge; et une matrice de pixels comprenant un premier élément de réception de lumière qui détecte la lumière visible transmise par les première et deuxième couches optiques et un second élément de réception de lumière qui détecte la lumière proche infrarouge transmise par la première couche optique. La seconde couche optique comprend une ouverture dans une partie de celle-ci correspondant au second élément de réception de lumière. Lorsque la bande de longueur d'onde de la longueur d'onde la plus courte (X1) ayant une transmittance de 30 % ou plus à la longueur d'onde la plus longue (X2) ayant une transmittance de 30 % ou moins parmi les longueurs d'onde dans une plage prédéfinie à l'intérieur de la lumière proche infrarouge dans la première couche optique telle que mesurée dans la direction verticale est désignée par X, le produit de la transmittance moyenne dans la direction verticale dans la bande de longueur d'onde (X) dans la première couche optique et la transmittance moyenne dans la direction verticale dans la bande de longueur d'onde (X) dans la deuxième couche optique est de 70 % ou moins.
PCT/JP2015/083239 2014-12-04 2015-11-26 Dispositif d'imagerie à semi-conducteurs WO2016088644A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2016562404A JP6669079B2 (ja) 2014-12-04 2015-11-26 固体撮像装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2014245884 2014-12-04
JP2014-245884 2014-12-04

Publications (1)

Publication Number Publication Date
WO2016088644A1 true WO2016088644A1 (fr) 2016-06-09

Family

ID=56091590

Family Applications (1)

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PCT/JP2015/083239 WO2016088644A1 (fr) 2014-12-04 2015-11-26 Dispositif d'imagerie à semi-conducteurs

Country Status (3)

Country Link
JP (1) JP6669079B2 (fr)
TW (1) TW201622125A (fr)
WO (1) WO2016088644A1 (fr)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016109809A (ja) * 2014-12-04 2016-06-20 旭硝子株式会社 光学フィルタ
JP2018025732A (ja) * 2016-07-27 2018-02-15 京セラ株式会社 光学フィルタ部材および撮像装置
WO2018135208A1 (fr) * 2017-01-18 2018-07-26 ソニーセミコンダクタソリューションズ株式会社 Dispositif d'imagerie et système d'imagerie
KR20190091322A (ko) * 2016-12-07 2019-08-05 소시에떼 프랑세즈 뒤 드테끄퇴르 인프라루즈 소프라디르 개선된 다중 스펙트럼 검출을 위한 디바이스
KR20200103069A (ko) 2018-03-16 2020-09-01 후지필름 가부시키가이샤 구조체, 근적외선 차단 필터용 조성물, 드라이 필름, 구조체의 제조 방법, 광센서 및 화상 표시 장치
US11982939B2 (en) 2018-03-16 2024-05-14 Fujifilm Corporation Composition, film, dry film, pattern forming method, near-infrared transmitting filter, structure, optical sensor, and image display device

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08139982A (ja) * 1994-11-11 1996-05-31 Sanyo Electric Co Ltd 固体撮像装置
JP2000212546A (ja) * 1998-11-17 2000-08-02 Nisshinbo Ind Inc 近赤外吸収組成物
JP2003324751A (ja) * 2002-05-07 2003-11-14 Toshiba Corp 情報入力装置
JP2011101006A (ja) * 2009-11-04 2011-05-19 Samsung Electronics Co Ltd 映像センサ及びその製造方法
JP2012185468A (ja) * 2010-12-17 2012-09-27 Nippon Shokubai Co Ltd 光選択透過フィルター、樹脂シート及び固体撮像素子
JP2014103657A (ja) * 2012-11-20 2014-06-05 Visera Technologies Company Ltd イメージセンシング装置
WO2015056734A1 (fr) * 2013-10-17 2015-04-23 Jsr株式会社 Filtre optique, dispositif à semi-conducteurs de capture d'image et module de caméra

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08139982A (ja) * 1994-11-11 1996-05-31 Sanyo Electric Co Ltd 固体撮像装置
JP2000212546A (ja) * 1998-11-17 2000-08-02 Nisshinbo Ind Inc 近赤外吸収組成物
JP2003324751A (ja) * 2002-05-07 2003-11-14 Toshiba Corp 情報入力装置
JP2011101006A (ja) * 2009-11-04 2011-05-19 Samsung Electronics Co Ltd 映像センサ及びその製造方法
JP2012185468A (ja) * 2010-12-17 2012-09-27 Nippon Shokubai Co Ltd 光選択透過フィルター、樹脂シート及び固体撮像素子
JP2014103657A (ja) * 2012-11-20 2014-06-05 Visera Technologies Company Ltd イメージセンシング装置
WO2015056734A1 (fr) * 2013-10-17 2015-04-23 Jsr株式会社 Filtre optique, dispositif à semi-conducteurs de capture d'image et module de caméra

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016109809A (ja) * 2014-12-04 2016-06-20 旭硝子株式会社 光学フィルタ
JP2018025732A (ja) * 2016-07-27 2018-02-15 京セラ株式会社 光学フィルタ部材および撮像装置
KR20190091322A (ko) * 2016-12-07 2019-08-05 소시에떼 프랑세즈 뒤 드테끄퇴르 인프라루즈 소프라디르 개선된 다중 스펙트럼 검출을 위한 디바이스
CN110235252A (zh) * 2016-12-07 2019-09-13 兴业法兰西红外探测器-索弗拉迪尔公司 用于改进多光谱检测的装置
JP2020501152A (ja) * 2016-12-07 2020-01-16 ソシエテ、フランセーズ、ド、デテクトゥル、ザンフラルージュ、ソフラディルSociete Francaise De Detecteurs Infrarouges Sofradir 改善されたマルチスペクトル検出のための装置
JP7161267B2 (ja) 2016-12-07 2022-10-26 リンレッド 改善されたマルチスペクトル検出のための装置
KR102470061B1 (ko) * 2016-12-07 2022-11-22 린레드 개선된 다중 스펙트럼 검출을 위한 디바이스
CN110235252B (zh) * 2016-12-07 2023-08-22 灵锐得 用于改进多光谱检测的装置
WO2018135208A1 (fr) * 2017-01-18 2018-07-26 ソニーセミコンダクタソリューションズ株式会社 Dispositif d'imagerie et système d'imagerie
KR20200103069A (ko) 2018-03-16 2020-09-01 후지필름 가부시키가이샤 구조체, 근적외선 차단 필터용 조성물, 드라이 필름, 구조체의 제조 방법, 광센서 및 화상 표시 장치
US11982939B2 (en) 2018-03-16 2024-05-14 Fujifilm Corporation Composition, film, dry film, pattern forming method, near-infrared transmitting filter, structure, optical sensor, and image display device

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TW201622125A (zh) 2016-06-16
JPWO2016088644A1 (ja) 2017-11-02
JP6669079B2 (ja) 2020-03-18

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