Classifications

• • H—ELECTRICITY
  • H04—ELECTRIC COMMUNICATION TECHNIQUE
  • H04B—TRANSMISSION
  • H04B17/00—Monitoring; Testing
  • H04B17/10—Monitoring; Testing of transmitters
  • H04B17/11—Monitoring; Testing of transmitters for calibration
  • H04B17/13—Monitoring; Testing of transmitters for calibration of power amplifiers, e.g. gain or non-linearity
• • H—ELECTRICITY
  • H03—ELECTRONIC CIRCUITRY
  • H03F—AMPLIFIERS
  • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
  • H03F3/189—High-frequency amplifiers, e.g. radio frequency amplifiers
  • H03F3/19—High-frequency amplifiers, e.g. radio frequency amplifiers with semiconductor devices only
  • H03F3/195—High-frequency amplifiers, e.g. radio frequency amplifiers with semiconductor devices only in integrated circuits
• • H—ELECTRICITY
  • H03—ELECTRONIC CIRCUITRY
  • H03F—AMPLIFIERS
  • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
  • H03F3/20—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers
  • H03F3/21—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers with semiconductor devices only
  • H03F3/211—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers with semiconductor devices only using a combination of several amplifiers
• • H—ELECTRICITY
  • H03—ELECTRONIC CIRCUITRY
  • H03F—AMPLIFIERS
  • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
  • H03F3/20—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers
  • H03F3/21—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers with semiconductor devices only
  • H03F3/213—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers with semiconductor devices only in integrated circuits
• • H—ELECTRICITY
  • H04—ELECTRIC COMMUNICATION TECHNIQUE
  • H04B—TRANSMISSION
  • H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
  • H04B1/38—Transceivers, i.e. devices in which transmitter and receiver form a structural unit and in which at least one part is used for functions of transmitting and receiving
  • H04B1/40—Circuits
• • H—ELECTRICITY
  • H04—ELECTRIC COMMUNICATION TECHNIQUE
  • H04B—TRANSMISSION
  • H04B17/00—Monitoring; Testing
  • H04B17/10—Monitoring; Testing of transmitters
  • H04B17/11—Monitoring; Testing of transmitters for calibration
  • H04B17/14—Monitoring; Testing of transmitters for calibration of the whole transmission and reception path, e.g. self-test loop-back
• • H—ELECTRICITY
  • H04—ELECTRIC COMMUNICATION TECHNIQUE
  • H04B—TRANSMISSION
  • H04B17/00—Monitoring; Testing
  • H04B17/10—Monitoring; Testing of transmitters
  • H04B17/15—Performance testing
  • H04B17/19—Self-testing arrangements
• • H—ELECTRICITY
  • H04—ELECTRIC COMMUNICATION TECHNIQUE
  • H04B—TRANSMISSION
  • H04B17/00—Monitoring; Testing
  • H04B17/20—Monitoring; Testing of receivers
  • H04B17/21—Monitoring; Testing of receivers for calibration; for correcting measurements
• • H—ELECTRICITY
  • H04—ELECTRIC COMMUNICATION TECHNIQUE
  • H04B—TRANSMISSION
  • H04B17/00—Monitoring; Testing
  • H04B17/20—Monitoring; Testing of receivers
  • H04B17/21—Monitoring; Testing of receivers for calibration; for correcting measurements
  • H04B17/22—Monitoring; Testing of receivers for calibration; for correcting measurements for calibration of the receiver components
• • H—ELECTRICITY
  • H03—ELECTRONIC CIRCUITRY
  • H03F—AMPLIFIERS
  • H03F2200/00—Indexing scheme relating to amplifiers
  • H03F2200/421—Multiple switches coupled in the output circuit of an amplifier are controlled by a circuit

Definitions

• the present disclosure is generally related to an analog built-in self test transceiver.
• a wireless telephone may transmit and receive signals using a transceiver.
• a front-end of the transceiver may include multiple low noise amplifiers (for signal reception) and multiple power amplifiers (for signal transmission).
• a built-in self test (BiST) mechanism to test transmission and reception properties e.g., power, noise figure, linearity, gain, etc.
• BiST built-in self test
• a modem at the back-end of the transceiver may be unable to determine characteristics of the amplifiers at the front-end of the transceiver.
• the transceiver may not be capable of calibrating the power amplifiers and/or the low noise amplifiers if the BiST mechanism is implemented at the back-end of the transceiver.
• FIG. 1 shows a wireless device communicating with a wireless system
• FIG. 2 shows a block diagram of the wireless device in FIG. 1 ;
• FIG. 5 is a diagram that depicts another exemplary embodiment of a transceiver having a topology that enables analog BiST;
• FIG. 6 is a diagram that depicts another exemplary embodiment of a transceiver 600 having a topology that enables analog BIST.
• FIG. 1 shows a wireless device 1 10 communicating with a wireless
• FIG. 2 shows a block diagram of an exemplary design of wireless device 1 10 in FIG. 1.
• wireless device 110 includes a transceiver 220 coupled to a primary antenna 210, a transceiver 222 coupled to a secondary antenna 212, and a data processor/controller 280.
• Transceiver 220 includes multiple (K) receivers 230pa to 230pk and multiple (K) transmitters 250pa to 250pk to support multiple frequency bands, multiple radio technologies, carrier aggregation, etc.
• Transceiver 222 includes multiple (L) receivers 230sa to 230sl and multiple (L) transmitters 250sa to 250sl to support multiple frequency bands, multiple radio technologies, carrier aggregation, receive diversity, multiple-input multiple-output (MIMO) transmission from multiple transmit antennas to multiple receive antennas, etc.
• Receive circuits 242pa may include mixers, filters, amplifiers, matching circuits, an oscillator, a local oscillator (LO) generator, a phase locked loop (PLL), etc. Each remaining receiver 230 in transceivers 220 and 222 may operate in similar manner as receiver 230pa.
• LO local oscillator
• PLL phase locked loop
• Wireless device 110 may support multiple band groups, multiple radio technologies, and/or multiple antennas.
• Wireless device 1 10 may include a number of LNAs to support reception via the multiple band groups, multiple radio technologies, and/or multiple antennas.
• the transceiver 300 also includes a first array of transceivers (Split 1_1, Split 1_2) and a second array of transceivers (Split 2_1, Split 2_2).
• the transceiver 300 may be a multi-antenna array transceiver that is used for beam-forming mechanisms.
• the first array of transceivers may include a first transceiver, a second transceiver, a third transceiver, and a fourth transceiver.
• Each transceiver may include a corresponding power amplifier, low noise amplifier, and phase shifter.
• the first transceiver may include a first power amplifier (PA 1), a first low noise amplifier (LNA 1), and a first phase shifter (PS 1).
• the first power amplifier (PA 1) is coupled to the first phase shifter (PS 1) via a first transmission path
• the first low noise amplifier (LNA 1) is coupled to the first phase shifter (PS 2) via a first reception path.
• the second array of transceivers may include a fifth transceiver, a sixth transceiver, a seventh transceiver, and an eighth transceiver.
• the fifth transceiver may include a fifth power amplifier (PA 5), a fifth low noise amplifier (LNA 5), and a fifth phase shifter (PS 5).
• the fifth power amplifier (PA 5) is coupled to the fifth phase shifter (PS 5) via a fifth transmission path
• the fifth low noise amplifier (LNA 5) is coupled to the fifth phase shifter (PS 5) via a fifth reception path.
• the sixth transceiver may include a sixth power amplifier (PA 6), a sixth low noise amplifier (LNA 6), and a sixth phase shifter (PS 6).
• the sixth power amplifier (PA 5) is coupled to the sixth phase shifter (PS 6) via a sixth transmission path
• the sixth low noise amplifier (LNA 6) is coupled to the sixth phase shifter (PS 6) via a sixth reception path.
• the seventh transceiver may include a seventh power amplifier (PA 7), a seventh low noise amplifier (LNA 7), and a seventh phase shifter (PS 7).
• the seventh power amplifier (PA 7) is coupled to the seventh phase shifter (PS 7) via a seventh
• the eighth transceiver may include an eighth power amplifier (PA 8), an eighth low noise amplifier (LNA 8), and an eighth phase shifter (PS 8).
• the eighth power amplifier (PA 8) is coupled to the eighth phase shifter (PS 8) via an eighth transmission path
• the eighth low noise amplifier (LNA 5) is coupled to the eighth phase shifter (PS 8) via an eighth reception path.
• Each power amplifier (PA 1-8) may be configured to amplify signals to be transmitted over a wireless network, such as a wireless network associated with the wireless system 120 of FIG. 1.
• Each low noise amplifier (LNA 1-8) may be configured to amplify and improve the gain of signals received from the wireless network.
• a power amplifier in the first array of transceivers (Split 1 1, Split 1 2) and a low noise amplifier in the second array of transceivers (Split 2_1, Split 2_2) may be coupled together via a three-state switch to enable analog BiST.
• the first power amplifier (PA 1) may be coupled to the fifth low noise amplifier (LNA 5) via a first three-state switch 321
• the second power amplifier (PA 2) may be coupled to the sixth low noise amplifier (LNA 6) via a second three-state switch 322
• the third power amplifier (PA 3) may be coupled to the seventh low noise amplifier (LNA 7) via a third three-state switch 323
• the fourth power amplifier (PA 4) may be coupled to the eighth low noise amplifier (LNA 8) via a fourth three-state switch 324.
• Each three-state switch 321-324 may be coupled to a correspond antenna 331-334 (e.g., antenna element).
• a power amplifier in the second array of transceivers (Split 2_1, Split 2_2) and a low noise amplifier in the first array of transceivers (Split 1_1, Split 1_2) may be coupled together via a three-state switch to enable analog BiST.
• Each three-state switch 321-328 may include a transmission state to transmit signals via the corresponding antennas 331-338, a reception state to receive signals via the corresponding antennas 331-338, and a loopback state to provide a transmission signal (e.g., a leakage current) from the corresponding power amplifier to the corresponding low noise amplifier to enable concurrent testing of transmission properties and reception properties.
• the first three-state switch 321 may provide a transmission signal from the first power amplifier (PA 1) to the fifth low noise amplifier (LNA 5) to enable concurrent testing of transmission properties of the first power amplifier (PA 1) and reception properties of the fifth low noise amplifier (LNA 5), as explained below.
• the first diversity switch 350 may be configured to selectively couple a transmission path to the first transmission driver 342 or to the second transmission driver 346.
• the first diversity switch 350 may be coupled to a first mixer 308 (e.g., a transmission mixer), and the first mixer 308 may be coupled to receive a local oscillator signal from the local oscillator 312.
• the first mixer 308 may be configured to mix the local oscillator signal with an intermediate frequency transmission signal (TX IF) from the transmission path to generate a transmission signal.
• TX IF intermediate frequency transmission signal
• the second diversity switch 352 may be configured to selectively couple a reception path to the first reception driver 344 or to the second reception driver 348.
• the second diversity switch 352 may be coupled to a second mixer 310, and the second mixer 310 may be coupled to receive the local oscillator signal from the local oscillator 312.
• the second mixer 310 may be configured to mix the local oscillator signal with a received signal to generate a received intermediate frequency signal (RX IF).
• the received signal may received from low noise amplifiers (LNA 1-4) in the first array of transceivers (Split 1_1, Split 1_2) or from low noise amplifiers (LNA 5-8) in the second array of transceivers (Split 2_1, Split 2_2) based on the state of the second diversity switch 352.
• LNA 1-4 low noise amplifiers
• LNA 5-8 low noise amplifiers
• the transceiver 300 may test transmission characteristics of power amplifiers in one array of transceivers and reception characteristics of low noise amplifiers in the other array or transceivers. Thus, characteristics of components (e.g. power amplifiers and low noise amplifiers) at the front-end of the transceiver 300 may be tested during the loopback testing (e.g., during analog BiST).
• characteristics of components e.g. power amplifiers and low noise amplifiers
• the transceiver 300 may test transmission properties of the power amplifiers (PA 1-4) in the first array of transceivers (Split 1_1, Split 1_2) and reception properties of the low noise amplifiers (LNA 5-8) in the second array of transceivers (Split 2_1, Split 2_2).
• PA 1-4 power amplifiers
• LNA 5-8 low noise amplifiers
• a power sensor may be coupled to the output of the first power amplifier (PA 1) (e.g., between the first power amplifier (PA 1) and the first three-state switch 321) to measure the output power of the first power amplifier (PA 1) with relatively high accuracy.
• a power sensor may be coupled between the first array of the transceivers (Split 1_1) and the switching network 302 to enable power measurements prior to power leakage that may be attributed to components within the switching network 302.
• the first mixer 308 may provide the transmission signal (e.g., the intermediate frequency transmission signal (TX IF) mixed with the local oscillator signal) to each power amplifier (PA 1-4) via the first transmission driver 342.
• the power amplifiers (PA 1-4) may amplify the transmission signal and provide an amplified transmission signal (e.g., a radio frequency transmission signal) to the corresponding low noise amplifiers (LNA 5-8) based on the three-state switches 321-328, as described in greater detail with respect to FIG. 4.
• the second mixer 310 may generate the received intermediate frequency signal (RX IF) by mixing the received signals with the local oscillator signal.
• the power detectors 304, 306 may measure signal qualities of the intermediate frequency transmission signal (TX IF) and the received intermediate frequency signal (RX IF), respectively, as described above.
• the second mixer 310 may generate the received intermediate frequency signal (RX IF) by mixing the received signals with the local oscillator signal.
• the power detectors 304, 306 may measure signal characteristics of the intermediate frequency transmission signal (TX IF) and the received intermediate frequency signal (RX IF), respectively, as described above.
• the transceiver 300 may be implemented on a radio frequency/intermediate frequency (RF/IF) converter chip.
• RF/IF radio frequency/intermediate frequency
• the analog BiST may be performed with the power sensors 304, 306 to monitor performance.
• the first power amplifier (PA 1) may be coupled to the first three-state switch 321, and the low noise amplifier (LNA 5) may also be coupled to the first three-state switch 321.
• the first three-state switch 321 may also be coupled to the first antenna 331.
• the first phase shifter (PS 1) may be coupled to the input of the first power amplifier (PA 1), and the fifth phase shifter (PS 5) may be coupled to the output of the fifth low noise amplifier (LNA 5).
• the first three-state switch 321 may couple the output of the first power amplifier (PA 1) to the input of the fifth low noise amplifier (LNA 5).
• a radio frequency transmission signal generated at the first power amplifier (PA 1) may be provided to the fifth low noise amplifier (LNA 5) as a leakage current.
• the antenna chain 400 foregoes transmitting or receiving radio frequency signals and generates the leakage current from the first power amplifier (PA 1).
• the leakage current may be provided to the fifth low noise amplifier (LNA 5), amplified at the fifth low noise amplifier (LNA 5), and used as a received signal to enable analog BiST at the front-end, as described with respect to FIG. 3.
• measurements at the second power sensor 306 may be based on the leakage current.
• a first bypass circuit 402 may enable particular measurements for the first power amplifier (PA 1). For example, selectively enabling the first bypass circuit 402 (e.g., closing the switch) may enable the first power detector 304 to measure the power of the transmission signal prior to and after power amplification to determine the gain associated with the first power amplifier (PA 1).
• a second bypass circuit 404 may enable particular measurements for the fifth low noise amplifier (LNA 5). For example, selectively enabling the second bypass circuit 404 may enable the second power detector 306 to measure the power of the received signal prior to amplification and after amplification to determine the gain associated with the fifth low noise amplifier (LNA 5).
• the first diversity switch 350 may be coupled to a pair of transmission mixers 508.
• the pair of transmission mixers 508 may include an in-phase transmission mixer and a quadrature transmission mixer.
• the in-phase transmission mixer may be coupled to in-phase transmission circuitry 522
• the quadrature transmission mixer may be coupled to quadrature transmission circuitry 524.
• the in-phase transmission circuitry 522 may include an in- phase video graphics array (VGA) transmitter and an image rejection filter.
• the quadrature transmission circuitry 524 may include a quadrature VGA transmitter and an image rejection filter.
• the in-phase transmission circuitry 522 and the quadrature transmission circuitry 524 may be coupled to a digital modem 530 via digital-to-analog converters.
• the second diversity switch 352 may be coupled to a pair of reception mixers 510.
• the pair of reception mixers 510 may include an in-phase reception mixer and a quadrature reception mixer.
• the in-phase reception mixer may be coupled to in-phase reception circuitry 526
• the quadrature reception mixer may be coupled to quadrature reception circuitry 528.
• the in-phase reception circuitry 526 may include an in-phase VGA receiver and an anti-aliasing filter.
• the quadrature reception circuitry 528 may include a quadrature VGA receiver and an anti-aliasing filter.
• the in-phase reception circuitry 526 and the quadrature reception circuitry 528 may be coupled to the digital modem 530 via analog-to-digital converters.
• the transceiver 500 may be implemented on a zero intermediate frequency (ZIF) converter chip.
• ZIF zero intermediate frequency
• analog BiST may be performed with the digital modem 530 to monitor performance of the power amplifiers (PA 1-8) and the low noise amplifiers (LNA 1-8).
• FIG. 6 another exemplary embodiment of a transceiver 600 having a topology that enables analog built-in self test (BiST) is shown.
• the transceiver 600 includes the switching network 302, the first array of transceivers (Split 1_1, Split 1_2), and the second array of transceivers (Split 2_1, Split 2_2).
• a fifth antenna 635 is coupled to an output of the fifth power amplifier (PA 5) and to an input of the fifth low noise amplifier (LNA 6)
• a sixth antenna 636 is coupled to an output of the sixth power amplifier (PA 6) and to an input of the sixth low noise amplifier (LNA 6)
• a seventh antenna 637 is coupled to an output of the seventh power amplifier (PA 7) and to an input of the seventh low noise amplifier (LNA 7)
• an eighth antenna 638 is coupled to an output the eighth power amplifier (PA 8) and to an input of the eighth low noise amplifier (LNA 8).
• a first loopback switch (LBS 1) may selectively couple the first power amplifier (PA 1) to the fifth low noise amplifier (LNA 5) to enable a feedback current to propagate from the first power amplifier (PA 1) to the fifth low noise amplifier (LNA 5), as described with respect to FIG. 4.
• the first loopback switch (LBS) may also selectively couple the fifth power amplifier (PA 5) to the first low noise amplifier (LNA 1) to enable a feedback current to propagate from the fifth power amplifier (PA 1) to the first low noise amplifier (LNA 1).
• a second loopback switch may selectively couple the second power amplifier (PA 2) to the sixth low noise amplifier (LNA 6) or may couple the sixth power amplifier (PA 6) to the second low noise amplifier (LNA 2).
• a third loopback switch may selectively couple the third power amplifier (PA 3) to the seventh low noise amplifier (LNA 7) or may couple the seventh power amplifier (PA 7) to the third low noise amplifier (LNA 3).
• a fourth loopback switch may selectively couple the fourth power amplifier (PA 4) to the eighth low noise amplifier (LNA 8) or may couple the eighth power amplifier (PA 8) to the fourth low noise amplifier (LNA 4).
• the array chain topology of the transceiver 600 in FIG. 6 may be implemented with the transceiver 300 of FIG. 3 or the transceiver 500 of FIG. 5.
• the array chain topology of the transceiver 600 may be implemented on a radio frequency/intermediate frequency (RF/IF) converter chip.
• RF/IF radio frequency/intermediate frequency
• analog BiST may be performed with the power sensors 304, 306 of FIG. 3 to monitor performance of the power amplifiers (PA 1-8) and the low noise amplifiers (LNA 1-8).
• the array chain topology of the transceiver 600 may be implemented on a zero intermediate frequency (ZIF) converter chip.
• the analog BiST may be performed with the digital modem 530 to monitor performance.
• FIG. 7 a flowchart illustrates an exemplary embodiment of a method 700 for enabling analog built-in self testing for transceiver components.
• the method 700 may be performed using the wireless device 110 of FIGs. 1-2, the transceiver 300 of FIG. 3, the antenna chain 400 of FIG. 4, the transceiver 500 of FIG. 5, the transceiver 600 of FIG. 6, or any combination thereof.
• the first low noise amplifier may be selectively coupled to receive an output of the second power amplifier to enable loopback testing, at 704.
• the fifth power amplifier PA 5
• LNA 1 the first low noise amplifier
• the method 700 may include determining characteristics of the first power amplifier during loopback testing. For example, referring to FIG. 3, characteristics of the first power amplifier (PA 1) may be determined (e.g., measured using the first power sensor 304) during loopback testing. As another example, referring to FIG. 6, characteristics of the first power amplifier (PA 1) may be determined (e.g., measured using a power sensor (not shown) coupled to the first array of transceivers (Split 1_1, Split 1_2)) during loopback testing. The method 700 may also include simultaneously determining characteristics of the second low noise amplifier during loopback testing. For example, referring to FIG. 3,
• characteristics of the fifth low noise amplifier (LNA 5) may be determined (e.g., measured using the second power sensor 306) during loopback testing when the characteristics of the first power amplifier (PA 1) are being determined.
• characteristics of the fifth low noise amplifier (LNA 5) may be determined (e.g., measured using a power sensor (not shown) coupled to the second array of transceivers (Split 2_1, Split 2_2)) during loopback testing when characteristics of the first power amplifier (PA 1) are being determined.
• the method 700 may include selectively coupling the first power amplifier to a first antenna to enable signal transmission via the first antenna.
• the first loopback switch (LBS 1) may be deactivated (e.g., open).
• the first power amplifier (PA 1) may be coupled to the first antenna 631.
• Signal transmission via the first antenna 631 may be enabled using the first power amplifier (PA 1) and the first transmission path.
• the method 700 may also include selectively coupling the second low noise amplifier to a second antenna to enable simultaneous signal reception via the second antenna.
• the fifth low noise amplifier (LNA 5) may be coupled to the fifth antenna 635 when the first loopback switch (LBS 1) is deactivated.
• Signal reception via the fifth antenna 635 may be enabled using the fifth low noise amplifier (LNA 5) and the fifth reception path. It will be appreciated that signal transmission may be enabled for each power amplifier (PA 1-4) in the first array of transceivers (Split 1_1, Split 1_2) while signal reception is simultaneously enabled for each low noise amplifier (LNA 5-8) in the second array of transceivers (Split 2_1, Split 2_2).
• LNA 5-8 low noise amplifier
• the method 700 of FIG. 7 may enable properties of the power amplifiers (PA 1- 8) and properties of the low noise amplifiers (LNA 1-8) to be determined and calibrated based on measured metric values (e.g., power, gain, local oscillator leakage, linearity, etc.) determined by the power sensors 304, 306 or the digital modem 530.
• the method 700 enables a topology that supports analog BiST of the power amplifiers (PA 1-8) and the low noise amplifiers (LNA 1-8) at the front-end of the transceiver 300.
• the apparatus may also include first means for amplifying a received signal.
• the first means for amplifying the received signal may include the first low noise amplifier (LNA 1) of FIGs. 3, 5, and 6, the second low noise amplifier (LNA 2) of FIGs. 3, 5, and 6, the third low noise amplifier (LNA 3) of FIGs. 3, 5, and 6, the fourth low noise amplifier (LNA 4) of FIGs. 3, 5, and 6, one or more other devices, circuits, modules, or instructions to amplify the received signal, or any combination thereof.
• a first transceiver may include the first means for amplifying the transmission signal and the first means for amplifying the received signal.
• the apparatus may also include second means for amplifying a received signal.
• the second means for amplifying the received signal may include the fifth low noise amplifier (LNA 5) of FIGs. 3-6, the sixth low noise amplifier (LNA 6) of FIGs. 3, 5, and 6, the seventh low noise amplifier (LNA 7) of FIGs. 3, 5, and 6, the eighth low noise amplifier (LNA 8) of FIGs. 3, 5, and 6, one or more other devices, circuits, modules, or instructions to amplify the received signal, or any combination thereof.
• a second transceiver may include the second means for amplifying the transmission signal and the second means for amplifying the received signal.
• the apparatus may also include means for selectively coupling the second means for amplifying the received signal to receive an output of the first means for amplifying the transmission signal to enable loopback testing.
• the means for selectively coupling may include one or more of the three-state switches 321-328 of FIGs. 3 and 5, the first three-state switch 321 of FIG. 4, one or more of the loopback switches (LBS 1-LBS 4) of FIG. 6, one or more other devices, circuits, modules, or instructions to selectively couple the second means for amplifying the received signal to receive the output of the first means for amplifying the transmission signal, or any combination thereof.
• a software module may reside in random access memory (RAM), flash memory, read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), registers, hard disk, a removable disk, a compact disc read-only memory (CD-ROM), or any other form of non-transient storage medium known in the art.
• An exemplary storage medium is coupled to the processor such that the processor can read information from, and write information to, the storage medium.
• the storage medium may be integral to the processor.
• the processor and the storage medium may reside in an application-specific integrated circuit (ASIC).
• ASIC application-specific integrated circuit
• the ASIC may reside in a computing device or a user terminal.
• the processor and the storage medium may reside as discrete components in a computing device or user terminal.

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• Engineering & Computer Science (AREA)
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• Signal Processing (AREA)
• Electromagnetism (AREA)
• Power Engineering (AREA)
• Microelectronics & Electronic Packaging (AREA)
• Nonlinear Science (AREA)
• Transceivers (AREA)
• Radio Transmission System (AREA)

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• 2014
  • 2014-03-04 US US14/196,743 patent/US9628203B2/en active Active
• 2015
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  • 2015-03-03 JP JP2016555482A patent/JP6479843B2/ja active Active
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