CN106063160B - 模拟内置自测试收发器 - Google Patents

模拟内置自测试收发器 Download PDF

Info

Publication number
CN106063160B
CN106063160B CN201580011632.0A CN201580011632A CN106063160B CN 106063160 B CN106063160 B CN 106063160B CN 201580011632 A CN201580011632 A CN 201580011632A CN 106063160 B CN106063160 B CN 106063160B
Authority
CN
China
Prior art keywords
coupled
switch
noise amplifier
low
power amplifier
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201580011632.0A
Other languages
English (en)
Chinese (zh)
Other versions
CN106063160A (zh
Inventor
H·M·韦斯曼
L·拉维夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Qualcomm Inc
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Publication of CN106063160A publication Critical patent/CN106063160A/zh
Application granted granted Critical
Publication of CN106063160B publication Critical patent/CN106063160B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/10—Monitoring; Testing of transmitters
    • H04B17/11—Monitoring; Testing of transmitters for calibration
    • H04B17/13—Monitoring; Testing of transmitters for calibration of power amplifiers, e.g. gain or non-linearity
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/189—High-frequency amplifiers, e.g. radio frequency amplifiers
    • H03F3/19—High-frequency amplifiers, e.g. radio frequency amplifiers with semiconductor devices only
    • H03F3/195—High-frequency amplifiers, e.g. radio frequency amplifiers with semiconductor devices only in integrated circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/20—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers
    • H03F3/21—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers with semiconductor devices only
    • H03F3/211—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers with semiconductor devices only using a combination of several amplifiers
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/20—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers
    • H03F3/21—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers with semiconductor devices only
    • H03F3/213—Power amplifiers, e.g. Class B amplifiers, Class C amplifiers with semiconductor devices only in integrated circuits
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B1/00—Details of transmission systems, not covered by a single one of groups H04B3/00 - H04B13/00; Details of transmission systems not characterised by the medium used for transmission
    • H04B1/38—Transceivers, i.e. devices in which transmitter and receiver form a structural unit and in which at least one part is used for functions of transmitting and receiving
    • H04B1/40—Circuits
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/10—Monitoring; Testing of transmitters
    • H04B17/11—Monitoring; Testing of transmitters for calibration
    • H04B17/14—Monitoring; Testing of transmitters for calibration of the whole transmission and reception path, e.g. self-test loop-back
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/10—Monitoring; Testing of transmitters
    • H04B17/15—Performance testing
    • H04B17/19—Self-testing arrangements
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/20—Monitoring; Testing of receivers
    • H04B17/21—Monitoring; Testing of receivers for calibration; for correcting measurements
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H04B17/20—Monitoring; Testing of receivers
    • H04B17/21—Monitoring; Testing of receivers for calibration; for correcting measurements
    • H04B17/22—Monitoring; Testing of receivers for calibration; for correcting measurements for calibration of the receiver components
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2200/00—Indexing scheme relating to amplifiers
    • H03F2200/421—Multiple switches coupled in the output circuit of an amplifier are controlled by a circuit

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Electromagnetism (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Nonlinear Science (AREA)
  • Transceivers (AREA)
  • Radio Transmission System (AREA)
CN201580011632.0A 2014-03-04 2015-03-03 模拟内置自测试收发器 Active CN106063160B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/196,743 2014-03-04
US14/196,743 US9628203B2 (en) 2014-03-04 2014-03-04 Analog built-in self test transceiver
PCT/US2015/018517 WO2015134519A1 (en) 2014-03-04 2015-03-03 Analog built-in self test transceiver

Publications (2)

Publication Number Publication Date
CN106063160A CN106063160A (zh) 2016-10-26
CN106063160B true CN106063160B (zh) 2018-09-07

Family

ID=52693058

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201580011632.0A Active CN106063160B (zh) 2014-03-04 2015-03-03 模拟内置自测试收发器

Country Status (6)

Country Link
US (1) US9628203B2 (enExample)
EP (1) EP3114782B1 (enExample)
JP (1) JP6479843B2 (enExample)
KR (1) KR102357242B1 (enExample)
CN (1) CN106063160B (enExample)
WO (1) WO2015134519A1 (enExample)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9461595B2 (en) 2014-03-14 2016-10-04 Qualcomm Incoporated Integrator for class D audio amplifier
WO2016070159A1 (en) * 2014-10-31 2016-05-06 Skyworks Solutions, Inc. Uplink diversity and interband uplink carrier aggregation in front-end architecture
US9794007B2 (en) * 2015-07-01 2017-10-17 Arm Limited Single RF oscillator technique for built-in tune, test, and calibration of a transceiver
CN105429714B (zh) * 2015-11-03 2018-01-30 中国电子科技集团公司第四十一研究所 一种t/r组件测试装置及装置安全性校验方法
CN105848093A (zh) * 2016-06-14 2016-08-10 深圳市北斗时空科技有限公司 一种亚米级北斗精密定位蓝牙终端
CN106972881B (zh) * 2017-02-22 2019-11-22 上海华为技术有限公司 一种波束赋形bf权值赋值的方法和装置
US20190089471A1 (en) * 2017-09-21 2019-03-21 Qualcomm Incorporated System and method for mmwave massive array self-testing
US10038508B1 (en) * 2017-10-17 2018-07-31 Nxp B.V. Wireless communication unit diagnostics
DE102017219690A1 (de) * 2017-11-06 2019-05-09 Laird Dabendorf Gmbh Verfahren und Vorrichtungen zur Ermittlung eines Frequenzbereichs eines zu übertragenden Signals
US11171683B2 (en) 2018-04-12 2021-11-09 Shenzhen GOODIX Technology Co., Ltd. Multi-mode configurable transceiver with low voltage switches
US10333579B1 (en) * 2018-04-12 2019-06-25 Shenzhen GOODIX Technology Co., Ltd. Multi-mode configurable transceiver with low voltage switches
JP7178427B2 (ja) * 2018-05-18 2022-11-25 ナンヤン テクノロジカル ユニヴァーシティー 無線通信のための装置及び方法
US10498375B1 (en) * 2018-07-11 2019-12-03 Rohde & Schwarz Gmbh & Co. Kg Portable RF receiver module and portable antenna arrangement
US11032113B2 (en) * 2018-09-25 2021-06-08 Qualcomm Incorporated Apparatus and methods for hybrid vector based polar modulator
KR102612360B1 (ko) * 2018-12-04 2023-12-12 삼성전자 주식회사 안테나를 통해 송신하고 수신된 신호에 기반하여 통신 회로의 성능을 확인하는 방법
US11569886B2 (en) * 2019-04-01 2023-01-31 Qualcomm Incorporated Network-sensitive transmit diversity scheme
JP7327169B2 (ja) * 2020-01-08 2023-08-16 株式会社デンソー 自己診断装置
JP7327168B2 (ja) * 2020-01-08 2023-08-16 株式会社デンソー 自己診断装置
US11140633B2 (en) * 2020-02-10 2021-10-05 Samsung Electronics Co., Ltd. Method and apparatus for loopback gain step calibration on RF chain with phase shifter
CN111525933B (zh) 2020-04-30 2021-12-17 维沃移动通信有限公司 一种射频电路及电子设备
US11804866B2 (en) * 2020-10-22 2023-10-31 Molex Technologies Gmbh Circuit arrangement and method for adjusting signal parameters
DE102020134061A1 (de) * 2020-12-17 2022-06-23 Endress+Hauser Flowtec Ag Hochfrequenz-basiertes Feldgerät
US20250007624A1 (en) * 2023-06-29 2025-01-02 Qualcomm Incorporated Transceiver built-in self-test

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101668356A (zh) * 2009-09-22 2010-03-10 福建三元达通讯股份有限公司 双模数字射频拉远系统
CN201887766U (zh) * 2010-12-28 2011-06-29 成都福兰特电子技术有限公司 无线通信转发系统
CN103582106A (zh) * 2012-07-23 2014-02-12 京信通信系统（中国）有限公司 基于双载波跳频技术的信号处理方法、装置及塔顶放大器

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10303830A (ja) * 1997-04-23 1998-11-13 Oki Electric Ind Co Ltd 無線装置の内部折り返し試験回路
US6006112A (en) * 1997-11-26 1999-12-21 Lucent Technologies, Inc. Transceiver with RF loopback and downlink frequency scanning
US6346910B1 (en) 1999-04-07 2002-02-12 Tei Ito Automatic array calibration scheme for wireless point-to-multipoint communication networks
JP3649082B2 (ja) * 2000-04-25 2005-05-18 松下電工株式会社 演算増幅器の測定回路及びその測定方法
US20040204105A1 (en) * 2002-05-24 2004-10-14 Ying-Chang Liang Method and apparatus for a base station with multiple distributed antennas to communicate with mobile stations
US7248625B2 (en) * 2002-09-05 2007-07-24 Silicon Storage Technology, Inc. Compensation of I-Q imbalance in digital transceivers
JP2004204105A (ja) * 2002-12-26 2004-07-22 Toray Ind Inc 難燃性耐衝撃性ポリアミド樹脂組成物
JP3798759B2 (ja) * 2003-04-09 2006-07-19 日本無線株式会社 無線式送受信装置
JP4172589B2 (ja) * 2004-08-31 2008-10-29 シャープ株式会社 消費電力制御装置、高周波通信装置、消費電力制御方法および消費電力制御プログラム
US20060063494A1 (en) * 2004-10-04 2006-03-23 Xiangdon Zhang Remote front-end for a multi-antenna station
US20060197538A1 (en) 2005-03-07 2006-09-07 Nokia Corporation Self-test method for antennas
US7379716B2 (en) 2005-03-24 2008-05-27 University Of Florida Research Foundation, Inc. Embedded IC test circuits and methods
US8140031B2 (en) 2006-12-19 2012-03-20 Texas Instruments Incorporated Transmitter built-in production line testing utilizing digital gain calibration
US8139670B1 (en) 2007-09-21 2012-03-20 Marvell International Ltd. Modular MIMO transceiver architecture
JP4651750B2 (ja) * 2008-05-16 2011-03-16 三菱電機株式会社 キャリブレーション方法および通信装置
JP5051385B2 (ja) * 2008-05-16 2012-10-17 日本電気株式会社 アレーアンテナを用いた無線通信装置、その校正方法、及び無線通信基地局システム
US8045926B2 (en) * 2008-10-15 2011-10-25 Nokia Siemens Networks Oy Multi-transceiver architecture for advanced Tx antenna monitoring and calibration in MIMO and smart antenna communication systems
KR101058648B1 (ko) * 2009-02-16 2011-08-22 삼성전자주식회사 카메라 렌즈 모듈의 렌즈 조립체 정렬 장치
DE112010006076B4 (de) 2010-12-22 2020-02-20 Snaptrack, Inc. Schaltungsanordnung für eine RF-Prüfschleife
US12081243B2 (en) * 2011-08-16 2024-09-03 Qualcomm Incorporated Low noise amplifiers with combined outputs
US8918060B2 (en) 2011-09-29 2014-12-23 St-Ericsson Sa 2G, 2.5G RF loopback arrangement for mobile device self-testing
US9088448B2 (en) * 2011-11-11 2015-07-21 Mediatek Singapore Pte. Ltd. Phased array device and calibration method therefor
JP2013156085A (ja) * 2012-01-27 2013-08-15 Sharp Corp 光検出装置、物体検出センサ及び電子機器
US9338664B2 (en) * 2012-02-22 2016-05-10 Mediatek Singapore Pte. Ltd. Wireless communication unit, integrated circuit and method therefor

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101668356A (zh) * 2009-09-22 2010-03-10 福建三元达通讯股份有限公司 双模数字射频拉远系统
CN201887766U (zh) * 2010-12-28 2011-06-29 成都福兰特电子技术有限公司 无线通信转发系统
CN103582106A (zh) * 2012-07-23 2014-02-12 京信通信系统（中国）有限公司 基于双载波跳频技术的信号处理方法、装置及塔顶放大器

Also Published As

Publication number Publication date
KR102357242B1 (ko) 2022-01-27
EP3114782A1 (en) 2017-01-11
US9628203B2 (en) 2017-04-18
US20150256272A1 (en) 2015-09-10
CN106063160A (zh) 2016-10-26
EP3114782B1 (en) 2019-04-17
JP6479843B2 (ja) 2019-03-06
WO2015134519A1 (en) 2015-09-11
KR20160129074A (ko) 2016-11-08
JP2017507611A (ja) 2017-03-16

Similar Documents

Publication Publication Date Title
CN106063160B (zh) 模拟内置自测试收发器
EP2932631B1 (en) Receiver calibration with lo signal from inactive receiver
KR102504244B1 (ko) 복수의 lna들 간의 캐스캐이딩된 스위치
US20150270813A1 (en) Dynamically adjustable power amplifier load tuner
EP3342051B1 (en) Low noise amplifier and notch filter
US10305431B2 (en) Noise cancelling baseband amplifier
TWI578716B (zh) 用於接收器天線中閉路調諧器的方法
TWI618348B (zh) 具有輸出耦合器的低雜訊放大器模組
WO2023244405A1 (en) System and method for radio frequency (rf) sensing to determine device parameters
US20150381112A1 (en) Filter with an auxiliary mixing path

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant