WO2015096391A1 - 阵列基板及其制作方法、显示装置 - Google Patents
阵列基板及其制作方法、显示装置 Download PDFInfo
- Publication number
- WO2015096391A1 WO2015096391A1 PCT/CN2014/078847 CN2014078847W WO2015096391A1 WO 2015096391 A1 WO2015096391 A1 WO 2015096391A1 CN 2014078847 W CN2014078847 W CN 2014078847W WO 2015096391 A1 WO2015096391 A1 WO 2015096391A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- layer
- quantum dot
- insulating layer
- array substrate
- film transistor
- Prior art date
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 142
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 20
- 239000002096 quantum dot Substances 0.000 claims abstract description 163
- 239000010409 thin film Substances 0.000 claims abstract description 77
- 239000010410 layer Substances 0.000 claims description 400
- 239000012044 organic layer Substances 0.000 claims description 29
- 238000000034 method Methods 0.000 claims description 24
- 238000000059 patterning Methods 0.000 claims description 12
- 230000005525 hole transport Effects 0.000 claims description 6
- 239000011159 matrix material Substances 0.000 claims description 6
- 229910052793 cadmium Inorganic materials 0.000 claims description 5
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 claims description 5
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 claims description 3
- 229910052711 selenium Inorganic materials 0.000 claims description 3
- 239000011669 selenium Substances 0.000 claims description 3
- 239000004054 semiconductor nanocrystal Substances 0.000 claims description 3
- 238000005286 illumination Methods 0.000 claims 1
- 238000002834 transmittance Methods 0.000 abstract description 6
- 239000004973 liquid crystal related substance Substances 0.000 description 12
- 238000005516 engineering process Methods 0.000 description 11
- 239000000463 material Substances 0.000 description 7
- 239000003086 colorant Substances 0.000 description 6
- 238000004891 communication Methods 0.000 description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 6
- 229910045601 alloy Inorganic materials 0.000 description 4
- 239000000956 alloy Substances 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- 238000005530 etching Methods 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 239000002356 single layer Substances 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 230000005684 electric field Effects 0.000 description 3
- 230000005284 excitation Effects 0.000 description 3
- 239000011368 organic material Substances 0.000 description 3
- 238000002161 passivation Methods 0.000 description 3
- 229920002120 photoresistant polymer Polymers 0.000 description 3
- 125000001637 1-naphthyl group Chemical group [H]C1=C([H])C([H])=C2C(*)=C([H])C([H])=C([H])C2=C1[H] 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 239000007850 fluorescent dye Substances 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 229910052750 molybdenum Inorganic materials 0.000 description 2
- 239000011733 molybdenum Substances 0.000 description 2
- ORFSSYGWXNGVFB-UHFFFAOYSA-N sodium 4-amino-6-[[4-[4-[(8-amino-1-hydroxy-5,7-disulfonaphthalen-2-yl)diazenyl]-3-methoxyphenyl]-2-methoxyphenyl]diazenyl]-5-hydroxynaphthalene-1,3-disulfonic acid Chemical compound COC1=C(C=CC(=C1)C2=CC(=C(C=C2)N=NC3=C(C4=C(C=C3)C(=CC(=C4N)S(=O)(=O)O)S(=O)(=O)O)O)OC)N=NC5=C(C6=C(C=C5)C(=CC(=C6N)S(=O)(=O)O)S(=O)(=O)O)O.[Na+] ORFSSYGWXNGVFB-UHFFFAOYSA-N 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 239000010937 tungsten Substances 0.000 description 2
- -1 3-decylphenyl Chemical group 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 229910021417 amorphous silicon Inorganic materials 0.000 description 1
- 150000004982 aromatic amines Chemical class 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 210000002858 crystal cell Anatomy 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- AJNVQOSZGJRYEI-UHFFFAOYSA-N digallium;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Ga+3].[Ga+3] AJNVQOSZGJRYEI-UHFFFAOYSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005265 energy consumption Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 229910001195 gallium oxide Inorganic materials 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 229910000449 hafnium oxide Inorganic materials 0.000 description 1
- WIHZLLGSGQNAGK-UHFFFAOYSA-N hafnium(4+);oxygen(2-) Chemical compound [O-2].[O-2].[Hf+4] WIHZLLGSGQNAGK-UHFFFAOYSA-N 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 229910003437 indium oxide Inorganic materials 0.000 description 1
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 125000001624 naphthyl group Chemical group 0.000 description 1
- 150000004866 oxadiazoles Chemical class 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 230000027756 respiratory electron transport chain Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
- 238000007738 vacuum evaporation Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/10—OLEDs or polymer light-emitting diodes [PLED]
- H10K50/11—OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers
- H10K50/115—OLEDs or polymer light-emitting diodes [PLED] characterised by the electroluminescent [EL] layers comprising active inorganic nanostructures, e.g. luminescent quantum dots
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors
- G02F1/1336—Illuminating devices
- G02F1/133617—Illumination with ultraviolet light; Luminescent elements or materials associated to the cell
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1222—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or crystalline structure of the active layer
- H01L27/1225—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or crystalline structure of the active layer with semiconductor materials not belonging to the group IV of the periodic table, e.g. InGaZnO
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/124—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or layout of the wiring layers specially adapted to the circuit arrangement, e.g. scanning lines in LCD pixel circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1248—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition or shape of the interlayer dielectric specially adapted to the circuit arrangement
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/10—OLEDs or polymer light-emitting diodes [PLED]
- H10K50/14—Carrier transporting layers
- H10K50/15—Hole transporting layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/10—OLEDs or polymer light-emitting diodes [PLED]
- H10K50/14—Carrier transporting layers
- H10K50/16—Electron transporting layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/805—Electrodes
- H10K50/81—Anodes
- H10K50/813—Anodes characterised by their shape
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/805—Electrodes
- H10K50/82—Cathodes
- H10K50/822—Cathodes characterised by their shape
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/86—Arrangements for improving contrast, e.g. preventing reflection of ambient light
- H10K50/865—Arrangements for improving contrast, e.g. preventing reflection of ambient light comprising light absorbing layers, e.g. light-blocking layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/121—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/123—Connection of the pixel electrodes to the thin film transistors [TFT]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/131—Interconnections, e.g. wiring lines or terminals
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/30—Devices specially adapted for multicolour light emission
- H10K59/38—Devices specially adapted for multicolour light emission comprising colour filters or colour changing media [CCM]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/015—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on semiconductor elements with at least one potential jump barrier, e.g. PN, PIN junction
- G02F1/017—Structures with periodic or quasi periodic potential variation, e.g. superlattices, quantum wells
- G02F1/01791—Quantum boxes or quantum dots
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136222—Colour filters incorporated in the active matrix substrate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K2102/00—Constructional details relating to the organic devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/1201—Manufacture or treatment
Definitions
- Embodiments of the present disclosure relate to an array substrate, a method of fabricating the same, and a display device. Background technique
- TFT-LCD Thin Film Transistor-Liquid Crystal Display
- OLED Organic Light-Emitting Diode
- the TFT-LCD or the OLED is filtered by a color filter layer such as a red color filter layer, a green color filter layer, and a blue color filter layer, and the white light emitted from the light source is converted into red, green, blue, and the like.
- a color filter layer such as a red color filter layer, a green color filter layer, and a blue color filter layer
- Monochromatic light, different color filter layers respectively transmit light corresponding to different color bands, thereby realizing color display of TFT-LCD or OLED.
- An object of an embodiment of the present disclosure is to provide an array substrate, a method of fabricating the same, and a display device capable of improving a display color gamut range and a light transmittance of a display device without increasing power consumption of the display device.
- At least one embodiment of the present disclosure provides an array substrate including an array-arranged thin film transistor unit, further including a quantum dot layer over the thin film transistor unit, the quantum dot layer At least three quantum dots are included, and any one of the quantum dots is irradiated with light from the incident light of the array substrate to emit light of a corresponding wavelength band.
- the quantum dot layer includes a red quantum dot region, a blue quantum dot region, and a green quantum dot region.
- the quantum dots in the quantum dot layer are semiconductor nanocrystals, which are composed of at least a combination of a cadmium, a cadmium, a selenium, and a gram atom.
- the array substrate includes: a base substrate, a thin film transistor unit, a first insulating layer, a second insulating layer, a quantum dot layer, and a first conductive layer, wherein the first insulating layer a first via hole is disposed, the second insulating layer is provided with a second via hole, the quantum dot layer is provided with a third via hole, the first via hole, the second via hole and the third The via holes communicate, and the first conductive layer is connected to the drain of the thin film transistor unit through the third via, the second via, and the first via.
- the array substrate further includes a color filter layer, wherein the color filter layer is far from the light entrance of the array substrate, wherein the color filter is The layer includes a red color filter area i or a blue color filter area i or a green color filter area, the red color filter area corresponding to the red quantum dot area of the quantum dot layer, the blue color filter The region corresponds to a blue quantum dot region of the quantum dot layer, and the green color filter region corresponds to a green quantum dot region of the quantum dot layer.
- the array substrate further includes a second conductive layer, and a third insulating layer disposed between the first conductive layer and the second conductive layer.
- the second conductive layer is in a slit shape
- the first conductive layer is in a plate shape or a slit shape
- the array substrate further includes a fourth insulating layer, an organic layer, and a third conductive layer over the first conductive layer, the fourth insulating layer has an opening, and the organic layer passes The opening contacts the first conductive layer.
- the organic layer includes a hole transport layer, a light emitting layer, and an electron transport layer.
- the array substrate further includes a black matrix located above the thin film transistor unit.
- the white light or other light provided by the display device first enters the quantum dot layer, and the quantum dots in the quantum dot layer are excited to emit mixed light including red light, green light, and blue light, and then the mixed light enters the filter.
- the color filter layer, the color filter regions of different colors in the color filter layer filter out different colors of light. Since the color purity of the monochromatic light emitted by the quantum dots is high, it is not necessary to increase the color purity of the color filter layer, thereby improving the color gamut range and light transmission of the display device without increasing the light output intensity of the light source of the display device. rate.
- At least one embodiment of the present disclosure provides a display device including any of the above arrays Substrate.
- At least one embodiment of the present disclosure provides a method of fabricating an array substrate, including: forming a pattern of each layer structure including a thin film transistor unit on a substrate;
- a quantum dot layer comprising at least three quantum dots is formed over the thin film transistor unit, wherein any one of the quantum dots is excited by light from the incident light of the array substrate to emit light of a corresponding wavelength band.
- the method further includes:
- Forming a quantum dot layer including at least three quantum dots on the thin film transistor unit includes:
- Forming a quantum dot layer over the second insulating layer developing the protrusion to remove a quantum dot layer at the protrusion and a second insulating layer under the protrusion, forming a third via of the quantum dot layer and a second via hole of the second insulating layer, the third via hole, the second via hole and the first via hole are in communication;
- a pattern including the first conductive layer is formed over the quantum dot layer.
- the method further includes:
- Forming a quantum dot layer including at least three quantum dots on the thin film transistor unit includes:
- a first via corresponding to a drain of the thin film transistor unit in the first insulating layer, the third via, the second via, and the The first vias are in communication; a pattern including the first conductive layer is formed over the quantum dot layer.
- the manufacturing method further includes:
- a color filter layer is formed, wherein the color filter layer is farther from the entrance light of the array substrate than the quantum dot layer.
- the manufacturing method further includes: forming a third insulating layer and a second conductive layer on the first conductive layer, wherein the third insulating layer is located in the first conductive layer and the first Between two conductive layers.
- the manufacturing method further includes:
- Forming a fourth insulating layer on the first conductive layer the fourth insulating layer has an opening; forming an organic layer on the fourth insulating layer, the organic layer passing through the opening and the first conductive layer Contact
- a third conductive layer is formed on the organic layer.
- the manufacturing method further includes: forming a pattern including a black matrix over the thin film transistor unit.
- FIG. 1 is a schematic structural view 1 of an array substrate according to an embodiment of the present disclosure
- FIG. 2 is a second schematic structural view of an array substrate according to an embodiment of the present disclosure.
- FIG. 3 is a schematic structural view 3 of an array substrate according to an embodiment of the present disclosure.
- FIG. 4 is a schematic structural view 4 of an array substrate according to an embodiment of the present disclosure.
- FIG. 5 is a schematic structural view 5 of an array substrate according to an embodiment of the present disclosure.
- FIG. 6 is a schematic structural view 6 of an array substrate according to an embodiment of the present disclosure.
- FIG. 7 is a schematic structural view 7 of an array substrate according to an embodiment of the present disclosure.
- FIG. 8 is a schematic structural diagram VIII of an array substrate according to an embodiment of the present disclosure
- FIG. 9 is a schematic structural view IX of an array substrate according to an embodiment of the present disclosure
- FIG. 10 is a schematic structural view of an array substrate according to an embodiment of the present disclosure.
- FIG. 11 is a schematic structural view 11 of an array substrate according to an embodiment of the present disclosure. detailed description
- the inventors have found that if it is necessary to expand the color gamut of the LCD or OLED, it is necessary to increase the color purity of the color filter layer, but this will reduce the light transmittance of the color filter layer. In order to ensure the display brightness of the TFT-LCD or OLED, it is also necessary to increase the intensity of the light output from the light source, resulting in an increase in the power consumption of the TFT-LCD or the OLED.
- At least one embodiment of the present disclosure provides an array substrate including a thin film transistor unit 2 arrayed on a substrate, and a quantum dot layer on the thin film transistor unit 2 3.
- the quantum dot layer 3 includes at least three kinds of quantum dots, and any one of the quantum dots is irradiated and excited by light from the incident light of the array substrate to emit light of a corresponding wavelength band.
- Quantum dots are extremely tiny semiconductor nanocrystals that are invisible to the naked eye. They are composed of a combination of words, cadmium, selenium and gram atoms. The diameter of the particles in the crystal is usually less than 10 nm. It has a distinctive feature: it emits light when excited by electricity or light, producing a solid color of light. The color of the emitted light is determined by the composition, size and shape of the quantum dots. The smaller the size of the quantum dot, the more the light generated by the excitation is biased toward blue light. The larger the size of the quantum dot, the more the light generated by the excitation is biased toward red light. According to the actual situation, the size of the quantum dots can be adjusted to obtain different colors of light.
- the quantum dot layer 3 includes a red quantum dot emitting red light, a green quantum dot emitting green light, and a blue quantum dot emitting blue light.
- the red quantum dot has a size of 8-1 Onm, and the red light emits a wavelength of 610 nm to 620 nm;
- the green quantum dot has a size of 5 to 7 nm, and the emitted green light has a wavelength of 540 nm to 550 nm;
- the size of the quantum dots is 3 to 5 ⁇ , and the wavelength of the blue light emitted is 475 nm to 485 nm.
- the wavelength range of the light of each color excited by the quantum dots in the embodiment of the present disclosure can be made narrower, that is, the color of the light of each color is relatively pure.
- the array substrate includes a quantum dot layer. If the light emitting structure (for example, the backlight) of the display device is located on the substrate substrate side of the array substrate, the path of the light in the array substrate is as shown in FIG. The dotted arrow in 1 is shown. After the white light enters the quantum dot layer, each quantum dot is excited by light. Correspondingly, the red quantum dot emits pure red light, the green quantum dot emits pure green light, and the blue quantum dot emits pure blue light, that is, the quantum dot layer 3 Under the excitation of white light or other light, a mixture of red, green and blue light is emitted.
- the light emitting structure for example, the backlight
- the color filter layer includes a red color filter region, a green filter region, and a blue filter region, and the red filter region allows only red light in the mixed light to pass, and absorbs the green light and the blue light; similarly, The green color filter area only allows the green light in the mixed light to pass, and absorbs the red and blue light; the blue color filter area allows only the blue light in the mixed light to pass.
- the final light can be ensured without increasing the color purity of the color filter layer on the color filter substrate.
- the saturation and the color purity are high, so that the light transmittance of the color filter layer can be ensured, thereby ensuring the display brightness of the display device.
- the red color filter area of the substrate in the embodiment of the present disclosure emits pure red light
- the green color filter area emits pure green light
- the blue color filter area emits pure blue light. It is apparent that the color of light emitted from the substrate in the embodiment of the present disclosure is relatively high, and therefore, the display device including the substrate can provide a wider variety of colors having a larger color gamut.
- the white light or other light provided by the light source first enters the quantum dot layer, and the quantum dots in the quantum dot layer are excited to emit mixed light including red light, green light, and blue light, and then the mixed light enters the color filter.
- Layers, different color filter areas in the color filter layer filter out different colors of light. Since the color purity of the monochromatic light emitted from the quantum dots is high, it is not necessary to increase the color purity of the color filter layer, thereby increasing the color gamut range of the display device without increasing the light output intensity of the light source of the display device.
- the array substrate includes: a substrate substrate 1, a thin film transistor unit 2, and a first insulation. a layer 4, a second insulating layer 5, a quantum dot layer 3, and a first conductive layer 6, wherein the first insulating layer 4 is provided with a first via hole 14, and the second insulating layer 5 is provided with a second via hole
- the quantum dot layer 3 is provided with a third via hole 16 , the first via hole 14 , the second via hole 15 and the third via hole 16 are in communication with each other, and corresponds to the thin film transistor unit 1
- the drain electrode 25 is connected to the drain 25 of the thin film transistor unit 1 through the third via 16, the second via 15, and the first via 14.
- the base substrate 1 can be made of a common transparent material such as glass or quartz; the gate electrode 21 can be made of a single layer of a metal such as molybdenum, aluminum, tungsten, titanium, or copper, or a single layer of one of its alloys, It may be made of a multilayer stack of the above metals or alloys; similarly, the source 24 or the drain 25 may be made of a single layer of a metal such as molybdenum, aluminum, tungsten, titanium, copper or the like, or a single layer of one of its alloys. Alternatively, it may be formed by laminating a plurality of layers of the above metals or alloys.
- the active layer 23 may be formed of a common semiconductor material such as amorphous silicon, polycrystalline silicon or indium gallium oxide; the first conductive layer 6 may be a common transparent conductive material such as indium tin oxide or indium oxide.
- the first conductive layer 6 is connected to the drain electrode 25 of the thin film transistor unit 1, and the conductive layer 6 corresponds to the pixel electrode of the array substrate.
- the first insulating layer 4 is also commonly referred to as a passivation layer, and the passivation layer process not only improves the ability of the display device to withstand harsh environments, but also contributes to improving the photoelectric performance of the thin film transistor unit 1.
- the passivation layer is usually formed of an insulating material such as silicon oxide, silicon nitride, hafnium oxide, or resin.
- the second insulating layer 5, also called a flat layer, is used to planarize the surface of the substrate, facilitating subsequent fabrication and processing of the array substrate.
- the quantum dot layer 3 is located between the first conductive layer 6 and the second insulating layer 5 .
- the quantum dot layer 3 may also be located on the first insulating layer 4 and the second insulating layer 5 . Between the two layers of the array substrate, as shown in FIG. 2, the embodiments of the present disclosure do not limit this.
- the array substrate shown in FIG. 1 or FIG. 2 is an array substrate of a twisted nematic (TN) mode.
- the structure of the array substrate shown in Fig. 1 is changed.
- the array substrate shown in FIG. 3 further includes a second conductive layer 8 on the basis of the array substrate shown in FIG. 1 , and a portion between the first conductive layer 6 and the second conductive layer 8
- the third insulating layer 7 and the second conductive layer 8 cooperate with the first conductive layer 6 to jointly drive the rotation of the liquid crystal molecules in the liquid crystal layer, that is, the second conductive layer 8 is a common electrode.
- the array substrate is an array substrate of an Advanced Super Dimension Switch (ADS) mode based on the COA process.
- ADS Advanced Super Dimension Switch
- ADS Advanced Super Dimension Switch
- the core technical characteristics are described as follows: The electric field generated by the edge of the slit electrode in the same plane and the electric field generated between the slit electrode layer and the plate electrode layer form a multi-dimensional electric field, so that the slit electrode between the liquid crystal cell and the electrode directly above The aligned liquid crystal molecules are capable of rotating, thereby improving the liquid crystal working efficiency and increasing the light transmission efficiency.
- Advanced super-dimensional field conversion technology can improve the picture quality of TFT-LCD products, with high resolution, high transmittance, low power consumption, wide viewing angle, high aperture ratio, low chromatic aberration, push mura, etc. advantage.
- ADS technology has improved high-transmission I-ADS technology, high aperture ratio H-ADS and high-resolution S-ADS technology.
- the second conductive layer 8 and the third insulating layer 7 may be formed on the structure of the array substrate shown in FIG. 2 to form an array substrate of the ADS mode, which will not be described herein.
- the first conductive layer 6 serving as the pixel electrode of the above embodiment may be in the form of a plate or a slit, as is the second conductive layer 8 serving as a common electrode.
- FIG. 1 shows the structure in which the pixel electrode is on the lower side and the common electrode, in practice, the positional relationship between the pixel electrode and the common electrode is interchangeable, but the upper electrode should be slit-shaped, under The electrode may be a plate electrode or a slit.
- a color filter layer and a thin film transistor as a driving switch are formed on different substrates and located on both sides of the liquid crystal layer.
- this arrangement causes a decrease in the aperture ratio of the display panel, thereby affecting Display panel brightness and picture quality.
- the market demand for the aperture ratio and brightness of display panels has increased.
- the industry has developed a technology in which a color filter layer is directly formed on an array substrate (Color Filter On Array, COA for short).
- the color filter layer and the thin film transistor are formed on one substrate, which not only can increase the aperture ratio of the display panel, increase the brightness of the display panel, but also avoid the problems caused by forming the color filter layer and the thin film transistor on different substrates.
- the array substrate further includes a color filter layer 9, and the color filter layer 9 is away from the light incident portion of the array substrate as compared with the quantum dot layer 3. Therefore, it can be ensured that the light provided by the display device first enters the quantum dot layer 3, and the quantum dots in the quantum dot layer 3 are excited to emit light, and the mixed light emitted by the quantum dots is filtered by the color filter layer 9 to provide a display device. Display the desired monochromatic light.
- the color filter layer 9 includes a plurality of color filter regions, and any of the color filter regions has only one color, corresponding to the light exit region of the pixel unit, and the light exit region, that is, the region between the two thin film transistor units. , that is, from FIG. 4, any of the color filter regions are disposed in the two thin film transistor units 1 between.
- the color filter layer 9 on the second insulating layer 5 should be processed such that the color filter layer 9 is provided with a fourth via hole 17 communicating with the second via hole 15 and the first via hole 14, Then, the first conductive layer 6 may be connected to the drain 25 through the fourth via 17, the second via 15, and the first via 14.
- the array substrate shown in Fig. 4 can also be processed to form a third insulating layer 7 and a second conductive layer 8 on the first conductive layer 6, forming an ADS array substrate of COA technology as shown in Fig. 6.
- the quantum dot layer includes a red quantum dot region, a blue quantum dot region, and a green quantum dot region, and correspondingly, the color filter layer a red color filter region, a blue color filter region, and a green color filter region, wherein the red color filter region corresponds to a red quantum dot region of the quantum dot layer, and the blue color filter region corresponds to the quantum dot A blue quantum dot region of the layer is disposed, and the green color filter region is disposed corresponding to a green quantum dot region of the quantum dot layer.
- each of the quantum dot regions corresponding to the color of one sub-pixel can be excited by the backlight to emit a monochromatic light, which can be finally transparent compared to the mixed light of red, green and blue light.
- the rate of increase is increased.
- the array substrate shown in FIG. 4 can be processed.
- the substrate further includes a fourth insulating layer 10, an organic layer 11, and a third conductive layer above the first conductive layer 6.
- the fourth insulating layer 10 has an opening 18, the organic layer 11 is connected to the first conductive layer 6 through the opening 18, and the first conductive layer 6 and the third conductive layer 12 are co-driven
- the organic layer 11 emits light, that is, the array substrate at this time is an array substrate of an Organic Light-Emitting Diode (OLED) mode.
- OLED Organic Light-Emitting Diode
- the organic layer 11 includes a hole transport layer, a light emitting layer and an electron transport layer.
- the voltage between the first conductive layer 6 and the third conductive layer 12 is appropriate, the holes in the hole transport layer and the electron transport layer The electrons recombine in the luminescent layer to cause the luminescent layer to occur.
- the electron transport layer and the hole transport layer of the organic light-emitting diode should be different organic materials or only organic impurities which are different in doping impurities. material.
- the materials most commonly used to make electron transport layers must have high film stability, thermal stability, and good electron transport properties.
- fluorescent dye compounds such as oxadiazole derivatives and naphthalene ring derivatives are generally used. 1-naphthyl, 3-decylphenyl, and the like.
- the material of the hole transport layer belongs to an aromatic amine fluorescent compound such as an organic material such as 1-naphthyl.
- the material of the organic layer 11 must have characteristics of strong fluorescence in a solid state, good carrier transport performance, good thermal stability and chemical stability, high quantum efficiency, and vacuum evaporation, for example, octahydroxyquinoline aluminum can be used.
- the organic layer 11 is selected to use a material capable of emitting white light.
- the third conductive layer 12 that cooperates with the first conductive layer 6 to drive the organic layer 11 to emit light may use a lower cost and opaque material such as aluminum.
- the light emitted from the organic layer 11 can be made to enter the array substrate substantially (as indicated by the dotted arrow in FIG. 7), and the utilization ratio of the light emitted from the organic layer 11 is increased. At the same time, it is also possible to prevent the light emitted from the organic layer 11 from being discolored by the conductive layer, thereby ensuring the display effect of the display device.
- the fourth insulating layer 10 may be disposed on a region of the first conductive layer 6 that does not need to emit light (for example, a corresponding region of the thin film transistor unit 1).
- the first conductive layer 6 and the organic layer 11 are insulated to prevent the organic layer 11 of the region from emitting light; and in the region where light is required, that is, the sub-pixel region, the organic layer 11 is provided by providing the opening 18 on the fourth insulating layer 10
- the first conductive layer 6 is connected through the opening 18.
- the fourth insulating layer 10 is also referred to as a pixel defining layer, and the sub-pixel region is defined to define a light-emitting region, wherein the region corresponding to the opening 18 is a light-emitting region, and the region covered by the fourth insulating layer 10 does not emit light.
- the thin film transistor unit 1 in the schematic diagram of the array substrate provided by the embodiment of the present disclosure is a bottom gate type thin film transistor unit
- a top gate type thin film transistor unit may also be selected, and the implementation of the present disclosure This example does not limit this.
- the display device may be a product or component having any display function, such as a liquid crystal panel, an electronic paper, an OLED panel, a liquid crystal television, a liquid crystal display, a digital photo frame, a mobile phone, a tablet computer, or the like.
- Embodiment 2 At least one embodiment of the present disclosure further provides a method for fabricating the above array substrate, the method comprising:
- Step S101 forming a pattern of each layer structure including the thin film transistor unit on the base substrate.
- Step S102 forming a quantum dot layer including at least three kinds of quantum dots on the thin film transistor unit, wherein any one of the quantum dots is excited by light from the incident light of the array substrate to emit light of a corresponding wavelength band.
- the thin film transistor unit 2 includes, in order from bottom to top, a gate electrode 21, a gate insulating layer 22 over the gate electrode 21, and an active layer 23 over the gate insulating layer 22, thus At the time of fabrication, the gate electrode 21, the gate insulating layer 22, and the active layer 23 are sequentially formed on the array substrate.
- a structure such as a gate line (not shown) on the base substrate 1 is integrally formed.
- the thin film transistor unit 2 further includes a source 21 and a drain 25 in addition to the above-described structures of the gate electrode 21, the gate insulating layer 22, the active layer 23 and the like.
- the source 21 and the drain 25 of the thin film transistor unit 2 are disposed in the same layer, so that the source 21 can be formed while forming the drain 25.
- the source 21 and the drain 25 are disposed in different layers, it may be considered that the source 21 is formed before or after the drain 25 is formed according to the actual situation, which is not limited in the embodiment of the present disclosure.
- the thin film transistor unit 2 Since the thin film transistor unit 2 has the above-described multilayer structure, each layer of the thin film transistor unit 2 is required to be placed in the etching gas or the etching liquid as a whole. Therefore, if the quantum dot layer 3 is provided Under the thin film transistor unit 2, there is no guarantee that the quantum dot layer 3 is still intact after being etched by a plurality of etching gases or etching liquids. Therefore, the quantum dot layer 3 should be fabricated after the thin film transistor unit is fabricated.
- the manufacturing method further includes: Step S201 , forming a first insulating layer on the thin film transistor unit, and patterning the first insulating layer a process of forming a first via corresponding to a drain of the thin film transistor unit.
- step S201 an array substrate as shown in Fig. 8 is formed.
- Step S202 forming a second insulating layer on the first insulating layer, and patterning the second insulating layer to form a protrusion corresponding to the first via hole.
- step S202 an array substrate as shown in Fig. 9 is formed.
- the second insulating layer 5 can be made of a positive photoresist, and the first exposure is performed by using a halftone mask. After development, a protrusion corresponding to the first via hole 14 is formed.
- Step S203 exposing the protrusions.
- step S102 includes:
- Step S204 forming a quantum dot layer over the second insulating layer, developing the protrusion to remove the quantum dot layer at the protrusion and the second insulating layer under the protrusion, and forming the quantum dot layer in the quantum dot layer a third via hole and a second via hole disposed in the second insulating layer, wherein the third via hole, the second via hole and the first via hole communicate with each other.
- the second insulating layer 5 at the protrusion of the corresponding region of the quantum dot layer 3 to be removed is exposed first.
- the treatment, the exposure time and the exposure light intensity are appropriately adjusted, so that the second insulating layer 5 at the protrusion is exposed; after that, the quantum dot layer 3 is formed by deposition or the like, and the quantum dot layer 3 covers the entire second insulating layer. 5, as shown in FIG. 10, at this time, the array substrate is developed, and since the second insulating layer 5 is made of a positive photoresist, the second insulating layer 5 at the exposed protrusions is removed. At the same time, the quantum dot layer 3 overlying the protrusions is also removed, forming a third via 16 disposed in the quantum dot layer 3 and a second via 15 disposed in the second insulating layer 5, as shown in FIG. Shown.
- step S204 the method further includes:
- Step S205 forming a pattern including the first conductive layer above the quantum dot layer.
- the first conductive layer 6 can be connected to the drain 25 of the thin film transistor unit 2, that is, the first conductive layer 6 corresponds to the pixel of the array substrate. electrode.
- the first via hole 14 of the first insulating layer 4 is formed by a patterning process performed immediately after the formation of the first insulating layer 4.
- the first via hole 14 may also be formed by using the second insulating layer 5 as a mask after forming the second via hole 15 and the third via hole 16 , and the method includes the following steps: Step S301 : forming a thin film transistor unit First insulating layer;
- Step S302 forming a second insulating layer over the first insulating layer, and patterning the second insulating layer to form a protrusion corresponding to a drain of the thin film transistor unit;
- Step S303 exposing the protrusions.
- Step S102 includes: Step S304, forming a quantum dot layer over the second insulating layer, and developing the protrusion to remove the quantum dot layer at the protrusion and the second insulating layer under the protrusion to form a third layer of the quantum dot layer a via hole and a second via hole of the second insulating layer, wherein the third via hole and the second via hole are in communication;
- Step S305 forming a first via corresponding to a drain of the thin film transistor unit in the first insulating layer by using the second insulating layer as a mask, the third via, the second via, and The first vias are in communication;
- Step S306 forming a pattern including the first conductive layer above the quantum dot layer.
- the array substrate as shown in Fig. 2 can also be formed.
- the method of fabricating the array substrate shown in Fig. 3 can be inferred. It should be noted that, since the quantum dot layer 3 in FIG. 3 is located between the first insulating layer 4 and the second insulating layer 5, in order to form the pattern of the quantum dot layer 3, it is necessary to use the halftone mask to the first layer.
- the insulating layer 4 is subjected to two patterning processes. Therefore, the first insulating layer 4 can be selected with a positive photoresist at this time. It should be noted that when the first exposure layer 4 is subjected to the second exposure, the exposed light should be controlled. The strength and time allow the first insulating layer 4 to completely cover the structure of the thin film transistor unit 2, the data line (not shown), and the like after being developed.
- a fifth insulating layer may be formed between the first insulating layer 4 and the quantum dot layer 3, and a pattern of the quantum dot layer 3 is formed by a patterning process of the fifth insulating layer, which will not be described herein.
- the manufacturing method further includes:
- a color filter layer is formed, wherein the color filter layer is farther from the entrance light of the array substrate than the quantum dot layer.
- the color filter layer 9 should be placed between the quantum dot layer 3 and the substrate substrate 1, such as 4; if the light provided by the display device is incident from the substrate substrate 1 side of the array substrate, the color filter layer 9 should be placed above the quantum dot layer 3, as shown in FIG.
- the first via hole 14 in Fig. 4 may be formed before or after the color filter layer 9 is formed, which is not limited in the present embodiment.
- a third insulating layer 7 and a second conductive layer 8 may be formed, and the third insulating layer 7 is located in the first conductive layer 6 and the second conductive layer 8.
- the second conductive layer 8 is equivalent to the matching A common electrode of a conductive layer 6, as shown in FIG.
- the first conductive layer 6 serving as the pixel electrode of the above embodiment may be in the form of a plate or a slit, as is the second conductive layer 8 serving as a common electrode.
- the pixel electrode shown in FIG. 2 is on the bottom and the common electrode is on, in practice, the position of the pixel electrode and the common electrode may be reversed, but the upper electrode should be slit-shaped, and the lower electrode may be Plate electrode. However, sometimes the upper and lower electrodes are slit-like.
- the third insulating layer 7 and the second conductive layer 8 may also be formed on the basis of the array substrate shown in FIG. 2, FIG. 4 or FIG. 5, and details are not described herein again.
- the organic layer 11 and the like are added to form an array substrate of the OLED mode shown in FIG.
- the method includes:
- Step S401 forming a fourth insulating layer on the first conductive layer, the fourth insulating layer having an opening thereon;
- Step S402 forming an organic layer on the fourth insulating layer, the organic layer contacting the first conductive layer through the opening;
- Step S403 forming a third conductive layer on the organic layer.
- the black matrix 13 needs to be disposed on the array substrate.
- a pattern including the black matrix 3 is formed over the thin film transistor unit 2. , as shown in Figure 7.
- the thin film transistor unit formed in the embodiment of the present disclosure may be a bottom gate type thin film transistor unit or a top gate type thin film transistor unit, which is not limited in the embodiment of the present disclosure.
Abstract
Description
Claims
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US14/428,847 US9455414B2 (en) | 2013-12-25 | 2014-05-29 | Array substrate, manufacturing method thereof, and display device |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201310728310.0 | 2013-12-25 | ||
CN201310728310.0A CN103730472B (zh) | 2013-12-25 | 2013-12-25 | 阵列基板及其制作方法、显示装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2015096391A1 true WO2015096391A1 (zh) | 2015-07-02 |
Family
ID=50454486
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/CN2014/078847 WO2015096391A1 (zh) | 2013-12-25 | 2014-05-29 | 阵列基板及其制作方法、显示装置 |
Country Status (3)
Country | Link |
---|---|
US (1) | US9455414B2 (zh) |
CN (1) | CN103730472B (zh) |
WO (1) | WO2015096391A1 (zh) |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9470826B2 (en) * | 2003-02-12 | 2016-10-18 | Hon Hai Precision Industry Co., Ltd. | Color filter and display panel using same |
CN103730472B (zh) * | 2013-12-25 | 2015-05-06 | 京东方科技集团股份有限公司 | 阵列基板及其制作方法、显示装置 |
CN104090402A (zh) * | 2014-06-19 | 2014-10-08 | 京东方科技集团股份有限公司 | 一种阵列基板及其制作方法、显示装置 |
CN104157671B (zh) * | 2014-06-25 | 2018-02-23 | 京东方科技集团股份有限公司 | 一种电致发光显示面板、其制备方法及显示装置 |
CN104880849A (zh) | 2015-06-01 | 2015-09-02 | 武汉华星光电技术有限公司 | 一种显示面板及液晶显示装置 |
CN105098084B (zh) * | 2015-06-16 | 2017-05-24 | 武汉华星光电技术有限公司 | 一种基于量子点的电致发光器件及显示装置 |
CN105097878B (zh) * | 2015-07-17 | 2018-02-13 | 京东方科技集团股份有限公司 | 有机电致发光显示面板及制备方法、显示装置 |
CN105140299B (zh) * | 2015-10-14 | 2017-12-15 | 京东方科技集团股份有限公司 | 薄膜晶体管及其制备方法 |
KR102516054B1 (ko) * | 2015-11-13 | 2023-03-31 | 삼성디스플레이 주식회사 | 유기발광표시장치 및 유기발광표시장치의 제조 방법 |
CN105259683B (zh) * | 2015-11-20 | 2018-03-30 | 深圳市华星光电技术有限公司 | Coa型阵列基板的制备方法及coa型阵列基板 |
CN105467666A (zh) * | 2016-01-28 | 2016-04-06 | 京东方科技集团股份有限公司 | 一种液晶显示面板及制作方法、显示装置 |
KR102562896B1 (ko) * | 2016-03-18 | 2023-08-04 | 삼성디스플레이 주식회사 | 디스플레이 장치 |
CN205900543U (zh) * | 2016-05-18 | 2017-01-18 | 武汉华星光电技术有限公司 | 一种oled显示面板 |
KR102607407B1 (ko) * | 2016-06-03 | 2023-11-28 | 삼성디스플레이 주식회사 | 표시 장치 및 이의 제조 방법 |
CN105911749A (zh) * | 2016-07-05 | 2016-08-31 | 京东方科技集团股份有限公司 | 一种阵列基板及显示装置 |
TWI605288B (zh) | 2017-01-16 | 2017-11-11 | 友達光電股份有限公司 | 畫素結構與具有此畫素結構的顯示面板 |
CN107102468A (zh) * | 2017-05-08 | 2017-08-29 | 京东方科技集团股份有限公司 | 一种显示装置及其制备方法 |
KR102392670B1 (ko) | 2017-06-07 | 2022-04-29 | 삼성디스플레이 주식회사 | 표시 장치 |
CN107910448A (zh) * | 2017-10-25 | 2018-04-13 | 信利半导体有限公司 | 一种ito基板及oled显示器 |
CN108761894B (zh) * | 2018-07-03 | 2022-04-15 | 京东方科技集团股份有限公司 | 一种彩膜基板、其制备方法、显示面板及显示装置 |
CN108598289B (zh) * | 2018-07-12 | 2019-11-08 | 京东方科技集团股份有限公司 | 封装盖板及其制造方法、显示面板及显示装置 |
CN110137184B (zh) | 2019-05-27 | 2021-09-21 | 京东方科技集团股份有限公司 | 一种阵列基板、显示面板和显示装置 |
CN112820762B (zh) * | 2020-12-31 | 2023-04-25 | 长沙惠科光电有限公司 | Oled显示器 |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070007881A1 (en) * | 2005-04-29 | 2007-01-11 | Kim Byung-Ki | Photo-luminescent liquid crystal display |
WO2010056240A1 (en) * | 2008-11-13 | 2010-05-20 | Hcf Partners, L.P. | Cross-linked quantum dots and methods for producing and using the same |
US20110261294A1 (en) * | 2010-04-23 | 2011-10-27 | Samsung Electronics Co., Ltd. | Color filter and display device employing the same |
CN103207476A (zh) * | 2013-04-07 | 2013-07-17 | 易美芯光(北京)科技有限公司 | 一种led背光液晶显示装置及其发光材料的涂覆方法 |
CN103226259A (zh) * | 2013-04-09 | 2013-07-31 | 北京京东方光电科技有限公司 | 液晶显示面板、显示装置及液晶显示面板的制造方法 |
CN103278876A (zh) * | 2013-05-28 | 2013-09-04 | 京东方科技集团股份有限公司 | 量子点彩色滤光片及其制作方法、显示装置 |
CN103730472A (zh) * | 2013-12-25 | 2014-04-16 | 京东方科技集团股份有限公司 | 阵列基板及其制作方法、显示装置 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9577137B2 (en) * | 2007-01-25 | 2017-02-21 | Au Optronics Corporation | Photovoltaic cells with multi-band gap and applications in a low temperature polycrystalline silicon thin film transistor panel |
TWI394071B (zh) * | 2009-08-14 | 2013-04-21 | Au Optronics Corp | 有機發光二極體觸控面板及其製作方法 |
KR101274068B1 (ko) * | 2010-05-25 | 2013-06-12 | 서울대학교산학협력단 | 양자점 발광 소자 및 이를 이용한 디스플레이 |
TWI442139B (zh) * | 2011-07-21 | 2014-06-21 | Au Optronics Corp | 液晶顯示裝置 |
JP2013037165A (ja) | 2011-08-08 | 2013-02-21 | Sony Corp | 表示装置およびその製造方法、ならびに電子機器 |
CN103226260B (zh) * | 2013-04-09 | 2015-12-09 | 北京京东方光电科技有限公司 | 液晶显示屏、显示装置及量子点层图形化的方法 |
-
2013
- 2013-12-25 CN CN201310728310.0A patent/CN103730472B/zh active Active
-
2014
- 2014-05-29 WO PCT/CN2014/078847 patent/WO2015096391A1/zh active Application Filing
- 2014-05-29 US US14/428,847 patent/US9455414B2/en active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070007881A1 (en) * | 2005-04-29 | 2007-01-11 | Kim Byung-Ki | Photo-luminescent liquid crystal display |
WO2010056240A1 (en) * | 2008-11-13 | 2010-05-20 | Hcf Partners, L.P. | Cross-linked quantum dots and methods for producing and using the same |
US20110261294A1 (en) * | 2010-04-23 | 2011-10-27 | Samsung Electronics Co., Ltd. | Color filter and display device employing the same |
CN103207476A (zh) * | 2013-04-07 | 2013-07-17 | 易美芯光(北京)科技有限公司 | 一种led背光液晶显示装置及其发光材料的涂覆方法 |
CN103226259A (zh) * | 2013-04-09 | 2013-07-31 | 北京京东方光电科技有限公司 | 液晶显示面板、显示装置及液晶显示面板的制造方法 |
CN103278876A (zh) * | 2013-05-28 | 2013-09-04 | 京东方科技集团股份有限公司 | 量子点彩色滤光片及其制作方法、显示装置 |
CN103730472A (zh) * | 2013-12-25 | 2014-04-16 | 京东方科技集团股份有限公司 | 阵列基板及其制作方法、显示装置 |
Also Published As
Publication number | Publication date |
---|---|
US20150380671A1 (en) | 2015-12-31 |
CN103730472B (zh) | 2015-05-06 |
CN103730472A (zh) | 2014-04-16 |
US9455414B2 (en) | 2016-09-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO2015096391A1 (zh) | 阵列基板及其制作方法、显示装置 | |
US11832495B2 (en) | Display apparatus and manufacturing method therefor | |
US11296149B2 (en) | Display substrate, display panel, display apparatus, and method of fabricating a display substrate thereof | |
US9209231B2 (en) | Array substrate, method for fabricating the same, and OLED display device | |
US9064822B2 (en) | Organic electroluminescent device and method of manufacturing the same | |
CN110911463B (zh) | Oled显示背板及其制作方法和oled显示装置 | |
WO2020199445A1 (zh) | 一种oled显示器件及其制备方法 | |
US11081680B2 (en) | Pixel structure, method for forming the same, and display screen | |
WO2019052002A1 (zh) | 一种彩膜基板及显示设备 | |
TWI611613B (zh) | 有機發光裝置及該裝置的製造方法 | |
WO2015096378A1 (zh) | 阵列基板及其制备方法、显示装置 | |
WO2015096308A1 (zh) | Oled显示面板及其制作方法 | |
US11183111B2 (en) | Pixel unit and method for manufacturing the same, and double-sided OLED display device | |
US20220285454A1 (en) | Display panel, manufacturing method thereof and display device | |
CN106158739B (zh) | 显示器的阵列基板及其制造方法 | |
WO2015096318A1 (zh) | 阵列基板及其制作方法、显示装置 | |
WO2015096310A1 (zh) | 一种oled阵列基板的对置基板及其制备方法、显示装置 | |
KR20120139076A (ko) | 디스플레이 장치 | |
WO2016119380A1 (zh) | 薄膜晶体管及制备方法、阵列基板及制备方法、显示装置 | |
US20200241183A1 (en) | Color film structure, color film substrate, display panel and display device | |
US20220020780A1 (en) | Thin film transistor and method of manufacturing the same, display substrate, and display device | |
US11917894B2 (en) | Method for preparing organic electroluminescent device, and organic electroluminescent device and display apparatus | |
WO2015078157A1 (zh) | 彩膜基板及其制作方法、显示装置 | |
WO2019153401A1 (zh) | 一种oled显示面板 | |
CN110137233B (zh) | 阵列基板及其制备方法、显示装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
WWE | Wipo information: entry into national phase |
Ref document number: 14428847 Country of ref document: US |
|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 14874616 Country of ref document: EP Kind code of ref document: A1 |
|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
32PN | Ep: public notification in the ep bulletin as address of the adressee cannot be established |
Free format text: NOTING OF LOSS OF RIGHTS PURSUANT TO RULE 112(1) EPC (EPO FORM 1205A DATED 02.12.2016) |
|
122 | Ep: pct application non-entry in european phase |
Ref document number: 14874616 Country of ref document: EP Kind code of ref document: A1 |