WO2015084466A3 - Sources de rayons x utilisant l'accumulation linéaire - Google Patents

Sources de rayons x utilisant l'accumulation linéaire Download PDF

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Publication number
WO2015084466A3
WO2015084466A3 PCT/US2014/056688 US2014056688W WO2015084466A3 WO 2015084466 A3 WO2015084466 A3 WO 2015084466A3 US 2014056688 W US2014056688 W US 2014056688W WO 2015084466 A3 WO2015084466 A3 WO 2015084466A3
Authority
WO
WIPO (PCT)
Prior art keywords
ray
microstructures
brightness
allows
rays
Prior art date
Application number
PCT/US2014/056688
Other languages
English (en)
Other versions
WO2015084466A2 (fr
Inventor
Wenbing Yun
Sylvia Jia Yun Lewis
Janos KIRZ
Alan Francis Lyon
Original Assignee
Sigray, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US14/465,816 external-priority patent/US20150092924A1/en
Application filed by Sigray, Inc. filed Critical Sigray, Inc.
Priority to CN201480051973.6A priority Critical patent/CN105556637B/zh
Priority to JP2016544039A priority patent/JP2016537797A/ja
Priority to EP14868433.5A priority patent/EP3047501A4/fr
Priority to EP16200793.4A priority patent/EP3168856B1/fr
Priority claimed from US14/490,672 external-priority patent/US9390881B2/en
Publication of WO2015084466A2 publication Critical patent/WO2015084466A2/fr
Publication of WO2015084466A3 publication Critical patent/WO2015084466A3/fr

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08—Anodes; Anti cathodes
    • H01J35/10—Rotary anodes; Arrangements for rotating anodes; Cooling rotary anodes
    • H01J35/105—Cooling of rotating anodes, e.g. heat emitting layers or structures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00—X-ray tubes
    • H01J2235/08—Targets (anodes) and X-ray converters
    • H01J2235/083—Bonding or fixing with the support or substrate
    • H01J2235/084—Target-substrate interlayers or structures, e.g. to control or prevent diffusion or improve adhesion
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00—X-ray tubes
    • H01J2235/08—Targets (anodes) and X-ray converters
    • H01J2235/086—Target geometry

Landscapes

  • X-Ray Techniques (AREA)

Abstract

L'invention concerne une source compacte de génération de rayons X à haute luminosité. Cette haute luminosité est obtenue via le bombardement par faisceau électronique de multiples régions alignées les unes avec les autres pour obtenir une accumulation linéaire de rayons X. Ceci est réalisé en alignant des émetteurs de rayons X discrets, ou via l'utilisation de nouvelles cibles de rayons X comprenant un certain nombre de microstructures de matériaux générant des rayons X fabriqués en contact thermique étroit avec un substrat à haute conductivité thermique. Ceci permet d'évacuer plus efficacement la chaleur du matériau générant des rayons X et permet le bombardement de ce matériau avec une densité électronique plus élevée et/ou des électrons à énergie plus élevée, menant à une luminosité de rayons X plus grande. L'orientation des microstructures permet d'utiliser un angle de recueil dans l'axe, permettant à l'accumulation de rayons X à partir de plusieurs microstructures d'être alignée, en semblant avoir une origine unique, ce qui est également connu comme une émission de rayons X à angle nul.
PCT/US2014/056688 2013-09-19 2014-09-19 Sources de rayons x utilisant l'accumulation linéaire WO2015084466A2 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
CN201480051973.6A CN105556637B (zh) 2013-09-19 2014-09-19 使用线性累加的x射线源
JP2016544039A JP2016537797A (ja) 2013-09-19 2014-09-19 直線累積を用いたｘ線ソース
EP14868433.5A EP3047501A4 (fr) 2013-09-19 2014-09-19 Sources de rayons x utilisant l'accumulation linéaire
EP16200793.4A EP3168856B1 (fr) 2013-09-19 2014-09-19 Sources de rayons x utilisant l'accumulation linéaire

Applications Claiming Priority (12)

Application Number Priority Date Filing Date Title
US201361880151P 2013-09-19 2013-09-19
US61/880,151 2013-09-19
US201361894073P 2013-10-22 2013-10-22
US61/894,073 2013-10-22
US201461931519P 2014-01-24 2014-01-24
US61/931,519 2014-01-24
US201462008856P 2014-06-06 2014-06-06
US62/008,856 2014-06-06
US14/465,816 2014-08-21
US14/465,816 US20150092924A1 (en) 2013-09-04 2014-08-21 Structured targets for x-ray generation
US14/490,672 US9390881B2 (en) 2013-09-19 2014-09-19 X-ray sources using linear accumulation
US14/490,672 2014-09-19

Publications (2)

Publication Number Publication Date
WO2015084466A2 WO2015084466A2 (fr) 2015-06-11
WO2015084466A3 true WO2015084466A3 (fr) 2015-07-30

Family

ID=53274258

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2014/056688 WO2015084466A2 (fr) 2013-09-19 2014-09-19 Sources de rayons x utilisant l'accumulation linéaire

Country Status (4)

Country Link
EP (2) EP3168856B1 (fr)
JP (2) JP2016537797A (fr)
CN (1) CN105556637B (fr)
WO (1) WO2015084466A2 (fr)

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US10269528B2 (en) 2013-09-19 2019-04-23 Sigray, Inc. Diverging X-ray sources using linear accumulation
US10297359B2 (en) 2013-09-19 2019-05-21 Sigray, Inc. X-ray illumination system with multiple target microstructures
US10416099B2 (en) 2013-09-19 2019-09-17 Sigray, Inc. Method of performing X-ray spectroscopy and X-ray absorption spectrometer system
US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
US10304580B2 (en) 2013-10-31 2019-05-28 Sigray, Inc. Talbot X-ray microscope
US10401309B2 (en) 2014-05-15 2019-09-03 Sigray, Inc. X-ray techniques using structured illumination
US10352880B2 (en) 2015-04-29 2019-07-16 Sigray, Inc. Method and apparatus for x-ray microscopy
US10295486B2 (en) 2015-08-18 2019-05-21 Sigray, Inc. Detector for X-rays with high spatial and high spectral resolution
KR101724213B1 (ko) * 2015-12-04 2017-04-18 전남대학교산학협력단 엑스선 하베스팅 장치
US10247683B2 (en) 2016-12-03 2019-04-02 Sigray, Inc. Material measurement techniques using multiple X-ray micro-beams
GB2565138A (en) * 2017-08-04 2019-02-06 Adaptix Ltd X-ray generator
US10847336B2 (en) * 2017-08-17 2020-11-24 Bruker AXS, GmbH Analytical X-ray tube with high thermal performance
CN107887243B (zh) * 2017-09-19 2019-11-08 中国电子科技集团公司第三十八研究所 一种用于电子束扫描ct的x射线源的阵列靶及制作方法
US10624195B2 (en) * 2017-10-26 2020-04-14 Moxtek, Inc. Tri-axis x-ray tube
CN108269725A (zh) * 2018-01-24 2018-07-10 宁波英飞迈材料科技有限公司 一种脉冲式x射线发生装置及产生方法
JP6857400B2 (ja) 2018-03-01 2021-04-14 株式会社リガク Ｘ線発生装置、及びｘ線分析装置
US10578566B2 (en) 2018-04-03 2020-03-03 Sigray, Inc. X-ray emission spectrometer system
DE112019002822T5 (de) 2018-06-04 2021-02-18 Sigray, Inc. Wellenlängendispersives röntgenspektrometer
GB2591630B (en) 2018-07-26 2023-05-24 Sigray Inc High brightness x-ray reflection source
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
WO2020051061A1 (fr) 2018-09-04 2020-03-12 Sigray, Inc. Système et procédé pour fluorescence à rayon x avec filtration
WO2020051221A2 (fr) 2018-09-07 2020-03-12 Sigray, Inc. Système et procédé d'analyse de rayons x sélectionnable en profondeur
WO2021011209A1 (fr) 2019-07-15 2021-01-21 Sigray, Inc. Source de rayons x avec anode tournante à pression atmosphérique
CN114729907B (zh) * 2019-09-03 2023-05-23 斯格瑞公司 用于计算机层析x射线荧光成像的系统和方法
CN111479377A (zh) * 2020-04-22 2020-07-31 吉林大学 一种d-d中子管靶膜保护层
WO2022126071A1 (fr) * 2020-12-07 2022-06-16 Sigray, Inc. Système d'imagerie radiographique 3d à haut débit utilisant une source de rayons x de transmission
JP2022105848A (ja) 2021-01-05 2022-07-15 浜松ホトニクス株式会社 Ｘ線発生装置及びｘ線撮像システム
JP2022105846A (ja) 2021-01-05 2022-07-15 浜松ホトニクス株式会社 Ｘ線発生用ターゲット、ｘ線発生装置及びｘ線撮像システム
GB2604137A (en) * 2021-02-25 2022-08-31 Modular Energy Tech Ltd Experimentation and electricity generation apparatus
US11992350B2 (en) 2022-03-15 2024-05-28 Sigray, Inc. System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector
US11885755B2 (en) 2022-05-02 2024-01-30 Sigray, Inc. X-ray sequential array wavelength dispersive spectrometer

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Publication number Priority date Publication date Assignee Title
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Patent Citations (5)

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Publication number Priority date Publication date Assignee Title
EP1028451A1 (fr) * 1998-11-25 2000-08-16 Picker International, Inc. Tube à rayons X et méthode de génération d'une pluralité de faisceaux X
US20050074094A1 (en) * 2003-10-03 2005-04-07 Ge Medical Systems Global Technology Company, Llc Method and apparatus for x-ray anode with increased coverage
JP2007265981A (ja) * 2006-03-03 2007-10-11 Canon Inc マルチｘ線発生装置
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Title
See also references of EP3047501A4 *

Also Published As

Publication number Publication date
CN105556637A (zh) 2016-05-04
EP3047501A4 (fr) 2017-06-21
EP3047501A2 (fr) 2016-07-27
EP3168856B1 (fr) 2019-07-03
JP2016537797A (ja) 2016-12-01
EP3168856A3 (fr) 2017-08-23
EP3168856A2 (fr) 2017-05-17
JP2019012695A (ja) 2019-01-24
WO2015084466A2 (fr) 2015-06-11
JP6659025B2 (ja) 2020-03-04
CN105556637B (zh) 2019-12-10

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