WO2015014065A1 - 检测信号线和修复线的短路的方法 - Google Patents

检测信号线和修复线的短路的方法 Download PDF

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Publication number
WO2015014065A1
WO2015014065A1 PCT/CN2013/088996 CN2013088996W WO2015014065A1 WO 2015014065 A1 WO2015014065 A1 WO 2015014065A1 CN 2013088996 W CN2013088996 W CN 2013088996W WO 2015014065 A1 WO2015014065 A1 WO 2015014065A1
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Prior art keywords
line
short
detection voltage
repair
voltage
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English (en)
French (fr)
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汤展峰
刘俊豪
张明亮
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BOE Technology Group Co Ltd
Hefei BOE Optoelectronics Technology Co Ltd
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BOE Technology Group Co Ltd
Hefei BOE Optoelectronics Technology Co Ltd
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    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136259—Repairing; Defects
    • G02F1/136263—Line defects
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F2201/00—Constructional arrangements not provided for in groups G02F1/00 - G02F7/00
    • G02F2201/50—Protective arrangements
    • G02F2201/506—Repairing, e.g. with redundant arrangement against defective part
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00—Aspects of the constitution of display devices
    • G09G2300/04—Structural and physical details of display devices
    • G09G2300/0421—Structural details of the set of electrodes
    • G09G2300/0426—Layout of electrodes and connections
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
    • G09G2330/08—Fault-tolerant or redundant circuits, or circuits in which repair of defects is prepared

Definitions

  • the present invention relates to a method of detecting a short circuit between a signal line and a repair line. Background technique
  • TFT-LCDs thin film transistor liquid crystal displays
  • small size products typically use a Shorting Bar test during the Cell Test process.
  • a common electrode line 4 is formed on the display panel, a shorting bar corresponding to the driving red sub-pixel data line 5, a shorting bar 2 corresponding to the driving green sub-pixel data line 6, and a driving blue sub-pixel data line 7 are provided.
  • Three shorting bars 1, 2, and 3 are connected to the corresponding data lines 5, 6, and 7 through vias 8, respectively, for applying detection voltages to data lines 5, 6, and 7.
  • a repair line 9 is also formed on the display panel. If one of the data lines is short-circuited with the repair line 9, as shown in FIG. 1, a certain data line 6 and the repair line 9 are short-circuited at the intersection 10, and the detection of the data line 6 is performed. The voltage is pulled low (the voltage of the data line is positive, and the repair line voltage is zero, that is, no voltage). However, since the repair line 9 itself has no voltage, and the data line 6 is connected to other data lines 6 (the data lines driving the same color sub-pixels are connected together), the repair line 9 can only pull the voltage of these data lines 6 to a minimum.
  • the difference between the data line 6 short-circuited to the repair line 9 and the un-short-circuited data line 6 is small, that is, the voltage of the pixel electrode driven by the short-circuited data line 6 and the pixel electrode driven by the other data line 6.
  • the gap is small, the difference in liquid crystal deflection is not obvious, and the difference in display color is not obvious, so this short-circuit defect is not easy to detect.
  • the full contact detection mode is adopted.
  • the data line 6 is not connected to other data lines 6 (disconnected along the broken line in the figure), and the repair line 9 can pull down the data line 6
  • the voltage and voltage are small, the degree of liquid crystal deflection is different from that of the normal area, and the detection phenomenon is a bright line.
  • the entire panel may be scrapped. If it is not serious, the repair process will be additionally added. Therefore, there is a need for a method capable of detecting a situation in which a data line and a repair line are short-circuited during a Cell Test phase. Summary of the invention
  • the present invention provides a method for detecting a short circuit of a signal line and a repair line, including:
  • the display condition of the pixel is detected, and if a predetermined display abnormality occurs in the pixel driven by the signal line, it is detected that the signal line and the repair line are short-circuited.
  • the signal line is connected to the shorting bar, and the first detection voltage is applied to the signal line through the shorting bar.
  • repair line is connected to the common electrode line, and the voltage of the common electrode line is applied to the repair line as the second detection voltage.
  • the signal line includes: a gate line or a data line.
  • the data line is connected to a data line short-circuit strip; or the data line driving the same color sub-pixel is connected to the same data line short-circuit strip, and the data lines driving the different color sub-pixels are connected to different data line short-circuit strips.
  • a first detection voltage is applied to the different data lines by different data line shorting bars.
  • the predetermined display abnormality includes: the display of the pixel driven by the data line short-circuited with the repair line has the largest difference from the normal monochrome picture, and the two sides of the pixel driven by the data line short-circuited with the repair line Extending, the closer the display color is to the normal monochrome picture, the normal monochrome picture is a monochrome picture that should be displayed when the data line is not short-circuited with the repair line.
  • the gate line is connected to the gate line shorting bar, and the first detection voltage is applied to the gate line through the gate line shorting bar.
  • the first detection voltage is smaller than an opening voltage of the gate line driven thin film transistor, the second detection voltage is not less than an opening voltage of the gate line driven thin film transistor; or the first detection voltage is not less than the The turn-on voltage of the gate line driven thin film transistor, the second detection voltage is small The turn-on voltage of the thin film transistor driven by the gate line.
  • the predetermined display abnormality includes: a pixel driven by a gate line short-circuited with the repair line and a pixel within a certain width of both sides thereof display a monochrome picture different in color from a normal monochrome picture, the normal monochrome
  • the picture is a monochrome picture that should be displayed when the gate line is not short-circuited with the repair line.
  • the present invention applies a second detection voltage to the repair line while applying a first detection voltage to the signal line, and if the signal line and the repair line are short-circuited, the signal line and the other signal line are short-circuited by the second detection voltage.
  • the difference is increased, thereby amplifying the degree of difference in the final display, thereby making it easier to detect which signal line is short-circuited with the repair line.
  • 1 is a schematic view of short circuit strip detection in the prior art
  • FIG. 2 is a flow chart of a method for detecting a short circuit condition of a data line and a repair line according to an embodiment of the present invention
  • FIG. 3 is a schematic illustration of the detection using the method of the present invention. detailed description
  • the method for detecting a short circuit between a signal line and a repair line includes:
  • Step S210 when driving the pixel display, applying a first detection voltage to the signal line, and simultaneously applying a second detection voltage that is not equal to the first detection voltage to the repair line;
  • Step S220 detecting the display condition of the pixel, if the pixel corresponding to the signal line driving does not meet the display abnormality of the predetermined screen, detecting that the signal line and the repair line are short-circuited.
  • the signal line when detecting a liquid crystal cell, the signal line usually includes a gate line and a data line, and the data line is taken as an example for detailed description below.
  • a first detection voltage may be applied to the data line by means of an external signal line, and a second detection voltage is also applied to the repair line through a different external signal line.
  • whether the data line and the repair line are short-circuited can be detected based on the detection structure of the Shorting Bar detection mode.
  • the data lines 5', 6', and ⁇ are respectively connected to corresponding data line shorting bars, 2' and 3'.
  • the repair line 9' is connected to a different signal source than the shorting bar, preferably, in order not to additionally increase the signal source, the repair line 9' is connected to the common electrode line 4' via the wire 11' (the display device usually has a common electrode line) And data lines The applied voltage is different).
  • the detection mode can control the deflection of the liquid crystal by the voltage difference between the data line shorting strip, 2' and 3' and the common electrode line 4' to realize various predetermined test color pictures (the monochrome picture is usually displayed during the test) If a bright line or a dark line is abnormal in the screen, the corresponding problem that the data line and the repair line are short-circuited is detected.
  • one of the data lines 6' is short-circuited with the repair line 9' (eg, the data line 6' and the repair line 9' are at the intersection 10' A short circuit occurs and the voltage of all data lines 6' is pulled low.
  • the common electrode line 4' is not connected with respect to the repair line 9', the voltage of the data line 6' short-circuited with the repair line 9' is pulled lower. The further the other data lines 6 from the shorted data line 6' are pulled down, the smaller the extent.
  • the voltage of the shorted data line 6' is pulled to a minimum such that the voltage difference between the common electrode and the pixel electrode driven by the shorted data line 6' is not equal to the voltage between the common electrode and the pixel electrode driven by the other data line 6'. Poor, and the voltage difference between the common electrode and the pixel electrode driven by the shorted data line 6' is significantly smaller than the voltage difference between the common electrode and the pixel electrode driven by the other data line 6' (especially relative to the common electrode and the off-short data) Line 6' is the voltage difference between the pixel electrodes driven by the farther data line 6'). The difference in voltage difference causes the degree of liquid crystal deflection to be significantly different from the normal area.
  • the detection phenomenon is that the pixel display driven by the shorted data line 6' has the largest difference from the normal monochrome picture, and the closer to the two sides of the pixel, the closer the color is to the normal single.
  • the color picture so that it is easier to determine which data line 6' is short-circuited with the repair line 9', depending on where the picture difference is greatest.
  • the normal monochrome picture is a monochrome picture that should be displayed when the data line 6' is not short-circuited with the repair line 9'. If the second detection voltage is greater than the first detection voltage, the shorted data line 6' and the other data line 6' are pulled high, and the detection principle and the second detection voltage are similar to the first detection voltage, and are not described herein again.
  • the monochrome mode is usually used for detection, that is, the entire screen displays only one color.
  • the data line driven red, green and blue pixels can be combined into a plurality of different single colors.
  • the screen displays red, green and blue monochrome pictures, which makes the detection more accurate.
  • only one data line shorting bar can be set, and the first detection voltage is applied to all the data lines through the data line shorting bar, which is especially suitable for some monochrome display devices.
  • the gate line shorting bar applies a first detection voltage to the gate line that is smaller than the turn-on voltage of the thin film transistor TFT driven by the gate line, that is, the gate line cannot open the TFT, and the data line cannot charge the corresponding pixel electrode.
  • the display screen at this time is a normal monochrome screen (that is, the display screen when the pixel electrode is not powered. At this time, the liquid crystal does not deflect. If it is a normally black mode, the backlight cannot pass through, and usually displays black, if it is always white. Mode, the backlight can pass through, showing the same white picture as the backlight).
  • the common electrode line shorting bar applies a thin film transistor that is not smaller than the gate line driving for the repair line
  • the second detection voltage of the turn-on voltage of the TFT If a certain gate line is short-circuited with the repair line, it is equivalent to applying a voltage of the common electrode line to the gate line, the TFT driven by the gate line is turned on, and the data line is charged for a row of pixels opened by the gate line, the row of pixels The liquid crystal is deflected. Since the gate lines are all connected to the shorting bars, the voltage of the gate lines is pulled high, and the voltage of the gate lines closer to the shorting gate lines is higher than the voltage of the gate lines farther from the shorting gate lines. May be larger than the open voltage of the TFT.
  • the gate line driving TFT closer to the short-circuit gate line is in an open state, and the data line charges the plurality of rows of pixels opened by the gate lines, and the liquid crystal of the plurality of rows of pixels is deflected to display a screen different from the normal monochrome screen.
  • a short-width gate line driving pixel and a pixel within a certain width on both sides thereof display a monochrome picture of a different color from a normal monochrome picture
  • the normal monochrome picture is a monochrome picture that should be displayed when the gate line is not short-circuited with the repair line. There are no areas of different colors.
  • the gate line shorting bar applies a first detection voltage to the gate line that is not less than the turn-on voltage of the gate line-driven thin film transistor TFT, that is, the gate driving signal can turn on the TFT, and the common electrode line short-circuit strip A second detection voltage that is smaller than the turn-on voltage of the gate line-driven thin film transistor TFT is applied to the repair line.
  • each gate line can open the TFT of the corresponding row, so a normal picture of a certain color is displayed. If a certain gate line is short-circuited with the repair line, the voltage of the gate line is pulled down to the second detection voltage.
  • the gate lines are connected to the shorting bars, the voltage of the gate lines is pulled down, and the voltage of the gate lines closer to the shorting gate lines is lower than the voltage of the gate lines farther from the shorting gate lines. May be smaller than the TFT's turn-on voltage. Therefore, the TFTs driven by the gate lines and the adjacent gate lines cannot be turned on, and the data lines cannot charge the pixels corresponding to the gate lines, and the liquid crystals of the pixels of the line are not deflected to display a picture different from the normal picture (if the black mode is normal) The backlight is not transparent. Usually, the short-circuited gate line drives the pixels and pixels within a certain width of the two sides to display a black picture.
  • the backlight can pass through, usually within a certain width of the short-circuited gate line driving pixels and both sides thereof.
  • the pixels display the same white picture as the backlight, thereby detecting which gate line is shorted to the repair line.
  • the present invention applies a second detection voltage to the repair line while applying a first detection voltage to the signal line, and if the signal line and the repair line are short-circuited, thereby further increasing the signal line between the repair line and the other signal line.
  • the voltage difference makes it easy to detect which signal line is shorted to the repair line through the display screen.

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Abstract

一种信号线和修复线（9'）的短路检测方法，包括步骤：在液晶盒检测阶段驱动像素显示时，施加第一检测电压至信号线，同时施加与第一检测电压不相等的第二检测电压至修复线（9'）检测像素的显示情况，若信号线驱动的像素出现预定的显示异常，则检测出信号线与修复线（9'）短路。在对信号线施加第一检测电压同时，对修复线（9'）施加第二检测电压，若信号线与修复线（9'）短路，则通过第二检测电压使与修复线（9'）短路的信号线与其它信号线的压差增大，从而放大最终显示的差异程度，从而更容易地检测出哪条信号线与修复线（9'）发生了短路。

Description

检测信号线和修复线的短路的方法 技术领域 本发明涉及一种检测信号线和修复线的短路的方法。 背景技术
在薄膜晶体管液晶显示器（TFT-LCD )制造过程中， 小尺寸产品在液晶 盒检测 （Cell Test )过程中通常采用短路条 ( Shorting Bar )检测方式。 如图 1所示， 显示面板上形成有公共电极线 4、 驱动红色亚像素数据线 5对应的 短路条 1、 驱动绿色亚像素数据线 6对应的短路条 2和驱动蓝色亚像素数据 线 7对应的短路条 3。三条短路条 1、 2和 3分别通过过孔 8连接对应的数据 线 5、 6和 7, 用于为数据线 5、 6和 7施加检测电压。
显示面板上还形成有修复线 9,如果其中某一条数据线与修复线 9短路， 如图 1 中， 某条数据线 6与修复线 9在交叉点 10发生短路， 该条数据线 6 的检测电压被拉低（数据线的电压都为正， 而修复线电压为零， 即无电压）。 但是由于修复线 9本身无电压， 且该条数据线 6与其他数据线 6连接 (驱动 相同颜色亚像素的数据线连在一起）， 修复线 9只能将这些数据线 6电压拉 低极小部分， 与修复线 9短路的数据线 6相对于未短路的数据线 6被拉低的 差异很小， 即短路的这条数据线 6驱动的像素电极与其它数据线 6驱动的像 素电极的电压差距 4艮小，液晶偏转的差异不明显，显示颜色的差异也不明显， 因此这种短路不良不容易检出。 而模组 （Module ) 阶段时为全接触 （Full Contact )检测方式，该条数据线 6不与其他数据线 6连接（沿图中虚线断开）， 修复线 9可以拉低这条数据线 6电压， 电压变小会导致液晶偏转程度不同于 正常区域， 检测现象表现为亮线。 但此时检测出来后， 若问题严重可能导致 整个面板报废， 不严重时也会额外增加修复流程。 因此， 需要一种能够在液 晶盒测试（Cell Test ) 阶段检测出数据线和修复线短路的情况的方法。 发明内容
为解决上述技术问题， 本发明提供了一种用于检测信号线和修复线的短 路的方法， 包括：
在液晶盒检测阶段驱动像素显示时， 施加第一检测电压至所述信号线， 同时施加与所述第一检测电压不相等的第二检测电压至所述修复线；
检测像素的显示情况， 若所述信号线驱动的像素出现预定的显示异常， 则检测出所述信号线和所述修复线短路。
其中， 将所述信号线连接至短路条， 通过所述短路条施加所述第一检测 电压至所述信号线。
其中， 将所述修复线连接至公共电极线， 将所述公共电极线的电压作为 所述第二检测电压施加至所述修复线。
其中， 所述信号线包括： 栅线或数据线。
其中， 所述数据线连接一条数据线短路条； 或者驱动相同颜色亚像素的 数据线连接同一条所述数据线短路条，驱动不同颜色亚像素的数据线连接不 同的所述数据线短路条，通过不同的数据线短路条施加第一检测电压至所述 不同的数据线。
其中， 所述预定的显示异常包括： 与所述修复线短路的数据线所驱动的 像素的显示与正常单色画面差异最大，越向与所述修复线短路的数据线所驱 动的像素两侧延伸， 显示色彩越接近于正常单色画面， 所述正常单色画面为 所述数据线未与所述修复线短路时应该显示的单色画面。
其中， 所述栅线连接栅线短路条， 通过所述栅线短路条施加所述第一检 测电压至所述栅线。
所述第一检测电压小于所述栅线驱动的薄膜晶体管的开启电压，所述第 二检测电压不小于所述栅线驱动的薄膜晶体管的开启电压； 或者所述第一检 测电压不小于所述栅线驱动的薄膜晶体管的开启电压， 所述第二检测电压小 于所述栅线驱动的薄膜晶体管的开启电压。
其中， 所述预定的显示异常包括： 与所述修复线短路的栅线所驱动的像 素及其两侧一定宽度内的像素显示与正常单色画面不同颜色的单色画面，所 述正常单色画面为所述栅线未与所述修复线短路时应该显示的单色画面。
本发明通过在对信号线施加第一检测电压同时，对修复线施加第二检测 电压， 若信号线和修复线短路， 通过第二检测电压使与修复线短路的信号线 与其它信号线的压差增大， 从而放大最终显示的差异程度， 由此更容易地检 测出哪条信号线与修复线发生了短路。 附图说明 为了更清楚地说明本发明实施例的技术方案， 下面将对实施例的附图作 筒单地介绍，显而易见地，下面描述中的附图仅仅涉及本发明的一些实施例， 而非对本发明的限制。
图 1是现有技术中的短路条检测示意图；
图 2是本发明实施例的一种用于检测数据线和修复线的短路情况的方法 流程图；
图 3是利用本发明方法的检测示意图。 具体实施方式
为使本发明实施例的目的、 技术方案和优点更加清楚， 下面将结合本发 明实施例的附图，对本发明实施例的技术方案进行清楚、完整地描述。显然， 所描述的实施例是本发明的一部分实施例， 而不是全部的实施例。 基于所描 述的本发明的实施例，本领域普通技术人员在无需创造性劳动的前提下所获 得的所有其他实施例， 都属于本发明保护的范围。
除非另作定义， 此处使用的技术术语或者科学术语应当为本发明所属领 域内具有一般技能的人士所理解的通常意义。本发明专利申请说明书以及权 利要求书中使用的 "第一" 、 "第二" 以及类似的词语并不表示任何顺序、 数量或者重要性，而只是用来区分不同的组成部分。同样， "一个 "或者 "一" 等类似词语也不表示数量限制， 而是表示存在至少一个。 "包括" 或者 "包 含" 等类似的词语意指出现在 "包括" 或者 "包含" 前面的元件或者物件涵 盖出现在 "包括" 或者 "包含" 后面列举的元件或者物件及其等同， 并不排 除其他元件或者物件。 "连接" 或者 "相连" 等类似的词语并非限定于物理 的或者机械的连接， 而是可以包括电性的连接， 不管是直接的还是间接的。 "上" 、 "下" 、 "左" 、 "右" 等仅用于表示相对位置关系， 当被描述对 象的绝对位置改变后， 则该相对位置关系也可能相应地改变。
下面结合附图和实施例， 对本发明的具体实施方式作进一步详细描述。 以下实施例用于说明本发明， 但不用来限制本发明的范围。
如图 2所示， 本发明实施例的检测信号线和修复线的短路的方法流程包 括：
步骤 S210, 驱动像素显示时， 施加第一检测电压至所述信号线， 同时 施加与所述第一检测电压不相等的第二检测电压至所述修复线；
步骤 S220, 检测像素的显示情况， 若对应所述信号线驱动的像素出现 不符合预定画面的显示异常， 则检测出信号线和修复线短路。
在显示领域中， 对液晶盒进行检测时， 信号线通常包括栅线和数据线， 下面以数据线为例进行详细说明。
步骤 S210 中可以通过外接信号线的方式为数据线施加第一检测电压， 同时也通过不同的外接信号线为所述修复线施加第二检测电压。
本实施例中， 可在短路条 ( Shorting Bar )检测方式的检测结构基础上来 检测数据线和修复线是否短路。 如图 3所示， 具体地， 将数据线 5' 、 6' 和 Ύ 分别连接至对应的数据线短路条 、 2' 和 3' 。 修复线 9' 连接到与短 路条不同的信号源， 优选地， 为了不额外地增加信号源， 通过导线 11' 将修 复线 9' 连接到公共电极线 4' (显示装置中通常对公共电极线和数据线的 施加电压不同） 。 通过数据线短路条 、 2' 和 3' 分别施加不同电压值的 第一检测电压至所述数据线 5' 、 61 和 7' , 同时将公共电极线的电压作为 第二检测电压施加至所述修复线 9' 。 也可以通过数据线短路条 、 T 和 Ύ 分时施加第一检测电压至所述数据线 5' 、 6' 和 7' , 同时将公共电极 线的电压作为第二检测电压施加至所述修复线 9' 。
步骤 S220中， 该检测方式可以通过数据线短路条 、 2' 和 3' 与公 共电极线 4' 的压差来控制液晶的偏转以实现各种预定的测试颜色画面 （测 试时通常显示单色画面）， 若画面中出现亮线或暗线异常， 则对应的检测出 数据线与修复线短路异常问题。
以第二检测电压小于第一检测电压为例进行说明， 如图 3所示， 其中一 条数据线 6' 与修复线 9' 短路（如： 数据线 6' 与修复线 9' 在交叉点 10' 发生短路） ， 所有数据线 6' 的电压都会被拉低。 相对于修复线 9' 未连接 公共电极线 4' 时， 与修复线 9' 短路的数据线 6' 的电压被拉的更低。 离短 路的数据线 6' 越远的其它数据线 6被拉低的程度越小。 短路的数据线 6' 的电压被拉的最低， 使得公共电极和该短路的数据线 6' 驱动的像素电极之 间电压差不等于公共电极和其它数据线 6' 驱动的像素电极之间的电压差， 且公共电极和该短路的数据线 6' 驱动的像素电极之间电压差明显小于公共 电极和其它数据线 6' 驱动的像素电极之间的电压差 （尤其相对于公共电极 和离短路数据线 6' 较远的数据线 6' 驱动的像素电极之间的电压差） 。 电 压差不同会导致液晶偏转程度明显不同于正常区域，检测现象表现为以短路 的数据线 6' 驱动的像素显示与正常单色画面差异最大， 越向该像素两侧延 伸色彩越接近于正常单色画面， 从而根据画面差异最大的地方， 更容易确定 哪条数据线 6' 与修复线 9' 短路。正常单色画面为数据线 6' 未与修复线 9' 短路时应该显示的单色画面。 若第二检测电压大于第一检测电压时， 短路的 数据线 6' 和其它数据线 6' 会被拉高， 检测原理和第二检测电压小于第一 检测电压时类似， 此处不再赘述。 在检测阶段通常采用单色模式进行检测， 即整个画面只显示一种颜色。 采用不同的数据线短路条 、 和 y 施加不同大小的第一检测电压， 能 够使数据线驱动的红绿蓝像素组合成多种不同的单种颜色。采用不同的数据 线短路条 、 和 y 分时施加第一检测电压时， 画面显示红绿蓝单色画 面， 使检测更加准确。
当然也可以只设置一条数据线短路条，通过该数据线短路条为所有数据 线施加第一检测电压， 尤其适用于一些单色显示装置。
对于栅线和修复线短路，栅线短路条对栅线施加一小于栅线驱动的薄膜 晶体管 TFT的开启电压的第一检测电压， 即栅线无法打开 TFT, 数据线无 法为对应的像素电极充电， 此时的显示画面为正常单色画面（即为对像素电 极不加电时的显示画面， 此时液晶不会发生偏转， 若是常黑模式， 背光无法 透过， 通常显示黑色， 若是常白模式， 背光可以透过， 显示与背光相同的白 色画面）。 公共电极线短路条为修复线施加一不小于栅线驱动的薄膜晶体管
TFT的开启电压的第二检测电压。 若某条栅线与修复线短路， 相当于为该条 栅线施加了公共电极线的电压，该条栅线驱动的 TFT打开，数据线为该条栅 线打开的一行像素充电， 该行像素的液晶发生偏转。 由于栅线都连接在短路 条上， 栅线的电压都会被拉高， 离该短路栅线越近的栅线的电压比离该短路 栅线越远的栅线的电压拉的越高，有可能大于 TFT的打开电压。 因此离该短 路栅线越近的栅线驱动的 TFT处于打开状态，数据线为这些栅线打开的多行 像素充电， 该多行像素的液晶发生偏转， 以显示与正常单色画面不同的画面 (通常是在短路栅线驱动像素及其两侧一定宽度内的像素显示与正常单色 画面不同颜色的单色画面） ， 从而检测出哪条栅线与修复线短路。 正常单色 画面为栅线未与修复线短路时应该显示的单色画面， 不会存在不同颜色的区 域。
或者栅线短路条对栅线施加一不小于栅线驱动的薄膜晶体管 TFT 的开 启电压的第一检测电压， 即栅极驱动信号能够打开 TFT, 公共电极线短路条 为修复线施加一小于栅线驱动的薄膜晶体管 TFT 的开启电压的第二检测电 压。 正常情况下， 每条栅线都能打开相应行的 TFT, 因此会显示一定色彩的 正常画面。若某条栅线与修复线短路，该栅线的电压被拉低至第二检测电压。 由于栅线都连接在短路条上， 栅线的电压都会被拉低， 离该短路栅线越近的 栅线的电压比离该短路栅线越远的栅线的电压拉的越低， 有可能小于 TFT 的打开电压。 因此该条栅线及附近栅线驱动的 TFT无法打开，数据线不能为 这些栅线对应的像素充电， 该行像素的液晶不会发生偏转， 以显示与正常画 面不同的画面（若是常黑模式， 背光无法透过， 通常在短路栅线驱动像素及 其两侧一定宽度内的像素显示黑色画面， 若是常白模式， 背光可以透过， 通 常在短路栅线驱动像素及其两侧一定宽度内的像素显示与背光相同的白色 画面） ， 从而检测出哪条栅线与修复线短路。
检测完毕后若液晶盒无异常，则可进入模组（ Module )阶段，进入 Module 阶段之前， 将信号线和短路条连接的线路切断或关断， 同时也将修复线和公 共电极线短路条连接的线路切断或关断。
本发明通过在对信号线施加第一检测电压同时，对修复线施加第二检测 电压， 若信号线和修复线的短路， 从而进一步增大与修复线短路的信号线和 其它信号线之间的电压差距， 则通过显示画面很容易检测出哪条信号线与修 复线的短路。
以上实施方式仅用于说明本发明， 而并非对本发明的限制， 有关技术领 域的普通技术人员， 在不脱离本发明的精神和范围的情况下， 还可以做出各 种变化和变型， 因此所有等同的技术方案也属于本发明的范畴， 本发明的专 利保护范围应由权利要求限定。

Claims

权利要求书
1、 一种用于检测信号线和修复线的短路的方法， 包括：
在液晶盒检测阶段驱动像素显示时， 施加第一检测电压至所述信号线， 同时施加与所述第一检测电压不相等的第二检测电压至所述修复线；
检测像素的显示情况， 若所述信号线驱动的像素出现预定的显示异常， 则检测出所述信号线和所述修复线短路。
2、 如权利要求 1 所述的方法， 其中， 将所述信号线连接至短路条， 通 过所述短路条施加所述第一检测电压至所述信号线。
3、 如权利要求 1或 2所述的方法， 其中， 将所述修复线连接至公共电 极线， 将所述公共电极线的电压作为所述第二检测电压施加至所述修复线。
4、 如权利要求 1-3 中任一项所述的方法， 其中， 所述信号线包括： 栅 线或数据线。
5、 如权利要求 4所述的方法， 其中， 所述数据线连接一条数据线短路 条； 或者驱动相同颜色亚像素的数据线连接同一条所述数据线短路条， 驱动 不同颜色亚像素的数据线连接不同的所述数据线短路条，通过不同的数据线 短路条施加第一检测电压至所述不同的数据线。
6、 如权利要求 5所述的方法， 其中， 所述预定的显示异常包括： 与所 述修复线短路的数据线所驱动的像素的显示与正常单色画面差异最大，越向 与所述修复线短路的数据线所驱动的像素两侧延伸，显示色彩越接近于正常 单色画面， 所述正常单色画面为所述数据线未与所述修复线短路时应该显示 的单色画面。
7、 如权利要求 4所述的方法， 其中， 所述栅线连接栅线短路条， 通过 所述栅线短路条施加所述第一检测电压至所述栅线；
所述第一检测电压小于所述栅线驱动的薄膜晶体管的开启电压，所述第 二检测电压不小于所述栅线驱动的薄膜晶体管的开启电压； 或者所述第一检 测电压不小于所述栅线驱动的薄膜晶体管的开启电压， 所述第二检测电压小 于所述栅线驱动的薄膜晶体管的开启电压。
8、 如权利要求 7所述的方法， 其中， 所述预定的显示异常包括： 与所 述修复线短路的栅线所驱动的像素及其两侧一定宽度内的像素显示与正常 单色画面不同颜色的单色画面，所述正常单色画面为所述栅线未与所述修复 线短路时应该显示的单色画面。
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016003888A1 (en) 2014-06-30 2016-01-07 Immunolight, Llc Improved adhesive bonding composition and method of use

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103399422B (zh) * 2013-07-31 2015-11-11 合肥京东方光电科技有限公司 信号线和修复线短路检测方法
CN104183206B (zh) * 2014-09-10 2017-04-19 南京中电熊猫液晶显示科技有限公司 显示面板的检测方法
CN104407481B (zh) * 2014-12-09 2017-05-10 京东方科技集团股份有限公司 阵列基板、信号线不良的检测方法、显示面板及显示装置
CN105609025B (zh) 2016-01-05 2018-02-16 京东方科技集团股份有限公司 显示面板检测结构
CN105785610B (zh) * 2016-04-28 2019-05-03 深圳市华星光电技术有限公司 液晶显示面板测试线路
CN105759521B (zh) * 2016-05-06 2019-05-03 深圳市华星光电技术有限公司 用于具有半源极驱动像素阵列的液晶显示面板的测试线路
CN107863054A (zh) * 2017-11-07 2018-03-30 深圳市华星光电半导体显示技术有限公司 一种修复感测信号线的方法、装置和显示装置
CN110164346A (zh) * 2019-06-27 2019-08-23 惠科股份有限公司 驱动电路的修复系统及修复方法
CN116434684A (zh) * 2023-04-26 2023-07-14 京东方科技集团股份有限公司 检测方法及其检测装置
CN119667996A (zh) * 2025-01-22 2025-03-21 京东方科技集团股份有限公司 显示基板、显示面板、显示装置和显示面板的制作方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002328627A (ja) * 2001-04-27 2002-11-15 Seiko Epson Corp 表示装置の検査方法
JP2006267416A (ja) * 2005-03-23 2006-10-05 Victor Co Of Japan Ltd アクティブマトリクス基板の検査方法
CN101930128A (zh) * 2009-06-24 2010-12-29 上海天马微电子有限公司 线路修复结构及其修复方法
CN102116950A (zh) * 2009-12-30 2011-07-06 上海天马微电子有限公司 具有触控功能的显示面板及其检测方法
CN103399422A (zh) * 2013-07-31 2013-11-20 合肥京东方光电科技有限公司 信号线和修复线短路检测方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20070020778A (ko) * 2005-08-17 2007-02-22 삼성전자주식회사 액정 표시 장치와 이의 검사 방법 및 이의 리페어 방법
CN102955306B (zh) * 2011-08-30 2015-12-02 上海天马微电子有限公司 液晶显示装置及其测试方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002328627A (ja) * 2001-04-27 2002-11-15 Seiko Epson Corp 表示装置の検査方法
JP2006267416A (ja) * 2005-03-23 2006-10-05 Victor Co Of Japan Ltd アクティブマトリクス基板の検査方法
CN101930128A (zh) * 2009-06-24 2010-12-29 上海天马微电子有限公司 线路修复结构及其修复方法
CN102116950A (zh) * 2009-12-30 2011-07-06 上海天马微电子有限公司 具有触控功能的显示面板及其检测方法
CN103399422A (zh) * 2013-07-31 2013-11-20 合肥京东方光电科技有限公司 信号线和修复线短路检测方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016003888A1 (en) 2014-06-30 2016-01-07 Immunolight, Llc Improved adhesive bonding composition and method of use

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