WO2015003491A1 - 一种液晶面板及其制造方法 - Google Patents
一种液晶面板及其制造方法 Download PDFInfo
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- WO2015003491A1 WO2015003491A1 PCT/CN2014/071707 CN2014071707W WO2015003491A1 WO 2015003491 A1 WO2015003491 A1 WO 2015003491A1 CN 2014071707 W CN2014071707 W CN 2014071707W WO 2015003491 A1 WO2015003491 A1 WO 2015003491A1
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- measuring point
- film transistor
- thin film
- liquid crystal
- crystal panel
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Classifications
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
- G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
Definitions
- the present invention relates to a liquid crystal panel manufacturing process, and more particularly to a liquid crystal panel and a method of fabricating the same. Background technique
- the thin film transistor substrate 10 of the liquid crystal panel is provided with a peripheral test line ii connected to the display area 20 and the color filter substrate 30 to be tested.
- a cell tester shorting bar is usually placed on the thin film transistor substrate.
- the line to be tested is divided into several sets of odd and even lines, and then passed through corresponding measuring points (for example, as shown in FIG.
- the data odd line point 13 and the data even line point 14) are electrically connected to an external lighting test device (not shown) to complete the test task.
- the connection between the peripheral test circuit 11 and the display area 20 and the line on the color filter substrate 30 generally needs to be removed or lasered to make the test circuit return to the independent test before the test. status.
- this removal or disconnection operation is relatively simple for the data line and the gate line of the display area, but it is more difficult for the color filter: the line of the common electrode on the photo sheet.
- the above object can be achieved by applying a laser disconnecting shorting bar 12 to the display area line drawn from the fan-out area: A-A'.
- the common electrode 31 CF COM transfer pad, hereinafter referred to as the first measurement point
- the thin film transistor substrate 0 on the measurement point 15 CF COM pad, hereinafter referred to as the second
- the connection between the points is often because the position is far from the laser cut area, or because the lead space is limited and cannot be removed or broken. In general, this connection does not cause any problem; however, in the process of installing the conductive front frame in the liquid crystal display module, if the conductive front frame 40 is pressed by force, the conductive front frame 40 is deformed and the thin film transistor substrate i0
- the second measuring point 5 on the upper side is short-circuited (as shown in Figs. 2A and 2B).
- a picture abnormality such as picture noise and flickering is caused.
- the conductive front frame 40 is usually grounded.
- the color filter still remains connected to the second measuring point 15;
- the potential of the first measuring point 31 of the electrode is abnormal, which causes the grounding potential of the entire liquid crystal panel to be abnormal, thereby causing the reference datum of the digital signal of the driving circuit to be affected.
- the present invention provides a liquid crystal panel and a method of fabricating the same.
- the invention provides a liquid crystal panel, which comprises:
- a color filter substrate including a first measuring point of the common electrode
- a thin film transistor substrate comprising: a second measuring point for testing the color filter substrate line; a switching unit disposed between the second measuring point and the first measuring point, wherein the second measuring When the point potential is abnormal, the circuit connection between the second measuring point and the first measuring point is in an off state.
- the switching unit is also used to communicate the electrical connection between the second measuring point and the first measuring point during the lighting test.
- the switch unit may be a thin film transistor switch having a drain connected to the second measuring point, a source connected to the first measuring point, and a gate serving as a control end Receiving a control voltage that controls whether the thin film transistor switch is turned on or off.
- the thin film transistor substrate is further provided with a switch measuring point connected to the thin film transistor switch control end for applying a control voltage for controlling whether the thin film transistor switch is turned on or off.
- the switching unit may be a switching diode, an anode of the switching diode is connected to the second measuring point, and a cathode is connected to the first measuring point.
- the switching unit may be two or more switching diodes connected in parallel, and the anode of the switching diode is connected in parallel to the second trace point, and the cathode is connected in parallel. The first measurement point is described.
- the switching unit may be two or more switching diodes connected in series, and the anode of the switching diode is sequentially connected to the second Liu, cathode Connected to the first measuring point in turn.
- the switching unit is preferably disposed on the thin film transistor substrate.
- the invention also provides a method for manufacturing a liquid crystal panel, comprising the following steps:
- Forming a thin film transistor substrate including a second measuring point for testing a color filter substrate line; and providing a switching unit between the second measuring point and the first measuring point, wherein the second measuring point is Potential When abnormal, the circuit connection between the second measuring point and the first measuring point is in an off state.
- the switch unit is configured to communicate a circuit connection between the second measuring point and the first measuring point during the lighting test.
- the switch unit may be a thin film transistor switch having a drain connected to the second measuring point, a source connected to the first measuring point, and a gate serving as a control end, receiving and controlling the thin film transistor.
- a switch measuring point connecting the control terminal of the thin film transistor is further disposed on the thin film transistor substrate, and a control voltage for controlling whether the thin film transistor is turned on or off is applied.
- the switching unit may adopt a switching diode, an anode of the switching diode is connected to the second measuring point, and a cathode is connected to the first measuring point.
- the switching unit may employ two or more switching diodes connected in parallel, the anode of the switching diode being connected in parallel to the second measuring point, and the cathode being connected in parallel to the first measuring point.
- the switching unit may use two or more switching diodes connected in series, the anode of the switching diode is sequentially connected to the second measuring point, and the cathode is sequentially connected to the first measuring point.
- the invention adds a switching unit to the circuit connection between the first measuring point of the common color filter substrate common electrode and the second measuring point of the thin film transistor substrate for testing the color filter substrate line,
- the circuit connection between the two measuring points is broken, and A can avoid the color filter.
- the potential of the first measuring point inside the light sheet substrate is disturbed, which prevents the liquid crystal panel from being abnormal due to the short circuit of the measuring point.
- FIG. 1 is a schematic diagram showing the circuit connection of a liquid crystal panel and a peripheral test circuit in the prior art
- FIG. 2A is a partial schematic view showing the assembly of a liquid crystal panel in the prior art
- 2B is a partial schematic view showing a short circuit of the conductive front frame in contact with the measuring point due to press deformation
- FIG. 3 is a schematic circuit diagram of a switch unit according to Embodiment 1 of the present invention.
- FIG. 4 is a schematic circuit diagram of a switching unit of a second embodiment of the present invention
- 5 is a schematic diagram showing the circuit connection of the switching unit of the embodiment of the present invention
- FIG. 6 is a schematic diagram of the circuit connection of the switching unit according to the fourth embodiment of the present invention
- FIG. 7 is a schematic diagram showing comparison of threshold voltages of the embodiment of the present invention and the implementation of the fourth embodiment
- Figure 8 is a schematic diagram of a thin film transistor of the present invention equivalent to a switching diode.
- the present invention has further improved the prior art liquid crystal panel and the manufacturing method thereof, that is, in the existing film.
- a switching unit 6 is added to the circuit connection between the second measuring point 5 on the transistor substrate 10 and the first measuring point 31 on the color filter substrate 30 to break when the potential of the second measuring point 15 is abnormal.
- the circuit connection between it and the first measuring point 31 is opened.
- the switch unit i6 adopts a thin film transistor switch, the drain thereof is connected to the second measuring point 15, the source is connected to the first measuring point 31, and the gate is used as a control end, and receives a control voltage for controlling whether the thin film transistor switch is turned on or off.
- the pole can be connected to the switch measuring point 17 which is also disposed on the thin film transistor substrate 10.
- the switching point ⁇ can apply a control voltage sufficient to turn on the drain and source of the thin film transistor switch through the probe, thereby making the circuit connection between the second measuring point 15 and the first measuring point 31.
- the test voltage on the second measuring point 15 is transmitted to the inside of the color filter substrate 30 to realize the test function for the internal circuit of the color filter substrate 30.
- the circuit connection between the second measuring point 15 and the first measuring point 31 is in a broken state. . Therefore, even if the second measuring point 15 is abnormal due to the short contact with the conductive outer frame 40, the potential of the first measuring point 31 of the common electrode on the color filter substrate 30 is not affected. Therefore, the purpose of preventing the abnormality of the picture due to the short circuit of the measuring point is achieved.
- the breaking mode has strong controllability and high flexibility.
- the second measuring point 15 and the first measuring point 31 can be applied by applying a control voltage to the switching measuring point 17.
- the circuit connection between the two changes from a broken state to a connected state.
- the same technical effect can be achieved by using an NMOS transistor switch in addition to the above-described thin film transistor switch, which will not be described in detail herein.
- the switch unit 16 is adopted A switching diode has an anode connected to the second measuring point 15 and a cathode connected to the measuring point 31.
- the test voltage of the threshold voltage of the large dry-switched diode is applied to the second measuring point 15, and the switching diode is turned from the off state to the conduction state, thereby passing the test voltage to the color filter.
- a test function for the internal wiring of the color filter substrate 30 is realized. Normally, since there is no voltage on the second measuring point 15, the switching diode is in an off state, and accordingly, the circuit connection between the second measuring point 15 and the first measuring point 31 is in an off state.
- the second measuring point 15 has an abnormality in which the potential is zero due to short-circuit contact with the conductive outer frame 40, the potential of the first measuring point 31 is not affected, and thus the prevention of the measuring point is achieved.
- a short circuit causes the screen to be abnormal.
- the switching unit 16 uses two or more switching diodes connected in parallel.
- the anodes of all the switching diodes are connected in parallel to the second measuring point 15
- the cathode is connected in parallel to the first measuring point 31.
- the circuit between the second measuring point 15 and the measuring point 31 is connected.
- the switching diode has a constant threshold voltage from the disconnected state to the connected state, and is still used in the implementation of the feed two.
- the switching diodes are the same, but when the two measuring points are connected to ', the current flowing from the second measuring point 15 into the first measuring point 31 is increased, so that the voltage stabilization effect can be achieved more quickly.
- the present invention proposes a new technical solution in the implementation of the fourth embodiment.
- the switching unit 16 employs two or more switching diodes connected in series. As the number of switching diodes increases, the critical voltage that causes the circuit connection between the second measuring point 15 and the first measuring point 3 to change from the off state to the connected state also increases. As shown in Figure 7, when using a switching diode, the threshold voltage is about 3V. After using two switching diodes in series, the threshold voltage rises to about 5V.
- the principle of implementing the fault prevention function by using a plurality of series-connected switching diodes as the switching unit is basically the same as that of the previous embodiments, and details are not described herein again.
- a thin-film transistor in which the gate and the drain are short-circuited as shown in FIG. 8 has the same switching diode as the drain and the source, and realizes the same function as the switching diode. Therefore, the present invention is not limited to the specific embodiments disclosed herein, but includes all the technical solutions falling within the scope of the claims, and all equivalent transformations and improvements based on the technical solutions of the present invention should not be Excluded from the protection of the present invention.
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Abstract
一种液晶面板及其制造方法。液晶面板包括彩色滤光片基板(30)和薄膜晶体管基板(10)。彩色滤光片基板(30)上包括共通电极的第一测点(31),薄膜晶体管基板(10)上包括用于测试彩色滤光片基板(30)线路的第二测点(15)。第一测点(31)与第二测点(15)之间设置开关单元(16)。开关单元(16)能在第二测点(15)电位异常时,例如在第二测点(15)因与导电外框接触短路而出现电位为零的情况时,断开两个测点(31,15)之间的电路连接,从而能避免彩色滤光片基板(30)共通电极的第一测点(31)的电位受到干扰,防止液晶面板因测点短路而出现画面显示异常的现象。
Description
一种液晶面板及其制造方法 技术领域
本发明涉及液晶面板制造工艺, 特别是关于一种液晶面板及其制造方法。 背景技术
在薄膜晶体管 (TF LCD) 液晶面板的生产过程中, 必须经过如点灯溯试等 测试环节监控液晶面板的良品率。 如图 1所示, 为方便测试, 液晶面板的薄膜晶 体管基板 10上设置有与显示区 20和彩色滤光片基板 30上待测试线路连接的外 围测试线路 i i。 在进行点灯测试时, 通常会在薄膜晶体管基板上设置短路棒 12 ( cell tester shorting bar) 将待测试的线路分成几组奇数线路和偶数线路, 然后通 过相应的测点 (例如图 i中所示的数据奇数线测点 13和数据偶数线测点 14) 与 外部的点灯测试设备 (图中未示出) 电连接, 完成测试任务。 测试完毕之后, 上 述外围测试电路 11与显示区 20和彩色滤光片基板 30上线路的连接一般需要移 除或者用激光断开 (laser oit), 以使测试的线路回复到测试前各自独立的状态。 般, 这种移除或者断开的操作对于显示区的数据线和栅极线比较简单, 但是对 于彩色滤:光片 板上共通电极的线路则难度较大。 如图 1所示, A- A'处施以激光 断开短路棒 12与经扇出区: Π所引出的显示区线路的连接,就能够实现上述目的。 但是, 彩色滤光片基板 30上共通电极的测点 31 ( CF COM transfer pad, 以下称 为第一测点)与薄膜晶体管基板】 0上的测点 15 ( CF COM pad, 以下称为第二劉 点) 之间的连接往往会因为位置相对 laser cut区域较远, 或是因为引线空间限制 而不能被移除或者被断幵。 一般情况下, 这种连接不会引发任何问题; 但是, 在 液晶显示模组安装导电前框的过程中, 若 ¾力按压导电前框 40, 会使导电前框 40变形而与薄膜晶体管基板 i0上的第二测点 5接触短路(如图 2A和 2B所示), 此时, 就会引发画面杂讯和闪烁不良等画面异常的现象。 这主要是因为导电前框 40通常是接地电位, 当导电前框 40变形而与第二测点 15接触时, 会使仍与第二 测点 15保持连接的彩色滤光; t基板 30上共通电极的第一测点 31 电位异常, 从 而导致整个液晶面板接地电位异常, 进而导致驱动电路数位信号的参考基准受到
干扰而出现画面异常的故障。 发明内容
针对上述 题, 本发明提供了一种液晶面板及其制造方法。
本发明提供一种液晶面板, 其中包括:
彩色滤光片基板, 其上包括共通电极的第一测点;
薄膜晶体管基板, 其上包括 ffl于测试所述彩色滤光片基板线路的第二测点; 所述第二测点与第一测点之间设置有开关单元, 其能够在所述第二测点电位 异常时, 使所述第二测点与第一测点之间的电路连接处于断开状态。
在一个优选的实施方案中, 所述开关单元还在点灯测试时用于连通所述第二 测点与第一测点之间的电路连接。
根据本发明的实施例 ·, 在上述实施方案中, 所述开关单元可以为薄膜晶体 管开关, 其漏极连接所述第二测点, 源极连接所述第一测点, 栅极作为控制端, 接收控制所述薄膜晶体管开关导通或截止的控制电压。
进一步地, 在上述实施方案中, 所述薄膜晶体管基板上还设置连接所述薄膜 晶体管开关控制端的开关测点, 用于施加控制所述薄膜晶体管开关导通或截止的 控制电压。
根据本发明的实施例二, 在一个优选的实施方案中, 所述幵关单元可以为一 开关二极管,所述开关二极管的阳极连接所述第二测点,阴极连接所述第一测点。
根据本发明的实施例 在一个优选的实施方案中, 所述开关单元可以为两 个或两个以上并联的开关二极管, 所述开关二极管的阳极并联连接所述第二溯 点, 阴极并联连接所述第一测点。
根据本发明的实施例四, 在一个优选的实施方案中, 所述开关单元可以为两 个或两个以上串联的开关二极管, 所述开关二极管的阳极依次连接至所述第二劉 点, 阴极依次连接至所述第一测点。
在上述实施方案中, 所述开关单元优选地设置在所述薄膜晶体管基板上。 本发明还提供一种液晶面板的制造方法, 其包括以下步骤:
制作彩色滤光片基板, 其上包括共通电极的第一測点;
制作薄膜晶体管基板, 其上包括^于测试彩色滤光片基板线路的第二测点; 在所述第二测点与第一测点之间设置开关单元, 其能够在所述第二测点电位
异常时, 使所述第二测点与第一测点之间的电路连接处于断开状态。
进一步地, 上述开关单元在点灯测试时用于连通所述第二测点与第一测点之 间的电路连接。
根据本发明的实施例一, 上述开关单元可以采用薄膜晶体管开关, 其漏极连 接所述第二测点, 源极连接所述第一测点, 栅极作为控制端, 接收控制所述薄膜 晶体管开关导通或截止的控制电压。
且进一步地, 上述薄膜晶体管基板上还设置连接所述薄膜晶体管幵关控制端 的开关测点, ^于施加控制所述薄膜晶体管幵关导通或截止的控制电压。
根据本发明的实施例二, 上述开关单元可以采用一开关二极管, 所述开关二 极管的阳极连接所述第二测点, 阴极连接所述第一测点。
根据本发明的实施例 , 上述开关单元可以采用两个或两个以上并联的开关 二极管, 所述开关二极管的阳极并联连接所述第二测点, 阴极并联连接所述第一 测点。
根据本发明的实施例四, 上述开关单元可以采用两个或两个以上串联的开关 二极管, 所述开关二极管的阳极依次连接至所述第二测点, 阴极依次连接至所述 第一测点。
本发明在现有的彩色滤光片基板共通电极的第一测点与薄膜晶体管基板用 于测试彩色滤光片基板线路的第二测点之间的电路连接中增设了一幵关单元, 以 在第二测点电位异常时, 例如在第二测点因与导电外框接触短路而出现电位为零 的情况时, 断开两个测点之间的电路连接, A认而能够避免彩色滤光片基板内部的 第一测点的电位受到干扰, 也就防止了液晶面板会因测点短路而出现画面显示异 常的现象。 本发明的其它特征和优点将在随后的说明书中阐述, 并且, 部分地从 说明书中变得显而易见, 或者通过实施本发明而了解。 附图说明
图 1是现有技术中液晶面板与外围测试电路的电路连接示意图;
图 2A是现有技术中液晶面板组装的局部示意图;
图 2B是导电前框因按压变形而与测点接触短路的局部示意图;
图 3是本发明实施例一的开关单元的电路连接示意图;
图 4是本发明实施例二的开关单元的电路连接示意图;
图 5是本发明实施例≡的幵关单元的电路连接示意图; 图 6是本发明实施例四的开关单元的电路连接示意图;
图 7是本发明实施例≡和实施倒四的临界电压比较示意图;
图 8是本发明等效于开关二级管的薄膜晶体管示意图。 具钵实施方式
为了防止因导电前框变形与薄膜晶体管基板上的测点接触短路而导致画面 异常的故障, 本发明对现有技术的液晶面板及其制造方法做了迸一步的改进, 即 在现有的薄膜晶体管基板 10上的第二测点】5与彩色滤光片基板 30上的第一测 点 31之间的电路连接中增设了一开关单元 6, 以在第二测点 15电位异常时, 断 开其与第一测点 31之间的电路连接。
下面结合非限定性的实施例并参考跗图详细地描述本发明的目的和技术方 案, 以及能够达到的技术效果。
如图 3所示, 是本发明实施例一的具体实施方案。 其中, 开关单元 i6采用 了一薄膜晶体管开关, 其漏极连接第二测点 15, 源极连接第一测点 31, 栅极作 为控制端, 接收控制薄膜晶体管开关导通或截止的控制电压。 进一歩地, 極极可 以与同样设置在薄膜晶体管基板 10上的开关测点 17连接。 在进行点灯測试时, 开关测点 Π 上可以通过探针施加足以导通薄膜晶体管开关漏极与源极的控制电 压, 从而使第二測点 15与第一测点 31之间的电路连接处于连通状态, 将第二测 点 15上的测试电压传入彩色滤光片基板 30内部, 实现对彩色滤光片基板 30内 部线路的测试功能。 常态下, 由于开关测点 17 上没有电压, 薄膜晶体管开关漏 极与源极之间没有导通通路, 相应地, 第二测点 15与第一测点 31之间的电路连 接处于断幵状态。 由此, 即使第二测点 15如因与导电外框 40接触短路而出现电 位为零的异常情况, 也不会对彩色滤光片基板 30上共通电极的第一测点 31的电 位产生影响, 从而也就达到了防止因测点短路而导致画面异常的目的。 这种幵断 方式可控性强, 灵活度高, 除点灯测试之外, 当有其他需求时也能够通过向开关 测点 17施加控制电压, 将第二测点 15与第一测点 31之间的电路连接从断幵状 态变为连通状态。除上述薄膜晶体管开关外采用 NMOS晶体管开关也能达到同样 的技术效果, 此处不再详述。
如图 4所示, 是本发明实施^二的具体实施方案。 其中, 开关単元 16采用
了一开关二极管, 其阳极连接第二测点 15 , 阴极连接第 ·测点 31。 当进行点灯 测试^, 在第二测点 15 上施加大干幵关二级管的临界电压的测试电压, 幵关二 极管会由截止变为导通状态, 进而将测试电压传入彩色滤光片基板 30 内部, 实 现彩色滤光片基板 30内部线路的测试功能。 常态下, 由于第二测点 15上没有电 压, 开关二极管处于截止状态, 相应地, 第二测点 15与第一测点 31之间的电路 连接处于断开状态。 由此, 即使第二测点 15如因与导电外框 40接触短路而出现 电位为零的异常情况, 也不会对第一测点 31 的电位产生影响, 从而 &就达到了 防止因测点短路而导致画面异常的目的。
如图 5所示,是本发明实施例三,其在实施例二的基础上做了进一步地扩展。 其中, 开关单元 16采用了两个或两个以上并联的开关二极管, 所有开关二极管 的阳极并联连接第二测点 15 , 阴极并联连接第一测点 31。 在这种实施^中, 使 第二测点 15与第 ·测点 31之间的电路连接.从断幵状态变为连通状态的开关二极 管临界电压大小不变, 仍与实施飼二中采用一个开关二极管的情况相同, 但是当 两个测点连通', 从第二测点 15流入第一测点 31的电流会增多, 从而能够更快 地实现稳压效果。
上述实施例中, 由于一个开关二极管从截止变为导通的临界电压偏低, 有时 会低至 0 7V, 因此防范因测点短路导致画面异常的效果并不十分理想。 为此, 本 发明在实施倒四中提出了一种新的技术方案, 如图 6所示, 开关单元 16采用了 两个或两个以上串联的开关二极管。 随着开关二级管的个数的增加, 使第二测点 15与第一测点 3】之间的电路连接从断开状态变为连通状态的临界电压也会随之 增大。 倒如图 7所示, 使用一个开关二极管时, 临界电压为 3V左右, 使用二个 串联的开关二极管后, 临界电压升至 5V左右。 采用多个串联的开关二极管作为 幵关单元实现故障防范功能的原理与前面几个实施例基本相同, 此处不再赘述。
虽然已经参考优选实施例对本发明进行了描述, 但是在不脱离本发明的范圈 的情况下, 可以对其进行各种改进并且可以用等效物替换其中的部件。 例如, 釆 如图 8所示的栅极与漏极短接的薄膜晶体管, 其漏极与源极之间等同一开关二 极管, 实现与开关二级管相同的功能。 由此, 本发明并不局限于文中公开的特定 实施例, 而是包括落入权利要求的范围 ή的所有技术方案, 凡是在本发明技术方 案的基础上进行的等同变换和改进, 均不应排除在本发明的保护范 I之外。
Claims
权利要求书
】. 一种液晶面板, 其中包括- 彩色滤光片基板, 其上包括共通电极的第一测点;
薄膜晶体管基板, 其上包括 ^于测试所述彩色滤光片基板线路的第二测点; 所述第二测点与第一测点之间设置有开关单元, 其能够在所述第二测点电位 异常^, 使所述第二测点与第一测点之间的电路连接处于断开状态。
2, 如权利要求 1所述的液晶面板, 其中:
所述开关单元在点灯测试时用于连通所述第二测点与第一测点之间的电路 连接。
3 , 如权利要求 1所述的液晶面板, 其中:
所述开关单元为薄膜晶体管开关, 其漏极连接所述第二测点, 源极连接所述 第一测点, 栅极作为控制端, 接收控制所述薄膜晶体管开关导通或截止的控制电 压。
4, 如权利要求 2所述的液晶面板, 其中:
所述开关单元为薄膜晶体管幵关, 其漏极连接所述第二测点, 源极连接所述 第一测点, 栅极作为控制端, 接收控制所述薄膜晶体管开关导通或截止的控制电 压。
5 , 如权利要求 3所述的液晶面板, 其中:
所述薄膜晶体管基板上还设置有连接所述薄膜晶体管幵关控制端的开关测 点, 用于施加控制所述薄膜晶体管开关导通或截止的控制电压。
6, 如权利要求 4所述的液晶面板, 其中:
所述薄膜晶体管基板上还设置有连接所述薄膜晶体管开关控制端的开关测 点, 用于施加控制所述薄膜晶体管开关导通或截止的控制电压。
7, 如权利要求〗所述的液晶面板, 其中- 所述幵关单元为一开关二极管, 所述开关二极管的阳极连接所述第二测点, 阴极连接所述第一测点。
8, 如权利要求 2所述的液晶面板, 其中:
所述开关单元为一开关二极管, 所述开关二极管的阳极连接所述第二测点, 阴极连接所述第一测点。
9, 如权利要求 i所述的液晶面板, 其中:
所述幵关单元为两个或两个以上并联的开关二极管, 所述开关二极管的阳极 并联连接所述第二测点, 阴极并联连接所述第一劉点。
10. 如权利要求 2所述的液晶面板, 其中- 所述开关单元为两个或两个以上并联的开关二极管, 所述开关二极管的阳极 并联连接所述第二测点, 阴极并联连接所述第一测点。
11 - 如权利要求 i所述的液晶面板, 其中:
所述开关单元为两个或两个以上串联的开关二极管, 所述幵关二极管的阳极 依次连接至所述第二测点, 阴极依次连接至所述第一測点。
12. 如权利要求 2所述的液晶面板, 其中:
所述开关单元为两个或两个以上串联的开关二极管, 所述开关二极管的阳极 依次连接至所述第二测点, 阴极依次连接至所述第一溯点。
13. 如权利要求 1所述的液晶面板, 其中- 所述开关单元设置在所述薄膜晶体管基板上。
14. 一种液晶面板的制造方法, 包括以下歩骤:
制诈彩色滤光片基板, 其上包括共通电极的第一测点;
制作薄膜晶体管基板, 其上包括 ^于测试彩色滤光片基板线路的第二测点; 在所述第二测点与第一测点之间设置开关单元, 其能够在所述第二测点电位 异常时, 使所述第二测点与第一测点之间的电路连接处于断幵状态。
15. 如权利要求 14所述的制造方法, 其中:
所述开关单元在点灯测试时用于连通所述第二测点与第一测点之间的电路 连接。
16. 如权利要求 14所述的制造方法, 其中- 所述幵关单元采用薄膜晶体管开关, 其漏极连接所述第二测点, 源极连接所 述第一测点, 栅极作为控制端, 接收控制所述薄膜晶体管开关导通或截止的控制 电压。
17. 如权利要求 16所述的制造方法, 其中:
所述薄膜晶体管基板上还设置连接所述薄膜晶体管开关控制端的开关测点, ]¾于施加控制所述薄膜晶体管开关导通或截止的控制电压。
18. 如权利要求 14所述的制造方法, 其中:
所述开关单元采 ^一开关二极管, 所述开关二极管的阳极连接所述第二测
点, 阴极连接所述第一测点。
】9. 如权利要求 14所述的制造方法, 其中- 所述幵关单元采用两个或两个以上并联的幵关二极管, 所述开关二极管的阳 极并联连接所述第二测点, 阴极并联连接所述第一测点。
20. 如权利要求 14所述的制造方法, 其中- 所述开关单元采用两个或两个以上串联的幵关二极管, 所述幵关二极管的阳 极依次连接至所述第二测点, 阴极依次连接至所述第一测点。
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