WO2015001753A1 - コヒーレントテラヘルツ光用光学装置 - Google Patents
コヒーレントテラヘルツ光用光学装置 Download PDFInfo
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- WO2015001753A1 WO2015001753A1 PCT/JP2014/003324 JP2014003324W WO2015001753A1 WO 2015001753 A1 WO2015001753 A1 WO 2015001753A1 JP 2014003324 W JP2014003324 W JP 2014003324W WO 2015001753 A1 WO2015001753 A1 WO 2015001753A1
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- light
- terahertz
- terahertz light
- coherent
- optical device
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- 230000003287 optical effect Effects 0.000 title claims abstract description 75
- 230000001427 coherent effect Effects 0.000 title claims abstract description 57
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Classifications
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/361—Optical details, e.g. image relay to the camera or image sensor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0216—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using light concentrators or collectors or condensers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0229—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using masks, aperture plates, spatial light modulators or spatial filters, e.g. reflective filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
Definitions
- the present invention relates to an optical device for coherent terahertz light.
- Terahertz waves which are electromagnetic waves with a frequency of 0.1 to 10 THz (wavelength 30 ⁇ m to 3 mm), are not harmful to X-rays while passing through plastic, paper, clothes, etc., and have a fingerprint spectrum peculiar to the terahertz region. It has attracted attention because it has been discovered. Although no suitable light source has been available in the terahertz region for a long time, a stable light source has recently been obtained by using a quantum cascade laser. This greatly advanced research and development. For example, a terahertz microscope using a quantum cascade laser as described in Non-Patent Document 1 has been developed.
- FIG. 1 The configuration of this terahertz microscope is shown in FIG.
- a housing 101 houses a coherent terahertz light source 102 that outputs a coherent terahertz wave and an illumination optical system.
- a sample stage 103 is provided at the tip of the illumination optical system, and an observation optical system and a terahertz camera 105 housed in a lens barrel 104 are provided at the tip. With this configuration, a terahertz image of the sample 106 placed on the sample stage 103 is acquired by the terahertz camera 105.
- the coherent terahertz light source 102 is a quantum cascade laser, and its frequency is 2.83 THz (wavelength 106 ⁇ m).
- the illumination optical system includes a first lens 107, a mirror 108, an iris diaphragm 109, and a second lens 110.
- a sample stage 103 is provided at the tip of the illumination optical system, and an objective lens 111, an infrared cut filter 112, and an eyepiece 113 are provided in the observation optical system.
- a terahertz camera 105 is installed at the tip of the eyepiece lens 113.
- the observation optical system and the terahertz camera 105 are supported by an arm 114.
- the first lens 107 is supported by a lens support 115, and the mirror 108 is supported by a mirror support 116.
- the sensor package 117 is built in the terahertz camera 105.
- An array sensor 118 is enclosed in the sensor package 117, and a window 119 is provided in the terahertz light incident portion of the sensor package 117.
- the light output from the coherent terahertz light source 102 is collected by the first lens 107, reflected by the mirror 108, and collected at the position of the iris diaphragm 109. Next, unnecessary light is removed by the iris diaphragm 109.
- the light that has passed through the iris diaphragm 109 is collimated by the second lens 110 and irradiated onto the sample 106 placed on the sample stage 103.
- the light transmitted through the sample 106 enters the terahertz camera 105 through the observation optical system. As described above, a terahertz image of the sample 106 can be acquired. Note that the magnification can be adjusted by changing the combination of the objective lens 111 and the eyepiece lens 113.
- Non-Patent Document 1 has a problem that an interference pattern is generated in the background image and the sample image becomes unclear. This is a problem caused by diffraction and interference peculiar to coherent terahertz light. Details will be described below.
- the first problem is that it is affected by diffraction. This is because the wavelength of terahertz light is two to three orders of magnitude longer than visible light. In a microscope using visible light, the wavelength is 1 ⁇ m or less, and since it is smaller by three orders of magnitude or more than the size of the optical component, diffraction hardly becomes a problem. Moreover, since the location where the unnecessary light is generated can be specified only by tracing the ray of geometric optics, measures such as antireflection can be taken. On the other hand, the wavelength of the terahertz light is 0.03 to 3 mm, which is close to the order of the optical system size because it is one to two orders of magnitude smaller than the lens diameter and mirror diameter.
- the beam diameter spreads over a short distance.
- the wavelength is 0.6 mm, that is, the frequency is 0.5 THz
- the beam diameter of ⁇ 10 mm spreads to ⁇ 25 mm when the beam diameter advances by 30 cm.
- the second problem is that the above-described interference of unnecessary light becomes significant.
- the coherence of the light itself is high.
- the processing variation is 1 ⁇ m or more. For this reason, if it is visible light, the phase of scattered light will be random and coherence will be lost. Therefore, no interference fringes are generated.
- the wavelength of terahertz light is larger than the processing variation, coherence is not lost even in scattered light. As a result, interference fringes due to scattered light are generated.
- the present invention has been made in view of the above-described problems, and an object of the present invention is to reduce and eliminate unnecessary interference patterns in an optical device using coherent terahertz light, and obtain a high-quality terahertz image. Is to provide.
- an optical device for coherent terahertz light includes an optical system using coherent terahertz light having a frequency of 0.1 to 10 THz, and a structure positioned outside the effective diameter of the optical system. And an antireflection body installed on the effective diameter side.
- the effect of the present invention is that the image quality of a coherent terahertz light image can be improved.
- FIG. 1 is a sectional view showing a first embodiment of the present invention.
- the optical device for coherent terahertz light according to the present embodiment has an optical system 2 that uses coherent terahertz light 1 having a frequency of 0.1 to 10 THz.
- the structure 4 located outside the effective diameter 3 of the optical system 2 has an antireflection body 5 on the effective diameter 3 side.
- the optical system 2 may be provided with various optical means for controlling the coherent terahertz light 1.
- FIG. 2 is a cross-sectional view showing an optical apparatus according to a first embodiment of the present invention.
- a housing 6 is provided with a coherent terahertz light source 7 that outputs coherent terahertz light 1, a first lens 9 supported by a lens support 8, a sample support 10, and a terahertz camera 11.
- a sample is supported on the sample support 10. It is desirable that the sample is detachably supported.
- an antireflection body 5 is provided on the optical path side of the lens holding portion of the lens support 8 and the sample support portion of the sample support 10. The antireflection body 5 is provided so as to cover the diffraction range of the terahertz light.
- the optical system 2 includes a coherent terahertz light source 7, a first lens 9, an opening in which a sample of the sample support 10 is disposed, and a terahertz camera 11.
- the effective diameter 3 in the optical system 2 is a ray tracing range in geometric optics.
- the light emission range from the coherent terahertz light source 7 in geometric optics, the light incident / exit range of the first lens 9, and the light incident range to the terahertz camera 11 correspond to the effective diameter 3.
- Structures outside the effective diameter 3 are the lens support 8, the sample support 10, and portions other than the light incident part of the terahertz camera 11.
- the antireflection body 5 is provided outside the effective optical diameter 3 of the structure. That is, the antireflection body 5 is provided on the outside of the first lens 9 holding portion of the lens support 8, the sample holding portion of the sample support 10, and the light incident portion of the terahertz camera 11.
- the terahertz camera 11 has a sensor package 12 built therein.
- An array sensor 13 for detecting terahertz light is enclosed in the sensor package 12.
- a window 14 that transmits terahertz light is provided in the light incident portion of the sensor package 12, and an antireflection body 5 is provided around the window 14.
- the array sensor 13 includes terahertz light sensor elements (not shown) arranged in an array.
- the coherent terahertz light 1 output from the coherent terahertz light source 7 is collimated by the first lens 9 and irradiated onto the sample.
- the coherent terahertz light 1 transmitted through the sample enters the terahertz camera 11. Then, the transmitted terahertz light passes through the window 14 and enters the array sensor 13 to obtain an image of the sample.
- the antireflective body 5 for example, a sheet in which fibers such as rayon, nylon, and polyester are stretched on a plastic base material such as polyester can be used. Since such a material has irregularities longer than the wavelength, the coherent property is lost even if there is a minute reflection. For this reason, generation
- the antireflection body 5 preferably absorbs light and has a property close to a black body. This is because the terahertz sensor senses heat radiation.
- FIG. 3 is a cross-sectional view schematically showing unnecessary light interference in the sensor package 12 when the antireflection body 5 is not provided.
- the coherent terahertz light 1 is transmitted through the window 14, the coherent terahertz light 1 is reflected at the edge of the sensor package 12 in a direction different from the incident direction.
- the light reflected at the left end of the opening of the sensor package 12 interferes with the light reflected at the right end to form an intensity distribution on the array sensor 13 according to the optical path difference.
- the intensity distribution becomes a concentric interference fringe. Since the interference fringes are superimposed on the image, the quality of the acquired image is deteriorated.
- FIG. 3 is a cross-sectional view schematically showing unnecessary light interference in the sensor package 12 when the antireflection body 5 is not provided.
- FIG. 5 shows a cross-sectional view of a terahertz microscope 15 using the present invention.
- the illumination optical system includes a coherent terahertz light source 7, a first lens 9, a mirror 16, an iris diaphragm 17, and a second lens 18.
- the lens support part of the lens support 8 that supports the first lens 9, the mirror support part of the mirror support 19 that supports the mirror 16, the support part of the second lens 18, and the terahertz light reachable range of the iris diaphragm 17, respectively.
- An antireflection body 5 is provided.
- the observation optical system includes a lens barrel 20, an objective lens 21 supported by the lens barrel 20, an infrared cut filter 22, an eyepiece lens 23, and a terahertz camera 11.
- the infrared cut filter 22 cuts infrared rays that become noise, for example, light having a frequency of 10 THz or more.
- An antireflection body 5 is formed on the inner wall of the lens barrel 20 that supports the objective lens 21 and the like.
- the structure of the terahertz camera 11 is the same as that of the second embodiment, and an antireflection body 5 is provided around the light incident part.
- a sample stage 24 for supporting a sample is provided between the illumination optical system and the observation optical system.
- the sample stage 24 is provided with a light transmission part for transmitting light, and the antireflection body 5 is provided around the light transmission part in the same manner as other optical elements.
- the lens barrel 20 and the terahertz camera 11 are supported by an arm 25. Although referred to herein as a microscope, the magnification is not limited to 1 or more.
- coherent terahertz light 1 is output from the coherent terahertz light source 7.
- a quantum cascade laser is used when the light frequency is 1.5 THz or higher
- a Schottky diode multiplier light source or the like is used when the frequency is 2 THz or lower.
- the light output from the coherent terahertz light source 7 is collected by the first lens 9 and reflected by the mirror 16 toward the sample stage 24.
- the reflected light is focused at the position of the iris diaphragm 17, collimated by the second lens 18, and the sample 26 on the sample stage 24 is illuminated.
- the iris diaphragm 17 is used to exclude unnecessary light such as higher order modes.
- the light that has been absorbed by the sample 26 and transmitted through the sample 26 is condensed and collimated by the objective lens 21 and the eyepiece lens 23 and is incident on the terahertz camera 11.
- An array in which the image of the sample 26 is built in the sensor package 12. An image is formed on the sensor.
- FIG. 6 shows an example of a lens.
- An antireflection body 5 is provided on the outer periphery of the first lens 9.
- the effective diameter of the optical system is the diameter of the portion transparent to the terahertz light
- the structure is the outer peripheral portion of the first lens 9
- the antireflection body 5 is provided on the outer peripheral portion.
- FIG. 7 shows an example of a mirror.
- An antireflection body 5 is formed on the outer periphery of the mirror 16.
- FIG. 8 is a plan view showing an example of the iris diaphragm 17.
- the blades 27 are supported by the diaphragm support 28.
- An antireflection body 5 is formed on the blade 27.
- the effective diameter can be adjusted by moving the blade 27 with the lever 29.
- the antireflection body 5 is drawn so as to be formed on the entire surface of the blade 27, but the same effect can be obtained even if the antireflection body 5 is provided only in the vicinity of the end portion of the wing that defines the effective diameter. be able to.
- the optical device to which the present embodiment is applied is not limited to the above, and can be applied to various devices such as a fixed diaphragm, a prism, and a diffraction grating. ⁇ Example ⁇ Next, an example of actual observation results is shown.
- the frame can be regarded as an aperture having a fixed effective diameter.
- the frequency of the output light of the quantum cascade laser was 2 THz.
- the frame that causes the interference is a metal frame having an opening diameter of 30 mm and a length of 20 mm, which has been subjected to black anodized surface treatment.
- the infrared cut filter is a filter that does not transmit light having a frequency of 10 THz or higher.
- the terahertz camera incorporates an array sensor having 320 ⁇ 240 pixels and a pixel pitch of 23.5 ⁇ m, and the sensor size is 7.52 mm ⁇ 5.64 mm.
- the distance from the emission point of the quantum cascade laser to the tip of the terahertz camera was 140 mm, and the infrared cut filter was installed at a position in contact with the tip of the terahertz camera.
- FIG. 9 is a terahertz image when a metal frame is not placed. Since the light is not condensed by the lens, the entire image is dark.
- FIG. 10 is an image of the terahertz camera when a metal frame without an antireflection body is placed at a position 90 mm from the light emitting point and 50 mm from the tip of the terahertz camera. Since the reflected light from the metal frame also enters, the entire screen becomes brighter, and at the same time, the reflected light from the circular frame interferes with the light passing through the frame, so that concentric interference fringes are generated.
- FIG. 11 is a terahertz image when an antireflection body is installed inside the metal frame. Since reflection from the metal frame was suppressed, the image was the same as that in FIG. 9 when the metal frame was not placed, and it was found that the generation of interference fringes was sufficiently suppressed.
- the antireflection body is a film obtained by electrostatically flocking nylon having a length of 1 mm dyed black on a polyester base material.
- FIG. 12 is a cross-sectional view showing a fifth embodiment of the present invention.
- the present embodiment relates to a terahertz camera 10.
- the terahertz camera 10 is provided with an iris diaphragm 17 at the entrance of the coherent terahertz light 1.
- the iris diaphragm 17 can move the blade 27 to enlarge or reduce the inner diameter, and the antireflection body 5 is installed at the inner end of the blade 27.
- the iris diaphragm 17 it is possible to prevent the terahertz light from being irradiated to the reflection element such as the end of the window 14 or the end of the sensor package 12. For this reason, it is possible to prevent deterioration in image quality due to interference of unnecessary light.
- the iris diaphragm 17 is configured to be supported by the casing of the terahertz camera 10, but may be supported by another support.
- FIG. 13 is a sectional view showing an optical apparatus according to a sixth embodiment.
- the coherent terahertz light source 7 can output a plurality of types of terahertz light having different frequencies. Since the components arranged outside the coherent terahertz light source 7 such as an optical system and a terahertz camera are the same as those in the other embodiments, description thereof is omitted.
- the coherent light source 7 includes a plurality of lasers 30 each having a different frequency, and here, a laser a30a, a laser b30b, and a laser c30c are assumed.
- the laser 30 output from the movable mirror 31 can be selected.
- the terahertz light reflected by the movable mirror 31 is emitted at a predetermined emission angle by the action of the lens 32.
- the number of types of lasers 30 used is not limited to three.
- the light source used is not limited to the laser, and means for switching the frequency of the output light is not limited to the movable mirror 31.
- Various variations are possible using known techniques, such as turning on a plurality of light sources at the same time and switching them with a filter or slit.
- the present invention can be applied to an optical apparatus for acquiring a fingerprint spectrum.
- a baggage inspection device can be considered as an example of a device utilizing this feature.
- FIG. 14 is a schematic diagram showing the baggage inspection apparatus 33 according to the present embodiment.
- a coherent terahertz light source 7 and a terahertz camera 11 are provided in the housing 6. By making these reflection-type arrangements, a terahertz image of the baggage 35 flowing on the conveyor 34 can be acquired.
- Terahertz light has the characteristic of transmitting paper and plastic, so it can inspect the contents of luggage that cannot be seen with visible light. Also, it is possible to check the carry-in of drugs etc. using the fingerprint spectrum.
- the apparatus may be configured in a transmissive arrangement. Further, the inspection object is not limited to the baggage 35, and the optical device of the present embodiment can be used for inspection of fruits, vegetables, chemicals, and the like.
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Abstract
Description
〔実施例〕
次に実際の観察結果の一例を示す。現象の要因を複雑化させないために、量子カスケードレーザと、レンズの無い金属枠のみと、赤外線カットフィルタと、テラヘルツカメラと、を直線上に配置して実験を行った。ここで枠は、有効径の固定された絞りとみなすことが出来る。
2 光学系
3 有効径
4 構造体
5 反射防止体
6、101 筐体
7、102 コヒーレントテラヘルツ光源
8、115 レンズ支持体
9、107 第1レンズ
10 試料支持体
11、105 テラヘルツカメラ
12、117 センサパッケージ
13、118 アレイセンサ
14、119 窓
15 テラヘルツ顕微鏡
16、108 ミラー
17、109 虹彩絞り
18、110 第2レンズ
19、116 ミラー支持体
20、104 鏡筒
21、111 対物レンズ
22、112 赤外線カットフィルタ
23、113 接眼レンズ
24、103 試料ステージ
25、114 アーム
26、106 試料
27 羽根
28 絞り支持体
29 レバー
30 レーザ
31 可動ミラー
32 レンズ
33 手荷物検査装置
34 コンベア
35 手荷物
Claims (10)
- 周波数が0.1から10THzのコヒーレントテラヘルツ光を用いる光学系と、前記光学系の有効径外に位置する構造体の前記有効径側に設置された反射防止体と、を有する、ことを特徴とするコヒーレントテラヘルツ光用光学装置。
- 前記有効径が、幾何光学の光線追跡範囲であることを特徴とする請求項1に記載のコヒーレントテラヘルツ光用光学装置。
- 前記光学装置が、前記コヒーレントテラヘルツ光を検出する光検出手段を有することを特徴とするコヒーレントテラヘルツ光用光学装置。
- 前記光学装置が、前記コヒーレントテラヘルツ光を出力するコヒーレントテラヘルツ光源を有することを特徴とする請求項1乃至請求項3いずれか一項に記載のコヒーレントテラヘルツ光用光学装置。
- 前記コヒーレントテラヘルツ光源が、周波数の異なる複数の前記コヒーレントテラヘルツ光を選択的に出力することを特徴とする請求項4に記載のコヒーレントテラヘルツ光用光学装置。
- 前記構造体が絞りであることを特徴とする請求項1乃至請求項5いずれか一項に記載のコヒーレントテラヘルツ光用光学装置。
- 前記光学装置がレンズまたはミラーであることを特徴とする請求項1または請求項2に記載のコヒーレントテラヘルツ光用光学装置。
- 前記光学装置が前記コヒーレントテラヘルツ光を検出する光検出装置であり、前記構造体が前記光検出装置の光検出部を収納する筐体を含むことを特徴とする請求項1または請求項2に記載のコヒーレントテラヘルツ光用光学装置。
- 前記光検出装置が、光検出素子がアレイ状に配列した光検出部を有することを特徴とする請求項8に記載のコヒーレントテラヘルツ光用光学装置。
- 前記光検出部への光入射部の端部に前記反射防止体が設けられていることを特徴とする請求項9に記載のコヒーレントテラヘルツ光用光学装置。
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015141172A (ja) * | 2014-01-30 | 2015-08-03 | パイオニア株式会社 | テラヘルツ波ガイド装置、及びテラヘルツ波装置 |
WO2019116998A1 (ja) * | 2017-12-13 | 2019-06-20 | キヤノン株式会社 | テラヘルツ波カメラおよび検出モジュール |
JP2019105622A (ja) * | 2017-12-13 | 2019-06-27 | キヤノン株式会社 | テラヘルツ波カメラおよび検出モジュール |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10247842B2 (en) * | 2015-12-23 | 2019-04-02 | Raysecur Inc. | Mail screening apparatus |
WO2018169517A1 (en) * | 2017-03-14 | 2018-09-20 | Archit Lens Technology Inc. | Terahertz-gigahertz illuminator |
DE102018105352A1 (de) | 2018-03-08 | 2019-09-12 | Deutsche Post Ag | Verfahren und Vorrichtung zur Untersuchung von Sendungen |
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Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001304959A (ja) * | 2000-04-27 | 2001-10-31 | Omron Corp | 赤外線センサ |
JP2005156188A (ja) * | 2003-11-20 | 2005-06-16 | National Institute Of Advanced Industrial & Technology | 光の透過測定による試料の平坦度と複素誘電率測定装置及び測定法 |
JP2006234681A (ja) * | 2005-02-25 | 2006-09-07 | National Institute Of Advanced Industrial & Technology | 立体双楕円型光学装置 |
JP2009288047A (ja) * | 2008-05-29 | 2009-12-10 | Epson Toyocom Corp | テラヘルツ分光分析用液体セルおよびテラヘルツ分光分析用液体セルの製造方法 |
JP2010038809A (ja) * | 2008-08-07 | 2010-02-18 | Murata Mfg Co Ltd | テラヘルツ分光装置 |
JP2011198801A (ja) * | 2010-03-17 | 2011-10-06 | Canon Inc | 光伝導素子 |
WO2011134562A1 (de) * | 2010-04-30 | 2011-11-03 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e. V. | Anordnung zum erzeugen eines signals mit einstellbarer zeit- oder phasenlage |
JP2011252872A (ja) * | 2010-06-04 | 2011-12-15 | Nec Corp | 反射型イメージング装置 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3825756A (en) * | 1973-05-03 | 1974-07-23 | Barnes Eng Co | Calibration device for a gas analyzer |
US4782222A (en) * | 1987-09-03 | 1988-11-01 | Power Spectra | Bulk avalanche semiconductor switch using partial light penetration and inducing field compression |
US4864119A (en) * | 1987-09-03 | 1989-09-05 | Power Spectra, Inc. | Bulk avalanche semiconductor switch using a mesa structure |
US4903101A (en) * | 1988-03-28 | 1990-02-20 | California Institute Of Technology | Tunable quantum well infrared detector |
US5030828A (en) * | 1990-06-25 | 1991-07-09 | Grumman Aerospace Corporation | Recessed element photosensitive detector array with optical isolation |
US5591975A (en) * | 1993-09-10 | 1997-01-07 | Santa Barbara Research Center | Optical sensing apparatus for remotely measuring exhaust gas composition of moving motor vehicles |
US7008870B2 (en) * | 2003-12-26 | 2006-03-07 | Macronix International Co., Ltd. | Structure applied to a photolithographic process and method for fabricating a semiconductor device |
US7642205B2 (en) * | 2005-04-08 | 2010-01-05 | Mattson Technology, Inc. | Rapid thermal processing using energy transfer layers |
US7825381B2 (en) * | 2007-06-29 | 2010-11-02 | Agiltron, Inc. | Micromechanical device for infrared sensing |
US9523152B2 (en) * | 2013-09-06 | 2016-12-20 | Massachusetts Institute Of Technology | Metallic dielectric photonic crystals and methods of fabrication |
-
2014
- 2014-06-20 JP JP2015525035A patent/JP6156495B2/ja not_active Expired - Fee Related
- 2014-06-20 US US14/898,524 patent/US20160131889A1/en not_active Abandoned
- 2014-06-20 WO PCT/JP2014/003324 patent/WO2015001753A1/ja active Application Filing
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001304959A (ja) * | 2000-04-27 | 2001-10-31 | Omron Corp | 赤外線センサ |
JP2005156188A (ja) * | 2003-11-20 | 2005-06-16 | National Institute Of Advanced Industrial & Technology | 光の透過測定による試料の平坦度と複素誘電率測定装置及び測定法 |
JP2006234681A (ja) * | 2005-02-25 | 2006-09-07 | National Institute Of Advanced Industrial & Technology | 立体双楕円型光学装置 |
JP2009288047A (ja) * | 2008-05-29 | 2009-12-10 | Epson Toyocom Corp | テラヘルツ分光分析用液体セルおよびテラヘルツ分光分析用液体セルの製造方法 |
JP2010038809A (ja) * | 2008-08-07 | 2010-02-18 | Murata Mfg Co Ltd | テラヘルツ分光装置 |
JP2011198801A (ja) * | 2010-03-17 | 2011-10-06 | Canon Inc | 光伝導素子 |
WO2011134562A1 (de) * | 2010-04-30 | 2011-11-03 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e. V. | Anordnung zum erzeugen eines signals mit einstellbarer zeit- oder phasenlage |
JP2011252872A (ja) * | 2010-06-04 | 2011-12-15 | Nec Corp | 反射型イメージング装置 |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2015141172A (ja) * | 2014-01-30 | 2015-08-03 | パイオニア株式会社 | テラヘルツ波ガイド装置、及びテラヘルツ波装置 |
WO2019116998A1 (ja) * | 2017-12-13 | 2019-06-20 | キヤノン株式会社 | テラヘルツ波カメラおよび検出モジュール |
JP2019105622A (ja) * | 2017-12-13 | 2019-06-27 | キヤノン株式会社 | テラヘルツ波カメラおよび検出モジュール |
JP7288296B2 (ja) | 2017-12-13 | 2023-06-07 | キヤノン株式会社 | テラヘルツ波カメラおよび検出モジュール |
US11770596B2 (en) | 2017-12-13 | 2023-09-26 | Canon Kabushiki Kaisha | Terahertz wave camera and detection module |
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JPWO2015001753A1 (ja) | 2017-02-23 |
US20160131889A1 (en) | 2016-05-12 |
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