WO2014117546A1 - Spectrometer - Google Patents

Spectrometer Download PDF

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Publication number
WO2014117546A1
WO2014117546A1 PCT/CN2013/085779 CN2013085779W WO2014117546A1 WO 2014117546 A1 WO2014117546 A1 WO 2014117546A1 CN 2013085779 W CN2013085779 W CN 2013085779W WO 2014117546 A1 WO2014117546 A1 WO 2014117546A1
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WO
WIPO (PCT)
Prior art keywords
spectrometer
array
light
band
measurement
Prior art date
Application number
PCT/CN2013/085779
Other languages
French (fr)
Chinese (zh)
Inventor
潘建根
Original Assignee
杭州远方光电信息有限公司
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Publication of WO2014117546A1 publication Critical patent/WO2014117546A1/en

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02Details
    • G01J3/0205Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0218Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using optical fibers
    • G01J3/0221Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using optical fibers the fibers defining an entry slit
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12Generating the spectrum; Monochromators
    • G01J3/18Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28Investigating the spectrum
    • G01J3/2803Investigating the spectrum using photoelectric array detector
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12Generating the spectrum; Monochromators
    • G01J3/18Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • G01J2003/1842Types of grating
    • G01J2003/1861Transmission gratings

Definitions

  • the invention belongs to the field of optical radiation measurement, and in particular relates to a spectrometer.
  • Spectrometers are used to measure the spectral composition of spectral radiant power distribution and are widely used in light source radiation measurement, color measurement, element identification, chemical analysis and other fields. Commonly used spectrometers include monochromators and multicolor instruments (multi-channel spectrometers, array fast spectrometers, etc.). Array spectrometers with multi-channel detectors have millimeter-level measurement speeds, which have developed rapidly in recent years and are becoming more widely used.
  • the stray light indicator is an important indicator of the array spectrometer.
  • stray light refers to other spectral components that are irradiated on the corresponding pixel at a specific wavelength point, and its size determines the measurement accuracy of the array spectrometer.
  • the existing array is generally measured by the whole method, that is, the spectral power distribution of the entire tested band can be obtained in one measurement. Although the measurement method is fast and the cost is low, the stray light is large and the accuracy is relatively high. low. In addition, the bandwidth, energy efficiency, sensitivity, and wavelength resolution of the spectrometer have a greater impact on the test results.
  • the publication No. CN101324468B discloses a technical solution for performing segment-by-segment measurement using a band pass color wheel, which is different by cutting the color filter of different conduction bands into the optical path by rotating the band color wheel.
  • the band is introduced into the optical path for measurement.
  • This measurement method can accurately measure each segment of the spectrum, and the measurement accuracy is high.
  • each filter needs to switch the color filter, it takes a long time and the test speed is slow; and all the measured light is introduced into the spectrometer once.
  • the conduction filter used before the grating splitting there are still many undesired reflections that bring stray light, which affects the measurement accuracy.
  • the measurement band on the array detector has been determined, ie the degree of subdivision of the wavelength has also been determined.
  • the technical solution uses the same spectrometer to measure light in different wavelength bands.
  • the array detector can only be utilized in a small part and cannot be fully utilized.
  • the wavelength range of the entire test band is 380 nm to 780 nm.
  • the measurement wavelengths on each pixel of the array detector have been determined.
  • the bulletin number "CN 201476880U” discloses a spectrometer consisting of a plurality of monochromators, each of which outputs monochromatic light of different wavelength bands, and the output monochromatic light bands overlap end to end.
  • each monochromator When each monochromator is actually working, it outputs not only monochromatic light of different wavelengths by rotating the grating, but also takes a long time; and as described above, All the measured light is introduced into the monochromator at one time, introducing a large amount of stray light, and the measurement accuracy is low.
  • the spectrometer actually measures the first-order spectrum of the grating dispersion, but because of its low energy, it is limited to the sensitivity of the detector, and often requires a larger energy of incident light. In order to ensure that the first-order spectrum is detected by the detector, the energy utilization rate is low; but the incident light energy is increased, the energy of the zero-order spectrum and other grades of the spectrum is also larger, and the stray light inside the spectrometer is also more, affecting The accuracy of the measurement.
  • the present invention aims to provide a high-precision array spectrometer which can measure the spectrum of the entire band to be measured with high precision by means of one-step measurement, which is greatly reduced.
  • Stray light interference level featuring fast speed, high measurement accuracy, high wavelength accuracy, high energy utilization, and convenient operation.
  • a spectrometer is realized by the following technical solutions.
  • a spectrometer comprising a beam splitter and two or more array spectrometers, the beam splitter comprising an optical input port, two or more optical output ports, a light output port and an array
  • the number of spectrometers is equal and one-to-one correspondence.
  • the measurement bands of each array spectrometer are connected end to end and cover the entire band to be tested.
  • Each light output port introduces the light to be measured into the corresponding array spectrometer, and each array spectrometer receives and measures different bands. Light.
  • the invention discloses a plurality of one-to-one corresponding light output ports and an array spectrometer.
  • the measuring beam is input from the fiber input port, and the beam splitter divides the beam into a plurality of beams, each of which is incident on a different array spectrometer for measurement. Since the measurement bands of each array spectrometer are connected end to end and cover the entire band to be tested, that is, the band to be tested is divided into multiple bands, and each band is measured step by step, and the results of each band are combined to obtain the entire test.
  • the spectral power distribution of the band is provided.
  • the technical solution can accurately measure each band by measuring the array spectrometer with different wavelength bands, and the spectral power distribution of the whole test band can be obtained by one-step measurement only in one measurement, and the measurement speed is fast, the accuracy is high, and the operation is convenient;
  • the array spectrometer has different measurement ranges, and the internal array detector only measures the light of a part of the band, and the array detector has a smaller wavelength range distributed on the same pixel, that is, the wavelength subdivision. Higher, measurement accuracy is also higher.
  • the invention can be further defined and improved by the following technical solutions.
  • the array spectrometer includes an incident slit, a grating, and an array detector.
  • the grating-level blaze wavelengths in each array spectrometer are within the measurement band of the array spectrometer.
  • the light beam emitted from the light output port is incident on the incident slit, and after being dispersed by the grating, is detected by the array detector.
  • the array spectrometer further includes a collimating mirror and a converging mirror, and the collimating mirror and the converging mirror are disposed behind the optical path of the incident slit to reflect and concentrate the beam.
  • the spectrum of the grating diffraction is divided into zero-order spectrum, first-order spectrum, and second-order spectrum.
  • the spectrometer In order to obtain dispersive light with relatively high light intensity, the spectrometer actually detects the first-order spectrum with relatively high light intensity and also dispersion, but since most of the light energy of the grating is concentrated on the zero-order spectrum of the grating, the spectrometer There are more stray light inside, which has a great influence on the measurement results.
  • a blazed grating is formed by scribing a series of equidistant zigzag groove faces on a polished metal plate or a metal film of a metal substrate.
  • the grating maximizes the zero-order principal maxima of a single groove surface diffraction and the zero-order principal of each groove surface interference, thereby causing the light energy to be greatly shifted from the interference zero-order main and concentrated to a certain polar spectrum.
  • the blazed wavelength of each stage can be obtained.
  • the wavelength is called the first-order blazed wavelength
  • the first-order spectrum is obtained.
  • the maximum light intensity combines the advantages of dispersion and light intensity.
  • the grating first-order blaze wavelengths in each array spectrometer are within the measurement band of the array spectrometer, and the single-slot diffraction zero-order main maximum of the light incident on each array detector falls exactly on the first-order line of the blazed wavelength.
  • the light intensity of the first-order line is the strongest, and the light intensity of other lines is weak, which ensures that the stray light inside each array spectrometer is small, the signal-to-noise ratio is greatly increased, and the wavelength energy utilization rate is greatly improved.
  • the grating first order blaze wavelengths in each array spectrometer are located near the center wavelength of the array spectrometer.
  • the grating-level blaze wavelengths in different array spectrometers are located near the center wavelength of the array spectrometer to maximize energy efficiency.
  • two or more band pass filters are included, and the number of the band pass filters and the array spectrometer are equal and one-to-one correspondence, and the conduction bands of the respective band pass filters are slightly larger than or equal to their corresponding ones.
  • a plurality of band pass filters and an array spectrometer are in one-to-one correspondence, and the measuring beam is input from the fiber input port, and the beam splitter divides the beam into a plurality of beams, each of which passes through a different band pass filter and is incident respectively.
  • each band pass filter only allows the light in the measurement range of the array spectrometer to pass through, and the light outside the measurement range is not transmitted, thus entering
  • the light inside the array spectrometer is only the light of its measurement range, which avoids the high-level spectrum mixed into other bands in the band to be tested, which can greatly reduce the stray light level and improve the measurement accuracy; or each band-pass filter only makes the array spectrometer slightly Light that is larger than its measurement range is transmitted, and other light is not transmitted. Compared with other non-measurement ranges, the undesired light entering the array spectrometer is greatly reduced. It can also greatly reduce stray light and improve measurement accuracy.
  • the band pass filter may be disposed on the optical path before the array spectrometer; or the band pass filter may be disposed inside the array spectrometer as part of the array spectrometer.
  • the position of the bandpass filter can be flexibly set as long as it divides the beam from the source under test into different measurement bands.
  • the conduction bands of the two or more band pass filters cover the ultraviolet to infrared band.
  • the measurement band of the array spectrometer covers the ultraviolet-visible-infrared band, so the conduction band of the band pass filter should cover the band to be tested of the array spectrometer accordingly.
  • the light mixer is disposed on a light path before the light output port, and the light mixer is an integrating sphere or a diffuse reflection plate or a diffuse transmission plate.
  • the mixer mixes the optical signals from the target to be measured and outputs them to the fiber input port to measure the average spectral information of the source under test.
  • the beam splitter is a quartz bifurcated fiber or a spectroscopic half mirror or a spectroscopic half mirror set which can obtain multiple beams.
  • Quartz fiber can transmit light in various wavelengths such as ultraviolet, visible and infrared, and has a wide range of applications.
  • a control center for controlling the simultaneous measurement or integration of the respective array spectrometers, the control centers being electrically coupled to the respective array spectrometers.
  • the control center controls each array spectrometer to perform electronic synchronous measurement. The measurement of the entire band to be tested can be realized in one measurement. At the same time, after the measurement of each array spectrometer is finished, the measured results can be transmitted to the control center and integrated into the whole. The relative spectral power distribution of the measured band.
  • the integration time of each of the array spectrometers can be set independently or automatically according to the intensity of the incident light.
  • the integration time of each array spectrometer can be set independently to suit different incident light.
  • each array spectrometer can also automatically adjust the integration time to obtain a reasonable A/D value.
  • the band pass filter and the array spectrometer are arranged side by side.
  • the band pass filter and the array spectrometer are not limited to this arrangement, and other arrangements such as a band pass filter and an array spectrometer are disposed on one spherical surface.
  • the housing includes a beam splitter, an array spectrometer, and a band pass filter disposed in the chassis.
  • Each unit is housed in a single chassis with a high degree of integration, design integration, and ease of operation.
  • a convergence device, an imaging device, a dimming device, and the like may be disposed in the optical path.
  • an imaging device disposed on an optical path before the beam splitter and the beam splitter being located at an image plane position of the imaging device; or the imaging device being disposed after the beam splitter, before the array spectrometer The light path.
  • the imaging device here is a lens or other device. If the imaging device is disposed in front of the beam splitter, the light of the target to be measured is imaged by the imaging device to the input port of the beam splitter to measure the image spectrum and image spectrum of the target to be measured.
  • the imaging device concentrates the light output through the optical output port to the light entrance of the different array spectrometer for measurement.
  • the dimmable aperture disposed on the optical path before the beam splitter; or the dimmable aperture is disposed after the beam splitter and on the optical path preceding the array spectrometer.
  • the dimming aperture is disposed in front of the beam splitter to limit the light incident on the object to be measured in the input port of the beam splitter; the adjustable aperture is disposed after the beam splitter, and the array spectrometer is used to limit incidence into the array spectrometer The light.
  • the present invention uses a beam splitter to divide the measured light into a plurality of light beams, and accurately measures each wavelength band through each array spectrometer whose measurement range is connected end to end and covers the entire band to be tested, and only one measurement is needed.
  • the spectral power distribution of the entire band to be tested can be obtained, which has the characteristics of fast measurement speed, high wavelength subdivision, high measurement accuracy and convenient operation; in addition, the conduction band is respectively set in front of each array spectrometer Measuring each bandpass filter with the same band can greatly reduce stray light interference and further improve measurement accuracy.
  • Figure 1 is a schematic view of Embodiment 1;
  • Figure 2 is a schematic view of Embodiment 2
  • Figure 3 is a schematic view of Embodiment 3.
  • 1-beam splitter 1-1-optical input port; 1-2-optical output port; 2-array spectrometer; 3-band pass filter Color film; 4-control center; 5-chassis; 6-mixer.
  • this embodiment discloses a spectrometer comprising a beam splitter 1, five band pass filters 3, five array spectrometers 2, a control center 4 and a chassis 5; a beam splitter 1, a band pass The color filter 3 and the array spectrometer 2 are both disposed in the chassis 5.
  • the beam splitter 1 is a "one-to-five" bifurcated fiber, including one optical input port 1-1 and five optical output ports 1-2; the wavelength of the light to be measured is 380 nm-780 nm, and the measurement bands of the respective array spectrometers 2 are respectively For the 380 nm-460 nm, 460 nm-540 nm, 540 nm-620 nm, 620 nm-700 nm, and 700 nm-780 nm, the conduction bands of the respective array spectrometers 2 overlap first and cover the entire test band; the conduction of each band pass filter 3 is The band is slightly larger than the measurement band of its corresponding array spectrometer 2, and its conduction band is also 360 nm-480 nm 440 nm-560 nm, 520 nm-620 nm, 620 nm-700 nm, and 700 nm-780 nm.
  • the array spectrometer 2 receives the light beams emitted by the light output ports 1-2 filtered by the respective band pass filters 3, and the five array spectrometers 2 measure 380 nm - 460 nm, 460 nm - 540 nm, 540 nm - 620 nm, 620 nm - Spectral power distribution in the 700 nm and 700 nm-780 nm bands.
  • This embodiment also includes a control center 4 that controls and integrates the measurements of the various array spectrometers 2, and the control center 4 is electrically coupled to each of the array spectrometers 2. After the end of each array spectrometer 2 measurement, the respective measured results are transmitted to the control center 4 and integrated into the relative spectral power distribution of the entire band to be tested.
  • the measurement of the entire band to be tested can be obtained by one measurement, the stray light can be greatly reduced, the wavelength subdivision is high, and the measurement speed is fast, the accuracy is high, and the operation is convenient.
  • the beam splitter 1 of the present embodiment is a beam splitting half mirror group, the light beam is input from the light output port 1-1, and the beam splitting half mirror group includes three.
  • Each of the prisms has a light output port 1-2; each of the light output ports 1-2 is respectively provided with an array spectrometer 2, and each array spectrometer 2 is provided with a band pass filter 3 in front.
  • each band pass filter 3 corresponds to each array spectrometer, and the conduction band of each band pass filter 3 is equal to the measurement band of its corresponding array spectrometer 2.
  • the band to be tested is
  • the measurement bands of the three array spectrometers 2 are 380nm-500nm, 500nm-620nm and 620nm-780nm, respectively, and the conduction band of each band pass filter 3 is also 380nm-500nm. 500 nm to 620 nm and 620 nm to 780 nm.
  • the array spectrometer 2 in this embodiment includes an incident slit, a blazed grating, and an array detector.
  • the first-order blazed wavelength of the grating is in the measurement band of the corresponding array spectrometer 2, and the measured light source is filtered by the band pass filter.
  • the single-channel diffraction zero-order main maximum of the transmitted light falls on the first-order spectral line of the blazed wavelength, that is, the light intensity of the first-order line is the strongest, and the light intensity of the other-level lines is weak, thereby It ensures that the stray light inside the array spectrometer 2 is small, the signal-to-noise ratio is greatly increased, and the wavelength energy utilization rate is greatly improved.
  • the light mixer 6 is included, and the light mixer 6 is an integrating sphere, which is disposed on the optical path before the light output port 1-2, and the measured light passes through the light mixer. 6 is fully mixed, and then filtered by each band pass filter 3 to enter the corresponding array spectrometer 2 for analysis and measurement.

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)

Abstract

A spectrometer comprises a light beam separator (1) and multiple array spectrometers (2). The beam separator separates the detected light into multiple light beams. The measuring ranges of the multiple array spectrometers are linked end-to-end and cover the whole detected wave band. Each array spectrometer detects each wave band accurately. The power spectrum distribution of the whole detected wave band can be obtained accurately only by single measurement. The spectrometer has the advantages of quick measuring speed, high measuring accuracy, high wavelength subdivision, high energy utilization, convenient operation, and so on.

Description

一种光谱仪  Spectrometer
【技术领域】  [Technical Field]
本发明属于光辐射测量领域, 具体涉及一种光谱仪。  The invention belongs to the field of optical radiation measurement, and in particular relates to a spectrometer.
【背景技术】  【Background technique】
光谱仪用来测量分析光谱辐射功率分布的光谱组成的设备, 广泛应用于光 源辐射测量、 颜色测量、 元素鉴定、 化学分析等领域。 常用的光谱仪包括单色 仪和多色仪(多通道光谱仪、 阵列式快速光谱仪等), 采用多通道探测器的阵列 光谱仪具有毫秒级的测量速度, 近年来发展迅速, 应用也越来越广泛。  Spectrometers are used to measure the spectral composition of spectral radiant power distribution and are widely used in light source radiation measurement, color measurement, element identification, chemical analysis and other fields. Commonly used spectrometers include monochromators and multicolor instruments (multi-channel spectrometers, array fast spectrometers, etc.). Array spectrometers with multi-channel detectors have millimeter-level measurement speeds, which have developed rapidly in recent years and are becoming more widely used.
杂散光指标是阵列光谱仪的重要指标, 针对阵列光谱仪, 杂散光是指照射 在某个特定波长点所对应的象元上的其他光谱成分, 其大小决定着阵列光谱仪 的测量准确度。 现有的阵列一般通过整段方式测量, 即一次测量即可获得整个 待测波段的光谱功率分布, 这种测量方法虽然测试速度快, 成本也较低, 但杂 散光较大, 准确度相对较低。 此外, 光谱仪的带宽、 能量利用率、 灵敏度、 波 长分辨率对于测试结果的影响也较大。  The stray light indicator is an important indicator of the array spectrometer. For the array spectrometer, stray light refers to other spectral components that are irradiated on the corresponding pixel at a specific wavelength point, and its size determines the measurement accuracy of the array spectrometer. The existing array is generally measured by the whole method, that is, the spectral power distribution of the entire tested band can be obtained in one measurement. Although the measurement method is fast and the cost is low, the stray light is large and the accuracy is relatively high. low. In addition, the bandwidth, energy efficiency, sensitivity, and wavelength resolution of the spectrometer have a greater impact on the test results.
为了减小杂散光, 公开号为 CN101324468B的专利公开了一种利用带通色 轮进行逐段测量的技术方案, 通过转动带通色轮将不同导通波段的滤色片切入 光路, 从而将不同的波段导入到光路中进行测量。 这种测量方式可对每段光谱 准确测量, 测量准确度高, 但由于每次测量均需要切换滤色片, 耗时较长, 测 试速度慢; 而且所有被测光一次均被引入到光谱仪内部, 虽然在光栅分光前采 用的导通滤色片, 仍会有较多的非期望反射带来杂散光, 影响测量准确度。 更 为重要的是, 对于同一个光谱仪, 阵列探测器上的测量波段已经确定, 即波长 的细分程度也已经确定。 该技术方案利用同一个光谱仪测量不同波段的光线, 每次测量时, 阵列探测器仅能被利用其中的较少部分,不能被充分利用,例如, 整个待测波段的波长范围为 380nm~780nm, 阵列探测器上各个像素上的测量波 长已经确定,在测量 380nm~480nm波段时,仅较少部分的像素点参与光线响应, 其它像素点不参与响应, 像素点不能被充分利用。  In order to reduce the stray light, the publication No. CN101324468B discloses a technical solution for performing segment-by-segment measurement using a band pass color wheel, which is different by cutting the color filter of different conduction bands into the optical path by rotating the band color wheel. The band is introduced into the optical path for measurement. This measurement method can accurately measure each segment of the spectrum, and the measurement accuracy is high. However, since each filter needs to switch the color filter, it takes a long time and the test speed is slow; and all the measured light is introduced into the spectrometer once. Although the conduction filter used before the grating splitting, there are still many undesired reflections that bring stray light, which affects the measurement accuracy. More importantly, for the same spectrometer, the measurement band on the array detector has been determined, ie the degree of subdivision of the wavelength has also been determined. The technical solution uses the same spectrometer to measure light in different wavelength bands. For each measurement, the array detector can only be utilized in a small part and cannot be fully utilized. For example, the wavelength range of the entire test band is 380 nm to 780 nm. The measurement wavelengths on each pixel of the array detector have been determined. When measuring the 380 nm to 480 nm band, only a small number of pixels participate in the light response, and other pixels do not participate in the response, and the pixels cannot be fully utilized.
公告号为 "CN 201476880U"公开了由多个单色仪组成的一种光谱仪, 各个 单色仪分别输出不同波段的单色光, 且输出的单色光波段首尾交叠。每个单色仪 实际工作时,均通过转动光栅输出不同波长的单色光,不仅耗时长;且如上所述, 所有被测光线一次性引入到单色仪内部, 引入大量杂散光, 测量准确度较低。 此外, 由于光栅的零级光谱能量最大但不能发生色散, 光谱仪实际测量的是 光栅发生色散的一级光谱, 但由于其能量较低, 限于探测器的灵敏度, 往往需要 较大能量的入射光, 才能保证一级光谱被探测器探测到, 能量利用率较低; 但入 射光能量增大,其零级光谱以及其它级次的光谱的能量也更大, 光谱仪内部的杂 散光也更多, 影响测量的准确度。 The bulletin number "CN 201476880U" discloses a spectrometer consisting of a plurality of monochromators, each of which outputs monochromatic light of different wavelength bands, and the output monochromatic light bands overlap end to end. When each monochromator is actually working, it outputs not only monochromatic light of different wavelengths by rotating the grating, but also takes a long time; and as described above, All the measured light is introduced into the monochromator at one time, introducing a large amount of stray light, and the measurement accuracy is low. In addition, since the zero-order spectral energy of the grating is the largest but the dispersion cannot occur, the spectrometer actually measures the first-order spectrum of the grating dispersion, but because of its low energy, it is limited to the sensitivity of the detector, and often requires a larger energy of incident light. In order to ensure that the first-order spectrum is detected by the detector, the energy utilization rate is low; but the incident light energy is increased, the energy of the zero-order spectrum and other grades of the spectrum is also larger, and the stray light inside the spectrometer is also more, affecting The accuracy of the measurement.
【发明内容】  [Summary of the Invention]
针对上述现有技术的不足,本发明旨在提供一种高精度阵列光谱仪, 该光谱 仪仅需一次测量,即可通过逐段测量的方式高精度地实现整个待测波段光谱的测 量, 大幅降低了杂散光干扰水平, 具有速度快、 测量准确度高、 波长精度高、 能 量利用率高、 操作方便等特点。  In view of the above deficiencies of the prior art, the present invention aims to provide a high-precision array spectrometer which can measure the spectrum of the entire band to be measured with high precision by means of one-step measurement, which is greatly reduced. Stray light interference level, featuring fast speed, high measurement accuracy, high wavelength accuracy, high energy utilization, and convenient operation.
本发明所述的一种光谱仪是通过以下技术方案实现的。一种光谱仪, 其特征 在于,包括光束分离器以及两个或者两个以上阵列光谱仪, 所述的光束分离器包 括一个光输入端口、两个或者两个以上的光输出端口, 光输出端口与阵列光谱仪 的数目相等且一一对应,各个阵列光谱仪的测量波段首尾相接且覆盖整个待测波 段; 各个光输出端口将待测光线导入到对应的阵列光谱仪中, 各个阵列光谱仪接 收和测量不同波段的光线。  A spectrometer according to the present invention is realized by the following technical solutions. A spectrometer comprising a beam splitter and two or more array spectrometers, the beam splitter comprising an optical input port, two or more optical output ports, a light output port and an array The number of spectrometers is equal and one-to-one correspondence. The measurement bands of each array spectrometer are connected end to end and cover the entire band to be tested. Each light output port introduces the light to be measured into the corresponding array spectrometer, and each array spectrometer receives and measures different bands. Light.
本发明公开了包括多个一一对应的光输出端口和阵列光谱仪,测量光束从光 纤输入端口输入,光束分离器将光束分为多束, 每束光线分别入射到不同的阵列 光谱仪中进行测量。由于各个阵列光谱仪的测量波段首尾相接且覆盖整个待测波 段, 即待测波段被分为多个波段, 对每个波段逐段测量, 每个波段测得的结果合 并即可得到整个待测波段的光谱功率分布。本技术方案通过测量波段不同的阵列 光谱仪对各个波段精确测量,仅需一次测量即可通过逐段测量即可获得整个待测 波段的光谱功率分布, 测量速度快、准确度高且操作方便; 相比于同一测量范围 的阵列光谱仪, 该阵列光谱仪具有不同的测量范围, 其内部的阵列探测器仅测量 部分波段的光线, 阵列探测器的同一像素上分布的波长范围更小, 即波长细分度 更高, 测量准确度也更高。  The invention discloses a plurality of one-to-one corresponding light output ports and an array spectrometer. The measuring beam is input from the fiber input port, and the beam splitter divides the beam into a plurality of beams, each of which is incident on a different array spectrometer for measurement. Since the measurement bands of each array spectrometer are connected end to end and cover the entire band to be tested, that is, the band to be tested is divided into multiple bands, and each band is measured step by step, and the results of each band are combined to obtain the entire test. The spectral power distribution of the band. The technical solution can accurately measure each band by measuring the array spectrometer with different wavelength bands, and the spectral power distribution of the whole test band can be obtained by one-step measurement only in one measurement, and the measurement speed is fast, the accuracy is high, and the operation is convenient; Compared with the array spectrometer of the same measurement range, the array spectrometer has different measurement ranges, and the internal array detector only measures the light of a part of the band, and the array detector has a smaller wavelength range distributed on the same pixel, that is, the wavelength subdivision. Higher, measurement accuracy is also higher.
本发明还可以通过以下技术方案进一步限定和完善。  The invention can be further defined and improved by the following technical solutions.
作为一种技术方案, 所述的阵列光谱仪包括入射狭缝、 光栅和阵列探测器, 各个阵列光谱仪中的光栅一级闪耀波长均处于该阵列光谱仪的测量波段内。从光 输出端口发出的光束入射到入射狭缝中, 经光栅色散后, 被阵列探测器探测。此 夕卜,所述的阵列光谱仪还包括准直镜和会聚镜, 准直镜和会聚镜设置在入射狭缝 的光路后, 用以反射和会聚光束。 As a technical solution, the array spectrometer includes an incident slit, a grating, and an array detector. The grating-level blaze wavelengths in each array spectrometer are within the measurement band of the array spectrometer. The light beam emitted from the light output port is incident on the incident slit, and after being dispersed by the grating, is detected by the array detector. Further, the array spectrometer further includes a collimating mirror and a converging mirror, and the collimating mirror and the converging mirror are disposed behind the optical path of the incident slit to reflect and concentrate the beam.
光栅衍射的光谱分为零级光谱、 一级光谱、 二级光谱……,光谱级次越高, 色散本领越好, 光强度越小; 光谱级次越低, 色散本领越弱, 光强度越大, 因而 零级光谱能量最大, 但没有发生色散。 为了得到光强度相对较大的色散光, 光谱 仪实际探测的是具有相对较高光强度、 同时也发生色散的一级光谱, 但由于光栅 绝大多数光能都集中在光栅的零级光谱上,光谱仪内部的杂散光较多, 对测量结 果影响较大。  The spectrum of the grating diffraction is divided into zero-order spectrum, first-order spectrum, and second-order spectrum. The higher the spectral order, the better the dispersion power and the smaller the light intensity. The lower the spectral level, the weaker the dispersion power, and the light intensity is higher. Large, so the zero-order spectral energy is the largest, but no dispersion occurs. In order to obtain dispersive light with relatively high light intensity, the spectrometer actually detects the first-order spectrum with relatively high light intensity and also dispersion, but since most of the light energy of the grating is concentrated on the zero-order spectrum of the grating, the spectrometer There are more stray light inside, which has a great influence on the measurement results.
为了减小杂散光,通过在磨光的金属板或金属膜的玻璃基板上, 刻划出一系 列等距离的锯齿形槽面形成闪耀光栅。该光栅使得单个槽面衍射的零级主极大和 各槽面干涉的零级主极大分开,从而使得光能量从干涉零级主极大转移并集中到 某一极光谱上去。根据光栅方程, 可以得到各级的闪耀波长, 如果光栅的单槽衍 射零级主极大正好落在某一波长的一级谱线上, 则该波长称为一级闪耀波长,一 级光谱获得最大的光强度, 兼具了色散和光强度的优势。各个阵列光谱仪中的光 栅一级闪耀波长均处于该阵列光谱仪的测量波段内,入射到各个阵列探测器上的 光线的单槽衍射零级主极大正好落在闪耀波长的一级谱线上,即一级谱线的光强 度最强,其它级谱线的光强都很弱, 从而保证了各个阵列光谱仪内部的杂散光均 较小, 信噪比大幅增加, 波长能量利用率大幅提升。  In order to reduce stray light, a blazed grating is formed by scribing a series of equidistant zigzag groove faces on a polished metal plate or a metal film of a metal substrate. The grating maximizes the zero-order principal maxima of a single groove surface diffraction and the zero-order principal of each groove surface interference, thereby causing the light energy to be greatly shifted from the interference zero-order main and concentrated to a certain polar spectrum. According to the grating equation, the blazed wavelength of each stage can be obtained. If the single-slot diffraction zero-order main maximum of the grating falls exactly on the first-order line of a certain wavelength, the wavelength is called the first-order blazed wavelength, and the first-order spectrum is obtained. The maximum light intensity combines the advantages of dispersion and light intensity. The grating first-order blaze wavelengths in each array spectrometer are within the measurement band of the array spectrometer, and the single-slot diffraction zero-order main maximum of the light incident on each array detector falls exactly on the first-order line of the blazed wavelength. That is, the light intensity of the first-order line is the strongest, and the light intensity of other lines is weak, which ensures that the stray light inside each array spectrometer is small, the signal-to-noise ratio is greatly increased, and the wavelength energy utilization rate is greatly improved.
作为优选,各个阵列光谱仪中的光栅一级闪耀波长均位于该阵列光谱仪的中 心波长附近。不同阵列光谱仪中的光栅一级闪耀波长均位于阵列光谱仪的中心波 长附近, 以最大程度地增大能量利用率。  Preferably, the grating first order blaze wavelengths in each array spectrometer are located near the center wavelength of the array spectrometer. The grating-level blaze wavelengths in different array spectrometers are located near the center wavelength of the array spectrometer to maximize energy efficiency.
作为优选,包括两个或者两个以上的带通滤色片, 带通滤色片与阵列光谱仪 的数目相等且一一对应,各个带通滤色片的导通波段略大于或者等于其对应的阵 列光谱仪的测量波段; 各个光输出端口发出的光线被对应的带通滤色片滤光, 各 个阵列光谱仪接收和测量经带通滤色片滤光后的光线。测量时, 多个带通滤色片 和阵列光谱仪一一对应,测量光束从光纤输入端口输入, 光束分离器将光束分为 多束,每束光线经不同的带通滤色片后, 分别入射到不同的阵列光谱仪中进行测 量。 由于各个带通滤色片的对应的阵列光谱仪的测量波段相同, 各个带通滤色片 仅让阵列光谱仪测量范围内的光线透过、而其测量范围外的光线不能透过,因此, 进入到阵列光谱仪内部的光线仅是其测量范围的光线,避免了待测波段中混入其 它波段的高级光谱, 可大幅降低杂散光水平, 提高测量准确度; 或者各个带通滤 色片仅让阵列光谱仪略大于其测量范围的光线透过、而其它光线均不能透过, 相 比于其它非测量范围内的光线均进入阵列光谱仪的情况,该技术方案进入到阵列 光谱仪内部的非期望光线大幅减小, 亦可大幅减小杂散光, 提高测量准确度。 Preferably, two or more band pass filters are included, and the number of the band pass filters and the array spectrometer are equal and one-to-one correspondence, and the conduction bands of the respective band pass filters are slightly larger than or equal to their corresponding ones. The measurement band of the array spectrometer; the light emitted by each light output port is filtered by the corresponding band pass filter, and each array spectrometer receives and measures the light filtered by the band pass filter. In the measurement, a plurality of band pass filters and an array spectrometer are in one-to-one correspondence, and the measuring beam is input from the fiber input port, and the beam splitter divides the beam into a plurality of beams, each of which passes through a different band pass filter and is incident respectively. Test in different array spectrometers the amount. Since the measurement bands of the corresponding array spectrometers of the respective band pass filters are the same, each band pass filter only allows the light in the measurement range of the array spectrometer to pass through, and the light outside the measurement range is not transmitted, thus entering The light inside the array spectrometer is only the light of its measurement range, which avoids the high-level spectrum mixed into other bands in the band to be tested, which can greatly reduce the stray light level and improve the measurement accuracy; or each band-pass filter only makes the array spectrometer slightly Light that is larger than its measurement range is transmitted, and other light is not transmitted. Compared with other non-measurement ranges, the undesired light entering the array spectrometer is greatly reduced. It can also greatly reduce stray light and improve measurement accuracy.
本发明中,所述的带通滤色片可以设置在阵列光谱仪之前的光路上; 或者所 述的带通滤色片设置在阵列光谱仪内部, 是阵列光谱仪的一部分。带通滤色片的 位置可灵活设置, 只要其能将被测光源发出的光束划分为不同的测量波段即可。 此外,所述的两个或者两个以上的带通滤色片的导通波段覆盖紫外到红外的波段。 阵列光谱仪的测量波段覆盖紫外一可见光一红外波段,因而带通滤色片的导通波 段应相应地覆盖阵列光谱仪的待测波段。  In the present invention, the band pass filter may be disposed on the optical path before the array spectrometer; or the band pass filter may be disposed inside the array spectrometer as part of the array spectrometer. The position of the bandpass filter can be flexibly set as long as it divides the beam from the source under test into different measurement bands. In addition, the conduction bands of the two or more band pass filters cover the ultraviolet to infrared band. The measurement band of the array spectrometer covers the ultraviolet-visible-infrared band, so the conduction band of the band pass filter should cover the band to be tested of the array spectrometer accordingly.
作为一种技术方案,包括混光器, 所述的混光器设置在光输出端口之前的光 路上,所述的混光器为积分球或漫反射板或者漫透射板。混光器将从被测目标发 出的光信号充分混合, 并输出到光纤输入端口, 用以测量被测光源的平均光谱信 息。  As a technical solution, including a light mixer, the light mixer is disposed on a light path before the light output port, and the light mixer is an integrating sphere or a diffuse reflection plate or a diffuse transmission plate. The mixer mixes the optical signals from the target to be measured and outputs them to the fiber input port to measure the average spectral information of the source under test.
作为一种技术方案,所述的光束分离器为石英分叉光纤或者可获得多路光束 的分光半透半反镜或者分光半透半反镜组。石英光纤可传输紫外、可见、 红外等 各个波段的光线, 适用范围广。  As a technical solution, the beam splitter is a quartz bifurcated fiber or a spectroscopic half mirror or a spectroscopic half mirror set which can obtain multiple beams. Quartz fiber can transmit light in various wavelengths such as ultraviolet, visible and infrared, and has a wide range of applications.
作为优选,包括控制各个阵列光谱仪同步测量或积分的控制中心, 所述的控 制中心与各个阵列光谱仪均电连接。控制中心控制各个阵列光谱仪进行电子同步 测量,一次测量即可实现整个待测波段的测量;同时各个阵列光谱仪测量结束后, 还可以将各自测得的结果传输到控制中心上,整合为整个待测波段的相对光谱功 率分布。  Preferably, a control center is provided for controlling the simultaneous measurement or integration of the respective array spectrometers, the control centers being electrically coupled to the respective array spectrometers. The control center controls each array spectrometer to perform electronic synchronous measurement. The measurement of the entire band to be tested can be realized in one measurement. At the same time, after the measurement of each array spectrometer is finished, the measured results can be transmitted to the control center and integrated into the whole. The relative spectral power distribution of the measured band.
作为一种技术方案,所述的各个阵列光谱仪的积分时间可独立设置或者根据 入射光的强弱自动调节。各个阵列光谱仪的积分时间均可独立设置, 以适用于不 同的入射光线; 同时可根据入射光的强弱, 各个阵列光谱仪还可以自动调节各自 的积分时间, 以得到合理的 A/D值。 作为优选, 所述的带通滤色片和阵列光谱仪并列设置。此外, 带通滤色片和 阵列光谱仪不限于这种排列方式, 也包括其它设置方式, 如带通滤色片和阵列光 谱仪两者设置在一个球面上。 As a technical solution, the integration time of each of the array spectrometers can be set independently or automatically according to the intensity of the incident light. The integration time of each array spectrometer can be set independently to suit different incident light. At the same time, according to the intensity of the incident light, each array spectrometer can also automatically adjust the integration time to obtain a reasonable A/D value. Preferably, the band pass filter and the array spectrometer are arranged side by side. In addition, the band pass filter and the array spectrometer are not limited to this arrangement, and other arrangements such as a band pass filter and an array spectrometer are disposed on one spherical surface.
作为优选, 包括机箱, 所述的光束分离器、 阵列光谱仪、 带通滤色片均设置 在机箱内。 各个装置均设置在一个机箱内, 集成化程度高、 设计一体化、 操作方 便。  Preferably, the housing includes a beam splitter, an array spectrometer, and a band pass filter disposed in the chassis. Each unit is housed in a single chassis with a high degree of integration, design integration, and ease of operation.
此外, 在光路中还可以设置会聚装置、 成像装置、 可调光阑等装置。 例如, 包括成像装置,所述的成像装置设置在光束分离器之前的光路上, 且光束分离器 位于成像装置的像面位置上; 或者所述的成像装置设置在光束分离器之后、阵列 光谱仪之前的光路上。这里的成像装置为透镜或者其他装置, 若成像装置设置在 光束分离器之前, 被测目标的光线经成像装置成像到光束分离器的输入端口上, 用以测量被测目标的图像光谱和图像光谱辐亮度;若成像装置设置在光束分离器 之后、阵列光谱仪之前, 成像装置将经光输出端口输出的光线会聚到不同阵列光 谱仪的入光口上进行测量。或者包括可调光阑, 所述的可调光阑设置在光束分离 器之前的光路上; 或者所述的可调光阑设置在光束分离器之后、阵列光谱仪之前 的光路上。可调光阑设置在光束分离器之前, 用以限制入射到光束分离器输入端 口中的被测目标的光线; 可调光阑设置在光束分离器之后、阵列光谱仪用以限制 入射到阵列光谱仪中的光线。  In addition, a convergence device, an imaging device, a dimming device, and the like may be disposed in the optical path. For example, comprising an imaging device disposed on an optical path before the beam splitter and the beam splitter being located at an image plane position of the imaging device; or the imaging device being disposed after the beam splitter, before the array spectrometer The light path. The imaging device here is a lens or other device. If the imaging device is disposed in front of the beam splitter, the light of the target to be measured is imaged by the imaging device to the input port of the beam splitter to measure the image spectrum and image spectrum of the target to be measured. Radiation; if the imaging device is placed behind the beam splitter and before the array spectrometer, the imaging device concentrates the light output through the optical output port to the light entrance of the different array spectrometer for measurement. Or including a dimmable aperture disposed on the optical path before the beam splitter; or the dimmable aperture is disposed after the beam splitter and on the optical path preceding the array spectrometer. The dimming aperture is disposed in front of the beam splitter to limit the light incident on the object to be measured in the input port of the beam splitter; the adjustable aperture is disposed after the beam splitter, and the array spectrometer is used to limit incidence into the array spectrometer The light.
综上所述,本发明采用光束分离器将被测光线分为多个光束, 通过测量范围 首尾相接且覆盖整个待测波段的各个阵列光谱仪,对各个波段精确测量, 仅需一 次测量即可通过逐段测量即可获得整个待测波段的光谱功率分布,具有测量速度 快、 波长细分度高、 测量准确度高且操作方便等特点; 此外, 在各个阵列光谱仪 前分别设置导通波段与其测量波段相同的各个带通滤色片,还可大幅降低杂散光 干扰, 进一步提高测量准确度。  In summary, the present invention uses a beam splitter to divide the measured light into a plurality of light beams, and accurately measures each wavelength band through each array spectrometer whose measurement range is connected end to end and covers the entire band to be tested, and only one measurement is needed. Through the piece by piece measurement, the spectral power distribution of the entire band to be tested can be obtained, which has the characteristics of fast measurement speed, high wavelength subdivision, high measurement accuracy and convenient operation; in addition, the conduction band is respectively set in front of each array spectrometer Measuring each bandpass filter with the same band can greatly reduce stray light interference and further improve measurement accuracy.
【附图说明】  [Description of the Drawings]
附图 1是实施例 1的示意图;  Figure 1 is a schematic view of Embodiment 1;
附图 2是实施例 2的示意图;  Figure 2 is a schematic view of Embodiment 2;
附图 3是实施例 3的示意图。  Figure 3 is a schematic view of Embodiment 3.
1-光束分离器; 1-1-光输入端口; 1-2-光输出端口; 2-阵列光谱仪; 3-带通滤 色片; 4-控制中心; 5-机箱; 6-混光器。 1-beam splitter; 1-1-optical input port; 1-2-optical output port; 2-array spectrometer; 3-band pass filter Color film; 4-control center; 5-chassis; 6-mixer.
【具体实施方式】  【detailed description】
实施例 1  Example 1
如图 1所示, 本实施例公开了一种光谱仪, 包括光束分离器 1、 5个带通滤 色片 3、 5个阵列光谱仪 2、 控制中心 4和机箱 5; 光束分离器 1、 带通滤色片 3 和阵列光谱仪 2均设置在机箱 5内。  As shown in FIG. 1, this embodiment discloses a spectrometer comprising a beam splitter 1, five band pass filters 3, five array spectrometers 2, a control center 4 and a chassis 5; a beam splitter 1, a band pass The color filter 3 and the array spectrometer 2 are both disposed in the chassis 5.
光束分离器 1为 "一拖五"分叉光纤, 包括一个光输入端口 1-1、 5个光输 出端口 1-2; 待测光线的波段为 380nm-780nm, 各个阵列光谱仪 2的测量波段分 别为 380nm-460nm、460nm-540nm、540nm-620nm、620nm-700nm和 700nm-780nm, 上述各个阵列光谱仪 2的导通波段首位交叠且覆盖整个待测波段;各个带通滤色 片 3的导通波段略大于其对应的阵列光谱仪 2的测量波段,其导通波段也依次为 360nm-480nm 440nm-560nm、 520nm-620nm、 620nm-700nm禾卩 700nm-780nm。 测试时, 阵列光谱仪 2接收经各个带通滤色片 3滤光后的光输出端口 1-2发出的 光束, 5个阵列光谱仪 2分别测量 380nm-460nm、 460nm-540nm、 540nm-620nm、 620nm-700nm和 700nm-780nm波段的光谱功率分布。  The beam splitter 1 is a "one-to-five" bifurcated fiber, including one optical input port 1-1 and five optical output ports 1-2; the wavelength of the light to be measured is 380 nm-780 nm, and the measurement bands of the respective array spectrometers 2 are respectively For the 380 nm-460 nm, 460 nm-540 nm, 540 nm-620 nm, 620 nm-700 nm, and 700 nm-780 nm, the conduction bands of the respective array spectrometers 2 overlap first and cover the entire test band; the conduction of each band pass filter 3 is The band is slightly larger than the measurement band of its corresponding array spectrometer 2, and its conduction band is also 360 nm-480 nm 440 nm-560 nm, 520 nm-620 nm, 620 nm-700 nm, and 700 nm-780 nm. During the test, the array spectrometer 2 receives the light beams emitted by the light output ports 1-2 filtered by the respective band pass filters 3, and the five array spectrometers 2 measure 380 nm - 460 nm, 460 nm - 540 nm, 540 nm - 620 nm, 620 nm - Spectral power distribution in the 700 nm and 700 nm-780 nm bands.
本实施例还包括控制和整合各个阵列光谱仪 2测量结果的控制中心 4, 控制 中心 4与各个阵列光谱仪 2均电连接。各个阵列光谱仪 2测量结束后, 将各自测 得的结果传输到控制中心 4上, 整合为整个待测波段的相对光谱功率分布。  This embodiment also includes a control center 4 that controls and integrates the measurements of the various array spectrometers 2, and the control center 4 is electrically coupled to each of the array spectrometers 2. After the end of each array spectrometer 2 measurement, the respective measured results are transmitted to the control center 4 and integrated into the relative spectral power distribution of the entire band to be tested.
该实施例通过一次测量,即可得到整个待测波段的测量,可大幅降低杂散光, 波长细分程度高, 具有测量速度快、 准确度高且操作方便。  In this embodiment, the measurement of the entire band to be tested can be obtained by one measurement, the stray light can be greatly reduced, the wavelength subdivision is high, and the measurement speed is fast, the accuracy is high, and the operation is convenient.
实施例 2  Example 2
如图 2所示, 与实施例 1不同的是, 本实施例的光束分离器 1为分光半透半 反镜组, 光束从光输出端口 1-1输入, 分光半透半反镜组包括三个分光棱镜, 每 个棱镜上分别有一个光输出端口 1-2; 每个光输出端口 1-2分别设置一个阵列光 谱仪 2, 且每个阵列光谱仪 2前均设置一个带通滤色片 3。  As shown in FIG. 2, unlike the first embodiment, the beam splitter 1 of the present embodiment is a beam splitting half mirror group, the light beam is input from the light output port 1-1, and the beam splitting half mirror group includes three. Each of the prisms has a light output port 1-2; each of the light output ports 1-2 is respectively provided with an array spectrometer 2, and each array spectrometer 2 is provided with a band pass filter 3 in front.
本实施例中,各个带通滤色片 3与各个阵列光谱仪 2—一对应, 各个带通滤 色片 3的导通波段等于其对应的阵列光谱仪 2的测量波段。 待测波段为  In this embodiment, each band pass filter 3 corresponds to each array spectrometer, and the conduction band of each band pass filter 3 is equal to the measurement band of its corresponding array spectrometer 2. The band to be tested is
380nm-780nm,三个阵列光谱仪 2的测量波段分别为 380nm-500nm、500nm-620nm 和 620nm-780nm, 各个带通滤色片 3的导通波段也依次为 380nm-500nm、 500nm-620nm和 620nm-780nm。 380nm-780nm, the measurement bands of the three array spectrometers 2 are 380nm-500nm, 500nm-620nm and 620nm-780nm, respectively, and the conduction band of each band pass filter 3 is also 380nm-500nm. 500 nm to 620 nm and 620 nm to 780 nm.
此外, 本实施例中的阵列光谱仪 2包括入射狭缝、 闪耀光栅和阵列探测器, 光栅的一级闪耀波长处于对应的阵列光谱仪 2的测量波段内,被测光源经带通滤 色片滤光后,透过的光线的单槽衍射零级主极大正好落在闪耀波长的一级谱线上, 即一级谱线的光强度最强, 其它级谱线的光强都很弱, 从而保证了阵列光谱仪 2 内部的杂散光较小, 信噪比大幅增加, 波长能量利用率大幅提升。  In addition, the array spectrometer 2 in this embodiment includes an incident slit, a blazed grating, and an array detector. The first-order blazed wavelength of the grating is in the measurement band of the corresponding array spectrometer 2, and the measured light source is filtered by the band pass filter. After that, the single-channel diffraction zero-order main maximum of the transmitted light falls on the first-order spectral line of the blazed wavelength, that is, the light intensity of the first-order line is the strongest, and the light intensity of the other-level lines is weak, thereby It ensures that the stray light inside the array spectrometer 2 is small, the signal-to-noise ratio is greatly increased, and the wavelength energy utilization rate is greatly improved.
实施例 3  Example 3
如图 3所示, 与实施例 1不同的是, 包括混光器 6, 该混光器 6为积分球, 设置在光输出端口 1-2之前的光路上, 被测光线经到混光器 6中充分混光, 然后 经各个带通滤色片 3滤光后进入对应的阵列光谱仪 2中分析测量。  As shown in FIG. 3, unlike the first embodiment, the light mixer 6 is included, and the light mixer 6 is an integrating sphere, which is disposed on the optical path before the light output port 1-2, and the measured light passes through the light mixer. 6 is fully mixed, and then filtered by each band pass filter 3 to enter the corresponding array spectrometer 2 for analysis and measurement.

Claims

权利要求书 Claim
1. 一种光谱仪, 其特征在于, 包括光束分离器 (1)以及两个或者两个以上阵列光 谱仪 (2),所述的光束分离器 (1)包括一个光输入端口 (1-1)、两个或者两个以上 的光输出端口 (1-2),光输出端口 (1-2)与阵列光谱仪 (2)的数目相等且一一对应, 各个阵列光谱仪 (2)的测量波段首尾相接且覆盖整个待测波段;各个光输出端 口 (1-2)将待测光线导入到对应的阵列光谱仪 (2)中,各个阵列光谱仪 (2)接收和 测量不同波段的光线。  A spectrometer comprising: a beam splitter (1) and two or more array spectrometers (2), said beam splitter (1) comprising an optical input port (1-1), Two or more light output ports (1-2), the number of light output ports (1-2) and the array spectrometer (2) are equal and one-to-one correspondence, and the measurement bands of each array spectrometer (2) are connected end to end. And covering the entire band to be tested; each light output port (1-2) introduces the light to be measured into the corresponding array spectrometer (2), and each array spectrometer (2) receives and measures the light of different bands.
2. 如权利要求 1所述的一种光谱仪, 其特征在于, 所述的阵列光谱仪 (2)包括入 射狭缝、光栅和阵列探测器, 各个阵列光谱仪 (2)中的光栅一级闪耀波长均处 于该阵列光谱仪 (2)的测量波段内。  2. A spectrometer according to claim 1, wherein said array spectrometer (2) comprises an entrance slit, a grating and an array detector, and the grating first-order blaze wavelengths in each array spectrometer (2) Within the measurement band of the array spectrometer (2).
3. 如权利要求 2所述的一种光谱仪, 其特征在于, 各个阵列光谱仪 (2)中的光栅 一级闪耀波长均位于该阵列光谱仪 (2)的中心波长附近。  3. A spectrometer according to claim 2, characterized in that the grating first order blaze wavelengths in each array spectrometer (2) are located near the central wavelength of the array spectrometer (2).
4. 如权利要求 1所述的一种光谱仪, 其特征在于, 包括两个或者两个以上的带 通滤色片 (3), 带通滤色片 (3)与阵列光谱仪 (2)的数目相等且一一对应, 各个 带通滤色片 (3)的导通波段略大于或者等于其对应的阵列光谱仪 (2)的测量波 段; 各个光输出端口 (1-2)发出的光线被对应的带通滤色片 (3)滤光, 各个阵列 光谱仪 (2)接收和测量经带通滤色片 (3)滤光后的光线。  4. A spectrometer according to claim 1, comprising two or more band pass filters (3), band pass filters (3) and array spectrometer (2) Equal and one-to-one correspondence, the conduction band of each band pass filter (3) is slightly larger than or equal to the measurement band of its corresponding array spectrometer (2); the light emitted by each light output port (1-2) is corresponding The band pass filter (3) filters, and each array spectrometer (2) receives and measures the light filtered by the band pass filter (3).
5. 如权利要求 4所述的一种光谱仪, 其特征在于, 所述的带通滤色片 (3)设置在 阵列光谱仪 (2)之前的光路上;或者所述的带通滤色片 (3)设置在阵列光谱仪 (2) 内部, 是阵列光谱仪 (2)的一部分。  5. A spectrometer according to claim 4, characterized in that said band pass filter (3) is arranged on the optical path before the array spectrometer (2); or said band pass filter ( 3) Set inside the array spectrometer (2) and be part of the array spectrometer (2).
6. 如权利要求 1所述的一种光谱仪, 其特征在于, 包括控制各个阵列光谱仪 (3) 同步测量或积分的控制中心 (4), 所述的控制中心 (4)与各个阵列光谱仪 (2)均 电连接。  6. A spectrometer according to claim 1, comprising a control center (4) for controlling the simultaneous measurement or integration of the respective array spectrometers (3), said control center (4) and respective array spectrometers (2) ) All electrical connections.
7. 如权利要求 1 所述的一种光谱仪, 其特征在于, 所述的各个阵列光谱仪 (3) 的积分时间可独立设置或者根据入射光的强弱自动调节。  7. A spectrometer according to claim 1, characterized in that the integration time of the respective array spectrometers (3) can be set independently or automatically according to the intensity of the incident light.
8. 如权利要求 1所述的一种光谱仪, 其特征在于, 所述的光束分离器 (1)为分叉 光纤或者可获得多路光束的分光半透半反镜或者分光半透半反镜组。  8. A spectrometer according to claim 1, wherein said beam splitter (1) is a bifurcated optical fiber or a spectroscopic transflective or a spectroscopic half mirror that can obtain multiple beams. group.
9. 如权利要求 1所述的一种光谱仪, 其特征在于, 包括混光器 (6), 所述的混光 器 (6)设置在光束分离器 (1)的光输出端口 (1-2)之前的光路上,所述的混光器 (6) 为积分球或漫反射板或者漫透射板。 9. A spectrometer according to claim 1, comprising a light mixer (6), said light mixer (6) being arranged at a light output port of the beam splitter (1) (1-2) On the previous optical path, the light mixer (6) is an integrating sphere or a diffuse reflector or a diffuse transmission plate.
10. 如权利要求 4所述的一种光谱仪, 其特征在于, 包括机箱 (5), 所述的光束分 离器 (1)、 阵列光谱仪 (2)、 带通滤色片 (3)均设置在机箱 (5)内。 10. A spectrometer according to claim 4, comprising a chassis (5), said beam splitter (1), array spectrometer (2), band pass filter (3) are all disposed at Inside the chassis (5).
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