JPH0341326A - Spectrometry - Google Patents
SpectrometryInfo
- Publication number
- JPH0341326A JPH0341326A JP17751489A JP17751489A JPH0341326A JP H0341326 A JPH0341326 A JP H0341326A JP 17751489 A JP17751489 A JP 17751489A JP 17751489 A JP17751489 A JP 17751489A JP H0341326 A JPH0341326 A JP H0341326A
- Authority
- JP
- Japan
- Prior art keywords
- wavelength
- spectral
- light
- array
- dispersion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000004611 spectroscopical analysis Methods 0.000 title claims abstract description 8
- 230000003595 spectral effect Effects 0.000 claims abstract description 70
- 238000005259 measurement Methods 0.000 claims abstract description 37
- 239000006185 dispersion Substances 0.000 claims abstract description 31
- 238000001228 spectrum Methods 0.000 claims abstract description 11
- 230000007812 deficiency Effects 0.000 claims abstract description 7
- 238000005070 sampling Methods 0.000 claims description 16
- 230000003287 optical effect Effects 0.000 claims description 14
- 238000001514 detection method Methods 0.000 claims description 2
- 238000000691 measurement method Methods 0.000 claims 3
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 5
- 229910052753 mercury Inorganic materials 0.000 description 5
- 238000009877 rendering Methods 0.000 description 5
- 230000005540 biological transmission Effects 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- 239000003086 colorant Substances 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
Landscapes
- Spectrometry And Color Measurement (AREA)
Abstract
Description
【発明の詳細な説明】
産業上の利用分野
本発明（よ 光源からの光や物体の探射光などの分光分
布を測定するための分光測定装置に関するもので、光源
の光色 演色性を評価したり、物体色の測定などミ そ
のスペクトルに対する効果量の評価に使用するものであ
る。[Detailed Description of the Invention] Industrial Field of Application The present invention relates to a spectrometer for measuring the spectral distribution of light from a light source, detection light of an object, etc., and is used to evaluate the color rendering properties of the light source. It is used to evaluate the effect size on the spectrum of objects, such as measuring the color of objects.
従来の技術
光源のエネルギー量や光色 演色性を評価したり、物体
色の測定に分光測定を使用する場合、スペクトルの波長
分解能よりも測定におけるエネルギー積分の精度の向上
が重要となる。すなわち、波長分布の細部の形状より、
適当な波長区分に対する放射のエネルギー強度をいかに
正確にとらえるかが課題となる。これに（よ 使用する
分光器のスペクトル帯域半値幅と測定波長サンプリング
間隔を一致させることで実現される。従来の分散素子駆
動型モノクロメータで（よ たとえばプリズムモノクロ
メータでは分散曲線とと波長目盛りが一致するた取 機
械幅を等間隔送りで測定した このとき、短波長部分と
長波長部分で（よ 線令散の大きさがかなり異なるが、
隣合う測定波長位置での分散の差は大きな変化がない
ものとして行なった また分散素子駆動型の回折格子モ
ノクロメータで（よ サインバー機構の導入により、分
散曲線と波長目盛りは独立している。しかし回折格子モ
ノクロメータの分散（よ プリズムのそれに比べて直線
に近く、また 分光測定の途中で分散の変化に合わせて
スリット幅を機械的に修正することが難しいたム 分散
の変化を無視して分光測定をおこなってきた
先に述べた分散素子駆動型モノクロメータでは測定時間
がかかるた吹 社風 分光分散光学系と受光素子アレイ
を組み合せ、測定対象物からの光スペクトルを短時間に
測定する分光測定器が使用されるようになったが、 測
定サンプリング間隔に相当する受光素子の機械的間隔と
、分散とが独立しているたム 受光素子アレイの面上で
の分散の非直線性が大きく、スペクトル帯域半値幅と測
定波長サンプリング間隔が一致せず、先に述べた分散索
子駆動型モノクロメータに比べて測定誤差が大きいとい
う問題点があった
発明が解決しようとする課題
上記に述べたように 分光分散光学系と受光素子アレイ
を組み合せ、測定対象物からの光スペクトルを短時間に
測定する分光測定器では 測定ザンプリング間隔に相当
する受光素子の機械的間隔と、分光分散光学系の分散と
が独立している。このた数 受光素子アレイの面上での
分散の非直線性が大きく、スペクトル帯域半値幅と測定
波長サンプリング間隔が一致せず不整合が生じるたム光
源のエネルギー量や光色 演色性を評価したり、物体色
の測定に分光測定を使用する場合、誤差を生ずる。Conventional technology When using spectrometry to evaluate the energy content and color rendering properties of a light source or to measure the color of an object, it is more important to improve the accuracy of energy integration during measurement than the wavelength resolution of the spectrum. In other words, from the detailed shape of the wavelength distribution,
The challenge is how to accurately capture the energy intensity of radiation for appropriate wavelength divisions. This is achieved by matching the half-width of the spectral band of the spectrometer used with the measurement wavelength sampling interval.For example, with a conventional dispersive element-driven monochromator (for example, with a prism monochromator, the dispersion curve and wavelength scale are The width of the corresponding take-up machine was measured at equal intervals. At this time, the width of the horizontal line scattering was quite different between the short wavelength part and the long wavelength part.
This was done assuming that there was no significant change in the difference in dispersion between adjacent measurement wavelength positions.The dispersion curve and wavelength scale were independent due to the introduction of a sine bar mechanism. However, the dispersion of a diffraction grating monochromator (which is closer to a straight line than that of a prism), and it is difficult to mechanically adjust the slit width to match changes in dispersion during spectroscopic measurements, ignoring changes in dispersion. The previously mentioned dispersive element-driven monochromator, which has been used for spectroscopic measurements, takes a long time to measure.By combining a spectroscopic dispersive optical system and a photodetector array, spectroscopic measurements are used to quickly measure the light spectrum from an object to be measured. However, because the mechanical spacing of the light-receiving elements, which corresponds to the measurement sampling interval, and the dispersion are independent, the nonlinearity of the dispersion on the surface of the light-receiving element array is large; There was a problem in that the half-width of the spectral band did not match the measurement wavelength sampling interval, and the measurement error was larger than that of the dispersion rod-driven monochromator described above.Problems to be solved by the inventionAs stated above. In a spectrometer that combines a spectral dispersive optical system and a photodetector array to quickly measure the optical spectrum from an object to be measured, the mechanical spacing of the photodetector corresponding to the measurement sampling interval and the dispersion of the spectral dispersive optical system The dispersion on the surface of the photodetector array is highly nonlinear, and the half-width of the spectral band and the measurement wavelength sampling interval do not match, causing a mismatch. Color When spectroscopic measurements are used to evaluate color rendering properties or measure object colors, errors occur.
いま、モノクロメータのスペクトル帯域特性の波長半値
幅を５ｎｍに設定し 波長５４６． ｌｎｍの水銀輝線
を測定した場合を考える。 モノクロメータの波長を
５４５ｎｍおよび５５０ｎｍに設定したとき、そのスペ
クトル帯域特性は第１図のようになる。水銀輝線のエネ
ルギーをＰ ＝ １００ｍＷ−ｍ−２としたとき、設定
波長が５４５ｎｍおよび５５０ｎｍのときの測定値（上
（１）、（２）式よりもとめられる。Now, the wavelength half width of the monochromator's spectral band characteristic is set to 5 nm, and the wavelength is 546. Consider the case where a 1 nm mercury emission line is measured. When the wavelength of the monochromator is set to 545 nm and 550 nm, the spectral band characteristics are as shown in FIG. When the energy of the mercury emission line is P = 100 mW-m-2, the measured values when the set wavelengths are 545 nm and 550 nm (obtained from equations (1) and (2) above).
（１）
、 、、 （２）
逆に このときの測定値Ｐ（５４５）、Ｐ （５５０）
から区分求積によりＰを求めると
Ｐ＝Ｐ（５４５）＋Ｐ（５５０）＝ １００ ［ｍ
Ｗ ＋＋ｒ” ］、、 （３）
となる。すなわち、モノクロメータのスペクトル帯域特
性が理想的な二等辺三角形であれば スペクトル帯域特
性の波長半値幅と測定における波長ザンプリング間隔を
一致させることにより、先に示した電価積分を精度よく
行なうことができる。(1) , , , (2) Conversely, the measured values at this time are P (545) and P (550)
Find P by piecewise quadrature from P = P (545) + P (550) = 100 [m
W ++r”],, (3) In other words, if the spectral band characteristics of the monochromator are an ideal isosceles triangle, then by matching the wavelength half-width of the spectral band characteristics with the wavelength sampling interval in the measurement, The electric charge integral shown in can be performed with high accuracy.
これに対し スペクトル帯域特性の波長半値幅と測定に
おける波長サンプリング間隔が一致しない場合を考える
。上記の例で、波長サンプリング間隔５ｎｍ、入射スリ
ット波長幅５ｎｍ、 に対して出側スリット波長幅を
７ｎｍに設定すると、モノクロメータのスペクトル帯域
特性は第２図に示す様に帯域半値幅９ｎｍの台形となる
。 （図の放射照度の目盛り（よ この台形のスペクト
ル帯域特性と、先に示した理想的な二等辺三角形を威す
スペクトル帯域特性の面積が等しくなるよう正規化した
ものである。On the other hand, consider the case where the wavelength half-width of the spectral band characteristic and the wavelength sampling interval in measurement do not match. In the above example, if the wavelength sampling interval is 5 nm, the input slit wavelength width is 5 nm, and the output slit wavelength width is set to 7 nm, the spectral band characteristics of the monochromator will be a trapezoid with a half-width of 9 nm as shown in Figure 2. becomes. (The irradiance scale in the figure is normalized so that the area of this trapezoidal spectral band characteristic and the spectral band characteristic of the ideal isosceles triangle shown earlier is equal.
）このとき、放射照度１００ｍＷ・ｍ”２の波長５４６
．１ｎｍ水銀輝線の測定値（よ 設定波長が５４５ｎｍ
および５５０ｎｍにおいて、それぞれ９７ｍＷ−ｍ−２
と４２ｍＷ−ｍ−２で、水銀輝線の放射照度測定値が１
３９＋ｎＬｍ−２となり真値に対して３９％の誤差を生
じる。) At this time, the wavelength 546 with an irradiance of 100 mW m"2
．． Measured value of 1 nm mercury emission line (set wavelength is 545 nm)
and 97 mW-m-2 at 550 nm, respectively.
and 42 mW-m-2, the measured irradiance of the mercury emission line is 1
39+nLm-2, resulting in an error of 39% from the true value.
本発明は 分光分散光学系と受光素子アレイを組み合せ
た分光測定器のスペクトル帯域半値幅と測定波長サンプ
リング間隔との不整合によって生じる測定誤差を無くし
分光測定を行なう波長範囲の全域のどの部分でＬ 分
光的情報（データ）の過不足が生じないようにし 測定
精度を向上させることを課題としｔも
課題を解決するための手段
上記の問題点を解決するための手段について示す。分光
分散光学系と受光素子アレイを組み合せ、測定対象物か
らの光スペクトルを測定する分光測定器において、それ
ぞれの受光素子と分散素子との組合わせによる分光応答
度特性と、隣接する受光素子と分散素子との組合わせに
よる分光応答度特性を台底した分光応答特性 不連続に
ならずに互いに隣接する分光応答特性の重心波長を結ぶ
連続した滑らかな曲線になるような位置になるように
受光素子アレイを分散方向に移動する。このとき、その
受光素子の出力を検出する。受光素子アレイを移動しな
がら、上記の条件を満足した位置の受光素子の出力を検
出していき、分光測定を行なう波長範囲の全域にわたっ
て測定されたとき、波長範囲のどの部分で転 スペクト
ル帯域半値幅と測定波長ザンプリング間隔を一致させる
ことができ、測定精度を向上させ、分光的情報（データ
）の過不足が生じないようにした分光測定が実現できる
。The present invention eliminates measurement errors caused by a mismatch between the spectral band half-width of a spectrometer that combines a spectral dispersion optical system and a photodetector array and the measurement wavelength sampling interval. The objective is to prevent excess or deficiency of spectral information (data) and to improve measurement accuracy.Means for solving the problemMeans for solving the above-mentioned problems will be described. In a spectrometer that combines a spectral dispersive optical system and a photodetector array to measure the light spectrum from an object to be measured, the spectral responsivity characteristics of each photodetector and dispersive element combination, and the dispersion and dispersion of adjacent photodetectors Spectral response characteristics with the bottom of the spectral response characteristics due to the combination with the element.The position should be such that it forms a continuous smooth curve that connects the center wavelengths of adjacent spectral response characteristics without being discontinuous.
The light receiving element array is moved in the dispersion direction. At this time, the output of the light receiving element is detected. While moving the photodetector array, the output of the photodetector at a position that satisfies the above conditions is detected, and when the measurement is performed over the entire wavelength range for spectroscopic measurement, it is determined at which part of the wavelength range the spectral band half is shifted. The value width and measurement wavelength sampling interval can be matched, measurement accuracy can be improved, and spectroscopic measurement can be realized without excess or deficiency of spectral information (data).
作用
上記の手段によって、分光分散光学系と受光素子アレイ
を組み合せ、測定対象物からの光スペクトルを短時間に
測定する分光測定器において、受光素子アレイの面上で
の分散の非直線性が大きい場合、測定しようとする波長
範囲のどの部分でも、スペクトル帯域半値幅と測定波長
サンプリング間隔を一致させることができ、分光的情報
（データ）の過不足が生じないようにした分光測定が実
現できる。このたム 光源のエネルギー量や光色 演色
性を評価したり、物体色の測定に分光測定を使用する場
合、精度の高い測定が可能となる。Effect In a spectrometer that combines a spectral dispersion optical system and a light-receiving element array to measure the light spectrum from an object to be measured in a short time using the above means, the non-linearity of dispersion on the surface of the light-receiving element array is large. In this case, the spectral band half-width and measurement wavelength sampling interval can be made to match in any part of the wavelength range to be measured, and spectroscopic measurements can be realized without excess or deficiency of spectroscopic information (data). When using spectrometry to evaluate the energy content and color rendering properties of a light source, or to measure the color of an object, highly accurate measurements are possible.
実施例
本発明の一実施例を図面を使って説明する。第３図に
本発明の一実施例である連続干渉フィルタ（フィルター
の一方向に対して、透過帯域スペクトルの重心波長力文
連続的に変化する狭帯域透Ｑ−
過干渉フイルター）とフォトダイオードアレイを使用し
たものに関して、それを使用して光源の分光分布を測定
する場合について示す。図において１は測定しようとす
る光源である。光源１からの光束を、連続干渉フィルタ
２に導き、空間的に波長分離した光をフォトダイオード
アレイ３で検出する。前記フォトダイオードアレイ３（
よ モータ４で、前記連続干渉フィルタ２の分光分散方
向に前記フォトダイオードアレイ３を移動する。これに
よって、前記フォトダイオードアレイ３を構成する個々
の受光素子の分光応答度（よ その前面に位置する前記
連続干渉フィルタ２Ｑ その受光素子の位置における分
光透過率によって補正され前記連続干渉フィルタ２の分
光分散方向に前記フォトダイオードアレイ３を移動する
ことにより、個々の受光素子の干渉フィルタによって補
正された分光応答度の重心波長を、変化させる。フォト
ダイオードアレイ３の各素子の出力は データ処理部５
に送られる。前記データ処理部５（戴 モータ制御部６
から前記フォトダイオードアレイ３を０−
移動位置の信号を受は取り、前記フォトダイオドアレイ
３を構成する個々の受光素子と前記連続干渉フィルタ２
との組合わせによる分光応答度特性と、隣接する受光素
子と前記連続干渉フィルタ２との組合わせによる分光応
答特性力交 不連続にならずに 互いに隣接する分光応
答特性の重心波長を結ぶ連続した滑らかな曲線になるよ
うな移動位置で、それぞれの受光素子の出力を検出する
。Embodiment An embodiment of the present invention will be described with reference to the drawings. In Figure 3
An embodiment of the present invention that uses a continuous interference filter (a narrowband transmission Q-over interference filter whose center wavelength of the transmission band spectrum changes continuously in one direction of the filter) and a photodiode array. The case of using it to measure the spectral distribution of a light source will be described. In the figure, 1 is the light source to be measured. A light beam from a light source 1 is guided to a continuous interference filter 2, and the spatially wavelength-separated light is detected by a photodiode array 3. The photodiode array 3 (
A motor 4 moves the photodiode array 3 in the spectral dispersion direction of the continuous interference filter 2. As a result, the spectral responsivity of each light receiving element constituting the photodiode array 3 (the continuous interference filter 2Q located in front of the spectral transmittance at the position of the light receiving element) is corrected, and the spectral response of the continuous interference filter 2 is corrected by the spectral transmittance at the position of the light receiving element. By moving the photodiode array 3 in the dispersion direction, the center wavelength of the spectral responsivity corrected by the interference filter of each light receiving element is changed.The output of each element of the photodiode array 3 is
sent to. The data processing section 5 (the motor control section 6
The photodiode array 3 receives and receives the signal of the moving position from 0- to the individual light receiving elements constituting the photodiode array 3 and the continuous interference filter 2.
spectral response characteristics in combination with the continuous interference filter 2 and the spectral response characteristics in combination with the adjacent light receiving elements and the continuous interference filter 2. The output of each light receiving element is detected at a moving position that forms a smooth curve.
第４図に前記連続干渉フィルタ２の分散方向の機械的な
位置と分光透過特性の重心波長の関係を示す。波長（よ
短波長短からの距離に比例している。一方、それぞれ
の波長位置におけるそれぞれの受光素子の分光応答度の
スペクトル帯域半値幅（よ 第５図に示すとおり、波長
に大きく依存する。FIG. 4 shows the relationship between the mechanical position of the continuous interference filter 2 in the dispersion direction and the centroid wavelength of the spectral transmission characteristics. On the other hand, the spectral band half-width of the spectral responsivity of each light-receiving element at each wavelength position is largely dependent on the wavelength, as shown in Figure 5.
したがって、それぞれの受光素子の分光応答度の重心波
長と、隣接する受光素子の出力検出を行なう時の分光応
答度の重心波長との波長的距離が、その波長におけ衣
分散光学系によって決定される波長帯域半値幅また（戴
その整数分の１となる位置で、その受光素子の出力を
検出し 波長帯域１
半値幅また（よ その整数分の１と、波長サンプリング
間隔が等しい分光測定データを得る。Therefore, the wavelength distance between the centroid wavelength of the spectral responsivity of each light-receiving element and the centroid wavelength of the spectral responsivity when detecting the output of the adjacent light-receiving element varies at that wavelength.
The output of the light-receiving element is detected at a position that is an integer fraction of the wavelength band half width determined by the dispersive optical system. obtain equal spectroscopic data.
発明の効果
以上述べてきたように 本発明の構成によって、分光分
散光学系と受光素子アレイを組み合せ、測定対象物から
の光スペクトルを短時間に測定する分光測定器において
、受光素子アレイの面上での分散の非直線性が大きい場
合、測定しようとする波長範囲のどの部分でｋ スペク
トル帯域半値幅と測定波長サンプリング間隔を一致させ
ることができ、分光的情報（データ）の過不足が生じな
いようにした分光測定が実現できる。このた歇 光源の
エネルギー量や光色 演色性を評価したり、物体色の測
定に分光測定を使用する場合、精度の高い測定が可能と
なる。Effects of the Invention As described above, with the configuration of the present invention, in a spectrometer that combines a spectral dispersion optical system and a light receiving element array to measure the light spectrum from an object to be measured in a short time, If the nonlinearity of the dispersion is large, the half-width of the k spectral band and the measurement wavelength sampling interval can be made to match in any part of the wavelength range to be measured, and there will be no excess or deficiency of spectral information (data). Spectroscopic measurements can be realized in this manner. When using spectrometry to evaluate the energy content and color rendering properties of a light source, or to measure the color of an object, highly accurate measurements are possible.
第１図は モノクロメータのスペクトル帯域特性の波長
半値幅を５ｎｍに設定し 波長５４６．１ｎｍの水銀輝
線を測定した場合、モノクロメータの波長を５４５ｎｍ
および５５０ｎｍに設定したときへ スペクトル２−
帯域特性、すなわちスペクトル帯域半値幅と測定波長サ
ンプリング間隔の整合がとれている場合のスペクトル帯
域特性阻 第２図（上 波長サンプリング間隔５０ｍ、
入射スリット波長幅５ｒ＋＋ｎ、 に対して出射スリ
ット波長幅を９ｎｍに設定した場合のモノクロメータの
スペクトル帯域特性、すなわちスペクトル帯域半値幅と
測定波長サンプリング間隔の整合がとれない場合のスペ
クトル帯域特性は 第３図は 本発明の一実施例である
連続干渉フィルタとフォトダイオードアレイを使用した
装置の構成図である。また 第４図に前記連続干渉フィ
ルタ２の分散方向の機械的な位置と分光透過特性の重心
波長の関係を、第５図に受光素子の分光応答度のスペク
トル帯域半値幅の波長に対する特性図を示す。
１３１．光温２．．．連続干渉フィル久 フォトダイオ
ードアレイ、４１１．モー久 ５９９．データ処理敵６
１０．モータ制御訛Figure 1 shows that when the wavelength half width of the monochromator's spectral band characteristics is set to 5 nm and a mercury emission line with a wavelength of 546.1 nm is measured, the monochromator's wavelength is set to 545 nm.
and when set to 550 nm. Spectrum 2 - Spectral band characteristics, that is, the spectral band characteristics when the half-width of the spectral band and the measurement wavelength sampling interval are matched.
The spectral band characteristics of the monochromator when the input slit wavelength width is 5r++n and the output slit wavelength width is set to 9 nm, that is, the spectral band characteristics when the spectral band half width and the measurement wavelength sampling interval cannot be matched are as follows. The figure is a configuration diagram of a device using a continuous interference filter and a photodiode array, which is an embodiment of the present invention. Furthermore, Fig. 4 shows the relationship between the mechanical position of the continuous interference filter 2 in the dispersion direction and the centroid wavelength of the spectral transmission characteristics, and Fig. 5 shows the characteristic diagram of the spectral responsivity of the light receiving element with respect to the wavelength of the spectral band half width. show. 131. Light temperature 2. ．． ．． Continuous interference filter photodiode array, 411. Mokyu 599. Data processing enemy 6
10. motor control accent
Claims (3)
定対象物からの光スペクトルを測定する分光測定器にお
いて、前記受光素子アレイを構成する個々の受光素子と
前記分散素子との組合わせによる分光応答度特性と、隣
接する受光素子と分散素子との組合わせによる分光応答
度特性が、不連続にならずに、互いに隣接する分光応答
特性の重心波長を結ぶ連続した滑らかな曲線になるよう
な移動位置で、それぞれの受光素子の出力を検出し、分
光測定を行なう波長範囲の全域のどの部分でも、分光的
情報の過不足が生じないようにした分光測定方法および
測定装置。(1) In a spectrometer that combines a spectral dispersive optical system and a photodetector array to measure the light spectrum from an object to be measured, spectroscopy is performed by the combination of the individual photodetectors constituting the photodetector array and the dispersive element. The responsivity characteristics and the spectral responsivity characteristics resulting from the combination of adjacent light-receiving elements and dispersion elements do not become discontinuous, but form a continuous, smooth curve that connects the centroid wavelengths of adjacent spectral response characteristics. A spectroscopic measurement method and a measuring device that detect the output of each light receiving element at a moving position and prevent excess or deficiency of spectral information from occurring in any part of the entire wavelength range in which spectroscopic measurements are performed.
受光素子アレイをそのアレイ間隔以内の距離だけ移動し
、前記受光素子アレイのそれぞれの受光素子の分光応答
度の重心波長と隣接する受光素子の出力検出を行なう時
の分光応答度の重心波長との波長的距離が、その波長に
おける前記分散光学系によって決定される波長帯域半値
幅、またはその整数分の１となる位置で、その受光素子
の出力を検出し、波長帯域半値幅、またはその整数分の
１と波長サンプリング間隔が等しい分光測定データを得
ることを特徴とする分光測定方法および測定装置。(2) In claim 1, the light-receiving element array is moved in the dispersion direction of the spectral dispersion optical system by a distance within the array spacing, and the light receiving element array is moved at a distance within the array spacing, and the light is received adjacent to the centroid wavelength of the spectral responsivity of each of the light-receiving elements of the light-receiving element array. The light is received at a position where the wavelength distance from the centroid wavelength of the spectral responsivity when detecting the output of the element is the half width of the wavelength band determined by the dispersion optical system at that wavelength, or an integer fraction thereof. A spectroscopic measurement method and a measuring device, characterized in that the output of an element is detected and spectroscopic measurement data having a wavelength sampling interval equal to the wavelength band half width or an integer fraction thereof is obtained.
分光分散素子をそのアレイ間隔以内の距離だけ移動し、
前記受光素子アレイのそれぞれの受光素子の分光応答度
の重心波長と隣接する受光素子の出力検出を行なう時の
分光応答度の重心波長との波長的距離が、その波長にお
ける前記分散光学系によって決定される波長帯域半値幅
、またはその整数分の１となる位置で、その受光素子の
出力を検出し、波長帯域半値幅、またはその整数分の１
と波長サンプリング間隔が等しい分光測定データを得る
分光測定方法および測定装置。(3) In claim 1, the spectrally dispersive element is moved in the dispersion direction of the spectrally dispersive optical system by a distance within the array interval,
The wavelength distance between the centroid wavelength of the spectral responsivity of each photodetector of the photodetector array and the centroid wavelength of the spectral responsivity when output detection of an adjacent photodetector is performed is determined by the dispersive optical system at that wavelength. The output of the light-receiving element is detected at a position that is the half-width of the wavelength band at half maximum, or an integer fraction thereof, and
Spectroscopic measurement method and measurement device for obtaining spectroscopic measurement data with equal wavelength sampling intervals.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1177514A JPH0789084B2 (en) | 1989-07-10 | 1989-07-10 | Spectroscopic measurement method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1177514A JPH0789084B2 (en) | 1989-07-10 | 1989-07-10 | Spectroscopic measurement method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0341326A true JPH0341326A (en) | 1991-02-21 |
| JPH0789084B2 JPH0789084B2 (en) | 1995-09-27 |
Family
ID=16032241
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1177514A Expired - Lifetime JPH0789084B2 (en) | 1989-07-10 | 1989-07-10 | Spectroscopic measurement method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0789084B2 (en) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5200913A (en) * | 1990-05-04 | 1993-04-06 | Grid Systems, Inc. | Combination laptop and pad computer |
| JPH05107114A (en) * | 1991-10-16 | 1993-04-27 | Nec Corp | Observed wavelength band variable type electronic scanning radiometer |
| US5333116A (en) * | 1990-05-04 | 1994-07-26 | Ast Research, Inc. | Combination laptop and pad computer |
| JPH0843206A (en) * | 1994-05-19 | 1996-02-16 | Schablonentechnik Kufstein Ag | Chromaticity detector of luminous flux |
| US6005767A (en) * | 1997-11-14 | 1999-12-21 | Vadem | Portable computer having articulated display |
| WO2001001070A1 (en) * | 1999-06-29 | 2001-01-04 | Omron Corporation | Light source device, spectroscope comprising the light source device, and film thickness sensor |
| US6266236B1 (en) | 1997-08-27 | 2001-07-24 | Vadem | Apparatus and method for connecting and articulating display in a portable computer having multiple display orientations |
| USRE39429E1 (en) * | 1990-05-04 | 2006-12-12 | Samsung Electronics Co., Ltd. | Combination laptop and pad computer |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57168028U (en) * | 1981-04-17 | 1982-10-22 |
-
1989
- 1989-07-10 JP JP1177514A patent/JPH0789084B2/en not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57168028U (en) * | 1981-04-17 | 1982-10-22 |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5200913A (en) * | 1990-05-04 | 1993-04-06 | Grid Systems, Inc. | Combination laptop and pad computer |
| US5333116A (en) * | 1990-05-04 | 1994-07-26 | Ast Research, Inc. | Combination laptop and pad computer |
| US6219681B1 (en) | 1990-05-04 | 2001-04-17 | Ast Research, Inc. | Combination laptop and pad computer |
| US6366935B2 (en) | 1990-05-04 | 2002-04-02 | Ast Research, Inc. | Combination laptop and pad computer |
| USRE39429E1 (en) * | 1990-05-04 | 2006-12-12 | Samsung Electronics Co., Ltd. | Combination laptop and pad computer |
| JPH05107114A (en) * | 1991-10-16 | 1993-04-27 | Nec Corp | Observed wavelength band variable type electronic scanning radiometer |
| JPH0843206A (en) * | 1994-05-19 | 1996-02-16 | Schablonentechnik Kufstein Ag | Chromaticity detector of luminous flux |
| US6266236B1 (en) | 1997-08-27 | 2001-07-24 | Vadem | Apparatus and method for connecting and articulating display in a portable computer having multiple display orientations |
| US6005767A (en) * | 1997-11-14 | 1999-12-21 | Vadem | Portable computer having articulated display |
| WO2001001070A1 (en) * | 1999-06-29 | 2001-01-04 | Omron Corporation | Light source device, spectroscope comprising the light source device, and film thickness sensor |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0789084B2 (en) | 1995-09-27 |
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