WO2014103865A1 - Inspection chip, and inspection system - Google Patents
Inspection chip, and inspection system Download PDFInfo
- Publication number
- WO2014103865A1 WO2014103865A1 PCT/JP2013/084056 JP2013084056W WO2014103865A1 WO 2014103865 A1 WO2014103865 A1 WO 2014103865A1 JP 2013084056 W JP2013084056 W JP 2013084056W WO 2014103865 A1 WO2014103865 A1 WO 2014103865A1
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- WO
- WIPO (PCT)
- Prior art keywords
- wall surface
- unit
- component
- quantification
- guide
- Prior art date
Links
- 238000007689 inspection Methods 0.000 title claims abstract description 151
- 239000003153 chemical reaction reagent Substances 0.000 claims description 118
- 238000011002 quantification Methods 0.000 claims description 95
- 238000012360 testing method Methods 0.000 claims description 60
- 230000005484 gravity Effects 0.000 claims description 10
- 238000000926 separation method Methods 0.000 claims description 9
- 238000012423 maintenance Methods 0.000 claims description 2
- 238000005119 centrifugation Methods 0.000 abstract description 6
- 238000005259 measurement Methods 0.000 description 41
- 238000002347 injection Methods 0.000 description 40
- 239000007924 injection Substances 0.000 description 40
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- 238000000034 method Methods 0.000 description 17
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- 230000007246 mechanism Effects 0.000 description 7
- 210000000601 blood cell Anatomy 0.000 description 5
- 238000012207 quantitative assay Methods 0.000 description 5
- 239000000758 substrate Substances 0.000 description 5
- 239000000126 substance Substances 0.000 description 3
- 230000008859 change Effects 0.000 description 2
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- 239000012530 fluid Substances 0.000 description 2
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- 239000011259 mixed solution Substances 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
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- 238000004891 communication Methods 0.000 description 1
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- 210000000981 epithelium Anatomy 0.000 description 1
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- 239000002184 metal Substances 0.000 description 1
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- 210000003296 saliva Anatomy 0.000 description 1
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Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
- G01N35/04—Details of the conveyor system
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
- B01L3/00—Containers or dishes for laboratory use, e.g. laboratory glassware; Droppers
- B01L3/50—Containers for the purpose of retaining a material to be analysed, e.g. test tubes
- B01L3/502—Containers for the purpose of retaining a material to be analysed, e.g. test tubes with fluid transport, e.g. in multi-compartment structures
- B01L3/5027—Containers for the purpose of retaining a material to be analysed, e.g. test tubes with fluid transport, e.g. in multi-compartment structures by integrated microfluidic structures, i.e. dimensions of channels and chambers are such that surface tension forces are important, e.g. lab-on-a-chip
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/04—Investigating sedimentation of particle suspensions
- G01N15/042—Investigating sedimentation of particle suspensions by centrifuging and investigating centrifugates
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
- B01L2200/00—Solutions for specific problems relating to chemical or physical laboratory apparatus
- B01L2200/06—Fluid handling related problems
- B01L2200/0605—Metering of fluids
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
- B01L2200/00—Solutions for specific problems relating to chemical or physical laboratory apparatus
- B01L2200/06—Fluid handling related problems
- B01L2200/0621—Control of the sequence of chambers filled or emptied
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
- B01L2300/00—Additional constructional details
- B01L2300/08—Geometry, shape and general structure
- B01L2300/0809—Geometry, shape and general structure rectangular shaped
- B01L2300/0816—Cards, e.g. flat sample carriers usually with flow in two horizontal directions
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
- B01L2400/00—Moving or stopping fluids
- B01L2400/04—Moving fluids with specific forces or mechanical means
- B01L2400/0403—Moving fluids with specific forces or mechanical means specific forces
- B01L2400/0409—Moving fluids with specific forces or mechanical means specific forces centrifugal forces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
- G01N35/04—Details of the conveyor system
- G01N2035/0439—Rotary sample carriers, i.e. carousels
- G01N2035/0446—Combinations of the above
- G01N2035/0449—Combinations of the above using centrifugal transport of liquid
Definitions
- the present disclosure relates to an inspection chip and an inspection system for performing a chemical, medical, or biological inspection of an inspection object.
- an inspection chip for inspecting a specimen such as a biological substance or a chemical substance
- an inspection chip disclosed as a microchip in Patent Document 1 is formed by bonding a first substrate and a second substrate.
- a groove is formed on the surface of the first substrate, and a fluid circuit is formed from the groove and the first substrate side surface of the second substrate.
- the fluid circuit includes a centrifuge for separating the specimen into a first component and a second component having a specific gravity greater than that of the first component by centrifugation.
- a centrifugal force is applied to the centrifuge in the first direction, whereby blood as a sample is introduced into the centrifuge and a predetermined amount of blood is quantified.
- a centrifugal force is applied to the centrifuge in the first direction, so that blood is separated into plasma as the first component and blood cells as the second component. Thereafter, a centrifugal force is applied to the centrifuge in the second direction, whereby a part of the centrifuged plasma is taken out from the centrifuge.
- the amount of plasma to be taken out is a value obtained by subtracting the amount of residue from the amount of blood injected into the centrifuge and quantified.
- the amount of the residue is an amount quantified by a quantitative surface for quantifying the residue other than plasma taken out in the centrifugal separator.
- the quantitative surface for quantifying the residue and the wall surface of the centrifuge holding the discharged plasma are substantially V-shaped. For this reason, the liquid surface of the fixed surface adheres to the adjacent wall surface due to surface tension. Thus, the amount of plasma removed is reduced. Therefore, there is a problem that the quantitative accuracy at the time of taking out the plasma is lowered. In addition, if the quantification is performed after the plasma is taken out in order to improve the quantification accuracy of the plasma, there is a problem that a quantification unit different from the centrifugal separation unit is required and the inspection chip becomes large.
- An object of the present disclosure is to provide a test chip and a test system that can improve the quantification accuracy of a test target component centrifuged from a specimen and can reduce the size of the test chip without providing a quantification unit separately from the centrifuge unit. It is to be.
- the test chip includes a separation unit that quantifies an injected sample and separates a first component contained in the sample and a second component having a specific gravity greater than that of the first component.
- a quantification unit that also serves as a supply guide unit that injects the sample into the quantification unit, a first guide unit that moves the first component separated in the quantification unit, and a surplus unit that accommodates the sample overflowing from the quantification unit
- a second guide unit connected from the quantification unit to the surplus unit, and a mixing unit in which the first component moved from the quantification unit via the first guide unit and the reagent are mixed
- the quantitative portion includes a first connection portion connected to the first guide portion, a second connection portion connected to the second guide portion, a first wall surface connected to the first connection portion, and the first Connected to the second wall facing the wall, the end of the second wall and the second connection
- the recess includes a third wall surface constituting the recess, a third connection portion to which the third wall surface and the second wall surface are connected
- the third wall surface intersects the sixth wall surface that is the wall surface of the first guide portion, and the third wall surface is closer to the second guide portion side than the second virtual surface connecting the first connection portion and the third connection portion.
- the angle on the second connecting portion side is greater than 180 degrees.
- the first virtual surface extending the fifth wall surface intersects the sixth wall surface that is the wall surface of the first guide portion. Therefore, the sixth wall surface relative to the surface extending the virtual surface connecting the first connection portion and the second connection portion from the inclination angle of the fifth wall surface relative to the surface extending the virtual surface connecting the first connection portion and the second connection portion.
- the third wall surface is closer to the second guide portion than the second virtual surface connecting the first connection portion and the third connection portion, so that the third wall surface and the fourth wall surface are close to the second virtual surface. Therefore, it can reduce that a 1st component adheres to a 3rd wall surface and a 4th wall surface by surface tension. Therefore, the quantitative accuracy at the time of taking out the first component is improved.
- the quantitative unit also serves as the separation unit, the inspection chip can be miniaturized.
- the angle on the second connecting portion side is larger than 180 degrees among the angles formed by the second virtual surface and the sixth wall surface, the first component quantified on the second virtual surface is the first component. It can be made to flow into the guide part side.
- the angle on the second guide portion side may be 90 degrees or more.
- the angle on the second guide portion side is 90 degrees or more among the angles formed by the third virtual surface and the fourth wall surface. It is possible to prevent the air bubbles from being easily collected and to prevent the air bubbles from being accumulated in the concave portion. Therefore, the quantitative accuracy in the quantitative unit is further improved.
- the imaginary line drawn from the end portion on the first guide portion side of the supply guide portion in the direction perpendicular to the wall surface on the supply guide portion side of the wall surface on which the first guide portion is formed is the quantification portion You may cross the bottom of the.
- the imaginary line drawn from the end portion on the first guide portion side of the supply guide portion in the direction perpendicular to the wall surface on the supply guide portion side of the wall surface on which the first guide portion is formed Since it intersects the bottom surface of the quantification unit, it is possible to prevent the specimen injected into the quantification unit from hitting the concave portion and flowing to the second guide unit. Therefore, the sample quantification accuracy can be improved in the quantification unit without running out of samples.
- a residue holding unit that is connected to the first wall surface by a connection channel and holds the residue of the quantification unit may be provided.
- the residue remaining in the quantification unit is retained in the residue retention unit, so that after the quantified first component has moved to the first guide unit, the residue flows out from the quantification unit to the first guide unit. Can be prevented. Therefore, the inspection accuracy can be improved.
- connection channel intersects the extending direction of the second imaginary surface
- fourth imaginary surface extending in parallel with the second imaginary surface from the inlet of the connection channel is the residue You may cross
- the test system includes a test chip for quantifying and mixing a specimen or a reagent, and causing the test chip to revolve around a predetermined first axis to apply a centrifugal force to the test chip.
- an inspection system configured to change the direction of the centrifugal force by rotating the inspection chip around a second axis different from the first axis, the inspection chip being an injection
- a quantification unit that also serves as a separation unit for separating a first component contained in the sample and a second component having a specific gravity greater than that of the first component, and the sample in the quantification unit
- Second A first connection that connects the first guide unit with the interior, and a mixing unit that mixes the first component moved from the quantification unit via the first guide unit and the reagent.
- a second connection portion connected to the second guide portion, a first wall surface connected to the first connection portion, a second wall surface facing the first wall surface, and an end of the second wall surface And a recess connected to the second connection portion, the recess via a third connection portion to which the third wall surface and the second wall surface are connected, the third wall surface and the fourth connection portion.
- a first virtual surface extending from a fifth wall surface, which is a wall surface of the second guide portion connected to the second connection portion, is connected to the first connection portion.
- Crossing the sixth wall surface, which is the wall surface of the first guide portion, the third wall surface is a second virtual surface connecting the first connection portion and the third connection portion. Is also present on the second guide part side, and the angle on the second connection part side is formed larger than 180 degrees among the angles formed by the second virtual surface and the sixth wall surface,
- a rotation control means for controlling the rotation and a revolution control means for controlling the revolution wherein the rotation control means injects the specimen from the supply guide section into the quantification section by a centrifugal force generated by the revolution.
- the specimen is quantified on the first quantitative surface connecting the first connection part and the second connection part in the quantification part by the first step of rotating the test chip in the direction to be moved and the centrifugal force.
- the first component is quantified in the second imaginary plane in the quantification unit, and the fourth step of rotating the inspection chip in the direction in which the quantified first component flows into the first guide unit, It is characterized by executing at least.
- the inspection system having the above configuration, when the specimen is injected into the quantification unit by applying centrifugal force to the inspection chip in the first step, the surplus part does not leak over the sixth wall surface to the first guide part side. Can flow into The third wall surface is closer to the second guide portion than the second virtual surface connecting the first connection portion and the third connection portion, so that the third wall surface and the fourth wall surface are close to the second virtual surface.
- the fourth step it is possible to reduce adhesion of the first component to the third wall surface and the fourth wall surface due to surface tension. Therefore, the quantitative accuracy when the first component flows out from the quantitative unit is improved.
- the revolution control means may make the revolution speed in the third step higher than that in the second step.
- the revolution speed is increased as compared with the second step, so that the centrifugation can be performed in a short time.
- FIG. It is a figure which shows the structure of the test
- FIG. It is a front view before applying centrifugal force to the test
- FIG. 1 shows a plane of the inspection apparatus 1 constituting the inspection system 3 and functional blocks inside the control apparatus 90.
- the inspection system 3 of the present embodiment includes an inspection chip 2 that can store a sample and a reagent that are liquids, and an inspection apparatus 1 that performs an inspection using the inspection chip 2.
- the inspection device 1 rotates the inspection chip 2 around the vertical axis A ⁇ b> 1 separated from the inspection chip 2, centrifugal force acts on the inspection chip 2.
- the inspection apparatus 1 rotates the inspection chip 2 around the horizontal axis A2
- the centrifugal direction which is the direction of the centrifugal force acting on the inspection chip 2 is switched.
- the inspection system 3 and the inspection apparatus 1 of the present embodiment have a known structure as described in Japanese Patent Application Laid-Open No. 2012-78107. Therefore, in the following description, an outline of the structure of the inspection apparatus 1 will be described.
- FIG. 1 shows a state where the top plate of the upper housing 30 of the inspection apparatus 1 is removed.
- the inspection apparatus 1 includes an upper housing 30, a lower housing 31, an upper plate 32, a turntable 33, an angle changing mechanism 34, and a control device 90.
- the turntable 33 is a disk rotatably provided on the upper side of an upper plate 32 described later.
- the inspection chip 2 is held above the turntable 33.
- the angle changing mechanism 34 is a drive mechanism provided on the turntable 33.
- the angle changing mechanism 34 rotates the inspection chip 2 around the horizontal axis A2.
- the upper housing 30 is fixed to an upper plate 32 described later, and a measurement unit 7 that performs optical measurement on the inspection chip 2 is provided inside.
- the control device 90 is a controller that controls various processes of the inspection device 1.
- the schematic structure of the lower housing 31 will be described.
- the lower housing 31 has a box-shaped frame structure in which frame members are combined.
- An upper plate 32 that is a rectangular plate material is provided on the upper surface of the lower housing 31.
- a drive mechanism that rotates the turntable 33 around the vertical axis A1 is provided in the lower housing 31 as follows.
- a spindle motor 35 that supplies a driving force for rotating the turntable 33 is installed on the left side of the lower housing 31.
- a shaft 36 of the main shaft motor 35 protrudes upward, and a pulley 37 is fixed.
- a vertical main shaft 57 extending upward from the inside of the lower housing 31 is provided at the center of the lower housing 31.
- the main shaft 57 passes through the upper plate 32 and protrudes above the lower housing 31.
- the upper end portion of the main shaft 57 is connected to the center portion of the turntable 33.
- the main shaft 57 is rotatably held by a support member (not shown) provided immediately below the upper plate 32.
- a pulley 38 is fixed to the main shaft 57 below the support member.
- a belt 39 is stretched over the pulley 37 and the pulley 38.
- a guide rail (not shown) extending in the vertical direction inside the lower housing 31 is provided on the right side in the lower housing 31.
- a T-shaped plate (not shown) is movable in the vertical direction in the lower housing 31 along the guide rail.
- the above-described main shaft 57 is a hollow cylindrical body.
- An inner shaft (not shown) is a shaft that can move in the vertical direction inside the main shaft 57.
- the upper end portion of the inner shaft passes through the main shaft 57 and is connected to the rack gear 43.
- a bearing (not shown) is provided at the left end of the T-shaped plate. Inside the bearing, the lower end portion of the inner shaft is rotatably held.
- a stepping motor 51 for moving the T-shaped plate up and down is fixed in front of the T-shaped plate.
- the shaft 58 of the stepping motor 51 protrudes rearward, that is, downward in FIG.
- a disc-shaped cam plate (not shown) is fixed to the tip of the shaft 58.
- a cylindrical projection (not shown) is provided on the rear surface of the cam plate.
- the tip of the protrusion is inserted into a groove (not shown). The protrusion can slide in the groove.
- the angle changing mechanism 34 has a pair of L-shaped plates 60 fixed to the upper surface of the turntable 33. Each L-shaped plate 60 extends upward from a base portion fixed in the vicinity of the center of the turntable 33, and its upper end portion extends outward in the radial direction of the turntable 33.
- a rack gear 43 (not shown) fixed to the inner shaft is provided between the pair of L-shaped plates 60.
- the rack gear 43 is a metal plate-like member that is long in the vertical direction, and gears are respectively carved on both end faces.
- a horizontal support shaft 46 having a gear 45 is rotatably supported at the distal end side in the extending direction of each L-shaped plate 60.
- the support shaft 46 is fixed to the inspection chip 2 via a mounting holder (not shown). For this reason, the inspection chip 2 also rotates around the support shaft 46 in conjunction with the rotation of the gear 45.
- a pinion gear 44 supported by an L-shaped plate 60 so as to be rotatable about a horizontal axis (not shown) is interposed.
- the pinion gear 44 meshes with the gear 45 and the rack gear 43, respectively. In conjunction with the vertical movement of the rack gear 43, the pinion gear 44 and the gear 45 are driven to rotate, and the inspection chip 2 rotates about the support shaft 46.
- the inspection chip 2 rotates around the main shaft 57, which is a vertical axis, and centrifugal force is applied to the inspection chip 2.
- the rotation around the vertical axis A1 of the inspection chip 2 is referred to as revolution.
- the inspection chip 2 rotates about the support shaft 46 which is a horizontal axis, and the direction of the centrifugal force acting on the inspection chip 2 changes relatively.
- the rotation around the horizontal axis A2 of the inspection chip 2 is called autorotation.
- the rack gear 43 is also lowered to the lowermost end of the movable range.
- the inspection chip 2 is in a steady state where the rotation angle is 0 degree.
- the rack gear 43 is also raised to the uppermost end of the movable range.
- inspection chip 2 will be in the state rotated 180 degree
- the upper housing 30 has a box-like frame structure in which frame members are combined, and is installed on the upper left side of the upper plate 32. More specifically, the upper housing 30 is provided outside the range in which the inspection chip 2 is rotated as viewed from the main shaft 57 at the rotation center of the turntable 33.
- the measurement unit 7 provided in the upper housing 30 includes a light source 71 that emits measurement light, and an optical sensor 72 that detects the measurement light emitted from the light source 71.
- the light source 71 and the optical sensor 72 are disposed on both the front and rear sides of the turntable 33 outside the rotation range of the inspection chip 2.
- the position on the left side of the main shaft 57 in the reciprocable range of the inspection chip 2 is the measurement position at which the inspection chip 2 is irradiated with the measurement light.
- the measurement light connecting the light source 71 and the optical sensor 72 intersects the surface of the inspection chip 2 substantially perpendicularly.
- the control device 90 includes a CPU 91 that performs main control of the inspection device 1, a RAM 92 that temporarily stores various data, and a ROM 93 that stores a control program. Connected to the CPU 91 are an operation unit 94 for a user to input instructions to the control device 90, a hard disk device 95 for storing various data and programs, and a display 96 for displaying various information.
- a personal computer may be used, or a dedicated control device may be used.
- a revolution controller 97 controls the revolution of the inspection chip 2 by transmitting a control signal for rotating the spindle motor 35 to the spindle motor 35.
- the rotation controller 98 controls the rotation of the inspection chip 2 by transmitting a control signal for rotating the stepping motor 51 to the stepping motor 51.
- the measurement controller 99 performs optical measurement of the inspection chip 2 by driving the measurement unit 7. Specifically, the measurement controller 99 transmits a control signal for executing light emission of the light source 71 and light detection of the optical sensor 72 to the light source 71 and the optical sensor 72.
- the CPU 91 controls the revolution controller 97, the rotation controller 98, and the measurement controller 99.
- FIG. 2 The detailed structure of the test chip 2 according to the first embodiment will be described with reference to FIGS. 2 and 3 below.
- the upper, lower, right, left, front side, and back side of FIG. 2 are the upper, lower, right, left, front, and rear sides of the inspection chip 2, respectively.
- 3 to 10 show front views of the inspection chip 2 with the sheet 29 removed.
- the inspection chip 2 has a square shape when viewed from the front as an example, and includes an upper side part 21, a right side part 22, a left side part 23, and a lower side part 24, and has a predetermined thickness.
- the front surface of the plate member 20 is sealed with a sheet 29 made of a transparent synthetic resin thin plate.
- a liquid flow path 25 is formed through which the liquid sealed in the inspection chip 2 can flow.
- the liquid flow path 25 is a recess formed on the front side of the plate member 20 with a predetermined depth, and extends in a direction orthogonal to the front-rear direction, which is the thickness direction of the plate member 20. That is, the sheet 29 seals the flow path forming surface of the liquid flow path 25 formed in the plate material 20.
- the liquid channel 25 includes a sample injection unit 101, a sample holding unit 112, a supply guide unit 113, a quantification unit 120, a sample surplus unit 140, a first reagent injection unit 102, a first reagent holding unit 133, and a second reagent injection unit 103.
- the sample holding unit 112 In the upper part of the test chip 2, from the right side 22 toward the left side 23 along the upper side 21, the sample holding unit 112, the sample injection unit 101, the second reagent holding unit 143, the second reagent injection unit 103, One reagent holding part 133 and the first reagent injection part 102 are arranged.
- the sample injection unit 101 is a part into which the sample 10 is injected from a sample injection port (not shown) formed in the sheet 29.
- the specimen injection portion 101 is formed between a wall portion 151 that extends downward from the upper side portion 21 and a wall portion 104 that extends obliquely to the upper right from the lower end portion of the wall portion 151 and opens upward.
- the specimen 10 of the present embodiment includes a first component made of a liquid and a second component made of a solid or semi-solid having a specific gravity greater than that of the first component.
- the specimen 10 is, for example, blood, bone marrow, urine, vaginal tissue, epithelial tissue, tumor, semen, saliva or food.
- the sample holding unit 112 is a flow channel connected to the upper side of the sample injection unit 101.
- the specimen holding unit 112 is provided between the right side part 22, a wall part 155 extending obliquely lower left from the right side part 22, and a wall part 105 extending obliquely lower right from the lower end part of the wall part 151. Is formed.
- the sample holding unit 112 is a supply flow path for the sample 10 extending downward along the wall 104 and the right side 22.
- the lower end portion of the sample holding unit 112 is connected to a supply guide unit 113 that is an opening in which a channel is formed narrower than other channels.
- the sample 10 flows from the sample holding unit 112 to the quantification unit 120 through the supply guide unit 113.
- the quantification unit 120 opens toward the supply guide unit 113 and is formed in a concave shape including a bottom surface 120C, a first wall surface 120A, a second wall surface 120B, and a recess 126. That is, the fixed quantity part 120 is a recessed part which inclines in the 2nd guide part 129 side mentioned later, and opens diagonally on the left.
- the bottom surface 120C connects the lower end portion of the first wall surface 120A and the lower end portion of the second wall surface 120B.
- the recess 126 at the top of the quantification unit 120 includes a third wall surface 120D and a fourth wall surface 120E, and is recessed in an L shape when viewed from the front.
- the third wall surface 120D is connected to the second wall surface 120B through the third connection portion 127.
- a lower end portion of the fourth wall surface 120E is connected to an end portion of the third wall surface 120D opposite to the third connection portion 127 via the fourth connection portion 128.
- the upper end of the fourth wall surface 120 ⁇ / b> E is connected to a second guide portion 129 described later via the second connection portion 123.
- the upper end of the fourth wall surface 120 ⁇ / b> E is connected to the fifth wall surface 124 that forms the second guide portion 129 via the second connection portion 123.
- the sixth wall surface 122 is connected to the first guide part 130 described later via the first connection part 121.
- the sixth wall surface 122 is connected to the first wall surface 120 ⁇ / b> A that forms the first guide portion 130 via the first connection portion 121.
- the angle ⁇ 2 on the second guide portion 129 side is formed to be 90 degrees or more.
- the third virtual surface K3 is a virtual surface connecting the first connection part 121 and the second connection part 123.
- the upper limit of the angle ⁇ 2 is less than 180 degrees. This is because the concave portion 126 cannot be formed when the angle ⁇ 2 is 180 degrees or more.
- the quantification unit 120 performs quantification of the specimen 10 and centrifugal separation that separates the specimen 10 into a first component 10A and a second component 10B having a higher specific gravity than the first component 10A by the action of centrifugal force. That is, the quantification unit 120 also functions as a separation unit. As an example, when the specimen 10 is blood, the quantification unit 120 separates the plasma as the first component 10A and the blood cells as the second component 10B.
- the first guide unit 130 that is a flow channel extends obliquely upward to the right and is connected to the flow channel 160 that extends downward along the right side portion 22. Yes.
- a measurement unit 150 shown in FIG. 2 is provided at the downstream end of the flow channel 160. The measurement unit 150 functions as a mixing unit.
- the supply guide 113 is connected to a second guide 129 that is a channel extending diagonally to the left.
- the second guide part 129 extends to the specimen surplus part 140 provided on the lower left side of the fixed quantity part 120.
- the specimen surplus part 140 is a part where the specimen 10 overflowing from the quantification part 120 is stored, and is a concave part extending rightward from the lower end part of the second guide part 129.
- the second guide portion 129 is bent when viewed from the front so that the flow path forming direction changes.
- the sixth wall surface 122 constituting the first guide part 130 extends obliquely upward to the right, and from the second connection part 123 of the quantification part 120, the second guide part 129.
- the fifth wall surface 124 that extends is extended obliquely downward to the left.
- the first virtual surface K ⁇ b> 1 extending the fifth wall surface 124 intersects the sixth wall surface 122.
- the third virtual surface K3 connecting the first connection part 121 and the second connection part 123 is a quantitative surface on which the specimen 10 is quantified in the second step described later.
- the amount of the specimen 10 to be quantified includes the first wall surface 120A, the second wall surface 120B, the bottom surface 120C, the third wall surface 120D, the fourth wall surface 120E, the third virtual surface K3, the back surface 120F of the quantification unit 120, and The volume is surrounded by the sheet 29.
- the second virtual surface K2 connecting the first connection portion 121 and the third connection portion 127 is a quantitative surface on which the first component 10A is quantified in a fourth step described later.
- the volume of the first component 10A to be quantified is a volume surrounded by the third wall surface 120D, the fourth wall surface 120E, the second virtual surface K2, the third virtual surface K3, the back surface 120F of the quantification unit 120, and the sheet 29. is there. This volume is determined to be an amount necessary for the inspection performed in the measurement unit 150.
- 3rd wall surface 120D exists in the 2nd guide part 129 side rather than the 2nd virtual surface K2 which connects the 1st connection part 121 and the 3rd connection part 127.
- FIG. Of the angles formed by the surface extending from the third virtual surface K3 and the fourth wall surface 120E, the angle ⁇ 2 on the second guide portion 129 side is formed to be 90 degrees or more.
- the angle ⁇ 3 on the second connection portion 123 side is formed to be greater than 180 degrees. Yes.
- the reason why the angle ⁇ 3 is formed larger than 180 degrees is that when the angle ⁇ 3 is 180 degrees or less, the first component quantified by the quantification unit 120 due to centrifugal force does not flow to the first guide unit 130.
- the upper limit of the angle ⁇ 3 is up to an angle at which the sixth wall surface 122 is parallel to the first wall surface 120A.
- the imaginary line J drawn from the end portion 155A on the supply guide portion 113 side in a direction perpendicular to the lower wall surface 155B of the wall portion 155 on the supply guide portion 113 side among the wall surfaces on which the first guide portion 130 is formed is , Which intersects the bottom surface 120C of the quantitative unit 120.
- the inclination angle ⁇ 5 of the sixth wall surface 122 with respect to the surface extending the third virtual surface K3 is larger than the inclination angle ⁇ 4 of the fifth wall surface 124 with respect to the surface extending the third virtual surface K3.
- the inclination angle ⁇ 4 is an acute angle among the angles formed by the fifth wall surface 124 with respect to a surface obtained by extending the third virtual surface K3. Therefore, when the sample 10 is injected into the quantification unit 120 by applying a centrifugal force to the test chip 2, the sample 10 passes over the sixth wall surface 122 and flows into the sample surplus unit 140 without leaking into the flow channel 160. I can do it.
- the first reagent injection part 102 is a part into which the first reagent 13 is injected from a first reagent injection port (not shown) formed in the sheet 29.
- the first reagent injection part 102 is a recess formed between the left side part 23 and the wall part 131 extending obliquely upward to the right from the left side part 23 and opening upward.
- the first reagent holding part 133 is connected to the first reagent injection part 102 and is formed between the wall part 131 and the wall part 152 extending downward from the upper side part 21.
- a first reagent inflow port 134 is formed for allowing the first reagent 13 to flow into the first reagent quantifying unit 135 for quantifying a predetermined amount of the first reagent 13.
- the first reagent quantification unit 135 is formed in a recess having a capacity for quantifying a predetermined amount of the first reagent 13 that is necessary for the inspection. That is, the predetermined amount is an amount based on the amount of the first component moved from the quantification unit 120 to the measurement unit 150.
- a flow path 136 is connected to the first reagent inlet 134.
- the flow path 136 extends to the first reagent surplus portion 137 provided at the lower left of the first reagent fixed amount portion 135. Further, from a portion where the first reagent inlet 134 and the first reagent quantitative unit 135 communicate with each other, the flow path 138 extends a predetermined length in the upper right direction and is bent to extend a predetermined length downward.
- the second reagent injection part 103 is a part into which the second reagent 14 is injected from a second reagent injection port (not shown) formed in the sheet 29.
- the second reagent injecting portion 103 is a recess formed between the wall portion 152 and the wall portion 141 extending obliquely upward to the right from the wall portion 152 and opening upward.
- the second reagent holding part 143 is connected to the second reagent injection part 103 and is formed between the wall part 141 and the wall part 151. Below the second reagent holding unit 143, a second reagent inflow port 144 through which the second reagent 14 flows into the second reagent quantifying unit 145 for quantifying a predetermined amount of the second reagent 14 is formed.
- the second reagent quantification unit 145 is formed in a recess having a capacity in which the second reagent 14 is quantified by a predetermined amount, which is an amount necessary for inspection. That is, the predetermined amount is an amount based on the amount of the first component moved from the quantification unit 120 to the measurement unit 150.
- a flow path 146 is connected to the second reagent inlet 144.
- the channel 146 extends to the second reagent surplus portion 147 provided at the lower left of the second reagent fixed amount portion 145.
- the flow path 139 extends a predetermined length in the upper right direction, and is bent and extends a predetermined length downward.
- the sample injection unit 101, the first reagent injection unit 102, and the second reagent injection unit 103 are arranged on the front surface of the plate member 20 along the upper side portion 21 that is the upper wall surface of the test chip 2. It is formed side by side in the direction.
- the measurement unit 150 is a rectangular recess that opens on the upper right side of the inspection chip 2 and opens on the upper side.
- the first component flowing in from the flow path 160, the first reagent 13 flowing in from the flow path 138, and the second reagent 14 flowing in from the flow path 139 are mixed, and the mixed liquid 170 shown in FIG. Is generated.
- the generated mixed liquid 170 is optically measured by measurement light passing through the measurement unit 150.
- the method of measuring the generated mixed liquid 170 is not limited to optical measurement, and other methods may be used.
- the sample 10 accommodated in an instrument may be injected from the sample injection port by a user operation. That is, the sample 10 may be injected into the sample injection unit 101 via the sample injection port using a known technique.
- a similar method may be used for injection of the first reagent 13 and the second reagent 14.
- FIG. 2 shows a state in which the specimen 10, the first reagent 13, and the second reagent 14 are injected.
- each injection port of the specimen injection unit 101, the first reagent injection unit 102, and the second reagent injection unit 103 may have a shape in which the upper side portion 21 is opened.
- Example of inspection method> An inspection method using the inspection apparatus 1 and the inspection chip 2 will be described with reference to FIGS.
- the rotation, revolution, and rotation speed of the inspection chip 2 are controlled based on whether a predetermined reference time has elapsed. Information on the reference time is stored in advance in the HDD 95 of the control device 90.
- the inspection chip 2 is attached to the spindle 46 and a processing start command is input from the operation unit 94 to the control device 90, the following measurement operation is executed.
- the inspection apparatus 1 can inspect two inspection chips 2 at the same time, but the procedure for inspecting one inspection chip 2 will be described below for convenience of explanation. In the following description, the steady state of the inspection chip 2 shown in FIG.
- rotation angle of 80 degrees the state rotated from the steady state by 80 degrees counterclockwise is referred to as “rotation angle of 80 degrees”, and from the steady state to 85 degrees.
- the state rotated counterclockwise is referred to as “rotation angle 85 degrees”
- the state rotated 90 degrees counterclockwise from the steady state is referred to as “rotation angle 90 degrees”.
- the test chip 2, the first reagent 13, and the second reagent 14 are injected.
- the spindle motor 35 starts driving the turntable 33 based on an instruction from the CPU 91 of the control device 90.
- the inspection chip 2 having a rotation angle of 0 degrees revolves.
- the spindle motor 35 increases the rotation speed of the turntable 33 based on an instruction from the CPU 91.
- the rotation speed of the turntable 33 is not limited to 3000 rpm, and may be other rotation speeds.
- centrifugal force F acts on the test chip 2 from the left side 23 toward the right side 22.
- the specimen 10 moves from the specimen injection section 101 to the specimen holding section 112 by the action of the centrifugal force F.
- the first reagent 13 moves from the first reagent injection unit 102 to the first reagent holding unit 133.
- the second reagent 14 moves from the second reagent injection unit 103 to the second reagent holding unit 143.
- the revolution time in this state is stored in advance in the HDD 95 for a time sufficient for the specimen 10, the first reagent 13, and the second reagent 14 to move as described above.
- the specimen 10 is injected from the specimen holding part 112 into the fixed quantity part 120 through the supply guide part 113 by the action of the centrifugal force F.
- the volume of the specimen 10 injected into the quantification unit 120 corresponds to the first wall surface 120A, the second wall surface 120B, the bottom surface 120C, the third wall surface 120D, the fourth wall surface 120E, and the first virtual wall of the quantification unit 120 shown in FIG.
- the volume is surrounded by the surface K1. Accordingly, the volume is larger than the volume surrounded by the first wall surface 120A, the second wall surface 120B, the bottom surface 120C, the third wall surface 120D, the fourth wall surface 120E, and the third virtual surface K3 of the quantification unit 120 shown in FIG.
- the sample 10 overflowing from the quantification unit 120 is stored in the sample surplus unit 140.
- the first reagent 13 is injected from the first reagent holding unit 133 into the first reagent quantitative unit 135 via the first reagent inlet 134.
- the first reagent 13 overflowing from the first reagent quantitative unit 135 is stored in the first reagent surplus unit 137.
- the second reagent 14 is injected from the second reagent holding unit 143 into the second reagent quantitative unit 145 through the second reagent inflow port 144.
- the second reagent 14 overflowing from the second reagent quantitative unit 145 is stored in the second reagent surplus unit 147.
- ⁇ Second step> by the drive control of the stepping motor 51 based on the instruction of the CPU 91, as shown in FIG. 6, the revolving test chip 2 is rotated five times counterclockwise when viewed from the front. Thereby, the rotation angle of the test
- the rotation speed of the turntable 33 is 3000 rpm.
- the centrifugal force F acts on the test chip 2 so that the angle formed by the upper side portion 21 and the direction of the centrifugal force is 90 degrees.
- the direction of action of the centrifugal force F by this rotation is the opening direction of the supply guide portion 113, that is, the communication direction of the supply guide portion 113.
- the direction of action of the centrifugal force F is a direction orthogonal to the third virtual plane K3 of the quantification unit 120 shown in FIG.
- the sample 10 injected into the quantification unit 120 is quantified.
- the volume of the specimen 10 to be quantified is the first wall surface 120A, the second wall surface 120B, the bottom surface 120C, the third wall surface 120D, the fourth wall surface 120E, and the third virtual surface K3 of the quantification unit 120 shown in FIG.
- the first reagent 13 is quantified by the first reagent quantification unit 135.
- the second reagent 14 is also quantified by the second reagent quantification unit 145.
- the revolution time in this state is stored in advance in the HDD 95 for a time sufficient for the specimen 10, the first reagent 13, and the second reagent 14 to perform the above-described rotation speed, movement, and specimen centrifugation.
- ⁇ Third step> Next, as shown in FIG. 7, by the drive control of the stepping motor 51 based on the instruction of the CPU 91, the revolving test chip 2 is rotated 10 degrees clockwise as viewed from the front. Thereby, the rotation angle of the test
- the liquid level of the specimen 10 in the quantitative unit 120 is in a direction orthogonal to the direction F of the centrifugal force. While the rotation angle in the first step was 85 degrees, in the third step, the rotation angle became a low angle of 80 degrees.
- the liquid level of the specimen 10 is located between the two. Accordingly, it is possible to reduce the leakage of the specimen 10 from the quantification unit 120 to the second guide unit 129 side.
- the specimen 10 injected into the quantitative unit 120 shown in FIG. 7 is centrifuged into the first component 10A and the second component 10B.
- the rotation speed of the turntable 33 is faster than the rotation speed of the second step. As an example, the speed is increased to 5000 rpm.
- the specimen 10 injected into the quantification unit 120 by performing this high-speed revolution is centrifuged in a short time into the first component 10A and the second component 10B having a higher specific gravity than the first component. Is done.
- the second component 10B Since the second component 10B has a specific gravity greater than that of the first component 10A, it accumulates on the bottom surface 120C side of the quantitative unit 120.
- the specimen 10 is blood
- it is separated into plasma as the first component 10A and blood cells as the second component 10B, and the blood cells accumulate on the bottom surface 120C side of the quantification unit 120.
- the revolution time in this state is stored in advance in the HDD 95 for a time sufficient for the specimen 10, the first reagent 13, and the second reagent 14 to perform the above-described rotation speed, movement, and specimen centrifugation.
- the first component 10A corresponding to the volume flows into the flow path 160 via the first guide part 130 and is held on the right side part 22 side.
- the first component 10A corresponding to the volume of the concave portion 126 is defined as V1.
- the volume of the specimen 10 quantified in the second step is set as V2.
- V1 V2 ⁇ V3.
- the first reagent 13 quantified by the first reagent quantification unit 135 flows into the flow path 138 and is held on the wall 141 side. A part of the first reagent 13 flows in the direction of the measurement unit 150.
- the second reagent 14 quantified by the second reagent quantification unit 145 is held on the wall 102 side via the flow path 139. A part of the second reagent 14 flows in the direction of the measurement unit 150.
- the above-described rotation speed and time sufficient for movement are stored in advance in the HDD 95.
- ⁇ Mixed liquid generation step> Next, the spindle motor 35 is decelerated and driven by the drive control of the spindle motor 35 based on an instruction from the CPU 91, and the spindle motor 35 is stopped. Therefore, the revolution of the inspection chip 2 is completed. As shown in FIG. 10, the mixed solution 170 in which the first component 10 ⁇ / b> A, the first reagent 13, and the second reagent 14 are mixed accumulates in the measurement unit 150 by gravity.
- ⁇ Measurement step> After execution of the centrifugal process, the inspection chip 2 is rotated to the angle of the measurement position by drive control of the spindle motor 35.
- the light source 71 emits light
- the measurement light passes through the mixed solution 170 stored in the measurement unit 150.
- optical measurement of the mixed liquid 170 is performed, and measurement data is acquired.
- the measurement result of the specimen 10 is calculated based on the acquired measurement data.
- the test result of the specimen 10 based on the measurement result is displayed. Thereafter, the main process is terminated.
- the first virtual surface K1 provided with the fifth wall surface 124 intersects the sixth wall surface 122 that is the wall surface of the first guide portion 130. Therefore, the sixth wall surface 122 of the sixth wall surface 122 with respect to the surface extending the third virtual surface K3 from the inclination angle ⁇ 4 of the fifth wall surface 124 with respect to the surface extending the third virtual surface K3 connecting the first connection portion 121 and the second connection portion 123.
- the inclination angle ⁇ 5 is large.
- the specimen 10 when the specimen 10 is injected into the quantification unit 120 by applying a centrifugal force to the test chip 2, the specimen 10 does not leak over the sixth wall surface 122 and leak into the flow path 160, and the overflowing specimen 10 is removed from the specimen surplus. Can flow into the portion 140. Further, since the third wall surface 120D exists on the second guide portion 129 side with respect to the second virtual surface K2 connecting the first connection portion 121 and the third connection portion 127, the third wall surface 120D and the fourth wall surface 120E. Can be reduced from adhering to the third wall surface 120D and the fourth wall surface 120E due to surface tension without being close to the second virtual surface K2, which is a liquid surface. Therefore, the quantitative accuracy at the time of taking out the first component 10A is improved. Moreover, since the fixed_quantity
- the angle ⁇ 2 on the second guide portion 129 side is 90 degrees or more out of the angles formed by the third virtual surface K3 and the fourth wall surface 120E. It is possible to prevent the bubbles from being accumulated in the recess 126 because the bubbles in the specimen 10 are easily released and opened outward. Therefore, the quantitative accuracy in the quantitative unit is further improved.
- the specimen 10 when the specimen 10 is injected into the quantification unit 120 by applying centrifugal force to the inspection chip in the first step, the specimen 10 does not cross the sixth wall surface 122 and leak into the flow path 160. In addition, the overflowing specimen 10 can be caused to flow into the specimen surplus portion 140. Further, since the third wall surface 120D is located closer to the second guide portion 129 than the second virtual surface K2 connecting the first connection portion 121 and the third connection portion 127, the third wall surface 120D and the fourth wall surface 120E are provided. It is possible to reduce the first component 10A from adhering to the third wall surface 120D and the fourth wall surface 120E due to surface tension in the fourth step without approaching the second virtual surface K2. Therefore, the quantitative accuracy at the time of taking out the first component 10A is improved.
- the revolution speed in the third step is higher than the revolution speed in the second step. Therefore, when the specimen 10 is separated into the first component 10A and the second component 10B in the third step, the inspection system 3 is short. Centrifugation can be performed in time.
- FIG. 11 shows an enlarged view around the quantitative unit 120 of the inspection chip 202 with the sheet 29 removed.
- the structure other than the periphery of the quantitative unit 120 of the test chip 202 is the same as the structure of the test chip 2 of the first embodiment. Therefore, in the following, referring to FIG. Only 202 specific structures are described.
- a quantitative unit 120 having the same structure as that of the first embodiment is provided below the supply guide unit 113. Similar to the test chip 2, the quantification unit 120 opens toward the supply guide unit 113, and includes a bottom surface 120 ⁇ / b> C, a first wall surface 120 ⁇ / b> A, a second wall surface 120 ⁇ / b> B, and a recess 126 and is formed in a concave shape. Other structures are the same as in the first embodiment.
- the inspection chip 202 stores and holds the first component 10A and the second component 10B remaining in the quantification unit 120 after the first component 10A used for the inspection is taken out from the quantification unit 120.
- a residue holding unit 161 is provided.
- the residue holding part 161 is a rectangular storage part when viewed from the front. Further, the residue holding unit 161 is connected to a substantially middle portion of the first wall surface 120 ⁇ / b> A of the quantifying unit 120 by a connection channel 163.
- the connection flow path 163 extends obliquely right and upward from a substantially middle portion of the first wall surface 120A. The distal end portion of the connection channel 163 is connected to the upper end portion of the residue holding portion 161.
- the virtual surface K20 that extends the second virtual surface K2 that connects the first connection portion 121 and the third connection portion 127, and the virtual line K5 that extends the extending direction of the connecting flow path 163, are the quantification unit 120.
- Cross over The fourth virtual surface K4 extending in parallel with the second virtual surface K2 from the inlet 163A of the connection channel 163 intersects the wall surface 162 of the connection channel that separates the residue holding portion 161 and the connection channel 163.
- test chip 202 according to the second embodiment includes the residue holding unit 161 connected to the first wall surface 120A by the connection channel 163, the residue remaining in the quantification unit 120 can be held by the residue holding unit 161. . Accordingly, it is possible to prevent the residue from flowing out from the quantitative unit 120 to the first guide unit 130 after the quantified first component 10A has moved to the first guide unit 130. Therefore, the inspection accuracy can be improved.
- the extending direction of the second virtual surface K2 and the extending direction of the connection channel 163 intersect, and the fourth virtual surface K4 that extends in parallel with the second virtual surface K2 from the inlet of the connection channel 163. Intersects the wall surface 162 of the connection channel 163 that separates the residue holding part 161 and the connection channel 163. Therefore, in the inspection chip 202, when the first component 10A is moved from the quantitative unit 120 to the first guide unit 130 side, it is possible to reduce the first component 10A from flowing into the residue holding unit 161 from the connection channel 163. .
- the 4th connection part 128 which connects 3rd wall surface 120D and 4th wall surface 120E is a contact
- the angle ⁇ 1 outside the quantitative unit 120 among the angles formed by the second wall surface 120B and the third wall surface 120D may be greater than 90 degrees and less than 180 degrees.
- the third wall surface 120D is not close to the second virtual surface K2, which is a quantitative surface connecting the first connection portion 121 and the third connection portion 127, and the first component is applied to the third wall surface 120D due to surface tension. Adhesion can be reduced. Therefore, the quantitative accuracy at the time of taking out the first component 10A is improved.
- the measurement unit 150 is an example of a “mixing unit”.
- the present disclosure is not limited to the above-described embodiment, and various modifications are possible.
- the inspection apparatus 1 and the inspection chip 2 of the above embodiment are merely examples, and the structure, shape, processing, and the like of each can be changed.
- the CPU 91 performs the revolution control process and the rotation control process of the inspection chip 2, but the form of performing the process is not limited thereto.
- Each process may be shared by a plurality of CPUs.
- Each process may be processed by an ASIC.
- each process may be executed by a combination of one or more CPUs and one or more ASICs.
- the 1st step and the 2nd step are performed separately, the 1st step and the 2nd step are performed at once, and the injection
- quantitative_assay are performed. You may go at once.
- the quantification unit 120 does not necessarily require the bottom surface 120C, and may be V-shaped including the first wall surface 120A and the second wall surface 120B.
- the rotation speed of the turntable 33 is not limited to 3000 rpm and 5000 rpm, and may be any rotation speed that generates a necessary centrifugal force.
- the first reagent 13 and the second reagent 14 may be previously injected into the first reagent injection unit 102 and the second reagent injection unit 103, respectively.
- the first reagent 13 and the second reagent 14 may be injected into the first reagent injection part 102 and the second reagent injection part 103 from an injection port (not shown) by a known method.
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Abstract
Provided are and inspection chip and an inspection system that can improve the quantitative precision of an component to be inspected that has been centrifuged from a specimen, and that allow the miniaturization of the inspection chip without providing a separate quantifying part to a centrifugation part. A quantifying part (120) opens towards a supply guide part (113), is formed in a recessed shape, and comprises a bottom surface (120C), a first wall surface (120A), a second wall surface (120B), and a recessed part (126). The recessed part (126) at the top of the quantifying part (120) is equipped with a third wall surface (120D) and a fourth wall surface (120E), and forms a recessed L-shape when viewed from the front. The third wall surface (120D) is connected, via a third connecting part (127), to the second wall surface (120B). The lower end part of the fourth wall surface (120E) is connected, via a fourth connecting part (128), to the end part of the third wall surface (120D) on the opposite side to the third connecting part (127). The other end part of the fourth wall surface (120E) is connected to a fifth wall surface (124) by a second connecting part (123).
Description
本開示は、検査対象物の化学的、医学的、または生物学的な検査を行うための検査チップ及び検査システムに関する。
The present disclosure relates to an inspection chip and an inspection system for performing a chemical, medical, or biological inspection of an inspection object.
従来、生体物質、または化学物質等の検体を検査するための検査チップが知られている。例えば特許文献1にマイクロチップとして開示された検査チップは、第一の基板と第二の基板とが貼り合わせられて形成される。第一の基板の表面には溝が形成され、溝と第二の基板の第一の基板側表面とから流体回路が形成される。流体回路は、検体を遠心分離により第一成分と第一成分より比重が大きい第二成分とに分離するための遠心分離部を備える。この検査チップでは、遠心分離部に第一方向に遠心力が印加されることにより、検体である血液が遠心分離部に導入されると共に血液が所定量定量される。次いで、遠心分離部に第一の方向に遠心力が印加されることで、血液が第一成分である血漿と第二成分である血球とに分離される。その後、遠心分離部に第二の方向に遠心力が印加されることにより、遠心分離された血漿の一部が遠心分離部から取り出される。ここで、取り出される血漿の量は、遠心分離部に注入され定量された血液の量から残渣の量を引いた値である。残渣の量は、遠心分離部において取り出される血漿以外の残渣を定量する定量面により定量された量である。
Conventionally, an inspection chip for inspecting a specimen such as a biological substance or a chemical substance is known. For example, an inspection chip disclosed as a microchip in Patent Document 1 is formed by bonding a first substrate and a second substrate. A groove is formed on the surface of the first substrate, and a fluid circuit is formed from the groove and the first substrate side surface of the second substrate. The fluid circuit includes a centrifuge for separating the specimen into a first component and a second component having a specific gravity greater than that of the first component by centrifugation. In this test chip, a centrifugal force is applied to the centrifuge in the first direction, whereby blood as a sample is introduced into the centrifuge and a predetermined amount of blood is quantified. Next, a centrifugal force is applied to the centrifuge in the first direction, so that blood is separated into plasma as the first component and blood cells as the second component. Thereafter, a centrifugal force is applied to the centrifuge in the second direction, whereby a part of the centrifuged plasma is taken out from the centrifuge. Here, the amount of plasma to be taken out is a value obtained by subtracting the amount of residue from the amount of blood injected into the centrifuge and quantified. The amount of the residue is an amount quantified by a quantitative surface for quantifying the residue other than plasma taken out in the centrifugal separator.
特許文献1に開示の検査チップでは、残渣を定量する定量面と、排出される血漿を保持している遠心分離部の壁面とが略V字状となっている。このため定量面の液面が近接した壁面に表面張力により付着する。従って、取り出される血漿の量は減少する。よって、血漿の取り出し時の定量精度が低下するという問題点があった。また、血漿の定量精度を向上する為に血漿の取り出し後に定量を行うようにすると、遠心分離部と別の定量部が必要になり検査チップが大型化するという問題点があった。
In the test chip disclosed in Patent Document 1, the quantitative surface for quantifying the residue and the wall surface of the centrifuge holding the discharged plasma are substantially V-shaped. For this reason, the liquid surface of the fixed surface adheres to the adjacent wall surface due to surface tension. Thus, the amount of plasma removed is reduced. Therefore, there is a problem that the quantitative accuracy at the time of taking out the plasma is lowered. In addition, if the quantification is performed after the plasma is taken out in order to improve the quantification accuracy of the plasma, there is a problem that a quantification unit different from the centrifugal separation unit is required and the inspection chip becomes large.
本開示の目的は、検体から遠心分離した検査対象成分の定量精度を向上して、遠心分離部と別に定量部を設けずに検査チップの小型化を図ることのできる検査チップ及び検査システムを提供することである。
An object of the present disclosure is to provide a test chip and a test system that can improve the quantification accuracy of a test target component centrifuged from a specimen and can reduce the size of the test chip without providing a quantification unit separately from the centrifuge unit. It is to be.
本開示の第一態様の検査チップは、注入された検体が定量されると共に、前記検体中に含まれる第一成分と前記第一成分より比重が大きい第二成分とが分離される分離部を兼ねる定量部と、前記定量部に前記検体を注入する供給案内部と、前記定量部において分離された第一成分が移動する第一案内部と、前記定量部から溢れた検体を収容する余剰部と、前記定量部から前記余剰部に接続された第二案内部と、前記定量部から前記第一案内部を介して移動した前記第一成分と試薬とが混合される混合部とを備え、前記定量部は、前記第一案内部と接続する第一接続部と、前記第二案内部と接続する第二接続部と、前記第一接続部に接続される第一壁面と、前記第一壁面と対向する第二壁面と、前記第二壁面の端部と前記第二接続部とに接続する凹部とを備え、前記凹部は、前記凹部を構成する第三壁面と、前記第三壁面と前記第二壁面とが接続される第三接続部と、前記第三壁面と第四接続部を介して接続される第四壁面とを備え、前記第二接続部に接続する前記第二案内部の壁面である第五壁面を延設した第一仮想面は、前記第一接続部に接続する前記第一案内部の壁面である第六壁面に交差し、前記第三壁面は、前記第一接続部と前記第三接続部とを結ぶ第二仮想面よりも前記第二案内部側に存在し、前記第二仮想面と、前記第六壁面とがなす角度の内、前記第二接続部側の角度は、180度より大きいことを特徴とする。
The test chip according to the first aspect of the present disclosure includes a separation unit that quantifies an injected sample and separates a first component contained in the sample and a second component having a specific gravity greater than that of the first component. A quantification unit that also serves as a supply guide unit that injects the sample into the quantification unit, a first guide unit that moves the first component separated in the quantification unit, and a surplus unit that accommodates the sample overflowing from the quantification unit A second guide unit connected from the quantification unit to the surplus unit, and a mixing unit in which the first component moved from the quantification unit via the first guide unit and the reagent are mixed, The quantitative portion includes a first connection portion connected to the first guide portion, a second connection portion connected to the second guide portion, a first wall surface connected to the first connection portion, and the first Connected to the second wall facing the wall, the end of the second wall and the second connection The recess includes a third wall surface constituting the recess, a third connection portion to which the third wall surface and the second wall surface are connected, and the third wall surface and the fourth connection portion. A first virtual surface extending through a fifth wall surface, which is a wall surface of the second guide portion connected to the second connection portion, is connected to the first connection portion. The third wall surface intersects the sixth wall surface that is the wall surface of the first guide portion, and the third wall surface is closer to the second guide portion side than the second virtual surface connecting the first connection portion and the third connection portion. Of the angles formed by the second virtual surface and the sixth wall surface, the angle on the second connecting portion side is greater than 180 degrees.
上記態様に係る検査チップによれば、上記構成の検査チップでは、第五壁面を延設した第一仮想面は、第一案内部の壁面である第六壁面に交差する。従って、第一接続部と第二接続部とを結ぶ仮想面を延長した面に対する第五壁面の傾斜角度より第一接続部と第二接続部とを結ぶ仮想面を延長した面に対する第六壁面の傾斜角度が大きく、検査チップへ遠心力を作用させて定量部へ検体の注入をするときに、検体が第六壁面を乗り越えて第一案内部側に漏れずに余剰部へ流入させることが出来る。また、第三壁面は、第一接続部と第三接続部とを結ぶ第二仮想面よりも第二案内部側に存在するので、第三壁面及び第四壁面が第二仮想面に近接せず、表面張力により第三壁面及び第四壁面に第一成分が付着することを低減できる。従って、第一成分の取り出し時の定量精度が向上する。また、定量部が分離部を兼ねるので検査チップを小型化できる。また、前記第二仮想面と、前記第六壁面とがなす角度の内、第二接続部側の角度は、180度より大きいので、第二仮想面にて定量された第一成分を第一案内部側に流入させることができる。
According to the inspection chip according to the above aspect, in the inspection chip having the above-described configuration, the first virtual surface extending the fifth wall surface intersects the sixth wall surface that is the wall surface of the first guide portion. Therefore, the sixth wall surface relative to the surface extending the virtual surface connecting the first connection portion and the second connection portion from the inclination angle of the fifth wall surface relative to the surface extending the virtual surface connecting the first connection portion and the second connection portion. When the specimen is injected into the quantification part by applying a centrifugal force to the test chip, the specimen can get over the sixth wall surface and flow into the surplus part without leaking to the first guide part side. I can do it. The third wall surface is closer to the second guide portion than the second virtual surface connecting the first connection portion and the third connection portion, so that the third wall surface and the fourth wall surface are close to the second virtual surface. Therefore, it can reduce that a 1st component adheres to a 3rd wall surface and a 4th wall surface by surface tension. Therefore, the quantitative accuracy at the time of taking out the first component is improved. In addition, since the quantitative unit also serves as the separation unit, the inspection chip can be miniaturized. Moreover, since the angle on the second connecting portion side is larger than 180 degrees among the angles formed by the second virtual surface and the sixth wall surface, the first component quantified on the second virtual surface is the first component. It can be made to flow into the guide part side.
前記第一接続部と前記第二接続部と結ぶ第三仮想面と前記第四壁面とがなす角度の内、前記第二案内部側の角度は、90度以上であってもよい。上記構成の検査チップでは、第三仮想面と第四壁面とがなす角度の内、第二案内部側の角度は90度以上であるので、第四壁面が定量部の外側に開き検体中の気泡が放出されやすく凹部に気泡が溜まることを防止できる。よって、定量部における定量精度がより向上する。
Among the angles formed by the third virtual surface connecting the first connection portion and the second connection portion and the fourth wall surface, the angle on the second guide portion side may be 90 degrees or more. In the test chip having the above configuration, the angle on the second guide portion side is 90 degrees or more among the angles formed by the third virtual surface and the fourth wall surface. It is possible to prevent the air bubbles from being easily collected and to prevent the air bubbles from being accumulated in the concave portion. Therefore, the quantitative accuracy in the quantitative unit is further improved.
前記第一案内部が形成された壁面の内、前記供給案内部側の壁面に対して直角方向に前記供給案内部の前記第一案内部側の端部から引いた仮想線は、前記定量部の底面と交差してもよい。上記構成の検査チップでは、第一案内部が形成された壁面の内、供給案内部側の壁面に対して直角方向に供給案内部の第一案内部側の端部から引いた仮想線は、定量部の底面と交差するので、定量部に注入される検体が、凹部に当たり第二案内部に流れてしまうことを防止できる。従って、検体が不足せず定量部において検体の定量精度を向上することができる。
The imaginary line drawn from the end portion on the first guide portion side of the supply guide portion in the direction perpendicular to the wall surface on the supply guide portion side of the wall surface on which the first guide portion is formed is the quantification portion You may cross the bottom of the. In the inspection chip having the above configuration, the imaginary line drawn from the end portion on the first guide portion side of the supply guide portion in the direction perpendicular to the wall surface on the supply guide portion side of the wall surface on which the first guide portion is formed, Since it intersects the bottom surface of the quantification unit, it is possible to prevent the specimen injected into the quantification unit from hitting the concave portion and flowing to the second guide unit. Therefore, the sample quantification accuracy can be improved in the quantification unit without running out of samples.
前記第一壁面に連結流路により接続され、且つ、前記定量部の残渣を保持する残渣保持部を備えてもよい。上記構成の検査チップでは、定量部に残った残渣を残渣保持部にて保持するので、定量された第一成分が第一案内部に移動した後に、残渣が定量部から第一案内部に流れ出してしまうことを防止できる。従って、検査の精度を向上することができる。
A residue holding unit that is connected to the first wall surface by a connection channel and holds the residue of the quantification unit may be provided. In the inspection chip having the above configuration, the residue remaining in the quantification unit is retained in the residue retention unit, so that after the quantified first component has moved to the first guide unit, the residue flows out from the quantification unit to the first guide unit. Can be prevented. Therefore, the inspection accuracy can be improved.
前記連結流路の延設方向は前記第二仮想面の延設方向と交差し、且つ、前記連結流路の入口から前記第二仮想面と平行に延設した第四仮想面は、前記残渣保持部と前記連結流路とを隔てる連結流路の壁面と交差してもよい。上記構成の検査チップでは、定量部から第一成分が第一案内部側に移動される場合に、第一成分が連結流路から残渣保持部へ流入することを低減できる。よって、定量部における定量精度がより向上する。
The extending direction of the connection channel intersects the extending direction of the second imaginary surface, and the fourth imaginary surface extending in parallel with the second imaginary surface from the inlet of the connection channel is the residue You may cross | intersect the wall surface of the connection flow path which separates a holding | maintenance part and the said connection flow path. In the inspection chip having the above-described configuration, when the first component is moved from the quantitative unit to the first guide unit side, it is possible to reduce the first component from flowing into the residue holding unit from the connection channel. Therefore, the quantitative accuracy in the quantitative unit is further improved.
本開示の第二態様の検査システムは、検体または試薬を定量して混合する検査チップと、前記検査チップを所定の第一軸を中心に公転させることにより前記検査チップに遠心力を作用させ、且つ、前記第一軸とは異なる第二軸を中心に前記検査チップを自転させることにより前記遠心力の方向を変化させる検査装置とから構成される検査システムであって、前記検査チップは、注入された検体が定量されると共に、前記検体中に含まれる第一成分と前記第一成分より比重が大きい第二成分とが分離される分離部を兼ねる定量部と、前記定量部に前記検体を注入する供給案内部と、前記定量部において分離された第一成分が移動する第一案内部と、前記定量部から溢れた検体を収容する余剰部と、前記定量部から前記余剰部に接続された第二案内部と、前記定量部から前記第一案内部を介して移動した前記第一成分と試薬とが混合される混合部とを備え、前記定量部は、前記第一案内部と接続する第一接続部と、前記第二案内部と接続する第二接続部と、前記第一接続部に接続される第一壁面と、前記第一壁面と対向する第二壁面と、前記第二壁面の端部と前記第二接続部とに接続する凹部とを備え、前記凹部は、前記第三壁面と前記第二壁面とが接続される第三接続部と、前記第三壁面と第四接続部を介して接続される第四壁面とを備え、前記第二接続部に接続する前記第二案内部の壁面である第五壁面を延設した第一仮想面は、前記第一接続部に接続する前記第一案内部の壁面である第六壁面に交差し、前記第三壁面は、前記第一接続部と前記第三接続部とを結ぶ第二仮想面よりも前記第二案内部側に存在し、前記第二仮想面と、前記第六壁面とがなす角度の内、前記第二接続部側の角度は、180度より大きく形成され、前記検査装置は、前記自転を制御する自転制御手段と、前記公転を制御する公転制御手段とを備え、前記自転制御手段は、前記公転により生じる遠心力により、前記検体が前記供給案内部から前記定量部に注入される方向に前記検査チップを自転させる第一ステップと、前記遠心力により、前記定量部において前記第一接続部と前記第二接続部とを結ぶ第一定量面で前記検体が定量される方向に前記検査チップを自転させる第二ステップと、前記遠心力により、前記定量部にて前記検体が前記第一成分と前記第二成分とに分離される方向に前記検査チップを自転させる第三ステップと、前記遠心力により、前記定量部において前記第二仮想面にて前記第一成分が定量され、定量された第一成分が前記第一案内部に流入される方向に前記検査チップを自転させる第四ステップとを少なくとも実行することを特徴とする。
The test system according to the second aspect of the present disclosure includes a test chip for quantifying and mixing a specimen or a reagent, and causing the test chip to revolve around a predetermined first axis to apply a centrifugal force to the test chip. And an inspection system configured to change the direction of the centrifugal force by rotating the inspection chip around a second axis different from the first axis, the inspection chip being an injection A quantification unit that also serves as a separation unit for separating a first component contained in the sample and a second component having a specific gravity greater than that of the first component, and the sample in the quantification unit A supply guide unit to be injected, a first guide unit in which the first component separated in the quantification unit moves, a surplus unit for storing a sample overflowing from the quantification unit, and a quantification unit connected to the surplus unit. Second A first connection that connects the first guide unit with the interior, and a mixing unit that mixes the first component moved from the quantification unit via the first guide unit and the reagent. A second connection portion connected to the second guide portion, a first wall surface connected to the first connection portion, a second wall surface facing the first wall surface, and an end of the second wall surface And a recess connected to the second connection portion, the recess via a third connection portion to which the third wall surface and the second wall surface are connected, the third wall surface and the fourth connection portion. A first virtual surface extending from a fifth wall surface, which is a wall surface of the second guide portion connected to the second connection portion, is connected to the first connection portion. Crossing the sixth wall surface, which is the wall surface of the first guide portion, the third wall surface is a second virtual surface connecting the first connection portion and the third connection portion. Is also present on the second guide part side, and the angle on the second connection part side is formed larger than 180 degrees among the angles formed by the second virtual surface and the sixth wall surface, A rotation control means for controlling the rotation and a revolution control means for controlling the revolution, wherein the rotation control means injects the specimen from the supply guide section into the quantification section by a centrifugal force generated by the revolution. The specimen is quantified on the first quantitative surface connecting the first connection part and the second connection part in the quantification part by the first step of rotating the test chip in the direction to be moved and the centrifugal force. A second step of rotating the test chip in a direction; and a third step of rotating the test chip in a direction in which the specimen is separated into the first component and the second component by the centrifugal force by the centrifugal force. Step and said centrifugal force The first component is quantified in the second imaginary plane in the quantification unit, and the fourth step of rotating the inspection chip in the direction in which the quantified first component flows into the first guide unit, It is characterized by executing at least.
上記構成の検査システムでは、第一ステップにおいて検査チップへ遠心力を作用させて定量部へ検体の注入をする場合に、検体が第六壁面を乗り越えて第一案内部側に漏れずに余剰部へ流入させることが出来る。また、第三壁面は、第一接続部と第三接続部とを結ぶ第二仮想面よりも第二案内部側に存在するので、第三壁面及び第四壁面が第二仮想面に近接せず、第四ステップにおいて、表面張力により第三壁面及び第四壁面に第一成分が付着することを低減できる。従って、第一成分を定量部から流出させる場合の定量精度が向上する。
In the inspection system having the above configuration, when the specimen is injected into the quantification unit by applying centrifugal force to the inspection chip in the first step, the surplus part does not leak over the sixth wall surface to the first guide part side. Can flow into The third wall surface is closer to the second guide portion than the second virtual surface connecting the first connection portion and the third connection portion, so that the third wall surface and the fourth wall surface are close to the second virtual surface. First, in the fourth step, it is possible to reduce adhesion of the first component to the third wall surface and the fourth wall surface due to surface tension. Therefore, the quantitative accuracy when the first component flows out from the quantitative unit is improved.
前記公転制御手段は、前記第三ステップでの公転速度を前記第二ステップよりも上げるようにしてもよい。上記構成の検査システムでは、第三ステップにて検体を第一成分と第二成分とに分離する場合に、公転速度を第二ステップよりも上げるので、短時間に遠心分離を行うことができる。
The revolution control means may make the revolution speed in the third step higher than that in the second step. In the inspection system having the above configuration, when the specimen is separated into the first component and the second component in the third step, the revolution speed is increased as compared with the second step, so that the centrifugation can be performed in a short time.
本開示を具体化した実施の形態について、図面を参照して説明する。尚、図1は、検査システム3を構成する検査装置1の平面及び制御装置90の内部の機能ブロックを示している。
Embodiments embodying the present disclosure will be described with reference to the drawings. FIG. 1 shows a plane of the inspection apparatus 1 constituting the inspection system 3 and functional blocks inside the control apparatus 90.
<1.検査システム3の概略構造>
本開示の実施形態を説明する。図1を参照して、検査システム3の概略構造について説明する。本実施形態の検査システム3は、液体である検体及び試薬を収容可能な検査チップ2と、検査チップ2を用いて検査を行う検査装置1とを含む。検査装置1が検査チップ2から離間した垂直軸線A1を中心として検査チップ2を回転させると、遠心力が検査チップ2に作用する。検査装置1が水平軸線A2を中心に検査チップ2を回転させると、検査チップ2に作用する遠心力の方向である遠心方向が切り替えられる。尚、本実施形態の検査システム3及び検査装置1は、特開2012-78107に記載されているように周知の構造であるので、以下の説明では、検査装置1の構造の概略について説明する。 <1. Schematic structure of inspection system 3>
An embodiment of the present disclosure will be described. A schematic structure of the inspection system 3 will be described with reference to FIG. The inspection system 3 of the present embodiment includes aninspection chip 2 that can store a sample and a reagent that are liquids, and an inspection apparatus 1 that performs an inspection using the inspection chip 2. When the inspection device 1 rotates the inspection chip 2 around the vertical axis A <b> 1 separated from the inspection chip 2, centrifugal force acts on the inspection chip 2. When the inspection apparatus 1 rotates the inspection chip 2 around the horizontal axis A2, the centrifugal direction, which is the direction of the centrifugal force acting on the inspection chip 2, is switched. Note that the inspection system 3 and the inspection apparatus 1 of the present embodiment have a known structure as described in Japanese Patent Application Laid-Open No. 2012-78107. Therefore, in the following description, an outline of the structure of the inspection apparatus 1 will be described.
本開示の実施形態を説明する。図1を参照して、検査システム3の概略構造について説明する。本実施形態の検査システム3は、液体である検体及び試薬を収容可能な検査チップ2と、検査チップ2を用いて検査を行う検査装置1とを含む。検査装置1が検査チップ2から離間した垂直軸線A1を中心として検査チップ2を回転させると、遠心力が検査チップ2に作用する。検査装置1が水平軸線A2を中心に検査チップ2を回転させると、検査チップ2に作用する遠心力の方向である遠心方向が切り替えられる。尚、本実施形態の検査システム3及び検査装置1は、特開2012-78107に記載されているように周知の構造であるので、以下の説明では、検査装置1の構造の概略について説明する。 <1. Schematic structure of inspection system 3>
An embodiment of the present disclosure will be described. A schematic structure of the inspection system 3 will be described with reference to FIG. The inspection system 3 of the present embodiment includes an
<2.検査装置1の構造>
図1を参照して、検査装置1の構造について説明する。以下の説明では、図1の上方、下方、右方、左方、紙面手前側、及び紙面奥側を、それぞれ、検査装置1の前方、後方、右方、左方、上方、及び下方とする。本実施形態では、垂直軸線A1の方向は検査装置1の上下方向であり、水平軸線A2の方向は、検査チップ2が垂直軸線A1を中心として回転される際の速度の方向である。なお、図1は検査装置1の上部筐体30の天板が取り除かれた状態を示す。 <2. Structure of theinspection apparatus 1>
The structure of theinspection apparatus 1 will be described with reference to FIG. In the following description, the upper, lower, right, left, front side, and back side of FIG. 1 are defined as the front, rear, right, left, upper, and lower sides of the inspection apparatus 1, respectively. . In the present embodiment, the direction of the vertical axis A1 is the vertical direction of the inspection apparatus 1, and the direction of the horizontal axis A2 is the direction of the speed when the inspection chip 2 is rotated about the vertical axis A1. FIG. 1 shows a state where the top plate of the upper housing 30 of the inspection apparatus 1 is removed.
図1を参照して、検査装置1の構造について説明する。以下の説明では、図1の上方、下方、右方、左方、紙面手前側、及び紙面奥側を、それぞれ、検査装置1の前方、後方、右方、左方、上方、及び下方とする。本実施形態では、垂直軸線A1の方向は検査装置1の上下方向であり、水平軸線A2の方向は、検査チップ2が垂直軸線A1を中心として回転される際の速度の方向である。なお、図1は検査装置1の上部筐体30の天板が取り除かれた状態を示す。 <2. Structure of the
The structure of the
図1に示すように、検査装置1は、上部筐体30、下部筐体31、上板32、ターンテーブル33、角度変更機構34、及び制御装置90を備える。ターンテーブル33は、後述する上板32の上側に回転可能に設けられた円盤である。検査チップ2は、ターンテーブル33の上方に保持される。角度変更機構34は、ターンテーブル33に設けられた駆動機構である。この角度変更機構34は、水平軸線A2を中心に検査チップ2を各々回転させる。上部筐体30は、後述する上板32に固定されており、検査チップ2に対して光学測定を行う測定部7が内部に設けられている。制御装置90は、検査装置1の各種処理を制御するコントローラである。
As shown in FIG. 1, the inspection apparatus 1 includes an upper housing 30, a lower housing 31, an upper plate 32, a turntable 33, an angle changing mechanism 34, and a control device 90. The turntable 33 is a disk rotatably provided on the upper side of an upper plate 32 described later. The inspection chip 2 is held above the turntable 33. The angle changing mechanism 34 is a drive mechanism provided on the turntable 33. The angle changing mechanism 34 rotates the inspection chip 2 around the horizontal axis A2. The upper housing 30 is fixed to an upper plate 32 described later, and a measurement unit 7 that performs optical measurement on the inspection chip 2 is provided inside. The control device 90 is a controller that controls various processes of the inspection device 1.
下部筐体31の概略構造を説明する。下部筐体31は、枠部材を組み合わせた箱状のフレーム構造を有する。下部筐体31の上面には、長方形の板材である上板32が設けられている。下部筐体31の内部には、垂直軸線A1を中心にターンテーブル33を回転させる駆動機構が、次のように設けられている。
The schematic structure of the lower housing 31 will be described. The lower housing 31 has a box-shaped frame structure in which frame members are combined. An upper plate 32 that is a rectangular plate material is provided on the upper surface of the lower housing 31. A drive mechanism that rotates the turntable 33 around the vertical axis A1 is provided in the lower housing 31 as follows.
下部筐体31内の左方寄りに、ターンテーブル33を回転させるための駆動力を供給する主軸モータ35が設置されている。主軸モータ35の軸36は、上方に突出しており、プーリ37が固定されている。下部筐体31の中央部には、下部筐体31の内部から上方に延びる垂直な主軸57が設けられている。主軸57は、上板32を貫通して、下部筐体31の上側に突出している。主軸57の上端部は、ターンテーブル33の中央部に接続されている。
A spindle motor 35 that supplies a driving force for rotating the turntable 33 is installed on the left side of the lower housing 31. A shaft 36 of the main shaft motor 35 protrudes upward, and a pulley 37 is fixed. A vertical main shaft 57 extending upward from the inside of the lower housing 31 is provided at the center of the lower housing 31. The main shaft 57 passes through the upper plate 32 and protrudes above the lower housing 31. The upper end portion of the main shaft 57 is connected to the center portion of the turntable 33.
主軸57は、上板32の直下に設けられた図示しない支持部材により、回転自在に保持されている。支持部材の下側では、主軸57にプーリ38が固定されている。プーリ37とプーリ38とに亘って、ベルト39が掛け渡されている。主軸モータ35が軸36を回転させると、プーリ37、ベルト39、及びプーリ38を介して駆動力が主軸57に伝達される。このとき、主軸57の回転に連動して、ターンテーブル33が主軸57を中心に回転する。
The main shaft 57 is rotatably held by a support member (not shown) provided immediately below the upper plate 32. A pulley 38 is fixed to the main shaft 57 below the support member. A belt 39 is stretched over the pulley 37 and the pulley 38. When the main shaft motor 35 rotates the shaft 36, the driving force is transmitted to the main shaft 57 via the pulley 37, the belt 39, and the pulley 38. At this time, the turntable 33 rotates around the main shaft 57 in conjunction with the rotation of the main shaft 57.
下部筐体31内の右方寄りに、下部筐体31の内部において上下方向に延びる図示しないガイドレールが設けられている。図示しないT型プレートは、ガイドレールに沿って下部筐体31内において上下方向に移動可能である。
A guide rail (not shown) extending in the vertical direction inside the lower housing 31 is provided on the right side in the lower housing 31. A T-shaped plate (not shown) is movable in the vertical direction in the lower housing 31 along the guide rail.
先述の主軸57は、内部が中空の筒状体である。図示しない内軸は、主軸57の内部において上下方向に移動可能な軸である。内軸の上端部は、主軸57内を貫通してラックギア43に接続されている。T型プレートの左端部には、図示しない軸受が設けられている。軸受の内部では、内軸の下端部が回転自在に保持される。
The above-described main shaft 57 is a hollow cylindrical body. An inner shaft (not shown) is a shaft that can move in the vertical direction inside the main shaft 57. The upper end portion of the inner shaft passes through the main shaft 57 and is connected to the rack gear 43. A bearing (not shown) is provided at the left end of the T-shaped plate. Inside the bearing, the lower end portion of the inner shaft is rotatably held.
T型プレートの前方には、T型プレートを上下動させるためのステッピングモータ51が固定されている。ステッピングモータ51の軸58は後方、すなわち図1では下方側に向けて突出している。軸58の先端には、図示しない円盤状のカム板が固定されている。カム板の後側の面には、図示しない円柱状の突起が設けられている。突起の先端部は、図示しない溝部に挿入されている。突起は、溝部内を摺動可能である。ステッピングモータ51が軸58を回転させると、カム板の回転に連動して突起が上下動する。このとき、溝部に挿入されている突起に連動して、T型プレートがガイドレールに沿って上下動する。
A stepping motor 51 for moving the T-shaped plate up and down is fixed in front of the T-shaped plate. The shaft 58 of the stepping motor 51 protrudes rearward, that is, downward in FIG. A disc-shaped cam plate (not shown) is fixed to the tip of the shaft 58. A cylindrical projection (not shown) is provided on the rear surface of the cam plate. The tip of the protrusion is inserted into a groove (not shown). The protrusion can slide in the groove. When the stepping motor 51 rotates the shaft 58, the protrusion moves up and down in conjunction with the rotation of the cam plate. At this time, the T-shaped plate moves up and down along the guide rail in conjunction with the protrusion inserted in the groove.
角度変更機構34の詳細構造を説明する。角度変更機構34は、ターンテーブル33の上面に固定された一対のL型プレート60を有する。各L型プレート60は、ターンテーブル33の中心近傍に固定された基部から上方に延び、且つ、その上端部がターンテーブル33の径方向外側に向けて延びている。一対のL型プレート60の間には、内軸に固定された図示しないラックギア43が設けられている。ラックギア43は、上下方向に長い金属製の板状部材であり、両端面にギアが各々刻まれている。
The detailed structure of the angle changing mechanism 34 will be described. The angle changing mechanism 34 has a pair of L-shaped plates 60 fixed to the upper surface of the turntable 33. Each L-shaped plate 60 extends upward from a base portion fixed in the vicinity of the center of the turntable 33, and its upper end portion extends outward in the radial direction of the turntable 33. A rack gear 43 (not shown) fixed to the inner shaft is provided between the pair of L-shaped plates 60. The rack gear 43 is a metal plate-like member that is long in the vertical direction, and gears are respectively carved on both end faces.
各L型プレート60の延設方向の先端側では、ギア45を有する水平な支軸46が回転自在に軸支されている。支軸46は図示外の装着用ホルダを介して検査チップ2に固定されている。このため、ギア45の回転に連動して検査チップ2も支軸46を中心に回転する。ギア45とラックギア43との間には、L型プレート60により図示略の水平軸線を中心に回転自在に支持されたピニオンギア44が介在している。ピニオンギア44は、ギア45及びラックギア43にそれぞれ噛合している。ラックギア43の上下動に連動して、ピニオンギア44、及びギア45がそれぞれ従動回転し、ひいては検査チップ2が支軸46を中心に回転する。
A horizontal support shaft 46 having a gear 45 is rotatably supported at the distal end side in the extending direction of each L-shaped plate 60. The support shaft 46 is fixed to the inspection chip 2 via a mounting holder (not shown). For this reason, the inspection chip 2 also rotates around the support shaft 46 in conjunction with the rotation of the gear 45. Between the gear 45 and the rack gear 43, a pinion gear 44 supported by an L-shaped plate 60 so as to be rotatable about a horizontal axis (not shown) is interposed. The pinion gear 44 meshes with the gear 45 and the rack gear 43, respectively. In conjunction with the vertical movement of the rack gear 43, the pinion gear 44 and the gear 45 are driven to rotate, and the inspection chip 2 rotates about the support shaft 46.
本実施形態では、主軸モータ35がターンテーブル33を回転駆動するのに伴って、検査チップ2が垂直軸である主軸57を中心に回転して、検査チップ2に遠心力が付与される。検査チップ2の垂直軸線A1を中心とした回転を、公転と呼ぶ。一方、ステッピングモータ51が内軸を上下動させるのに伴って、検査チップ2が水平軸である支軸46を中心に回転して、検査チップ2に作用する遠心力の方向が相対変化する。検査チップ2の水平軸線A2を中心とした回転を、自転と呼ぶ。
In this embodiment, as the main shaft motor 35 rotates and drives the turntable 33, the inspection chip 2 rotates around the main shaft 57, which is a vertical axis, and centrifugal force is applied to the inspection chip 2. The rotation around the vertical axis A1 of the inspection chip 2 is referred to as revolution. On the other hand, as the stepping motor 51 moves the inner shaft up and down, the inspection chip 2 rotates about the support shaft 46 which is a horizontal axis, and the direction of the centrifugal force acting on the inspection chip 2 changes relatively. The rotation around the horizontal axis A2 of the inspection chip 2 is called autorotation.
T型プレートが可動範囲の最下端まで下降した状態では、ラックギア43も可動範囲の最下端まで下降する。このとき、検査チップ2は、自転角度が0度の定常状態になる。また、T型プレートが可動範囲の最上端まで上昇した状態では、ラックギア43も可動範囲の最上端まで上昇する。このとき、検査チップ2は、定常状態から水平軸線A2を中心に180度回転した状態になる。つまり、本実施形態では検査チップ2が自転可能な角度幅は、自転角度0度~180度である。
When the T plate is lowered to the lowermost end of the movable range, the rack gear 43 is also lowered to the lowermost end of the movable range. At this time, the inspection chip 2 is in a steady state where the rotation angle is 0 degree. Further, in the state where the T-shaped plate is raised to the uppermost end of the movable range, the rack gear 43 is also raised to the uppermost end of the movable range. At this time, the test | inspection chip 2 will be in the state rotated 180 degree | times centering on the horizontal axis line A2 from the steady state. That is, in this embodiment, the angular width that the test chip 2 can rotate is the rotation angle of 0 degrees to 180 degrees.
上部筐体30の詳細構造を説明する。図1に示すように、上部筐体30は、枠部材を組み合わせた箱状のフレーム構造を有し、上板32の左部上側に設置されている。より詳細には、上部筐体30は、ターンテーブル33の回転中心にある主軸57からみて、検査チップ2が回転される範囲の外側に設けられている。
The detailed structure of the upper housing 30 will be described. As shown in FIG. 1, the upper housing 30 has a box-like frame structure in which frame members are combined, and is installed on the upper left side of the upper plate 32. More specifically, the upper housing 30 is provided outside the range in which the inspection chip 2 is rotated as viewed from the main shaft 57 at the rotation center of the turntable 33.
上部筐体30の内部に設けられた測定部7は、測定光を発光する光源71と、光源71から発せられた測定光を検出する光センサ72とを有する。光源71及び光センサ72は、検査チップ2の回転範囲の外側において、ターンテーブル33の前後両側に配置されている。本実施形態では、検査チップ2の公転可能範囲のうちで主軸57の左側位置が、検査チップ2に測定光が照射される測定位置である。検査チップ2が測定位置にある場合、光源71と光センサ72とを結ぶ測定光が、検査チップ2の表面に対して略垂直に交差する。
The measurement unit 7 provided in the upper housing 30 includes a light source 71 that emits measurement light, and an optical sensor 72 that detects the measurement light emitted from the light source 71. The light source 71 and the optical sensor 72 are disposed on both the front and rear sides of the turntable 33 outside the rotation range of the inspection chip 2. In the present embodiment, the position on the left side of the main shaft 57 in the reciprocable range of the inspection chip 2 is the measurement position at which the inspection chip 2 is irradiated with the measurement light. When the inspection chip 2 is at the measurement position, the measurement light connecting the light source 71 and the optical sensor 72 intersects the surface of the inspection chip 2 substantially perpendicularly.
<3.制御装置90の電気的構成>
図1を参照して、制御装置90の電気的構成について説明する。制御装置90は、検査装置1の主制御を司るCPU91と、各種データを一時的に記憶するRAM92と、制御プログラムを記憶したROM93とを有する。CPU91には、ユーザが制御装置90に対する指示を入力するための操作部94と、各種データ、及びプログラムを記憶するハードディスク装置95と、各種情報を表示するディスプレイ96とが接続されている。制御装置90としては、パーソナルコンピュータを用いてもよいし、専用の制御装置を用いてもよい。 <3. Electrical configuration ofcontrol device 90>
The electrical configuration of thecontrol device 90 will be described with reference to FIG. The control device 90 includes a CPU 91 that performs main control of the inspection device 1, a RAM 92 that temporarily stores various data, and a ROM 93 that stores a control program. Connected to the CPU 91 are an operation unit 94 for a user to input instructions to the control device 90, a hard disk device 95 for storing various data and programs, and a display 96 for displaying various information. As the control device 90, a personal computer may be used, or a dedicated control device may be used.
図1を参照して、制御装置90の電気的構成について説明する。制御装置90は、検査装置1の主制御を司るCPU91と、各種データを一時的に記憶するRAM92と、制御プログラムを記憶したROM93とを有する。CPU91には、ユーザが制御装置90に対する指示を入力するための操作部94と、各種データ、及びプログラムを記憶するハードディスク装置95と、各種情報を表示するディスプレイ96とが接続されている。制御装置90としては、パーソナルコンピュータを用いてもよいし、専用の制御装置を用いてもよい。 <3. Electrical configuration of
The electrical configuration of the
さらに、CPU91には、公転コントローラ97、自転コントローラ98、及び測定コントローラ99が接続されている。公転コントローラ97は、主軸モータ35を回転駆動させる制御信号を主軸モータ35に送信することにより、検査チップ2の公転を制御する。自転コントローラ98は、ステッピングモータ51を回転駆動させる制御信号をステッピングモータ51に送信することにより、検査チップ2の自転を制御する。測定コントローラ99は、測定部7を駆動することにより、検査チップ2の光学測定を実行する。詳細には、測定コントローラ99は、光源71の発光、及び光センサ72の光検出を実行させる制御信号を、光源71及び光センサ72に送信する。尚、CPU91が公転コントローラ97、自転コントローラ98及び測定コントローラ99を制御する。
Further, a revolution controller 97, a rotation controller 98, and a measurement controller 99 are connected to the CPU 91. The revolution controller 97 controls the revolution of the inspection chip 2 by transmitting a control signal for rotating the spindle motor 35 to the spindle motor 35. The rotation controller 98 controls the rotation of the inspection chip 2 by transmitting a control signal for rotating the stepping motor 51 to the stepping motor 51. The measurement controller 99 performs optical measurement of the inspection chip 2 by driving the measurement unit 7. Specifically, the measurement controller 99 transmits a control signal for executing light emission of the light source 71 and light detection of the optical sensor 72 to the light source 71 and the optical sensor 72. The CPU 91 controls the revolution controller 97, the rotation controller 98, and the measurement controller 99.
<4.検査チップ2の構造>
以下の図2及び図3を参照して、第一実施形態に係る検査チップ2の詳細構造を説明する。以下の説明では、図2の上方、下方、右方、左方、紙面手前側、及び紙面奥側を、それぞれ、検査チップ2の上方、下方、右方、左方、前方及び後方とする。図3~図10は、シート29を取り除いた検査チップ2の正面図を示している。 <4. Structure ofinspection chip 2>
The detailed structure of thetest chip 2 according to the first embodiment will be described with reference to FIGS. 2 and 3 below. In the following description, the upper, lower, right, left, front side, and back side of FIG. 2 are the upper, lower, right, left, front, and rear sides of the inspection chip 2, respectively. 3 to 10 show front views of the inspection chip 2 with the sheet 29 removed.
以下の図2及び図3を参照して、第一実施形態に係る検査チップ2の詳細構造を説明する。以下の説明では、図2の上方、下方、右方、左方、紙面手前側、及び紙面奥側を、それぞれ、検査チップ2の上方、下方、右方、左方、前方及び後方とする。図3~図10は、シート29を取り除いた検査チップ2の正面図を示している。 <4. Structure of
The detailed structure of the
図2に示すように、検査チップ2は一例として前方から見た場合に正方形状であり、上辺部21、右辺部22、左辺部23及び下辺部24を備え、所定の厚みを有する透明な合成樹脂の板材20を主体とする。板材20の前面は、透明の合成樹脂の薄板から構成されたシート29により封止されている。板材20とシート29との間には、検査チップ2に封入された液体が流動可能な液体流路25が形成されている。液体流路25は、板材20の前面側に所定深さにより形成された凹部であり、板材20の厚み方向である前後方向と直交する方向に延びる。すなわち、シート29は、板材20に形成された液体流路25の流路形成面を封止する。
As shown in FIG. 2, the inspection chip 2 has a square shape when viewed from the front as an example, and includes an upper side part 21, a right side part 22, a left side part 23, and a lower side part 24, and has a predetermined thickness. Mainly a resin plate 20. The front surface of the plate member 20 is sealed with a sheet 29 made of a transparent synthetic resin thin plate. Between the plate member 20 and the sheet 29, a liquid flow path 25 is formed through which the liquid sealed in the inspection chip 2 can flow. The liquid flow path 25 is a recess formed on the front side of the plate member 20 with a predetermined depth, and extends in a direction orthogonal to the front-rear direction, which is the thickness direction of the plate member 20. That is, the sheet 29 seals the flow path forming surface of the liquid flow path 25 formed in the plate material 20.
液体流路25は、検体注入部101、検体保持部112、供給案内部113、定量部120、検体余剰部140、第一試薬注入部102、第一試薬保持部133、第二試薬注入部103、第二試薬保持部143、第一試薬流入口134、第一試薬定量部135、第一試薬余剰部137、第二試薬流入口144、第二試薬定量部145、第二試薬余剰部147、及び測定部150を含む。検査チップ2の上部には、右辺部22から左辺部23に向けて、上辺部21に沿って検体保持部112、検体注入部101、第二試薬保持部143、第二試薬注入部103、第一試薬保持部133及び第一試薬注入部102が配列されている。
The liquid channel 25 includes a sample injection unit 101, a sample holding unit 112, a supply guide unit 113, a quantification unit 120, a sample surplus unit 140, a first reagent injection unit 102, a first reagent holding unit 133, and a second reagent injection unit 103. , Second reagent holding unit 143, first reagent inlet 134, first reagent quantitative unit 135, first reagent surplus unit 137, second reagent inlet 144, second reagent quantitative unit 145, second reagent surplus unit 147, And a measurement unit 150. In the upper part of the test chip 2, from the right side 22 toward the left side 23 along the upper side 21, the sample holding unit 112, the sample injection unit 101, the second reagent holding unit 143, the second reagent injection unit 103, One reagent holding part 133 and the first reagent injection part 102 are arranged.
図2に示すように、検体注入部101は、シート29に形成された図示しない検体注入口から検体10が注入される部位である。検体注入部101は上辺部21から下方に延設される壁部151と壁部151の下端部から斜め右上方に延設される壁部104との間に形成され、且つ上方向に開口している。本実施形態の検体10は、液体から成る第一成分と、第一成分より比重が大きい固体又は半固体から成る第二成分を含む。検体10は、例えば血液、骨髄、尿、膣組織、上皮組織、腫瘍、精液、唾液または食料品などである。一例として、検体10が血液である場合には、第一成分が血漿であり、第二成分が血球である。検体保持部112は、検体注入部101の上方に連結した流路である。検体保持部112は、右辺部22と、右辺部22から斜め左下方に延設される壁部155と、壁部151の下端部から斜め右下方に延設される壁部105との間に形成されている。また、検体保持部112は、壁部104及び右辺部22に沿って下方向に延びる検体10の供給流路である。検体保持部112の下端部は、流路が他の流路より狭く形成された開口部である供給案内部113に接続する。供給案内部113を通過して、検体保持部112から定量部120に検体10が流入する。
As shown in FIG. 2, the sample injection unit 101 is a part into which the sample 10 is injected from a sample injection port (not shown) formed in the sheet 29. The specimen injection portion 101 is formed between a wall portion 151 that extends downward from the upper side portion 21 and a wall portion 104 that extends obliquely to the upper right from the lower end portion of the wall portion 151 and opens upward. ing. The specimen 10 of the present embodiment includes a first component made of a liquid and a second component made of a solid or semi-solid having a specific gravity greater than that of the first component. The specimen 10 is, for example, blood, bone marrow, urine, vaginal tissue, epithelial tissue, tumor, semen, saliva or food. As an example, when the sample 10 is blood, the first component is plasma and the second component is blood cells. The sample holding unit 112 is a flow channel connected to the upper side of the sample injection unit 101. The specimen holding unit 112 is provided between the right side part 22, a wall part 155 extending obliquely lower left from the right side part 22, and a wall part 105 extending obliquely lower right from the lower end part of the wall part 151. Is formed. The sample holding unit 112 is a supply flow path for the sample 10 extending downward along the wall 104 and the right side 22. The lower end portion of the sample holding unit 112 is connected to a supply guide unit 113 that is an opening in which a channel is formed narrower than other channels. The sample 10 flows from the sample holding unit 112 to the quantification unit 120 through the supply guide unit 113.
図3を参照して、定量部120の構造を説明する。供給案内部113の下方には、定量部120が設けられている。定量部120は、供給案内部113に向けて開口すると共に、底面120C、第一壁面120A、第二壁面120B及び凹部126を備えた凹状に形成されている。すなわち、定量部120は、後述する第二案内部129側に傾斜して左斜め上方に開口する凹部である。第一壁面120Aは、定量部120の右側面を構成し、第二壁面120Bは、第一壁面120Aと対向すると共に定量部120の左側面を構成する。底面120Cは、第一壁面120Aの下端部と第二壁面120Bの下端部とを接続する。定量部120の上部の凹部126は、第三壁面120D及び第四壁面120Eを備え、正面から見てL字形状に窪んでいる。第三壁面120Dは第三接続部127を介して第二壁面120Bに接続する。第四壁面120Eの下端部は、第四接続部128を介して第三壁面120Dにおける第三接続部127と反対側の端部に接続する。第四壁面120Eの上端は、第二接続部123を介して後述する第二案内部129に接続する。具体的には、第四壁面120Eの上端は、第二接続部123を介して第二案内部129を形成する第五壁面124に接続する。第六壁面122は、第一接続部121を介して後述する第一案内部130に接続する。具体的には、第六壁面122は、第一接続部121を介して第一案内部130を形成する第一壁面120Aに接続する。第三仮想面K3を延長した面と第四壁面120Eとがなす角度の内、第二案内部129側の角度θ2は、90度以上に形成されている。第三仮想面K3は、第一接続部121と第二接続部123と結ぶ仮想面である。尚、角度θ2の上限は、180度未満である。角度θ2が180度以上になると、凹部126が形成できなくなるからである。
The structure of the quantification unit 120 will be described with reference to FIG. Below the supply guide unit 113, a quantitative unit 120 is provided. The quantification unit 120 opens toward the supply guide unit 113 and is formed in a concave shape including a bottom surface 120C, a first wall surface 120A, a second wall surface 120B, and a recess 126. That is, the fixed quantity part 120 is a recessed part which inclines in the 2nd guide part 129 side mentioned later, and opens diagonally on the left. 120 A of 1st wall surfaces comprise the right side surface of the fixed_quantity | quantitative_assay part 120, and 120B of 2nd wall surfaces comprise 120 A of 1st wall surfaces, and comprise the left side surface of the fixed_quantity | quantitative_assay part 120. The bottom surface 120C connects the lower end portion of the first wall surface 120A and the lower end portion of the second wall surface 120B. The recess 126 at the top of the quantification unit 120 includes a third wall surface 120D and a fourth wall surface 120E, and is recessed in an L shape when viewed from the front. The third wall surface 120D is connected to the second wall surface 120B through the third connection portion 127. A lower end portion of the fourth wall surface 120E is connected to an end portion of the third wall surface 120D opposite to the third connection portion 127 via the fourth connection portion 128. The upper end of the fourth wall surface 120 </ b> E is connected to a second guide portion 129 described later via the second connection portion 123. Specifically, the upper end of the fourth wall surface 120 </ b> E is connected to the fifth wall surface 124 that forms the second guide portion 129 via the second connection portion 123. The sixth wall surface 122 is connected to the first guide part 130 described later via the first connection part 121. Specifically, the sixth wall surface 122 is connected to the first wall surface 120 </ b> A that forms the first guide portion 130 via the first connection portion 121. Of the angles formed by the surface extending from the third virtual surface K3 and the fourth wall surface 120E, the angle θ2 on the second guide portion 129 side is formed to be 90 degrees or more. The third virtual surface K3 is a virtual surface connecting the first connection part 121 and the second connection part 123. The upper limit of the angle θ2 is less than 180 degrees. This is because the concave portion 126 cannot be formed when the angle θ2 is 180 degrees or more.
定量部120では、検体10の定量と、遠心力の作用により検体10を第一成分10Aと第一成分10Aより比重が大きい第二成分10Bとに分離する遠心分離とが行われる。即ち、定量部120は、分離部としての機能も兼ねる。一例として、検体10が血液の場合には、定量部120において、第一成分10Aである血漿と、第二成分10Bである血球とに分離される。
The quantification unit 120 performs quantification of the specimen 10 and centrifugal separation that separates the specimen 10 into a first component 10A and a second component 10B having a higher specific gravity than the first component 10A by the action of centrifugal force. That is, the quantification unit 120 also functions as a separation unit. As an example, when the specimen 10 is blood, the quantification unit 120 separates the plasma as the first component 10A and the blood cells as the second component 10B.
供給案内部113と定量部120とが連通する部位から、流路である第一案内部130が右斜め上方向に延び、右辺部22に沿って下方に延びている流路160に接続している。流路160の下流側の端部には、図2に示す測定部150が設けられている。測定部150は混合部として機能する。
From the portion where the supply guide unit 113 and the fixed amount unit 120 communicate with each other, the first guide unit 130 that is a flow channel extends obliquely upward to the right and is connected to the flow channel 160 that extends downward along the right side portion 22. Yes. A measurement unit 150 shown in FIG. 2 is provided at the downstream end of the flow channel 160. The measurement unit 150 functions as a mixing unit.
供給案内部113には、左斜め下に延びる流路である第二案内部129が接続している。第二案内部129は、定量部120の左下方に設けられた検体余剰部140まで延びている。検体余剰部140は、定量部120から溢れ出た検体10が貯留される部位であり、第二案内部129の下端部から右方向に延びる凹部である。第二案内部129は、流路の形成方向が変わるように前方からみて屈曲している。これにより、第二案内部129において検体10が定量部120と検体余剰部140との間を移動するためには、検体10に複数の異なる方向の外力を付与する必要がある。つまり検体余剰部140に貯留された検体10は、第二案内部129を介して定量部120に逆流しにくい。
The supply guide 113 is connected to a second guide 129 that is a channel extending diagonally to the left. The second guide part 129 extends to the specimen surplus part 140 provided on the lower left side of the fixed quantity part 120. The specimen surplus part 140 is a part where the specimen 10 overflowing from the quantification part 120 is stored, and is a concave part extending rightward from the lower end part of the second guide part 129. The second guide portion 129 is bent when viewed from the front so that the flow path forming direction changes. Thus, in order for the sample 10 to move between the quantification unit 120 and the sample surplus unit 140 in the second guide unit 129, it is necessary to apply external forces in a plurality of different directions to the sample 10. That is, the specimen 10 stored in the specimen surplus section 140 is unlikely to flow back to the quantification section 120 via the second guide section 129.
定量部120の第一接続部121からは、第一案内部130を構成する第六壁面122が右斜め上方に延設され、定量部120の第二接続部123からは、第二案内部129を構成する第五壁面124が左斜め下方に延設されている。図3に示すように、第五壁面124を延設した第一仮想面K1は、第六壁面122に交差する。第一接続部121と第二接続部123とを結ぶ第三仮想面K3は、後述する第二ステップにおいて、検体10が定量される定量面となる。第二ステップにおいて、定量される検体10の量は、第一壁面120A、第二壁面120B、底面120C、第三壁面120D、第四壁面120E、第三仮想面K3、定量部120の背面120F及びシート29により囲まれる体積である。第一接続部121と第三接続部127とを結ぶ第二仮想面K2は、後述する第四ステップにおいて、第一成分10Aが定量される定量面である。ここで、定量される第一成分10Aの体積は、第三壁面120D、第四壁面120E、第二仮想面K2、第三仮想面K3、定量部120の背面120F及びシート29により囲まれる体積である。この体積は、測定部150にて行われる検査に必要な量となるように決められている。
From the first connection part 121 of the quantification part 120, the sixth wall surface 122 constituting the first guide part 130 extends obliquely upward to the right, and from the second connection part 123 of the quantification part 120, the second guide part 129. The fifth wall surface 124 that extends is extended obliquely downward to the left. As shown in FIG. 3, the first virtual surface K <b> 1 extending the fifth wall surface 124 intersects the sixth wall surface 122. The third virtual surface K3 connecting the first connection part 121 and the second connection part 123 is a quantitative surface on which the specimen 10 is quantified in the second step described later. In the second step, the amount of the specimen 10 to be quantified includes the first wall surface 120A, the second wall surface 120B, the bottom surface 120C, the third wall surface 120D, the fourth wall surface 120E, the third virtual surface K3, the back surface 120F of the quantification unit 120, and The volume is surrounded by the sheet 29. The second virtual surface K2 connecting the first connection portion 121 and the third connection portion 127 is a quantitative surface on which the first component 10A is quantified in a fourth step described later. Here, the volume of the first component 10A to be quantified is a volume surrounded by the third wall surface 120D, the fourth wall surface 120E, the second virtual surface K2, the third virtual surface K3, the back surface 120F of the quantification unit 120, and the sheet 29. is there. This volume is determined to be an amount necessary for the inspection performed in the measurement unit 150.
第三壁面120Dは、第一接続部121と第三接続部127とを結ぶ第二仮想面K2よりも第二案内部129側に存在する。第三仮想面K3を延長した面と第四壁面120Eとがなす角度の内、第二案内部129側の角度θ2は、90度以上に形成されている。第一接続部121と第三接続部127とを結ぶ第二仮想面K2と、第六壁面122とがなす角度の内、第二接続部123側の角度θ3は、180度より大きく形成されている。角度θ3が180度より大きく形成されているのは、角度θ3が180度以下だと、遠心力により定量部120にて定量された第一成分が第一案内部130に流れなくなるからである。角度θ3の上限は、第六壁面122が第一壁面120Aと平行になる角度までである。
3rd wall surface 120D exists in the 2nd guide part 129 side rather than the 2nd virtual surface K2 which connects the 1st connection part 121 and the 3rd connection part 127. FIG. Of the angles formed by the surface extending from the third virtual surface K3 and the fourth wall surface 120E, the angle θ2 on the second guide portion 129 side is formed to be 90 degrees or more. Of the angles formed by the second virtual surface K2 connecting the first connection portion 121 and the third connection portion 127 and the sixth wall surface 122, the angle θ3 on the second connection portion 123 side is formed to be greater than 180 degrees. Yes. The reason why the angle θ3 is formed larger than 180 degrees is that when the angle θ3 is 180 degrees or less, the first component quantified by the quantification unit 120 due to centrifugal force does not flow to the first guide unit 130. The upper limit of the angle θ3 is up to an angle at which the sixth wall surface 122 is parallel to the first wall surface 120A.
第一案内部130が形成された壁面の内、供給案内部113側の壁部155の下側の壁面155Bに対して直角方向に供給案内部113側の端部155Aから引いた仮想線Jは、定量部120の底面120Cと交差している。
The imaginary line J drawn from the end portion 155A on the supply guide portion 113 side in a direction perpendicular to the lower wall surface 155B of the wall portion 155 on the supply guide portion 113 side among the wall surfaces on which the first guide portion 130 is formed is , Which intersects the bottom surface 120C of the quantitative unit 120.
定量部120では、第三仮想面K3を延長した面に対する第五壁面124の傾斜角度θ4より、第三仮想面K3を延長した面に対する第六壁面122の傾斜角度θ5が大きく形成されている。傾斜角度θ4は、第三仮想面K3を延長した面に対する第五壁面124の成す角の内の鋭角である。従って、検査チップ2へ遠心力を作用させて定量部120へ検体10の注入をするときに、検体10が第六壁面122を乗り越えて流路160に漏れずに検体余剰部140へ流入させることが出来る。
In the quantification unit 120, the inclination angle θ5 of the sixth wall surface 122 with respect to the surface extending the third virtual surface K3 is larger than the inclination angle θ4 of the fifth wall surface 124 with respect to the surface extending the third virtual surface K3. The inclination angle θ4 is an acute angle among the angles formed by the fifth wall surface 124 with respect to a surface obtained by extending the third virtual surface K3. Therefore, when the sample 10 is injected into the quantification unit 120 by applying a centrifugal force to the test chip 2, the sample 10 passes over the sixth wall surface 122 and flows into the sample surplus unit 140 without leaking into the flow channel 160. I can do it.
次に、図2を参照して、第一試薬注入部102について説明する。第一試薬注入部102はシート29に形成された図示しない第一試薬注入口から第一試薬13が注入される部位である。第一試薬注入部102は、左辺部23と左辺部23から斜め右上方に延設される壁部131との間に形成され、且つ上側に開口する凹部である。第一試薬保持部133は、第一試薬注入部102に連結し、壁部131と上辺部21から下方に延設される壁部152との間に形成される。第一試薬保持部133の下方には、第一試薬13が所定量定量される第一試薬定量部135に第一試薬13を流入させる第一試薬流入口134が形成されている。第一試薬定量部135は、第一試薬13が検査に必要な量である所定量定量される容量の凹部に形成されている。すなわち、所定量は、定量部120から測定部150に移動した第一成分の量に基づく量である。第一試薬流入口134には、流路136が接続している。流路136は、第一試薬定量部135の左下方に設けられた第一試薬余剰部137まで延びている。また、第一試薬流入口134と第一試薬定量部135とが連通する部位から、流路138が右斜め上方向に所定長さ延び、屈曲して下方に所定長さ延びている。
Next, the first reagent injection unit 102 will be described with reference to FIG. The first reagent injection part 102 is a part into which the first reagent 13 is injected from a first reagent injection port (not shown) formed in the sheet 29. The first reagent injection part 102 is a recess formed between the left side part 23 and the wall part 131 extending obliquely upward to the right from the left side part 23 and opening upward. The first reagent holding part 133 is connected to the first reagent injection part 102 and is formed between the wall part 131 and the wall part 152 extending downward from the upper side part 21. Below the first reagent holding unit 133, a first reagent inflow port 134 is formed for allowing the first reagent 13 to flow into the first reagent quantifying unit 135 for quantifying a predetermined amount of the first reagent 13. The first reagent quantification unit 135 is formed in a recess having a capacity for quantifying a predetermined amount of the first reagent 13 that is necessary for the inspection. That is, the predetermined amount is an amount based on the amount of the first component moved from the quantification unit 120 to the measurement unit 150. A flow path 136 is connected to the first reagent inlet 134. The flow path 136 extends to the first reagent surplus portion 137 provided at the lower left of the first reagent fixed amount portion 135. Further, from a portion where the first reagent inlet 134 and the first reagent quantitative unit 135 communicate with each other, the flow path 138 extends a predetermined length in the upper right direction and is bent to extend a predetermined length downward.
第二試薬注入部103はシート29に形成された図示しない第二試薬注入口から第二試薬14が注入される部位である。第二試薬注入部103は、壁部152と壁部152から斜め右上方に延設される壁部141との間に形成され、且つ上側に開口する凹部である。第二試薬保持部143は、第二試薬注入部103に連結し、壁部141と壁部151との間に形成される。第二試薬保持部143の下方には、第二試薬14が所定量定量される第二試薬定量部145に第二試薬14を流入させる第二試薬流入口144が形成されている。第二試薬定量部145は、第二試薬14が、検査に必要な量である所定量定量される容量の凹部に形成されている。すなわち、所定量は、定量部120から測定部150に移動した第一成分の量に基づく量である。第二試薬流入口144には、流路146が接続している。流路146は、第二試薬定量部145の左下方に設けられた第二試薬余剰部147まで延びている。また、第二試薬流入口144と第二試薬定量部145とが連通する部位から、流路139が右斜め上方向に所定長さ延び、屈曲して下方に所定長さ延びている。
The second reagent injection part 103 is a part into which the second reagent 14 is injected from a second reagent injection port (not shown) formed in the sheet 29. The second reagent injecting portion 103 is a recess formed between the wall portion 152 and the wall portion 141 extending obliquely upward to the right from the wall portion 152 and opening upward. The second reagent holding part 143 is connected to the second reagent injection part 103 and is formed between the wall part 141 and the wall part 151. Below the second reagent holding unit 143, a second reagent inflow port 144 through which the second reagent 14 flows into the second reagent quantifying unit 145 for quantifying a predetermined amount of the second reagent 14 is formed. The second reagent quantification unit 145 is formed in a recess having a capacity in which the second reagent 14 is quantified by a predetermined amount, which is an amount necessary for inspection. That is, the predetermined amount is an amount based on the amount of the first component moved from the quantification unit 120 to the measurement unit 150. A flow path 146 is connected to the second reagent inlet 144. The channel 146 extends to the second reagent surplus portion 147 provided at the lower left of the second reagent fixed amount portion 145. In addition, from the part where the second reagent inlet 144 and the second reagent quantitative unit 145 communicate with each other, the flow path 139 extends a predetermined length in the upper right direction, and is bent and extends a predetermined length downward.
図2に示すように、検体注入部101、第一試薬注入部102、及び第二試薬注入部103は、検査チップ2の上側の壁面である上辺部21に沿って、板材20の前面に左右方向に並んで形成されている。
As shown in FIG. 2, the sample injection unit 101, the first reagent injection unit 102, and the second reagent injection unit 103 are arranged on the front surface of the plate member 20 along the upper side portion 21 that is the upper wall surface of the test chip 2. It is formed side by side in the direction.
測定部150は、検査チップ2の右下部に設けられた上側に開口する矩形状の凹部である。測定部150では、流路160から流入する第一成分と、流路138から流入する第一試薬13と、流路139から流入する第二試薬14とが混合され、図10に示す混合液170が生成される。生成された混合液170は、測定部150を通る測定光により光学測定される。生成された混合液170の測定方法は、光学測定に限られず、他の方法でもよい。
The measurement unit 150 is a rectangular recess that opens on the upper right side of the inspection chip 2 and opens on the upper side. In the measurement unit 150, the first component flowing in from the flow path 160, the first reagent 13 flowing in from the flow path 138, and the second reagent 14 flowing in from the flow path 139 are mixed, and the mixed liquid 170 shown in FIG. Is generated. The generated mixed liquid 170 is optically measured by measurement light passing through the measurement unit 150. The method of measuring the generated mixed liquid 170 is not limited to optical measurement, and other methods may be used.
検体10を検体注入部101に注入するためには、例えば、図示しない器具に収容された検体10が、ユーザの操作により検体注入口から注入されればよい。すなわち、公知の手法を用いて、検体注入口を介して検体10が検体注入部101に注入されればよい。第一試薬13及び第二試薬14の注入も同様の方法を用いればよい。図2は、検体10、第一試薬13及び第二試薬14を注入した状態を示している。尚、検体注入部101、第一試薬注入部102、及び第二試薬注入部103の各注入口は、上辺部21を開口した形状としてもよい。
In order to inject the sample 10 into the sample injection unit 101, for example, the sample 10 accommodated in an instrument (not shown) may be injected from the sample injection port by a user operation. That is, the sample 10 may be injected into the sample injection unit 101 via the sample injection port using a known technique. A similar method may be used for injection of the first reagent 13 and the second reagent 14. FIG. 2 shows a state in which the specimen 10, the first reagent 13, and the second reagent 14 are injected. In addition, each injection port of the specimen injection unit 101, the first reagent injection unit 102, and the second reagent injection unit 103 may have a shape in which the upper side portion 21 is opened.
<5.検査方法の一例>
図2~図10を参照して、検査装置1及び検査チップ2を用いた検査方法について説明する。検査チップ2の自転、公転、及び回転数の制御は、それぞれ、所定の基準時間が経過したか否かで制御される。基準時間の情報は制御装置90のHDD95に予め記憶されている。検査チップ2が支軸46に取り付けられて、制御装置90に操作部94から処理開始のコマンドが入力されると、以下の測定動作が実行される。なお、検査装置1は二つの検査チップ2を同時に検査可能であるが、以下では説明の便宜のため、一つの検査チップ2を検査する手順を説明する。以下の説明では、図2に示す検査チップ2の定常状態を自転角度0度と言い、定常状態から80度反時計回りに回転した状態を「自転角度80度」と言い、定常状態から85度反時計回りに回転した状態を「自転角度85度」と言い、定常状態から90度反時計回りに回転した状態を「自転角度90度」と言う。また、検査チップ2には、検体10、第一試薬13及び第二試薬14が注入された状態になっている。 <5. Example of inspection method>
An inspection method using theinspection apparatus 1 and the inspection chip 2 will be described with reference to FIGS. The rotation, revolution, and rotation speed of the inspection chip 2 are controlled based on whether a predetermined reference time has elapsed. Information on the reference time is stored in advance in the HDD 95 of the control device 90. When the inspection chip 2 is attached to the spindle 46 and a processing start command is input from the operation unit 94 to the control device 90, the following measurement operation is executed. Note that the inspection apparatus 1 can inspect two inspection chips 2 at the same time, but the procedure for inspecting one inspection chip 2 will be described below for convenience of explanation. In the following description, the steady state of the inspection chip 2 shown in FIG. 2 is referred to as a rotation angle of 0 degree, the state rotated from the steady state by 80 degrees counterclockwise is referred to as “rotation angle of 80 degrees”, and from the steady state to 85 degrees. The state rotated counterclockwise is referred to as “rotation angle 85 degrees”, and the state rotated 90 degrees counterclockwise from the steady state is referred to as “rotation angle 90 degrees”. Further, the test chip 2, the first reagent 13, and the second reagent 14 are injected.
図2~図10を参照して、検査装置1及び検査チップ2を用いた検査方法について説明する。検査チップ2の自転、公転、及び回転数の制御は、それぞれ、所定の基準時間が経過したか否かで制御される。基準時間の情報は制御装置90のHDD95に予め記憶されている。検査チップ2が支軸46に取り付けられて、制御装置90に操作部94から処理開始のコマンドが入力されると、以下の測定動作が実行される。なお、検査装置1は二つの検査チップ2を同時に検査可能であるが、以下では説明の便宜のため、一つの検査チップ2を検査する手順を説明する。以下の説明では、図2に示す検査チップ2の定常状態を自転角度0度と言い、定常状態から80度反時計回りに回転した状態を「自転角度80度」と言い、定常状態から85度反時計回りに回転した状態を「自転角度85度」と言い、定常状態から90度反時計回りに回転した状態を「自転角度90度」と言う。また、検査チップ2には、検体10、第一試薬13及び第二試薬14が注入された状態になっている。 <5. Example of inspection method>
An inspection method using the
〈液体移動ステップ〉
まず、主軸モータ35が制御装置90のCPU91の指示に基づき、ターンテーブル33の駆動を開始する。この結果、自転角度が0度の検査チップ2が公転する。主軸モータ35は、CPU91の指示に基づき、ターンテーブル33の回転速度を上げる。一例として、回転速度が3000rpmに達すると、主軸モータ35はこの回転速度を保持する。尚、ターンテーブル33の回転速度は、3000rpmに限られず、他の回転速度でもよい。この状態で、図4に示すように、左辺部23から右辺部22に向けて、検査チップ2に遠心力Fが作用する。遠心力Fの作用により検体10は検体注入部101から検体保持部112に移動する。同様に、第一試薬13は第一試薬注入部102から第一試薬保持部133に移動する。第二試薬14は第二試薬注入部103から第二試薬保持部143に移動する。この状態での公転時間は、検体10、第一試薬13、及び第二試薬14が、上述した移動を行うのに十分な時間はHDD95に予め記憶されている。 <Liquid transfer step>
First, thespindle motor 35 starts driving the turntable 33 based on an instruction from the CPU 91 of the control device 90. As a result, the inspection chip 2 having a rotation angle of 0 degrees revolves. The spindle motor 35 increases the rotation speed of the turntable 33 based on an instruction from the CPU 91. As an example, when the rotational speed reaches 3000 rpm, the spindle motor 35 maintains this rotational speed. Note that the rotation speed of the turntable 33 is not limited to 3000 rpm, and may be other rotation speeds. In this state, as shown in FIG. 4, centrifugal force F acts on the test chip 2 from the left side 23 toward the right side 22. The specimen 10 moves from the specimen injection section 101 to the specimen holding section 112 by the action of the centrifugal force F. Similarly, the first reagent 13 moves from the first reagent injection unit 102 to the first reagent holding unit 133. The second reagent 14 moves from the second reagent injection unit 103 to the second reagent holding unit 143. The revolution time in this state is stored in advance in the HDD 95 for a time sufficient for the specimen 10, the first reagent 13, and the second reagent 14 to move as described above.
まず、主軸モータ35が制御装置90のCPU91の指示に基づき、ターンテーブル33の駆動を開始する。この結果、自転角度が0度の検査チップ2が公転する。主軸モータ35は、CPU91の指示に基づき、ターンテーブル33の回転速度を上げる。一例として、回転速度が3000rpmに達すると、主軸モータ35はこの回転速度を保持する。尚、ターンテーブル33の回転速度は、3000rpmに限られず、他の回転速度でもよい。この状態で、図4に示すように、左辺部23から右辺部22に向けて、検査チップ2に遠心力Fが作用する。遠心力Fの作用により検体10は検体注入部101から検体保持部112に移動する。同様に、第一試薬13は第一試薬注入部102から第一試薬保持部133に移動する。第二試薬14は第二試薬注入部103から第二試薬保持部143に移動する。この状態での公転時間は、検体10、第一試薬13、及び第二試薬14が、上述した移動を行うのに十分な時間はHDD95に予め記憶されている。 <Liquid transfer step>
First, the
〈第一ステップ〉
次に、CPU91の指示に基づくステッピングモータ51の駆動制御により、図5に示すように、公転中の検査チップ2が前方からみて反時計回りに85度自転される。これにより、検査チップ2の自転角度が85度に変化する。ターンテーブル33の回転速度は、一例として、3000rpmである。この結果、図5の矢印F方向に遠心力Fが作用する。遠心力Fの作用方向は、図3に示す仮想線Jの方向、すなわち、供給案内部113から定量部120の底面120Cに向かう方向となる。従って、遠心力Fの作用により検体10は検体保持部112から供給案内部113を介して定量部120に注入される。このとき、定量部120に注入される検体10の体積は、図3に示す定量部120の第一壁面120A、第二壁面120B、底面120C、第三壁面120D、第四壁面120E及び第一仮想面K1にて囲まれる体積となる。従って、図3に示す定量部120の第一壁面120A、第二壁面120B、底面120C、第三壁面120D、第四壁面120E及び第三仮想面K3にて囲まれる体積より多い。定量部120から溢れた検体10は、検体余剰部140に収容される。第一試薬13は第一試薬保持部133から第一試薬流入口134を介して第一試薬定量部135に注入される。第一試薬定量部135から溢れた第一試薬13は第一試薬余剰部137に収容される。第二試薬14は第二試薬保持部143から第二試薬流入口144を介して第二試薬定量部145に注入される。第二試薬定量部145から溢れた第二試薬14は第二試薬余剰部147に収容される。 <First step>
Next, by the drive control of the steppingmotor 51 based on the instruction of the CPU 91, as shown in FIG. 5, the revolving test chip 2 is rotated 85 degrees counterclockwise when viewed from the front. Thereby, the rotation angle of the test | inspection chip 2 changes to 85 degree | times. As an example, the rotation speed of the turntable 33 is 3000 rpm. As a result, centrifugal force F acts in the direction of arrow F in FIG. The direction of action of the centrifugal force F is the direction of the phantom line J shown in FIG. 3, that is, the direction from the supply guide unit 113 toward the bottom surface 120C of the quantitative unit 120. Therefore, the specimen 10 is injected from the specimen holding part 112 into the fixed quantity part 120 through the supply guide part 113 by the action of the centrifugal force F. At this time, the volume of the specimen 10 injected into the quantification unit 120 corresponds to the first wall surface 120A, the second wall surface 120B, the bottom surface 120C, the third wall surface 120D, the fourth wall surface 120E, and the first virtual wall of the quantification unit 120 shown in FIG. The volume is surrounded by the surface K1. Accordingly, the volume is larger than the volume surrounded by the first wall surface 120A, the second wall surface 120B, the bottom surface 120C, the third wall surface 120D, the fourth wall surface 120E, and the third virtual surface K3 of the quantification unit 120 shown in FIG. The sample 10 overflowing from the quantification unit 120 is stored in the sample surplus unit 140. The first reagent 13 is injected from the first reagent holding unit 133 into the first reagent quantitative unit 135 via the first reagent inlet 134. The first reagent 13 overflowing from the first reagent quantitative unit 135 is stored in the first reagent surplus unit 137. The second reagent 14 is injected from the second reagent holding unit 143 into the second reagent quantitative unit 145 through the second reagent inflow port 144. The second reagent 14 overflowing from the second reagent quantitative unit 145 is stored in the second reagent surplus unit 147.
次に、CPU91の指示に基づくステッピングモータ51の駆動制御により、図5に示すように、公転中の検査チップ2が前方からみて反時計回りに85度自転される。これにより、検査チップ2の自転角度が85度に変化する。ターンテーブル33の回転速度は、一例として、3000rpmである。この結果、図5の矢印F方向に遠心力Fが作用する。遠心力Fの作用方向は、図3に示す仮想線Jの方向、すなわち、供給案内部113から定量部120の底面120Cに向かう方向となる。従って、遠心力Fの作用により検体10は検体保持部112から供給案内部113を介して定量部120に注入される。このとき、定量部120に注入される検体10の体積は、図3に示す定量部120の第一壁面120A、第二壁面120B、底面120C、第三壁面120D、第四壁面120E及び第一仮想面K1にて囲まれる体積となる。従って、図3に示す定量部120の第一壁面120A、第二壁面120B、底面120C、第三壁面120D、第四壁面120E及び第三仮想面K3にて囲まれる体積より多い。定量部120から溢れた検体10は、検体余剰部140に収容される。第一試薬13は第一試薬保持部133から第一試薬流入口134を介して第一試薬定量部135に注入される。第一試薬定量部135から溢れた第一試薬13は第一試薬余剰部137に収容される。第二試薬14は第二試薬保持部143から第二試薬流入口144を介して第二試薬定量部145に注入される。第二試薬定量部145から溢れた第二試薬14は第二試薬余剰部147に収容される。 <First step>
Next, by the drive control of the stepping
〈第二ステップ〉
次に、CPU91の指示に基づくステッピングモータ51の駆動制御により、図6に示すように、公転中の検査チップ2が前方からみて反時計回りに5度自転される。これにより、検査チップ2の自転角度が90度に変化する。ターンテーブル33の回転速度は、一例として、3000rpmである。この結果、上辺部21と遠心力の方向との成す角度が90度になるように検査チップ2に遠心力Fが作用する。この自転による遠心力Fの作用方向は、供給案内部113の開口方向、つまり、供給案内部113の連通方向となる。すなわち、遠心力Fの作用方向は、図3に示す定量部120の第三仮想面K3と直交する方向となる。この状態にて公転が行われることにより定量部120に注入された検体10の定量が行われる。ここで、定量される検体10の体積は、図3に示す定量部120の第一壁面120A、第二壁面120B、底面120C、第三壁面120D、第四壁面120E及び第三仮想面K3にて囲まれる体積である。同様に第一試薬13は第一試薬定量部135にて定量される。第二試薬14も第二試薬定量部145にて定量される。この状態での公転時間は、検体10、第一試薬13、及び第二試薬14が、上述した回転速度、移動及び検体の遠心分離を行うのに十分な時間はHDD95に予め記憶されている。 <Second step>
Next, by the drive control of the steppingmotor 51 based on the instruction of the CPU 91, as shown in FIG. 6, the revolving test chip 2 is rotated five times counterclockwise when viewed from the front. Thereby, the rotation angle of the test | inspection chip 2 changes to 90 degree | times. As an example, the rotation speed of the turntable 33 is 3000 rpm. As a result, the centrifugal force F acts on the test chip 2 so that the angle formed by the upper side portion 21 and the direction of the centrifugal force is 90 degrees. The direction of action of the centrifugal force F by this rotation is the opening direction of the supply guide portion 113, that is, the communication direction of the supply guide portion 113. That is, the direction of action of the centrifugal force F is a direction orthogonal to the third virtual plane K3 of the quantification unit 120 shown in FIG. By performing revolution in this state, the sample 10 injected into the quantification unit 120 is quantified. Here, the volume of the specimen 10 to be quantified is the first wall surface 120A, the second wall surface 120B, the bottom surface 120C, the third wall surface 120D, the fourth wall surface 120E, and the third virtual surface K3 of the quantification unit 120 shown in FIG. The volume that is enclosed. Similarly, the first reagent 13 is quantified by the first reagent quantification unit 135. The second reagent 14 is also quantified by the second reagent quantification unit 145. The revolution time in this state is stored in advance in the HDD 95 for a time sufficient for the specimen 10, the first reagent 13, and the second reagent 14 to perform the above-described rotation speed, movement, and specimen centrifugation.
次に、CPU91の指示に基づくステッピングモータ51の駆動制御により、図6に示すように、公転中の検査チップ2が前方からみて反時計回りに5度自転される。これにより、検査チップ2の自転角度が90度に変化する。ターンテーブル33の回転速度は、一例として、3000rpmである。この結果、上辺部21と遠心力の方向との成す角度が90度になるように検査チップ2に遠心力Fが作用する。この自転による遠心力Fの作用方向は、供給案内部113の開口方向、つまり、供給案内部113の連通方向となる。すなわち、遠心力Fの作用方向は、図3に示す定量部120の第三仮想面K3と直交する方向となる。この状態にて公転が行われることにより定量部120に注入された検体10の定量が行われる。ここで、定量される検体10の体積は、図3に示す定量部120の第一壁面120A、第二壁面120B、底面120C、第三壁面120D、第四壁面120E及び第三仮想面K3にて囲まれる体積である。同様に第一試薬13は第一試薬定量部135にて定量される。第二試薬14も第二試薬定量部145にて定量される。この状態での公転時間は、検体10、第一試薬13、及び第二試薬14が、上述した回転速度、移動及び検体の遠心分離を行うのに十分な時間はHDD95に予め記憶されている。 <Second step>
Next, by the drive control of the stepping
〈第三ステップ〉
次に、CPU91の指示に基づくステッピングモータ51の駆動制御により、図7に示すように、公転中の検査チップ2が前方からみて時計回りに10度自転される。これにより、検査チップ2の自転角度が80度に変化する。この結果、上辺部21と遠心力の方向との成す角度が80度になるように検査チップ2に遠心力Fが作用する。ここで、図7に示すように定量部120における検体10の液面は遠心力の方向Fと直交する方向となる。第一ステップにおいて自転角度が85度であったのに対して、第三ステップにおいて自転角度が80度と低角になったことにより、定量部120において第二接続部123から第四接続部128の間に検体10の液面が位置する。従って、定量部120から第二案内部129側に検体10が漏れて流れることを低減できる。図7に示す定量部120に注入された検体10は、図8に示すように、第一成分10Aと第二成分10Bとに遠心分離される。図8に示す例では、ターンテーブル33の回転速度は、第二ステップの回転速度よりも速くなる。一例として、5000rpmに速くなる。図8に示すように、この高速の公転が行われることにより定量部120に注入された検体10は、短時間で第一成分10Aと第一成分より比重の大きい第二成分10Bとに遠心分離される。第二成分10Bは、第一成分10Aより比重が大きいため定量部120の底面120C側に溜まる。例えば、検体10が血液の場合には、第一成分10Aである血漿と第二成分10Bである血球とに分離され、血球が定量部120の底面120C側に溜まる。この状態での公転時間は、検体10、第一試薬13、及び第二試薬14が、上述した回転速度、移動及び検体の遠心分離を行うのに十分な時間はHDD95に予め記憶されている。 <Third step>
Next, as shown in FIG. 7, by the drive control of the steppingmotor 51 based on the instruction of the CPU 91, the revolving test chip 2 is rotated 10 degrees clockwise as viewed from the front. Thereby, the rotation angle of the test | inspection chip 2 changes to 80 degree | times. As a result, the centrifugal force F acts on the test chip 2 so that the angle formed by the upper side portion 21 and the direction of the centrifugal force is 80 degrees. Here, as shown in FIG. 7, the liquid level of the specimen 10 in the quantitative unit 120 is in a direction orthogonal to the direction F of the centrifugal force. While the rotation angle in the first step was 85 degrees, in the third step, the rotation angle became a low angle of 80 degrees. The liquid level of the specimen 10 is located between the two. Accordingly, it is possible to reduce the leakage of the specimen 10 from the quantification unit 120 to the second guide unit 129 side. As shown in FIG. 8, the specimen 10 injected into the quantitative unit 120 shown in FIG. 7 is centrifuged into the first component 10A and the second component 10B. In the example shown in FIG. 8, the rotation speed of the turntable 33 is faster than the rotation speed of the second step. As an example, the speed is increased to 5000 rpm. As shown in FIG. 8, the specimen 10 injected into the quantification unit 120 by performing this high-speed revolution is centrifuged in a short time into the first component 10A and the second component 10B having a higher specific gravity than the first component. Is done. Since the second component 10B has a specific gravity greater than that of the first component 10A, it accumulates on the bottom surface 120C side of the quantitative unit 120. For example, when the specimen 10 is blood, it is separated into plasma as the first component 10A and blood cells as the second component 10B, and the blood cells accumulate on the bottom surface 120C side of the quantification unit 120. The revolution time in this state is stored in advance in the HDD 95 for a time sufficient for the specimen 10, the first reagent 13, and the second reagent 14 to perform the above-described rotation speed, movement, and specimen centrifugation.
次に、CPU91の指示に基づくステッピングモータ51の駆動制御により、図7に示すように、公転中の検査チップ2が前方からみて時計回りに10度自転される。これにより、検査チップ2の自転角度が80度に変化する。この結果、上辺部21と遠心力の方向との成す角度が80度になるように検査チップ2に遠心力Fが作用する。ここで、図7に示すように定量部120における検体10の液面は遠心力の方向Fと直交する方向となる。第一ステップにおいて自転角度が85度であったのに対して、第三ステップにおいて自転角度が80度と低角になったことにより、定量部120において第二接続部123から第四接続部128の間に検体10の液面が位置する。従って、定量部120から第二案内部129側に検体10が漏れて流れることを低減できる。図7に示す定量部120に注入された検体10は、図8に示すように、第一成分10Aと第二成分10Bとに遠心分離される。図8に示す例では、ターンテーブル33の回転速度は、第二ステップの回転速度よりも速くなる。一例として、5000rpmに速くなる。図8に示すように、この高速の公転が行われることにより定量部120に注入された検体10は、短時間で第一成分10Aと第一成分より比重の大きい第二成分10Bとに遠心分離される。第二成分10Bは、第一成分10Aより比重が大きいため定量部120の底面120C側に溜まる。例えば、検体10が血液の場合には、第一成分10Aである血漿と第二成分10Bである血球とに分離され、血球が定量部120の底面120C側に溜まる。この状態での公転時間は、検体10、第一試薬13、及び第二試薬14が、上述した回転速度、移動及び検体の遠心分離を行うのに十分な時間はHDD95に予め記憶されている。 <Third step>
Next, as shown in FIG. 7, by the drive control of the stepping
〈第四ステップ〉
次に、CPU91の指示に基づくステッピングモータ51の駆動制御により、図9に示すように、公転中の検査チップ2が前方からみて時計回りに80度自転される。これにより検査チップ2の自転角度が0度に戻り、左辺部23から右辺部22に向けて検査チップ2に遠心力Fが作用する。ターンテーブル33の回転速度は、一例として、3000rpmに低下する。従って、遠心力Fの作用により、定量部120にて分離された第一成分10Aの内、第三壁面120D、第四壁面120E、第二仮想面K2及び第三仮想面K3に囲まれる凹部126の体積分の第一成分10Aが、第一案内部130を介して流路160に流れ込み、右辺部22側に保持される。ここで、凹部126の体積分の第一成分10AをV1とする。また、第二ステップにて定量された検体10の体積をV2とする。図9に示すように、定量部120に残った第一成分10A及び第二成分10Bの合計の体積をV3とする。V1=V2-V3となる。尚、第一試薬定量部135にて定量された第一試薬13が流路138に流れ込み壁部141側に保持される。また、第一試薬13の一部は、測定部150方向に流れ込む。同様に、第二試薬定量部145にて定量された第二試薬14が流路139を介して壁部102側に保持される。また、第二試薬14の一部は、測定部150方向に流れ込む。上述した回転速度、移動を行うのに十分な時間はHDD95に予め記憶されている。 <Fourth step>
Next, by the drive control of the steppingmotor 51 based on the instruction of the CPU 91, as shown in FIG. 9, the revolving inspection chip 2 is rotated 80 degrees clockwise as viewed from the front. As a result, the rotation angle of the inspection chip 2 returns to 0 degrees, and the centrifugal force F acts on the inspection chip 2 from the left side portion 23 toward the right side portion 22. As an example, the rotation speed of the turntable 33 decreases to 3000 rpm. Accordingly, the concave portion 126 surrounded by the third wall surface 120D, the fourth wall surface 120E, the second virtual surface K2, and the third virtual surface K3 among the first component 10A separated by the quantitative unit 120 by the action of the centrifugal force F. The first component 10A corresponding to the volume flows into the flow path 160 via the first guide part 130 and is held on the right side part 22 side. Here, the first component 10A corresponding to the volume of the concave portion 126 is defined as V1. Further, the volume of the specimen 10 quantified in the second step is set as V2. As shown in FIG. 9, the total volume of the first component 10A and the second component 10B remaining in the quantification unit 120 is V3. V1 = V2−V3. The first reagent 13 quantified by the first reagent quantification unit 135 flows into the flow path 138 and is held on the wall 141 side. A part of the first reagent 13 flows in the direction of the measurement unit 150. Similarly, the second reagent 14 quantified by the second reagent quantification unit 145 is held on the wall 102 side via the flow path 139. A part of the second reagent 14 flows in the direction of the measurement unit 150. The above-described rotation speed and time sufficient for movement are stored in advance in the HDD 95.
次に、CPU91の指示に基づくステッピングモータ51の駆動制御により、図9に示すように、公転中の検査チップ2が前方からみて時計回りに80度自転される。これにより検査チップ2の自転角度が0度に戻り、左辺部23から右辺部22に向けて検査チップ2に遠心力Fが作用する。ターンテーブル33の回転速度は、一例として、3000rpmに低下する。従って、遠心力Fの作用により、定量部120にて分離された第一成分10Aの内、第三壁面120D、第四壁面120E、第二仮想面K2及び第三仮想面K3に囲まれる凹部126の体積分の第一成分10Aが、第一案内部130を介して流路160に流れ込み、右辺部22側に保持される。ここで、凹部126の体積分の第一成分10AをV1とする。また、第二ステップにて定量された検体10の体積をV2とする。図9に示すように、定量部120に残った第一成分10A及び第二成分10Bの合計の体積をV3とする。V1=V2-V3となる。尚、第一試薬定量部135にて定量された第一試薬13が流路138に流れ込み壁部141側に保持される。また、第一試薬13の一部は、測定部150方向に流れ込む。同様に、第二試薬定量部145にて定量された第二試薬14が流路139を介して壁部102側に保持される。また、第二試薬14の一部は、測定部150方向に流れ込む。上述した回転速度、移動を行うのに十分な時間はHDD95に予め記憶されている。 <Fourth step>
Next, by the drive control of the stepping
〈混合液生成ステップ〉
次に、CPU91の指示に基づく主軸モータ35の駆動制御により、主軸モータ35が減速駆動され、主軸モータ35が停止する。故に、検査チップ2の公転が終了する。図10に示すように、第一成分10A、第一試薬13及び第二試薬14が混合された混合液170は重力により測定部150に溜まる。 <Mixed liquid generation step>
Next, thespindle motor 35 is decelerated and driven by the drive control of the spindle motor 35 based on an instruction from the CPU 91, and the spindle motor 35 is stopped. Therefore, the revolution of the inspection chip 2 is completed. As shown in FIG. 10, the mixed solution 170 in which the first component 10 </ b> A, the first reagent 13, and the second reagent 14 are mixed accumulates in the measurement unit 150 by gravity.
次に、CPU91の指示に基づく主軸モータ35の駆動制御により、主軸モータ35が減速駆動され、主軸モータ35が停止する。故に、検査チップ2の公転が終了する。図10に示すように、第一成分10A、第一試薬13及び第二試薬14が混合された混合液170は重力により測定部150に溜まる。 <Mixed liquid generation step>
Next, the
〈測定ステップ〉
上記遠心処理の実行後、主軸モータ35の駆動制御により、検査チップ2を測定位置の角度まで回転移動させる。光源71が発光すると、測定光が測定部150に貯溜された混合液170を通る。光センサ72が受光した測定光の変化量に基づいて、混合液170の光学測定が行われ、測定データが取得される。次いで、取得された測定データに基づいて、検体10の測定結果が算出される。測定結果に基づく検体10の検査結果が表示される。その後、メイン処理が終了される。 <Measurement step>
After execution of the centrifugal process, theinspection chip 2 is rotated to the angle of the measurement position by drive control of the spindle motor 35. When the light source 71 emits light, the measurement light passes through the mixed solution 170 stored in the measurement unit 150. Based on the change amount of the measurement light received by the optical sensor 72, optical measurement of the mixed liquid 170 is performed, and measurement data is acquired. Next, the measurement result of the specimen 10 is calculated based on the acquired measurement data. The test result of the specimen 10 based on the measurement result is displayed. Thereafter, the main process is terminated.
上記遠心処理の実行後、主軸モータ35の駆動制御により、検査チップ2を測定位置の角度まで回転移動させる。光源71が発光すると、測定光が測定部150に貯溜された混合液170を通る。光センサ72が受光した測定光の変化量に基づいて、混合液170の光学測定が行われ、測定データが取得される。次いで、取得された測定データに基づいて、検体10の測定結果が算出される。測定結果に基づく検体10の検査結果が表示される。その後、メイン処理が終了される。 <Measurement step>
After execution of the centrifugal process, the
<6.第一実施形態の主たる作用・効果>
以上説明したように、本実施形態の検査チップ2によれば、第五壁面124を延設した第一仮想面K1は、第一案内部130の壁面である第六壁面122に交差する。従って、第一接続部121と第二接続部123とを結ぶ第三仮想面K3を延長した面に対する第五壁面124の傾斜角度θ4より第三仮想面K3を延長した面に対する第六壁面122の傾斜角度θ5が大きい。従って、検査チップ2へ遠心力を作用させて定量部120へ検体10の注入をするときに、検体10が第六壁面122を乗り越えて流路160に漏れずに、溢れた検体10を検体余剰部140へ流入させることが出来る。また、第三壁面120Dは、第一接続部121と第三接続部127とを結ぶ第二仮想面K2よりも第二案内部129側に存在するので、第三壁面120Dが及び第四壁面120Eが液面である第二仮想面K2に近接せず、表面張力により第三壁面120Dが及び第四壁面120Eに第一成分10Aが付着することを低減できる。従って、第一成分10Aの取り出し時の定量精度が向上する。また、定量部120が分離部を兼ねるので検査チップ2を小型化できる。 <6. Main actions and effects of first embodiment>
As described above, according to theinspection chip 2 of the present embodiment, the first virtual surface K1 provided with the fifth wall surface 124 intersects the sixth wall surface 122 that is the wall surface of the first guide portion 130. Therefore, the sixth wall surface 122 of the sixth wall surface 122 with respect to the surface extending the third virtual surface K3 from the inclination angle θ4 of the fifth wall surface 124 with respect to the surface extending the third virtual surface K3 connecting the first connection portion 121 and the second connection portion 123. The inclination angle θ5 is large. Therefore, when the specimen 10 is injected into the quantification unit 120 by applying a centrifugal force to the test chip 2, the specimen 10 does not leak over the sixth wall surface 122 and leak into the flow path 160, and the overflowing specimen 10 is removed from the specimen surplus. Can flow into the portion 140. Further, since the third wall surface 120D exists on the second guide portion 129 side with respect to the second virtual surface K2 connecting the first connection portion 121 and the third connection portion 127, the third wall surface 120D and the fourth wall surface 120E. Can be reduced from adhering to the third wall surface 120D and the fourth wall surface 120E due to surface tension without being close to the second virtual surface K2, which is a liquid surface. Therefore, the quantitative accuracy at the time of taking out the first component 10A is improved. Moreover, since the fixed_quantity | quantitative_assay part 120 serves also as a isolation | separation part, the test | inspection chip 2 can be reduced in size.
以上説明したように、本実施形態の検査チップ2によれば、第五壁面124を延設した第一仮想面K1は、第一案内部130の壁面である第六壁面122に交差する。従って、第一接続部121と第二接続部123とを結ぶ第三仮想面K3を延長した面に対する第五壁面124の傾斜角度θ4より第三仮想面K3を延長した面に対する第六壁面122の傾斜角度θ5が大きい。従って、検査チップ2へ遠心力を作用させて定量部120へ検体10の注入をするときに、検体10が第六壁面122を乗り越えて流路160に漏れずに、溢れた検体10を検体余剰部140へ流入させることが出来る。また、第三壁面120Dは、第一接続部121と第三接続部127とを結ぶ第二仮想面K2よりも第二案内部129側に存在するので、第三壁面120Dが及び第四壁面120Eが液面である第二仮想面K2に近接せず、表面張力により第三壁面120Dが及び第四壁面120Eに第一成分10Aが付着することを低減できる。従って、第一成分10Aの取り出し時の定量精度が向上する。また、定量部120が分離部を兼ねるので検査チップ2を小型化できる。 <6. Main actions and effects of first embodiment>
As described above, according to the
また、検査チップ2では、第三仮想面K3と第四壁面120Eとがなす角度の内、第二案内部129側の角度θ2は90度以上であるので、第四壁面120Eが定量部120の外側に開き検体10中の気泡が放出されやすく凹部126に気泡が溜まることを防止できる。よって、定量部における定量精度がより向上する。
In the inspection chip 2, the angle θ2 on the second guide portion 129 side is 90 degrees or more out of the angles formed by the third virtual surface K3 and the fourth wall surface 120E. It is possible to prevent the bubbles from being accumulated in the recess 126 because the bubbles in the specimen 10 are easily released and opened outward. Therefore, the quantitative accuracy in the quantitative unit is further improved.
上記構成の検査チップ2では、第一案内部130が形成された壁面の内、供給案内部113側の壁部155の下側の壁面155Bに対して直角方向に供給案内部113側の端部155Aから引いた仮想線Jは、定量部120の底面120Cと交差するので、定量部120に注入される検体10が、凹部126に当たり第二案内部129に流れてしまうことを防止できる。従って、検体10が不足せず定量部120において検体10の定量精度を向上することができる。
In the inspection chip 2 configured as described above, the end portion on the supply guide portion 113 side in the direction perpendicular to the lower wall surface 155B of the wall portion 155 on the supply guide portion 113 side among the wall surfaces on which the first guide portion 130 is formed. Since the imaginary line J drawn from 155A intersects the bottom surface 120C of the quantification unit 120, it is possible to prevent the specimen 10 injected into the quantification unit 120 from hitting the recess 126 and flowing to the second guide unit 129. Therefore, the quantification accuracy of the specimen 10 can be improved in the quantification unit 120 without running out of the specimen 10.
上記構成の検査システム3では、第一ステップにおいて検査チップへ遠心力を作用させて定量部120へ検体10の注入をするときに、検体10が第六壁面122を乗り越えて流路160に漏れずに、溢れた検体10を検体余剰部140へ流入させることが出来る。また、第三壁面120Dは、第一接続部121と第三接続部127とを結ぶ第二仮想面K2よりも第二案内部129側に存在するので、第三壁面120D及び第四壁面120Eが第二仮想面K2に近接せず、第四ステップにおいて、表面張力により第三壁面120D及び第四壁面120Eに第一成分10Aが付着することを低減できる。従って、第一成分10Aの取り出し時の定量精度が向上する。
In the inspection system 3 configured as described above, when the specimen 10 is injected into the quantification unit 120 by applying centrifugal force to the inspection chip in the first step, the specimen 10 does not cross the sixth wall surface 122 and leak into the flow path 160. In addition, the overflowing specimen 10 can be caused to flow into the specimen surplus portion 140. Further, since the third wall surface 120D is located closer to the second guide portion 129 than the second virtual surface K2 connecting the first connection portion 121 and the third connection portion 127, the third wall surface 120D and the fourth wall surface 120E are provided. It is possible to reduce the first component 10A from adhering to the third wall surface 120D and the fourth wall surface 120E due to surface tension in the fourth step without approaching the second virtual surface K2. Therefore, the quantitative accuracy at the time of taking out the first component 10A is improved.
また、上記検査システム3では、第三ステップにおける公転速度を第二ステップにおける公転速度よりも上げるので、第三ステップにて検体10を第一成分10Aと第二成分10Bに分離する場合に、短時間に遠心分離を行うことができる。
Further, in the inspection system 3, the revolution speed in the third step is higher than the revolution speed in the second step. Therefore, when the specimen 10 is separated into the first component 10A and the second component 10B in the third step, the inspection system 3 is short. Centrifugation can be performed in time.
<7.第二実施形態の検査チップ202の構造>
図11を参照して、第二実施形態に係る検査チップ202の詳細構造を説明する。以下の説明では、図11の上方、下方、右方、左方、紙面手前側、及び紙面奥側を、それぞれ、検査チップ2の上方、下方、右方、左方、前方及び後方とする。図11は、シート29を取り除いた検査チップ202の定量部120周辺の拡大図を示している。尚、第二実施形態において、検査チップ202の定量部120の周辺以外の構造は、第一実施形態の検査チップ2の構造と同じであるので、以下では、図11を参照して、検査チップ202の特有の構造のみ説明する。 <7. Structure ofInspection Chip 202 of Second Embodiment>
With reference to FIG. 11, the detailed structure of the test |inspection chip 202 which concerns on 2nd embodiment is demonstrated. In the following description, the upper, lower, right, left, front side, and back side of FIG. 11 are the upper, lower, right, left, front, and rear sides of the inspection chip 2, respectively. FIG. 11 shows an enlarged view around the quantitative unit 120 of the inspection chip 202 with the sheet 29 removed. In the second embodiment, the structure other than the periphery of the quantitative unit 120 of the test chip 202 is the same as the structure of the test chip 2 of the first embodiment. Therefore, in the following, referring to FIG. Only 202 specific structures are described.
図11を参照して、第二実施形態に係る検査チップ202の詳細構造を説明する。以下の説明では、図11の上方、下方、右方、左方、紙面手前側、及び紙面奥側を、それぞれ、検査チップ2の上方、下方、右方、左方、前方及び後方とする。図11は、シート29を取り除いた検査チップ202の定量部120周辺の拡大図を示している。尚、第二実施形態において、検査チップ202の定量部120の周辺以外の構造は、第一実施形態の検査チップ2の構造と同じであるので、以下では、図11を参照して、検査チップ202の特有の構造のみ説明する。 <7. Structure of
With reference to FIG. 11, the detailed structure of the test |
図11に示すように、検査チップ202では、供給案内部113の下方には、第一実施形態と同様な構造の定量部120が設けられている。定量部120は、検査チップ2と同様に、供給案内部113に向けて開口すると共に、底面120C、第一壁面120A、第二壁面120B及び凹部126を備え凹状に形成されている。他の構造も第一実施形態と同様である。
As shown in FIG. 11, in the inspection chip 202, a quantitative unit 120 having the same structure as that of the first embodiment is provided below the supply guide unit 113. Similar to the test chip 2, the quantification unit 120 opens toward the supply guide unit 113, and includes a bottom surface 120 </ b> C, a first wall surface 120 </ b> A, a second wall surface 120 </ b> B, and a recess 126 and is formed in a concave shape. Other structures are the same as in the first embodiment.
検査チップ202では、検査チップ2と異なり、検査に使用される第一成分10Aが定量部120から取り出された後に定量部120に残った第一成分10A及び第二成分10Bを収容して保持する残渣保持部161を備えている。残渣保持部161は正面から見て矩形の貯溜部である。また、残渣保持部161は、定量部120の第一壁面120Aの略中間部分に連結流路163により接続されている。連結流路163は、第一壁面120Aの略中間部分から斜め右上方に延設されている。連結流路163の先端部は残渣保持部161の上端部に接続されている。尚、第一接続部121と第三接続部127とを結ぶ第二仮想面K2を延設した仮想面K20と、連結流路163の延設方向を延長した仮想線K5とは、定量部120の上方で交差する。また、連結流路163の入口163Aから第二仮想面K2と平行に延設した第四仮想面K4は、残渣保持部161と連結流路163とを隔てる連結流路の壁面162と交差する。
Unlike the inspection chip 2, the inspection chip 202 stores and holds the first component 10A and the second component 10B remaining in the quantification unit 120 after the first component 10A used for the inspection is taken out from the quantification unit 120. A residue holding unit 161 is provided. The residue holding part 161 is a rectangular storage part when viewed from the front. Further, the residue holding unit 161 is connected to a substantially middle portion of the first wall surface 120 </ b> A of the quantifying unit 120 by a connection channel 163. The connection flow path 163 extends obliquely right and upward from a substantially middle portion of the first wall surface 120A. The distal end portion of the connection channel 163 is connected to the upper end portion of the residue holding portion 161. In addition, the virtual surface K20 that extends the second virtual surface K2 that connects the first connection portion 121 and the third connection portion 127, and the virtual line K5 that extends the extending direction of the connecting flow path 163, are the quantification unit 120. Cross over The fourth virtual surface K4 extending in parallel with the second virtual surface K2 from the inlet 163A of the connection channel 163 intersects the wall surface 162 of the connection channel that separates the residue holding portion 161 and the connection channel 163.
<8.第二実施形態の主たる作用・効果>
第二実施形態に係る検査チップ202では、第一壁面120Aに連結流路163により接続された残渣保持部161を備えているので、定量部120に残った残渣を残渣保持部161にて保持できる。従って、定量された第一成分10Aが第一案内部130に移動した後に、残渣が定量部120から第一案内部130に流れ出してしまうことを防止できる。従って、検査の精度を向上することができる。 <8. Main functions and effects of the second embodiment>
Since thetest chip 202 according to the second embodiment includes the residue holding unit 161 connected to the first wall surface 120A by the connection channel 163, the residue remaining in the quantification unit 120 can be held by the residue holding unit 161. . Accordingly, it is possible to prevent the residue from flowing out from the quantitative unit 120 to the first guide unit 130 after the quantified first component 10A has moved to the first guide unit 130. Therefore, the inspection accuracy can be improved.
第二実施形態に係る検査チップ202では、第一壁面120Aに連結流路163により接続された残渣保持部161を備えているので、定量部120に残った残渣を残渣保持部161にて保持できる。従って、定量された第一成分10Aが第一案内部130に移動した後に、残渣が定量部120から第一案内部130に流れ出してしまうことを防止できる。従って、検査の精度を向上することができる。 <8. Main functions and effects of the second embodiment>
Since the
また、第二仮想面K2の延設方向と連結流路163の延設方向とが交差し、さらに、連結流路163の入口から第二仮想面K2と平行に延設した第四仮想面K4は、残渣保持部161と連結流路163とを隔てる連結流路163の壁面162と交差する。従って、検査チップ202では、定量部120から第一成分10Aが第一案内部130側に移動される場合に、第一成分10Aが連結流路163から残渣保持部161へ流入することを低減できる。
In addition, the extending direction of the second virtual surface K2 and the extending direction of the connection channel 163 intersect, and the fourth virtual surface K4 that extends in parallel with the second virtual surface K2 from the inlet of the connection channel 163. Intersects the wall surface 162 of the connection channel 163 that separates the residue holding part 161 and the connection channel 163. Therefore, in the inspection chip 202, when the first component 10A is moved from the quantitative unit 120 to the first guide unit 130 side, it is possible to reduce the first component 10A from flowing into the residue holding unit 161 from the connection channel 163. .
<9.その他>
上記実施形態において、第三壁面120Dと第四壁面120Eとを接続する第四接続部128は、接点になっているが、第四接続部128を壁または円弧状の壁にしてもよい。すなわち、これら壁または円弧状の壁が第四接続部に相当する。よって、第四壁面120Eは、第三壁面120Dと第四接続部128を介して接続される。また、第二壁面120Bと第三壁面120Dとのなす角の内、定量部120の外側の角度θ1は、90度より大きく、180度未満に形成してもよい。この場合にも、第三壁面120Dが第一接続部121と第三接続部127とを結ぶ定量面である第二仮想面K2に近接せず、表面張力により第三壁面120Dに第一成分が付着することを低減できる。従って、第一成分10Aの取り出し時の定量精度が向上する。尚、上記実施の形態では、測定部150が、「混合部」の一例である。 <9. Other>
In the said embodiment, although the4th connection part 128 which connects 3rd wall surface 120D and 4th wall surface 120E is a contact, you may make the 4th connection part 128 into a wall or a circular-arc-shaped wall. That is, these walls or arcuate walls correspond to the fourth connection portion. Therefore, the fourth wall surface 120E is connected to the third wall surface 120D via the fourth connection portion 128. In addition, the angle θ1 outside the quantitative unit 120 among the angles formed by the second wall surface 120B and the third wall surface 120D may be greater than 90 degrees and less than 180 degrees. Also in this case, the third wall surface 120D is not close to the second virtual surface K2, which is a quantitative surface connecting the first connection portion 121 and the third connection portion 127, and the first component is applied to the third wall surface 120D due to surface tension. Adhesion can be reduced. Therefore, the quantitative accuracy at the time of taking out the first component 10A is improved. In the above embodiment, the measurement unit 150 is an example of a “mixing unit”.
上記実施形態において、第三壁面120Dと第四壁面120Eとを接続する第四接続部128は、接点になっているが、第四接続部128を壁または円弧状の壁にしてもよい。すなわち、これら壁または円弧状の壁が第四接続部に相当する。よって、第四壁面120Eは、第三壁面120Dと第四接続部128を介して接続される。また、第二壁面120Bと第三壁面120Dとのなす角の内、定量部120の外側の角度θ1は、90度より大きく、180度未満に形成してもよい。この場合にも、第三壁面120Dが第一接続部121と第三接続部127とを結ぶ定量面である第二仮想面K2に近接せず、表面張力により第三壁面120Dに第一成分が付着することを低減できる。従って、第一成分10Aの取り出し時の定量精度が向上する。尚、上記実施の形態では、測定部150が、「混合部」の一例である。 <9. Other>
In the said embodiment, although the
本開示は、上記実施形態に限定されるものではなく、各種の変形が可能である。上記実施形態の検査装置1及び検査チップ2は単なる例示であり、各々の構造、形状及び処理などを変更可能である。上記実施形態では、CPU91によって検査チップ2の公転の制御処理及び自転の制御処理を行ったが、処理を行う形態はこれらに限られない。各処理を複数のCPUにより分担して処理してもよい。また、各処理をASICにより処理してもよい。さらに、各処理を一または複数のCPUと一または複数のASICとの組み合わせにより実行してもよい。
The present disclosure is not limited to the above-described embodiment, and various modifications are possible. The inspection apparatus 1 and the inspection chip 2 of the above embodiment are merely examples, and the structure, shape, processing, and the like of each can be changed. In the above embodiment, the CPU 91 performs the revolution control process and the rotation control process of the inspection chip 2, but the form of performing the process is not limited thereto. Each process may be shared by a plurality of CPUs. Each process may be processed by an ASIC. Furthermore, each process may be executed by a combination of one or more CPUs and one or more ASICs.
また、上記実施の形態では、第一ステップと第二ステップとを別々に行っているが、第一ステップと第二ステップとを一度に行って、検体10の定量部120への注入と定量を一度に行ってもよい。また、定量部120は必ずしも底面120Cを必要とせず、第一壁面120A及び第二壁面120BからなるV字形状でもよい。また、ターンテーブル33の回転速度は、3000rpm及び5000rpmに限られず、必要な遠心力が生じる回転速度であればよい。尚、第一試薬13及び第二試薬14は、予め第一試薬注入部102及び第二試薬注入部103に各々注入されていてもよい。また、第一試薬13及び第二試薬14は、図示しない注入口から第一試薬注入部102及び第二試薬注入部103に各々公知の方法で注入されるようにしてもよい。
Moreover, in the said embodiment, although the 1st step and the 2nd step are performed separately, the 1st step and the 2nd step are performed at once, and the injection | pouring to the fixed_quantity | quantitative_assay part 120 and fixed_quantity | quantitative_assay are performed. You may go at once. Further, the quantification unit 120 does not necessarily require the bottom surface 120C, and may be V-shaped including the first wall surface 120A and the second wall surface 120B. Further, the rotation speed of the turntable 33 is not limited to 3000 rpm and 5000 rpm, and may be any rotation speed that generates a necessary centrifugal force. The first reagent 13 and the second reagent 14 may be previously injected into the first reagent injection unit 102 and the second reagent injection unit 103, respectively. The first reagent 13 and the second reagent 14 may be injected into the first reagent injection part 102 and the second reagent injection part 103 from an injection port (not shown) by a known method.
1 検査装置
2 検査チップ
3 検査システム
10 検体
13 第一試薬
14 第二試薬
90 制御装置
95 ハードディスク装置
97 公転コントローラ
98 自転コントローラ
113 供給案内部
115 壁面
120 定量部
120A 第一壁面
120B 第二壁面
120C 底面
120D 第三壁面
120E 第四壁面
120F 背面
121 第一接続部
122 第六壁面
123 第二接続部
124 第五壁面
126 凹部
127 第三接続部
128 第四接続部
129 第二案内部
130 第一案内部 DESCRIPTION OFSYMBOLS 1 Inspection apparatus 2 Inspection chip 3 Inspection system 10 Specimen 13 1st reagent 14 2nd reagent 90 Control apparatus 95 Hard disk apparatus 97 Revolving controller 98 Autorotation controller 113 Supply guide part 115 Wall surface 120 Fixed | quantitative part 120A 1st wall surface 120B 2nd wall surface 120C Bottom 120D 3rd wall surface 120E 4th wall surface 120F Back surface 121 1st connection part 122 6th wall surface 123 2nd connection part 124 5th wall surface 126 Recessed part 127 3rd connection part 128 4th connection part 129 2nd guide part 130 1st guide part
2 検査チップ
3 検査システム
10 検体
13 第一試薬
14 第二試薬
90 制御装置
95 ハードディスク装置
97 公転コントローラ
98 自転コントローラ
113 供給案内部
115 壁面
120 定量部
120A 第一壁面
120B 第二壁面
120C 底面
120D 第三壁面
120E 第四壁面
120F 背面
121 第一接続部
122 第六壁面
123 第二接続部
124 第五壁面
126 凹部
127 第三接続部
128 第四接続部
129 第二案内部
130 第一案内部 DESCRIPTION OF
Claims (7)
- 注入された検体が定量されると共に、前記検体中に含まれる第一成分と前記第一成分より比重が大きい第二成分とが分離される分離部を兼ねる定量部と、
前記定量部に前記検体を注入する供給案内部と、
前記定量部において分離された第一成分が移動する第一案内部と、
前記定量部から溢れた検体を収容する余剰部と、
前記定量部から前記余剰部に接続された第二案内部と、
前記定量部から前記第一案内部を介して移動した前記第一成分と試薬とが混合される混合部とを備え、
前記定量部は、
前記第一案内部と接続する第一接続部と、
前記第二案内部と接続する第二接続部と、
前記第一接続部に接続される第一壁面と、
前記第一壁面と対向する第二壁面と、
前記第二壁面の端部と前記第二接続部とに接続する凹部とを備え、
前記凹部は、
前記凹部を構成する第三壁面と、
前記第三壁面と前記第二壁面とが接続される第三接続部と、
前記第三壁面と第四接続部を介して接続される第四壁面とを備え、
前記第二接続部に接続する前記第二案内部の壁面である第五壁面を延設した第一仮想面は、前記第一接続部に接続する前記第一案内部の壁面である第六壁面に交差し、
前記第三壁面は、前記第一接続部と前記第三接続部とを結ぶ第二仮想面よりも前記第二案内部側に存在し、
前記第二仮想面と、前記第六壁面とがなす角度の内、前記第二接続部側の角度は、180度より大きいことを特徴とする検査チップ。 A quantification unit serving as a separation unit for quantifying the injected sample and separating a first component contained in the sample and a second component having a specific gravity greater than that of the first component;
A supply guide unit for injecting the specimen into the quantification unit;
A first guide part in which the first component separated in the quantitative part moves;
A surplus part for containing the sample overflowing from the quantification part;
A second guide part connected from the quantification part to the surplus part;
A mixing unit in which the first component moved from the quantification unit via the first guide unit and the reagent are mixed;
The quantitative unit is
A first connecting part connected to the first guiding part;
A second connection part connected to the second guide part;
A first wall surface connected to the first connection portion;
A second wall surface facing the first wall surface;
A recess connected to the end of the second wall surface and the second connection portion;
The recess is
A third wall surface constituting the recess,
A third connecting portion to which the third wall surface and the second wall surface are connected;
A fourth wall surface connected via the third wall surface and the fourth connection portion;
A first virtual surface extending from a fifth wall surface that is a wall surface of the second guide portion connected to the second connection portion is a sixth wall surface that is a wall surface of the first guide portion connected to the first connection portion. Intersect
The third wall surface is present on the second guide portion side than the second virtual surface connecting the first connection portion and the third connection portion,
Of the angles formed by the second virtual surface and the sixth wall surface, the angle on the second connecting portion side is greater than 180 degrees. - 前記第一接続部と前記第二接続部と結ぶ第三仮想面と前記第四壁面とがなす角度の内、前記第二案内部側の角度は、90度以上であることを特徴とする請求項1に記載の検査チップ。 The angle on the second guide portion side among the angles formed by the third virtual surface connecting the first connection portion and the second connection portion and the fourth wall surface is 90 degrees or more. Item 2. The inspection chip according to Item 1.
- 前記第一案内部が形成された壁面の内、前記供給案内部側の壁面に対して直角方向に前記供給案内部の前記第一案内部側の端部から引いた仮想線は、前記定量部の底面と交差することを特徴とする請求項1又は2に記載の検査チップ。 The imaginary line drawn from the end portion on the first guide portion side of the supply guide portion in the direction perpendicular to the wall surface on the supply guide portion side of the wall surface on which the first guide portion is formed is the quantification portion The test chip according to claim 1, wherein the test chip crosses a bottom surface of the test chip.
- 前記第一壁面に連結流路により接続され、且つ、前記定量部の残渣を保持する残渣保持部を備えたことを特徴とする請求項1~3の何れかに記載の検査チップ。 The inspection chip according to any one of claims 1 to 3, further comprising a residue holding unit connected to the first wall surface by a connecting channel and holding a residue of the quantification unit.
- 前記連結流路の延設方向は前記第二仮想面の延設方向と交差し、
且つ、前記連結流路の入口から前記第二仮想面と平行に延設した第四仮想面は、前記残渣保持部と前記連結流路とを隔てる連結流路の壁面と交差することを特徴とする請求項4に記載の検査チップ。 The extending direction of the connection channel intersects with the extending direction of the second virtual plane,
And the 4th virtual surface extended in parallel with the 2nd virtual surface from the entrance of the connection channel intersects the wall surface of the connection channel which divides the residue maintenance part and the connection channel, The inspection chip according to claim 4. - 検体または試薬を定量して混合する検査チップと、前記検査チップを所定の第一軸を中心に公転させることにより前記検査チップに遠心力を作用させ、且つ、前記第一軸とは異なる第二軸を中心に前記検査チップを自転させることにより前記遠心力の方向を変化させる検査装置とから構成される検査システムであって、
前記検査チップは、
注入された検体が定量されると共に、前記検体中に含まれる第一成分と前記第一成分より比重が大きい第二成分とが分離される分離部を兼ねる定量部と、
前記定量部に前記検体を注入する供給案内部と、
前記定量部において分離された第一成分が移動する第一案内部と、
前記定量部から溢れた検体を収容する余剰部と、
前記定量部から前記余剰部に接続された第二案内部と、
前記定量部から前記第一案内部を介して移動した前記第一成分と試薬とが混合される混合部とを備え、
前記定量部は、
前記第一案内部と接続する第一接続部と、
前記第二案内部と接続する第二接続部と、
前記第一接続部に接続される第一壁面と、
前記第一壁面と対向する第二壁面と、
前記第二壁面の端部と前記第二接続部とに接続する凹部とを備え、
前記凹部は、
前記第三壁面と前記第二壁面とが接続される第三接続部と、
前記第三壁面と第四接続部を介して接続される第四壁面とを備え、
前記第二接続部に接続する前記第二案内部の壁面である第五壁面を延設した第一仮想面は、前記第一接続部に接続する前記第一案内部の壁面である第六壁面に交差し、
前記第三壁面は、前記第一接続部と前記第三接続部とを結ぶ第二仮想面よりも前記第二案内部側に存在し、
前記第二仮想面と、前記第六壁面とがなす角度の内、前記第二接続部側の角度は、180度より大きく形成され、
前記検査装置は、
前記自転を制御する自転制御手段と、
前記公転を制御する公転制御手段と
を備え、
前記自転制御手段は、前記公転により生じる遠心力により、前記検体が前記供給案内部から前記定量部に注入される方向に前記検査チップを自転させる第一ステップと、
前記遠心力により、前記定量部において前記第一接続部と前記第二接続部とを結ぶ第一定量面にて前記検体が定量される方向に前記検査チップを自転させる第二ステップと、
前記遠心力により、前記定量部にて前記検体が前記第一成分と前記第二成分とに分離される方向に前記検査チップを自転させる第三ステップと、
前記遠心力により、前記定量部において前記第二仮想面にて前記第一成分が定量され、定量された第一成分が前記第一案内部に流入される方向に前記検査チップを自転させる第四ステップと
を少なくとも実行することを特徴とする検査システム。 A test chip for quantifying and mixing a sample or a reagent, and a second force different from the first axis, wherein the test chip is revolved around a predetermined first axis to apply a centrifugal force to the test chip. An inspection system comprising an inspection device that changes the direction of the centrifugal force by rotating the inspection chip around an axis,
The inspection chip is
A quantification unit serving as a separation unit for quantifying the injected sample and separating a first component contained in the sample and a second component having a specific gravity greater than that of the first component;
A supply guide unit for injecting the specimen into the quantification unit;
A first guide part in which the first component separated in the quantitative part moves;
A surplus part for containing the sample overflowing from the quantification part;
A second guide part connected from the quantification part to the surplus part;
A mixing unit in which the first component moved from the quantification unit via the first guide unit and the reagent are mixed;
The quantitative unit is
A first connecting part connected to the first guiding part;
A second connection part connected to the second guide part;
A first wall surface connected to the first connection portion;
A second wall surface facing the first wall surface;
A recess connected to the end of the second wall surface and the second connection portion;
The recess is
A third connecting portion to which the third wall surface and the second wall surface are connected;
A fourth wall surface connected via the third wall surface and the fourth connection portion;
A first virtual surface extending from a fifth wall surface that is a wall surface of the second guide portion connected to the second connection portion is a sixth wall surface that is a wall surface of the first guide portion connected to the first connection portion. Intersect
The third wall surface is present on the second guide portion side than the second virtual surface connecting the first connection portion and the third connection portion,
Of the angles formed by the second virtual surface and the sixth wall surface, the angle on the second connecting portion side is formed to be greater than 180 degrees,
The inspection device includes:
A rotation control means for controlling the rotation;
A revolution control means for controlling the revolution,
The rotation control means is a first step of rotating the test chip in a direction in which the specimen is injected from the supply guide unit into the quantitative unit by a centrifugal force generated by the revolution,
A second step of rotating the test chip in a direction in which the specimen is quantified on a first quantification surface connecting the first connection part and the second connection part in the quantification part by the centrifugal force;
A third step of rotating the test chip in a direction in which the specimen is separated into the first component and the second component by the centrifugal force by the centrifugal force;
The centrifugal force causes the first component to be quantified in the second imaginary plane in the quantification unit, and the fourth component rotates the inspection chip in a direction in which the quantified first component flows into the first guide unit. An inspection system characterized by executing at least the steps. - 前記公転制御手段は、前記第三ステップでの公転速度を前記第二ステップよりも上げることを特徴とする請求項6に記載の検査システム。 The inspection system according to claim 6, wherein the revolution control means increases the revolution speed in the third step as compared with the second step.
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JP2009139369A (en) * | 2007-11-16 | 2009-06-25 | Rohm Co Ltd | Microchip |
JP2010151447A (en) * | 2008-12-24 | 2010-07-08 | Panasonic Corp | Analyzing device and analyzing method using same |
JP2010210531A (en) * | 2009-03-12 | 2010-09-24 | Panasonic Corp | Analyzing device |
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