WO2014089803A1 - Connecteur de radiofréquence, carte de radiofréquence et composant d'étalonnage - Google Patents

Connecteur de radiofréquence, carte de radiofréquence et composant d'étalonnage Download PDF

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Publication number
WO2014089803A1
WO2014089803A1 PCT/CN2012/086540 CN2012086540W WO2014089803A1 WO 2014089803 A1 WO2014089803 A1 WO 2014089803A1 CN 2012086540 W CN2012086540 W CN 2012086540W WO 2014089803 A1 WO2014089803 A1 WO 2014089803A1
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WO
WIPO (PCT)
Prior art keywords
radio frequency
test
connector
frequency connector
line
Prior art date
Application number
PCT/CN2012/086540
Other languages
English (en)
Chinese (zh)
Inventor
王帅
刘尧
谢晓龙
李勇
Original Assignee
华为技术有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 华为技术有限公司 filed Critical 华为技术有限公司
Priority to PCT/CN2012/086540 priority Critical patent/WO2014089803A1/fr
Priority to CN201280002544.0A priority patent/CN104081212B/zh
Publication of WO2014089803A1 publication Critical patent/WO2014089803A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2103/00—Two poles
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R24/00—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
    • H01R24/38—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts
    • H01R24/40—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure having concentrically or coaxially arranged contacts specially adapted for high frequency

Definitions

  • the present invention relates to communications technologies, and in particular, to a radio frequency connector, a radio frequency single board, and a calibration device. Background technique
  • testing a radio frequency board generally requires performing the following series of steps: facilitating contact with the test point by scraping the solder mask where the test point is located, and isolating the interference of the non-test area by secant, by flying
  • the line method realizes the connection with the test instrument, thereby obtaining the test parameters, and then locating the fault point according to the test parameters and determining the fault type.
  • the RF board is tested by the test method in the prior art.
  • the operations such as scratch-resistance welding, secant, and flying line can cause irreparable damage to the RF board, and cannot be located when multiple faults need to be located. Decoupling multiple parameters, testing efficiency is low. Summary of the invention
  • the embodiments of the present invention provide a radio frequency connector, a radio frequency single board, and a calibration device to avoid damage to the radio frequency board and improve the testing efficiency of the radio frequency board.
  • the first aspect provides an RF connector, including:
  • the first end of the inner conductor is provided with a probe end, and the probe end protrudes from the dielectric layer for connecting to a test point after the solder mask opening on the radio frequency board under test;
  • the first end is provided with a first grounding end and a second grounding end for engaging the latching structure of the radio frequency board to be tested, so as to fix the radio frequency connector and the radio frequency board to be tested;
  • the second end of the outer conductor and the second end of the inner conductor form a test connection for connection to a test port of the tester.
  • the probe end The diameter is the same as the width of the signal line of the RF board to be tested.
  • the outer diameter of the dielectric layer is 2-4 times the diameter of the inner conductor .
  • the impedance is 50 ohms or 75 ohms.
  • the first ground end and the second ground end of the outer conductor are curved.
  • the second aspect provides a radio frequency board, which is tested by using any of the radio frequency connectors provided by the first aspect, where the radio frequency board includes:
  • the signal line is provided with a test point after the solder mask opening, and the test point is used for connecting the probe end on the RF connector;
  • the grounding area is provided with a latching structure after the soldering and sliding, the latching structure is configured to connect the first ground end and the second ground end of the radio frequency connector to fix the radio frequency board and The radio frequency connector.
  • a third aspect provides a calibration device for calibrating any of the RF connectors provided in the first aspect such that a tester connected to the RF connector obtains a parameter related to a short circuit open load direct pass (SOLT) calibration algorithm , the calibration device includes:
  • test line includes an open route, a short circuit, a signal line or a straight line;
  • the test line is provided with at least one solder mask open window test point, and the test point is used for connecting the probe end on the RF connector;
  • the grounding area is provided with at least one solder-proof window-opening structure, and the snap-in structure is configured to connect the first ground end and the second ground end on the radio frequency connector to fix the radio frequency connector And the calibration device.
  • the test line is an open route, and the test point is disposed at one end of the open route; the calibration device is specifically configured to The RF connector is calibrated such that the tester connected to the RF connector obtains an open circuit related parameter of the SOLT calibration algorithm; the tester is in an open calibration mode.
  • the test line is a short-circuit line, and one end of the short-circuit line is provided with the test point; The RF connector is calibrated such that the tester connected to the RF connector obtains a short circuit related parameter of the SOLT calibration algorithm; the tester is in a short circuit calibration mode.
  • the test line is a signal line
  • the test line is disposed at one end of the signal line, and the other end of the signal line is matched.
  • the calibration device is specifically configured to calibrate the RF connector such that a tester connected to the RF connector obtains load-related parameters of a SOLT calibration algorithm; the tester is in a load calibration mode.
  • the test line is a straight-through line, one end of the straight-through line is provided with a first test point, and the other end of the straight-through line is provided with a first a test point, the first test point is used to connect the probe end on the first RF connector, and the second test point is used to connect the probe end on the second RF connector;
  • the first grounding structure is connected to the first grounding end and the second grounding end of the first RF connector, and the second grounding structure is connected to the second grounding structure.
  • the snap-on structure is connected to the first ground end and the second ground end on the second RF connector; the calibration device is specifically configured to calibrate the RF connector to connect to the RF connector
  • the tester obtains pass-through related parameters of the SOLT calibration algorithm; the tester is in a through-calibration mode.
  • the radio frequency connector, the radio frequency single board, and the calibration device are provided in the embodiment of the present invention.
  • the first end of the inner conductor of the radio frequency connector is provided with a probe end, and the probe end protrudes from the dielectric layer for connecting the radio frequency board to be tested.
  • the first end of the outer conductor is provided with a first ground end and a second ground end, and is used for snapping into the card structure of the radio frequency board to be tested, so as to connect the radio frequency connector with
  • the RF board to be tested is fixed, and the second end of the outer conductor and the second end of the inner conductor form a test connection end for connecting to the test port of the tester, and the RF board and the test to be tested are implemented by using the above RF connector.
  • connection of the instrument does not require unrecoverable damage such as scratch-resistance welding and flying leads of the RF board, and avoids damage to the RF board caused by the test process, and the RF connector has the advantages of simple operation and convenient plugging and unplugging. Therefore, the test efficiency of the radio frequency board can be improved.
  • FIG. 1 is a front elevational view showing the structure of a radio frequency connector according to an embodiment of the present invention
  • 2 to 6 are schematic structural diagrams of five implementations of a connection end of a test connector of a radio frequency connector and a tester according to an embodiment of the present invention
  • FIG. 7 is a bottom view of a structure of a radio frequency connector according to an embodiment of the present invention.
  • FIG. 8 is a top plan view of a structure of a radio frequency connector according to an embodiment of the present invention.
  • FIG. 9 is a top plan view showing a structure of a radio frequency single board according to an embodiment of the present disclosure.
  • FIG. 10 is a top plan view showing the structure of an open circuit calibration device according to an embodiment of the present invention.
  • FIG. 11 is a top plan view showing a structure of a short-circuit calibration device according to an embodiment of the present invention.
  • FIG. 12 is a top plan view showing a structure of a load calibration device according to an embodiment of the present invention.
  • FIG. 13 is a top plan view showing a structure of a through-calibration device according to an embodiment of the present invention.
  • FIG. 14 is a schematic flowchart diagram of a testing method according to an embodiment of the present invention.
  • the technical solutions in the embodiments of the present invention are clearly and completely described in the following with reference to the accompanying drawings in the embodiments of the present invention. It is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. example. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without creative efforts are within the scope of the present invention.
  • the radio frequency connector provided by the embodiment of the invention includes an inner conductor, a dielectric layer and an outer conductor in order from the inside to the outside; wherein the dielectric layer is disposed between the inner conductor and the outer conductor; the first end of the radio frequency connector is used for connection
  • the radio frequency board to be tested includes a first end of the inner conductor, a first end of the dielectric layer and the outer conductor from the inside to the outside, and a second end of the radio frequency connector is used for connecting the tester.
  • a probe end is disposed at a first end of the inner conductor, and a dielectric layer is protruded from the probe end for connecting a test point after the solder mask opening on the radio frequency board to be tested;
  • the first grounding end and the second grounding end are disposed at the end, and the dielectric layer is protruded from the latching structure of the radio frequency board to be tested to fix the radio frequency connector to the radio frequency board to be tested.
  • FIG. 1 is a front view of a structure of a radio frequency connector according to an embodiment of the present invention.
  • a first end of an inner conductor is provided with a probe end 1111, and a probe end 1111 protrudes from a dielectric layer for connection to be tested.
  • the first end of the outer conductor is provided with a first ground end 311 and a second ground end 312 for engaging the clip structure of the radio frequency board to be tested, Fix the RF connector to the RF board to be tested.
  • the second end of the RF connector is used to connect the tester.
  • the second end 12 of the inner conductor and the second end 32 of the outer conductor form a test connection for connecting to the test port of the tester.
  • FIG. 2 is a schematic structural diagram of five implementations of a connection end between a test connector and a tester of a radio frequency connector according to an embodiment of the present invention, wherein the reference numeral “263” in FIG. 2 to FIG. 6 is a radio frequency connector.
  • the test connector labeled "264" shows the test port of the tester.
  • the test connection end 263 and the test port 264 shown in FIG. 2 form a threaded connection; the test connection end 263 and the test port 264 shown in FIG. 3 form a bayonet type connection; the test connection end 263 and the test port 264 shown in FIG.
  • Push-in connection; test connection 263 and test port 264 shown in Figure 5 form a push-in self-locking connection; test connection 263 and test port 264 shown in Figure 6 form a slide-in connection.
  • the label "264" in Figure 2-6 shows the test connector of the RF connector, and the label "263" shows the test port of the tester, as long as the RF connector is tested.
  • the connection end is matched with the test port of the tester, and the connection can be adapted.
  • FIG. 7 is a bottom view of a structure of a radio frequency connector according to an embodiment of the present invention, that is, viewed from a first end of the radio frequency connector, as shown in FIG. 7, including a probe end 1111, a dielectric layer 2, and a partial outer conductor. 3, and a first ground end 311 and a second ground end 312 disposed at the first end of the outer conductor 3.
  • the radio frequency connector includes an inner conductor 1 in order from the inside to the outside.
  • the dielectric layer 2 and the outer conductor 3 are specifically the second end of the inner conductor 1, the second end of the dielectric layer 2 and the outer conductor 3.
  • one or more test points after the solder mask is opened on the RF board to be tested.
  • the soldering window is not provided with solder mask at the test point or the card structure, and the test point or the surface of the card structure is leaked out to be connected with the RF connector, and the test point is located on the signal line of the RF board to be tested, and a snap-on structure is disposed on the grounding area after the solder-proof window corresponding to the test RF card and the test point, and the structural feature of the snap-fit structure and the first ground end of the first end of the RF connector outer conductor are The second ground end coincides.
  • the outer conductor since the first end of the inner conductor is provided with a probe end, the probe end protrudes from the dielectric layer, and is used for connecting the test point after the solder mask opening on the radio frequency board to be tested, the outer conductor
  • the first end of the outer conductor is provided with a first grounding end and a second grounding end for engaging the latching structure of the radio frequency board to be tested, so as to fix the radio frequency connector to the radio frequency board to be tested, and the second end of the outer conductor
  • the second end of the inner conductor constitutes a test connection end for connecting with the test port of the tester, and the connection between the tested RF board and the tester is realized by using the above RF connector, and the RF board is not required to be scraped Unrecoverable damage such as solder masks and flying leads, to avoid damage to the RF board caused by the test process, and the RF connector has the advantages of simple operation and easy insertion and removal.
  • the application scenarios are wide, including but not limited to RF single board fault
  • the diameter of the probe end of the RF connector may be fixed or may be set according to the type of the signal line.
  • the diameter of the probe end of the RF connector is the same as the line width of the signal of the RF board to be tested, so as to ensure the continuity of signal transmission.
  • the probe end 1 1 1 1 disposed at the first end of the inner conductor of the RF connector protrudes from the length of the dielectric layer, preferably less than 2 cm, to ensure that the probe has a certain strength while introducing parasitic The inductance is small.
  • the outer diameter of the dielectric layer is 2-4 times the diameter of the inner conductor, because the distance between the signal line and the ground area on the radio frequency single board is 2-4 times the width of the signal line. In this way, the first ground end and the second ground end of the first end of the outer conductor of the RF connector are in contact with the latching structure of the radio frequency single board.
  • a material having a suitable dielectric constant is selected as the dielectric layer to ensure that the characteristic impedance of the RF connector is 50 ohms or 75 ohms, so that the characteristic impedance of the RF connector is consistent with the characteristic impedance of the RF board, and the signal is ensured.
  • the continuity of the transport for example, the material of the dielectric layer may be ceramic, glass or the like.
  • the first ground end 31 1 and the second ground end 312 of the outer conductor are arcuate or crescent, and the shape of the first ground end and the second ground end of the outer conductor are closer to a closed shape, The smaller the parasitic inductance is, and the first grounding end and the second grounding end are used for the carding structure of the radio frequency board to be tested, and the card structure of the tested radio frequency board is set to the radio frequency meter to be tested. Board with The test point corresponds to the grounding area after the solder mask is opened, and therefore, the contact between the first ground end and the second ground end and the signal line on the radio frequency board to be tested is avoided.
  • the shape of the first grounding end 31 1 and the second grounding end 312 is not limited to an arc shape, and may be, for example, a chevron shape, a concave shape, or the like which can form an approximately closed shape.
  • the second end 32 of the outer conductor and the first end 12 of the inner conductor form a test connection end.
  • the outer surface of the second end of the outer conductor is threaded to facilitate connection with the test port of the tester.
  • the structure of the test connection end is not limited to a thread shape, and other implementation structures can be seen in FIGS.
  • FIG. 9 is a top view of a structure of a radio frequency veneer according to an embodiment of the present invention. Only the structure of the relevant part of the present invention is shown.
  • the radio frequency board of this embodiment includes:
  • each radio frequency board has at least one signal line 91 to be tested, and each side of each signal line 91 has a grounding area 92.
  • the signal line 91 is provided with a test point 94 after solder masking, and the test point 94 is used to connect to the probe end on the RF connector.
  • the test signal is connected to the probe end on the RF connector, and the test signal is transmitted from the RF board to be tested to the tester for analysis by the tester.
  • the grounding area 92 is provided with a latching structure 93 after the soldering is opened, and the latching structure 93 is used for connecting with the first grounding end and the second grounding end of the RF connector to fix the RF board and the RF connector.
  • the shape of the snap-fit structure 93 may be curved, crescent-shaped, etc., and the structural features of the snap-fit structure 93 are consistent with the shapes of the first ground end and the second ground end of the first end of the outer conductor of the RF connector.
  • the first grounding end and the second grounding end of the RF connector are inserted into the latching structure of the RF board to be tested, ensuring good and reliable contact, and no damage to the RF board to be tested.
  • the latching structure 93 may be a crescent-shaped recess disposed on the grounding region 92, and the first grounding end and the second grounding end of the first end of the outer conductor of the radio frequency connector may be crescent-shaped protrusions, The corresponding protrusions are snapped into the corresponding recesses to fix the latching structure 93 and the RF connector.
  • the snap-fit structure 93 can also be configured as other curved structures or other structures other than arc-shaped, such as a convex shape. Or concave shape.
  • the test point 94 on the radio frequency board is usually set at a high fault rate.
  • the number of test points is determined according to the actual characteristics of the tested radio board. The present invention does not limit this.
  • a test point on a radio panel to be tested and a corresponding snap-on structure are taken as an example for description.
  • the soldering window processing is performed on the test points on the signal line, and the snap-on structure of the solder-proof window is formed on the grounding areas on both sides of the signal line, thereby facilitating the use of the present invention.
  • the RF connector is tested, the test is simple, and the unrecoverable damage to the RF board to be tested is not caused, which facilitates mass production.
  • an embodiment of the present invention provides a set.
  • the calibration device used in conjunction with the RF connector connects the calibration device and the tester by using the RF connector provided by the present invention, and the tester can obtain the parasitic parameters of the RF connector for subsequent testing of the tested RF board. Therefore, the influence of the parasitic parameters introduced by the RF connector on the test accuracy can be avoided.
  • the tester used in the embodiment of the present invention is equipped with a short circuit open load straight through.
  • SOLT Short Open Load Thru
  • the calibration device provided by the embodiment of the invention is configured to calibrate the RF connector, so that the tester obtains relevant parameters of the SOLT calibration algorithm
  • the calibration device includes: a grounding area corresponding to the test line and the test line; and the test line includes Route, short-circuit line, signal line or straight-through line; test line is provided with at least one test point after solder masking, the test point is used to connect the probe end on the RF connector; the grounding area is provided with at least one solder resist open
  • a snap-fit structure behind the window, the snap-on structure is configured to connect the first ground end and the second ground end on the RF connector to fix the RF connector and the calibration device.
  • the test line is an open path.
  • the open circuit calibration device of the embodiment includes: an open route 101 and an open route 101. Grounding area 102; Grounding area 102 is located on both sides of the open path.
  • test point 1031 is used for connecting with the probe end on the RF connector
  • the grounding area 102 is provided with a snap-fit structure 1041 after the solder-proof window is opened, and the snap-in structure 1041 is used for Connect to the first ground and the second ground on the RF connector to secure the open circuit calibration device and RF connector.
  • the snap-fit structure 1041 can be disposed in a pair of crescent shapes, and the structural features of the snap-fit structure 1041 coincide with the shapes of the first ground end and the second ground end of the first end of the outer conductor of the radio frequency connector.
  • the open circuit calibration device of this embodiment is typically implemented using a high quality RF sheet with a small temperature drift, coefficient of thermal expansion, and high dielectric uniformity.
  • the open circuit calibration device and the tester are connected by using the RF connector provided by the present invention.
  • the calibration device is in an open calibration mode during calibration, and the calibration device is used to calibrate the RF connector to enable the tester to obtain an open circuit correlation of the SOTL calibration algorithm. Parameter used to test the RF board being tested.
  • the test line is a short-circuit line.
  • the short-circuit calibration device of the embodiment includes: a short-circuit line 111 and a short-circuit line 111. Corresponding grounding area 112.
  • the first end of the shorting line 111 is provided with a solder masked test point 1132 for connecting to the probe end of the RF connector.
  • the grounding area 112 is provided with a soldering structure after the soldering structure 1142, and the clamping structure 1142 is used for connecting with the first grounding end and the second grounding end of the RF connector to fix the short circuit calibration device and the RF connector.
  • the short-circuit calibration device of this embodiment is typically implemented using a high quality RF plate with a small temperature drift, thermal expansion coefficient, and high dielectric uniformity.
  • the short-circuit calibration device and the tester are connected by using the RF connector provided by the present invention, and the tester is in a short-circuit calibration mode during calibration, and the calibration device is used to calibrate the RF connector to enable the tester to obtain a short-circuit related to the SOLT calibration algorithm. Parameter used to test the RF board being tested.
  • the test line is a signal line.
  • the load calibration device of the embodiment includes: a signal line 121 and a signal line 121. Corresponding grounding area 122.
  • the first end of the signal line 121 is provided with a solder joint window test point 1233 for connecting to the probe end of the RF connector.
  • the second end of the signal line 121 is provided with a matching load 125, which generally matches the impedance of the load and the connector The characteristic impedance is the same.
  • the grounding area 122 is provided with a solder-proof windowed latch structure 1243 for connecting to the first grounding terminal and the second grounding terminal on the RF connector to fix the load calibration device and the RF connector.
  • the load calibration device of this embodiment is typically implemented using a high quality RF sheet with a small temperature drift, coefficient of thermal expansion, and high dielectric uniformity.
  • the load calibration device and the tester are connected by using the RF connector provided by the present invention.
  • the calibration device is in a load calibration mode during calibration, and the calibration device is used to calibrate the RF connector to enable the tester to obtain the load correlation of the SOLT calibration algorithm. Parameter used to test the RF board being tested.
  • FIG. 13 is a top view of a structure of a through-calibration device according to an embodiment of the present invention.
  • two RF connectors are used, which are a first RF connector and a second RF connector.
  • the test line is The through line, as shown in FIG. 13, the through calibration device of the embodiment includes: a through line 131 and a grounding area 132 corresponding to the through line 131.
  • the first end of the straight-through line 131 is provided with a first test point 1334 after the solder-proof window opening, the first test point
  • 1334 is for connection to a probe end on the first RF connector.
  • the second end of the straight-through line 131 is provided with a second test point 1335 after the solder-proof window, and the second test point 1335 is for connecting with the probe end on the second RF connector.
  • the grounding area 132 is provided with a first latching structure 1344 and a second latching structure 1345 after the solder resisting window is opened.
  • the first latching structure 1344 is used for the first grounding end and the second grounding end on the first RF connector.
  • the second clamping structure 1345 is configured to be connected to the first ground and the second ground on the second RF connector to fix the through-calibration device and the second RF Connector.
  • the through-calibration device of this embodiment is typically implemented using a high quality RF plate with a small temperature drift, coefficient of thermal expansion, and high dielectric uniformity.
  • the above-mentioned through-calibration device and the tester are connected by using the first RF connector and the second RF connector provided by the present invention, and the tester is in a through-calibration mode during calibration, and the calibration device is used to calibrate the RF connector to enable the test
  • the instrument obtains the pass-through related parameters of the SOLT calibration algorithm and is used when testing the RF board to be tested.
  • FIG. 14 is a schematic flowchart of a test method according to an embodiment of the present invention.
  • the RF connector Before using the RF connector to test the RF board to be tested, the RF connector is first calibrated due to the inherent characteristics of the RF connector. When the RF connector is used to connect the RF board to the tester, the RF connector itself introduces parasitic parameters, which affects the accuracy of the tester's analysis data to some extent. Therefore, there are four compatible RF connectors.
  • Calibration devices, three single-port and one dual-port, three single-port calibration devices are open-circuit calibration devices, short-circuit calibration devices, load calibration devices, and a two-port calibration device is a pass-through calibration device, calibration device
  • Table 1 The composition is shown in Table 1.
  • test method includes:
  • the tester When the tester is in open calibration mode, connect the open calibration device and tester through the RF connector.
  • the specific method of connecting is to connect the inner end of the radio frequency connector with the first end of the probe end to the test point, and the outer conductor of the radio frequency connector is provided with the first end of the first ground end and the second ground end
  • the snap-in structure on the open-circuit calibration device is fixed to fix the RF connector to the open-circuit calibration accessory board; the test connector formed by the second end of the outer conductor of the RF connector and the second end of the inner conductor is connected to the tester Test port connection.
  • the RF connector linearly transmits the test and reflected signals to allow the tester to obtain open-circuit related parameters.
  • test signal and the reflected signal are transmitted between the tester and the open calibration device through the inner conductor of the RF connector to enable the tester to obtain open circuit related parameters.
  • Linear transmission refers to transmission without distortion.
  • the RF connector is connected to the tester and the short calibration device.
  • the tester is in short-circuit calibration mode and the short-circuit calibration device and tester are connected via an RF connector.
  • the connection method uses an operation similar to that of 1401, and will not be described here.
  • the RF connector linearly transmits the test and reflected signals to allow the tester to obtain short-circuit related parameters.
  • test signal and the reflected signal are transmitted between the tester and the short-circuit calibration device through the inner conductor of the RF connector to obtain the short-circuit related parameters of the tester.
  • Linear transmission refers to transmission without distortion.
  • the RF connector connects the tester to the load calibration device.
  • the tester is in load calibration mode and the load calibration device and tester are connected via an RF connector.
  • the connection method uses an operation similar to that of 1401, and will not be described here.
  • the RF connector linearly transmits the test signal and the reflected signal to obtain load-related parameters for the tester.
  • test signal and the reflected signal are transmitted between the tester and the load calibration device through the inner conductor of the RF connector to enable the tester to obtain load related parameters.
  • Linear transmission refers to transmission without distortion.
  • the RF connector is connected to the tester and the straight-through calibration device.
  • the pass-through calibration device is a two-port calibration device, so two identical RF connectors are required, a first RF connector and a second RF connector.
  • the tester is in pass-through calibration mode, and the pass-through calibration device and tester are connected through the first RF connector and the second RF connector.
  • the connection method uses an operation similar to that of 1401, and will not be described here.
  • the RF connector linearly transmits the test signal and the reflected signal to obtain the tester Have direct access to relevant parameters.
  • the calibration device and the tester are respectively connected through the RF connector, and the open circuit related parameters, the short circuit related parameters, the load related parameters, and the through-related parameters are obtained, so that the tester performs the test on the tested RF board.
  • the obtained related parameters are stripped to improve the accuracy of the test.
  • the order of obtaining the open circuit related parameters, the short circuit related parameters, the load related parameters, and the straight through related parameters is not limited.
  • the RF connector is connected to the tester and the RF board to be tested.
  • the inner conductor of the radio frequency connector is disposed with the first end of the probe end in contact with the test point, and the outer conductor of the radio frequency connector is provided with the first ground end and the second ground end.
  • One end is snapped into the latching structure of the RF board to be tested to fix the RF connector to the RF board to be tested; and the test connection is formed by the second end of the outer conductor of the RF connector and the second end of the inner conductor. The end is connected to the test port of the tester.
  • the RF connector linearly transmits the test signal and the reflected signal to enable the tester to obtain test data of the tested RF board.
  • the SOLT algorithm is used to strip the parasitic parameters introduced by the RF connector.
  • the test data after the parasitic parameters are stripped is analyzed to determine the type of the fault and the location of the fault point, and the accuracy of the test is improved.
  • the RF connector is first calibrated with four calibration accessories, and the RF connector is respectively connected with four calibration accessories, so that the tester obtains the relevant parameters, and then the RF connector is tested.
  • the RF board is connected to receive the test signal sent by the test point on the tested RF board, and the test signal is transmitted to the tester, so that the tester obtains the test data. After the tester obtains the test data, according to the test data. And pre-obtained open circuit related parameters, short circuit related parameters, load related parameters and through-related parameters, using the SOLT algorithm to strip the parasitic parameters introduced by the RF connector, and analyzing the test data after stripping the parasitic parameters to determine
  • the fault type and the location of the fault point improve the accuracy of the test.
  • the test method is simple and the damage of the RF board is not damaged. This improves the test efficiency of the RF board.
  • test radio frequency board can have any number of test points and the corresponding card connection structure, which is not limited by the present invention.
  • a test point on the radio frequency measurement board is taken as an example.
  • the other test points on the tested radio board, or other RF boards tested, have the same process and principle.
  • the method includes the steps of the foregoing method embodiments; and the foregoing storage medium includes: a medium that can store program codes, such as a ROM, a RAM, a magnetic disk, or an optical disk.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Manufacturing Of Electrical Connectors (AREA)

Abstract

La présente invention concerne, dans certains modes de réalisation, un connecteur de radiofréquence, une carte de radiofréquence et un composant d'étalonnage. Le connecteur de radiofréquence comprend un conducteur interne, une couche diélectrique et un conducteur externe. La couche diélectrique est située entre le conducteur interne et le conducteur externe. Une première extrémité du conducteur interne est dotée d'une extrémité de sonde. L'extrémité de sonde fait saillie à partir de la couche diélectrique. Une première extrémité du conducteur externe est dotée d'une première extrémité de mise à la terre et d'une seconde extrémité de mise à la terre. Une seconde extrémité du conducteur externe et une seconde extrémité du conducteur interne forment une extrémité de connexion d'essai. L'utilisation du connecteur de radiofréquence pour connecter une carte de radiofréquence à un appareil d'essai peut améliorer l'efficacité de l'essai.
PCT/CN2012/086540 2012-12-13 2012-12-13 Connecteur de radiofréquence, carte de radiofréquence et composant d'étalonnage WO2014089803A1 (fr)

Priority Applications (2)

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PCT/CN2012/086540 WO2014089803A1 (fr) 2012-12-13 2012-12-13 Connecteur de radiofréquence, carte de radiofréquence et composant d'étalonnage
CN201280002544.0A CN104081212B (zh) 2012-12-13 射频连接器、射频单板及校准器件

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PCT/CN2012/086540 WO2014089803A1 (fr) 2012-12-13 2012-12-13 Connecteur de radiofréquence, carte de radiofréquence et composant d'étalonnage

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WO2014089803A1 true WO2014089803A1 (fr) 2014-06-19

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CN106970344A (zh) * 2017-03-24 2017-07-21 西安科技大学 一种降低开路器校准件边缘电容的方法及开路器校准件
CN113939744A (zh) * 2019-09-26 2022-01-14 株式会社村田制作所 连接器测定用探针以及连接器的测定方法

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CN113939744A (zh) * 2019-09-26 2022-01-14 株式会社村田制作所 连接器测定用探针以及连接器的测定方法
CN113939744B (zh) * 2019-09-26 2024-05-14 株式会社村田制作所 连接器测定用探针以及连接器的测定方法

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