WO2014069511A1 - Inspection chip - Google Patents

Abstract

Provided is an inspection chip with improved quantitative accuracy. A first connecting portion (121) of each of multiple stages of specimen quantifying sections (114) of the inspection chip (2) has a first wall face (123) connected thereto. A second connecting portion (122) of each specimen quantifying section (114) has a second wall face (124) connected thereto. A third wall face (125) connected to a second wall face (124) is contained in channels (120) having openings (127). A first virtual line (75) drawn from the tip of a third wall face (125) in an opening (127) in a direction orthogonal to the second wall face (124) that is connected to an Nth stage specimen quantifying section (114) is located more toward the first wall face (123) side of an N+1 stage specimen quantifying section (114) than a second virtual line (76) that joins the tip of the third wall face (125) in the opening (127) with the second connecting portion (122) of the N+1 stage specimen quantifying section (114). The opening (127) is located more toward the second wall face (124) side of the N+1 stage specimen quantifying section (114) than a third virtual line (77) drawn from the second connecting portion (122) of the N+1 stage specimen quantifying section (114) in a direction orthogonal to a virtual face (128).

Description

Inspection chip

The present invention relates to a test chip provided with a plurality of quantification units for quantifying a specimen or a reagent.

Conventionally, a test chip including a plurality of quantification units for quantifying a specimen or a reagent is known. For example, the microchip described in Patent Document 1 includes an overflow sample storage unit and six sample measurement units. The sample measuring unit is a part for measuring the sample. Each sample measuring part is connected in series. Each sample measurement part is located in the left-right direction. When a leftward centrifugal force is applied to the microchip, the sample is supplied to the sample measuring unit. At this time, the sample is measured in the right sample measuring unit, and the surplus sample is supplied to the left sample measuring unit and measured. That is, the samples are sequentially supplied to the sample measuring unit and weighed. Samples overflowing from all the sample measurement units are stored in the overflow sample storage unit. The sample weighed in the sample weighing unit is mixed with the weighed liquid reagent and tested.

JP 2009-109429 A

In the conventional microchip, the specimen moves along the flow path in the microchip along the direction of the centrifugal force, and the specimen moves to the next flow path by changing the direction of the centrifugal force. For example, when the timing at which the direction of the centrifugal force changes is controlled based on whether or not a predetermined time has elapsed, the direction of the centrifugal force may change before the specimen finishes moving through the flow path. In this case, the surplus sample may flow into the sample measuring unit at a timing other than the desired timing, and the measurement accuracy may be reduced. In particular, if a surplus sample flows into the sample measuring unit while the sample is being measured in the sample measuring unit, the sample leaks from the sample measuring unit due to an impact at the time of inflow. As a result, there is a risk that the sample to be weighed in the sample measuring unit will be insufficient, and the test accuracy may be lowered. In addition to this, for example, when a sample leaks from the sample measuring unit due to vibration applied to the inspection apparatus, the leaked sample is supplied to the left sample measuring unit. In this case, the leaked sample may affect the amount of the sample in the left sample measuring unit, and the measurement accuracy may deteriorate.

An object of the present invention is to provide an inspection chip that improves quantitative accuracy.

The test chip of the present disclosure is a multi-stage quantification unit that quantifies a sample or a reagent, and the sample or reagent remaining in the N-th quantification unit is supplied to the N + 1-th quantification unit. A plurality of quantification units, a first wall connected to a first connection located at one end of the quantification unit, and a second wall connected to a second connection located at the other end of the quantification unit And a third wall surface connected to an end portion of the second wall surface connected to the N-stage quantification portion on the side opposite to the end portion on the second connection portion side, A passage having an opening on the second wall surface side connected to a portion, and the first wall surface connected to the N-stage fixed amount portion includes the first connection portion and the second connection portion. Tilts from the virtual plane parallel to the connected quantitative surface to the side opposite to the N + 1-th quantitative unit, and connects to the N-th quantitative unit The second wall surface is inclined toward the N + 1-stage quantification part side from the virtual plane, and the second wall surface connected to the N-stage quantification part from the tip of the third wall surface in the opening The first imaginary line drawn in the orthogonal direction is the N + 1 stage from the second imaginary line connecting the tip of the third wall surface in the opening and the second connection part of the N + 1 stage quantification part. Is located on the first wall surface side connected to the quantification unit, and the opening is from a third imaginary line drawn in a direction orthogonal to the imaginary plane from the second connection portion of the N + 1 stage quantification unit. , And located on the second wall surface side connected to the N + 1 stage determination unit.

In this case, the opening is positioned on the second wall surface side connected to the N + 1 stage quantification unit from the third imaginary line drawn in the direction orthogonal to the virtual plane from the second connection part of the N + 1 stage quantification unit. To do. For this reason, in the case where centrifugal force is applied in the direction orthogonal to the imaginary plane and the quantification plane and the sample is quantified, when the remaining sample or reagent passes through the passage at the Nth stage, the remaining sample or reagent is Supplied to the second wall surface connected to the N + 1 stage quantification unit. That is, the surplus specimen or reagent is not supplied to the N + 1 stage quantification unit. For this reason, when a surplus specimen or reagent flows into the N + 1 stage quantification part, the specimen is prevented from leaking from the quantification part due to an impact at the time of inflow. Therefore, there is no shortage of the sample or reagent to be quantified in the quantification unit, the quantification accuracy in the quantification unit is improved, and the inspection accuracy is improved. Further, for example, when a sample or reagent overflows from the N-th stage quantification unit due to vibration, the overflowing sample or reagent is also connected to the N + 1-th stage quantification unit. Supplied to two wall surfaces. For this reason, the overflowing specimen or reagent is not supplied to the N + 1 stage determination unit. For this reason, it is possible to prevent the amount of the specimen or reagent quantified by the N + 1 stage quantification unit from being affected. Therefore, the quantitative accuracy of the specimen or reagent is improved, and the inspection accuracy is improved.

In the inspection chip, the first imaginary line may intersect with at least one of the first connection portion of the N + 1-stage determination unit and the first wall surface connected to the N + 1-stage determination unit. Good. In this case, when the surplus specimen or reagent in the N-th stage quantification part is supplied to the N + 1-th stage quantification part, the supplied specimen or reagent is at least one of the first connection part and the first wall surface. It hits. Therefore, compared with the case where the sample or reagent is supplied to the second wall surface side from the first connection portion, the possibility that the supplied sample or reagent flows to the second wall surface side without being supplied to the quantification unit can be reduced. For this reason, it is possible to supply the specimen or the reagent to the quantitative unit more reliably.

In the inspection chip, the first imaginary line may intersect with the first connection part of the N + 1-stage determination unit. In this case, when the surplus sample or reagent in the N-th stage quantification unit is supplied to the N + 1-th stage quantification unit, the sample or reagent hits the first connection unit. Therefore, compared with the case where the sample or reagent is supplied from the first connection portion to the first wall surface side, the possibility that the supplied sample or reagent gets over the first wall surface can be reduced. For this reason, for example, when a sample or reagent after quantification is supplied from the first wall surface and the inspection is performed, the sample or reagent after quantification is mixed with the sample or reagent that has crossed the first wall during supply. Can be prevented. Therefore, the user can obtain an accurate inspection result.

In the inspection chip, an angle formed between the virtual surface in the N-th stage quantification unit and the first wall surface connected to the N-th stage quantification unit is the virtual plane in the N + 1-th stage quantification unit. It may be larger than an angle formed by the first wall surface connected to the N + 1-stage determination unit. When the sample or reagent supplied to the N-th stage quantification part is supplied to the N + 1-th stage quantification part, the sample or reagent is reduced by the amount quantified in the N-th stage quantification part. In other words, the smaller the value of N, the greater the amount of sample or reagent supplied to the quantification unit. If the amount of the sample or reagent supplied to the quantification unit increases, the possibility that the sample or reagent crosses the first wall surface increases when the sample or reagent is supplied to the quantification unit. In the present disclosure, as the value of N decreases, the angle formed by the virtual surface and the first wall surface increases. If the angle formed by the virtual surface and the first wall surface increases, it becomes difficult for the specimen or reagent to get over the first wall surface. That is, even if the value of N is small and the amount of the sample or reagent supplied to the quantification unit is large, the sample or reagent can be prevented from getting over the first wall surface. For this reason, for example, when a sample or reagent after quantification is supplied from the first wall surface and the inspection is performed, the sample or reagent after quantification is mixed with the sample or reagent that has crossed the first wall during supply. Can be prevented. Therefore, the user can obtain an accurate inspection result.

In the inspection chip, an angle formed between the virtual plane and the second virtual line in the N-th stage quantification unit is greater than an angle formed between the virtual plane and the second virtual line in the N + 1 stage quantification unit. May be small. As described above, the smaller the value of N, the greater the amount of the specimen or reagent supplied to the quantification unit, and the higher the possibility that the specimen or reagent will get over the first wall surface. In the present disclosure, the smaller the value of N, the smaller the angle formed between the virtual plane and the second virtual line. In this case, in the direction connecting the first connection portion and the second connection portion, the smaller the value of N, the greater the distance between the tip of the third wall portion in the opening and the quantitative portion. Therefore, when the surplus sample or reagent in the N-th stage quantification unit is supplied to the N + 1-th stage quantification unit, the smaller the value of N, the closer the supplied sample or reagent approaches the second connection unit. If the supplied specimen or reagent is close to the second connection part, it is difficult for the specimen or reagent to get over the first wall surface located on the opposite side of the second connection part across the quantitative part. That is, even if the value of N is small and the amount of the sample or reagent supplied to the quantification unit is large, the sample or reagent can be prevented from getting over the first wall surface. Therefore, for example, when a sample or reagent after quantification is supplied from the first wall surface and the inspection is performed, the sample or reagent after quantification and the sample or reagent that has crossed the first wall at the time of supply are mixed. Can be prevented. Therefore, the user can obtain an accurate inspection result.

In the inspection chip, an upstream opening is provided on the second wall surface side connected to the first-stage quantification unit, provided on the side opposite to the second-stage quantification unit side with respect to the first-stage quantification unit. An upstream passage having a first portion, wherein the upstream opening is a first stage from the third imaginary line drawn in a direction perpendicular to the virtual plane from the second connection part of the first stage of the quantitative unit. You may be located in the said 2nd wall surface side connected to the said fixed_quantity | quantitative_assay part. In this case, in the state where centrifugal force is applied in the direction orthogonal to the virtual plane, the specimen or reagent that has passed through the upstream passage due to some influence is the second wall surface connected to the first-stage quantification unit. To be supplied. That is, the specimen or reagent is not supplied to the first-stage quantitative unit. For this reason, the quantitative accuracy of the specimen or reagent quantified by the first-stage quantitative unit is improved, and the test accuracy is improved.

It is a rear view of the inspection apparatus 1 in which the inspection chip 2 is in a steady state. It is a rear view of the test | inspection apparatus 1 in the state which the test | inspection chip 2 rotated from the steady state. It is a top view of the inspection apparatus 1 shown in FIG. 2 is a perspective view of an inspection chip 2. FIG. It is a front view of the test | inspection chip 2 before a centrifugation process. FIG. 6 is an enlarged front view of a plurality of sample quantification units 114 of the test chip 2 shown in FIG. 6 is a timing chart showing the revolution speed, rotation angle, and movement of the specimen of the test chip 2; It is a front view of the test | inspection chip 2 revolved in the autorotation angle of 0 degree | times. FIG. 7 is a front view of a plurality of sample quantification units 114 of the test chip 2 and its surroundings when the specimen 17 is supplied to the sample quantification unit 114 after being revolved at a rotation angle of 82.4 degrees. It is a front view of the test | inspection chip 2 revolved in autorotation angle 82.4 degree | times. It is an enlarged front view of the sample quantification part 114 of the multi-stage of the test | inspection chip 2 revolved in the autorotation angle 82.4 degree | times, and its periphery. FIG. 6 is an enlarged front view of the specimen quantitative unit 114 of the test chip 2 and its surroundings when the specimen 17 is revolved at a rotation angle of 90 degrees and surplus specimen 17 flows toward the specimen surplus part 116. It is a front view of the test | inspection chip 2 revolved in 90 autorotation angles. It is the sample fixed_quantity | quantitative_assay part 114 of the test | inspection chip 2 revolved in 90 autorotation angles, and its expansion front view. It is a front view of the test | inspection chip 2 revolved in the autorotation angle of 0 degree | times. It is a front view of the test | inspection chip 2 revolved in 90 autorotation angles. It is an enlarged front view of the sample quantification part 114 of the multistage of the test | inspection chip 102 which concerns on 2nd embodiment, and its periphery. It is an enlarged front view of the sample quantification part 114 of the multistage of the test | inspection chip 103 which concerns on 3rd embodiment, and its periphery.

Embodiments embodying the present disclosure will be described with reference to the drawings. The drawings to be referred to are used to explain technical features that can be adopted by the present disclosure, and are merely illustrative examples.

<1. Schematic structure of inspection system 3>
A first embodiment of the present disclosure will be described. With reference to FIG.1 and FIG.2, the schematic structure of the test | inspection system 3 is demonstrated. The inspection system 3 of the first embodiment includes an inspection chip 2 that can store a specimen and a reagent that are liquids, and an inspection apparatus 1 that performs an inspection using the inspection chip 2. The inspection apparatus 1 can apply a centrifugal force to the inspection chip 2 by rotation about a vertical axis separated from the inspection chip 2. The inspection apparatus 1 can switch the centrifugal direction that is the direction of the centrifugal force acting on the inspection chip 2 by rotating the inspection chip 2 about the horizontal axis.

<2. Detailed structure of the inspection apparatus 1>
The detailed structure of the inspection apparatus 1 will be described with reference to FIGS. In the following description, the upper, lower, right, left, front side, and rear side of FIG. 1 and FIG. 2 are respectively the upper, lower, right, left, rear, and rear sides of the inspection apparatus 1. Let it be in front. The upper, lower, right, left, front side, and back side of FIG. 3 are the front, rear, right, left, upper, and lower sides of the inspection apparatus 1, respectively. In this embodiment, the direction of the vertical axis is the vertical direction, and the direction of the horizontal axis is the direction of the speed when the inspection chip 2 rotates around the vertical axis. In order to facilitate understanding, FIGS. 1 and 2 show the upper housing 30 by a virtual line, and FIG. 3 shows a state in which the top plate of the upper housing 30 is removed.

As shown in FIGS. 1 to 3, the inspection apparatus 1 includes an upper housing 30, a lower housing 31, a turntable 33, an angle changing mechanism 34, and a control device 90. The turntable 33 is a disk-shaped rotating body provided on the upper surface side of the lower housing 31. The inspection chip 2 is held above the turntable 33. The angle changing mechanism 34 is a drive mechanism provided on the turntable 33. This drive mechanism rotates the inspection chip 2 around the horizontal axis. The upper housing 30 is fixed to the upper side of the lower housing 31, and the measurement unit 7 that performs optical measurement on the inspection chip 2 is provided inside. The control device 90 is a controller that controls various processes of the inspection device 1.

The detailed structure of the lower housing 31 will be described. As shown in FIG.1 and FIG.2, the lower housing | casing 31 has a box-shaped frame structure which combined the frame member. An upper plate 32 that is a rectangular plate material is provided on the upper surface of the lower housing 31. A turntable 33 is rotatably provided above the upper plate 32. A drive mechanism for rotating the turntable 33 around the vertical axis is provided in the lower housing 31 as follows.

A spindle motor 35 that supplies a driving force for rotating the turntable 33 is installed on the left side of the lower housing 31. A shaft 36 of the main shaft motor 35 protrudes upward, and a pulley 37 is fixed. A vertical main shaft 57 extending upward from the inside of the lower housing 31 is provided at the center of the lower housing 31. The main shaft 57 passes through the upper plate 32 and protrudes above the lower housing 31. The upper end portion of the main shaft 57 is connected to the center portion of the turntable 33.

The main shaft 57 is rotatably held by a support member 53 provided immediately below the upper plate 32. A pulley 38 is fixed to the main shaft 57 below the support member 53. A belt 39 is stretched over the pulleys 37 and 38. When the main shaft motor 35 rotates the shaft 36, the driving force is transmitted to the main shaft 57 via the pulley 37, the belt 39, and the pulley 38. At this time, the turntable 33 rotates around the main shaft 57 in conjunction with the rotation of the main shaft 57.

A guide rail 56 extending in the vertical direction inside the lower housing 31 is provided on the right side in the lower housing 31. The T-shaped plate 48 is movable in the vertical direction in the lower housing 31 along the guide rail 56. A groove 80 that is long in the left-right direction is formed on the front side of the T-shaped plate 48, that is, on the back side in FIG. 1 and FIG.

The above-described main shaft 57 is a hollow cylindrical body. The inner shaft 40 is a shaft that can move in the vertical direction inside the main shaft 57. An upper end portion of the inner shaft 40 passes through the main shaft 57 and is connected to a rack gear 43 described later. A bearing 41 is provided at the left end of the T-shaped plate 48. Inside the bearing 41, the lower end portion of the inner shaft 40 is rotatably held.

A stepping motor 51 for moving the T-shaped plate 48 up and down is fixed in front of the T-shaped plate 48. The shaft 58 of the stepping motor 51 protrudes rearward, that is, toward the front side of the page in FIGS. A disc-shaped cam plate 59 is fixed to the tip of the shaft 58. A cylindrical projection 70 is provided on the rear surface of the cam plate 59. The tip of the protrusion 70 is inserted into the groove 80 described above. The protrusion 70 can slide in the groove 80. When the stepping motor 51 rotates the shaft 58, the projection 70 moves up and down in conjunction with the rotation of the cam plate 59. At this time, the T-shaped plate 48 moves up and down along the guide rail 56 in conjunction with the protrusion 70 inserted in the groove 80.

The detailed structure of the angle changing mechanism 34 will be described. The angle changing mechanism 34 has a pair of L-shaped plates 60 fixed to the upper surface of the turntable 33. Each L-shaped plate 60 extends upward from a base portion fixed in the vicinity of the center of the turntable 33, and its upper end portion extends outward in the radial direction of the turntable 33. A rack gear 43 fixed to the inner shaft 40 is provided between the pair of L-shaped plates 60. The rack gear 43 is a metal plate-like member that is long in the vertical direction, and gears are respectively carved on both end faces.

A horizontal support shaft 46 having a gear 45 is rotatably supported at the distal end side in the extending direction of each L-shaped plate 60. The support shaft 46 is fixed to the inspection chip 2 via a mounting holder (not shown). For this reason, the inspection chip 2 also rotates around the support shaft 46 in conjunction with the rotation of the gear 45. Between the gear 45 and the rack gear 43, a pinion gear 44 supported by an L-shaped plate 60 so as to be rotatable around a horizontal axis is interposed. The pinion gear 44 meshes with the gear 45 and the rack gear 43, respectively. In conjunction with the vertical movement of the rack gear 43, the pinion gear 44 and the gear 45 are driven to rotate, and the inspection chip 2 rotates about the support shaft 46.

In this embodiment, as the main shaft motor 35 rotates and drives the turntable 33, the inspection chip 2 rotates about the main shaft 57, which is a vertical axis, and a centrifugal force acts on the inspection chip 2. The rotation around the vertical axis of the inspection chip 2 is called revolution. On the other hand, as the stepping motor 51 moves the inner shaft 40 up and down, the inspection chip 2 rotates around the support shaft 46 which is a horizontal axis, and the direction of the centrifugal force acting on the inspection chip 2 changes relatively. . The rotation around the horizontal axis of the inspection chip 2 is called rotation.

As shown in FIG. 1, when the T-shaped plate 48 is lowered to the lowermost end of the movable range, the rack gear 43 is also lowered to the lowermost end of the movable range. At this time, the test | inspection chip 2 will be in the steady state whose autorotation angle is 0 degree | times (degree). As shown in FIG. 2, when the T-shaped plate 48 is raised to the uppermost end of the movable range, the rack gear 43 is also raised to the uppermost end of the movable range. At this time, the test | inspection chip 2 will be in the state rotated 180 degree | times centering on the horizontal axis line from a steady state. That is, in this embodiment, the angular width that the test chip 2 can rotate is the rotation angle of 0 degrees to 180 degrees.

The detailed structure of the upper housing 30 will be described. As shown in FIG. 3, the upper housing 30 has a box-like frame structure in which frame members are combined, and is installed on the upper left side of the upper plate 32. More specifically, the upper housing 30 is provided outside the range in which the inspection chip 2 is rotated as viewed from the main shaft 57 at the rotation center of the turntable 33.

The measurement unit 7 provided in the upper housing 30 includes a light source 71 that emits measurement light, and an optical sensor 72 that detects the measurement light emitted from the light source 71. The light source 71 and the optical sensor 72 are disposed on both the front and rear sides of the turntable 33 outside the rotation range of the inspection chip 2. In the present embodiment, the position on the left side of the main shaft 57 in the reciprocable range of the inspection chip 2 is the measurement position at which the inspection chip 2 is irradiated with the measurement light. When the inspection chip 2 is at the measurement position, the measurement light connecting the light source 71 and the optical sensor 72 intersects the front and rear surfaces of the inspection chip 2 substantially perpendicularly.

<3. Structure of inspection chip 2>
The detailed structure of the test chip 2 according to the first embodiment will be described with reference to FIGS. In the following description, the upper, lower, lower left, upper right, lower right, and upper left in FIG. 4 are the upper, lower, front, rear, right, and left of the test chip 2, respectively. 5 and 6, the illustration of the sheet 29 is omitted. The same applies to FIGS. 8 to 18 described later.

As shown in FIG. 4, the inspection chip 2 has a square shape when viewed from the front as an example, and mainly includes a transparent synthetic resin plate material 20 having a predetermined thickness. The front surface of the plate member 20 is sealed with a sheet 29 made of a transparent synthetic resin thin plate. Between the plate member 20 and the sheet 29, a liquid flow path 25 is formed through which the liquid sealed in the inspection chip 2 can flow. The liquid flow path 25 is a recess formed at a predetermined depth on the front side of the plate member 20 and extends in a direction orthogonal to the front-rear direction, which is the thickness direction of the plate member 20. That is, the sheet 29 seals the flow path forming surface of the plate material 20.

As shown in FIGS. 4 and 5, the liquid channel 25 includes the first reagent quantitative channels 13A, 13B, and 13C, the second reagent quantitative channels 15A, 15B, and 15C, the sample quantitative channel 11, and the mixing unit 170A. , 170B, 170C. The first reagent quantitative flow path 13A is provided in the upper right part of the test chip 2. The first reagent quantitative channel 13B is provided obliquely to the left of the first reagent quantitative channel 13A. The first reagent fixed amount flow channel 13C is provided in the upper left part of the test chip 2. The second reagent quantitative flow path 15A is provided below the first reagent quantitative flow path 13A. The second reagent quantitative flow path 15B is provided below the first reagent quantitative flow path 13B. The second reagent quantitative flow channel 15C is provided below the first reagent quantitative flow channel 13C. The sample quantitative flow path 11 is provided on the right side of the first reagent quantitative flow path 13C and the second reagent quantitative flow path 15C and on the left side of the first reagent quantitative flow path 13B and the second reagent quantitative flow path 15B. Yes.

The mixing unit 170A is provided in the lower right part of the inspection chip 2. The mixing unit 170B is provided on the left side of the mixing unit 170A. The mixing unit 170C is provided on the left side of the mixing unit 170B. As will be described in detail later, as shown in FIG. 16, in the mixing unit 170A, the first reagent 18 quantified in the first reagent quantification channel 13A and the second reagent 19 quantified in the second reagent quantification channel 15A. And the sample 17 quantified in the sample quantification unit 114A described later are mixed to form a mixed solution 26. In the mixing unit 170B, the first reagent 18 quantified in the first reagent quantification channel 13B, the second reagent 19 quantified in the second reagent quantification channel 15B, and the sample quantified in the sample quantification unit 114B described later. 17 is mixed to be a mixed liquid 26. In the mixing unit 170C, the first reagent 18 quantified in the first reagent quantification channel 13C, the second reagent 19 quantified in the second reagent quantification channel 15C, and the sample quantified in the sample quantification unit 114C described later. 17 is mixed to be a mixed liquid 26.

The specimen 17 of the present embodiment is a liquid containing components such as blood, plasma, blood cells, bone marrow, urine, vaginal tissue, epithelial tissue, tumor, semen, saliva, or foodstuff. The types of the first reagent 18 quantified in the first reagent quantification channels 13A, 13B, and 13C may be different from each other. In addition, the types of the second reagent 19 quantified in the second reagent quantitative channels 15A, 15B, and 15C may be different from each other. As a result, in the mixing units 170A, 170B, and 170C, the mixed liquid 26 is used, and inspections are performed for different inspection items.

The first reagent quantitative flow channels 13A, 13B, and 13C will be described. The first reagent fixed flow channels 13A, 13B, and 13C have substantially the same configuration. For this reason, the first reagent quantitative flow path 13A will be described in detail, and the first reagent quantitative flow paths 13B and 13C will be briefly described.

As shown in FIGS. 4 and 5, the first reagent quantitative flow path 13A includes a first reagent holding part 131A, a first reagent supply part 132A, a first reagent guide part 133A, a first reagent quantitative part 134A, a passage 135A, A passage 137A and a first reagent surplus portion 136A are included. 131 A of 1st reagent holding parts are the recessed parts opened upwards. The first reagent holding part 131A is a part where the first reagent 18 is injected and stored. The first reagent holding part 131 </ b> A is formed between a holding part wall surface 138 </ b> A extending diagonally right upward from the partition wall 141 and the partition wall 141. The partition wall 141 is a wall portion that extends downward from the upper side portion 21 that is the upper wall surface of the test chip 2 and separates the first reagent fixed amount flow channel 13A and the first reagent holding portion 131A. The first reagent supply unit 132A is a flow path of the first reagent 18 extending downward from the upper right portion of the first reagent holding unit 131A. The lower end of the first reagent supply unit 132A is connected to a first reagent guide unit 133A having a narrow channel. Below the first reagent guide section 133A, a first reagent quantitative section 134A is provided. 134 A of 1st reagent fixed_quantity | quantitative_assay part is a site | part which quantifies the 1st reagent 18, and is a recessed part opened upwards.

The passage 137A extends in the right direction and the passage 135A extends in the left direction from the portion where the first reagent guide portion 133A and the first reagent fixed amount portion 134A communicate with each other. The passage 137A is connected to the mixing unit 170A. The passage 135A extends to the first reagent surplus portion 136A provided on the lower left side of the first reagent fixed amount portion 134A. The first reagent surplus portion 136A is a portion in which the first reagent 18 overflowing from the first reagent quantitative portion 134A is stored, and is a recess provided in the right direction from the lower end portion of the passage 135A.

The first reagent fixed flow channel 13B and the first reagent fixed flow channel 13C will be described. The first reagent quantitative flow path 13B includes a first reagent holding part 131B, a holding part wall surface 138B, a first reagent supply part 132B, a first reagent guide part 133B, a first reagent quantitative part 134B, a passage 135B, a passage 137B, and One reagent surplus part 136B is included. The first reagent quantitative flow path 13C includes a first reagent holding part 131C, a holding part wall surface 138C, a first reagent supply part 132C, a first reagent guide part 133C, a first reagent quantitative part 134C, a passage 135C, a passage 137C, and One reagent surplus part 136C is included. The configurations of the first reagent holding units 131B and 131C and the holding unit wall surfaces 138B and 138C are substantially the same as the configurations of the first reagent holding unit 131A, the holding unit wall surface 138A, and the first reagent supply unit 132A, respectively. The configuration of the first reagent supply units 132B and 132C is substantially the same as the configuration of the first reagent supply unit 132A. The configuration of the first reagent guides 133B and 133C is substantially the same as the configuration of the first reagent guide 133A. The configuration of the first reagent quantification units 134B and 134C is substantially the same as the configuration of the first reagent quantification unit 134A. The configuration of the passages 135B and 135C is substantially the same as the configuration of the passage 135A. The configurations of the passages 137B and 137C are substantially the same as the configuration of the passage 137A. The configuration of the first reagent surplus portion 136B, 136C is substantially the same as the configuration of the first reagent surplus portion 136A. The passage 137B is connected to the mixing unit 170B. The passage 137C is connected to the mixing unit 170C.

2nd reagent fixed_quantity | assay flow path 15A, 15B, 15C is demonstrated. The configurations of the second reagent fixed amount channels 15A, 15B, and 15C are substantially the same as each other. Therefore, the second reagent quantitative flow channel 15A will be described in detail, and the second reagent quantitative flow channels 15B and 15C will be briefly described.

The second reagent quantitative channel 15A includes a second reagent holding unit 151A, a second reagent supply unit 152A, a second reagent guide unit 153A, a second reagent quantitative unit 154A, a channel 155A, a channel 157A, and a second reagent surplus unit 156A. including. The second reagent holding portion 151A is a recess that opens upward. The second reagent holding unit 151A is a part where the second reagent 19 is injected and stored. The second reagent holding portion 151A is formed between a holding portion wall surface 158A extending obliquely upward to the right from the partition wall 141 and the partition wall 141. The second reagent supply unit 152A is a flow path of the second reagent 19 that extends downward from the upper right portion of the second reagent holding unit 151A. The lower end of the second reagent supply unit 152A is connected to a second reagent guide unit 153A having a narrow channel. A second reagent quantitative unit 154A is provided below the second reagent guide unit 153A. The second reagent quantification unit 154A is a part that quantifies the second reagent 19, and is a recess that opens upward.

The passage 157A extends in the right direction and the passage 155A extends in the left direction from the portion where the second reagent guide portion 153A and the second reagent fixed amount portion 154A communicate with each other. The passage 157A is connected to the mixing unit 170A. The passage 155A extends to the second reagent surplus portion 156A provided on the lower left side of the second reagent fixed amount portion 154A. The second reagent surplus portion 156A is a portion in which the second reagent 19 overflowing from the second reagent quantitative portion 154A is stored, and is a recess provided in the right direction from the lower end portion of the passage 155A.

The second reagent quantification channel 15B and the second reagent quantification channel 15C will be described. The second reagent quantitative channel 15B includes a second reagent holding unit 151B, a holding unit wall surface 158B, a second reagent supply unit 152B, a second reagent guiding unit 153B, a second reagent quantitative unit 154B, a passage 155B, a passage 157B, and Two reagent surplus portions 156B are included. The second reagent quantitative channel 15C includes a second reagent holding unit 151C, a holding unit wall surface 158C, a second reagent supply unit 152C, a second reagent guide unit 153C, a second reagent quantitative unit 154C, a passage 155C, a passage 157C, A two-reagent surplus portion 156C is included. The second reagent holding portions 151B and 151C and the holding portion wall surfaces 158B and 158C have substantially the same configurations as the second reagent holding portion 151A and the holding portion wall surface 158A, respectively. The configurations of the second reagent supply units 152B and 152C are substantially the same as the configuration of the second reagent supply unit 152A. The configurations of the second reagent guides 153B and 153C are substantially the same as the configuration of the second reagent guide 153A. The configurations of the second reagent quantification units 154B and 154C are substantially the same as the configuration of the second reagent quantification unit 154A. The configuration of the passages 155B and 155C is substantially the same as the configuration of the passage 155A. The configuration of the passages 157B and 157C is substantially the same as the configuration of the passage 157A. The configuration of the second reagent surplus portion 156B, 156C is substantially the same as the configuration of the second reagent surplus portion 156A. The passage 157B is connected to the mixing unit 170B. The passage 157C is connected to the mixing unit 170C.

The specimen quantification channel 11 will be described. In the following description, sample quantification units 114A, 114B, and 114C, which will be described later, are collectively referred to as sample quantification unit 114, or when any of them is not specified. First wall surfaces 123A, 123B, 123C, second wall surfaces 124A, 124B, 124C, third wall surfaces 125A, 125B, 125C, fixed surfaces 126A, 126B, 126C, passages 120A, 120B, 120C and openings 127A, 127B, which will be described later. The same applies to 127C and virtual surfaces 128A, 128B, and 128C.

The first virtual lines 751 and 752 to be described later are collectively referred to as the first virtual line 75 or when any one is not specified. When the second virtual lines 761 and 762 described later are generically referred to, or when any one of them is not specified, it is referred to as a second virtual line 76. The third virtual lines 77A, 77B, and 77C, which will be described later, are collectively referred to as the third virtual line 77 when they are collectively referred to or when any one is not specified. 4 to 6 and 8 to 16, reference numerals 75, 76, 77, 114, 120, 123, 124, 125, 126, and 127 of the respective components are shown only at one place or two places. Yes. The same applies to FIGS. 17 and 18 described later. “N” is a natural number.

As shown in FIGS. 4 to 6, the sample quantification channel 11 includes a sample holding unit 111, a sample supply unit 112, a sample guide unit 113, sample quantification units 114A, 114B, and 114C, passages 115A, 115B, and 115C, and a passage 117A. , 117B, 117C, and the specimen surplus portion 116. The sample holder 111 is a recess that opens upward. The specimen holding unit 111 is a part where the specimen 17 is injected and stored. The specimen holding unit 111 is formed between the holding unit wall surface 118 that extends obliquely upward to the right from the partition wall 142 and the partition wall 142. The partition wall 142 is a wall portion that extends downward from the upper side portion 21 and separates the sample quantitative flow channel from the first reagent quantitative flow channel 13C. The sample supply unit 112 is a flow path of the sample 17 that extends downward from the upper right portion of the sample holding unit 111. A lower end portion of the sample supply unit 112 is connected to a sample guide unit 113 which is a passage having a narrow channel.

A plurality of sample quantification units 114A, 114B, and 114C are provided below the sample guide unit 113. The specimen quantification units 114A, 114B, and 114C are parts for quantifying the specimen 17, and are concave portions that open upward. The sample quantification units 114A, 114B, and 114C are arranged obliquely downward to the left. The sample quantitative unit 114A is a first-stage sample quantitative unit. The sample quantification unit 114B is a second-stage sample quantification unit. The sample quantitative unit 114C is a third-stage sample quantitative unit. In the present embodiment, the surplus sample 17 in the N-th stage sample quantifying unit 114 is supplied to the N + 1-th stage sample quantifying unit 114. That is, the first-stage sample quantification unit 114A is a sample quantification unit on the most upstream side of the flow of the sample 17. The third-stage sample quantification unit 114 </ b> C is a sample quantification unit on the most downstream side of the flow of the sample 17.

The first-stage sample quantitative unit 114A is located below the sample guide unit 113. That is, the sample guide unit 113 is located on the upper side opposite to the second-stage sample determination unit 114B side with respect to the first-stage sample determination unit 114A. The sample guide unit 113 extends from the lower end portion of the sample supply unit 112 toward the second wall surface 124A (described later) connected to the first-stage sample determination unit 114A. The sample guide unit 113 has an opening 129 on the lower side, which is the second wall surface 124A side, connected to the first-stage sample determination unit 114A. The sample guide 113 and the opening 129 are located on the upstream side of the first-stage sample determination unit 114A.

The passage 117A extends in the right direction and the passage 115A extends in the left direction from the portion where the sample guide portion 113 and the sample determination portion 114A communicate with each other. The passage 117A extends to the right and then extends downward, and is connected to the mixing unit 170A. The passage 115A is connected to a passage 120A having a narrow flow path. A passage 117B extends rightward and a passage 115B extends leftward from a portion where the passage 120A communicates with the sample determination unit 114B. The passage 117B extends in the right direction, then extends downward, and is connected to the mixing unit 170B. The passage 115B is connected to a passage 120B having a narrow flow path.

The passage 117C extends rightward and the passage 115C extends leftward from the portion where the passage 120B and the sample determination unit 114C communicate with each other. The passage 117C extends in the right direction, then extends downward, and is connected to the mixing unit 170C. The passage 115C is connected to the passage 120C. The passage 120C is connected to the specimen surplus portion 116. The sample surplus section 116 is provided in the direction on the first wall surface 123 side to be described later among the directions intersecting the direction from the N-th stage sample quantification section 114 to the N + 1-th stage sample quantification section 114. For this reason, the sample surplus part 116 is provided below the sample quantification part 114C.

As shown in FIG. 6, the first connection parts 121A, 121B, and 121C are located at the right ends of the sample quantification parts 114A, 114B, and 114C, respectively. First wall surfaces 123A, 123B, and 123C are connected to the first connection portions 121A, 121B, and 121C, respectively. The first wall surfaces 123A, 123B, and 123C form part of the passages 117A, 117B, and 117C, respectively. Second connection portions 122A, 122B, and 122C are located at the left end portions of the sample quantification portions 114A, 114B, and 114C, respectively. Second wall surfaces 124A, 124B, and 124C are connected to the second connection portions 122A, 122B, and 122C, respectively. The second wall surfaces 124A, 124B, and 124C form part of the passages 115A, 115B, and 115C, respectively. A surface connecting the first connecting portion 121A and the second connecting portion 122A is referred to as a fixed surface 126A. A surface connecting the first connection portion 121B and the second connection portion 122B is referred to as a quantitative surface 126B. A surface connecting the first connecting portion 121C and the second connecting portion 122C is referred to as a fixed surface 126C. The fixed surfaces 126A, 126B, 126C are parallel to each other and extend in the left-right direction. Surfaces extending from each of the fixed surfaces 126A, 126B, and 126C and parallel to the fixed surface 126 are referred to as virtual surfaces 128A, 128B, and 128C. The virtual surfaces 128A, 128B, and 128C are surfaces on the outer side in the left-right direction with respect to the virtual surfaces 126A, 126B, and 126C.

The first wall surface 123 connected to the N-th stage sample quantification unit 114 is inclined upward from the virtual plane 128 parallel to the quantification surface 126, which is the opposite side to the N + 1-th stage sample quantification unit 114 side. More specifically, the first wall surface 123A connected to the first-stage sample quantitative unit 114A is inclined upward from the virtual surface 128A, which is the opposite side to the second-stage sample quantitative unit 114B side. The first wall surface 123B connected to the second-stage sample quantification unit 114B is inclined upward from the virtual plane 128B, which is the opposite side to the third-stage sample quantification part 114C side. Note that the sample surplus section 116 is provided below the third stage sample quantification section 114C, which is the final stage, and no other sample quantification section 114 is arranged. However, similarly to the first wall surfaces 123A and 123B, the first wall surface 123C connected to the third-stage sample quantification unit 114C is inclined upward from the virtual surface 128C. The first wall surfaces 123A, 123B, and 123C are parallel to each other and extend obliquely upward to the right from the first connection portions 121A, 121B, and 121C, respectively.

The second wall surface 124 connected to the N-th stage sample quantifying unit 114 is inclined downward from the virtual plane 128, which is the N + 1-th stage sample quantifying unit 114 side. More specifically, the second wall surface 124B connected to the first-stage sample quantification unit 114A is tilted downward from the virtual surface 128B, which is the second-stage sample quantification part 114B side. The second wall surface 124B connected to the second-stage sample quantification unit 114B is tilted downward from the virtual plane 128B, which is the third-stage sample quantification part 114C side. Similarly to the second wall surfaces 124A and 124B, the second wall surface 124B connected to the third-stage sample quantification unit 114C, which is the final stage, is inclined downward from the virtual surface 128C. The second wall surfaces 124A, 124B, and 124C are parallel to each other, and extend obliquely downward to the left from the second connection portions 122A, 122B, and 122C, respectively. The angle formed between the first wall surface 123 and the virtual surface 128 is larger than the angle formed between the second wall surface 124 and the virtual surface 128.

Third wall surfaces 125A, 125B, and 125C are connected to left end portions that are opposite to the end portions on the second connection portions 122A, 122B, and 122C side of the second wall surfaces 124A, 124B, and 124C, respectively. . The third wall surfaces 125A, 125B, and 125C are included in the passages 120A, 120B, and 120C, respectively. The passage 120 extends toward the second wall surface 124 connected to the N + 1-stage sample determination unit 114. The passage 120 has an opening 127 on the second wall surface 124 side connected to the N + 1-th stage sample determination unit 114. More specifically, the passage 120A extends downward, which is a direction toward the second wall surface 124B connected to the second-stage sample quantitative unit 114B side. The passage 120A has an opening 127A on the lower side, which is the second wall surface 124B side, connected to the second-stage sample determination unit 114B. The passage 120B extends downward, which is a direction toward the second wall surface 124B connected to the third-stage sample determination unit 114C. The passage 120A has an opening 127B on the lower side, which is the second wall surface 124B side, connected to the third-stage sample determination unit 114C. The passage 120C extends downward similarly to the passages 120A and 120B, and has an opening 127C on the lower side.

The positional relationship among the first wall surface 123, the second wall surface 124, the specimen quantification unit 114, the opening 127, the opening 129, and the like will be described in detail. In the following description, a line drawn in the direction orthogonal to the second wall surface 124A connected to the first stage sample determination unit 114A from the tip of the third wall surface 125A in the opening 127A is referred to as a first virtual line 751. A line drawn from the tip of the third wall surface 125B in the opening 127B in a direction perpendicular to the second wall surface 124B connected to the second-stage sample determination unit 114B is referred to as a first virtual line 752.

A line connecting the tip of the third wall surface 125A in the opening 127A and the first connection part 121B of the second-stage sample determination part 114B is referred to as a second virtual line 761. A line connecting the distal end of the third wall surface 125B in the opening 127B and the first connection part 121C of the third-stage sample determination part 114C is referred to as a second virtual line 762.

The line drawn in the direction orthogonal to the virtual plane 128 from the second connection portion 122A of the first-stage sample quantitative unit 114A is referred to as a third virtual line 77A. A line drawn from the second connection part 122B of the second-stage sample quantification part 114B in the direction orthogonal to the virtual surface 128B is referred to as a third virtual line 77B. A line drawn in the direction orthogonal to the virtual plane 128C from the second connection portion 122C of the third-stage sample quantification unit 114C is referred to as a third virtual line 77C.

The first imaginary line 75 drawn from the tip of the third wall surface 125 in the opening 127 in the direction orthogonal to the second wall surface 124 connected to the N-th sample quantification unit 114 is the third imaginary line 125 in the opening 127. It is located on the first wall surface 123 side connected to the N + 1-stage quantification unit from the second virtual line 76 connecting the tip and the N + 1-stage sample quantification unit 114. In the present embodiment, of the lines extending in the direction orthogonal to the second wall surface 124 connected to the N-th stage sample determination unit 114 from the tip of the third wall surface 125 in the opening 127, N + 1 from the third wall surface 125. The lower line on the side of the sample quantification unit 114 is the first virtual line 75.

In the present embodiment, the first virtual line 751 is located on the right side, which is on the first wall surface 123B side connected to the second-stage sample quantitative unit 114B, from the second virtual line 761. The first virtual line 751 intersects the first connection part 121B. Further, the first virtual line 752 is located on the right side on the first wall surface 123C side connected to the third-stage sample quantification unit 114C from the second virtual line 762. The first virtual line 752 intersects the first connection part 121C.

Further, in the present embodiment, the opening 127 has the N + 1 stage sample quantification from the third virtual line 77 drawn in the direction orthogonal to the virtual plane 128 from the second connection part 122 of the N + 1 stage sample quantification part 114. Located on the second wall surface 124 side connected to the portion 114. More specifically, the opening 127A is located on the left side on the second wall surface 124B side from the third virtual line 77B. Further, the opening 127B is located on the left side on the second wall surface 124C side from the third virtual line 77C. Further, the opening 129 of the sample guide unit 113 has a first-stage sample quantification from a third virtual line 77A drawn in a direction orthogonal to the virtual surface 128A from the second connection part 122A of the first-stage sample quantification unit 114. It is located on the left side which is the second wall surface 124A side connected to the portion 114A.

<4. Other structures of inspection chip 2>
As shown in FIG. 1, the support shaft 46 extending from the L-shaped plate 60 is vertically connected to the center of the rear surface of the plate member 20 via a mounting holder (not shown). As the support shaft 46 rotates, the inspection chip 2 rotates around the support shaft 46. When the inspection chip 2 is in the steady state shown in FIGS. 4 to 6, the upper side 21 and the lower side 24 are orthogonal to the direction of the gravity G, the right side 22 and the left side 23 are parallel to the direction of the gravity G, and The left side portion 23 is disposed closer to the main shaft 57 than the right side portion 22. In a state where the inspection chip 2 in the steady state is disposed at the measurement position, the inspection apparatus 1 is optically transmitted by selectively passing the measurement light connecting the light source 71 and the optical sensor 72 through the mixing units 170A, 170B, and 170C. Inspect by measurement.

<5. Example of inspection method>
An inspection method using the inspection apparatus 1 and the inspection chip 2 will be described with reference to FIGS. Note that the rotation, revolution, and rotation speed of the inspection chip 2 shown in FIG. 7 are controlled by whether or not the times T1 to T5 have elapsed. Information of times T1 to T5 is stored in advance in a storage device (not shown) of the control device 90.

The user arranges the first reagent 18 in the first reagent holding units 131A, 131B, and 131C, arranges the second reagent 19 in the second reagent holding units 151A, 151B, and 151C, and arranges the sample 17 in the sample holding unit 111. To the state. The arrangement method of the first reagent 18, the second reagent 19, and the specimen 17 is not limited. For example, holes are opened at positions corresponding to the first reagent holding parts 131A, 131B, 131C, the second reagent holding parts 151A, 151B, 151C, and the sample holding part 111 in the sheet 29, and the user can The reagent 18, the second reagent 19, and the specimen 17 may be injected, and further sealed. In addition, the first reagent 18 is arranged in advance in the first reagent holding units 131A, 131B, and 131C, and the second reagent 19 is arranged in the second reagent holding units 151A, 151B, and 151C and sealed with the sheet 29 in advance. May be. In this case, a hole may be opened at a position corresponding to the sample holding unit 111 in the sheet 29, and the user may inject the sample 17 from the hole, and further seal and seal. Further, the upper part of the upper side 21 of the sample holding part 111 is open, and the user may inject the sample 17 from the opening and seal the opening.

Next, when the user attaches the inspection chip 2 to the spindle 46 and inputs a process start command to the control device 90, the following measurement operation is executed. The time when the processing start command is input is time T0 in the timing chart shown in FIG. The inspection apparatus 1 can inspect two inspection chips 2 at the same time. For convenience of explanation, a procedure for inspecting one inspection chip 2 will be described below. In the following description, the stationary state of the inspection chip 2 shown in FIG. 5 is defined as a rotation angle of 0 degree, and the state rotated from the steady state by 82.4 degrees counterclockwise is referred to as “a rotation angle of 82.4 degrees”. A state in which the rotation angle is further rotated 7.6 degrees counterclockwise from 82.4 degrees is referred to as “rotation angle 90 degrees”.

First, from time T0, the spindle motor 35 starts driving the turntable 33 based on an instruction from the control device 90. As a result, the inspection chip 2 having a rotation angle of 0 degrees revolves. The spindle motor 35 increases the rotation speed of the turntable 33 based on an instruction from the control device 90. When the rotation speed reaches 3000 rpm, the spindle motor 35 maintains this rotation speed. Hereinafter, a state in which the turntable 33 is rotating at a rotation speed of 3000 rpm is referred to as high-speed driving. Note that the rotational speed at the time of high-speed driving is not limited to 3000 rpm, but may be other rotational speeds.

As shown in FIG. 8, the centrifugal force X acts on the test chip 2 from the left side 23 toward the right side 22 from time T0 to time T1. The sample 17 moves from the sample holding unit 111 to the sample supply unit 112 by the action of the centrifugal force X. Similarly, the first reagent 18 moves from the first reagent holding unit 131A, 131B, 131C to the first reagent supply unit 132A, 132B, 132C. The second reagent 19 moves from the second reagent holding unit 151A, 151B, 151C to the second reagent supply unit 152A, 152B, 152C. The time T1 is stored in advance in a storage device (not shown) of the control device 90 as a time sufficient for the specimen 17, the first reagent 18, and the second reagent 19 to move as described above.

At time T1, by the driving control of the stepping motor 51 based on the instruction of the control device 90, the test chip 2 revolving by high speed driving is 82.4 degrees counterclockwise as viewed from the front, as shown in FIGS. Rotated. As a result, the rotation angle of the inspection chip 2 changes to 82.4 degrees. As a result, the centrifugal force X acts on the test chip 2 so that the angle formed by the upper side portion 21 and the direction of the centrifugal force is 82.4 degrees. In the present embodiment, the rotation angle “82.4 degrees” is a rotation angle at which the centrifugal force X can be applied in a direction orthogonal to the second wall surface 124.

As shown in FIG. 9, due to the action of the centrifugal force X, the specimen 17 is supplied to the specimen quantitative section 114A via the specimen guide section 113. At this time, the surplus sample 17 in the N-th stage sample determination unit 114 is supplied to the N + 1-th stage sample determination unit 114 via the second wall surface 124. That is, the remaining sample 17 in the first-stage sample quantification unit 114A is supplied to the second-stage sample quantification unit 114B. The surplus sample 17 in the second-stage sample quantification unit 114B is supplied to the third-stage sample quantification unit 114C. The surplus sample 17 in the third-stage sample quantitative unit 114C is supplied to the sample surplus unit 116.

Also, due to the action of the centrifugal force X, the first reagent 18 is supplied to the first reagent quantification units 134A, 134B, 134C via the first reagent guides 133A, 133B, 133C. The excess first reagent 18 in the first reagent quantification units 134A, 134B, and 134C flows into the first reagent surplus units 136A, 136B, and 136C. In FIG. 9, the 1st reagent 18 is supplied to the 1st reagent fixed_quantity | quantitative_assay part 134B via the 1st reagent guide part 133B, and the surplus 1st reagent 18 has flowed into the 1st reagent surplus part 136B. Although not shown, similarly, the second reagent 19 flows into the second reagent quantitative units 154A, 154B, 154C via the second reagent guides 153A, 153B, 153C. The excess second reagent 19 in the second reagent quantification units 154A, 154B, 154C flows into the second reagent surplus portions 156A, 156B, 156C.

As shown in FIG. 7, during a period of time T1 to T2, the spindle motor 35 reduces the rotation speed of the turntable 33 based on an instruction from the control device 90. When the rotational speed reaches 1000 rpm, the spindle motor 35 maintains this rotational speed. The state where the turntable 33 is rotating at a rotation speed of 1000 rpm is hereinafter referred to as low speed driving. The rotational speed at the time of low speed driving is not limited to 1000 rpm as long as it is slower than the rotational speed at the time of high speed driving, and may be other rotational speeds. Centrifugal force X during low-speed driving is weaker than centrifugal force X during high-speed driving. That is, the centrifugal force X at time T2 is based on the centrifugal force X at the start of injection of each liquid into the sample quantitative unit 114, the first reagent quantitative units 134A, 134B, and 124C, and the second reagent quantitative units 154A, 154B, and 154C. weak. As a result, at the start of injection into the sample quantification units 114A, 114B, 114C, the first reagent quantification units 134A, 134B, 134C, and the second reagent quantification units 154A, 154B, 154C, each liquid is efficiently produced by a strong centrifugal force. Is injected. Further, by weakening the centrifugal force at the end of injection, it is possible to prevent bubbles from being mixed and to suppress the dents in the liquid surface of each liquid. The time T2 is stored in advance in a storage device (not shown) of the control device 90 as a time sufficient for the specimen 17, the first reagent 18, and the second reagent 19 to move to each quantification unit.

As shown in FIG. 10, the surplus sample 17 in the sample quantification units 114A, 114B, and 114C is stored in the sample surplus unit 116. Here, as shown in FIG. 11, the sample 17 is a total amount of the volume of the sample determination unit 114 and the amount overflowing the first wall 123 side beyond the first connection unit 121. As shown in FIG. 10, the same applies to the first reagent quantitative units 134A, 134B, and 134C and the second reagent quantitative units 154A, 154B, and 154C. During times T1 to T2 shown in FIG. 7, the spindle motor 35 drives the turntable 33 at a low speed, so that the centrifugal force is weaker than the centrifugal force at the time of high speed driving. This is because the amount of the liquid in the total amount of the sample 17 is reduced.

Next, at time T2 shown in FIG. 7, by the drive control of the stepping motor 51 based on the instruction of the control device 90, the inspection chip 2 that is revolving by low speed rotation is rotated 7.6 degrees counterclockwise when viewed from the front. . As a result, the rotation angle of the test chip 2 changes to 90 degrees as shown in FIGS. As shown in FIG. 12, the centrifugal force X acting on the quantitative surface 126 is a direction orthogonal to the quantitative surface 126 and the virtual surface 128. Therefore, the specimen 17 that has overflowed beyond the fixed surface 126 and beyond the first connecting portion 121 to the first wall surface 123 side overflows to the second wall surface 124 side.

Here, the opening 127 is connected to the N + 1-stage sample quantification unit 114 from the third virtual line 77 drawn in the direction orthogonal to the virtual plane 128 from the second connection unit 122 of the N-th stage sample quantification unit 114. It is located on the second wall surface 124 side. For this reason, the 2nd wall surface 124 is located in the direction side where the centrifugal force X of the opening part 127 acts. Therefore, the sample 17 overflowing from the N-th stage sample quantifying unit 114 is supplied to the second wall surface 124 connected to the N + 1-th stage sample quantifying unit 114. Therefore, as shown in FIG. 12, the sample 17 overflowing from the N-th stage sample quantifying unit 114 is not supplied to the N + 1-th stage sample quantifying unit 114.

The sample 17 overflowing from all the sample quantification units 114A, 114B, 114C is stored in the sample surplus unit 116. As a result, as shown in FIGS. 13 and 14, a predetermined amount of the sample 17 is accurately quantified in the sample quantification units 114A, 114B, and 114C. Here, the volume surrounded by the quantitative surface 126 and the wall forming the specimen quantitative unit 114 is a desired quantitative amount. As shown in FIG. 16, the sample 17, the first reagent 18, and the second reagent 19, which are quantified by the sample quantifying unit 114, are mixed to form a mixed solution 26. This mixed liquid 26 is optically measured and inspected. For this reason, if the volume of the specimen 17 quantified by the specimen quantification unit 114 deviates from a desired volume, the inspection accuracy based on the optical measurement decreases. Similarly, in the first reagent quantitative units 134A, 134B, and 134C, the first reagent 18 that exceeds a predetermined amount overflows into the passages 135A, 135B, and 135C. The overflowed first reagent 18 is stored in the first reagent surplus portions 136A, 136B, and 136C. As a result, the predetermined amount of the first reagent 18 is accurately quantified. Further, in the second reagent quantification units 154A, 154B, 154C, the second reagent 19 exceeding a predetermined amount overflows into the passages 155A, 155B, 155C. The overflowed second reagent 19 is stored in the second reagent surplus portions 156A, 156B, 156C. As a result, the predetermined amount of the second reagent 19 is accurately quantified.

7 during the period from time T2 to time T3 shown in FIG. 7, the spindle motor 35 drives the turntable 33 at high speed based on an instruction from the control device 90. As a result, the inspection chip 2 whose rotation angle is 90 degrees revolves. By this high speed driving, a centrifugal force stronger than the centrifugal force at the time of low speed driving acts on the specimen 17, so that the viscous specimen 17 such as blood, plasma or blood cells is quantified more accurately. The time T3 is stored in advance in a storage device (not shown) of the control device 90 as a time sufficient for the sample 17, the first reagent 18, and the second reagent 19 to be quantified in each quantification unit.

Next, at the time T3 shown in FIG. 7, by the drive control of the stepping motor 51 based on the instruction of the control device 90, as shown in FIG. 15, the rotating test chip 2 is rotated 90 degrees clockwise as viewed from the front. The As a result, the rotation angle of the inspection chip 2 returns to 0 degrees, and the centrifugal force X acts on the inspection chip 2 from the left side portion 23 toward the right side portion 22. By the action of the centrifugal force X, the specimen 17 quantified in the specimen quantification units 114A, 114B, 114C moves to the passages 117A, 117B, 117C. On the other hand, since the specimen surplus portion 116 is a concave portion that closes in the right direction, the surplus specimen 17 remains in the specimen surplus portion 116.

Similarly, the first reagent 18 quantified in the first reagent quantification units 134A, 134B, and 134C moves to the passages 135A, 135B, and 135C. On the other hand, since the first reagent surplus portions 136A, 136B, and 136C are concave portions that are closed in the right direction, the surplus first reagent 18 remains in the first reagent surplus portions 136A, 136B, and 136C. The second reagent 19 quantified in the second reagent quantification units 154A, 154B, 154C moves to the passages 157A, 157B, 157C. On the other hand, since the second reagent surplus portions 156A, 156B, and 156C are concave portions that are closed in the right direction, the surplus second reagent 19 remains in the second reagent surplus portions 156A, 156B, and 156C.

Next, at the time T4 shown in FIG. 7, by the drive control of the stepping motor 51 based on the instruction of the control device 90, as shown in FIG. 16, the rotating test chip 2 rotates 90 degrees counterclockwise as viewed from the front. Is done. As a result, the rotation angle of the inspection chip 2 changes to 90 degrees, and the centrifugal force X acts on the inspection chip 2 from the upper side portion 21 toward the lower side portion 24. Due to the action of the centrifugal force X, the specimen 17 flows into the mixing sections 170A, 170B, and 170C from the passages 117A, 117B, and 117C. The first reagent 18 flows from the passages 137A, 137B, and 137C into the mixing units 170A, 170B, and 170C. The second reagent 19 flows into the mixing unit 170 from the passages 157A, 157B, and 157C. On the other hand, the surplus specimen 17, the first reagent 18, and the second reagent 19 remain in the specimen surplus part 116, the first reagent surplus parts 136A, 136B, and 136C, and the second reagent surplus parts 156A, 156B, and 156C. The specimen 17, the first reagent 18, and the second reagent 19 that have flowed into the mixing units 170A, 170B, and 170C are mixed by the action of the centrifugal force X, and a mixed liquid 26 is generated.

Next, at time T5 shown in FIG. 7, the test chip 2 that is revolving is rotated 90 degrees clockwise as viewed from the front by the drive control of the stepping motor 51 based on the instruction of the control device 90. As a result, the rotation angle of the inspection chip 2 changes to 0 degrees. Thereafter, the spindle motor 35 is decelerated and driven by the drive control of the spindle motor 35, and the spindle motor 35 stops. Therefore, the revolution of the inspection chip 2 is completed.

After the above centrifugal process is performed, the inspection chip 2 is rotated to the angle of the measurement position by driving control of the spindle motor 35. When the light source 71 emits light, the measurement light passes through the mixed liquid 26 stored in the mixing unit 170. Based on the amount of change in measurement light received by the optical sensor 72, optical measurement of the mixed liquid 26 is performed, and measurement data is acquired. Next, the measurement result of the specimen 17 is calculated based on the acquired measurement data. The test result of the sample 17 based on the measurement result is displayed. Thereafter, the main process is terminated.

<6. Main actions and effects of first embodiment>
As described above, the inspection apparatus 1 can use the inspection chip 2 into which the specimen 17, which is a liquid, the first reagent 18, and the second reagent 19 are injected. In the present embodiment, as shown in FIG. 12, the specimen 17 that has overflowed beyond the first connection portion 121 on the first wall surface 123 side, that is, the surplus specimen 17 overflows to the second wall surface 124 side, and the passage 120. Pass through. At this time, the surplus sample 17 in the N-th stage sample determination unit 114 is supplied to the second wall surface 124 connected to the N + 1-th stage sample determination unit 114. For this reason, the surplus sample 17 is not supplied to the N + 1-stage sample determination unit 114. Therefore, when the surplus sample 17 in the N-th stage sample quantifying unit 114 flows into the N + 1-th stage sample quantifying unit 114, the specimen 17 is prevented from leaking from the sample quantifying unit 114 due to an impact at the time of inflow. Therefore, there is no shortage of the sample 17 to be quantified in the sample quantification unit 114, and the quantification accuracy in the sample quantification unit 114 is improved. Therefore, the inspection accuracy is improved.

Also, if the specimen 17 is flowing as shown in FIG. 9 before the specimen 17 is not flowing as shown in FIG. 11, that is, before the specimen 17 finishes moving through the flow path. It is assumed that the inspection chip 2 is rotated and changes to a state as shown in FIGS. Even in this case, the surplus sample 17 that has not moved through the flow path is supplied to the second wall surface 124 connected to the N + 1-stage sample determination unit 114. For this reason, when the surplus sample 17 flows into the N + 1-th stage sample determination unit 114, the sample 17 is prevented from leaking from the sample determination unit 114 due to an impact at the time of inflow. Therefore, there is no shortage of the sample 17 to be quantified in the sample quantification unit 114, and the quantification accuracy in the sample quantification unit 114 is improved. Therefore, the inspection accuracy is improved.

Further, as shown in FIG. 14, in the state where the sample 17 is quantified in the sample quantification unit 114, the sample 17 may overflow from the N-th stage sample quantification unit 114 due to some influence such as vibration. Even in this case, the sample 17 that overflowed beyond the first connection portion 121 on the first wall surface 123 side overflowed from the N-th stage sample determination unit 114 in the same manner as when the sample 17 overflowed to the second wall surface 124 side. The sample 17 is supplied to the second wall surface 124 connected to the N + 1-stage sample quantification unit 114. For this reason, the overflowing specimen 17 is not supplied to the (N + 1) -th stage specimen quantitative unit 114. Therefore, it is possible to prevent the sample 17 overflowing from the N-th stage sample quantifying unit 114 from affecting the amount of the sample 17 quantified by the N + 1-th stage sample quantifying unit 114. Therefore, the quantitative accuracy of the specimen 17 is improved, and the inspection accuracy is improved.

In the present embodiment, the opening 129 of the sample guide 113 is 1 from the third virtual line 77A drawn in the direction orthogonal to the virtual plane 128A from the second connection 122A of the first-stage sample determination unit 114. It is located on the left side, which is the second wall surface 124A side, connected to the stage sample determination unit 114A. For example, before the sample 17 disappears from the sample supply unit 112, the sample 17 moves the sample guide unit 113 due to some influence, such as the rotation angle of the test chip 2 is rotated to 90 degrees as shown in FIGS. Suppose you pass. Even in this case, since the opening 129 is located on the second wall surface 124A side from the third imaginary line 77A, it passes through the sample guiding portion 113 in a state where a centrifugal force is applied in a direction orthogonal to the imaginary surface 128. The sample 17 is supplied to the second wall surface 124A connected to the first-stage sample determination unit 114. That is, the sample 17 is not supplied to the first-stage sample determination unit 114. For this reason, the quantitative accuracy of the sample 17 quantified by the first-stage sample quantitative unit 114 is improved, and the test accuracy is improved.

The first imaginary line 75 is a line drawn from the tip of the third wall surface 125 in the opening 127 in a direction perpendicular to the second wall surface 124 connected to the N-th stage sample determination unit 114. Further, the first virtual line 75 intersects with the first connection unit 121 of the sample quantification unit 114. For this reason, when it rotates so that the direction of the centrifugal force X and the 2nd wall surface 124 may become orthogonal direction like this embodiment, at the time of supply of the sample 17 to the sample fixed_quantity | quantitative_assay part 114, it is Nth stage. The sample 17 remaining in the sample determination unit 114 flows in the direction in which the first virtual line 75 extends due to the action of the centrifugal force X. For this reason, as shown in FIG. 9, the sample 17 corresponds to the first connection unit 121 of the N + 1 stage sample determination unit 114. Therefore, compared to the case where the surplus sample 17 in the N-th stage sample quantifying unit 114 is supplied from the first connection part 121 of the N + 1-th stage sample quantifying part 114 to the first wall surface 123 side, the supplied specimen 17 is supplied. Can overcome the first wall surface 123 and flow toward the mixing unit 170 side. For this reason, for example, when the sample 17 after quantification is supplied to the mixing unit 170 from the first wall surface 123 side and the inspection is performed, the first wall surface 123 is supplied to the sample 17 after quantification and the sample quantification unit 114 is supplied. It is possible to prevent mixing with the specimen 17 that has passed over. Therefore, the user can obtain an accurate inspection result. Compared to the case where the surplus sample 17 in the N-th stage sample determination unit 114 is supplied to the second wall surface 124 side from the first connection part 121 of the N + 1-th stage sample determination unit 114, the supplied sample 17 is supplied. Can flow to the second wall surface 124 without being supplied to the specimen quantification unit 114. For this reason, the sample 17 can be supplied to the sample determination unit 114 more reliably.

<7. Other>
In the present embodiment, the sample quantification unit 114 corresponds to the “quantification unit” of the present embodiment. The passage 120 corresponds to a “passage” of the present disclosure. The opening 127 corresponds to the “opening” of the present disclosure. The opening 129 corresponds to the “upstream opening” of the present disclosure. The passage 120 corresponds to a “passage” of the present disclosure. The sample guide unit 113 corresponds to the “upstream passage” of the present disclosure.

In addition, this indication is not limited to said embodiment, A various change is possible. For example, the number of stages of the sample quantification unit 114 is three, but the number of stages is not limited. The number of stages of the sample quantification unit 114 may be two stages or eight stages, for example.

In addition, the sample 17 is quantified in the plurality of sample quantification units 114, and the first reagent 18 and the second reagent 19 are not quantified in the plurality of quantification units. However, the present invention is not limited to this. For example, the first reagent 18 and the second reagent 19 may be quantified by the same configuration as the configuration for quantifying the specimen 17. That is, each of the first reagent 18 and the second reagent 19 may be quantified in a plurality of stages of quantification units. In this case, the same effect as when the specimen 17 is quantified can be obtained.

Moreover, although the opening part 129 was located in the left side which is the 2nd wall surface 124A side from the 3rd virtual line 77A, it is not limited to this. For example, the opening 129 may be located on the right side which is the first wall surface 123A side from the third virtual line 77A.

In the first embodiment, the first virtual line 75 intersects the first connection part 121, but is not limited to this. For example, the first virtual line 75 may intersect at least one of the first connection part 121 of the (N + 1) th stage sample determination unit 114 and the first wall surface 123 connected to the (N + 1) th stage sample determination part 114. . For example, when the first imaginary line 75 intersects the first wall surface 123, the position of the opening 127 shown in FIG. 6 may be moved to the right side that is the first wall surface 123 side. Further, the angle between the second wall surface 124 and the virtual surface 128 is increased to change the inclination of the first virtual line 751 extending in the direction orthogonal to the second wall surface 124, so that the first virtual line 75 becomes the first wall surface. 123 may be crossed. When the first virtual line 75 intersects at least one of the first connection part 121 and the first wall surface 123, the test chip 2 is arranged so that the direction of the centrifugal force X and the second wall surface 124 are orthogonal to each other. It is assumed that the sample 17 is rotated and supplied to the sample determination unit 114. In this case, the specimen 17 flows in the direction in which the first virtual line 75 extends, and hits at least one of the first connection part 121 and the first wall surface 123. Therefore, compared to the case where the sample 17 is supplied from the first connection unit 121 to the second wall surface 124 side, the possibility that the supplied sample 17 flows to the second wall surface 124 side without being supplied to the sample determination unit 114 is increased. Can be reduced. Therefore, the sample 17 or the reagent can be supplied to the sample determination unit 114 more reliably. Note that the first virtual line 75 may intersect with the N + 1 stage sample quantification unit 114.

Further, in the section of time T1 to T2 shown in FIG. 7, the rotation angle of the inspection chip 2 is set so that the centrifugal force X acts in the direction orthogonal to the second wall surface 124 as shown in FIGS. However, it is not limited to this. For example, the rotation angle of the inspection chip 2 in a state where a line drawn in the direction in which the centrifugal force X acts from the tip of the third wall surface 125 in the opening 127 intersects the second connection portion 122, and the line is the first wall surface 123. The rotation angle may be changed between the rotation angle of the inspection chip 2 in a state intersecting with the rotation angle. Even in this case, since the specimen 17 moves from the opening 127 in the direction in which the centrifugal force X acts, it is possible to supply the specimen 17 to the specimen quantitative unit 114.

<8. Second Embodiment of Inspection Chip>
Moreover, although 1st wall surface 123A, 123B, 123C was mutually parallel, it is not limited to this. For example, the angle formed between the virtual surface 128 in the N-th stage sample quantifying unit 114 and the first wall surface 123 connected to the N-th stage sample quantifying unit 114 is the virtual plane 128 in the N + 1-th stage sample quantifying unit 114. The angle may be larger than the angle formed by the first wall surface 123 connected to the N + 1-stage sample quantification unit 114. In the test chip 102 according to the second embodiment shown in FIG. 17, the angle R1 formed by the virtual surface 128A and the first wall surface 123A in the first-stage sample quantification unit 114A is the virtual surface in the second-stage sample quantification unit 114B. It is larger than the angle R2 formed by 128B and the first wall surface 123B. An angle R2 formed between the virtual surface 128B and the first wall surface 123B in the second-stage sample quantitative unit 114B is larger than an angle R3 formed between the virtual surface 128C and the first wall surface 123C in the third-stage sample quantitative unit 114C.

<9. Main functions and effects of the second embodiment>
Here, when the sample 17 supplied to the N-th stage sample quantifying unit 114 is supplied to the N + 1-th stage sample quantifying unit 114, the sample 17 is quantified by the N-th stage sample quantifying unit 114. Less. For this reason, the smaller the value of N, that is, the more upstream the sample quantifying unit 114, the greater the amount of the sample 17 supplied to the sample quantifying unit 114. If the amount of the sample 17 supplied to the sample quantification unit 114 is increased, the possibility that the sample 17 gets over the first wall surface 123 increases when the sample 17 is supplied to the sample quantification unit 114. In the inspection chip 102 shown in FIG. 17, the smaller the value of N, the larger the angle formed by the virtual surface 128 and the first wall surface 123. If the angle formed by the virtual surface 128 and the first wall surface 123 is increased, it is difficult for the specimen 17 to get over the first wall surface 123. That is, even if the value of N is small and the amount of the sample 17 supplied to the sample quantification unit 114 is large, the sample 17 can be prevented from getting over the first wall surface 123. For this reason, for example, when the sample 17 after quantification is supplied to the mixing unit 170 from the first wall surface 123 side and the inspection is performed, the first wall surface 123 is supplied to the sample 17 after quantification and the sample quantification unit 114 is supplied. It is possible to prevent mixing with the specimen 17 that has passed over. Therefore, the user can obtain an accurate inspection result.

<10. Third Embodiment of Inspection Chip>
In addition, the angle formed by the virtual surface 128 and the second virtual line 76 in the N-th stage sample determination unit 114 is smaller than the angle formed by the virtual surface 128 and the second virtual line 76 in the N + 1 stage determination unit. Also good. In the test chip 103 according to the third embodiment shown in FIG. 18, the angle R4 formed by the virtual surface 128B and the second virtual line 761 in the second-stage sample quantifying unit 114B is a virtual value in the third-stage sample quantifying part 114C. It is smaller than the angle R5 formed by the surface 128C and the second imaginary line 762.

<11. Main functions and effects of the second embodiment>
As described above, the smaller the value of N, the greater the amount of the sample 17 supplied to the sample quantifying unit 114, and the higher the possibility that the sample 17 will get over the first wall surface 123. In the inspection chip 103 shown in FIG. 18, the smaller the value of N, the smaller the angle formed by the virtual surface 128 and the second virtual line 76. In this case, in the left-right direction, which is the direction connecting the first connection part 121 and the second connection part 122, the smaller the value of N, the more the tip of the third wall surface 125 in the opening 127 and the specimen quantification part 114 The distance between them increases. Therefore, when the surplus sample 17 is supplied to the N + 1-stage sample quantification unit 114 in the N-th stage sample quantification unit 114, the smaller the value of N, the more the sample 17 to be supplied becomes. Get closer to. If the supplied sample 17 is close to the second connection part 122, the sample 17 becomes difficult to get over the first wall surface 123 located on the opposite side of the second connection part 122 with the sample determination part 114 interposed therebetween. That is, even if the value of N is small and the amount of the sample 17 supplied to the sample quantification unit 114 is large, the sample 17 can be prevented from getting over the first wall surface 123. For this reason, for example, when the sample 17 after quantification is supplied to the mixing unit 170 from the first wall surface 123 side and the inspection is performed, the first wall surface 123 is supplied to the sample 17 after quantification and the sample quantification unit 114 is supplied. It is possible to prevent mixing with the specimen 17 that has passed over. Therefore, the user can obtain an accurate inspection result.

DESCRIPTION OF SYMBOLS 1 Test | inspection apparatus 2,102,103 Test | inspection chip 17 Sample 18 1st reagent 19 2nd reagent 75,751,752 1st virtual line 76,761,762 2nd virtual line 77,77A, 77B, 77C 3rd virtual line 113 Specimen guide parts 114, 114A, 114B, 114C Specimen quantification parts 120, 120A, 120B, 120C Passages 121, 121A, 121B, 121C First connection parts 122, 122A, 122B, 122C Second connection parts 123, 123A, 123B, 123C First wall surface 124, 124A, 124B, 124C Second wall surface 125, 125A, 125B, 125C Third wall surface 126, 126A, 126B, 126C Fixed surface 127, 127A, 127B, 127C Openings 128, 128A, 128B, 128C Virtual surface 129 opening

Claims (6)

1. A multi-stage quantification unit for quantifying a sample or a reagent, wherein the sample or the reagent remaining in the N-stage quantification unit is supplied to the N + 1-stage quantification unit;
   A first wall surface connected to a first connection portion located at one end of the quantitative portion;
   A second wall surface connected to the second connection part located at the other end of the quantitative part;
   Including a third wall surface connected to an end portion of the second wall surface connected to the N-stage quantification portion on the side opposite to the end portion on the second connection portion side; A passage having an opening on the connected second wall surface side,
   The first wall surface connected to the N-stage quantification unit is closer to the N + 1-stage quantification unit side than a virtual plane parallel to the quantification surface connecting the first connection part and the second connection part. Tilt to the other side,
   The second wall surface connected to the N-stage quantification unit is inclined to the N + 1-stage quantification unit side from the virtual plane,
   The first imaginary line drawn in the direction orthogonal to the second wall surface connected to the N-stage fixed portion from the tip of the third wall surface in the opening is the tip of the third wall surface in the opening. From the second imaginary line connecting the second connection part of the N + 1 stage quantification part, located on the first wall surface side connected to the N + 1 stage quantification part,
   The second wall surface connected to the N + 1-stage quantification section from a third imaginary line drawn from the second connection section of the N + 1-stage quantification section in a direction orthogonal to the virtual plane. Inspection chip characterized by being located on the side.
2. The first imaginary line intersects with at least one of the first connection part of the N + 1 stage quantification part and the first wall surface connected to the N + 1 stage quantification part. The inspection chip according to 1.
3. 3. The inspection chip according to claim 2, wherein the first imaginary line intersects with the first connection part of the N + 1 stage quantification part.
4. The angle formed between the virtual surface in the N-th stage quantification unit and the first wall surface connected to the N-th stage quantification unit is the virtual plane in the N + 1 stage quantification unit and the N + 1-th stage. The inspection chip according to any one of claims 1 to 3, wherein the inspection chip is larger than an angle formed by the first wall surface connected to the determination unit.
5. An angle formed between the virtual plane and the second virtual line in the N-th stage quantification unit is smaller than an angle formed between the virtual plane and the second virtual line in the N + 1 stage quantification unit. The inspection chip according to claim 1 or 2.
6. Upper distribution provided on the side opposite to the second-stage quantification section side with respect to the first-stage quantification section and having an upstream opening on the second wall surface side connected to the first-stage quantitation section With a road,
   The upstream opening is connected to the first-stage quantitative unit from the third imaginary line drawn in the direction orthogonal to the virtual plane from the second connection part of the first-stage quantitative unit. The inspection chip according to claim 1, wherein the inspection chip is located on a second wall surface side.

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